TWI529876B - Package on package structure and manufacturing method thereof - Google Patents

Package on package structure and manufacturing method thereof Download PDF

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Publication number
TWI529876B
TWI529876B TW102143690A TW102143690A TWI529876B TW I529876 B TWI529876 B TW I529876B TW 102143690 A TW102143690 A TW 102143690A TW 102143690 A TW102143690 A TW 102143690A TW I529876 B TWI529876 B TW I529876B
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Taiwan
Prior art keywords
package substrate
package
electronic component
stack structure
electrical contact
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TW102143690A
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Chinese (zh)
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TW201521164A (en
Inventor
江政嘉
蘇哲民
施嘉凱
徐逐崎
王隆源
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矽品精密工業股份有限公司
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Priority to TW102143690A priority Critical patent/TWI529876B/en
Priority to CN201310676913.0A priority patent/CN104681499B/en
Publication of TW201521164A publication Critical patent/TW201521164A/en
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Publication of TWI529876B publication Critical patent/TWI529876B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation

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  • Combinations Of Printed Boards (AREA)
  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Packaging Frangible Articles (AREA)

Description

封裝堆疊結構及其製法 Package stack structure and its preparation method

本發明係有關一種封裝堆疊結構,尤指一種得提升產品可靠度之封裝堆疊結構及其製法。 The invention relates to a package stack structure, in particular to a package stack structure and a method for manufacturing the same.

隨著半導體封裝技術的演進,半導體裝置(Semiconductor device)已開發出不同的封裝型態,而為提升電性功能及節省封裝空間,遂堆加複數封裝結構以形成封裝堆疊結構(Package on Package,POP),此種封裝方式能發揮系統封裝(SiP)異質整合特性,可將不同功用之電子元件,例如:記憶體、中央處理器、繪圖處理器、影像應用處理器等,藉由堆疊設計達到系統的整合,適合應用於輕薄型各種電子產品。 With the evolution of semiconductor packaging technology, semiconductor devices have developed different package types, and in order to improve electrical functions and save packaging space, a plurality of package structures are stacked to form a package on package (Package on Package, POP), this package can take advantage of the heterogeneous integration of system package (SiP), which can achieve different functional electronic components, such as: memory, central processing unit, graphics processor, image application processor, etc. The system is integrated and suitable for use in a variety of thin and light electronic products.

第1圖係為習知封裝堆疊結構1之剖面示意圖。如第1圖所示,該封裝堆疊結構1係包含第一封裝基板11及第二封裝基板12。該第一封裝基板11具有相對之第一及第二表面11a,11b,且於該第一表面11a上設有電性連接該第一封裝基板11之第一半導體元件10,而該第二表面11b上具有植球墊112以供結合銲球17。該第二封裝基板12係具有相對之第三及第四表面12a,12b,且該第三表面12a設有複數電性接觸墊120,又該第三及第四表面 12a,12b上具有防銲層123,並形成有複數開孔以外露該些電性接觸墊120。 1 is a schematic cross-sectional view of a conventional package stack structure 1. As shown in FIG. 1 , the package stack structure 1 includes a first package substrate 11 and a second package substrate 12 . The first package substrate 11 has opposite first and second surfaces 11a, 11b, and the first surface 11a is provided with a first semiconductor component 10 electrically connected to the first package substrate 11, and the second surface A ball pad 112 is provided on the 11b for bonding the solder balls 17. The second package substrate 12 has opposite third and fourth surfaces 12a, 12b, and the third surface 12a is provided with a plurality of electrical contact pads 120, and the third and fourth surfaces 12a, 12b have a solder resist layer 123, and a plurality of openings are formed to expose the electrical contact pads 120.

於製作時,先於該第一封裝基板11之第一表面11a上形成銲錫柱13,再使該第二封裝基板12之第四表面12b藉由該銲錫柱13疊設且電性連接於該第一封裝基板11上。接著,形成封裝膠體14於該第一封裝基板11之第一表面11a與該第二封裝基板12之第四表面12b之間,以包覆該第一半導體元件10。之後,設置複數第二半導體元件15於該第三表面12a上以電性連接該些電性接觸墊120。其中,該第一及第二半導體元件10,15係以覆晶方式電性連接該些封裝基板,且可藉由底膠16充填於該第一及第二半導體元件10,15與第一封裝基板11及第二封裝基板12之間。 A solder pillar 13 is formed on the first surface 11a of the first package substrate 11 , and the fourth surface 12 b of the second package substrate 12 is stacked on the solder pillar 13 and electrically connected thereto. On the first package substrate 11. Next, an encapsulant 14 is formed between the first surface 11a of the first package substrate 11 and the fourth surface 12b of the second package substrate 12 to cover the first semiconductor device 10. Then, a plurality of second semiconductor elements 15 are disposed on the third surface 12a to electrically connect the electrical contact pads 120. The first and second semiconductor devices 10 and 15 are electrically connected to the package substrates by flip chip bonding, and may be filled in the first and second semiconductor devices 10, 15 and the first package by a primer 16. Between the substrate 11 and the second package substrate 12.

