TWI606305B - 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體 - Google Patents

液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體 Download PDF

Info

Publication number
TWI606305B
TWI606305B TW102109844A TW102109844A TWI606305B TW I606305 B TWI606305 B TW I606305B TW 102109844 A TW102109844 A TW 102109844A TW 102109844 A TW102109844 A TW 102109844A TW I606305 B TWI606305 B TW I606305B
Authority
TW
Taiwan
Prior art keywords
substrate
liquid
liquid immersion
path
space
Prior art date
Application number
TW102109844A
Other languages
English (en)
Chinese (zh)
Other versions
TW201348890A (zh
Inventor
佐藤真路
Original Assignee
尼康股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 尼康股份有限公司 filed Critical 尼康股份有限公司
Publication of TW201348890A publication Critical patent/TW201348890A/zh
Application granted granted Critical
Publication of TWI606305B publication Critical patent/TWI606305B/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70866Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2041Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
TW102109844A 2012-04-10 2013-03-20 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體 TWI606305B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261622182P 2012-04-10 2012-04-10
US13/800,448 US9268231B2 (en) 2012-04-10 2013-03-13 Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium

Publications (2)

Publication Number Publication Date
TW201348890A TW201348890A (zh) 2013-12-01
TWI606305B true TWI606305B (zh) 2017-11-21

Family

ID=49292051

Family Applications (3)

Application Number Title Priority Date Filing Date
TW102109844A TWI606305B (zh) 2012-04-10 2013-03-20 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體
TW106123571A TWI668520B (zh) 2012-04-10 2013-03-20 液浸曝光裝置、曝光方法及元件製造方法
TW108118244A TW201935146A (zh) 2012-04-10 2013-03-20 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體

Family Applications After (2)

Application Number Title Priority Date Filing Date
TW106123571A TWI668520B (zh) 2012-04-10 2013-03-20 液浸曝光裝置、曝光方法及元件製造方法
TW108118244A TW201935146A (zh) 2012-04-10 2013-03-20 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體

Country Status (8)

Country Link
US (5) US9268231B2 (https=)
EP (1) EP2836876B1 (https=)
JP (3) JP6447131B2 (https=)
KR (1) KR102147071B1 (https=)
CN (2) CN108614393A (https=)
HK (2) HK1205279A1 (https=)
TW (3) TWI606305B (https=)
WO (1) WO2013153965A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2009692A (en) 2011-12-07 2013-06-10 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9494870B2 (en) * 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9651873B2 (en) * 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
JP6369472B2 (ja) 2013-10-08 2018-08-08 株式会社ニコン 液浸部材、露光装置及び露光方法、並びにデバイス製造方法
CN108139683B (zh) * 2015-09-30 2021-11-05 株式会社尼康 曝光装置及曝光方法、以及平面显示器制造方法
CN118584764A (zh) 2017-12-15 2024-09-03 Asml荷兰有限公司 流体处置结构、光刻设备、以及使用流体处置结构的方法
JP6610726B2 (ja) * 2018-07-11 2019-11-27 株式会社ニコン 液浸部材、露光装置及び露光方法、並びにデバイス製造方法

