TWI620781B - Resin composition - Google Patents

Resin composition Download PDF

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Publication number
TWI620781B
TWI620781B TW102118794A TW102118794A TWI620781B TW I620781 B TWI620781 B TW I620781B TW 102118794 A TW102118794 A TW 102118794A TW 102118794 A TW102118794 A TW 102118794A TW I620781 B TWI620781 B TW I620781B
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resin composition
resin
mass
insulating layer
pigment
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TW102118794A
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TW201410777A (en
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Yoshio Nishimura
西村嘉生
Kenji Kawai
川合賢司
Shigeo Nakamura
中村茂雄
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Ajinomoto Co., Inc.
味之素股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • B32B15/092Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin comprising epoxy resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/04Oxygen-containing compounds
    • C08K5/10Esters; Ether-esters
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L21/00Compositions of unspecified rubbers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/14Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0366Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement reinforced, e.g. by fibres, fabrics
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Epoxy Resins (AREA)
  • Laminated Bodies (AREA)

Abstract

本發明欲解決的課題係提供可達成樹脂組成物之硬化物之低介電損耗正切化,且可抑制將硬化物開孔加工,進行粗化處理後之導通孔內之樹脂殘渣的樹脂組成物。 The problem to be solved by the present invention is to provide a resin composition capable of achieving a low dielectric loss tangent of a hardened material of a resin composition and a resin residue in a via hole after the hardened material is subjected to hole-opening processing and roughening treatment. .

本發明係含有環氧樹脂、活性酯化合物及樹脂殘渣抑制成分之特定的樹脂組成物。 The present invention is a specific resin composition containing an epoxy resin, an active ester compound, and a resin residue suppression component.

Description

樹脂組成物 Resin composition

本發明係有關樹脂組成物。更詳細為有關薄片狀層合材料、多層印刷電路板、半導體裝置。 The present invention relates to a resin composition. More specifically, it relates to a sheet-shaped laminate, a multilayer printed wiring board, and a semiconductor device.

近年,電子機器之小型化、高性能化進展,多層印刷電路板被要求堆積層(Build up layer)之複層化,配線之微細化及高密度化,此外,為了降低傳送損失,而要求介電損耗正切(Dielectric loss tangent)較低的絕緣材料。 In recent years, the miniaturization and high performance of electronic devices have progressed. Multilayer printed circuit boards are required to be multi-layered (Build up layer), miniaturized and high-density wiring. In addition, in order to reduce transmission loss, media are required. Insulation material with low electrical loss tangent.

專利文獻1中揭示含有環氧樹脂、硬化劑、碳黑之封閉用環氧樹脂組成物,且記載防止碳黑之凝集。 但是完全未揭示或暗示樹脂殘渣或低介電損耗正切的概念。 Patent Document 1 discloses an epoxy resin composition for sealing containing an epoxy resin, a hardener, and carbon black, and describes preventing the aggregation of carbon black. However, the concept of resin residue or low dielectric loss tangent is not disclosed or suggested at all.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2008-121010號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2008-121010

多層印刷電路板之絕緣層進行開孔加工時,在導通孔(via hole)內會產生樹脂殘渣(smear),必須以粗化處理步驟除去樹脂殘渣。但是依據本發明人等之見解,使用含有活性酯化合物之低介電損耗正切之樹脂組成物,製作多層印刷電路板時,即使在絕緣層之開孔加工後,將導通孔內進行粗化處理,會發現不易除去導通孔內之樹脂殘渣的問題。 When the insulating layer of the multilayer printed circuit board is subjected to hole processing, resin residues may be generated in the via holes, and the resin residues must be removed in a roughening process. However, according to the findings of the present inventors, when using a resin composition containing a low dielectric loss tangent of an active ester compound to make a multilayer printed circuit board, the via hole is roughened even after the opening of the insulating layer is processed. It will be found that it is difficult to remove the resin residue in the via hole.

因此本發明欲解決的課題係提供可達成樹脂組成物之硬化物之低介電損耗正切化,且可抑制將硬化物開孔加工,進行粗化處理後之導通孔內之樹脂殘渣的樹脂組成物。 Therefore, the problem to be solved by the present invention is to provide a resin composition that can achieve a low dielectric loss tangent of a hardened material of a resin composition, and can suppress the opening of the hardened material and roughening the resin residue in the via hole. Thing.

本發明人為了解決上述課題而精心研究的結果,發現含有環氧樹脂、活性酯化合物及樹脂殘渣抑制成分之特定的樹脂組成物,而完成本發明。 As a result of intensive studies in order to solve the above problems, the present inventors have found a specific resin composition containing an epoxy resin, an active ester compound, and a resin residue suppressing component, and completed the present invention.

換言之,本發明係含有以下的內容者。 In other words, the present invention includes the following contents.

[1]一種樹脂組成物,其特徵係含有(A)環氧樹脂、(B)活性酯化合物及(C)樹脂殘渣抑制成分的樹脂組成物,該樹脂組成物之不揮發成分為100質量%時,(C)樹脂殘渣抑制成分為0.001~10質量%。 [1] A resin composition characterized by a resin composition containing (A) an epoxy resin, (B) an active ester compound, and (C) a resin residue suppressing component, and a non-volatile content of the resin composition is 100% by mass (C) The resin residue suppression component is 0.001 to 10% by mass.

[2]如前述[1]項之樹脂組成物,其中樹脂組成物中之不揮發成分為100質量%時,(B)活性酯化合物之含量 為1~30質量%。 [2] The resin composition according to the aforementioned item [1], wherein when the non-volatile content in the resin composition is 100% by mass, the content of the (B) active ester compound It is 1 to 30% by mass.

[3]如前述[1]或[2]項之樹脂組成物,其中(C)樹脂殘渣抑制成分為有機系樹脂殘渣抑制成分。 [3] The resin composition according to the above [1] or [2], wherein the (C) resin residue suppression component is an organic resin residue suppression component.

[4]如前述[3]項之樹脂組成物,其中有機系樹脂殘渣抑制成分為選自由顏料、染料、橡膠粒子、抗氧化劑及紅外線吸收劑所成群之1種以上。 [4] The resin composition according to the item [3], wherein the organic resin residue suppressing component is one or more members selected from the group consisting of a pigment, a dye, a rubber particle, an antioxidant, and an infrared absorber.

[5]如前述[3]項之樹脂組成物,其中有機系樹脂殘渣抑制成分為顏料及/或橡膠粒子。 [5] The resin composition according to the item [3], wherein the organic resin residue suppression component is a pigment and / or rubber particles.

[6]如前述[3]項之樹脂組成物,其中有機系樹脂殘渣抑制成分為顏料。 [6] The resin composition according to the item [3], wherein the organic resin residue suppression component is a pigment.

[7]如前述[3]項之樹脂組成物,其中有機系樹脂殘渣抑制成分為選自由藍色顏料、黃色顏料、紅色顏料及綠色顏料所成群之1種以上。 [7] The resin composition according to the item [3], wherein the organic resin residue suppression component is one or more selected from the group consisting of a blue pigment, a yellow pigment, a red pigment, and a green pigment.

[8]如前述[3]項之樹脂組成物,其中有機系樹脂殘渣抑制成分為混合藍色顏料、黃色顏料及紅色顏料而成的混合顏料。 [8] The resin composition according to the item [3], wherein the organic resin residue suppression component is a mixed pigment obtained by mixing a blue pigment, a yellow pigment, and a red pigment.

[9]如前述[1]~[8]項中任一項之樹脂組成物,其係再含有(D)無機填充材。 [9] The resin composition according to any one of the items [1] to [8], which further contains (D) an inorganic filler.

[10]如前述[9]項之樹脂組成物,其中(D)無機填充材之平均粒徑為0.01~5μm。 [10] The resin composition according to the aforementioned item [9], wherein the average particle diameter of the (D) inorganic filler is 0.01 to 5 μm.

[11]如前述[9]或[10]項之樹脂組成物,其中樹脂組成物中之不揮發成分為100質量%時,(D)無機填充材之含有量為40~85質量%。 [11] The resin composition according to the item [9] or [10], wherein when the non-volatile content in the resin composition is 100% by mass, the content of the (D) inorganic filler is 40 to 85% by mass.

[12]如前述[9]~[11]項中任一項之樹脂組成物,其中 無機填充材之每單位重量之碳量為0.02~3%。 [12] The resin composition according to any one of the items [9] to [11], wherein The carbon content per unit weight of the inorganic filler is 0.02 to 3%.

[13]如前述[1]~[12]項中任一項之樹脂組成物,其係將樹脂組成物硬化形成絕緣層,將該絕緣層表面進行粗化處理後之該絕緣層表面之均方根(Root Mean Square)粗度Rq為500nm以下,於該絕緣層表面鍍敷所得之導體層與該絕緣層之剝離強度為0.3kgf/cm以上,樹脂組成物之硬化物之介電損耗正切為0.05以下。 [13] The resin composition according to any one of the above items [1] to [12], wherein the resin composition is hardened to form an insulating layer, and the surface of the insulating layer is roughened after the surface of the insulating layer is roughened. The Root Mean Square has a thickness Rq of 500 nm or less. The peel strength of the conductive layer and the insulating layer obtained by plating on the surface of the insulating layer is 0.3 kgf / cm or more. The dielectric loss tangent of the hardened material of the resin composition is tangent. It is 0.05 or less.

[14]如前述[1]~[13]項中任一項之樹脂組成物,其係多層印刷電路板之絕緣層用樹脂組成物。 [14] The resin composition according to any one of the aforementioned items [1] to [13], which is a resin composition for an insulating layer of a multilayer printed circuit board.

[15]一種薄片狀層合材料,其特徵係含有如前述[1]~[14]項中任一項之之樹脂組成物。 [15] A sheet-like laminated material characterized by containing the resin composition according to any one of the items [1] to [14].

[16]一種多層印刷電路板,其特徵係藉由如前述[1]~[14]項中任一項之樹脂組成物之硬化物,形成絕緣層者。 [16] A multilayer printed circuit board characterized by forming an insulating layer from a hardened product of the resin composition as described in any one of [1] to [14] above.

[17]一種半導體裝置,其特徵係使用如前述[16]項之多層印刷電路板者。 [17] A semiconductor device characterized by using a multilayer printed circuit board as described in [16] above.

[18]一種多層印刷電路板之製造方法,其特徵係將如前述[15]項之薄片狀層合材料層合於電路基板,使樹脂組成物進行熱硬化形成絕緣層,對於形成於電路基板上之絕緣層,由支撐體上進行開孔加工形成導通孔。 [18] A method for manufacturing a multilayer printed circuit board, which is characterized in that the sheet-like laminated material as described in [15] above is laminated on a circuit board, and the resin composition is heat cured to form an insulating layer. An insulating layer is formed on the support to form a via hole.

藉由含有環氧樹脂、活性酯化合物及樹脂殘渣抑制成分之特定的樹脂組成物,可提供可達成該樹脂組 成物之硬化物之低介電損耗正切化,且可抑制將硬化物開孔加工,進行粗化處理後之導通孔內之樹脂殘渣的樹脂組成物。 By providing a specific resin composition containing an epoxy resin, an active ester compound, and a resin residue suppressing component, it is possible to provide the resin group Resin composition of hardened product with low dielectric loss tangent, and resin residue in the via hole after roughening treatment can be suppressed by hardening the hardened product.

[實施發明的形態] [Mode for Carrying Out the Invention]

本發明係含有(A)環氧樹脂、(B)活性酯化合物及(C)樹脂殘渣抑制成分的樹脂組成物,其特徵係該樹脂組成物之不揮發成分為100質量%時,(C)樹脂殘渣抑制成分為0.001~10質量%。 The present invention is a resin composition containing (A) an epoxy resin, (B) an active ester compound, and (C) a resin residue suppression component, and is characterized in that when the non-volatile content of the resin composition is 100% by mass, (C) The resin residue suppression component is 0.001 to 10% by mass.

<(A)環氧樹脂> <(A) epoxy resin>

本發明所使用的(A)環氧樹脂無特別限定,較佳為1分子中含有2個以上之環氧基之環氧樹脂者。具體而言,例如有雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、酚醛型環氧樹脂、第三丁基-鄰苯二酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、伸萘基醚型環氧樹脂、縮水甘油胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛型環氧樹脂、聯苯基型環氧樹脂、蒽型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯結構之環氧樹脂、脂環環氧樹脂、雜環環氧樹脂、含有螺環(Spiro ring)之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。此等可1種或2種以上組合使用。 The (A) epoxy resin used in the present invention is not particularly limited, and an epoxy resin containing two or more epoxy groups in one molecule is preferred. Specifically, there are, for example, a bisphenol A-type epoxy resin, a bisphenol F-type epoxy resin, a bisphenol S-type epoxy resin, a bisphenol AF-type epoxy resin, a phenolic epoxy resin, and a third butyl-ortho Resorcinol epoxy resin, naphthol epoxy resin, naphthalene epoxy resin, naphthyl ether epoxy resin, glycidylamine epoxy resin, glycidyl ester epoxy resin, cresol novolac type Epoxy resin, biphenyl type epoxy resin, anthracene type epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, containing spiral Spiro ring epoxy resin, cyclohexanedimethanol epoxy resin, trimethylol epoxy resin, halogenated epoxy resin, etc. These can be used singly or in combination of two or more kinds.

此等中,從提高耐熱性、提高絕緣信賴性、 提高與金屬箔之密著性的觀點,較佳為雙酚A型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、伸萘基醚型環氧樹脂、縮水甘油酯型環氧樹脂、蒽型環氧樹脂、具有丁二烯結構之環氧樹脂。具體而言,例如有雙酚A型環氧樹脂(三菱化學(股)製造之「Epikote 828EL」、「YL980」)、雙酚F型環氧樹脂(三菱化學(股)製造之「jER806H」、「YL983U」)、萘型二官能環氧樹脂(DIC(股)製造之「HP4032」、「HP4032D」、「HP4032SS」、「EXA4032SS」)、萘型四官能環氧樹脂(DIC(股)製造之「HP4700」、「HP4710」)、萘酚型環氧樹脂(東都化成(股)製造之「ESN-475V」)、具有丁二烯結構之環氧樹脂(Daicel化學工業(股)製造之「PB-3600」)、聯苯型環氧樹脂(日本化藥(股)製造之「NC3000H」、「NC3000L」、「NC3100」,三菱化學(股)製造之「YX4000」、「YX4000H」、「YX4000HK」、「YL6121」)、蒽型環氧樹脂(三菱化學(股)製造之「YX8800」)、伸萘基醚型環氧樹脂(DIC(股)製造之「EXA-7310」、「EXA-7311」、「EXA-7311L」、「EXA7311-G3」)、縮水甘油酯型環氧樹脂(nagasechemtex(股)製「EX711」、「EX721」、(股)printec製「R540」)等。 Among them, from improving heat resistance, improving insulation reliability, From the viewpoint of improving adhesion with metal foil, bisphenol A epoxy resin, naphthol epoxy resin, naphthalene epoxy resin, biphenyl epoxy resin, and naphthyl ether epoxy resin are preferred. Glycidyl epoxy resin, anthracene epoxy resin, epoxy resin with butadiene structure. Specifically, for example, there are bisphenol A type epoxy resin ("Epikote 828EL" and "YL980" manufactured by Mitsubishi Chemical Corporation), bisphenol F type epoxy resin ("jER806H" manufactured by Mitsubishi Chemical Corporation), "YL983U"), naphthalene-type bifunctional epoxy resin ("HP4032", "HP4032D", "HP4032SS", "EXA4032SS") manufactured by DIC (share) "HP4700", "HP4710"), naphthol-type epoxy resin ("ESN-475V" manufactured by Tohto Kasei Co., Ltd.), epoxy resin with butadiene structure ("PB" manufactured by Daicel Chemical Industry Co., Ltd.) -3600 "), biphenyl epoxy resin (" NC3000H "," NC3000L "," NC3100 "manufactured by Nippon Kayaku Co., Ltd.," YX4000 "," YX4000H "," YX4000HK "manufactured by Mitsubishi Chemical Co., Ltd. , "YL6121"), anthracene-based epoxy resin ("YX8800" manufactured by Mitsubishi Chemical Corporation), dnaphthyl ether epoxy resin ("EXA-7310", "EXA-7311" manufactured by DIC) , "EXA-7311L", "EXA7311-G3"), glycidyl epoxy resin (nagasechemtex (stock) "EX711", "EX721", (stock) printec "R540") Wait.

其中併用液狀環氧樹脂與固體狀環氧樹脂較佳,更佳為含有一分子中具有兩個以上之環氧基,且在溫 度20℃下為液狀芳香族系環氧樹脂(以下也稱為「液狀環氧樹脂」)與一分子中具有三個以上之環氧基,且在溫度20℃下為固體狀之芳香族系環氧樹脂(以下稱為「固體狀環氧樹脂」)之樣態。又,本發明中所稱之芳香族系環氧樹脂意指其分子內具有芳香環結構之環氧樹脂。環氧樹脂為併用液狀環氧樹脂與固體狀環氧樹脂時,從接著薄膜形態使用樹脂組成物時,具有適度可撓性方面,或樹脂組成物之硬化物具有適度之斷裂強度方面而言,其調配比例(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,較佳為1:0.1~1:4之範圍,更佳為1:0.1~1:2之範圍,又更佳為1:0.3~1:1.8之範圍,又更佳為1:0.6~1:1.5之範圍。 Among them, it is preferable to use a liquid epoxy resin and a solid epoxy resin in combination, and it is more preferable that the epoxy resin contains two or more epoxy groups in one molecule. A liquid aromatic epoxy resin (hereinafter also referred to as a "liquid epoxy resin") at a temperature of 20 ° C and a solid aromatic fragrance having three or more epoxy groups in one molecule at a temperature of 20 ° C Family epoxy resin (hereinafter referred to as "solid epoxy resin"). The term "aromatic epoxy resin" as used in the present invention means an epoxy resin having an aromatic ring structure in the molecule. When the epoxy resin is a combination of a liquid epoxy resin and a solid epoxy resin, when the resin composition is used in the form of a film, it has a moderate flexibility, or a cured product of the resin composition has a moderate breaking strength. , Its blending ratio (liquid epoxy resin: solid epoxy resin) is based on mass ratio, preferably in the range of 1: 0.1 ~ 1: 4, more preferably in the range of 1: 0.1 ~ 1: 2, and more It is preferably in the range of 1: 0.3 to 1: 1.8, and more preferably in the range of 1: 0.6 to 1: 1.5.

