TWI627400B - Defective rejection method for passive component batch detection and rejection system thereof - Google Patents

Defective rejection method for passive component batch detection and rejection system thereof Download PDF

Info

Publication number
TWI627400B
TWI627400B TW106112028A TW106112028A TWI627400B TW I627400 B TWI627400 B TW I627400B TW 106112028 A TW106112028 A TW 106112028A TW 106112028 A TW106112028 A TW 106112028A TW I627400 B TWI627400 B TW I627400B
Authority
TW
Taiwan
Prior art keywords
defect
passive component
component
passive
detection
Prior art date
Application number
TW106112028A
Other languages
Chinese (zh)
Other versions
TW201837455A (en
Inventor
qing-zhang Zheng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW106112028A priority Critical patent/TWI627400B/en
Application granted granted Critical
Publication of TWI627400B publication Critical patent/TWI627400B/en
Publication of TW201837455A publication Critical patent/TW201837455A/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

一種被動元件批次式檢測之缺陷品剔除方法及其剔除系統,該方法包括:首先提供一承載並黏著有多個被動元件的膠帶載體;其次進行該些被動元件的缺陷檢測,以獲得包括至少一被動元件缺陷品位置的一檢測資訊;繼而進行至少一被動元件缺陷品之剔除,以一缺陷品剔除系統解析該檢測資訊,並自動地將對應的被動元件缺陷品自該膠帶載體移除,藉以完全自動化整個被動元件缺陷剔除過程,改善剔除效率及剔除正確率。 A defective component rejection method for passive component batch detection and a rejection system thereof, the method comprising: first providing a tape carrier carrying and adhering a plurality of passive components; and secondly performing defect detection of the passive components to obtain at least a detection information of the position of the defective component defect; then performing at least one passive component defect rejection, analyzing the detection information by a defect rejection system, and automatically removing the corresponding passive component defect from the tape carrier, In order to fully automate the entire passive component defect rejection process, the rejection efficiency is improved and the correct rate is eliminated.

Description

被動元件批次式檢測之缺陷品剔除方法及其剔除系統 Defective rejection method for passive component batch detection and its rejection system

本發明係一種被動元件批次式檢測之缺陷品剔除方法及其剔除系統,特別是有關於一種可根據檢測結果,自動地進行一個或多個被動元件缺陷品排除剔除方法及其剔除系統。 The invention relates to a defect rejection method for a passive component batch detection and a rejection system thereof, and particularly relates to a method for automatically eliminating one or more passive component defect elimination and rejection and a rejection system thereof according to the detection result.

目前對於電子元件檢測後的缺陷剔除方案,大多是應用於單排式輸送帶上,主要係將待測的電子元件置放於該單排式輸送帶的載盤上,並在該單排式輸送帶的行進方向的先後,分別設置缺陷檢測裝置及缺陷剔除裝置,在進行缺陷檢測後,將缺陷品在輸送帶載盤的位置進行記錄,俟載有缺陷品的載盤輸送經該缺陷剔除裝置時,將該載盤上的電子元件吹離該單排式輸送帶。 At present, most of the defect rejection schemes for electronic component detection are applied to a single-row conveyor belt, mainly by placing the electronic components to be tested on the carrier of the single-row conveyor belt, and in the single row type. The defect detection device and the defect rejection device are respectively arranged in the traveling direction of the conveyor belt, and after the defect detection is performed, the defective product is recorded at the position of the conveyor belt carrier, and the carrier transport carrying the defective product is rejected by the defect. In the case of the device, the electronic components on the carrier are blown away from the single-row conveyor.

惟,上述的缺陷剔除裝置設計,對於同一載體上具有多個待測電子元件的承載結構,即無法適用,因為該載體上的多個電子元件,可能僅有少部分是缺陷品,此時前述之缺陷剔除裝並無法將之全數挑出而予以排除。也因此,目前在一載體上承置多個電子元件進行檢測後,僅能以人工方式逐一將缺陷品移離載體,因此在剔除效率及剔除正確率上,難以獲得改善。 However, the defect culling device described above is not applicable to a load-bearing structure having a plurality of electronic components to be tested on the same carrier, because a plurality of electronic components on the carrier may have only a small number of defective products. Defects are excluded and cannot be picked out and excluded. Therefore, after a plurality of electronic components are mounted on a carrier for detection, only the defective product can be manually removed from the carrier, so that it is difficult to obtain improvement in rejection efficiency and rejection accuracy.

本發明目的在於,應用一缺陷品剔除系統,藉由讀取並分析 經缺陷檢測後的檢測資訊,轉換其被動元件缺陷品的位置,並自動驅動該缺陷品剔除系統的機械結構,將該位置之被動元件缺陷品移離膠帶載體。 The object of the present invention is to apply a defect rejection system by reading and analyzing After the defect detection test information, the position of the passive component defect is converted, and the mechanical structure of the defect rejection system is automatically driven, and the passive component defect of the position is removed from the tape carrier.

本發明之被動元件缺陷品剔除方法的技術方案在於,本發明提供一種被動元件批次式檢測之缺陷品剔除方法,其步驟包括:提供一承載並以二維陣列排列或不規則排列方式黏著有該些被動元件的膠帶載體;進行該些被動元件的缺陷檢測,以獲得包括至少一具有缺陷之被動元件缺陷品所在位置的一檢測資訊;進行至少一被動元件缺陷品之剔除,以一缺陷品剔除系統解析該檢測資訊,並將對應的被動元件缺陷品自該膠帶載體移除。 The technical solution of the passive component defect rejection method of the present invention is that the present invention provides a defect rejection method for passive component batch detection, the steps of which include: providing a carrier and adhering in a two-dimensional array or an irregular arrangement a tape carrier of the passive components; performing defect detection of the passive components to obtain a detection information including at least one location of the defective component defect having defects; performing at least one passive component defect removal, to a defective product The reject system parses the detection information and removes the corresponding passive component defect from the tape carrier.

