TWI543862B - Surface-treated copper foil and copper clad laminate using the same - Google Patents

Surface-treated copper foil and copper clad laminate using the same Download PDF

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TWI543862B
TWI543862B TW103104874A TW103104874A TWI543862B TW I543862 B TWI543862 B TW I543862B TW 103104874 A TW103104874 A TW 103104874A TW 103104874 A TW103104874 A TW 103104874A TW I543862 B TWI543862 B TW I543862B
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copper foil
copper
treated
roughened
composite compound
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TW103104874A
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TW201446492A (en
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津吉裕昭
細川真
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三井金屬鑛業股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/385Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by conversion of the surface of the metal, e.g. by oxidation, whether or not followed by reaction or removal of the converted layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/389Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1157Using means for chemical reduction
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Laminated Bodies (AREA)
  • Chemical Treatment Of Metals (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Other Surface Treatments For Metallic Materials (AREA)
  • ing And Chemical Polishing (AREA)

Description

表面處理銅箔以及使用表面處理銅箔而得之貼銅積層板 Surface treated copper foil and copper clad laminate obtained by using surface treated copper foil

本申請案係關於表面處理銅箔及使用表面處理銅箔而得之貼銅積層板。尤其關於銅箔之表面以由銅複合化合物所成之針狀或板狀之微細凹凸予以粗化之表面處理銅箔。 The present application relates to a surface-treated copper foil and a copper-clad laminate obtained by using a surface-treated copper foil. In particular, the surface-treated copper foil in which the surface of the copper foil is roughened by fine irregularities in the form of needles or plates made of a copper composite compound.

一般而言,市場流通之銅箔大多使用於印刷配線板之形成電路之用途中,為提高與絕緣樹脂基材之密著性,而於成為接著面之銅箔表面上設置發揮錨定效果之粗化形狀。至於發揮該錨定效果之粗化,係進行如專利文獻1(日本專利申請案:特開平05-029740號公報)等所揭示之「微細銅粒之附著」、如專利文獻2(日本專利申請案:特開2000-282265號公報)等所揭示之「利用蝕刻之凹凸形成」等。 In general, many copper foils that are in circulation in the market are used in the formation of circuits for printed wiring boards, and in order to improve the adhesion to the insulating resin substrate, the anchoring effect is provided on the surface of the copper foil to be the surface. Thicken the shape. For example, the "attachment of fine copper particles" as disclosed in the patent document 1 (Japanese Patent Application Laid-Open No. Hei 05-029740), and the like. In the case of the "concave-convex formation by etching" disclosed in Japanese Laid-Open Patent Publication No. 2000-282265.

不過,近年來,對於形成微間距電路之要求顯著,印刷配線板之製造技術亦大幅進步之結果,亦進行如專利文獻3(日本專利申請案:特開平09-074273號公報)及專利文獻4(日本專利申請案:特開2008-297569號公報)等所揭示之無粗化銅箔之使用。 However, in recent years, the demand for the formation of the micro-pitch circuit is remarkable, and the manufacturing technology of the printed wiring board is also greatly improved, as in Patent Document 3 (Japanese Patent Application Laid-Open No. Hei 09-074273) and Patent Document 4 The use of the non-roughened copper foil disclosed in Japanese Laid-Open Patent Publication No. 2008-297569.

該專利文獻3中為了提供利用強韌且富反應性之接著劑,使銅箔與積層基材牢固接著之印刷電路用貼銅積層板,而揭示採用下列等:「一種印刷電路用貼銅積層板,其係於積層基材之單面或 兩面上積層接著有銅箔之貼銅積層板,其特徵為a.於前述銅箔上,介隔由以通式QRSiXYZ...[1](但,式中Q表示能與下述樹脂組成物反應之官能基,R表示連結Q與Si原子之結合基,X、Y、Z表示鍵結於Si原子上之水解性基或羥基)所示之矽烷偶合劑,或以通式T(SH)n...[2](但,T為芳香環、脂肪族環、雜環、脂肪族鏈,n為2以上之整數)所示之硫醇系矽烷偶合劑所成之接著性基底,藉由b.由下列(1)~(6)所成之接著劑與積層積材接著:(1)丙烯酸單體、甲基丙烯酸單體、該等之聚合物或與烯烴之共聚物、(2)鄰苯二甲酸二烯丙酯、環氧基丙烯酸酯或環氧基甲基丙烯酸酯及該等之寡聚物之過氧化物硬化性樹脂組成物,(3)分子內含有乙烯丁烯共聚物與苯乙烯共聚物之熱可塑性彈性體之過氧化物硬化物樹脂組成物、(4)含有縮水甘油基之烯烴共聚物之樹脂組成物、(5)具有含有不飽和基之側鏈之聚乙烯縮丁醛樹脂之樹脂組成物、或者、(6)聚乙烯縮丁醛樹脂與具有螺乙縮醛環之胺基樹脂與環氧樹脂之樹脂組成物,或者與兼作前述樹脂組成物之接著劑的積層基材直接接著」。 In order to provide a copper-clad laminate for a printed circuit in which a copper foil and a laminated substrate are firmly adhered to each other by using a strong and reactive adhesive, the following disclosure is disclosed: "A copper-clad laminate for a printed circuit. a board that is attached to a single side of a laminated substrate or A copper-clad laminate with copper foil laminated on both sides, characterized in that a. on the copper foil, the medium is separated by the formula QRSiXYZ...[1] (however, Q represents a composition with the following resin a functional group for the reaction, R represents a decane coupling agent which bonds a bond of Q and a Si atom, X, Y, Z represents a hydrolyzable group or a hydroxy group bonded to a Si atom, or has a general formula T (SH) n) [2] (but T is an aromatic ring, an aliphatic ring, a heterocyclic ring, an aliphatic chain, and n is an integer of 2 or more), and the thiol-based decane coupling agent is formed as an adhesion substrate. By b. an adhesive formed from the following (1) to (6) and a laminated material: (1) an acrylic monomer, a methacrylic monomer, a polymer of the same or a copolymer with an olefin, 2) a diallyl phthalate, an epoxy acrylate or an epoxy methacrylate, and a peroxide curable resin composition of the oligomer, (3) an ethylene butene in the molecule a peroxide cured resin composition of a thermoplastic elastomer of a copolymer and a styrene copolymer, (4) a resin composition of a glycidyl group-containing olefin copolymer, and (5) having an unsaturated group a resin composition of a polyvinyl butyral resin of a side chain, or a resin composition of (6) a polyvinyl butyral resin and an amine-based resin having an acetal ring and an epoxy resin, or a resin The laminated substrate of the adhesive of the composition is directly followed.

而且,專利文獻4中,以提供一種表面處理層中不含 鉻,加工成印刷配線板以後之電路之撕離強度、該撕離強之耐藥品性劣化率等優異之表面處理銅箔為目的,而揭示採用「一種表面處理銅箔,其特徵係與絕緣樹脂基材貼合而製造貼銅積層板時所使用之於銅箔貼合面上設置表面處理層之表面處理銅箔,其中該表面處理層係於銅箔之貼合面上附著鋅成分,且附著熔點1400℃以上之高熔點金屬成分,進而附著碳成分而得者」,其中揭示「較好使用前述銅箔之貼合 面不施以粗化處理且表面粗糙度(Rzjis)為2.0μm以下者」。 Moreover, Patent Document 4 provides a surface treatment layer which does not contain Chromium, a surface-treated copper foil excellent in tearing strength of a circuit after processing into a printed wiring board, and a chemical resistance deterioration rate such as the peeling strength, and reveals that "a surface-treated copper foil is characterized and insulated. a surface-treated copper foil provided with a surface-treated layer on a copper foil bonding surface used for bonding a resin substrate to a copper-clad laminate, wherein the surface-treated layer is adhered to a copper foil bonding surface, Further, a high-melting-point metal component having a melting point of 1400 ° C or higher is attached, and a carbon component is adhered thereto, and "the use of the copper foil is preferably used." The surface is not subjected to roughening treatment and the surface roughness (Rzjis) is 2.0 μm or less.

上述無粗化處理銅箔在與絕緣樹脂基材之接著表面上不 存在粗化所用之凹凸。因此,並無必要設置蝕刻加工該銅箔進行電路形成時用以去除埋入於絕緣樹脂基材側之狀態之錨定形狀(凹凸形狀)之過度蝕刻時間。因此,在形成具備良好蝕刻因子之微間距電路中非常有用。 The above non-roughened copper foil is not on the surface of the insulating resin substrate There are irregularities used for roughening. Therefore, it is not necessary to provide an excessive etching time for removing the anchor shape (concavo-convex shape) in a state of being buried on the side of the insulating resin substrate when the copper foil is etched and formed. Therefore, it is very useful in forming a micro-pitch circuit having a good etching factor.