本發明之樹脂組成物中,就提高樹脂組成物之硬化物之機械強度或絕緣信賴性之觀點而言,樹脂組成物中之不揮發成分為100質量%時,(A)環氧樹脂之含量較佳為3~40質量%,更佳為5~35質量%,又更佳為10~30質量%。 In the resin composition of the present invention, from the viewpoint of improving the mechanical strength or insulation reliability of the hardened material of the resin composition, when the non-volatile content in the resin composition is 100% by mass, the content of (A) the epoxy resin is It is preferably 3 to 40% by mass, more preferably 5 to 35% by mass, and even more preferably 10 to 30% by mass.

<(B)活性酯化合物> <(B) Active ester compound>

本發明中之(B)活性酯化合物係1分子中具有1個以上之活性酯基的化合物,可將樹脂組成物之介電損耗正切降低,且可使均方根粗度Rq較小。(B)活性酯化合物可與環氧樹脂等反應,1分子中具有2個以上之活性酯基的化合物較佳。一般而言,較佳為使用酚酯類、苯硫酚(Thiophenol)酯類、N-羥基胺酯類、雜環羥基化合物之酯 類等1分子中具有2個以上之反應活性高之酯基的化合物。 The (B) active ester compound in the present invention is a compound having one or more active ester groups in one molecule, which can reduce the dielectric loss tangent of the resin composition, and can make the root mean square roughness Rq small. (B) The active ester compound can react with epoxy resin and the like, and a compound having two or more active ester groups in one molecule is preferred. Generally speaking, it is preferable to use phenolic esters, thiophenol esters, N-hydroxyamine esters, and heterocyclic hydroxy compound esters. Compounds such as compounds having two or more highly reactive ester groups in one molecule.

從提高耐熱性之觀點,更佳為使羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物進行縮合反應而得的活性酯化合物。又更佳為羧酸化合物與選自酚化合物、萘酚化合物、硫醇化合物之1種或2種以上,進行反應而得的活性酯化合物。又更佳為羧酸化合物與具有酚性羥基之芳香族化合物,進行反應而得之1分子中具有2個以上之活性酯基的芳香族化合物。此外,特佳為1分子中具有至少2個以上之羧基之羧酸化合物與具有酚性羥基之芳香族化合物,進行反應而得的芳香族化合物,且該芳香族化合物之1分子中具有2個以上之活性酯基的芳香族化合物。又,可為直鏈狀或多支鏈狀。又,1分子中具有至少2個以上之羧基之羧酸化合物為含有脂肪族鏈的化合物時,可提高與樹脂組成物之相溶性,而具有芳香族環之化合物時,考提高耐熱性。 From the viewpoint of improving heat resistance, an active ester compound obtained by subjecting a carboxylic acid compound and / or a thiocarboxylic acid compound to a condensation reaction with a hydroxy compound and / or a thiol compound is more preferable. Still more preferred is an active ester compound obtained by reacting a carboxylic acid compound with one or two or more selected from a phenol compound, a naphthol compound, and a thiol compound. Still more preferred is an aromatic compound having two or more active ester groups in one molecule obtained by reacting a carboxylic acid compound and an aromatic compound having a phenolic hydroxyl group. In addition, it is particularly preferable that the carboxylic acid compound having at least two carboxyl groups in one molecule and the aromatic compound having a phenolic hydroxyl group react with each other, and that the aromatic compound has two in one molecule. An aromatic compound of the above active ester group. Moreover, it may be linear or branched. In addition, when a carboxylic acid compound having at least two carboxyl groups in one molecule is a compound containing an aliphatic chain, compatibility with a resin composition can be improved, and when a compound has an aromatic ring, heat resistance can be improved.

羧酸化合物具體而言例如有苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、苯二甲酸、間苯二甲酸、對苯二甲酸、苯均四酸等。其中從耐熱性的觀點,較佳為琥珀酸、馬來酸、衣康酸、苯二甲酸、間苯二甲酸、對苯二甲酸,更佳為間苯二甲酸、對苯二甲酸。硫代羧酸具體而言,例如有硫代乙酸、硫代苯甲酸等。 Specific examples of the carboxylic acid compound include benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid, and the like. Among these, from the viewpoint of heat resistance, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, and terephthalic acid are preferred, and isophthalic acid and terephthalic acid are more preferred. Specific examples of the thiocarboxylic acid include thioacetic acid and thiobenzoic acid.

酚化合物或萘酚化合物,具體而言例如有對苯二酚、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲 酚、m-甲酚、p-甲酚、鄰苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚(Phloroglucin)、苯三醇、二環戊二烯二酚、酚醛等。 從提高耐熱性、提高溶解性之觀點,較佳為雙酚A、雙酚F、雙酚S、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、鄰苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯二酚、酚醛,更佳為鄰苯二酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三醇、二環戊二烯二酚、酚醛,又,更佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、二環戊二烯二酚、酚醛,又,更佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二環戊二烯二酚、酚醛,特佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二環戊二烯二酚,特佳為二環戊二烯二酚。硫醇化合物具體而言,例如有苯二硫醇、三嗪二硫醇等。活性酯化合物可使用1種或併用2種以上。 Examples of the phenol compound or naphthol compound include hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, Methylated bisphenol S, phenol, o-methyl Phenol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene , Dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, resorcinol (Phloroglucin), benzenetriol, dicyclopentadienediol, phenolic, etc. From the viewpoint of improving heat resistance and improving solubility, bisphenol A, bisphenol F, bisphenol S, methylated bisphenol A, methylated bisphenol F, methylated bisphenol S, and phthalate are preferred. Phenol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, Tetrahydroxybenzophenone, resorcinol, pyroglycerol, dicyclopentadienediphenol, phenolic form, more preferably catechol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, resorcinol, benzenetriol, dicyclopentadienediphenol, phenolic, and, More preferred are 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, and bicyclic Pentadiene, phenol, and more preferably 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dicyclopentadienediphenol, and phenolaldehyde, particularly preferably 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dicyclopentadiene diphenol, and dicyclopentadiene diphenol is particularly preferred. Specific examples of the thiol compound include benzenedithiol and triazinedithiol. The active ester compound may be used singly or in combination of two or more kinds.

含有二環戊二烯二酚結構的活性酯化合物,更具體而言。例如有以下式(1)之化合物。 More specifically, the active ester compound containing a dicyclopentadiene diphenol structure. For example, there are compounds of the following formula (1).

(式中,R表示苯基、萘基,k表示0或1,n係重複單元之平均數為0.05~2.5)。 (In the formula, R represents a phenyl group and a naphthyl group, k represents 0 or 1, and the average number of n-type repeating units is 0.05 to 2.5).

從降低介電損耗正切,提高耐熱性的觀點,R較佳為萘基,k較佳為0,又,n較佳為0.25~1.5。 From the viewpoint of reducing the dielectric loss tangent and improving heat resistance, R is preferably a naphthyl group, k is preferably 0, and n is preferably 0.25 to 1.5.

(B)活性酯化合物可使用日本特開2004-277460號公報所揭示之活性酯化合物,又亦可使用市售之活性酯化合物。市售之活性酯化合物,具體而言較佳為含有二環戊二烯二酚結構之活性酯系硬化劑者、含有萘結構之活性酯系硬化劑、含有酚醛之乙醯基化物之活性酯系硬化劑、含有酚醛之苯甲醯基化物之活性酯系硬化劑,其中更佳為含有萘結構之活性酯系硬化劑、含有二環戊二烯二酚結構之活性酯系硬化劑。含有二環戊二烯二酚結構之活性酯系硬化劑,例如有EXB 9451、EXB 9460、EXB 9460S、HPC-8000-65T(DIC(股)製,含有萘結構之活性酯系硬化劑,例如有EXB9416-70BK(DIC(股)製),含有酚醛之乙醯化物之活性酯系硬化劑,例如有DC808(三菱化學(股)製,含有酚醛之苯甲醯基化物之活性酯系硬化劑,例如有YLH1026(三菱化學(股)製)等。 (B) As the active ester compound, the active ester compound disclosed in Japanese Patent Application Laid-Open No. 2004-277460 may be used, or a commercially available active ester compound may be used. Commercially available active ester compounds are specifically preferably active ester-based hardeners containing a dicyclopentadiene diphenol structure, active ester-based hardeners containing a naphthalene structure, and active esters containing an acetamidate of a phenolic compound. Type hardeners, active ester hardeners containing benzamidine compounds containing phenolic form, more preferably active ester hardeners containing a naphthalene structure, and active ester hardeners containing a dicyclopentadiene diphenol structure. Active ester hardeners containing a dicyclopentadiene diphenol structure include, for example, EXB 9451, EXB 9460, EXB 9460S, HPC-8000-65T (manufactured by DIC (stock), active ester hardeners containing a naphthalene structure, for example There is EXB9416-70BK (manufactured by DIC), and active ester-based hardeners containing acetic acid compounds of phenolic compounds. For example, there is YLH1026 (Mitsubishi Chemical Corporation).

(B)活性酯化合物之含量,從提高耐熱性及抑制樹脂殘渣發生的觀點,樹脂組成物中之不揮發成分為 100質量%時,較佳為30質量%以下,更佳為20質量%以下,又更佳為10質量%以下。又,從提高剝離強度的觀點,樹脂組成物中之不揮發成分為100質量%時,較佳為1質量%以上,更佳為3質量%以上,又更佳為5質量%以上。 (B) The content of the active ester compound, from the viewpoint of improving heat resistance and suppressing the occurrence of resin residue, the non-volatile components in the resin composition are When it is 100% by mass, it is preferably 30% by mass or less, more preferably 20% by mass or less, and still more preferably 10% by mass or less. From the viewpoint of improving the peel strength, when the non-volatile content in the resin composition is 100% by mass, it is preferably 1% by mass or more, more preferably 3% by mass or more, and even more preferably 5% by mass or more.

又,(A)環氧樹脂之環氧基數為1時,從提高樹脂組成物之機械特性的觀點,(B)活性酯化合物之反應基數較佳為0.2~2,更佳為0.3~1.5,又更佳為0.4~1。在此,「環氧樹脂之環氧基數」係指存在於樹脂組成物中之各環氧樹脂之固形分質量除以環氧當量的值,對於所有環氧樹脂之合計的值。又,「反應基」係指可與環氧基反應的官能基,而「活性酯化合物之反應基數」係指存在於樹脂組成物中之活性酯化合物之固形分質量除以反應基當量的值全部合計的值。 In addition, when the epoxy group number of the (A) epoxy resin is 1, from the viewpoint of improving the mechanical properties of the resin composition, the number of reactive groups of the (B) active ester compound is preferably 0.2 to 2, and more preferably 0.3 to 1.5. It is more preferably 0.4 to 1. Here, the "epoxy number of epoxy resin" refers to a value obtained by dividing the solid content of each epoxy resin present in the resin composition by the epoxy equivalent, and the total value for all epoxy resins. The "reactive group" refers to a functional group capable of reacting with an epoxy group, and the "reactive group number of the active ester compound" refers to a value obtained by dividing the solid content mass of the active ester compound present in the resin composition by the equivalent of the reactive group. The total value of all.

<(C)樹脂殘渣抑制成分> <(C) Resin residue suppression component>

本發明中使用的樹脂殘渣抑制成分係可抑制樹脂組成物之硬化物進行開孔加工,粗化處理後之導通孔的樹脂殘渣的成分。其中,樹脂殘渣抑制係指包含減少開孔加工時所產生之樹脂殘渣量,及在粗化處理時更容易除去樹脂殘渣之任一者。樹脂殘渣抑制成分例如有有機系樹脂殘渣抑制成分、無機系樹脂殘渣抑制成分,從提高絕緣信賴性的觀點,較佳為有機系樹脂殘渣抑制成分。具體而言,有機系樹脂殘渣抑制成分例如有顏料、染料、橡膠粒子、抗氧 化劑、紅外線吸收劑等,而無機系樹脂殘渣抑制成分例如有金屬化合物粉、金屬粉等。(C)樹脂殘渣抑制成分較佳為使用選自顏料、染料、橡膠粒子、抗氧化劑及紅外線吸收劑所成群之1種以上。此等中,從樹脂殘渣抑制能優異、剝離強度也優異的觀點,更佳為顏料及/或橡膠粒子,又更佳為顏料。此等可使用1種或組合2種以上使用。 The resin residue-suppressing component used in the present invention is a component that can suppress the resin residue of the through-holes of the hardened product of the resin composition after roughening treatment. Here, the term "resin residue suppression" refers to either of reducing the amount of resin residues generated during the hole-opening process and making it easier to remove the resin residues during roughening. The resin residue suppression component includes, for example, an organic resin residue suppression component and an inorganic resin residue suppression component. From the viewpoint of improving insulation reliability, an organic resin residue suppression component is preferred. Specifically, the organic resin residue suppression component includes, for example, pigments, dyes, rubber particles, and antioxidants. Chemical agents, infrared absorbers, etc., and the inorganic resin residue suppressing components include, for example, metal compound powders and metal powders. (C) The resin residue suppressing component is preferably one or more selected from the group consisting of pigments, dyes, rubber particles, antioxidants, and infrared absorbers. Among these, pigments and / or rubber particles are more preferable, and pigments are more preferable from the viewpoints of excellent resin residue suppression performance and excellent peel strength. These can be used singly or in combination of two or more kinds.

顏料例如有藍色顏料、黃色顏料、紅色顏料、黑色顏料、綠色顏料等。藍色顏料例如有酞花菁系、蒽醌系、二噁嗪系等之顏料。黃色顏料例如有單偶氮系、雙偶氮(DISAZO)系、縮合偶氮系、苯並咪唑酮(Benzimidazolone)系、異吲哚啉酮(isoindolinone)系、蒽醌系等之顏料。紅色顏料例如有單偶氮系、雙偶氮系、偶氮色澱(AZO LAKE)系、苯並咪唑酮系、苝系、二酮基吡咯并吡咯(Diketopyrrolopyrrole)系、縮合偶氮系、蒽醌系、喹吖酮系等之顏料。黑色顏料例如有碳黑、石墨等。綠色顏料例如有酞花菁系等之顏料。顏料可使用1種或併用2種以上,可適當調配選自由藍色顏料、黃色顏料、紅色顏料、黑色顏料及綠色顏料所成群之1種以上。其中從可進一步提高絕緣信賴性的觀點,較佳為使用選自由藍色顏料、黃色顏料、紅色顏料及綠色顏料所成群之1種以上,更佳為使用混合藍色顏料、黃色顏料及紅色顏料所成的混合顏料。又調製混合藍色顏料、黃色顏料及紅色顏料所成之混合顏料時,可有效地吸收開孔加工時之 雷射,從更能抑制樹脂殘渣發生的觀點,藍色顏料、黃色顏料及紅色顏料之質量比,較佳為2~6:5~9:6~10,更佳為3~5:6~8:7~9。 Examples of the pigment include a blue pigment, a yellow pigment, a red pigment, a black pigment, and a green pigment. Examples of the blue pigment include phthalocyanine-based, anthraquinone-based, and dioxazine-based pigments. Examples of yellow pigments include monoazo-based, disazo-based, condensed azo-based, benzimidazolone-based, isoindolinone-based, and anthraquinone-based pigments. Examples of red pigments are monoazo-based, disazo-based, azo lake (AZO LAKE) -based, benzimidazolone-based, fluorene-based, diketopyrrolopyrrole-based, condensed azo-based, anthracene Pigments such as quinone and quinacridone. Examples of the black pigment include carbon black and graphite. Examples of the green pigment include phthalocyanine-based pigments. One kind of pigment may be used, or two or more kinds may be used in combination, and one or more kinds selected from the group consisting of a blue pigment, a yellow pigment, a red pigment, a black pigment, and a green pigment may be appropriately blended. Among them, from the viewpoint of further improving insulation reliability, it is preferred to use one or more members selected from the group consisting of blue pigments, yellow pigments, red pigments, and green pigments, and more preferably to use a mixture of blue pigments, yellow pigments, and red pigments. A pigment made from pigments. In addition, when a mixed pigment made by mixing blue pigment, yellow pigment, and red pigment is prepared, it can effectively absorb Laser, from the viewpoint of more inhibiting the occurrence of resin residue, the mass ratio of blue pigment, yellow pigment and red pigment is preferably 2 ~ 6: 5 ~ 9: 6 ~ 10, more preferably 3 ~ 5: 6 ~ 8: 7 ~ 9.

