TWI450429B - Organic thin film transistor and method for preparing thereof - Google Patents

Organic thin film transistor and method for preparing thereof Download PDF

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TWI450429B
TWI450429B TW097149387A TW97149387A TWI450429B TW I450429 B TWI450429 B TW I450429B TW 097149387 A TW097149387 A TW 097149387A TW 97149387 A TW97149387 A TW 97149387A TW I450429 B TWI450429 B TW I450429B
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organic
thin film
electrode
film transistor
source
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TW200941784A (en
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Ho-Jin Lee
Byung-Uk Kim
We-Yong Kim
Dae-Jung Jeong
Dong-Hyuk Lee
Sang-Ook Kang
Moon-Pyo Hong
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Dongjin Semichem Co Ltd
Univ Ind & Acad Collaboration
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/80Constructional details
    • H10K10/82Electrodes
    • H10K10/84Ohmic electrodes, e.g. source or drain electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/464Lateral top-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/484Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/484Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
    • H10K10/486Insulated gate field-effect transistors [IGFETs] characterised by the channel regions the channel region comprising two or more active layers, e.g. forming pn heterojunctions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • H10K71/125Deposition of organic active material using liquid deposition, e.g. spin coating using electrolytic deposition e.g. in-situ electropolymerisation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/10Organic polymers or oligomers
    • H10K85/111Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
    • H10K85/113Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene

Description

有機薄膜電晶體及其製造方法Organic thin film transistor and method of manufacturing same 發明領域Field of invention

本發明有關一有機薄膜電晶體及其製造方法,更特別有關一可改良一有機半導體層與源極/汲極電極間的介面性質、且增加載體從源極/汲極電極注射至有機半導體層的能力藉以改良電晶體的電性效能之有機薄膜電晶體,以及其製造方法。The invention relates to an organic thin film transistor and a manufacturing method thereof, and more particularly to improving the interface property between an organic semiconductor layer and a source/drain electrode, and increasing the injection of the carrier from the source/drain electrode to the organic semiconductor layer. The ability to improve the electrical performance of an organic thin film transistor of a transistor, and its method of manufacture.

背景技術Background technique

已從1980年開始研究有關使用有機物作為半導體層之有機薄膜電晶體,且現今全球正進行許多研究。Organic thin film transistors using organic materials as semiconductor layers have been studied since 1980, and many studies are being conducted worldwide.

因為有機薄膜電晶體的製造製程很簡單且便宜,且相較於既有的矽薄膜電晶體而言可以低溫執行,其可滿足近來平板顯示器中所需要之大且薄的尺寸及撓性性質。Since the manufacturing process of the organic thin film transistor is simple and inexpensive, and can be performed at a low temperature compared to the existing germanium thin film transistor, it can satisfy the large and thin size and flexibility properties required in recent flat panel displays.

有機薄膜電晶體的效能係藉由場效活動性、Ion/Ioff比值、低限值電壓及次低限值斜率等予以評價,且其實際上趨近於矽薄膜電晶體的效能。The performance of the organic thin film transistor is evaluated by field effect activity, Ion/Ioff ratio, low limit voltage and sub-low limit slope, etc., and it actually approaches the performance of the germanium thin film transistor.

並且,有機薄膜電晶體的效能係依據有機半導體層的結晶性、閘極絕緣膜與有機半導體層之間介面的電荷性質、載體注射至源極/汲極電極與有機半導體層之間介面中的能力等而定。Moreover, the effectiveness of the organic thin film transistor is based on the crystallinity of the organic semiconductor layer, the charge property of the interface between the gate insulating film and the organic semiconductor layer, and the carrier is injected into the interface between the source/drain electrode and the organic semiconductor layer. Ability depends on the ability.

然而,由於有機薄膜電晶體的有機半導體層與源極/汲極電極之間的能量障壁導致之接觸電阻的增加令載體難以注射,其使得有機薄膜電晶體的性質變差。因此,作出不同嘗試企圖解決上述問題。However, the increase in contact resistance due to the energy barrier between the organic semiconductor layer of the organic thin film transistor and the source/drain electrode makes the carrier difficult to inject, which deteriorates the properties of the organic thin film transistor. Therefore, different attempts have been made to solve the above problems.

為了解決習知技術的上述問題,本發明之一目的係提供一包含一有機緩衝層之有機薄膜電晶體,該有機緩衝層係介於一有機半導體層與源極/汲極電極之間,改良有機半導體層與源極/汲極電極之間的介面性質,並降低有機半導體與金屬電極之間的能量障壁以降低接觸電阻藉以增進載體注射的能力,故改良電晶體的效能,以及一包含該有機薄膜電晶體之有機發光顯示器。In order to solve the above problems of the prior art, an object of the present invention is to provide an organic thin film transistor including an organic buffer layer interposed between an organic semiconductor layer and a source/drain electrode. The interfacial properties between the organic semiconductor layer and the source/drain electrodes, and the energy barrier between the organic semiconductor and the metal electrode to reduce the contact resistance to enhance the ability of the carrier to be injected, thereby improving the performance of the transistor, and including Organic thin film transistor organic light emitting display.