在一實施方式中,該缺陷品剔除系統係以一往復作動的頂針機構,撞擊該被動元件缺陷品,進而將該被動元件缺陷品移離該膠帶載體、該缺陷品剔除系統係以一吹氣氣嘴機構將該被動元件缺陷品吹離該膠帶載體,或以一吸氣氣嘴機構將該被動元件缺陷品吸離該膠帶載體。 In one embodiment, the defect rejection system is a reciprocating ejector mechanism that strikes the passive component defect, thereby moving the passive component defect away from the tape carrier, and the defect rejection system is blown. The nozzle mechanism blows the passive component defect away from the tape carrier or draws the passive component defect away from the tape carrier by an air suction nozzle mechanism.

在一實施例中,該膠帶載體黏著該被動元件的膠類為熱熔式膠,且該缺陷品剔除系統係以電熱式或UV光照式之局部加熱機構,對該對應的被動元件缺陷品黏著區域加熱或照射UV光線以解除黏著性,進而使該被動元件缺陷品脫離該膠帶載體。 In one embodiment, the adhesive tape of the adhesive tape adheres to the passive component is a hot melt adhesive, and the defective reject system is an electric heating or UV illumination local heating mechanism, and the corresponding passive component defect is adhered. The area heats or illuminates the UV light to relieve adhesion, thereby causing the passive component defect to detach from the tape carrier.

在一實施方式中,該缺陷品剔除系統更包含一刀刃,並在該被動元件缺陷品被移離該膠帶載體之前,預先以該刀刃將對應於該被動元件缺陷品之該膠帶載體的黏著位置劃出至少一開口,或是該缺陷品剔除系統更包含一雷射切割機構,並在該被動元件缺陷品被移離該膠帶載體之前,預先以該刀刃將對應於該被動元件缺陷品之該膠帶載體的黏著位置劃 出至少一開口。 In one embodiment, the defect rejection system further includes a blade, and the adhesive position of the tape carrier corresponding to the passive component defect is previously pre-cut by the blade before the passive component defect is removed from the tape carrier. Delineating at least one opening, or the defect rejection system further comprises a laser cutting mechanism, and before the passive component defect is removed from the tape carrier, the blade corresponds to the passive component defect Adhesive position of the tape carrier At least one opening.

在一實施方式中,該檢測資訊為影像或數值資料。 In an embodiment, the detection information is image or numerical data.

在一實施方式中,於該進行至少一被動元件缺陷品之剔除步驟之後,更包含一確保步驟,用以檢測該檢測資訊中的被動元件缺陷品位置的被動元件缺陷品是否全部剔除,或用以檢測該檢測資訊中除了該些被動元件缺陷品位置除外的被動元件是否有任一遭剔除。 In an embodiment, after the step of removing at least one passive component defect, the method further includes a securing step of detecting whether the passive component defect of the passive component defect location in the detection information is completely removed, or To detect whether any of the passive components except the location of the passive component defects in the detection information are rejected.

在一實施方式中,該缺陷品剔除系統係應用一多軸機械手臂或一多軸運動平台設備進行移動。 In one embodiment, the defect rejection system is moved using a multi-axis robotic arm or a multi-axis motion platform device.

本發明提供之種被動元件批次式檢測之缺陷品剔除系統,包括:一空間移動單元,用以依據一剔除指令而驅動一移動機構,使其在一3維空間座標之工作範圍內準確移動;一膠帶載體定位單元,用以將已進行批次式檢測之承載並黏著有多個被動元件的膠帶載體,對應定位於該工作範圍內;一元件脫離單元,係設置於該移動單元上並接受其輸送移動至具有缺陷之被動元件所在位置後,依據該剔除指令,用以將被動元件缺陷品自該膠帶載體移除;一輸入單元,用以讀取或接收經該批次式檢測該些被動元件後產出之一檢測資訊,該檢測資訊包括至少一具有缺陷之被動元件缺陷品的所在位置;一處理單元,係電性連接該輸入單元、該空間移動單元與該元件脫離單元,用以分析該檢測資訊,並據而將具有缺陷之被動元件缺陷品的所在位置轉換對應為該空間移動單元之該工作範圍的座標位置之後,產生該剔除指令,該剔除指令包含將該元件脫離單元移至對應的該工作範圍的座標位置的指令及使該元件脫離單元進行剔除動作的指令。 The invention provides a defective component rejection system for passive component batch detection, comprising: a space moving unit for driving a moving mechanism according to a culling command to accurately move within a working range of a 3-dimensional space coordinate; a tape carrier positioning unit for positioning a tape carrier that has been subjected to batch detection and having a plurality of passive components, correspondingly positioned within the working range; a component release unit is disposed on the mobile unit and After receiving the transport to the position of the passive component having the defect, the culling instruction is used to remove the passive component defect from the tape carrier; an input unit for reading or receiving the batch detection The passive component generates one of the detection information, the detection information includes a location of at least one defective component defect having a defect; a processing unit electrically connecting the input unit, the spatial mobile unit, and the component separation unit, For analyzing the detection information, and correspondingly converting the position of the defective component with defects into the space movement The culling command is generated after the coordinate position of the working range of the unit, and the culling command includes an instruction to move the component out of the cell to a coordinate position of the corresponding working range and an instruction to cause the component to be detached from the cell.