然而,該無粗化銅箔由於不存在埋入於絕緣樹脂基材側 之狀態之錨定形狀(凹凸形狀),故有無粗化銅箔之對於絕緣樹脂基材之密著性比粗化之銅箔更為降低之傾向。 However, the non-roughened copper foil is buried in the side of the insulating resin substrate Since the anchored shape (concave-convex shape) of the state is high, the adhesion of the roughened copper foil to the insulating resin substrate tends to be lower than that of the roughened copper foil.

因此,市場上存在有相較於無粗化銅箔對於絕緣樹脂基 材之密著性,具備與絕緣樹脂基材更良好之密著性,且具備與不存在粗化所用之凹凸之無粗化銅箔同等之良好蝕刻性能之銅箔的要求。 Therefore, there are on the market compared to the non-roughened copper foil for the insulating resin base. The adhesiveness of the material is required to have better adhesion to the insulating resin substrate, and it is required to have a copper foil having good etching performance equivalent to that of the roughened copper foil having no irregularities for roughening.

因此,本發明人等進行積極研究之結果,可知藉由採用以下所示之銅箔,在存在有埋入絕緣樹脂基材側之狀態之錨定形狀(凹凸形狀)下,可具備與絕緣樹脂基材之良好密著性。以下,針對本申請案之表面處理銅箔加以說明。 Therefore, as a result of the active research by the inventors of the present invention, it has been found that the copper foil described below can be provided with an insulating resin in an anchor shape (concavo-convex shape) in a state in which the insulating resin substrate is embedded. Good adhesion of the substrate. Hereinafter, the surface-treated copper foil of the present application will be described.

表面處理銅箔:本申請案之表面處理銅箔之特徵係銅箔之表面經粗化之表面處理銅箔中,於該銅箔之表面具備以最大長度為500nm以下之銅複合化合物所成之針狀或板狀之微細凹凸所形成之粗化處理層。又,以下將「由銅複合化合物所成之針狀或板狀之微細凹凸」簡稱為「由銅複合化合物所成之微細凹凸」者。 Surface-treated copper foil: The surface-treated copper foil of the present application is characterized in that the surface of the copper foil is roughened by surface-treated copper foil, and the surface of the copper foil is provided with a copper composite compound having a maximum length of 500 nm or less. A roughened layer formed by fine irregularities in the form of needles or plates. In the following, the "fine or irregular shape of the needle-like or plate-like shape formed by the copper composite compound" is simply referred to as "fine irregularities formed by the copper composite compound".

本申請案之表面處理銅箔之粗化處理層之由銅複合化合 物所成之微細凹凸,使用掃描型電子顯微鏡,以試料之傾斜角45°、50000倍以上之倍率自粗化處理層之表面觀察時之最大長度為150nm以下。 The copper composite compound of the roughened layer of the surface treated copper foil of the present application The maximum irregularity of the material was 150 nm or less when observed from the surface of the roughened layer by a scanning electron microscope at a magnification of 45° or more and a magnification of 50,000 times or more.

本申請案之表面處理銅箔之由銅複合化合物所成之微細 凹凸,將以XPS分析時之Cu(I)及Cu(II)之各波鋒面積之合計面積設為100%時,Cu(I)波峰之佔有面積率較好為50%以上。 The surface-treated copper foil of the present application is made of a copper composite compound In the unevenness, when the total area of the respective wave front areas of Cu(I) and Cu(II) in the XPS analysis is 100%, the occupied area ratio of the Cu(I) peak is preferably 50% or more.

本申請案之表面處理銅箔之由銅複合化合物所成之微細 凹凸係含有氧化銅及氧化亞銅者。 The surface-treated copper foil of the present application is made of a copper composite compound The bumps contain copper oxide and cuprous oxide.

此外,本申請案之表面處理銅箔之由銅複合化合物所成 之微細凹凸,以吸附氪(krypton)所測定之比表面積較好為0.035m2/g以上。 In addition, the surface treated copper foil of the present application is formed of a copper composite compound. The fine unevenness and the specific surface area measured by krypton are preferably 0.035 m 2 /g or more.

再者,本申請案之表面處理銅箔之前述粗化處理層之表 面較好具備L*a*b*表色系之亮度L*為25以下之亮度。 Furthermore, the surface of the roughened layer of the surface-treated copper foil of the present application The surface preferably has a brightness L* of L*a*b* color system of 25 or less.

貼銅積層板:本申請案之貼銅積層板之特徵係使用上述 之表面處理銅箔而得。 Copper-clad laminate: The characteristics of the copper-clad laminate of the present application are as follows The surface is treated with copper foil.

本申請案之表面處理銅箔係以「由最大長度為500nm以 下之銅複合化合物所成之微細凹凸」形成粗化處理表面。而且,該粗化處理表面雖位於銅箔之最表面,但銅箔之與絕緣樹脂基材之接著面所具備之μm等級之微米凹凸形狀仍直接保持。其結果,相較於無粗化銅箔對於絕緣樹脂基材之密著性,可確保更良好的密著性。 The surface treated copper foil of the present application is "having a maximum length of 500 nm" The fine unevenness formed by the underlying copper composite compound forms a roughened surface. Further, although the roughened surface is located on the outermost surface of the copper foil, the μm-scale micro-concave shape of the copper foil and the insulating resin substrate are directly maintained. As a result, it is possible to ensure better adhesion than the adhesion of the non-roughened copper foil to the insulating resin substrate.

圖1係用以說明本申請案之表面處理銅箔之粗化形態之掃描型電子顯微鏡觀察像(實施例1中之氧化處理之浸漬時間2分鐘之試料)。 Fig. 1 is a scanning electron microscope observation image (a sample in which the immersion time of the oxidation treatment in Example 1 was immersed for 2 minutes) for explaining the roughened form of the surface-treated copper foil of the present application.

圖2係本申請案之表面處理銅箔中,用以顯示依據電解銅箔之電極面與析出面之粗化對象部位而異之不同粗化形態的掃描型電子顯微鏡觀察像(實施例1中之氧化處理之浸漬時間2分鐘之試料)。 2 is a scanning electron microscope observation image in which the roughened form is different depending on the roughened target portion of the electrode surface and the deposition surface of the electrolytic copper foil in the surface-treated copper foil of the present application (Example 1) The immersion time of the oxidation treatment was 2 minutes.

圖3係本申請案之表面處理銅箔之粗化處理層之剖面的掃描型電子顯微鏡觀察像(實施例1中之氧化處理之浸漬時間2分鐘之試料)。 Fig. 3 is a scanning electron microscope observation image of the cross section of the roughened layer of the surface-treated copper foil of the present application (the sample of the immersion time of the oxidation treatment in Example 1 for 2 minutes).

圖4係自表面觀察比較例中之比較試料之粗化處理形態之掃描型電子顯微鏡觀察像。 Fig. 4 is a scanning electron microscope observation image of the roughened treatment form of the comparative sample in the comparative example from the surface.

圖5係自剖面觀察比較例中之比較試料之粗化處理層的掃描型電子顯微鏡觀察像。 Fig. 5 is a scanning electron microscope observation image of the roughened layer of the comparative sample in the comparative example.

以下,說明關於本申請案之「表面處理銅箔之形態」及「貼銅積層板之形態」。 Hereinafter, the "form of the surface-treated copper foil" and the "form of the copper-clad laminate" in the present application will be described.

表面處理銅箔之形態:本申請案之表面處理銅箔之特徵係銅箔之表面經粗化之表面處理銅箔中,於該銅箔之表面具備以最大長度為500nm以下之銅複合化合物所成之微細凹凸所形成之粗化處理層。 The surface-treated copper foil is characterized in that the surface-treated copper foil of the present application is characterized in that the surface of the copper foil is roughened in a surface-treated copper foil, and a copper composite compound having a maximum length of 500 nm or less is provided on the surface of the copper foil. A roughened layer formed by fine concavities and convexities.

本申請案之表面處理銅箔之製造中所用之銅箔可使用電 解銅箔、壓延銅箔之任一種。此外,關於銅箔之厚度亦無特別限制,一般認知為200μm以下之厚度即已足夠。此外,本申請案之表面處理銅箔係以於單面施以粗化之情況、於兩面施以粗化之情況二者作為對象。 The copper foil used in the manufacture of the surface treated copper foil of the present application can be used. Any one of copper foil and rolled copper foil. Further, the thickness of the copper foil is not particularly limited, and it is generally sufficient to recognize a thickness of 200 μm or less. Further, the surface-treated copper foil of the present application is intended to be both roughened on one side and roughened on both sides.

