TWI512783B - 可攜式質譜儀裝置及方法 - Google Patents

可攜式質譜儀裝置及方法 Download PDF

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Publication number
TWI512783B
TWI512783B TW099145494A TW99145494A TWI512783B TW I512783 B TWI512783 B TW I512783B TW 099145494 A TW099145494 A TW 099145494A TW 99145494 A TW99145494 A TW 99145494A TW I512783 B TWI512783 B TW I512783B
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TW
Taiwan
Prior art keywords
analyte
equal
source
mass
ratio
Prior art date
Application number
TW099145494A
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English (en)
Chinese (zh)
Other versions
TW201135794A (en
Inventor
Chung Hsuan Chen
Jung Lee Lin
Ming Lee Chu
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Academia Sinica
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Publication of TW201135794A publication Critical patent/TW201135794A/zh
Application granted granted Critical
Publication of TWI512783B publication Critical patent/TWI512783B/zh

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0022—Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
TW099145494A 2009-12-23 2010-12-23 可攜式質譜儀裝置及方法 TWI512783B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US28953109P 2009-12-23 2009-12-23

Publications (2)

Publication Number Publication Date
TW201135794A TW201135794A (en) 2011-10-16
TWI512783B true TWI512783B (zh) 2015-12-11

Family

ID=44149732

Family Applications (1)

Application Number Title Priority Date Filing Date
TW099145494A TWI512783B (zh) 2009-12-23 2010-12-23 可攜式質譜儀裝置及方法

Country Status (5)

Country Link
US (1) US9224586B2 (enExample)
EP (1) EP2517223A4 (enExample)
JP (1) JP5890782B2 (enExample)
TW (1) TWI512783B (enExample)
WO (1) WO2011079202A1 (enExample)

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US8669521B2 (en) * 2010-09-24 2014-03-11 Wisconsin Alumni Research Foundation Microwave cavity detector for mass spectrometry
EP2740144A4 (en) * 2011-08-05 2015-05-06 Academia Sinica IONFALL MASS SPECTROMETRY WITH STEP-BY-STEP HIGH-SPEED PROTEOMIC SCANNING
DE102012008972B4 (de) * 2012-05-03 2018-02-01 Bruker Daltonik Gmbh Spannungsquellen für Massenspektrometer
WO2014105089A1 (en) * 2012-12-31 2014-07-03 908 Devices Inc. Compact mass spectrometer
US9093253B2 (en) * 2012-12-31 2015-07-28 908 Devices Inc. High pressure mass spectrometry systems and methods
US9099286B2 (en) * 2012-12-31 2015-08-04 908 Devices Inc. Compact mass spectrometer
US8878127B2 (en) * 2013-03-15 2014-11-04 The University Of North Carolina Of Chapel Hill Miniature charged particle trap with elongated trapping region for mass spectrometry
WO2014183105A1 (en) * 2013-05-10 2014-11-13 Academia Sinica Nanoparticle measurement virus mass spectrometry
RU2533383C1 (ru) * 2013-06-06 2014-11-20 Вячеслав Иванович Козловский Способ разделения заряженных частиц по удельному заряду
US9711341B2 (en) 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
CN110573865B (zh) 2016-12-19 2021-04-27 珀金埃尔默健康科学加拿大股份有限公司 无机和有机质谱系统及其使用方法
JP6658921B2 (ja) * 2017-01-25 2020-03-04 株式会社島津製作所 飛行時間型質量分析装置
JP2017201635A (ja) * 2017-07-20 2017-11-09 908 デバイセズ インク.908 Devices Inc. コンパクトな質量分析計
US10242857B2 (en) 2017-08-31 2019-03-26 The University Of North Carolina At Chapel Hill Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
JP7215121B2 (ja) * 2018-12-05 2023-01-31 株式会社島津製作所 イオントラップ質量分析装置
JP2019091700A (ja) * 2019-01-04 2019-06-13 908 デバイセズ インク.908 Devices Inc. コンパクトな質量分析計
JP7369486B2 (ja) * 2020-03-02 2023-10-26 国立研究開発法人物質・材料研究機構 観測対象ガスの透過拡散経路観測装置及び観測対象ガスの計測方法、点欠陥位置検出装置及び点欠陥位置検出方法、並びに観測用の試料
US11842891B2 (en) 2020-04-09 2023-12-12 Waters Technologies Corporation Ion detector
JP7141432B2 (ja) * 2020-09-24 2022-09-22 908 デバイセズ インク. コンパクトな質量分析計
EP4449473A1 (en) 2021-12-15 2024-10-23 Waters Technologies Corporation An inductive detector with integrated amplifier
US20240153753A1 (en) * 2022-11-07 2024-05-09 Inficon Inc. Atmospheric pressure ionization coupled to an electron ionization mass spectrometer