本發明特點在於,本發明可依據批次式的被動元件缺陷檢測 的檢測資訊,自動地進行被動元件缺陷品相對位置的分析,再以該缺陷品剔除系統的機械結構進行該被動元件缺陷品的剔除,整個被動元件缺陷剔除過程完全自動化,可改善剔除效率及剔除正確率。另外,本發明進一步地在缺陷品剔除系統對該被動元件缺陷品剔除後,進一步檢測在該批次被動元件缺陷品是否全部剔除或檢測該批次檢測資訊中除了該些被動元件缺陷品位置除外的被動元件是否有任一遭剔除,因而可確保自動化剔除的正確率。 The invention is characterized in that the invention can be based on batch type passive component defect detection The detection information automatically analyzes the relative position of the passive component defect, and then removes the passive component defect by the mechanical structure of the defect rejection system, and the entire passive component defect elimination process is completely automated, which can improve the rejection efficiency and eliminate Correct rate. In addition, the present invention further detects, after the defective product rejection system rejects the passive component defect, further detecting whether the passive component defect is completely rejected or detected in the batch detection information except the passive component defect location. Whether any of the passive components are rejected, thus ensuring the correct rate of automated rejection.

10‧‧‧膠帶載體 10‧‧‧ tape carrier

11‧‧‧膠層 11‧‧‧ glue layer

111‧‧‧熱熔式膠 111‧‧‧Hot melt adhesive

20‧‧‧被動元件 20‧‧‧ Passive components

21‧‧‧被動元件缺陷品 21‧‧‧ Passive component defects

30‧‧‧缺陷品剔除系統 30‧‧‧Defective reject system

301‧‧‧空間移動單元 301‧‧‧Space Mobile Unit

3011‧‧‧移動機構 3011‧‧‧Mobile agencies

3012‧‧‧工作範圍 3012‧‧‧Scope of work

302‧‧‧膠帶載體定位單元 302‧‧‧ Tape carrier positioning unit

303‧‧‧元件脫離單元 303‧‧‧Component separation unit

304‧‧‧輸入單元 304‧‧‧ input unit

305‧‧‧處理單元 305‧‧‧Processing unit

31‧‧‧頂針機構 31‧‧‧ thimble mechanism

32‧‧‧吹氣氣嘴機構 32‧‧‧Blowing nozzle mechanism

33‧‧‧吸氣氣嘴機構 33‧‧‧ Inhalation nozzle mechanism

34‧‧‧刀刃 34‧‧‧blade

341‧‧‧截面形狀 341‧‧‧section shape

35‧‧‧雷射切割機構 35‧‧‧Laser cutting mechanism

36‧‧‧電熱式局部加熱機構 36‧‧‧Electrical local heating mechanism

37‧‧‧UV光照式局部光照機構 37‧‧‧UV-illuminated local illumination mechanism

38‧‧‧開口 38‧‧‧ openings

A‧‧‧檢測資訊 A‧‧‧Test information

B‧‧‧剔除指令 B‧‧‧ omitting instructions

步驟S10~步驟S30‧‧‧被動元件批次式檢測之缺陷品剔除方法之步驟 Steps S10~Step S30‧‧‧Steps for rejecting defective parts of batch components

步驟S40‧‧‧被動元件批次式檢測之缺陷品剔除方法之確保步驟 Step S40‧‧‧Steps to ensure the defective product rejection method for passive component batch detection

圖1為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例的步驟流程圖;圖2為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之被動元件不規則排列方式黏著於膠帶載體並檢測出被動元件缺陷品的平面示意圖;圖3為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之被動元件二維陣列排列排列方式黏著於膠帶載體並檢測出被動元件缺陷品的平面示意圖;圖4為本發明之被動元件批次式檢測之缺陷品剔除系統一實施例之系統方塊示意圖;圖5為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以頂針機構將被動元件缺陷品移除的示意圖;圖6為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以吹氣 氣嘴機構將該被動元件缺陷品吹離該膠帶載體的示意圖;圖7為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以吸氣氣嘴機構將該被動元件缺陷品吸離該膠帶載體的示意圖;圖8為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以電熱式局部加熱機構去除被動元件缺陷品脫離膠帶載體的示意圖;圖9為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以光熱式局部加熱機構去除被動元件缺陷品脫離膠帶載體的示意圖;圖10為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以一刀刃預切開膠帶載體的黏著位置示意圖;圖11為圖10之切開膠帶載體的黏著位置的底面示意圖;圖12為本發明之被動元件批次式檢測之缺陷品剔除方法一實施例之以一雷射切割機構預切開膠帶載體的黏著位置示意圖。 1 is a flow chart of steps of an embodiment of a method for rejecting defective parts of a passive component of the present invention; FIG. 2 is an irregular part of a passive component rejection method for passive component batch detection according to the present invention; FIG. 3 is a plan view showing the passive component defect detection method of the passive component batch detection method according to the embodiment of the present invention; FIG. 3 is a passive component two-dimensional array arrangement arrangement method of the passive component batch detection method of the present invention. And a schematic diagram of a passive component defect is detected; FIG. 4 is a schematic block diagram of an embodiment of a passive component rejection system for passive component batch detection according to the present invention; FIG. 5 is a schematic diagram of a passive component batch detection defect of the present invention. FIG. 6 is a schematic diagram of a method for removing defective components of a passive component batch detection according to an embodiment of the present invention; FIG. A schematic diagram of the nozzle mechanism blowing the passive component defect away from the tape carrier; FIG. 7 is a schematic diagram of the passive component rejection method for passive component batch detection according to an embodiment of the present invention. FIG. 8 is a schematic diagram of a method for removing a defective component from a passive component batch detection method according to an embodiment of the present invention; FIG. 9 is a schematic diagram of removing an adhesive component from a tape carrier by an electrothermal local heating mechanism; The invention discloses a schematic diagram of the defective component rejection method of the passive component batch detection according to an embodiment. The schematic diagram of removing the passive component defect from the tape carrier by the photothermal local heating mechanism; FIG. 10 is a defect rejection of the passive component batch detection according to the present invention. FIG. 11 is a schematic view showing the bottom surface of the adhesive tape of the cutting tape carrier of FIG. 10; FIG. 12 is a schematic diagram of the defective component of the passive component batch detection according to the present invention; In one embodiment, a laser cutting mechanism pre-cuts the adhesive position of the tape carrier.