本發明之另一目的係提供一用於製造一有機薄膜電晶體之方法,包含同時塗覆一有機緩衝層於源極電極及汲極電極上,或藉由電化塗覆將其選擇性塗覆於源極電極或汲極電極上。Another object of the present invention is to provide a method for fabricating an organic thin film transistor comprising simultaneously coating an organic buffer layer on a source electrode and a drain electrode, or selectively coating it by electrochemical coating. On the source or drain electrode.

為了達成該等目的,本發明提供一有機薄膜電晶體,包含:一源極電極及一汲極電極;一有機半導體層,其電性連接至源極電極及汲極電極;一有機緩衝層,其介於源極電極及有機半導體層之間及/或汲極電極及有機半導體層之間;一閘極電極,其與源極電極、汲極電極及有機半導體層呈絕緣;及一閘極絕緣膜,其用於使閘極電極自源極電極、汲極電極及有機半導體層呈絕緣。In order to achieve the above objectives, the present invention provides an organic thin film transistor comprising: a source electrode and a drain electrode; an organic semiconductor layer electrically connected to the source electrode and the drain electrode; and an organic buffer layer, It is interposed between the source electrode and the organic semiconductor layer and/or between the drain electrode and the organic semiconductor layer; a gate electrode is insulated from the source electrode, the drain electrode and the organic semiconductor layer; and a gate An insulating film for insulating the gate electrode from the source electrode, the drain electrode, and the organic semiconductor layer.

本發明亦提供一用於製造一有機薄膜電晶體之方法,包含使一有機緩衝層介於源極/汲極電極與一有機半導體層之間,其中有機緩衝層藉由電化塗覆被塗覆於源極電極及汲極電極的至少一者上。The present invention also provides a method for fabricating an organic thin film transistor comprising interposing an organic buffer layer between a source/drain electrode and an organic semiconductor layer, wherein the organic buffer layer is coated by electrochemical coating At least one of the source electrode and the drain electrode.

本發明亦提供一有機發光顯示器,其包含本發明的有機薄膜電晶體;及一電性連接至該有機薄膜電晶體之有機發光裝置。The present invention also provides an organic light emitting display comprising the organic thin film transistor of the present invention; and an organic light emitting device electrically connected to the organic thin film transistor.

根據本發明,可改良有機半導體層與源極/汲極電極之間的介面性質及載體注射的能力藉以改良電晶體效能。並且,有機緩衝層可藉由電化塗覆被選擇性塗覆於源極電極、汲極電極或源極/汲極電極上。According to the present invention, the interface properties between the organic semiconductor layer and the source/drain electrodes and the ability of the carrier to be injected can be improved to improve the transistor performance. Also, the organic buffer layer can be selectively applied to the source electrode, the drain electrode, or the source/drain electrode by electrochemical coating.

圖式簡單說明Simple illustration

第1圖為示意地顯示根據本發明的一較佳實施例之一藉由電化塗覆來形成一有機緩衝層之裝備及方法的橫剖視圖;1 is a cross-sectional view schematically showing an apparatus and method for forming an organic buffer layer by electrochemical coating according to a preferred embodiment of the present invention;

第2圖為示意地顯示根據本發明的一較佳實施例之有機薄膜電晶體的橫剖面之橫剖視圖;2 is a cross-sectional view schematically showing a cross section of an organic thin film transistor according to a preferred embodiment of the present invention;

第3圖為示意地顯示根據本發明另一較佳實施例之有機薄膜電晶體的橫剖面之橫剖視圖。Figure 3 is a cross-sectional view schematically showing a cross section of an organic thin film transistor according to another preferred embodiment of the present invention.

發明模式Invention mode

現在將詳細地說明本發明。The invention will now be described in detail.

本發明的有機薄膜電晶體係包含一源極電極及一汲極電極;一有機半導體層,其電性連接至源極電極及汲極電極;一有機緩衝層,其介於源極電極與有機半導體層之間及/或汲極電極與有機半導體層之間;一閘極電極,其與源極電極、汲極電極及有機半導體層呈絕緣;及一閘極絕緣膜,其用於使閘極電極自源極電極、汲極電極及有機半導體層呈絕緣。The organic thin film electro-crystal system of the present invention comprises a source electrode and a drain electrode; an organic semiconductor layer electrically connected to the source electrode and the drain electrode; and an organic buffer layer interposed between the source electrode and the organic Between the semiconductor layers and/or between the drain electrode and the organic semiconductor layer; a gate electrode insulated from the source electrode, the drain electrode and the organic semiconductor layer; and a gate insulating film for the gate The electrode is insulated from the source electrode, the drain electrode, and the organic semiconductor layer.

