TWI618814B - Surface treatment metal foil, laminate, printed wiring board, semiconductor package, electronic device, and printed wiring board manufacturing method - Google Patents
Surface treatment metal foil, laminate, printed wiring board, semiconductor package, electronic device, and printed wiring board manufacturing method Download PDFInfo
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- TWI618814B TWI618814B TW105130807A TW105130807A TWI618814B TW I618814 B TWI618814 B TW I618814B TW 105130807 A TW105130807 A TW 105130807A TW 105130807 A TW105130807 A TW 105130807A TW I618814 B TWI618814 B TW I618814B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B9/00—Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/20—Layered products comprising a layer of metal comprising aluminium or copper
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/04—Wires; Strips; Foils
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
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- Organic Chemistry (AREA)
- Electrochemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Mechanical Engineering (AREA)
- Laminated Bodies (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Electroplating Methods And Accessories (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Abstract
本發明提供一種金屬箔,其係藉由於金屬箔設置脫模層而使將該金屬箔貼合於樹脂基材時之樹脂基材可物理性剝離,從而於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除,又,可將樹脂成分不同之樹脂彼此以良好之密接性貼合。本發明之金屬箔於至少一表面具有表面處理層,且表面處理層側表面之水接觸角為90度以上。 The present invention provides a metal foil which is physically peeled off when the metal foil is bonded to a resin substrate by providing a release layer of the metal foil, thereby removing the metal foil from the resin substrate. In the step, the metal foil can be removed at a preferred cost without damaging the contour of the surface of the metal foil transferred onto the surface of the resin substrate, and the resins having different resin components can be bonded to each other with good adhesion. . The metal foil of the present invention has a surface treatment layer on at least one surface, and the water contact angle of the side surface of the surface treatment layer is 90 degrees or more.
Description
本發明係關於一種表面處理金屬箔、積層體、印刷配線板、半導體封裝、電子機器及印刷配線板之製造方法。 The present invention relates to a method of producing a surface-treated metal foil, a laminate, a printed wiring board, a semiconductor package, an electronic device, and a printed wiring board.
印刷配線基板及半導體封裝基板之電路形成工藝方法之主流係減成法,但因近年來進一步之微細配線化,而M-SAP(Modified Semi -Additive Process)、或使用金屬箔之表面輪廓之半加成法等新工藝方法興起。 The mainstream method of forming a circuit for forming a printed wiring board and a semiconductor package substrate is a subtractive method. However, due to further fine wiring in recent years, M-SAP (Modified Semi-Additive Process) or half of the surface profile of the metal foil is used. New process methods such as addition methods have arisen.
該等新電路形成工藝方法中,作為後者之使用金屬箔之表面輪廓之半加成法之一例,列舉如下方法。即,首先,對積層於樹脂基材之金屬箔之整個面進行蝕刻,利用雷射等對轉印有金屬箔表面輪廓之蝕刻基材面進行開孔,施加用以使開孔部導通之無電解鍍銅層,利用乾膜覆蓋無電解鍍銅表面,藉由UV曝光及顯影將電路形成部之乾膜去除,對未被乾膜覆蓋之無電解鍍銅面實施電解鍍銅,將乾膜剝離,最後利用含有硫酸、過氧化氫水之蝕刻液等對無電解鍍銅層進行蝕刻(閃蝕、快速蝕刻),藉此形成微細之電路(專利文獻1、專利文獻2)。 In the new circuit forming process, as an example of the semi-additive method of the surface profile of the metal foil used in the latter, the following method is exemplified. In other words, first, the entire surface of the metal foil laminated on the resin substrate is etched, and the surface of the etched substrate on which the surface contour of the metal foil is transferred is opened by laser or the like, and the opening for conducting the opening is applied. Electrolytic copper plating layer, covering the surface of the electroless copper plating with a dry film, removing the dry film of the circuit forming portion by UV exposure and development, performing electrolytic copper plating on the electroless copper plating surface not covered by the dry film, and drying the film After the peeling, the electroless copper plating layer is etched (flashing, rapid etching) by an etching solution containing sulfuric acid or hydrogen peroxide water, thereby forming a fine circuit (Patent Document 1 and Patent Document 2).
[先前技術文獻] [Previous Technical Literature]
[專利文獻] [Patent Literature]
[專利文獻1]日本特開2006-196863號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2006-196863
[專利文獻2]日本特開2007-242975號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2007-242975
然而,習知之使用金屬箔表面之輪廓之半加成法中,關於在不損傷金屬箔表面之輪廓之情況下良好地轉印至樹脂基材之表面之方面、以及以較佳之成本將該金屬箔去除之方面上仍存在研究之餘地。 However, in the semi-additive method using the contour of the surface of the metal foil, the metal is favorably transferred to the surface of the resin substrate without damaging the contour of the surface of the metal foil, and the metal is preferably used at a preferable cost. There is still room for research in terms of foil removal.
又,近年來,對於樹脂積層電路或樹脂等增層而製造積層體之技術進行了研究、開發。此時,存在於電路或樹脂等增層與樹脂之間無法獲得充分之密接性之情形,必須使單側之樹脂具有凹凸而謀求錨固效應所帶來之密接性提高。於硬化之樹脂表面留下凹凸之方法存在物理加工、化學加工等,但根據樹脂之物理性質或化學性質,存在該等方法不合適之情形。因此,對於在樹脂以良好之密接性設置電路或樹脂等增層之技術,亦期待進一步之開發。 In addition, in recent years, research and development of a technique for producing a laminated body by laminating a resin laminated circuit or a resin has been conducted. In this case, in the case where a sufficient adhesion between the build-up layer such as a circuit or a resin and the resin is not obtained, it is necessary to make the resin on one side have irregularities and to improve the adhesion due to the anchoring effect. There are physical processing, chemical processing, and the like for leaving the unevenness on the surface of the cured resin, but depending on the physical properties or chemical properties of the resin, such methods are not suitable. Therefore, further development is desired for a technique in which a resin or a resin is added to a resin with good adhesion.
本發明人等努力進行研究,結果發現:藉由於金屬箔表面設置脫模層等表面處理層而使金屬箔具有特定之撥水表面,藉此,於將該金屬箔貼合於樹脂基材時,可將金屬箔自樹脂基材物理性剝離。並且發現: 藉由如上所述般使金屬箔可自樹脂基材物理性剝離,而於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除。進而發現:藉由將具有特定之撥水表面之金屬箔與樹脂基材貼合並使其硬化,其後將金屬箔去除,而使輪廓轉印至樹脂基材表面,藉此,可將樹脂基材與增層以良好之密接性積層。 As a result of intensive studies, the present inventors have found that the metal foil has a specific water-repellent surface by providing a surface treatment layer such as a release layer on the surface of the metal foil, thereby bonding the metal foil to the resin substrate. The metal foil can be physically peeled off from the resin substrate. And found: By physically peeling the metal foil from the resin substrate as described above, in the step of removing the metal foil from the resin substrate, the contour of the surface of the metal foil transferred to the surface of the resin substrate can be prevented from being damaged. In the case of the metal foil, the metal foil is removed at a preferred cost. Further, it has been found that the metal foil having a specific water-repellent surface is bonded to the resin substrate to be cured, and then the metal foil is removed, and the outline is transferred to the surface of the resin substrate, whereby the resin base can be removed. The material and the build-up layer are laminated with good adhesion.
基於以上見解而完成之本發明於一態樣中係一種表面處理金屬箔,其於至少一表面具有表面處理層,且上述表面處理層側表面之水接觸角為90度以上。 The present invention, which is completed based on the above findings, is a surface-treated metal foil having a surface treatment layer on at least one surface, and a water contact angle of the side surface of the surface treatment layer is 90 degrees or more.
本發明之金屬箔於一實施形態中,上述表面處理層側表面之由JIS B 0601所定義之峰度Rku為2.0~4.0。 In one embodiment of the metal foil of the present invention, the kurtosis Rku defined by JIS B 0601 on the side surface of the surface treatment layer is 2.0 to 4.0.
本發明之金屬箔於另一實施形態中,上述表面處理層具備上述脫模層,且上述脫模層使自上述脫模層側向上述金屬箔貼合有樹脂基材時之上述樹脂基材可剝離。 In another embodiment of the present invention, the surface treatment layer includes the release layer, and the release layer has the resin substrate when the resin substrate is bonded to the metal foil from the side of the release layer. Peelable.
本發明之表面處理金屬箔於又一實施形態中,上述脫模層係單獨使用或組合使用數種下式所表示之鋁酸鹽化合物、鈦酸鹽化合物、鋯酸鹽化合物、該等之水解生成物、該水解生成物之縮合物而成,(R1)m-M-(R2)n In still another embodiment of the surface-treated metal foil of the present invention, the release layer is used alone or in combination of several kinds of aluminate compounds, titanate compounds, zirconates, and the like, which are represented by the following formulas. a product, a condensate of the hydrolyzate, (R 1 ) m -M-(R 2 ) n
(式中,R1為烷氧基或鹵素原子,R2為選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基,M為Al、Ti、Zr中之任一者,n為0、1或2,m為1以上且M 之價數以下之整數,至少一個R1為烷氧基;再者,m+n為M之價數,即,於Al之情形時為3,於Ti、Zr之情形時為4)。 (wherein R 1 is an alkoxy group or a halogen atom, R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or one or more hydrogen atoms are substituted with a halogen atom; Any one of the hydrocarbon groups, M is any one of Al, Ti, Zr, n is 0, 1 or 2, m is an integer of 1 or more and a valence of M or less, and at least one R 1 is an alkoxy group; Furthermore, m+n is the valence of M, that is, 3 in the case of Al and 4 in the case of Ti and Zr.
本發明之表面處理金屬箔於又一實施形態中,上述脫模層係單獨使用或組合使用數種下式所表示之矽烷化合物、其水解生成物、該水解生成物之縮合物而成,
(式中,R1為烷氧基或鹵素原子,R2為選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基,R3及R4分別獨立地為鹵素原子、或烷氧基、或者選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基)。 (wherein R 1 is an alkoxy group or a halogen atom, R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or one or more hydrogen atoms are substituted with a halogen atom; Any of the hydrocarbon groups in the group, R 3 and R 4 are each independently a halogen atom, or an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms Any one of these groups substituted with a halogen atom).
本發明之表面處理金屬箔於又一實施形態中,上述脫模層係使用分子內具有2個以下之巰基之化合物而成。 In still another embodiment of the surface-treated metal foil of the present invention, the release layer is formed by using a compound having two or less sulfhydryl groups in the molecule.
本發明之表面處理金屬箔於又一實施形態中,於上述金屬箔與上述脫模層之間,設置有選自由粗化處理層、耐熱層、防銹層、鉻酸鹽處理層及矽烷偶合處理層所組成之群中之一種以上之層。 In still another embodiment of the surface-treated metal foil of the present invention, the metal foil and the release layer are provided with a coating selected from the group consisting of a roughened layer, a heat-resistant layer, a rust-proof layer, a chromate-treated layer, and a decane coupling layer. Processing one or more layers of the group consisting of layers.
本發明之表面處理金屬箔於又一實施形態中,於上述選自由粗化處理層、耐熱層、防銹層、鉻酸鹽處理層及矽烷偶合處理層所組成之 群中之一種以上之層之表面設置有樹脂層。 In still another embodiment, the surface-treated metal foil of the present invention comprises the above-mentioned selected from the group consisting of a roughened layer, a heat-resistant layer, a rust-proof layer, a chromate-treated layer, and a decane coupling treatment layer. A surface of one or more layers of the group is provided with a resin layer.
本發明之表面處理金屬箔於又一實施形態中,於上述脫模層側表面設置有樹脂層。 In still another embodiment of the surface-treated metal foil of the present invention, a resin layer is provided on the surface of the release layer side.
本發明之表面處理金屬箔於又一實施形態中,上述樹脂層係接著用樹脂、底塗劑或半硬化狀態之樹脂。 In still another embodiment of the surface-treated metal foil of the present invention, the resin layer is followed by a resin, a primer, or a resin in a semi-hardened state.
本發明之表面處理金屬箔於又一實施形態中,厚度為5~210μm。 In still another embodiment, the surface-treated metal foil of the present invention has a thickness of 5 to 210 μm.
本發明之表面處理金屬箔於又一實施形態中,上述金屬箔為銅箔。 In still another embodiment of the surface-treated metal foil of the present invention, the metal foil is a copper foil.
本發明於又一態樣中係一種積層體,其具備本發明之表面處理金屬箔、及設置於上述表面處理金屬箔之脫模層側之樹脂基材。 In still another aspect, the present invention provides a laminate comprising the surface-treated metal foil of the present invention and a resin substrate provided on the release layer side of the surface-treated metal foil.
本發明之積層體於一實施形態中,上述樹脂基材為預浸料,或者含有熱硬化性樹脂。 In one embodiment of the laminate of the present invention, the resin substrate is a prepreg or a thermosetting resin.
本發明於又一態樣中係一種印刷配線板,其具備本發明之表面處理金屬箔。 In still another aspect, the present invention is a printed wiring board comprising the surface treated metal foil of the present invention.
本發明於又一態樣中係一種半導體封裝,其具備本發明之印刷配線板。 In another aspect, the present invention is a semiconductor package comprising the printed wiring board of the present invention.
本發明於又一態樣中係一種電子機器,其具備本發明之印刷配線板或本發明之半導體封裝。 In another aspect, the invention is an electronic device comprising the printed wiring board of the invention or the semiconductor package of the invention.
本發明於又一態樣中係一種印刷配線板之製造方法,其具備:於本發明之表面處理金屬箔自上述表面處理層側貼合樹脂基材之步驟;藉由不進行蝕刻而將上述表面處理金屬箔自上述樹脂基材剝離,而獲 得於剝離面轉印有上述金屬箔之表面輪廓之樹脂基材之步驟;及於上述轉印有表面輪廓之樹脂基材之上述剝離面側形成電路之步驟。 In another aspect, the present invention provides a method of producing a printed wiring board, comprising: a step of bonding a resin substrate to a surface-treated metal layer of the present invention from the surface treatment layer side; The surface-treated metal foil is peeled off from the above resin substrate, and a step of transferring a resin substrate having a surface profile of the metal foil on the peeling surface; and a step of forming a circuit on the peeling surface side of the resin substrate on which the surface profile is transferred.
本發明之印刷配線板之製造方法於一實施形態中,形成於上述轉印有表面輪廓之樹脂基材之上述剝離面側之電路係鍍覆圖案或印刷圖案。 In one embodiment, the method for producing a printed wiring board according to the present invention is a circuit-plated pattern or a printed pattern formed on the peeling surface side of the resin substrate on which the surface profile is transferred.
本發明於又一態樣中係一種印刷配線板之製造方法,其具備:於本發明之表面處理金屬箔自上述表面處理層側貼合樹脂基材之步驟;藉由不進行蝕刻而將上述表面處理金屬箔自上述樹脂基材剝離,而獲得於剝離面轉印有上述金屬箔之表面輪廓之樹脂基材之步驟;及於上述轉印有表面輪廓之樹脂基材之上述剝離面側設置增層之步驟。 In another aspect, the present invention provides a method of producing a printed wiring board, comprising: a step of bonding a resin substrate to a surface-treated metal layer of the present invention from the surface treatment layer side; a step of peeling the surface-treated metal foil from the resin substrate to obtain a resin substrate on which the surface profile of the metal foil is transferred on the release surface; and setting the peeling surface side of the resin substrate on which the surface profile is transferred Steps to add layers.
本發明之印刷配線板之製造方法於又一實施形態中,構成上述增層之樹脂含有液晶聚合物或聚四氟乙烯。 In still another embodiment of the method for producing a printed wiring board according to the present invention, the resin constituting the layered layer contains a liquid crystal polymer or polytetrafluoroethylene.
藉由於金屬箔設置脫模層而使將該金屬箔貼合於樹脂基材時之樹脂基材可物理性剝離,從而於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除。又,能夠以良好之密接性於樹脂基材上設置增層。 The resin substrate can be physically peeled off by attaching the metal foil to the resin substrate by providing the release layer of the metal foil, so that the step of removing the metal foil from the resin substrate can be performed without damaging the transfer. The metal foil is removed at a preferred cost in the case of the contour of the surface of the metal foil on the surface of the resin substrate. Further, it is possible to provide a buildup layer on the resin substrate with good adhesion.
圖1表示使用銅箔之輪廓之半加成法之概略例。 Fig. 1 shows a schematic example of a semi-additive method using a contour of a copper foil.
(表面處理金屬箔) (surface treatment metal foil)
本發明之表面處理金屬箔於至少一表面、即一表面或兩表面具有表面處理層,且上述表面處理層側表面之水接觸角為90度以上。又,本發明之表面處理金屬箔於一實施形態中,上述表面處理層具備脫模層,且上述脫模層使自上述脫模層側向上述金屬箔貼合有樹脂基材時之上述樹脂基材可剝離。如此,藉由將脫模層等表面處理層設置於金屬箔表面,而使金屬箔具有水接觸角為90度以上之撥水表面,其結果,於將該金屬箔貼合於樹脂基材時,金屬箔能夠自樹脂基材物理性剝離。並且,藉由使金屬箔可自樹脂基材物理性剝離,而於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除。進而,藉由將具有水接觸角為90度以上之撥水表面之金屬箔與樹脂基材貼合並使其硬化,其後將金屬箔去除,從而使輪廓轉印至樹脂基材表面,藉此,能夠以良好之密接性於樹脂基材上積層電路或樹脂等增層等。 The surface-treated metal foil of the present invention has a surface treatment layer on at least one surface, that is, on one surface or both surfaces, and the water contact angle of the side surface of the surface treatment layer is 90 degrees or more. Furthermore, in the surface-treated metal foil of the present invention, the surface-treated layer includes a release layer, and the release layer has the resin when the resin substrate is bonded to the metal foil from the side of the release layer. The substrate can be peeled off. By providing a surface-treated layer such as a release layer on the surface of the metal foil, the metal foil has a water-repellent surface having a water contact angle of 90 degrees or more, and as a result, when the metal foil is bonded to the resin substrate, The metal foil can be physically peeled off from the resin substrate. Further, by physically peeling the metal foil from the resin substrate, in the step of removing the metal foil from the resin substrate, the contour of the surface of the metal foil transferred to the surface of the resin substrate can be prevented from being damaged. The metal foil is removed at a preferred cost. Further, the metal foil having the water-repellent surface having a water contact angle of 90 degrees or more is bonded to the resin substrate to be cured, and then the metal foil is removed to transfer the contour to the surface of the resin substrate. It is possible to laminate a circuit or a resin or the like on a resin substrate with good adhesion.
表面處理金屬箔由於具有水接觸角為90度以上之撥水表面,故而可良好地保持將金屬箔與樹脂基材貼合後之剝離性,並且能夠以良好之密接性設置將金屬箔剝離後之轉印有金屬箔表面之凹凸輪廓之樹脂基材表面與電路或樹脂等增層。 Since the surface-treated metal foil has a water-repellent surface having a water contact angle of 90 degrees or more, the peeling property after bonding the metal foil and the resin substrate can be favorably maintained, and the metal foil can be peeled off with good adhesion. The surface of the resin substrate on which the uneven contour of the surface of the metal foil is transferred is layered with a circuit or a resin.
