TWI589433B - Copper foil with carrier foil, copper clad laminate, and printed circuit board - Google Patents

Copper foil with carrier foil, copper clad laminate, and printed circuit board Download PDF

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Publication number
TWI589433B
TWI589433B TW104109496A TW104109496A TWI589433B TW I589433 B TWI589433 B TW I589433B TW 104109496 A TW104109496 A TW 104109496A TW 104109496 A TW104109496 A TW 104109496A TW I589433 B TWI589433 B TW I589433B
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Taiwan
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copper
layer
foil
carrier foil
copper foil
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TW104109496A
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Chinese (zh)
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TW201605611A (en
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Hiroaki Tsuyoshi
Makoto Hosokawa
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Mitsui Mining & Smelting Co
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/18Working by laser beam, e.g. welding, cutting or boring using absorbing layers on the workpiece, e.g. for marking or protecting purposes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • B23K26/389Removing material by boring or cutting by boring of fluid openings, e.g. nozzles, jets
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/06Interconnection of layers permitting easy separation
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates
    • H05K3/025Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates by transfer of thin metal foil formed on a temporary carrier, e.g. peel-apart copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/385Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by conversion of the surface of the metal, e.g. by oxidation, whether or not followed by reaction or removal of the converted layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4652Adding a circuit layer by laminating a metal foil or a preformed metal foil pattern
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • B23K2101/40Semiconductor devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/16Composite materials, e.g. fibre reinforced
    • B23K2103/166Multilayered materials
    • B23K2103/172Multilayered materials wherein at least one of the layers is non-metallic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/50Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/70Other properties
    • B32B2307/748Releasability
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • C25D7/0614Strips or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0315Oxidising metal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/0026Etching of the substrate by chemical or physical means by laser ablation
    • H05K3/0032Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
    • H05K3/0035Etching of the substrate by chemical or physical means by laser ablation of organic insulating material of blind holes, i.e. having a metal layer at the bottom

Description

具備載子箔之銅箔、覆銅層積板以及印刷電路板 Copper foil with carrier foil, copper clad laminate, and printed circuit board

本申請案係關於一種具備載子箔之銅箔、覆銅層積板以及印刷電路板。 The present application relates to a copper foil, a copper clad laminate, and a printed circuit board having a carrier foil.

隨著近年來之行動電話、移動式工具、筆記型個人電腦PC等之輕量化.小型化之流行而即使是關於組裝在這些電子機器之印刷電路板,也要求相同之輕薄短小及高密度構裝化。為了應付對於此種印刷電路板之輕薄短小化及高密度構裝化,因此,使用多層印刷電路板。 With the recent years of mobile phones, mobile tools, notebook PCs and other lightweight. The popularity of miniaturization requires even the same thin, short, and high-density packaging for printed circuit boards assembled on these electronic devices. In order to cope with the thinness and high density of such a printed circuit board, a multilayer printed circuit board is used.

多層印刷電路板係具備複數個之導體層,藉由通孔(through hole)等之層間導通手段而呈電氣地連接各導體層間。此外,在近年來,為了應付更進一步之高密度構裝化及微細配線化,因此,使用導通孔(via hole),來作為層間導通手段而取代通孔。相對於一般藉由鑽孔加工而形成通孔,藉由雷射加工而形成導通孔,因此,在比較於通孔時,導通孔係直徑小於通孔,在進行高密度構裝之方面,變得有利。作為層間導通手段之導通孔係知道例如盲導通孔(BVH)、間質型導通孔(IVH)、堆疊型導通孔等之各種形態。 The multilayer printed circuit board has a plurality of conductor layers which are electrically connected between the conductor layers by interlayer conduction means such as through holes. Further, in recent years, in order to cope with further high-density mounting and fine wiring, a via hole is used as an interlayer conduction means instead of a via. The through hole is formed by drilling in general, and the via hole is formed by laser processing. Therefore, when compared with the through hole, the diameter of the via hole is smaller than that of the through hole, and the high density structure is changed. It is beneficial. As the via hole of the interlayer conduction means, various forms such as a blind via (BVH), a mesoporous via (IVH), and a stacked via are known.

為了形成導通孔,因此,必須在由銅箔等而組成之導體層,來照射雷射光。銅箔係一般為鏡面,反射雷射光, 因此,不容易進行雷射鑽孔加工。所以,要求雷射光照射面係具備良好之雷射鑽孔加工性能。此外,在雷射鑽孔加工時,發生在開口部之周圍來附著飛散之滴疤之濺疤現象。在引起濺疤現象時,在開口部之周圍,附著滴疤之部分係成為突起狀。因此,在鑽孔加工後而進行銅電鍍層之形成時,在成為突起狀之該部位,引起電鍍層之異常析出,發生無法形成要求之電路等之不良。因此,在藉由雷射加工而形成導通孔之際,必須防止由於該濺疤現象而造成之滴疤之附著。 In order to form the via holes, it is necessary to irradiate the laser light in a conductor layer composed of a copper foil or the like. Copper foil is generally mirrored and reflects laser light. Therefore, it is not easy to perform laser drilling. Therefore, the laser light irradiation surface is required to have good laser drilling performance. In addition, during laser drilling, the phenomenon of splashing of the scattered dripping occurs around the opening. When the splashing phenomenon occurs, the portion to which the drip adheres is formed around the opening. Therefore, when the copper plating layer is formed after the drilling process, the plating layer is abnormally precipitated in the portion where the projection is formed, and the failure of the required circuit or the like occurs. Therefore, when the via hole is formed by laser processing, it is necessary to prevent the adhesion of the drip caused by the splash phenomenon.

作為考慮濺疤現象之技術係在專利文獻1,揭示:「一種雙面印刷電路板或3層以上之多層印刷電路板之製造方法,係需要通孔或導通孔等之層間導通銅電鍍之雙面印刷電路板或3層以上之多層印刷電路板之製造方法,其特徵為:在位處於前述印刷電路板外層之銅箔,使用可剝離型式之具備載子箔之銅箔,無剝離載子箔,進行通孔用貫通孔或導通孔用孔部之必要之加工處理,進行通孔用貫通孔或導通孔用孔部之除膠渣處理,進行用以確保通孔用貫通孔或導通孔用孔部之電導通之層間導通銅電鍍,然後,剝離載子箔,在位處於外層之銅箔,進行外層電路圖案之阻劑化,進行蝕刻處理。」。 As a technique for considering the phenomenon of splashing, Patent Document 1 discloses that "a double-sided printed circuit board or a method of manufacturing a multilayer printed circuit board of three or more layers requires a double-layer copper plating plating such as a via hole or a via hole. A method for manufacturing a surface printed circuit board or a multilayer printed circuit board of three or more layers, characterized in that a copper foil with a carrier foil in a peelable type is used in a copper foil located on the outer layer of the printed circuit board, and no peeling carrier is used. The foil is subjected to a necessary processing for the through hole for the through hole or the hole for the via hole, and the desiccant for the through hole for the through hole or the hole for the via hole is treated to ensure the through hole or the via hole for the through hole. The interlayer conduction copper plating is performed by electrically conducting the holes, and then the carrier foil is peeled off, and the copper foil in the outer layer is placed, and the outer layer circuit pattern is resisted and etched.

正如該專利文獻1所揭示的,如果是在除去載子箔之前而進行雷射鑽孔加工然後除去載子箔的話,則能夠一起除去載子箔和附著於開口部周邊之滴疤。 As disclosed in Patent Document 1, if the laser drilling process is performed before the carrier foil is removed and then the carrier foil is removed, the carrier foil and the drip attached to the periphery of the opening can be removed together.

【先前技術文獻】 [Previous Technical Literature] 【專利文獻】 [Patent Literature]

【專利文獻1】WO00/69238號公報 [Patent Document 1] WO00/69238

但是,正如前述之專利文獻1,在企圖使用二氧化碳氣體雷射而由位處於多層積層板之外層之具備載子箔之銅箔之載子箔表面開始來進行雷射鑽孔加工之時,有越是增加載子箔之厚度而越是降低雷射鑽孔加工性能,無法得到具備作為目標之開口直徑之導通孔之傾向發生。 However, as in the aforementioned Patent Document 1, when laser drilling is performed by using a carbon dioxide gas laser and the surface of the carrier foil of the copper foil having the carrier foil located on the outer layer of the multilayer laminated board is used, there is The more the thickness of the carrier foil is increased, the more the laser drilling performance is lowered, and the tendency to obtain the via hole having the target opening diameter cannot be obtained.

因此,正如專利文獻1,要求在使用二氧化碳氣體雷射而由位處於多層積層板之外層之具備載子箔之銅箔之載子箔表面開始來進行鑽孔加工之狀態下之雷射鑽孔加工性能呈良好之材料。 Therefore, as in Patent Document 1, it is required to perform laser drilling in a state where drilling is performed by using a carbon dioxide gas laser and starting from a surface of a carrier foil of a copper foil having a carrier foil on the outer layer of a multi-layer laminate. A material with good processing properties.

於是,本案發明人們係全心地進行研究,結果發現:在使用以下敘述之具備載子箔之銅箔時,可以進行良好之雷射鑽孔加工。在以下,敘述本申請案之發明概要。 Then, the inventors of the present invention conducted a thorough study, and found that a good laser drilling process can be performed when the copper foil with a carrier foil described below is used. In the following, an outline of the invention of the present application will be described.

<具備載子箔之銅箔> <copper foil with carrier foil>

本申請案之具備載子箔之銅箔,係具備載子箔/剝離層/整體銅層之層構造之具備載子箔之銅箔,其特徵為:在該具備載子箔之銅箔之兩面,將具有藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層予以具備,具備於該載子箔表面之粗化處理層係使用作為雷射光吸收層,具備於該整體銅層表面之粗化處理層係使用作為粗化處理層和絕緣層構造材料之 間之接合層。 The copper foil with a carrier foil of the present application is a copper foil provided with a carrier foil having a layer structure of a carrier foil/release layer/whole copper layer, and is characterized in that the copper foil provided with the carrier foil A roughened layer having a fine concavo-convex structure formed of a needle-like or plate-like convex portion composed of a copper composite compound and having a maximum length of 500 nm or less is provided on both surfaces, and is provided on the surface of the carrier foil. The roughening treatment layer is used as a laser light absorbing layer, and the roughening treatment layer provided on the surface of the entire copper layer is used as a roughening treatment layer and an insulating layer construction material. Interlayer.

<覆銅層積板> <Covered copper laminate>

本申請案之覆銅層積板,其特徵為:將本申請案之具備載子箔之銅箔之前述整體銅層之前述接合層側,層積於絕緣層構造材料之至少單面。 The copper-clad laminate of the present application is characterized in that the bonding layer side of the entire copper layer of the copper foil with a carrier foil of the present application is laminated on at least one side of the insulating layer structural material.

<印刷電路板> <Printed Circuit Board>

本申請案之印刷電路板,其特徵為:使用本申請案之具備載子箔之銅箔之前述整體銅層而形成。 The printed circuit board of the present application is characterized in that the entire copper layer of the copper foil with a carrier foil of the present application is used.

本申請案之具備載子箔之銅箔係在該具備載子箔之銅箔之兩面,將具有藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層予以具備。接著,具備於該載子箔表面之粗化處理層係使用作為雷射光吸收層,具備於整體銅層表面之粗化處理層係使用作為粗化處理層和絕緣層構造材料之間之接合層。如果具備於該整體銅層表面之粗化處理層來接合於絕緣層構造材料而成為接合層的話,則得到一種具備載子箔之覆銅層積板,係將具有藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層予以具備。如果是使用該具備載子箔之覆銅層積板的話,則可以得到絕緣層構造材料和整體銅層之間之良好之密合性。此外,具備於載子箔表面之粗化處理層係吸收雷射光,因此,可以使用雷射而對於載子箔和整體銅層,同時進行鑽孔。接著,可以藉由在鑽孔後,剝離及除去載子箔,而將存在 於藉由雷射鑽孔加工之所形成之孔洞之開口部周圍之濺疤和載子箔,一起除去,露出潔淨之整體銅層。因此,本申請案之具備載子箔之銅箔係可以適合使用在藉由增層法、無芯增層法而製造多層印刷電路板之際。如果是使用該具備載子箔之銅箔的話,則可以提供一種高品質之印刷電路板,係銅箔和絕緣層構造材料之間之密合性呈良好,並且,排除起因存在於藉著雷射鑽孔加工之所形成之孔洞之開口部周圍之濺疤而引起之不良。 The copper foil with a carrier foil of the present application has a needle-like or plate-like convex portion composed of a copper composite compound and having a maximum length of 500 nm or less on both surfaces of the copper foil provided with the carrier foil. The roughened layer of the fine concavo-convex structure formed is provided. Next, the roughened layer provided on the surface of the carrier foil is used as a laser light absorbing layer, and the roughened layer provided on the surface of the entire copper layer is used as a bonding layer between the roughened layer and the insulating layer material. . When the roughened layer provided on the surface of the entire copper layer is bonded to the insulating layer structural material to form a bonding layer, a copper-clad laminate having a carrier foil is obtained, which is obtained by a copper composite compound. A roughened layer of a fine concavo-convex structure formed by forming a needle-like or plate-like convex portion having a maximum length of 500 nm or less is provided. If the copper clad laminate having the carrier foil is used, good adhesion between the insulating layer structural material and the entire copper layer can be obtained. Further, since the roughened layer provided on the surface of the carrier foil absorbs the laser light, the carrier foil and the entire copper layer can be drilled simultaneously using a laser. Then, it can be present by peeling off and removing the carrier foil after drilling. The splash and carrier foil around the opening of the hole formed by the laser drilling process are removed together to expose the clean overall copper layer. Therefore, the copper foil with a carrier foil of the present application can be suitably used when a multilayer printed wiring board is produced by a build-up method or a coreless build-up method. If the copper foil with the carrier foil is used, it is possible to provide a high-quality printed circuit board in which the adhesion between the copper foil and the insulating layer construction material is good, and the cause of the exclusion exists in the mine. It is caused by splashing around the opening of the hole formed by the drilling process.

1‧‧‧(具備載子箔)之覆銅層積板 1‧‧‧ (with carrier foil) copper clad laminate

2‧‧‧銅箔 2‧‧‧ copper foil

3‧‧‧電極面側之粗化處理面 3‧‧‧The roughening surface of the electrode side

4‧‧‧析出面側之粗化處理面 4‧‧‧The roughening surface of the surface

5‧‧‧絕緣層構造材料 5‧‧‧Insulation structural materials

8‧‧‧內層電路 8‧‧‧ Inner layer circuit

9‧‧‧內層基板 9‧‧‧ Inner substrate

10‧‧‧場導通孔(導通孔) 10‧‧‧ Field vias (vias)

11‧‧‧具備載子箔之銅箔 11‧‧‧ Copper foil with carrier foil

12‧‧‧載子箔 12‧‧‧Side foil

13‧‧‧剝離層 13‧‧‧ peeling layer

14‧‧‧整體銅層 14‧‧‧Overall copper layer

23‧‧‧第1增層配線電路 23‧‧‧1st build-up wiring circuit

24‧‧‧電鍍層 24‧‧‧Electroplating

31‧‧‧第1增層配線層 31‧‧‧1st build-up wiring layer

32‧‧‧第2增層配線層 32‧‧‧2nd build-up wiring layer

40‧‧‧具備載子箔之第1增層積層體 40‧‧‧The first buildup layer with carrier foil

41‧‧‧具備第1增層之層積體 41‧‧‧The first layered layered body

42‧‧‧具備第1增層配線層之層積體 42‧‧‧Layer with the first build-up wiring layer

43‧‧‧具備載子箔之第2增層積層體 43‧‧‧Second buildup layer with carrier foil

圖1係用以顯示本申請案之具備載子箔之覆銅層積板之基本層構造之剖面示意圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing the basic layer structure of a copper-clad laminate having a carrier foil of the present application.

圖2係用以在本申請案之具備載子箔之銅箔而說明粗化處理層之形態之掃描型電子顯微鏡之觀察圖像。 Fig. 2 is an observation image of a scanning electron microscope for explaining a form of a roughened layer in the copper foil with a carrier foil of the present application.

圖3係在適用本申請案之雷射鑽孔加工法之際而顯示雷射光照射於其表面之粗化處理層剖面之掃描型電子顯微鏡之觀察圖像。 Fig. 3 is an observation image of a scanning electron microscope showing a cross section of a roughened layer irradiated with laser light on the surface of the laser drilling method of the present application.

圖4係用以顯示在使用雷射光而形成盲導通孔之際之雷射鑽孔加工之圖像之剖面示意圖。 4 is a schematic cross-sectional view showing an image of a laser drilling process at the time of forming a blind via hole using laser light.

圖5係用以顯示在增層法而用以顯示製造多層印刷電路板之製程之製造流程之剖面示意圖。 Figure 5 is a schematic cross-sectional view showing the manufacturing process for the process of manufacturing a multilayer printed circuit board in the build-up method.

圖6係用以顯示在增層法而用以顯示製造多層印刷電路板之製程之製造流程之剖面示意圖。 Figure 6 is a schematic cross-sectional view showing the manufacturing process for the process of manufacturing a multilayer printed circuit board in the build-up method.

圖7係用以顯示在增層法而用以顯示製造多層印刷電路板 之製程之製造流程之剖面示意圖。 Figure 7 is used to display the layering method for displaying a multilayer printed circuit board A schematic cross-sectional view of the manufacturing process of the process.

圖8係使用在實施例1來得到之雷射鑽孔加工用之具備載子箔之銅箔而得到之電路幅寬8μm/電路間縫隙幅寬8μm之直線電路之掃描型電子顯微鏡之觀察圖像。 Fig. 8 is a scanning electron microscope observation of a linear circuit having a circuit width of 8 μm/inter-slice gap width of 8 μm obtained by using a copper foil of a carrier foil for laser drilling processing obtained in Example 1. image.

在以下,關於本申請案之「覆銅層積板之形態」以及「印刷電路板之形態」而進行說明。此外,在「覆銅層積板之形態」,一併說明本申請案之「具備載子箔之銅箔之形態」。 Hereinafter, the "formation of a copper clad laminate" and "a form of a printed circuit board" in the present application will be described. In addition, in the "form of copper-clad laminate", the "form of copper foil with carrier foil" in the present application will be described.

