TWI442505B - A pallet type substrate transport system, a film forming method, and a manufacturing method of an electronic device - Google Patents

A pallet type substrate transport system, a film forming method, and a manufacturing method of an electronic device Download PDF

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TWI442505B
TWI442505B TW100104210A TW100104210A TWI442505B TW I442505 B TWI442505 B TW I442505B TW 100104210 A TW100104210 A TW 100104210A TW 100104210 A TW100104210 A TW 100104210A TW I442505 B TWI442505 B TW I442505B
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tray
substrate
end surface
pressure
resin
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TW100104210A
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Chinese (zh)
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TW201203431A (en
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Masahiro Matsui
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Canon Anelva Corp
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    • AHUMAN NECESSITIES
    • A62LIFE-SAVING; FIRE-FIGHTING
    • A62CFIRE-FIGHTING
    • A62C33/00Hose accessories
    • AHUMAN NECESSITIES
    • A62LIFE-SAVING; FIRE-FIGHTING
    • A62CFIRE-FIGHTING
    • A62C31/00Delivery of fire-extinguishing material
    • A62C31/28Accessories for delivery devices, e.g. supports
    • AHUMAN NECESSITIES
    • A62LIFE-SAVING; FIRE-FIGHTING
    • A62CFIRE-FIGHTING
    • A62C37/00Control of fire-fighting equipment
    • A62C37/36Control of fire-fighting equipment an actuating signal being generated by a sensor separate from an outlet device
    • A62C37/38Control of fire-fighting equipment an actuating signal being generated by a sensor separate from an outlet device by both sensor and actuator, e.g. valve, being in the danger zone
    • A62C37/40Control of fire-fighting equipment an actuating signal being generated by a sensor separate from an outlet device by both sensor and actuator, e.g. valve, being in the danger zone with electric connection between sensor and actuator
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16KVALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
    • F16K17/00Safety valves; Equalising valves, e.g. pressure relief valves
    • F16K17/02Safety valves; Equalising valves, e.g. pressure relief valves opening on surplus pressure on one side; closing on insufficient pressure on one side
    • F16K17/164Safety valves; Equalising valves, e.g. pressure relief valves opening on surplus pressure on one side; closing on insufficient pressure on one side and remaining closed after return of the normal pressure
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16KVALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
    • F16K27/00Construction of housing; Use of materials therefor
    • F16K27/02Construction of housing; Use of materials therefor of lift valves

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Business, Economics & Management (AREA)
  • Emergency Management (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Physical Vapour Deposition (AREA)

Description

托盤式基板搬送系統、成膜方法及電子裝置之製造方法Pallet type substrate transport system, film forming method and electronic device manufacturing method

本發明是關於一種使用托盤進行搬送基板的托盤式基板搬送系統者,尤其是關於以進行減壓下的成膜等的處理的基板處理裝置被使用於基板的搬送的系統者。又,本發明是關於使用此種基板處理裝置的成膜方法或電子裝置的製造方法者。The present invention relates to a tray-type substrate transport system that transports a substrate using a tray, and more particularly to a system in which a substrate processing apparatus that performs processing such as film formation under reduced pressure is used for transporting a substrate. Moreover, the present invention relates to a film forming method using such a substrate processing apparatus or a method of manufacturing an electronic device.

又,電子裝置,是指利用電子技術的所有裝置,例如液晶顯示器或電漿顯示器等的各種顯示用元件,太陽電池等。Moreover, the electronic device refers to all devices using electronic technology, such as various display elements such as a liquid crystal display or a plasma display, and solar cells.

在製造各種電子裝置中,對於被處理物(以下,稱為基板),必須施以加熱處理或成膜處理等的表面處理。In the manufacture of various electronic devices, it is necessary to apply a surface treatment such as heat treatment or film formation treatment to a workpiece (hereinafter referred to as a substrate).

例如,在液晶顯示器中,成為在玻璃製的基板板面(不是端面的面)形成透明電極的處理等。被使用於此種處理的基板處理裝置是具備為了在所定環境進行處理基板,構成排氣成真空而可減壓,或是可將所定氣體導入至內部的腔。又,必須連續地進行不相同的處理,或是由大氣壓徐徐地降低壓力,而作成具備複數腔的構成。For example, in a liquid crystal display, a process of forming a transparent electrode on a substrate surface (not a surface of an end surface) made of glass is used. The substrate processing apparatus used in such a process is provided with a chamber for processing a substrate in a predetermined environment, and the exhaust gas is evacuated to be decompressed, or a predetermined gas can be introduced into the chamber. Further, it is necessary to continuously perform different treatments or to gradually reduce the pressure by atmospheric pressure to form a configuration having a plurality of cavities.

第4圖是作為習知的代表性的基板處理技術的一例子,表示豎立基板進行搬送的縱型搬送的線內型基板處理裝置的概略機構者。Fig. 4 is a schematic diagram showing an example of a conventional substrate processing technique which is a conventional example of an in-line type substrate processing apparatus for vertically transporting a vertical substrate.

