TWI466750B - Welding needle - Google Patents
Welding needle Download PDFInfo
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- TWI466750B TWI466750B TW102127249A TW102127249A TWI466750B TW I466750 B TWI466750 B TW I466750B TW 102127249 A TW102127249 A TW 102127249A TW 102127249 A TW102127249 A TW 102127249A TW I466750 B TWI466750 B TW I466750B
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- end surface
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- tip end
- welding pin
- wire
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45147—Copper (Cu) as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78301—Capillary
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
- H01L2224/7825—Means for applying energy, e.g. heating means
- H01L2224/783—Means for applying energy, e.g. heating means by means of pressure
- H01L2224/78301—Capillary
- H01L2224/78302—Shape
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
Description
本發明的態樣是關於銲針(bonding capillary),具體上是關於適合進行利用銅等的硬的銲線(bonding wire)進行的接合(bonding)的情形之銲針。The aspect of the invention relates to a bonding capillary, and in particular to a soldering pin in a case where bonding is performed by a hard bonding wire such as copper.
在以細金屬線(thin metallic wire)接合半導體元件與導線架(lead frame)的導線(lead)之打線接合(wire bonding)中,使用銲針將細金屬線(銲線)的一端壓接於電極墊(electrode pad)(第一銲(first bond)),接著拉細金屬線壓接於導線(第二銲(second bond)。在壓接細金屬線時,藉由在透過銲針緊壓細金屬線的狀態下施加超音波而實現確實的壓接。In a wire bonding in which a semiconductor element and a lead of a lead frame are bonded by a thin metal wire, one end of the thin metal wire (bonding wire) is crimped using a soldering pin. An electrode pad (first bond), followed by a crimped metal wire crimped to the wire (second bond). When crimping the thin metal wire, by pressing through the soldering pin Ultrasonic waves are applied in the state of the thin metal wires to achieve a reliable crimping.
近年來,銲線的材料使用成本比金還低的銅的嘗試擴大。但是,在銅線的接合中,因銅線硬,故很難得到高的接合強度,且銲針的頂端部容易磨耗。因此,有與使用金線的情形比較,銲針的更換頻率變高的問題。In recent years, attempts have been made to increase the cost of materials for wire bonding to copper that is lower than gold. However, in the joining of the copper wires, since the copper wires are hard, it is difficult to obtain high joint strength, and the tip end portion of the solder pins is easily worn. Therefore, there is a problem that the frequency of replacement of the solder pins becomes higher as compared with the case of using gold wires.
在專利文獻1中揭示有:可藉由在銲針的頂端面形成具有圓度的凸凹,使附著於頂端面的附著物減少並延長壽命的銲針。而且,在專利文獻2中揭示有:可延長壽命的銲針係在銲針的頂端部的一部分露出材料的粒子 構造之構成。Patent Document 1 discloses a welding pin which can reduce the adhesion of the tip end surface and extend the life by forming a convex and concave having a roundness on the tip end surface of the welding pin. Further, Patent Document 2 discloses that a solder needle which can extend the life is a particle which is exposed to a part of the tip end portion of the welding pin. The composition of the structure.
但是,在專利文獻1、2的任一技術中,為了對銲線的抓緊力的提高或長期維持初期的接合強度仍有改善的餘地。特別是當使用銅線等比金線硬的銲線時,接合強度的降低或因磨耗造成的壽命的降低之問題變得顯著。However, in any of the techniques of Patent Documents 1 and 2, there is still room for improvement in terms of improving the grip force of the bonding wire or maintaining the initial bonding strength for a long period of time. In particular, when a bonding wire which is harder than a gold wire such as a copper wire is used, the problem of a decrease in joint strength or a decrease in life due to abrasion becomes remarkable.
[專利文獻1]日本國實開昭62-190343號公報[Patent Document 1] Japanese National Publication No. 62-190343
[專利文獻2]日本國特表2009-540624號公報[Patent Document 2] Japanese National Patent Publication No. 2009-540624
本發明是根據如此的課題的認識所進行的創作,其目的為提供一種可長期維持充分的接合強度之銲針。The present invention has been made in recognition of such a problem, and an object thereof is to provide a welding pin which can maintain sufficient joint strength for a long period of time.
第一發明為一種銲針,其特徵包含:具有打線接合的頂端面之本體部,前述頂端面具有微細的凹凸形狀,前述凹凸形狀中的凸部的頂端的尖端比前述凹凸形狀中的凹部的頂端的尖端小,由垂直於前述頂端面的方向看時的前述凸部的面積比前述凹部的面積大,前述頂端面的偏斜度(skewness)為-0.3以下,且前述頂端面的平均高度為0.06微米(micrometer)以上0.3微米以下。According to a first aspect of the invention, a welding pin includes: a main body portion having a top end surface of a wire bonding, wherein the distal end surface has a fine uneven shape, and a tip end of the convex portion of the uneven shape is larger than a concave portion of the uneven shape The tip end of the tip is small, and the area of the convex portion when viewed in a direction perpendicular to the distal end surface is larger than the area of the concave portion, and the skewness of the distal end surface is -0.3 or less, and the average height of the distal end surface is It is 0.06 micrometer or more and 0.3 micrometer or less.
依照該銲針,可確保初期的接合強度,同時即使進行重複接合也能長期維持該接合強度。According to the welding pin, the initial bonding strength can be ensured, and the bonding strength can be maintained for a long period of time even if the bonding is repeated.
而且,第二發明為一種銲針,其特徵包含:具有打線接合的頂端面之本體部,前述頂端面具有微細的凹凸形狀,前述凹凸形狀中的凸部的頂端的尖端比前述凹凸形狀中的凹部的頂端的尖端小,由垂直於前述頂端面的 方向看時的前述凸部的面積比前述凹部的頂端面積大,前述頂端面的偏斜度為-0.43以下,且前述頂端面的平均高度為0.16微米以上0.3微米以下。Further, a second aspect of the invention provides a welding pin comprising: a main body portion having a top end surface of a wire bonding, wherein the distal end surface has a fine uneven shape, and a tip end of the convex portion of the uneven shape is larger than a tip end of the uneven shape The tip end of the recess is small, perpendicular to the aforementioned tip end surface The area of the convex portion when viewed in the direction is larger than the area of the distal end of the concave portion, the skewness of the distal end surface is -0.43 or less, and the average height of the distal end surface is 0.16 μm or more and 0.3 μm or less.