若表面處理金屬箔之撥水表面之水接觸角未達90度,則會產生將金屬箔貼合於樹脂時之剝離強度變得過高之問題。金屬箔之撥水表面之水接觸角較佳為90度以上,更佳為110度以上。又,若表面處理金屬箔之撥水表面之水接觸角為120度以下,則於金屬箔不會自然地剝離而剝離性為適度之範圍內之方面上較佳。 If the water contact angle of the water-repellent surface of the surface-treated metal foil is less than 90 degrees, the peeling strength when the metal foil is bonded to the resin becomes excessively high. The water contact angle of the water-repellent surface of the metal foil is preferably 90 degrees or more, more preferably 110 degrees or more. Moreover, when the water contact angle of the water-repellent surface of the surface-treated metal foil is 120 degrees or less, it is preferable that the metal foil is not naturally peeled off and the peeling property is within an appropriate range.
又,表面處理金屬箔表面之凹凸形狀亦作為影響剝離強度之因素而較重要。若供設置脫模層之金屬箔表面之峰度Rku為2.0~4.0之範圍,則可兼顧金屬箔之良好之脫模性、及於將金屬箔剝離後設置之電路或樹脂等增層之良好之密接性。 Further, the uneven shape of the surface of the surface-treated metal foil is also important as a factor affecting the peel strength. When the kurtosis Rku of the surface of the metal foil on which the release layer is provided is in the range of 2.0 to 4.0, it is possible to achieve good mold release property of the metal foil and good adhesion of the circuit or resin provided after peeling off the metal foil. The closeness.
再者,於本說明書中,所謂「表面」、「金屬箔之表面」及「金屬箔表面」,於在金屬箔表面設置有粗化處理層、耐熱層、防銹層、鉻酸鹽處理層、矽烷偶合處理層、脫模層等表面處理層之情形時,係指設置該表面處理層後之表面(最外層之表面)。 In addition, in the present specification, the "surface", the "surface of the metal foil", and the "metal foil surface" are provided with a roughened layer, a heat-resistant layer, a rust-proof layer, and a chromate-treated layer on the surface of the metal foil. In the case of a surface treatment layer such as a decane coupling treatment layer or a release layer, it means a surface (the outermost surface) after the surface treatment layer is provided.
再者,脫模層亦可設置於金屬箔之兩面。又,貼合亦可進行壓接而貼合。又,脫模層亦可設置於金屬箔之兩面。 Furthermore, the release layer may also be provided on both sides of the metal foil. Moreover, the bonding can also be performed by crimping and bonding. Further, the release layer may be provided on both sides of the metal foil.
金屬箔(亦稱作生箔)並無特別限定,可使用銅箔、鋁箔、鎳箔、銅合金箔、鎳合金箔、鋁合金箔、不鏽鋼箔、鐵箔、鐵合金箔等。 The metal foil (also referred to as a green foil) is not particularly limited, and a copper foil, an aluminum foil, a nickel foil, a copper alloy foil, a nickel alloy foil, an aluminum alloy foil, a stainless steel foil, an iron foil, an iron alloy foil, or the like can be used.
金屬箔(生箔)之厚度並無特別限定,例如可設為5~105μm。又,就自樹脂基材之剝離變得容易之方面而言,金屬箔之厚度較佳為9~70μm,更佳為12~35μm,進而更佳為18~35μm。 The thickness of the metal foil (raw foil) is not particularly limited, and can be, for example, 5 to 105 μm. Further, the thickness of the metal foil is preferably from 9 to 70 μm, more preferably from 12 to 35 μm, still more preferably from 18 to 35 μm, in terms of easy peeling from the resin substrate.
以下,作為金屬箔(生箔)之例,對銅箔進行說明。作為銅箔(生箔)之製造方法,並無特別限定,例如可以下述之電解條件製作電解銅箔。 Hereinafter, the copper foil will be described as an example of a metal foil (raw foil). The method for producing the copper foil (raw foil) is not particularly limited, and for example, an electrolytic copper foil can be produced under the following electrolysis conditions.
電解生箔之電解條件: Electrolytic conditions for electrolytic foil:
Cu:30~190g/L Cu: 30~190g/L
H2SO4:100~400g/L H 2 SO 4 : 100~400g/L
氯化物離子(Cl-):60~200質量ppm Chloride ion (Cl - ): 60 to 200 ppm by mass
動物膠:1~10ppm Animal glue: 1~10ppm
電解液溫度:25~80℃ Electrolyte temperature: 25~80°C
電解時間:10~300秒(根據析出之銅厚、電流密度進行調整) Electrolysis time: 10~300 seconds (adjusted according to copper thickness and current density)
電流密度:50~150A/dm2 Current density: 50~150A/dm 2
電解液線速度:1.5~5m/sec Electrolyte line speed: 1.5~5m/sec
於本發明中,將金屬箔自樹脂基材去除,意指藉由利用蝕刻等之化學處理將金屬箔自樹脂基材去除、或藉由剝離等物理性地將樹脂基材自金屬箔剝離。於將樹脂基材如上所述般於與本發明之表面處理金屬箔貼合後去除時,樹脂基材與表面處理金屬箔於脫模層分離。此時,於樹脂基材之剝離面亦可殘留有剝離層、下述金屬箔之粗化粒子、耐熱層、防銹層、鉻酸鹽處理層、矽烷偶合處理層等之一部分,但較佳為不存在殘留物。 In the present invention, the removal of the metal foil from the resin substrate means that the metal foil is removed from the resin substrate by chemical treatment such as etching, or the resin substrate is physically peeled off from the metal foil by peeling or the like. When the resin substrate is removed after being bonded to the surface-treated metal foil of the present invention as described above, the resin substrate and the surface-treated metal foil are separated from the release layer. In this case, a part of the peeling layer, the roughened particles of the following metal foil, the heat-resistant layer, the rust-preventing layer, the chromate-treated layer, and the decane coupling treatment layer may remain on the peeling surface of the resin substrate, but it is preferably In the absence of residue.
關於本發明之表面處理金屬箔,較佳為於自脫模層側向金屬箔貼合有樹脂基材時將樹脂基材剝離時之剝離強度為200gf/cm以下。若以此方式進行控制,則樹脂基材之物理性剝離變得容易,金屬箔表面之輪廓被更良好地轉印至樹脂基材。該剝離強度更佳為150gf/cm以下,進而更佳為100gf/cm以下,進而更佳為50gf/cm以下,典型而言為1~200gf/cm,更典型而言為1~150gf/cm。 In the surface-treated metal foil of the present invention, when the resin substrate is bonded to the metal foil from the side of the release layer, the peel strength is preferably 200 gf/cm or less. When the control is carried out in this manner, the physical peeling of the resin substrate becomes easy, and the contour of the surface of the metal foil is more favorably transferred to the resin substrate. The peel strength is more preferably 150 gf/cm or less, still more preferably 100 gf/cm or less, still more preferably 50 gf/cm or less, and typically 1 to 200 gf/cm, and more typically 1 to 150 gf/cm.
繼而,對本發明中可使用之脫模層進行說明。 Next, the release layer which can be used in the present invention will be described.
(1)矽烷化合物 (1) decane compound
藉由單獨使用或混合使用數種具有下式所表示之結構之矽烷化合物、或其水解生成物、或該水解生成物之縮合物(以下,簡記為矽烷化合物)而形成脫模層,從而於將表面處理金屬箔與樹脂基材貼合時,密接性會適 度地降低,可將剝離強度調節為上述範圍。 The decane compound having a structure represented by the following formula, or a hydrolyzate thereof, or a condensate of the hydrolyzate (hereinafter, abbreviated as a decane compound) is used alone or in combination to form a release layer. When the surface-treated metal foil is bonded to the resin substrate, the adhesion is suitable. The degree of peeling can be adjusted to the above range.
式:
(式中,R1為烷氧基或鹵素原子,R2為選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基,R3及R4分別獨立地為鹵素原子、或烷氧基、或者選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基) (wherein R 1 is an alkoxy group or a halogen atom, R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or one or more hydrogen atoms are substituted with a halogen atom; Any of the hydrocarbon groups in the group, R 3 and R 4 are each independently a halogen atom, or an alkoxy group, or a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms Any one of the groups substituted with a halogen atom)
該矽烷化合物必須具有至少一個烷氧基。於不存在烷氧基而僅由選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基構成取代基之情形時,存在樹脂基材與金屬箔之密接性過度降低之傾向。又,該矽烷化合物必須具有至少一個之選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基。其原因在於:於不存在該烴基之情形時,存在樹脂基材與金屬箔之密接性上升之傾向。再者,烷氧基中亦包含一個以上之氫原子被取代為鹵素原子之烷氧基。 The decane compound must have at least one alkoxy group. Substituting a hydrocarbon group in a group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or a hydrocarbon group in which one or more hydrogen atoms are substituted with a halogen atom, in the absence of an alkoxy group In the case of a base, there is a tendency that the adhesion between the resin substrate and the metal foil is excessively lowered. Further, the decane compound must have at least one hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or any one of the groups in which one or more hydrogen atoms are substituted with a halogen atom. This is because when the hydrocarbon group is not present, the adhesion between the resin substrate and the metal foil tends to increase. Further, the alkoxy group also contains an alkoxy group in which one or more hydrogen atoms are substituted with a halogen atom.
於將樹脂基材與金屬箔之剝離強度調節為上述範圍之方面而言,該矽烷化合物較佳為具有三個烷氧基、一個上述烴基(包含一個以 上之氫原子被取代為鹵素原子之烴基)。若以上式言此,則係指R3及R4兩者為烷氧基。 In order to adjust the peeling strength of the resin substrate and the metal foil to the above range, the decane compound preferably has three alkoxy groups and one of the above hydrocarbon groups (hydrocarbon groups containing one or more hydrogen atoms substituted with a halogen atom) ). In the above formula, it is meant that both R 3 and R 4 are alkoxy groups.
作為烷氧基,並無限定,可列舉:甲氧基、乙氧基、正或異丙氧基、正、異或第三丁氧基、正、異或新戊氧基、正己氧基、環己氧基、正庚氧基、及正辛氧基等直鏈狀、支鏈狀、或環狀之碳數1~20、較佳為碳數1~10、更佳為碳數1~5之烷氧基。 The alkoxy group is not limited, and examples thereof include a methoxy group, an ethoxy group, a normal or isopropoxy group, a n-, iso- or tert-butoxy group, a n-, iso- or neopentyloxy group, and a n-hexyloxy group. The linear, branched or cyclic carbon number such as cyclohexyloxy, n-heptyloxy and n-octyloxy is 1 to 20, preferably 1 to 10, more preferably 1 to carbon. 5 alkoxy groups.
作為鹵素原子,可列舉:氟原子、氯原子、溴原子及碘原子。 Examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
作為烷基,並無限定,可列舉:甲基、乙基、正或異丙基、正、異或第三丁基、正、異或新戊基、正己基、正辛基、正癸基等直鏈狀或支鏈狀之碳數1~20、較佳為碳數1~10、更佳為碳數1~5之烷基。 The alkyl group is not limited and may, for example, be a methyl group, an ethyl group, a normal or an isopropyl group, a normal or an isobutyl group, a n-, iso- or neopentyl group, a n-hexyl group, an n-octyl group or a n-decyl group. The linear or branched carbon number is from 1 to 20, preferably from 1 to 10 carbon atoms, more preferably from 1 to 5 carbon atoms.
作為環烷基,並無限定,可列舉:環丙基、環丁基、環戊基、環己基、環庚基、環辛基等碳數3~10、較佳為碳數5~7之環烷基。 The cycloalkyl group is not limited, and examples thereof include a carbon number of 3 to 10, preferably a carbon number of 5 to 7 such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group or a cyclooctyl group. Cycloalkyl.
作為芳基,可列舉苯基、經烷基取代之苯基(例:甲苯基、二甲苯基)、1-或2-萘基、蒽基等碳數6~20、較佳為6~14之芳基。 Examples of the aryl group include a phenyl group, an alkyl group-substituted phenyl group (for example, tolyl group, xylyl group), a 1- or 2-naphthyl group, and a fluorenyl group having 6 to 20 carbon atoms, preferably 6 to 14 carbon atoms. The aryl group.
該等烴基之一個以上之氫原子亦可被取代為鹵素原子,例如可被取代為氟原子、氯原子、或溴原子。 One or more hydrogen atoms of the hydrocarbon groups may be substituted with a halogen atom, and for example, may be substituted with a fluorine atom, a chlorine atom, or a bromine atom.
作為較佳之矽烷化合物之例,可列舉:甲基三甲氧基矽烷、乙基三甲氧基矽烷、正或異丙基三甲氧基矽烷、正、異或第三丁基三甲氧基矽烷、正、異或新戊基三甲氧基矽烷、己基三甲氧基矽烷、辛基三甲氧基矽烷、癸基三甲氧基矽烷、苯基三甲氧基矽烷;烷基取代苯基三甲氧基矽烷(例如對(甲基)苯基三甲氧基矽烷)、甲基三乙氧基矽烷、乙基三乙氧基矽烷、正或異丙基三乙氧基矽烷、正、異或第三丁基三乙氧基矽烷、 戊基三乙氧基矽烷、己基三乙氧基矽烷、辛基三乙氧基矽烷、癸基三乙氧基矽烷、苯基三乙氧基矽烷、烷基取代苯基三乙氧基矽烷(例如對(甲基)苯基三乙氧基矽烷)、(3,3,3-三氟丙基)三甲氧基矽烷、及十三氟辛基三乙氧基矽烷、甲基三氯矽烷、二甲基二氯矽烷、三甲基氯矽烷、苯基三氯矽烷、三甲基氟矽烷、二甲基二溴矽烷、二苯基二溴矽烷、該等之水解生成物、及該等之水解生成物之縮合物等。該等中,就獲取之容易性之觀點而言,較佳為丙基三甲氧基矽烷、甲基三乙氧基矽烷、己基三甲氧基矽烷、苯基三乙氧基矽烷、癸基三甲氧基矽烷。 Preferred examples of the decane compound include methyltrimethoxydecane, ethyltrimethoxydecane, n- or isopropyltrimethoxynonane, n-, iso- or tert-butyltrimethoxydecane, and Iso- or neopentyltrimethoxydecane, hexyltrimethoxydecane, octyltrimethoxydecane, decyltrimethoxydecane, phenyltrimethoxydecane;alkyl-substituted phenyltrimethoxynonane (for example, Methyl)phenyltrimethoxydecane), methyltriethoxydecane, ethyltriethoxydecane, n- or isopropyltriethoxydecane, n-, iso- or tert-butyltriethoxy Decane, Butyl triethoxy decane, hexyl triethoxy decane, octyl triethoxy decane, decyl triethoxy decane, phenyl triethoxy decane, alkyl substituted phenyl triethoxy decane ( For example, p-(methyl)phenyltriethoxydecane), (3,3,3-trifluoropropyl)trimethoxynonane, and tridecafluorooctyltriethoxydecane, methyltrichlorodecane, Dimethyldichlorodecane, trimethylchlorodecane, phenyltrichlorodecane, trimethylfluorodecane, dimethyldibromodecane, diphenyldibromodecane, hydrolyzed products thereof, and the like A condensate of a hydrolyzed product or the like. Among these, from the viewpoint of easiness of obtaining, propyltrimethoxydecane, methyltriethoxydecane, hexyltrimethoxydecane, phenyltriethoxydecane, decyltrimethoxy is preferred. Base decane.
於脫模層之形成步驟中,矽烷化合物可以水溶液之形態進行使用。為了提高對水之溶解性,亦可添加甲醇或乙醇等醇。醇之添加於使用疏水性較高之矽烷化合物時尤其有效。矽烷化合物之水溶液藉由進行攪拌而促進烷氧基之水解,若攪拌時間較長,則會促進水解生成物之縮合。通常,於使用經過充分之攪拌時間而使水解及縮合充分進行之矽烷化合物時,存在樹脂基材與金屬箔之剝離強度降低之傾向。因此,可藉由攪拌時間之調整而調整剝離強度。作為使矽烷化合物溶解於水中後之攪拌時間並無限定,例如可設為1~100小時,典型而言可設為1~30小時。當然,亦存在不進行攪拌而使用之方法。 In the step of forming the release layer, the decane compound can be used in the form of an aqueous solution. In order to improve the solubility in water, an alcohol such as methanol or ethanol may be added. The addition of an alcohol is particularly effective when a highly hydrophobic decane compound is used. The aqueous solution of the decane compound promotes hydrolysis of the alkoxy group by stirring, and if the stirring time is long, the condensation of the hydrolyzate is promoted. In general, when a decane compound which is sufficiently subjected to hydrolysis and condensation after a sufficient stirring time is used, the peel strength of the resin substrate and the metal foil tends to decrease. Therefore, the peel strength can be adjusted by adjusting the stirring time. The stirring time after dissolving the decane compound in water is not limited, and may be, for example, 1 to 100 hours, and typically 1 to 30 hours. Of course, there is also a method of using without stirring.
於矽烷化合物在水溶液中之矽烷化合物之濃度較高時,存在金屬箔與板狀載體之剝離強度降低之傾向,可藉由矽烷化合物之濃度調整來調整剝離強度。 When the concentration of the decane compound in the aqueous solution is high, the peel strength of the metal foil and the plate-shaped carrier tends to decrease, and the peel strength can be adjusted by adjusting the concentration of the decane compound.
又,藉由提高矽烷化合物在水溶液中之矽烷化合物之濃度,可較習知進一步提高撥水性。矽烷化合物在水溶液中之矽烷化合物之濃度可設為8 ~15體積%。若該濃度未達8體積%,則會產生撥水性不足(具體而言,存在水接觸角未達90度之情形),於超過15體積%之情形時,會產生矽烷化合物之溶解不良,於使該金屬箔與樹脂基板積層時,有因未反應矽烷化合物而產生鼓起之虞。 Further, by increasing the concentration of the decane compound in the aqueous solution of the decane compound, it is known to further improve the water repellency. The concentration of the decane compound in the decane compound in the aqueous solution can be set to 8 ~15% by volume. If the concentration is less than 8% by volume, insufficient water repellency (specifically, there is a case where the water contact angle is less than 90 degrees), and when it exceeds 15% by volume, the decane compound is poorly dissolved. When the metal foil and the resin substrate are laminated, there is a possibility that bulging occurs due to the unreacted decane compound.
又,較佳為於在金屬箔之處理表面塗佈矽烷化合物後,實施2次乾燥步驟。第1次乾燥係僅出於使矽烷化合物之水溶液乾燥之目的而進行。第2次乾燥係藉由針對未完全進行縮合反應之矽烷化合物內之羥基,使縮合反應全部結束而消除殘留之OH基(羥基),而具有使撥水性提高之效果。第1次乾燥可以80~120℃×10秒~2分鐘之條件進行,第2次乾燥可以120~200℃×30秒~5分鐘之條件進行。 Further, it is preferred to carry out the drying step twice after applying the decane compound to the treated surface of the metal foil. The first drying is carried out only for the purpose of drying the aqueous solution of the decane compound. In the second drying, the OH group (hydroxy group) is eliminated by completely eliminating the condensation reaction for the hydroxyl group in the decane compound which is not completely subjected to the condensation reaction, and the water repellency is improved. The first drying can be carried out at 80 to 120 ° C for 10 seconds to 2 minutes, and the second drying can be carried out at 120 to 200 ° C for 30 seconds to 5 minutes.
又,於使用矽烷化合物之水-醇混合溶液之情形時,為了使難溶於水之矽烷化合物均勻地溶解,該溶液中之醇濃度較佳為20~80體積%。若該溶液中之醇濃度未達20體積%,則存在矽烷化合物不溶解之情形,於超過80體積%之情形時,水解反應變得不完全,故而有矽烷化合物未被水解而直接殘留,撥水性降低,水之接觸角變小之虞。 Further, in the case of using a water-alcohol mixed solution of a decane compound, in order to uniformly dissolve the poorly water-soluble decane compound, the concentration of the alcohol in the solution is preferably from 20 to 80% by volume. If the concentration of the alcohol in the solution is less than 20% by volume, the decane compound is not dissolved. When the amount exceeds 80% by volume, the hydrolysis reaction becomes incomplete, so that the decane compound is directly hydrolyzed and remains. The water content is lowered, and the contact angle of water becomes small.
