KR102216118B1 - 실질적인 원통형의 정반사성 반사 표면의 형상을 결정하는 방법 - Google Patents
실질적인 원통형의 정반사성 반사 표면의 형상을 결정하는 방법 Download PDFInfo
- Publication number
- KR102216118B1 KR102216118B1 KR1020167016285A KR20167016285A KR102216118B1 KR 102216118 B1 KR102216118 B1 KR 102216118B1 KR 1020167016285 A KR1020167016285 A KR 1020167016285A KR 20167016285 A KR20167016285 A KR 20167016285A KR 102216118 B1 KR102216118 B1 KR 102216118B1
- Authority
- KR
- South Korea
- Prior art keywords
- reflection
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- data
- target structure
- reflective surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000000034 method Methods 0.000 title claims abstract description 111
- 238000012937 correction Methods 0.000 claims abstract description 37
- 239000011521 glass Substances 0.000 claims description 127
- 239000000463 material Substances 0.000 claims description 19
- 238000007496 glass forming Methods 0.000 claims description 16
- 230000008569 process Effects 0.000 claims description 12
- 239000006060 molten glass Substances 0.000 claims description 7
- 238000011143 downstream manufacturing Methods 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 description 21
- 230000004927 fusion Effects 0.000 description 13
- 239000000156 glass melt Substances 0.000 description 13
- 238000012545 processing Methods 0.000 description 12
- 238000000611 regression analysis Methods 0.000 description 12
- 238000002844 melting Methods 0.000 description 10
- 230000008018 melting Effects 0.000 description 10
- 238000005352 clarification Methods 0.000 description 9
- 238000011084 recovery Methods 0.000 description 8
- 238000004458 analytical method Methods 0.000 description 6
- 238000013459 approach Methods 0.000 description 6
- 230000005484 gravity Effects 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- 230000009466 transformation Effects 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 4
- 230000003750 conditioning effect Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 238000013019 agitation Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 238000003286 fusion draw glass process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 239000011819 refractory material Substances 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Inorganic materials O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011449 brick Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000005816 glass manufacturing process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- PXXKQOPKNFECSZ-UHFFFAOYSA-N platinum rhodium Chemical compound [Rh].[Pt] PXXKQOPKNFECSZ-UHFFFAOYSA-N 0.000 description 1
- HWLDNSXPUQTBOD-UHFFFAOYSA-N platinum-iridium alloy Chemical compound [Ir].[Pt] HWLDNSXPUQTBOD-UHFFFAOYSA-N 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- -1 refractory (eg Substances 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000003283 slot draw process Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B17/00—Forming molten glass by flowing-out, pushing-out, extruding or drawing downwardly or laterally from forming slits or by overflowing over lips
- C03B17/06—Forming glass sheets
- C03B17/064—Forming glass sheets by the overflow downdraw fusion process; Isopipes therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P40/00—Technologies relating to the processing of minerals
- Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361908277P | 2013-11-25 | 2013-11-25 | |
| US61/908,277 | 2013-11-25 | ||
| PCT/US2014/065399 WO2015077113A1 (en) | 2013-11-25 | 2014-11-13 | Methods for determining a shape of a substantially cylindrical specular reflective surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160090325A KR20160090325A (ko) | 2016-07-29 |
| KR102216118B1 true KR102216118B1 (ko) | 2021-02-17 |
Family
ID=53180042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167016285A Active KR102216118B1 (ko) | 2013-11-25 | 2014-11-13 | 실질적인 원통형의 정반사성 반사 표면의 형상을 결정하는 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9835442B2 (enExample) |
| JP (2) | JP2017501951A (enExample) |
| KR (1) | KR102216118B1 (enExample) |
| CN (1) | CN105764860B (enExample) |
| TW (1) | TWI637144B (enExample) |
| WO (1) | WO2015077113A1 (enExample) |
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| EP2754524B1 (de) | 2013-01-15 | 2015-11-25 | Corning Laser Technologies GmbH | Verfahren und Vorrichtung zum laserbasierten Bearbeiten von flächigen Substraten, d.h. Wafer oder Glaselement, unter Verwendung einer Laserstrahlbrennlinie |
