TWI632373B - Fixture platform - Google Patents

Abstract

The utility model relates to a fixture platform, which is suitable for a thimble test fixture, the thimble test fixture has a concave portion and a plurality of pinholes, the pinholes are disposed in the concave portion and penetrate the thimble test fixture, and the fixture platform comprises a base and a plurality of fixing frames , an adjustment platform and at least one adjustment component. The base is used to provide a thimble test fixture placement. The mounting brackets are spaced apart from the base, and the upper surfaces of the mounting brackets are used to provide a bottom surface contact of the recess of the thimble test fixture. The adjusting platform is movably disposed between the fixing frames, and the height of the adjusting platform is smaller than the heights of the fixing frames, and the plurality of thimbles respectively pass through the pinholes of the thimble test fixture to expose the pinholes and offset Adjust the upper surface of the platform. The adjusting component is disposed under the adjusting platform to link and adjust the lifting and lowering of the adjusting platform.

Description

Fixture platform

The invention relates to a fixture platform, in particular to a fixture platform matched with a thimble test fixture.

With the development of technology, electronic products are widely used in daily life, and before the sale of electronic products to the market, complete product testing will be carried out at the factory or inspection unit, especially for printed circuit boards (PCBs). When the upper electronic component is functionally tested, it is necessary to carry out subsequent electrical tests by using various test fixtures.

Traditionally, thimble test fixtures have to be designed with corresponding thimble slots for different thimbles to ensure that each thimble maintains the ends at the same level when the thimble test fixture is exposed, and finally The thimble is soldered to the printed circuit board from the back of the thimble test fixture. However, the matching of the slot design of the thimble test fixture and the appearance of the thimble has its own special characteristics. If the thimble of different appearances is replaced for functional test, the original thimble test fixture cannot be adapted, and the corresponding thimble test fixture must be re-created. The new thimble test fixture, the thimble test fixture has low compatibility with various thimbles, resulting in prolonged test time and high test cost.

In addition, if you use the universal thimble test fixture for functional testing, the ejector pin slot must be changed to a through hole to fit the ejector pins of different shapes, although the compatibility of the thimble test fixture with various thimbles is improved. However, the ejector pin slot of the thimble test fixture cannot be used to fix the thimble, which increases the probability of unevenness of the thimble during welding, and causes poor contact between the thimble and the electronic component during testing, thereby affecting the accuracy of the test.

Therefore, how to solve the problem of unevenness of the thimble when the thimble is soldered to the printed circuit board, and at the same time improve the adaptability of the thimble test fixture and various thimbles is one of the current important topics.

In view of the above problems, the object of the present invention is to provide a jig platform which can cooperate with various thimble test fixtures and improve the adaptability with various thimbles, and avoid the problem of unevenness during thimble welding, thereby optimizing the electronic The test effect of the component.

To achieve the above object, the present invention provides a fixture platform suitable for use with a thimble test fixture, the thimble test fixture has a concave portion and a plurality of pinholes, the pinholes are disposed in the concave portion and penetrate the thimble test fixture, and the fixture platform The utility model comprises a base, a plurality of fixing frames, an adjusting platform and at least one adjusting component. The base is used to provide a thimble test fixture placement. The mounting brackets are spaced apart from the base, and the upper surfaces of the mounting brackets are used to provide a bottom surface contact of the recess of the thimble test fixture. The adjusting platform is movably disposed between the fixing frames, and the height of the adjusting platform is smaller than the heights of the fixing frames, and the plurality of thimbles respectively pass through the pinholes of the thimble test fixture to expose the pinholes and offset Adjust the upper surface of the platform. The adjusting component is disposed under the adjusting platform to link and adjust the lifting and lowering of the adjusting platform.

In an embodiment, each of the adjusting components is a gasket or a spacer, and each of the adjusting components is disposed between the base and the adjusting platform to separate the adjusting platform from the base.

In one embodiment, each of the adjusting components is a screw or a stud, and each of the adjusting components passes through the base and abuts against a lower surface of the adjusting platform, and each of the adjusting components drives the adjusting platform to move toward the base or the recess.