矽烷化合物之水溶液之pH並無特別限制,於酸性側或鹼性側均可利用。例如可以3.0~10.0之範圍之pH進行使用。就無需進行特別之pH調整之觀點而言,較佳為設為中性附近之5.0~9.0之範圍之pH,更佳為設為7.0~9.0之範圍之pH。 The pH of the aqueous solution of the decane compound is not particularly limited and can be utilized on the acidic side or the alkaline side. For example, it can be used at a pH in the range of 3.0 to 10.0. From the viewpoint of not requiring special pH adjustment, it is preferably a pH in the range of 5.0 to 9.0 in the vicinity of neutrality, and more preferably a pH in the range of 7.0 to 9.0.
(2)分子內具有2個以下之巰基之化合物 (2) Compounds having two or less sulfhydryl groups in the molecule
脫模層係使用分子內具有2個以下之巰基之化合物而構成,即便藉由介隔該脫模層將樹脂基材與金屬箔貼合,而密接性亦會適度地降低,可調 節剝離強度。 The release layer is formed by using a compound having two or less sulfhydryl groups in the molecule, and even if the resin substrate is bonded to the metal foil by interposing the release layer, the adhesion is moderately lowered, and the adjustment is possible. Section peel strength.
但是,於使分子內具有3個以上之巰基之化合物或其鹽介存於樹脂基材與金屬箔之間而將其等貼合之情形時,不符合降低剝離強度之目的。認為其原因在於:若分子內存在過量之巰基,則存在藉由巰基彼此、或巰基與板狀載體、或巰基與金屬箔之化學反應而過量地生成硫鍵、雙硫鍵或多硫鍵,於樹脂基材與金屬箔之間形成牢固之三維交聯結構,藉此剝離強度上升之情形。此種事例揭示於日本特開2000-196207號公報中。 However, when a compound having three or more mercapto groups in the molecule or a salt thereof is interposed between the resin substrate and the metal foil and bonded thereto, the peel strength is not satisfied. The reason is considered to be that if there are excessive sulfhydryl groups in the molecule, there are excessively generated sulfur bonds, disulfide bonds or polysulfide bonds by chemical reaction of sulfhydryl groups with each other, or sulfhydryl groups and plate-shaped carriers, or sulfhydryl groups and metal foils. A strong three-dimensional crosslinked structure is formed between the resin substrate and the metal foil, whereby the peel strength is increased. Such an example is disclosed in Japanese Laid-Open Patent Publication No. 2000-196207.
作為該分子內具有2個以下之巰基之化合物,可列舉:硫醇、二硫醇、硫羧酸或其鹽、二硫羧酸或其鹽、硫磺酸或其鹽、及二硫磺酸或其鹽,可使用選自該等中之至少一種。 Examples of the compound having two or less mercapto groups in the molecule include a mercaptan, a dithiol, a sulfuric acid or a salt thereof, a dithiocarboxylic acid or a salt thereof, sulfuric acid or a salt thereof, and disulfuric acid or As the salt, at least one selected from the group consisting of these can be used.
硫醇係分子內具有一個巰基者,例如由R-SH表示。此處,R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。 A thiol group having a fluorenyl group in the molecule is represented, for example, by R-SH. Here, R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group.
二硫醇係分子內具有兩個巰基者,例如由R(SH)2表示。R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。又,兩個巰基可分別鍵結於相同之碳,亦可鍵結於互相不同之碳或氮。 The dithiol type has two indenyl groups in the molecule, and is represented, for example, by R(SH) 2 . R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group. Further, the two sulfhydryl groups may be bonded to the same carbon, respectively, or may be bonded to carbon or nitrogen which are different from each other.
硫羧酸係有機羧酸之羥基被取代為巰基者,例如由R-CO-SH表示。R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。又,硫羧酸亦可以鹽之形態進行使用。再者,亦可使用具有兩個硫羧酸基之化合物。 The hydroxy group of the thiocarboxylic acid-based organic carboxylic acid is substituted with a fluorenyl group, and is represented, for example, by R-CO-SH. R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group. Further, the sulfuric acid can also be used in the form of a salt. Further, a compound having two thiocarboxylic acid groups can also be used.
二硫羧酸係有機羧酸之羧基中之2個氧原子被取代為硫原子者,例如由R-(CS)-SH表示。R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。又,二硫羧酸亦可以鹽之形態進行使用。 再者,亦可使用具有兩個二硫羧酸基之化合物。 The two oxygen atoms in the carboxyl group of the dithiocarboxylic acid-based organic carboxylic acid are substituted with a sulfur atom, and are represented, for example, by R-(CS)-SH. R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group. Further, the dithiocarboxylic acid can also be used in the form of a salt. Further, a compound having two dithiocarboxylic acid groups can also be used.
硫磺酸係有機磺酸之羥基被取代為巰基者,例如由R(SO2)-SH表示。R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。又,硫磺酸亦可以鹽之形態進行使用。 The hydroxyl group of the sulfuric acid-based organic sulfonic acid is substituted with a fluorenyl group, and is represented, for example, by R(SO 2 )-SH. R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group. Further, sulfuric acid can also be used in the form of a salt.
二硫磺酸係有機二磺酸之兩個羥基分別被取代為巰基者,例如由R-((SO2)-SH)2表示。R表示亦可包含羥基或胺基之脂肪族系或芳香族系烴基或者雜環基。又,兩個硫磺酸基可分別鍵結於相同之碳,亦可鍵結於互相不同之碳。又,二硫磺酸亦可以鹽之形態進行使用。 The two hydroxyl groups of the disulfonic acid-based organic disulfonic acid are each substituted with a fluorenyl group, for example, represented by R-((SO 2 )-SH) 2 . R represents an aliphatic or aromatic hydrocarbon group or a heterocyclic group which may further contain a hydroxyl group or an amine group. Further, the two sulfonic acid groups may be bonded to the same carbon, respectively, or may be bonded to carbons different from each other. Further, disulfuric acid can also be used in the form of a salt.
此處,作為有關R之較佳之脂肪族系烴基,可列舉:烷基、環烷基,該等烴基可包含羥基與胺基之任一者或兩者。 Here, as the preferred aliphatic hydrocarbon group for R, an alkyl group or a cycloalkyl group may be mentioned, and the hydrocarbon group may include either or both of a hydroxyl group and an amine group.
又,作為烷基,並無限定,可列舉:甲基、乙基、正或異丙基、正、異或第三丁基、正、異或新戊基、正己基、正辛基、正癸基等直鏈狀或支鏈狀之碳數1~20、較佳為碳數1~10、更佳為碳數1~5之烷基。 Further, the alkyl group is not limited, and examples thereof include a methyl group, an ethyl group, a normal or an isopropyl group, a normal or an isobutyl group, a normal or an iso-pentyl group, a n-hexyl group, a n-octyl group, and a positive group. The linear or branched carbon number such as a mercapto group is 1 to 20, preferably a carbon number of 1 to 10, more preferably an alkyl group having 1 to 5 carbon atoms.
又,作為環烷基,並無限定,可列舉:環丙基、環丁基、環戊基、環己基、環庚基、環辛基等碳數3~10、較佳為碳數5~7之環烷基。 Further, the cycloalkyl group is not limited, and examples thereof include a carbon number of 3 to 10, preferably a carbon number of 5 to 10, such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group or a cyclooctyl group. 7 cycloalkyl.
又,作為有關R之較佳之芳香族烴基,可列舉:苯基、經烷基取代之苯基(例:甲苯基、二甲苯基)、1-或2-萘基、蒽基等碳數6~20、較佳為6~14之芳基,該等烴基可包含羥基與胺基之任一者或兩者。 Further, examples of the preferred aromatic hydrocarbon group for R include a phenyl group, a phenyl group substituted by an alkyl group (for example, a tolyl group, a xylyl group), a 1- or 2-naphthyl group, and a fluorenyl group. ~20, preferably 6 to 14 aryl groups, which may comprise either or both of a hydroxyl group and an amine group.
又,作為有關R之較佳之雜環基,可列舉:咪唑、三唑、四唑、苯并咪唑、苯并三唑、噻唑、苯并噻唑,可包含羥基與胺基之任一者或兩者。 Further, as a preferred heterocyclic group for R, there may be mentioned imidazole, triazole, tetrazole, benzimidazole, benzotriazole, thiazole, benzothiazole, and may contain either or both of a hydroxyl group and an amine group. By.
作為分子內具有2個以下之巰基之化合物之較佳之例,可列 舉:3-巰基-1,2-丙二醇、2-巰基乙醇、1,2-乙二硫醇、6-巰基-1-己醇、1-辛硫醇、1-十二烷硫醇、10-羥基-1-十二烷硫醇、10-羧基-1-十二烷硫醇、10-胺基-1-十二烷硫醇、1-十二烷硫醇磺酸鈉、苯硫酚、硫代苯甲酸、4-胺基苯硫酚、對甲苯硫醇、2,4-二甲基苯硫醇、3-巰基-1,2,4-三唑、2-巰基苯并噻唑。該等中,就水溶性與廢棄物處理上之觀點而言,較佳為3-巰基-1,2-丙二醇。 A preferred example of a compound having two or less sulfhydryl groups in the molecule can be listed. Take: 3-mercapto-1,2-propanediol, 2-mercaptoethanol, 1,2-ethanedithiol, 6-mercapto-1-hexanol, 1-octylmercaptan, 1-dodecanethiol, 10 -hydroxy-1-dodecyl mercaptan, 10-carboxy-1-dodecanethiol, 10-amino-1-dodecanethiol, sodium 1-dodecanethiolsulfonate, thiophenol , thiobenzoic acid, 4-amino thiophenol, p-toluene thiol, 2,4-dimethyl benzene thiol, 3-mercapto-1,2,4-triazole, 2-mercaptobenzothiazole. Among these, from the viewpoint of water solubility and waste treatment, 3-mercapto-1,2-propanediol is preferred.
於脫模層之形成步驟中,分子內具有2個以下之巰基之化合物可以水溶液之形態進行使用。為了提高對水之溶解性,亦可添加甲醇或乙醇等醇。醇之添加於使用疏水性較高之分子內具有2個以下之巰基之化合物時尤其有效。 In the step of forming the release layer, a compound having two or less mercapto groups in the molecule can be used in the form of an aqueous solution. In order to improve the solubility in water, an alcohol such as methanol or ethanol may be added. The addition of an alcohol is particularly effective when a compound having two or less mercapto groups in a molecule having high hydrophobicity is used.
分子內具有2個以下之巰基之化合物於水溶液中之濃度較高時,存在樹脂基材與金屬箔之剝離強度降低之傾向,可藉由調整分子內具有2個以下之巰基之化合物之濃度而調整剝離強度。 When the concentration of the compound having two or less sulfhydryl groups in the molecule is high in the aqueous solution, the peel strength of the resin substrate and the metal foil tends to decrease, and the concentration of the compound having two or less sulfhydryl groups in the molecule can be adjusted. Adjust the peel strength.
又,藉由提高分子內具有2個以下之巰基之化合物於水溶液中之濃度,可較習知進一步提高撥水性。分子內具有2個以下之巰基之化合物於水溶液中之濃度可設為8~15體積%。若該濃度未達8體積%,則會產生撥水性不足(具體而言,存在水接觸角未達90度之情形),於超過15體積%之情形時,會產生分子內具有2個以下之巰基之化合物之溶解不良,於使該金屬箔與樹脂基板積層時,有因未反應化合物而產生鼓起之虞。 Further, by increasing the concentration of the compound having two or less sulfhydryl groups in the aqueous solution in the aqueous solution, the water repellency can be further improved. The concentration of the compound having two or less sulfhydryl groups in the molecule in the aqueous solution can be set to 8 to 15% by volume. If the concentration is less than 8% by volume, insufficient water repellency (specifically, there is a case where the water contact angle is less than 90 degrees), and when it exceeds 15% by volume, two or less molecules are generated in the molecule. The compound of the sulfhydryl group is poorly dissolved, and when the metal foil and the resin substrate are laminated, there is a tendency to bulge due to the unreacted compound.
又,較佳為於在金屬箔之處理表面塗佈分子內具有2個以下之巰基之化合物後,實施2次乾燥步驟。第1次乾燥係僅出於使分子內具有2個以下之巰基之化合物之水溶液乾燥之目的而進行。第2次乾燥係藉由調整配 位於金屬箔表面之分子內具有2個以下之巰基之化合物之排列,而具有使撥水性提高之效果。第1次乾燥可以80~120℃×10秒~2分鐘之條件進行,第2次乾燥可以120~200℃×30秒~5分鐘之條件進行。 Further, it is preferred to apply a drying step twice after coating a compound having two or less sulfhydryl groups in the molecule on the treated surface of the metal foil. The first drying is carried out only for the purpose of drying an aqueous solution of a compound having two or less sulfhydryl groups in the molecule. The second drying is done by adjusting The arrangement of compounds having two or less sulfhydryl groups in the molecule of the surface of the metal foil has an effect of improving water repellency. The first drying can be carried out at 80 to 120 ° C for 10 seconds to 2 minutes, and the second drying can be carried out at 120 to 200 ° C for 30 seconds to 5 minutes.
又,於使用分子內具有2個以下之巰基之化合物之水-醇混合溶液之情形時,為了使難溶於水之分子內具有2個以下之巰基之化合物均勻地溶解,該溶液中之醇濃度較佳為20~80體積%。若該溶液中之醇濃度未達20體積%,則存在分子內具有2個以下之巰基之化合物不溶解之情形,於超過80體積%之情形時,有緻密地配位於金屬箔表面之分子內具有2個以下之巰基之化合物之排列混亂,撥水性降低,水之接觸角變小之虞。 Further, in the case of using a water-alcohol mixed solution of a compound having two or less sulfhydryl groups in the molecule, in order to uniformly dissolve a compound having two or less sulfhydryl groups in a water-insoluble molecule, the alcohol in the solution The concentration is preferably from 20 to 80% by volume. If the concentration of the alcohol in the solution is less than 20% by volume, the compound having two or less sulfhydryl groups in the molecule does not dissolve, and in the case of more than 80% by volume, it is densely disposed in the molecule of the surface of the metal foil. The arrangement of the compound having two or less sulfhydryl groups is disordered, the water repellency is lowered, and the contact angle of water becomes small.
分子內具有2個以下之巰基之化合物之水溶液之pH並無特別限制,於酸性側或鹼性側均可利用。例如可以3.0~10.0之範圍之pH進行使用。就無需進行特別之pH調整之觀點而言,較佳為設為中性附近之5.0~9.0之範圍之pH,更佳為設為7.0~9.0之範圍之pH。 The pH of the aqueous solution of the compound having two or less sulfhydryl groups in the molecule is not particularly limited, and it can be used on the acidic side or the alkaline side. For example, it can be used at a pH in the range of 3.0 to 10.0. From the viewpoint of not requiring special pH adjustment, it is preferably a pH in the range of 5.0 to 9.0 in the vicinity of neutrality, and more preferably a pH in the range of 7.0 to 9.0.
(3)金屬烷氧化物 (3) Metal alkoxide
可單獨使用或混合使用數種具有下式所表示之結構之鋁酸鹽化合物、鈦酸鹽化合物、鋯酸鹽化合物、或其水解生成物、或該水解生成物之縮合物(以下,簡記為金屬烷氧化物)而構成脫模層。藉由介隔該脫模層將樹脂基材與金屬箔貼合,而使密接性適度地降低,可調節剝離強度。 The aluminate compound, the titanate compound, the zirconate compound, or the hydrolyzate thereof, or the condensate of the hydrolyzate may be used alone or in combination (hereinafter, abbreviated as The metal alkoxide) constitutes a release layer. The resin substrate and the metal foil are bonded to each other by interposing the release layer, whereby the adhesion is appropriately lowered, and the peel strength can be adjusted.
(R1)m-M-(R2)n (R 1 ) m -M-(R 2 ) n
式中,R1為烷氧基或鹵素原子,R2為選自由烷基、環烷基及 芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基,M為Al、Ti、Zr中之任一者,n為0、1或2,m為1以上且M之價數以下之整數,至少一個R1為烷氧基。再者,m+n為M之價數,即,於Al之情形時為3,於Ti、Zr之情形時為4。 Wherein R 1 is an alkoxy group or a halogen atom, R 2 is a hydrocarbon group selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or a group in which one or more hydrogen atoms are substituted with a halogen atom Any one of the hydrocarbon groups, M is any one of Al, Ti, and Zr, n is 0, 1 or 2, m is an integer of 1 or more and a valence of M or less, and at least one R 1 is an alkoxy group. Furthermore, m+n is the valence of M, that is, 3 in the case of Al and 4 in the case of Ti and Zr.
該金屬烷氧化物必須具有至少一個烷氧基。於不存在烷氧基而僅由選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基構成取代基之情形時,存在樹脂基材與金屬箔之密接性過度降低之傾向。又,該金屬烷氧化物必須具有0~2個選自由烷基、環烷基及芳基所組成之群中之烴基、或一個以上之氫原子被取代為鹵素原子之該等基中之任一烴基。其原因在於:於具有3個以上之該烴基之情形時,存在樹脂基材與金屬箔之密接性過度降低之傾向。再者,烷氧基中亦包含一個以上之氫原子被取代為鹵素原子之烷氧基。於將樹脂基材與金屬箔之剝離強度調節為上述範圍之方面而言,該金屬烷氧化物較佳為具有兩個以上之烷氧基、一個或兩個上述烴基(包含一個以上之氫原子被取代為鹵素原子之烴基)。 The metal alkoxide must have at least one alkoxy group. Substituting a hydrocarbon group in a group consisting of an alkyl group, a cycloalkyl group, and an aryl group, or a hydrocarbon group in which one or more hydrogen atoms are substituted with a halogen atom, in the absence of an alkoxy group In the case of a base, there is a tendency that the adhesion between the resin substrate and the metal foil is excessively lowered. Further, the metal alkoxide must have any one of 0 to 2 hydrocarbon groups selected from the group consisting of an alkyl group, a cycloalkyl group and an aryl group, or one or more hydrogen atoms substituted with a halogen atom. a hydrocarbon group. The reason for this is that when three or more of the hydrocarbon groups are present, the adhesion between the resin substrate and the metal foil tends to be excessively lowered. Further, the alkoxy group also contains an alkoxy group in which one or more hydrogen atoms are substituted with a halogen atom. The metal alkoxide preferably has two or more alkoxy groups, one or two of the above hydrocarbon groups (containing one or more hydrogen atoms) in terms of adjusting the peeling strength of the resin substrate and the metal foil to the above range. A hydrocarbon group substituted with a halogen atom).
又,作為烷基,並無限定,可列舉:甲基、乙基、正或異丙基、正、異或第三丁基、正、異或新戊基、正己基、正辛基、正癸基等直鏈狀或支鏈狀之碳數1~20、較佳為碳數1~10、更佳為碳數1~5之烷基。 Further, the alkyl group is not limited, and examples thereof include a methyl group, an ethyl group, a normal or an isopropyl group, a normal or an isobutyl group, a normal or an iso-pentyl group, a n-hexyl group, a n-octyl group, and a positive group. The linear or branched carbon number such as a mercapto group is 1 to 20, preferably a carbon number of 1 to 10, more preferably an alkyl group having 1 to 5 carbon atoms.