在縱型搬送線內型中,在一直線上縱設有真空隔絕腔408,及複數製程腔409的構成,作成貫穿真空隔絕腔408及複數製程腔409,設有進行搬送基板402的搬送機構。又,在各腔間,設有閘閥404。In the vertical transfer line inner type, a vacuum insulation chamber 408 and a plurality of process chambers 409 are vertically disposed in a straight line, and a vacuum isolation chamber 408 and a plurality of process chambers 409 are formed, and a transfer mechanism for transporting the substrate 402 is provided. Further, a gate valve 404 is provided between the chambers.

基板402是在被裝載於托盤(或是稱為第一托盤)406的狀態藉由搬送機構依次搬送至各腔,例如進行著成膜等的處理。各腔中的一腔,是在搬入,搬出基板402之際朝著大氣被開放的真空隔絕腔408。The substrate 402 is sequentially transported to each chamber by a transport mechanism in a state of being loaded on a tray (also referred to as a first tray) 406, and for example, a film formation process or the like is performed. A cavity in each cavity is a vacuum isolation chamber 408 that is opened to the atmosphere while being carried in and out of the substrate 402.

在進行縱型搬送的線內型基板處理裝置中,被保持於托盤的基板,是在搬送時的振動之故,因而產生大變形,而有關於基板的破損及脫落的問題。尤其是在處理G6世代(1500mm×1800mm)尺寸以上的玻璃基板之際,因基板本體的重量會變重,及隨著逐年來的顯示面板的薄型化要求也將基板厚度變薄,因此搬送時的變形程度也大而顯著地出現基板的破損或脫落的事情的課題。In the in-line type substrate processing apparatus that performs the vertical conveyance, the substrate held by the tray is vibrated during transportation, and thus has a large deformation, and there is a problem that the substrate is damaged or fallen off. In particular, when the glass substrate of the G6 generation (1500 mm × 1800 mm) or larger is processed, the weight of the substrate body becomes heavier, and the thickness of the substrate is reduced as the thickness of the display panel is reduced year by year. The degree of deformation is also large, and the problem of damage or falling off of the substrate occurs remarkably.

對於上述課題,作為進行縱型搬送的線內型基板處理裝置的搬送用托盤,在專利文獻1揭示有具備藉由使用柔軟的纖維材料的支撐針腳來支撐基板於基板處理面的機構的搬送用托盤的構成。In the above-mentioned problem, the transport tray for the in-line type substrate processing apparatus that performs the vertical transport is disclosed in Patent Document 1 for transporting a mechanism that supports the substrate on the substrate processing surface by using support pins of a soft fibrous material. The composition of the tray.

又,在專利文獻2揭示著在搬送用托盤下部設置吸收搬送基板時的衝擊的機構而抑制對於大型基板的破損的構成。Furthermore, in the lower part of the transport tray, a mechanism for absorbing the impact when transporting the substrate is provided, and the structure for suppressing damage to the large substrate is suppressed.

專利文獻1:日本特開2007-204824號公報Patent Document 1: Japanese Laid-Open Patent Publication No. 2007-204824

專利文獻2:日本特開2007-262539號公報Patent Document 2: Japanese Laid-Open Patent Publication No. 2007-262539

如上所述地,習知的線內型基板處理裝置的托盤是安裝有嵌入玻璃基板的方形狀托盤,成為僅嵌入基板進行保持的機構。因此,托盤的基板嵌入空間是對於基板的外形尺寸,僅考慮到不必進行給壓就可把握的程度的充裕。所以,將基板移裝於托盤的機構(機器人等)是被要求極高精度的基板移裝動作。As described above, the tray of the conventional in-line type substrate processing apparatus is a square-shaped tray on which a glass substrate is embedded, and is a mechanism in which only the substrate is embedded and held. Therefore, the substrate embedding space of the tray is an outer dimension of the substrate, and it is only sufficient in consideration of the extent that it is not necessary to perform the pressing. Therefore, the mechanism (robot or the like) for transferring the substrate to the tray is a substrate transfer operation requiring extremely high precision.

還有,隨著基板的大型化在G6世代(1800mm×1500mm×0.07mm)尺寸的基板中,重量是成為大約5公斤,而將基板移載至基板處理裝置的托盤之際的機構是被要求極高精度,而且被要求大型化且高積裝重量之故,因而成為極昂貴。Further, as the size of the substrate is increased in the G6 generation (1800 mm × 1500 mm × 0.07 mm) substrate, the weight is about 5 kg, and the mechanism for transferring the substrate to the tray of the substrate processing apparatus is required. Extremely high precision, and it is required to be large and high in weight, which makes it extremely expensive.