In an embodiment, the lower surface of the adjustment platform has at least one recessed hole, and the recessed hole is disposed corresponding to each of the adjustment elements.

In an embodiment, the distance between the upper surface of the adjustment platform and the upper surface of the holders is 1 to 5 mm.

In one embodiment, each of the mounting brackets includes at least one magnetic component corresponding to at least one magnetic component or at least one metal component of the thimble test fixture for securing the thimble test fixture.

In one embodiment, each of the fixing frames includes at least one fastening structure, and the fastening structure corresponds to the outer shape of the thimble test fixture or the at least one fastening structure for fixing the thimble test fixture.

In an embodiment, the upper surface of the adjustment platform is a plane, and the adjustment platform is in contact with each of the holders.

In an embodiment, the adjustment platform has a convex structure toward the surface of the fixing frame, and each of the fixing frames has a sliding groove structure corresponding to the convex structure toward the surface of the adjusting platform.

In one embodiment, the adjustment platform has a chute structure facing the surfaces of the mounts, and each of the mounts has a bump structure corresponding to the chute structure toward the surface of the adjustment platform.

According to the above, the fixture platform of the present invention places the thimble test fixture on the base, and then the plurality of thimbles are respectively disposed and exposed to the pinholes of the thimble test fixture, so that the thimbles are abutted against the adjustment platform. The upper surface is used to achieve horizontal alignment of the ends of the thimbles. In addition, the length of the ejector pins can be controlled and adjusted by adjusting the components and adjusting the lifting and lowering of the adjustment platform. The fixture platform of the invention can solve the problem that the thimbles are uneven when the thimble is soldered to the printed circuit board, so that the ends of the thimbles are horizontally aligned, the defects of the universal thimble test fixture are improved, and the thimble test fixture is added. Adaptability to various thimbles to optimize the test results of electronic components.

1, 1a, 1b‧‧‧ fixture platform

11‧‧‧Base

12‧‧‧ Fixing frame

121, 33‧‧‧ magnetic components

13‧‧‧Adjustment platform

131‧‧‧ recessed hole

14, 15‧‧‧ Adjusting components

3, 3a, 3b‧‧‧ thimble test fixture

31‧‧‧ recess

32‧‧‧ pinhole

4‧‧‧ thimble

5, 5a, 5b‧‧‧ printed circuit board

D, D1, D2, D3, D4‧‧‧ distance

d, d1, d2, d3, d4‧‧‧ length

1 is a side cross-sectional view of a jig platform of the present invention.

2 is a side cross-sectional view showing the combination of the jig platform, the thimble test fixture and the thimble of the present invention.

3A to 3C are schematic views showing the operation of the jig platform of the present invention.

4A and 4B are side cross-sectional views showing an embodiment of an adjusting member of the present invention.

5A and 5B are side cross-sectional views showing another embodiment of the adjusting member of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a jig platform according to a preferred embodiment of the present invention will be described with reference to the accompanying drawings, wherein the same elements will be described with the same reference numerals.

Please refer to FIG. 1 , FIG. 2 and FIG. 3B , FIG. 1 is a side cross-sectional view of the jig platform of the present invention; FIG. 2 is a side cross-sectional view showing the jig platform, the thimble test jig and the thimble of the present invention.

The invention provides a fixture platform 1 suitable for matching with a thimble test fixture 3 As shown in FIG. 2, the thimble test fixture 3 has a recess 31 and a plurality of pinholes 32. The pinholes 32 are disposed in the recess 31 and penetrate the thimble test fixture 3, and a printed circuit board 5 is disposed on the thimble. Test fixture 3 above. Wherein, in the programming of the test, the pinholes 32 of the thimble test fixture 3 can be made into a through-hole structure to improve the adaptability with the various thimbles 4. Here, for the sake of simplicity, only three pinholes 32 are presented in parallel but not limited thereto. In practice, the number of pinholes 32 on the thimble test fixture 3 can be adjusted according to the design of the different printed circuit boards 5. And the arrangement is moderately adjusted.