<覆銅層積板之形態> <Form of copper clad laminate>

1.覆銅層積板之層構造之概念 1. The concept of layer construction of copper clad laminate

本申請案之覆銅層積板係具備例如圖1所示之層構造。本申請案之覆銅層積板係本申請案之具備載子箔之銅箔11層積於絕緣層構造材料5之至少單面,在圖1(1-A),顯示在絕緣層構造材料5之兩面來分別層積本申請案之具備載子箔之銅箔11之例子,在圖1(1-B),顯示在絕緣層構造材料5之單面來層積本申請案之具備載子箔之銅箔11之例子。此外,在圖1(1-B)所示之例子,在絕緣層構造材料5之其他面側,層積其他之銅箔2。但是,圖1所示之覆銅層積板1係僅是本申請案之覆銅層積板之一例,本申請案之發明係不過是限定於圖1所示之層構造之解釋。 The copper clad laminate of the present application has, for example, a layer structure as shown in Fig. 1 . The copper-clad laminate of the present application is a laminate of a copper foil 11 having a carrier foil of the present application laminated on at least one side of the insulating layer structural material 5, and is shown in FIG. 1 (1-A). An example of the copper foil 11 with a carrier foil of the present application is laminated on both sides of the fifth embodiment. In Fig. 1 (1-B), the one side of the insulating layer structural material 5 is shown to be laminated. An example of a copper foil 11 of a sub-foil. Further, in the example shown in Fig. 1 (1-B), the other copper foil 2 is laminated on the other surface side of the insulating layer structural material 5. However, the copper clad laminate 1 shown in Fig. 1 is only an example of the copper clad laminate of the present application, and the invention of the present application is merely an explanation limited to the layer structure shown in Fig. 1.

1-1.具備載子箔之銅箔 1-1. Copper foil with carrier foil

首先,關於本申請案之具備載子箔之銅箔而進行敘述。本申請案之具備載子箔之銅箔,其特徵為:正如圖1所 示,具備「載子箔12/剝離層13/整體銅層14」之層構造,在該具備載子箔之銅箔之兩面,具備「具有藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層」4,具備於該載子箔12表面之粗化處理層4係使用作為雷射光吸收層,具備於該整體銅層14表面之粗化處理層4係使用作為粗化處理層和絕緣層構造材料之間之接合層。此外,所謂具備載子箔之銅箔之兩面係指相反於面對著載子箔之剝離層13之側之相反側之表面(以下之載子箔之外表面)以及相反於面對著整體銅層14之剝離層13之側之相反側之表面(以下之整體銅層之外表面)。如果是使用該具備載子箔之銅箔而製造覆銅層積板的話,則可以藉由整體銅層側之粗化處理層而得到粗化處理層和絕緣層構造材料之間之良好之密合性,可以藉由載子箔側之粗化處理層而得到雷射鑽孔加工性能呈良好之覆銅層積板。在以下,敘述各構成要素之每一個。 First, the copper foil with a carrier foil of this application is described. The copper foil with carrier foil of the present application is characterized as follows: The layer structure of the "carrier foil 12 / release layer 13 / the entire copper layer 14" is provided, and both sides of the copper foil provided with the carrier foil have "having a composition of a copper composite compound and a maximum length of 500 nm. The roughened layer 4 of the fine concavo-convex structure formed by the convex portion of the needle-like or plate-like shape is provided on the roughened layer 4 on the surface of the carrier foil 12 as a laser light absorbing layer. The roughened layer 4 on the surface of the entire copper layer 14 is used as a bonding layer between the roughened layer and the insulating layer material. Further, the two sides of the copper foil having the carrier foil refer to the surface opposite to the side facing the peeling layer 13 of the carrier foil (the outer surface of the carrier foil below) and the opposite to the entire surface. The surface on the opposite side of the side of the peeling layer 13 of the copper layer 14 (the outer surface of the entire copper layer below). When the copper clad laminate is produced by using the copper foil with the carrier foil, the roughened layer on the entire copper layer side can be obtained to obtain a good density between the roughened layer and the insulating layer material. In combination, it is possible to obtain a copper clad laminate having excellent laser drilling performance by the roughened layer on the carrier foil side. Each of the constituent elements will be described below.

載子箔:關於該具備載子箔之銅箔之載子箔,並無特別限定材質。但是,在考慮於載子箔之外表面來設置「具有藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層」之時,該載子箔係最好是銅箔、表面塗佈銅之樹脂薄膜等之銅成分存在於表面之箔。 Carrier foil: The carrier foil of the copper foil provided with a carrier foil is not specifically limited. However, a roughened layer having a fine concavo-convex structure formed by a convex portion having a needle-like or plate-like shape composed of a copper composite compound and having a maximum length of 500 nm or less is provided in consideration of the surface of the carrier foil. In this case, the carrier foil is preferably a foil in which a copper component such as a copper foil or a copper-coated resin film is present on the surface.

此外,關於載子箔之厚度,並無特別限定。但是,在本件發明,在施行雷射鑽孔加工之際,使用設置於載子箔之外表面之粗化處理層,來作為雷射光吸收層。因此,在考慮雷 射鑽孔加工之容易性、加工時間之縮短、材料成本之削減等之時,該載子箔之厚度係最好是7μm~18μm之範圍。 Further, the thickness of the carrier foil is not particularly limited. However, in the present invention, when laser drilling is performed, a roughened layer provided on the outer surface of the carrier foil is used as the laser light absorbing layer. Therefore, considering the mine The thickness of the carrier foil is preferably in the range of 7 μm to 18 μm when the easiness of the drilling process, the shortening of the processing time, and the reduction of the material cost.

像這樣,該載子箔之材質及厚度係並無特別限定,但是,由所謂在前述粗化處理層之表面來照射雷射光而施行雷射鑽孔加工之際之雷射鑽孔加工性呈良好之觀點來看的話,則該載子箔之外表面係最好是具備以下之表面特性。 In this manner, the material and thickness of the carrier foil are not particularly limited. However, the laser drilling process is performed by irradiating laser light on the surface of the roughened layer to perform laser drilling. From a good point of view, it is preferable that the surface of the carrier foil has the following surface characteristics.

首先,該載子箔之外表面係最好是「在藉由以雷射法來測定57570μm2之二次元區域時之表面積(三次元面積:Aμm2)和二次元區域面積之間之比值[(A)/(57570)]而算出之表面積比(B)」之值為1.1以上,更加理想是1.5以上。在表面積比(B)為1.1以上之時,雷射鑽孔性能呈良好,在成為1.5以上之時,變得更加良好。另一方面,在表面積比(B)之值超過3.0之時,在載子箔之厚度,產生偏差,結果,在雷射孔徑,容易發生偏差。因此,載子箔之外表面之表面積比(B)之值係最好是3.0以下。 First, the outer surface of the carrier foil is preferably "the ratio between the surface area (three-dimensional area: Aμm 2 ) and the area of the secondary element area when the secondary region of 57770 μm 2 is measured by a laser method [ The value of the surface area ratio (B)" calculated by (A)/(57570)] is 1.1 or more, and more preferably 1.5 or more. When the surface area ratio (B) is 1.1 or more, the laser drilling performance is good, and when it is 1.5 or more, it becomes more favorable. On the other hand, when the value of the surface area ratio (B) exceeds 3.0, a variation occurs in the thickness of the carrier foil, and as a result, variation in the laser aperture is likely to occur. Therefore, the surface area ratio (B) of the outer surface of the carrier foil is preferably 3.0 or less.

此外,該載子箔之外表面之表面粗糙度(Rzjis)係最好是2.0μm以上。可以藉由對於具有表面粗糙度(Rzjis)為2.0μm以上之面之載子箔之外表面,設置具有前述微細凹凸構造之粗化處理層,使用該粗化處理層,來作為雷射光吸收層,而使得雷射鑽孔加工性能,更加地良好。載子箔之外表面之表面粗糙度係越加變粗而越加降低載子箔之外表面之雷射光之反射率,提高雷射鑽孔加工性能而變得理想。另一方面,在表面粗糙度(Rzjis)為6.0μm以上之時,在載子箔之厚度,發生偏差,結果,在雷射孔徑,容易發生偏差。因此,載子箔 之外表面之表面粗糙度(Rzjis)係最好是6.0μm以下。 Further, the surface roughness (Rzjis) of the outer surface of the carrier foil is preferably 2.0 μm or more. A roughened layer having the fine concavo-convex structure described above may be provided on the outer surface of the carrier foil having a surface having a surface roughness (Rzjis) of 2.0 μm or more, and the roughened layer may be used as a laser light absorbing layer. This makes the laser drilling process performance even better. It is desirable that the surface roughness of the outer surface of the carrier foil becomes thicker and the reflectance of the laser light on the outer surface of the carrier foil is lowered, and the laser drilling performance is improved. On the other hand, when the surface roughness (Rzjis) is 6.0 μm or more, the thickness of the carrier foil varies, and as a result, the laser aperture is likely to vary. Therefore, the carrier foil The surface roughness (Rzjis) of the outer surface is preferably 6.0 μm or less.

剝離層:使用於本申請案之雷射鑽孔加工法之具備載子箔之銅箔之剝離層係只要是可以在事後來剝離載子箔的話,則並無特別限定,只要是滿足剝離層之所要求之特性的話,則可以是使用有機成分而形成之「有機剝離層」和使用無機成分而形成之「無機剝離層」之任何一種。 The release layer: the release layer of the copper foil with a carrier foil used in the laser drilling method of the present application is not particularly limited as long as the carrier foil can be peeled off later, as long as the release layer is satisfied. The desired properties may be any of an "organic release layer" formed using an organic component and an "inorganic release layer" formed using an inorganic component.

在採用「有機剝離層」來作為剝離層之狀態下,作為有機成分係最好是使用包含由含氮有機化合物、含硫有機化合物和羧酸所組成之群組而選出之化合物之至少一種以上者。在此,在所謂含氮有機化合物,包含具有取代基之含氮有機化合物。具體地說,作為含氮有機化合物係最好是使用成為具有取代基之三唑化合物之1,2,3-苯并三唑、羧基苯并三唑、N’,N’-雙(苯并三唑基甲基)脲、1H-1,2,4-三唑以及3-胺基-1H-1,2,4-三唑等。接著,作為含硫有機化合物係最好是使用巰基苯并噻唑、硫氰尿酸以及2-苯并咪唑硫代等。此外,作為羧酸係特別最好是使用單羧酸,即使是在其中,也最好是使用油酸、亞油酸和亞麻酸等。因為這些有機成分係具有良好之高溫耐熱性,在載子箔之表面,容易形成厚度5nm~60nm之剝離層之緣故。 In the state in which the "organic release layer" is used as the release layer, it is preferable to use at least one or more compounds selected from the group consisting of nitrogen-containing organic compounds, sulfur-containing organic compounds, and carboxylic acids as the organic component. By. Here, the nitrogen-containing organic compound includes a nitrogen-containing organic compound having a substituent. Specifically, as the nitrogen-containing organic compound, it is preferred to use 1,2,3-benzotriazole, carboxybenzotriazole, N', N'-bis (benzo) which is a triazole compound having a substituent. Triazolylmethyl)urea, 1H-1,2,4-triazole, and 3-amino-1H-1,2,4-triazole, and the like. Next, as the sulfur-containing organic compound, mercaptobenzothiazole, thiocyanuric acid, 2-benzimidazolethione or the like is preferably used. Further, as the carboxylic acid system, a monocarboxylic acid is particularly preferably used, and among them, oleic acid, linoleic acid, linolenic acid or the like is preferably used. Since these organic components have good high-temperature heat resistance, a peeling layer having a thickness of 5 nm to 60 nm is easily formed on the surface of the carrier foil.

另一方面,在採用「無機剝離層」來作為剝離層之狀態下,作為無機成分係可以使用Ni、Mo、Co、Cr、Fe、Ti、W、P或者是以這些元素來作為主成分之合金或化合物而組成之群組來選出之至少一種以上。在這些無機剝離層之狀態下,可以使用電著法、無電解法、物理蒸鍍法等之習知之手法 而形成。 On the other hand, in the state in which the "inorganic release layer" is used as the release layer, Ni, Mo, Co, Cr, Fe, Ti, W, P may be used as the inorganic component or these elements may be used as the main component. At least one or more selected from the group consisting of alloys or compounds. In the state of these inorganic release layers, conventional methods such as an electrophoresis method, an electroless deposition method, and a physical vapor deposition method can be used. And formed.

在本申請案,最好是可以使用有機剝離層和無機剝離層之任何一種,但是,在剝離層和絕緣層構造材料之間之層積時,也在負荷熱能之狀態等,由所謂可以安定地確保載子箔之適當之剝離強度之觀點來看的話,則最好是有機剝離層。 In the present application, it is preferable to use any one of an organic peeling layer and an inorganic peeling layer. However, in the case of laminating between the peeling layer and the insulating layer structural material, it is also in a state of load heat energy, etc. From the standpoint of ensuring proper peel strength of the carrier foil, an organic release layer is preferred.

整體銅層:使用於本申請案之具備載子箔之銅箔之整體銅層係如果是透過剝離層而可剝離地層積於載子箔之銅箔的話,則並無特別限定。構成整體銅層之銅箔之製造方法係並無特別限定,可以藉由包含電解電鍍法、無電解電鍍法、真空蒸鍍法、濺鍍蒸鍍法、化學氣相反應法等之可以製造銅箔之向來習知方法之各種方法而進行製造。但是,在考慮生產成本等之時,最好是藉由電解電鍍法而製造整體銅層。 The entire copper layer is not particularly limited as long as the entire copper layer of the copper foil with a carrier foil used in the present application is detachably laminated on the copper foil of the carrier foil through the release layer. The method for producing the copper foil constituting the entire copper layer is not particularly limited, and copper can be produced by an electrolytic plating method, an electroless plating method, a vacuum deposition method, a sputtering vapor deposition method, a chemical vapor phase reaction method, or the like. The foil is manufactured by various methods of the conventional method. However, when considering the production cost and the like, it is preferable to manufacture the entire copper layer by electrolytic plating.

整體銅層之厚度係並無特別限定,可以在覆銅層積板或者是印刷電路板等,滿足在形成銅層之際而要求之厚度。但是,本申請案之具備載子箔之銅箔係可以在載子箔之外表面,具備作為雷射吸收層之粗化處理層,適合使用作為供應於雷射鑽孔加工之覆銅層積板或者是印刷電路板之製造材料。在考慮此種使用形態時,該整體銅層之厚度係最好是0.1μm~9μm。如果是整體銅層之厚度為9μm以下的話,則可以在載子箔之外表面來照射雷射光之時,同時地鑽孔「載子箔/剝離層/整體銅層」之3層。相對於此,在整體銅層之厚度超過9μm之時,具備載子箔之銅箔整體之厚度係變得過度厚,降低雷射鑽孔加工性能,因此,變得不理想。此外,另一方面,在整體銅層之厚度未滿0.1μm之時,不容易得到均勻層厚度之整體銅 層,因此,變得不理想。 The thickness of the entire copper layer is not particularly limited, and may be a thickness such as a copper-clad laminate or a printed circuit board, which is required to form a copper layer. However, the copper foil provided with the carrier foil of the present application may have a roughened layer as a laser absorbing layer on the outer surface of the carrier foil, and is suitably used as a copper-clad laminate for laser drilling. The board is either a manufacturing material for a printed circuit board. When considering such a use form, the thickness of the entire copper layer is preferably from 0.1 μm to 9 μm. When the thickness of the entire copper layer is 9 μm or less, three layers of the "carrier foil/release layer/whole copper layer" can be simultaneously drilled while irradiating the laser beam on the outer surface of the carrier foil. On the other hand, when the thickness of the entire copper layer exceeds 9 μm, the thickness of the entire copper foil including the carrier foil is excessively thick, and the laser drilling performance is lowered, which is not preferable. In addition, on the other hand, when the thickness of the entire copper layer is less than 0.1 μm, it is not easy to obtain an overall copper having a uniform layer thickness. Layers, therefore, become less than ideal.

因此,由所謂得到良好之雷射鑽孔加工性能之觀點來看的話,則整體銅層之厚度係最好是更加薄。具體地說,更加理想是5μm以下,甚至最好是3μm以下,最佳理想是2μm以下。此外,即使是在整體銅層之厚度越加薄而越加使用該整體銅層來進行電路之形成之方面,也變得理想。另一方面,由所謂得到更加均勻之層厚度之整體銅層之觀點來看的話,則整體銅層之厚度係更加理想是0.5μm以上,甚至最好是1μm以上。 Therefore, the thickness of the entire copper layer is preferably thinner from the viewpoint of obtaining good laser drilling performance. Specifically, it is more preferably 5 μm or less, even more preferably 3 μm or less, and most preferably 2 μm or less. Further, it is preferable even if the thickness of the entire copper layer is made thinner and the entire copper layer is used to form a circuit. On the other hand, from the viewpoint of obtaining an overall copper layer having a more uniform layer thickness, the thickness of the entire copper layer is more preferably 0.5 μm or more, and even more preferably 1 μm or more.

整體銅層之表面特性係並無特別限定。但是,在考慮該具備載子箔之銅箔層積於絕緣層構造材料而成為覆銅層積板來使用該覆銅層積板而進行電路之形成時,整體銅層之外表面之表面特性係最好是在設置粗化處理層之前,正如以下。該外表面之表面粗糙度(Rzjis)係最好是2.0μm以下,更加理想是1.5μm以下,甚至最好是1.0μm以下。此外,整體銅層之外表面之光澤度(Gs60°)係最好是100以上,更加理想是300以上。 The surface characteristics of the entire copper layer are not particularly limited. However, when the copper foil provided with the carrier foil is laminated on the insulating layer structural material to form a copper clad laminate, and the circuit is formed by using the copper clad laminate, the surface characteristics of the outer surface of the entire copper layer are considered. It is best to set the roughing layer before, as follows. The surface roughness (Rzjis) of the outer surface is preferably 2.0 μm or less, more preferably 1.5 μm or less, and even more preferably 1.0 μm or less. Further, the gloss (Gs 60°) of the outer surface of the entire copper layer is preferably 100 or more, more preferably 300 or more.