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US6262638B1 (en) * 1998-09-28 2001-07-17 Axcelis Technologies, Inc. Tunable and matchable resonator coil assembly for ion implanter linear accelerator
US20050153341A1 (en) * 2003-12-08 2005-07-14 Alexander James N.Iv Apparatus for determining molecular weight
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US20070272852A1 (en) * 2006-01-26 2007-11-29 Sionex Corporation Differential mobility spectrometer analyzer and pre-filter apparatus, methods, and systems
US7329866B2 (en) * 2003-01-31 2008-02-12 Yang Wang Two-dimensional ion trap mass spectrometry
US20080149821A1 (en) * 2006-12-21 2008-06-26 Senko Michael W Method and apparatus for identifying the apex of a chromatographic peak

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JPH09320516A (ja) 1996-05-29 1997-12-12 Shimadzu Corp 四重極質量分析計
US6777671B2 (en) * 2001-04-10 2004-08-17 Science & Engineering Services, Inc. Time-of-flight/ion trap mass spectrometer, a method, and a computer program product to use the same
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JP4941402B2 (ja) 2008-05-12 2012-05-30 株式会社島津製作所 質量分析装置
US8309912B2 (en) * 2008-11-21 2012-11-13 Applied Nanotech Holdings, Inc. Atmospheric pressure ion trap
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EP2740144A4 (en) * 2011-08-05 2015-05-06 Academia Sinica IONFALL MASS SPECTROMETRY WITH STEP-BY-STEP HIGH-SPEED PROTEOMIC SCANNING

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US6262638B1 (en) * 1998-09-28 2001-07-17 Axcelis Technologies, Inc. Tunable and matchable resonator coil assembly for ion implanter linear accelerator
US7329866B2 (en) * 2003-01-31 2008-02-12 Yang Wang Two-dimensional ion trap mass spectrometry
US20050153341A1 (en) * 2003-12-08 2005-07-14 Alexander James N.Iv Apparatus for determining molecular weight
US20070272852A1 (en) * 2006-01-26 2007-11-29 Sionex Corporation Differential mobility spectrometer analyzer and pre-filter apparatus, methods, and systems
TW200729274A (en) * 2006-01-27 2007-08-01 Univ Nat Sun Yat Sen Electrospray-assisted laser desorption ionization devices, mass spectrometers, and methods for mass spectrometry
US20080149821A1 (en) * 2006-12-21 2008-06-26 Senko Michael W Method and apparatus for identifying the apex of a chromatographic peak

Also Published As

Publication number Publication date
EP2517223A4 (en) 2015-11-18
EP2517223A1 (en) 2012-10-31
CN102754181A (zh) 2012-10-24
JP5890782B2 (ja) 2016-03-22
WO2011079202A1 (en) 2011-06-30
TW201135794A (en) 2011-10-16
US20110147581A1 (en) 2011-06-23
JP2013516036A (ja) 2013-05-09
US9224586B2 (en) 2015-12-29

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