The jig platform 1 includes a base 11, a plurality of fixing frames 12, an adjustment platform 13, and at least one adjusting member 14. The base 11 is used to provide a thimble test fixture 3 for placement. The mounting brackets 12 are disposed on the base 11 , and the upper surfaces of the mounting brackets are used to provide the bottom surface contact of the recesses 31 of the thimble test fixture 3 , that is, the upper surface of the mounting brackets 12 is ejector pins. The bottom surface of the recess 31 of 3. The adjustment platform 13 is movably disposed between the fixing frames 12, wherein the upper surface of the adjustment platform 13 is a flat surface, and the adjustment platform 13 is in contact with each of the fixing frames 12. In addition, the height of the adjustment platform 13 is smaller than the height of the fixing frames 12, and the plurality of thimbles 4 respectively pass through the pinholes 32 of the thimble test fixture 3 to expose the pinholes 32 and abut against the upper surface of the adjustment platform 13. The adjusting element 14 is disposed under the adjusting platform 13 and between the fixing frames 12 to connect and adjust the lifting and lowering of the adjusting platform 13 . Here, the two adjusting elements 14 are taken as an example, but are not limited thereto. By moving the adjustment platform 13 in the direction of the base 11 or the recess 31, the length d exposed by each of the thimbles 4 is controlled and adjusted. Finally, each of the thimbles 4 is soldered to the printed circuit board 5 above the thimble test fixture 3, and after the thimble test fixture 3 is demolded, a test printed circuit board 5 can be completed.

The fixture platform 1 of the present invention can make the thimbles 4 abut against the upper surface of the adjustment platform 13 to achieve the horizontal alignment of the ends of the thimbles 4, so that when the thimbles 4 are welded to the printed circuit board 5, the thimbles 4 are uneven. The problem is solved, the ends of the thimbles 4 are horizontally aligned with each other, the disadvantages of the universal thimble test fixture 3 are improved, the adaptability of the thimble test fixture 3 to the various thimbles 4 is increased, and the test effect of the electronic components is optimized.

The operation mode and the detailed structure of the jig platform of the present invention will be described in detail. Please refer to FIG. 3A to FIG. 3C simultaneously, and FIG. 3A to FIG. 3C are schematic diagrams showing the operation of the jig platform of the present invention.

As shown in FIG. 3A, the thimble test fixture 3 has a recess 31 and a plurality of pinholes. 32, the pinholes 32 are disposed in the recessed portion 31 and penetrate the thimble test fixture 3, and the pinholes 32 are used to guide the thimble 4 into the thimble test fixture 3, and the pinholes 32 can be made in the programming of the test. It is a through-hole structure to improve the fit with various thimbles 4. The printed circuit board 5 is disposed above the thimble test fixture 3. Here, for the sake of simplicity, only three pinholes 32 are presented in parallel but not limited thereto. In practice, the number of pinholes 32 on the thimble test fixture 3 can be adjusted according to the design of the different printed circuit boards 5. And the arrangement is moderately adjusted.

After the printed circuit board 5 is printed on the thimble test fixture 3, the two are flipped together by 180 degrees and placed on the jig platform 1 so that the bottom surface of the recess 31 of the thimble test fixture 3 contacts the upper surface of the holder 12. That is, the upper surface of the holder 12 abuts against the bottom surface of the recess 31 of the thimble test fixture 3. Each of the fixing frames 12 includes at least one magnetic component 121 corresponding to at least one magnetic component 33 or at least one metal component (not shown) of the thimble test fixture 3 for fixing the thimble test fixture 3 at On the fixture platform 1, for the subsequent processing. In addition, for the thimble test fixture 3 which is not provided with the magnetic component 33 or the metal component, each of the fixing brackets 12 can be designed to include at least one fastening structure (not shown), and the fastening structure on the fixing frame 12 and The outer shape of the thimble test fixture 3 or the at least one fastening structure (not shown) on the thimble test fixture 3 corresponds to the thimble test fixture 3. Specifically, the outer shape of the thimble test fixture 3 is fitted or fixed by the fastening structure on the fixing frame 12, or the corresponding structure of the thimble test fixture 3 is fixed by the fastening structure on the fixing frame 12. The thimble test fixture 3 is coupled and fixed on the jig platform 1 to facilitate subsequent processing.

