TWI471864B - - Google Patents
Info
- Publication number
- TWI471864B TWI471864B TW101116890A TW101116890A TWI471864B TW I471864 B TWI471864 B TW I471864B TW 101116890 A TW101116890 A TW 101116890A TW 101116890 A TW101116890 A TW 101116890A TW I471864 B TWI471864 B TW I471864B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110138166 CN102163165B (zh) | 2011-05-26 | 2011-05-26 | 一种闪存错误预估模块及其预估方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201248640A TW201248640A (en) | 2012-12-01 |
| TWI471864B true TWI471864B (zh) | 2015-02-01 |
Family
ID=44464402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101116890A TW201248640A (en) | 2011-05-26 | 2012-05-11 | Error estimation module and estimation method thereof for flash memory |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9047212B2 (zh) |
| JP (1) | JP6048497B2 (zh) |
| CN (1) | CN102163165B (zh) |
| TW (1) | TW201248640A (zh) |
| WO (1) | WO2012159490A1 (zh) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102163165B (zh) * | 2011-05-26 | 2012-11-14 | 忆正存储技术（武汉）有限公司 | 一种闪存错误预估模块及其预估方法 |
| TWI525635B (zh) | 2013-12-17 | 2016-03-11 | 慧榮科技股份有限公司 | 資料儲存裝置及其資料維護方法 |
| US9396080B2 (en) * | 2014-08-07 | 2016-07-19 | Sandisk Technologies Llc | Storage module and method for analysis and disposition of dynamically tracked read error events |
| CN104217765B (zh) * | 2014-09-09 | 2017-11-24 | 武汉新芯集成电路制造有限公司 | 闪存芯片操作时间的测量方法 |
| CN105159840B (zh) * | 2015-10-16 | 2018-11-02 | 华中科技大学 | 一种闪存器件的软信息提取方法 |
| CN106155587B (zh) * | 2016-06-29 | 2019-11-12 | 深圳忆联信息系统有限公司 | 信息处理方法及存储设备 |
| CN107220185A (zh) * | 2017-05-23 | 2017-09-29 | 建荣半导体（深圳）有限公司 | 基于闪存的数据存储方法、装置以及闪存芯片 |
| CN107203341A (zh) * | 2017-05-23 | 2017-09-26 | 建荣半导体（深圳）有限公司 | 基于闪存的数据存储方法、装置以及闪存芯片 |
| CN113113076A (zh) | 2017-08-08 | 2021-07-13 | 慧荣科技股份有限公司 | 解码方法及相关的闪存控制器与电子装置 |
| US10269422B2 (en) * | 2017-09-08 | 2019-04-23 | Cnex Labs, Inc. | Storage system with data reliability mechanism and method of operation thereof |
| CN110806794A (zh) * | 2019-10-10 | 2020-02-18 | 浙江大华技术股份有限公司 | 存储系统的掉电保护方法、系统、计算机设备以及介质 |
| CN111240887A (zh) * | 2020-01-07 | 2020-06-05 | 苏州大学 | 基于三维闪存存储结构的错误页识别方法 |
| CN113362877B (zh) * | 2020-03-03 | 2022-06-03 | 杭州海康存储科技有限公司 | 一种阈值电压确定方法和装置 |
| CN111859791B (zh) * | 2020-07-08 | 2023-12-26 | 上海威固信息技术股份有限公司 | 一种闪存数据保存错误率仿真方法 |
| CN111859792B (zh) * | 2020-07-08 | 2023-12-26 | 上海威固信息技术股份有限公司 | 一种闪存操作时延仿真方法 |
| CN111859643B (zh) * | 2020-07-08 | 2023-12-19 | 上海威固信息技术股份有限公司 | 一种三维闪存编程时延模型的建立方法及基于该模型的预测方法 |
| CN111880736B (zh) * | 2020-07-28 | 2022-08-16 | 苏州浪潮智能科技有限公司 | 一种固态硬盘访问方法、装置、设备及介质 |
| CN112069004B (zh) * | 2020-08-21 | 2023-01-06 | 苏州浪潮智能科技有限公司 | 一种闪存芯片中块读取与页读取换算关系测试方法及系统 |
| CN113643746B (zh) * | 2021-07-02 | 2023-09-26 | 深圳市宏旺微电子有限公司 | 闪存数据的分析方法、装置、终端设备及存储介质 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW307010B (zh) * | 1995-03-15 | 1997-06-01 | Hitachi Ltd | |
| CN1882918A (zh) * | 2003-10-03 | 2006-12-20 | 桑迪士克股份有限公司 | 快闪存储器数据校正及擦除技术 |
| WO2008066058A1 (fr) * | 2006-11-30 | 2008-06-05 | Kabushiki Kaisha Toshiba | Système mémoire |
| TW200907995A (en) * | 2007-08-06 | 2009-02-16 | Ind Tech Res Inst | Method and system of defect management for storage medium |
| US20100002506A1 (en) * | 2008-07-04 | 2010-01-07 | Samsung Electronics Co., Ltd. | Memory device and memory programming method |