本申請案之表面處理銅箔之粗化處理表面較好為於銅箔 之表面形成含氧化銅之「由銅化合物所成之微細凹凸」,且經還原處理將氧化銅之一部分轉換成氧化亞銅,藉此以含氧化銅及氧化亞銅之「由最大長度為500nm以下之銅複合化合物所成之微細凹凸」予以粗化而成者。此處,所謂「最大長度為500nm以下」係以電場輻射型掃描型電子顯微鏡觀察該表面處理銅箔之粗化處理表面時顯示「由銅複合化合物所成之微細凹凸」之最大值者。該「由銅複合化合物所成之微細凹凸」之形狀之最大值係如後述之圖3所示,於設於銅箔表面之「由銅複合化合物所成之微細凹凸所形成之粗化處理層」之剖面中,自銅箔之表面延伸之針狀或板狀之長度。就提高本申請案之表面處理銅箔與絕緣層構成材之密著性之觀點而言,該最大長度更好為400nm以下,又更好為300nm以下。又,該最大長度於以下有時稱為「最大長度1」。 The roughened surface of the surface treated copper foil of the present application is preferably copper foil The surface is formed with "fine irregularities made of a copper compound" containing copper oxide, and a part of the copper oxide is converted into cuprous oxide by reduction treatment, whereby the maximum length is 500 nm by containing copper oxide and cuprous oxide. The fine concavities and convexities formed by the following copper composite compound are coarsened. Here, the "maximum length is 500 nm or less" is the maximum value of the "fine irregularities formed by the copper composite compound" when the surface of the surface-treated copper foil is observed by the electric field radiation type scanning electron microscope. The maximum value of the shape of the "fine concavities and convexities formed by the copper composite compound" is as shown in FIG. 3, which will be described later, and the roughened layer formed by the fine concavities and convexities formed by the copper composite compound on the surface of the copper foil. In the cross section, the length of the needle or plate extending from the surface of the copper foil. From the viewpoint of improving the adhesion between the surface-treated copper foil of the present application and the insulating layer constituent material, the maximum length is preferably 400 nm or less, more preferably 300 nm or less. Further, the maximum length is sometimes referred to as "maximum length 1".

而且,構成本申請案之表面處理銅箔之粗化處理層之 「由銅複合化合物所成之微細凹凸」係如圖1所示,使用電場輻射型之掃描型電子顯微鏡,以50000倍以上之倍率以平面(掃描型電子顯微鏡觀察時之試料傾斜角45°)觀察該粗化處理層表面時之「由銅複合化合物所成之微細凹凸之最大長度」較好為150nm以下。該圖1係顯示 相對於兩面平滑電解銅箔之析出面(圖1(a)),以本申請案之「由銅複合化合物所成之微細凹凸」予以粗化時,則觀察為如圖1(b)。而且,圖1(c)係顯示將圖1(b)之表面再放大至50000倍之觀察像。就提高本申請案之表面處理銅箔與絕緣層構成材之密著性之觀點而言,該最大長度更好為100nm以下。又該最大長度於以下有時稱為「最大長度2」。 Moreover, the roughened layer constituting the surface-treated copper foil of the present application is "The fine concavities and convexities formed by the copper composite compound" are shown in Fig. 1. Using a scanning electron microscope of an electric field radiation type, the plane is at a magnification of 50,000 times or more (the sample tilt angle is 45° when observed by a scanning electron microscope). When the surface of the roughened layer is observed, the "maximum length of the fine concavities and convexities formed by the copper composite compound" is preferably 150 nm or less. Figure 1 shows When the deposition surface (Fig. 1 (a)) of the double-sided smooth electrolytic copper foil is roughened by the "fine irregularities formed of the copper composite compound" of the present application, it is observed as shown in Fig. 1(b). Further, Fig. 1(c) shows an observation image in which the surface of Fig. 1(b) is further enlarged to 50,000 times. From the viewpoint of improving the adhesion between the surface-treated copper foil of the present application and the insulating layer constituent material, the maximum length is more preferably 100 nm or less. Further, the maximum length is sometimes referred to as "maximum length 2".

列舉一例時,以Zygo股份有限公司製造之非接觸三次元 表面形狀.粗糙度測定機(型號:New-View 6000)測定圖1(a)所示之粗化前之電解銅箔之析出面時,為Ra=1.6nm,Rz=26nm。對於該電解銅箔之析出面,以本申請案之「由銅複合化合物所成之微細凹凸」予以粗化者係圖1(b)所示之粗化處理後之電解銅箔。同樣地測定該表面時係Ra=2.3nm,Rz=39nm,可理解為可藉nm等級進行粗化。再者,圖2中顯示依據電解銅箔之電極面與析出面之經粗化部位而異之不同粗化形態。關於該圖2詳述於實施例中。 When listed, the non-contact three-dimensional element manufactured by Zygo Co., Ltd. Surface shape. Roughness measuring machine (Model: New-View 6000) When the precipitation surface of the electrolytic copper foil before roughening shown in Fig. 1 (a) was measured, Ra = 1.6 nm and Rz = 26 nm. The surface of the electrolytic copper foil is roughened by the "fine irregularities formed of the copper composite compound" in the present application, and the electrolytic copper foil after the roughening treatment shown in Fig. 1 (b) is used. When the surface was measured in the same manner, Ra = 2.3 nm and Rz = 39 nm, which is understood to be roughenable by the nm level. Further, in Fig. 2, the roughened form differs depending on the roughened portion of the electrode surface of the electrolytic copper foil and the deposited surface. This Figure 2 is detailed in the examples.

此外,圖3顯示藉由此時之粗化所形成之由銅複合化合 物所成之微細凹凸之剖面。該剖面中,由銅複合化合物所成之微細凹凸密集而形成之粗化處理層之厚度雖有一定之偏差,但距銅箔表面之平均厚度仍處於400nm以下。圖3中顯示粗化處理層之該平均厚度為250nm者。本申請案之發明者等進行多數試驗之結果,判斷若該粗化處理層之平均厚度侷限在100nm~350nm之範圍,則可具備「比對於絕緣樹脂基材之無粗化銅箔更高的良好密著性」。 In addition, FIG. 3 shows the composite of copper formed by the coarsening at this time. A section of fine irregularities formed by the object. In this cross section, although the thickness of the roughened layer formed by the fine concavities and convexities of the copper composite compound is constant, the average thickness from the surface of the copper foil is still 400 nm or less. The average thickness of the roughened layer shown in Fig. 3 is 250 nm. As a result of performing most of the tests, the inventors of the present application judged that if the average thickness of the roughened layer is limited to the range of 100 nm to 350 nm, it can be provided to be "higher than the non-roughened copper foil for the insulating resin substrate. Good adhesion."

接著,關於構成由銅複合化合物所成之微細凹凸之成 分,嘗試使用X射線光電子分光分析法(X-ray Photoelectron Spectroscopy:以下簡稱為「XPS」)進行狀態分析。其結果,確認存在「Cu(0)」、「Cu(II)」、「Cu(I)」及「-COO基」。此處由於確認到存在「-COO基」,故認為含「碳酸銅」之可能性高。 Next, the composition of the fine concavities and convexities formed by the copper composite compound Try to use X-ray photoelectron spectroscopy (X-ray Photoelectron) Spectroscopy: hereinafter referred to as "XPS" for status analysis. As a result, it was confirmed that "Cu(0)", "Cu(II)", "Cu(I)", and "-COO group" exist. Here, since it is confirmed that "-COO group" exists, it is considered that the possibility of containing "copper carbonate" is high.