又,作為環烷基,並無限定,可列舉:環丙基、環丁基、環戊基、環己基、環庚基、環辛基等碳數3~10、較佳為碳數5~7之環烷基。 Further, the cycloalkyl group is not limited, and examples thereof include a carbon number of 3 to 10, preferably a carbon number of 5 to 10, such as a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a cyclohexyl group, a cycloheptyl group or a cyclooctyl group. 7 cycloalkyl.
又,作為有關R2之較佳之芳香族烴基,可列舉:苯基、經烷基取代之苯基(例:甲苯基、二甲苯基)、1-或2-萘基、蒽基等碳數6 ~20、較佳為6~14之芳基,該等烴基可包含羥基與胺基之任一者或兩者。該等烴基之一個以上之氫原子亦可被取代為鹵素原子,例如可被取代為氟原子、氯原子、或溴原子。 Further, examples of the preferred aromatic hydrocarbon group for R 2 include a phenyl group, an alkyl group-substituted phenyl group (for example, a tolyl group, a xylyl group), a 1- or 2-naphthyl group, and a fluorenyl group. 6 to 20, preferably 6 to 14, aryl groups, which may comprise either or both of a hydroxyl group and an amine group. One or more hydrogen atoms of the hydrocarbon groups may be substituted with a halogen atom, and for example, may be substituted with a fluorine atom, a chlorine atom, or a bromine atom.
作為較佳之鋁酸鹽化合物之例,可列舉:三甲氧基鋁、甲基二甲氧基鋁、乙基二甲氧基鋁、正或異丙基二甲氧基鋁、正、異或第三丁基二甲氧基鋁、正、異或新戊基二甲氧基鋁、己基二甲氧基鋁、辛基二甲氧基鋁、癸基二甲氧基鋁、苯基二甲氧基鋁;烷基取代苯基二甲氧基鋁(例如對(甲基)苯基二甲氧基鋁)、二甲基甲氧基鋁、三乙氧基鋁、甲基二乙氧基鋁、乙基二乙氧基鋁、正或異丙基二乙氧基鋁、正、異或第三丁基二乙氧基鋁、戊基二乙氧基鋁、己基二乙氧基鋁、辛基二乙氧基鋁、癸基二乙氧基鋁、苯基二乙氧基鋁、烷基取代苯基二乙氧基鋁(例如對(甲基)苯基二乙氧基鋁)、二甲基乙氧基鋁、三異丙氧基鋁、甲基二異丙氧基鋁、乙基二異丙氧基鋁、正或異丙基二乙氧基鋁、正、異或第三丁基二異丙氧基鋁、戊基二異丙氧基鋁、己基二異丙氧基鋁、辛基二異丙氧基鋁、癸基二異丙氧基鋁、苯基二異丙氧基鋁、烷基取代苯基二異丙氧基鋁(例如對(甲基)苯基二異丙氧基鋁)、二甲基異丙氧基鋁、(3,3,3-三氟丙基)二甲氧基鋁、及十三氟辛基二乙氧基鋁、甲基二氯鋁、二甲基氯鋁、二甲基氯鋁、苯基二氯鋁、二甲基氟鋁、二甲基溴鋁、二苯基溴鋁、該等之水解生成物、及該等之水解生成物之縮合物等。該等中,就獲取之容易性之觀點而言,較佳為三甲氧基鋁、三乙氧基鋁、三異丙氧基鋁。 Examples of preferred aluminate compounds include trimethoxy aluminum, methyl dimethoxy aluminum, ethyl dimethoxy aluminum, n- or isopropyl dimethoxy aluminum, ortho, x or Tributyldimethoxyaluminum, n-, iso- or neopentyldimethoxyaluminum, hexyldimethoxyaluminum, octyldimethoxyaluminum, decyldimethoxyaluminum, phenyldimethoxy Aluminium-substituted phenyldimethoxyaluminum (for example, p-(methyl)phenyldimethoxyaluminum), dimethylmethoxyaluminum, triethoxyaluminum, methyldiethoxyaluminum , ethyldiethoxyaluminum, n- or isopropyldiethoxyaluminum, n-, iso- or tert-butyldiethoxyaluminum, pentyldiethoxyaluminum, hexyldiethoxyaluminum, octyl Alkyl ethoxylated aluminum, decyldiethoxyaluminum, phenyldiethoxyaluminum, alkyl substituted phenyldiethoxyaluminum (for example, p-(methyl)phenyldiethoxyaluminum), Methyl ethoxylated aluminum, aluminum triisopropoxide, aluminum aluminum diisopropoxide, aluminum aluminum diisopropoxide, normal or isopropyl diethoxy aluminum, positive, different or third Aluminum diisopropoxide, aluminum pentyl diisopropoxide, aluminum hexyl diisopropoxide, Aluminium diisopropoxide, aluminum decyl diisopropoxide, aluminum phenyl diisopropoxide, aluminum substituted with alkyl phenyl diisopropoxide (for example, p-(methyl)phenyl diisopropyloxide Base aluminum), dimethyl isopropoxide aluminum, (3,3,3-trifluoropropyl)dimethoxy aluminum, and tridecafluorooctyldiethoxyaluminum, methyldichloroaluminum, two Methylchloroaluminum, dimethylchloroaluminum, phenyldichloroaluminum, dimethylfluoroaluminum, dimethylbromoaluminum, diphenylbromoaluminum, hydrolyzed products thereof, and hydrolyzed products thereof Condensate, etc. Among these, from the viewpoint of easiness of acquisition, trimethoxy aluminum, triethoxy aluminum, and aluminum triisopropoxide are preferred.
作為較佳之鈦酸鹽化合物之例,可列舉:四甲氧基鈦、甲基三甲氧基鈦、乙基三甲氧基鈦、正或異丙基三甲氧基鈦、正、異或第三丁 基三甲氧基鈦、正、異或新戊基三甲氧基鈦、己基三甲氧基鈦、辛基三甲氧基鈦、癸基三甲氧基鈦、苯基三甲氧基鈦;烷基取代苯基三甲氧基鈦(例如對(甲基)苯基三甲氧基鈦)、二甲基二甲氧基鈦、四乙氧基鈦、甲基三乙氧基鈦、乙基三乙氧基鈦、正或異丙基三乙氧基鈦、正、異或第三丁基三乙氧基鈦、戊基三乙氧基鈦、己基三乙氧基鈦、辛基三乙氧基鈦、癸基三乙氧基鈦、苯基三乙氧基鈦、烷基取代苯基三乙氧基鈦(例如對(甲基)苯基三乙氧基鈦)、二甲基二乙氧基鈦、四異丙氧基鈦、甲基三異丙氧基鈦、乙基三異丙氧基鈦、正或異丙基三乙氧基鈦、正、異或第三丁基三異丙氧基鈦、戊基三異丙氧基鈦、己基三異丙氧基鈦、辛基三異丙氧基鈦、癸基三異丙氧基鈦、苯基三異丙氧基鈦、烷基取代苯基三異丙氧基鈦(例如對(甲基)苯基三異丙氧基鈦)、二甲基二異丙氧基鈦、(3,3,3-三氟丙基)三甲氧基鈦、及十三氟辛基三乙氧基鈦、甲基三氯鈦、二甲基二氯鈦、三甲基氯鈦、苯基三氯鈦、二甲基二氟鈦、二甲基二溴鈦、二苯基二溴鈦、該等之水解生成物、及該等之水解生成物之縮合物等。該等中,就獲取之容易性之觀點而言,較佳為四甲氧基鈦、四乙氧基鈦、四異丙氧基鈦。 Examples of preferred titanate compounds include tetramethoxytitanium, methyltrimethoxytitanium, ethyltrimethoxytitanium, n- or isopropyltrimethoxytitanium, n-, iso- or tert-butyl Titanium trimethoxy, n-, iso- or neopentyltrimethoxytitanium, hexyltrimethoxytitanium, octyltrimethoxytitanium, decyltrimethoxytitanium, phenyltrimethoxytitanium; alkyl substituted phenyl Trimethoxytitanium (for example, p-(meth)phenyltrimethoxytitanium), dimethyldimethoxytitanium, tetraethoxytitanium, methyltriethoxytitanium, ethyltriethoxytitanium, Ortho- or isopropyl triethoxytitanium, n-, iso- or tert-butyltriethoxytitanium, pentyltriethoxytitanium, hexyltriethoxytitanium, octyltriethoxytitanium, fluorenyl Triethoxytitanium, phenyltriethoxytitanium, alkyl substituted phenyltriethoxytitanium (for example, p-(meth)phenyltriethoxytitanium), dimethyldiethoxytitanium, tetra Titanium isopropoxide, titanium methyl triisopropoxide, titanium triisopropoxide, titanium or n-butyl triethoxyoxide, n-, iso- or tert-butyl triisopropoxide titanium, Titanyl triisopropoxide, titanium hexyl triisopropoxide, titanium octyl triisopropoxide, titanium decyl triisopropoxide, titanium phenyl triisopropoxide, alkyl substituted phenyl tri Titanium isopropoxide (for example, p-(meth)phenyl triisopropoxytitanium), dimethyl Titanium diisopropoxide, titanium (3,3,3-trifluoropropyl)trimethoxy, and tridecafluorooctyltriethoxytitanium, methyltrichlorotitanium, dimethyldichlorotitanium, three Methyl chlorotitanium, phenyltrichlorotitanium, dimethyldifluorotitanium, dimethyldibromotitanium, diphenyldibromotitanium, hydrolyzed products thereof, and condensates of the hydrolyzed products thereof . Among these, from the viewpoint of easiness of acquisition, tetramethoxytitanium, tetraethoxytitanium, and tetraisopropoxytitanium are preferable.
作為較佳之鋯酸鹽化合物之例,可列舉:四甲氧基鋯、甲基三甲氧基鋯、乙基三甲氧基鋯、正或異丙基三甲氧基鋯、正、異或第三丁基三甲氧基鋯、正、異或新戊基三甲氧基鋯、己基三甲氧基鋯、辛基三甲氧基鋯、癸基三甲氧基鋯、苯基三甲氧基鋯;烷基取代苯基三甲氧基鋯(例如對(甲基)苯基三甲氧基鋯)、二甲基二甲氧基鋯、四乙氧基鋯、甲基三乙氧基鋯、乙基三乙氧基鋯、正或異丙基三乙氧基鋯、正、異或第三丁基三乙氧基鋯、戊基三乙氧基鋯、己基三乙氧基鋯、辛基三乙氧基鋯、癸基 三乙氧基鋯、苯基三乙氧基鋯、烷基取代苯基三乙氧基鋯(例如對(甲基)苯基三乙氧基鋯)、二甲基二乙氧基鋯、四異丙氧基鋯、甲基三異丙氧基鋯、乙基三異丙氧基鋯、正或異丙基三乙氧基鋯、正、異或第三丁基三異丙氧基鋯、戊基三異丙氧基鋯、己基三異丙氧基鋯、辛基三異丙氧基鋯、癸基三異丙氧基鋯、苯基三異丙氧基鋯、烷基取代苯基三異丙氧基鋯(例如對(甲基)苯基三異丙氧基鈦)、二甲基二異丙氧基鋯、(3,3,3-三氟丙基)三甲氧基鋯、及十三氟辛基三乙氧基鋯、甲基三氯鋯、二甲基二氯鋯、三甲基氯鋯、苯基三氯鋯、二甲基二氟鋯、二甲基二溴鋯、二苯基二溴鋯、該等之水解生成物、及該等之水解生成物之縮合物等。該等中,就獲取之容易性之觀點而言,較佳為四甲氧基鋯、四乙氧基鋯、四異丙氧基鋯。 As a preferable example of the zirconate compound, tetramethoxy zirconium, methyltrimethoxyzirconium, ethyltrimethoxyzirconium, n- or isopropyltrimethoxyzirconium, ortho, iso- or tert-butyl can be mentioned. Trimethyl zirconium, n-, iso- or neopentyltrimethoxy zirconium, hexyltrimethoxy zirconium, octyltrimethoxyzirconium, decyltrimethoxyzirconium, phenyltrimethoxyzirconium; alkyl substituted phenyl Trimethoxy zirconium (for example, p-(methyl)phenyltrimethoxyzirconium), dimethyldimethoxyzirconium, tetraethoxyzirconium, methyltriethoxyzirconium, ethyltriethoxyzirconium, N- or isopropyltriethoxy zirconium, n-, iso- or tert-butyltriethoxy zirconium, pentyltriethoxyzirconium, hexyltriethoxyzirconium, octyltriethoxyzirconium, fluorenyl Triethoxy zirconium, phenyltriethoxy zirconium, alkyl substituted phenyl triethoxy zirconium (for example, p-(methyl)phenyltriethoxy zirconium), dimethyldiethoxyzirconium, tetra Zirconium isopropoxide, zirconium methyl triisopropoxide, zirconium ethyl triisopropoxide, zirconium n- or isopropyl triethoxy, n-, iso- or tert-butyl triisopropoxy zirconium, Ziryl triisopropoxy zirconium, hexyl triisopropoxy zirconium, octyl triisopropoxy zirconium, decyl triisopropoxy zirconium, phenyl triisopropoxy zirconium, alkyl substituted phenyl tri Zirconium isopropoxide (for example, p-(meth)phenyltriisopropoxytitanium), zirconium dimethyldisisopropoxide, (3,3,3-trifluoropropyl)trimethoxyzirconium, and Trifluorooctyltriethoxyzirconium, methyltrichlorozirconium, dimethyldichlorozirconium, trimethylchlorozirconium, phenyltrichlorozirconium, dimethyldifluorozirconium, dimethyldibromozirconium, Zirconium diphenyl dibromide, a hydrolyzed product thereof, and a condensate of the hydrolyzed product. Among these, from the viewpoint of easiness of acquisition, tetramethoxy zirconium, tetraethoxy zirconium, and tetraisopropoxy zirconium are preferable.
於脫模層之形成步驟中,金屬烷氧化物可以水溶液之形態進行使用。為了提高對水之溶解性,亦可添加甲醇或乙醇等醇。醇之添加於使用疏水性較高之金屬烷氧化物時尤其有效。 In the step of forming the release layer, the metal alkoxide may be used in the form of an aqueous solution. In order to improve the solubility in water, an alcohol such as methanol or ethanol may be added. The addition of an alcohol is particularly effective when a metal alkoxide having a higher hydrophobicity is used.
金屬烷氧化物於水溶液中之濃度較高時,存在樹脂基材與金屬箔之剝離強度降低之傾向,可藉由調整金屬烷氧化物濃度而調整剝離強度。 When the concentration of the metal alkoxide in the aqueous solution is high, the peel strength of the resin substrate and the metal foil tends to decrease, and the peel strength can be adjusted by adjusting the metal alkoxide concentration.
又,藉由提高金屬烷氧化物於水溶液中之濃度,可較習知進一步提高撥水性。金屬烷氧化物於水溶液中之濃度可設為8~15體積%。若該濃度未達8體積%,則會產生撥水性不足(具體而言,存在水接觸角未達90度之情形),於超過15體積%之情形時,會產生金屬烷氧化物之溶解不良,於使該金屬箔與樹脂基板積層時,有因未反應化合物而產生鼓起之虞。 Further, by increasing the concentration of the metal alkoxide in the aqueous solution, it is known to further improve the water repellency. The concentration of the metal alkoxide in the aqueous solution can be set to 8 to 15% by volume. If the concentration is less than 8% by volume, there is insufficient water repellency (specifically, there is a case where the water contact angle is less than 90 degrees), and when it exceeds 15% by volume, the metal alkoxide is poorly dissolved. When the metal foil and the resin substrate are laminated, there is a tendency to bulge due to the unreacted compound.
又,較佳為於在金屬箔之處理表面塗佈金屬烷氧化物後,實施2次乾 燥步驟。第1次乾燥係僅出於使金屬烷氧化物之水溶液乾燥之目的而進行。第2次乾燥係藉由針對未完全進行縮合反應之金屬烷氧化物內之羥基,使縮合反應全部結束而消除殘留之OH基(羥基),而具有使撥水性提高之效果。第1次乾燥可以80~120℃×10秒~2分鐘之條件進行,第2次乾燥可以120~200℃×30秒~5分鐘之條件進行。 Further, it is preferred to carry out the drying twice after applying the metal alkoxide on the treated surface of the metal foil. Drying step. The first drying is carried out only for the purpose of drying the aqueous solution of the metal alkoxide. In the second drying, the OH group (hydroxy group) is eliminated by completely eliminating the condensation reaction for the hydroxyl group in the metal alkoxide which is not completely subjected to the condensation reaction, and the water repellency is improved. The first drying can be carried out at 80 to 120 ° C for 10 seconds to 2 minutes, and the second drying can be carried out at 120 to 200 ° C for 30 seconds to 5 minutes.
又,於使用金屬烷氧化物之水-醇混合溶液之情形時,為了使難溶於水之金屬烷氧化物均勻地溶解,該溶液中之醇濃度較佳為20~80體積%。若該溶液中之醇濃度未達20體積%,則存在金屬烷氧化物不溶解之情形,於超過80體積%之情形時,水解反應變得不完全,故而有金屬烷氧化物未被水解而直接殘留,撥水性降低,水之接觸角變小之虞。 Further, in the case of using a water-alcohol mixed solution of a metal alkoxide, in order to uniformly dissolve the metal alkoxide which is hardly soluble in water, the concentration of the alcohol in the solution is preferably from 20 to 80% by volume. If the concentration of the alcohol in the solution is less than 20% by volume, the metal alkoxide does not dissolve. In the case of more than 80% by volume, the hydrolysis reaction becomes incomplete, so that the metal alkoxide is not hydrolyzed. Direct residue, water repellency is reduced, and the contact angle of water becomes smaller.
金屬烷氧化物之水溶液之pH並無特別限制,於酸性側或鹼性側均可利用。例如可以3.0~10.0之範圍之pH進行使用。就無需進行特別之pH調整之觀點而言,較佳為設為中性附近之5.0~9.0之範圍之pH,更佳為設為7.0~9.0之範圍之pH。 The pH of the aqueous solution of the metal alkoxide is not particularly limited and can be utilized on the acidic side or the alkaline side. For example, it can be used at a pH in the range of 3.0 to 10.0. From the viewpoint of not requiring special pH adjustment, it is preferably a pH in the range of 5.0 to 9.0 in the vicinity of neutrality, and more preferably a pH in the range of 7.0 to 9.0.
(4)其他 (4) Others
可將矽系脫模劑、具有脫模性之樹脂被膜等公知之具有脫模性之物質用於脫模層。 A known release material such as a oxime release agent or a resin film having releasability can be used for the release layer.