| US20100077266A1 (en) * | 2008-04-24 | 2010-03-25 | Shinichi Kanno | Memory system and control method thereof |
| TW201021045A (en) * | 2008-11-18 | 2010-06-01 | Ind Tech Res Inst | Reliability test method for solid storage medium |
| TWI339337B (en) * | 2006-02-10 | 2011-03-21 | Sandisk Il Ltd | Method for estimating and reporting the life expectancy of flash-disk memory |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08190510A (ja) * | 1995-01-12 | 1996-07-23 | Hitachi Ltd | 不良部分を含む半導体メモリを搭載可能な情報処理装置 |
| JPH09259593A (ja) * | 1996-03-19 | 1997-10-03 | Canon Inc | メモリ装置 |
| JP2008508632A (ja) * | 2004-08-02 | 2008-03-21 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | データ記憶及び再生装置 |
| TWI368225B (en) * | 2007-11-29 | 2012-07-11 | Ind Tech Res Inst | Recoding medium structure capable of displaying defect rate |
| US8335977B2 (en) * | 2007-12-05 | 2012-12-18 | Densbits Technologies Ltd. | Flash memory apparatus and methods using a plurality of decoding stages including optional use of concatenated BCH codes and/or designation of “first below” cells |
| KR20100064005A (ko) * | 2008-12-04 | 2010-06-14 | 주식회사 하이닉스반도체 | 플래시 메모리 소자의 소거 방법 |
| CN101752008B (zh) * | 2008-12-05 | 2013-07-10 | 建兴电子科技股份有限公司 | 固态储存媒体可靠度的测试方法 |
| US8316173B2 (en) * | 2009-04-08 | 2012-11-20 | International Business Machines Corporation | System, method, and computer program product for analyzing monitor data information from a plurality of memory devices having finite endurance and/or retention |
| JP2011070346A (ja) * | 2009-09-25 | 2011-04-07 | Toshiba Corp | メモリシステム |
| CN102163165B (zh) * | 2011-05-26 | 2012-11-14 | 忆正存储技术（武汉）有限公司 | 一种闪存错误预估模块及其预估方法 |
| US9176810B2 (en) * | 2011-05-27 | 2015-11-03 | SanDisk Technologies, Inc. | Bit error reduction through varied data positioning |
-
2011
- 2011-05-26 CN CN 201110138166 patent/CN102163165B/zh active Active
-
2012
- 2012-03-23 JP JP2014511714A patent/JP6048497B2/ja active Active
- 2012-03-23 WO PCT/CN2012/072955 patent/WO2012159490A1/zh active Application Filing
- 2012-03-23 US US14/119,121 patent/US9047212B2/en active Active
- 2012-05-11 TW TW101116890A patent/TW201248640A/zh unknown
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW307010B (zh) * | 1995-03-15 | 1997-06-01 | Hitachi Ltd | |
| CN1882918A (zh) * | 2003-10-03 | 2006-12-20 | 桑迪士克股份有限公司 | 快闪存储器数据校正及擦除技术 |
| TWI339337B (en) * | 2006-02-10 | 2011-03-21 | Sandisk Il Ltd | Method for estimating and reporting the life expectancy of flash-disk memory |
| WO2008066058A1 (fr) * | 2006-11-30 | 2008-06-05 | Kabushiki Kaisha Toshiba | Système mémoire |
| TW200907995A (en) * | 2007-08-06 | 2009-02-16 | Ind Tech Res Inst | Method and system of defect management for storage medium |
| US20100077266A1 (en) * | 2008-04-24 | 2010-03-25 | Shinichi Kanno | Memory system and control method thereof |
| US20100002506A1 (en) * | 2008-07-04 | 2010-01-07 | Samsung Electronics Co., Ltd. | Memory device and memory programming method |
| TW201021045A (en) * | 2008-11-18 | 2010-06-01 | Ind Tech Res Inst | Reliability test method for solid storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2014517970A (ja) | 2014-07-24 |
| US9047212B2 (en) | 2015-06-02 |
| US20140089765A1 (en) | 2014-03-27 |
| CN102163165A (zh) | 2011-08-24 |
| CN102163165B (zh) | 2012-11-14 |
| TW201248640A (en) | 2012-12-01 |
| WO2012159490A1 (zh) | 2012-11-29 |
| JP6048497B2 (ja) | 2016-12-21 |