如果是在具有前述表面特性之整體銅層之外表面來形成前述之微細凹凸構造的話,則可以得到微細凹凸構造和絕緣層構造材料之間之良好之密合性,同時,形成高頻特性呈良好之電路。也就是說,為了在高頻電路,抑制由於表皮效果而造成之傳送損失,因此,要求在表面平滑之導體,形成電路。在此,在本申請案之所謂粗化處理層來設置於整體銅層之外表面之狀態下,擔心由於賦予在外表面之凹凸構造而造成高頻訊 號之傳送損失。但是,正如後面之敘述,該微細凹凸構造係藉著由含有氧化銅和氧化亞銅之銅複合化合物所組成之凸狀部而形成,因此,在由該微細凹凸構造而組成之粗化處理層,並無流動高頻訊號。因此,該整體銅層係顯示同等於無施行粗化處理之無粗化銅層之高頻特性。此外,該粗化處理層係對於使用在高頻基板之低介電常數之絕緣層構造材料之密合性呈良好。因此,在成為和絕緣層構造材料之間之接合面之整體銅層之外表面來具備具有該微細凹凸構造之粗化處理層之具備載子箔之銅箔係適合成為高頻電路形成材料以及印刷電路板之電路形成材料。 If the fine concavo-convex structure is formed on the outer surface of the entire copper layer having the surface characteristics described above, good adhesion between the fine concavo-convex structure and the insulating layer structure material can be obtained, and at the same time, high frequency characteristics are formed. Good circuit. That is to say, in order to suppress the transmission loss due to the skin effect in the high-frequency circuit, a conductor having a smooth surface is required to form a circuit. Here, in the state in which the so-called roughened layer of the present application is provided on the outer surface of the entire copper layer, there is a fear that the high-frequency signal is caused by the uneven structure provided on the outer surface. The transmission loss of the number. However, as will be described later, the fine concavo-convex structure is formed by a convex portion composed of a copper composite compound containing copper oxide and cuprous oxide, and therefore, a roughened layer composed of the fine concavo-convex structure There is no mobile high frequency signal. Therefore, the overall copper layer exhibits the same high frequency characteristics as the roughened copper layer without the roughening treatment. Further, the roughening treatment layer is excellent in adhesion to an insulating layer structural material using a low dielectric constant of a high-frequency substrate. Therefore, a copper foil having a carrier foil having a roughened layer having the fine uneven structure on the outer surface of the entire copper layer of the joint surface between the insulating layer structure and the insulating layer is suitable as a high-frequency circuit forming material. The circuit of the printed circuit board forms a material.

1-2.粗化處理層 1-2. Roughening layer

在本申請案,在具備載子箔之銅箔之兩面,設置具有「藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造」之粗化處理層。在此,在設置於具備載子箔之銅箔之載子箔之外表面之粗化處理層以及設置於整體銅層之外表面之粗化處理層,構成各面之粗化處理層之微細凹凸構造之形狀或大小等係可以成為共通。在以下,關於粗化處理層而言,在無特別區別地說明設置於載子箔之外表面之粗化處理層以及設置於整體銅層之外表面之粗化處理層之狀態下,其說明事項係也共通於任何一種之粗化處理層。 In the present application, a fine concavo-convex structure formed by a convex portion having a needle-like or plate-like shape composed of a copper composite compound and having a maximum length of 500 nm or less is provided on both surfaces of a copper foil having a carrier foil. The roughening layer. Here, the roughened layer provided on the outer surface of the carrier foil provided with the copper foil of the carrier foil and the roughened layer provided on the outer surface of the entire copper layer constitute a fine layer of the roughened layer on each surface. The shape or size of the concavo-convex structure can be made common. In the following, the roughened layer is described in a state in which the roughened layer provided on the outer surface of the carrier foil and the roughened layer provided on the outer surface of the entire copper layer are not particularly distinguished. The matter is also common to any of the roughening layers.

在載子箔之外表面來具備具有前述微細凹凸構造之粗化處理層之具備載子箔之覆銅層積板係可以使用該粗化處理層,來作為雷射光吸收層,可以同時鑽孔載子箔和整體銅 層。此外,在整體銅層之外表面來具備具有該微細凹凸構造之粗化處理層,因此,可以得到整體銅層和絕緣層構造材料之間之良好之密合性。此外,該粗化處理層係不同於藉由習知之黑化處理而形成之針狀結晶等,其他之物體係即使是接觸到表面,也使得形成微細凹凸構造之凸狀部係不容易受到損傷,發生所謂落粉等之現象。因此,本申請案之具備載子箔之銅箔係在其兩面、也就是載子箔之外表面以及整體銅層之外表面,分別具有粗化處理層,但是,無發生落粉等而使得處理變得容易。 A copper-clad laminate having a carrier foil having a roughened layer having the fine uneven structure on the outer surface of the carrier foil can be used as a laser light-absorbing layer by using a roughened layer. Carrier foil and integral copper Floor. Further, since the roughened layer having the fine concavo-convex structure is provided on the outer surface of the entire copper layer, good adhesion between the entire copper layer and the insulating layer structure material can be obtained. Further, the roughening treatment layer is different from the needle crystals formed by the conventional blackening treatment, and the other material system is not easily damaged by the convex portion forming the fine concavo-convex structure even if it contacts the surface. The phenomenon of so-called falling powder occurs. Therefore, the copper foil with a carrier foil of the present application has a roughened layer on both surfaces of the carrier foil and the outer surface of the entire copper layer, but no powder or the like occurs. Processing becomes easy.

在圖2,顯示在可以使用作為載子箔之一般之電解銅箔之表面來設置本申請案之所謂粗化處理層時之其粗化處理層之表面形態。在此,在使用電解銅箔來作為載子箔之狀態下,在電解銅箔之電極面側或析出面側之任何一面,可任意地設置整體銅層。因此,在電解銅箔來成為載子箔之時,可任意地使用其電極面側或析出面側之任何一面,來作為外表面、也就是雷射光照射面。因此,在圖2,顯示:也在任何一面來作為雷射光照射面之狀態下,在形成電解銅箔之電極面側和析出面側之各個粗化處理層而能夠掌握其粗化處理層之表面狀態時之掃描型電子顯微鏡之觀察圖像。 Fig. 2 shows the surface morphology of the roughened layer when the so-called roughened layer of the present application is provided on the surface of a general electrolytic copper foil which can be used as a carrier foil. Here, in the state in which the electrolytic copper foil is used as the carrier foil, the entire copper layer can be arbitrarily provided on either the electrode surface side or the deposition surface side of the electrolytic copper foil. Therefore, when the electrolytic copper foil is used as the carrier foil, any one of the electrode surface side and the deposition surface side can be arbitrarily used as the outer surface, that is, the laser light irradiation surface. Therefore, in the state in which the laser light irradiation surface is provided on either side, each roughening layer is formed on the electrode surface side and the deposition surface side of the electrodeposited copper foil, and the roughened layer can be grasped. An observation image of a scanning electron microscope at the surface state.

正如圖2所示,觀察到藉由在各粗化處理層之表面,分別使得突出成為針狀或板狀之微細之凸狀部呈相互地鄰接同時密集,而在電解銅箔之表面,形成極微細之凹凸構造,設置這些凸狀部而沿著電解銅箔之表面形狀,來被覆電解銅箔之表面之狀態。 As shown in Fig. 2, it is observed that the fine convex portions which are protruded into a needle shape or a plate shape are adjacent to each other and densely formed on the surface of each roughening treatment layer, and are formed on the surface of the electrolytic copper foil. The extremely fine concavo-convex structure is provided with these convex portions to cover the surface of the electrolytic copper foil along the surface shape of the electrolytic copper foil.

在此,在對比電解面側之粗化處理層之表面和析 出面側之粗化處理層之表面之時,各面之微型表面形狀呈不同。認為該微型表面形狀之相異處係起因於形成該微細凹凸構造之前之電解銅箔本身之電極面和析出面之微型表面形狀之相異處。正如最初之敘述,電解銅箔之電極面係轉印陰極之表面形狀,因此,變得平滑。另一方面,該其他面側(析出面側)係一般具有電析銅而形成之凹凸形狀。在參考圖2之時,得知:粗化處理層之表面係分別維持電解銅箔之各面之粗化處理前之微型表面形狀,電極面係具有比較平滑之微型表面形狀,析出面係將具有凹凸之微型表面形狀予以具備。這個係認為最大長度為500nm以下之針狀或板狀之凸狀部,沿著粗化處理前之電解銅箔之表面形狀,密集地設置於電解銅箔之表面而被覆電解銅箔之表面,因此,在形成該微細凹凸構造之後,也維持電解銅箔之各面之微型表面形狀。 Here, the surface and the surface of the roughened layer on the side of the comparative electrolytic surface are analyzed. When the surface of the roughened layer is formed on the surface side, the shape of the micro surface of each surface is different. It is considered that the difference in the shape of the micro surface is caused by the difference between the electrode surface of the electrodeposited copper foil itself before the formation of the fine uneven structure and the shape of the micro surface of the deposition surface. As originally described, the electrode surface of the electrodeposited copper foil transfers the surface shape of the cathode and, therefore, becomes smooth. On the other hand, the other surface side (precipitation surface side) generally has a concavo-convex shape formed by electrodepositing copper. Referring to FIG. 2, it is known that the surface of the roughened layer maintains the micro surface shape before the roughening treatment of each surface of the electrolytic copper foil, and the electrode surface has a relatively smooth micro surface shape, and the deposition surface will be A miniature surface shape having irregularities is provided. This is considered to be a needle-like or plate-like convex portion having a maximum length of 500 nm or less, and is densely disposed on the surface of the electrolytic copper foil to cover the surface of the electrolytic copper foil along the surface shape of the electrolytic copper foil before the roughening treatment. Therefore, after the fine concavo-convex structure is formed, the micro surface shape of each surface of the electrolytic copper foil is also maintained.

此外,該微細凹凸構造係藉由最大長度為500nm以下之凸狀部而形成,在參考圖2時,各凸狀部來配列於銅箔(電解銅箔)之表面之配列間距係短於各凸狀部之長度。在此,在雷射鑽孔加工之際,使用主波長為9.4μm及10.6μm之二氧化碳氣體雷射。該粗化處理層之表面係各凸狀部之配列間距,更加短於二氧化碳氣體雷射之發光波長,因此,該粗化處理層之表面係抑制由於二氧化碳氣體雷射而造成之雷射光之反射,以高度之吸光率,來吸收雷射光。因此,可以適合使用作為雷射光吸收層。此外,形成該微細凹凸構造之凸狀部之最大長度係500nm以下,在比較於藉由向來之黑化處理而形成之凸狀部之長度之時,變得比較短。藉由向來之黑化處理而形成 之凸狀部係由銅箔之表面開始變細,呈變長地突出,因此,在表面來接觸到其他物體之狀態下,容易受到彎曲折斷等之損傷,在處理時,發生所謂落粉。相對於此,在本申請案之所謂微細凹凸構造,無存在正如向來之黑化處理而由銅箔之表面開始變細並且呈變長地突出之凸狀部。因此,在處理時,即使是作業員之指頭等接觸到該粗化處理層之表面,也無形成該微細凹凸構造之凸狀部呈彎曲而局部地改變粗化處理層之表面形狀或者是在周圍來飛散氧化銅之微細粉末等之前述之落粉之發生,可以容易地進行處理。 Further, the fine concavo-convex structure is formed by a convex portion having a maximum length of 500 nm or less. When referring to FIG. 2, the arrangement pitch of the convex portions arranged on the surface of the copper foil (electrolytic copper foil) is shorter than each The length of the convex portion. Here, at the time of laser drilling, a carbon dioxide gas laser having a dominant wavelength of 9.4 μm and 10.6 μm is used. The surface of the roughening layer is arranged at a pitch of each convex portion, and is shorter than the emission wavelength of the carbon dioxide gas laser. Therefore, the surface of the roughened layer suppresses reflection of the laser light due to the carbon dioxide gas laser. Absorbs laser light with a high absorbance. Therefore, it can be suitably used as a laser light absorbing layer. Further, the maximum length of the convex portion forming the fine concavo-convex structure is 500 nm or less, and is relatively short when compared with the length of the convex portion formed by the conventional blackening treatment. Formed by the blackening process of the past Since the convex portion is tapered from the surface of the copper foil and protrudes in a long length, it is easily damaged by bending or the like in a state where the surface comes into contact with other objects, and so-called falling powder occurs during the treatment. On the other hand, in the so-called fine concavo-convex structure of the present application, there is no convex portion which is thickened and protrudes from the surface of the copper foil as in the conventional blackening treatment. Therefore, even if the operator's finger or the like comes into contact with the surface of the roughened layer during the treatment, the convex portion having the fine uneven structure is not bent to partially change the surface shape of the roughened layer or is The occurrence of the aforementioned falling powder such as fine powder of copper oxide scattered around can be easily handled.

接著,參考圖3,同時,就前述凸狀部之「最大長度」而進行說明。圖3係顯示在本申請案之所謂具備載子箔之銅箔之剖面之掃描型電子顯微鏡之觀察圖像。但是,在圖3,顯示具備載子箔之銅箔之載子箔側之剖面。正如圖3所示,在該具備載子箔之銅箔之剖面,觀察成為細線狀之部分係凸狀部。在圖3,確認藉由相互地密集之無數之凸狀部而覆蓋銅箔之表面,各凸狀部係沿著銅箔之表面形狀而由銅箔之表面開始突出。在本申請案,所謂「凸狀部之最大長度」係指在該銅箔之剖面,在測定由前述之觀察成為線(線部分)狀之各凸狀部之基端開始至前端為止之長度時之最大值。在此,使用作為雷射光吸收層之載子箔之外表面之粗化處理層係該凸狀部之最大長度越加長而越加提高雷射光吸光率,越加提高雷射鑽孔加工性能。此外,使用作為整體銅層和絕緣層構造材料之間之接合層之整體銅層之外表面之粗化處理層係該凸狀部之最大長度比較長者,可以藉由微細之固定效果而得到粗化處理層和絕 緣層構造材料之間之良好之密合性。另一方面,即使是在載子箔之外表面和整體銅層之外表面之任何一種,該凸狀部之最大長度比較短者係也比較容易處理。因為在該粗化處理層之表面來接觸到其他物體之時,該凸狀部之最大長度比較短者係比較不容易更加受到損傷之緣故。此外,凸狀部之最大長度比較短者係可以維持在粗化處理前之銅箔之表面形狀,可以抑制在粗化處理前後之表面粗糙度之變化。接著,可以形成微細間距電路,係具備同等於整體銅層之外表面為所謂無粗化銅層之狀態之同等之良好之蝕刻因子。於是,可以維持良好之雷射鑽孔加工性能,同時,可以一起得到和絕緣層構造材料之間之良好之密合性以及良好之蝕刻因子,並且,由所謂可以更加容易處理之觀點來看的話,則該凸狀部之最大長度係最好是400nm以下,更加理想是300nm以下。另一方面,在凸狀部之最大長度未滿100nm之時,降低雷射鑽孔加工性能,同時,也降低和絕緣層構造材料之間之密合性。因此,該凸狀部之最大長度係最好是100nm以上。 Next, referring to Fig. 3, the "maximum length" of the convex portion will be described. Fig. 3 is an observation image of a scanning electron microscope showing a cross section of a copper foil having a carrier foil in the present application. However, in Fig. 3, a cross section on the side of the carrier foil of the copper foil provided with the carrier foil is shown. As shown in Fig. 3, in the cross section of the copper foil provided with the carrier foil, a portion which is a thin line-like convex portion is observed. In Fig. 3, it was confirmed that the surface of the copper foil was covered by the infinite number of convex portions which were densely bonded to each other, and each of the convex portions protruded from the surface of the copper foil along the surface shape of the copper foil. In the present application, the "maximum length of the convex portion" means the length from the base end to the front end of each convex portion in the shape of the line (line portion) observed in the cross section of the copper foil. The maximum value of the time. Here, the roughening treatment layer using the outer surface of the carrier foil as the laser light absorbing layer is such that the longer the maximum length of the convex portion is, the more the laser light absorption rate is increased, and the laser drilling performance is improved. Further, the roughening treatment layer using the outer surface of the entire copper layer as the bonding layer between the entire copper layer and the insulating layer material is thicker, and the maximum length of the convex portion can be obtained by the fine fixing effect. Processing layer and Good adhesion between the edge layer construction materials. On the other hand, even if it is any one of the outer surface of the carrier foil and the outer surface of the entire copper layer, the maximum length of the convex portion is relatively easy to handle. When the surface of the roughened layer is in contact with other objects, the maximum length of the convex portion is relatively less susceptible to damage. Further, the shorter maximum length of the convex portion can maintain the surface shape of the copper foil before the roughening treatment, and the change in surface roughness before and after the roughening treatment can be suppressed. Next, a fine pitch circuit can be formed, which is equivalent to a good etching factor equivalent to the state in which the outer surface of the entire copper layer is a so-called roughened copper layer. Thus, good laser drilling performance can be maintained, and at the same time, a good adhesion with the insulating layer construction material and a good etching factor can be obtained together, and the viewpoint can be handled more easily. The maximum length of the convex portion is preferably 400 nm or less, more preferably 300 nm or less. On the other hand, when the maximum length of the convex portion is less than 100 nm, the laser drilling processability is lowered, and at the same time, the adhesion with the insulating layer construction material is also lowered. Therefore, the maximum length of the convex portion is preferably 100 nm or more.