As shown in FIG. 3B , the adjustment platform 13 is movably disposed between the fixing frames 12 , and the height of the adjustment platform 13 is smaller than the height of the fixing frames 12 , and the adjusting component 14 is disposed on the fixing frames 12 . In order to connect and adjust the lifting and lowering of the adjustment platform 13. In this case, the adjusting element 14 is exemplified by two screws or studs, but the adjusting element 14 can be a related mechanism for driving the lifting platform 13 to be lifted and lowered, and each of the adjusting elements 14 is inserted through the base 11 and is offset. The lower surface of the platform 13 is adjusted, and each of the adjusting elements 14 drives the adjustment platform 13 to move toward the base 11 or the recess 31.

In addition, the upper surface of the adjustment platform 13 is a plane, and the adjustment platform 13 is in contact with each of the fixing frames 12, and the adjustment platform 13 and each of the fixing frames 12 can have corresponding sliders and slides. a slot mechanism for increasing the group between the adjustment platform 13 and each of the holders 12 Stable. The adjustment platform 13 has a convex structure toward the surface of the fixing frame 12, and each of the fixing frames 12 has a sliding groove structure (not shown) corresponding to the convex structure toward the surface of the adjusting platform 13. In addition, according to the design of the structure, the adjustment platform 13 has a sliding groove structure toward the surface of the fixing frame 12, and each of the fixing frames 12 has a convex corresponding to the sliding groove structure toward the surface of the adjusting platform 13. Block structure. The adjustment of the assembly stability between the adjustment platform 13 and each of the fixing frames 12 can be increased by adjusting the platform 13 and each of the fixing frames 12, and the adjustment platform 13 can be added. The stability of motion between each of the holders 12. Therefore, the adjustment platform 13 can be moved by the adjustment member 14 toward the recess 11 of the base 11 or the thimble test fixture 3, and maintain the level of the upper surface of the adjustment platform 13 during the movement so that the upper surface of the adjustment platform 13 is adjusted. A vertical distance D is formed between the bottom surface of the recess 31 of the thimble test fixture 3, and the distance D controls the length d of the thimble 4 exposed to the pinholes 32 of the thimble test fixture 3. The distance D between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3 is 1 to 5 mm. In actual operation, the upper surface of the fixing frame 12 abuts against the bottom surface of the recess 31 of the thimble test fixture 3, so the vertical distance between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3 is separated. D, which is equivalent to the vertical distance between the upper surface of the adjustment platform 13 and the upper surface of the fixing frame 12, which can control and calculate the length of the pin holes 32 of the thimble 4 exposed to the thimble test fixture 3. d. Further, the distance between the upper surface of the adjustment platform 13 and the upper surfaces of the holders 12 is 1 to 5 mm.

When the adjustment of the distance D between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3 is completed, the plurality of thimbles 4 are respectively passed through the thimble test fixture 3 and the printed circuit fixed on the jig platform 1. The plate 5 guides the thimble 4 into the thimble test fixture 3 and abuts against the upper surface of the adjustment platform 13 by the pinholes 32 penetrating the thimble test fixture 3. At this time, the thimble 4 exposed to the pinholes 32 is limited by the distance D between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3, so that the thimbles 4 exposed to the pinholes 32 are exposed. The length d is equal to the distance D between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3, whereby the exposed length d of the thimble 4 is controlled. After the adjustment platform 13 is moved in the direction of the base 11 or the recess 31, the length d of each of the thimbles 4 is controlled and adjusted, and then the thimble 4 is welded to the printed circuit board 5.

