TWI448709B - 以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置 - Google Patents

以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置 Download PDF

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Publication number
TWI448709B
TWI448709B TW101117160A TW101117160A TWI448709B TW I448709 B TWI448709 B TW I448709B TW 101117160 A TW101117160 A TW 101117160A TW 101117160 A TW101117160 A TW 101117160A TW I448709 B TWI448709 B TW I448709B
Authority
TW
Taiwan
Prior art keywords
touch panel
voltage
sensing
difference
detecting
Prior art date
Application number
TW101117160A
Other languages
English (en)
Chinese (zh)
Other versions
TW201346294A (zh
Inventor
Chi Chang Lu
Chia Hsing Lin
I Shu Lee
Original Assignee
Elan Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Priority to TW101117160A priority Critical patent/TWI448709B/zh
Priority to CN201210268189.3A priority patent/CN103424644B/zh
Priority to KR1020120093144A priority patent/KR101358099B1/ko
Publication of TW201346294A publication Critical patent/TW201346294A/zh
Application granted granted Critical
Publication of TWI448709B publication Critical patent/TWI448709B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Position Input By Displaying (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW101117160A 2012-05-15 2012-05-15 以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置 TWI448709B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW101117160A TWI448709B (zh) 2012-05-15 2012-05-15 以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置
CN201210268189.3A CN103424644B (zh) 2012-05-15 2012-07-30 以不同电压刺激信号进行触控面板优劣检测方法及其装置
KR1020120093144A KR101358099B1 (ko) 2012-05-15 2012-08-24 상이한 전압들을 갖는 여기 신호들을 이용한 터치 패널의 품질 검사 방법 및 이를 이용한 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101117160A TWI448709B (zh) 2012-05-15 2012-05-15 以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置

Publications (2)

Publication Number Publication Date
TW201346294A TW201346294A (zh) 2013-11-16
TWI448709B true TWI448709B (zh) 2014-08-11

Family

ID=49649683

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101117160A TWI448709B (zh) 2012-05-15 2012-05-15 以不同電壓刺激訊號進行觸控面板優劣檢測方法及其檢測裝置

Country Status (3)

Country Link
KR (1) KR101358099B1 (ko)
CN (1) CN103424644B (ko)
TW (1) TWI448709B (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201612884A (en) * 2014-09-26 2016-04-01 Elan Microelectronics Corp A scanning method for a touch panel
TWI765969B (zh) * 2018-02-14 2022-06-01 李尚禮 電容式感測裝置的量測閾值的校正方法及電容式感測裝置
TWI765970B (zh) * 2018-02-14 2022-06-01 李尚禮 電容式感測裝置、其量測環境的事件偵測方法及其校正時機的判斷方法

Citations (3)

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TW200811567A (en) * 2006-08-31 2008-03-01 Au Optronics Corp Liquid crystal display, active matrix substrate and test method therefor
WO2010116696A1 (ja) * 2009-04-08 2010-10-14 パナソニック株式会社 プラズマディスプレイパネルの駆動方法およびプラズマディスプレイ装置
US20110057958A1 (en) * 2004-03-18 2011-03-10 Seiko Epson Corporation Reference voltage generation circuit, data driver, display device, and electronic instrument

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JPH04364512A (ja) * 1991-06-12 1992-12-16 Matsushita Electric Ind Co Ltd タッチパネル座標検出装置
JP2005127787A (ja) * 2003-10-22 2005-05-19 Kawaguchiko Seimitsu Co Ltd タッチパネルの直線性の評価方法と、その評価方法を用いた直線性検査装置及びそれに基づいて直線性評価を行ったタッチパネル
JP2005274225A (ja) * 2004-03-23 2005-10-06 Kawaguchiko Seimitsu Co Ltd タッチパネル検査装置
CN101727252A (zh) * 2008-10-13 2010-06-09 奇信电子股份有限公司 应用于触控面板的侦测装置及使用其的触控装置
CN102004588B (zh) * 2009-09-03 2014-10-29 义隆电子股份有限公司 电容式触控板的检测电路及方法
CN102043497A (zh) * 2009-10-19 2011-05-04 联咏科技股份有限公司 触控检测方法、触控检测装置及触控显示装置
KR101360000B1 (ko) * 2009-11-12 2014-02-11 한양대학교 산학협력단 터치스크린 및 그것의 센싱 커패시턴스 편차 및 오프셋 편차 보상 방법
US8629852B2 (en) * 2009-11-12 2014-01-14 Electronics And Telecommunications Research Institute Touch screen and method for compensating sensing capacitance variations and offset variations thereof
KR101091694B1 (ko) * 2010-01-14 2011-12-08 마이크로 인스펙션 주식회사 터치패널의 검사장치
KR100991130B1 (ko) * 2010-03-19 2010-11-02 주식회사 에임즈 터치 패널 구동 장치

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110057958A1 (en) * 2004-03-18 2011-03-10 Seiko Epson Corporation Reference voltage generation circuit, data driver, display device, and electronic instrument
TW200811567A (en) * 2006-08-31 2008-03-01 Au Optronics Corp Liquid crystal display, active matrix substrate and test method therefor
WO2010116696A1 (ja) * 2009-04-08 2010-10-14 パナソニック株式会社 プラズマディスプレイパネルの駆動方法およびプラズマディスプレイ装置

Also Published As

Publication number Publication date
CN103424644B (zh) 2016-08-03
CN103424644A (zh) 2013-12-04
TW201346294A (zh) 2013-11-16
KR20130127892A (ko) 2013-11-25
KR101358099B1 (ko) 2014-02-06

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