惟,習知封裝堆疊結構1之製法中,於形成該封裝膠體14時,該封裝膠體14’會溢流於該第二封裝基板12之電性接觸墊120上而殘留於其上,故需以雷射或蝕刻方式去除該封裝膠體14’,卻因而容易一併移除該電性接觸墊120及其周圍之防銲層123,造成該第二封裝基板12之信賴性不佳。 However, in the method of fabricating the package structure 1 , when the package body 14 is formed, the package body 14 ′ overflows on the electrical contact pads 120 of the second package substrate 12 and remains thereon. The encapsulant 14' is removed by laser or etching, so that the electrical contact pad 120 and the solder resist layer 123 around it are easily removed, resulting in poor reliability of the second package substrate 12.

再者,以雷射或蝕刻方式去除該封裝膠體14’時,並無法將該封裝膠體14’完全去除,造成後續製程中,該第二半導體元件15無法有效接置於該電性接觸墊120上,且與該電性接觸墊120之電性連接易發生不良。 Moreover, when the encapsulant 14' is removed by laser or etching, the encapsulant 14' cannot be completely removed, so that the second semiconductor component 15 cannot be effectively placed on the electrical contact pad 120 in a subsequent process. The electrical connection with the electrical contact pad 120 is prone to failure.

因此,如何克服習知技術中之種種問題,實已成目前亟欲解決的課題。 Therefore, how to overcome various problems in the prior art has become a problem that is currently being solved.

鑑於上述習知技術之缺失,本發明提供一種封裝堆疊結構, 係包括:第一封裝基板;第一電子元件,係設於該第一封裝基板上,且電性連接該第一封裝基板;複數支撐件,係設於該第一封裝基板上;第二封裝基板,係結合該些支撐件,使該第二封裝基板疊設於該第一封裝基板上,又該第二封裝基板具有複數電性接觸墊與至少一凹槽,且該凹槽較該電性接觸墊鄰近該第二封裝基板之邊緣;以及封裝膠體,係設於該第一封裝基板與第二封裝基板之間,並包覆該第一電子元件與該些支撐件。 In view of the above-mentioned shortcomings of the prior art, the present invention provides a package stack structure. The first electronic component is disposed on the first package substrate and electrically connected to the first package substrate; the plurality of support members are disposed on the first package substrate; the second package The second package substrate is stacked on the first package substrate, and the second package substrate has a plurality of electrical contact pads and at least one recess, and the recess is opposite to the electric The contact pad is adjacent to the edge of the second package substrate; and the encapsulant is disposed between the first package substrate and the second package substrate and covers the first electronic component and the support members.

本發明復提供一種封裝堆疊結構之製法,係包括:提供一設有第一電子元件之第一封裝基板,且該第一電子元件電性連接該第一封裝基板;一具有複數電性接觸墊與至少一凹槽之第二封裝基板藉由複數支撐件結合至該第一封裝基板上,使該第二封裝基板疊設於該第一封裝基板上,又該凹槽較該電性接觸墊鄰近該第二封裝基板之邊緣;以及形成封裝膠體於該第一封裝基板與該第二封裝基板之間,以包覆該第一電子元件與該些支撐件。 The present invention provides a method for fabricating a package stack structure, comprising: providing a first package substrate having a first electronic component, wherein the first electronic component is electrically connected to the first package substrate; and having a plurality of electrical contact pads The second package substrate and the at least one recess are coupled to the first package substrate by a plurality of support members, and the second package substrate is stacked on the first package substrate, and the recess is closer to the electrical contact pad. Adjacent to the edge of the second package substrate; and forming an encapsulant between the first package substrate and the second package substrate to encapsulate the first electronic component and the support members.