染料例如有偶氮(單偶氮、雙偶氮等)染料、偶氮-次甲基染料、蒽醌系染料、喹啉染料、酮亞胺染料、熒光酮(fluorone)染料、硝基染料、呫噸染料、苊萘染料、喹啉黃染料、胺基酮染料、次甲基染料、苝染料、香豆素染料、迫位酮(perinone)染料、三苯基染料、三烯丙基甲烷染料、酞花菁染料、吲哚酚染料、三嗪染料、或此等之混合物等。 Examples of the dye include azo (monoazo, disazo, etc.) dyes, azo-methine dyes, anthraquinone dyes, quinoline dyes, ketimine dyes, fluorone dyes, nitro dyes, Xanthene Dyes, Naphthalene Dyes, Quinoline Yellow Dyes, Amino Ketone Dyes, Methylene Dyes, Perylene Dyes, Coumarin Dyes, Perinone Dyes, Triphenyl Dyes, Triallyl Methane Dyes , Phthalocyanine dyes, indoxyl dyes, triazine dyes, or mixtures thereof.

橡膠粒子例如有芯殼型橡膠粒子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙烯丁二烯橡膠粒子、丙烯酸橡膠粒子等。蕊殼型橡膠粒子為具有芯層與殼層之橡膠粒子,例如外層之殼層以玻璃狀聚合物所構成,內層之芯層以橡膠狀聚合物所構成的二層構造,或外層之殼層以玻璃狀聚合物所構成,中間層以橡膠狀聚合物所構成,芯層以玻璃狀聚合物所構成之三層構造者等。 Examples of the rubber particles include core-shell type rubber particles, crosslinked acrylonitrile butadiene rubber particles, crosslinked styrene butadiene rubber particles, acrylic rubber particles, and the like. Core-shell type rubber particles are rubber particles having a core layer and a shell layer. For example, the outer layer of the shell layer is composed of a glass-like polymer, the inner layer of the core layer is composed of a two-layer structure composed of a rubber-like polymer, or the outer layer of the shell The layer is composed of a glass-like polymer, the intermediate layer is composed of a rubber-like polymer, and the core layer is composed of a three-layer structure composed of a glass-like polymer.

抗氧化劑例如有受阻酚(hindered phenol)系抗氧化劑、磷系抗氧化劑、硫系抗氧化劑等。市售品例如有季戊四醇四[3-(3,5-二-tert-丁基-4-羥基苯基)丙酸酯](CIBA JAPAN(股)製「IRGANOX 1010」)、2,2-硫代-二亞甲基雙[3-(3,5-二-tert-丁基-4-羥基苯基)丙酸酯](CIBA JAPAN(股)製「IRGANOX 1035」)、1,3,5-三[[3,5-雙(1,1-二甲基乙基)-4-羥基苯基]甲基]-1,3,5-三 嗪-2,4,6(1H,3H,5H)-三酮(CIBA JAPAN(股)製「IRGANOX 3114」)等。 Examples of the antioxidant include hindered phenol-based antioxidants, phosphorus-based antioxidants, and sulfur-based antioxidants. Commercial products include, for example, pentaerythritol tetrakis [3- (3,5-di-tert-butyl-4-hydroxyphenyl) propionate] ("IRGANOX 1010" manufactured by CIBA JAPAN) and 2,2-sulfur Substituted-dimethylenebis [3- (3,5-di-tert-butyl-4-hydroxyphenyl) propionate] ("IRGANOX 1035" by CIBA JAPAN), 1, 3, 5 -Tris [[3,5-bis (1,1-dimethylethyl) -4-hydroxyphenyl] methyl] -1,3,5-tris Azine-2,4,6 (1H, 3H, 5H) -trione ("IRGANOX 3114" manufactured by CIBA JAPAN).

紅外線吸收劑例如有酞花菁系化合物、蒽醌化合物、鎳錯合物等。市售品例如有IR-14(日本觸媒(股)製)、TX-HA-1(日本觸媒(股)製)等。 Examples of the infrared absorber include a phthalocyanine-based compound, an anthraquinone compound, and a nickel complex. Commercial products include, for example, IR-14 (manufactured by Japan Catalysts Co., Ltd.) and TX-HA-1 (manufactured by Japan Catalysts Co., Ltd.).

金屬化合物粉例如有氧化鈦等之氧化鈦類、氧化鎂等之氧化鎂類、氧化鐵等之鐵氧化物、氧化鎳等之鎳氧化物、二氧化錳、氧化鋅等之鋅氧化物、二氧化矽、氧化鋁、稀土類氧化物、氧化鈷等之鈷氧化物、氧化錫等之錫氧化物、氧化鎢等之鎢氧化物、碳化矽、碳化鎢、氮化硼、氮化矽、氮化鈦、氮化鋁、硫酸鋇、稀土類酸硫化物、或此等之混合物之粉末等。 Examples of the metal compound powder include titanium oxides such as titanium oxide, magnesium oxides such as magnesium oxide, iron oxides such as iron oxide, nickel oxides such as nickel oxide, zinc oxides such as manganese dioxide, zinc oxide, and the like. Silicon oxide, aluminum oxide, rare earth oxide, cobalt oxide such as cobalt oxide, tin oxide such as tin oxide, tungsten oxide such as tungsten oxide, silicon carbide, tungsten carbide, boron nitride, silicon nitride, nitrogen Titanium nitride, aluminum nitride, barium sulfate, rare-earth acid sulfide, or a mixture of these powders.

金屬粉例如有銀、鋁、鉍、鈷、銅、鐵、鎂、錳、鉬、鎳、鈀、銻、矽、錫、鈦、釩、鎢、鋅、或此等之合金或混合物之粉末等。 Examples of metal powder include silver, aluminum, bismuth, cobalt, copper, iron, magnesium, manganese, molybdenum, nickel, palladium, antimony, silicon, tin, titanium, vanadium, tungsten, zinc, or powders of alloys or mixtures thereof. .

(C)樹脂殘渣抑制成分之含量,從防止硬化物性降低的觀點,相對於樹脂組成物中之不揮發成分100質量%,較佳為10質量%以下,更佳為5質量%以下,又更佳為4質量%以下,又更佳為3質量%以下,特佳為2質量%以下。又,從提高樹脂殘渣抑制能的觀點,相對於樹脂組成物中之不揮發成分100質量%,較佳為0.001質量%以上,更佳為0.01質量%以上,又更佳為0.02質量%以上,又更佳為0.05質量%以上,又更佳為0.08質量%以上,特佳為0.1質量%以上。 (C) The content of the resin residue inhibiting component is, from the viewpoint of preventing deterioration in hardened properties, preferably 100% by mass or less, more preferably 5% by mass or less, and more preferably 100% by mass of the nonvolatile matter in the resin composition. It is preferably 4% by mass or less, more preferably 3% by mass or less, and particularly preferably 2% by mass or less. In addition, from the viewpoint of improving the resin residue suppression performance, it is preferably 0.001% by mass or more, more preferably 0.01% by mass or more, and even more preferably 0.02% by mass or more, with respect to 100% by mass of the nonvolatile matter in the resin composition. It is more preferably 0.05% by mass or more, still more preferably 0.08% by mass or more, and particularly preferably 0.1% by mass or more.

<(D)無機填充材> <(D) inorganic filler>

本發明之樹脂組成物為了降低線熱膨脹率及提高粗化處理時之樹脂殘渣除去性,可再含有(D)無機填充材。(D)無機填充材例如有二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。其中以二氧化矽為佳。又,二氧化矽以無定形二氧化矽、粉碎二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等為佳,熔融二氧化矽為更佳。又,二氧化矽以球狀之二氧化矽為佳。此等可1種或組合2種以上使用。市售之球狀熔融二氧化矽,例如有(股)Admatechs製「SO-C2」、「SO-C1」。 The resin composition of the present invention may further contain (D) an inorganic filler in order to reduce the linear thermal expansion rate and improve the resin residue removal property during roughening treatment. (D) The inorganic fillers include, for example, silicon dioxide, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, aluminum borate, and titanium. Barium acid, strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate and the like. Among them, silicon dioxide is preferred. In addition, amorphous silicon dioxide, pulverized silicon dioxide, fused silicon dioxide, crystalline silicon dioxide, synthetic silicon dioxide, hollow silicon dioxide, etc. are preferred, and fused silicon dioxide is more preferred. The silica is preferably spherical silica. These can be used singly or in combination of two or more kinds. Commercially available spherical fused silica includes, for example, "SO-C2" and "SO-C1" manufactured by Admatechs.

(D)無機填充材之平均粒徑,並未特別限定,從在絕緣層上形成微細配線的觀點,無機填充材之平均粒徑之上限值以增加無機填充材之總表面積,抑制開孔加工時產生樹脂殘渣的觀點,以5μm以下為佳,以3μm以下為更佳,以1μm以下又更佳,0.7μm以下更佳,0.5μm以下更佳,以0.4μm以下為特佳,以0.3μm以下特別佳。另一方面,無機填充材之平均粒徑之下限值,當環氧樹脂組成物作為清漆時,從防止清漆之黏度上升、操作性降低的觀點,以0.01μm以上為佳,以0.03μm以上為更佳,以0.05μm以上又更佳,以0.07μm以上更佳,以 0.1μm以上為特佳。上述無機充填材之平均粒徑可藉由依據米氏(Mie)散射理論之雷射衍射.散射法測定。具體而言,藉由雷射衍射式粒度分布測定裝置,以體積基準作成無機充填材之粒度分布,可將中位徑以平均粒徑來測定。 測定試料較佳為使用將無機充填材藉由超音波分散於水中者。雷射衍射式粒度分布測定裝置,可使用(股)堀場製作所製LA-500、750、950等。 (D) The average particle diameter of the inorganic filler is not particularly limited. From the viewpoint of forming fine wiring on the insulating layer, the upper limit of the average particle diameter of the inorganic filler increases the total surface area of the inorganic filler and suppresses openings. From the viewpoint of generating resin residue during processing, it is preferably 5 μm or less, more preferably 3 μm or less, even more preferably 1 μm or less, more preferably 0.7 μm or less, more preferably 0.5 μm or less, particularly preferably 0.4 μm or less, and 0.3 It is particularly preferable to be less than μm. On the other hand, when the epoxy resin composition is used as a varnish, the lower limit of the average particle diameter of the inorganic filler is preferably 0.01 μm or more, and 0.03 μm or more from the viewpoint of preventing an increase in the viscosity of the varnish and a decrease in workability. For the better, 0.05 μm or more is better, and 0.07 μm or more is better. It is particularly preferred that it is 0.1 μm or more. The average particle diameter of the above-mentioned inorganic filling materials can be determined by laser diffraction based on the Mie scattering theory. Determination by scattering method. Specifically, the particle size distribution of the inorganic filler is made on a volume basis by a laser diffraction type particle size distribution measuring device, and the median diameter can be measured by the average particle size. The measurement sample is preferably one in which an inorganic filler is dispersed in water by ultrasonic waves. The laser diffraction type particle size distribution measuring device can be LA-500, 750, 950, etc. manufactured by Horiba.

(D)無機填充材之含量,無特別限定,從防止將樹脂組成物作為薄膜形態時之可撓性降低的觀點,樹脂組成物中之不揮發成分為100質量%時,較佳為85質量%以下,更佳為80質量%以下,又更佳為75質量%以下。又,從降低絕緣層之熱膨脹率的觀點,增加無機填充材之總表面積、抑制開孔加工時之樹脂殘渣發生、粗化處理時容易除去樹脂殘渣的觀點,樹脂組成物中之不揮發成分為100質量%時,較佳為40質量%以上,更佳為50質量%以上,又更佳為60質量%以上,再更佳為70質量%以上。 (D) The content of the inorganic filler is not particularly limited, and from the viewpoint of preventing a reduction in flexibility when the resin composition is in the form of a film, when the non-volatile content in the resin composition is 100% by mass, it is preferably 85% by mass. % Or less, more preferably 80% by mass or less, and still more preferably 75% by mass or less. In addition, from the viewpoint of reducing the thermal expansion coefficient of the insulating layer, increasing the total surface area of the inorganic filler, suppressing the occurrence of resin residues during the hole-opening process, and easily removing the resin residues during the roughening process, the non-volatile components in the resin composition are When it is 100% by mass, it is preferably 40% by mass or more, more preferably 50% by mass or more, still more preferably 60% by mass or more, and even more preferably 70% by mass or more.

(D)無機填充材從提高耐濕性、分散性的觀點,較佳為以胺基矽烷系偶合劑、脲基矽烷系偶合劑、環氧基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、乙烯基矽烷系偶合劑、苯乙烯基矽烷系偶合劑、丙烯酸酯矽烷系偶合劑、異氰酸酯矽烷系偶合劑、硫(sulfide)矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑劑等之表面處理劑進行表面處理。其中,無機填充材以有機矽氮 烷化合物進行表面處理後,再以矽烷偶合劑進行表面處理,更提高無機填充材之耐濕性或分散性。此等可使用1種或組合2種以上使用。 (D) From the viewpoint of improving moisture resistance and dispersibility, the inorganic filler is preferably an amine-based silane-based coupling agent, a urea-based silane-based coupling agent, an epoxy-based silane-based coupling agent, a mercaptosilane-based coupling agent, or silane. Coupling Agent, Vinyl Silane Coupling Agent, Styryl Silane Coupling Agent, Acrylate Silane Coupling Agent, Isocyanate Silane Coupling Agent, Sulfide Silane Coupling Agent, Organic Silazane Compound, Titanate Surface treatment agents such as coupling agents are surface-treated. Organic inorganic nitrogen After the surface treatment of the alkane compound, the surface treatment with the silane coupling agent is performed to further improve the moisture resistance or dispersibility of the inorganic filler. These can be used singly or in combination of two or more kinds.