在此,正如圖3所示,由微細凹凸構造而組成之粗化處理層係在銅箔之表層部分,辨識成為層狀。粗化處理層之厚度係相當於前述之凸狀部由銅箔之表面開始突出之厚度方向之長度(高度)。但是,形成微細凹凸構造之各凸狀部之長度或突出方向係不一定,各凸狀部之突出方向係並非相對於銅箔之厚度方向呈平形。此外,在各凸狀部之高度,有偏差存在。因此,在粗化處理層之厚度,也發生偏差。但是,在前述凸狀部之最大長度和粗化處理層之間,有一定之相關之關係存 在,本案發明人們係進行重覆之試驗,結果,在該粗化處理層之平均厚度為400nm以下之狀態下,前述凸狀部之最大長度係成為500nm以下,正如前面之敘述,由銅箔(載子箔或整體銅層)之表面開始呈變長地突出之凸狀部係並無存在,因此,可以成為高度之耐擦傷性能之粗化處理層。所以,可以容易處理,可以進行無偏差之良好之雷射鑽孔加工,得到整體銅層和絕緣層構造材料之間之良好之密合性。 Here, as shown in FIG. 3, the roughening treatment layer composed of the fine concavo-convex structure is formed on the surface layer portion of the copper foil, and is identified as a layer. The thickness of the roughened layer corresponds to the length (height) in the thickness direction in which the convex portion is protruded from the surface of the copper foil. However, the length or the protruding direction of each convex portion forming the fine concavo-convex structure is not necessarily the same, and the protruding direction of each convex portion is not flat with respect to the thickness direction of the copper foil. Further, there is a variation in the height of each convex portion. Therefore, variations occur in the thickness of the roughened layer. However, there is a certain correlation between the maximum length of the convex portion and the roughened layer. In the case where the average thickness of the roughened layer is 400 nm or less, the inventors of the present invention have a maximum length of 500 nm or less, as described above, from the copper foil. The convex portion having a surface on which the surface of the carrier foil or the entire copper layer starts to grow is not present, and therefore, it can be a roughened layer having a high scratch resistance. Therefore, it can be easily handled, and a good laser drilling process without deviation can be performed, and a good adhesion between the entire copper layer and the insulating layer construction material can be obtained.

此外,在使用掃描型電子顯微鏡而以傾斜角45°、50000倍以上之倍率呈平面地觀察該粗化處理層之表面時,在相互地鄰接之凸狀部中,可分離於其他之凸狀部而進行觀察之前端部分之長度係最好是250nm以下。在此,所謂「可分離於其他之凸狀部而進行觀察之前端部分之長度(在以下,有省略簡稱為「前端部分之長度」之狀態發生。)」係指以下所示之長度。例如在藉由掃描型電子顯微鏡而觀察粗化處理層之表面時,參考圖2,同時,正如前面之敘述,在該粗化處理層之表面,呈針狀或板狀地突出凸狀部,設置該凸狀部而密集於銅層之表面,因此,無法由銅層之表面開始觀察凸狀部之基端部、也就是由銅複合化合物而組成之凸狀部和銅箔之間之界面。於是,正如前面之敘述,在呈平面地觀察該銅層之粗化處理層之時,在相互地密集同時鄰接之凸狀部中,將可以分離於其他之凸狀部而能夠觀察可以獨立地存在成為一個凸狀部之部分,稱為前述之「可分離於其他之凸狀部而進行觀察之前端部分」,所謂該前端部分之長度係指由該凸狀部之前端(也就是前端部分之前端)開始直到可分離於其他之凸狀部而進行觀察之最基 端部側之位置為止之長度。 In addition, when the surface of the roughened layer is observed in a plane at a magnification of 45° or more at a tilt angle of 45° or more using a scanning electron microscope, the convex portions adjacent to each other can be separated from other convex shapes. The length of the end portion before the observation is preferably 250 nm or less. Here, the length of the end portion that can be separated from the other convex portions and observed (hereinafter, abbreviated as "the length of the distal end portion") is referred to as the length shown below. For example, when observing the surface of the roughened layer by a scanning electron microscope, referring to FIG. 2, at the same time, as described above, the convex portion is protruded in a needle shape or a plate shape on the surface of the roughened layer. Since the convex portion is provided intensively on the surface of the copper layer, the interface between the convex portion of the convex portion and the copper foil, that is, the base portion of the convex portion, that is, the copper foil cannot be observed from the surface of the copper layer. Therefore, as described above, when the roughened layer of the copper layer is observed in a plane, the convex portions which are adjacent to each other while being dense and dense can be separated from the other convex portions and can be observed independently. There is a portion which becomes a convex portion, which is referred to as "the front end portion which can be separated from other convex portions and is observed", and the length of the front end portion refers to the front end of the convex portion (that is, the front end portion) Starting from the beginning) until the base can be separated from other convex parts for observation The length of the position on the end side.

在該凸狀部之前端部分之長度為250nm以下之狀態下,前述凸狀部之最大長度係大概為500nm以下。正如前面之敘述,在考慮雷射鑽孔加工性能以及和絕緣層構造材料之間之密合性之狀態下,也在任何一種狀態下,最好是凸狀部之最大長度係比較長,最好是該凸狀部之前端部分之長度也比較長。但是,在加長該凸狀部之前端部分之長度之時,在接觸到其他之物體等之際,容易受到損傷。於是,由所謂維持良好之雷射鑽孔加工性能以及和絕緣層構造材料之間之密合性同時更加提高耐擦傷性而更加容易處理之觀點來看的話,則該凸狀部之前端部分之長度係最好是200nm以下,更加理想是100nm以下。另一方面,在該凸狀部之前端部分之長度未滿30nm之時,降低雷射鑽孔加工性能,同時,也降低和絕緣層構造材料之間之密合性。因此,該凸狀部之前端部分之長度係最好是30nm以上。 In a state where the length of the front end portion of the convex portion is 250 nm or less, the maximum length of the convex portion is approximately 500 nm or less. As described above, in consideration of the compatibility between the laser drilling process performance and the insulating layer construction material, in any state, it is preferable that the maximum length of the convex portion is long and the most Preferably, the length of the front end portion of the convex portion is also relatively long. However, when the length of the end portion before the convex portion is lengthened, it is easily damaged when it comes into contact with other objects or the like. Therefore, from the viewpoint of the so-called well-maintained laser drilling processability and the adhesion with the insulating layer structural material while improving the scratch resistance and being easier to handle, the front end portion of the convex portion is The length system is preferably 200 nm or less, more preferably 100 nm or less. On the other hand, when the length of the front end portion of the convex portion is less than 30 nm, the laser drilling processability is lowered, and at the same time, the adhesion with the insulating layer construction material is also lowered. Therefore, the length of the front end portion of the convex portion is preferably 30 nm or more.

此外,相對於該凸狀部之前述之最大長度,該凸狀部之前述前端部分之長度係最好是1/2以下。可以藉由在該比率為1/2以下之狀態下,分離於其他之凸狀部,同時,由銅箔之表面開始突出凸狀部之前端部分,而以該微細凹凸構造,呈緻密地被覆銅箔之表面。 Further, the length of the front end portion of the convex portion is preferably 1/2 or less with respect to the maximum length of the convex portion. It is possible to separate from the other convex portions in a state where the ratio is 1/2 or less, and at the same time, the front end portion of the convex portion is protruded from the surface of the copper foil, and the fine concavo-convex structure is densely covered. The surface of the copper foil.

此外,最好是在該粗化處理層,對於微細凹凸構造之表面而吸附氪來進行測定之比表面積(在以下,僅稱為「Kr吸附比表面積」。)係滿足所謂0.035m2/g以上之條件。因為在該Kr吸附比表面積為0.035m2/g以上之時,粗化處理層之 前述凸狀部之平均高度為200nm位級,可以安定地確保良好之雷射鑽孔加工性能及耐擦傷性能之緣故。在此,並無決定Kr吸附比表面積之上限,但是,上限係大概為0.3m2/g程度,更加理想是0.2m2/g。此外,此時之Kr吸附比表面積係使用Micromeritics公司製之比表面積.細孔分布測定裝置3Flex,對於試料,進行300℃×2小時之加熱,來作為前處理,在吸附溫度,使用液體氮溫度,在吸附氣體,使用氪(Kr)而進行測定。 In addition, it is preferable that the specific surface area (hereinafter, simply referred to as "Kr adsorption specific surface area") which is measured by adsorbing ruthenium on the surface of the fine uneven structure in the roughened layer satisfies the so-called 0.035 m 2 /g. The above conditions. Since the average height of the convex portion of the roughened layer is 200 nm when the Kr adsorption specific surface area is 0.035 m 2 /g or more, good laser drilling performance and scratch resistance can be ensured stably. For the sake of it. Here, the upper limit of the Kr adsorption specific surface area is not determined, but the upper limit is about 0.3 m 2 /g, more preferably 0.2 m 2 /g. In addition, the Kr adsorption specific surface area at this time is the specific surface area made by Micromeritics. The pore distribution measuring device 3Flex was heated at 300 ° C for 2 hours for the sample as a pretreatment, and the liquid nitrogen temperature was used at the adsorption temperature, and the adsorbed gas was measured using krypton (Kr).

接著,就構成微細凹凸構造之成分而進行敘述。正如前面之敘述,前述之凸狀部係由銅複合化合物而組成。在本申請案,由所謂雷射鑽孔加工性能呈良好之觀點來看的話,在作為雷射光吸收層之粗化處理層,該銅複合化合物係最佳理想是氧化銅,能夠以氧化銅,來作為主成分,同時,含有氧化亞銅。此外,也在任何一種狀態下,可以含有少量之金屬銅。 Next, the components constituting the fine concavo-convex structure will be described. As described above, the aforementioned convex portion is composed of a copper composite compound. In the present application, in view of the fact that the laser drilling process performance is good, in the roughening treatment layer as the laser light absorbing layer, the copper composite compound is preferably copper oxide, and can be made of copper oxide. It comes as a main component and contains cuprous oxide. In addition, in any state, a small amount of metallic copper may be contained.

也就是說,在使用X射線光電子分光分析法(X-ray Photoelectron Spectroscopy:在以下,僅稱為「XPS」。)來分析前述微細凹凸構造之構成元素時而得到之Cu(I)之波峰面積相對於Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積之佔有之比例(以下之佔有面積率)係最好是在使用該粗化處理層來作為雷射光吸收層之狀態下,成為未滿50%。另一方面,最好是在使用該粗化處理層來作為和絕緣層構造材料之間之接合層之狀態下,Cu(I)之佔有面積率係最好是50%以上。 In other words, the peak area of Cu(I) obtained by analyzing the constituent elements of the fine concavo-convex structure by X-ray photoelectron spectroscopy (hereinafter, simply referred to as "XPS") is used. The proportion of the total area between the peak area of Cu(I) and the peak area of Cu(II) (the occupied area ratio below) is preferably the use of the roughened layer as the laser light absorbing layer. In the state, it is less than 50%. On the other hand, in the state in which the roughened layer is used as the bonding layer with the insulating layer structural material, it is preferable that the Cu(I) occupying area ratio is preferably 50% or more.

在此,說明藉由XPS而分析前述粗化處理層之構 成元素之方法。在藉由XPS而分析微細凹凸構造之構成元素之時,可以分離及檢測Cu(I)和Cu(Ⅱ)之各波峰。但是,在分離及檢測Cu(I)和Cu(Ⅱ)之各波峰之狀態下,有在大Cu(I)波峰之肩部分來重覆地觀察Cu(0)波峰之狀態發生。像這樣,在重覆地觀察Cu(0)波峰之狀態下,包含該肩部分而認為是Cu(I)波峰。也就是說,在本件發明,將使用XPS而形成微細凹凸構造之銅複合化合物之構成元素予以分析,將檢測出現於Cu2p3/2之鍵能之所對應之932.4eV之Cu(I)以及出現於934.3eV之Cu(Ⅱ)之光電子而得到之各波峰予以波形分離,由各成分之波峰面積而特定Cu(I)波峰之佔有面積率。但是,作為XPS分析裝置係可以使用ULVAC-PHI股份有限公司製之Quantum2000(束條件:40W、200μm直徑),使用「MultiPack ver.6.1A」,來作為解析用軟體而進行狀態.半定量用狹窄測定。 Here, it is explained that the structure of the aforementioned roughening layer is analyzed by XPS. The method of becoming an element. When the constituent elements of the fine concavo-convex structure are analyzed by XPS, the respective peaks of Cu(I) and Cu(II) can be separated and detected. However, in the state where the respective peaks of Cu(I) and Cu(II) are separated and detected, there is a state in which the Cu(0) peak is repeatedly observed in the shoulder portion of the large Cu(I) peak. In this way, in the state in which the Cu(0) peak is repeatedly observed, the shoulder portion is included and is considered to be a Cu(I) peak. In other words, in the present invention, the constituent elements of the copper composite compound which forms the fine concavo-convex structure using XPS are analyzed, and Cu(I) which is 932.4 eV corresponding to the bond energy of Cu2p3/2 is detected and appears in Each of the peaks obtained by photoelectrons of Cu(II) of 934.3 eV is separated by a waveform, and the area ratio of the Cu(I) peak is specified by the peak area of each component. However, as the XPS analyzer, Quantum 2000 (beam condition: 40 W, 200 μm diameter) manufactured by ULVAC-PHI Co., Ltd. can be used, and "MultiPack ver. 6.1A" is used as the analysis software. Semi-quantitative stenosis.

正如以上而得到之Cu(I)波峰係認為來自於構成氧化亞銅(氧化亞銅:Cu2O)之1價銅。接著,Cu(Ⅱ)波峰係認為來自於構成氧化銅(氧化銅:CuO)之2價銅。此外,Cu(0)波峰係認為來自於構成金屬銅之0價銅。因此,在Cu(I)波峰之佔有面積率未滿50%之狀態下,構成該粗化處理層之銅複合化合物之氧化亞銅之所佔有之比例係小於氧化銅之所佔有之比例。在考慮雷射鑽孔加工性能之狀態下,該Cu(I)波峰之佔有率係最好是越小越好。也就是說,最佳理想是該佔有率係正如未滿40%、未滿30%、未滿20%等,其值越小而越加提高雷射鑽孔加工性能,該佔有率為0%,也 就是構成微細凹凸構造之凸狀部係僅由氧化銅而組成。 The Cu(I) crest system obtained as above is considered to be derived from monovalent copper constituting cuprous oxide (copper oxide: Cu 2 O). Next, the Cu(II) peak system is considered to be derived from divalent copper constituting copper oxide (copper oxide: CuO). Further, the Cu(0) crest system is considered to be derived from zero-valent copper constituting metallic copper. Therefore, in the state where the occupied area ratio of the Cu(I) peak is less than 50%, the proportion of the cuprous oxide of the copper composite compound constituting the roughened layer is smaller than the ratio of the copper oxide. In the state in which the laser drilling performance is considered, the Cu(I) peak occupancy ratio is preferably as small as possible. That is to say, the best ideal is that the occupancy rate is less than 40%, less than 30%, less than 20%, etc., the smaller the value, the more the laser drilling performance is improved, the occupation rate is 0%. That is, the convex portion constituting the fine concavo-convex structure is composed only of copper oxide.

另一方面,在整體銅層之外表面來設置該粗化處理層之狀態下,關於整體銅層之外表面之粗化處理層而言,不同於成為雷射光照射面之載子箔之外表面之粗化處理層,銅複合化合物係最好是含有氧化銅和氧化亞銅,更加理想是以氧化亞銅,來作為主成分。具體地說,在設置於整體銅層之外表面之粗化處理層,前述之Cu(I)波峰之佔有率係最好是50%以上,更加理想是70%以上,甚至最好是80%以上,特別最好是90%以上。 On the other hand, in the state where the roughened layer is provided on the outer surface of the entire copper layer, the roughened layer on the outer surface of the entire copper layer is different from the carrier foil which becomes the irradiated surface of the laser light. The surface roughening layer and the copper composite compound preferably contain copper oxide and cuprous oxide, and more preferably copper oxide as a main component. Specifically, in the roughened layer provided on the outer surface of the entire copper layer, the Cu(I) peak occupancy ratio is preferably 50% or more, more preferably 70% or more, and even more preferably 80%. The above is particularly preferably 90% or more.

在Cu(I)波峰之佔有面積率未滿50%之狀態下,在對於該銅層來施行雷射鑽孔加工之後,並且,在企圖藉由蝕刻法而形成電路之時,在蝕刻液,容易溶解微細凹凸構造之構造成分。因為氧化銅係在比較於氧化亞銅之時,對於蝕刻液等之酸之溶解性變高之緣故。因此,在Cu(I)波峰之佔有面積率未滿50%之狀態下,恐怕會在事後,降低銅層和絕緣層構造材料之間之密合性,因此,變得不理想。 In the state where the occupied area ratio of the Cu(I) peak is less than 50%, after the laser drilling process is performed on the copper layer, and when an electric circuit is formed by an etching method, in the etching liquid, It is easy to dissolve the structural components of the fine concavo-convex structure. Since the copper oxide is compared with cuprous oxide, the solubility in an acid such as an etching solution is high. Therefore, in a state where the occupied area ratio of the Cu(I) peak is less than 50%, it is likely that the adhesion between the copper layer and the insulating layer structural material is lowered afterwards, and thus it is not preferable.

在該整體銅層之外表面之粗化處理層,並無特別限定Cu(I)波峰之佔有面積率之上限值,但是,最好是99%以下。Cu(I)波峰之佔有面積率越低而越加有提高整體銅層和絕緣層構造材料之間之密合性之傾向發生。因此,為了得到兩者之良好之密合性,所以,Cu(I)波峰之佔有面積率係最好是98%以下,更加理想是95%以下。此外,Cu(I)波峰之佔有面積率係藉由Cu(I)/{Cu(I)+Cu(Ⅱ)}×100(%)之計算式而算出。 The roughened layer on the outer surface of the entire copper layer is not particularly limited to the upper limit of the occupied area ratio of the Cu(I) peak, but is preferably 99% or less. The lower the occupied area ratio of the Cu(I) peak, the higher the tendency to improve the adhesion between the entire copper layer and the insulating layer structural material. Therefore, in order to obtain good adhesion between the two, the area ratio of the Cu(I) peak is preferably 98% or less, more preferably 95% or less. Further, the occupied area ratio of the Cu(I) peak is calculated by a calculation formula of Cu(I) / {Cu(I) + Cu(II)} × 100 (%).