又,在線內型的基板處理裝置中,雖進行著將基板嵌入搬送至托盤,惟為了縮短基板處理時間,搬送速度也變快。還有,基板重量較重,慣性也變大,暗示著在搬運中發生來自托盤的變位,及基板的破損,脫落的可能性,而被要求著該對應。Further, in the in-line type substrate processing apparatus, the substrate is embedded and transported to the tray, but the transport speed is also increased in order to shorten the substrate processing time. Further, the weight of the substrate is heavy, and the inertia is also large, suggesting that the displacement from the tray and the possibility of breakage or detachment of the substrate during transportation are required, and this correspondence is required.

本發明是鑑於上述課題而創作者,其目的是在於即使對於移載基板時的托盤的基板移載機構的精度低時,對於托盤也可將基板經常穩定地予以保持,而抑制發生來自搬送基板時的托盤的基板的錯位、破損、脫落。The present invention has been made in view of the above-described problems, and an object of the present invention is to prevent a substrate from being stably held in a tray even when the accuracy of the substrate transfer mechanism of the tray is low when the substrate is transferred, and to suppress occurrence of the substrate from the transport substrate. The substrate of the tray is displaced, broken, or peeled off.

本發明的第一態樣是一種托盤式基板搬送系統,是使用托盤進行搬送基板的托盤式基板搬送系統,其特徵為:具備:可裝載上述基板的第一托盤;及於上述第一托盤裝載有上述基板之際,於該基板的端面給予壓力而於上述第一托盤保持該基板的給壓機構;及上述第一托盤被裝卸的第二托盤;及從水平地配置被裝載於上述第一托盤的基板的狀態以豎立的狀態進行搬送裝設有上述第一托盤的上述第二托盤的搬送機構。A first aspect of the present invention is a tray type substrate transport system, which is a tray type substrate transport system that transports a substrate using a tray, and includes: a first tray on which the substrate can be loaded; and the first tray loading a pressure-feeding mechanism that applies pressure to an end surface of the substrate to hold the substrate on the first tray, and a second tray on which the first tray is detached; and is horizontally disposed on the first substrate In the state of the substrate of the tray, the transport mechanism of the second tray of the first tray is transported in an upright state.

本發明的第二態樣是一種成膜方法,其特徵為:具有:於第一托盤裝載基板的步驟;及於被裝載於上述第一托盤的上述基板的端面給予壓力而於該第一托盤保持上述基板的步驟;及將保持上述基板的第一托盤裝設於第二托盤的步驟;及從水平地配置被保持於上述第一托盤的基板的狀態以豎立狀態搬送裝設有上述第一托盤的上述第二托盤至腔內的步驟;及在上述腔內,利用上述第二托盤被搬送,對於被保持在與該第二托盤一體化的上述第一托盤的基板,施以所定處理的步驟。A second aspect of the present invention is a film forming method, comprising: a step of loading a substrate on a first tray; and applying pressure to an end surface of the substrate loaded on the first tray to the first tray a step of holding the substrate; and a step of mounting the first tray holding the substrate on the second tray; and transporting the first tray in an upright state from a state in which the substrate held by the first tray is horizontally disposed a step of moving the second tray of the tray into the chamber; and transporting the second tray in the chamber, and applying the predetermined treatment to the substrate held by the first tray integrated with the second tray step.

本發明的第三態樣是一種托盤,是保持基板而用以搬送的托盤,其特徵為:具備:可裝載基板的第一托盤;及設於上述第一托盤,在上述基板被裝載於該第一托盤之際具有與該基板的端面接觸的面的給壓機構,藉由該面將壓力給予上述基板的端面的方式所構成,且上述面可變位地構成於上述第一托盤的內側及外側的給壓機構;及可裝卸地構成上述第一托盤的第二托盤。A third aspect of the present invention is a tray for holding a substrate and transporting the tray, comprising: a first tray on which the substrate can be loaded; and a first tray provided on the substrate a pressure applying mechanism having a surface in contact with an end surface of the substrate in the first tray, wherein the surface is configured to apply pressure to an end surface of the substrate, and the surface is variably formed inside the first tray And an outer pressure feeding mechanism; and a second tray detachably forming the first tray.

依照本發明,即使對於移載基板時的托盤的基板移載機構的精度低時,對於托盤也可將基板經常穩定地予以保持,而抑制發生來自搬送基板時的托盤的基板的錯位、破損、脫落。According to the present invention, even when the accuracy of the substrate transfer mechanism of the tray at the time of transferring the substrate is low, the substrate can be stably held for the tray, and the occurrence of displacement or breakage of the substrate from the tray when the substrate is transferred can be suppressed. Fall off.

以下,依據圖式進行說明本發明的實施形態。Hereinafter, embodiments of the present invention will be described based on the drawings.

又,在圖中與以第4圖所說明的要素實質上相同的要素上,給予相同符號。In the drawings, elements that are substantially the same as those described in FIG. 4 are denoted by the same reference numerals.

