TWI637144B - 用於決定實質上圓柱狀鏡面反射表面的形狀之方法 - Google Patents
用於決定實質上圓柱狀鏡面反射表面的形狀之方法 Download PDFInfo
- Publication number
- TWI637144B TWI637144B TW103139801A TW103139801A TWI637144B TW I637144 B TWI637144 B TW I637144B TW 103139801 A TW103139801 A TW 103139801A TW 103139801 A TW103139801 A TW 103139801A TW I637144 B TWI637144 B TW I637144B
- Authority
- TW
- Taiwan
- Prior art keywords
- reflection
- target
- data
- target structure
- shape
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 126
- 239000011521 glass Substances 0.000 claims description 135
- 239000000463 material Substances 0.000 claims description 20
- 238000007496 glass forming Methods 0.000 claims description 13
- 230000008569 process Effects 0.000 claims description 9
- 238000011144 upstream manufacturing Methods 0.000 claims description 7
- 239000006060 molten glass Substances 0.000 claims description 5
- 238000011143 downstream manufacturing Methods 0.000 claims description 2
- 238000002844 melting Methods 0.000 description 16
- 230000008018 melting Effects 0.000 description 16
- 239000000156 glass melt Substances 0.000 description 13
- 238000002156 mixing Methods 0.000 description 12
- 238000007670 refining Methods 0.000 description 12
- 238000000611 regression analysis Methods 0.000 description 12
- 238000012545 processing Methods 0.000 description 10
- 230000015572 biosynthetic process Effects 0.000 description 8
- 230000009467 reduction Effects 0.000 description 8
- 238000004364 calculation method Methods 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 6
- 230000005484 gravity Effects 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- 230000002123 temporal effect Effects 0.000 description 6
- 230000009466 transformation Effects 0.000 description 6
- 230000001105 regulatory effect Effects 0.000 description 5
- 230000003750 conditioning effect Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 239000005357 flat glass Substances 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 230000004927 fusion Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000003286 fusion draw glass process Methods 0.000 description 2
- 229910052735 hafnium Inorganic materials 0.000 description 2
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 235000012149 noodles Nutrition 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 241000238876 Acari Species 0.000 description 1
- 241000218645 Cedrus Species 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011449 brick Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- PXXKQOPKNFECSZ-UHFFFAOYSA-N platinum rhodium Chemical compound [Rh].[Pt] PXXKQOPKNFECSZ-UHFFFAOYSA-N 0.000 description 1
- HWLDNSXPUQTBOD-UHFFFAOYSA-N platinum-iridium alloy Chemical compound [Ir].[Pt] HWLDNSXPUQTBOD-UHFFFAOYSA-N 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000011819 refractory material Substances 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 238000003283 slot draw process Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B17/00—Forming molten glass by flowing-out, pushing-out, extruding or drawing downwardly or laterally from forming slits or by overflowing over lips
- C03B17/06—Forming glass sheets
- C03B17/064—Forming glass sheets by the overflow downdraw fusion process; Isopipes therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361908277P | 2013-11-25 | 2013-11-25 | |
| US61/908,277 | 2013-11-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201522906A TW201522906A (zh) | 2015-06-16 |
| TWI637144B true TWI637144B (zh) | 2018-10-01 |
Family
ID=53180042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103139801A TWI637144B (zh) | 2013-11-25 | 2014-11-17 | 用於決定實質上圓柱狀鏡面反射表面的形狀之方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9835442B2 (enExample) |