以上敘述之微細凹凸構造係可以藉由例如在具備載子箔之銅箔之兩面(也就是載子箔之外表面以及整體銅層之外表面),來施行藉由以下之濕式之所造成之粗化處理,而形成微細凹凸構造。首先,藉由以濕式法,在具備載子箔之銅箔之兩面,來施行氧化處理,而在具備載子箔之銅箔之兩面,形成以氧化銅(氧化銅:CuO)來作為主成分之銅複合化合物。可以藉此而在具備載子箔之銅箔之兩面,形成由以氧化銅來作為主成分之銅複合化合物而組成之「藉由針狀或板狀之凸狀部而形成之微細凹凸構造」。然後,可以藉由配合需要,來施行還原處理,在具備載子箔之銅箔之兩面或單面,還原一部分之氧化銅,來成為氧化亞銅(氧化亞銅:Cu2O),而在具備載子箔之銅箔之兩面或單面,形成由含有氧化銅和氧化亞銅之銅複合化合物而組成之「藉由針狀或板狀之凸狀部而形成之微細凹凸構造」。在此,在本申請案之所謂「微細凹凸構造」本身係形成於氧化處理之階段。因此,在形成以氧化銅來作為主成分之微細凹凸構造或者是由氧化銅而組成之微細凹凸構造之狀態下,可以在氧化處理後,無施行還原處理,完成該粗化處理。另一方面,能夠在形成以一定之比例來包含氧化亞銅之微細凹凸構造之狀態下,在氧化處理後,施行還原處理。即使是施行還原處理,也在氧化處理之階段,在仍然幾乎維持微細凹凸構造之形狀之狀態下,將一部分之氧化銅,來還原成為氧化亞銅。結果,可以形成由含有氧化銅和氧化亞銅之銅複合化合物而組成之「微細凹凸構造」。可以藉由像這樣,在具備載子箔之銅箔之兩面藉由濕式法等而施行氧化處理之後,配合需要, 來施行必要程度之還原處理,而形成在本申請案之所謂「微細凹凸構造」。此外,能夠在以氧化銅來作為主成分之銅複合化合物或者是在含有氧化銅和氧化亞銅之銅複合化合物,含有少量之金屬銅。 The fine concavo-convex structure described above can be caused by, for example, the following wet type on both sides of the copper foil having the carrier foil (that is, the outer surface of the carrier foil and the outer surface of the entire copper layer). The roughening treatment forms a fine uneven structure. First, oxidation treatment is performed on both surfaces of a copper foil provided with a carrier foil by a wet method, and copper oxide (copper oxide: CuO) is mainly formed on both surfaces of a copper foil having a carrier foil. a copper composite compound of the composition. In this case, a "fine concavo-convex structure formed by a convex portion of a needle shape or a plate shape" composed of a copper composite compound containing copper oxide as a main component is formed on both surfaces of a copper foil having a carrier foil. . Then, the reduction treatment can be carried out by the need of blending, and a part of the copper oxide is reduced on both sides or one side of the copper foil with the carrier foil to form cuprous oxide (cuprous oxide: Cu 2 O). On both sides or a single surface of a copper foil having a carrier foil, a "fine concavo-convex structure formed by a convex portion of a needle shape or a plate shape" composed of a copper composite compound containing copper oxide and cuprous oxide is formed. Here, the "fine concavo-convex structure" itself in the present application is formed at the stage of oxidation treatment. Therefore, in a state in which a fine concavo-convex structure having copper oxide as a main component or a fine concavo-convex structure composed of copper oxide is formed, the refining treatment can be completed without performing a reduction treatment after the oxidation treatment. On the other hand, in the state in which the fine concavo-convex structure containing cuprous oxide is contained in a predetermined ratio, the reduction treatment can be performed after the oxidation treatment. Even in the case of performing the reduction treatment, a part of the copper oxide is reduced to cuprous oxide in a state where the shape of the fine concavo-convex structure is maintained almost at the stage of the oxidation treatment. As a result, a "fine concavo-convex structure" composed of a copper composite compound containing copper oxide and cuprous oxide can be formed. In this way, by performing an oxidation treatment on the both surfaces of the copper foil provided with the carrier foil by a wet method or the like, and performing a necessary degree of reduction treatment as needed, the so-called "fine bumps" in the present application can be formed. structure". Further, a copper composite compound containing copper oxide as a main component or a copper composite compound containing copper oxide and cuprous oxide may contain a small amount of metallic copper.

例如在施行藉由前述之濕式法而造成之粗化處理之際,最好是使用氫氧化鈉溶液等之鹼溶液。可以藉由使用鹼溶液,氧化具備載子箔之銅箔之兩面,而在具備載子箔之銅箔之兩面,形成由以針狀或板狀之氧化銅來作為主成分之銅複合化合物而組成之凸狀部。在此,在藉由鹼溶液而對於具備載子箔之銅箔之兩面來施行氧化處理之狀態下,有呈變長地成長該凸狀部而使得其最大長度超過500nm之狀態發生,不容易形成在本申請案之所謂微細凹凸構造。於是,為了形成前述之微細凹凸構造,因此,最好是將包含可以抑制具備載子箔之銅箔之兩面之氧化之氧化抑制劑之鹼溶液予以使用。 For example, when the roughening treatment by the wet method described above is carried out, it is preferred to use an alkali solution such as a sodium hydroxide solution. By using an alkali solution, both sides of the copper foil provided with the carrier foil can be oxidized, and a copper composite compound containing copper oxide as a main component in a needle shape or a plate shape can be formed on both surfaces of the copper foil provided with the carrier foil. The convex part of the composition. Here, in the state where the oxidation treatment is performed on both surfaces of the copper foil provided with the carrier foil by the alkali solution, the convex portion is grown to have a maximum length exceeding 500 nm, which is not easy. The so-called fine concavo-convex structure formed in the present application. Then, in order to form the above-described fine concavo-convex structure, it is preferable to use an alkali solution containing an oxidation inhibitor which can suppress oxidation of both surfaces of the copper foil provided with the carrier foil.

作為此種氧化抑制劑係可以列舉例如胺基系矽烷偶合劑。如果是使用包含胺基系矽烷偶合劑之鹼溶液而在具備載子箔之銅箔之兩面來施行氧化處理的話,則該鹼溶液中之胺基系矽烷偶合劑係可以吸附於具備載子箔之銅箔之兩面,抑制由於鹼溶液而造成之氧化。結果,可以抑制氧化銅之針狀結晶之成長,可以在具備載子箔之銅箔之兩面,形成極度微細之凹凸構造。 Examples of such an oxidation inhibitor include an amine-based decane coupling agent. If an alkali solution containing an amine-based decane coupling agent is used to perform oxidation treatment on both sides of a copper foil having a carrier foil, the amine-based decane coupling agent in the alkali solution can be adsorbed on the carrier-containing foil. Both sides of the copper foil suppress oxidation due to the alkali solution. As a result, the growth of the needle crystals of the copper oxide can be suppressed, and an extremely fine uneven structure can be formed on both surfaces of the copper foil provided with the carrier foil.

作為前述之胺基系矽烷偶合劑係可以具體地使用N-2-(胺乙基)-3-胺丙基甲基二甲氧基矽烷、N-2-(胺乙基)-3-胺丙基三甲氧基矽烷、3-胺丙基三甲氧基矽烷、 3-胺丙基三乙氧基矽烷、3-三乙氧基甲矽烷基-N-(1,3-二甲基-丁叉)丙基胺、N-苯基-3-胺丙基三甲氧基矽烷等。這些係皆溶解於鹼性溶液,安定地保持於鹼性溶液中,同時,發揮抑制前述之具備載子箔之銅箔之兩面之氧化之效果。 As the aforementioned amino decane coupling agent, N-2-(aminoethyl)-3-aminopropylmethyldimethoxydecane, N-2-(aminoethyl)-3-amine can be specifically used. Propyltrimethoxydecane, 3-aminopropyltrimethoxydecane, 3-aminopropyltriethoxydecane, 3-triethoxymethylidene-N-(1,3-dimethyl-butylidene)propylamine, N-phenyl-3-aminopropyltrimethyl Oxydecane, etc. These systems are all dissolved in an alkaline solution, and are stably held in an alkaline solution, and at the same time, exhibit an effect of suppressing oxidation of both surfaces of the copper foil having the carrier foil described above.

正如以上,藉由以包含胺基系矽烷偶合劑之鹼溶液而在具備載子箔之銅箔之兩面來施行氧化處理而形成之微細凹凸構造係即使是在後面,施行還原處理,也幾乎仍然維持其形狀。結果,可以形成粗化處理層,該粗化處理層係具有藉由包含氧化銅和氧化亞銅且由這些銅複合化合物所組成之最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造。此外,可以在還原處理,在使用XPS而對於藉由調整還原劑濃度、溶液pH值和溶液溫度等來形成微細凹凸構造之銅複合化合物之構成元素而進行定性分析時之所得到之Cu(I)之波峰相對於Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積之佔有面積率予以適當地調整。此外,如果例如是藉由具備載子箔之銅箔來浸漬於鹼溶液,而在具備載子箔之銅箔之兩面、也就是載子箔之外表面和整體銅層之外表面,分別形成以氧化銅來作為主成分之微細凹凸構造,然後,僅在整體銅層之外表面之粗化處理層來施行還原處理的話,則雷射光照射面係可以使得Cu(I)波峰之佔有率成為0%,和絕緣層構造材料之間之接合面係可以成為Cu(I)波峰之佔有率50%以上之具備載子箔之銅箔。在藉由XPS而分析以前面之方法來形成之微細凹凸構造之構成元素之時,檢測到「-COOH」之存在。 As described above, the fine concavo-convex structure formed by performing the oxidation treatment on both surfaces of the copper foil containing the carrier foil by the alkali solution containing the amine-based decane coupling agent is almost always performed after the reduction treatment. Maintain its shape. As a result, a roughening treatment layer having a needle-like or plate-like convex portion having a maximum length of 500 nm or less composed of copper oxide and cuprous oxide and composed of these copper composite compounds can be formed. A fine concavo-convex structure formed. Further, in the reduction treatment, Cu (I) obtained by qualitative analysis using a constituent element of a copper composite compound having a fine uneven structure by adjusting a reducing agent concentration, a solution pH, a solution temperature, or the like using XPS can be used. The peak area is appropriately adjusted with respect to the occupied area ratio of the total area between the peak area of Cu(I) and the peak area of Cu(II). Further, for example, it is immersed in an alkali solution by a copper foil provided with a carrier foil, and is formed on both surfaces of the copper foil having the carrier foil, that is, the outer surface of the carrier foil and the outer surface of the entire copper layer. In the fine concavo-convex structure in which copper oxide is used as a main component, and then the reduction treatment is performed only on the roughened layer on the outer surface of the entire copper layer, the laser light irradiation surface system can make the Cu(I) peak occupancy ratio become The joint surface between 0% and the insulating layer structural material may be a copper foil having a carrier foil having a Cu(I) peak occupancy ratio of 50% or more. When the constituent elements of the fine concavo-convex structure formed by the above method were analyzed by XPS, the presence of "-COOH" was detected.

正如前面之敘述,可以藉由濕式法而進行氧化處理及還原處理,因此,可以藉由在處理溶液中,來浸漬具備載子箔之銅箔等之方法,而在具備載子箔之銅箔之兩面,形成前述之微細凹凸構造。於是,在利用該濕式法而在具備載子箔之銅箔之兩面來形成微細凹凸構造之時,可以使得雷射光照射面側之雷射鑽孔加工性,變得良好,同時,可以藉著由於該微細凹凸構造來造成之奈米固定效果,而使得絕緣層構造材料和整體銅層之間之密合性,變得良好。此外,該微細凹凸構造係正如前面之敘述,耐擦傷性能變高,因此,即使是在具備載子箔之銅箔之兩面,來形成該微細凹凸構造,也容易處理,可以防止落粉等。 As described above, the oxidation treatment and the reduction treatment can be carried out by the wet method. Therefore, the copper foil having the carrier foil can be immersed in the treatment solution, and the copper having the carrier foil can be used. The above-mentioned fine concavo-convex structure is formed on both sides of the foil. Therefore, when the fine concavo-convex structure is formed on both surfaces of the copper foil provided with the carrier foil by the wet method, the laser drilling processability on the side of the laser beam irradiation surface can be improved, and at the same time, it is possible to borrow Due to the nano-fixing effect caused by the fine concavo-convex structure, the adhesion between the insulating layer structural material and the entire copper layer is improved. In addition, as described above, the fine uneven structure has a high scratch resistance. Therefore, even if the fine uneven structure is formed on both surfaces of the copper foil having the carrier foil, it is easy to handle, and powder falling or the like can be prevented.

1-3.矽烷偶合劑處理 1-3. Treatment of decane coupling agent

可以藉由在具備載子箔之銅箔,在前述整體銅層之外表面之粗化處理層之表面,設置矽烷偶合劑處理層,而改善在加工成為印刷電路板時之耐吸濕劣化特性。設置於該粗化處理面之矽烷偶合劑處理層係可以使用烯烴官能性矽烷、環氧官能性矽烷、乙烯基官能性矽烷、丙烯官能性矽烷、胺基官能性矽烷和巰基官能性矽烷之任何一種,來作為矽烷偶合劑而形成矽烷偶合劑處理層。這些矽烷偶合劑係藉由通式R-Si(OR’)n而表示(在此,R:胺基或乙烯基等之所表示之有機官能基,OR’:甲氧基或乙氧基等之所表示之水解基,n:2或3。)。 The ruthenium coupling agent treatment layer can be provided on the surface of the roughened layer on the outer surface of the entire copper layer by the copper foil provided with the carrier foil, thereby improving the moisture absorption deterioration resistance when processed into a printed circuit board. Any of the decane coupling agent treatment layers disposed on the roughening treatment surface may be any of an olefin functional decane, an epoxy functional decane, a vinyl functional decane, a propylene functional decane, an amine functional decane, and a thiol functional decane. One is to form a decane coupling agent treatment layer as a decane coupling agent. These decane coupling agents are represented by the general formula R-Si(OR')n (here, R: an organic functional group represented by an amine group or a vinyl group, OR': a methoxy group or an ethoxy group, etc. The hydrolyzed group represented by n, 2 or 3.).

作為在此之所謂矽烷偶合劑係能夠使用以相同於使用在印刷電路板用之黏合片之玻纖布之同樣之偶合劑來作 為中心之乙烯基三甲氧基矽烷、乙烯基苯基三甲氧基矽烷、γ-甲基丙烯醯基丙基三甲氧基矽烷、γ-環氧丙氧基丙基三甲氧基矽烷、4-環氧丙基丁基三甲氧基矽烷、γ-胺基丙基三乙氧基矽烷、N-β(胺乙基)γ-胺基丙基三甲氧基矽烷、N-3-(4-(3-胺基丙氧基)丁氧基)丙基-3-胺基丙基三甲氧基矽烷、咪唑矽烷、三嗪矽烷、3-丙烯氧化丙基甲氧基矽烷、γ-巰基丙基三甲氧基矽烷等。 As the so-called decane coupling agent used herein, the same coupling agent as that of the fiberglass cloth used for the adhesive sheet for printed circuit boards can be used. Centered vinyl trimethoxy decane, vinyl phenyl trimethoxy decane, γ-methyl propylene propyl propyl trimethoxy decane, γ-glycidoxypropyl trimethoxy decane, 4-ring Oxypropyl propyl trimethoxy decane, γ-aminopropyl triethoxy decane, N-β (aminoethyl) γ-aminopropyl trimethoxy decane, N-3-(4-(3) -Aminopropoxy)butoxy)propyl-3-aminopropyltrimethoxydecane, imidazolium, triazine decane, 3-propene oxide propyl methoxy decane, γ-mercaptopropyltrimethoxy Base decane and the like.

在此列舉之矽烷偶合劑係對於成為印刷電路板之後之特性,無造成不良之影響。在該矽烷偶合劑之中而是否使用任何一種類係可以配合該覆銅層積板之用途等而適度地選擇。 The decane coupling agent exemplified herein has no adverse effect on the characteristics after it becomes a printed circuit board. Whether or not any of the types of the decane coupling agent can be used can be appropriately selected in accordance with the use of the copper clad laminate or the like.

前述之矽烷偶合劑係最好是使用成為室溫水準之溫度之矽烷偶合劑處理液,該矽烷偶合劑處理液係含有以水來作為主要溶媒而該矽烷偶合劑成分為0.5g/L~10g/L之濃度範圍。在該矽烷偶合劑處理液之矽烷偶合劑濃度低於0.5g/L之狀態下,矽烷偶合劑之吸附速度係變得緩慢,不合乎一般商業基底之採算,吸附也變得不均勻。另一方面,即使是該矽烷偶合劑濃度超過10g/L,也無特別加速吸附之速度,無特別提高耐吸濕劣化性等之性能品質,變得不經濟,因此,變得不理想。 Preferably, the decane coupling agent is a decane coupling agent treatment liquid which is a temperature at a room temperature level, and the decane coupling agent treatment liquid contains water as a main solvent and the decane coupling agent component is 0.5 g/L to 10 g. /L concentration range. In the state where the concentration of the decane coupling agent in the decane coupling agent treatment liquid is less than 0.5 g/L, the adsorption rate of the decane coupling agent becomes slow, which is not compatible with the calculation of a general commercial substrate, and the adsorption also becomes uneven. On the other hand, even if the concentration of the decane coupling agent exceeds 10 g/L, the speed of adsorption is not particularly accelerated, and the performance quality such as moisture absorption deterioration resistance is not particularly improved, which is uneconomical, and therefore, it is not preferable.

使用該矽烷偶合劑處理液而矽烷偶合劑對於粗化處理層之表面之吸附方法係可以採用浸漬法、噴淋環圈法、噴霧法等,並無特別限定。也就是說,可以是配合製程之設計而能夠呈最均勻地接觸該粗化處理層之表面和矽烷偶合劑處理 液來進行吸附之方法。 The decane coupling agent treatment liquid and the decane coupling agent may be a method of adsorbing the surface of the roughened layer by a dipping method, a shower ring method, a spray method, or the like, and are not particularly limited. That is to say, it can be designed to match the surface of the roughened layer and the decane coupling agent in the most uniform manner. Liquid to carry out the adsorption method.

在該粗化處理層之表面來吸附矽烷偶合劑之後,進行充分之乾燥,促進位處於該粗化處理層之表面之-OH基和吸附之矽烷偶合劑之間之縮合反應,完全地蒸發由於縮合之結果而產生之水份。關於此時之乾燥方法,並無特別之限定。例如即使是使用電熱器,即使是吹附溫風之衝風法,也無特別之限制,可以採用配合於製造線之乾燥方法和乾燥條件。但是,在以上說明之矽烷偶合劑處理係為了提高和絕緣層構造材料之間之密合性而對於整體銅層之外表面之粗化處理層來施行之處理,並不需要施行於載子箔之外表面之粗化處理層。 After adsorbing the decane coupling agent on the surface of the roughened layer, sufficient drying is performed to promote a condensation reaction between the -OH group at the surface of the roughened layer and the adsorbed decane coupling agent, completely evaporating due to The water produced as a result of the condensation. There is no particular limitation on the drying method at this time. For example, even if an electric heater is used, there is no particular limitation on the method of blowing the warm air, and a drying method and drying conditions suitable for the production line can be employed. However, the above-described decane coupling agent treatment is performed for the roughening treatment layer on the outer surface of the entire copper layer in order to improve the adhesion with the insulating layer structural material, and does not need to be applied to the carrier foil. The roughened layer of the outer surface.

