TWM500894U - Testing apparatus - Google Patents

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Publication number
TWM500894U
TWM500894U TW103221931U TW103221931U TWM500894U TW M500894 U TWM500894 U TW M500894U TW 103221931 U TW103221931 U TW 103221931U TW 103221931 U TW103221931 U TW 103221931U TW M500894 U TWM500894 U TW M500894U
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Taiwan
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test
electronic product
detector
controller
group
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TW103221931U
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Chinese (zh)
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bo-cheng Xue
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Optiviz Technology Inc
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Description

測試裝置Test device

本新型是有關於一種測試裝置,特別是指一種可以對一電子裝置進行電性測試之測試裝置。The present invention relates to a test device, and more particularly to a test device capable of electrically testing an electronic device.

現今社會在電子產品的影像下,生活習慣可以說與以前大大的不相同,尤其目前電子設備的設計越來越人性化,現今人類根本脫離不了電子產品的使用,使的電子產品從工廠被大量製造出來。In today's society, the habits of electronic products can be said to be greatly different from the previous ones. In particular, the design of electronic devices is becoming more and more humanized. Nowadays, human beings cannot be separated from the use of electronic products, and the electronic products are greatly Made out.

早期電子設備從工廠出貨前,其電路都有檢測關卡來確保出貨的良率,檢測關卡使用大量的人力使用手持式探針來檢測電路板是否有斷路或短路的瑕疵,但是人工檢測具有易疲勞與人事管理繁瑣之缺點。隨著時代的進步,電子產品越做越小,自動化檢測設備技術也逐漸進步,且其優點有工作時間長、檢測的時間快與檢測結果精準,可以取代大量的人力,節省大量的人事成本。。Before the electronic equipment was shipped from the factory, its circuit had check levels to ensure the shipment rate. The check level used a lot of manpower to use the hand-held probe to detect whether the board has an open circuit or short circuit, but the manual test has The shortcomings of fatigue and cumbersome personnel management. With the advancement of the times, electronic products have become smaller and smaller, and automated detection equipment technology has gradually improved, and its advantages include long working hours, fast detection time and accurate detection results, which can replace a large amount of manpower and save a lot of personnel costs. .

參閱圖1,為中華民國新型第I454415號專利「電子元件之檢測機」,該專利案揭露一種檢測機,包含供料裝置50、收料裝置60、空匣裝置70、檢測裝置80、輸送裝置90,及電子元件所構成,其將複數電子元件放置於該空匣裝置70中,並使用該輸送裝置90抓取複數的電子元件進行檢測,用以加快檢測速度。Referring to FIG. 1 , the invention discloses a new type I454415 patent "detector for electronic components", which discloses a detecting machine comprising a feeding device 50, a receiving device 60, an open device 70, a detecting device 80, and a conveying device. 90, and an electronic component, which places a plurality of electronic components in the open space device 70, and uses the transport device 90 to capture a plurality of electronic components for detection to speed up the detection.

習知之電子元件之檢測機雖然能有效的利用該輸送裝置90抓取複數的電子元件進行檢測與縮小供料裝置50、收料裝置60,及檢測裝置80間的配置來加快檢測速度,其實際使用時仍然有以下的缺點產生:The conventional electronic component detecting machine can effectively use the conveying device 90 to grasp a plurality of electronic components to detect and reduce the arrangement between the feeding device 50, the receiving device 60, and the detecting device 80 to speed up the detection speed, and the actual The following shortcomings still occur when using:

一、無分類裝置First, no classification device

習知之檢測機雖然可以檢測複數的電子元件,但是檢測結果中不良品之電子元件還是混在複數的電子元件中,必須到退出檢測機再以其他的方式來將不良之電子元件挑出,而增加其他人力或機台成本。Although the conventional detection machine can detect a plurality of electronic components, the electronic components of the defective products in the detection result are mixed in the plurality of electronic components, and it is necessary to exit the inspection machine and then pick out the defective electronic components in other ways, thereby increasing Other manpower or machine costs.

二、無法確實檢測Second, can not be sure

習知之檢測機將複數電子元件放置於該空匣裝置中,就直接進入檢測裝置進行檢測,無任何確認位置之設備,當電子元件的位置發生偏移時,就會發生誤檢測而將良品當成不良品,而造成損失。The conventional detecting device places the plurality of electronic components in the open device, and directly enters the detecting device for detection. If there is no device for confirming the position, when the position of the electronic component is shifted, misdetection occurs and the good product is regarded as a good product. Bad goods, causing losses.

三、無法檢測精密的電路Third, can not detect sophisticated circuits

由上述可知,其電子元件不必經確認確實位置或進行定位流程,其檢測精細度必定只能達到一個程度,無法再針對較精密的電路進行檢測,對於目前電子產品越做越小,習知之檢測機已不符當前合日新月異的電子產品。It can be seen from the above that the electronic components do not have to confirm the exact position or the positioning process, and the detection fineness must be only one degree, and it is impossible to detect the more precise circuits. For the current electronic products, the smaller the electronic products, the conventional detection. The machine has not been in line with the current electronic products.

承上所述,對於習知單純的利用複數的檢測裝置來增快檢測的速度,無法針對目前電子元件中複雜的電路來進行檢測動作,並且,在檢測時忽略該電子元件正確所在位置,而在檢測時無法與該檢測裝置正確的接觸,有可發生正常的電子元件被誤檢測而遭到丟棄,造成產品的損失,實屬有必要再加以改進。As described above, it is impossible to increase the speed of detection by using a simple detection device, and it is impossible to perform a detection operation for a complicated circuit in the current electronic component, and ignore the correct position of the electronic component during detection. It is impossible to make proper contact with the detecting device at the time of detection, and it is necessary to improve the normal electronic component to be erroneously detected and discarded, resulting in loss of the product.

有鑑於此,本新型之目的是提供一種測試裝置,適用於對複數電子產品進行電性測試,並依據檢測結果將該電子產品搬移至一良品區及一壞品區,該測試裝置 包含一承載單元、一定位單元、一測試單元、一控制單元,及一分類單元。In view of this, the purpose of the present invention is to provide a testing device suitable for electrical testing of a plurality of electronic products, and moving the electronic product to a good product area and a bad product area according to the detection result, the testing device The utility model comprises a carrying unit, a positioning unit, a testing unit, a control unit and a classification unit.