關於本發明之表面處理金屬箔,亦可於金屬箔與脫模層之間設置有選自由粗化處理層、耐熱層、防銹層、鉻酸鹽處理層及矽烷偶合處理層所組成之群中之1種以上之層。此處,所謂鉻酸鹽處理層,係指經包含鉻酸酐、鉻酸、重鉻酸、鉻酸鹽或重鉻酸鹽之液體處理後之層。鉻酸鹽處理層亦可包含鈷、鐵、鎳、鉬、鋅、鉭、銅、鋁、磷、鎢、錫、砷及鈦 等元素(可為金屬、合金、氧化物、氮化物、硫化物等任意形態)。作為鉻酸鹽處理層之具體例,可列舉經鉻酸酐或重鉻酸鉀水溶液處理之鉻酸鹽處理層、或經含有鉻酸酐或重鉻酸鉀及鋅之處理液處理之鉻酸鹽處理層等。 In the surface-treated metal foil of the present invention, a group selected from the group consisting of a roughened layer, a heat-resistant layer, a rust-proof layer, a chromate-treated layer, and a decane coupling treatment layer may be disposed between the metal foil and the release layer. One or more layers in the middle. Here, the chromate-treated layer refers to a layer treated with a liquid containing chromic anhydride, chromic acid, dichromic acid, chromate or dichromate. The chromate treatment layer may also contain cobalt, iron, nickel, molybdenum, zinc, bismuth, copper, aluminum, phosphorus, tungsten, tin, arsenic and titanium. And other elements (may be any form of metal, alloy, oxide, nitride, sulfide, etc.). Specific examples of the chromate-treated layer include a chromate treatment layer treated with an aqueous solution of chromic acid anhydride or potassium dichromate, or a chromate treatment treated with a treatment liquid containing chromic anhydride or potassium dichromate and zinc. Layers, etc.
粗化處理層例如可藉由以下之處理而形成。 The roughening treatment layer can be formed, for example, by the following treatment.
[球狀粗化] [spherical roughening]
使用由Cu、H2SO4、As所構成之以下所記載之銅粗化鍍浴形成球狀粗化粒子。 The spherical roughening particles are formed using a copper roughening plating bath described below composed of Cu, H 2 SO 4 , and As.
.液組成1 . Liquid composition 1
CuSO4.5H2O 78~196g/L CuSO 4 . 5H 2 O 78~196g/L
Cu 20~50g/L Cu 20~50g/L
H2SO4 50~200g/L H 2 SO 4 50~200g/L
砷0.7~3.0g/L Arsenic 0.7~3.0g/L
(電解鍍覆溫度1)30~76℃ (electrolytic plating temperature 1) 30~76°C
(電流條件1)電流密度35~105A/dm2(浴之極限電流密度以上) (current condition 1) current density 35~105A/dm 2 (above the limit current density of the bath)
(鍍覆時間1)1~240秒 (plating time 1) 1~240 seconds
繼而,為了防止粗化粒子之脫落及提高剝離強度,利用由硫酸、硫酸銅所構成之銅電解浴進行被覆鍍覆。將被覆鍍覆條件記載於下文。 Then, in order to prevent the peeling of the roughened particles and to improve the peeling strength, the coating was performed by a copper electrolytic bath composed of sulfuric acid or copper sulfate. The coating plating conditions are described below.
.液組成2 . Liquid composition 2
CuSO4.5H2O 88~352g/L CuSO 4 . 5H 2 O 88~352g/L
Cu 22~90g/L Cu 22~90g/L
H2SO4 50~200g/L H 2 SO 4 50~200g/L
(電解鍍覆溫度2)25~80℃ (electrolytic plating temperature 2) 25~80°C
(電流條件2)電流密度:15~32A/dm2(未達浴之極限電流密度) (Current condition 2) Current density: 15~32A/dm 2 (Unlimited bath current limit)
(鍍覆時間1)1~240秒 (plating time 1) 1~240 seconds
又,作為耐熱層、防銹層,可使用公知之耐熱層、防銹層。例如,耐熱層及/或防銹層可為包含選自鎳、鋅、錫、鈷、鉬、銅、鎢、磷、砷、鉻、釩、鈦、鋁、金、銀、鉑族元素、鐵、鉭之群中之1種以上之元素之層,亦可為由選自鎳、鋅、錫、鈷、鉬、銅、鎢、磷、砷、鉻、釩、鈦、鋁、金、銀、鉑族元素、鐵、鉭之群中之1種以上之元素所構成之金屬層或合金層。又,耐熱層及/或防銹層亦可包含含有選自鎳、鋅、錫、鈷、鉬、銅、鎢、磷、砷、鉻、釩、鈦、鋁、金、銀、鉑族元素、鐵、鉭之群中之1種以上之元素之氧化物、氮化物、矽化物。又,耐熱層及/或防銹層亦可為包含鎳-鋅合金之層。又,耐熱層及/或防銹層亦可為鎳-鋅合金層。上述鎳-鋅合金層亦可為除了無法避免之雜質以外,含有50wt%~99wt%之鎳、50wt%~1wt%之鋅者。上述鎳-鋅合金層之鋅及鎳之合計附著量可為5~1000mg/m2,較佳為10~500mg/m2,較佳為20~100mg/m2。又,上述包含鎳-鋅合金之層或上述鎳-鋅合金層之鎳之附著量與鋅之附著量之比(=鎳之附著量/鋅之附著量)較佳為1.5~10。又,上述包含鎳-鋅合金之層或上述鎳-鋅合金層之鎳之附著量較佳為0.5mg/m2~500mg/m2,更佳為1mg/m2~50mg/m2。 Further, as the heat-resistant layer and the rust-preventive layer, a known heat-resistant layer or rust-preventing layer can be used. For example, the heat resistant layer and/or the rustproof layer may be selected from the group consisting of nickel, zinc, tin, cobalt, molybdenum, copper, tungsten, phosphorus, arsenic, chromium, vanadium, titanium, aluminum, gold, silver, platinum group elements, iron. a layer of one or more elements of the group of bismuth, or may be selected from the group consisting of nickel, zinc, tin, cobalt, molybdenum, copper, tungsten, phosphorus, arsenic, chromium, vanadium, titanium, aluminum, gold, silver, A metal layer or an alloy layer composed of one or more elements selected from the group consisting of platinum group elements, iron, and lanthanum. Moreover, the heat-resistant layer and/or the rust-preventing layer may further comprise a component selected from the group consisting of nickel, zinc, tin, cobalt, molybdenum, copper, tungsten, phosphorus, arsenic, chromium, vanadium, titanium, aluminum, gold, silver, and platinum. Oxides, nitrides, and tellurides of one or more elements of the group of iron and antimony. Further, the heat-resistant layer and/or the rust-preventive layer may be a layer containing a nickel-zinc alloy. Further, the heat-resistant layer and/or the rust-preventive layer may be a nickel-zinc alloy layer. The above nickel-zinc alloy layer may also contain 50% by weight to 99% by weight of nickel and 50% by weight to 1% by weight of zinc in addition to unavoidable impurities. The total amount of zinc and nickel attached to the nickel-zinc alloy layer may be 5 to 1000 mg/m 2 , preferably 10 to 500 mg/m 2 , preferably 20 to 100 mg/m 2 . Further, the ratio of the adhesion amount of nickel to the nickel-zinc alloy layer or the nickel-zinc alloy layer to the adhesion amount of zinc (=the adhesion amount of nickel/the adhesion amount of zinc) is preferably 1.5 to 10. Further, the adhesion amount of the nickel-containing zinc alloy layer or the nickel-zinc alloy layer is preferably 0.5 mg/m 2 to 500 mg/m 2 , more preferably 1 mg/m 2 to 50 mg/m 2 .
例如,耐熱層及/或防銹層亦可為依次積層附著量為1mg/m2~100mg/m2、較佳為5mg/m2~50mg/m2之鎳或鎳合金層、與附著量為1mg/m2~80mg/m2、較佳為5mg/m2~40mg/m2之錫層而成者,上述鎳合金層亦可由鎳-鉬、鎳-鋅、鎳-鉬-鈷中之任一種構成。又, 耐熱層及/或防銹層中,鎳或鎳合金與錫之合計附著量較佳為2mg/m2~150mg/m2,更佳為10mg/m2~70mg/m2。又,耐熱層及/或防銹層中,[鎳或鎳合金中之鎳附著量]/[錫附著量]較佳為0.25~10,更佳為0.33~3。 For example, the heat-resistant layer and/or the rust-preventing layer may be a nickel or nickel alloy layer in which the deposition amount is 1 mg/m 2 to 100 mg/m 2 , preferably 5 mg/m 2 to 50 mg/m 2 , and the adhesion amount. The nickel alloy layer may also be composed of nickel-molybdenum, nickel-zinc, nickel-molybdenum-cobalt, which is a tin layer of 1 mg/m 2 to 80 mg/m 2 , preferably 5 mg/m 2 to 40 mg/m 2 . Any of the components. Further, in the heat-resistant layer and/or the rust-preventive layer, the total adhesion amount of nickel or a nickel alloy to tin is preferably 2 mg/m 2 to 150 mg/m 2 , more preferably 10 mg/m 2 to 70 mg/m 2 . Further, in the heat-resistant layer and/or the rust-preventive layer, [the amount of nickel deposited in the nickel or nickel alloy] / [the amount of tin adhesion] is preferably 0.25 to 10, more preferably 0.33 to 3.
再者,於矽烷偶合處理中所使用之矽烷偶合劑可使用公知之矽烷偶合劑,例如可使用胺基系矽烷偶合劑或環氧系矽烷偶合劑、巰基系矽烷偶合劑。又,對於矽烷偶合劑,亦可使用乙烯基三甲氧基矽烷、乙烯基苯基三甲氧基矽烷、γ-甲基丙烯醯氧基丙基三甲氧基矽烷、γ-縮水甘油氧基丙基三甲氧基矽烷、4-縮水甘油基丁基三甲氧基矽烷、γ-胺基丙基三乙氧基矽烷、N-β(胺基乙基)γ-胺基丙基三甲氧基矽烷、N-3-(4-(3-胺基丙氧基)丁氧基)丙基-3-胺基丙基三甲氧基矽烷、咪唑矽烷、三矽烷、γ-巰基丙基三甲氧基矽烷等。 Further, a known decane coupling agent can be used as the decane coupling agent used in the decane coupling treatment, and for example, an amine decane coupling agent, an epoxy decane coupling agent, or a decyl decane coupling agent can be used. Further, as the decane coupling agent, vinyl trimethoxy decane, vinyl phenyl trimethoxy decane, γ-methyl propylene methoxy propyl trimethoxy decane, γ-glycidoxy propyl trimethyl group can also be used. Oxydecane, 4-glycidylbutyltrimethoxydecane, γ-aminopropyltriethoxydecane, N-β(aminoethyl)γ-aminopropyltrimethoxydecane, N- 3-(4-(3-Aminopropyloxy)butoxy)propyl-3-aminopropyltrimethoxydecane, imidazolium, three Decane, γ-mercaptopropyltrimethoxydecane, and the like.
上述矽烷偶合處理層亦可使用環氧系矽烷、胺基系矽烷、甲基丙烯醯氧基系矽烷、巰基系矽烷等矽烷偶合劑等而形成。再者,此種矽烷偶合劑亦可混合2種以上而使用。其中,較佳為使用胺基系矽烷偶合劑或環氧系矽烷偶合劑而形成者。 The decane coupling treatment layer may be formed using a decane coupling agent such as epoxy decane, amino decane, methacryloxy decane or decyl decane. Further, such a decane coupling agent may be used in combination of two or more kinds. Among them, it is preferred to use an amine decane coupling agent or an epoxy decane coupling agent.
所謂此處所言之胺基系矽烷偶合劑,亦可為選自由N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、3-(N-苯乙烯基甲基-2-胺基乙基胺基)丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、雙(2-羥基乙基)-3-胺基丙基三乙氧基矽烷、胺基丙基三甲氧基矽烷、N-甲基胺基丙基三甲氧基矽烷、N-苯基胺基丙基三甲氧基矽烷、N-(3-丙烯醯氧基-2-羥基丙基)-3-胺基丙基三乙氧基矽烷、4-胺基丁基三乙氧基矽烷、(胺基乙基胺基甲基)苯乙基三甲氧基矽烷、N-(2-胺基乙基- 3-胺基丙基)三甲氧基矽烷、N-(2-胺基乙基-3-胺基丙基)三(2-乙基己氧基)矽烷、6-(胺基己基胺基丙基)三甲氧基矽烷、胺基苯基三甲氧基矽烷、3-(1-胺基丙氧基)-3,3-二甲基-1-丙烯基三甲氧基矽烷、3-胺基丙基三(甲氧基乙氧基乙氧基)矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基三甲氧基矽烷、ω-胺基十一烷基三甲氧基矽烷、3-(2-N-苄基胺基乙基胺基丙基)三甲氧基矽烷、雙(2-羥基乙基)-3-胺基丙基三乙氧基矽烷、(N,N-二乙基-3-胺基丙基)三甲氧基矽烷、(N,N-二甲基-3-胺基丙基)三甲氧基矽烷、N-甲基胺基丙基三甲氧基矽烷、N-苯基胺基丙基三甲氧基矽烷、3-(N-苯乙烯基甲基-2-胺基乙基胺基)丙基三甲氧基矽烷、γ-胺基丙基三乙氧基矽烷、N-β(胺基乙基)γ-胺基丙基三甲氧基矽烷、N-3-(4-(3-胺基丙氧基)丁氧基)丙基-3-胺基丙基三甲氧基矽烷所組成之群中之矽烷偶合劑。 The amine decane coupling agent referred to herein may also be selected from the group consisting of N-(2-aminoethyl)-3-aminopropyltrimethoxydecane, 3-(N-styrylmethyl- 2-Aminoethylamino)propyltrimethoxydecane, 3-aminopropyltriethoxydecane, bis(2-hydroxyethyl)-3-aminopropyltriethoxydecane, amine Propyltrimethoxydecane, N-methylaminopropyltrimethoxydecane, N-phenylaminopropyltrimethoxydecane, N-(3-propenyloxy-2-hydroxypropyl) 3-aminopropyltriethoxydecane, 4-aminobutyltriethoxydecane, (aminoethylaminomethyl)phenethyltrimethoxydecane, N-(2-amino Ethyl- 3-aminopropyl)trimethoxynonane, N-(2-aminoethyl-3-aminopropyl)tris(2-ethylhexyloxy)decane, 6-(aminohexylaminopropyl) Trimethoxy decane, aminophenyl trimethoxy decane, 3-(1-aminopropoxy)-3,3-dimethyl-1-propenyltrimethoxydecane, 3-aminopropyl Tris(methoxyethoxyethoxy)decane, 3-aminopropyltriethoxydecane, 3-aminopropyltrimethoxydecane, ω-aminoundecyltrimethoxydecane , 3-(2-N-benzylaminoethylaminopropyl)trimethoxydecane, bis(2-hydroxyethyl)-3-aminopropyltriethoxydecane, (N,N- Diethyl-3-aminopropyl)trimethoxydecane, (N,N-dimethyl-3-aminopropyl)trimethoxynonane, N-methylaminopropyltrimethoxydecane, N-phenylaminopropyltrimethoxydecane, 3-(N-styrylmethyl-2-aminoethylamino)propyltrimethoxydecane, γ-aminopropyltriethoxy Decane, N-β(aminoethyl)γ-aminopropyltrimethoxydecane, N-3-(4-(3-aminopropoxy)butoxy)propyl-3-aminopropyl A decane coupling agent in a group consisting of trimethoxy decane.
矽烷偶合處理層較理想為以矽原子換算計以0.05mg/m2~200mg/m2、較佳為0.15mg/m2~20mg/m2、較佳為0.3mg/m2~2.0mg/m2之範圍設置。於上述範圍之情形時,可進一步提高樹脂基材與金屬箔之密接性。 The decane coupling treatment layer is preferably 0.05 mg/m 2 to 200 mg/m 2 , preferably 0.15 mg/m 2 to 20 mg/m 2 , preferably 0.3 mg/m 2 to 2.0 mg/in terms of ruthenium atom. The range of m 2 is set. In the case of the above range, the adhesion between the resin substrate and the metal foil can be further improved.
又,可對金屬箔、粗化粒子層、耐熱層、防銹層、矽烷偶合處理層、鉻酸鹽處理層或脫模層之表面,進行國際公開編號WO2008/053878、日本特開2008-111169號、日本專利第5024930號、國際公開編號WO2006/028207、日本專利第4828427號、國際公開編號WO2006/134868、日本專利第5046927號、國際公開編號WO2007/105635、日本專利第5180815號、日本特開2013-19056號中所記載之表面處理。 Further, the surface of the metal foil, the roughened particle layer, the heat-resistant layer, the rustproof layer, the decane coupling treatment layer, the chromate treatment layer or the release layer can be subjected to International Publication No. WO2008/053878, and JP-A-2008-111169 No. Japanese Patent No. 5024930, International Publication No. WO2006/028207, Japanese Patent No. 4828427, International Publication No. WO2006/134868, Japanese Patent No. 5046927, International Publication No. WO2007/105635, Japanese Patent No. 5180815, Japanese Special Opening Surface treatment as described in 2013-19056.
於本發明之表面處理金屬箔之表面亦可設置樹脂層。樹脂層通常設置於脫模層上。 A resin layer may also be provided on the surface of the surface-treated metal foil of the present invention. The resin layer is usually disposed on the release layer.
上述表面處理金屬箔之表面之樹脂層可為接著用樹脂、即接著劑,亦可為底塗劑,亦可為半硬化狀態(B階段狀態)之接著用絕緣樹脂層。所謂半硬化狀態(B階段狀態),包括如下狀態:即便用手指觸碰其表面,亦無黏著感,可將該絕緣樹脂層重疊來保管,進而,若受到加熱處理,則會產生硬化反應。上述表面處理金屬箔之表面之樹脂層較佳為於與脫模層接觸時表現出適度之剝離強度(例如2gf/cm~200gf/cm)之樹脂層。又,較佳為使用追隨金屬箔之表面之凹凸而難以產生有可能導致鼓起之空隙或氣泡之混入的樹脂。例如,於在金屬箔表面設置該樹脂層時,較佳為使用樹脂黏度為10000mPa.s(25℃)以下、更佳為樹脂黏度為5000mPa.s(25℃)以下等黏度較低之樹脂而設置樹脂層。藉由於表面處理金屬箔所積層之絕緣基板與表面處理金屬箔之間設置上述樹脂層,而即便於使用難以追隨金屬箔之表面之凹凸之絕緣基板之情形時,樹脂層亦追隨金屬箔表面,因此,可使表面處理金屬箔與絕緣基板之間難以產生空隙或氣泡,故而有效。 The resin layer on the surface of the surface-treated metal foil may be a resin, that is, an adhesive, or a primer, or an insulating resin layer may be used in a semi-hardened state (B-stage state). The semi-hardened state (B-stage state) includes a state in which there is no adhesive feeling even when the surface is touched with a finger, and the insulating resin layer can be stacked and stored, and further, if subjected to heat treatment, a curing reaction occurs. The resin layer on the surface of the surface-treated metal foil is preferably a resin layer which exhibits a moderate peel strength (for example, 2 gf/cm to 200 gf/cm) when it comes into contact with the release layer. Moreover, it is preferable to use the unevenness of the surface of the metal foil, and it is difficult to produce a resin which may cause a bulging void or a bubble. For example, when the resin layer is provided on the surface of the metal foil, it is preferred to use a resin viscosity of 10000 mPa. s (25 ° C) or less, more preferably the resin viscosity is 5000 mPa. A resin layer is provided with a resin having a low viscosity such as s (25 ° C) or less. By providing the resin layer between the insulating substrate laminated with the surface-treated metal foil and the surface-treated metal foil, the resin layer follows the surface of the metal foil even when an insulating substrate which is difficult to follow the unevenness of the surface of the metal foil is used. Therefore, it is possible to make it difficult to generate voids or bubbles between the surface-treated metal foil and the insulating substrate, which is effective.