具體而言,例如有3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基二乙氧基甲基矽烷、N-苯基-3-胺基丙基三甲氧基矽烷、N-甲基胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基二甲氧基甲基矽烷等之胺基矽烷系偶合劑、3-脲基丙基三乙氧基矽烷等之脲基矽烷系偶合劑、3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基丙基甲氧基二乙氧基矽烷、3-縮水甘油氧基丙基(二甲氧基)甲基矽烷、縮水甘油基丁基三甲氧基矽烷、2-(3,4-乙氧基環己基)乙基三甲氧基矽烷等之環氧基矽烷系偶合劑、3-巰基丙基三甲氧基矽烷、3-巰基丙基三乙氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、11-巰基十一烷基三甲氧基矽烷等之巰基矽烷系偶合劑、甲基三甲氧基矽烷、十八烷基三甲氧基矽烷、苯基三甲氧基矽烷、甲基甲基丙烯醯氧基(methacryloxy)丙基三甲氧基矽烷、咪唑矽烷、三嗪矽烷、tert-丁基三甲氧基矽烷等之矽烷系偶合劑、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基甲基二乙氧基矽烷等之乙烯基矽烷系偶合劑、p-苯乙烯基三甲氧基矽烷等之苯乙烯基矽烷系偶合劑、3-丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-甲基丙烯 醯氧基丙基二甲氧基矽烷、3-甲基丙烯醯氧基丙基三乙氧基矽烷、3-甲基丙烯醯氧基丙基二乙氧基矽烷等之丙烯酸酯矽烷系偶合劑、3-異氰酸酯丙基三甲氧基矽烷等之異氰酸酯矽烷系偶合劑、雙(三乙氧基矽烷基丙基)二硫、雙(三乙氧基矽烷基丙基)四硫等之硫矽烷系偶合劑、六甲基二矽氮烷、1,3-二乙烯基-1,1,3,3-四甲基二矽氮烷、六苯基二矽氮烷、三矽氮烷、環三矽氮烷、2,2,4,4,6,6-六甲基環三矽氮烷、八甲基環四矽氮烷、六丁基二矽氮烷、六辛基二矽氮烷、1,3-二乙基四甲基二矽氮烷、1,3-二-n-辛基四甲基二矽氮烷、1,3-二苯基四甲基二矽氮烷、1,3-二甲基四苯基二矽氮烷、1,3-二乙基四甲基二矽氮烷、1,1,3,3-四苯基-1,3-二甲基二矽氮烷、1,3-二丙基四甲基二矽氮烷、六甲基環三矽氮烷、二甲基胺基三甲基矽氮烷、四甲基二矽氮烷等之有機矽氮烷化合物、四-n-丁基鈦酸丁酯二聚物、i-丙氧基辛二醇鈦、四-n-丁基鈦酸酯、辛二醇鈦、二異丙氧基鈦雙(三乙醇戊酸酯)、二羥基雙乳酸鈦、二羥基雙(乳酸銨)鈦、雙(二辛基焦磷酸酯)伸乙基鈦酸酯、雙(二辛基焦磷酸酯)氧基乙酸酯鈦酸酯、三正丁氧基單硬脂酸鈦、鈦酸四正丁酯、四(2-乙基己基)鈦酸酯、四異丙基雙(二辛基磷酸酯)鈦酸酯、四辛基雙(二(十三烷基)磷酸酯)鈦酸酯、四(2,2-二烯丙氧基甲基-1-丁基)雙(二(十三烷基))磷酸酯鈦酸酯、異丙基三辛醯基鈦酸酯、異丙基三枯基苯基鈦酸酯、異丙基三異硬脂醯基鈦酸酯、異丙基異硬脂醯基二丙烯醯基鈦酸 酯、異丙基二甲基丙烯醯基異硬脂醯基鈦酸酯、異丙基三(二辛基磷酸酯)鈦酸酯、異丙基三(十二烷基)苯磺醯基鈦酸酯、異丙基三(二辛基焦磷酸酯)鈦酸酯、異丙基三(N-醯胺基乙基.胺基乙基)鈦酸酯等鈦酸酯矽偶合劑等。此等中,胺基矽烷系偶合劑再耐濕性、分散性、硬化物之特性等優異,故較佳,有機矽氮烷化合物在提高樹脂清漆之分散性方面優異,故較佳。表面處理劑之市售品例如有信越化學工業(股)製「KBM403」(3-縮水甘油氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)等。 Specific examples include 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyldiethoxymethylsilane, and N-phenyl-3- Aminopropyltrimethoxysilane, N-methylaminopropyltrimethoxysilane, N- (2-aminoethyl) -3-aminopropyltrimethoxysilane, N- (2-amine (Ethylethyl) -3-aminopropyldimethoxymethylsilane and other aminosilane-based coupling agents, 3-ureidopropyltriethoxysilane and other urea-based silane coupling agents, 3-shrink Glyceryloxypropyltrimethoxysilane, 3-glycidoxypropyltriethoxysilane, 3-glycidoxypropylmethoxydiethoxysilane, 3-glycidoxypropyl ( Dimethoxy) methylsilane, glycidylbutyltrimethoxysilane, 2- (3,4-ethoxycyclohexyl) ethyltrimethoxysilane, and other epoxysilane-based coupling agents, 3- Mercaptosilane coupling agents such as mercaptopropyltrimethoxysilane, 3-mercaptopropyltriethoxysilane, 3-mercaptopropylmethyldimethoxysilane, 11-mercaptoundecyltrimethoxysilane, etc. , Methyltrimethoxysilane, octadecyltrimethoxysilane , Silane-based coupling agents such as phenyltrimethoxysilane, methacryloxy, propyltrimethoxysilane, imidazole silane, triazine silane, tert-butyltrimethoxysilane, vinyl Trimethoxysilane, vinyltriethoxysilane, vinylmethyldiethoxysilane, vinyl silane-based coupling agents, p-styryltrimethoxysilane, styrene-based silane-based coupling agents, 3-propenyloxypropyltrimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-methylpropylene Acrylic silane-based coupling agents such as methoxypropyldimethoxysilane, 3-methacryloxypropyltriethoxysilane, and 3-methacryloxypropyldiethoxysilane , Isocyanate silane coupling agents such as 3-isocyanatepropyltrimethoxysilane, thiosilanes such as bis (triethoxysilylpropyl) disulfide, bis (triethoxysilylpropyl) tetrasulfide, etc. Coupling agent, hexamethyldisilazane, 1,3-divinyl-1,1,3,3-tetramethyldisilazane, hexaphenyldisilazane, trisilazane, cyclotris Silazane, 2,2,4,4,6,6-hexamethylcyclotrisilazane, octamethylcyclotetrasilazane, hexabutyldisilazane, hexaoctyldisilazane, 1,3-diethyltetramethyldisilazane, 1,3-di-n-octyltetramethyldisilazane, 1,3-diphenyltetramethyldisilazane, 1, 3-dimethyltetraphenyldisilazane, 1,3-diethyltetramethyldisilazane, 1,1,3,3-tetraphenyl-1,3-dimethyldisilazane Organosilicon nitrogen, 1,3-dipropyltetramethyldisilazane, hexamethylcyclotrisilazane, dimethylaminotrimethylsilazane, tetramethyldisilazane, etc. Alkanes, tetra-n-butane Butyl titanate dimer, i-propoxy titanium octanediol, tetra-n-butyl titanate, titanium octanediol, titanium diisopropoxy bis (triethanolvalerate), dihydroxy Titanium lactate, titanium dihydroxybis (ammonium lactate), bis (dioctyl pyrophosphate) ethylene titanate, bis (dioctyl pyrophosphate) oxyacetate titanate, tri-n-butyl Oxymonostearate, tetra-n-butyl titanate, tetra (2-ethylhexyl) titanate, tetraisopropylbis (dioctyl phosphate) titanate, tetraoctylbis (di ( Tridecyl) phosphate) Titanate, tetra (2,2-diallyloxymethyl-1-butyl) bis (di (tridecyl)) phosphate titanate, isopropyl Trioctylfluorenyl titanate, isopropyltricumylphenyl titanate, isopropyltriisostearylfluorenyl titanate, isopropylisostearylfluorenyldipropenylfluorenyl titanate Ester, isopropyldimethylpropenyl isostearyl isopropyl titanate, isopropyl tri (dioctyl phosphate) titanate, isopropyl tri (dodecyl) benzenesulfonyl titanium Esters, isopropyl tris (dioctyl pyrophosphate) titanates, isopropyl tris (N-fluorenylaminoethyl.aminoethyl) titanates, and other titanate silicon coupling agents. Among these, an amine-based silane-based coupling agent is preferred because it is excellent in re-moisture resistance, dispersibility, and characteristics of hardened materials, and an organosilazane compound is excellent in improving the dispersibility of a resin varnish. Commercially available products of the surface treatment agent are, for example, "KBM403" (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and "KBM803" (3-mercaptopropyl) manufactured by Shin-Etsu Chemical Industry Co., Ltd. (Trimethoxysilane), "KBE903" (3-aminopropyltriethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and "KBM573" (N-phenyl-3-amino) manufactured by Shin-Etsu Chemical Industry Co., Ltd. Propyltrimethoxysilane) and the like.

又,以表面處理劑進行表面處理後的無機填充材,可測定藉由溶劑(例如甲基乙基酮)洗淨處理後之無機充填材之每單位重量的碳量。其中,「無機填充材之每單位重量的碳量」係指鍵結於無機填充材1g之碳量(g)以百分比表示者。具體而言,將充分量之MEK作為溶劑加入於以表面處理劑進行表面處理後之無機充填材,25℃下進行超音波洗淨5分鐘。去除上清液,使固體成分乾燥後,使用碳分析儀測定無機充填材之每單位重量的碳量。碳分析儀可使用堀場製作所製「EMIA-320V」等。 In addition, the inorganic filler after the surface treatment with the surface treatment agent can measure the amount of carbon per unit weight of the inorganic filler after the cleaning treatment with a solvent (for example, methyl ethyl ketone). The "carbon content per unit weight of the inorganic filler" refers to the amount of carbon (g) bonded to 1 g of the inorganic filler, which is expressed as a percentage. Specifically, a sufficient amount of MEK was added as a solvent to an inorganic filler after surface treatment with a surface treatment agent, and ultrasonic cleaning was performed at 25 ° C. for 5 minutes. After removing the supernatant and drying the solid content, the carbon content per unit weight of the inorganic filler was measured using a carbon analyzer. As the carbon analyzer, "EMIA-320V" manufactured by Horiba, etc. can be used.

無機填充材之每單位重量的碳量,從使提高無機填充材之分散性或硬化物之粗化處理後之均方根粗度 安定的觀點,較佳為0.02%以上,更佳為0.05%以上,又更佳為0.1%以上。另外從防止樹脂清漆之溶融黏度或接著薄膜形態之溶融黏度上昇的觀點,較佳為3%以下,更佳為2%以下,更佳為1%以下。 The amount of carbon per unit weight of the inorganic filler increases from the root-mean-square roughness of the inorganic filler to improve the dispersibility of the inorganic filler or the roughening of the hardened material. A stable viewpoint is preferably 0.02% or more, more preferably 0.05% or more, and still more preferably 0.1% or more. In addition, from the viewpoint of preventing an increase in the melt viscosity of the resin varnish or the melt viscosity of the film form, it is preferably 3% or less, more preferably 2% or less, and even more preferably 1% or less.

<(E)硬化促進劑> <(E) Hardening accelerator>

本發明之樹脂組成物,為了調整硬化時間及硬化溫度等,可進一步含有(E)硬化促進劑。(E)硬化促進劑無特別限定,例如有咪唑系硬化促進劑、胺系硬化促進劑、有機膦(PHOSPHINE)化合物、有機鏻鹽化合物等。此等可1種或組合2種以上使用。 The resin composition of the present invention may further contain (E) a hardening accelerator in order to adjust the hardening time, the hardening temperature, and the like. (E) The hardening accelerator is not particularly limited, and examples thereof include an imidazole-based hardening accelerator, an amine-based hardening accelerator, an organic phosphine (PHOSPHINE) compound, and an organic sulfonium salt compound. These can be used singly or in combination of two or more kinds.

咪唑系硬化促進劑例如有2-甲基咪唑、2-十一基咪唑、2-十七基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一基咪唑、1-氰乙基-2-乙基-4-甲基咪唑、1-氰乙基-2-苯基咪唑、1-氰乙基-2-十一基咪唑鎓偏苯三甲酸酯、1-氰乙基-2-苯基咪唑鎓偏苯三甲酸酯、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異三聚氰酸加成物、2-苯基咪唑異三聚氰酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲 基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苄基咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等之咪唑化合物及咪唑化合物與環氧樹脂之加成物。此等可1種或組合2種以上使用。 Examples of the imidazole-based hardening accelerator include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 1,2 -Dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2-methylimidazole, 1-benzyl- 2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1- Cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenylimidazolium trimellitate, 2,4 -Diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-undecylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-ethyl-4'-methylimidazolyl- (1')]-ethyl-s- Triazine, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine isocyanuric acid adduct, 2-phenylimidazolium Cyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl Methyl-5-hydroxymethylimidazole, 2,3-dihydro-1H-pyrrole [1,2-a] benzimidazole, 1-dodecyl-2-methyl-3-benzylimidazolium chloride , 2-methylimidazoline, 2-phenylimidazoline and other imidazole compounds and adducts of imidazole compounds and epoxy resins. These can be used singly or in combination of two or more kinds.

胺系硬化促進劑例如有三乙基胺、三丁基胺等之三烷基胺、4-二甲基胺基吡啶、苄基二甲基胺、2,4,6,-參(二甲基胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一烯(以下簡稱為DBU)等之胺化合物等。此等可1種或組合2種以上使用。 Examples of the amine-based hardening accelerator include trialkylamines such as triethylamine, tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, and 2,4,6, -ginseng (dimethyl Amine compounds such as aminomethyl) phenol, 1,8-diazabicyclo (5,4,0) -undecene (hereinafter abbreviated as DBU), and the like. These can be used singly or in combination of two or more kinds.

有機膦化合物、有機鏻鹽化合物,例如有TPP、TPP-K、TPP-S、TPTP-S、TBP-DA、TPP-SCN、TPTP-SCN(北興化學工業(股)商品名)等。此等可1種或組合2種以上使用。 Examples of the organic phosphine compound and the organic phosphonium salt compound include TPP, TPP-K, TPP-S, TPTP-S, TBP-DA, TPP-SCN, and TPTP-SCN (beixing chemical industry (stock) trade name). These can be used singly or in combination of two or more kinds.

(E)硬化促進劑之含量,從樹脂清漆之保存安定性或硬化之效率化的觀點,相對於樹脂組成物中之不揮發成分100質量%,較佳為0.01~3質量%,更佳為0.1~2質量%。 (E) The content of the hardening accelerator is preferably 0.01 to 3% by mass, and more preferably 100% by mass of the nonvolatile component in the resin composition, from the viewpoint of storage stability of the resin varnish or efficiency of hardening. 0.1 ~ 2 mass%.

<(F)熱可塑性樹脂> <(F) thermoplastic resin>

本發明之樹脂組成物中,使其再含有(F)熱可塑性樹脂,可將由該樹脂組成物所得之樹脂清漆之黏度調整為適當的範圍,可提高硬化物之可撓性。熱可塑性樹脂無特別限定,例如有苯氧基樹脂、聚乙醯基縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醯胺樹脂、聚醚碸樹脂、 聚碸樹脂、聚丁二烯樹脂、ABS樹脂等。其中,從提高硬化物之考撓性、有助於密著性的觀點,較佳為苯氧基樹脂、聚乙醯基縮醛樹脂,更佳為苯氧基樹脂。此等可1種或組合2種以上使用。熱可塑性樹脂較佳為玻璃轉化溫度為80℃以上者。 The resin composition of the present invention further contains (F) a thermoplastic resin, and the viscosity of the resin varnish obtained from the resin composition can be adjusted to an appropriate range, and the flexibility of the cured product can be improved. The thermoplastic resin is not particularly limited, and examples thereof include phenoxy resin, polyvinylacetal resin, polyimide resin, polyimide resin, polyimide resin, polyether resin, Polyfluorene resin, polybutadiene resin, ABS resin, etc. Among these, from the viewpoints of improving the flexibility of the cured product and contributing to adhesion, a phenoxy resin and a polyethylene acetal resin are preferred, and a phenoxy resin is more preferred. These can be used singly or in combination of two or more kinds. The thermoplastic resin is preferably one having a glass transition temperature of 80 ° C or higher.

熱可塑性樹脂之重量平均分子量,較佳為5000~800000之範圍,更佳為10000~200000之範圍,又更佳為15000~150000之範圍,又更佳為20000~100000之範圍。在此範圍內時,可充分發揮薄膜成型能或提高機械強度的效果,提高與環氧樹脂之相溶性。本發明之重量平均分子量係以凝膠滲透層析(GPC)法(以聚苯乙烯換算)測定。藉由GPC法所測定之重量平均分子量,具體而言,測定裝置使用(股)島津製作所製LC-9A/RID-6A,管柱使用昭和電工(股)公司製Shodex K-800P/K-804L/K-804L,移動相使用氯仿等,在管柱溫度40℃下測定,使用標準聚苯乙烯之檢量線算出重量平均分子量。 The weight average molecular weight of the thermoplastic resin is preferably in the range of 5,000 to 800,000, more preferably in the range of 10,000 to 200,000, still more preferably in the range of 15,000 to 150,000, and still more preferably in the range of 20,000 to 100,000. When it is within this range, the effect of film forming energy or mechanical strength can be fully exerted, and compatibility with epoxy resin can be improved. The weight average molecular weight of the present invention is measured by a gel permeation chromatography (GPC) method (in terms of polystyrene). The weight-average molecular weight measured by the GPC method, specifically, a measuring device using LC-9A / RID-6A manufactured by Shimadzu Corporation, and a column used Shodex K-800P / K-804L manufactured by Showa Denko Corporation / K-804L, the mobile phase was measured with chloroform, etc. at a column temperature of 40 ° C, and the weight average molecular weight was calculated using a calibration curve of standard polystyrene.

苯氧基樹脂例如具有選自雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛骨架、聯苯骨架、茀骨架、二環戊二烯骨架、降莰烯骨架、萘骨架、蒽骨架、金剛烷骨架、萜烯(terpene)骨架、三甲基環己烷骨架之1種以上之骨架者。苯氧基樹脂可混合2種以上使用。苯氧基樹脂之末端可為酚性羥基、環氧基等之任一官能基。市售品例如有三菱化學(股)製1256、4250(含有雙酚A骨架之苯氧基樹脂)、三菱化學(股)製 YX8100(含有雙酚S骨架之苯氧基樹脂)、三菱化學(股)製YX6954(含有雙酚苯乙酮骨架之苯氧基樹脂)。市售品例如有新日鐵化學(股)製FX280、FX293、三菱化學(股)製YL7553、YL6954、YL6794、YL7213、YL7290、YL7482等。 The phenoxy resin has, for example, a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a phenolic skeleton, a biphenyl skeleton, a fluorene skeleton, a dicyclopentadiene skeleton, and norbornene. One of one or more of a skeleton, a naphthalene skeleton, an anthracene skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The phenoxy resin can be used as a mixture of two or more. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. Commercial products include, for example, Mitsubishi Chemical Corporation's 1256 and 4250 (phenoxy resin containing a bisphenol A skeleton), and Mitsubishi Chemical Corporation's YX8100 (phenoxy resin containing bisphenol S skeleton), YX6954 (phenoxy resin containing bisphenol acetophenone skeleton) manufactured by Mitsubishi Chemical Corporation. Commercial products include, for example, FX280, FX293 manufactured by Nippon Steel Chemical Co., Ltd., YL7553, YL6954, YL6794, YL7213, YL7290, YL7482, and the like manufactured by Mitsubishi Chemical Corporation.

聚乙醯基縮醛樹脂之具體例,例如有電化學工業(股)製、電化縮丁醛4000-2、5000-A、6000-C、6000-EP、積水化學工業(股)製s-lec BH系列、BX系列、KS系列、BL系列、BM系列等。聚醯亞胺樹脂之具體例,例如有新日本理化(股)製之聚醯亞胺「RIKACOAT SN20」及「RIKACOAT PN20」。又,使2官能性羥基末端聚丁二烯、二異氰酸酯化合物及四元酸酐(tetrabasic acid dianhydride)反應所得之線狀聚醯亞胺(日本特開2006-37083號公報記載者)、含有聚矽氧烷骨架之聚醯亞胺(日本特開2002-12667號公報、特開2000-319386號公報等所記載者)等之改質聚醯亞胺。聚醯胺醯亞胺樹脂之具體例,例如有東洋紡績(股)製之聚醯胺醯亞胺「VYLOMAX HR11NN」及「VYLOMAX HR16NN」。又,日立化成工業(股)製之含有聚矽氧烷骨架之聚醯胺醯亞胺「KS9100」、「KS9300」等之改質聚醯胺醯亞胺。聚醚碸樹脂之具體例,例如有住友化學(股)製之聚醚碸「PES5003P」等。聚碸樹脂之具體例,例如有solven Advanced polymers(股)製之聚碸「P1700」、「P3500」等。 Specific examples of the polyacetal acetal resin include, for example, those manufactured by the Electrochemical Industry Co., Ltd., electrochemical butyral 4000-2, 5000-A, 6000-C, 6000-EP, and Sekisui Chemical Industry Co., Ltd. lec BH series, BX series, KS series, BL series, BM series, etc. Specific examples of the polyimide resin include, for example, polyimide "RIKACOAT SN20" and "RIKACOAT PN20" made by Nippon Rika Co., Ltd. In addition, a linear polyimide obtained by reacting a bifunctional hydroxyl-terminated polybutadiene, a diisocyanate compound, and a tetrabasic acid dianhydride (as described in Japanese Patent Application Laid-Open No. 2006-37083), containing polysilicon Modified polyimide of an oxane skeleton (described in Japanese Patent Application Laid-Open No. 2002-12667, Japanese Patent Application Laid-Open No. 2000-319386) and the like. Specific examples of the polyamidoimide resin include, for example, polyamidoimide "VYLOMAX HR11NN" and "VYLOMAX HR16NN" manufactured by Toyobo Corporation. In addition, Hitachi Chemical Industries, Ltd. has modified polyamidoimines such as polyamidoimide "KS9100" and "KS9300" containing a polysiloxane skeleton. Specific examples of the polyether resin include, for example, polyether resin "PES5003P" manufactured by Sumitomo Chemical Co., Ltd. and the like. Specific examples of the polymer resin include, for example, polymer "P1700" and "P3500" made of solve advanced polymers.