而且,使用上述XPS分析本申請案之表面處理銅箔之前 述銅複合化合物時,可分離檢測出Cu(I)及Cu(II)之各波峰。以該XPS分析銅複合化合物時,由於有時觀察到在大的Cu(I)波峰之肩部部分重複有Cu(0)波峰,故包含該肩部部分在內被看作為Cu(I)波峰。因此,本申請案中,使用XPS分析銅複合化合物,且將對應於Cu 2p 3/2之鍵結能之出現在932.4eV之Cu(I)、及出現在934.3eV之Cu(II)之光電子所檢測而得之各波峰進行波形分離,由各成分之波峰面積特定出Cu(I)波峰之佔有面積。此時之Cu(I)波峰認為係源自「構成氧化亞銅之1價銅」。而且,Cu(II)波峰認為係源自「構成氧化銅之2價銅」。再者,Cu(0)波峰認為係源自「構成金屬銅之0價銅」。本申請案中,係使用ULVAC-PHI股份有限公司製造之Quantum 2000(光束條件:40W、200μm直徑)作為XPS分析裝置,且使用「MultiPack ver.6.1A」作為解析軟體進行狀態.半定量用狹窄測定。 Moreover, before using the above XPS to analyze the surface treated copper foil of the present application When the copper composite compound is described, each peak of Cu(I) and Cu(II) can be separated and detected. When the copper composite compound was analyzed by the XPS, since the Cu(0) peak was repeatedly observed in the shoulder portion of the large Cu(I) peak, it was regarded as the Cu(I) peak including the shoulder portion. . Therefore, in the present application, XPS is used to analyze the copper composite compound, and the photoelectron corresponding to Cu 2p 3/2 bonding energy appearing at 932.4 eV Cu(I) and 934.3 eV Cu(II) The detected peaks are separated by a waveform, and the area of the peak of the Cu(I) peak is specified by the peak area of each component. The Cu(I) peak at this time is considered to be derived from "monovalent copper constituting cuprous oxide". Further, the Cu(II) peak is considered to be derived from "two-valent copper constituting copper oxide". Furthermore, the Cu(0) peak is considered to be derived from "zero-valent copper constituting metallic copper." In the present application, Quantum 2000 (beam condition: 40 W, 200 μm diameter) manufactured by ULVAC-PHI Co., Ltd. is used as an XPS analysis device, and "MultiPack ver.6.1A" is used as an analytical software for the state. Semi-quantitative stenosis.

據此,本申請案之表面處理銅箔之「由銅複合化合物所 成之微細凹凸」之情況,將以XPS分析時之Cu(I)及Cu(II)之各波峰面積之合計面積設為100%時,Cu(I)波峰之佔有面積率較好為50%以上。Cu(I)波峰之佔有面積率未達50%時,將本申請案之表面處理銅箔之粗化處理表面積層於絕緣層構成材上,且形成電路所得之電路之耐藥品性能下降故較不佳。此處,前述銅複合化合物之Cu(I)波峰之佔 有面積率更好為70%以上,又更好為80%以上。其理由為氧化亞銅相較於氧化銅由於酸溶解性較低,故Cu(I)波峰之佔有面積率增加時,有降低電路形成時之蝕刻步驟中之蝕刻液.電鍍液等對於與絕緣層構成材之密著部分之滲入之可能性,而能提高耐藥品性能。另一方面,關於Cu(I)波峰之佔有面積率,並無特別限制,但藉後述之氧化處理及還原處理而成為99%以下。然而,Cu(I)波峰之佔有面積率變得愈低,會有提高與絕緣層構成材之密著性本身之傾向,為了獲得良好之耐氧化性,較好為98%以下,更好為95%以下。又,Cu(I)波峰之佔有面積率係以Cu(I)/{Cu(I)+Cu(II)}×100(%)之計算式算出。 Accordingly, the surface treated copper foil of the present application is "made of a copper composite compound" In the case of the fine concavities and convexities, when the total area of the respective peak areas of Cu(I) and Cu(II) in the XPS analysis is 100%, the occupied area ratio of the Cu(I) peak is preferably 50%. the above. When the occupied area ratio of the Cu(I) peak is less than 50%, the roughened surface area of the surface-treated copper foil of the present application is layered on the insulating layer constituent material, and the chemical resistance of the circuit formed by the circuit is lowered. Not good. Here, the Cu(I) peak of the aforementioned copper composite compound accounts for The area ratio is better than 70%, and more preferably 80% or more. The reason is that the cuprous oxide phase is lower in acid solubility than the copper oxide, so when the occupied area ratio of the Cu(I) peak is increased, there is an etching liquid in the etching step when the circuit is formed. The plating solution or the like can improve the chemical resistance of the insulating portion to the intimate portion of the insulating material. On the other hand, the area ratio of the Cu(I) peak is not particularly limited, but is 99% or less by the oxidation treatment and the reduction treatment described later. However, the lower the occupied area ratio of the Cu(I) peak, the tendency to improve the adhesion to the insulating layer constituent material, and in order to obtain good oxidation resistance, it is preferably 98% or less, more preferably 95% or less. Further, the area ratio of the Cu(I) peak is calculated by the calculation formula of Cu(I) / {Cu(I) + Cu(II)} × 100 (%).

而且,藉由此時之粗化而形成之由銅複合化合物所成之 微細凹凸較好滿足以吸附氪測定之比表面積(以下簡稱為「比表面積」)為0.035m2/g以上之條件。其理由為該比表面積為0.035m2/g以上時,粗化處理層之前述平均厚度成為200nm等級,可超越無粗化銅箔對於絕緣樹脂基材之密著性。此處,比表面積之上限並未定,但為確保與無粗化銅箔同等之良好蝕刻性能,上限為0.3m2/g左右,更好為0.2m2/g。又,此時之比表面積係使用Micromeritics公司製造之比表面積.細孔分佈測定裝置3Flex,對試料進行300℃×2小時之加熱作為前處理,且係以吸附溫度使用液態氮溫度,吸附氣體使用氪進行測定。 Moreover, the copper composite compound formed by the coarsening at this time The fine concavities and convexities preferably satisfy the condition that the specific surface area (hereinafter simply referred to as "specific surface area") measured by the adsorption enthalpy is 0.035 m 2 /g or more. When the specific surface area is 0.035 m 2 /g or more, the average thickness of the roughened layer is 200 nm, which is superior to the adhesion of the non-roughened copper foil to the insulating resin substrate. Here, the upper limit of the specific surface area is not fixed, but the upper limit is about 0.3 m 2 /g, more preferably 0.2 m 2 /g, in order to ensure good etching performance equivalent to that of the non-roughened copper foil. Moreover, the specific surface area at this time is the specific surface area manufactured by Micromeritics. The pore distribution measuring device 3Flex was subjected to heating at 300 ° C for 2 hours as a pretreatment, and the liquid nitrogen temperature was used at the adsorption temperature, and the adsorption gas was measured using hydrazine.

以上所述之「由銅複合化合物所成之微細凹凸」由於愈吸收光愈微細,故粗化處理層之表面暗色化成黑色化、茶褐色化等。亦即,本申請案之表面處理銅箔之粗化處理層之表面,其色調上亦有 特色,且L*a*b*表色系之亮度L*為25以下,更好為20以下。其亮度L*超過25成為亮色調時,處於未進行充分之粗化,無法獲得「比無粗化銅箔對於絕緣樹脂基材以上之更良好密著性」故而欠佳。又,亮度L*之測定係使用日本電色工業股份有限公司製造之分光色差計SE2000,亮度之校正係使用附屬於測定裝置之白色版,依據JIS Z8722:2000進行。而且,針對相同部位進行3次測定,以3次測定之亮度L*之測定數據之平均值記載作為本申請案之亮度L*之值。 The "fine concavities and convexities formed by the copper composite compound" described above are finer in light absorption, so that the surface of the roughened layer is darkened to blackening or browning. That is, the surface of the roughened layer of the surface-treated copper foil of the present application also has a color tone. Features, and the brightness L* of the L*a*b* color system is 25 or less, more preferably 20 or less. When the brightness L* exceeds 25 and becomes a bright color tone, it is not sufficiently roughened, and it is not preferable because "the adhesiveness of the roughened copper foil is more excellent than the insulating resin substrate". Further, the measurement of the luminance L* was carried out by using a spectrophotometer SE2000 manufactured by Nippon Denshoku Industries Co., Ltd., and the calibration of the luminance was carried out in accordance with JIS Z8722:2000 using a white plate attached to the measuring device. Further, the measurement was performed three times for the same portion, and the average value of the measurement data of the brightness L* measured three times is described as the value of the brightness L* of the present application.