茲配合圖式將本發明實施例詳細說明如下,其所附圖式均為簡化之示意圖,僅以示意方式說明本發明之基本結構,因此在該等圖式中僅標示與本發明有關之元件,且所顯示之元件並非以實施時之數目、形狀、尺寸比例等加以繪製,其實際實施時之規格尺寸實為一種選擇性之設計,且其元件佈局形態有可能更為複雜。 The embodiments of the present invention are described in detail below with reference to the accompanying drawings, in which FIG. The components shown are not drawn in the number, shape, size ratio, etc. at the time of implementation, and the actual size of the implementation is a selective design, and the component layout form may be more complicated.

首先請參照圖1至圖5所示。本發明實施例之被動元件批次式檢測之缺陷品剔除方法,其步驟包括: First, please refer to FIG. 1 to FIG. 5. In the embodiment of the present invention, the defective component rejection method for the passive component batch detection includes the following steps:

步驟S10:提供一承載並黏著有多個被動元件20的膠帶載體10,其中該膠帶載體10至少一表面具有膠層11,且該些待檢測的被動元件 20係以二維陣列排列方式或不規則排列方式黏著於該膠帶載體10之該膠層11。 Step S10: providing a tape carrier 10 carrying and adhering a plurality of passive components 20, wherein at least one surface of the tape carrier 10 has a glue layer 11, and the passive components to be detected The 20 series is adhered to the adhesive layer 11 of the tape carrier 10 in a two-dimensional array arrangement or an irregular arrangement.

步驟S20:進行該些被動元件20的缺陷檢測,以測得包括至少一具有缺陷之被動元件缺陷品21的所在位置的一檢測資訊A,其中,所謂缺陷可以是不符合檢測標準的不良品,或是無法確認是否符合檢測標準的再確認,該些被動元件20的缺陷檢測可為一超音波缺陷檢測、外觀影像缺陷檢測或電性連接缺陷檢測等檢測設備,且經由上述缺陷檢測後所獲得的該檢測資訊A可為圖像式的影像資料或為數值資料。 Step S20: performing defect detection of the passive components 20 to detect a detection information A including at least one location of the defective passive component 21 having a defect, wherein the defect may be a defective product that does not meet the detection standard. Or, it is impossible to confirm whether the re-confirmation of the detection standard is met. The defect detection of the passive components 20 may be a detection device such as ultrasonic defect detection, appearance image defect detection or electrical connection defect detection, and obtained after the above defect detection. The detection information A can be image type image data or numerical data.

步驟S30:進行至少一被動元件缺陷品21之剔除,以一缺陷品剔除系統30之輸入單元讀取並解析該檢測資訊A,進一步將該具有缺陷之被動元件缺陷品21所在位置(例如一相對於該膠帶載體上的一參考基準點之座標點或座標範圍)對應至或轉換為該缺陷品剔除系統30的多軸機械手臂或多軸運動平台所能移動的範圍中的座標位置後,驅動該缺陷品剔除系統30之多軸機械手臂或多軸運動平台,以將對應的被動元件缺陷品21自該膠帶載體10移除。 Step S30: performing culling of at least one passive component defect 21, reading and parsing the detection information A by an input unit of the defective reject system 30, and further locating the defective passive component defect 21 (for example, a relative After the coordinate point or coordinate range of a reference datum on the tape carrier corresponds to or is converted to a coordinate position in a range in which the multi-axis robot or multi-axis motion platform of the defect rejection system 30 can move, the drive The defective rejects the multi-axis robotic arm or multi-axis motion platform of system 30 to remove corresponding passive component defects 21 from the tape carrier 10.

值得一提的是,本發明在進行了上述步驟S30之後,可更包含一確保步驟,即步驟S40:應用一檢測手段(例如以影像檢測方式將被動元件缺陷品21剔除後的膠帶載體10影像與被動元件缺陷品21剔除前的的膠帶載體10影像相互相比較)檢測該批次的該檢測資訊A中的被動元件缺陷品21位置的被動元件缺陷品21是否全部剔除,或檢測該批次的該檢測資訊A中除了該些被動元件缺陷品21位置除外的被動元件20是否有任一遭剔除,藉以確保該缺陷品剔除系統30對該批次的被動元件缺陷品21之剔除作業的可 靠性。 It is to be noted that, after performing the above step S30, the present invention may further include a securing step, that is, step S40: applying a detecting means (for example, the image of the tape carrier 10 after the passive component defect 21 is removed by image detection. Comparing the images of the tape carrier 10 before the rejection of the passive component defect 21 with each other) detecting whether the passive component defect 21 of the position of the passive component defect 21 in the detection information A of the batch is completely rejected, or detecting the batch Whether or not any of the passive components 20 except the position of the passive component defect 21 is rejected in the detection information A, thereby ensuring that the defective reject system 30 can eliminate the passive component defect 21 of the batch. Rely on sex.