Finally, as shown in FIG. 3C, when the ejector pins 4 and the thimble test fixture 3 are above After the printed circuit board 5 is soldered, the thimble test fixture 3 is demolded to complete a printed circuit board 5 having a test electrical function.

4A to FIG. 5B, FIG. 4A and FIG. 4B are schematic side cross-sectional views showing an embodiment of the adjusting component of the present invention, and FIGS. 5A and 5B are side cross-sectional views of another embodiment of the adjusting component of the present invention. See the schematic.

Each of the adjusting elements 14 shown in FIG. 4A and FIG. 4B is a screw or a stud. Here, a screw or a stud is taken as an example, but the number and arrangement thereof are not limited thereto. Each of the adjusting elements 14 passes through the base 11 and abuts against the lower surface of the adjusting platform 13 . Each of the adjusting elements 14 drives the adjusting platform 13 to move toward the base 11 or the recess 31 , thereby controlling the upper surface of the adjusting platform 13 . The distance D1, D2 between the bottom surfaces of the recesses 31 of the thimble test fixture 3a and the lengths d1, d2 of the thimbles 4 of the pinholes 32 exposed to the thimble test fixture 3a. Further, the adjustment platform 13 shown in FIG. 4A is disposed and in contact with the upper surface of the base 11, and the distance D1 between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3a is the maximum value. At the same time, the length d1 of the thimble 4 of the pinholes 32 exposed to the thimble test fixture 3a is also the maximum value. 4B, the adjusting member 14 drives the adjustment platform 13 to move in the direction of the concave portion 31 of the thimble test fixture 3a. At this time, the distance D2 between the upper surface of the adjustment platform 13 and the bottom surface of the concave portion 31 of the thimble test fixture 3a is slowly When the size is reduced, the length d2 of the thimble 4 exposed to the pinholes 32 is gradually shortened. In addition, the adjusting component 14 of the embodiment can be designed according to the lengths d1 and d2 of the ejector pins 4 to be exposed of the printed circuit board 5a, and the distance D1 between the adjusting platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3a can be arbitrarily adjusted. D2, in turn, controls and adjusts the lengths d1, d2 at which the ejector pins 4 are exposed. The distances D1 and D2 between the upper surface of the adjustment stage 13 and the bottom surface of the recess 31 of the thimble test fixture 3a are in the range of 1 to 5 mm. In addition, the lower surface of the adjustment platform 13 may further have at least one recessed hole 131, and the recessed hole 131 is disposed corresponding to each of the adjusting elements 14 , and by the arrangement of the recessed holes 131 , the screw or the stud can be lifted and lowered by the adjusting platform 13 . During the process, the stability of the adjustment platform 13 can be improved.

Each of the adjusting elements 15 shown in FIG. 5A and FIG. 5B is a spacer or a pad. Here, two spacers or pads are taken as an example, but the number, thickness and arrangement thereof are not limited thereto. Each of the adjusting elements 15 is disposed between the base 11 and the adjusting platform 13 to separate the adjusting platform 13 from the base 11, thereby controlling the upper surface of the adjusting platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3b. The distances D3, D4 and the lengths d3, d4 of the thimbles 4 of the pinholes 32 exposed to the thimble test fixture 3b. Further, the adjustment platform 13 shown in FIG. 5A is disposed and in contact with the upper surface of the base 11, and the distance D3 between the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3b is the maximum value. At the same time, the length d3 of the thimble 4 of the pinholes 32 exposed to the thimble test fixture 3b is also the maximum value. 5B, the adjustment elements 15 are disposed between the base 11 and the adjustment platform 13, separating the adjustment platform 13 from the base 11, and the upper surface of the adjustment platform 13 and the bottom surface of the recess 31 of the thimble test fixture 3b. The distance D4 between them is reduced, and the length d4 of the thimble 4 exposed to the pinholes 32 is also shortened. In addition, the adjusting component 15 of the embodiment can further adjust the thickness of the spacer or the pad according to the lengths d3 and d4 of the ejector pins 4 required for the printed circuit board 5b, thereby controlling the concave portion of the adjusting platform 13 and the thimble test fixture 3b. The distances D3, D4 between the bottom faces of 31 and the length d of each thimble 4 exposed. The distances D3 and D4 between the upper surface of the adjustment stage 13 and the bottom surface of the recess 31 of the thimble test fixture 3b are in the range of 1 to 5 mm.