又,上述表面處理金屬箔之表面之樹脂層可含有熱硬化性樹脂,亦可為熱塑性樹脂。又,上述表面處理金屬箔之表面之樹脂層亦可包含熱塑性樹脂。上述表面處理金屬箔之表面之樹脂層可包含公知之樹脂、樹脂硬化劑、化合物、硬化促進劑、介電體、反應觸媒、交聯劑、聚合物、預浸料、骨架材料等。又,上述表面處理金屬箔之表面之樹脂層亦可使用例如國際公開編號WO2008/004399、國際公開編號WO2008/053878、國 際公開編號WO2009/084533、日本特開平11-5828號、日本特開平11-140281號、日本專利第3184485號、國際公開編號WO97/02728、日本專利第3676375號、日本特開2000-43188號、日本專利第3612594號、日本特開2002-179772號、日本特開2002-359444號、日本特開2003-304068號、日本專利第3992225號、日本特開2003-249739號、日本專利第4136509號、日本特開2004-82687號、日本專利第4025177號、日本特開2004-349654號、日本專利第4286060號、日本特開2005-262506號、日本專利第4570070號、日本特開2005-53218號、日本專利第3949676號、日本專利第4178415號、國際公開編號WO2004/005588、日本特開2006-257153號、日本特開2007-326923號、日本特開2008-111169號、日本專利第5024930號、國際公開編號WO2006/028207、日本專利第4828427號、日本特開2009-67029號、國際公開編號WO2006/134868、日本專利第5046927號、日本特開2009-173017號、國際公開編號WO2007/105635、日本專利第5180815號、國際公開編號WO2008/114858、國際公開編號WO2009/008471、日本特開2011-14727號、國際公開編號WO2009/001850、國際公開編號WO2009/145179、國際公開編號WO2011/068157、日本特開2013-19056號中所記載之物質(樹脂、樹脂硬化劑、化合物、硬化促進劑、介電體、反應觸媒、交聯劑、聚合物、預浸料、骨架材料等)及/或樹脂層之形成方法、形成裝置而形成。 Further, the resin layer on the surface of the surface-treated metal foil may contain a thermosetting resin or a thermoplastic resin. Further, the resin layer on the surface of the surface-treated metal foil may further contain a thermoplastic resin. The resin layer on the surface of the surface-treated metal foil may include a known resin, a resin hardener, a compound, a hardening accelerator, a dielectric, a reaction catalyst, a crosslinking agent, a polymer, a prepreg, a skeleton material, and the like. Further, the resin layer on the surface of the surface-treated metal foil may be, for example, International Publication No. WO2008/004399, International Publication No. WO2008/053878, Japanese Patent Publication No. WO2009/084533, Japanese Patent Application Laid-Open No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei No. Hei. Japanese Patent No. 3,612,594, Japanese Patent Laid-Open No. 2002-179772, Japanese Laid-Open Patent Publication No. 2002-359444, Japanese Patent Laid-Open No. 2003-304068, Japanese Patent No. 3992225, Japanese Patent Laid-Open No. 2003-249739, Japanese Patent No. 4136509, Japanese Patent Publication No. 2004-82687, Japanese Patent No. 4025177, Japanese Patent Laid-Open No. 2004-349654, Japanese Patent No. 4286060, Japanese Patent Laid-Open No. 2005-262506, Japanese Patent No. 4570070, Japanese Patent Laid-Open No. 2005-53218, Japanese Patent No. 3,949,676, Japanese Patent No. 4,174,415, International Publication No. WO2004/005588, Japanese Patent Laid-Open No. Hei. No. 2006-257153, Japanese Patent Laid-Open No. 2007-326923, Japanese Patent Publication No. 2008-111169, Japanese Patent No. 5024930, International Publication No. WO2006/028207, Japanese Patent No. 4828427, Japanese Patent Laid-Open No. 2009-67029, International Publication No. WO2006/134868, Japanese Patent No. 5046927, Japanese Patent Laid-Open No. 2009-173017, International Publication No. No. WO2007/105635, Japanese Patent No. 5180815, International Publication No. WO2008/114858, International Publication No. WO2009/008471, Japanese Patent Laid-Open No. 2011-14727, International Publication No. WO2009/001850, International Publication No. WO2009/145179, International Publication No. The materials described in WO2011/068157 and JP-A-2013-19056 (resin, resin curing agent, compound, curing accelerator, dielectric, reaction catalyst, crosslinking agent, polymer, prepreg, skeleton material) The method of forming a resin layer and/or forming a device is formed.
(積層體、半導體封裝、電子機器) (layered body, semiconductor package, electronic equipment)
可於本發明之表面處理金屬箔之脫模層側設置樹脂基材而製作積層體。該積層體可利用紙基材酚樹脂、紙基材環氧樹脂、合成纖維布基材環 氧樹脂、玻璃布-紙複合基材環氧樹脂、玻璃布-玻璃不織布複合基材環氧樹脂及玻璃布基材環氧樹脂等形成樹脂基材。樹脂基材可為預浸料,亦可含有熱硬化性樹脂。又,藉由於該積層體之表面處理金屬箔形成電路,可製作印刷配線板。進而,可藉由於印刷配線板搭載電子零件類而製作印刷電路板。於本發明中,「印刷配線板」中亦包含以此種方式搭載有電子零件類之印刷配線板、印刷電路板及印刷基板。又,可使用該印刷配線板製作電子機器,亦可使用搭載有該電子零件類之印刷電路板製作電子機器,亦可使用搭載有該電子零件類之印刷基板製作電子機器。又,上述「印刷電路板」中,亦包含半導體封裝用電路形成基板。進而,可於半導體封裝用電路形成基板搭載電子零件類而製作半導體封裝。進而,亦可使用該半導體封裝製作電子機器。 A resin substrate can be provided on the release layer side of the surface-treated metal foil of the present invention to produce a laminate. The laminate can utilize a paper substrate phenol resin, a paper substrate epoxy resin, a synthetic fiber cloth substrate ring An epoxy resin, a glass cloth-paper composite substrate epoxy resin, a glass cloth-glass non-woven composite substrate epoxy resin, and a glass cloth substrate epoxy resin are used to form a resin substrate. The resin substrate may be a prepreg or a thermosetting resin. Further, a printed wiring board can be produced by forming a circuit by processing the metal foil on the surface of the laminated body. Further, a printed circuit board can be produced by mounting electronic components on a printed wiring board. In the present invention, the "printed wiring board" also includes a printed wiring board, a printed circuit board, and a printed circuit board on which electronic components are mounted in this manner. Moreover, an electronic device can be produced using the printed wiring board, and an electronic device can be produced using a printed circuit board on which the electronic component is mounted, or an electronic device can be manufactured using the printed circuit board on which the electronic component is mounted. Further, the above-mentioned "printed circuit board" also includes a circuit-formed substrate for semiconductor packaging. Further, an electronic component can be mounted on a circuit-formed substrate for semiconductor packaging to fabricate a semiconductor package. Further, an electronic device can be fabricated using the semiconductor package.
(印刷配線板之製造方法) (Manufacturing method of printed wiring board)
本發明之印刷配線板之製造方法於一態樣中具備:於本發明之表面處理金屬箔自上述脫模層側貼合樹脂基材之步驟;藉由不進行蝕刻而將上述表面處理金屬箔自上述樹脂基材剝離,而獲得於剝離面轉印有上述金屬箔之表面輪廓之樹脂基材之步驟;及於上述轉印有表面輪廓之樹脂基材之上述剝離面側形成電路之步驟。藉由此種構成,於金屬箔設置脫模層並將該金屬箔貼合於樹脂基材時之樹脂基材可物理性剝離,於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除。該製造方法中,亦可利用鍍覆圖案形成電路。於此情形時,可於形成鍍覆圖案後,利用該鍍覆圖案形成所需之電路而製作印刷配線板。又,亦可利用印刷圖案形成電路。於此情形時, 例如可於使用油墨中含有導電膏等之噴墨形成印刷圖案後,利用該印刷圖案形成所需之印刷電路而製作印刷配線板。 The method for producing a printed wiring board according to the present invention includes the step of bonding a resin substrate to the surface of the release layer of the surface-treated metal foil of the present invention; and treating the surface-treated metal foil by etching. a step of peeling off the resin substrate to obtain a resin substrate on which the surface profile of the metal foil is transferred, and a step of forming a circuit on the peeling surface side of the resin substrate on which the surface profile is transferred. According to this configuration, the resin substrate is physically peeled off when the metal foil is provided with the release layer and the metal foil is bonded to the resin substrate, and the step of removing the metal foil from the resin substrate is not possible. The metal foil is removed at a preferred cost in the case of damaging the contour of the surface of the metal foil transferred to the surface of the resin substrate. In this manufacturing method, a circuit can be formed using a plating pattern. In this case, after the plating pattern is formed, a desired wiring can be formed by using the plating pattern to form a printed wiring board. Further, the circuit can be formed using a printed pattern. In this case, For example, a printed wiring board can be formed by forming a desired printed circuit using the printed pattern by using an inkjet ink containing a conductive paste or the like to form a printed pattern.
進而,本發明之印刷配線板之製造方法於又一態樣中具備:於本發明之表面處理金屬箔自上述脫模層側貼合樹脂基材之步驟;藉由不進行蝕刻而將上述表面處理金屬箔自上述樹脂基材剝離,而獲得於剝離面轉印有上述金屬箔之表面輪廓之樹脂基材之步驟;及於上述轉印有表面輪廓之樹脂基材之上述剝離面側設置增層之步驟。藉由此種構成,於金屬箔設置脫模層並將該金屬箔貼合於樹脂基材時之樹脂基材可物理性剝離,於將金屬箔自樹脂基材去除之步驟中,可於不損傷轉印至樹脂基材之表面之金屬箔表面之輪廓之情況下以較佳之成本將金屬箔去除。又,藉由轉印至樹脂基材之特定之表面形狀,即便樹脂基材之樹脂成分與增層之樹脂成分不同,亦可將兩者以良好之密接性貼合。 Furthermore, the method for producing a printed wiring board according to the present invention includes the step of bonding a resin substrate to the surface of the release layer of the surface-treated metal foil of the present invention; and etching the surface without etching. a step of peeling the metal foil from the resin substrate to obtain a resin substrate on which the surface profile of the metal foil is transferred on the peeling surface; and adding the peeling surface side of the resin substrate to which the surface profile is transferred The steps of the layer. According to this configuration, the resin substrate is physically peeled off when the metal foil is provided with the release layer and the metal foil is bonded to the resin substrate, and the step of removing the metal foil from the resin substrate is not possible. The metal foil is removed at a preferred cost in the case of damaging the contour of the surface of the metal foil transferred to the surface of the resin substrate. Further, by transferring to a specific surface shape of the resin substrate, even if the resin component of the resin substrate differs from the resin component of the buildup layer, the two can be bonded together with good adhesion.
此處,關於構成設置於樹脂基材之表面之增層之樹脂,將該樹脂及樹脂基材於分別未進行任何處理之情況下相互貼合(將構成上述增層之樹脂及上述樹脂基材之未處理表面彼此貼合),進行拉伸而使其剝離,此時之強度(拉伸強度)亦可為500g/cm2以下。 Here, the resin constituting the build-up layer provided on the surface of the resin substrate is bonded to each other without any treatment (the resin constituting the build-up layer and the resin substrate described above) The untreated surfaces are bonded to each other, and are stretched and peeled off. The strength (tensile strength) at this time may be 500 g/cm 2 or less.
此處,所謂「增層」,係指具有導電層、配線圖案或電路、及樹脂之層。該樹脂之形狀亦可為層狀。又,上述導電層、配線圖案或電路、及樹脂可以任何方式設置。 Here, "additional layer" means a layer having a conductive layer, a wiring pattern, a circuit, and a resin. The shape of the resin may also be a layer. Further, the above conductive layer, wiring pattern or circuit, and resin may be provided in any manner.
增層可藉由於在剝離面轉印有上述金屬箔之表面輪廓之樹脂基材之剝離面側設置導電層、配線圖案或電路、及樹脂而製作。作為導電層、配線圖案或電路之形成方法,可使用半加成法、全加成法、減成法、部分加成 法等公知之方法。 The build-up layer can be produced by providing a conductive layer, a wiring pattern, a circuit, and a resin on the side of the release surface of the resin substrate on which the surface profile of the metal foil is transferred on the release surface. As a method of forming a conductive layer, a wiring pattern or a circuit, a semi-additive method, a full additive method, a subtractive method, a partial addition method can be used. A well-known method such as law.
增層亦可具有數層,亦可具有複數之導電層、配線圖案或電路、及樹脂(層)。 The buildup layer may also have several layers, and may have a plurality of conductive layers, wiring patterns or circuits, and a resin (layer).
複數之導電層、配線圖案或電路亦可藉由樹脂而電性絕緣。亦可於藉由雷射及/或鑽孔器於樹脂上形成通孔及/或盲孔後,於該通孔及/或盲孔形成鍍銅等導通鍍覆,藉此,使電性絕緣之複數之導電層、配線圖案或電路電性連接。 The plurality of conductive layers, wiring patterns or circuits may also be electrically insulated by a resin. After forming a through hole and/or a blind hole in the resin by a laser and/or a drill, a through plating such as copper plating may be formed on the through hole and/or the blind hole, thereby electrically insulating. The plurality of conductive layers, wiring patterns or circuits are electrically connected.
再者,亦可將於表面設置有脫模層之表面處理金屬箔自上述脫模層側貼合於樹脂基材之兩面,其後,將表面處理金屬箔去除,並將表面處理金屬箔之表面輪廓轉印至樹脂基材之兩面,於該樹脂基材之兩面設置電路、配線圖案或增層,藉此製造印刷配線板。 Further, a surface-treated metal foil provided with a release layer on the surface may be attached to both sides of the resin substrate from the side of the release layer, after which the surface-treated metal foil is removed, and the surface-treated metal foil is removed. The surface profile is transferred to both sides of the resin substrate, and a circuit, a wiring pattern, or a buildup layer is provided on both surfaces of the resin substrate, thereby manufacturing a printed wiring board.
構成此種增層之樹脂可使用本說明書中所記載之樹脂、樹脂層、樹脂基材,可使用公知之樹脂、樹脂層、樹脂基材、絕緣體、預浸料、使玻璃布含浸樹脂而成之基材等。樹脂亦可含有無機物及/或有機物。又,構成增層之樹脂亦可由LCP(液晶聚合物)或聚四氟乙烯等具有低相對介電常數之材料形成。近年來,隨著高頻製品之擴大,將LCP(液晶聚合物)或聚四氟乙烯(Teflon:註冊商標)等具有低相對介電常數之材料引入印刷基板之構造中之動向活躍。此時,由於該等材料為熱塑性,故而於熱壓加工時無法避免形狀變化,利用LCP(液晶聚合物)或聚四氟乙烯單獨成分之基板構成中,存在生產良率未得到提高之基本量產上之課題。上述本發明之製造方法中,對於此種問題,藉由使用環氧樹脂般之熱硬化性樹脂作為樹脂基板,並與此貼合,亦可提供一種高頻特性優異、且可防止加熱時 之形狀變形之印刷配線板。 The resin, the resin layer, and the resin substrate described in the present specification can be used as the resin constituting the layered layer, and a known resin, a resin layer, a resin substrate, an insulator, a prepreg, and a glass cloth impregnated with a resin can be used. Substrate and the like. The resin may also contain inorganic and/or organic materials. Further, the resin constituting the buildup layer may be formed of a material having a low relative dielectric constant such as LCP (liquid crystal polymer) or polytetrafluoroethylene. In recent years, with the expansion of high-frequency products, the trend of introducing a material having a low relative dielectric constant such as LCP (liquid crystal polymer) or polytetrafluoroethylene (Teflon: registered trademark) into a structure of a printed substrate has become active. At this time, since these materials are thermoplastic, shape change cannot be avoided during hot press processing, and in the substrate configuration using LCP (liquid crystal polymer) or a single component of polytetrafluoroethylene, there is a substantial amount in which the production yield is not improved. The subject of production. In the above-described production method of the present invention, by using an epoxy resin-like thermosetting resin as a resin substrate and bonding it, it is possible to provide a high-frequency characteristic and prevent heating. A printed wiring board whose shape is deformed.
使用本發明之金屬箔並藉由半加成法,可形成微細電路。圖1中表示使用金屬箔(例如銅箔)之輪廓之半加成法之概略例。該半加成法中,使用金屬箔之表面輪廓。具體而言,首先,使本發明之表面處理金屬箔自脫模層側積層於樹脂基材而製作積層體。繼而,藉由蝕刻將積層體之金屬箔去除或剝離。繼而,利用稀硫酸等將轉印有金屬箔表面輪廓之樹脂基材之表面洗淨後,實施無電解鍍銅。繼而,利用乾膜等覆蓋樹脂基材之不形成電路之部分,對未被乾膜覆蓋之無電解鍍銅層之表面實施電(電解)鍍銅。其後,將乾膜去除後,將在不形成電路之部分所形成之無電解鍍銅層去除,藉此形成微細之電路。本發明中所形成之微細電路與轉印有本發明之金屬箔表面輪廓之樹脂基材之剝離面密接,故而其密接力(剝離強度)良好。 A fine circuit can be formed by using the metal foil of the present invention and by a semi-additive method. Fig. 1 shows a schematic example of a semi-additive method using a profile of a metal foil (e.g., copper foil). In the semi-additive method, the surface profile of the metal foil is used. Specifically, first, the surface-treated metal foil of the present invention is laminated on the resin substrate from the release layer side to form a laminate. Then, the metal foil of the laminate is removed or peeled off by etching. Then, the surface of the resin substrate on which the surface profile of the metal foil is transferred is washed with dilute sulfuric acid or the like, and then electroless copper plating is performed. Then, the surface of the resin substrate which does not form a circuit is covered with a dry film or the like, and the surface of the electroless copper plating layer which is not covered with the dry film is subjected to electric (electrolytic) copper plating. Thereafter, after the dry film is removed, the electroless copper plating layer formed in the portion where the circuit is not formed is removed, thereby forming a fine circuit. The fine circuit formed in the present invention is in close contact with the peeling surface of the resin substrate on which the surface profile of the metal foil of the present invention is transferred, so that the adhesion (peeling strength) is good.
又,半加成法之另一實施形態為如下所述。 Further, another embodiment of the semi-additive method is as follows.
所謂半加成法,係指如下方法:於樹脂基材或金屬箔上進行較薄之無電解鍍覆,形成圖案後,利用電解鍍覆及蝕刻形成導體圖案。因此,於使用半加成法之本發明之印刷配線板之製造方法之一實施形態中,包括:準備本發明之表面處理金屬箔及樹脂基材之步驟;於上述表面處理金屬箔自脫模層側積層樹脂基材之步驟;於將上述表面處理金屬箔與樹脂基材積層後,藉由蝕刻將上述表面處理金屬箔去除或剝離之步驟;於將上述表面處理金屬箔剝離而產生之樹脂基材之剝離面設置通孔或/及盲孔之步驟; 對包含上述通孔或/及盲孔之區域進行除膠渣處理之步驟;對於上述樹脂基材及包含上述通孔或/及盲孔之區域,利用稀硫酸等將樹脂基材表面洗淨,並設置無電解鍍覆層(例如無電解鍍銅層)之步驟;於上述無電解鍍覆層上設置抗鍍覆層之步驟;對上述抗鍍覆層進行曝光,其後,將形成電路之區域之抗鍍覆層去除之步驟;於上述抗鍍覆層被去除之上述形成電路之區域設置電解鍍覆層(例如電解鍍銅層)之步驟;將上述抗鍍覆層去除之步驟;及藉由閃蝕等將上述形成電路之區域以外之區域中存在之無電解鍍覆層去除之步驟。 The semi-additive method refers to a method in which thin electroless plating is performed on a resin substrate or a metal foil, and after forming a pattern, a conductor pattern is formed by electrolytic plating and etching. Therefore, an embodiment of the method for producing a printed wiring board of the present invention using a semi-additive method includes the steps of: preparing a surface-treated metal foil of the present invention and a resin substrate; and self-releasing the surface-treated metal foil a step of laminating the resin substrate on the layer side; a step of removing or peeling off the surface-treated metal foil by etching the surface-treated metal foil and the resin substrate; and removing the resin from the surface-treated metal foil a step of providing a through hole or/and a blind hole in the peeling surface of the substrate; a step of desmear treatment of the region including the through hole or/and the blind hole; and cleaning the surface of the resin substrate with dilute sulfuric acid or the like for the resin substrate and the region including the through hole or/and the blind hole; And providing an electroless plating layer (for example, an electroless copper plating layer); providing a plating resist layer on the electroless plating layer; exposing the plating resist layer, and thereafter forming a circuit a step of removing the plating layer in the region; a step of providing an electrolytic plating layer (for example, an electrolytic copper plating layer) in the region where the plating resist layer is removed, and a step of removing the plating resist layer; and The step of removing the electroless plating layer existing in the region other than the region where the circuit is formed by flash etching or the like.