前述之封裝堆疊結構及其製法中,該第二封裝基板疊設於該第一封裝基板上之製程,係包括:形成複數第一金屬柱於該第一封裝基板上,且形成複數第二金屬柱於該第二封裝基板上;以及將第一金屬柱結合第二金屬柱,使該第二封裝基板疊設於該第一封裝基板上,且令該第一金屬柱與第二金屬柱作為該支撐件。因此,該支撐件具有相結合之第一金屬柱與第二金屬柱,該第一金屬柱結合該第一封裝基板,且該第二金屬柱結合該第二封裝基板,又該支撐件復具有結合該第一金屬柱與該第二金屬柱的銲錫材料。 In the foregoing package stack structure and the manufacturing method thereof, the process of the second package substrate being stacked on the first package substrate comprises: forming a plurality of first metal pillars on the first package substrate, and forming a plurality of second metals The second metal substrate is bonded to the second metal substrate, and the second metal substrate is stacked on the first package substrate, and the first metal pillar and the second metal pillar are used as The support. Therefore, the support member has a first metal post and a second metal post combined, the first metal post is coupled to the first package substrate, and the second metal post is coupled to the second package substrate, and the support member has The solder material of the first metal pillar and the second metal pillar is combined.

前述之封裝堆疊結構及其製法中,該支撐件電性連接該第一 及第二封裝基板。 In the foregoing package stack structure and method of manufacturing the same, the support member is electrically connected to the first And a second package substrate.

前述之封裝堆疊結構及其製法中,該封裝膠體復形成於該第一封裝基板與該第一電子元件之間。 In the foregoing package stack structure and method of manufacturing the same, the encapsulant is formed between the first package substrate and the first electronic component.

另外,前述之封裝堆疊結構及其製法中,復包括設置第二電子元件於該第二封裝基板上,且該第二電子元件電性連接該電性接觸墊。 In addition, in the foregoing package stack structure and the manufacturing method thereof, the second electronic component is disposed on the second package substrate, and the second electronic component is electrically connected to the electrical contact pad.

由上可知,本發明封裝堆疊結構及其製法,係藉由該凹槽之設計,使其較該電性接觸墊鄰近該第二封裝基板之邊緣,故於形成該封裝膠體時,該封裝膠體會溢流於該凹槽中而集中於該凹槽中,並不會流至該電性接觸墊上。因此,當去除殘留之該封裝膠體時,僅會損壞該凹槽及其周圍之絕緣保護層,而不會損壞該電性接觸墊,因而不會影響該第二封裝基板之信賴性。 It can be seen that the package stack structure of the present invention and the manufacturing method thereof are designed such that the recess is adjacent to the edge of the second package substrate than the electrical contact pad, so when the package colloid is formed, the package adhesive The experience overflows in the recess and concentrates in the recess and does not flow onto the electrical contact pad. Therefore, when the residual encapsulant is removed, only the insulating protective layer of the recess and its surrounding area is damaged without damaging the electrical contact pad, thereby not affecting the reliability of the second package substrate.

再者,即使無法將該封裝膠體完全去除,仍不會影響後續製程。例如,該第二電子元件仍可有效接置於該電性接觸墊上,且與該電性接觸墊之電性連接可保持良好。 Moreover, even if the encapsulant cannot be completely removed, the subsequent process will not be affected. For example, the second electronic component can still be effectively placed on the electrical contact pad, and the electrical connection with the electrical contact pad can be maintained.

