TWI618917B - 用於量測一零件的方法及裝置 - Google Patents

用於量測一零件的方法及裝置 Download PDF

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Publication number
TWI618917B
TWI618917B TW102141319A TW102141319A TWI618917B TW I618917 B TWI618917 B TW I618917B TW 102141319 A TW102141319 A TW 102141319A TW 102141319 A TW102141319 A TW 102141319A TW I618917 B TWI618917 B TW I618917B
Authority
TW
Taiwan
Prior art keywords
probe
artifact
during
fluid flow
point
Prior art date
Application number
TW102141319A
Other languages
English (en)
Chinese (zh)
Other versions
TW201428234A (zh
Inventor
約翰 查爾斯 歐德
德瑞克 馬歇爾
保羅 威廉 摩爾
馬修 安東尼 李維爾
Original Assignee
任尼紹公司
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Filing date
Publication date
Application filed by 任尼紹公司 filed Critical 任尼紹公司
Publication of TW201428234A publication Critical patent/TW201428234A/zh
Application granted granted Critical
Publication of TWI618917B publication Critical patent/TWI618917B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Auxiliary Devices For Machine Tools (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
TW102141319A 2012-11-14 2013-11-13 用於量測一零件的方法及裝置 TWI618917B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
??12250176.0 2012-11-14
EP12250176 2012-11-14

Publications (2)

Publication Number Publication Date
TW201428234A TW201428234A (zh) 2014-07-16
TWI618917B true TWI618917B (zh) 2018-03-21

Family

ID=47678534

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102141319A TWI618917B (zh) 2012-11-14 2013-11-13 用於量測一零件的方法及裝置

Country Status (7)

Country Link
US (1) US10048065B2 (https=)
EP (1) EP2920549B1 (https=)
JP (1) JP6466847B2 (https=)
KR (1) KR20150082620A (https=)
CN (1) CN104813140B (https=)
TW (1) TWI618917B (https=)
WO (1) WO2014076454A1 (https=)

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US10393505B2 (en) * 2013-12-06 2019-08-27 Werth Messtechnik Gmbh Device and method for measuring workpieces
WO2015097893A1 (ja) * 2013-12-27 2015-07-02 株式会社牧野フライス製作所 工作機械の制御装置
CN106796095B (zh) * 2014-09-02 2021-05-28 瑞尼斯豪公司 操作坐标测量设备的方法、坐标测量设备和计算机程序
GB201603496D0 (en) * 2016-02-29 2016-04-13 Renishaw Plc Method and apparatus for calibrating a scanning probe
JP6663808B2 (ja) * 2016-07-04 2020-03-13 株式会社キーエンス 画像測定装置
JP6663807B2 (ja) * 2016-07-04 2020-03-13 株式会社キーエンス 画像測定装置
JP2018096886A (ja) * 2016-12-15 2018-06-21 株式会社Ｉｚｏｘ 三次元形状測定検査システム及び三次元形状測定検査方法
IT201700064533A1 (it) * 2017-06-12 2018-12-12 Marposs Spa Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione
CN111121651A (zh) 2018-10-31 2020-05-08 财团法人工业技术研究院 光学测量稳定性控制系统
CN110244165A (zh) * 2019-06-20 2019-09-17 昆山埃维奥电机有限公司 一种刷架功能测试机构及方法
JP6810882B1 (ja) * 2019-11-27 2021-01-13 株式会社東京精密 検出器、表面性状測定装置及び測定方法
CN112171374A (zh) * 2020-09-25 2021-01-05 陈清 一种数控机床自动寻点加工工艺
JP7030280B2 (ja) * 2020-12-01 2022-03-07 株式会社東京精密 表面性状測定装置及び測定方法
JP7715610B2 (ja) * 2021-11-30 2025-07-30 株式会社ディスコ リニアゲージ
JP2024125793A (ja) * 2023-03-06 2024-09-19 株式会社ミツトヨ 三次元測定機およびインライン測定システム

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US6154972A (en) * 1998-07-16 2000-12-05 Mitutoyo Corporation Measuring machine with cleaning device
EP1953497A1 (en) * 2007-01-31 2008-08-06 Mitutoyo Corporation Touch probe with cleaning function

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JP5203028B2 (ja) * 2007-05-30 2013-06-05 株式会社ミツトヨ 形状測定機構の異常検出方法及び形状測定機構
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Publication number Priority date Publication date Assignee Title
US4536661A (en) * 1982-10-15 1985-08-20 Renishaw Plc Position-sensing apparatus
US6154972A (en) * 1998-07-16 2000-12-05 Mitutoyo Corporation Measuring machine with cleaning device
EP1953497A1 (en) * 2007-01-31 2008-08-06 Mitutoyo Corporation Touch probe with cleaning function

Also Published As

Publication number Publication date
TW201428234A (zh) 2014-07-16
KR20150082620A (ko) 2015-07-15
JP2016515192A (ja) 2016-05-26
JP6466847B2 (ja) 2019-02-06
US10048065B2 (en) 2018-08-14
WO2014076454A1 (en) 2014-05-22
US20150285629A1 (en) 2015-10-08
EP2920549A1 (en) 2015-09-23
CN104813140A (zh) 2015-07-29
EP2920549B1 (en) 2020-01-08
CN104813140B (zh) 2019-05-03

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