Family Cites Families (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG102627A1 (en) 1996-11-28 2004-03-26 Nikon Corp Lithographic device
EP0900412B1 (en) 1997-03-10 2005-04-06 ASML Netherlands B.V. Lithographic apparatus comprising a positioning device having two object holders
US6897963B1 (en) 1997-12-18 2005-05-24 Nikon Corporation Stage device and exposure apparatus
US6208407B1 (en) 1997-12-22 2001-03-27 Asm Lithography B.V. Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
WO1999049504A1 (fr) * 1998-03-26 1999-09-30 Nikon Corporation Procede et systeme d'exposition par projection
WO2001035168A1 (en) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Interference lithography utilizing phase-locked scanning beams
US6452292B1 (en) 2000-06-26 2002-09-17 Nikon Corporation Planar motor with linear coil arrays
EP1364257A1 (en) 2001-02-27 2003-11-26 ASML US, Inc. Simultaneous imaging of two reticles
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
JP2005536775A (ja) 2002-08-23 2005-12-02 株式会社ニコン 投影光学系、フォトリソグラフィ方法および露光装置、並びに露光装置を用いた方法
KR101177330B1 (ko) * 2003-04-10 2012-08-30 가부시키가이샤 니콘 액침 리소그래피 장치
WO2004090634A2 (en) * 2003-04-10 2004-10-21 Nikon Corporation Environmental system including vaccum scavange for an immersion lithography apparatus
TWI295414B (en) * 2003-05-13 2008-04-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1503244A1 (en) * 2003-07-28 2005-02-02 ASML Netherlands B.V. Lithographic projection apparatus and device manufacturing method
EP1519230A1 (en) * 2003-09-29 2005-03-30 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
JP4797984B2 (ja) * 2004-02-19 2011-10-19 株式会社ニコン 露光装置及びデバイス製造方法
SG186621A1 (en) 2004-06-09 2013-01-30 Nikon Corp Substrate holding device, exposure apparatus having same, exposure method, method for producing device, and liquid repellent plate
WO2006080516A1 (ja) * 2005-01-31 2006-08-03 Nikon Corporation 露光装置及びデバイス製造方法
JP2011258999A (ja) * 2005-01-31 2011-12-22 Nikon Corp 露光装置及びデバイス製造方法
TWI424260B (zh) 2005-03-18 2014-01-21 尼康股份有限公司 A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method
WO2006118108A1 (ja) * 2005-04-27 2006-11-09 Nikon Corporation 露光方法、露光装置、デバイス製造方法、及び膜の評価方法
JP4984747B2 (ja) * 2005-08-31 2012-07-25 株式会社ニコン 光学素子、それを用いた露光装置及びマイクロデバイスの製造方法
KR100651579B1 (ko) * 2005-11-15 2006-11-29 매그나칩 반도체 유한회사 이에스디 보호회로
US7864292B2 (en) * 2005-11-16 2011-01-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7656501B2 (en) * 2005-11-16 2010-02-02 Asml Netherlands B.V. Lithographic apparatus
US7804577B2 (en) * 2005-11-16 2010-09-28 Asml Netherlands B.V. Lithographic apparatus
KR101323565B1 (ko) 2006-01-19 2013-10-29 가부시키가이샤 니콘 이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법및 패턴 형성 장치, 노광 방법 및 노광 장치, 그리고디바이스 제조 방법
US8477283B2 (en) * 2006-05-10 2013-07-02 Nikon Corporation Exposure apparatus and device manufacturing method
US8004651B2 (en) 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US8134685B2 (en) 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8068209B2 (en) 2007-03-23 2011-11-29 Nikon Corporation Nozzle to help reduce the escape of immersion liquid from an immersion lithography tool
JP2009088037A (ja) * 2007-09-28 2009-04-23 Nikon Corp 露光方法及びデバイス製造方法、並びに露光装置
JP5084432B2 (ja) * 2007-10-05 2012-11-28 キヤノン株式会社 露光方法、露光装置およびデバイス製造方法
US8610873B2 (en) 2008-03-17 2013-12-17 Nikon Corporation Immersion lithography apparatus and method having movable liquid diverter between immersion liquid confinement member and substrate
US8289497B2 (en) 2008-03-18 2012-10-16 Nikon Corporation Apparatus and methods for recovering fluid in immersion lithography
KR20090124179A (ko) * 2008-05-29 2009-12-03 삼성전자주식회사 노광 장치의 빔위치 오차 측정 방법 및 이를 이용한 노광장치
JP2010016166A (ja) * 2008-07-03 2010-01-21 Canon Inc 走査型露光装置および露光方法、ならびにデバイス製造方法
NL2003835A (en) * 2008-12-22 2010-06-23 Asml Netherlands Bv Lithographic apparatus and control method.
JP2010157726A (ja) * 2008-12-29 2010-07-15 Nikon Corp 露光装置、露光方法、及びデバイス製造方法
US8896806B2 (en) * 2008-12-29 2014-11-25 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
KR20120113238A (ko) * 2010-01-08 2012-10-12 가부시키가이샤 니콘 액침 부재, 노광 장치, 노광 방법, 및 디바이스 제조 방법
JP5495948B2 (ja) * 2010-05-27 2014-05-21 キヤノン株式会社 ステージ装置、露光装置及びデバイスの製造方法
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium

Also Published As

Publication number Publication date
JP2018136581A (ja) 2018-08-30
US9268231B2 (en) 2016-02-23
US10409177B2 (en) 2019-09-10
US20160161860A1 (en) 2016-06-09
JP6593493B2 (ja) 2019-10-23
US20180217511A1 (en) 2018-08-02
TW201935146A (zh) 2019-09-01
TW201348890A (zh) 2013-12-01
US20170108786A1 (en) 2017-04-20
WO2013153965A1 (en) 2013-10-17
JP6447131B2 (ja) 2019-01-09
CN108614393A (zh) 2018-10-02
HK1205279A1 (zh) 2015-12-11
EP2836876B1 (en) 2020-08-05
US10768537B2 (en) 2020-09-08
EP2836876A1 (en) 2015-02-18
KR20150003276A (ko) 2015-01-08
US20130265556A1 (en) 2013-10-10
CN104508560B (zh) 2018-05-22
US9927724B2 (en) 2018-03-27
KR102147071B1 (ko) 2020-08-24
TW201740219A (zh) 2017-11-16
HK1257550A1 (zh) 2019-10-25
HK1207908A1 (en) 2016-02-12
JP2015514304A (ja) 2015-05-18
US9557654B2 (en) 2017-01-31
US20190391503A1 (en) 2019-12-26
JP2019215586A (ja) 2019-12-19
CN104508560A (zh) 2015-04-08
TWI668520B (zh) 2019-08-11

Similar Documents

Publication Publication Date Title
TWI606305B (zh) 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體
CN104487897B (zh) 液浸构件及曝光装置
KR102158968B1 (ko) 액침 부재 및 노광 장치
TW201435517A (zh) 液浸構件、曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體
TWI722395B (zh) 曝光裝置及元件製造方法
TW201415175A (zh) 曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體
TW201341967A (zh) 曝光裝置、曝光方法、元件製造方法、程式、及記錄媒體
JP6212884B2 (ja) 露光装置、露光方法、及びデバイス製造方法
JP2014093479A (ja) 液浸部材、露光装置、露光方法、デバイス製造方法、プログラム、及び記録媒体
JP2014086678A (ja) 液浸部材、露光装置、露光方法、デバイス製造方法、プログラム、及び記録媒体
HK1207908B (en) Liquid immersion member and exposure apparatus
HK1242789A1 (en) Liquid immersion member and exposure apparatus
HK1206435B (en) Liquid immersion member and exposure apparatus