熱可塑性樹脂之含量無特別限定,從薄片狀層合材料之融熔黏度調整或樹脂清漆黏度之調整的觀點,相對於樹脂組成物中之不揮發成分100質量%,較佳為0.5~30質量%,更佳為1~20質量%。 The content of the thermoplastic resin is not particularly limited. From the viewpoint of adjusting the melt viscosity of the laminar laminated material or adjusting the viscosity of the resin varnish, it is preferably 0.5 to 30 masses with respect to 100% by mass of the nonvolatile component in the resin composition. %, More preferably 1 to 20% by mass.

<(G)硬化劑> <(G) Hardener>

本發明之樹脂組成物中可再含有(G)硬化劑。藉此可提高樹脂組成物之硬化物之絕緣信賴性、剝離強度、機械特性。(G)硬化劑無特別限定,例如有酚系硬化劑、氰酸酯系硬化劑、苯并噁嗪(Benzoxazine)系硬化劑、酸酐系硬化劑等。此等可使用1種或組合2種以上使用。其中從提高樹脂殘渣除去性、提高介電特性的觀點,較佳為酚系硬化劑、氰酸酯系硬化劑。 The resin composition of the present invention may further contain (G) a hardener. This improves the insulation reliability, peel strength, and mechanical properties of the hardened material of the resin composition. (G) The hardener is not particularly limited, and examples thereof include a phenol-based hardener, a cyanate-based hardener, a Benzoxazine-based hardener, and an acid anhydride-based hardener. These can be used singly or in combination of two or more kinds. Among these, from the viewpoints of improving the removal of resin residues and improving the dielectric properties, phenol-based hardeners and cyanate-based hardeners are preferred.

酚系硬化劑無特別限定,例如有酚醛樹脂、含有三嗪骨架之酚醛樹脂、萘酚酚醛樹脂、萘酚芳烷基型樹脂、含有三嗪骨架之萘酚樹脂、聯苯基芳烷基型酚樹脂等。聯苯基芳烷基型酚樹脂例如有「MEH-7700」、「MEH-7810」、「MEH-7851」(明和化成(股)製)、NHN」、「CBN」、「GPH」(日本化藥(股)製)、萘酚芳烷基型樹脂例如有「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」(東都化成(股)製)、酚醛樹脂例如有「TD2090」(DIC(股)製)、含有三嗪骨架之酚醛樹脂例如有「LA3018」、「LA7052」、 「LA7054」、「LA1356」(DIC(股)製)等。酚系硬化劑可使用1種或併用2種以上。 The phenol-based hardener is not particularly limited, and examples thereof include a phenol resin, a phenol resin containing a triazine skeleton, a naphthol resin, a naphthol aralkyl resin, a naphthol resin containing a triazine skeleton, and a biphenylaralkyl resin. Phenol resin and so on. Examples of biphenylaralkyl phenol resins are "MEH-7700", "MEH-7810", "MEH-7851" (made by Meiwa Chemical Co., Ltd.), NHN "," CBN "," GPH "(Japanese version) (Made by Pharmaceutical Co., Ltd.) and naphthol aralkyl resins include, for example, "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN375", "SN395" (Product), phenol resins such as "TD2090" (manufactured by DIC), and phenol resins containing a triazine skeleton, such as "LA3018", "LA7052", "LA7054", "LA1356" (DIC (shares) system), etc. A phenolic hardener can be used individually by 1 type or in combination of 2 or more types.

氰酸酯系硬化劑,並未特別限制,例如有酚醛型(酚系酚醛型、烷基酚醛型等)氰酸酯系硬化劑、雙環戊二烯型氰酸酯系硬化劑、雙酚型(雙酚A型、雙酚F型、雙酚S型等)氰酸酯系硬化劑、及此等一部份經三嗪化之預聚物等。氰酸酯系硬化劑之重量平均分子量,並未有特別限定,以500~4500為佳,更佳為600~3000。氰酸酯系硬化劑之具體例,例如有雙酚A二氰酸酯、聚酚氰酸酯(寡(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂、酚醛、甲酚酚醛、含有二環戊二烯結構之酚樹脂等所衍生之多官能氰酸酯樹脂、此等氰酸酯樹脂一部份經三嗪化之預聚物等。此等可使用1種或組合2種以上使用。市售之氰酸酯樹脂,例如有酚醛(Phenol Novolac)型多官能氰酸酯樹脂(Lonza Japan(股)製,PT30、氰酸酯當量124)、雙酚A二氰酸酯之一部份或全部經三嗪化,成為三聚物的預聚物(Lonza Japan(股)製,BA230、氰酸酯當量232)、含有二環戊二烯結構之氰酸酯樹脂(Lonza Japan(股)製、DT- 4000、DT-7000)等。 The cyanate-based hardener is not particularly limited, and examples thereof include phenol-based (phenol-based phenol-based, alkylphenol-based, etc.) cyanate-based hardener, dicyclopentadiene-based cyanate-based hardener, and bisphenol-based (Bisphenol A type, bisphenol F type, bisphenol S type, etc.) cyanate ester hardeners, and some of these prepolymers are triazinated. The weight average molecular weight of the cyanate ester-based hardener is not particularly limited, but is preferably 500 to 4500, and more preferably 600 to 3000. Specific examples of the cyanate-based curing agent include, for example, bisphenol A dicyanate, polyphenol cyanate (oligo (3-methylene-1,5-phenylene cyanate), 4,4 ' -Methylenebis (2,6-dimethylphenylcyanate), 4,4'-ethylenediphenyldicyanate, hexafluorobisphenol A dicyanate, 2,2- Bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanatephenylmethane), bis (4-cyanate-3,5-dimethylphenyl) methane, 1, 3-bis (4-cyanatephenyl-1- (methylethylene)) benzene, bis (4-cyanatephenyl) sulfide, bis (4-cyanatephenyl) ether, etc. Polyfunctional cyanate resins derived from 2-functional cyanate resins, phenols, cresol novolacs, phenol resins containing a dicyclopentadiene structure, etc., part of these cyanate resins are prepolymerized with triazination These can be used alone or in combination of two or more. Commercially available cyanate resins include, for example, Phenol Novolac type polyfunctional cyanate resin (Lonza Japan Co., Ltd., PT30, cyanic acid). Ester equivalent 124), part or all of the bisphenol A dicyanate was triazinated to become a terpolymer prepolymer (manufactured by Lonza Japan Co., Ltd., BA230, cyanate equivalent 232), containing two Cyclopentane Alkenyl cyanate resin structures (Lonza Japan (shares) system, DT- 4000, DT-7000), etc.

苯并噁嗪系硬化劑無特別限定,具體而言,例如有F-a、P-d(四國化成(股)製)、HFB2006M(昭和高分子(股)製)等。 The benzoxazine-based hardener is not particularly limited, and specific examples include F-a, P-d (manufactured by Shikoku Kasei Co., Ltd.), HFB2006M (manufactured by Showa Polymer Co., Ltd.), and the like.

樹脂組成物中之(G)硬化劑之含量無特別限定,從防止樹脂組成物之硬化物變脆的觀點,相對於樹脂組成物中之不揮發成分100質量%,較佳為0.5~10質量%,更佳為1~6質量%。 The content of the (G) hardener in the resin composition is not particularly limited. From the viewpoint of preventing the hardened material of the resin composition from becoming brittle, it is preferably 0.5 to 10 mass% with respect to 100% by mass of the non-volatile content in the resin composition. %, More preferably 1 to 6 mass%.

<其他的成分> <Other ingredients>

本發明之樹脂組成物,必要時在不阻礙本發明效果的範圍,可摻合例如馬來醯亞胺化合物、雙烯丙烯基納迪醯亞胺(NADIIMIDE)化合物、乙烯基苄基樹脂、乙烯基苄醚樹脂等之熱硬化成分、矽粉、耐隆粉、氟粉等之有機充填劑、Orben、Benton等之增黏劑、聚矽氧系、氟系、高分子系之消泡劑或平坦劑、咪唑系、噻唑系、三唑系、矽烷系偶合劑等之密著性賦予劑、磷系化合物、氫氧化金屬等的難燃劑等。 The resin composition of the present invention may be blended with, for example, a maleimide compound, a diene propenyl nadiimide compound, a vinyl benzyl resin, ethylene, and the like, as long as the effect of the present invention is not hindered. Thermosetting ingredients such as benzyl ether resin, organic fillers such as silicon powder, durable powder, fluorine powder, tackifiers such as Orben, Benton, polysiloxane-based, fluorine-based, and polymer-based defoamers or Adhesion imparting agents such as leveling agents, imidazole-based, thiazole-based, triazole-based, and silane-based coupling agents; flame-retardants such as phosphorus-based compounds; and metal hydroxides.

本發明之樹脂組成物係將上述成分適當混合,又必要時,可藉由三輥、球磨機、珠磨機、砂磨機等之混練手段、或超級混合機、行星混合機等之攪拌手段進行混練或混合,製造樹脂清漆。本發明之樹脂組成物之硬化物可達成低介電損耗正切化,且可抑制將硬化物進行開孔加工、粗化處理後之導通孔內的樹脂殘渣。 The resin composition of the present invention appropriately mixes the above-mentioned ingredients, and if necessary, it can be carried out by a kneading means such as a three-roller, a ball mill, a bead mill, a sand mill, or the agitating means such as a super mixer, a planetary mixer, or the like. Knead or mix to make resin varnish. The hardened product of the resin composition of the present invention can achieve a low dielectric loss tangent, and can suppress the resin residue in the via hole after the hardened product is subjected to a hole-opening process and a roughening process.

本發明之樹脂組成物之硬化物之介電損耗正切,可藉由後述之<介電損耗正切之測定>所記載的方法測定。具體而言,可藉由空洞共振器攝動法在頻率5.8GHz、測定溫度23℃下測定。從防止高頻之發熱、信號延遲及信號雜訊之降低的觀點,介電損耗正切較佳為0.05以下,更佳為0.04以下,又更佳為0.03以下,又更佳為0.02以下,特佳為0.01以下。此外,介電損耗正切之下限值無特別限定,較佳為0.001以上。 The dielectric loss tangent of the hardened material of the resin composition of the present invention can be measured by the method described in <Measurement of Dielectric Loss Tangent> described later. Specifically, it can be measured by a cavity resonator perturbation method at a frequency of 5.8 GHz and a measurement temperature of 23 ° C. From the viewpoint of preventing high-frequency heating, signal delay, and reduction of signal noise, the dielectric loss tangent is preferably 0.05 or less, more preferably 0.04 or less, still more preferably 0.03 or less, and still more preferably 0.02 or less. It is 0.01 or less. The lower limit of the dielectric loss tangent is not particularly limited, but is preferably 0.001 or more.

本發明之樹脂組成物之硬化物之均方根粗度Rq可藉由後述<均方根粗度(Rq)之測定>所記載的測定方法測定。粗化處理後之絕緣層表面,從降低電信號之損失的觀點,成為微細之凹凸較佳。展現絕緣層表面之凹凸之緊密度者,例如有均方根粗度Rq。藉由此指標不僅絕緣層表面之凹凸的平均值,且可知絕緣層表面成為緊密的凹凸形狀。具體而言,將樹脂組成物硬化形成絕緣層,該絕緣層表面經粗化處理後之該絕緣層表面的均方根粗度Rq,較佳為500nm.以下,更佳為400nm以下,又更佳為300nm以下,又更佳為200nm以下,特佳為100nm以下。又,下限值從得到與鍍敷導體層之良好密著性的觀點,較佳為5nm以上,更佳為10nm以上,又更佳為20nm以上。 The root-mean-square roughness Rq of the hardened | cured material of the resin composition of this invention can be measured by the measuring method as described in "Measurement of root-mean-square roughness (Rq)" mentioned later. From the viewpoint of reducing the loss of electrical signals, the surface of the insulating layer after the roughening treatment is preferably fine unevenness. Examples of the tightness of the unevenness on the surface of the insulating layer include, for example, the root-mean-square roughness Rq. From this index, it can be seen that not only the average value of the unevenness on the surface of the insulating layer, but also that the surface of the insulating layer has a dense uneven shape. Specifically, the resin composition is hardened to form an insulating layer, and the root-mean-square roughness Rq of the surface of the insulating layer after roughening the surface of the insulating layer is preferably 500 nm or less, more preferably 400 nm or less, and more It is preferably below 300 nm, more preferably below 200 nm, and particularly preferably below 100 nm. The lower limit value is preferably 5 nm or more, more preferably 10 nm or more, and still more preferably 20 nm or more from the viewpoint of obtaining good adhesion to the plated conductor layer.

本發明之樹脂組成物之硬化物之剝離強度可藉由後述<鍍敷導體層之拉離強度(剝離強度)之測定>所記載的測定方法測定。具體而言,將樹脂組成物硬化形成 絕緣層,在粗化處理後之該絕緣層表面,經鍍敷所得之導體層與該絕緣層之剝離強度,較佳為0.3kgf/cm以上,更佳為0.5kgf/cm以上,又更佳為0.6kgf/cm以上。此外,上限值無特別限定,一般而言為1.2kgf/cm以下。 The peeling strength of the cured product of the resin composition of the present invention can be measured by a measuring method described in "Measurement of Pulling Strength (Peeling Strength) of Plating Conductive Layer" described later. Specifically, the resin composition is hardened to form Insulating layer, on the surface of the insulating layer after the roughening treatment, the peel strength of the conductive layer and the insulating layer obtained by plating is preferably 0.3 kgf / cm or more, more preferably 0.5 kgf / cm or more, and more preferably It is 0.6 kgf / cm or more. The upper limit value is not particularly limited, and is generally 1.2 kgf / cm or less.

本發明之樹脂組成物的用途,並未有特別限制,例如可使用於接著薄膜、預浸體等之薄片狀層合材料、電路基板(層合板用途、多層印刷電路板用途等)、阻焊劑、下底填充材、晶片接合材、半導體封閉材、埋孔樹脂、零件埋入樹脂等,需要樹脂組成物之用途的廣泛範圍。其中,本發明之樹脂組成物可抑制將硬化物開孔加工,進行粗化處理後之導通孔內的樹脂殘渣,因此可提高導通孔內之鍍敷密著力,防止導通孔內之孔隙發生,可確保多階段形成之多層印刷電路板之絕緣層間的導通信賴性。換言之,多層印刷電路板之製造時,可適合作為形成絕緣層用之樹脂組成物(多層印刷電路板之絕緣層用樹脂組成物)使用,可更適合作為藉由鍍敷形成導體層用之樹脂組成物(藉由鍍敷形成導體層用之多層印刷電路板之絕緣層用樹脂組成物)使用。本發明之樹脂組成物可以清漆狀態塗佈於電路基板形成絕緣層,然而工業上一般以接著薄膜、預浸體等之薄片狀層合材料的形態使用較佳。從薄片狀層合材料之層合性的觀點,樹脂組成物之軟化點較佳為40~150℃。 The use of the resin composition of the present invention is not particularly limited. For example, it can be used as a sheet-like laminated material for bonding a film, a prepreg, or the like, a circuit board (such as a laminated board, a multilayer printed circuit board, etc.), or a solder resist. , Underfill material, wafer bonding material, semiconductor sealing material, buried-hole resin, parts-embedded resin, etc., a wide range of uses for resin compositions are required. Among them, the resin composition of the present invention can suppress the resin residue in the via hole after roughening the hardened material, and thus can improve the plating adhesion in the via hole and prevent the occurrence of pores in the via hole. It can ensure the conductivity between the insulating layers of the multilayer printed circuit board formed in multiple stages. In other words, when manufacturing a multilayer printed circuit board, it can be suitably used as a resin composition for forming an insulating layer (resin composition for an insulating layer of a multilayer printed circuit board), and can be more suitable as a resin for forming a conductor layer by plating. A composition (a resin composition for an insulating layer of a multilayer printed wiring board for forming a conductor layer by plating) is used. The resin composition of the present invention can be applied to a circuit board to form an insulating layer in a varnished state. However, it is generally preferably used in the form of a sheet-like laminated material such as a film, a prepreg, or the like in the industry. The softening point of the resin composition is preferably from 40 to 150 ° C from the viewpoint of the lamination property of the sheet-like laminated material.

