TWI445076B - Vacuum processing device - Google Patents
Vacuum processing device Download PDFInfo
- Publication number
- TWI445076B TWI445076B TW097106066A TW97106066A TWI445076B TW I445076 B TWI445076 B TW I445076B TW 097106066 A TW097106066 A TW 097106066A TW 97106066 A TW97106066 A TW 97106066A TW I445076 B TWI445076 B TW I445076B
- Authority
- TW
- Taiwan
- Prior art keywords
- vacuum
- transfer chamber
- processing
- chamber
- wafer
- Prior art date
Links
- 238000012545 processing Methods 0.000 title claims description 328
- 238000012546 transfer Methods 0.000 claims description 113
- 238000005530 etching Methods 0.000 claims description 20
- 238000004380 ashing Methods 0.000 claims description 8
- 239000013078 crystal Substances 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 description 98
- 239000007789 gas Substances 0.000 description 30
- 238000012423 maintenance Methods 0.000 description 26
- 238000000034 method Methods 0.000 description 23
- 230000008569 process Effects 0.000 description 23
- 230000032258 transport Effects 0.000 description 21
- 238000002955 isolation Methods 0.000 description 20
- 238000009434 installation Methods 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 9
- 239000010453 quartz Substances 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 239000002699 waste material Substances 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 238000003860 storage Methods 0.000 description 5
- 230000005684 electric field Effects 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 239000003507 refrigerant Substances 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 230000006837 decompression Effects 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000012805 post-processing Methods 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000009489 vacuum treatment Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007335516A JP5596265B2 (ja) | 2007-12-27 | 2007-12-27 | 真空処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200929352A TW200929352A (en) | 2009-07-01 |
| TWI445076B true TWI445076B (zh) | 2014-07-11 |
Family
ID=40796666
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097106066A TWI445076B (zh) | 2007-12-27 | 2008-02-21 | Vacuum processing device |
| TW102119148A TW201338037A (zh) | 2007-12-27 | 2008-02-21 | 真空處理裝置 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW102119148A TW201338037A (zh) | 2007-12-27 | 2008-02-21 | 真空處理裝置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20090165952A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5596265B2 (cg-RX-API-DMAC7.html) |
| KR (2) | KR100978887B1 (cg-RX-API-DMAC7.html) |
| TW (2) | TWI445076B (cg-RX-API-DMAC7.html) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5260981B2 (ja) * | 2008-02-22 | 2013-08-14 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
| KR101390900B1 (ko) | 2011-05-31 | 2014-04-30 | 세메스 주식회사 | 기판처리장치 |
| US9991139B2 (en) * | 2012-12-03 | 2018-06-05 | Asm Ip Holding B.V. | Modular vertical furnace processing system |
| JP6609425B2 (ja) * | 2015-06-17 | 2019-11-20 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| CN113436984B (zh) * | 2020-03-23 | 2024-12-06 | 台湾积体电路制造股份有限公司 | 用于半导体制程机台的设备接口系统 |
| CN112317745B (zh) * | 2020-09-22 | 2022-05-10 | 成都飞机工业(集团)有限责任公司 | 一种自动化增材制造粉末存储装置及存储方法 |
| CN120659950A (zh) * | 2023-02-06 | 2025-09-16 | 应用材料公司 | 用于处理光学装置的模块、系统及方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0982493A (ja) * | 1995-09-14 | 1997-03-28 | Tokyo Electron Ltd | プラズマ処理装置 |
| KR100193886B1 (ko) * | 1996-05-03 | 1999-06-15 | 김영환 | 플라즈마 식각 장비 및 그를 이용한 식각 방법 |
| JP3454034B2 (ja) * | 1996-09-13 | 2003-10-06 | 株式会社日立製作所 | 真空処理装置 |
| US5844195A (en) * | 1996-11-18 | 1998-12-01 | Applied Materials, Inc. | Remote plasma source |
| JPH11145251A (ja) | 1997-08-15 | 1999-05-28 | Tokyo Electron Ltd | 基板処理装置 |
| US6107192A (en) * | 1997-12-30 | 2000-08-22 | Applied Materials, Inc. | Reactive preclean prior to metallization for sub-quarter micron application |
| JP2000021870A (ja) * | 1998-06-30 | 2000-01-21 | Tokyo Electron Ltd | プラズマ処理装置 |
| JP2000133597A (ja) * | 1998-10-22 | 2000-05-12 | Tadahiro Omi | 半導体製造装置 |
| JP2000269149A (ja) * | 1999-03-19 | 2000-09-29 | Rohm Co Ltd | 半導体基板に対するプラズマ表面処理装置 |
| JP2001007117A (ja) * | 1999-06-24 | 2001-01-12 | Tokyo Electron Ltd | 処理装置及び処理方法 |
| US6860965B1 (en) * | 2000-06-23 | 2005-03-01 | Novellus Systems, Inc. | High throughput architecture for semiconductor processing |
| US7335277B2 (en) * | 2003-09-08 | 2008-02-26 | Hitachi High-Technologies Corporation | Vacuum processing apparatus |
| JP2006080347A (ja) | 2004-09-10 | 2006-03-23 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| JP4694249B2 (ja) * | 2005-04-20 | 2011-06-08 | 株式会社日立ハイテクノロジーズ | 真空処理装置及び試料の真空処理方法 |
| JP5030410B2 (ja) * | 2005-09-28 | 2012-09-19 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
| KR100758298B1 (ko) | 2006-03-03 | 2007-09-12 | 삼성전자주식회사 | 기판 처리 장치 및 방법 |
-
2007
- 2007-12-27 JP JP2007335516A patent/JP5596265B2/ja active Active
-
2008
- 2008-02-21 TW TW097106066A patent/TWI445076B/zh not_active IP Right Cessation
- 2008-02-21 TW TW102119148A patent/TW201338037A/zh unknown
- 2008-02-28 KR KR1020080018591A patent/KR100978887B1/ko not_active Expired - Fee Related
- 2008-02-29 US US12/039,994 patent/US20090165952A1/en not_active Abandoned
-
2010
- 2010-06-24 KR KR1020100060189A patent/KR101116875B1/ko active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20090071304A (ko) | 2009-07-01 |
| KR20100087689A (ko) | 2010-08-05 |
| US20090165952A1 (en) | 2009-07-02 |
| KR101116875B1 (ko) | 2012-03-06 |
| KR100978887B1 (ko) | 2010-08-31 |
| JP5596265B2 (ja) | 2014-09-24 |
| TW201338037A (zh) | 2013-09-16 |
| JP2009158733A (ja) | 2009-07-16 |
| TW200929352A (en) | 2009-07-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |