TWI500912B - 量子效率測量方法、量子效率測量裝置以及積分器 - Google Patents
量子效率測量方法、量子效率測量裝置以及積分器 Download PDFInfo
- Publication number
- TWI500912B TWI500912B TW100105595A TW100105595A TWI500912B TW I500912 B TWI500912 B TW I500912B TW 100105595 A TW100105595 A TW 100105595A TW 100105595 A TW100105595 A TW 100105595A TW I500912 B TWI500912 B TW I500912B
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- Prior art keywords
- excitation light
- integrator
- window
- quantum efficiency
- spectrum
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- 238000000691 measurement method Methods 0.000 title description 2
- 230000005284 excitation Effects 0.000 claims description 254
- 238000001228 spectrum Methods 0.000 claims description 136
- 230000010354 integration Effects 0.000 claims description 75
- 230000003287 optical effect Effects 0.000 claims description 31
- 238000000034 method Methods 0.000 claims description 16
- 230000007246 mechanism Effects 0.000 claims description 10
- 238000004364 calculation method Methods 0.000 claims description 7
- 230000001678 irradiating effect Effects 0.000 claims description 7
- 238000009792 diffusion process Methods 0.000 claims description 2
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J2001/0481—Preset integrating sphere or cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
- G01N2021/6469—Cavity, e.g. ellipsoid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
- G01N2201/0655—Hemispheres
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010061804A JP5640257B2 (ja) | 2010-03-18 | 2010-03-18 | 量子効率測定方法および量子効率測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201135197A TW201135197A (en) | 2011-10-16 |
| TWI500912B true TWI500912B (zh) | 2015-09-21 |
Family
ID=44601322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100105595A TWI500912B (zh) | 2010-03-18 | 2011-02-21 | 量子效率測量方法、量子效率測量裝置以及積分器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8415639B2 (enExample) |
| JP (1) | JP5640257B2 (enExample) |
| KR (1) | KR101781219B1 (enExample) |
| CN (1) | CN102192786B (enExample) |
| TW (1) | TWI500912B (enExample) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4666376A (en) | 1984-06-04 | 1987-05-19 | Solomon Fred D | Solar powered pump assembly |
| JP5491368B2 (ja) | 2010-11-29 | 2014-05-14 | 浜松ホトニクス株式会社 | 量子収率測定装置及び量子収率測定方法 |
| JP5491369B2 (ja) | 2010-11-29 | 2014-05-14 | 浜松ホトニクス株式会社 | 量子収率測定装置 |
| JP5760589B2 (ja) * | 2011-03-30 | 2015-08-12 | 豊田合成株式会社 | 白色ｌｅｄ装置用蛍光体の蛍光スペクトルの測定方法及び測定装置 |
| WO2013054379A1 (en) * | 2011-10-13 | 2013-04-18 | Otsuka Electronics Co., Ltd. | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
| JP2014535056A (ja) * | 2011-11-08 | 2014-12-25 | ザ・トラスティーズ・オブ・コロンビア・ユニバーシティ・イン・ザ・シティ・オブ・ニューヨーク | トモグラフィのデータを取り込むための同時多方向イメージングに向けたシステムと方法 |
| JP6041691B2 (ja) * | 2013-01-31 | 2016-12-14 | 大塚電子株式会社 | 測定装置および測定方法 |
| JP5529305B1 (ja) | 2013-02-04 | 2014-06-25 | 浜松ホトニクス株式会社 | 分光測定装置、及び分光測定方法 |
| CN103344621B (zh) * | 2013-07-03 | 2015-12-02 | 重庆大学 | 一种荧光量子效率测量装置及其测量方法 |
| JP6279399B2 (ja) | 2014-05-23 | 2018-02-14 | 浜松ホトニクス株式会社 | 光計測装置及び光計測方法 |
| EP3229000B1 (en) | 2014-12-02 | 2022-05-04 | Hamamatsu Photonics K.K. | Spectrometry device and spectrometry method |
| JP6693694B2 (ja) * | 2014-12-02 | 2020-05-13 | 浜松ホトニクス株式会社 | 分光測定装置および分光測定方法 |
| CN104713647A (zh) * | 2015-03-10 | 2015-06-17 | 张美英 | 光谱仪及光谱分析方法 |
| JP6613063B2 (ja) * | 2015-07-07 | 2019-11-27 | 大塚電子株式会社 | 光学特性測定システム |
| JP6227068B1 (ja) * | 2016-07-27 | 2017-11-08 | 浜松ホトニクス株式会社 | 試料容器保持部材、光計測装置及び試料容器配置方法 |