依照該銲針,因與金屬線(wire)的接觸面積增加,並且成為朝凹部陡峭的斜度,故頂端表面與銲線之間的抓緊力增加。According to the welding pin, since the contact area with the wire increases and the inclination becomes steep toward the concave portion, the gripping force between the tip end surface and the bonding wire increases.
依照該銲針,伴隨使用中的磨耗的形狀變化更少,即使進行重複接合也能長期維持初期的接合強度。According to this welding pin, the shape change accompanying abrasion during use is small, and the initial joining strength can be maintained for a long period of time even if the joining is repeated.
而且,第三發明為一種銲針,在第一發明或第二發明中,前述頂端面的最大峰高為前述平均高度的0.9倍以下。Further, the third invention is a welding pin, and in the first invention or the second invention, the maximum peak height of the distal end surface is 0.9 times or less of the average height.
依照該銲針,伴隨使用中的磨耗的形狀變化少,即使進行重複接合也能長期維持初期的接合強度。According to this welding pin, the shape change accompanying abrasion during use is small, and the initial joining strength can be maintained for a long period of time even if the joining is repeated.
而且,第四發明為一種銲針,在第一發明或第二發明中,露出於前述頂端面的結晶的平均粒徑(mean particle size)為1.2微米以下。Further, the fourth invention is a welding pin, and in the first invention or the second invention, the mean particle size of the crystal exposed on the distal end surface is 1.2 μm or less.
依照該銲針,若陶瓷的結晶的平均粒徑為1.2微米以下,則可減少頂端面的磨耗。According to the welding pin, if the average particle diameter of the crystal of the ceramic is 1.2 μm or less, the abrasion of the tip end surface can be reduced.
而且,第五發明為一種銲針,在第一發明或第二發明發明中,前述本體部具有:配設於前述頂端面側,插通銲線的孔,與設置於前述孔與前述頂端面之間的倒角部(chamfer part),前述頂端面的前述凹凸形狀在前述頂端面之中由前述倒角部的邊緣沿著前述頂端面離開前述孔的方向至少20微米的表面區域中,藉由被以至少長度100微 米測定的粗糙度曲線(roughness curve)求出。According to a fifth aspect of the invention, in the first aspect of the invention, the main body portion includes: a hole disposed on the distal end surface side, through which the bonding wire is inserted, and the hole and the tip end surface In the chamfer part, the uneven shape of the distal end surface is obtained by a surface of the chamfered portion at least 20 micrometers in a direction away from the hole along the distal end surface of the distal end surface. By being at least 100 micrometers in length The roughness curve of the meter measurement was obtained.
依照該銲針,針對第一~第五的任一發明的每一個,若為在前述表面區域中藉由以至少長度100微米測定的粗糙度曲線求出的凹凸形狀的話,則可長期維持充分的接合強度。According to the welding pin, each of the first to fifth inventions can be sufficiently maintained for a long period of time if it is a concave-convex shape obtained by a roughness curve measured at least 100 μm in the surface region. Joint strength.
依照本發明的態樣,可提供一種可長期維持充分的接合強度之銲針。According to the aspect of the invention, it is possible to provide a welding pin which can maintain sufficient joint strength for a long period of time.
10‧‧‧本體部10‧‧‧ Body Department
11‧‧‧圓筒部11‧‧‧Cylinder
11h‧‧‧孔11h‧‧‧ hole
12‧‧‧圓錐部12‧‧‧Cone
13‧‧‧瓶頸部13‧‧‧ Bottleneck
13c‧‧‧倒角部13c‧‧‧Chamfering
50、51、52‧‧‧頂端面50, 51, 52‧ ‧ top surface
50r‧‧‧表面區域50r‧‧‧Surface area
110‧‧‧銲針110‧‧‧ soldering needle
200‧‧‧導線200‧‧‧ wire
BW‧‧‧金屬線BW‧‧‧metal wire
CIR‧‧‧圓CIR‧‧‧ Round
Cpk‧‧‧製程能力指數Cpk‧‧‧Process Capability Index
L1‧‧‧長度L1‧‧‧ length
L2‧‧‧測定長度L2‧‧‧Measure length
Rc‧‧‧平均高度Rc‧‧ average height
Rp‧‧‧最大峰高Rp‧‧‧Maximum peak height
Rsk‧‧‧偏斜度Rsk‧‧‧ skewness
圖1是舉例說明與本實施形態有關的銲針之模式圖。Fig. 1 is a schematic view showing a welding pin according to the embodiment.
圖2是舉例說明與本實施形態有關的銲針的頂端形狀之模式的放大視圖。Fig. 2 is an enlarged plan view showing a mode of a tip shape of a welding pin according to the embodiment.
圖3是舉例說明與本實施形態有關的銲針的頂端面之模式的放大視圖。Fig. 3 is an enlarged plan view illustrating a mode of a tip end surface of a welding pin according to the embodiment.
圖4是舉例說明打線接合的狀態之模式的剖面圖。Fig. 4 is a cross-sectional view showing a mode of a state in which wire bonding is performed.
圖5(a)及(b)是舉例說明在本實施形態的頂端面的凹凸形狀之圖。Figs. 5(a) and 5(b) are views for explaining the uneven shape of the distal end surface of the embodiment.
圖6(a)及(b)是舉例說明在參考例(其一)的頂端面的凹凸形狀之圖。6(a) and 6(b) are diagrams illustrating the concavo-convex shape of the distal end surface of the reference example (the first).
圖7(a)及(b)是舉例說明在參考例(其二)的頂端面的凹凸形狀之圖。7(a) and 7(b) are diagrams illustrating the concavo-convex shape of the distal end surface of the reference example (the second).
圖8是顯示實施例及比較例的評價結果之圖。Fig. 8 is a view showing evaluation results of Examples and Comparative Examples.
圖9是舉例說明測定區域之模式的斜視圖。Fig. 9 is a perspective view illustrating a mode of a measurement area.
圖10是顯示接合強度的判定結果之圖。Fig. 10 is a view showing the result of determination of the joint strength.
圖11(a)及(b)是顯示因接合次數造成的Cpk的變化之圖。Figures 11(a) and (b) are diagrams showing changes in Cpk due to the number of joints.