第1圖是本實施形態的基板搬送系統及基板處理裝置的概略圖,表示於第1圖的裝置是縱型搬送的線內型的裝置。表示於第1圖的基板處理裝置是具備裝載複數枚基板102的複數晶盒部101,及基板搬送機器人部103。基板搬送機器人部103是擔負利用晶盒部101俾將基板102移載至基板處理裝置的作用,及將已處理的基板102回收至晶盒部101的作用。Fig. 1 is a schematic view showing a substrate transfer system and a substrate processing apparatus according to the present embodiment, and shows that the apparatus shown in Fig. 1 is an in-line type apparatus for vertical transport. The substrate processing apparatus shown in FIG. 1 includes a plurality of crystal cassette units 101 on which a plurality of substrates 102 are mounted, and a substrate transfer robot unit 103. The substrate transfer robot unit 103 functions to transfer the substrate 102 to the substrate processing apparatus by the cassette unit 101 , and to collect the processed substrate 102 into the cassette unit 101 .

在本實施形態中,可裝載基板的托盤[在第3(a)圖的符號110]是具有:備有用以保持基板的保持機構的第一托盤106,及構成與該第一托盤106可分離,而用以保持該第一托盤106的第二托盤107。In the present embodiment, the tray on which the substrate can be mounted [indicator 110 in Fig. 3(a)] has the first tray 106 provided with a holding mechanism for holding the substrate, and the configuration is separable from the first tray 106. And a second tray 107 for holding the first tray 106.

本實施形態的基板處理裝置是具有與基板搬送機器人部103協作而將基板102移載至第一托盤106的平台105。平台105是構成載置該平台105的第一托盤106的載置面成為水平(對於重力方向垂直方向),於第一托盤106載置基板102之際,第一托盤106是水平被載置於平台105上。因此,由晶盒部61藉由基板搬送機器人部103被搬送的基板102,是利用該基板搬送機器人部103在平台105上,水平地被移載至第一托盤106。當基板102被移載於第一托盤106上,則藉由下述的給壓機構,俾於基板102給予壓力而將該基板102被保持於第一托盤106。此時,例如使用由平台105延伸的針腳狀機構,也可將基板搬送機器人部103的基板102一旦載置於該上面之後移載於第一托盤106上。The substrate processing apparatus of the present embodiment has a stage 105 that cooperates with the substrate transfer robot unit 103 to transfer the substrate 102 to the first tray 106. The stage 105 is such that the mounting surface of the first tray 106 on which the platform 105 is placed is horizontal (vertical direction to the direction of gravity), and the first tray 106 is placed horizontally when the substrate 102 is placed on the first tray 106. On the platform 105. Therefore, the substrate 102 transported by the substrate transfer robot unit 103 by the cassette unit 61 is horizontally transferred to the first tray 106 by the substrate transfer robot unit 103 on the stage 105. When the substrate 102 is transferred onto the first tray 106, the substrate 102 is held by the first tray 106 by applying pressure to the substrate 102 by a pressure applying mechanism described below. At this time, for example, using the stitch-shaped mechanism extended by the stage 105, the substrate 102 of the substrate transfer robot unit 103 may be transferred to the first tray 106 once placed on the upper surface.

如此地,將基板102裝載於托盤110之際,採用從第二托盤107可分離第一托盤106的構造,在第一托盤106中配置有基板102的基板配置領域(在第3圖中為符號111)成為水平的方式,可將第一托盤106配置在平台105上。因此,可將基板102搬送至被保持成水平的基板配置領域111上之故,因而即使有基板102朝著其厚度方向彎曲時,也可將基板102容易地配置在基板配置領域111。As described above, when the substrate 102 is loaded on the tray 110, the first tray 106 can be separated from the second tray 107, and the substrate arrangement area in which the substrate 102 is disposed in the first tray 106 (symbol in FIG. 3) 111) The first tray 106 can be placed on the platform 105 in a horizontal manner. Therefore, the substrate 102 can be transported to the substrate arrangement area 111 held horizontally. Therefore, even when the substrate 102 is bent in the thickness direction thereof, the substrate 102 can be easily disposed in the substrate arrangement area 111.

然後,將設於平台105且裝載有基板102的第一托盤106利用托盤設置機器人(未予圖示),以豎放第一托盤106的狀態裝設於縱型地被裝載的具稍微傾斜的第二托盤107而使之一體化。之後,裝設於第二托盤107的第一托盤106是利用設於第二托盤107下部的搬送軌302(圖示於第3(a)圖)及設於基板處理裝置內的搬送滾子303(圖示於第3(b)圖),被搬送至真空隔絕腔108以及製程腔109。又,在真空隔絕腔108與製程腔109之間,及製程腔109間設有閘閥104。Then, the first tray 106 provided on the stage 105 and loaded with the substrate 102 is attached to the vertically loaded state with a slightly inclined state by a tray setting robot (not shown) in a state where the first tray 106 is vertically placed. The second tray 107 is integrated. Thereafter, the first tray 106 mounted on the second tray 107 is a transporting rail 302 (shown in FIG. 3(a)) provided in the lower portion of the second tray 107, and a transport roller 303 provided in the substrate processing apparatus. (Illustrated in Fig. 3(b)), it is transported to the vacuum isolation chamber 108 and the process chamber 109. Further, a gate valve 104 is provided between the vacuum isolation chamber 108 and the process chamber 109, and between the process chamber 109.