接著,敘述關於本申請案之表面處理銅箔之粗化所用之「由銅複合化合物所成之微細凹凸」之形成方法。而且,該銅複合化合物係含有氧化銅及氧化亞銅者。該銅複合化合物係如下述般形成。首先,使用溶液,以濕式法對銅箔表面施以氧化處理,於銅箔表面形成包含氧化銅之「由銅化合物所成之微細凹凸」。隨後,使該銅化合物經還原處理,將氧化銅之一部分轉換成為氧化亞銅,成為含氧化銅與氧化亞銅之「由銅複合化合物所成之微細凹凸」。本申請案中氧化處理所用之溶液較好使用不易侵蝕氧化銅之鹼性溶液,更好使用可溶解於鹼性溶液中,且可較安定地共存之胺基系矽烷偶合劑。此處,藉由於該氧化處理所用之溶液中含有胺基系矽烷偶合劑,使形成「由銅化合物所成之微細凹凸」變容易。藉由使胺系矽烷偶合劑吸附於銅箔表面,微細地抑制銅箔表面之氧化,故成為「由銅化合物所成之微細凹凸」之形狀。具體例示該胺基系矽烷偶合劑時,可使用N-2-(胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、N-2-(胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、 3-三乙氧基矽烷基-N-(1,3-二甲基-亞丁基)丙基胺、N-苯基-3-胺基丙基三甲氧基矽烷等。 Next, a method of forming the "fine irregularities formed of the copper composite compound" used for the roughening of the surface-treated copper foil of the present application will be described. Further, the copper composite compound contains copper oxide and cuprous oxide. This copper composite compound is formed as follows. First, the surface of the copper foil is oxidized by a wet method using a solution, and "fine irregularities made of a copper compound" containing copper oxide are formed on the surface of the copper foil. Subsequently, the copper compound is subjected to a reduction treatment to convert a part of the copper oxide into cuprous oxide, and the "fine irregularities formed by the copper composite compound" containing copper oxide and cuprous oxide. The solution used for the oxidation treatment in the present application is preferably an alkaline solution which does not easily erode copper oxide, and an amine-based decane coupling agent which is soluble in an alkaline solution and which can coexist more stably. Here, since the solution used for the oxidation treatment contains an amine-based decane coupling agent, formation of "fine irregularities formed of a copper compound" is facilitated. By adsorbing the amine-based decane coupling agent on the surface of the copper foil, the oxidation of the surface of the copper foil is finely suppressed, so that it is in the shape of "fine irregularities made of a copper compound". When the amine decane coupling agent is specifically exemplified, N-2-(aminoethyl)-3-aminopropylmethyldimethoxydecane, N-2-(aminoethyl)-3 can be used. -Aminopropyltrimethoxydecane, 3-aminopropyltrimethoxydecane, 3-aminopropyltriethoxydecane, 3-triethoxydecyl-N-(1,3-dimethyl-butylene)propylamine, N-phenyl-3-aminopropyltrimethoxydecane, and the like.

接著,於上述氧化處理結束時,使由該銅化合物所成之 微細凹凸進行還原處理。本申請案之表面處理銅箔之表面藉由該氧化處理而形成之「由銅化合物所成之微細凹凸」即使施以還原處理仍大致上維持當初之由銅化合物所成之微細凹凸之形狀,成為含有nm等級長度之氧化銅及氧化亞銅之「由銅複合化合物所成之微細凹凸」。 其理由係直接殘留因氧化處理所得之「由銅化合物所成之微細凹凸」之銅化合物時,由於容易因該成分之蝕刻液及其他酸溶液造成侵蝕,故表面處理銅箔與絕緣樹脂基材之界面之溶液侵蝕顯著,因而使形成之電路之耐藥品性能下降之故。因此,較好進行還原處理,將「由銅化合物所成之微細凹凸」之氧化銅之一部分轉化成氧化亞銅而成為銅複合化合物。該還原處理中,藉由調整還原劑濃度、溶液pH、溶液溫度等,可適當地調整「由銅複合氧化物所成之微細凹凸」之Cu(I)波峰之佔有面積率。又,含有氧化銅及氧化亞銅之銅複合化合物亦可含有少量的金屬銅。 Then, at the end of the oxidation treatment, the copper compound is formed. The fine unevenness is subjected to reduction treatment. In the surface of the surface-treated copper foil of the present application, the "fine concavities and convexities formed by the copper compound" formed by the oxidation treatment substantially maintain the shape of the fine concavities and convexities formed by the copper compound at the time of the reduction treatment. It is a "fine unevenness formed of a copper composite compound" containing copper oxide and cuprous oxide having a length of nm. The reason is that when the copper compound which is "fine irregularities made of a copper compound" obtained by the oxidation treatment is left as it is, the surface-treated copper foil and the insulating resin substrate are easily eroded by the etching liquid of the component and other acid solutions. The solution at the interface is significantly eroded, thereby deteriorating the chemical resistance of the formed circuit. Therefore, it is preferred to carry out a reduction treatment to convert a part of the copper oxide "fine irregularities formed by the copper compound" into cuprous oxide to form a copper composite compound. In the reduction treatment, by adjusting the concentration of the reducing agent, the pH of the solution, the temperature of the solution, and the like, the area ratio of the Cu(I) peak of the "fine irregularities formed by the copper composite oxide" can be appropriately adjusted. Further, the copper composite compound containing copper oxide and cuprous oxide may also contain a small amount of metallic copper.

基於以上所述可理解,本申請案之表面處理銅箔浸漬於 氧化處理溶液中,以濕式法於銅箔之表面設置含氧化銅之「由銅化合物所成之微細凹凸」,隨後經還原處理而形成Cu(I)波峰之佔有面積率為50%以上之「由銅複合氧化物所成之微細凹凸」。據此,可同時對銅箔之兩面同時施以粗化。因此,利用該濕式法時,可容易地獲得適於多層印刷配線板之內層電路形成之兩面粗化處理銅箔。 Based on the above, it can be understood that the surface treated copper foil of the present application is immersed in In the oxidation treatment solution, a "fine irregularity formed of a copper compound" containing copper oxide is provided on the surface of the copper foil by a wet method, and then the area ratio of the Cu(I) peak formed by the reduction treatment is 50% or more. "Micro-concave irregularities made of copper composite oxide." According to this, both sides of the copper foil can be simultaneously roughened. Therefore, when the wet method is used, the double-faced roughened copper foil suitable for the formation of the inner layer circuit of the multilayer printed wiring board can be easily obtained.

貼銅積層板之形態:本申請案之貼銅積層板之特徵係使 用具備上述粗化處理層之表面處理銅箔而得。此時之貼銅積層板若為使用本申請案之表面處理銅箔而得者,則關於所使用之絕緣樹脂基材之構成成分、厚度、貼合方法等並無特別限制。此外,此處所稱之貼銅積層板之概念中,包含硬質類、可撓類二者之概念者。 The form of the copper-clad laminate: the characteristics of the copper-clad laminate in this application are It is obtained by the surface-treated copper foil which has the said roughening process layer. In the case where the copper-clad laminate in this case is obtained by using the surface-treated copper foil of the present application, the constituent components, the thickness, the bonding method, and the like of the insulating resin substrate to be used are not particularly limited. In addition, the concept of the copper-clad laminate as referred to herein includes the concept of both hard and flexible.

[實施例1] [Example 1]

使用析出面之表面粗糙度(Rzjis)為0.2μm、光澤度 [Gs(60°)]為600之三井金屬鑛業股份有限公司製造之電解銅箔(厚度18μm)作為電解銅箔,且藉以下順序實施表面處理。 The surface roughness (Rzjis) of the precipitated surface was 0.2 μm, and the gloss was used. [Gs (60°)] was an electrolytic copper foil (thickness: 18 μm) manufactured by Mitsui Metals Co., Ltd., 600, and was subjected to surface treatment in the following order.

預處理:將該電解銅箔浸漬在氫氧化鈉水溶液中,進行 鹼脫脂處理,進行水洗。隨後,將結束該鹼脫脂處理之電解銅箔浸漬在過氧化氫濃度為1質量%、硫酸濃度為5質量%之硫酸系溶液中5分鐘後,進行水洗。 Pretreatment: the electrolytic copper foil is immersed in an aqueous sodium hydroxide solution Alkali degreasing treatment, washing with water. Subsequently, the electrolytic copper foil which had been subjected to the alkali degreasing treatment was immersed in a sulfuric acid-based solution having a hydrogen peroxide concentration of 1% by mass and a sulfuric acid concentration of 5% by mass for 5 minutes, and then washed with water.

氧化處理:將結束前述預處理之電解銅箔浸漬在液溫 70℃、pH=12、含亞氯酸濃度為150g/L,N-2-(胺基乙基)-3-胺基丙基三甲氧基矽烷濃度為10g/L之氫氧化鈉溶液中,浸漬特定之氧化處理時間(1分鐘、2分鐘、4分鐘、10分鐘),獲得於電解銅箔表面形成「由銅化合物所成之微細凹凸」之4種試料。 Oxidation treatment: immersing the above-mentioned pretreated electrolytic copper foil in liquid temperature 70 ° C, pH = 12, containing chlorous acid concentration of 150g / L, N-2-(aminoethyl)-3-aminopropyltrimethoxydecane concentration of 10g / L sodium hydroxide solution, Four kinds of samples having "fine irregularities made of a copper compound" formed on the surface of the electrodeposited copper foil were obtained by immersing the specific oxidation treatment time (1 minute, 2 minutes, 4 minutes, and 10 minutes).