具體而言,再請參照圖4所示。被動元件批次式檢測之缺陷品剔除系統30,包含:一空間移動單元301、一膠帶載體定位單元302、一元件脫離單元303、一輸入單元304以及一處理單元305。該空間移動單元301,用以依據一剔除指令B而驅動一移動機構3011,使其在一3維空間座標之工作範圍3012內準確移動;該膠帶載體定位單元,用以將已進行批次式檢測之承載並黏著有多個被動元件20的膠帶載體10,對應定位於該工作範圍3012內;該元件脫離單元303係設置於該移動機構3011上,並被輸送移動至具有缺陷之被動元件缺陷品21所在位置後,依據該剔除指令B,用以將被動元件缺陷品21自該膠帶載體10移除;該輸入單元304係用以讀取或接收經該批次式檢測該些被動元件20後產出之一檢測資訊A,該檢測資訊A包括至少一具有缺陷之被動元件缺陷品21的所在位置;該處理單元係電性連接該輸入單元、該空間移動單元與該元件脫離單元,用以分析由輸入單元304所載入之該檢測資訊A,並據而將具有缺陷之被動元件缺陷品21的所在位置(一般為對應於該膠帶載體10上之一特定的基準標記點)轉換對應為該空間移動單元301之該工作範圍3012的座標位置之後,產生該剔除指令B,該剔除指令B包含將該元件脫離單元303移至對應的該工作範圍3012的座標位置的指令及使該元件脫離單元303進行剔除動作的指令。 Specifically, please refer to FIG. 4 again. The defective component rejecting system 30 for passive component batch detection comprises: a space moving unit 301, a tape carrier positioning unit 302, a component detaching unit 303, an input unit 304, and a processing unit 305. The space moving unit 301 is configured to drive a moving mechanism 3011 according to a culling command B to accurately move within a working range 3012 of a 3-dimensional space coordinate; the tape carrier positioning unit is configured to perform batch type The tape carrier 10 that is loaded and adhered to the plurality of passive components 20 is correspondingly positioned within the working range 3012; the component detaching unit 303 is disposed on the moving mechanism 3011 and is transported to the passive component defect having defects After the product 21 is located, according to the culling command B, the passive component defect 21 is removed from the tape carrier 10; the input unit 304 is configured to read or receive the passive components 20 by the batch detection. And one of the output information A, the detection information A includes at least one location of the defective passive component defect 21; the processing unit is electrically connected to the input unit, the spatial mobile unit and the component is separated from the unit, To analyze the detection information A loaded by the input unit 304, and accordingly, the location of the passive component defect 21 having the defect (generally corresponding to the tape carrier 10) After the specific coordinate point is converted to the coordinate position of the working range 3012 of the spatial moving unit 301, the culling instruction B is generated, and the culling instruction B includes moving the component detaching unit 303 to the corresponding working range. The command of the coordinate position of 3012 and the command to disengage the component from the unit 303 to perform the culling operation.

詳細言之,如圖5所示。前述該缺陷品剔除系統30(之元件脫離單元303)係以一往復作動的頂針機構31,移動至該被動元件缺陷品21的位置並進行撞擊,進而將該被動元件缺陷品移離該膠帶載體10。 In detail, as shown in Figure 5. The defect rejecting system 30 (the component detaching unit 303) is moved by a reciprocating ejector mechanism 31 to the position of the passive component defect 21 and impacted, thereby moving the passive component defect away from the tape carrier. 10.

在一實施例中,如圖6所示。該缺陷品剔除系統30(之元件 脫離單元303)係以一移動至該被動元件缺陷品21位置的吹氣氣嘴機構32將該被動元件缺陷品21吹離該膠帶載體10,或者如圖7所示,該缺陷品剔除系統30係以一移動至該被動元件缺陷品21位置的以一吸氣氣嘴機構33將該被動元件缺陷品21吸離該膠帶載體10。 In an embodiment, as shown in FIG. The defective reject system 30 The detachment unit 303) blows the passive component defect 21 away from the tape carrier 10 by a blow nozzle mechanism 32 that moves to the position of the passive component defect 21, or the defect rejection system 30, as shown in FIG. The passive component defect 21 is sucked away from the tape carrier 10 by an inhalation nozzle mechanism 33 moving to the position of the passive component defect 21.

在一實施例中,如圖8所示。該膠帶載體10黏著該被動元件20的膠層11為熱熔式膠(加熱至一特定溫度時,可以液化固著的膠體,進而解除其黏著狀態),且該缺陷品剔除系統30(之元件脫離單元303)係以電熱式局部加熱機構36(如圖8所示),對該對應的被動元件缺陷品21黏著區域的膠層11加熱以解除該處熱熔式膠的黏著性,進而使該被動元件缺陷品21脫離該膠帶載體10。 In an embodiment, as shown in FIG. The adhesive layer 10 adheres the adhesive layer 10 of the passive component 20 to a hot melt adhesive (when heated to a specific temperature, the fixed colloid can be liquefied, thereby releasing the adhesive state), and the defective reject system 30 (the component The disengagement unit 303) is heated by the electrothermal local heating mechanism 36 (as shown in FIG. 8) to the adhesive layer 11 of the corresponding passive component defect 21 to remove the adhesiveness of the hot melt adhesive. The passive component defect 21 is detached from the tape carrier 10.

在另一實施例中,如圖9所示。該膠帶載體10黏著該被動元件20的膠層11為紫外光熔式膠(以UV光線照射,可以解除其黏著狀態),且該缺陷品剔除系統30(之元件脫離單元303)係以UV光照式局部光照機構37(如圖9所示)對該對應的被動元件缺陷品21黏著區域的膠層11照射UV光線,以解除該處紫外光熔式膠的黏著性,進而使該被動元件缺陷品21脫離該膠帶載體10。 In another embodiment, as shown in FIG. The adhesive layer 10 of the adhesive tape carrier 10 is adhered to the ultraviolet light-melting adhesive (which is irradiated with UV light to release the adhesive state), and the defect rejection system 30 (the component release unit 303) is UV-illuminated. The local illumination mechanism 37 (shown in FIG. 9) irradiates the adhesive layer 11 of the corresponding passive component defect 21 with UV light to remove the adhesion of the ultraviolet melt adhesive, thereby making the passive component defective. The article 21 is detached from the tape carrier 10.