該承載單元包括一具有複數用以承載該電子產品之第一測試槽的第一承載組。該定位單元包括一設置於該承載單元上並可偵測該電子產品位於該第一測試槽中位置的第一粗定位偵測器。該測試單元包括一設置於該承載單元上並可相對該承載單元移動之第一測試座、一設置於該第一測試座上並可與該電子產品作接觸測試的第一檢測器。The carrying unit includes a first carrier set having a plurality of first test slots for carrying the electronic product. The positioning unit includes a first coarse positioning detector disposed on the carrying unit and capable of detecting a position of the electronic product in the first test slot. The test unit includes a first test socket disposed on the load bearing unit and movable relative to the load bearing unit, a first detector disposed on the first test socket and capable of being in contact with the electronic product.

該控制單元包括一與該第一檢測組電性連接之控制器,該控制器可儲存該第一檢測器之電性檢測資料。該分類單元包括一與該控制器電性連接之搬移組,該搬移組是受該控制器之控制並且依據電性檢測資料將該第一測試槽上之電子產品搬移至該良品區或該壞品區。The control unit includes a controller electrically connected to the first detection group, and the controller can store electrical detection data of the first detector. The classification unit includes a moving group electrically connected to the controller, and the moving group is controlled by the controller and moves the electronic product on the first test slot to the good product area according to the electrical detection data or the bad Product area.

本新型的又一技術手段,是在於該第一承載組為一概呈圓形且可驅動旋轉之分度盤,該複數第一測試槽是間隔地設置於該第一承載組之周緣上,當該第一承載組轉動時可使該複數第一測試槽變換於該定位單元及該測試單元下的位置。A further technical means of the present invention is that the first carrier group is a circular disk that can be driven to rotate, and the plurality of first test slots are spaced apart on the circumference of the first carrier group. When the first carrier group rotates, the plurality of first test slots can be transformed into the positioning unit and a position under the test unit.

本新型的再一技術手段,是在於該定位單元更包括一設置於該第一承載組下方的第一進料偵測器,而每一第一測試槽開設有一第一檢測孔,該第一進料偵測器可透過該第一檢測孔偵測該電子產品是否有放置於該第一測試槽上。A further technical means of the present invention is that the positioning unit further includes a first feeding detector disposed under the first carrier group, and each of the first testing slots defines a first detecting hole, the first The feed detector can detect whether the electronic product is placed on the first test slot through the first detection hole.

本新型的另一技術手段,是在於該測試單元更包括一設置於該第一測試座上之第一微定位器,該第一微定位器與該控制器電性連接可進一步偵測位於下方第一測試槽中之電子產品的精確位置,並將所偵測的結果回饋給該控制器,以決定該第一檢測器是否與該電子產品作接觸測試。Another technical means of the present invention is that the test unit further includes a first micro locator disposed on the first test pedestal, the first micro locator being electrically connected to the controller for further detecting the lower position The precise position of the electronic product in the first test slot, and the detected result is fed back to the controller to determine whether the first detector is in contact test with the electronic product.

本新型的又一技術手段,是在於該搬移組具有一設置於該第一承載組上方之搬移座、一設置於該搬移座下端且可吸取該電子產品之吸取件,及一與該搬移座連接之移動件,該移動件移動該搬移座將該吸取件移動至該第一測試槽的電子產品上,並依據電性檢測資料將該電子產品搬移至該良品區或該壞品區。Another technical means of the present invention is that the moving group has a moving seat disposed above the first carrying group, a suction member disposed at a lower end of the moving seat and absorbing the electronic product, and a moving seat And connecting the moving member, the moving member moves the moving seat to move the suction member to the electronic product of the first test slot, and moves the electronic product to the good product area or the bad product area according to the electrical detection data.

本新型的再一技術手段,是在於該搬移組更具有一設置於該搬移座與該吸取件中間之轉向件,當該吸取件吸取該第一測試槽上之電子產品時,該轉向件可以將該吸取件及該電子產品旋轉轉向。A further technical means of the present invention is that the moving group further has a steering member disposed between the moving seat and the suction member. When the suction member sucks the electronic product on the first testing slot, the steering member can Rotating the suction member and the electronic product.

本新型的另一技術手段,是在於該定位單元更包括一位於該第一承載組上方且與該控制器電性連接之第一料號辨識器,該第一料號辨識器可偵測位於該第一測試槽之電子產品種類,並將偵測結果回饋至該控制器。Another technical means of the present invention is that the positioning unit further includes a first item identifier located above the first carrier group and electrically connected to the controller, and the first item identifier can detect the location The electronic product type of the first test slot, and the detection result is fed back to the controller.

本新型的又一技術手段,是在於該控制單元更包括一與該控制器電性連接之顯示器,用以顯示該複數電子產品的測試結果。A further technical means of the present invention is that the control unit further comprises a display electrically connected to the controller for displaying the test result of the plurality of electronic products.

本新型的再一技術手段,是在於該第一粗定位偵測器為一可擷取該電子產品的圖像之圖像擷取器,並具有一可比對該電子產品的圖像且與該控制器電性連接之第一定位晶片,用以確認該電子產品放置於該第一測試槽上的位置並回饋至該控制器。A further technical means of the present invention is that the first coarse positioning detector is an image capturing device capable of capturing an image of the electronic product, and has an image comparable to the electronic product and The controller is electrically connected to the first positioning chip to confirm the position of the electronic product placed on the first test slot and fed back to the controller.

本新型的另一技術手段,是在於該承載單元更包括一間隔對應該第一承載組並具有複數用以承載該電子產品之第二測試槽的第二承載組,該定位單元更包括一間隔對應該第一粗定位偵測器之第二粗定位偵測器、一間隔對應該第一進料偵測器之第二進料偵測器,及一間隔對應該第一料號辨識器之第二料號辨識器,該測試單元更包括一間隔對應該第一測試座之第二測試座、一間隔對應該第一檢測器之第二檢測器,及一間隔對應該第一微定位器 之第二微定位器,該控制器可儲存該第二檢測器之電性檢測資料,該搬移組也受該控制器之控制並且依據電性檢測資料將該第二測試槽上之電子產品搬移至該良品區或該壞品區。Another technical means of the present invention is that the bearer unit further includes a second bearer group corresponding to the first bearer group and having a plurality of second test slots for carrying the electronic product, and the positioning unit further includes a space. a second coarse position detector corresponding to the first coarse position detector, a second feed detector corresponding to the first feed detector, and an interval corresponding to the first item number identifier a second item identifier, the test unit further comprising a second test block spaced apart from the first test block, a second detector corresponding to the first detector, and an interval corresponding to the first micro positioner a second micro locator, the controller can store the electrical detection data of the second detector, and the moving group is also controlled by the controller and moves the electronic product on the second test slot according to the electrical detection data To the good area or the bad area.

