TWI594840B - 製造經溝槽化之化學機械硏磨層之方法 - Google Patents

製造經溝槽化之化學機械硏磨層之方法 Download PDF

Info

Publication number
TWI594840B
TWI594840B TW102133452A TW102133452A TWI594840B TW I594840 B TWI594840 B TW I594840B TW 102133452 A TW102133452 A TW 102133452A TW 102133452 A TW102133452 A TW 102133452A TW I594840 B TWI594840 B TW I594840B
Authority
TW
Taiwan
Prior art keywords
mold cavity
axis
nozzle opening
mold
annular
Prior art date
Application number
TW102133452A
Other languages
English (en)
Chinese (zh)
Other versions
TW201433411A (zh
Inventor
傑弗瑞 詹姆斯 漢卓恩
肯尼斯 瓦瓦拉
傑弗瑞 伯查德 米勒
布萊恩T 康翠爾
詹姆士T 磨內
凱薩林 麥克哈吉
喬治H 麥克蘭
杜瑞A 哈特
羅伯特A 伯帝
克里斯多佛A 楊
Original Assignee
羅門哈斯電子材料Cmp控股公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 羅門哈斯電子材料Cmp控股公司 filed Critical 羅門哈斯電子材料Cmp控股公司
Publication of TW201433411A publication Critical patent/TW201433411A/zh
Application granted granted Critical
Publication of TWI594840B publication Critical patent/TWI594840B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • B24D18/0009Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for using moulds or presses
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D7/00Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
TW102133452A 2012-09-27 2013-09-16 製造經溝槽化之化學機械硏磨層之方法 TWI594840B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13/628,364 US9034063B2 (en) 2012-09-27 2012-09-27 Method of manufacturing grooved chemical mechanical polishing layers

Publications (2)

Publication Number Publication Date
TW201433411A TW201433411A (zh) 2014-09-01
TWI594840B true TWI594840B (zh) 2017-08-11

Family

ID=50337486

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102133452A TWI594840B (zh) 2012-09-27 2013-09-16 製造經溝槽化之化學機械硏磨層之方法

Country Status (5)

Country Link
US (1) US9034063B2 (https=)
JP (1) JP6238664B2 (https=)
KR (1) KR102085640B1 (https=)
CN (1) CN103692370B (https=)
TW (1) TWI594840B (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10722999B2 (en) * 2016-06-17 2020-07-28 Rohm And Haas Electronic Materials Cmp Holdings, Inc. High removal rate chemical mechanical polishing pads and methods of making
CN111318956A (zh) * 2018-12-13 2020-06-23 夏泰鑫半导体(青岛)有限公司 聚氨酯研磨垫及其制造方法、及化学机械研磨装置
CN116061102A (zh) * 2023-02-06 2023-05-05 上海芯谦集成电路有限公司 一种具有沟槽的抛光垫及其制备方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW491755B (en) * 2000-09-19 2002-06-21 Rodel Inc Polishing pad having an advantageous micro-texture and methods relating thereto
TW511174B (en) * 1999-03-30 2002-11-21 Nikon Corp Polishing body, polishing method, polishing apparatus, and manufacturing method semiconductor device
TW200408505A (en) * 2002-11-19 2004-06-01 Iv Technologies Co Ltd Method of fabricating a polishing pad
TW200513344A (en) * 2003-04-09 2005-04-16 Jsr Corp Abrasive pad, method and metal mold for manufacturing the same, and semiconductor wafer polishing method
TW200618943A (en) * 2004-11-23 2006-06-16 Rohm & Haas Elect Mat Apparatus for forming a striation reduced chemical mechanical polishing pad
TW200834699A (en) * 2006-11-03 2008-08-16 Rohm & Haas Elect Mat Curved grooving of polishing pads
TW201221305A (en) * 2010-11-23 2012-06-01 Univ Nat Pingtung Sci & Tech Wafer grinding plate and manufacture method thereof