圖12(a)及(b)是舉例說明銲針的製造方法的一部分之圖。12(a) and (b) are diagrams illustrating a part of a method of manufacturing a welding pin.
圖13是舉例說明陶瓷的結晶的平均粒徑的測定方法之圖。Fig. 13 is a view exemplifying a method of measuring the average particle diameter of crystals of ceramics.
圖14是舉例說明陶瓷的結晶的平均粒徑與壽命的關係之圖。Fig. 14 is a view exemplifying the relationship between the average particle diameter of the crystal of the ceramic and the life.
以下,針對本發明的實施的形態一邊參照圖面,一邊進行說明。此外,各圖面中對同樣的構成要素附加同一符號而適宜省略詳細的說明。Hereinafter, the embodiment of the present invention will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and detailed descriptions thereof will be omitted.
(實施形態)(embodiment)
圖1是舉例說明與本實施形態有關的銲針之模式圖。Fig. 1 is a schematic view showing a welding pin according to the embodiment.
圖2是舉例說明與本實施形態有關的銲針的頂端形狀之模式的放大視圖。Fig. 2 is an enlarged plan view showing a mode of a tip shape of a welding pin according to the embodiment.
圖3是舉例說明與本實施形態有關的銲針的頂端面之模式的放大視圖。Fig. 3 is an enlarged plan view illustrating a mode of a tip end surface of a welding pin according to the embodiment.
在圖1顯示有銲針110的全體。在圖2顯示有將圖1所示的A部放大之圖。在圖3顯示有由斜下看頂端面之斜視圖。The entirety of the welding pin 110 is shown in FIG. FIG. 2 shows an enlarged view of the portion A shown in FIG. 1. In Fig. 3, there is shown a perspective view of the tip end face viewed obliquely.
如圖1所示,銲針110包含具有頂端面50的本體部10。本體部10包含:具有用以機械地固定於接合裝置的直徑之圓筒部11;配設於圓筒部11的頂端側之圓 錐部12;避開相鄰的配線完了的細金屬線而在瞄準的位置進行接合用之瓶頸部13。頂端面50為瓶頸部13的頂端側的端面。As shown in FIG. 1, the welding pin 110 includes a body portion 10 having a top end face 50. The main body portion 10 includes a cylindrical portion 11 having a diameter for mechanically fixing to the joint device, and a circle disposed on the tip end side of the cylindrical portion 11 The tapered portion 12; the neck portion 13 for joining at a position to be aimed away from the adjacent thin metal wire. The distal end surface 50 is an end surface on the distal end side of the neck portion 13.
在銲針110的內部,用以插通細金屬線(銲線)的孔貫通於軸向而被設置。圓筒部11具有可機械地固定於接合裝置的直徑。圓錐部12的直徑隨著朝向頂端側而變小。圓錐部12具有例如圓錐台形狀,圓筒部11側的直徑與圓筒部11的直徑大致相等。Inside the welding pin 110, a hole for inserting a thin metal wire (welding wire) is provided through the axial direction. The cylindrical portion 11 has a diameter that can be mechanically fixed to the engagement device. The diameter of the conical portion 12 becomes smaller toward the distal end side. The conical portion 12 has, for example, a truncated cone shape, and the diameter on the side of the cylindrical portion 11 is substantially equal to the diameter of the cylindrical portion 11.
如圖2所示,瓶頸部13配設於圓錐部12的進行接合的側。瓶頸部13具有像可避開已經配線的相鄰的細金屬線而在規定的接合位置進行打線接合之直徑。例如瓶頸部13的直徑由根側(圓錐部12側)朝頂端面50側逐漸變小。特別是根側的直徑曲線地變小。As shown in FIG. 2, the neck portion 13 is disposed on the side where the conical portion 12 is joined. The neck portion 13 has a diameter that can be wire-bonded at a predetermined joint position, such as avoiding adjacent thin metal wires that have been wired. For example, the diameter of the neck portion 13 gradually decreases from the root side (the conical portion 12 side) toward the distal end surface 50 side. In particular, the diameter of the root side becomes smaller.
可藉由使瓶頸部13的外徑變細而對應進行接合位置的間距(pitch)小至例如50微米(μm)以下的高密度的打線接合。也就是說,若減小瓶頸部13的直徑,則即使是接合位置的間隔狹窄的情形(進行高密度的打線接合的情形),也能防止已經配線的相鄰的細金屬線與瓶頸部13的干涉。By making the outer diameter of the neck portion 13 thin, it is possible to perform a high-density wire bonding in which the pitch of the joint position is as small as, for example, 50 μm or less. In other words, if the diameter of the neck portion 13 is made small, even if the interval of the joint position is narrow (in the case of performing high-density wire bonding), the adjacent thin metal wire and the neck portion 13 which have been wired can be prevented. Interference.
如圖3所示,在銲針110的頂端面50側設置插通銲線的孔11h。在孔11h與頂端面50之間設置有倒角部13c。倒角部13c具有自孔11h的邊緣到頂端面50設置成例如曲面狀的面。As shown in FIG. 3, a hole 11h through which the bonding wire is inserted is provided on the tip end surface 50 side of the welding pin 110. A chamfered portion 13c is provided between the hole 11h and the tip end surface 50. The chamfered portion 13c has a surface that is provided, for example, in a curved shape from the edge of the hole 11h to the tip end surface 50.
圖4是舉例說明打線接合的狀態之模式的剖 面圖。Figure 4 is a cross-sectional view illustrating a mode of the state of wire bonding Surface map.
在圖4中顯示有第二接合(second bonding)的狀態。A state of second bonding is shown in FIG.
被插通於銲針110的孔11h的銲線(以下稱為金屬線)BW被進行第一接合(first bonding)。然後,以規定的軌道將銲針110拉到導線200上而在金屬線BW形成環。The bonding wire (hereinafter referred to as a metal wire) BW inserted into the hole 11h of the welding pin 110 is subjected to the first bonding. Then, the soldering pin 110 is pulled onto the wire 200 in a prescribed track to form a loop on the wire BW.
