TWI484613B - 半導體裝置、半導體裝置之製造方法及半導體裝置之製造設備 - Google Patents
半導體裝置、半導體裝置之製造方法及半導體裝置之製造設備 Download PDFInfo
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- TWI484613B TWI484613B TW100109462A TW100109462A TWI484613B TW I484613 B TWI484613 B TW I484613B TW 100109462 A TW100109462 A TW 100109462A TW 100109462 A TW100109462 A TW 100109462A TW I484613 B TWI484613 B TW I484613B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/2075—Diameter ranges larger or equal to 1 micron less than 10 microns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20751—Diameter ranges larger or equal to 10 microns less than 20 microns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20752—Diameter ranges larger or equal to 20 microns less than 30 microns
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/20—Parameters
- H01L2924/207—Diameter ranges
- H01L2924/20753—Diameter ranges larger or equal to 30 microns less than 40 microns
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
- Led Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010139998A JP2012004464A (ja) | 2010-06-18 | 2010-06-18 | 半導体装置、半導体装置の製造方法及び半導体装置の製造装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201201341A TW201201341A (en) | 2012-01-01 |
| TWI484613B true TWI484613B (zh) | 2015-05-11 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100109462A TWI484613B (zh) | 2010-06-18 | 2011-03-18 | 半導體裝置、半導體裝置之製造方法及半導體裝置之製造設備 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8237295B2 (enExample) |
| JP (1) | JP2012004464A (enExample) |
| CN (1) | CN102290391B (enExample) |
| TW (1) | TWI484613B (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013143447A (ja) * | 2012-01-10 | 2013-07-22 | Toshiba Corp | 半導体装置の製造方法およびボンディング装置 |
| KR102621753B1 (ko) | 2018-09-28 | 2024-01-05 | 삼성전자주식회사 | 본딩 와이어, 이를 포함하는 반도체 패키지, 및 와이어 본딩 방법 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200504903A (en) * | 2003-06-24 | 2005-02-01 | Renesas Tech Corp | Semiconductor device |
| TW200807586A (en) * | 2006-07-27 | 2008-02-01 | Fujitsu Ltd | Semiconductor device and manufacturing method for the same |
| US20080197461A1 (en) * | 2007-02-15 | 2008-08-21 | Taiwan Semiconductor Manufacturing Co.,Ltd. | Apparatus for wire bonding and integrated circuit chip package |
| TW200915450A (en) * | 2007-09-21 | 2009-04-01 | Shinkawa Kk | Semiconductor device and wire bonding method |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7200930B2 (en) * | 1994-11-15 | 2007-04-10 | Formfactor, Inc. | Probe for semiconductor devices |
| WO1996016440A1 (en) * | 1994-11-15 | 1996-05-30 | Formfactor, Inc. | Interconnection elements for microelectronic components |
| JPH0951011A (ja) * | 1995-08-10 | 1997-02-18 | Tanaka Denshi Kogyo Kk | 半導体チップのワイヤボンディング方法 |
| EP1158579B1 (en) * | 1996-10-01 | 2008-11-19 | Panasonic Corporation | Wire bonding capillary for forming bump electrodes |
| JP2004172477A (ja) | 2002-11-21 | 2004-06-17 | Kaijo Corp | ワイヤループ形状、そのワイヤループ形状を備えた半導体装置、ワイヤボンディング方法及び半導体製造装置 |
| JP2005167178A (ja) * | 2003-11-10 | 2005-06-23 | Shinkawa Ltd | 半導体装置及びワイヤボンディング方法 |
| US7347352B2 (en) * | 2003-11-26 | 2008-03-25 | Kulicke And Soffa Industries, Inc. | Low loop height ball bonding method and apparatus |
| CN1886226A (zh) * | 2003-11-26 | 2006-12-27 | 库利克和索夫工业公司 | 低回路高度球焊方法和设备 |
| JP4298665B2 (ja) * | 2005-02-08 | 2009-07-22 | 株式会社新川 | ワイヤボンディング方法 |
| US7371676B2 (en) * | 2005-04-08 | 2008-05-13 | Micron Technology, Inc. | Method for fabricating semiconductor components with through wire interconnects |
| WO2008048262A1 (en) * | 2006-10-18 | 2008-04-24 | Kulicke And Soffa Industries, Inc. | Improved conductive bumps, wire loops including the improved conductive bumps, and methods of forming the same |
| KR101143836B1 (ko) * | 2006-10-27 | 2012-05-04 | 삼성테크윈 주식회사 | 반도체 패키지 및 그 반도체 패키지의 와이어 루프 형성방법 |
| JP2008117888A (ja) * | 2006-11-02 | 2008-05-22 | Rohm Co Ltd | 電子部品、およびワイヤボンディング方法 |
| JP2009010064A (ja) * | 2007-06-27 | 2009-01-15 | Shinkawa Ltd | 半導体装置及びワイヤボンディング方法 |
| US7572679B2 (en) * | 2007-07-26 | 2009-08-11 | Texas Instruments Incorporated | Heat extraction from packaged semiconductor chips, scalable with chip area |
| JP4625858B2 (ja) * | 2008-09-10 | 2011-02-02 | 株式会社カイジョー | ワイヤボンディング方法、ワイヤボンディング装置及びワイヤボンディング制御プログラム |
| JP4344002B1 (ja) * | 2008-10-27 | 2009-10-14 | 株式会社新川 | ワイヤボンディング方法 |
-
2010
- 2010-06-18 JP JP2010139998A patent/JP2012004464A/ja active Pending
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2011
- 2011-03-18 TW TW100109462A patent/TWI484613B/zh active
- 2011-03-18 CN CN201110066789.7A patent/CN102290391B/zh active Active
- 2011-03-21 US US13/052,368 patent/US8237295B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200504903A (en) * | 2003-06-24 | 2005-02-01 | Renesas Tech Corp | Semiconductor device |
| TW200807586A (en) * | 2006-07-27 | 2008-02-01 | Fujitsu Ltd | Semiconductor device and manufacturing method for the same |
| US20080197461A1 (en) * | 2007-02-15 | 2008-08-21 | Taiwan Semiconductor Manufacturing Co.,Ltd. | Apparatus for wire bonding and integrated circuit chip package |
| TW200915450A (en) * | 2007-09-21 | 2009-04-01 | Shinkawa Kk | Semiconductor device and wire bonding method |
Also Published As
| Publication number | Publication date |
|---|---|
| US8237295B2 (en) | 2012-08-07 |
| TW201201341A (en) | 2012-01-01 |
| US20110309502A1 (en) | 2011-12-22 |
| CN102290391B (zh) | 2014-11-12 |
| JP2012004464A (ja) | 2012-01-05 |
| CN102290391A (zh) | 2011-12-21 |
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