| EP2781296B1 (de) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Vorrichtung und verfahren zum ausschneiden von konturen aus flächigen substraten mittels laser |
| US9815730B2 (en) | 2013-12-17 | 2017-11-14 | Corning Incorporated | Processing 3D shaped transparent brittle substrate |
| US9676167B2 (en) | 2013-12-17 | 2017-06-13 | Corning Incorporated | Laser processing of sapphire substrate and related applications |
| US11556039B2 (en) | 2013-12-17 | 2023-01-17 | Corning Incorporated | Electrochromic coated glass articles and methods for laser processing the same |
| US20150165560A1 (en) | 2013-12-17 | 2015-06-18 | Corning Incorporated | Laser processing of slots and holes |
| US9850160B2 (en) | 2013-12-17 | 2017-12-26 | Corning Incorporated | Laser cutting of display glass compositions |
| US9517963B2 (en) | 2013-12-17 | 2016-12-13 | Corning Incorporated | Method for rapid laser drilling of holes in glass and products made therefrom |
| US10442719B2 (en) | 2013-12-17 | 2019-10-15 | Corning Incorporated | Edge chamfering methods |
| US9701563B2 (en) | 2013-12-17 | 2017-07-11 | Corning Incorporated | Laser cut composite glass article and method of cutting |
| CN106687419A (zh) | 2014-07-08 | 2017-05-17 | 康宁股份有限公司 | 用于激光处理材料的方法和设备 |
| EP3169635B2 (en) | 2014-07-14 | 2025-11-12 | 4JET microtech GmbH | Method and system for forming perforations |
| KR20170028943A (ko) | 2014-07-14 | 2017-03-14 | 코닝 인코포레이티드 | 조정가능한 레이저 빔 촛점 라인을 사용하여 투명한 재료를 처리하는 방법 및 시스템 |
| US10335902B2 (en) | 2014-07-14 | 2019-07-02 | Corning Incorporated | Method and system for arresting crack propagation |
| JP6788571B2 (ja) | 2014-07-14 | 2020-11-25 | コーニング インコーポレイテッド | 界面ブロック、そのような界面ブロックを使用する、ある波長範囲内で透過する基板を切断するためのシステムおよび方法 |
| US10047001B2 (en) | 2014-12-04 | 2018-08-14 | Corning Incorporated | Glass cutting systems and methods using non-diffracting laser beams |
| CN107406293A (zh) | 2015-01-12 | 2017-11-28 | 康宁股份有限公司 | 使用多光子吸收方法来对经热回火的基板进行激光切割 |
| JP7292006B2 (ja) | 2015-03-24 | 2023-06-16 | コーニング インコーポレイテッド | ディスプレイガラス組成物のレーザ切断及び加工 |
| CN107666983B (zh) | 2015-03-27 | 2020-10-02 | 康宁股份有限公司 | 可透气窗及其制造方法 |
| US11186060B2 (en) | 2015-07-10 | 2021-11-30 | Corning Incorporated | Methods of continuous fabrication of holes in flexible substrate sheets and products relating to the same |
| KR20220078719A (ko) | 2016-05-06 | 2022-06-10 | 코닝 인코포레이티드 | 투명 기판들로부터의 윤곽 형상들의 레이저 절단 및 제거 |
| US10410883B2 (en) | 2016-06-01 | 2019-09-10 | Corning Incorporated | Articles and methods of forming vias in substrates |
| US10794679B2 (en) | 2016-06-29 | 2020-10-06 | Corning Incorporated | Method and system for measuring geometric parameters of through holes |
| WO2018022476A1 (en) | 2016-07-29 | 2018-02-01 | Corning Incorporated | Apparatuses and methods for laser processing |
| US10522963B2 (en) | 2016-08-30 | 2019-12-31 | Corning Incorporated | Laser cutting of materials with intensity mapping optical system |
| US10730783B2 (en) | 2016-09-30 | 2020-08-04 | Corning Incorporated | Apparatuses and methods for laser processing transparent workpieces using non-axisymmetric beam spots |
| US11542190B2 (en) | 2016-10-24 | 2023-01-03 | Corning Incorporated | Substrate processing station for laser-based machining of sheet-like glass substrates |
| US10752534B2 (en) | 2016-11-01 | 2020-08-25 | Corning Incorporated | Apparatuses and methods for laser processing laminate workpiece stacks |
| US10688599B2 (en) | 2017-02-09 | 2020-06-23 | Corning Incorporated | Apparatus and methods for laser processing transparent workpieces using phase shifted focal lines |
| US10580725B2 (en) | 2017-05-25 | 2020-03-03 | Corning Incorporated | Articles having vias with geometry attributes and methods for fabricating the same |
| US11078112B2 (en) | 2017-05-25 | 2021-08-03 | Corning Incorporated | Silica-containing substrates with vias having an axially variable sidewall taper and methods for forming the same |
| US10626040B2 (en) | 2017-06-15 | 2020-04-21 | Corning Incorporated | Articles capable of individual singulation |
| EP3460760B1 (en) * | 2017-09-26 | 2021-05-19 | Dassault Systèmes | Generating a 2d drawing representing a mechanical part |
| US12180108B2 (en) | 2017-12-19 | 2024-12-31 | Corning Incorporated | Methods for etching vias in glass-based articles employing positive charge organic molecules |