In summary, the jig platform of the present invention combines the thimble test fixture with the printed circuit board, flips it 180 degrees, and then places the two together on the base, and then allows the plurality of thimbles to be respectively worn and exposed to the thimble test. The pinholes of the jig are such that the thimbles abut against the upper surface of the adjustment platform to achieve horizontal alignment of the ends of the thimbles. In addition, by adjusting the component connection and adjusting the lifting and lowering of the adjustment platform, the distance between the upper surface of the adjustment platform and the bottom surface of the concave portion of the thimble test fixture and the thimble length of the pinholes exposed to the thimble test fixture are controlled. .

The fixture platform of the invention can solve the problem that the thimbles are uneven when the thimble is soldered to the printed circuit board, so that the ends of the thimbles are horizontally aligned with each other, the defects of the universal thimble test fixture are improved, and the thimble test is increased. It has adaptability to various thimbles to optimize the test results of electronic components.

The above is intended to be illustrative only and not limiting. Any equivalent modifications or alterations to the spirit and scope of the invention are intended to be included in the scope of the appended claims.

Claims (10)

The utility model relates to a fixture platform, which is suitable for a thimble test fixture, the thimble test fixture has a concave portion and a plurality of pinholes, the pinholes are disposed in the concave portion and penetrate the thimble test fixture, and a printed circuit board is disposed on the Above the thimble test fixture, the fixture platform comprises: a base for providing the thimble test fixture placement; a plurality of fixing brackets disposed on the base, the upper surface of the fixtures for providing the thimble test The bottom surface of the recess of the jig is in contact; an adjusting platform is movably disposed between the fixing frames, and the height of the adjusting platform is smaller than the height of the fixing frames, and the plurality of thimbles respectively pass the printed circuit board and the The pinholes of the thimble test fixture expose the pinholes and abut the upper surface of the adjustment platform, and the thimbles are fixed to the printed circuit board; and at least one adjusting component is disposed under the adjustment platform To link and adjust the lift of the adjustment platform. The fixture platform of claim 1, wherein each of the adjustment components is a gasket or a spacer, and each of the adjustment components is disposed between the base and the adjustment platform, so that the adjustment platform and the base Separation. The fixture platform of claim 1, wherein each of the adjustment components is a screw or a stud, and each of the adjustment components passes through the base and abuts against a lower surface of the adjustment platform, and the adjustment components The adjustment platform is moved toward the base or the recess. The fixture platform of claim 3, wherein the lower surface of the adjustment platform has at least one recessed hole, and the recessed hole is disposed corresponding to each of the adjustment elements. The jig platform of claim 1, wherein a distance between an upper surface of the adjustment platform and an upper surface of the fixing frame is 1 to 5 mm. The jig platform of claim 1, wherein each of the fixing frames comprises at least one magnetic component corresponding to at least one magnetic component or at least one metal component of the thimble test fixture for fixing the thimble Test Fixture. The fixture platform of claim 1, wherein each of the fixtures comprises at least one fastening structure, the fastening structure corresponding to the shape of the thimble test fixture or at least one fastening structure, Fix the thimble test fixture. The fixture platform of claim 1, wherein the upper surface of the adjustment platform is a plane, and the adjustment platform is in contact with each of the fixtures. The fixture platform of claim 1, wherein the adjustment platform has a convex structure facing the surface of the fixing frame, and each of the fixing frames faces the surface of the adjusting platform and has a structure corresponding to the protruding structure Corresponding to a chute structure. The fixture platform of claim 1, wherein the adjustment platform has a sliding groove structure toward the surface of the fixing frame, and each of the fixing frames faces the surface of the adjusting platform and has a structure corresponding to the sliding groove structure. Corresponding to a bump structure.