| JP (2) | JP2017501951A (enExample) |
| KR (1) | KR102216118B1 (enExample) |
| CN (1) | CN105764860B (enExample) |
| TW (1) | TWI637144B (enExample) |
| WO (1) | WO2015077113A1 (enExample) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014079478A1 (en) | 2012-11-20 | 2014-05-30 | Light In Light Srl | High speed laser processing of transparent materials |
| EP2754524B1 (de) | 2013-01-15 | 2015-11-25 | Corning Laser Technologies GmbH | Verfahren und Vorrichtung zum laserbasierten Bearbeiten von flächigen Substraten, d.h. Wafer oder Glaselement, unter Verwendung einer Laserstrahlbrennlinie |
| EP2781296B1 (de) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Vorrichtung und verfahren zum ausschneiden von konturen aus flächigen substraten mittels laser |
| US9815730B2 (en) | 2013-12-17 | 2017-11-14 | Corning Incorporated | Processing 3D shaped transparent brittle substrate |
| US9676167B2 (en) | 2013-12-17 | 2017-06-13 | Corning Incorporated | Laser processing of sapphire substrate and related applications |
| US20150165560A1 (en) | 2013-12-17 | 2015-06-18 | Corning Incorporated | Laser processing of slots and holes |
| US10293436B2 (en) | 2013-12-17 | 2019-05-21 | Corning Incorporated | Method for rapid laser drilling of holes in glass and products made therefrom |
| US11556039B2 (en) | 2013-12-17 | 2023-01-17 | Corning Incorporated | Electrochromic coated glass articles and methods for laser processing the same |
| US10442719B2 (en) | 2013-12-17 | 2019-10-15 | Corning Incorporated | Edge chamfering methods |
| US9701563B2 (en) | 2013-12-17 | 2017-07-11 | Corning Incorporated | Laser cut composite glass article and method of cutting |
| US9850160B2 (en) | 2013-12-17 | 2017-12-26 | Corning Incorporated | Laser cutting of display glass compositions |
| EP3166895B1 (en) | 2014-07-08 | 2021-11-24 | Corning Incorporated | Methods and apparatuses for laser processing materials |
| US10335902B2 (en) | 2014-07-14 | 2019-07-02 | Corning Incorporated | Method and system for arresting crack propagation |
| CN107073641B (zh) | 2014-07-14 | 2020-11-10 | 康宁股份有限公司 | 接口块；用于使用这种接口块切割在波长范围内透明的衬底的系统和方法 |
| CN208586209U (zh) | 2014-07-14 | 2019-03-08 | 康宁股份有限公司 | 一种用于在工件中形成限定轮廓的多个缺陷的系统 |
| EP3552753A3 (en) * | 2014-07-14 | 2019-12-11 | Corning Incorporated | System for and method of processing transparent materials using laser beam focal lines adjustable in length and diameter |
| US10047001B2 (en) | 2014-12-04 | 2018-08-14 | Corning Incorporated | Glass cutting systems and methods using non-diffracting laser beams |
| KR20170105562A (ko) | 2015-01-12 | 2017-09-19 | 코닝 인코포레이티드 | 다중 광자 흡수 방법을 사용한 열적 템퍼링된 기판의 레이저 절단 |
| JP7292006B2 (ja) | 2015-03-24 | 2023-06-16 | コーニング インコーポレイテッド | ディスプレイガラス組成物のレーザ切断及び加工 |
| KR20170131638A (ko) | 2015-03-27 | 2017-11-29 | 코닝 인코포레이티드 | 가스 투과성 유리창 및 이의 제작방법 |
| WO2017011296A1 (en) | 2015-07-10 | 2017-01-19 | Corning Incorporated | Methods of continuous fabrication of holes in flexible substrate sheets and products relating to the same |
| CN109311725B (zh) | 2016-05-06 | 2022-04-26 | 康宁股份有限公司 | 从透明基材激光切割及移除轮廓形状 |
| US10410883B2 (en) | 2016-06-01 | 2019-09-10 | Corning Incorporated | Articles and methods of forming vias in substrates |
| US10794679B2 (en) | 2016-06-29 | 2020-10-06 | Corning Incorporated | Method and system for measuring geometric parameters of through holes |
| WO2018022476A1 (en) | 2016-07-29 | 2018-02-01 | Corning Incorporated | Apparatuses and methods for laser processing |
| EP3507057A1 (en) | 2016-08-30 | 2019-07-10 | Corning Incorporated | Laser processing of transparent materials |
| KR102078294B1 (ko) | 2016-09-30 | 2020-02-17 | 코닝 인코포레이티드 | 비-축대칭 빔 스폿을 이용하여 투명 워크피스를 레이저 가공하기 위한 기기 및 방법 |
| EP3529214B1 (en) | 2016-10-24 | 2020-12-23 | Corning Incorporated | Substrate processing station for laser-based machining of sheet-like glass substrates |