1-4.粗化處理層表面之亮度L* 1-4. The brightness of the surface of the roughened layer L *

正如前面之敘述,構成微細凹凸構造之最大長度為500nm以下之針狀或板狀之凸狀部係藉由更加短於二氧化碳氣體雷射之波長並且更加短於可見光之波長區域之間距而進行配列。入射至該粗化處理層表面之光線係在微細凹凸構造內,重覆地進行混亂反射,結果,發生衰減。也就是說,該粗化處理層之表面係發揮作為吸光面之機能,該粗化處理層之表面係比較於粗化處理前之時,進行暗色化而成為黑色、茶褐色等。也就是說,本申請案之覆銅層積板係也在使用作為雷射光吸收層之載子箔之外表面之粗化處理層之表面之色調,具有特色,L*a*b*表色系之亮度L*係30以下,最好是25以下。在該亮度L*之值超過30而成為明亮之色調時,有構成該微細凹凸構造之前述凸狀部之最大長度超過500nm之狀態發生,因此,變得不理想。此外,在亮度L*之值超過30之狀態下,即 使是前述凸狀部之最大長度為500nm以下,也有該凸狀部無法呈充分密集地設置於載子箔之外表面之狀態發生。也就是說,認為在亮度L*之值超過30之狀態下,粗化處理之狀態係不充分,或者是在粗化處理之狀態,有不均勻發生,並非透過載子箔而在整體銅層來適合於雷射鑽孔加工之狀態,變得不理想。接著,在該亮度L*成為25以下之時,前述粗化處理層之表面係成為適合於雷射鑽孔加工之更加理想狀態。此外,亮度L*之測定係使用日本電色工業股份有限公司製之分光色差計SE2000,為了亮度之校正,因此,在測定裝置,使用附屬之白色板,按照JIS Z8722:2000而進行測定。接著,關於同一部位,進行3次之測定,以3次之亮度L*之測定資料之平均值,來作為本申請案之所謂亮度L*之值。此外,即使是關於設置在整體銅層之外表面之粗化處理層,即使是在得到和絕緣層構造材料之間之良好之密合性之方面,亮度L*之值係也相同於設置在載子箔之外表面之粗化處理層。但是,即使是對於設置在整體銅層之外表面之粗化處理層來施行前述之矽烷偶合劑處理之狀態下,也在其前後,在該粗化處理層之表面之亮度L*之值,無變動發生。 As described above, the acicular or plate-like convex portions having a maximum length of 500 nm or less constituting the fine concavo-convex structure are arranged by being shorter than the wavelength of the carbon dioxide gas laser and shorter than the wavelength range of the visible light. . The light incident on the surface of the roughened layer is in the fine concavo-convex structure, and is repeatedly subjected to chaotic reflection, and as a result, attenuation occurs. That is, the surface of the roughened layer functions as a light absorbing surface, and the surface of the roughened layer is darkened to be black, brown or the like as compared with the case before the roughening treatment. That is, the copper-clad laminate of the present application is also characterized by the color tone of the surface of the roughened layer on the outer surface of the carrier foil as the laser light absorbing layer, and has a characteristic L * a * b * color The brightness L * is 30 or less, preferably 25 or less. When the value of the luminance L * exceeds 30 and becomes a bright color tone, the maximum length of the convex portion constituting the fine concavo-convex structure exceeds 500 nm, which is undesirable. Further, in a state where the value of the luminance L * exceeds 30, even if the maximum length of the convex portion is 500 nm or less, the convex portion may not be sufficiently densely disposed on the outer surface of the carrier foil. In other words, it is considered that the state of the roughening treatment is insufficient in the state where the value of the luminance L * exceeds 30, or the unevenness occurs in the state of the roughening treatment, and the entire copper layer is not transmitted through the carrier foil. It is suitable for the state of laser drilling and is not ideal. Next, when the luminance L * is 25 or less, the surface of the roughened layer is more suitable for laser drilling. In addition, the measurement of the luminance L * was carried out by using a spectrophotometer SE2000 manufactured by Nippon Denshoku Industries Co., Ltd., and the brightness was corrected. Therefore, the measurement device was measured in accordance with JIS Z8722:2000 using an attached white plate. Next, the same portion was measured three times, and the average value of the measured data of the luminance L * of three times was used as the value of the so-called luminance L * in the present application. Further, even in the case of the roughened layer provided on the outer surface of the entire copper layer, the value of the luminance L * is the same even in the case of obtaining a good adhesion with the insulating layer structural material. The roughened layer of the outer surface of the carrier foil. However, even in the state in which the above-described decane coupling agent treatment is performed on the roughened layer provided on the outer surface of the entire copper layer, the value of the luminance L * on the surface of the roughened layer before and after the film is No change occurs.

2.雷射鑽孔加工法之基本概念 2. The basic concept of laser drilling method

接著,參考圖4,同時,就使用前述之覆銅層積板而施行雷射鑽孔加工之方法,來進行說明。在此,列舉在具有相同於圖1(1-A)所示之形態之同樣之層構造之覆銅層積板1來施行雷射鑽孔加工之狀態,作為例子而進行說明。本申請案之覆銅層積板1係在絕緣層構造材料5之至少單面,層積本 申請案之具備載子箔之銅箔11之整體銅層14之接合層側。因此,正如圖4(A)所示,照射雷射光之側之面(雷射照射面)係成為具備載子箔之銅箔11之載子箔12之外表面。在載子箔12之外表面,具備具有前述微細凹凸構造之粗化處理層,因此,如果是由載子箔12之外表面側開始照射雷射光的話,則可以同時對於載子箔12和整體銅層14,來進行雷射鑽孔。然後,可以藉由剝離載子箔12,而由整體銅層之表面開始,一起除去存在於藉由雷射鑽孔加工之所形成之導通孔之開口部之周圍之濺疤以及載子箔,可以形成開口部之周圍為平坦之圖4(B)所示之導通孔10。 Next, referring to Fig. 4, a description will be given of a method of performing laser drilling processing using the above-described copper clad laminate. Here, a state in which the copper-clad laminate 1 having the same layer structure as that of the embodiment shown in Fig. 1 (1-A) is subjected to laser drilling is described as an example. The copper clad laminate 1 of the present application is on at least one side of the insulating layer construction material 5, and the laminated product The bonding layer side of the entire copper layer 14 of the copper foil 11 containing the carrier foil of the application. Therefore, as shown in FIG. 4(A), the surface on which the laser light is irradiated (the laser irradiation surface) is the outer surface of the carrier foil 12 having the copper foil 11 of the carrier foil. The outer surface of the carrier foil 12 is provided with a roughened layer having the fine uneven structure. Therefore, if the laser beam is irradiated from the outer surface side of the carrier foil 12, the carrier foil 12 and the entire carrier foil can be simultaneously provided. The copper layer 14 is used for laser drilling. Then, by peeling off the carrier foil 12, starting from the surface of the entire copper layer, the splash and the carrier foil existing around the opening of the via hole formed by the laser drilling process can be removed together. The via hole 10 shown in FIG. 4(B) in which the periphery of the opening portion is flat can be formed.

在此,在本申請案,關於藉由在成為雷射光照射面之載子箔之外表面來設置前述之粗化處理層而提高雷射鑽孔加工性能之理由,來進行考量。首先,藉由載子箔之外表面來成為前述之粗化處理層,而正如前面之敘述,該粗化處理層之表面成為黑色或茶褐色之消光面,抑制雷射光之反射。結果,可以使得雷射光之熱能,呈效率良好地賦予至雷射光照射部位。相對於此,在覆銅層積板之雷射光照射面為銅層(所謂載子箔或整體銅層。在以下相同。)本身之狀態下,只要是在表面無施行粗化處理或黑化處理等的話,則銅層之表面係成為鏡面,反射雷射光,因此,無法使得雷射光之熱能呈效率良好地賦予至雷射光照射部位。 Here, in the present application, consideration is given to the reason why the above-described roughened layer is provided on the outer surface of the carrier foil which is the irradiation surface of the laser light to improve the laser drilling performance. First, the roughened layer is formed by the outer surface of the carrier foil, and as described above, the surface of the roughened layer becomes a black or brownish matte surface, and the reflection of the laser light is suppressed. As a result, the thermal energy of the laser light can be efficiently supplied to the laser light irradiation portion. On the other hand, in the state in which the laser light irradiation surface of the copper clad laminate is a copper layer (so-called carrier foil or integral copper layer, the same applies hereinafter), as long as the surface is not roughened or blackened. In the case of processing or the like, the surface of the copper layer is a mirror surface and reflects the laser light. Therefore, the thermal energy of the laser light cannot be efficiently supplied to the laser light irradiation portion.

此外,相對於銅之沸點為2562℃,氧化銅和氧化亞銅之沸點係分別為2000℃、1800℃,在比較於銅之時,氧化銅和氧化亞銅之沸點係比較低。因此,在雷射光來照射於前述 粗化處理層之表面時,在比較於銅層本身為雷射光照射面之狀態,粗化處理層表面之雷射照射部位係迅速地達到至沸點。另一方面,銅之熱傳導率係在700℃,成為354W.m-1.K-1,相對地,氧化銅和氧化亞銅之熱傳導率係皆在700℃,成為20W.m-1.K-1以下。也就是說,氧化銅和氧化亞銅之熱傳導率係相對於銅之熱傳導率而變得極為小。另一方面,氧化銅和氧化亞銅之熔點係分別為1201℃、1235℃,相對地,銅之熔點係變低成為1083℃。因此,在比較於銅層本身為雷射光照射面之狀態之時,在前述粗化處理層之表面來照射雷射光之狀態下,熱能傳達至雷射照射部位之外側之速度係變得緩慢。結果,可以使得熱能集中於深度方向,可以容易使得載子箔和整體銅層之溫度,成為熔點以上。因此,可以藉著由前述之銅複合化合物而組成之微細凹凸構造,來設置於雷射光照射面,而在比較於銅層本身為雷射光照射面之狀態之時,呈效率良好地進行雷射鑽孔加工。 Further, the boiling point of copper relative to copper is 2562 ° C, and the boiling points of copper oxide and cuprous oxide are 2000 ° C and 1800 ° C, respectively, and the boiling points of copper oxide and cuprous oxide are relatively low when compared with copper. Therefore, when the laser light is irradiated onto the surface of the roughened layer, the laser irradiation portion on the surface of the roughened layer rapidly reaches the boiling point in a state where the copper layer itself is irradiated with the laser light. On the other hand, the thermal conductivity of copper is at 700 ° C, which is 354 W. m -1 . K -1 , relatively, the thermal conductivity of copper oxide and cuprous oxide are both at 700 ° C, becoming 20 W. m -1 . K -1 or less. That is, the thermal conductivity of copper oxide and cuprous oxide becomes extremely small with respect to the thermal conductivity of copper. On the other hand, the melting points of copper oxide and cuprous oxide are 1201 ° C and 1235 ° C, respectively, and the melting point of copper is relatively low to 1083 ° C. Therefore, when the copper layer itself is in the state of being irradiated with the laser light, the speed at which the thermal energy is transmitted to the outside of the laser irradiation portion is slow in the state where the surface of the roughened layer is irradiated with the laser light. As a result, the heat energy can be concentrated in the depth direction, and the temperature of the carrier foil and the entire copper layer can be easily made higher than the melting point. Therefore, it can be provided on the laser beam irradiation surface by the fine concavo-convex structure composed of the copper composite compound described above, and the laser beam can be efficiently performed when the copper layer itself is in the state of the laser beam irradiation surface. Drilling processing.

<印刷電路板之形態> <Form of printed circuit board>

本申請案之印刷電路板,其特徵為:具備使用本申請案之具備載子箔之銅箔之整體銅層而形成之銅層;可以使用本申請案之覆銅層積板而進行製造。此外,在本申請案之印刷電路板,最好是在該銅層,具備藉由雷射鑽孔加工而形成之導通孔。例如可以成為藉由圖5~圖7所示之增層製程而製造之多層印刷電路板。 The printed circuit board of the present application is characterized in that it has a copper layer formed by using the entire copper layer of the copper foil with a carrier foil of the present application, and can be manufactured by using the copper clad laminate of the present application. Further, in the printed circuit board of the present application, it is preferable that the copper layer is provided with via holes formed by laser drilling. For example, it can be a multilayer printed circuit board manufactured by the build-up process shown in FIGS. 5 to 7.

在以下,合併本申請案之印刷電路板之形態和製造方法,參考圖5~圖7,同時,進行說明。但是,本申請案 之印刷電路板之層構造或製造方法等係並非限定於以下說明之形態,如果是具備使用本申請案之具備載子箔之銅箔之整體銅層而形成之銅層的話,則也可以包含任何一種形態。 In the following, the form and manufacturing method of the printed circuit board of the present application will be described with reference to FIGS. 5 to 7. However, this application The layer structure or the manufacturing method of the printed circuit board is not limited to the form described below, and may be included if the copper layer is formed using the entire copper layer of the copper foil with the carrier foil of the present application. Any form.

在圖5~圖7,顯示藉由所謂增層法而造成之多層印刷電路板之製造製程之一例。例如圖5(A)所示,在具備內層電路8之內層基板9之兩面,透過黏合片.樹脂薄膜等之絕緣層構造材料5而層積具備「載子箔12/剝離層13/整體銅層14」之層構造之具備載子箔之銅箔11,得到具備載子箔之第1增層積層體40。此時,可以僅在絕緣層構造材料5之某一面側,層積該具備載子箔之銅箔11。在該圖5(A)所示之例子,圖示作為內層基板9係在其兩面,具備內層電路8,形成層間連接用之場導通孔(導通孔)10。但是,內層基板9係並非限定於圖5(A)所示之形態,其層構造等係可以是任何一種。 In Figs. 5 to 7, an example of a manufacturing process of a multilayer printed circuit board by a so-called build-up method is shown. For example, as shown in FIG. 5(A), on both sides of the inner substrate 9 having the inner layer circuit 8, the adhesive sheet is passed through. A copper foil 11 having a carrier foil having a layer structure of "a carrier foil 12 / a release layer 13 / an entire copper layer 14" is laminated on the insulating layer structural material 5 such as a resin film, and the first increase in the carrier foil is obtained. The layered body 40 is laminated. At this time, the copper foil 11 provided with the carrier foil may be laminated only on one side of the insulating layer structural material 5. In the example shown in FIG. 5(A), the inner layer substrate 9 is provided on both surfaces thereof, and the inner layer circuit 8 is provided to form field via holes (via holes) 10 for interlayer connection. However, the inner layer substrate 9 is not limited to the one shown in FIG. 5(A), and the layer structure or the like may be any.

接著,正如圖6(B)所示,在具備載子箔之第1增層積層體40之載子箔12之粗化處理層4之表面,照射雷射光,進行雷射鑽孔加工。在完成該雷射鑽孔加工之時,藉由以剝離層13,來剝離載子箔12,而除去存在於藉由雷射鑽孔加工之所形成之孔洞之開口部周圍之濺疤之全部,露出無濺疤之潔淨之整體銅層14之表面,成為圖6(C)所示之具備第1增層之層積體41之狀態。此外,在圖6(B)所示之具備載子箔之第1增層積層體40之狀態下,存在於其兩表面來設置具有前述微細凹凸構造之粗化處理層4之載子箔12,因此,可以由該具備載子箔之第1增層積層體40之兩面開始,容易進行雷 射鑽孔加工。接著,施行用以除去由於雷射鑽孔加工而產生之樹脂殘渣之除膠渣處理,對於導通孔內,進行電鍍填充而成為場導通孔10,同時,在整體銅層之表面,形成電鍍層24。接著,可以藉由進行蝕刻加工,形成第1增層配線層31,而形成圖7(D)所示之具備第1增層配線層之層積體42。 Next, as shown in FIG. 6(B), the surface of the roughened layer 4 of the carrier foil 12 of the first buildup layered body 40 having the carrier foil is irradiated with laser light to perform laser drilling. At the time of completion of the laser drilling process, the carrier foil 12 is peeled off by the peeling layer 13, and all the splashes existing around the opening portion of the hole formed by the laser drilling process are removed. The surface of the entire copper layer 14 which is clean without splashing is exposed, and the laminated body 41 having the first buildup shown in Fig. 6(C) is in a state. Further, in the state in which the first buildup layered body 40 having the carrier foil shown in Fig. 6(B) is present, the carrier foil 12 having the roughened layer 4 having the fine uneven structure is provided on both surfaces thereof. Therefore, it is possible to easily perform the thunder from the both sides of the first buildup layered body 40 having the carrier foil. Shot drilling. Next, a desmear process for removing the resin residue generated by the laser drilling process is performed, and the via hole 10 is formed by plating and filling in the via hole, and a plating layer is formed on the surface of the entire copper layer. twenty four. Then, the first build-up wiring layer 31 can be formed by etching, and the laminate 42 having the first build-up wiring layer shown in FIG. 7(D) can be formed.

此外,在圖7(D)所示之具備第1增層配線層之層積體42之兩面來透過黏合片.樹脂薄膜等之絕緣層構造材料5而層積具備載子箔之銅箔11之時,成為具備圖7(E)所示之第2增層配線層32之具備載子箔之第2增層積層體43。像這樣,也可以藉由配合需要而重覆地進行相同於圖6(B)、圖6(C)和圖7(D)之同樣之操作,來成為具備第n電路圖案層(n≧3:整數)之增層積層體。此時,也最好是使用具備用以在整體銅層14之外表面來構成絕緣層之樹脂層之具備樹脂層之具備載子箔之銅箔,來取代絕緣層構造材料5和具備前述之「載子箔12/剝離層13/整體銅層14」之層構造之具備載子箔之銅箔11之使用。 In addition, the two sides of the laminate 42 having the first build-up wiring layer shown in Fig. 7 (D) are passed through the adhesive sheet. When the copper foil 11 having the carrier foil is laminated on the insulating layer structural material 5 such as a resin film, the second buildup layer provided with the carrier foil having the second build-up wiring layer 32 shown in FIG. 7(E) is provided. Laminate 43. In this manner, the same operation as in FIG. 6(B), FIG. 6(C), and FIG. 7(D) can be repeatedly performed by the need of the cooperation to form the n-th circuit pattern layer (n≧3). : integer) layered layer body. In this case, it is also preferable to use a copper foil having a carrier foil provided with a resin layer for forming a resin layer on the outer surface of the entire copper layer 14 instead of the insulating layer structural material 5 and the foregoing. The use of a copper foil 11 having a carrier foil of a layer structure of "carrier foil 12 / release layer 13 / overall copper layer 14".