有機緩衝層可由以噻吩為基礎的化合物或以莘-噻吩為基礎的化合物製成。The organic buffer layer may be made of a thiophene-based compound or a quinone-thiophene-based compound.

可使用二噻吩並噻吩、丙烯基噻吩、噻吩並噻吩或其衍生物來作為以噻吩為基礎的化合物。確切來說,以噻吩為基礎的化合物係以下列化學式1至5的一者代表:Dithienothiophene, propenylthiophene, thienothiophene or a derivative thereof can be used as the thiophene-based compound. Specifically, the thiophene-based compound is represented by one of the following Chemical Formulas 1 to 5:

(其中R2 及R3 係獨立為羥基、烷基、環烷基、烷氧基、環烷氧基或硫代烷氧基基團,較佳為羥基、C1 -C18 烷基、烷氧基或硫代烷氧基基團;且m為從1至6的一整數) (wherein R 2 and R 3 are independently hydroxy, alkyl, cycloalkyl, alkoxy, cycloalkoxy or thioalkoxy groups, preferably hydroxy, C 1 -C 18 alkyl, alkane An oxy or thioalkoxy group; and m is an integer from 1 to 6)

(其中Ar為C4 -C18 噻吩基基團) (wherein Ar is a C 4 -C 18 thienyl group)

以并苯-噻吩為基礎的化合物可以下列化學式6至14的一者代表: The acene-thiophene-based compound can be represented by one of the following Chemical Formulas 6 to 14:

[化學式7] [Chemical Formula 7]

(其中R1 係獨立為羥基、烷基、環烷基、烷氧基、環烷氧基或硫代烷氧基基團,較佳為羥基、C1 -C18 烷基、烷氧基或硫代烷氧基;且n獨立為1或2)。 (wherein R 1 is independently a hydroxy, alkyl, cycloalkyl, alkoxy, cycloalkoxy or thioalkoxy group, preferably hydroxy, C 1 -C 18 alkyl, alkoxy or Thioalkoxy; and n is independently 1 or 2).

有機緩衝層未藉由習知技術的旋塗、沾浸等被塗覆,而是藉由電化塗覆法被塗覆,故其可被選擇性塗覆於源極電極、汲極電極或源極/汲極電極上。電化塗覆可避免習知技術的旋塗或沾浸之整體表面塗覆,且其可讓一有機緩衝層得以只塗覆於一所需要部份上而維持優良性質。The organic buffer layer is not coated by spin coating, dipping or the like according to the prior art, but is coated by an electrochemical coating method, so that it can be selectively applied to the source electrode, the drain electrode or the source. On the pole/dip electrode. Electrochemical coating avoids the spin coating or dip-coating of the overall surface coating of the prior art, and it allows an organic buffer layer to be applied to only a desired portion to maintain superior properties.

源極/汲極電極可形成為一單層或多層,且由選自Al、Ag、Mo、Au、Pt、Pd、Ni、Ir、Cr、Ti、MoW、或其一合金組成的群組之至少一者製成。並且,源極/汲極電極可由譬如ITO、IZO、ZnO及In2 O3 等透明材料製成。The source/drain electrode may be formed as a single layer or a plurality of layers, and is composed of a group selected from the group consisting of Al, Ag, Mo, Au, Pt, Pd, Ni, Ir, Cr, Ti, MoW, or an alloy thereof. Made of at least one. Also, the source/drain electrodes may be made of a transparent material such as ITO, IZO, ZnO, and In 2 O 3 .

有機半導體層可由選自下列各物組成的群組之至少一者製成:并五苯,并四苯,蒽,萘,α-6-噻吩,α-4-噻吩,苝,紅螢烯,蔻,苝四羧基二醯亞胺,苝四羧基二酐,聚噻吩,聚-3-己基噻吩,聚對伸苯基乙烯,聚對伸苯基,聚茀,聚噻吩乙烯,聚噻吩-雜環芳族共聚物,萘的寡聚并苯,α-5-噻吩的寡噻吩,酞青素,苯均四酸二酐,苯均四酸二醯亞胺,苝四羧酸二酐,苝四羧酸二醯亞胺及其衍生物。The organic semiconductor layer may be made of at least one selected from the group consisting of pentacene, tetracene, anthracene, naphthalene, α-6-thiophene, α-4-thiophene, anthracene, and fluorene.蔻, 苝tetracarboxy quinone imine, 苝 tetracarboxy dianhydride, polythiophene, poly-3-hexyl thiophene, polyparaphenylene vinyl, polyparaphenylene, polyfluorene, polythiophene ethylene, polythiophene Cycloaromatic copolymer, oligoacene of naphthalene, oligothiophene of α-5-thiophene, anthraquinone, pyromellitic dianhydride, dipyridinium pyromellitic acid, ruthenium tetracarboxylic dianhydride, hydrazine Dicarboxylic acid diamine imide and its derivatives.