一將銲針110緊壓於導線200之上,金屬線BW就被夾入頂端面50與導線200之間。因頂端面50傾斜到倒角部13c,故頂端面50與導線200的間隔由頂端面50的外側到內側變窄。因此,被夾在頂端面與導線200之間的金屬線BW的厚度由頂端面50的外側到內側變薄。金屬線BW在倒角部13c的邊緣的位置被分離。As soon as the solder pin 110 is pressed against the wire 200, the wire BW is sandwiched between the tip end face 50 and the wire 200. Since the distal end surface 50 is inclined to the chamfered portion 13c, the distance between the distal end surface 50 and the lead wire 200 is narrowed from the outer side to the inner side of the distal end surface 50. Therefore, the thickness of the metal wire BW sandwiched between the tip end face and the wire 200 is thinned from the outer side to the inner side of the tip end face 50. The metal wire BW is separated at the position of the edge of the chamfered portion 13c.
於在頂端面50與導線200之間夾入金屬線BW的狀態下,將例如超音波施加於銲針110。據此,將金屬線BW壓接於導線200。壓接金屬線BW後,使銲針110上升。據此,在電極墊與導線200之間連接有金屬線BW。In a state in which the metal wire BW is sandwiched between the tip end surface 50 and the wire 200, for example, ultrasonic waves are applied to the welding pin 110. Accordingly, the wire BW is crimped to the wire 200. After the metal wire BW is crimped, the solder pin 110 is raised. Accordingly, a metal wire BW is connected between the electrode pad and the wire 200.
在這種打線接合中,因銲針110在將緊壓力施加於金屬線BW的狀態下施加超音波,故頂端面50與金屬線BW之間的抓緊力變得重要。抓緊力一變弱,就無法在金屬線BW與導線200之間有效地被施加超音波的振動,金屬線BW與導線200的接合力容易變弱。In such wire bonding, since the welding pin 110 applies ultrasonic waves in a state where a pressing force is applied to the wire BW, the gripping force between the tip end surface 50 and the wire BW becomes important. As the gripping force is weakened, ultrasonic vibration cannot be effectively applied between the wire BW and the wire 200, and the bonding force of the wire BW and the wire 200 is easily weakened.
另一方面,若想加大緊壓力或超音波振幅而確保接合力,則頂端面50變得容易磨耗。若頂端面50磨耗而無法得到所需的抓緊力,則會產生更換銲針110的必要。若銲針110的更換頻率高,則必須頻繁地停止接合裝 置,會給予製造時間影響。On the other hand, if the pressing force or the ultrasonic amplitude is increased to secure the joining force, the tip end surface 50 is easily worn. If the tip end face 50 is worn out and the desired gripping force is not obtained, it is necessary to replace the welding pin 110. If the frequency of replacement of the welding pin 110 is high, the bonding must be stopped frequently. Set, will give the impact of manufacturing time.
如圖3所示,與本實施形態有關的銲針110的頂端面50具有微細的凹凸形狀。該凹凸形狀中的凸部的頂端的尖端比凹凸形狀中的凹部的頂端的尖端小。據此,在銲針110中所需的抓緊力被長期維持。As shown in FIG. 3, the tip end surface 50 of the welding pin 110 according to the present embodiment has a fine uneven shape. The tip end of the convex portion in the uneven shape is smaller than the tip end of the tip end of the concave portion in the uneven shape. Accordingly, the required grip force in the welding pin 110 is maintained for a long period of time.
此處,針對頂端面的凹凸形狀進行說明。Here, the uneven shape of the tip end surface will be described.
圖5(a)及(b)是舉例說明在本實施形態的頂端面的凹凸形狀之圖。Figs. 5(a) and 5(b) are views for explaining the uneven shape of the distal end surface of the embodiment.
圖6(a)及(b)是舉例說明在參考例(其一)的頂端面的凹凸形狀之圖。6(a) and 6(b) are diagrams illustrating the concavo-convex shape of the distal end surface of the reference example (the first).
圖7(a)及(b)是舉例說明在參考例(其二)的頂端面的凹凸形狀之圖。7(a) and 7(b) are diagrams illustrating the concavo-convex shape of the distal end surface of the reference example (the second).
在圖5~圖7中,(a)是顯示頂端面之利用三維掃描電子顯微鏡(three-dimensional scanning electron microscope)得到的凹凸形狀的測定值,(b)是顯示粗糙度曲線之像圖。In FIGS. 5 to 7, (a) is a measured value of a concavo-convex shape obtained by a three-dimensional scanning electron microscope showing a distal end surface, and (b) is an image showing a roughness curve.
頂端面的凹凸形狀以例如平均高度Rc及偏斜度(歪度)Rsk表示。The uneven shape of the tip end surface is represented by, for example, an average height Rc and a skewness (twist) Rsk.
平均高度Rc及偏斜度Rsk是根據JIS B 0601-2001而算出。The average height Rc and the skewness Rsk are calculated in accordance with JIS B 0601-2001.
在本實施形態中,透過以下的條件測定了頂端面的粗糙度曲線。In the present embodiment, the roughness curve of the tip end surface was measured by the following conditions.
測定機器:雷射顯微鏡(奧林巴斯公司(Olympus Corporation)製、OLS4000)Measuring machine: Laser microscope (Olympus Corporation, OLS4000)
測定倍率:50倍Measuring magnification: 50 times
截止(cut off)(相位補償形高通濾波器)λ c:25μmCut off (phase compensated high-pass filter) λ c: 25 μm
由透過上述的條件測定的粗糙度曲線,藉由以下的(1)式求平均高度Rc,藉由以下的(2)式求偏斜度Rsk。From the roughness curve measured by the above-described conditions, the average height Rc is obtained by the following formula (1), and the skewness Rsk is obtained by the following formula (2).
在(1)式中,m是輪廓曲線要素的數,Zti是輪廓曲線要素的高度的平均值。In the formula (1), m is the number of contour curve elements, and Zti is the average value of the heights of the contour curve elements.
在(2)式中,Zq是均方根(root mean square)高度,Zn是粗糙度曲線中的高度的值。In the formula (2), Zq is the root mean square height, and Zn is the value of the height in the roughness curve.
顯示於圖5(a)及(b)之在本實施形態的頂端面50的平均高度Rc為60奈米(nanometer)(nm)以上,偏斜度Rsk為約-1.2以上-0.3以下。The average height Rc of the distal end surface 50 of the present embodiment shown in Figs. 5(a) and 5(b) is 60 nanometers or more, and the skewness Rsk is about -1.2 or more and 0.3 or less.