接著,完成最後之層積之多層積層板係配合需要而施行雷射鑽孔加工,施行用以除去由於雷射鑽孔加工而產生之樹脂殘渣之除膠渣處理,對於導通孔內,進行電鍍填充而成為場導通孔,同時,在整體銅層之表面,形成電鍍層,然後,對於外層之銅層,進行蝕刻加工等,形成外層電路而成為多層印刷電路板。 Then, laser drilling processing is performed to complete the multi-layer laminated board of the final layer, and the desmear treatment for removing the resin residue generated by the laser drilling process is performed, and plating is performed in the via hole. The surface is filled to form a field via, and a plating layer is formed on the surface of the entire copper layer. Then, the copper layer of the outer layer is etched or the like to form an outer layer circuit to form a multilayer printed circuit board.

本申請案之印刷電路板係可以藉由使用本申請案之具備載子箔之銅箔11,進行製造,而在雷射鑽孔加工後,以 剝離層13,來剝離載子箔12,而完全地除去存在於藉由雷射鑽孔加工之所形成之導通孔之開口部周圍之濺疤。因此,可以使得導通孔之開口部周圍之整體銅層之表面成為潔淨狀態,藉由電鍍加工.蝕刻加工等而進行導通孔內之電鍍之填充或電路之形成。此外,可以藉由整體銅層14之外表面之粗化處理層4而得到粗化處理層和構成層間絕緣層之絕緣層構造材料5之間之良好之接合性。 The printed circuit board of the present application can be manufactured by using the copper foil 11 with carrier foil of the present application, and after laser drilling, The peeling layer 13 peels off the carrier foil 12, and completely removes the spatter existing around the opening of the via hole formed by the laser drilling process. Therefore, the surface of the entire copper layer around the opening of the via hole can be made clean, by electroplating. The filling or plating of the plating in the via hole is performed by etching or the like. Further, the adhesion between the roughened layer and the insulating layer material 5 constituting the interlayer insulating layer can be obtained by roughening the layer 4 on the outer surface of the entire copper layer 14.

在以下,透過實施例及比較例,關於使用本申請案之具備載子箔之銅箔而製造覆銅層積板和印刷電路板時之技術優勢性,來進行敘述。 Hereinafter, the technical advantages of producing a copper clad laminate and a printed circuit board using the copper foil of the carrier foil of the present application will be described by way of examples and comparative examples.

【實施例1】 [Example 1]

正如以下而製作本申請案之具備載子箔之銅箔。首先,準備具有「載子箔/剝離層/整體銅層」之層構造之未處理之具備載子箔之銅箔。作為該未處理之具備載子箔之銅箔係使用由載子箔之外表面之表面粗糙度(Rzjis)為5.3μm、光澤度[Gs(60°)]為2.1、載子箔之厚度為12μm、整體銅層之厚度為1.5μm以及剝離層包含1,2,3-苯并三唑之有機剝離層而組成者。得到本申請案之具備載子箔之銅箔,係藉由以下之程序而對於該未處理之具備載子箔之銅箔之載子箔之外表面和整體銅層之外表面,來施行表面處理,在其兩面,具備粗化處理層。此外,表面粗糙度、表面積比和光澤度之測定方法係正如以下。 A copper foil with a carrier foil of the present application was produced as follows. First, an unprocessed copper foil with a carrier foil having a layer structure of "carrier foil/release layer/whole copper layer" was prepared. As the untreated copper foil with a carrier foil, the surface roughness (Rzjis) of the outer surface of the carrier foil was 5.3 μm, the gloss [Gs (60°)] was 2.1, and the thickness of the carrier foil was The composition is 12 μm, the thickness of the entire copper layer is 1.5 μm, and the release layer contains an organic release layer of 1,2,3-benzotriazole. The copper foil with a carrier foil of the present application is obtained by applying the surface to the outer surface of the unprocessed copper foil with a carrier foil and the outer surface of the entire copper layer by the following procedure. The treatment has a roughening treatment layer on both sides. Further, the methods of measuring the surface roughness, the surface area ratio, and the gloss are as follows.

[粗糙度之測定] [Measurement of roughness]

使用小坂研究所製之觸針式表面粗糙度計 SE3500,按照JIS B 0601-2001而進行表面粗糙度之測定。 Using a stylus surface roughness meter made by Otaru Research Institute SE3500 was measured for surface roughness in accordance with JIS B 0601-2001.

[表面積比之測定] [Measurement of surface area ratio]

使用KEYENCE股份有限公司製之雷射顯微鏡VK-X100,根據在藉由雷射法而測定57570μm2之二次元區域時之表面積A,按照前述之計算式而求出表面積比(B)。 Using a laser microscope VK-X100 manufactured by KEYENCE Co., Ltd., the surface area ratio (B) was determined according to the above calculation formula based on the surface area A when a secondary region of 57570 μm 2 was measured by a laser method.

[光澤度之測定] [Measurement of gloss]

使用日本電色工業股份有限公司製之光澤度計PG-1M型,按照成為光澤度之測定方法之JIS Z 8741-1997而進行光澤度之測定。 Glossiness was measured in accordance with JIS Z 8741-1997, which is a method for measuring glossiness, using a gloss meter PG-1M manufactured by Nippon Denshoku Industries Co., Ltd.

在對於該具備載子箔之銅箔來施行預備處理後,施行粗化處理。在以下,依序地進行說明。 After the preliminary treatment is performed on the copper foil provided with the carrier foil, the roughening treatment is performed. In the following, the description will be made in order.

預備處理:將該具備載子箔之銅箔,浸漬於氫氧化鈉水溶液,進行鹼脫脂及水洗。接著,在將該鹼脫脂之具備載子箔之銅箔來浸漬於硫酸濃度為5質量%之硫酸系水溶液1分鐘之後,進行水洗。 Preparation treatment: The copper foil containing the carrier foil was immersed in an aqueous sodium hydroxide solution, and subjected to alkali degreasing and water washing. Next, the copper foil containing the carrier foil degreased with the alkali was immersed in a sulfuric acid-based aqueous solution having a sulfuric acid concentration of 5 mass% for 1 minute, and then washed with water.

粗化處理:對於施行前述預備處理之具備載子箔之銅箔,來施行氧化處理。在氧化處理,將該具備載子箔之銅箔11,以規定之氧化處理時間(1分鐘、2分鐘、4分鐘、10分鐘),浸漬於包含液溫70℃、pH值=12、亞氯酸濃度150g/L、N-2-(胺乙基)-3-胺丙基三甲氧基矽烷濃度10g/L之氫氧化鈉溶液,在具備載子箔之銅箔11之兩面,形成含有氧化銅之銅化合物。 Roughening treatment: An oxidation treatment is performed on the copper foil with a carrier foil subjected to the aforementioned preliminary treatment. In the oxidation treatment, the copper foil 11 containing the carrier foil is immersed in a predetermined oxidation treatment time (1 minute, 2 minutes, 4 minutes, 10 minutes) at a liquid temperature of 70 ° C, pH = 12, and chlorine. A sodium hydroxide solution having an acid concentration of 150 g/L and a N-2-(aminoethyl)-3-aminopropyltrimethoxydecane concentration of 10 g/L is formed to contain oxidation on both surfaces of the copper foil 11 having a carrier foil. Copper copper compound.

接著,將完成氧化處理之具備載子箔之銅箔,浸漬在使用碳酸鈉和氫氧化鈉而調整成為pH值=12之二甲基胺 硼烷濃度20g/L之水溶液(室溫)之中1分鐘,施行還原處理,進行水洗及乾燥。藉由這些製程而得到在載子箔之外表面及整體銅層之外表面來具備本申請案之微細凹凸構造之4種類之具備載子箔之銅箔。 Next, the copper foil containing the carrier foil which has been subjected to the oxidation treatment is immersed in a dimethylamine adjusted to pH = 12 using sodium carbonate and sodium hydroxide. The solution was subjected to a reduction treatment for 1 minute in an aqueous solution (room temperature) having a borane concentration of 20 g/L, and washed with water and dried. By these processes, four kinds of copper foils having a carrier foil having the fine concavo-convex structure of the present application are provided on the outer surface of the carrier foil and the outer surface of the entire copper layer.

以這些4種類之具備載子箔之銅箔,來作為試料,使用XPS而對於各試料之載子箔之粗化處理層之表面,來進行定性分析。結果,在全試料,明瞭地確認「氧化銅」、「氧化亞銅」之存在。各試料之Cu(I)之波峰相對於Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積之佔有面積率係分別正如表1所示。此外,藉由該定性分析之結果而明瞭地確認在全部之試料,存在「-COO基」。在表1,一起整理及顯示Cu(I)之波峰之佔有面積率以及各試料之載子箔之外表面之粗化處理層表面之Kr吸附比表面積和亮度L*。此外,在表1,將「Kr吸附比表面積」,僅單純地顯示為「比表面積」。 These four types of copper foils containing carrier foils were used as samples, and the surface of the roughened layer of the carrier foil of each sample was subjected to qualitative analysis using XPS. As a result, in the entire sample, the existence of "copper oxide" and "copper oxide" was clearly confirmed. The occupied area ratio of the total area of the peak of Cu(I) of each sample with respect to the peak area of Cu(I) and the peak area of Cu(II) is shown in Table 1, respectively. Further, from the results of the qualitative analysis, it was confirmed that "-COO group" exists in all the samples. In Table 1, the occupied area ratio of the peak of Cu(I) and the Kr adsorption specific surface area and the luminance L * of the surface of the roughened layer on the outer surface of the carrier foil of each sample were collectively arranged and displayed. In addition, in Table 1, "Kr adsorption specific surface area" is simply shown as "specific surface area".

此外,將前述之4種類之試料,分別抵接於絕緣層構造材料之兩面,使用真空沖壓機,以沖床壓力3.9MPa、溫度220℃、沖壓時間90分鐘之條件,來進行層積。但是,作為絕緣層構造材料係使用三菱瓦斯化學股份有限公司製之黏合片(prepreg)GFPL-830NS。藉此而得到在絕緣層構造材料之兩面來具有具備載子箔之銅箔之覆銅層積板。 Further, the above-mentioned four kinds of samples were respectively brought into contact with both surfaces of the insulating layer structural material, and laminated using a vacuum press at a punching pressure of 3.9 MPa, a temperature of 220 ° C, and a pressing time of 90 minutes. However, as the insulating layer structural material, a prepreg GFPL-830NS manufactured by Mitsubishi Gas Chemical Co., Ltd. was used. Thereby, a copper clad laminate having a copper foil having a carrier foil on both surfaces of the insulating layer structural material was obtained.

此外,在藉由前述之方法而將前述之4種類之試料來層積於絕緣層構造材料之單面之後,剝離載子箔,在露出之整體銅層,附著及形成銅電鍍層,製作具備厚度18μm之銅層之覆銅層積板。接著,使用該試料,藉由蝕刻法而製作具備 0.4mm幅寬之剝離強度測定用之直線電路之試驗基板。接著,按照JIS C6481(1996)而測定各試驗基板之剝離強度。 In addition, after the above-mentioned four kinds of samples are laminated on one surface of the insulating layer structural material by the above-described method, the carrier foil is peeled off, and the copper plating layer is adhered and formed on the exposed entire copper layer, and is produced. A copper clad laminate of a copper layer having a thickness of 18 μm. Next, using this sample, it is produced by an etching method. A test substrate for a linear circuit for measuring the peel strength of 0.4 mm width. Next, the peel strength of each test substrate was measured in accordance with JIS C6481 (1996).

【實施例2】 [Example 2]

在實施例2,除了使用相同於實施例1之未處理之具備載子箔之銅箔,在對於完成預備處理之具備載子箔之銅箔而在其兩面來施行氧化處理(氧化處理時間2分鐘)之後,在載子箔之外表面,無施行還原處理,僅在整體銅層之外表面,噴淋.噴霧相同於實施例1之還原處理溶液,而施行還原處理以外,其餘係相同於實施例1,得到本申請案之微細凹凸構造來具備於載子箔之外表面和整體銅層之外表面之具備載子箔之銅箔。接著,相同於實施例1而求出Cu(I)之波峰相對於各面之Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積之佔有面積率、載子箔之粗化處理層表面之Kr吸附比表面積和亮度L*。將其結果顯示於表1。此外,即使是關於實施例2之具備載子箔之銅箔,也明瞭地確認「-COO基」之存在。此外,相同於實施例1而得到覆銅層積板,同時,製作剝離強度測定用之試驗基板,測定剝離強度。 In Example 2, except that the untreated copper foil with a carrier foil similar to that of Example 1 was used, the copper foil with the carrier foil for the preliminary treatment was subjected to oxidation treatment on both sides (oxidation treatment time 2 After the minute, on the outer surface of the carrier foil, no reduction treatment is applied, only on the outer surface of the whole copper layer, sprayed. The spray was the same as that of the reduction treatment solution of Example 1, except that the reduction treatment was carried out, and the same procedure as in Example 1 was carried out, and the fine concavo-convex structure of the present application was obtained to be provided on the outer surface of the carrier foil and the outer surface of the entire copper layer. Copper foil with carrier foil. Next, in the same manner as in Example 1, the occupied area ratio of the total area between the peak of Cu(I) and the peak area of Cu(I) of each surface and the peak area of Cu(II), and the carrier foil were determined. The Kr adsorption specific surface area and brightness L * of the surface of the roughened layer are roughened. The results are shown in Table 1. Further, even in the case of the copper foil provided with the carrier foil of Example 2, the existence of the "-COO group" was clearly confirmed. Further, a copper-clad laminate was obtained in the same manner as in Example 1, and a test substrate for measuring the peel strength was prepared, and the peel strength was measured.

【比較例】 [Comparative example]

[比較例1] [Comparative Example 1]

在比較例1,使用相同於實施例1之未處理之具備載子箔之銅箔,在其載子箔之外表面,無施行粗化處理,僅在整體銅層之外表面,施行習知之粗化處理(使用藉由硫酸銅系銅電解液而形成之微細銅粒子之粗化處理)。使用像這樣得到之比較例1之具備載子箔之銅箔,相同於實施例1而得到覆銅 層積板。 In Comparative Example 1, the untreated copper foil with a carrier foil similar to that of Example 1 was used, and the outer surface of the carrier foil was not subjected to roughening treatment, and only the outer surface of the entire copper layer was subjected to conventional practice. The roughening treatment (the roughening treatment of the fine copper particles formed by the copper sulfate-based copper electrolytic solution). Using the copper foil provided with the carrier foil of Comparative Example 1 obtained in this manner, copper was obtained in the same manner as in Example 1. Laminated board.

[比較例2] [Comparative Example 2]

在比較例2,使用相同於實施例1之未處理之具備載子箔之銅箔,施行相同於實施例1之預備處理,在兩面,施行黑化處理,並且,施行還原處理,在載子箔之外表面以及整體銅層之外表面,得到具備向來之還原黑化處理層之具備載子箔之銅箔。在以下,說明黑化處理以及還原處理之程序。 In Comparative Example 2, the copper foil with the carrier foil similar to that of Example 1 was used, and the preliminary treatment similar to that of Example 1 was carried out, blackening treatment was performed on both sides, and reduction treatment was carried out in the carrier. On the outer surface of the foil and the outer surface of the entire copper layer, a copper foil with a carrier foil having a conventional reduced blackening layer was obtained. In the following, the procedures of the blackening process and the restoration process will be described.

黑化處理:對於完成前述之預備處理之具備載子箔之銅箔,施行一般之黑化處理。在氧化處理,在含有成為Rohm and Haas電子材料股份有限公司製之氧化處理液之「PRO BOND 80A OXIDE SOLUTION」之10vol%和「PRO BOND 80B OXIDE SOLUTION」之20vol%之液溫85℃之水溶液,浸漬5分鐘,成為黑化處理。 Blackening treatment: A general blackening treatment is performed on the copper foil with a carrier foil which is subjected to the aforementioned preliminary treatment. In the oxidation treatment, an aqueous solution containing 10 vol% of "PRO BOND 80A OXIDE SOLUTION" which is an oxidation treatment liquid manufactured by Rohm and Haas Electronic Materials Co., Ltd. and 20 vol% of "PRO BOND 80B OXIDE SOLUTION" at a liquid temperature of 85 ° C is used. After immersion for 5 minutes, it became blackened.

還原處理:對於施行黑化處理之具備載子箔之銅箔,來施行還原處理。在還原處理,在含有成為Rohm and Haas電子材料股份有限公司製之還原處理液之「CIRCUPOS IT PB OXIDE CONVERTER 60C」之6.7vol%和「CUPOS IT Z」之1.5vol%之液溫35℃之水溶液,浸漬5分鐘,進行水洗及乾燥。藉由這些製程而得到具備一般之還原黑化處理層之具備載子箔之銅箔。接著,相同於實施例1而求出Cu(I)之波峰相對於各面之Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積之佔有面積率、載子箔之粗化處理層表面之Kr吸附比表面積以及亮度L*。將其結果顯示於表1。 Reduction treatment: A reduction treatment is performed on a copper foil having a carrier foil subjected to a blackening treatment. In the reduction treatment, an aqueous solution containing 6.7 vol% of "CIRCUPOS IT PB OXIDE CONVERTER 60C" which is a reducing treatment liquid manufactured by Rohm and Haas Electronic Materials Co., Ltd. and 1.5 vol% of "CUPOS IT Z" at a liquid temperature of 35 ° C , immersed for 5 minutes, washed with water and dried. By these processes, a copper foil with a carrier foil having a general reduced blackening layer is obtained. Next, in the same manner as in Example 1, the occupied area ratio of the total area between the peak of Cu(I) and the peak area of Cu(I) of each surface and the peak area of Cu(II), and the carrier foil were determined. The Kr adsorption specific surface area and the luminance L * of the surface of the roughened layer are roughened. The results are shown in Table 1.