於使用半加成法之本發明之印刷配線板之製造方法之另一實施形態中,包括:準備本發明之表面處理金屬箔及樹脂基材之步驟;於上述表面處理金屬箔自脫模層側積層樹脂基材之步驟;於將上述表面處理金屬箔與樹脂基材積層後,藉由蝕刻將上述表面處理金屬箔去除或剝離之步驟;對於將上述表面處理金屬箔剝離而產生之樹脂基材之剝離面,利用稀硫酸等將樹脂基材表面洗淨,並設置無電解鍍覆層(例如無電解鍍銅層)之步驟;於上述無電解鍍覆層上設置抗鍍覆層之步驟;對上述抗鍍覆層進行曝光,其後,將形成電路之區域之抗鍍覆層去除之步驟; 於上述抗鍍覆層被去除之上述形成電路之區域設置電解鍍覆層(例如電解鍍銅層)之步驟;將上述抗鍍覆層去除之步驟;及藉由閃蝕等將上述形成電路之區域以外之區域中存在之無電解鍍覆層去除之步驟。 Another embodiment of the method for producing a printed wiring board of the present invention using a semi-additive method includes the steps of: preparing a surface-treated metal foil of the present invention and a resin substrate; and self-releasing the surface-treated metal foil a step of laminating a resin substrate on the side; a step of removing or peeling the surface-treated metal foil by etching after laminating the surface-treated metal foil and the resin substrate; and forming a resin base by peeling off the surface-treated metal foil a peeling surface of the material, a step of washing the surface of the resin substrate with dilute sulfuric acid or the like, and an electroless plating layer (for example, an electroless copper plating layer); and a step of providing a plating resist layer on the electroless plating layer Exposing the above-mentioned plating resist layer, and thereafter, removing the plating resist layer in the region where the circuit is formed; a step of providing an electrolytic plating layer (for example, an electrolytic copper plating layer) in the region where the plating resist layer is removed, and a step of removing the plating resist layer; and forming the circuit by flash etching or the like The step of removing the electroless plating layer present in the area outside the area.
如此,於將表面處理金屬箔剝離後之樹脂基材之剝離面形成電路,而可製作印刷電路形成基板、半導體封裝用電路形成基板。進而,可使用該電路形成基板製作印刷配線板、半導體封裝。進而,可使用該印刷配線板、半導體封裝製作電子機器。 By forming a circuit on the peeling surface of the resin substrate after the surface-treated metal foil is peeled off, a printed circuit forming substrate and a circuit forming substrate for semiconductor packaging can be produced. Further, a printed wiring board or a semiconductor package can be produced by using the circuit to form a substrate. Further, an electronic device can be produced using the printed wiring board or the semiconductor package.
另一方面,於使用全加成法之本發明之印刷配線板之製造方法之另一實施形態中,包括:準備本發明之表面處理金屬箔及樹脂基材之步驟;於上述表面處理金屬箔自脫模層側積層樹脂基材之步驟;於將上述表面處理金屬箔與樹脂基材積層後,藉由蝕刻將上述表面處理金屬箔去除或剝離之步驟;對於將上述表面處理金屬箔剝離而產生之樹脂基材之剝離面,利用稀硫酸等將樹脂基材表面洗淨之步驟;於上述洗淨之樹脂基材表面設置抗鍍覆層之步驟;對上述抗鍍覆層進行曝光,其後,將形成電路之區域之抗鍍覆層去除之步驟;於上述抗鍍覆層被去除之上述形成電路之區域設置無電解鍍覆層(例如亦可為無電解鍍銅層、厚的無電解鍍覆層)之步驟;及 將上述抗鍍覆層去除之步驟。 On the other hand, another embodiment of the method for producing a printed wiring board of the present invention using the full additive method includes the steps of: preparing the surface-treated metal foil of the present invention and a resin substrate; and treating the metal foil on the surface a step of laminating a resin substrate from the release layer side; a step of removing or peeling the surface-treated metal foil by etching after laminating the surface-treated metal foil and the resin substrate; and peeling off the surface-treated metal foil a step of removing the surface of the resin substrate by using dilute sulfuric acid or the like; a step of providing a plating resist layer on the surface of the washed resin substrate; and exposing the plating resist layer Then, a step of removing the plating layer in the region where the circuit is formed; and providing an electroless plating layer in the region where the plating layer is removed to form the circuit (for example, it may be an electroless copper plating layer, and the thickness is not Electroplating layer); and The step of removing the above-mentioned plating resist layer.
再者,於半加成法及全加成法中,存在藉由將上述樹脂基材表面洗淨而發揮容易設置無電解鍍覆層之效果之情形。尤其於脫模層殘留於樹脂基材表面之情形時,藉由該洗淨而將脫模層之一部分或全部自樹脂基材表面去除,故而存在藉由上述樹脂基材表面之洗淨而發揮更容易設置無電解鍍覆層之效果之情形。該洗淨可使用利用公知之洗淨方法(所使用之液體之種類、溫度、液體之塗佈方法等)進行之洗淨。又,較佳為使用可將本發明之脫模層之一部分或全部去除之洗淨方法。 Further, in the semi-additive method and the full-addition method, there is a case where the surface of the resin substrate is washed to exhibit an effect of easily providing an electroless plating layer. In particular, when the release layer remains on the surface of the resin substrate, part or all of the release layer is removed from the surface of the resin substrate by the cleaning, so that the surface of the resin substrate is washed by the surface of the resin substrate. It is easier to set the effect of the electroless plating layer. This washing can be carried out by using a known washing method (the type of liquid to be used, the temperature, the method of applying the liquid, etc.). Further, it is preferred to use a cleaning method which can remove part or all of the release layer of the present invention.
如此,藉由全加成法,可於將表面處理金屬箔剝離後之樹脂基材之剝離面形成電路,而製作印刷電路形成基板、半導體封裝用電路形成基板。進而,使用該電路形成基板可製作印刷配線板、半導體封裝。進而,使用該印刷配線板、半導體封裝可製作電子機器。 In this way, by the full-addition method, a circuit on which the surface of the resin substrate after the surface-treated metal foil is peeled off can be formed into a circuit to form a printed circuit-formed substrate or a circuit-formed substrate for semiconductor package. Further, a printed wiring board or a semiconductor package can be produced by forming a substrate using the circuit. Further, an electronic device can be produced by using the printed wiring board or the semiconductor package.
再者,利用具備XPS(X射線光電子光譜裝置)、EPMA(電子探針微量分析器)、EDX(能量分散型X射線分析)之掃描電子顯微鏡等機器測定表面處理金屬箔之表面,若檢測出Si,則可推測於表面處理金屬箔之表面存在矽烷化合物。又,於表面處理金屬箔與樹脂基板之剝離強度(peel strength)處於200gf/cm以下之情形時,可推定使用了本發明之脫模層所可使用之上述矽烷化合物。 Further, the surface of the surface-treated metal foil is measured by a scanning electron microscope including an XPS (X-ray photoelectron spectroscopy apparatus), an EPMA (electron probe microanalyzer), and an EDX (energy dispersive X-ray analysis), and is detected. For Si, it is presumed that a decane compound is present on the surface of the surface-treated metal foil. Moreover, when the peel strength of the surface-treated metal foil and the resin substrate is 200 gf/cm or less, the above-described decane compound which can be used for the release layer of the present invention can be estimated.
又,利用具備XPS(X射線光電子光譜裝置)、EPMA(電子探針微量分析器)、EDX(能量分散型X射線分析)之掃描電子顯微鏡等機器測定表面處理金屬箔之表面,於檢測出S,並且表面處理金屬箔與樹脂基板之剝離強度(peel strength)處於200gf/cm以下之情形時,可推測於表 面處理金屬箔之表面存在本案發明之脫模層所可使用之上述分子內具有2個以下之巰基之化合物。 Further, the surface of the surface-treated metal foil is measured by a scanning electron microscope including an XPS (X-ray photoelectron spectroscopy apparatus), an EPMA (electron probe microanalyzer), and an EDX (energy dispersive X-ray analysis) to detect S. When the peel strength of the surface-treated metal foil and the resin substrate is 200 gf/cm or less, it can be presumed that On the surface of the surface-treated metal foil, there is a compound having two or less sulfhydryl groups in the above-mentioned molecule which can be used for the release layer of the present invention.
又,利用具備XPS(X射線光電子光譜裝置)、EPMA(電子探針微量分析器)、EDX(能量分散型X射線分析)之掃描電子顯微鏡等機器測定表面處理金屬箔之表面,於檢測出Al、Ti、Zr,並且表面處理金屬箔與樹脂基板之剝離強度(peel strength)處於200gf/cm以下之情形時,可推測於表面處理金屬箔之表面存在本案發明之脫模層所可使用之上述金屬烷氧化物。 Further, the surface of the surface-treated metal foil was measured by a scanning electron microscope including an XPS (X-ray photoelectron spectroscopy apparatus), an EPMA (electron probe microanalyzer), and an EDX (energy dispersive X-ray analysis) to detect Al. When Ti, Zr, and the surface-treated metal foil and the resin substrate have a peel strength of 200 gf/cm or less, it is presumed that the above-mentioned release layer of the present invention can be used on the surface of the surface-treated metal foil. Metal alkoxide.
[實施例] [Examples]
以下,示出實驗例作為本發明之實施例及比較例,但該等實施例係為了使本發明及其優點更好理解而提供者,並不意圖限定發明。 In the following, the experimental examples are shown as examples and comparative examples of the present invention, but they are provided to better understand the present invention and its advantages, and are not intended to limit the invention.
.生箔(表面處理前之金屬箔(銅箔))之製造以如下之電解條件製作表1中所記載之厚度之電解生箔。 . Production of green foil (metal foil (copper foil) before surface treatment) The electrolytic green foil of the thickness described in Table 1 was produced under the following electrolysis conditions.
(電解液組成) (electrolyte composition)
Cu 120g/L Cu 120g/L
H2SO4 100g/L H 2 SO 4 100g/L
氯化物離子(Cl-)70ppm Chloride ion (Cl - ) 70ppm
魚膠6ppm Fish gelatin 6ppm
電解液溫度60℃ Electrolyte temperature 60 ° C
電流密度70A/dm2 Current density 70A/dm 2
電解液線速度2m/sec Electrolyte line speed 2m/sec
.表面處理 . Surface treatment
繼而,作為表面處理,以下文所示之各條件對生箔之M面(無光澤面)進行粗化處理、障壁處理(耐熱處理)、防銹處理、矽烷偶合處理、樹脂層形成處理中之任一者或組合進行各處理。繼而,以下文所示之條件於銅箔之該處理側表面形成脫模層。再者,於未特別言及之情形時,各處理係以該記載順序進行。又,於表1中,各處理之欄中記載為「無」者表示未實施該等處理。 Then, as the surface treatment, each of the conditions shown below is subjected to roughening treatment, barrier treatment (heat treatment), rust prevention treatment, decane coupling treatment, and resin layer formation treatment on the M surface (matte surface) of the green foil. Each of the processes is performed in either or combination. Then, the conditions shown below form a release layer on the treated side surface of the copper foil. Furthermore, in the case where it is not specifically mentioned, each process is performed in this order. Further, in Table 1, the description of "None" in the column of each process indicates that the processes are not performed.
(1)粗化處理 (1) roughening treatment
[球狀粗化] [spherical roughening]
使用由Cu、H2SO4、As所構成之以下所記載之銅粗化鍍浴形成球狀粗化粒子。 The spherical roughening particles are formed using a copper roughening plating bath described below composed of Cu, H 2 SO 4 , and As.
.液組成1 . Liquid composition 1
CuSO4.5H2O 78~118g/L CuSO 4 . 5H 2 O 78~118g/L
Cu 20~30g/L Cu 20~30g/L
H2SO4 12g/L H 2 SO 4 12g/L
砷1.0~3.0g/L Arsenic 1.0~3.0g/L
(電解鍍覆溫度1)25~33℃ (electrolytic plating temperature 1) 25~33 °C
(電流條件1)電流密度78A/dm2(浴之極限電流密度以上) (Current condition 1) Current density 78A/dm 2 (above the limit current density of the bath)
(鍍覆時間1)1~45秒 (plating time 1) 1~45 seconds
繼而,為了防止粗化粒子之脫落及提高剝離強度,利用由硫酸、硫酸銅所構成之銅電解浴進行被覆鍍覆。將被覆鍍覆條件記載於下文。 Then, in order to prevent the peeling of the roughened particles and to improve the peeling strength, the coating was performed by a copper electrolytic bath composed of sulfuric acid or copper sulfate. The coating plating conditions are described below.
.液組成2 . Liquid composition 2
CuSO4.5H2O 156g/L CuSO 4 . 5H 2 O 156g/L
Cu 40g/L Cu 40g/L
H2SO4 120g/L H 2 SO 4 120g/L
(電解鍍覆溫度2)40℃ (electrolytic plating temperature 2) 40 ° C
(電流條件2)電流密度:20A/dm2(未達浴之極限電流密度) (Current condition 2) Current density: 20A/dm 2 (Unlimited bath current limit)
(鍍覆時間2)1~60秒 (plating time 2) 1~60 seconds
(2)障壁處理(耐熱處理) (2) Barrier treatment (heat treatment)
(液組成) (liquid composition)
Ni 13g/L Ni 13g/L
Zn 5g/L Zn 5g/L
pH 2 pH 2
(電解鍍覆條件) (electrolytic plating conditions)
溫度40℃ Temperature 40 ° C
電流密度8A/dm2 Current density 8A/dm 2
(3)防銹處理 (3) Anti-rust treatment
(液組成) (liquid composition)
CrO3 2.5g/L CrO 3 2.5g/L
Zn 0.7g/L Zn 0.7g/L
Na2SO4 10g/L Na 2 SO 4 10g/L
pH 4.8 pH 4.8
(鋅鉻酸鹽條件) (zinc chromate conditions)
溫度54℃ Temperature 54 ° C
電流密度0.7As/dm2 Current density 0.7As/dm 2
(4)矽烷偶合處理 (4) decane coupling treatment
(液組成) (liquid composition)
四乙氧基矽烷含量0.4% Tetraethoxy decane content 0.4%
pH 7.5 pH 7.5
塗佈方法 溶液之噴霧 Coating method spray of solution
(5)脫模層之形成 (5) Formation of release layer
[脫模層A] [Release layer A]
於使用噴塗機將以體積比計含有8vol%矽烷化合物(正丙基三甲氧基矽烷)之水-甲醇混合溶液塗佈於金屬箔(銅箔)之處理表面後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層A。使矽烷化合物溶解於水中後至進行塗佈前之攪拌時間係設為30小時,溶液中之甲醇濃度係設為以體積比計為40vol%,水溶液之pH係設為3.8~4.2。 After applying a water-methanol mixed solution containing 8 vol% of a decane compound (n-propyltrimethoxydecane) in a volume ratio to a treated surface of a metal foil (copper foil) using a spray coater, the air was made in air at 100 ° C. The surface of the copper foil was dried for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a release layer A. The stirring time before the application of the decane compound in water to the coating was 30 hours, the methanol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 3.8 to 4.2.
[脫模層B] [release layer B]
於使用噴塗機將以體積比計含有8vol%矽烷化合物(正己基三甲氧基矽烷)之水-甲醇混合溶液塗佈於金屬箔(銅箔)之處理表面後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層B。使矽烷化合物溶解於水中後至進行塗佈前之攪拌時間係設為30小時,溶液中之甲醇濃度係設為以體積比計為40vol%,水溶液之pH係設為3.8~4.2。 After applying a water-methanol mixed solution containing 8 vol% of a decane compound (n-hexyltrimethoxydecane) in a volume ratio to a treated surface of a metal foil (copper foil) using a spray coater, copper was made in air at 100 ° C. The surface of the foil was dried for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a release layer B. The stirring time before the application of the decane compound in water to the coating was 30 hours, the methanol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 3.8 to 4.2.
[脫模層C] [release layer C]
於使用噴塗機將以體積比計含有8vol%矽烷化合物(正癸基三甲氧基 矽烷)之水-甲醇混合溶液塗佈於金屬箔(銅箔)之處理表面後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層C。使矽烷化合物溶解於水中後至進行塗佈前之攪拌時間係設為30小時,溶液中之甲醇濃度係設為以體積比計為40vol%,水溶液之pH係設為3.8~4.2。 In the use of a sprayer, 8 vol% of a decane compound (n-decyltrimethoxy) is contained by volume. After the water-methanol mixed solution of decane was applied to the treated surface of the metal foil (copper foil), the surface of the copper foil was dried in air at 100 ° C for 1 minute, and then heat treated in air at 150 ° C for 1 minute. A release layer C is formed. The stirring time before the application of the decane compound in water to the coating was 30 hours, the methanol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 3.8 to 4.2.
[脫模層D] [release layer D]
於使用噴塗機將以體積比計含有8vol%矽烷化合物(二甲基二甲氧基矽烷)之水-甲醇混合溶液塗佈於金屬箔(銅箔)之處理表面後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層D。使矽烷化合物溶解於水中後至進行塗佈前之攪拌時間係設為30小時,溶液中之甲醇濃度係設為以體積比計為40vol%,水溶液之pH係設為3.8~4.2。 Applying a water-methanol mixed solution containing 8 vol% of a decane compound (dimethyl dimethoxy decane) in a volume ratio to a treated surface of a metal foil (copper foil) using a spray coater, in air at 100 ° C The surface of the copper foil was dried for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a release layer D. The stirring time before the application of the decane compound in water to the coating was 30 hours, the methanol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 3.8 to 4.2.
[脫模層E] [release layer E]
於使用噴塗機將以體積比計含有8vol%矽烷化合物(三氟丙基三甲氧基矽烷)之水-甲醇混合溶液塗佈於金屬箔(銅箔)之處理表面後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層E。使矽烷化合物溶解於水中後至進行塗佈前之攪拌時間係設為30小時,溶液中之甲醇濃度係設為以體積比計為40vol%,水溶液之pH係設為3.8~4.2。 Applying a water-methanol mixed solution containing 8 vol% of a decane compound (trifluoropropyltrimethoxydecane) in a volume ratio to a treated surface of a metal foil (copper foil) using a spray coater, in air at 100 ° C The surface of the copper foil was dried for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a release layer E. The stirring time before the application of the decane compound in water to the coating was 30 hours, the methanol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 3.8 to 4.2.