本新型之有益功效在於當該電子產品放置於該第一承載組之第一測試槽中,該第一承載組帶動該第一測試槽移動至該定位單元下方,該第一粗定位偵測器可確定該電子產品位於該第一測試槽的位置,接著,該第一承載組再帶動該第一測試槽移動至測試單元下方,該第一測試座移動該第一檢測器對該電子產品進行接觸式的電性檢測,最後,該第一承載組帶動該第一測試槽移動至該分類單元下方,該搬移組依據該第一檢測器對該電子產品的電性檢測結果,將該電子產品搬移至該良品區或該壞品區中。The first usefulness of the present invention is that the first test carrier moves the first test slot below the positioning unit, and the first coarse positioning detector is placed in the first test slot of the first carrier group. Determining that the electronic product is located at the first test slot, and then the first load bearing group further drives the first test slot to move under the test unit, the first test socket moves the first detector to perform the electronic product Contact type electrical detection, finally, the first carrier group drives the first test slot to move under the classification unit, and the migration group according to the electrical detection result of the first detector to the electronic product, the electronic product Move to the good area or the bad area.

21‧‧‧電子產品21‧‧‧Electronic products

22‧‧‧良品區22‧‧‧Good area

23‧‧‧壞品區23‧‧‧Defective area

4‧‧‧承載單元4‧‧‧ Carrying unit

41‧‧‧第一承載組41‧‧‧First Bearer Group

411‧‧‧第一測試槽411‧‧‧First test slot

412‧‧‧第一檢測孔412‧‧‧ first detection hole

42‧‧‧第二承載組42‧‧‧Second carrier group

421‧‧‧第二測試槽421‧‧‧Second test slot

422‧‧‧第二檢測孔422‧‧‧Second detection hole

5‧‧‧控制單元5‧‧‧Control unit

51‧‧‧控制器51‧‧‧ Controller

52‧‧‧顯示器52‧‧‧ display

6‧‧‧定位單元6‧‧‧ Positioning unit

61‧‧‧第一粗定位偵測器61‧‧‧First coarse positioning detector

62‧‧‧第一進料偵測器62‧‧‧First Feed Detector

63‧‧‧第一料號辨識器63‧‧‧First Item Number Identifier

64‧‧‧第二粗定位偵測器64‧‧‧Second coarse positioning detector

65‧‧‧第二進料偵測器65‧‧‧Second feed detector

66‧‧‧第二料號辨識器66‧‧‧Second item number identifier

7‧‧‧測試單元7‧‧‧Test unit

71‧‧‧第一測試座71‧‧‧First test stand

72‧‧‧第一檢測器72‧‧‧First detector

73‧‧‧第一微定位器73‧‧‧First Micro Positioner

74‧‧‧第二測試座74‧‧‧Second test seat

75‧‧‧第二檢測器75‧‧‧Second detector

76‧‧‧第二微定位器76‧‧‧Second Micro Locator

8‧‧‧分類單元8‧‧‧Classification unit

81‧‧‧搬移組81‧‧‧Transfer group

811‧‧‧搬移座811‧‧‧moving seat

812‧‧‧吸取件812‧‧‧Sucker

813‧‧‧移動件813‧‧‧Mobile parts

814‧‧‧轉向件814‧‧‧Steering parts

圖1是一立體示意圖,說明說明習知台灣發明第I454415號一種電子元件之檢測機;圖2是一示意圖,說明本新型測試裝置之一較佳實施例;圖3是一上視示意圖,說明該較佳實施例之元件配置;圖4是一正視示意圖,說明該較佳實施例之元件配置;及圖5是一立體示意圖,說明該較佳實施例之元件配置。1 is a perspective view showing a conventional electronic device detecting machine of the invention No. 1454415; FIG. 2 is a schematic view showing a preferred embodiment of the testing device of the present invention; FIG. 3 is a schematic top view showing The component configuration of the preferred embodiment; FIG. 4 is a front elevational view showing the component configuration of the preferred embodiment; and FIG. 5 is a perspective view showing the component configuration of the preferred embodiment.

有關於本新型之相關申請專利特色與技術內容,在以下配合參考圖式之較佳實施例的詳細說明中,將可清楚的呈現。The detailed description of the preferred embodiments of the present invention will be apparent from the detailed description of the preferred embodiments.

參閱圖2、3、4,為本新型測試裝置之較佳實施例,適用於對複數電子產品21進行電性測試,並依據檢測結果將該電子產品搬移至一良品區22及一壞品區23,該測試裝置包含一承載單元4、一控制單元5、一定位單元6、一測試單元7,及一分類單元8。其中,該較佳實施例之電子產品21使用設置有電子元件的軟板,實際實施時,該電子產品21可為電路板或是積體電路等產品,而該電子產品21種類繁多且技術成熟,在此不再一一贅述,也不應以此為限。2, 3, and 4, a preferred embodiment of the test device of the present invention is applicable to electrical testing of the plurality of electronic products 21, and moving the electronic product to a good product area 22 and a bad product area according to the detection result. 23, the test device comprises a carrying unit 4, a control unit 5, a positioning unit 6, a testing unit 7, and a sorting unit 8. The electronic product 21 of the preferred embodiment uses a flexible board provided with electronic components. In actual implementation, the electronic product 21 can be a circuit board or an integrated circuit, and the electronic product 21 has various types and mature technologies. It will not be repeated here, nor should it be limited to this.

該承載單元4包括一具有複數用以承載該電子產品21之第一測試槽411的第一承載組41,及一具有複數用以承載該電子產品21之第二測試槽421的第二承載組42,該第二承載組42間隔的設置於該第一承載組41之一測,較佳地,該第一承載組41設置於該第二承載組42的左側,彼此間隔的空間可設置該良品區22及該壞品區23,該良品區22為一可放置一可承載複數電子產品21之載具的平台。且該第一、二承載組41、42為一概呈圓形且可驅動旋轉之分度盤,該複數第一、二測試槽411、421是間隔地設置於該第一、二承載組41、42之周緣上,當該第一、二承載組41、42轉動時可使該複數第一、二測試槽411、421變換於該定位單元6、該測試單元7,及該分類單元8下的位置。The carrier unit 4 includes a first carrier group 41 having a plurality of first test slots 411 for carrying the electronic product 21, and a second carrier group having a plurality of second test slots 421 for carrying the electronic product 21. The second carrier group 42 is spaced apart from the first carrier group 41. Preferably, the first carrier group 41 is disposed on the left side of the second carrier group 42. The good area 22 and the bad area 23 are a platform on which a carrier capable of carrying a plurality of electronic products 21 can be placed. The first and second load groups 41 and 42 are a circular disk and can be driven to rotate. The first and second test slots 411 and 421 are spaced apart from the first and second load groups 41. The plurality of first and second test slots 411, 421 can be converted to the positioning unit 6, the test unit 7, and the classification unit 8 when the first and second carrier groups 41, 42 are rotated. position.