將參照附圖詳細地說明本發明的較佳實施例。Preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

第1圖為示意地顯示根據本發明的一較佳實施例藉由電化塗覆來形成有機緩衝層之方法的橫剖視圖。1 is a cross-sectional view schematically showing a method of forming an organic buffer layer by electrochemical coating according to a preferred embodiment of the present invention.

參照第1圖,一其上形成有源極/汲極電極(31,33,35,37)之基材(2)係浸入一電解質及一溶劑的一混合溶液中,其中形成參考電極(1)及背板電極(3)。可使用TBAB(四丁基四氟硼酸銨)作為電解質。可使用MC(二氯甲烷)作為溶劑。Referring to Fig. 1, a substrate (2) on which a source/drain electrode (31, 33, 35, 37) is formed is immersed in a mixed solution of an electrolyte and a solvent, wherein a reference electrode is formed (1). ) and back plate electrodes (3). TBAB (ammonium tetrabutylammonium tetrafluoroborate) can be used as the electrolyte. MC (dichloromethane) can be used as a solvent.

利用Epsilon CV(循環伏安法),藉由控制其位準同時施加恆定電壓至參考電極(1)而將電壓施加至樣本基材(2)的源極/汲極電極(31,33,35,37)及背板電極(3)之間。然後,有機緩衝層(41,43,45,47)形成於樣本基材(2)的源極/汲極電極(31,33,35,37)上。確切來說,若樣本基材(2)的源極/汲極電極(31,33,35,37)被同時地連接且電壓施加至背板基材(3)與源極/汲極電極之間,有機緩衝層(41,43,45,47)可同時形成於源極/汲極電極上。若只有源極電極被連接且施加電壓,有機緩衝層可只形成於源極電極(31,35)上。若只有汲極電極被連接且施加電壓,有機緩衝層可只形成於汲極電極(33,37)上。Using Epsilon CV (Cycle Voltammetry), a voltage is applied to the source/drain electrodes of the sample substrate (2) by controlling its level while applying a constant voltage to the reference electrode (1) (31, 33, 35) , 37) and between the back plate electrodes (3). Then, an organic buffer layer (41, 43, 45, 47) is formed on the source/drain electrodes (31, 33, 35, 37) of the sample substrate (2). Specifically, if the source/drain electrodes (31, 33, 35, 37) of the sample substrate (2) are simultaneously connected and a voltage is applied to the back substrate (3) and the source/drain electrodes The organic buffer layer (41, 43, 45, 47) can be simultaneously formed on the source/drain electrodes. If only the source electrodes are connected and a voltage is applied, the organic buffer layer may be formed only on the source electrodes (31, 35). If only the drain electrodes are connected and a voltage is applied, the organic buffer layer may be formed only on the drain electrodes (33, 37).

如上述,有機緩衝層(41,43,45,47)可形成於排除閘極絕緣膜之源極/汲極電極(31,33,35,37)上。As described above, the organic buffer layer (41, 43, 45, 47) may be formed on the source/drain electrodes (31, 33, 35, 37) excluding the gate insulating film.

第2圖為示意地顯示根據本發明的一較佳實施例之有機薄膜電晶體的橫剖視圖。Fig. 2 is a cross-sectional view schematically showing an organic thin film transistor according to a preferred embodiment of the present invention.

參照第2圖,一源極電極(31)、一汲極電極(33)、及一電性連接至源極電極(31)及汲極電極(33)的有機半導體層 (51)係配置於基材(11)上。Referring to FIG. 2, a source electrode (31), a drain electrode (33), and an organic semiconductor layer electrically connected to the source electrode (31) and the drain electrode (33) (51) is disposed on the substrate (11).

源極電極(31)及汲極電極(33)可由如上述的導電性材料製成,並利用光微影術沉積於基材的整體表面上且進行圖案化、或利用罩幕只沉積於基材的一經決定區域上藉以被形成在基材(1)上。較佳利用陰影罩幕藉由熱性沉積來形成源極電極(31)及汲極電極(33)。The source electrode (31) and the drain electrode (33) may be made of a conductive material as described above, and deposited on the entire surface of the substrate by photolithography and patterned, or deposited only on the base by the mask. The material is then formed on the substrate (1) as soon as it is determined. The source electrode (31) and the drain electrode (33) are preferably formed by thermal deposition using a shadow mask.