<薄片狀層合材料> <Laminar laminate material> (接著薄膜) (Adhesive film)

實施形態中,本發明之薄片狀層合材料為接著薄膜。 該接著薄膜係於支撐體上形成樹脂組成物層者。該接著薄膜可藉由該領域具有通常知識者公知方法,例如將樹脂組成物溶解於有機溶劑而調製樹脂清漆,此樹脂清漆使用模塗佈機等,塗佈於支撐體,再加熱、或吹熱風等使有機溶劑乾燥形成樹脂組成物層來製造。 In an embodiment, the sheet-like laminated material of the present invention is an adhesive film. This adhesive film forms a resin composition layer on a support. The adhesive film can be prepared by a method known to those skilled in the art, for example, by dissolving a resin composition in an organic solvent to prepare a resin varnish. The resin varnish is applied to a support using a die coater, and then heated or blown. It is produced by drying an organic solvent with hot air or the like to form a resin composition layer.

有機溶劑例如有丙酮、甲基乙基酮、環己酮等之酮類、乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲醚乙酸酯、卡必醇乙酸酯等之乙酸酯類、溶纖劑、丁基卡必醇等之卡必醇類、甲苯、二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等之醯胺系溶劑等。有機溶劑亦可組合2種以上使用。 Examples of organic solvents include ketones such as acetone, methyl ethyl ketone, cyclohexanone, ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol acetate. Acetates, cellosolves, carbitols such as butyl carbitol, aromatic hydrocarbons such as toluene, xylene, dimethylformamide, dimethylacetamide, N-methyl Amidamine-based solvents such as pyrrolidone. The organic solvent may be used in combination of two or more kinds.

乾燥條件並未有特別限制,使樹脂組成物層中之有機溶劑的含量變成10質量%以下,較佳為5質量%以下進行乾燥。清漆中之有機溶劑量係因有機溶劑之沸點而異,例如將含有30~60質量%之有機溶劑的清漆,以50~150℃下乾燥3~10分鐘左右,可形成樹脂組成物層。 The drying conditions are not particularly limited, and the content of the organic solvent in the resin composition layer is 10% by mass or less, preferably 5% by mass or less for drying. The amount of the organic solvent in the varnish varies depending on the boiling point of the organic solvent. For example, the varnish containing 30 to 60% by mass of the organic solvent is dried at 50 to 150 ° C. for about 3 to 10 minutes to form a resin composition layer.

接著薄膜中,形成之樹脂組成物層的厚度,較佳為導體層之厚度以上。電路基板所具有之導體層的厚度通常為5~70μm之範圍,因此樹脂組成物層較佳為具有10~100μm之厚度。從薄膜化的觀點,更佳為15~80μm。 The thickness of the resin composition layer formed in the subsequent film is preferably equal to or greater than the thickness of the conductor layer. The thickness of the conductor layer included in the circuit board is usually in the range of 5 to 70 μm. Therefore, the resin composition layer preferably has a thickness of 10 to 100 μm. From the viewpoint of thin film formation, it is more preferably 15 to 80 μm.

支撐體例如有聚乙烯、聚丙烯、聚氯乙烯等聚烯烴的薄膜、聚對苯二甲酸乙二酯(以下有時簡稱為 「PET」)、聚萘二甲酸乙二酯等聚酯的薄膜、聚碳酸酯薄膜、聚醯亞胺薄膜等之各種塑膠薄膜。又亦可使用脫模紙或銅箔、鋁箔等之金屬箔等。其中從泛用性的觀點,較佳為塑膠薄膜,更佳為聚對苯二甲酸乙二酯薄膜。支撐體及後述之保護薄膜亦可施予電子衝擊(mad)處理、電暈處理等之表面處理。又,亦可以聚矽氧樹脂系脫模劑、醇酸樹脂系脫模劑、氟樹脂系脫模劑等之脫模劑施予脫模處理。 Examples of the support include films of polyolefins such as polyethylene, polypropylene, and polyvinyl chloride, and polyethylene terephthalate (hereinafter sometimes referred to simply as "PET"), polyester films such as polyethylene naphthalate, polycarbonate films, and polyimide films. It is also possible to use release paper, metal foils such as copper foil and aluminum foil. Among them, from the viewpoint of versatility, a plastic film is preferable, and a polyethylene terephthalate film is more preferable. The support and a protective film described later may be subjected to surface treatments such as an electron impact (mad) treatment and a corona treatment. In addition, a release treatment such as a silicone resin-based release agent, an alkyd resin-based release agent, or a fluororesin-based release agent may be applied.

支撐體之厚度並未有特別限制,由支撐體上進行開孔加工時,即使雷射照射之能量較大,也不易殘留樹脂殘渣,可抑制樹脂殘渣之發生的觀點,較佳為10μm以上,更佳為20μm以上,又更佳為30μm以上。又,從成本表現提昇或由支撐體上進行開孔時,可有效地開孔的觀點,較佳為150μm以下,更佳為100μm以下,又更佳為50μm以下。 There is no particular limitation on the thickness of the support body. When the hole is processed from the support body, even if the energy of laser irradiation is large, the resin residue is not easy to remain, and the viewpoint of suppressing the occurrence of the resin residue is preferably 10 μm or more. It is more preferably 20 μm or more, and even more preferably 30 μm or more. In addition, from the viewpoint of improving cost performance or effective hole formation from the support, it is preferably 150 μm or less, more preferably 100 μm or less, and still more preferably 50 μm or less.

於樹脂組成物層之支撐體密著之面的相反面,可再層合依據支撐體之保護薄膜。此時,接著薄膜含有支撐體、形成於該支撐體上之樹脂組成物層、及形成該樹脂組成物層上之保護薄膜。保護薄膜之厚度,並未有特別限定,例如為1~40μm。藉由層合保護薄膜,可防止在樹脂組成物層之表面附著塵埃等或造成傷痕。接著薄膜亦可捲繞成卷狀儲存。 On the opposite side of the support surface of the resin composition layer, the support film according to the support body may be further laminated. At this time, the adhesive film includes a support, a resin composition layer formed on the support, and a protective film formed on the resin composition layer. The thickness of the protective film is not particularly limited, and is, for example, 1 to 40 μm. By laminating the protective film, it is possible to prevent dust or the like from being attached to the surface of the resin composition layer or to cause scratches. The film can then be rolled into a roll and stored.

(預浸體) (Prepreg)

實施形態中,本發明之薄片狀層合材料為預浸體。該預浸體可藉由熱熔法或溶劑法將本發明之樹脂組成物含浸於薄片狀補強基材中,以加熱產生半硬化來製造。換言之,可形成本發明之樹脂組成物含浸於薄片狀補強基材之狀態的預浸體。薄片狀補強基材,可使用例如玻璃布或芳香族聚醯胺纖維等,常作為預浸體用纖維所構成者。此外,支撐體上形成有預浸體者較佳。 In an embodiment, the sheet-like laminated material of the present invention is a prepreg. The prepreg can be produced by impregnating the resin composition of the present invention in a sheet-like reinforcing substrate by a hot-melt method or a solvent method, and heating to produce a semi-hardened material. In other words, it is possible to form a prepreg in a state where the resin composition of the present invention is impregnated into a sheet-like reinforcing substrate. The sheet-like reinforcing substrate may be, for example, glass cloth, aromatic polyamide fiber, or the like, and is often composed of fibers for prepreg. In addition, a prepreg is preferably formed on the support.

熱熔法係不必將樹脂組成物溶解於有機溶劑,而是一旦塗佈於支撐體上,然後將其層合於薄片狀補強基材,或藉由模塗佈機直接塗佈於薄片狀補強基材等,製造預浸體的方法。此外,溶劑法係與黏著薄膜同樣,將樹脂溶解於有機溶劑中調製樹脂清漆,使薄片狀補強基材浸漬於此清漆中,使薄片狀補強基材含浸樹脂清漆,然後使其乾燥的方法。又,由薄片狀補強基材之兩面在加熱、加壓條件下,進行連續熱層合可製造接著薄膜。支撐體或保護薄膜等也可與接著薄膜同樣使用。 The hot-melt method does not need to dissolve the resin composition in an organic solvent, but once it is coated on a support, and then laminated to a sheet-shaped reinforcing substrate, or directly coated on a sheet-shaped reinforcement by a die coater. A method of manufacturing a prepreg, such as a substrate. In addition, the solvent method is a method of dissolving a resin in an organic solvent to prepare a resin varnish in the same manner as an adhesive film, immersing the sheet-shaped reinforcing substrate in the varnish, impregnating the sheet-shaped reinforcing substrate with the resin varnish, and then drying the resin varnish. In addition, an adhesive film can be produced by continuous thermal lamination of both sides of the sheet-like reinforcing base material under heating and pressure conditions. A support, a protective film, etc. can also be used similarly to an adhesive film.

<使用薄片狀層合材料之多層印刷電路板> <Multilayer printed circuit board using sheet-like laminated material>

其次,說明使用如上述製造之薄片狀層合材料,製造多層印刷電路板之方法。 Next, a method for manufacturing a multilayer printed wiring board using the sheet-like laminated material manufactured as described above will be described.

首先,使用真空層合機將薄片狀層合材料層合於電路基板之單面或兩面。電路基板用的基板,例如有玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。電路基板係指如 上述基板之單面或兩面形成有經圖型加工之導體層(電路)者。又,在導體層與絕緣層相互層合所成之多層印刷電路板中,該多層印刷電路基板之最外層的單面或兩面成為經圖型加工後的導體層(電路)者,亦包含於在此的電路基板中。此外,於導體層表面,亦可藉由黑化處理、銅蝕刻等預先施予粗糙化處理。 First, a sheet lamination material is laminated on one or both sides of a circuit board using a vacuum laminator. Examples of the substrate for the circuit substrate include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, and a thermosetting polyphenylene ether substrate. Circuit board means One or both sides of the substrate are formed with a patterned conductive layer (circuit). In addition, in a multilayer printed circuit board in which a conductor layer and an insulating layer are laminated on each other, one or both sides of the outermost layer of the multilayer printed circuit board becomes a conductor layer (circuit) after pattern processing, and is also included in In this circuit board. In addition, the surface of the conductor layer may be previously roughened by blackening treatment, copper etching, or the like.

薄片狀層合材料具有保護薄膜時,去除該保護薄膜後,必要時可將薄片狀層合材料及電路基板預熱,將薄片狀層合材料一邊加壓及加熱一邊層合於電路基板。 較佳之實施形態為藉由在真空層合法於減壓下,將本發明之薄片狀層合材料層合於電路基板。層合之條件,並未有特別限定,例如壓黏溫度(層合溫度)較佳為70~140℃,壓黏壓力(層合壓力)較佳為1~11kgf/cm2(9.8×104~107.9×104N/m2),壓黏時間(層合時間)較佳為5~180秒,且在空氣壓20mmHg(26.7hPa)以下的減壓下層合較佳。又,層合的方法可為分批式亦可為使用輥的連續式。 真空層合可使用市售之真空層合機進行。市售之真空層合機例如有nichigo-morton(股)製真空層合機器、(股)名機製作所製真空加壓式層合機、(股)日立Industries製輥式乾燥塗佈機、日立A-I-C(股)製真空層合機等。 When the sheet-like laminated material has a protective film, after removing the protective film, the sheet-like laminated material and the circuit board may be preheated if necessary, and the sheet-like laminated material may be laminated on the circuit board while being pressurized and heated. In a preferred embodiment, the sheet-like laminated material of the present invention is laminated on a circuit board by a vacuum layer under reduced pressure. The conditions for lamination are not particularly limited. For example, the pressing pressure (laminating temperature) is preferably 70 to 140 ° C, and the pressing pressure (laminating pressure) is preferably 1 to 11 kgf / cm 2 (9.8 × 10 4 ~ 107.9 × 10 4 N / m 2 ), the pressing time (lamination time) is preferably 5 to 180 seconds, and lamination is preferably performed under a reduced pressure of an air pressure of 20 mmHg (26.7 hPa) or less. The lamination method may be a batch method or a continuous method using a roll. Vacuum lamination can be performed using a commercially available vacuum laminator. Commercially available vacuum laminators include, for example, vacuum laminators made by Nichigo-Morton, vacuum pressure laminators made by Meiki Seisakusho, roll drying coaters made by Hitachi Industries, and Hitachi. AIC (stock) vacuum laminator.

將薄片狀層合材料層合於電路基板後,冷卻至室溫附近,剝離支持體時係剝離後,將樹脂組成物熱硬化形成絕緣層。藉此可在電路基板上形成絕緣層。熱硬化之條件係配合樹脂組成物中之樹脂成分的種類、含量等適 當選擇即可,較佳為於150℃~220℃下、20~180分鐘,更佳為於160℃~210℃下、30~120分鐘的範圍內選擇。形成絕緣層後,於硬化前未剝離支持體時,必要時可於此時剝離。 After laminating the sheet-like laminated material on the circuit board, it is cooled to around room temperature. After the support is peeled off, the resin composition is thermally cured to form an insulating layer. Thereby, an insulating layer can be formed on the circuit substrate. The conditions for heat curing are suitable for the type and content of the resin components in the resin composition. When selected, it is preferably selected at 150 ° C to 220 ° C for 20 to 180 minutes, and more preferably at 160 ° C to 210 ° C for 30 to 120 minutes. After forming the insulating layer, if the support is not peeled before curing, it can be peeled at this time if necessary.

又,使用真空熱壓機將薄片狀層合材料層合於電路基板之單面或雙面。減壓下進行加熱及加壓之層合步驟,可使用一般真空熱壓機進行。例如將加熱後之SUS板等之金屬板從支持體層側加壓來進行。加壓條件係將減壓度通常為1×10-2MPa以下,較佳為1×10-3MPa以下之減壓下。加熱及加壓雖可以1階段進行,但從控制樹脂滲出的觀點,將條件分成2階段以上進行為佳。例如第一階段之加壓係以溫度為70~150℃、壓力為1~15kgf/cm2之範圍進行,第二階段之加壓,以溫度為150~200℃、壓力為1~40kgf/cm2之範圍進行為佳。各階段之時間以30~120分鐘進行為佳。如此藉由將樹脂組成物層進行熱硬化,可在電路基板上形成絕緣層。市售之真空熱壓機,例如有MNPC-V-750-5-200(股)名機製作所製)、VH1-1603(北川精機(股)製)等。 Furthermore, the sheet-shaped laminated material was laminated on one side or both sides of the circuit board using a vacuum hot press. The lamination step of heating and pressing under reduced pressure can be performed using a general vacuum hot press. For example, a metal plate such as a heated SUS plate is pressed from the support layer side. The pressure condition is such that the degree of pressure reduction is usually 1 × 10 -2 MPa or less, and preferably 1 × 10 -3 MPa or less. Although heating and pressurization can be performed in one stage, it is preferable to divide the conditions into two or more stages from the viewpoint of controlling resin bleeding. For example, the pressurization in the first stage is performed at a temperature of 70 to 150 ° C and a pressure of 1 to 15 kgf / cm 2 , and the pressurization in the second stage is at a temperature of 150 to 200 ° C and a pressure of 1 to 40 kgf / cm A range of 2 is preferred. The duration of each stage is preferably 30 to 120 minutes. By thermally curing the resin composition layer in this manner, an insulating layer can be formed on the circuit board. Commercially available vacuum hot-pressing machines include, for example, MNPC-V-750-5-200 (manufactured by Seiki Co., Ltd.), VH1-1603 (manufactured by Kitagawa Seiki Co., Ltd.), and the like.

其次,對於形成於電路基板上之絕緣層進行開孔加工形成導通孔(via hole)、通孔。開孔加工係藉由例如鑽孔、雷射、電漿等公知的方法,又必要時可組合此等方法進行開孔加工。其中以二氧化碳氣體雷射、YAG雷射等之雷射開孔加工為最平常的方法。又,將本發明之薄片狀層合材料層合於電路基板,使樹脂組成物層進行熱 硬化形成絕緣層,而形成於電路基板上之絕緣層,由支撐體上進行開孔加工可形成導通孔,以製作多層印刷電路板較佳,開孔加工後,將支撐體進行剝離較佳。如此,由支撐體上進行開孔加工形成導通孔,可抑制樹脂殘渣之發生。又,為了對應多層印刷電路板之薄型化,因此導通孔之直徑,較佳為15~70μm,更佳為20~65μm,又更佳為25~60μm。 Next, a hole processing is performed on the insulating layer formed on the circuit substrate to form via holes and via holes. The drilling process is performed by a known method such as drilling, laser, plasma, and the like, and a combination of these methods may be used to perform the drilling process. Among them, carbon dioxide gas laser, YAG laser, and other laser drilling are the most common methods. Furthermore, the sheet-like laminated material of the present invention is laminated on a circuit board, and the resin composition layer is heated. The insulating layer is hardened to form the insulating layer formed on the circuit substrate. The through hole can be formed on the support to form a through hole to make a multilayer printed circuit board. After the hole is processed, the support is preferably peeled off. In this way, the via hole is formed by performing a hole-forming process on the support, and the occurrence of resin residue can be suppressed. In addition, in order to support the thinning of the multilayer printed circuit board, the diameter of the via hole is preferably 15 to 70 μm, more preferably 20 to 65 μm, and even more preferably 25 to 60 μm.