1,2‧‧‧封裝堆疊結構 1,2‧‧‧Package stack structure

10‧‧‧第一半導體元件 10‧‧‧First semiconductor component

11,21‧‧‧第一封裝基板 11, 21‧‧‧ First package substrate

11a,21a‧‧‧第一表面 11a, 21a‧‧‧ first surface

11b,21b‧‧‧第二表面 11b, 21b‧‧‧ second surface

112,212‧‧‧植球墊 112,212‧‧‧Ball mat

12,22‧‧‧第二封裝基板 12,22‧‧‧Second package substrate

12a,22a‧‧‧第三表面 12a, 22a‧‧‧ third surface

12b,22b‧‧‧第四表面 12b, 22b‧‧‧ fourth surface

120,220‧‧‧電性接觸墊 120,220‧‧‧Electrical contact pads

123‧‧‧防銲層 123‧‧‧ solder mask

13‧‧‧銲錫柱 13‧‧‧ Solder column

14,14’,24,24’‧‧‧封裝膠體 14,14’,24,24’‧‧‧Package colloid

15‧‧‧第二半導體元件 15‧‧‧Second semiconductor component

16,26‧‧‧底膠 16,26‧‧‧Bottom

17,27‧‧‧銲球 17,27‧‧‧ solder balls

20‧‧‧第一電子元件 20‧‧‧First electronic components

200,250‧‧‧銲錫凸塊 200,250‧‧‧ solder bumps

210‧‧‧銲墊 210‧‧‧ solder pads

211‧‧‧第一外接墊 211‧‧‧First external mat

213,223‧‧‧絕緣保護層 213,223‧‧‧Insulating protective layer

2130,2230‧‧‧開孔 2130, 2230‧‧‧ openings

22c‧‧‧邊緣 22c‧‧‧ edge

221‧‧‧第二外接墊 221‧‧‧Second external mat

222‧‧‧凹槽 222‧‧‧ Groove

23‧‧‧支撐件 23‧‧‧Support

230‧‧‧銲錫材料 230‧‧‧ solder materials

231‧‧‧第一金屬柱 231‧‧‧First metal column

232‧‧‧第二金屬柱 232‧‧‧Second metal column

25‧‧‧第二電子元件 25‧‧‧Second electronic components

第1圖係為習知堆疊封裝結構之剖視示意圖;其中,第1’圖係為第1圖之局部放大圖;以及第2A至2D圖係為本發明封裝堆疊結構之製法之剖視示意圖;其中,第2A’圖係為第2A圖之局部上視圖。 1 is a schematic cross-sectional view of a conventional stacked package structure; wherein, FIG. 1A is a partial enlarged view of FIG. 1; and FIGS. 2A to 2D are schematic cross-sectional views showing a manufacturing method of the package stack structure of the present invention; Wherein the 2A' diagram is a partial top view of the 2A diagram.

以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。 The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.

須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如“上”、“第一”、“第二”及“一”等之用語,亦僅為便於敘述之明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。 It is to be understood that the structure, the proportions, the size, and the like of the present invention are intended to be used in conjunction with the disclosure of the specification, and are not intended to limit the invention. The conditions are limited, so it is not technically meaningful. Any modification of the structure, change of the proportional relationship or adjustment of the size should remain in this book without affecting the effects and the objectives that can be achieved by the present invention. The technical content disclosed in the invention can be covered. In the meantime, the terms "upper", "first", "second" and "one" are used in the description, and are not intended to limit the scope of the invention. Changes or adjustments in the relative relationship are considered to be within the scope of the present invention.

第2A至2D圖係為本發明封裝堆疊結構2之製法之剖視示意圖。 2A to 2D are schematic cross-sectional views showing the manufacturing method of the package stack structure 2 of the present invention.

如第2A圖所示,提供一具有相對之第一表面21a及第二表面21b之第一封裝基板21、及一具有相對之第三表面22a及第四表面22b之第二封裝基板22。 As shown in FIG. 2A, a first package substrate 21 having a first surface 21a and a second surface 21b opposite to each other, and a second package substrate 22 having an opposite third surface 22a and a fourth surface 22b are provided.

所述之第一封裝基板21,其第一表面21a上具有複數銲墊210與第一外接墊211,且其第二表面21b上具有複數植球墊212,又該第一及第二表面21a,21b上具有例如防銲層之絕緣保護層213,並形成有複數開孔2130以外露該些銲墊210、第一外接墊211及植球墊212。 The first package substrate 21 has a plurality of pads 210 and a first outer pad 211 on the first surface 21a, and a plurality of ball pads 212 on the second surface 21b, and the first and second surfaces 21a. An insulating protective layer 213 having a solder resist layer is formed on 21b, and the plurality of openings 2130 are formed to expose the solder pads 210, the first external pads 211, and the ball pad 212.

所述之第二封裝基板22,其第三表面22a上具有複數電性接觸墊220,且其第四表面22b上具有複數第二外接墊221,又該第三及第四表面22a,22b上具有例如防銲層之絕緣保護層223,並形成有複數開孔2230以外露該些電性接觸墊220及第二外接墊 221,且上方絕緣保護層223復形成有複數凹槽222,以外露該第三表面22a。 The second package substrate 22 has a plurality of electrical contact pads 220 on the third surface 22a, and a plurality of second external pads 221 on the fourth surface 22b, and the third and fourth surfaces 22a, 22b. An insulating protective layer 223 having a solder resist layer, and a plurality of openings 2230 are formed to expose the electrical contact pads 220 and the second external pads. 221, and the upper insulating protective layer 223 is further formed with a plurality of grooves 222 to expose the third surface 22a.