電性連接至源極電極(31)及汲極電極(33)之有機半導體層(51)並未直接地接觸於源極電極(31)及汲極電極(33),而是經由分別介於源極電極(31)與有機半導體層(51)之間以及汲極電極(33)與有機半導體層(51)之間的一有機緩衝層(41,43)被系統性連接至源極電極(31)及汲極電極(33)。因此,在如第2圖所示的交錯型有機薄膜電晶體之案例中,源極電極(31)及汲極電極(33)形成於基材(11)上,然後,有機緩衝層(41,43)根據第1圖所示的方法形成於源極電極(31)及汲極電極(33)上,並在140℃的烤爐中乾燥2小時,然後有機半導體(51)形成於其上。The organic semiconductor layer (51) electrically connected to the source electrode (31) and the drain electrode (33) is not directly in contact with the source electrode (31) and the drain electrode (33), but is separately An organic buffer layer (41, 43) between the source electrode (31) and the organic semiconductor layer (51) and between the drain electrode (33) and the organic semiconductor layer (51) is systematically connected to the source electrode ( 31) and the drain electrode (33). Therefore, in the case of the interleaved organic thin film transistor as shown in Fig. 2, the source electrode (31) and the drain electrode (33) are formed on the substrate (11), and then the organic buffer layer (41, 43) The source electrode (31) and the drain electrode (33) were formed by the method shown in Fig. 1 and dried in an oven at 140 ° C for 2 hours, and then an organic semiconductor (51) was formed thereon.

可利用陰影罩幕以0.2Å/秒速率、80℃基材溫度、在1x10-7 托耳(torr)真空下藉由熱性沉積來形成有機半導體層(51)。The organic semiconductor layer (51) can be formed by thermal deposition using a shadow mask at a rate of 0.2 Å/sec, a substrate temperature of 80 ° C, and a vacuum of 1 x 10 -7 torr.

在有機半導體層(51)上,配置有一閘極絕緣膜(23)。閘極絕緣膜(23)係使其上所形成的一閘極電極(21)自源極電極(31)、汲極電極(33)及有機半導體層(51)呈絕緣。並且,其可由諸如金屬氧化物、譬如氧化矽、氮化矽、氧化鋁等無機物質製成,或者其可由諸如聚乙烯苯酚、聚乙烯醇、 聚甲基丙烯酸甲酯、聚苯乙烯、或其類似物等有機物製成。On the organic semiconductor layer (51), a gate insulating film (23) is disposed. The gate insulating film (23) is such that a gate electrode (21) formed thereon is insulated from the source electrode (31), the drain electrode (33), and the organic semiconductor layer (51). Also, it may be made of an inorganic substance such as a metal oxide, such as cerium oxide, cerium nitride, aluminum oxide, or the like, or it may be composed of, for example, polyvinyl phenol, polyvinyl alcohol, Made of organic materials such as polymethyl methacrylate, polystyrene, or the like.

在閘極絕緣膜(23)上,配置有諸如Al等導電性材料製成的一閘極電極(21)。閘極電極(21)可利用陰影罩幕由熱沉積形成。On the gate insulating film (23), a gate electrode (21) made of a conductive material such as Al is disposed. The gate electrode (21) can be formed by thermal deposition using a shadow mask.

雖然根據第2圖的實施例之有機薄膜電晶體屬於交錯型,本發明不在此限。Although the organic thin film transistor according to the embodiment of Fig. 2 is of a staggered type, the present invention is not limited thereto.

第3圖為顯示根據本發明另一較佳實施例的有機薄膜電晶體之橫剖視圖。如第3圖所示,本發明亦可施用於倒置共面型有機薄膜電晶體,其中源極電極(35)及汲極電極(37)配置於一閘極電極(25)上,一有機半導體層(53)配置於源極電極(35)及汲極電極(37)上,且一閘極絕緣膜(37)配置於源極/汲極電極(35,37)及閘極電極(25)之間。在此例中,有機緩衝層(45,47)配置於源極/汲極電極(35,37)及有機半導體層(53)之間。Figure 3 is a cross-sectional view showing an organic thin film transistor according to another preferred embodiment of the present invention. As shown in FIG. 3, the present invention can also be applied to an inverted coplanar organic thin film transistor in which a source electrode (35) and a drain electrode (37) are disposed on a gate electrode (25), an organic semiconductor. The layer (53) is disposed on the source electrode (35) and the drain electrode (37), and a gate insulating film (37) is disposed on the source/drain electrodes (35, 37) and the gate electrode (25) between. In this example, the organic buffer layer (45, 47) is disposed between the source/drain electrodes (35, 37) and the organic semiconductor layer (53).

如上文說明,本發明的有機薄膜電晶體係包含介於有機半導體層及源極/汲極電極之間的有機緩衝層,藉以改良其間的介面性質及載體注射的能力,因此改良電晶體的裝置性質。As described above, the organic thin film electro-crystal system of the present invention comprises an organic buffer layer interposed between the organic semiconductor layer and the source/drain electrodes, thereby improving the interfacial property therebetween and the ability of the carrier to be injected, thereby improving the device of the transistor. nature.

本發明亦提供一有機發光顯示器,其包含本發明的有機薄膜電晶體及電性連接至該有機薄膜電晶體的有機發光裝置。The present invention also provides an organic light emitting display comprising the organic thin film transistor of the present invention and an organic light emitting device electrically connected to the organic thin film transistor.

有機發光顯示器可屬於諸如主動矩陣(AM)型等不同類型。The organic light emitting display may belong to different types such as an active matrix (AM) type.