其次,絕緣層表面進行粗化處理。乾式之粗化處理例如有電漿處理等,濕式之粗化處理,例如有藉由膨潤液之膨潤處理、以氧化劑之粗化處理及以中和液之中和處理,以此順序進行的方法。可採用乾式、濕式之任一的粗化處理,但是濕式之粗化處理,在絕緣層表面形成凸凹之錨,同時可除去導通孔內之樹脂殘渣,故較佳。以膨潤液之膨潤處理係將絕緣層於50~80℃下、浸漬於膨潤液中5~20分鐘(較佳為55~70℃、8~15分鐘)。膨潤液例如有鹼溶液、界面活性劑溶液等,較佳為鹼溶液,該鹼溶液例如有氫氧化鈉溶液、氫氧化鉀溶液等。市售之膨潤液,例如有Atotech Japan(股)製之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。以氧化劑之粗糙化處理係將絕緣層於60~80℃下、浸漬於氧化劑溶液10~30分鐘(較佳為70~80℃、15~25分鐘)。氧化劑例如有氫氧化鈉水溶液中溶解有過錳酸鉀或過錳酸鈉之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。又,在鹼性過錳酸溶液中之過錳酸鹽的濃度,較佳 為5~10重量%。市售之氧化劑,例如有Atotech Japan(股)製之Concentrate.Compact CP、Dosing Solution Securiganth P等之鹼性過錳酸溶液。以中和液之中和處理係將絕緣層於30~50℃下、浸漬於中和液中3~10分鐘(較佳為35~45℃、3~8分鐘)。中和液較佳為酸性水溶液,市售品例如有Atotech Japan(股)製之Reduction solution.Securiganth P。 Secondly, the surface of the insulating layer is roughened. Dry roughening treatment includes, for example, plasma treatment, and wet roughening treatment includes, for example, swelling treatment with a swelling solution, roughening treatment with an oxidizing agent, and neutralization treatment with a neutralizing solution. method. Either dry or wet roughening can be used, but wet roughening can form convex and concave anchors on the surface of the insulating layer and remove resin residues in the vias. The insulation layer is immersed in a swelling liquid at 50 to 80 ° C for 5 to 20 minutes (preferably 55 to 70 ° C, 8 to 15 minutes) by a swelling treatment using a swelling liquid. Examples of the swelling liquid include an alkaline solution and a surfactant solution, and preferably an alkaline solution. Examples of the alkaline solution include a sodium hydroxide solution and a potassium hydroxide solution. Commercially available swelling liquids include, for example, Swelling Dip Securiganth P and Swelling Dip Securiganth SBU manufactured by Atotech Japan. The roughening treatment of the oxidant is to immerse the insulating layer in the oxidant solution at 60 to 80 ° C for 10 to 30 minutes (preferably 70 to 80 ° C and 15 to 25 minutes). Examples of the oxidizing agent include an alkaline permanganate solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous sodium hydroxide solution, dichromate, ozone, hydrogen peroxide / sulfuric acid, nitric acid, and the like. In addition, the concentration of permanganate in the alkaline permanganate solution is preferably It is 5 to 10% by weight. Commercially available oxidants include, for example, Concentrate made by Atotech Japan. Compact CP, Dosing Solution Securiganth P and other alkaline permanganic acid solutions. In a neutralizing solution, the insulating layer is immersed in a neutralizing solution at 30 to 50 ° C for 3 to 10 minutes (preferably 35 to 45 ° C and 3 to 8 minutes). The neutralizing solution is preferably an acidic aqueous solution, and a commercially available product is, for example, a Reduction solution made by Atotech Japan. Securiganth P.

其次,利用乾式鍍敷或濕式鍍敷在絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子電鍍等習知方法。濕式鍍敷係組合無電解鍍敷與電解鍍敷形成導體層的方法,形成與導體層相反圖型之鍍敷抗蝕,僅以無電解鍍敷形成導體層的方法等。其後之圖型形成方法,例如可使用熟悉該項技藝者所公知的減法製程(subtractive Process)、半加法製程(additive process)等。多次重複上述一連串的步驟,可製造多階段層合增層(Build-up)的多層印刷電路板。本發明可抑制樹脂殘渣之發生,因此可確保層間之導通信賴性。因此,本發明之薄片狀層合材料可適用於形成多層印刷電路板之增層。 Next, a conductive layer is formed on the insulating layer by dry plating or wet plating. For the dry plating, conventional methods such as vapor deposition, sputtering, and ion plating can be used. Wet plating is a method of forming a conductive layer by combining electroless plating and electrolytic plating, forming a plating resist having a pattern opposite to that of a conductive layer, and forming a conductive layer only by electroless plating. For the subsequent pattern formation method, for example, a subtractive process, an additive process and the like known to those skilled in the art can be used. Repeating the above series of steps multiple times can produce a multi-stage build-up multilayer printed circuit board. The present invention can suppress the occurrence of resin residues, and thus can ensure the communication reliability between layers. Therefore, the sheet-like laminated material of the present invention is suitable for forming a build-up layer of a multilayer printed circuit board.

<半導體裝置> <Semiconductor device>

使用本發明之多層印刷電路板可製造半導體裝置。於本發明之多層印刷電路板的導通點,安裝半導體晶片可製造半導體裝置。所謂「導通點」係指「多層印刷電路板中傳遞電信號的點」,該點可在表面,或被埋入的點均可。 又,半導體晶片只要以半導體作為材料之電子電路元件即可無特別限定。 A semiconductor device can be manufactured using the multilayer printed circuit board of the present invention. At the conducting point of the multilayer printed circuit board of the present invention, a semiconductor device can be manufactured by mounting a semiconductor wafer. The so-called "conduction point" refers to "a point where an electrical signal is transmitted in a multilayer printed circuit board", and the point may be on the surface or a buried point. The semiconductor wafer is not particularly limited as long as it is an electronic circuit element using a semiconductor as a material.

製造本發明之半導體裝置時之半導體晶片的安裝方法,只要是半導體晶片能有效地產生功能時,即無特別限制,具體而言,例如有線接合安裝方法、覆晶安裝方法、無凸塊之增層(BBUL)的安裝方法、以異方性導電膜(ACF)之安裝方法、以非導電性膜(NCF)之安裝方法等。 The method for mounting a semiconductor wafer when manufacturing the semiconductor device of the present invention is not particularly limited as long as the semiconductor wafer can effectively function, and specifically, for example, a wire bonding mounting method, a flip-chip mounting method, and no bump increase. Installation method of BBUL, installation method using anisotropic conductive film (ACF), installation method using non-conductive film (NCF), etc.

[實施例] [Example]

以下,使用實施例即比較例詳細說明本發明,但本發明並不受限於此等實施例。以下記載中,「份」係表示「質量份」。 Hereinafter, the present invention will be described in detail using examples and comparative examples, but the present invention is not limited to these examples. In the following description, "part" means "mass part".

<測定方法.評價方法> <Measurement method. Evaluation method>

首先說明各種測定方法.評價方法。 First, various measurement methods are explained. Evaluation method.

<樹脂殘渣評價> <Resin residue evaluation>

對於各實施例及各比較例所得之接著薄膜,依據以下評價樹脂殘渣(smear)。 About the adhesive films obtained by each Example and each comparative example, resin smear was evaluated based on the following.

(1)電路基板之製作 (1) Fabrication of circuit board

在玻璃布基材環氧樹脂丙面貼銅之層合板(銅箔之厚度18μm、基板厚度0.8mm、松下電工(股)製R5715ES)之兩面藉由蝕刻,形成電路圖型,在使用微蝕刻劑(MEC(股)製CZ8100)進行粗化處理製作電路基板。 Laminate a copper-clad laminated board (thickness of copper foil of 18 μm, substrate thickness of 0.8 mm, and Matsushita Electric Works Co., Ltd. R5715ES) on the glass cloth substrate epoxy resin surface to form a circuit pattern by etching. Micro-etchants are used. (CZ8100 manufactured by MEC Co., Ltd.) was roughened to prepare a circuit board.

(2)接著薄膜之層合 (2) Laminating the film

將各實施例及比較例製作的接著薄膜,使用分批式真空加壓層合機MVLP-500(商品名、名機(股)製),層合於上述(1)製作的電路基板之兩面。層合係藉由經30秒減壓,氣壓為13hPa以下,然後以100℃、30秒、壓力0.74MPa壓黏來進行。 The adhesive films produced in the examples and comparative examples were laminated on both sides of the circuit board produced in the above-mentioned (1) using a batch-type vacuum pressure laminator MVLP-500 (trade name, manufactured by Meiki Co., Ltd.). . The lamination was performed by depressurizing for 30 seconds, the air pressure was 13 hPa or less, and then performing pressure bonding at 100 ° C, 30 seconds, and a pressure of 0.74 MPa.

(3)樹脂組成物層之硬化 (3) Hardening of the resin composition layer

實施例1~8及比較例1係由層合後之接著薄膜上,剝離PET薄膜,以170℃、30分鐘的硬化條件,使樹脂組成物層硬化,形成絕緣層。實施例9係未剝離PET薄膜,以170℃、30分鐘的硬化條件使樹脂組成物層硬化,形成絕緣層。 In Examples 1 to 8 and Comparative Example 1, the PET film was peeled from the adhesive film after lamination, and the resin composition layer was hardened at 170 ° C for 30 minutes to form an insulating layer. Example 9 was a non-peeling PET film, and the resin composition layer was cured under a curing condition of 170 ° C. for 30 minutes to form an insulating layer.

(4)導通孔形成 (4) Via formation

使用松下焊接系統(股)製CO2雷射加工機(YB-HCS03T04),在頻率數1000Hz、派衝寬度13μ秒、衝擊數3的條件下,將絕緣層進行開孔,在絕緣層表面形成導 通孔之直徑為60μm之導通孔。實施例9中,其後將PET薄膜剝離。 Using a CO 2 laser processing machine (YB-HCS03T04) made by Panasonic Welding System, the insulation layer was opened at a frequency of 1000 Hz, a punch width of 13 μs, and an impact number of 3. The via hole has a via hole diameter of 60 μm. In Example 9, the PET film was peeled thereafter.

(5)粗化處理 (5) Roughening

將電路基板在60℃下,於膨潤液、即Atotech Japan(股)之Swelling Dip Securiganth P中浸漬10分鐘。接著在80℃下,於粗化液(氧化劑),即Atotech Japan(股)之Concentrate.Compact P(KMnO4:60g/L、NaOH:40g/L之水溶液)中浸漬20分鐘。最後在40℃下,於中和液,即Atotech Japan(股)之Reduction Solution.Securiganth P中浸漬5分鐘。 The circuit board was immersed in a swelling liquid, that is, Swelling Dip Securiganth P of Atotech Japan (stock) at 60 ° C for 10 minutes. Then at 80 ° C, the crude solution (oxidant), that is, the Concentrate of Atotech Japan (stock). Compact P (KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution) was immersed for 20 minutes. Finally, the solution was neutralized at 40 ° C, which is the Reduction Solution of Atotech Japan. Immerse in Securiganth P for 5 minutes.

(6)導通孔底部之殘渣評價 (6) Evaluation of residue at the bottom of via hole

將導通孔底部之周圍使用掃描電子顯微鏡(SEM)觀察,由所得之圖像測定從導通孔底部之牆面之最大樹脂殘渣長。◎○係表示最大樹脂殘渣長未達2μm,◎係表示最大樹脂殘渣長為2μm以上、未達3.5μm,○係表示最大樹脂殘渣長為3.5μm以上,未達5μm,×係表示最大樹脂殘渣長為5μm以上。 The periphery of the bottom of the via hole was observed with a scanning electron microscope (SEM), and the maximum resin residue length from the wall surface of the bottom of the via hole was measured from the obtained image. ◎ indicates the maximum resin residue length is less than 2 μm, ◎ indicates the maximum resin residue length is 2 μm or more and less than 3.5 μm, ○ indicates the maximum resin residue length is 3.5 μm or more and less than 5 μm, and × indicates the maximum resin residue. The length is 5 μm or more.

<鍍敷導體層之拉伸剝離強度(剝離強度)之測定、均方根粗度(Rq)之測定、及絕緣信賴性之評價> <Measurement of tensile peel strength (peel strength) of plated conductor layer, measurement of root mean square roughness (Rq), and evaluation of insulation reliability> (1)層合板之底部處理 (1) Bottom treatment of laminated board

形成有內部電路之玻璃布基材環氧樹脂丙面貼銅之層 合板(銅箔之厚度18μm、殘銅率60%、基板厚度0.3mm、松下電工(股)製R5715ES)之兩面浸漬於MEC(股)製CZ8100中,進行銅表面之粗化處理。 A glass cloth substrate with an internal circuit formed with an epoxy-acrylic surface and a copper-clad layer Both sides of the plywood (copper foil thickness: 18 μm, copper residual rate: 60%, substrate thickness: 0.3 mm, Matsushita Electric Works Co., Ltd. R5715ES) were immersed in CZ8100 manufactured by MEC Co., Ltd. to roughen the copper surface.

(2)接著薄膜之層合 (2) Laminating the film

將各實施例及比較例製作的接著薄膜,使用分批式真空加壓層合機MVLP-500(名機(股)製、商品名),層合於層合板之兩面。層合係藉由經30秒減壓,氣壓為13hPa以下,然後在30秒間以100℃、壓力0.74MPa壓黏來進行。 The adhesive films produced in each of the Examples and Comparative Examples were laminated on both sides of a laminated board using a batch-type vacuum pressure laminator MVLP-500 (manufactured by Meiki Co., Ltd., trade name). The lamination was performed by depressurizing for 30 seconds, the air pressure was 13 hPa or less, and then performing pressure bonding at 100 ° C and a pressure of 0.74 MPa for 30 seconds.

(3)樹脂組成物層之硬化 (3) Hardening of the resin composition layer

由層合後之接著薄膜上,剝離PET薄膜,以170℃、30分鐘的硬化條件,使樹脂組成物硬化。 From the laminated film, the PET film was peeled off, and the resin composition was cured under the curing conditions of 170 ° C. and 30 minutes.

(4)粗化處理 (4) Roughening

將層合板在60℃下,於膨潤液、即Atotech Japan(股)之含有二乙二醇單丁醚之Swelling Dip Securiganth P中浸漬10分鐘,接著在80℃下,於粗化液,即Atotech Japan(股)之Concentrate.Compact P(KMnO4:60g/L、NaOH:40g/L之水溶液)中浸漬20分鐘。最後在40℃下,於中和液,即Atotech Japan(股)之Reduction Solution.Securiganth P中浸漬5分鐘。此粗化處理後之層合板作為樣品A。 The laminate was immersed in a swelling liquid, that is, Swelling Dip Securiganth P containing diethylene glycol monobutyl ether at 60 ° C. for 10 minutes, and then at 80 ° C. in a roughening solution, namely Atotech Concentrate of Japan (shares). Compact P (KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution) was immersed for 20 minutes. Finally, the solution was neutralized at 40 ° C, which is the Reduction Solution of Atotech Japan. Immerse in Securiganth P for 5 minutes. The roughened laminate was used as Sample A.

(5)由半加法製程之鍍敷形成 (5) Formed by plating in a semi-additive process

為了於絕緣層表面形成電路,因此將層合板浸漬於含有PdCl2之無電解鍍敷用溶液中,接著浸漬於無電解銅鍍敷液中。以150℃加熱30分鐘進行退火處理後,形成蝕刻阻劑,藉由蝕刻形成圖型後,進行硫酸銅電解鍍敷,以30μm的厚度形成導體層。其次,以180℃進行退火處理60分鐘。此層合板作為樣品B。 In order to form a circuit on the surface of the insulating layer, the laminate is immersed in an electroless plating solution containing PdCl 2 and then immersed in an electroless copper plating solution. After annealing at 150 ° C. for 30 minutes, an etching resist was formed, and a pattern was formed by etching, and then copper sulfate electrolytic plating was performed to form a conductor layer with a thickness of 30 μm. Next, annealing was performed at 180 ° C for 60 minutes. This laminate was used as Sample B.

(6)均方根粗度(Rq值)之測定 (6) Determination of root mean square thickness (Rq value)

對於樣品A,使用非接觸型表面粗度計(Veeco Instruments公司製WYKO NT3300),藉由VSI接觸模式、50倍透鏡,測定範圍為121μm×92μm而得之數值求得Rq值。然後,求得各自10點的平均值作為測定值。 For the sample A, a non-contact surface roughness meter (WYKO NT3300 manufactured by Veeco Instruments) was used, and the Rq value was obtained from a VSI contact mode, a 50-times lens, and a measurement range of 121 μm × 92 μm. Then, an average value of 10 points was obtained as a measured value.

(7)鍍敷導體層之拉剝離強度(Peel strength)測定 (7) Determination of Peel strength of plated conductor layer

於樣品B之導體層上,施予寬10mm、長100mm之部分的刻痕,將此一端剝離以夾持器(股份有限公司T.S.E,Auto com型試驗機AC-50C-SL)挾住,於室溫下測定以50mm/分鐘的速度於垂直方向拉剝離35mm時的荷重(kgf/cm)。 A score of 10 mm in width and 100 mm in length was applied to the conductor layer of Sample B, and this end was peeled off and held by a holder (T.S.E, Auto com type testing machine AC-50C-SL). The load (kgf / cm) when pulling and peeling 35 mm in the vertical direction at a speed of 50 mm / minute was measured at room temperature.