在上述製程腔109內,設有基板102的托盤110被配置於該製程腔109內之際,對於上述基板102施以所定處理。例如,減壓製程腔109內而導入所定氣體,於基板102上形成薄膜於所定位置。In the processing chamber 109, when the tray 110 provided with the substrate 102 is placed in the processing chamber 109, the substrate 102 is subjected to a predetermined process. For example, a predetermined gas is introduced into the pressure reducing process chamber 109 to form a film on the substrate 102 at a predetermined position.

這時候,第二托盤107是成膜處理時,為了防止發生附著的成膜的剝落所致的粒子,作成不會有從被維持真空的基板處理裝置內朝大氣壓的外部被搬出的構成也沒有關係。At this time, in the case where the second tray 107 is formed during the film formation process, the particles are not removed from the inside of the substrate processing apparatus in which the vacuum is maintained, and the outside of the atmospheric pressure is not formed in order to prevent the particles from being peeled off due to deposition. relationship.

如第3(a)圖所示地,上述第二托盤107是形成有用以保持第一托盤106的保持部304而於設有第一托盤106的托盤設置面305可裝卸地構成第一托盤106。又,如上述地,在第二托盤107,設有與搬送滾子303卡合,用以移動第二托盤107(亦即,托盤110)的搬送軌302。在本實施形態中,搬送軌302與搬送滾子303為功能作為用以搬送托盤110的搬送機構。又,在本實施形態中,如第3(b)圖所示地,搬送軌302卡合於搬送滾子303之際,從托盤設置面305朝著重力方向上側,且托盤設置面305位在平行於重力方向的狀態成為與第二托盤107的托盤設置面305相反側僅傾斜所定角度的狀態的方式,構成有搬送軌302及搬送滾子303。因此,在藉由托盤110的搬送基板102時,搬送機構是成為分別作成傾斜姿勢進行搬送第一托盤106,配置於該第一托盤106的基板102,及第二托盤107。As shown in Fig. 3(a), the second tray 107 is formed to hold the holding portion 304 for holding the first tray 106, and the first tray 106 is detachably formed on the tray setting surface 305 provided with the first tray 106. . Further, as described above, the second tray 107 is provided with a transport rail 302 that engages with the transport roller 303 to move the second tray 107 (that is, the tray 110). In the present embodiment, the transport rail 302 and the transport roller 303 function as a transport mechanism for transporting the tray 110. Further, in the present embodiment, as shown in FIG. 3(b), when the transport rail 302 is engaged with the transport roller 303, the tray installation surface 305 is directed upward in the gravity direction, and the tray installation surface 305 is located. The state parallel to the gravity direction is a state in which the opposite direction to the tray installation surface 305 of the second tray 107 is inclined only by a predetermined angle, and the conveyance rail 302 and the conveyance roller 303 are comprised. Therefore, when the substrate 102 is transported by the tray 110, the transport mechanism is configured to transport the first tray 106 in an inclined posture, the substrate 102 disposed on the first tray 106, and the second tray 107.

在本實施形態中,成為傾斜配置有托盤設置面305之故,圖面於第二托盤107設置第一托盤106之際使用保持部304僅將第一托盤106豎著放在第二托盤107,就可將第一托盤106設於第二托盤107。亦即,更簡便,更穩定地以傾斜的姿勢可搬送基板102。In the present embodiment, the tray setting surface 305 is disposed obliquely. When the first tray 106 is disposed on the second tray 107, only the first tray 106 is placed vertically on the second tray 107 by the holding portion 304. The first tray 106 can be placed on the second tray 107. That is, it is easier and more stable to transport the substrate 102 in an inclined posture.

又,在本實施形態中,針對於以傾斜姿勢進行搬送托盤110(亦即,基板102)的形態加以說明,惟作成垂直地豎立進行托盤110也可以。亦即,若將托盤設置面305(亦即,設置於第一托盤106的基板102)從水平地配置的狀態可確立豎立的狀態[包括托盤設置面305的面內方向對於水平方向位於垂直方向時,及托盤設置面305的面內方向對於該垂直方向傾斜時(縱型托盤)],作為第二托盤107也可適用任何構造。Further, in the present embodiment, the configuration in which the transport tray 110 (that is, the substrate 102) is carried in an inclined posture will be described, but the tray 110 may be vertically erected. That is, if the tray setting surface 305 (that is, the substrate 102 provided on the first tray 106) is horizontally disposed, the erected state can be established [including the in-plane direction of the tray setting surface 305 is perpendicular to the horizontal direction In the case where the in-plane direction of the tray setting surface 305 is inclined in the vertical direction (vertical tray), any configuration can be applied as the second tray 107.

