JP6466847B2 - ワークピースを工作機械で測定するための方法および装置 - Google Patents

ワークピースを工作機械で測定するための方法および装置 Download PDF

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Publication number
JP6466847B2
JP6466847B2 JP2015542350A JP2015542350A JP6466847B2 JP 6466847 B2 JP6466847 B2 JP 6466847B2 JP 2015542350 A JP2015542350 A JP 2015542350A JP 2015542350 A JP2015542350 A JP 2015542350A JP 6466847 B2 JP6466847 B2 JP 6466847B2
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Prior art keywords
probe
machine tool
fluid flow
during
artifact
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Japanese (ja)
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JP2016515192A5 (https=
JP2016515192A (ja
Inventor
チャールズ オールド ジョン
チャールズ オールド ジョン
マーシャル デレク
マーシャル デレク
ウィリアム ムーア ポール
ウィリアム ムーア ポール
アンソニー レヴェル マシュー
アンソニー レヴェル マシュー
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Renishaw PLC
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Renishaw PLC
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Publication of JP2016515192A5 publication Critical patent/JP2016515192A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Auxiliary Devices For Machine Tools (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
JP2015542350A 2012-11-14 2013-11-05 ワークピースを工作機械で測定するための方法および装置 Active JP6466847B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261726233P 2012-11-14 2012-11-14
EP12250176 2012-11-14
US61/726,233 2012-11-14
EP12250176.0 2012-11-14
PCT/GB2013/052884 WO2014076454A1 (en) 2012-11-14 2013-11-05 Method and apparatus for measuring a workpiece with a machine tool

Publications (3)

Publication Number Publication Date
JP2016515192A JP2016515192A (ja) 2016-05-26
JP2016515192A5 JP2016515192A5 (https=) 2016-10-20
JP6466847B2 true JP6466847B2 (ja) 2019-02-06

Family

ID=47678534

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015542350A Active JP6466847B2 (ja) 2012-11-14 2013-11-05 ワークピースを工作機械で測定するための方法および装置

Country Status (7)

Country Link
US (1) US10048065B2 (https=)
EP (1) EP2920549B1 (https=)
JP (1) JP6466847B2 (https=)
KR (1) KR20150082620A (https=)
CN (1) CN104813140B (https=)
TW (1) TWI618917B (https=)
WO (1) WO2014076454A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10393505B2 (en) * 2013-12-06 2019-08-27 Werth Messtechnik Gmbh Device and method for measuring workpieces
WO2015097893A1 (ja) * 2013-12-27 2015-07-02 株式会社牧野フライス製作所 工作機械の制御装置
CN106796095B (zh) * 2014-09-02 2021-05-28 瑞尼斯豪公司 操作坐标测量设备的方法、坐标测量设备和计算机程序
GB201603496D0 (en) * 2016-02-29 2016-04-13 Renishaw Plc Method and apparatus for calibrating a scanning probe
JP6663808B2 (ja) * 2016-07-04 2020-03-13 株式会社キーエンス 画像測定装置
JP6663807B2 (ja) * 2016-07-04 2020-03-13 株式会社キーエンス 画像測定装置
JP2018096886A (ja) * 2016-12-15 2018-06-21 株式会社Ｉｚｏｘ 三次元形状測定検査システム及び三次元形状測定検査方法
IT201700064533A1 (it) * 2017-06-12 2018-12-12 Marposs Spa Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione
CN111121651A (zh) 2018-10-31 2020-05-08 财团法人工业技术研究院 光学测量稳定性控制系统
CN110244165A (zh) * 2019-06-20 2019-09-17 昆山埃维奥电机有限公司 一种刷架功能测试机构及方法
JP6810882B1 (ja) * 2019-11-27 2021-01-13 株式会社東京精密 検出器、表面性状測定装置及び測定方法
CN112171374A (zh) * 2020-09-25 2021-01-05 陈清 一种数控机床自动寻点加工工艺
JP7030280B2 (ja) * 2020-12-01 2022-03-07 株式会社東京精密 表面性状測定装置及び測定方法
JP7715610B2 (ja) * 2021-11-30 2025-07-30 株式会社ディスコ リニアゲージ
JP2024125793A (ja) * 2023-03-06 2024-09-19 株式会社ミツトヨ 三次元測定機およびインライン測定システム

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US4153998A (en) 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
GB1551218A (en) 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
US4561776A (en) * 1981-03-25 1985-12-31 Diffracto Ltd. Electro-optical sensors for tool and robotic inspection
JPS59501875A (ja) * 1982-10-15 1984-11-08 レニシヨウ　パブリツク　リミテツド　カンパニ− 位置検知装置
FR2567265B1 (fr) * 1984-07-04 1988-09-09 Snecma Palpeur de mesure dimensionnelle multidirectionnel etanche
DE3836263C1 (https=) 1988-10-25 1990-06-07 Mtu Muenchen Gmbh
JP3304994B2 (ja) 1991-08-30 2002-07-22 キヤノン株式会社 研磨方法および研磨装置
DE4436782B4 (de) * 1993-10-21 2006-05-04 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zur Vermessung von Prüflingen auf einem Koordinatenmeßgerät
JP2000035325A (ja) * 1998-07-16 2000-02-02 Mitsutoyo Corp 洗浄装置付測定機
JP2000221024A (ja) * 1998-11-25 2000-08-11 Fuji Seiki Kk 清掃流体吹き出し口付き加工物測定用接触プロ―ブ及びこれを用いる測定方法
EP1004846A3 (en) * 1998-11-25 2001-05-02 Fuji Seiki Co.,Ltd. Work measuring probe with cleaning function
EP1128156A1 (en) 2000-02-10 2001-08-29 General Electric Company Method and apparatus for automatically compensating for measurement error
JP2003042750A (ja) * 2001-07-26 2003-02-13 Canon Inc 水槽を有する３次元形状測定装置
GB0228371D0 (en) * 2002-12-05 2003-01-08 Leland E C E Workpiece inspection method
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JP2006090945A (ja) * 2004-09-27 2006-04-06 Olympus Corp 形状測定機
ATE487108T1 (de) * 2005-07-08 2010-11-15 Heidenhain Gmbh Dr Johannes Tastkopf
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JP5203028B2 (ja) * 2007-05-30 2013-06-05 株式会社ミツトヨ 形状測定機構の異常検出方法及び形状測定機構
EP2018934A1 (en) * 2007-07-26 2009-01-28 Renishaw plc Measurement device having authentication module
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TWI458938B (zh) 2011-01-19 2014-11-01 Renishaw Plc 用於機械工具裝置之類比量測探針
EP2479531A1 (en) 2011-01-19 2012-07-25 Renishaw plc Analogue measurement probe for a machine tool apparatus
JP6075797B2 (ja) * 2011-05-03 2017-02-08 スモルテク インターナショナル, リミテッド ライアビリティー カンパニーSmalTec International, LLC マイクロ放電に基づく計測システム
JP2013104721A (ja) * 2011-11-11 2013-05-30 Disco Abrasive Syst Ltd 研削装置

Also Published As

Publication number Publication date
TW201428234A (zh) 2014-07-16
KR20150082620A (ko) 2015-07-15
JP2016515192A (ja) 2016-05-26
US10048065B2 (en) 2018-08-14
WO2014076454A1 (en) 2014-05-22
US20150285629A1 (en) 2015-10-08
EP2920549A1 (en) 2015-09-23
TWI618917B (zh) 2018-03-21
CN104813140A (zh) 2015-07-29
EP2920549B1 (en) 2020-01-08
CN104813140B (zh) 2019-05-03

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