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2981322B2 (ja) * 1991-10-28 1999-11-22 松下電工株式会社 天井収納装置
MY114512A (en) * 1992-08-19 2002-11-30 Rodel Inc Polymeric substrate with polymeric microelements
GB0008553D0 (en) 2000-04-06 2000-05-24 Unilever Plc Process and apparatus for the production of a detergent bar
KR100877386B1 (ko) 2001-11-13 2009-01-07 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
US7073244B2 (en) 2002-09-20 2006-07-11 Lear Corporation Process for machining a flexible foam
US7704125B2 (en) * 2003-03-24 2010-04-27 Nexplanar Corporation Customized polishing pads for CMP and methods of fabrication and use thereof
JP2007081322A (ja) * 2005-09-16 2007-03-29 Jsr Corp 化学機械研磨パッドの製造方法
KR20060046093A (ko) * 2004-05-20 2006-05-17 제이에스알 가부시끼가이샤 화학 기계 연마 패드 및 화학 기계 연마 방법
US7037175B1 (en) * 2004-10-19 2006-05-02 Cabot Microelectronics Corporation Method of sharpening cutting edges
JP3769581B1 (ja) 2005-05-18 2006-04-26 東洋ゴム工業株式会社 研磨パッドおよびその製造方法
TWI385050B (zh) 2005-02-18 2013-02-11 Nexplanar Corp 用於cmp之特製拋光墊及其製造方法及其用途
KR20070070094A (ko) * 2005-12-28 2007-07-03 제이에스알 가부시끼가이샤 화학 기계 연마 패드 및 화학 기계 연마 방법
CN101134303A (zh) * 2006-08-30 2008-03-05 力晶半导体股份有限公司 抛光垫及其制造方法
US7300340B1 (en) * 2006-08-30 2007-11-27 Rohm and Haas Electronics Materials CMP Holdings, Inc. CMP pad having overlaid constant area spiral grooves
JP5166172B2 (ja) * 2008-09-02 2013-03-21 富士紡ホールディングス株式会社 研磨パッドの製造方法
US8585790B2 (en) * 2009-04-23 2013-11-19 Applied Materials, Inc. Treatment of polishing pad window
US8444727B2 (en) * 2011-08-16 2013-05-21 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of manufacturing chemical mechanical polishing layers
US8986585B2 (en) * 2012-03-22 2015-03-24 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of manufacturing chemical mechanical polishing layers having a window
US8709114B2 (en) * 2012-03-22 2014-04-29 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of manufacturing chemical mechanical polishing layers

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW511174B (en) * 1999-03-30 2002-11-21 Nikon Corp Polishing body, polishing method, polishing apparatus, and manufacturing method semiconductor device
TW530348B (en) * 1999-03-30 2003-05-01 Nikon Corp Polishing body, polishing device, polishing method and method for producing semiconductor device
TW491755B (en) * 2000-09-19 2002-06-21 Rodel Inc Polishing pad having an advantageous micro-texture and methods relating thereto
TW200408505A (en) * 2002-11-19 2004-06-01 Iv Technologies Co Ltd Method of fabricating a polishing pad
TW200513344A (en) * 2003-04-09 2005-04-16 Jsr Corp Abrasive pad, method and metal mold for manufacturing the same, and semiconductor wafer polishing method
TW200618943A (en) * 2004-11-23 2006-06-16 Rohm & Haas Elect Mat Apparatus for forming a striation reduced chemical mechanical polishing pad
TW200834699A (en) * 2006-11-03 2008-08-16 Rohm & Haas Elect Mat Curved grooving of polishing pads
TW201221305A (en) * 2010-11-23 2012-06-01 Univ Nat Pingtung Sci & Tech Wafer grinding plate and manufacture method thereof

Also Published As

Publication number Publication date
KR20140041360A (ko) 2014-04-04
US20140083018A1 (en) 2014-03-27
CN103692370B (zh) 2016-08-17
TW201433411A (zh) 2014-09-01
JP2014072527A (ja) 2014-04-21
KR102085640B1 (ko) 2020-03-06
US9034063B2 (en) 2015-05-19
JP6238664B2 (ja) 2017-11-29
CN103692370A (zh) 2014-04-02

Similar Documents

Publication Publication Date Title
TWI551395B (zh) 製造化學機械硏磨層之方法
TWI551397B (zh) 製造具有窗之化學機械硏磨層之方法
JP6177665B2 (ja) 軟質かつコンディショニング可能なケミカルメカニカル研磨パッド
JP2015109437A (ja) シリコンウェーハを化学機械研磨する方法
KR102527087B1 (ko) 개선된 제거 속도 및 연마 균일성을 위한 오프셋 원주 홈을 갖는 화학적 기계적 연마 패드
JP6783563B2 (ja) ケミカルメカニカル研磨パッドのための研磨層の製造方法
TWI593510B (zh) 製造化學機械研磨層之方法
TWI594840B (zh) 製造經溝槽化之化學機械硏磨層之方法
KR102477528B1 (ko) 화학 기계적 연마 패드 및 그 제조 방법
WO2026070884A1 (ja) 研磨パッド
JP2026060211A (ja) 研磨パッドおよび研磨装置
JP2026062526A (ja) 研磨パッド