還原處理:將結束氧化處理之4種試料浸漬於使用碳酸 鈉與氫氧化鈉調整成pH=12之二甲基胺硼烷濃度為20g/L之水溶液(室溫)中1分鐘,進行還原處理,經水洗、乾燥,獲得具備以「由銅複合化合物所成之微細凹凸」之粗化處理層之4種表面處理銅箔。 Reduction treatment: immersing four kinds of samples which have been subjected to oxidation treatment in the use of carbonic acid Sodium and sodium hydroxide were adjusted to a pH=12 dimethylamine borane concentration of 20 g/L in an aqueous solution (room temperature) for 1 minute, subjected to reduction treatment, washed with water, and dried to obtain "with copper composite compound". Four kinds of surface-treated copper foils of the roughened layer of the fine concavities and convexities.

於該實施例1中所得之表面處理銅箔之粗化處理層表面 之掃描型電子顯微鏡觀察像係如圖1所示者。而且,該粗化處理層之表面使用XPS進行狀態分析時,確認到存在有「Cu(I)」、「Cu(II)」及「-COO基」。另外,該實施例中所得之表面處理銅箔之Cu(I)波峰之佔有面積率、比表面積、亮度L*及撕離強度彙整示於下表1。 The surface of the roughened layer of the surface-treated copper foil obtained in Example 1 The scanning electron microscope observation image system is as shown in FIG. Further, when the surface of the roughened layer was subjected to state analysis using XPS, it was confirmed that "Cu(I)", "Cu(II)", and "-COO group" were present. Further, the area ratio, specific surface area, brightness L*, and tear strength of the Cu(I) peak of the surface-treated copper foil obtained in this example are shown in Table 1 below.

而且,本申請案中之撕離強度之測定係如下述般進行。 使用作為試料之表面處理銅箔與Panasonic股份有限公司製造之預浸體(R1551),且使用真空泵機,以加壓壓力為2.9MPa、溫度190℃、加壓時間90分鐘之條件貼合而製造貼銅積層板。接著,使用該貼銅積層板,以蝕刻法製造3mm寬之撕離強度測定用直線電路,且進行該3mm電路之撕離強度測定。又,說明書中,撕離強度之單位係使用「kgf/cm」,但由1kgf/cm=980N/m之關係,可容易地換算成「N/m」單位。 Further, the measurement of the tear strength in the present application was carried out as follows. A surface-treated copper foil as a sample and a prepreg (R1551) manufactured by Panasonic Co., Ltd. were used, and a vacuum pump was used to bond the pressure to a pressure of 2.9 MPa, a temperature of 190 ° C, and a press time of 90 minutes. Paste copper laminate. Next, using this copper-clad laminate, a linear circuit for measuring the tear strength of 3 mm width was produced by an etching method, and the tear strength of the 3 mm circuit was measured. Further, in the specification, the unit of the tear strength is "kgf/cm", but the relationship of 1 kgf/cm = 980 N/m can be easily converted into "N/m" unit.

[實施例2] [Embodiment 2]

使用與實施例1中所使用相同之電解銅箔,藉以下順序 實施表面處理。關於預處理及氧化處理(氧化處理時間:2分鐘)係與實施例1相同。而且,該實施例2中,為了觀察還原處理所使用之水溶液之pH及二甲基胺硼烷濃度之影響,故採用如下之還原處理。 The same electrolytic copper foil as used in Example 1 was used, in the following order Perform surface treatment. The pretreatment and oxidation treatment (oxidation treatment time: 2 minutes) were the same as in Example 1. Further, in Example 2, in order to observe the influence of the pH of the aqueous solution used for the reduction treatment and the concentration of dimethylamine borane, the following reduction treatment was employed.

還原處理:將結束氧化處理之電解銅箔浸漬於將使用碳 酸鈉與氫氧化鈉使成為pH=11、12、13三種水準,與二甲基胺硼烷濃度為5g/L、10g/L、20g/L三水準予以組合之9種各水溶液(室溫)中1分鐘,進行還原處理,並經水洗、乾燥,獲得本申請案之表面處理銅 箔。將還原處理所使用之水溶液在pH=11時所得之表面處理銅箔稱為「實施試料11-a、實施試料11-b、實施試料11-c」。將還原處理所使用之水溶液之pH=12時所得之表面處理銅箔稱為「實施試料12-a、實施試料12-b、實施試料12-c」。而且,將還原處理所使用之水溶液之pH=13時所得之表面處理銅箔稱為「實施試料13-a、實施試料13-b、實施試料13-c」。而且,顯示各實施試料時之「-a」之表示係還原處理所用之水溶液中之二甲基胺硼烷濃度為5g/L之情況。另外,「-b」之表示係還原處理所使用之水溶液中之二甲基胺硼烷濃度為10g/L之情況。「-c」之表示係還原處理所使用之水溶液中之二甲基胺硼烷濃度為20g/L之情況。 Reduction treatment: immersing the electrolytic copper foil which has been subjected to oxidation treatment in the carbon to be used 9 kinds of each aqueous solution (room temperature) which is combined with sodium hydroxide and sodium hydroxide to be three levels of pH=11, 12, and 13 and dimethylamine borane concentration of 5g/L, 10g/L, and 20g/L. 1 minute, subjected to reduction treatment, washed with water, dried to obtain surface treated copper of the present application Foil. The surface-treated copper foil obtained by the aqueous solution used for the reduction treatment at pH=11 is referred to as "the sample 11-a, the sample 11-b, and the sample 11-c". The surface-treated copper foil obtained when the pH of the aqueous solution used for the reduction treatment was 12 was referred to as "the sample 12-a, the sample 12-b, and the sample 12-c". In addition, the surface-treated copper foil obtained by the pH of the aqueous solution used for the reduction treatment is referred to as "the sample 13-a, the sample 13-b, and the sample 13-c". Further, "-a" at the time of carrying out each sample is shown to be a case where the concentration of dimethylamine borane in the aqueous solution used for the reduction treatment is 5 g/L. Further, "-b" indicates a case where the concentration of dimethylamine borane in the aqueous solution used for the reduction treatment is 10 g/L. "-c" indicates a case where the concentration of dimethylamine borane in the aqueous solution used for the reduction treatment is 20 g/L.

此實施例2中獲得之全部實施試料之表面處理銅箔之掃 描型電子顯微鏡觀察像係與圖1所示相同之狀態。而且,該各實施試料之處於粗化處理層之表面之「由銅復合化合物所成之微細凹凸」,使用XPS進行狀態分析時,確認到存在有「Cu(I)」、「Cu(II)」及「-COO基」。該實施例中所得之表面處理銅箔之Cu(I)波峰之佔有面積率、比表面積、亮度L*及撕離強度彙整示於下表2。 The surface-treated copper foil sweep of all the samples obtained in this Example 2 The image was observed in the same state as that shown in Fig. 1 by a scanning electron microscope. In addition, "the fine concavities and convexities formed by the copper composite compound" on the surface of the roughened layer of each of the samples were confirmed to have "Cu(I)" and "Cu(II) when analyzed by XPS. And "-COO base". The area ratio, specific surface area, brightness L*, and tear strength of the Cu(I) peaks of the surface-treated copper foil obtained in this example are shown in Table 2 below.

[比較例] [Comparative example]

比較例係使用與實施例相同之電解銅箔,實施與實施例 相同之預處理,進行黑化處理,再進行還原處理獲得比較試料。以下,針對黑化處理及還原處理加以說明。 The comparative example uses the same electrolytic copper foil as the embodiment, and the embodiment and the embodiment are used. The same pretreatment, blackening treatment, and then reduction treatment to obtain comparative samples. Hereinafter, the blackening process and the reduction process will be described.

黑化處理:將結束前述預處理之電解銅箔浸漬於羅門哈 斯電子材料股份有限公司製造之氧化處理液即含有10vol%之「PRO BOND 80A OXIDE SOLUTION」、20vol%之「PRO BOND 80B OXIDE SOLUTION」之液溫85℃之水溶液中5分鐘,於表面形成一般之黑化處理。 Blackening treatment: immersing the above-mentioned pretreated electrolytic copper foil in Rohmha The oxidation treatment liquid manufactured by Sis Electronic Materials Co., Ltd. contains 10 vol% of "PRO" BOND 80A OXIDE SOLUTION, 20 vol% of "PRO BOND 80B OXIDE SOLUTION" in an aqueous solution at 85 ° C for 5 minutes, forming a general blackening treatment on the surface.