又,在本實施形態中,托盤設置面305作成傾斜的方式設置第二托盤107,利用於該第二托盤107豎著放第一托盤106,俾將第一托盤106設置於第二托盤107,惟並不被限定於該方法。例如,於第一托盤106設置複數凸部(凹部),而於第二托盤107設置與該凸部(凹部)可嵌合的凹部(凸部),利用嵌合上述凸部與凹部,俾將第一托盤106作成設置於第二托盤107也可以。或是,使用螺釘及螺帽,俾將第一托盤106作成固定於第二托盤107也可以,如此地,在水平地配置的狀態豎立托盤設置面305的狀態下,若於該托盤設置面305可設置第一托盤106,則第一托盤106對於第二托盤107的設置機構是也可使用任何構造。Further, in the present embodiment, the tray setting surface 305 is provided with the second tray 107 in an inclined manner, and the first tray 106 is placed vertically by the second tray 107, and the first tray 106 is placed on the second tray 107. However, it is not limited to this method. For example, a plurality of convex portions (concave portions) are provided in the first tray 106, and concave portions (protrusions) engageable with the convex portions (concave portions) are provided in the second tray 107, and the convex portions and the concave portions are fitted by the fitting. The first tray 106 may be provided in the second tray 107. Alternatively, the first tray 106 may be fixed to the second tray 107 by using screws and nuts, and in the state where the tray setting surface 305 is erected in a horizontally disposed state, if the tray setting surface 305 is provided on the tray setting surface 305 The first tray 106 can be provided, and any configuration of the first tray 106 for the second tray 107 can be used.

以下,依據第2圖,第3(a)、(b)圖更詳述本實施形態的托盤式基板搬送系統。第2圖是本實施形態的第一托盤106的概略圖。又,第3(a)圖是針對於本實施形態的第一托盤106及第二托盤107的裝設前的一實施形態的概略側面圖,第3(b)圖是搬送基板時(裝設時),第一托盤106及第二托盤107的概略圖。Hereinafter, the tray type substrate transfer system of the present embodiment will be described in more detail with reference to Fig. 2 and Fig. 3(a) and Fig. 3(b). Fig. 2 is a schematic view of the first tray 106 of the embodiment. Further, Fig. 3(a) is a schematic side view showing an embodiment before the first tray 106 and the second tray 107 of the embodiment are mounted, and Fig. 3(b) is a view showing the case of transporting the substrate (installation) A schematic view of the first tray 106 and the second tray 107.

本實施形態的第一托盤106是例如在G6世代1800mm×1500mm尺寸以上的大型基板中,保持基板102而與第二托盤107一體化量,將基板102一面縱型地保持一面進行搬送及處理所用者。在本實施形態中,將基板102作為大型顯示用玻璃基板,而作為進行依濺鍍所致的成膜處理者。The first tray 106 of the present embodiment is used for transporting and processing the substrate 102 while holding the substrate 102 in a vertical direction, for example, in a large substrate of a size of 1800 mm × 1500 mm or more in the G6 generation. By. In the present embodiment, the substrate 102 is used as a glass substrate for large-scale display, and is used as a film formation process by sputtering.

首先,基板102是利用基板搬送機器人部103,被移載至水平地載置於平台105上的第一托盤106。如第3(b)圖所示地,基板102是作成稍傾斜於非處理面306(以下,指基板102的表面中,未施以處理的一側,或是若依濺鍍所致成膜處理則指未被成膜的基板102的背面側)側的姿勢。此時,使基板102穩定而被保持在第一托盤106的方式設有對於基板102給予壓力的給壓機構。作為給壓機構在本實施形態下,設有定位架202。具體地加以說明,於第一托盤106上設置作為複數支凸狀構件的基板保持針腳201,而作成將基板102以基板保持針腳201上支撐在非處理面306。基板保持針腳201是例如樹脂製。又,利用設置於第一托盤106的下部或側部的至少任何一方的定位架202,推壓基板102的端面而作成進行基板102的定位。First, the substrate 102 is transferred to the first tray 106 horizontally placed on the stage 105 by the substrate transfer robot unit 103. As shown in Fig. 3(b), the substrate 102 is formed to be slightly inclined to the non-treated surface 306 (hereinafter, referred to as the side of the substrate 102 where no treatment is applied, or if the film is formed by sputtering) The treatment refers to the posture on the side of the back side of the substrate 102 that is not formed. At this time, a pressure applying mechanism that applies pressure to the substrate 102 is provided in such a manner that the substrate 102 is stabilized and held in the first tray 106. In the present embodiment, a positioning frame 202 is provided as the pressure applying mechanism. Specifically, the substrate holding pins 201 as a plurality of convex members are provided on the first tray 106, and the substrate 102 is supported on the non-processing surface 306 by the substrate holding pins 201. The substrate holding stitch 201 is made of, for example, a resin. Further, the end surface of the substrate 102 is pressed by the positioning frame 202 provided on at least one of the lower portion or the side portion of the first tray 106 to position the substrate 102.