另外,在實務作業上,該膠帶載體10的膠層11黏度具有一定的受固著力,可一定程度地增加其被動元件缺陷品21的移除性,因此在進行被動元件缺陷品21剔除作業之前,可預先將該被動元件缺陷品21位置的膠帶載體10割開一開口38,以適度降低該被動元件缺陷品21的受固著強度例如圖10、圖11所示:該缺陷品剔除系統30可更包含一刀刃34,並在該被動元件缺陷品21被移離該膠帶載體10之前,預先以該刀刃34(當然也可由 移動機構3011進行移動)將對應於該被動元件缺陷品21之該膠帶載體10的黏著位置劃出至少一開口38,當然,在圖10、圖11中,該刀刃34的截面形狀341為十字型,因此在圖11中切出的開口38係相同的形狀,而本發明中,該刀刃34的截面形狀341不限於十字型,舉凡只要造成該膠帶載體10膠層11的黏著位置的黏著力降低的開口或開槽的形狀,都是可行的。再者,如圖12所示,劃開該膠帶載體10的方式也可以下列實施方式為之:該缺陷品剔除系統30更包含一雷射切割機構35(當然也可由移動機構3011進行移動),並在該被動元件缺陷品21被移離該膠帶載體10之前,預先以雷射將對應於該被動元件缺陷品21之該膠帶載體10的黏著位置切出至少一開口38。 In addition, in practice, the adhesive layer 11 of the tape carrier 10 has a certain degree of adhesion, which can increase the removal of the passive component defect 21 to a certain extent, so before the passive component defect 21 is removed. The tape carrier 10 at the position of the passive component defect 21 can be cut open to an opening 38 in advance to moderately reduce the fixing strength of the passive component defect 21, as shown in FIGS. 10 and 11 : the defect rejection system 30 A blade 34 may be further included, and the blade 34 may be previously used before the passive component defect 21 is removed from the tape carrier 10 (of course, The moving mechanism 3011 performs movement to draw at least one opening 38 of the adhesive position of the tape carrier 10 corresponding to the passive component defect 21. Of course, in FIGS. 10 and 11, the cross-sectional shape 341 of the blade 34 is a cross type. Therefore, the opening 38 cut out in FIG. 11 has the same shape, and in the present invention, the sectional shape 341 of the blade 34 is not limited to the cross type, and the adhesion of the adhesive position of the adhesive layer 10 of the tape carrier 10 is lowered. The shape of the opening or slotting is feasible. Furthermore, as shown in FIG. 12, the manner in which the tape carrier 10 is cut may be as follows: the defect rejecting system 30 further includes a laser cutting mechanism 35 (of course, it may be moved by the moving mechanism 3011). And before the passive component defect 21 is removed from the tape carrier 10, the adhesive position of the tape carrier 10 corresponding to the passive component defect 21 is previously cut out by laser to at least one opening 38.

上述本所採用的技術手段之實施方式或實施例,並非用來限定本專利實施之範圍。即凡與本專利申請範圍文義相符,或依本專利範圍所做的均等變化與修飾,皆為本專利範圍所涵蓋。 The embodiments or examples of the technical means used herein are not intended to limit the scope of implementation of the patent. All changes and modifications in accordance with the scope of this patent application, or in accordance with the scope of this patent, are covered by this patent.

Claims (15)