於本實施例中,該凹槽222之深度亦可依需求設計,故可不外露該第三表面22a,且如第2A’圖所示,該凹槽222較該電性接觸墊220鄰近該第二封裝基板22之邊緣22c。 In this embodiment, the depth of the recess 222 can also be designed according to requirements, so the third surface 22a can be omitted, and as shown in FIG. 2A', the recess 222 is adjacent to the electrical contact pad 220. The edge 22c of the package substrate 22 is two.

再者,於該第一外接墊211上電鍍形成第一金屬柱231,且於該第二外接墊221上電鍍形成例如銅柱之第二金屬柱232,並於該第一及第二金屬柱231,232上可形成銲錫材料230,以利於後續之堆疊製程。 Furthermore, a first metal pillar 231 is plated on the first external pad 211, and a second metal pillar 232 such as a copper pillar is electroplated on the second outer pad 221, and the first and second metal pillars are Solder material 230 may be formed on 231, 232 to facilitate subsequent stacking processes.

又,於該銲墊210上藉由銲錫凸塊200設置第一電子元件20,即該第一電子元件20以覆晶方式電性連接該第一封裝基板21。 Moreover, the first electronic component 20 is disposed on the solder pad 210 by solder bumps 200, that is, the first electronic component 20 is electrically connected to the first package substrate 21 in a flip chip manner.

另外,該第一電子元件20係為主動元件或被動元件,可使用複數個第一電子元件20,且可選自主動元件、被動元件或其組合,該主動元件係例如:晶片,而該被動元件係例如:電阻、電容及電感。 In addition, the first electronic component 20 is an active component or a passive component, a plurality of first electronic components 20 may be used, and may be selected from an active component, a passive component or a combination thereof, such as a wafer, and the passive component The components are, for example, resistors, capacitors and inductors.

如第2B圖所示,該第二封裝基板22以其第四表面22b藉由複數支撐件23結合至該第一封裝基板21之第一表面21a上,使該第二封裝基板22疊設於該第一封裝基板21上。 As shown in FIG. 2B, the second package substrate 22 is bonded to the first surface 21a of the first package substrate 21 by a plurality of support members 23, and the second package substrate 22 is stacked on the first package substrate 22. The first package substrate 21 is on the first package substrate 21.

於本實施例中,係將該第二金屬柱232結合該第一金屬柱231(或其上之銲錫材料230),使該第二封裝基板22疊設於該第一封裝基板21上,且令該第一與第二金屬柱231,232(及該銲錫材料230)作為該支撐件23。 In this embodiment, the second metal pillar 232 is coupled to the first metal pillar 231 (or the solder material 230 thereon), and the second package substrate 22 is stacked on the first package substrate 21, and The first and second metal posts 231, 232 (and the solder material 230) are used as the support member 23.

如第2C圖所示,形成封裝膠體24於該第一封裝基板21之第一表面21a與該第二封裝基板22之第四表面22b之間,以包覆該 第一電子元件20與該些支撐件23。 As shown in FIG. 2C, an encapsulant 24 is formed between the first surface 21a of the first package substrate 21 and the fourth surface 22b of the second package substrate 22 to encapsulate the The first electronic component 20 and the support members 23.

於本實施例中,該封裝膠體24復形成於該第一封裝基板21之第一表面21a與該第一電子元件20之間。於其它實施例中,亦可形成底膠於該第一封裝基板21之第一表面21a與該第一電子元件20之間。 In this embodiment, the encapsulant 24 is formed between the first surface 21 a of the first package substrate 21 and the first electronic component 20 . In other embodiments, a primer may be formed between the first surface 21a of the first package substrate 21 and the first electronic component 20.

如第2D圖所示,設置第二電子元件25於該第二封裝基板22之第三表面22a上,且該第二電子元件25係以覆晶方式(如藉由銲錫凸塊250)電性連接該電性接觸墊220,並形成底膠26於該第二電子元件25與該第二封裝基板22之第三表面22a之間,又結合銲球27於該第二表面21b上之植球墊212。 As shown in FIG. 2D, the second electronic component 25 is disposed on the third surface 22a of the second package substrate 22, and the second electronic component 25 is electrically flipped (eg, by solder bumps 250). The electrical contact pad 220 is connected, and a primer 26 is formed between the second electronic component 25 and the third surface 22a of the second package substrate 22, and the ball is bonded to the second surface 21b. Pad 212.