還原處理:將結束氧化處理之電解銅箔浸漬於羅門哈斯 電子材料股份有限公司製造之還原處理液即含6.7vol%之「CIRCUPOSIT PB OXIDE CONVERTER 60C」、1.5vol%之「CUPOSIT Z」之液溫35℃之水溶液中5分鐘,並經水洗、乾燥,獲得圖4(b)所示之具備還原黑化處理表面之比較試料。 Reduction treatment: immersing the electrolytic copper foil which has been oxidized in Rohm and Haas The reduction treatment liquid manufactured by Electronic Materials Co., Ltd. contains 6.7 vol% of "CIRCUPOSIT PB OXIDE CONVERTER 60C" and 1.5 vol% of "CUPOSIT Z" in an aqueous solution at 35 ° C for 5 minutes, and is washed with water and dried to obtain A comparative sample having a reduced blackened surface shown in Fig. 4(b).

使用XPS進行該比較例所得之表面處理銅箔(比較試料) 之粗化處理層表面之狀態分析時,清楚地確認到存在有「Cu(0)」,雖亦確認到存在有「Cu(II)」及「Cu(I)」,但未確認到「-COO基」。該比較例中所得之表面處理銅箔之Cu(I)波峰之佔有面積率、比表面積、亮度L*及撕離強度彙整示於下表2。 Surface-treated copper foil obtained by this comparative example using XPS (comparative sample) In the state analysis of the surface of the roughened layer, it was confirmed that "Cu(0)" was present, and "Cu(II)" and "Cu(I)" were confirmed, but "-COO" was not confirmed. base". The area ratio, specific surface area, brightness L*, and tear strength of the Cu(I) peak of the surface-treated copper foil obtained in this comparative example are shown in Table 2 below.

[實施例與比較例之比較] [Comparison of Examples and Comparative Examples]

實施例1與比較例之比較:參考以下之表1,進行實施例1與比較例之比較。 Comparison of Example 1 and Comparative Example: A comparison of Example 1 with a comparative example was carried out with reference to Table 1 below.

由表1可理解,即使在1分鐘~10分鐘之間變動氧化處理 時間,由粗化處理層之表面所見之「由銅複合化合物所成之微細凹凸」之最大長度為100nm,粗化處理表面之狀態分析之檢測內容也無變化。相對於此,比較例之情況之凹凸最大長度為500nm較實施例大了5倍左右。亦即,可知本申請案之表面處理銅箔之「由銅複合化合物所成之微細凹凸」相較於過去之黑化處理係極微細。 It can be understood from Table 1 that the oxidation treatment is changed even between 1 minute and 10 minutes. The maximum length of the "fine concavities and convexities formed by the copper composite compound" as seen from the surface of the roughened layer was 100 nm, and the detection contents of the state analysis of the roughened surface did not change. On the other hand, in the case of the comparative example, the maximum length of the concavities and convexities was 500 nm, which was about 5 times larger than that of the examples. That is, it can be seen that the "fine irregularities formed of the copper composite compound" of the surface-treated copper foil of the present application is extremely finer than the conventional blackening treatment.

接著,觀察比表面積時,相較於實施例1,比較例者顯 示較大之值。然而,將該等表面處理銅箔貼合於絕緣樹脂基材上,測定撕離強度時,實施例之撕離強度為0.63kgf/cm~0.78kgf/cm。即使是最短的氧化處理時間,仍可獲得實用上足夠之撕離強度,獲得與比表面積之值成比例之撕離強度。相對於此,具有比實施例1高之比表面積的比較例之撕離強度變低而為0.33kgf/cm。通常,比表面積之值愈高,撕離強度也愈高,但此處卻相反。此認為係比較例中之黑化處理之凹凸強度劣化所致。關於此,將在後述之「實施例2與比較例之比較」中詳細進行描述。且,僅觀看實施例1時,隨著氧化處理時間之增加,比表面積亦成比例地變大。亦即,該實施例1中採用之氧化處理時間可判斷為適當。再者,關於實施例1之粗化表面處理之亮度L*之值亦顯示偏差極少之值而為18~20。 Next, when the specific surface area was observed, compared with Example 1, the comparative example showed Show a larger value. However, when the surface-treated copper foil was bonded to an insulating resin substrate, and the peel strength was measured, the tear strength of the example was 0.63 kgf/cm to 0.78 kgf/cm. Even with the shortest oxidation treatment time, a practically sufficient tear strength can be obtained to obtain a tear strength which is proportional to the value of the specific surface area. On the other hand, in the comparative example having the specific surface area higher than that of Example 1, the tear strength was lowered to 0.33 kgf/cm. Generally, the higher the value of the specific surface area, the higher the tear strength, but the opposite is true here. This is considered to be caused by deterioration of the unevenness of the blackening treatment in the comparative example. This will be described in detail in "Comparison of Example 2 and Comparative Example" which will be described later. Further, when only Example 1 was observed, the specific surface area also became proportionally larger as the oxidation treatment time was increased. That is, the oxidation treatment time employed in the embodiment 1 can be judged to be appropriate. Further, the value of the brightness L* of the roughened surface treatment of Example 1 also showed a value which was extremely small and was 18 to 20.

再者,圖2係用於顯示觀察以實施例1之氧化處理之浸漬 時間2分鐘之條件獲得之表面處理銅箔之電極面側與析出面側之粗化形態之掃描型電子顯微鏡觀察像。由該圖2,巨觀上可知經粗化後仍維持了粗化前之電解銅箔之電極面側及析出面側之表面形狀,且沿著其粗化前之表面形狀形成有「由銅複合化合物所成之微細凹凸」。據此,可知本申請案之表面處理銅箔之情況下,維持了以「由銅複合化合物所成之微細凹凸」予以粗化前之巨觀的銅箔表面形狀,且以沿著其表面形狀之形態進行粗化。 Further, Fig. 2 is for showing the impregnation observed by the oxidation treatment of Example 1. A scanning electron microscope observation image of the roughened form of the electrode surface side and the deposition surface side of the surface-treated copper foil obtained under the conditions of 2 minutes. 2, the surface shape of the electrode surface side and the deposition surface side of the electrodeposited copper foil before roughening is maintained after the roughening, and the surface shape before the roughening is formed by "copper" Fine concavities and convexities formed by the composite compound." According to this, it is understood that in the case of the surface-treated copper foil of the present application, the surface shape of the copper foil before the roughening of the "fine irregularities made of the copper composite compound" is maintained, and along the surface shape thereof The form is roughened.

實施例2與比較例之比較:參考以下之表2進行實施例2與比較例之比較。 Comparison of Example 2 with Comparative Example: Comparison of Example 2 with Comparative Example was carried out with reference to Table 2 below.

表2中,著眼於Cu(I)波峰之佔有面積率,觀察還原處理 所使用之水溶液在pH=11時所得之表面處理銅箔(實施試料11-a、實施試料11-b、實施試料11-c),與還原處理所使用之水溶液在pH=12時所得之表面處理銅箔(實施試料12-a、實施試料12-b、實施試料12-c),及還原處理所使用之水溶液在pH=13時所得之表面處理銅箔(實施試料13-a、實施試料13-b、實施試料13-c)時,Cu(I)波峰之佔有面積率為59%~99%之範圍。相對於此,比較試料之Cu(I)波峰之佔有面積率亦為85%。因此,關於Cu(I)波峰之佔有面積率,可知實施例與比較例並無差異,但觀察以上述之XPS進行之狀態分析時,檢出之成分有差異。 In Table 2, focusing on the area ratio of Cu(I) peaks, observation reduction treatment The surface-treated copper foil obtained by using the aqueous solution at pH=11 (sample 11-a, sample 11-b, sample 11-c), and the surface of the aqueous solution used for the reduction treatment at pH=12 The copper foil (the sample 12-a, the sample 12-b, the sample 12-c), and the surface-treated copper foil obtained by the aqueous solution used for the reduction treatment at pH=13 (sample 13-a, sample was carried out) 13-b. When the sample 13-c) was carried out, the occupied area ratio of the Cu(I) peak was in the range of 59% to 99%. On the other hand, the occupied area ratio of the Cu(I) peak of the comparative sample was also 85%. Therefore, regarding the occupied area ratio of the Cu(I) peak, it is understood that the examples and the comparative examples are not different, but when the state analysis by the above XPS is observed, the components detected are different.