因為本發明的有機發光顯示器包含根據本發明的有機 薄膜電晶體,其可確切地成像輸入信號。Because the organic light emitting display of the present invention comprises organic according to the present invention A thin film transistor that accurately images the input signal.

將參照下列範例來說明本發明,然而,這些範例只用來示範本發明且本發明的範圍不在此限,The invention will be described with reference to the following examples, however, these examples are only intended to illustrate the invention and the scope of the invention is not limited thereto.

範例1Example 1

如第2圖所示,源極/汲極電極(31,33)利用陰影罩幕藉由熱性沉積被形成於一基材(11)上。使用Au作為電極材料。As shown in Fig. 2, the source/drain electrodes (31, 33) are formed on a substrate (11) by thermal deposition using a shadow mask. Au was used as the electrode material.

然後,其上形成有源極/汲極電極(31,33)的樣本基材(2)係浸入電解質TBAB(四丁基四氟硼酸銨)及溶劑MC(二氯甲烷)的一混合溶液中,其中形成參考電極(1)及背板電極(3),且利用Epsilon CV(循環伏安法),將電壓施加至樣本基材(2)的源極/汲極電極(31,33)及背板電極(3)之間同時施加恆定電壓至參考電極(1),以形成有機緩衝層(41,43)於樣本基材(2)的源極/汲極電極(31,33)上。所形成的有機緩衝層(41,43)在處於140℃的一烤爐中乾燥2小時。Then, the sample substrate (2) on which the source/drain electrodes (31, 33) are formed is immersed in a mixed solution of the electrolyte TBAB (ammonium tetrabutylammonium tetrafluoroborate) and the solvent MC (methylene chloride). Forming a reference electrode (1) and a backing plate electrode (3), and applying a voltage to the source/drain electrodes (31, 33) of the sample substrate (2) using Epsilon CV (cyclic voltammetry) and A constant voltage is simultaneously applied between the backing plate electrodes (3) to the reference electrode (1) to form an organic buffer layer (41, 43) on the source/drain electrodes (31, 33) of the sample substrate (2). The resulting organic buffer layer (41, 43) was dried in an oven at 140 ° C for 2 hours.

然後,在有機緩衝層(41,43)上,利用陰影罩幕在1x10-7 托耳的真空下藉由80℃基材溫度、0.2Å/秒速率的熱性沉積形成一由并五苯製成之有機半導體層(51)。Then, on the organic buffer layer (41, 43), a shadow mask was used to form a pentacene by thermal deposition at a substrate temperature of 0.2 ° / sec under a vacuum of 1 x 10 -7 Torr. Organic semiconductor layer (51).

在有機半導體層(51)上,利用氧化矽形成一閘極絕緣膜(23),且在閘極絕緣膜(23)上,利用陰影罩幕藉由熱沉積形成一閘極電極(21),因此製成交錯型有機薄膜電晶體。使用Al作為閘極電極材料。On the organic semiconductor layer (51), a gate insulating film (23) is formed using yttrium oxide, and a gate electrode (21) is formed on the gate insulating film (23) by thermal deposition using a shadow mask. Thus, a staggered organic thin film transistor was fabricated. Al is used as the gate electrode material.

範例2Example 2

如第3圖所示,在基材(13)上,利用陰影罩幕藉由熱性沉積形成一閘極電極(25)。使用Al作為閘極電極材料。然 後,在閘極電極(25)上,利用氧化矽形成一閘極絕緣膜(27)。As shown in Fig. 3, a gate electrode (25) is formed on the substrate (13) by thermal deposition using a shadow mask. Al is used as the gate electrode material. Of course Thereafter, a gate insulating film (27) is formed on the gate electrode (25) by using yttrium oxide.

在閘極絕緣膜(27)上,利用陰影罩幕藉由熱性沉積形成源極/汲極電極(35,37)。使用Au作為電極材料。On the gate insulating film (27), source/drain electrodes (35, 37) are formed by thermal deposition using a shadow mask. Au was used as the electrode material.

如第1圖所示,包含閘極電極(25)、閘極絕緣膜(27)及形成於一基材(13)上的源極/汲極電極(35,37)之樣本基材(2)係浸入TBAB(四丁基四氟硼酸銨)及MC(二氯甲烷)的一混合溶液中,其中形成參考電極(1)及背板電極(3)。然後,利用Epsilon CV(循環伏安法),將電壓施加至樣本基材(2)的源極/汲極電極(31,33)及背板電極(3)之間同時施加恆定電壓至參考電極(1),因此形成有機緩衝層(45,47)於排除閘極絕緣膜(27)之源極/汲極電極(35,37)上。所形成的有機緩衝層(45,47)在140℃的一烤爐中乾燥約2小時。As shown in Fig. 1, a sample substrate (2) including a gate electrode (25), a gate insulating film (27), and a source/drain electrode (35, 37) formed on a substrate (13) It is immersed in a mixed solution of TBAB (ammonium tetrabutylammonium tetrafluoroborate) and MC (dichloromethane), in which a reference electrode (1) and a back plate electrode (3) are formed. Then, using Epsilon CV (cyclic voltammetry), a voltage is applied between the source/drain electrodes (31, 33) of the sample substrate (2) and the back plate electrode (3) while applying a constant voltage to the reference electrode. (1) Thus, an organic buffer layer (45, 47) is formed on the source/drain electrodes (35, 37) excluding the gate insulating film (27). The resulting organic buffer layer (45, 47) was dried in an oven at 140 ° C for about 2 hours.