較佳地,複數設置於該第一、二承載組41、42之第一、二測試槽411、421的數目為4個,複數第一、二測試槽411、421彼此間隔90°,且設置於左邊的第一承載組41以順時鐘方向旋轉,而設置於右邊的第二承載組42以逆時鐘方向旋轉,每一次旋轉角度為90°,實際實施時,不應以此為限。Preferably, the number of the first and second test slots 411 and 421 of the first and second load groups 41 and 42 is four, and the plurality of first and second test slots 411 and 421 are spaced apart from each other by 90°. The first carrier group 41 on the left side rotates in the clockwise direction, and the second carrier group 42 disposed on the right side rotates in the counterclockwise direction. Each rotation angle is 90°, which should not be limited thereto.

該控制單元5包括一與該第一、二承載組41、42電性連接之控制器51,及一與該控制器51電性連 接之顯示器52,該控制器51可控制該第一、二承載組41、42旋轉與否,並可儲存該複數電子產品21的測試結果,該顯示器52可顯示該複數電子產品21的測試結果及該測試裝置中設備狀況。The control unit 5 includes a controller 51 electrically connected to the first and second carrier groups 41 and 42 , and is electrically connected to the controller 51 . Connected to the display 52, the controller 51 can control the rotation of the first and second carrier groups 41, 42 and can store the test result of the plurality of electronic products 21, and the display 52 can display the test result of the plurality of electronic products 21. And the condition of the equipment in the test device.

配合參閱圖5,該定位單元6包括一設置於該第一承載組41上方並可偵測該電子產品21位於該第一測試槽411中之位置且與該控制器51電性連接的第一粗定位偵測器61、一設置於該第一承載組41下方且與該控制器51電性連接的第一進料偵測器62、一位於該第一承載組41上方且與該控制器51電性連接之第一料號辨識器63、一設置於該第二承載組42上方並可偵測該電子產品21位於該第二測試槽421中之位置且與該控制器51電性連接的第二粗定位偵測器64、一設置於該第二承載組42下方且與該控制器51電性連接的第二進料偵測器65,及一位於該第二承載組42上方且與該控制器51電性連接之第一料號辨識器66。Referring to FIG. 5 , the positioning unit 6 includes a first portion disposed above the first carrier group 41 and detecting that the electronic product 21 is located in the first test slot 411 and electrically connected to the controller 51 . a coarse position detector 61, a first feed detector 62 disposed under the first load group 41 and electrically connected to the controller 51, one above the first load group 41 and the controller The first component identifier 63 of the electrical connection 51 is disposed above the second carrier group 42 and can detect the position of the electronic product 21 in the second test slot 421 and is electrically connected to the controller 51. a second coarse position detector 64, a second feed detector 65 disposed under the second load group 42 and electrically connected to the controller 51, and a second load group 42 and A first item identifier 66 electrically coupled to the controller 51.

而每一第一測試槽411開設有一第一檢測孔412,該第一進料偵測器62可透過該第一檢測孔412偵測該電子產品21是否有放置於該第一測試槽411上,且每一第二測試槽421開設有一第二檢測孔422,該第二進料偵測器65可透過該第二檢測孔422偵測該電子產品21是否有放置於該第二測試槽421上,較佳地,該第一、二檢測孔412、422設置於該第一、二測試槽411、421中並貫穿該第一、二承載組41、42,且該第一、二檢測孔412、422以透明材質封住,該第一、二進料偵測器62、65分別設置於該第一、二承載組41、42下方且以紅外線的技術透過該第一、二檢測孔412、422對該第一、二測試槽411、421之電子產品21進行偵測,並將偵測結果回饋於該控制器51。Each of the first test slots 411 defines a first detecting hole 412. The first detecting detector 62 can detect whether the electronic product 21 is placed on the first testing slot 411 through the first detecting hole 412. And the second detecting slot 421 is configured to detect whether the electronic product 21 is placed in the second testing slot 421 through the second detecting hole 422. Preferably, the first and second detection holes 412 and 422 are disposed in the first and second test slots 411 and 421 and penetrate the first and second carrier groups 41 and 42 , and the first and second detection holes are 412 and 422 are sealed by a transparent material. The first and second feed detectors 62 and 65 are respectively disposed under the first and second load groups 41 and 42 and pass through the first and second detection holes 412 by infrared technology. The electronic product 21 of the first and second test slots 411 and 421 is detected, and the detection result is fed back to the controller 51.

該第一、二料號辨識器63、66可偵測位於 該第一、二測試槽411、421之電子產品21的種類。較佳地,該第一、二料號辨識器411、421為2維條碼辨識器,該複數電子產品21上印有可辨識該電子產品21種類的2維條碼,該第一、二料號辨識器63、66將偵測結果回饋至該控制器51,實際實施時,可選用其他的種類辨識技術,不應以此為限。The first and second item identifiers 63 and 66 can detect the presence The types of the electronic products 21 of the first and second test slots 411 and 421. Preferably, the first and second item identifiers 411 and 421 are two-dimensional barcode identifiers, and the plurality of electronic products 21 are printed with a 2-dimensional barcode that can identify the type of the electronic product 21, and the first and second numbers are The identifiers 63 and 66 are fed back to the controller 51. In actual implementation, other types of identification techniques may be used, and should not be limited thereto.

該較佳實施例更包含一可將該電子產品21放入於該第一、二測試槽411、421的進料端,該進料端位於該第一、二承載組41、42前端的位置,該第一、二進料偵測器62、65及該第一、二料號辨識器63、66設置於該進料端處,並且於該進料端設置一與該控制器51電連接之按鍵,當該使用者按下該按鍵時,該第一、二進料偵測器62、65及該第一、二料號辨識器63、66偵測該電子產品21並回饋至該控制器51,該控制器51比對正確無誤後控制該第一、二承載組41、42各自旋轉90°,讓該第一、二測試槽411、421進入該定位單元6之第一、二粗定位偵測器61、64下方。The preferred embodiment further includes a feeding end of the electronic product 21 placed in the first and second test slots 411, 421, the feeding end being located at the front end of the first and second carrier groups 41, 42. The first and second feed detectors 62, 65 and the first and second material identifiers 63, 66 are disposed at the feed end, and a feed is electrically connected to the controller 51 at the feed end. a button, when the user presses the button, the first and second feed detectors 62, 65 and the first and second number identifiers 63, 66 detect the electronic product 21 and feed back to the control The controller 51 controls the first and second load groups 41 and 42 to rotate 90° respectively, so that the first and second test slots 411 and 421 enter the first and second coarse positions of the positioning unit 6. Below the position detectors 61, 64.