[脫模層F] [release layer F]
使用1-十二烷硫醇磺酸鈉作為分子內具有2個以下之巰基之化合物,使用噴塗機將1-十二烷硫醇磺酸鈉之水-甲醇混合溶液(1-十二烷硫醇 磺酸鈉濃度:8vol%)塗佈於金屬箔(銅箔)之處理面,然後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層F。溶液中之甲醇濃度係設為以體積比計為40vol%,溶液之pH係設為5~9。 Using sodium 1-dodecyl mercaptan sulfonate as a compound having 2 or less mercapto groups in the molecule, a water-methanol mixed solution of sodium 1-dodecanethiolsulfonate (1-dodecane sulfur) using a spray coater alcohol The sodium sulfonate concentration: 8 vol%) was applied to the treated surface of the metal foil (copper foil), and then the surface of the copper foil was dried in air at 100 ° C for 1 minute, and then heat treated in air at 150 ° C for 1 minute. The release layer F is formed. The methanol concentration in the solution was set to 40 vol% by volume, and the pH of the solution was set to 5 to 9.
[脫模層G] [release layer G]
使用作為鋁酸鹽化合物之三異丙氧基鋁作為金屬烷氧化物,使用噴塗機將三異丙氧基鋁之水-甲醇混合溶液(三異丙氧基鋁濃度:8vol%)塗佈於金屬箔(銅箔)之處理面,然後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層G。使鋁酸鹽化合物溶解於水中後至進行塗佈前之攪拌時間係設為2小時,溶液中之醇濃度係設為以體積比計為40vol%,溶液之pH係設為5~9。 Using aluminum triisopropoxide as an aluminate compound as a metal alkoxide, a water-methanol mixed solution of triisopropoxy aluminum (a concentration of aluminum triisopropoxide: 8 vol%) was applied using a spray coater. The surface of the metal foil (copper foil) was treated, and then the surface of the copper foil was dried in air at 100 ° C for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a release layer G. The stirring time before the application of the aluminate compound in water to the coating was 2 hours, the alcohol concentration in the solution was 40 vol% by volume, and the pH of the solution was 5-9.
[脫模層H] [release layer H]
使用作為鈦酸鹽化合物之正癸基三異丙氧基鈦作為金屬烷氧化物,使用噴塗機將正癸基三異丙氧基鈦之水-甲醇混合溶液(正癸基三異丙氧基鈦濃度:8vol%)塗佈於金屬箔(銅箔)之處理面,然後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層H。使鈦酸鹽化合物溶解於水中後至進行塗佈前之攪拌時間係設為24小時,溶液中之醇濃度係設為以體積比計為40vol%,水溶液之pH係設為5~9。 Using a n-decyltriisopropoxide titanium as a titanate compound as a metal alkoxide, a water-methanol mixed solution of n-decyltriisopropoxide titanium (n-decyltriisopropoxy group) using a spray coater Titanium concentration: 8 vol%) was applied to a treated surface of a metal foil (copper foil), and then the surface of the copper foil was dried in air at 100 ° C for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a surface. Release layer H. The stirring time before the application of the titanate compound in water to the application was 24 hours, the alcohol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 5 to 9.
[脫模層I] [release layer I]
使用作為鋯酸鹽化合物之正丙基三正丁氧基鋯作為金屬烷氧化物,使用噴塗機將正丙基三正丁氧基鋯之水-甲醇混合溶液(正丙基三正丁氧基 鋯濃度:8vol%)塗佈於金屬箔(銅箔)之處理面,然後,於100℃之空氣中使銅箔表面乾燥1分鐘,其後於150℃之空氣中進行1分鐘加熱處理而形成脫模層I。使鋯酸鹽化合物溶解於水中後至進行塗佈前之攪拌時間係設為12小時,溶液中之醇濃度係設為以體積比計為40vol%,水溶液之pH係設為5~9。 Using n-propyltri-n-butoxyzirconium as a zirconate compound as a metal alkoxide, a water-methanol mixed solution of n-propyltri-n-butoxyzirconium (n-propyltri-n-butoxy group) using a spray coater Zirconium concentration: 8 vol%) was applied to a treated surface of a metal foil (copper foil), and then the surface of the copper foil was dried in air at 100 ° C for 1 minute, and then heat-treated in air at 150 ° C for 1 minute to form a surface. Release layer I. The stirring time before the application of the zirconate compound in water to the coating was 12 hours, the alcohol concentration in the solution was 40 vol% by volume, and the pH of the aqueous solution was 5 to 9.
(6)樹脂層形成處理 (6) Resin layer formation treatment
關於實施例1,於形成脫模層後,進而以下述之條件形成樹脂層。 In Example 1, after the release layer was formed, the resin layer was further formed under the following conditions.
(樹脂合成例) (Resin Synthesis Example)
向於裝附有不鏽鋼製之碇型攪拌棒、氮氣導入管及活栓之捕集器上安裝有裝上球形冷卻管之回流冷卻器的2升之三口燒瓶中添加3,4,3',4'-聯苯四羧酸二酐117.68g(400mmol)、1,3-雙(3-胺基苯氧基)苯87.7g(300mmol)、γ-戊內酯4.0g(40mmol)、吡啶4.8g(60mmol)、N-甲基-2-吡咯啶酮(以下記為NMP)300g、甲苯20g,於180℃加熱1小時後冷卻至室溫附近,其後添加3,4,3',4'-聯苯四羧酸二酐29.42g(100mmol)、2,2-雙{4-(4-胺基苯氧基)苯基}丙烷82.12g(200mmol)、NMP200g、甲苯40g,於室溫下混合1小時後,於180℃加熱3小時,獲得固形物成分38%之嵌段共聚合聚醯亞胺。關於該嵌段共聚合聚醯亞胺,下文所示之通式(1):通式(2)=3:2,數量平均分子量為70000,重量平均分子量為150000。 Add 3, 4, 3', 4 to a 2-liter three-necked flask equipped with a stainless steel crucible stir bar, a nitrogen inlet tube, and a stopcock, and a reflux cooler equipped with a spherical cooling tube. '-Biphenyltetracarboxylic dianhydride 117.68g (400mmol), 1,3-bis(3-aminophenoxy)benzene 87.7g (300mmol), γ-valerolactone 4.0g (40mmol), pyridine 4.8g (60 mmol), N-methyl-2-pyrrolidone (hereinafter referred to as NMP) 300 g, and toluene 20 g, heated at 180 ° C for 1 hour, cooled to near room temperature, and then added 3, 4, 3', 4' -biphenyltetracarboxylic dianhydride 29.42g (100mmol), 2,2-bis{4-(4-aminophenoxy)phenyl}propane 82.12g (200mmol), NMP200g, toluene 40g, at room temperature After mixing for 1 hour, it was heated at 180 ° C for 3 hours to obtain a block copolymerized polyimine of 38% of a solid content. With respect to the block copolymerized polyimine, the following general formula (1): general formula (2) = 3:2, a number average molecular weight of 70,000, and a weight average molecular weight of 150,000.
利用NMP將合成例中所獲得之嵌段共聚合聚醯亞胺溶液進一步稀釋,製成固形物成分10%之嵌段共聚合聚醯亞胺溶液。於該嵌段共聚合聚醯亞胺溶液中,將雙(4-馬來醯亞胺苯基)甲烷(BMI-H、K.I Chemical Industry)設為固形物成分重量比率35,將嵌段共聚合聚醯亞胺設為固形物成分重量比率65(即,樹脂溶液中所含之雙(4-馬來醯亞胺苯基)甲烷固形物成分重量:樹脂溶液中所含之嵌段共聚合聚醯亞胺固形物成分重量=35:65),於60℃溶解混合20分鐘而製成樹脂溶液。其後,將上述樹脂溶液塗佈於脫模層形成面,於氮氣環境下,於120℃進行3分鐘乾燥處理,並於160℃進行3分鐘乾燥處理後,最後於300℃進行2分鐘加熱處理,製作具備樹脂層之銅箔。再者,樹脂層之厚度係設為2μm。 The block copolymerized polyimine solution obtained in the synthesis example was further diluted with NMP to prepare a block copolymerized polyimine solution having a solid content of 10%. In the block copolymerized polyimine solution, bis(4-maleimide phenyl)methane (BMI-H, K.I Chemical Industry) is set as a solid component weight ratio of 35, and the block is The copolymerized polyimine is set to have a solid component weight ratio of 65 (ie, the weight of the bis(4-maleimidophenyl)methane solid component contained in the resin solution: the total amount of the block contained in the resin solution The polymerized polyimine solid content component weight = 35:65) was dissolved and mixed at 60 ° C for 20 minutes to prepare a resin solution. Thereafter, the resin solution was applied onto the release layer forming surface, dried in a nitrogen atmosphere at 120 ° C for 3 minutes, dried at 160 ° C for 3 minutes, and finally heat treated at 300 ° C for 2 minutes. A copper foil having a resin layer was produced. Further, the thickness of the resin layer was set to 2 μm.
(7)各種評價 (7) Various evaluations
.水接觸角之評價 . Evaluation of water contact angle
金屬箔表面之水接觸角係藉由協和界面科學股份有限公司製造之FACE CA-D進行測定。測定所使用之水係pH6~8、溫度25℃之離子交換水。接觸角之測定係於將液滴滴至金屬箔表面後1分鐘以內進行。 The water contact angle of the surface of the metal foil was measured by FACE CA-D manufactured by Kyowa Interface Science Co., Ltd. Ion exchange water having a water pH of 6 to 8 and a temperature of 25 ° C was measured. The contact angle was measured within 1 minute after dropping the droplet onto the surface of the metal foil.
.峰度(Rku)之測定 . Determination of kurtosis (Rku)
金屬箔表面之峰度(Rku)係使用Olympus股份有限公司製造之雷射顯 微鏡OLS4100並依據JIS B 0601 2001標準模式進行測定。測定長度係設為258μm。又,測定時之溫度係設為23~25℃。 The kurtosis (Rku) of the surface of the metal foil is laser-made by Olympus Co., Ltd. The micromirror OLS4100 was measured in accordance with the JIS B 0601 2001 standard mode. The measurement length was set to 258 μm. Further, the temperature at the time of measurement was set to 23 to 25 °C.
.積層體之製造 . Manufacturing of laminated bodies
將以下之樹脂基材1~3中之任一者貼合於各表面處理金屬箔之脫模層側表面。 Any one of the following resin substrates 1 to 3 was bonded to the release layer side surface of each surface-treated metal foil.
基材1:Mitsubishi Gas Chemical(股份有限公司)製造之GHPL-830 MBT Substrate 1: GHPL-830 MBT manufactured by Mitsubishi Gas Chemical Co., Ltd.
基材2:日立化成工業(股份有限公司)製造之679-FG Substrate 2: 679-FG manufactured by Hitachi Chemical Co., Ltd.
基材3:Sumitomo Bakelite(股份有限公司)製造之EI-6785TS-F Substrate 3: EI-6785TS-F manufactured by Sumitomo Bakelite Co., Ltd.
積層壓製之溫度、壓力、時間係使用各基材製造商之推薦條件。 The temperature, pressure, and time of laminate pressing are recommended by the manufacturer of each substrate.
.表面處理金屬箔之剝離性之評價 . Evaluation of the peelability of surface treated metal foil
對於積層體,依據IPC-TM-650,藉由拉伸試驗機Autograph 100測定將樹脂基材自銅箔剝離時之常態剝離強度,以如下標準評價表面處理金屬箔之剝離性。 With respect to the laminate, the normal peel strength at the time of peeling the resin substrate from the copper foil was measured by a tensile tester Autograph 100 in accordance with IPC-TM-650, and the peeling property of the surface-treated metal foil was evaluated by the following criteria.
A:未達2gf/cm。 A: Less than 2 gf/cm.
B:為2~200gf/cm之範圍。 B: is in the range of 2 to 200 gf/cm.
C:超過200gf/cm。 C: more than 200 gf/cm.
.樹脂之破壞模式之評價 . Evaluation of the failure mode of resin
利用電子顯微鏡觀察上述剝離後之樹脂基材之剝離面,對樹脂之破壞模式(凝聚、界面、凝聚與界面之混合存在)進行觀察。關於樹脂之破壞模式,「界面」表示於銅箔與樹脂之界面發生剝離,「凝聚」表示剝離強度過強而樹脂遭到破壞,「混合存在」表示上述「界面」與「凝聚」混合存在。 The peeling surface of the resin substrate after peeling was observed with an electron microscope, and the failure mode of the resin (coagulation, interface, aggregation, and mixing of the interface) was observed. Regarding the failure mode of the resin, the "interface" indicates that the interface between the copper foil and the resin is peeled off, and "coagulation" indicates that the peel strength is too strong and the resin is broken. "Mixed presence" indicates that the "interface" and "aggregation" are mixed.
.電路剝離、基板鼓起之評價 . Evaluation of circuit stripping and substrate bulging
使用鍍覆液[液組成、Cu:50g/L、H2SO4:50g/L、Cl:60ppm)於上述剝離後之樹脂基材1~3之剝離面形成銅鍍覆圖案(線/間隙=50μm/50μm)(例1)。又,使用含有導電膏之油墨,藉由噴墨而於上述剝離後之樹脂基材之剝離面形成印刷圖案(線/間隙=50μm/50μm)(例2)。又,將由液晶聚合物所構成之樹脂層(假定為構成增層之樹脂)層壓於上述剝離後之樹脂基材之剝離面(例3)。 Using a plating solution [liquid composition, Cu: 50 g/L, H 2 SO 4 : 50 g/L, Cl: 60 ppm), a copper plating pattern (line/gap) was formed on the peeling faces of the resin substrates 1 to 3 after the above peeling. = 50 μm / 50 μm) (Example 1). Moreover, a printing pattern (line/gap=50 μm/50 μm) was formed on the peeling surface of the resin substrate after the peeling by inkjet using an ink containing a conductive paste (Example 2). Further, a resin layer composed of a liquid crystal polymer (assuming a resin constituting the build-up layer) is laminated on the peeling surface of the peeled resin substrate (Example 3).
繼而,分別藉由可靠性試驗(250℃±10℃×1小時之加熱試驗)確認是否產生電路剝離或基板鼓起。再者,評價樣品之大小係設為250mm×250mm,每個樣品編號係對3個樣品進行測定。 Then, it was confirmed by a reliability test (250 ° C ± 10 ° C × 1 hour heating test) whether or not circuit peeling or substrate bulging occurred. Further, the size of the evaluation sample was set to 250 mm × 250 mm, and each sample number was measured for three samples.
將未產生電路剝離及基板鼓起者評價為「◎」。將雖然產生少量電路剝離或基板鼓起(1個樣品中為3處以下),但若對使用之位置進行挑選,則可作為製品使用者評價為「○」。又,將產生大量(1個樣品中超過3處)電路剝離或基板鼓起而無法作為製品使用者評價為「×」。 The person who did not have the circuit peeling and the substrate bulging was evaluated as "◎". Although a small amount of circuit peeling or substrate bulging occurs (three or less in one sample), if the position to be used is selected, it can be evaluated as "○" as a product user. Further, a large number (more than three in one sample) were peeled off or the substrate was bulged, and it was not evaluated as "x" as a product user.
將各試驗條件及評價結果示於表1。 The test conditions and evaluation results are shown in Table 1.
實施例1~13中,表面處理層側表面之水接觸角均為90度以上,將金屬箔自樹脂基材物理性剝離時之剝離性良好,可良好地抑制電路剝離、基板鼓起之產生。 In each of Examples 1 to 13, the water contact angle of the surface of the surface treatment layer was 90 degrees or more, and the peeling property of the metal foil from the resin substrate was physically peeled off, and the peeling of the circuit and the occurrence of the substrate bulging were well suppressed. .
比較例1中,表面處理層側表面之水接觸角未達90度,將金屬箔自樹脂基材物理性剝離時之剝離性不良,無法良好地抑制電路剝離、基板鼓起之產生。 In Comparative Example 1, the water contact angle of the surface of the surface treatment layer was less than 90 degrees, and the peeling property of the metal foil from the resin substrate was poorly peeled off, and the occurrence of circuit peeling and substrate bulging could not be satisfactorily suppressed.
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US10581081B1 (en) | 2019-02-01 | 2020-03-03 | Chang Chun Petrochemical Co., Ltd. | Copper foil for negative electrode current collector of lithium ion secondary battery |
JP7231124B1 (en) * | 2022-03-30 | 2023-03-01 | 東洋インキScホールディングス株式会社 | Bonding agent for metal plate, reinforcing member for printed wiring board and manufacturing method thereof, and wiring board and manufacturing method thereof |
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JP5114355B2 (en) * | 2008-10-08 | 2013-01-09 | 株式会社Snt | Water- and oil-repellent coated articles and their manufacture |
JP4790003B2 (en) * | 2008-12-26 | 2011-10-12 | 株式会社カーメイト | Coating film forming method and coating liquid |
JP5817907B2 (en) * | 2012-02-24 | 2015-11-18 | Jfeスチール株式会社 | Metal material, method for producing metal material, method for producing water-repellent material based on metal material, device for producing metal material, and method for producing metal material |
KR20190009427A (en) * | 2012-06-04 | 2019-01-28 | 제이엑스금속주식회사 | Carrier-attached metal foil |
WO2013183604A1 (en) * | 2012-06-04 | 2013-12-12 | Jx日鉱日石金属株式会社 | Method for producing multilayer printed wiring board |
JP2014014752A (en) * | 2012-07-06 | 2014-01-30 | Toyota Motor Corp | Method for forming water and oil repellent film and water and oil repellent film formed by the same |
JP6096787B2 (en) * | 2012-09-24 | 2017-03-15 | Jx金属株式会社 | Metal foil with carrier, laminate made of resinous plate carrier and metal foil, and uses thereof |
US9528020B2 (en) * | 2013-01-07 | 2016-12-27 | Mitsubishi Electric Corporation | Coating composition, method for producing same, and coated article |
JP6593979B2 (en) * | 2013-07-24 | 2019-10-23 | Jx金属株式会社 | Surface treated copper foil, copper foil with carrier, base material, copper clad laminate manufacturing method, electronic device manufacturing method, and printed wiring board manufacturing method |
JP6327840B2 (en) * | 2013-12-04 | 2018-05-23 | Jx金属株式会社 | Resin composition comprising a thermosetting resin and a release agent |
JP6266965B2 (en) * | 2013-12-04 | 2018-01-24 | Jx金属株式会社 | Multilayer printed wiring board manufacturing method and base substrate |
JP6306865B2 (en) * | 2013-12-05 | 2018-04-04 | Jx金属株式会社 | Laminate with resin substrates in close contact with each other in a peelable manner |
EP3119532B1 (en) * | 2014-03-18 | 2019-07-03 | 3M Innovative Properties Company | Treated article and method of making the same |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH02144177A (en) * | 1988-11-26 | 1990-06-01 | Nisshin Steel Co Ltd | Formation of organic thin film on metallic plate |
JPH08246163A (en) * | 1995-01-11 | 1996-09-24 | Kao Corp | Method for imparting liquid pepellency to metallic surface |
JP2008104936A (en) * | 2006-10-25 | 2008-05-08 | National Institute Of Advanced Industrial & Technology | Water superrepellent aluminum foil and method of manufacturing the same |
JP2012169598A (en) * | 2011-01-26 | 2012-09-06 | Sumitomo Bakelite Co Ltd | Printed wiring board and manufacturing method therefor |
JP2014060407A (en) * | 2012-01-17 | 2014-04-03 | Panasonic Corp | Wiring board and manufacturing method of the same |
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WO2017051905A1 (en) | 2017-03-30 |
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TW201718937A (en) | 2017-06-01 |
JP6498091B2 (en) | 2019-04-10 |
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