在顯示於圖6(a)及(b)的參考例(其一)的頂端面51的平均高度Rc為10nm-15nm,偏斜度Rsk為0.3~-0.5。The average height Rc of the distal end surface 51 of the reference example (1) shown in Figs. 6(a) and (b) is 10 nm to 15 nm, and the skewness Rsk is 0.3 to -0.5.
在顯示於圖7(a)及(b)的參考例(其二)的頂端面52的平均高度Rc為150nm-280nm,偏斜度Rsk為0.2~-0.25。The average height Rc of the distal end surface 52 of the reference example (the second) shown in Figs. 7(a) and (b) is 150 nm to 280 nm, and the skewness Rsk is 0.2 to -0.25.
如此,在本實施形態的頂端面50的偏斜度Rsk為-0.3以下。而且,偏斜度Rsk能以-1.2以上。偏斜度 Rsk是表示凹凸形狀的山(凸)與谷(凹)的對稱性。若凹凸形狀為正弦分布(sine distribution),則偏斜度Rsk成為0。偏斜度Rsk為負是表示在垂直於頂端面50的方向看時的山(凸)的面積比谷(凹)的面積大(凸部的尖端比凹部的尖端小)。As described above, the skewness Rsk of the distal end surface 50 of the present embodiment is -0.3 or less. Moreover, the skewness Rsk can be -1.2 or more. Skewness Rsk is a symmetry of a mountain (convex) and a valley (concave) indicating a concavo-convex shape. If the concavo-convex shape is a sine distribution, the skewness Rsk becomes zero. The fact that the skewness Rsk is negative means that the area of the mountain (convex) when viewed in the direction perpendicular to the distal end surface 50 is larger than the area of the valley (concave) (the tip end of the convex portion is smaller than the tip end of the concave portion).
在具有頂端面50的本實施形態的銲針110中,初期的接合強度及壽命都良好。另一方面,在參考例(其一)的具有頂端面50的銲針中,初期的接合強度不足。而且,在參考例(其二)的具有頂端面52的銲針中,雖然初期的接合強度良好,但壽命短。In the welding pin 110 of this embodiment having the distal end surface 50, the initial joint strength and the life are good. On the other hand, in the welding pin having the tip end surface 50 of the reference example (the first), the initial joint strength was insufficient. Further, in the welding pin having the distal end surface 52 of the reference example (the second), although the initial bonding strength is good, the life is short.
可藉由頂端面50的凹凸形狀中的凸部的頂端的尖端比凹凸形狀中的凹部的頂端的尖端小而確保初期的接合強度,同時即使進行重複接合也能長期維持該接合強度。The tip end of the convex portion in the uneven shape of the distal end surface 50 can be made smaller than the tip end of the distal end of the concave portion in the uneven shape to ensure the initial joint strength, and the joint strength can be maintained for a long period of time even if the joint is repeated.
而且,頂端面50的偏斜度Rsk為負,因藉由山(凸)的面積比谷(凹)的面積大,而使頂端面50與金屬線BW的接觸面積增加,並且成為朝凹部陡峭的斜度,故頂端面50與金屬線BW之間的抓緊力增加。Further, the skewness Rsk of the distal end surface 50 is negative, and since the area of the mountain (convex) is larger than the area of the valley (concave), the contact area between the distal end surface 50 and the metal wire BW is increased, and the surface is steep toward the concave portion. The inclination is increased, so that the grip force between the tip end face 50 and the wire BW is increased.
也就是說,在具有頂端面50的銲針110中,可充分地確保初期的接合強度,同時可實現耐磨耗性優良的長壽命的製品。在本實施形態的銲針110中,即使是進行利用特別是銅等的硬的金屬線BW進行的接合的情形,也能得到充分的接合強度。而且,因頂端面50的耐磨耗性優良,故即使重複利用銅等的硬的金屬線BW進行的接 合,初期的接合強度也被長期維持。In other words, in the welding pin 110 having the tip end surface 50, the initial bonding strength can be sufficiently ensured, and a long-life product excellent in abrasion resistance can be realized. In the case of the bonding pin 110 of the present embodiment, even when bonding is performed using a hard metal wire BW such as copper, sufficient bonding strength can be obtained. Further, since the end surface 50 is excellent in wear resistance, even if the hard metal wire BW such as copper is repeatedly used for connection, The initial joint strength is also maintained for a long time.
(實施例)(Example)
其次,針對與本實施形態有關的銲針110的實施例進行說明。Next, an embodiment of the welding pin 110 according to the present embodiment will be described.
圖8是顯示實施例及比較例的評價結果之圖。Fig. 8 is a view showing evaluation results of Examples and Comparative Examples.
圖9是舉例說明測定區域之模式的斜視圖。Fig. 9 is a perspective view illustrating a mode of a measurement area.
在圖8中顯示有實施例1~6及比較例1~8的頂端面中的平均高度Rc、偏斜度Rsk及最大峰高Rp。The average height Rc, the skewness Rsk, and the maximum peak height Rp of the tip end faces of Examples 1 to 6 and Comparative Examples 1 to 8 are shown in Fig. 8 .
各個例子中的平均高度Rc、偏斜度Rsk及最大峰高Rp為以圖9所示的表面區域50r測定的值。也就是說如圖9所示,表面區域50r為在頂端面50之中由倒角部13c的邊緣沿著頂端面50離開孔11h的方向長度L1的區域。長度L1至少為20μm。測定長度L2為在表面區域50r的範圍內約100μm。在本實施形態中,以表面區域50r內的3處測定在100μm的測定長度L2下的線粗糙度,求其平均。The average height Rc, the skewness Rsk, and the maximum peak height Rp in each example are values measured by the surface area 50r shown in Fig. 9. That is, as shown in FIG. 9, the surface region 50r is a region in the direction of the direction L1 in the direction in which the edge of the chamfered portion 13c is separated from the hole 11h by the edge of the chamfered portion 13c. The length L1 is at least 20 μm. The measurement length L2 is about 100 μm in the range of the surface region 50r. In the present embodiment, the line roughness at a measurement length L2 of 100 μm is measured at three places in the surface region 50r, and the average is obtained.