| US11554984B2 (en) | 2018-02-22 | 2023-01-17 | Corning Incorporated | Alkali-free borosilicate glasses with low post-HF etch roughness |
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| JP2534170B2 (ja) * | 1991-07-11 | 1996-09-11 | 三菱電機株式会社 | 鏡面形状測定装置 |
| US5753931A (en) | 1995-07-13 | 1998-05-19 | Nike, Inc. | Object imaging device and method using line striping |
| US6690474B1 (en) | 1996-02-12 | 2004-02-10 | Massachusetts Institute Of Technology | Apparatus and methods for surface contour measurement |
| US6556783B1 (en) | 1997-01-16 | 2003-04-29 | Janet L. Gelphman | Method and apparatus for three dimensional modeling of an object |
| JP3411829B2 (ja) * | 1997-07-02 | 2003-06-03 | 旭硝子株式会社 | 表面形状の評価方法および評価装置 |
| US6262803B1 (en) | 1998-09-10 | 2001-07-17 | Acuity Imaging, Llc | System and method for three-dimensional inspection using patterned light projection |
| DE19855478B4 (de) * | 1998-12-01 | 2006-01-12 | Steinbichler Optotechnik Gmbh | Verfahren und Vorrichtung zur optischen Erfassung einer Kontrastlinie |
| JP2002543411A (ja) | 1999-04-30 | 2002-12-17 | ワグナー,クリストフ | 物体形状の光学的検出方法 |
| DE102004020419B3 (de) | 2004-04-23 | 2005-10-20 | 3D Shape Gmbh | Verfahren und Vorrichtung zur Bestimmung der Form und der lokalen Oberflächennormalen spiegelnder Oberflächen |
| JP5469340B2 (ja) * | 2005-07-27 | 2014-04-16 | コーニング インコーポレイテッド | シート状ガラスを測定するための装置及び方法 |
| US20070140311A1 (en) * | 2005-12-20 | 2007-06-21 | House Keith L | Method and apparatus for characterizing a glass ribbon |
| CN1945204A (zh) * | 2006-10-19 | 2007-04-11 | 上海大学 | 镜面物体表面三维轮廓测量装置和方法 |
| US8090194B2 (en) * | 2006-11-21 | 2012-01-03 | Mantis Vision Ltd. | 3D geometric modeling and motion capture using both single and dual imaging |
| US7471383B2 (en) * | 2006-12-19 | 2008-12-30 | Pilkington North America, Inc. | Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging |
| US8284392B2 (en) | 2007-03-13 | 2012-10-09 | 3D-Shape Gmbh | Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects |
| US8402785B2 (en) * | 2007-11-09 | 2013-03-26 | Corning Incorporated | Method and apparatus for measuring surface shape profile |
| WO2009070262A1 (en) * | 2007-11-30 | 2009-06-04 | Corning Incorporated | Method of and apparatus for detecting change in shape of a moving substrate |
| FR2930030B1 (fr) | 2008-04-11 | 2012-12-28 | Visuol Technologies | Dispositif de controle de la qualite d'une surface |
| US7920257B2 (en) | 2008-08-27 | 2011-04-05 | Corning Incorporated | Systems and methods for determining the shape of glass sheets |
| US7710558B2 (en) | 2008-09-11 | 2010-05-04 | Litesentry Corporation | Automated online measurement of glass part geometry |
| US8441532B2 (en) * | 2009-02-24 | 2013-05-14 | Corning Incorporated | Shape measurement of specular reflective surface |
| US8432395B2 (en) | 2009-06-16 | 2013-04-30 | Apple Inc. | Method and apparatus for surface contour mapping |
| KR101835157B1 (ko) * | 2009-10-14 | 2018-03-06 | 코닝 인코포레이티드 | 시트 두께 제어 방법 및 그 장치 |
| BRPI1000301B1 (pt) | 2010-01-27 | 2017-04-11 | Photonita Ltda | dispositivo óptico para medição e identificação de superfícies cilíndricas por deflectometria aplicado para identificação balística |
| FR2958404B1 (fr) * | 2010-04-01 | 2012-04-27 | Saint Gobain | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
| KR20130090326A (ko) * | 2010-06-15 | 2013-08-13 | 아사히 가라스 가부시키가이샤 | 형상 측정 장치, 형상 측정 방법 및 유리판의 제조 방법 |
| JP2012127675A (ja) * | 2010-12-13 | 2012-07-05 | Asahi Glass Co Ltd | 表面形状の評価方法および評価装置 |
-
2014
- 2014-11-13 JP JP2016530920A patent/JP2017501951A/ja active Pending
- 2014-11-13 WO PCT/US2014/065399 patent/WO2015077113A1/en not_active Ceased
- 2014-11-13 CN CN201480064286.8A patent/CN105764860B/zh active Active
- 2014-11-13 KR KR1020167016285A patent/KR102216118B1/ko active Active
- 2014-11-13 US US15/037,178 patent/US9835442B2/en not_active Expired - Fee Related
- 2014-11-17 TW TW103139801A patent/TWI637144B/zh active
-
2019
- 2019-09-20 JP JP2019171279A patent/JP6808002B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP6808002B2 (ja) | 2021-01-06 |
| US9835442B2 (en) | 2017-12-05 |
| TWI637144B (zh) | 2018-10-01 |
| WO2015077113A1 (en) | 2015-05-28 |
| CN105764860B (zh) | 2019-01-11 |
| US20160290791A1 (en) | 2016-10-06 |
| KR20160090325A (ko) | 2016-07-29 |
| JP2020019706A (ja) | 2020-02-06 |
| CN105764860A (zh) | 2016-07-13 |
| JP2017501951A (ja) | 2017-01-19 |
| TW201522906A (zh) | 2015-06-16 |
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