第5圖是作為本實施形態的給壓機構的一例子的定位架202的模式圖。Fig. 5 is a schematic view showing a positioning frame 202 as an example of the pressure applying mechanism of the embodiment.

在第5圖中,定位架202是設於比第一托盤106上的基板配置領域111還要外側,具有支撐板202a,例如具有彈簧等的彈性體202b,作為推壓部的樹脂202c,及把手202d。支撐板202a是被固定於第一托盤106上,而彈性體202b的一方端是被連接於該支撐板202a。彈性體202b的另一方端連接於樹脂202c,而該樹脂202c是對於第一托盤106未被固定,可滑動地構成在該第一托盤106上。因此,彈性體202b有變形時,藉由該彈性體202b的復原力,樹脂202c及該樹脂202c的端面202c是朝箭頭方向P可移動。又,在樹脂202c設有把手202d,使用者是利用該把手202d,朝箭頭方向P可變位樹脂202c及端面202e。如此地,作為給壓機構的定位架202是對於第一托盤106的外側(第5圖的箭號方向Q)及內側(第5圖的箭號方向R)可移動地構成有樹脂202c及端面202e,及利用樹脂202c(亦即,端面202e)構成可推壓基板102的端面102a。In FIG. 5, the positioning frame 202 is disposed outside the substrate arrangement area 111 on the first tray 106, and has a support plate 202a, for example, an elastic body 202b having a spring or the like, a resin 202c as a pressing portion, and Handle 202d. The support plate 202a is fixed to the first tray 106, and one end of the elastic body 202b is connected to the support plate 202a. The other end of the elastic body 202b is connected to the resin 202c, and the resin 202c is slidably formed on the first tray 106 without being fixed to the first tray 106. Therefore, when the elastic body 202b is deformed, the resin 202c and the end surface 202c of the resin 202c are movable in the arrow direction P by the restoring force of the elastic body 202b. Further, the resin 202c is provided with a handle 202d, and the user uses the handle 202d to position the resin 202c and the end surface 202e in the arrow direction P. In this manner, the positioning frame 202 as the pressure applying mechanism is configured to have the resin 202c and the end surface movably formed on the outer side (the arrow direction Q in FIG. 5) and the inner side (the arrow direction R in the fifth figure) of the first tray 106. 202e, and the resin 202c (that is, the end surface 202e) constitutes an end surface 102a on which the substrate 102 can be pressed.

在本實施形態中,於基板配置領域111配置有基板102之際,使彈性體202b成為縮小的狀態的方式,設置支撐板202a。因此,於基板配置領域111配置有基板102時,縮小彈性體202b作用成恢復成原來的復原力,樹脂202c(端面202e)是朝著第5圖的箭號方向R可推壓基板102的端面102a。如第2圖所示地,將一對定位架202利用該對設置成夾住基板配置領域,藉此對於基板102從相對的端面102c的兩側受到壓力。因此,定位架202是成為利用施加於端面102a的壓力來保持基板102。In the present embodiment, when the substrate 102 is placed on the substrate arrangement area 111, the support plate 202a is provided so that the elastic body 202b is in a reduced state. Therefore, when the substrate 102 is placed in the substrate arrangement area 111, the reduced elastic body 202b acts to restore the original restoring force, and the resin 202c (end surface 202e) pushes the end surface of the substrate 102 toward the arrow direction R of the fifth drawing. 102a. As shown in Fig. 2, the pair of positioning frames 202 are disposed to sandwich the substrate arrangement area by the pair, whereby the substrate 102 is subjected to pressure from both sides of the opposite end surface 102c. Therefore, the positioning frame 202 is to hold the substrate 102 by the pressure applied to the end surface 102a.

在此種構成中,於第一托盤106上設置基板102時,使用者是對於各定位架202的把手202d作用朝著箭頭方向Q的力量,則樹脂202c是成為沿著箭號方向Q移動,而在基板配置領域111與樹脂202之間形成有空間K。該空間K是成為利用依縮小的彈性體202b恢復成原來之際所作的復原力朝著樹脂202c的箭號方向R的移動而會消滅。亦即,樹脂202c的端面202e與基板配置領域111的端部111a一致時(亦即,如第5圖所示地,利用樹脂202c來保持基板102時),上述空間K是成為無,因此,如第6圖所示地,例如在基板102設置於第一托盤106時等,藉由朝著箭頭方向Q移動樹脂202c,僅上述空間K可設置容限於基板配置領域111。In such a configuration, when the substrate 102 is placed on the first tray 106, the user applies a force toward the arrow direction Q to the handle 202d of each of the positioning frames 202, and the resin 202c moves in the arrow direction Q. A space K is formed between the substrate arrangement area 111 and the resin 202. This space K is destroyed by the movement of the restoring force which is restored to the original by the reduced elastic body 202b toward the arrow direction R of the resin 202c. In other words, when the end surface 202e of the resin 202c coincides with the end portion 111a of the substrate arrangement area 111 (that is, when the substrate 102 is held by the resin 202c as shown in Fig. 5), the space K is not provided. As shown in FIG. 6, for example, when the substrate 102 is placed on the first tray 106, by moving the resin 202c in the arrow direction Q, only the space K can be set to be limited to the substrate arrangement area 111.