圖8所示的接合強度的Cpk為製程能力指數(process capability index)。在圖8所示的各例中,當設金屬線BW的接合強度的平均為Ave,設接合強度的下限規格為3克重(gf)時,以Cpk=(Ave-3gf)/3 σ計算。接合強度為在第二銲中的拉伸試驗(pull test)下的強度。樣本數為30。一般打線接合中的接合強度的Cpk被求出1.67以上。The Cpk of the joint strength shown in Fig. 8 is a process capability index. In each of the examples shown in FIG. 8, when the average of the joint strength of the metal wire BW is Ave, and the lower limit of the joint strength is 3 gram (gf), Cpk=(Ave-3gf)/3 σ is calculated. . The joint strength is the strength under a pull test in the second weld. The number of samples is 30. The Cpk of the joint strength in the wire bonding is generally found to be 1.67 or more.
如圖8所示,在實施例1~6及比較例1~8中,各自平均高度Rc、偏斜度Rsk及最大峰高Rp的組合不同。 其中,在實施例1~6及比較例4~8中,接合強度的Cpk成為1.67以上。As shown in FIG. 8, in Examples 1 to 6 and Comparative Examples 1 to 8, the combinations of the average height Rc, the skewness Rsk, and the maximum peak height Rp were different. In Examples 1 to 6 and Comparative Examples 4 to 8, the Cpk of the joint strength was 1.67 or more.
圖10是顯示接合強度的判定結果之圖。Fig. 10 is a view showing the result of determination of the joint strength.
在圖10中,針對圖8所示的例子之中接合強度的Cpk成為1.67以上的實施例1~6及比較例4~6顯示有接合強度判定的結果。In the examples shown in FIG. 8 , the results of the joint strength determination are shown in Examples 1 to 6 and Comparative Examples 4 to 6 in which the Cpk of the joint strength is 1.67 or more.
接合強度判定是針對初期的Cpk、打線接合的次數為50萬次後及100萬次後的Cpk,依照各個Cpk是否低於1.67而進行。在圖10的接合強度判定中,當各個Cpk為1.67以上時顯示[OK],當未滿1.67時顯示[NG]。The joint strength determination is performed for the initial Cpk, the number of wire bonding times of 500,000 times, and the Cpk of 1 million times, depending on whether or not each Cpk is lower than 1.67. In the joint strength determination of FIG. 10, [OK] is displayed when each Cpk is 1.67 or more, and [NG] is displayed when it is less than 1.67.
如圖10所示,在實施例1~6及比較例4~6中,初期的接合強度判定都為[OK]。在打線接合50萬次後,雖然實施例1~6為[OK],但比較例4~6都成為[NG]。在打線接合100萬次後,實施例1~3、5及6為[OK],實施例4及比較例4~6成為[NG]。在打線接合150萬次後,實施例5及6為[OK],實施例1~4及比較例4~6成為[NG]。As shown in FIG. 10, in Examples 1 to 6 and Comparative Examples 4 to 6, the initial joint strength determination was [OK]. After the wire bonding was performed 500,000 times, although Examples 1 to 6 were [OK], Comparative Examples 4 to 6 were both [NG]. After 1 million wire bonding, Examples 1 to 3, 5, and 6 were [OK], and Example 4 and Comparative Examples 4 to 6 were [NG]. After the wire bonding was performed 1.5 million times, Examples 5 and 6 were [OK], and Examples 1 to 4 and Comparative Examples 4 to 6 were [NG].
圖11(a)及(b)是顯示因接合次數造成的Cpk的變化之圖。Figures 11(a) and (b) are diagrams showing changes in Cpk due to the number of joints.
在圖11(a)顯示有圖8及圖10所示的實施例2的Cpk的變化,在圖11(b)顯示有圖8及圖10所示的比較例6的Cpk的變化。Fig. 11(a) shows changes in Cpk in the second embodiment shown in Figs. 8 and 10, and Fig. 11(b) shows changes in Cpk in the comparative example 6 shown in Figs. 8 and 10.
如圖11(a)所示,針對實施例2之具有頂端面的銲針,即使自接合初期起超過100萬次也維持初期的接合強度,1.67以上的Cpk持續。As shown in Fig. 11 (a), the welding pin having the tip end surface of Example 2 maintains the initial bonding strength even if it exceeds 1,000,000 times from the initial stage of bonding, and the Cpk of 1.67 or more continues.
另一方面,如圖11(b)所示,針對比較例6之具有頂端面的銲針,雖然接合初期的Cpk成為1.67以上,但大約自超過30萬次起Cpk顯著的降低被看到而低於1.67。On the other hand, as shown in Fig. 11 (b), the welding needle having the tip end surface of Comparative Example 6 has a Cpk of 1.67 or more at the initial stage of bonding, but a significant decrease in Cpk is observed from more than 300,000 times. Below 1.67.
由以上的結果,頂端面50的偏斜度Rsk為約-1.2以上-0.3以下,且頂端面50的平均高度Rc為0.06μm以上0.3μm以下較佳。若平均高度Rc不為0.06μm以上,則抓緊力小,特別是在使用銅線的金屬線BW的情形下無法得到充分的接合強度。而且,若平均高度Rc超過0.3μm,則形成以偏斜度Rsk-0.3以下的凹凸變得困難。而且更佳為,頂端面50的偏斜度Rsk為約-1.2以上-0.43以下,且頂端面50的平均高度Rc為0.16μm以上0.3μm以下。據此,即使是自接合初期起150萬次後也能維持初期的接合強度。As a result of the above, the skewness Rsk of the distal end surface 50 is about -1.2 or more and 0.3 or less, and the average height Rc of the distal end surface 50 is preferably 0.06 μm or more and 0.3 μm or less. When the average height Rc is not 0.06 μm or more, the gripping force is small, and in particular, in the case of using the metal wire BW of the copper wire, sufficient joint strength cannot be obtained. Further, when the average height Rc exceeds 0.3 μm, it becomes difficult to form irregularities having a skewness of Rsk-0.3 or less. Further, it is more preferable that the skewness Rsk of the distal end surface 50 is about -1.2 or more to 0.43 or less, and the average height Rc of the distal end surface 50 is 0.16 μm or more and 0.3 μm or less. According to this, the initial bonding strength can be maintained even after 1.5 million times from the initial stage of bonding.