一種被動元件批次式檢測之缺陷品剔除方法,其步驟包括:提供一承載並黏著有二維陣列排列或不規則排列的多個被動元件的膠帶載體;進行該些被動元件的缺陷檢測,以一次測得一批該些被動元件中包括至少一具有缺陷之被動元件缺陷品的所在位置的一檢測資訊;進行至少一被動元件缺陷品之剔除,以一缺陷品剔除系統解析該檢測資訊,進一步將該具有缺陷之被動元件缺陷品所在位置對應至該缺陷品剔除系統的座標位置後,驅動該缺陷品剔除系統將對應的被動元件缺陷品自該膠帶載體移除,該缺陷品剔除系統係應用一多軸機械手臂或一多軸運動平台設備進行對應的被動元件缺陷品位置的移動,以進行該被動元件缺陷品的剔除。 A defect rejection method for passive component batch detection, the method comprising: providing a tape carrier carrying and adhering a plurality of passive components arranged in a two-dimensional array or irregularly arranged; performing defect detection of the passive components to Detecting, at a time, a piece of detection information of at least one passive component defect having a defect in the passive component; performing at least one passive component defect rejection, and analyzing the detection information by a defect rejection system, further After the location of the defective passive component defect is corresponding to the coordinate position of the defect rejection system, the defective rejection system is driven to remove the corresponding passive component defect from the tape carrier, and the defect rejection system is applied. A multi-axis robotic arm or a multi-axis motion platform device performs the movement of the corresponding passive component defect position to perform the rejection of the passive component defect. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該缺陷品剔除系統係以一往復作動的頂針機構,撞擊該被動元件缺陷品,進而將該被動元件缺陷品移離該膠帶載體。 The defective product rejection method for passive component batch detection according to claim 1, wherein the defect rejection system is a reciprocating ejector mechanism that strikes the passive component defect, and the passive component is further The defective product is removed from the tape carrier. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該缺陷品剔除系統係以一吹氣氣嘴機構將該被動元件缺陷品吹離該膠帶載體,或以一吸氣氣嘴機構將該被動元件缺陷品吸離該膠帶載體。 The defect rejection method for batch component detection of the passive component according to claim 1, wherein the defect rejection system blows the passive component defect away from the tape carrier by a blow nozzle mechanism, or The passive component defect is aspirated from the tape carrier by an air suction nozzle mechanism. 如申請專利範圍第2或第3項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該缺陷品剔除系統更包含一刀刃,並在該被動元件缺陷品被移離該膠帶載體之前,預先以該刀刃將對應於該被動元件缺陷品之該膠帶載體的黏著位置劃出至少一開口。 The defective product rejection method for passive component batch detection according to the second or third aspect of the patent application, wherein the defect rejection system further comprises a blade, and the passive component defect is removed from the tape carrier Previously, the adhesive position of the tape carrier corresponding to the passive component defect is previously drawn by the blade to at least one opening. 如申請專利範圍第2或第3項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該缺陷品剔除系統更包含一雷射切割機構,並在該被動元件缺陷品被移離該膠帶載體之前,預先以雷射將對應於該被動元件缺陷品之該膠帶載體的黏著位置切出至少一開口。 The defect rejection method for batch component detection according to the second or third aspect of the patent application, wherein the defect rejection system further comprises a laser cutting mechanism, and the defective component is removed from the passive component Before the tape carrier, the adhesive position of the tape carrier corresponding to the passive component defect is cut out by at least one opening in advance by laser. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該膠帶載體黏著該被動元件的膠層為熱熔式膠,且該缺陷品剔除系統係以電熱式局部加熱機構,對該對應的被動元件缺陷品黏著區域的膠層加熱以解除該處熱熔式膠的黏著性,進而使該被動元件缺陷品脫離該膠帶載體。 The defect rejection method for batch component detection of the passive component according to claim 1, wherein the adhesive layer of the adhesive tape adheres to the passive component is a hot melt adhesive, and the defective rejection system is electrically heated. The local heating mechanism heats the adhesive layer of the corresponding adhesive component defect area to release the adhesiveness of the hot melt adhesive, thereby removing the passive component defect from the tape carrier. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該膠帶載體黏著該被動元件的膠層為紫外光熔式膠,且該缺陷品剔除系統係以UV光照式局部光照機構,對該對應的被動元件缺陷品黏著區域的膠層照射UV光線,以解除該處紫外光熔式膠的黏著性,進而使該被動元件缺陷品脫離該膠帶載體。 The defect rejection method for batch component detection of the passive component according to claim 1, wherein the adhesive layer of the adhesive tape adheres to the passive component is an ultraviolet light-melting adhesive, and the defective rejection system is UV-coated. The illumination type local illumination mechanism irradiates the glue layer of the corresponding passive component defect area with UV light to remove the adhesion of the ultraviolet light-melt glue, thereby removing the passive component defect from the tape carrier. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該些被動元件的缺陷檢測為一超音波缺陷檢測、外觀影像缺陷檢測或電性連接缺陷檢測。 The defect rejection method for batch component detection of the passive component according to claim 1, wherein the defect detection of the passive components is an ultrasonic defect detection, an appearance image defect detection or an electrical connection defect detection. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,其中,該檢測資訊為影像或數值資料。 The defect rejection method for batch component detection of the passive component as described in claim 1, wherein the detection information is image or numerical data. 如申請專利範圍第1項所述之被動元件批次式檢測之缺陷品剔除方法,於該進行至少一被動元件缺陷品之剔除步驟之後,更包含一確保步驟,應用一檢測手段檢測該批次的該檢測資訊中的被動元件缺陷品位置的被動 元件缺陷品是否全部剔除,或檢測該批次的該檢測資訊中除了該些被動元件缺陷品位置除外的被動元件是否有任一遭剔除。 The method for rejecting the defective component batch detection according to the first aspect of the patent application, after the step of removing at least one passive component defect, further comprises a securing step, and applying a detecting means to detect the batch Passive position of passive component defect in the detection information Whether all of the defective parts of the component are rejected, or whether any of the passive components except the position of the passive component defect are detected in the detection information of the batch is rejected. 一種被動元件批次式檢測之缺陷品剔除系統,包含:一空間移動單元,用以依據一剔除指令而驅動一移動機構,使其在一3維空間座標之工作範圍內準確移動;一膠帶載體定位單元,用以將已進行批次式檢測之承載並黏著有二維陣列排列或不規則排列的多個被動元件的膠帶載體,對應定位於該工作範圍內;一元件脫離單元,係設置於該移動機構上,並受其輸送移動至具有缺陷之被動元件所在位置後,依據該剔除指令,用以將被動元件缺陷品自該膠帶載體移除;一輸入單元,用以讀取或接收經該批次式檢測一批該些被動元件後產出之一檢測資訊,該檢測資訊包括至少一具有缺陷之被動元件缺陷品的所在位置;以及一處理單元,係電性連接該輸入單元、該空間移動單元與該元件脫離單元,用以分析該檢測資訊,並據而將具有缺陷之被動元件缺陷品的所在位置轉換對應為該空間移動單元之該工作範圍的座標位置之後,產生該剔除指令,該剔除指令包含將該元件脫離單元移至對應的該工作範圍的座標位置的指令及使該元件脫離單元進行剔除動作的指令,該空間移動單元係為一多軸機械手臂或一多軸運動平台設備。 A defective component rejection system for passive component batch detection, comprising: a space moving unit for driving a moving mechanism to accurately move in a working range of a 3-dimensional space coordinate according to a culling command; a tape carrier a positioning unit, configured to position a tape carrier that has been subjected to batch detection and adhered to a plurality of passive components arranged in a two-dimensional array or irregularly arranged in the working range; The moving mechanism is adapted to remove the passive component defect from the tape carrier according to the culling instruction after being transported to the position of the passive component having the defect; and an input unit for reading or receiving the The batch test detects a batch of the passive components to generate one of the detection information, the detection information includes a location of at least one defective component defect having a defect; and a processing unit electrically connected to the input unit, the The space moving unit and the component are separated from the unit for analyzing the detection information, and according to the defect of the passive component defect having defects After the position conversion corresponds to the coordinate position of the working range of the space moving unit, the culling instruction is generated, and the culling instruction includes an instruction to move the component off the unit to a coordinate position of the corresponding working range, and the component is detached from the unit. Excluding the action instruction, the space moving unit is a multi-axis robot arm or a multi-axis motion platform device. 如申請專利範圍第11項所述之被動元件批次式檢測之缺陷品剔除系統,其中,該元件脫離單元為一頂針機構,透過該空間移動單元移至該被動 元件缺陷品後,依據該剔除指令,對該被動元件缺陷品進行撞擊,進而將該被動元件缺陷品移離該膠帶載體。 The defective component rejection system for batch component detection according to claim 11, wherein the component release unit is a ejector mechanism, and the mobile unit moves to the passive through the space After the component defect, the passive component defect is impacted according to the culling command, and the passive component defect is moved away from the tape carrier. 如申請專利範圍第11項所述之被動元件批次式檢測之缺陷品剔除系統,其中,該元件脫離單元為一吹氣氣嘴機構,透過該空間移動單元移至該被動元件缺陷品後,依據該剔除指令,將該被動元件缺陷品吹離該膠帶載體,或該元件脫離單元為一吸氣氣嘴機構,透過該空間移動單元移至該被動元件缺陷品後,依據該剔除指令,將該被動元件缺陷品吸離該膠帶載體。 The defective component rejection system for passive component batch detection according to claim 11, wherein the component release unit is a blow nozzle mechanism, and after moving to the passive component defect through the space moving unit, Disposing the passive component defect from the tape carrier according to the culling instruction, or the component detaching unit is an air suction nozzle mechanism, and after moving to the passive component defect through the space moving unit, according to the culling instruction, The passive component defect picks up the tape carrier. 如申請專利範圍第11項所述之被動元件批次式檢測之缺陷品剔除系統,其中,該膠帶載體黏著該被動元件的膠層為熱熔式膠,且該元件脫離單元係為一可對該被動元件缺陷品黏著區域的膠層加熱以解除該處熱熔式膠的黏著性之電熱式局部加熱機構。 The defect rejection system for batch component detection of the passive component according to claim 11, wherein the adhesive layer of the adhesive tape adheres to the passive component is a hot melt adhesive, and the component is separated from the unit. The electrothermal local heating mechanism for heating the adhesive layer of the passive component defect area to dissipate the adhesion of the hot melt adhesive. 如申請專利範圍第11項所述之被動元件批次式檢測之缺陷品剔除系統,其中,該膠帶載體黏著該被動元件的膠層為紫外光熔式膠,且該元件脫離單元為一可對該被動元件缺陷品黏著區域的膠層照射UV光線,以解除該處紫外光熔式膠的黏著性之UV光照式局部光照機構。 The defect rejection system for batch component detection of the passive component according to claim 11, wherein the adhesive layer of the adhesive tape adheres to the passive component is an ultraviolet light-melting glue, and the component is separated from the unit. The adhesive layer of the passive component defect is irradiated with UV light to remove the UV-light localized illumination mechanism of the adhesive of the ultraviolet light-melting adhesive.
TW106112028A 2017-04-11 2017-04-11 Defective rejection method for passive component batch detection and rejection system thereof TWI627400B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW106112028A TWI627400B (en) 2017-04-11 2017-04-11 Defective rejection method for passive component batch detection and rejection system thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW106112028A TWI627400B (en) 2017-04-11 2017-04-11 Defective rejection method for passive component batch detection and rejection system thereof