此外,使用正如以上而得到之具備載子箔之銅 箔,相同於實施例1而得到覆銅層積板,同時,製作剝離強度測定用之試驗基板,測定剝離強度。 In addition, the copper with the carrier foil obtained as above is used. In the same manner as in Example 1, a copper-clad laminate was obtained, and a test substrate for measuring the peel strength was prepared, and the peel strength was measured.

[評價結果] [Evaluation results]

在以下之表1,顯示關於形成在實施例1、實施例2及比較例2所得到之具備載子箔之銅箔之載子箔表面之微細凹凸構造之比表面積、亮度L*、在整體銅層之外表面之粗化處理層側來層積於絕緣層構造材料時之剝離強度之測定結果。此外,在圖8,顯示使用在實施例1所得到之具備載子箔之銅箔而製作之電路幅寬8μm/電路間縫隙幅寬8μm之直線電路之掃描型電子顯微鏡之觀察圖像。 In Table 1 below, the specific surface area and the luminance L * of the fine concavo-convex structure formed on the surface of the carrier foil of the copper foil having the carrier foil obtained in Example 1, Example 2, and Comparative Example 2 are shown. The measurement result of the peeling strength at the time of the roughening of the outer surface of the copper layer to laminate the insulating layer structural material. Further, Fig. 8 shows an observation image of a scanning electron microscope using a linear circuit having a circuit width of 8 μm and an inter-circuit slit width of 8 μm, which was produced using the copper foil of the carrier foil obtained in Example 1.

由該表1而可以理解:即使是氧化處理時間來變動於1分鐘~10分鐘之間,也使得形成於實施例之具備載子箔之銅箔之載子箔之外表面之微細凹凸之凸狀部之最大長度係500nm以下,也無不同於微細凹凸之定性分析而檢測之內容。此外,即使是關於粗化處理層表面之亮度L*之值,也顯示18~25之偏差非常小之值。相對於此,Kr吸附比表面積係比例 於氧化處理時間之增加而使得值變大。於是,得知在該4種類之具備載子箔之銅箔之整體銅層外表面之接合層側來層積於絕緣層構造材料而測定剝離強度時,即使是最短之氧化處理時間,在實用上,也得到充分之剝離強度,得到比例於Kr吸附比表面積之值之剝離強度。由此而可以理解在實施例來採用之氧化處理時間係變得適當。 As can be understood from Table 1, even if the oxidation treatment time fluctuated between 1 minute and 10 minutes, the fine unevenness formed on the outer surface of the carrier foil of the copper foil with the carrier foil of the example was convex. The maximum length of the shape is 500 nm or less, and there is no difference from the qualitative analysis of the fine unevenness. Further, even with respect to the value of the luminance L * of the surface of the roughened layer, the value of the deviation of 18 to 25 is shown to be very small. On the other hand, the Kr adsorption specific surface area ratio is increased in the oxidation treatment time to make the value larger. Then, it is found that when the peeling strength is measured by laminating the insulating layer structure material on the bonding layer side of the outer surface of the entire copper layer of the copper foil having the carrier foil, the shortest oxidation treatment time is practical. Further, a sufficient peel strength was obtained, and a peel strength in which the ratio of the Kr adsorption specific surface area was obtained was obtained. From this, it can be understood that the oxidation treatment time employed in the examples becomes appropriate.

實施例和比較例1之間之對比:在此,就雷射鑽孔加工性能而進行檢討。相對於使用在實施例來得到之具備載子箔之銅箔之覆銅層積板以及在比較例1來得到之覆銅層積板,二氧化碳氣體雷射係成為雷射光源,由載子箔側開始照射雷射光。此時,採用遮罩直徑2.0mm、脈衝幅寬14μsec.、脈衝能19.3mJ、偏位0.8、雷射光徑153μm之雷射照射條件,預定在具備載子箔之覆銅層積板之整體銅層來形成60μm之加工直徑之孔洞,對於各覆銅層積板,進行100次發射之導通孔形成試驗。接著,在進行雷射之照射後,除去載子箔,判斷在形成於整體銅層之孔徑為60μm以上之狀態下而良好地進行加工。將其結果顯示於表2。 Comparison between Example and Comparative Example 1: Here, a review was made regarding the performance of laser drilling. The carbon dioxide gas laser system was a laser light source, and the carrier foil was used for the copper-clad laminate using the copper foil with a carrier foil obtained in the examples and the copper-clad laminate obtained in Comparative Example 1. The side begins to illuminate the laser light. At this time, a laser having a mask diameter of 2.0 mm, a pulse width of 14 μsec., a pulse energy of 19.3 mJ, a bias of 0.8, and a laser light path of 153 μm was used, and the copper was prepared in the copper-clad laminate having the carrier foil. The layer was formed to form a hole having a processing diameter of 60 μm, and a via hole formation test was performed for 100 times of each copper-clad laminate. Then, after the laser irradiation, the carrier foil was removed, and it was judged that the hole formed in the entire copper layer was 60 μm or more, and the processing was performed satisfactorily. The results are shown in Table 2.

由表2而得知:可以判斷在實施例之狀態下,在全部之覆銅層積板,能夠進行良好之雷射鑽孔加工。相對於此,在比較例1之狀態下,在適用於實施例之相同之雷射加工條件,不容易同時對於載子箔和整體銅層,進行鑽孔。此外,在表2之所謂開口率係進行100次發射之導通孔形成試驗而可以完成雷射鑽孔之發射數之比例。接著,所謂開口直徑分布係在測定藉由100次發射之導通孔形成試驗而得到之導通孔之開口直徑時之分布幅寬。 As is apparent from Table 2, it can be judged that in the state of the embodiment, it is possible to perform a good laser drilling process on all the copper-clad laminates. On the other hand, in the state of Comparative Example 1, it was not easy to simultaneously drill the carrier foil and the entire copper layer in the same laser processing conditions as applied to the examples. Further, in the so-called aperture ratio of Table 2, a via hole formation test was performed for 100 shots, and the ratio of the number of shots of the laser drilled hole was completed. Next, the opening diameter distribution is a distribution width when the opening diameter of the via hole obtained by the through hole forming test of 100 shots is measured.

實施例和比較例2之間之對比:在關於比較例2而相同於前面之敘述來評價雷射鑽孔加工性能時,比較例2之覆銅層積板之雷射鑽孔加工性能係同等於實施例。但是,在比較例2之覆銅層積板,在位處於其載子箔之外表面之還原黑化處理層之表面,有容易發生擦傷.摩擦等之傾向發生。發生擦傷.摩擦等之還原黑化處理層之表面係帶有光澤。在還原黑化處理層之表面帶有光澤之狀態下,顯著地降低雷射鑽孔加工性能,無法對於其覆銅層積板,施行雷射鑽孔加工。另一方面,在本申請案之雷射鑽孔加工用之具備載子箔之銅箔,無發生擦傷.摩擦等,無引起雷射鑽孔加工性能之降低。 Comparison between Example and Comparative Example 2: When the laser drilling performance was evaluated in the same manner as in Comparative Example 2, the laser drilling performance of the copper-clad laminate of Comparative Example 2 was equivalent. In the examples. However, in the copper clad laminate of Comparative Example 2, the surface of the reduced blackening layer on the outer surface of the carrier foil is liable to cause scratches. The tendency of friction and the like occurs. A bruise occurred. The surface of the reduced blackening layer such as friction is lustrous. In the state where the surface of the reduced blackening layer is glossy, the laser drilling performance is remarkably lowered, and the laser drilling process cannot be performed on the copper clad laminate. On the other hand, in the copper foil with carrier foil used in the laser drilling process of the present application, no scratches occur. Friction, etc., does not cause a reduction in the performance of laser drilling.

此外,使用在實施例1來得到之雷射鑽孔加工用之具備載子箔之銅箔以及在比較例1及比較例2所使用之具備載子箔之銅箔,嘗試藉由MSAP(Modified Semi Additive Process:改性半加成製程)工法而形成電路高度12μm、電路幅寬8μm/電路間縫隙幅寬8μm之直線電路。結果,在使用於實施例來得到之具備載子箔之銅箔之覆銅層積板之狀態下,由 圖8所示之掃描型電子顯微鏡之觀察圖像(圖8(a)為立體之觀察圖像,圖8(b)為剖面之觀察圖像)而得知:得到前述之直線電路。相對於此,在比較例1及比較例2所得到之覆銅層積板之狀態下,在比較於實施例之時,加長蝕刻之時間,無法得到前述之直線電路。因為直到完全地除去微細銅粒或還原黑化處理層為止,需要時間,在其間,進行電路之浸蝕,電路之高度變低,電路之幅寬也變細之緣故。因此,可以理解在藉由向來習知之微細銅粒或還原黑化處理而造成之粗化處理,不容易形成電路幅寬8μm/電路間縫隙幅寬8μm之電路。 Further, the copper foil with a carrier foil for laser drilling obtained in Example 1 and the copper foil with a carrier foil used in Comparative Example 1 and Comparative Example 2 were used, and an attempt was made by MSAP (Modified). Semi Additive Process: A linear circuit with a circuit height of 12 μm, a circuit width of 8 μm, and a gap width between circuits of 8 μm. As a result, in the state of using the copper-clad laminate having the copper foil of the carrier foil obtained in the examples, The observation image of the scanning electron microscope shown in Fig. 8 (Fig. 8(a) is a stereoscopic observation image, and Fig. 8(b) is a cross-sectional observation image), and it was found that the above-described linear circuit was obtained. On the other hand, in the state of the copper-clad laminate obtained in Comparative Example 1 and Comparative Example 2, the above-described linear circuit could not be obtained when the etching time was lengthened in comparison with the examples. It takes time until the fine copper particles are completely removed or the blackening treatment layer is removed, during which etching of the circuit is performed, the height of the circuit is lowered, and the width of the circuit is also reduced. Therefore, it can be understood that a circuit having a circuit width of 8 μm/inter-slice gap width of 8 μm is not easily formed by roughening treatment by conventionally known fine copper particles or reduction blackening treatment.

【產業上之可利用性】[Industrial Availability]

可以藉由使用本申請案之具備載子箔之銅箔,而完全地除去存在於藉由雷射鑽孔加工之所形成之孔洞之開口部周圍之濺疤,提供一種具備潔淨之銅層之覆銅層積板。結果,可以排除起因於該濺疤而引起之不良,提供一種高品質之多層印刷電路板。此外,在本申請案之具備載子箔之銅箔,可以藉由以「藉著由銅複合化合物所組成且最大長度為500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造」,來構成載子箔及整體銅層之粗化處理層,而形成向來以上之微細間距電路。接著,如果是使用本申請案之具備載子箔之銅箔的話,則無需要向來之製造方法之製程變更,可以藉由增層法、無芯增層法而製造多層印刷電路板,可以提供高品質之印刷電路板。 It is possible to completely remove the spatter existing around the opening of the hole formed by the laser drilling by using the copper foil with the carrier foil of the present application, thereby providing a clean copper layer. Copper clad laminate. As a result, it is possible to eliminate the defects caused by the sputtering, and to provide a high-quality multilayer printed circuit board. In addition, the copper foil provided with the carrier foil of the present application can be formed by a fine concavo-convex structure formed by a convex portion having a needle shape or a plate shape of a copper composite compound and having a maximum length of 500 nm or less. Then, the roughened layer of the carrier foil and the entire copper layer is formed to form a fine pitch circuit which is more than the above. Then, if the copper foil with a carrier foil of the present application is used, there is no need to change the manufacturing process of the conventional manufacturing method, and a multilayer printed circuit board can be produced by the build-up method or the coreless build-up method. High quality printed circuit board.

Claims (13)

一種具備載子箔之銅箔,係具備載子箔/剝離層/整體銅層之層構造之具備載子箔之銅箔,其特徵為:在該具備載子箔之銅箔之兩面,將具有藉著由銅複合化合物所組成且最大長度為100nm以上、500nm以下之針狀或板狀之凸狀部而形成之微細凹凸構造之粗化處理層予以具備,具備於該載子箔表面之粗化處理層係具有由以氧化銅來作為主成分之銅複合化合物而組成之前述微細凹凸構造,使用作為雷射光吸收層,具備於該整體銅層表面之粗化處理層係具有由含有氧化銅和氧化亞銅之銅複合化合物所組成之前述微細凹凸構造,使用作為粗化處理層和絕緣層構造材料之間之接合層。 A copper foil provided with a carrier foil, which is a copper foil provided with a carrier foil having a layer structure of a carrier foil/release layer/whole copper layer, and is characterized in that on both sides of the copper foil provided with the carrier foil A roughened layer having a fine concavo-convex structure formed of a needle-like or plate-like convex portion composed of a copper composite compound and having a maximum length of 100 nm or more and 500 nm or less is provided on the surface of the carrier foil. The roughened layer has the fine concavo-convex structure composed of a copper composite compound containing copper oxide as a main component, and is used as a laser light absorbing layer, and the roughened layer provided on the surface of the entire copper layer has oxidation-containing layer The fine concavo-convex structure composed of a copper composite compound of copper and cuprous oxide is used as a bonding layer between the roughened layer and the insulating layer material. 如申請專利範圍第1項之具備載子箔之銅箔,其中,相對於在藉由X射線光電子分光分析法來分析前述微細凹凸構造之構成元素時而得到之Cu(I)之波峰面積和Cu(Ⅱ)之波峰面積之間之合計面積,Cu(I)之波峰面積之佔有之比例係作為前述雷射光吸收層之粗化處理層為未滿50%,作為前述接合層之粗化處理層為50%以上。 The copper foil with a carrier foil according to the first aspect of the invention, wherein the peak area of Cu(I) obtained when the constituent elements of the fine concavo-convex structure are analyzed by X-ray photoelectron spectroscopy The ratio of the total area between the peak areas of Cu(II) and the peak area of Cu(I) is less than 50% as the roughening layer of the laser light absorbing layer, and is roughened as the bonding layer. The layer is 50% or more. 如申請專利範圍第1項之具備載子箔之銅箔,其中,作為前述接合層之粗化處理層係具有由以氧化亞銅來作為主成分之銅複合化合物而組成之前述微細凹凸構造。 The copper foil with a carrier foil according to the first aspect of the invention, wherein the roughening layer as the bonding layer has the fine concavo-convex structure composed of a copper composite compound containing cuprous oxide as a main component. 如申請專利範圍第1項之具備載子箔之銅箔,其中,在使 用掃描型電子顯微鏡而以傾斜角45°、50000倍以上之倍率來觀察前述之粗化處理層時,在相互地鄰接之凸狀部中,可分離於其他之凸狀部而進行觀察之前端部分之長度係250nm以下。 A copper foil with a carrier foil as in claim 1 of the patent application, wherein When the roughened layer is observed at a magnification of 45° or more at a tilt angle of 45° or more with a scanning electron microscope, the convex portions that are adjacent to each other can be separated from the other convex portions and observed at the front end. The length of the part is below 250 nm. 如申請專利範圍第4項之具備載子箔之銅箔,其中,前述凸狀部之前述前端部份之長度相對於前述凸狀部之前述最大長度係1/2以下。 The copper foil with a carrier foil according to the fourth aspect of the invention, wherein the length of the front end portion of the convex portion is 1/2 or less with respect to the maximum length of the convex portion. 如申請專利範圍第1項之具備載子箔之銅箔,其中,在前述粗化處理層之表面來吸附氪而進行測定之比表面積係0.035m2/g以上。 A copper foil provided with a carrier foil according to the first aspect of the invention, wherein the specific surface area measured by adsorbing ruthenium on the surface of the roughened layer is 0.035 m 2 /g or more. 如申請專利範圍第1項之具備載子箔之銅箔,其中,在藉由L*a*b*表色系而表示前述粗化處理層之表面時之亮度L*係30以下。 The copper foil with a carrier foil according to the first aspect of the invention is characterized in that the brightness L* is 30 or less when the surface of the roughened layer is represented by the L*a*b* color system. 如申請專利範圍第1項之具備載子箔之銅箔,其中,在藉由雷射法而測定57570μm2之二次元區域時之表面積成為三次元表面積(Aμm2)並且三次元表面積相對於前述二次元區域面積之比值成為B之時,前述粗化處理層之B係1.1以上。 The copper foil with a carrier foil according to claim 1, wherein the surface area when the secondary region of 57770 μm 2 is measured by a laser method becomes a cubic surface area (A μm 2 ) and the cubic surface area is relative to the foregoing When the ratio of the area of the secondary element region is B, the B of the roughening layer is 1.1 or more. 如申請專利範圍第1項之具備載子箔之銅箔,其中,前述整體銅層之前述接合層側之表面粗糙度(Rzjis)係2.0μm以下。 The copper foil with a carrier foil according to the first aspect of the invention, wherein the surface roughness (Rzjis) of the bonding layer side of the entire copper layer is 2.0 μm or less. 如申請專利範圍第1項之具備載子箔之銅箔,其中,在前述整體銅層之前述接合層側之面,施行矽烷偶合劑處理。 A copper foil provided with a carrier foil according to the first aspect of the invention, wherein the surface of the integral copper layer on the side of the bonding layer is subjected to a decane coupling agent treatment. 一種覆銅層積板,其特徵為:將如申請專利範圍第1項所 記載之具備載子箔之銅箔之前述整體銅層之前述接合層側,層積於絕緣層構造材料之至少單面。 A copper clad laminate, which is characterized in that it will be as in the first item of the patent application scope The bonding layer side of the entire copper layer of the copper foil with a carrier foil described above is laminated on at least one side of the insulating layer structural material. 一種印刷電路板,其特徵為:具備使用如申請專利範圍第1項所記載之具備載子箔之銅箔之前述整體銅層而形成之銅層。 A printed circuit board comprising a copper layer formed by using the entire copper layer of a copper foil having a carrier foil as described in claim 1 of the patent application. 如申請專利範圍第12項之印刷電路板,其中,在前述之銅層,具備藉由雷射鑽孔加工而形成之導通孔。 The printed circuit board of claim 12, wherein the copper layer is provided with a via hole formed by laser drilling.
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