而且,頂端面50的最大峰高Rp為平均高度Rc的0.9倍以下(Rp/Rc≦0.9)較佳。而且,Rp/Rc能以0.5倍以上。若Rp/Rc超過0.9,則長期維持初期的接合強度變得困難。另一方面,若Rp/Rc為0.9以下,則伴隨使用中的磨耗的形狀變化少,初期的接合強度被長期維持。Further, it is preferable that the maximum peak height Rp of the distal end surface 50 is 0.9 times or less (Rp/Rc ≦ 0.9) of the average height Rc. Moreover, Rp/Rc can be 0.5 times or more. When Rp/Rc exceeds 0.9, it is difficult to maintain the initial bonding strength for a long period of time. On the other hand, when Rp/Rc is 0.9 or less, the shape change accompanying abrasion during use is small, and the initial joint strength is maintained for a long period of time.
(製造方法)(Production method)
其次,針對與本實施形態有關的銲針110的製造方法進行說明。Next, a method of manufacturing the welding pin 110 according to the present embodiment will be described.
圖12(a)及(b)是舉例說明銲針的製造方法的一部分之圖。12(a) and (b) are diagrams illustrating a part of a method of manufacturing a welding pin.
在圖12(a)及(b)顯示有銲針110的製造方法之中形成頂端面50的凹凸形狀的程序。The procedure for forming the uneven shape of the distal end surface 50 in the method of manufacturing the welding pin 110 is shown in FIGS. 12(a) and (b).
在與本實施形態有關的銲針110的材料包含有例如鋁(Al2 O3 )及氧化鋯(zirconia)(ZrO2 )。如圖12(a)所示,在銲針110於粒徑大的Al2 O3 散佈著粒徑小的ZrO2 。一研磨頂端面50,就成為在頂端面50於Al2 O3 母材的表面露出ZrO2 的結晶的狀態。The material of the welding pin 110 according to the present embodiment includes, for example, aluminum (Al 2 O 3 ) and zirconia (ZrO 2 ). As shown in Fig. 12 (a), ZrO 2 having a small particle diameter is dispersed in the welding pin 110 in Al 2 O 3 having a large particle diameter. When the tip end surface 50 is polished, the crystal of the ZrO 2 is exposed on the surface of the Al 2 O 3 base material at the tip end surface 50.
在該狀態下,對頂端面50施以噴砂(sandblast)。噴砂的條件的一例為研磨粒(abrasive grain)種類、噴塗壓、噴塗時間。藉由使噴砂的條件最佳化,比Al2 O3 柔軟的ZrO2 的結晶由Al2 O3 母材的表面脫落。據此,如圖12(b)所示,在頂端面50的平坦的面的一部分形成有凹部。此時因ZrO2 對Al2 O3 母材的比率少,故ZrO2 的結晶脫落形成的凹部的面積不比凸部(平坦面)的面積大。In this state, the top end surface 50 is subjected to sandblasting. An example of the conditions of sand blasting is the type of abrasive grain, the spray pressure, and the spraying time. By optimizing the conditions of blasting, the crystal of ZrO 2 softer than Al 2 O 3 is detached from the surface of the Al 2 O 3 parent material. As a result, as shown in FIG. 12(b), a concave portion is formed in a part of the flat surface of the distal end surface 50. At this time, since the ratio of ZrO 2 to the Al 2 O 3 base material is small, the area of the concave portion formed by the crystal falling of ZrO 2 is not larger than the area of the convex portion (flat surface).
此外,上述的製造方法為一例,噴砂以外的方法也能製造。Further, the above-described production method is an example, and a method other than sand blasting can also be produced.
(結晶粒徑)(crystal size)
其次,針對銲針的結晶粒徑進行說明。Next, the crystal grain size of the welding pin will be described.
在與本實施形態有關的銲針110中,露出於頂端面50的陶瓷的結晶的平均粒徑為1.2μm以下。此外,陶瓷的結晶的平均粒徑能以0.3μm以上。若陶瓷的結晶的平均粒徑成為1.2μm以下,則頂端面50的磨耗變少,銲針110的壽命變長。In the welding pin 110 according to the present embodiment, the average crystal grain size of the ceramic exposed on the distal end surface 50 is 1.2 μm or less. Further, the average crystal grain size of the ceramic crystals can be 0.3 μm or more. When the average particle diameter of the crystal of the ceramic is 1.2 μm or less, the abrasion of the tip end surface 50 is reduced, and the life of the welding pin 110 is prolonged.
圖13是舉例說明陶瓷的結晶的平均粒徑的測 定方法之圖。Figure 13 is a graph illustrating the average particle diameter of crystals of ceramics. A diagram of the method.
在圖13顯示有研磨陶瓷製的試樣的平面後,為了使粒子間的邊界明確而施以熱侵蝕(thermal etching)的狀態的SEM(Scanning Electron Microscope:掃描電子顯微鏡)影像。In the SEM (Scanning Electron Microscope) image in which the surface of the sample made of the ceramic is polished, and the boundary between the particles is made clear, thermal etching is applied.
首先,以10000倍~30000倍左右的倍率藉由SEM觀察試樣的任意處,取得SEM影像。然後,根據所取得的SEM影像以例如平面測量法(planimetric method)算出平均粒徑。First, an arbitrary portion of the sample was observed by SEM at a magnification of about 10,000 times to 30,000 times to obtain an SEM image. Then, the average particle diameter is calculated based on the obtained SEM image by, for example, a planimetric method.
平均粒徑的算出是以如下的程序進行。The calculation of the average particle diameter was carried out by the following procedure.
首先,在取得的SEM影像上描繪面積A(μm2 )的已知的圓CIR。接著,計算包含於圓CIR的內側的粒子的數目nc,與落在圓CIR之上(圓周上)的粒子的數目ni。然後,使用該nc及ni藉由以下的公式計算平均粒徑。First, a known circle CIR of the area A (μm 2 ) is drawn on the acquired SEM image. Next, the number nc of particles contained inside the circle CIR and the number ni of particles falling above the circle CIR (on the circumference) are calculated. Then, using nc and ni, the average particle diameter was calculated by the following formula.
N=(nc+(1/2)ni/(A/倍率2 )N=(nc+(1/2)ni/(A/magnification 2 )
平均粒徑(μm)=2/(π.N)1/2 Average particle size (μm) = 2 / (π. N) 1/2
圖14是舉例說明陶瓷的結晶的平均粒徑與壽命的關係之圖。Fig. 14 is a view exemplifying the relationship between the average particle diameter of the crystal of the ceramic and the life.