此處,以電子顯微鏡觀察像比較實施試料與比較試料之 粗化狀態。觀察圖2時,可理解實施試料之粗化狀態。而且,觀察圖3時,可理解實施試料之粗化處理層之剖面狀態。相對於此,比較例中剛經黑化處理後之圖4(a)中所示之粗化狀態之電子顯微鏡觀察像可看見長的、粗的針狀形狀,黑化處理之前端部尖銳。而且,以該針狀形狀形成之粗化處理層之厚度為500nm~700nm。然而,進行還原處理後進行還原黑化處理時,如圖4(b)所示凹凸之前端部變圓,可理解藉由還原處理使粗化形狀大幅變化。 Here, the observation sample and the comparative sample are compared by an electron microscope observation image. Rough state. When FIG. 2 is observed, it can be understood that the roughened state of the sample is carried out. Further, when FIG. 3 is observed, the cross-sectional state of the roughened layer of the sample can be understood. On the other hand, in the comparative example, the electron microscope observation image of the roughened state shown in Fig. 4 (a) immediately after the blackening treatment showed a long, thick needle-like shape, and the end portion was sharp before the blackening treatment. Further, the thickness of the roughened layer formed in the needle shape is 500 nm to 700 nm. However, when the reduction blackening treatment is performed after the reduction treatment, the end portion before the unevenness is rounded as shown in FIG. 4(b), and it can be understood that the roughened shape is largely changed by the reduction treatment.

再者,圖5(a)中顯示比較例中剛經黑化處理後之粗化處 理層之剖面。而且,圖5(b)中顯示進行還原處理後進行還原黑化處理後之剖面。由該圖5可知,由於還原處理使還原前之凹凸形狀受到相當大的損傷。亦即,可知以氧化處理形成之針狀形狀因還原處理而變 細、微細地斷裂。相對於此,實施例之「由複合化合物所成之微細凹凸」之粗化形狀如由圖3之剖面所可理解,即使進行還原處理,亦未受到任何損傷。據此,相較於實施試料,比較試料之還原處理後之凹凸非常脆,可預測會發生所謂落粉之問題。 Furthermore, FIG. 5(a) shows the roughening after the blackening treatment in the comparative example. The profile of the layer. Further, Fig. 5(b) shows a cross section after the reduction blackening treatment after the reduction treatment. As is apparent from Fig. 5, the reduction treatment causes considerable damage to the uneven shape before reduction. That is, it can be seen that the needle shape formed by the oxidation treatment is changed by the reduction treatment. Fine and fine breakage. On the other hand, the roughened shape of the "fine concavities and convexities formed by the composite compound" in the examples can be understood from the cross section of Fig. 3, and even if the reduction treatment is carried out, no damage is caused. Accordingly, compared with the sample to be tested, the unevenness of the comparative sample after the reduction treatment is very brittle, and it is predicted that the problem of so-called falling powder may occur.

因此,對實施例2與比較例中獲得之表面處理銅箔之撕 離強度進行比較。其結果,實施試料之撕離強度為0.70kgf/cm~0.81kgf/cm。相對於此,比較試料之撕離強度為0.33kgf/cm,比實施試料低。 Therefore, the tearing of the surface-treated copper foil obtained in Example 2 and the comparative example Compare the intensity. As a result, the tear strength of the sample to be tested was 0.70 kgf/cm to 0.81 kgf/cm. On the other hand, the peeling strength of the comparative sample was 0.33 kgf/cm, which was lower than that of the sample.

[產業上之可利用性] [Industrial availability]

以上所示之本申請案之表面處理銅箔係以「最大長度為 500nm以下之由銅複合化合物所成之微細凹凸」予以粗化者,若與無粗化銅箔相對於絕緣樹脂基材之密著性進行比較,則可確保與絕緣樹脂基材之良好密著性。而且,本申請案之表面處理銅箔之「最大長度為50 0nm以下之由銅複合化合物所成之微細凹凸由於極為微細」,故蝕刻加工時,認為僅設極短時間之過度蝕刻時間即可完成,且可期待形成具備良好蝕刻因子之微細電路。據此,可有用地使用於全部之印刷配線板製品中。此外,如上述,本申請案之表面處理銅箔亦可為於銅箔之兩面實施粗化之形態,且可成為適於多層印刷配線板之內層電路形成之兩面粗化處理銅箔。 The surface treated copper foil of the present application shown above is "maximum length" When the fine concavities and convexities formed by the copper composite compound of 500 nm or less are coarsened, if the adhesion of the non-roughened copper foil to the insulating resin substrate is compared, the adhesion to the insulating resin substrate can be ensured. Sex. Further, in the surface-treated copper foil of the present application, "the fine concavities and convexities formed by the copper composite compound having a maximum length of 50 nm or less are extremely fine", so that it is considered that only an extremely long etching time can be provided in the etching process. This is accomplished, and it is expected to form a fine circuit having a good etching factor. Accordingly, it can be usefully used in all printed wiring board products. Further, as described above, the surface-treated copper foil of the present application may be in the form of being roughened on both sides of the copper foil, and may be a double-faced roughened copper foil suitable for forming an inner layer circuit of the multilayer printed wiring board.

Claims (7)

一種表面處理銅箔,其特徵係銅箔之表面經粗化之表面處理銅箔,其中於該銅箔之表面具備,於剖面中自銅箔表面延伸、由含有氧化銅及氧化亞銅之銅複合化合物所成、最大長度為350nm以下之針狀或板狀之微細凹凸所形成之粗化處理層,該由含有氧化銅及氧化亞銅之銅複合化合物所成之針狀或板狀之微細凹凸係,將使用XPS分析時之CU(I)及Cu(II)之各波峰面積之合計面積設為100%時,Cu(I)波峰之佔有面積率為50%以上99%以下。 A surface-treated copper foil characterized by a surface-treated copper foil having a roughened surface on a surface of the copper foil, which is provided on the surface of the copper foil and extends from the surface of the copper foil in a cross section, and is made of copper containing copper oxide and cuprous oxide. a roughened layer formed by a composite compound and having a needle-like or plate-like fine unevenness having a maximum length of 350 nm or less, and a needle-like or plate-like fine layer formed of a copper composite compound containing copper oxide and cuprous oxide. In the unevenness system, when the total area of each of the peak areas of CU (I) and Cu (II) in the XPS analysis is 100%, the occupied area ratio of the Cu (I) peak is 50% or more and 99% or less. 如請求項1之表面處理銅箔,其中前述由含有氧化銅及氧化亞銅之銅複合化合物所成之針狀或板狀之微細凹凸在利用XPS分析時,確認存在-COO基。 The surface-treated copper foil according to claim 1, wherein the acicular or plate-like fine concavities and convexities formed by the copper composite compound containing copper oxide and cuprous oxide are confirmed to have a -COO group by XPS analysis. 如請求項2之表面處理銅箔,其中前述含有氧化銅及氧化亞銅之銅複合化合物含有碳酸銅。 The surface-treated copper foil according to claim 2, wherein the copper composite compound containing copper oxide and cuprous oxide contains copper carbonate. 如請求項1至3項中任一項之表面處理銅箔,其中使用掃描型電子顯微鏡,以試料之傾斜角45°、50000倍以上之倍率自粗化處理層之表面觀察前述由銅複合化合物所成之針狀或板狀之微細凹凸時之最大長度為150nm以下。 The surface-treated copper foil according to any one of claims 1 to 3, wherein the copper composite compound is observed from the surface of the roughened layer by a scanning electron microscope at a magnification of 45° or more of 50,000 times or more of the sample. The maximum length of the fine needle-like or plate-like fine irregularities is 150 nm or less. 如請求項1至3項中任一項之表面處理銅箔,其中前述由銅複合化合物所成之針狀或板狀之微細凹凸之吸附氪(krypton)所測定之比表面積為0.035m2/g以上。 The surface-treated copper foil according to any one of claims 1 to 3, wherein the specific surface area measured by the krypton of the needle-like or plate-like fine irregularities formed by the copper composite compound is 0.035 m 2 / g or more. 如請求項1至3項中任一項之表面處理銅箔,其中前述粗化處理層之表面具備L*a*b*表色系之亮度L*為25以下。 The surface-treated copper foil according to any one of claims 1 to 3, wherein the roughened layer has a surface having a L*a*b* color system having a luminance L* of 25 or less. 一種貼銅積層板,其特徵係使用如請求項1至6項中任一項之表 面處理銅箔所得者。 A copper-clad laminate, characterized by using a table as claimed in any one of claims 1 to 6. The surface of the copper foil is obtained.
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