然後,在有機緩衝層(45,47)上,利用陰影罩幕在1x10-7 托耳的真空下藉由80℃基材溫度、0.2Å/秒速率的熱性沉積來形成一由并五苯製成之有機半導體層(53)。Then, on the organic buffer layer (45, 47), a pentacene system was formed by thermal deposition of a substrate temperature of 80 ° C and a rate of 0.2 Å / sec under a vacuum of 1 x 10 -7 Torr using a shadow mask. An organic semiconductor layer (53).

產業利用性Industrial utilization

根據本發明,可改良有機半導體層與源極/汲極電極之間的介面性質及載體注射的能力藉以改良電晶體效能。並且,有機緩衝層可藉由電化塗覆法而被選擇性塗覆於源極電極、汲極電極或源極/汲極電極上。According to the present invention, the interface properties between the organic semiconductor layer and the source/drain electrodes and the ability of the carrier to be injected can be improved to improve the transistor performance. Also, the organic buffer layer can be selectively applied to the source electrode, the drain electrode or the source/drain electrode by an electrochemical coating method.

1‧‧‧參考電極1‧‧‧ reference electrode

2‧‧‧其上形成有源極/汲極電極之基材(樣本基材)2‧‧‧Substrate (sample substrate) on which the source/drain electrodes are formed

3‧‧‧背板電極3‧‧‧back plate electrode

11,13‧‧‧基材11,13‧‧‧Substrate

21,25‧‧‧閘極電極21,25‧‧‧gate electrode

23,27‧‧‧閘極絕緣膜23,27‧‧‧Gate insulation film

31,35‧‧‧源極電極31,35‧‧‧Source electrode

33,37‧‧‧汲極電極33,37‧‧‧汲electrode

41,43,45,47‧‧‧有機緩衝層41,43,45,47‧‧‧ organic buffer layer

51,53‧‧‧有機半導體層51,53‧‧‧Organic semiconductor layer

第1圖為示意地顯示根據本發明的一較佳實施例之一藉由電化塗覆來形成一有機緩衝層之裝備及方法的橫剖視圖; 第2圖為示意地顯示根據本發明的一較佳實施例之有機薄膜電晶體的橫剖面之橫剖視圖;第3圖為示意地顯示根據本發明另一較佳實施例之有機薄膜電晶體的橫剖面之橫剖視圖。1 is a cross-sectional view schematically showing an apparatus and method for forming an organic buffer layer by electrochemical coating according to a preferred embodiment of the present invention; 2 is a cross-sectional view schematically showing a cross section of an organic thin film transistor according to a preferred embodiment of the present invention; and FIG. 3 is a view schematically showing an organic thin film transistor according to another preferred embodiment of the present invention. A cross-sectional view of the cross section.

11...基材11. . . Substrate

21...閘極電極twenty one. . . Gate electrode

23...閘極絕緣膜twenty three. . . Gate insulating film

31...源極電極31. . . Source electrode

33...汲極電極33. . . Bipolar electrode

41、43...有機緩衝層41, 43. . . Organic buffer layer

51...有機半導體層51. . . Organic semiconductor layer

Claims (8)