在圖14中顯示有針對數種類的平均粒徑,針對因接合次數造成的銲針的壽命而判定的結果。接合次數為50萬次及100萬次。壽命的判定若Cpk為1.67以上則顯示[OK],若未滿1.67則顯示[NG]。FIG. 14 shows the results of determination of the average particle diameter of the number of types for the life of the welding needle due to the number of joints. The number of joints is 500,000 times and 1 million times. When the life is judged, [OK] is displayed if Cpk is 1.67 or more, and [NG] is displayed if it is less than 1.67.
由圖14所示的結果,即使是50萬次的接合次數,為了維持1.67以上的Cpk,陶瓷的結晶的平均粒徑為約0.3μm以上1.2μm以下較佳。而且更佳的平均粒徑 為約0.3μm以上0.7μm以下。若平均粒徑為0.7μm以下,則即使是100萬次的接合次數,1.67以上的Cpk也被維持。As a result of the results shown in Fig. 14, even in the number of joints of 500,000 times, in order to maintain Cpk of 1.67 or more, the average crystal grain size of the ceramic is preferably about 0.3 μm or more and 1.2 μm or less. And better average particle size It is about 0.3 μm or more and 0.7 μm or less. When the average particle diameter is 0.7 μm or less, the Cpk of 1.67 or more is maintained even in the number of times of bonding of 1 million times.
若藉由這種具有平均粒徑的結晶的陶瓷構成銲針110,則頂端面50的磨耗變少。據此,銲針110的壽命變長,更換頻率的降低被實現。When the welding pin 110 is formed of such a ceramic having an average particle diameter, the wear of the tip end surface 50 is reduced. Accordingly, the life of the welding pin 110 becomes long, and the reduction in the frequency of replacement is achieved.
如以上說明的,依照本實施形態,在打線接合中可得到金屬線BW與導線200之充分的接合強度,並且即使是重複進行接合的情形也能長期維持初期的接合強度。As described above, according to the present embodiment, sufficient bonding strength between the metal wire BW and the wire 200 can be obtained in the wire bonding, and the initial bonding strength can be maintained for a long period of time even when the bonding is repeated.
以上針對本發明的實施的形態進行了說明。但是,本發明不是被限定於該等記述。關於前述的實施的形態,熟習該項技術者適宜加入設計變更只要具備本發明的特徵,也就包含於本發明的範圍。例如銲針110的形狀或大小、材料等不是被限定於所舉例說明者,可適宜變更。The embodiments of the present invention have been described above. However, the present invention is not limited to the descriptions. With regard to the above-described embodiments, it is within the scope of the present invention to incorporate design changes as appropriate to those skilled in the art. For example, the shape, size, material, and the like of the welding pin 110 are not limited to those exemplified, and can be appropriately changed.
10‧‧‧本體部10‧‧‧ Body Department
11‧‧‧圓筒部11‧‧‧Cylinder
12‧‧‧圓錐部12‧‧‧Cone
13‧‧‧瓶頸部13‧‧‧ Bottleneck
50‧‧‧頂端面50‧‧‧ top surface
110‧‧‧銲針110‧‧‧ soldering needle
Claims (7)
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JP2012212184 | 2012-09-26 | ||
JP2013126818A JP5510691B2 (en) | 2012-09-26 | 2013-06-17 | Bonding capillary |
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TWI466750B true TWI466750B (en) | 2015-01-01 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JP6126144B2 (en) * | 2014-06-30 | 2017-05-10 | Toto株式会社 | Bonding capillary |
USD771168S1 (en) | 2014-10-31 | 2016-11-08 | Coorstek, Inc. | Wire bonding ceramic capillary |
USD797171S1 (en) | 2015-02-03 | 2017-09-12 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
USD797172S1 (en) | 2015-02-03 | 2017-09-12 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
USD797826S1 (en) | 2015-02-03 | 2017-09-19 | Coorstek, Inc. | Ceramic bonding tool with textured tip |
USD753739S1 (en) | 2015-04-17 | 2016-04-12 | Coorstek, Inc. | Wire bonding wedge tool |
WO2017006880A1 (en) * | 2015-07-03 | 2017-01-12 | Toto株式会社 | Bonding capillary |
IL264627B2 (en) | 2016-08-08 | 2023-04-01 | Asml Netherlands Bv | Electron emitter and method of fabricating same |
USD868123S1 (en) | 2016-12-20 | 2019-11-26 | Coorstek, Inc. | Wire bonding wedge tool |
JP7407751B2 (en) * | 2021-01-27 | 2024-01-04 | 三菱電機株式会社 | Wire bonding equipment and semiconductor device manufacturing method |
CN114309920A (en) * | 2021-12-23 | 2022-04-12 | 潮州三环(集团)股份有限公司 | Ceramic cleaver and preparation method thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200507123A (en) * | 2003-08-12 | 2005-02-16 | Kulicke & Soffa Investments | Bonding tool with contained inner chamfer |
TWI229021B (en) * | 2002-06-12 | 2005-03-11 | Shi-Tong Yang | Welding head of spot welding machine |
US20050109817A1 (en) * | 1999-02-25 | 2005-05-26 | Reiber Steven F. | Flip chip bonding tool tip |
JP2009540624A (en) * | 2006-07-03 | 2009-11-19 | クリック アンド ソッファ インダストリーズ、インク. | Bonding tool with improved finish |
-
2013
- 2013-06-17 JP JP2013126818A patent/JP5510691B2/en active Active
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- 2013-09-20 MY MYPI2013003417A patent/MY158508A/en unknown
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050109817A1 (en) * | 1999-02-25 | 2005-05-26 | Reiber Steven F. | Flip chip bonding tool tip |
TWI229021B (en) * | 2002-06-12 | 2005-03-11 | Shi-Tong Yang | Welding head of spot welding machine |
TW200507123A (en) * | 2003-08-12 | 2005-02-16 | Kulicke & Soffa Investments | Bonding tool with contained inner chamfer |
JP2009540624A (en) * | 2006-07-03 | 2009-11-19 | クリック アンド ソッファ インダストリーズ、インク. | Bonding tool with improved finish |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI562847B (en) * | 2015-07-03 | 2016-12-21 | Toto Ltd |
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PH12013000287A1 (en) | 2015-04-06 |
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