於本實施例中,該第二電子元件25係為主動元件或被動元件;或者,可使用複數個第二電子元件25,且可選自主動元件、被動元件或其組合,該主動元件係例如:晶片,而該被動元件係例如:電阻、電容及電感。 In this embodiment, the second electronic component 25 is an active component or a passive component; or, a plurality of second electronic components 25 may be used, and may be selected from an active component, a passive component, or a combination thereof, for example, the active component is : A wafer, and the passive components are, for example, resistors, capacitors, and inductors.

本發明之製法係藉由該凹槽222之設計,使其較該電性接觸墊220鄰近該第二封裝基板22之邊緣,故於形成該封裝膠體24時,該封裝膠體24’會溢流於該凹槽222中而集中於該凹槽222中,如第2C圖所示,並不會流至該電性接觸墊220上,更不會殘留於該電性接觸墊220上。因此,當以雷射或蝕刻方式去除殘留之該封裝膠體24’時,僅會損壞該凹槽222及其周圍之絕緣保護層223,而不會損壞該電性接觸墊220,因而不會影響該第二封裝基板22之信賴性。 The method of the present invention is such that the recess 222 is designed to be adjacent to the edge of the second package substrate 22 than the electrical contact pad 220. Therefore, when the encapsulant 24 is formed, the encapsulant 24' overflows. The recess 222 is concentrated in the recess 222. As shown in FIG. 2C, it does not flow to the electrical contact pad 220, and does not remain on the electrical contact pad 220. Therefore, when the residual encapsulant 24' is removed by laser or etching, only the recess 222 and the insulating protective layer 223 around it can be damaged without damaging the electrical contact pad 220, thereby not affecting The reliability of the second package substrate 22.

再者,以雷射或蝕刻方式去除殘留之該封裝膠體24’時,即使無法將該封裝膠體24’完全去除,仍不會影響後續製程。例如, 該第二電子元件25仍可有效接置於該電性接觸墊220上,且該銲錫凸塊250與該電性接觸墊220之電性連接可保持良好,而不受殘留之該封裝膠體24’影響。 Further, when the remaining encapsulant 24' is removed by laser or etching, even if the encapsulant 24' cannot be completely removed, the subsequent process is not affected. E.g, The second electronic component 25 can still be effectively placed on the electrical contact pad 220, and the electrical connection between the solder bump 250 and the electrical contact pad 220 can be maintained well without being left by the encapsulant 24 . 'influences.

本發明復提供一種封裝堆疊結構2,係包括:第一封裝基板21、第一電子元件20、複數支撐件23、第二封裝基板22、封裝膠體24以及第二電子元件25。 The present invention further provides a package stack structure 2 including a first package substrate 21, a first electronic component 20, a plurality of support members 23, a second package substrate 22, an encapsulant 24, and a second electronic component 25.

所述之第一封裝基板21係具有相對之第一表面21a及第二表面21b。 The first package substrate 21 has a first surface 21a and a second surface 21b opposite to each other.

所述之第一電子元件20係設於該第一封裝基板21之第一表面21a上,且電性連接該第一封裝基板21。 The first electronic component 20 is disposed on the first surface 21 a of the first package substrate 21 and electrically connected to the first package substrate 21 .

所述之第二封裝基板22係結合該些支撐件23,使該第二封裝基板22疊設於該第一封裝基板21上,又該第二封裝基板22具有複數電性接觸墊220與至少一凹槽222,且該凹槽222較該電性接觸墊220鄰近該第二封裝基板22之邊緣。 The second package substrate 22 is coupled to the support member 23, and the second package substrate 22 is stacked on the first package substrate 21. The second package substrate 22 has a plurality of electrical contact pads 220 and at least A recess 222 is adjacent to the edge of the second package substrate 22 than the electrical contact pad 220.

所述之支撐件23係設於該第一封裝基板21之第一表面21a上,且電性連接該第一及第二封裝基板21,22。具體地,該支撐件23具有相結合之第一金屬柱231與第二金屬柱232,該第一金屬柱231結合該第一封裝基板21,且該第二金屬柱232結合該第二封裝基板22,而該支撐件23復具有結合該第一金屬柱231與該第二金屬柱232的銲錫材料230。 The support member 23 is disposed on the first surface 21a of the first package substrate 21 and electrically connected to the first and second package substrates 21, 22. Specifically, the support member 23 has a first metal post 231 and a second metal post 232, the first metal post 231 is coupled to the first package substrate 21, and the second metal post 232 is coupled to the second package substrate. 22, the support member 23 has a solder material 230 that combines the first metal pillar 231 and the second metal pillar 232.