| US10752534B2 (en) | 2016-11-01 | 2020-08-25 | Corning Incorporated | Apparatuses and methods for laser processing laminate workpiece stacks |
| US10688599B2 (en) | 2017-02-09 | 2020-06-23 | Corning Incorporated | Apparatus and methods for laser processing transparent workpieces using phase shifted focal lines |
| US11078112B2 (en) | 2017-05-25 | 2021-08-03 | Corning Incorporated | Silica-containing substrates with vias having an axially variable sidewall taper and methods for forming the same |
| US10580725B2 (en) | 2017-05-25 | 2020-03-03 | Corning Incorporated | Articles having vias with geometry attributes and methods for fabricating the same |
| US10626040B2 (en) | 2017-06-15 | 2020-04-21 | Corning Incorporated | Articles capable of individual singulation |
| EP3460760B1 (en) * | 2017-09-26 | 2021-05-19 | Dassault Systèmes | Generating a 2d drawing representing a mechanical part |
| US12180108B2 (en) | 2017-12-19 | 2024-12-31 | Corning Incorporated | Methods for etching vias in glass-based articles employing positive charge organic molecules |
| US11554984B2 (en) | 2018-02-22 | 2023-01-17 | Corning Incorporated | Alkali-free borosilicate glasses with low post-HF etch roughness |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009070262A1 (en) * | 2007-11-30 | 2009-06-04 | Corning Incorporated | Method of and apparatus for detecting change in shape of a moving substrate |
| CN101813460A (zh) * | 2009-02-24 | 2010-08-25 | 康宁股份有限公司 | 镜面反射表面的形状测量 |
| TW201231914A (en) * | 2010-12-13 | 2012-08-01 | Asahi Glass Co Ltd | Surface shape evaluating method and surface shape evaluating device |
| US20130098109A1 (en) * | 2010-06-15 | 2013-04-25 | Asahi Glass Company, Limited | Shape measuring device, shape measuring method, and glass plate manufacturing method |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2534170B2 (ja) * | 1991-07-11 | 1996-09-11 | 三菱電機株式会社 | 鏡面形状測定装置 |
| US5753931A (en) | 1995-07-13 | 1998-05-19 | Nike, Inc. | Object imaging device and method using line striping |
| US6690474B1 (en) | 1996-02-12 | 2004-02-10 | Massachusetts Institute Of Technology | Apparatus and methods for surface contour measurement |
| US6556783B1 (en) | 1997-01-16 | 2003-04-29 | Janet L. Gelphman | Method and apparatus for three dimensional modeling of an object |
| JP3411829B2 (ja) * | 1997-07-02 | 2003-06-03 | 旭硝子株式会社 | 表面形状の評価方法および評価装置 |
| US6262803B1 (en) | 1998-09-10 | 2001-07-17 | Acuity Imaging, Llc | System and method for three-dimensional inspection using patterned light projection |
| DE19855478B4 (de) * | 1998-12-01 | 2006-01-12 | Steinbichler Optotechnik Gmbh | Verfahren und Vorrichtung zur optischen Erfassung einer Kontrastlinie |
| ATE292784T1 (de) | 1999-04-30 | 2005-04-15 | Christoph Dr Wagner | Verfahren zur optischen formerfassung von gegenständen |
| DE102004020419B3 (de) | 2004-04-23 | 2005-10-20 | 3D Shape Gmbh | Verfahren und Vorrichtung zur Bestimmung der Form und der lokalen Oberflächennormalen spiegelnder Oberflächen |
| EP1907791A4 (en) * | 2005-07-27 | 2009-12-23 | Corning Inc | DEVICE AND METHOD FOR MEASURING A GLASS SHEET |
| US20070140311A1 (en) | 2005-12-20 | 2007-06-21 | House Keith L | Method and apparatus for characterizing a glass ribbon |
| CN1945204A (zh) * | 2006-10-19 | 2007-04-11 | 上海大学 | 镜面物体表面三维轮廓测量装置和方法 |
| US8090194B2 (en) * | 2006-11-21 | 2012-01-03 | Mantis Vision Ltd. | 3D geometric modeling and motion capture using both single and dual imaging |
| US7471383B2 (en) * | 2006-12-19 | 2008-12-30 | Pilkington North America, Inc. | Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging |
| US8284392B2 (en) | 2007-03-13 | 2012-10-09 | 3D-Shape Gmbh | Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects |
| US8402785B2 (en) * | 2007-11-09 | 2013-03-26 | Corning Incorporated | Method and apparatus for measuring surface shape profile |
| FR2930030B1 (fr) | 2008-04-11 | 2012-12-28 | Visuol Technologies | Dispositif de controle de la qualite d'une surface |
| US7920257B2 (en) | 2008-08-27 | 2011-04-05 | Corning Incorporated | Systems and methods for determining the shape of glass sheets |
| US7710558B2 (en) | 2008-09-11 | 2010-05-04 | Litesentry Corporation | Automated online measurement of glass part geometry |
| US8432395B2 (en) | 2009-06-16 | 2013-04-30 | Apple Inc. | Method and apparatus for surface contour mapping |
| WO2011047008A1 (en) * | 2009-10-14 | 2011-04-21 | Corning Incorporated | Method and apparatus for controlling sheet thickness |
| BRPI1000301B1 (pt) | 2010-01-27 | 2017-04-11 | Photonita Ltda | dispositivo óptico para medição e identificação de superfícies cilíndricas por deflectometria aplicado para identificação balística |
| FR2958404B1 (fr) * | 2010-04-01 | 2012-04-27 | Saint Gobain | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
-
2014
- 2014-11-13 CN CN201480064286.8A patent/CN105764860B/zh active Active
- 2014-11-13 WO PCT/US2014/065399 patent/WO2015077113A1/en not_active Ceased
- 2014-11-13 KR KR1020167016285A patent/KR102216118B1/ko active Active
- 2014-11-13 JP JP2016530920A patent/JP2017501951A/ja active Pending
- 2014-11-13 US US15/037,178 patent/US9835442B2/en not_active Expired - Fee Related
- 2014-11-17 TW TW103139801A patent/TWI637144B/zh active
-
2019
- 2019-09-20 JP JP2019171279A patent/JP6808002B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009070262A1 (en) * | 2007-11-30 | 2009-06-04 | Corning Incorporated | Method of and apparatus for detecting change in shape of a moving substrate |
| CN101813460A (zh) * | 2009-02-24 | 2010-08-25 | 康宁股份有限公司 | 镜面反射表面的形状测量 |
| US20130098109A1 (en) * | 2010-06-15 | 2013-04-25 | Asahi Glass Company, Limited | Shape measuring device, shape measuring method, and glass plate manufacturing method |
| TW201231914A (en) * | 2010-12-13 | 2012-08-01 | Asahi Glass Co Ltd | Surface shape evaluating method and surface shape evaluating device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2017501951A (ja) | 2017-01-19 |
| JP2020019706A (ja) | 2020-02-06 |
| CN105764860B (zh) | 2019-01-11 |
| KR20160090325A (ko) | 2016-07-29 |
| US9835442B2 (en) | 2017-12-05 |
| CN105764860A (zh) | 2016-07-13 |
| WO2015077113A1 (en) | 2015-05-28 |
| US20160290791A1 (en) | 2016-10-06 |
| KR102216118B1 (ko) | 2021-02-17 |
| TW201522906A (zh) | 2015-06-16 |
| JP6808002B2 (ja) | 2021-01-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI637144B (zh) | 用於決定實質上圓柱狀鏡面反射表面的形狀之方法 | |
| JP6027673B2 (ja) | 鏡面反射面の形状測定 | |
| US11953446B2 (en) | System and method for processing multiple loose gemstones using image-based analysis techniques | |
| TWI855187B (zh) | 缺陷分類方法、缺陷分類裝置以及玻璃物品的製造方法 | |
| EP3009905B1 (en) | Glass container inspection machine with a graphic user interface | |
| CN118379525B (zh) | 一种基于智能图像处理的透镜缺陷检测方法 | |
| JP5686139B2 (ja) | 液晶表示パネル用ガラス基板の製造方法 | |
| WO2015014067A1 (zh) | 液晶屏的质量检测方法、装置及设备 | |
| EP3088840B1 (en) | Shape measuring device, shape measuring method, and glass plate manufacturing method | |
| US11733685B2 (en) | Surface inspection method using mold surface inspection device | |
| CN108445020A (zh) | 一种玻璃基板缺陷聚集识别方法 | |
| CN104180772A (zh) | 一种视觉检测装置 | |
| TWI653426B (zh) | 用於確定實質圓柱鏡面反射表面之形狀的方法 | |
| KR102625796B1 (ko) | 유리 시트를 검사하는 방법, 유리 시트를 제조 하는 방법 및 유리 제조 장치 | |
| WO2008085160A1 (en) | System and method for inspection of films | |
| JP2022022465A (ja) | ガラス傷消し方法、傷消し監視装置、および傷消し監視プログラム | |
| CN120279320A (zh) | 一种浮法玻璃微观波纹度在线实时检测方法 | |
| JP2010019679A (ja) | 基板表面欠陥検出方法および検出装置 | |
| JPH07113968B2 (ja) | 照明条件決定支援装置および方法 |