一種有機薄膜電晶體,包含:一源極電極及一汲極電極;一有機半導體層,其電性連接至該源極電極及該汲極電極;一有機緩衝層,其置於該源極電極與該有機半導體層之間及/或該汲極電極與該有機半導體層之間,且該有機緩衝層係由以噻吩為基礎的化合物或以并苯-噻吩為基礎的化合物製成;一閘極電極,其與該源極電極、汲極電極及有機半導體層呈絕緣;及一閘極絕緣膜,其用於使該閘極電極與該源極電極、汲極電極及有機半導體層呈絕緣。 An organic thin film transistor comprising: a source electrode and a drain electrode; an organic semiconductor layer electrically connected to the source electrode and the drain electrode; and an organic buffer layer disposed at the source electrode Between the organic semiconductor layer and/or the gate electrode and the organic semiconductor layer, and the organic buffer layer is made of a thiophene-based compound or an acene-thiophene-based compound; a pole electrode insulated from the source electrode, the drain electrode, and the organic semiconductor layer; and a gate insulating film for insulating the gate electrode from the source electrode, the drain electrode, and the organic semiconductor layer . 如申請專利範圍第1項之有機薄膜電晶體,其中該以噻吩為基礎的化合物係由下列化學式1至5的一者代表: (其中R2 及R3 係獨立為羥基、烷基、環烷基、烷氧基、環烷氧基或硫代烷氧基基團,且m為從1至6的一整數) (其中Ar為C4 -C18 噻吩基基團)。The organic thin film transistor according to claim 1, wherein the thiophene-based compound is represented by one of the following chemical formulas 1 to 5: (wherein R 2 and R 3 are independently hydroxy, alkyl, cycloalkyl, alkoxy, cycloalkoxy or thioalkoxy groups, and m is an integer from 1 to 6) (wherein Ar is a C 4 -C 18 thienyl group). 如申請專利範圍第1項之有機薄膜電晶體,其中該以并苯-噻吩為基礎的化合物係由下列化學式6至14的一者代表:[化學式6] [化學式10] [化學式13] (其中R1 係獨立為羥基、烷基、環烷基、烷氧基、環烷氧基或硫代烷氧基基團,且n獨立為1或2)。An organic thin film transistor according to claim 1, wherein the acene-thiophene-based compound is represented by one of the following Chemical Formulas 6 to 14: [Chemical Formula 6] [Chemical Formula 10] [Chemical Formula 13] (wherein R 1 is independently a hydroxy, alkyl, cycloalkyl, alkoxy, cycloalkoxy or thioalkoxy group, and n is independently 1 or 2). 如申請專利範圍第1項之有機薄膜電晶體,其中該有機緩衝層係藉由電化塗覆法而被形成於該源極電極及該汲極電極的至少一者上。 The organic thin film transistor of claim 1, wherein the organic buffer layer is formed on at least one of the source electrode and the drain electrode by an electrochemical coating method. 如申請專利範圍第1項之有機薄膜電晶體,其中該源極/汲極電極係由選自Al、Ag、Mo、Au、Pt、Pd、Ni、Ir、Cr、Ti、MoW、ITO、IZO、ZnO及In2 O3 組成的群組之至少一者製成。The organic thin film transistor according to claim 1, wherein the source/drain electrode is selected from the group consisting of Al, Ag, Mo, Au, Pt, Pd, Ni, Ir, Cr, Ti, MoW, ITO, IZO. At least one of a group consisting of ZnO and In 2 O 3 is made. 如申請專利範圍第1項之有機薄膜電晶體,其中該有機半導體層係由選自下列所組成的群組之至少一者製 成:并五苯,并四苯,蒽,萘,α-6-噻吩,α-4-噻吩,苝,紅螢烯,蔻,苝四羧基二醯亞胺,苝四羧基二酐,聚噻吩,聚-3-己基噻吩,聚對伸苯基乙烯,聚對伸苯基,聚茀,聚噻吩乙烯,聚噻吩-雜環芳族共聚物,萘的寡聚并苯,α-5-噻吩的寡聚噻吩,酞青素,苯均四酸二酐,苯均四酸二醯亞胺,苝四羧酸二酐,苝四羧酸二醯亞胺及其等之衍生物。 The organic thin film transistor of claim 1, wherein the organic semiconductor layer is made of at least one selected from the group consisting of Form: pentacene, tetracene, anthracene, naphthalene, α-6-thiophene, α-4-thiophene, anthracene, erythrene, anthracene, anthracene tetracarboxydiimide, anthracene tetracarboxy dianhydride, polythiophene , poly-3-hexylthiophene, polyparaphenylene vinyl, polyparaphenylene, polyfluorene, polythiophene ethylene, polythiophene-heterocyclic aromatic copolymer, naphthalene oligoacene, α-5-thiophene Oligothiophene, anthraquinone, pyromellitic dianhydride, pyromellitic acid dinonimide, perylenetetracarboxylic dianhydride, perylenetetracarboxylic acid diimine and its derivatives. 一種用於製造一有機薄膜電晶體之方法,包含使一有機緩衝層置於源極/汲極電極與一有機半導體層之間,其中該有機緩衝層係藉由電化塗覆法而被塗覆於該源極電極及該汲極電極的至少一者上,其中該有機緩衝層係由以噻吩為基礎的化合物或以并苯-噻吩為基礎的化合物製成。 A method for fabricating an organic thin film transistor comprising placing an organic buffer layer between a source/drain electrode and an organic semiconductor layer, wherein the organic buffer layer is coated by an electrochemical coating method And at least one of the source electrode and the drain electrode, wherein the organic buffer layer is made of a thiophene-based compound or an acene-thiophene-based compound. 一種有機發光顯示器,包含如申請專利範圍第1至6項中任一項之有機薄膜電晶體;及一電性連接至該有機薄膜電晶體之有機發光裝置。An organic light-emitting display comprising the organic thin film transistor according to any one of claims 1 to 6; and an organic light-emitting device electrically connected to the organic thin film transistor.
TW097149387A 2007-12-21 2008-12-18 Organic thin film transistor and method for preparing thereof TWI450429B (en)

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