上述之第一、二粗定位偵測器61、64為一可擷取該電子產品的圖像之圖像擷取器,並分別具有一可比對該電子產品的圖像且與該控制器51電性連接之第一定位晶片與第二定位晶片,用以確認該電子產品21放置於該第一、二測試槽411、421上的形狀及位置並回饋至該控制器51,例如:以高解析之攝影機抓取該電子產品21的圖像後,該第一、二定位晶片解析該圖像上的基準點是否正確到達定位,此外,也確認該電子產品21的外觀,比對有瑕疵或損傷也回饋該控制器51,將該電子產品21歸類為不良品。較佳地,該第一粗定位偵測器61設置於該第一承載組41之左方90°的位置,該第二粗定位偵測器64設置於該第二承載組42之右方90°的位置。The first and second coarse position detectors 61 and 64 are an image capture device that can capture an image of the electronic product, and respectively have an image comparable to the electronic product and the controller 51 The first positioning chip and the second positioning chip are electrically connected to confirm the shape and position of the electronic product 21 placed on the first and second test slots 411, 421 and fed back to the controller 51, for example: high After the parsing camera captures the image of the electronic product 21, the first and second positioning wafers analyze whether the reference point on the image correctly reaches the positioning, and further confirms the appearance of the electronic product 21, which is defective or The damage is also fed back to the controller 51 to classify the electronic product 21 as a defective product. Preferably, the first coarse positioning detector 61 is disposed at a position 90° to the left of the first carrier group 41, and the second coarse positioning detector 64 is disposed at a right 90 of the second carrier group 42. ° location.

該測試單元7包括一設置於該第一承載組41 上並可相對該第一承載組41移動之第一測試座71、一設置於該第一測試座71上並可與該電子產品21作接觸測試的第一檢測器72、一設置於該第一測試座71上之第一微定位器73、一設置於該第二承載組42上並可相對該第二承載組42移動之第二測試座74、一設置於該第二測試座74上並可與該電子產品21作接觸測試的第二檢測器75,及一設置於該第二測試座74上之第二微定位器76。The test unit 7 includes a first load group 41. a first test stand 71 that is movable relative to the first load bearing group 41, a first detector 72 that is disposed on the first test stand 71 and can be in contact with the electronic product 21, and is disposed at the first tester a first micro locator 73 on a test socket 71, a second test socket 74 disposed on the second carrier group 42 and movable relative to the second carrier group 42, and a second test socket 74 disposed on the second test socket 74 And a second detector 75 for contact testing with the electronic product 21, and a second micro locator 76 disposed on the second test socket 74.

其中,該第一、二微定位器73、76與該控制器51電性連接並可進一步偵測位於下方第一、二測試槽411、421中之電子產品21的精確位置,並將偵測的結果回饋給該控制器51,而該第一、二測試座71、74受控於該控制器51,以決定該第一、二檢測器72、75是否與該電子產品21作接觸測試,該第一、二測試座71、74分別相對於該進料端並與該第一、二粗定位偵測器61、65間隔90。設置於該第一、二承載組41、42後端上方處。The first and second micro locators 73 and 76 are electrically connected to the controller 51 and can further detect the precise position of the electronic product 21 located in the first and second test slots 411 and 421 below, and detect The result is fed back to the controller 51, and the first and second test seats 71, 74 are controlled by the controller 51 to determine whether the first and second detectors 72, 75 are in contact with the electronic product 21 for testing. The first and second test seats 71, 74 are spaced 90 from the first and second coarse position detectors 61, 65, respectively, with respect to the feed end. It is disposed above the rear ends of the first and second carrier groups 41 and 42.

較佳地,該第一、二測試座71、74不僅具有上下移動的功能,還具有水平移動的功能,且該第一、二檢測器72、75為複數與該控制器51電連接的探針,當該第一、二微定位器73、76確認該電子產品21上的接觸點位置時,該控制器51調整該第一、二測試座71、74微調位置,使該第一、二檢測器72、75對準該電子產品上的接觸點,在該第一、二測試座71、74下壓時,該第一、二檢測器72、75能確無誤的接觸該電子產品21上的接觸點,並將電性量測數值回傳至該控制器51比對該電子產品21的電性是否正常。Preferably, the first and second test seats 71 and 74 not only have the function of moving up and down, but also have the function of horizontal movement, and the first and second detectors 72 and 75 are connected to the controller 51 in plurality. a pin, when the first and second micro locators 73, 76 confirm the position of the contact point on the electronic product 21, the controller 51 adjusts the fine adjustment position of the first and second test seats 71, 74 to make the first and second The detectors 72, 75 are aligned with the contact points on the electronic product. When the first and second test sockets 71, 74 are pressed, the first and second detectors 72, 75 can contact the electronic product 21 without any errors. The contact point and the electrical measurement value are transmitted back to the controller 51 to determine whether the electrical property of the electronic product 21 is normal.

該分類單元8包括一與該控制器51電性連接之搬移組81,該搬移組位於該第一承載41組右方90°的位置,並且也位於該第二承載組42左方90°的位置,剛好設置於該第一、二承載組41、42中間上方,此外,該良品區22及該壞品區23就位於該搬移組81下方,該搬移 組81是受該控制器51之控制並且依據電性檢測資料將該第一、二測試槽411、421上之電子產品21搬移至該良品區22或該壞品區23。The classifying unit 8 includes a moving group 81 electrically connected to the controller 51. The moving group is located at a position 90° to the right of the first carrier 41 group, and is also located 90° to the left of the second carrier group 42. The position is just above the middle of the first and second load groups 41 and 42. In addition, the good product area 22 and the bad product area 23 are located below the moving group 81, and the moving The group 81 is controlled by the controller 51 and moves the electronic products 21 on the first and second test slots 411, 421 to the good product area 22 or the bad product area 23 according to the electrical detection data.