Publications (2)

Publication Number Publication Date
TWI627400B true TWI627400B (en) 2018-06-21
TW201837455A TW201837455A (en) 2018-10-16

Family

ID=63255870

Family Applications (1)

Application Number Title Priority Date Filing Date
TW106112028A TWI627400B (en) 2017-04-11 2017-04-11 Defective rejection method for passive component batch detection and rejection system thereof

Country Status (1)

Country Link
TW (1) TWI627400B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW202044703A (en) * 2019-05-16 2020-12-01 台灣愛司帝科技股份有限公司 Chip removing device and chip removing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070253238A1 (en) * 2005-04-29 2007-11-01 Stmicroelectronics S.R.L. Semiconductor memory device with information loss self-detect capability
TW201036032A (en) * 2009-02-03 2010-10-01 Ismeca Semiconductor Holding Method and device for filling carrier tapes with electronic components
TW201443459A (en) * 2009-09-03 2014-11-16 Applied Materials Inc Testing apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070253238A1 (en) * 2005-04-29 2007-11-01 Stmicroelectronics S.R.L. Semiconductor memory device with information loss self-detect capability
TW201036032A (en) * 2009-02-03 2010-10-01 Ismeca Semiconductor Holding Method and device for filling carrier tapes with electronic components
TW201443459A (en) * 2009-09-03 2014-11-16 Applied Materials Inc Testing apparatus

Also Published As

Publication number Publication date
TW201837455A (en) 2018-10-16

Similar Documents

Publication Publication Date Title
CN110544666B (en) Method for semiconductor device transfer
US20140017822A1 (en) Method of manufacturing semiconductor device
JP5614825B1 (en) Classification device, classification method, and classification program
KR102219591B1 (en) Apparatus for manufacturing semiconductor and method of manufacturing semiconductor device
US8349624B2 (en) Method for fabricating semiconductor device
TWM552102U (en) System for removing defective passive components inspected in batch
JP2018152376A (en) Die-bonding device and method of manufacturing semiconductor device
CN110491795B (en) Sticking element, micro light-emitting diode optical maintenance equipment and optical maintenance method
CN113921446A (en) Method and apparatus for controlling transfer parameters during semiconductor device transfer
CN104517877B (en) Component loading apparatus and method
JP2016103574A (en) Classification device
JP2018120983A (en) Semiconductor manufacturing equipment and semiconductor device manufacturing method
JP2019029611A (en) Die bonding device and semiconductor device manufacturing method
TWI627400B (en) Defective rejection method for passive component batch detection and rejection system thereof
JP2019054203A (en) Manufacturing apparatus for semiconductor and manufacturing method for semiconductor
JP7082862B2 (en) Die bonding equipment, semiconductor equipment manufacturing method and semiconductor manufacturing system
CN110234484A (en) Image capture method and resin sealing apparatus in resin sealing apparatus
JP6042175B2 (en) Pickup method and pickup device
CN108738378B (en) Method and system for manufacturing flexible printed circuit board
JP2021163777A (en) Mounter
JP4800076B2 (en) Component mounting method and apparatus
CN113496177A (en) Visual inspection system and method of inspecting parts
CN108328015B (en) Object transferring device and method
TWI534937B (en) Assembly and method for algining wafers
TWI509681B (en) Method and apparatus for processing on wafers