| EP3526560A4 (en) * | 2016-10-11 | 2020-07-08 | Victoria Link Limited | SPECTROMETER APPARATUS FOR MEASURING SPECTRUMS OF A LIQUID SAMPLE USING AN INTEGRATION CAVITY |
| JP2018179884A (ja) * | 2017-04-19 | 2018-11-15 | 株式会社島津製作所 | 量子収率算出方法、分光蛍光光度計及び量子収率算出プログラム |
| CN107228849B (zh) * | 2017-06-23 | 2019-04-26 | 厦门大学 | 白光led荧光粉变温光谱特性的透射式测试装置及方法 |
| JP6856558B2 (ja) * | 2018-01-23 | 2021-04-07 | 浜松ホトニクス株式会社 | 光測定装置及び光測定方法 |
| JP6856559B2 (ja) | 2018-01-23 | 2021-04-07 | 浜松ホトニクス株式会社 | 光測定装置及び光測定方法 |
| CN112020639B (zh) * | 2018-02-27 | 2024-03-29 | 圣安德鲁斯大学董事会 | 用于分析包含颗粒的液体样品的设备 |
| CN111175627B (zh) * | 2018-11-09 | 2023-04-07 | 固安鼎材科技有限公司 | 一种oled器件光电及量子效率测试系统 |
| GB202001397D0 (en) | 2020-01-31 | 2020-03-18 | Odx Innovations Ltd | Apparatus, system and method for measuring properties of a sample |
| CN111707369B (zh) * | 2020-06-28 | 2024-04-12 | 中国计量大学 | 一种双光路分光测色仪及测色方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002310902A (ja) * | 2001-04-16 | 2002-10-23 | Central Glass Co Ltd | 波長選択性のある散乱光測定方法 |
| CN1639965A (zh) * | 2002-02-22 | 2005-07-13 | 鲁道夫·施瓦脱 | 用于检测和处理电信号和光信号的方法和装置 |
| TW200729655A (en) * | 2005-10-07 | 2007-08-01 | Fujifilm Corp | Method and apparatus for driving semiconductor lasers, and method and apparatus for deriving drive current patterns for semiconductor lasers |
| US20070242264A1 (en) * | 2006-04-12 | 2007-10-18 | Matsushita Electric Industrial Co., Ltd. | Optical measuring device |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05113386A (ja) * | 1990-11-30 | 1993-05-07 | Shimadzu Corp | 光損失測定装置 |
| JP3117565B2 (ja) * | 1992-11-27 | 2000-12-18 | 松下電器産業株式会社 | 光束計 |
| JP3287775B2 (ja) * | 1996-02-29 | 2002-06-04 | 松下電器産業株式会社 | 蛍光体の量子効率測定方法および測定装置 |
| JP3247845B2 (ja) | 1996-11-13 | 2002-01-21 | 松下電器産業株式会社 | 蛍光体の量子効率測定方法および装置 |
| JP3266046B2 (ja) | 1997-04-21 | 2002-03-18 | 松下電器産業株式会社 | 蛍光体の量子効率測定装置 |
| JP3437140B2 (ja) * | 2000-03-28 | 2003-08-18 | 株式会社島津製作所 | 赤外放射温度計 |
| JP4418731B2 (ja) * | 2004-10-27 | 2010-02-24 | 日本放送協会 | フォトルミネッセンス量子収率測定方法およびこれに用いる装置 |
| JP2007298310A (ja) * | 2006-04-27 | 2007-11-15 | Sanyo Electric Co Ltd | 光学装置 |
| JP4452737B2 (ja) * | 2007-10-25 | 2010-04-21 | 大塚電子株式会社 | 光束計および測定方法 |
-
2010
- 2010-03-18 JP JP2010061804A patent/JP5640257B2/ja active Active
-
2011
- 2011-02-21 TW TW100105595A patent/TWI500912B/zh active
- 2011-02-24 US US13/033,612 patent/US8415639B2/en active Active
- 2011-03-17 KR KR1020110023609A patent/KR101781219B1/ko active Active
- 2011-03-18 CN CN201110069976.0A patent/CN102192786B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002310902A (ja) * | 2001-04-16 | 2002-10-23 | Central Glass Co Ltd | 波長選択性のある散乱光測定方法 |
| CN1639965A (zh) * | 2002-02-22 | 2005-07-13 | 鲁道夫·施瓦脱 | 用于检测和处理电信号和光信号的方法和装置 |
| TW200729655A (en) * | 2005-10-07 | 2007-08-01 | Fujifilm Corp | Method and apparatus for driving semiconductor lasers, and method and apparatus for deriving drive current patterns for semiconductor lasers |
| US20070242264A1 (en) * | 2006-04-12 | 2007-10-18 | Matsushita Electric Industrial Co., Ltd. | Optical measuring device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102192786B (zh) | 2014-10-29 |
| KR101781219B1 (ko) | 2017-09-22 |
| CN102192786A (zh) | 2011-09-21 |
| JP5640257B2 (ja) | 2014-12-17 |
| US8415639B2 (en) | 2013-04-09 |
| TW201135197A (en) | 2011-10-16 |
| KR20110105349A (ko) | 2011-09-26 |
| JP2011196735A (ja) | 2011-10-06 |
| US20110226961A1 (en) | 2011-09-22 |
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