(8)絕緣信賴性之評價 (8) Evaluation of insulation reliability

將切成圓形之光阻膠帶(日東電工(股)製、ELEP MASKING N380)貼於樣品B之導體層上,在氯化亞鐵水溶液中浸漬30分鐘。除去未貼光阻膠帶之部分的導體層,製作於絕緣層上形成有圓形導體層的評價基板。然後,削除絕緣層之一部分,使底部之銅箔露出。露出之銅箔與圓形的導體層以配線(金屬線)連接。評價基板之配線與直流電源((股)高砂製作所製、TP018-3D)連接,在130℃、85%RH的條件下,供給200小時、3.3V的電壓。200小時後測定電阻值,當電阻值為1.0×108Ω以上者,評價為「○」,而1.0×107Ω以上、未達1.0×108Ω者,評價為「△」,未達1.0×107Ω者評價為「×」。 A circular photoresist tape (ELIP MASKING N380, manufactured by Nitto Denko Corporation, Ltd.) was affixed to the conductive layer of Sample B, and immersed in an aqueous solution of ferrous chloride for 30 minutes. The conductive layer of the portion where the photoresist tape was not applied was removed, and an evaluation substrate having a circular conductive layer formed on the insulating layer was prepared. Then, a part of the insulating layer was removed to expose the copper foil at the bottom. The exposed copper foil is connected to a circular conductor layer by wiring (metal wire). The wiring of the evaluation substrate was connected to a DC power supply (TP018-3D, manufactured by Takasago Manufacturing Co., Ltd.), and a voltage of 3.3 V was supplied under conditions of 130 ° C and 85% RH for 200 hours. The resistance value was measured after 200 hours. When the resistance value was 1.0 × 10 8 Ω or more, it was evaluated as “○”, and when the resistance value was 1.0 × 10 7 Ω or more and less than 1.0 × 10 8 Ω, it was evaluated as “△” and less than 1.0 × 10 7 Ω was evaluated as “×”.

<介電損耗正切之測定> <Measurement of Dielectric Loss Tangent>

將各實施例及各比較例所得之接著薄膜,以190℃、熱硬化90分鐘,剝離PET薄膜得到薄片狀硬化物。將該硬化物切成寬2mm、長度80mm之試驗片,使用關東電子應用開發(股)製空洞共振器攝動法介電率測定裝置CP521及Agilent Technologies(股)製Network Analyzer E8362B,以空洞共振器攝動法在測定頻率5.8GHz下,測定介電損耗正切(tanδ)。測定2片試驗片,算出平均值。 The adhesive films obtained in each example and each comparative example were thermally cured at 190 ° C for 90 minutes, and the PET film was peeled to obtain a sheet-like cured product. This hardened product was cut into a test piece having a width of 2 mm and a length of 80 mm. The cavity resonator perturbation permittivity measurement device CP521 manufactured by Kanto Electronics Application Development Co., Ltd. and Network Analyzer E8362B manufactured by Agilent Technologies Co., Ltd. were used for cavity resonance. The perturbation method measures the dielectric loss tangent (tan δ) at a measurement frequency of 5.8 GHz. Two test pieces were measured and the average value was calculated.

(實施例1) (Example 1)

使液狀雙酚A型環氧樹脂(環氧當量180、三菱化學(股)製「828US」)10份、聯苯型環氧樹脂(環氧當量291、日本化藥(股)製「NC3000H」)20份在甲基乙基 酮(以下簡稱為「MEK」)15份、環己酮15份中攪拌同時加熱溶解。再混合活性酯化合物(DIC(股)製「HPC8000-65T」、活性酯當量223、固形分65%之甲苯溶液)28份、含有三嗪之甲酚醛樹脂(DIC(股)製「LA3018-50P」、酚當量151、固形分50%之2-甲氧基丙醇溶液)7份、硬化促進劑(廣榮化學工業(股)製、「4-二甲基胺基吡啶」)0.1份、球形氧化矽(平均粒徑0.5μm、經胺基矽烷處理「SO-C2」、(股)admatechs製、每單位重量之碳量0.18%)140份、苯氧基樹脂(YL7553BH30、固形分30質量%之MEK與環己酮之1:1溶液、重量平均分子量40000)7份、藍色顏料(大日精化(股)製、cyanine blue4920)0.04份、黃色顏料(BASF(股)製、Paliotol Yellow K1841)0.07份、紅色顏料(Clariant Japan(股)製、PV Fast Pink E01)0.08份,以高速旋轉混合機均勻分散,製作樹脂清漆。其次,將此樹脂清漆於聚苯二甲酸乙二酯薄膜(厚度38μm、以下簡稱為「PET薄膜」)上,使模塗佈機塗佈使乾燥後的樹脂厚度成為40μm,以80~120℃(平均100℃)乾燥6分鐘,得到薄片狀的接著薄膜。 10 parts of liquid bisphenol A type epoxy resin (epoxy equivalent 180, "828US" manufactured by Mitsubishi Chemical Corporation), biphenyl type epoxy resin (epoxy equivalent 291, manufactured by Nippon Kayaku Corporation) "NC3000H '') 20 parts in methyl ethyl 15 parts of ketone (hereinafter referred to as "MEK") and 15 parts of cyclohexanone were dissolved while heating while stirring. Then, 28 parts of an active ester compound ("HPC8000-65T" manufactured by DIC (stock), 223 equivalent of active ester, and 65% toluene solution in solid content), and a cresol resin containing triazine ("LA3018-50P" manufactured by DIC) '', Phenol equivalent 151, 2-methoxypropanol solution with 50% solid content) 7 parts, hardening accelerator (made by Guangrong Chemical Industry Co., Ltd., `` 4-dimethylaminopyridine '') 0.1 part, 140 parts of spherical silica (average particle size: 0.5 μm, amine-treated "SO-C2", manufactured by admatechs, carbon content per unit weight: 0.18%), phenoxy resin (YL7553BH30, solid content: 30 mass) 1: 1 solution of MEK and cyclohexanone, weight average molecular weight 40000), 7 parts of blue pigment (manufactured by Daiichi Seika Co., Ltd., cyanine blue4920), 0.04 parts of yellow pigment (manufactured by BASF (stock), Paliotol Yellow K1841) 0.07 part, 0.08 part of red pigment (Clariant Japan Co., Ltd., PV Fast Pink E01), uniformly dispersed with a high-speed rotary mixer to produce a resin varnish. Next, this resin varnish was applied to a polyethylene terephthalate film (thickness: 38 μm, hereinafter referred to as “PET film”), and a die coater was applied so that the thickness of the dried resin was 40 μm at 80 to 120 ° C. Drying (average 100 ° C.) for 6 minutes to obtain a sheet-like adhesive film.

(實施例2) (Example 2)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為藍色顏料0.4份、黃色顏料0.66份、紅色顏料0.84份外,完全與實施例1同樣製作 樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 0.4 parts of blue pigments, 0.66 parts of yellow pigments, and 0.84 parts of red pigments, they were produced in the same manner as in Example 1. Resin varnish. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例3) (Example 3)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為藍色顏料0.9份、黃色顏料1.4份、紅色顏料1.6份外,完全與實施例1同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 0.9 parts of blue pigments, 1.4 parts of yellow pigments, and 1.6 parts of red pigments, resin varnishes were completely produced in the same manner as in Example 1. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例4) (Example 4)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為碳黑3份外,完全與實施例同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 3 parts of carbon black, a resin varnish was produced in the same manner as in the examples. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例5) (Example 5)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為橡膠粒子(gantsu化成(股)製「AC3816N」)3.5份外,完全與實施例1同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 3.5 parts of rubber particles ("AC3816N" manufactured by Gantsu Kasei Co., Ltd.), a resin varnish was prepared in the same manner as in Example 1. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例6) (Example 6)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為抗氧化劑(BASF(股)製「IRGANOX1010」)3.5份外,完全與實施例1同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 3.5 parts of an antioxidant ("IRGANOX 1010" manufactured by BASF), a resin varnish was prepared in the same manner as in Example 1. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例7) (Example 7)

除了將實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份變更為紅外線吸收劑((股)日本觸媒製「IR-14」)3.5份外,完全與實施例1同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were changed to 3.5 parts of an infrared absorber ("IR-14" manufactured by Japan Catalyst Co., Ltd.), they were completely the same as those of Example 1. Make resin varnish. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例8) (Example 8)

除了將實施例2之球形氧化矽(平均粒徑0.5μm、經胺基矽烷處理「SO-C2」、(股)admatechs製、每單位重量之碳量0.18%)140份變更為球形氧化矽(平均粒徑0.25μm、經胺基矽烷處理付「SO-C1」、(股)admatechs製、每單位重量之碳量0.8%)100份外,完全與實施例2同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except changing 140 parts of the spherical silica (the average particle size is 0.5 μm, treated with amine silane “SO-C2”, manufactured by admatechs, and the carbon content per unit weight is 0.18%) into spherical silica ( A resin varnish was prepared in the same manner as in Example 2 except that the average particle diameter was 0.25 μm, and 100 parts of "SO-C1" (manufactured by Admatechs, 0.8% carbon content per unit weight) were treated with amine silane. Next, an adhesive film was obtained in the same manner as in Example 1.

(實施例9) (Example 9)

使用與實施例2同樣的接著薄膜。 The same adhesive film as in Example 2 was used.

(比較例1) (Comparative example 1)

除了未添加實施例1之藍色顏料0.04份、黃色顏料0.07份、紅色顏料0.08份外,完全與實施例1同樣製作樹脂清漆。其次,與實施例1同樣得到接著薄膜。 Except that 0.04 parts of blue pigments, 0.07 parts of yellow pigments, and 0.08 parts of red pigments of Example 1 were not added, a resin varnish was completely produced in the same manner as in Example 1. Next, an adhesive film was obtained in the same manner as in Example 1.

結果如表1所示。 The results are shown in Table 1.

由表1得知,實施例係低介電損耗正切,且導通孔內之樹脂殘渣抑制優異。此外,實施例1~3、5~9係絕緣信賴性特別優異,實施例3、8、9係樹脂殘渣進一步被抑制的結果。而比較例1雖然介電損耗正切低,但是有樹脂殘渣殘留的結果。 It is known from Table 1 that the examples are of low dielectric loss tangent and excellent resin residue suppression in via holes. In addition, Examples 1 to 3 and 5 to 9 are particularly excellent in insulation reliability, and the results of Examples 3, 8, and 9 are further suppressed. On the other hand, although Comparative Example 1 had a low dielectric loss tangent, the resin residue remained.

[產業上之可利用性] [Industrial availability]

本發明可提供可達成樹脂組成物之硬化物之低介電損耗正切化,且可抑制硬化物經開孔加工進行粗化處理後之導通孔內之樹脂殘渣的樹脂組成物、薄片狀層合材料、多層印刷電路板、半導體裝置。此外,可提供搭載此等之電腦、行動電話、數位相機、電視等之電氣製品或摩托車、汽車、電車、船舶、飛機等之交通工具。 The present invention can provide a resin composition and lamellar laminate that can achieve a low dielectric loss tangent of a hardened material of a resin composition, and can suppress the resin residue in the via hole after the hardened material is roughened by opening processing. Materials, multilayer printed circuit boards, semiconductor devices. In addition, we can provide electrical products such as computers, mobile phones, digital cameras, and televisions, or vehicles such as motorcycles, automobiles, trams, ships, and airplanes.

Claims (17)

一種樹脂組成物,其特徵係含有(A)環氧樹脂、(B)活性酯化合物、(C)殘渣抑制成分及(D)無機填充材的樹脂組成物,(C)殘渣抑制成分為選自由顏料、染料、抗氧化劑及紅外線吸收劑所成群之1種以上,該樹脂組成物之不揮發成分為100質量%時,(C)殘渣抑制成分之含量為0.001~10質量%,該樹脂組成物之不揮發成分為100質量%時,(D)無機填充材之含量為40質量%以上,其中(B)活性酯化合物為含有萘結構之活性酯系硬化劑或含有二環戊二烯二酚結構之活性酯化合物。 A resin composition comprising (A) an epoxy resin, (B) an active ester compound, (C) a residue-inhibiting component, and (D) an inorganic filler, and (C) a residue-inhibiting component selected from the group consisting of Pigments, dyes, antioxidants, and infrared absorbers in one or more groups. When the non-volatile content of the resin composition is 100% by mass, the content of the (C) residue suppression component is 0.001 to 10% by mass. The resin composition When the non-volatile content of the material is 100% by mass, the content of (D) the inorganic filler is 40% by mass or more, in which (B) the active ester compound is an active ester-based hardener containing a naphthalene structure or containing Active ester compound with phenol structure. 如申請專利範圍第1項之樹脂組成物,其中樹脂組成物中之不揮發成分為100質量%時,(B)活性酯化合物之含量為1~30質量%。 For example, when the resin composition of the first scope of the patent application, wherein the non-volatile content in the resin composition is 100% by mass, the content of the (B) active ester compound is 1 to 30% by mass. 如申請專利範圍第1項之樹脂組成物,其中殘渣抑制成分為選自由顏料、抗氧化劑及紅外線吸收劑所成群之1種以上。 For example, the resin composition of the first scope of the patent application, wherein the residue suppression component is one or more selected from the group consisting of a pigment, an antioxidant, and an infrared absorber. 如申請專利範圍第1項之樹脂組成物,其中顏料為選自由藍色顏料、黃色顏料、紅色顏料及綠色顏料所成群之1種以上。 For example, the resin composition of the first patent application range, wherein the pigment is at least one selected from the group consisting of a blue pigment, a yellow pigment, a red pigment, and a green pigment. 如申請專利範圍第1項之樹脂組成物,其中顏料為混合藍色顏料、黃色顏料及紅色顏料而成的混合顏料。 For example, the resin composition of the first patent application range, wherein the pigment is a mixed pigment obtained by mixing a blue pigment, a yellow pigment, and a red pigment. 如申請專利範圍第1項之樹脂組成物,其中抗氧化 劑為受阻酚系抗氧化劑。 For example, the resin composition of the scope of patent application, wherein the antioxidant The agent is a hindered phenolic antioxidant. 如申請專利範圍第1項之樹脂組成物,其中紅外線吸收劑為選自酞花菁系化合物、蒽醌化合物及鎳錯合物的化合物。 For example, the resin composition of the first patent application range, wherein the infrared absorber is a compound selected from a phthalocyanine compound, an anthraquinone compound, and a nickel complex. 如申請專利範圍第1項之樹脂組成物,其中(D)無機填充材之平均粒徑為0.01~5μm。 For example, the resin composition of item 1 of the patent application range, wherein the average particle diameter of the (D) inorganic filler is 0.01 to 5 μm. 如申請專利範圍第1項之樹脂組成物,其中樹脂組成物中之不揮發成分為100質量%時,(D)無機填充材之含量為40~85質量%。 For example, if the resin composition of the first patent application range is 100% by mass of the nonvolatile component in the resin composition, the content of the (D) inorganic filler is 40 to 85% by mass. 如申請專利範圍第1項之樹脂組成物,其中(D)無機填充材之每單位重量之碳量為0.02~3%。 For example, the resin composition of the scope of application for patent No. 1 wherein the carbon content per unit weight of the (D) inorganic filler is 0.02 to 3%. 如申請專利範圍第1項之樹脂組成物,其中(D)無機填充材為二氧化矽。 For example, the resin composition of the first patent application range, wherein (D) the inorganic filler is silicon dioxide. 如申請專利範圍第1項之樹脂組成物,其係將樹脂組成物硬化形成絕緣層,將該絕緣層表面進行粗化處理後之該絕緣層表面之均方根(Root Mean Square)粗度Rq為500nm以下,於該絕緣層表面鍍敷所得之導體層與該絕緣層之剝離強度為0.3kgf/cm以上,樹脂組成物之硬化物之介電損耗正切為0.05以下。 For example, the resin composition of the scope of application for patent No. 1 is that the resin composition is hardened to form an insulating layer, and the surface of the insulating layer is subjected to a roughening treatment, and the root mean square (Rot Mean Square) roughness of the insulating layer is Rq The thickness is 500 nm or less, the peel strength of the conductive layer obtained by plating on the surface of the insulating layer and the insulating layer is 0.3 kgf / cm or more, and the dielectric loss tangent of the hardened product of the resin composition is 0.05 or less. 如申請專利範圍第1項之樹脂組成物,其係多層印刷電路板之絕緣層用樹脂組成物。 For example, the resin composition of the first patent application scope is a resin composition for an insulating layer of a multilayer printed circuit board. 一種薄片狀層合材料,其特徵係含有如申請專利範圍第1~13項中任一項之樹脂組成物。 A sheet-like laminated material, which is characterized by containing a resin composition according to any one of claims 1 to 13 of the scope of patent application. 一種多層印刷電路板,其特徵係藉由如申請專利 範圍第1~13項中任一項之樹脂組成物之硬化物,形成絕緣層者。 A multilayer printed circuit board characterized by The hardened product of the resin composition according to any one of the items 1 to 13 to form an insulating layer. 一種半導體裝置,其特徵係使用如申請專利範圍第15項之多層印刷電路板者。 A semiconductor device characterized by using a multilayer printed circuit board such as the item 15 of the patent application scope. 一種多層印刷電路板之製造方法,其特徵係將如申請專利範圍第14項之薄片狀層合材料層合於電路基板,使樹脂組成物進行熱硬化形成絕緣層,對於形成於電路基板上之絕緣層,由支撐體上進行開孔加工形成導通孔。 A method for manufacturing a multilayer printed circuit board, which is characterized in that a sheet-like laminated material such as the item No. 14 of the application for a patent is laminated on a circuit substrate, and the resin composition is thermally hardened to form an insulating layer. The insulating layer is formed with a through hole on the support to form a through hole.
TW102118794A 2012-05-31 2013-05-28 Resin composition TWI620781B (en)

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