IT201700064533A1 - Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione - Google Patents

Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione

Info

Publication number
IT201700064533A1
IT201700064533A1 IT102017000064533A IT201700064533A IT201700064533A1 IT 201700064533 A1 IT201700064533 A1 IT 201700064533A1 IT 102017000064533 A IT102017000064533 A IT 102017000064533A IT 201700064533 A IT201700064533 A IT 201700064533A IT 201700064533 A1 IT201700064533 A1 IT 201700064533A1
Authority
IT
Italy
Prior art keywords
control
protection device
mechanical parts
relative protection
optoelectronic equipment
Prior art date
Application number
IT102017000064533A
Other languages
English (en)
Inventor
Samuele Martelli
Matteo Venturi
Original Assignee
Marposs Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marposs Spa filed Critical Marposs Spa
Priority to IT102017000064533A priority Critical patent/IT201700064533A1/it
Priority to TW107119579A priority patent/TWI772434B/zh
Priority to ES18729135T priority patent/ES2877618T3/es
Priority to US16/618,575 priority patent/US11433499B2/en
Priority to PCT/EP2018/065367 priority patent/WO2018228998A1/en
Priority to JP2019568327A priority patent/JP7118097B2/ja
Priority to EP18729135.6A priority patent/EP3638976B1/en
Publication of IT201700064533A1 publication Critical patent/IT201700064533A1/it

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/248Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods
    • B23Q17/2485Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves using special electromagnetic means or methods using interruptions of light beams
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0006Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means to keep optical surfaces clean, e.g. by preventing or removing dirt, stains, contamination, condensation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/151Gas blown
IT102017000064533A 2017-06-12 2017-06-12 Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione IT201700064533A1 (it)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IT102017000064533A IT201700064533A1 (it) 2017-06-12 2017-06-12 Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione
TW107119579A TWI772434B (zh) 2017-06-12 2018-06-07 用於檢查機械零件的光電設備和相關保護裝置
ES18729135T ES2877618T3 (es) 2017-06-12 2018-06-11 Aparato optoelectrónico para controlar partes mecánicas, y pertinente dispositivo de protección
US16/618,575 US11433499B2 (en) 2017-06-12 2018-06-11 Optoelectronic apparatus for checking mechanical parts, and relevant protection device
PCT/EP2018/065367 WO2018228998A1 (en) 2017-06-12 2018-06-11 Optoelectronic apparatus for checking mechanical parts, and relevant protection device
JP2019568327A JP7118097B2 (ja) 2017-06-12 2018-06-11 機械部品を検査するための光電子装置および関連する保護デバイス
EP18729135.6A EP3638976B1 (en) 2017-06-12 2018-06-11 Optoelectronic apparatus for checking mechanical parts, and relevant protection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000064533A IT201700064533A1 (it) 2017-06-12 2017-06-12 Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione

Publications (1)

Publication Number Publication Date
IT201700064533A1 true IT201700064533A1 (it) 2018-12-12

Family

ID=60138763

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000064533A IT201700064533A1 (it) 2017-06-12 2017-06-12 Apparecchiatura optoelettronica per il controllo di parti meccaniche, e relativo dispositivo di protezione

Country Status (7)

Country Link
US (1) US11433499B2 (it)
EP (1) EP3638976B1 (it)
JP (1) JP7118097B2 (it)
ES (1) ES2877618T3 (it)
IT (1) IT201700064533A1 (it)
TW (1) TWI772434B (it)
WO (1) WO2018228998A1 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3708298A1 (en) * 2019-03-13 2020-09-16 Renishaw plc Tool measurement device for a machine tool
US11753999B2 (en) * 2021-06-17 2023-09-12 General Electric Company Gas turbine sensor assembly and associated shutter mechanism
CN116858151B (zh) * 2023-09-05 2023-12-12 西安德普赛科计量设备有限责任公司 一种三坐标测量机辅助支撑腿处的保护机构

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10337242A1 (de) * 2003-08-13 2005-03-17 Blum-Novotest Gmbh Schmutzabschirmung an einem optischen Gerät
EP2207643A1 (en) * 2007-09-13 2010-07-21 Marposs Societa' Per Azioni Apparatus for checking mechanical component parts with optical devices, and relevant protection device and method

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Publication number Priority date Publication date Assignee Title
US3749500A (en) 1970-12-23 1973-07-31 Gen Electric Optical caliper and edge detector-follower for automatic gaging
US3912925A (en) 1974-01-02 1975-10-14 J & M Associates Inc Method and apparatus for machining workpieces
FR2343555A1 (fr) 1976-03-12 1977-10-07 Dassault Avions Procede et dispositif de determination de la position d'un objet tel qu'un element de machine
DE3218754C2 (de) 1982-05-18 1985-11-28 Friedrich Deckel AG, 8000 München Verfahren und Einrichtung zur Vermessung eines in einem zustellbaren Werkzeughalter einer Werkzeugmaschine eingespannten Werkzeugs
DE4231407A1 (de) * 1992-09-19 1994-03-24 Leica Mikroskopie & Syst Wechselvorrichtung mit zentrierbaren Aufnahmeringen
US6003414A (en) * 1998-06-25 1999-12-21 Hsieh; Chih-Ching Quick-release socket adapter
US6496273B1 (en) 1999-05-05 2002-12-17 Renishaw Plc Position determining apparatus for coordinate positioning machine
DE10227242A1 (de) 2002-06-19 2004-02-05 Koenig & Bauer Ag Anordnung zum Pudern von Flächengebilden in einer Druckmaschine
ITBO20030430A1 (it) * 2003-07-17 2005-01-18 Marposs Spa Apparecchiatura e metodo per il controllo della posizione
ITBO20030536A1 (it) * 2003-09-16 2005-03-17 Marposs Spa Metodo e sistema per controllare la posizione di una parte meccanica
US7259872B2 (en) * 2004-12-17 2007-08-21 Peddinghaus Corporation Light beam switch system for locating the edge of a workpiece
JP2007301649A (ja) * 2006-05-09 2007-11-22 Jtekt Corp 工作機械の工具測定装置
TWI419763B (zh) * 2010-05-27 2013-12-21 Univ Nat Yunlin Sci & Tech 光電式刀尖位置精密感測裝置
CN104813140B (zh) * 2012-11-14 2019-05-03 瑞尼斯豪公司 用于通过机床测量工件的方法和设备
CN104128846B (zh) * 2014-07-21 2016-04-20 华中科技大学 一种高精度的刀具偏离量在线测量方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10337242A1 (de) * 2003-08-13 2005-03-17 Blum-Novotest Gmbh Schmutzabschirmung an einem optischen Gerät
EP2207643A1 (en) * 2007-09-13 2010-07-21 Marposs Societa' Per Azioni Apparatus for checking mechanical component parts with optical devices, and relevant protection device and method

Also Published As

Publication number Publication date
EP3638976B1 (en) 2021-04-21
ES2877618T3 (es) 2021-11-17
US20200156201A1 (en) 2020-05-21
JP7118097B2 (ja) 2022-08-15
JP2020523584A (ja) 2020-08-06
EP3638976A1 (en) 2020-04-22
TWI772434B (zh) 2022-08-01
TW201902616A (zh) 2019-01-16
US11433499B2 (en) 2022-09-06
WO2018228998A1 (en) 2018-12-20

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