該搬移組81具有一設置於該第一承載組41上方之搬移座811、一設置於該搬移座811下端且可吸取該電子產品21之吸取件812、一與該搬移座811連接之移動件813,及一設置於該搬移座811與該吸取件812中間之轉向件814,該移動件813受該控制器51的控制可將該吸取件812移動於該第一測試槽411、該第二測試槽422、該良品區22,及該壞品區23上方,且在該第一、二測試槽411、421時可往下移動,使該吸取件812與該第一、二測試槽411、421中之電子產品21進行接觸,並將該電子產品21吸住後向上搬移,並依據電性檢測資料,將該正常之電子產品21搬移至該良品區22的載具上擺置,而將電性檢測有問題的電子產品21丟入該壞品區23。The moving group 81 has a moving seat 811 disposed above the first carrying group 41, a suction member 812 disposed at a lower end of the moving seat 811 and capable of sucking the electronic product 21, and a moving member connected to the moving seat 811. 813, and a steering member 814 disposed between the moving seat 811 and the suction member 812, the moving member 813 is controlled by the controller 51 to move the suction member 812 to the first test slot 411, the second The test slot 422, the good product area 22, and the bad product area 23 are above, and can move downward when the first and second test slots 411 and 421 are moved, so that the suction member 812 and the first and second test slots 411, The electronic product 21 in the 421 is in contact, and the electronic product 21 is sucked up and moved upward, and the normal electronic product 21 is moved to the carrier of the good product area 22 according to the electrical detection data, and The electronic product 21 having the electrical detection problem is dropped into the defective area 23.

當該吸取件812吸取該第一、二測試槽411、421上之電子產品21並搬移至良品區22時,該良品區22上方會放置一個可整齊排列該複數電子產品21的載具,該搬移組81之轉向件814可以將該吸取件812及該電子產品21旋轉轉向,以正確的放置於該良品區22之載具中,該載具承載著複數檢測正常的電子產品21,以方便該使用者拿取複數電子產品21並移往下一道製程,其中,該轉向件814是使用一個汽缸搭配一個螺紋件來達到一固定旋轉角度的轉向,比起以往的轉向件有著更小的元件體積,非常合適複雜的測試機台。When the pick-up member 812 picks up the electronic product 21 on the first and second test slots 411, 421 and moves to the good product area 22, a carrier for aligning the plurality of electronic products 21 is placed above the good product area 22, The steering member 814 of the shifting group 81 can steer the picking member 812 and the electronic product 21 to be correctly placed in the carrier of the good product area 22, and the carrier carries the plurality of electronic products 21 for detecting normal. The user takes the plurality of electronic products 21 and moves to the next process, wherein the steering member 814 uses a cylinder with a threaded member to achieve a fixed angle of rotation, and has smaller components than the conventional steering member. Volume, very suitable for complex test machines.

在此,本發明人要強調的是,本新型可於該第一、二測試槽411、421將該電子產品21進行進料、該第一、二粗定位器61、64可確認該第一、二測試槽411、421中的電子產品進行粗定位、該檢測單元7對該第一、二測試槽411、421中的電子產品22進行電性的檢測,及 該分類單元8受該控制器51的控制將該第一、二測試槽411、421中的電子產品21進行分類,該承載單元4配合上述進料、粗定位、檢測,及分類4道檢測步驟將該第一、二測試槽411、421以90°的角度設置於該第一、二乘載組41、42中,使的複數第一、二乘載組41、42之電子產品21分別同時進行進料、粗定位、檢測,及分類4道檢測步驟,當上述4道檢測步驟完成時,按下該按鍵使該第一、二承載組41、42各別旋轉90°,馬上再執行上述4道檢測步驟,使每種檢測步驟持續不間斷的工作,不會產生設備空置的狀況而將時間浪費在等待上,可增進檢測的速度。Here, the inventors have emphasized that the electronic product 21 can be fed to the first and second test slots 411, 421, and the first and second coarse positioners 61, 64 can confirm the first The electronic products in the two test slots 411 and 421 are coarsely positioned, and the detecting unit 7 electrically detects the electronic products 22 in the first and second test slots 411 and 421, and The classification unit 8 is classified by the controller 51 to classify the electronic products 21 in the first and second test slots 411 and 421, and the carrier unit 4 cooperates with the above-mentioned feeding, coarse positioning, detection, and classification detection steps. The first and second test slots 411 and 421 are disposed at the first and second carrier groups 41 and 42 at an angle of 90°, so that the electronic products 21 of the plurality of first and second carrier groups 41 and 42 are simultaneously Performing four steps of feeding, rough positioning, detecting, and sorting. When the above four detecting steps are completed, press the button to rotate the first and second carrying groups 41 and 42 by 90°, and then execute the above. 4 detection steps, so that each detection step continues uninterrupted work, does not cause the device to be vacant and wastes time waiting, which can improve the detection speed.

此外,本發明人計算了該使用者將該電子產品21投入該承載單元4的時間與裝置內各個單元的工作時間後,設置了兩組承載組來加快進料速度,再配合該第一、二承載組41、42同使用一組搬移組81來進行分類工作,並且該搬移組81可將吸取該電子產品21移動並放置於該載具中,以快速的前往下一道製程,本裝置確實能以最快的的速度來完成電性檢測的工作,並將有瑕疵的電子產品21挑出。In addition, the inventors calculated that the user inputs the electronic product 21 into the carrying unit 4 and the working time of each unit in the device, and then sets two sets of carrying groups to speed up the feeding speed, and then cooperate with the first, The two carrying groups 41 and 42 use the same moving group 81 for sorting work, and the moving group 81 can move the electronic product 21 and place it in the vehicle to quickly go to the next process, and the device does The electrical inspection work can be completed at the fastest speed, and the defective electronic products 21 can be picked out.

由上述說明可知,本新型測試裝置確實具有以下優點:It can be seen from the above description that the new test device does have the following advantages:

一、增加檢測的精細度First, increase the fineness of detection

該較佳實施例之第一、二粗定位偵測器61、64,搭配該第一、二微定位器73、76來達到高解析的位置偵測,可增加該第一、二檢測器72、75之檢測精細度,以符合當前電子產品高規格的電性測試。The first and second coarse position detectors 61 and 64 of the preferred embodiment are matched with the first and second micro positioners 73 and 76 to achieve high resolution position detection, and the first and second detectors 72 can be added. , 75 detection fineness, in line with the current electrical specifications of high-level electrical products.