所述之封裝膠體24係設於該第一封裝基板21之第一表面21a與第二封裝基板22之間,並包覆該第一電子元件20與該些支撐件23。再者,該封裝膠體24復設於該第一封裝基板21之第一表面21a與該第一電子元件20之間。 The encapsulant 24 is disposed between the first surface 21 a of the first package substrate 21 and the second package substrate 22 , and covers the first electronic component 20 and the support members 23 . Furthermore, the encapsulant 24 is disposed between the first surface 21 a of the first package substrate 21 and the first electronic component 20 .

所述之第二電子元件25係設於該第二封裝基板22上,且電性連接該電性接觸墊220。 The second electronic component 25 is disposed on the second package substrate 22 and electrically connected to the electrical contact pad 220.

綜上所述,本發明封裝堆疊結構及其製法,係藉由該凹槽之設計,使其較該電性接觸墊鄰近該第二封裝基板之邊緣,故於形成該封裝膠體時,該封裝膠體會集中於該凹槽,而不會流至該電性接觸墊上。因此,當去除殘留之封裝膠體時,不會損壞該電性接觸墊,因而不會影響該第二封裝基板之信賴性,且即使無法完全去除殘留之封裝膠體,仍不會影響後續製程。 In summary, the package stack structure of the present invention and the manufacturing method thereof are designed such that the recess is adjacent to the edge of the second package substrate than the electrical contact pad, so when the package colloid is formed, the package is formed. The gel will concentrate on the groove without flowing onto the electrical contact pad. Therefore, when the residual encapsulant is removed, the electrical contact pad is not damaged, so that the reliability of the second package substrate is not affected, and even if the residual encapsulant cannot be completely removed, the subsequent process is not affected.

上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修改。因此本發明之權利保護範圍,應如後述之申請專利範圍所列。 The above embodiments are intended to illustrate the principles of the invention and its effects, and are not intended to limit the invention. Any of the above-described embodiments may be modified by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.

2‧‧‧封裝堆疊結構 2‧‧‧Package stack structure

20‧‧‧第一電子元件 20‧‧‧First electronic components

21‧‧‧第一封裝基板 21‧‧‧First package substrate

21a‧‧‧第一表面 21a‧‧‧ first surface

21b‧‧‧第二表面 21b‧‧‧ second surface

212‧‧‧植球墊 212‧‧‧Ball mat

22‧‧‧第二封裝基板 22‧‧‧Second package substrate

22a‧‧‧第三表面 22a‧‧‧ third surface

22b‧‧‧第四表面 22b‧‧‧Fourth surface

220‧‧‧電性接觸墊 220‧‧‧Electrical contact pads

222‧‧‧凹槽 222‧‧‧ Groove

23‧‧‧支撐件 23‧‧‧Support

230‧‧‧銲錫材料 230‧‧‧ solder materials

231‧‧‧第一金屬柱 231‧‧‧First metal column

232‧‧‧第二金屬柱 232‧‧‧Second metal column

24‧‧‧封裝膠體 24‧‧‧Package colloid

25‧‧‧第二電子元件 25‧‧‧Second electronic components

250‧‧‧銲錫凸塊 250‧‧‧ solder bumps

26‧‧‧底膠 26‧‧‧Bottom glue

27‧‧‧銲球 27‧‧‧ solder balls

Claims (12)

