JP5890782B2 - 携帯用質量分析のための装置および方法 - Google Patents

携帯用質量分析のための装置および方法 Download PDF

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JP5890782B2
JP5890782B2 JP2012546200A JP2012546200A JP5890782B2 JP 5890782 B2 JP5890782 B2 JP 5890782B2 JP 2012546200 A JP2012546200 A JP 2012546200A JP 2012546200 A JP2012546200 A JP 2012546200A JP 5890782 B2 JP5890782 B2 JP 5890782B2
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analyte
source
frequency
mass
ion trap
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JP2013516036A (ja
JP2013516036A5 (enExample
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チャン−シュアン チェン，
チャン−シュアン チェン，
ジョン−リー リン，
ジョン−リー リン，
ミン−リー チュー，
ミン−リー チュー，
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Academia Sinica
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Academia Sinica
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0022—Portable spectrometers, e.g. devices comprising independent power supply, constructional details relating to portability
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2012546200A 2009-12-23 2010-12-22 携帯用質量分析のための装置および方法 Active JP5890782B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US28953109P 2009-12-23 2009-12-23
US61/289,531 2009-12-23
PCT/US2010/061821 WO2011079202A1 (en) 2009-12-23 2010-12-22 Apparatuses and methods for portable mass spectrometry

Publications (3)

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JP2013516036A JP2013516036A (ja) 2013-05-09
JP2013516036A5 JP2013516036A5 (enExample) 2014-03-06
JP5890782B2 true JP5890782B2 (ja) 2016-03-22

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JP2012546200A Active JP5890782B2 (ja) 2009-12-23 2010-12-22 携帯用質量分析のための装置および方法

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US (1) US9224586B2 (enExample)
EP (1) EP2517223A4 (enExample)
JP (1) JP5890782B2 (enExample)
TW (1) TWI512783B (enExample)
WO (1) WO2011079202A1 (enExample)

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US9711341B2 (en) 2014-06-10 2017-07-18 The University Of North Carolina At Chapel Hill Mass spectrometry systems with convective flow of buffer gas for enhanced signals and related methods
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US12315696B2 (en) * 2020-03-02 2025-05-27 National Institute For Materials Science Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples
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JP7141432B2 (ja) * 2020-09-24 2022-09-22 ９０８ デバイセズ インク． コンパクトな質量分析計
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Also Published As

Publication number Publication date
US20110147581A1 (en) 2011-06-23
CN102754181A (zh) 2012-10-24
JP2013516036A (ja) 2013-05-09
EP2517223A1 (en) 2012-10-31
TW201135794A (en) 2011-10-16
WO2011079202A1 (en) 2011-06-30
TWI512783B (zh) 2015-12-11
EP2517223A4 (en) 2015-11-18
US9224586B2 (en) 2015-12-29

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