二、減少設備的等待時間Second, reduce equipment waiting time

該承載單元4使用概呈圓形且可驅動旋轉之分度盤,並於該分度盤上以90°的角度分別設置4個測試槽,可以同時進行進料、 粗定位、檢測,及分類的工作,且該分度盤旋轉90°後即可再進行4道檢測步驟,使裝置上的設備不閒置,而造成時間的浪費。The carrying unit 4 uses an indexing disk that is substantially circular and can drive rotation, and four test slots are respectively arranged on the indexing plate at an angle of 90°, and can be fed simultaneously. The operation of rough positioning, detection, and classification, and the indexing disc is rotated by 90°, then four detection steps can be performed, so that the equipment on the device is not idle, resulting in waste of time.

三、獲得最快的檢測速度Third, get the fastest detection speed

承上所述,本新型不僅大幅減少裝置中各設備的等待時間,還設計了兩組承載組來加快該電子產品21的進料速度,並於粗定位及檢測步驟後,該分類單元8可分別將兩組承載組上的電子產品21進行分類,且能將測試良好之電子產品21放置於該良品區22之載具上以前往下一道製程,本裝置確實能將該電子產品21快速完成檢測工作並且挑出不良品。As described above, the present invention not only greatly reduces the waiting time of each device in the device, but also designs two sets of load-bearing groups to speed up the feeding speed of the electronic product 21, and after the coarse positioning and detecting steps, the sorting unit 8 can The electronic products 21 on the two sets of carrying groups are respectively classified, and the well-tested electronic products 21 can be placed on the carrier of the good product area 22 to go to the next process, and the device can quickly complete the electronic product 21 Detect work and pick out defective products.

綜上所述,本新型分別使用4個第一、二測試槽411、421以90°的角度分別設置於該第一、二乘載組41、42上,並於該第一、二乘載組41、42之上下左右的方向可同時進行進料、粗定位、檢測,及分類的4道檢測程序,並於該第一、二乘載組41、42旋轉90°後再次執行上述4道檢測程序,使設備不會產生空置的狀況,且整合兩組乘載組的承載單元4可加快進料速度,搭配該分類單元8可挑出瑕疵品且排列正常的電子產品21,使該複數電子產品21能確實執行檢測工作並快速移動到下一道製程,故確實能夠達到本新型之目的。In summary, the present invention uses four first and second test slots 411, 421 to be respectively disposed on the first and second carrier groups 41, 42 at an angle of 90°, and is used in the first and second passenger carriers. The upper and lower directions of the groups 41 and 42 can simultaneously perform four detection procedures of feeding, rough positioning, detection, and classification, and execute the above four lanes after the first and second carrier groups 41 and 42 are rotated by 90°. The detection program is such that the device does not generate a vacant condition, and the carrier unit 4 integrating the two sets of the carrier groups can speed up the feeding speed, and the classification unit 8 can pick out the defective and arranged electronic products 21 to make the plural The electronic product 21 can surely perform the inspection work and move quickly to the next process, so that the purpose of the present invention can be achieved.

惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及新型說明內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。However, the above description is only a preferred embodiment of the present invention, and the scope of the present invention cannot be limited thereto, that is, the simple equivalent change and modification made by the novel patent application scope and the novel description content, All remain within the scope of this new patent.

22‧‧‧良品區22‧‧‧Good area

23‧‧‧壞品區23‧‧‧Defective area

4‧‧‧承載單元4‧‧‧ Carrying unit

41‧‧‧第一承載組41‧‧‧First Bearer Group

42‧‧‧第二承載組42‧‧‧Second carrier group

5‧‧‧控制單元5‧‧‧Control unit

51‧‧‧控制器51‧‧‧ Controller

52‧‧‧顯示器52‧‧‧ display

6‧‧‧定位單元6‧‧‧ Positioning unit

61‧‧‧第一粗定位偵測器61‧‧‧First coarse positioning detector

62‧‧‧第一進料偵測器62‧‧‧First Feed Detector

63‧‧‧第一料號辨識器63‧‧‧First Item Number Identifier

64‧‧‧第二粗定位偵測器64‧‧‧Second coarse positioning detector

65‧‧‧第二進料偵測器65‧‧‧Second feed detector

66‧‧‧第二料號辨識器66‧‧‧Second item number identifier

7‧‧‧測試單元7‧‧‧Test unit

71‧‧‧第一測試座71‧‧‧First test stand

72‧‧‧第一檢測器72‧‧‧First detector

73‧‧‧第一微定位器73‧‧‧First Micro Positioner

74‧‧‧第二測試座74‧‧‧Second test seat

75‧‧‧第二檢測器75‧‧‧Second detector

76‧‧‧第二微定位器76‧‧‧Second Micro Locator

8‧‧‧分類單元8‧‧‧Classification unit

81‧‧‧搬移組81‧‧‧Transfer group

811‧‧‧搬移座811‧‧‧moving seat

812‧‧‧吸取件812‧‧‧Sucker

813‧‧‧移動件813‧‧‧Mobile parts

814‧‧‧轉向件814‧‧‧Steering parts

Claims (10)