一種封裝堆疊結構,係包括:第一封裝基板;第一電子元件,係設於該第一封裝基板上且電性連接該第一封裝基板;複數支撐件,係設於該第一封裝基板上;第二封裝基板,係結合該些支撐件,使該第二封裝基板疊設於該第一封裝基板上,又該第二封裝基板具有複數電性接觸墊與至少一凹槽,且該凹槽較該電性接觸墊鄰近該第二封裝基板之邊緣;以及封裝膠體,係設於該第一封裝基板與第二封裝基板之間,並包覆該第一電子元件與該些支撐件。 A package stack structure includes: a first package substrate; a first electronic component disposed on the first package substrate and electrically connected to the first package substrate; and a plurality of support members disposed on the first package substrate a second package substrate, wherein the second package substrate is stacked on the first package substrate, and the second package substrate has a plurality of electrical contact pads and at least one recess, and the recess The slot is adjacent to the edge of the second package substrate; and the encapsulant is disposed between the first package substrate and the second package substrate and covers the first electronic component and the support members. 如申請專利範圍第1項所述之封裝堆疊結構,其中,該支撐件具有相結合之第一金屬柱與第二金屬柱,該第一金屬柱結合該第一封裝基板,且該第二金屬柱結合該第二封裝基板。 The package stack structure of claim 1, wherein the support member has a first metal post and a second metal post combined, the first metal post is coupled to the first package substrate, and the second metal The post is coupled to the second package substrate. 如申請專利範圍第2項所述之封裝堆疊結構,其中,該支撐件復具有結合該第一金屬柱與該第二金屬柱的銲錫材料。 The package stack structure of claim 2, wherein the support member has a solder material that combines the first metal post and the second metal post. 如申請專利範圍第1項所述之封裝堆疊結構,其中,該支撐件電性連接該第一及第二封裝基板。 The package stack structure of claim 1, wherein the support member is electrically connected to the first and second package substrates. 如申請專利範圍第1項所述之封裝堆疊結構,其中,該封裝膠體復形成於該第一封裝基板與該第一電子元件之間。 The package stack structure of claim 1, wherein the encapsulant is formed between the first package substrate and the first electronic component. 如申請專利範圍第1項所述之封裝堆疊結構,復包括第二電子元件,係設於該第二封裝基板上,且電性連接該電性接觸墊。 The package stack structure of claim 1, further comprising a second electronic component disposed on the second package substrate and electrically connected to the electrical contact pad. 一種封裝堆疊結構之製法,係包括: 提供一設有第一電子元件之第一封裝基板,且該第一電子元件係電性連接該第一封裝基板;一具有複數電性接觸墊與至少一凹槽之第二封裝基板藉由複數支撐件結合至該第一封裝基板上,使該第二封裝基板疊設於該第一封裝基板上,又該凹槽較該電性接觸墊鄰近該第二封裝基板之邊緣;以及形成封裝膠體於該第一封裝基板與該第二封裝基板之間,以包覆該第一電子元件與該些支撐件。 A method for manufacturing a package stack structure includes: Providing a first package substrate having a first electronic component, wherein the first electronic component is electrically connected to the first package substrate; and a second package substrate having a plurality of electrical contact pads and at least one recess The support member is coupled to the first package substrate, the second package substrate is stacked on the first package substrate, and the recess is adjacent to the edge of the second package substrate than the electrical contact pad; and forming an encapsulant The first package substrate and the second package substrate are wrapped to cover the first electronic component and the support members. 如申請專利範圍第7項所述之封裝堆疊結構之製法,其中,該第二封裝基板疊設於該第一封裝基板上之製程,係包括:形成複數第一金屬柱於該第一封裝基板上,且形成複數第二金屬柱於該第二封裝基板上;以及將第一金屬柱結合第二金屬柱,使該第二封裝基板疊設於該第一封裝基板上,且令該第一金屬柱與第二金屬柱作為該支撐件。 The method of manufacturing a package stack structure according to the seventh aspect of the invention, wherein the process of the second package substrate being stacked on the first package substrate comprises: forming a plurality of first metal pillars on the first package substrate And forming a plurality of second metal pillars on the second package substrate; and bonding the first metal pillars to the second metal pillars, so that the second package substrate is stacked on the first package substrate, and the first A metal post and a second metal post serve as the support. 如申請專利範圍第8項所述之封裝堆疊結構之製法,其中,該支撐件復具有結合該第一金屬柱與該第二金屬柱的銲錫材料。 The method for manufacturing a package stack structure according to claim 8, wherein the support member has a solder material combined with the first metal pillar and the second metal pillar. 如申請專利範圍第7項所述之封裝堆疊結構之製法,其中,該支撐件電性連接該第一及第二封裝基板。 The method for manufacturing a package stack structure according to claim 7, wherein the support member is electrically connected to the first and second package substrates. 如申請專利範圍第7項所述之封裝堆疊結構之製法,其中,該封裝膠體復形成於該第一封裝基板與該第一電子元件之間。 The method for manufacturing a package stack structure according to claim 7, wherein the encapsulant is formed between the first package substrate and the first electronic component. 如申請專利範圍第7項所述之封裝堆疊結構之製法,復包括設置第二電子元件於該第二封裝基板上,且該第二電子元件電性連接該電性接觸墊。 The method for manufacturing a package stack structure according to claim 7, further comprising: providing a second electronic component on the second package substrate, wherein the second electronic component is electrically connected to the electrical contact pad.
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