一種測試裝置,適用於對複數電子產品進行電性測試,並依據檢測結果將該電子產品搬移至一良品區及一壞品區,該測試裝置包含:一承載單元,包括一具有複數用以承載該電子產品之第一測試槽的第一承載組;一定位單元,包括一設置於該承載單元上並可偵測該電子產品位於該第一測試槽中位置的第一粗定位偵測器;一測試單元,包括一設置於該承載單元上並可相對該承載單元移動之第一測試座、一設置於該第一測試座上並可與該電子產品作接觸測試的第一檢測器;一控制單元,包括一與該第一檢測組電性連接之控制器,該控制器可儲存該第一檢測器之電性檢測資料;及一分類單元,包括一與該控制器電性連接之搬移組,該搬移組是受該控制器之控制並且依據電性檢測資料將該第一測試槽上之電子產品搬移至該良品區或該壞品區。 A test device is suitable for electrically testing a plurality of electronic products, and moving the electronic product to a good product area and a bad product area according to the detection result, the testing device comprises: a carrying unit, comprising a plurality of a first load-bearing group of the first test slot of the electronic product; a positioning unit comprising a first coarse position detector disposed on the load-bearing unit and detecting the position of the electronic product in the first test slot; a test unit includes a first test socket disposed on the load bearing unit and movable relative to the load bearing unit, a first detector disposed on the first test socket and capable of being in contact with the electronic product; The control unit includes a controller electrically connected to the first detection group, the controller can store electrical detection data of the first detector, and a classification unit including a mobile connection with the controller The moving group is controlled by the controller and moves the electronic product on the first test slot to the good product area or the bad product area according to the electrical detection data. 依據申請專利範圍第1項所述之測試裝置,其中,該第一承載組為一概呈圓形且可驅動旋轉之分度盤,該複數第一測試槽是間隔地設置於該第一承載組之周緣上,當該第一承載組轉動時可使該複數第一測試槽變換於該定位單元及該測試單元下的位置。 According to the test device of claim 1, wherein the first carrier group is a circular disk that can be driven to rotate, and the plurality of first test slots are spaced apart from the first carrier group. The plurality of first test slots can be converted to the position of the positioning unit and the test unit when the first carrier group is rotated. 依據申請專利範圍第2項所述之測試裝置,其中,該定位單元更包括一設置於該第一承載組下方的第一進料偵測器,而每一第一測試槽開設有一第一檢測孔,該第一進料偵測器可透過該第一檢測孔偵測該電子產品是否有放置於該第一測試槽上。 According to the test device of claim 2, the positioning unit further includes a first feed detector disposed under the first load group, and each first test slot has a first detection The first feeding detector can detect whether the electronic product is placed on the first test slot through the first detecting hole. 依據申請專利範圍第3項所述之測試裝置,其中,該測試單元更包括一設置於該第一測試座上之第一微定位器,該第一微定位器與該控制器電性連接可進一步偵測位於下方第一測試槽中之電子產品的精確位置,並將所偵測的結果回饋給該控制器,以決定該第一檢測器是否與該電子產品作接觸測試。 The test device of claim 3, wherein the test unit further comprises a first micro locator disposed on the first test pedestal, the first micro locator being electrically connected to the controller Further detecting the precise position of the electronic product located in the first test slot below, and feeding back the detected result to the controller to determine whether the first detector is in contact test with the electronic product. 依據申請專利範圍第4項所述之測試裝置,其中,該搬移組具有一設置於該第一承載組上方之搬移座、一設置於該搬移座下端且可吸取該電子產品之吸取件,及一與該搬移座連接之移動件,該移動件移動該搬移座將該吸取件移動至該第一測試槽的電子產品上,並依據電性檢測資料將該電子產品搬移至該良品區或該壞品區。 The test device of claim 4, wherein the transfer group has a transfer seat disposed above the first load group, a suction member disposed at a lower end of the transfer seat and absorbing the electronic product, and a moving member connected to the moving seat, the moving member moves the moving seat to move the suction member to the electronic product of the first test slot, and moves the electronic product to the good product area according to the electrical detection data or Bad goods area. 依據申請專利範圍第5項所述之測試裝置,其中,該搬移組更具有一設置於該搬移座與該吸取件中間之轉向件,當該吸取件吸取該第一測試槽上之電子產品時,該轉向件可以將該吸取件及該電子產品旋轉轉向。 The test device of claim 5, wherein the moving group further has a steering member disposed between the moving seat and the suction member, when the suction member absorbs the electronic product on the first test slot. The steering member can steer the suction member and the electronic product. 依據申請專利範圍第6項所述之測試裝置,其中,該定位單元更包括一位於該第一承載組上方且與該控制器電性連接之第一料號辨識器,該第一料號辨識器可偵測 位於該第一測試槽之電子產品種類,並將偵測結果回饋至該控制器。 According to the test device of claim 6, wherein the positioning unit further includes a first item identifier located above the first carrier group and electrically connected to the controller, the first item number identification Detectable The type of electronic product located in the first test slot, and the detection result is fed back to the controller. 依據申請專利範圍第7項所述之測試裝置,其中,該控制單元更包括一與該控制器電性連接之顯示器,用以顯示該複數電子產品的測試結果。 The test device of claim 7, wherein the control unit further comprises a display electrically connected to the controller for displaying the test result of the plurality of electronic products. 依據申請專利範圍第8項所述之測試裝置,其中,該第一粗定位偵測器為一可擷取該電子產品的圖像之圖像擷取器,並具有一可比對該電子產品的圖像且與該控制器電性連接之第一定位晶片,用以確認該電子產品放置於該第一測試槽上的位置並回饋至該控制器。 According to the test device of claim 8, wherein the first coarse positioning detector is an image capturing device capable of capturing an image of the electronic product, and has a comparable electronic product. And a first positioning chip electrically connected to the controller to confirm that the electronic product is placed on the first test slot and fed back to the controller. 依據申請專利範圍第9項所述之測試裝置,其中,該承載單元更包括一間隔對應該第一承載組並具有複數用以承載該電子產品之第二測試槽的第二承載組,該定位單元更包括一間隔對應該第一粗定位偵測器之第二粗定位偵測器、一間隔對應該第一進料偵測器之第二進料偵測器,及一間隔對應該第一料號辨識器之第二料號辨識器,該測試單元更包括一間隔對應該第一測試座之第二測試座、一間隔對應該第一檢測器之第二檢測器,及一間隔對應該第一微定位器之第二微定位器,該控制器可儲存該第二檢測器之電性檢測資料,該搬移組也受該控制器之控制並且依據電性檢測資料將該第二測試槽上之電子產品搬移至該良品區或該壞品區。 The test apparatus of claim 9, wherein the bearer unit further comprises a second load group corresponding to the first load group and having a plurality of second test slots for carrying the electronic product, the positioning The unit further includes a second coarse positioning detector corresponding to the first coarse positioning detector, a second feeding detector corresponding to the first feeding detector, and an interval corresponding to the first feeding detector. a second item identifier of the item number identifier, the test unit further comprising a second test seat spaced apart from the first test socket, a second detector corresponding to the first detector, and a spacing corresponding to the interval a second micro locator of the first micro locator, the controller can store electrical detection data of the second detector, the shift group is also controlled by the controller and the second test slot is determined according to the electrical detection data The electronic product on the product is moved to the good product area or the bad product area.
TW103221931U 2014-12-10 2014-12-10 Testing apparatus TWM500894U (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI621192B (en) * 2016-08-17 2018-04-11 詳維科技股份有限公司 A chip appearance inspection device and method
TWI636270B (en) * 2017-12-08 2018-09-21 昀業科技有限公司 Continuous automatic detection equipment
TWI667807B (en) * 2018-03-21 2019-08-01 英穩達科技股份有限公司 Intelligent classification system and method for solar cell

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI621192B (en) * 2016-08-17 2018-04-11 詳維科技股份有限公司 A chip appearance inspection device and method
TWI636270B (en) * 2017-12-08 2018-09-21 昀業科技有限公司 Continuous automatic detection equipment
TWI667807B (en) * 2018-03-21 2019-08-01 英穩達科技股份有限公司 Intelligent classification system and method for solar cell

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