在本實施形態中,樹脂202c的端面202e位於基板配置領域111的端部111a時,基板102的端面102a也成為位於上述端部111a之故,因而基板102是成為正確地位於基板配置領域111上。因此,例如在表示於第6圖的狀態下將基板102設於第一托盤106時,端面102a位於空間K內的方式,即使將基板102裝載於基板保持針腳201上,也藉由縮小的彈性體202b的復原力朝著箭頭方向R移動樹脂202c,藉此使樹脂202c的端面202e與存在於空間K內的端面102a,又朝著箭頭方向R側移動該端面102a(亦即,基板102)。又,如第5圖所示地,當端面202e,端面102a與基板配置領域111的端部111a一致,則樹脂202c是靜止,而基板102是正確地被配置於基板配置領域111上。In the present embodiment, when the end surface 202e of the resin 202c is located at the end portion 111a of the substrate arrangement area 111, the end surface 102a of the substrate 102 is also located at the end portion 111a, so that the substrate 102 is correctly positioned on the substrate arrangement area 111. . Therefore, for example, when the substrate 102 is placed on the first tray 106 in the state shown in FIG. 6, the end surface 102a is located in the space K, and the substrate 102 is mounted on the substrate holding stitch 201, for example, by the reduced elasticity. The restoring force of the body 202b moves the resin 202c in the arrow direction R, whereby the end surface 202e of the resin 202c and the end surface 102a existing in the space K are moved toward the arrow direction R side toward the end surface 102a (that is, the substrate 102). . Further, as shown in Fig. 5, when the end surface 202e and the end surface 102a coincide with the end portion 111a of the substrate arrangement area 111, the resin 202c is stationary, and the substrate 102 is correctly placed on the substrate arrangement area 111.

如此地,在本實施形態中,即使未將基板102正確地裝載於基板配置領域111上,在樹脂202c恢復至原來的位置的過程中,也利用依縮小的彈性體202b的復原力所致的樹脂202c的移動,可將基板102自動地定位在正確的位置。亦即,接觸於基板102的端面102a的樹脂202c(端面202e)藉由將壓力給予該端面102a所產生的一連串動作,就可實現基板102的正確的定位,及保持該正確的位置的基板102。As described above, in the present embodiment, even if the substrate 102 is not accurately mounted on the substrate arrangement area 111, the restoring force of the reduced elastic body 202b is utilized in the process of returning the resin 202c to the original position. The movement of the resin 202c automatically positions the substrate 102 in the correct position. That is, the resin 202c (end surface 202e) contacting the end surface 102a of the substrate 102 can realize the correct positioning of the substrate 102 by a series of actions generated by applying pressure to the end surface 102a, and the substrate 102 holding the correct position. .

因此,即使將基板102以粗精度裝載於第一托盤106上,定位架202是也將基板102移動至該基板102須位置之領域(亦即,基板配置領域111),且在其位置對於基板102施加壓力而可保持該基板102。因此,即使基板搬送機器人部103對於第一托盤106的基板配置精度不高時,也可正確地配置基板102,並在配置於該正確的位置可保持基板102。Therefore, even if the substrate 102 is loaded on the first tray 106 with a high precision, the positioning frame 202 moves the substrate 102 to the field of the substrate 102 (that is, the substrate configuration field 111), and at the position of the substrate The substrate 102 can be held by applying pressure to 102. Therefore, even when the substrate transfer robot unit 103 does not have high substrate placement accuracy with respect to the first tray 106, the substrate 102 can be accurately placed, and the substrate 102 can be held at the correct position.

又,在本實施形態中,並不是如習知地利用嵌入將基板設於托盤的構成,而利用作為上述給壓機構的定位架202,將壓力施加於基板102的端面102a而作成保持基板102之故,因而第一托盤106是經常地穩定而可保持基板102。因此,例如加快托盤110的搬送速度,或是增加基板102的重量,即使增大施加於基板102的慣性,也可減低基板102的錯位或脫落。又,利用彈性體202b之存在可將樹脂202c的端面202e與基板102的端面102a的端面之界面沿著箭號方向P撓性地變位,因此,即使搬送中的托盤110的振動變大,藉由彈性體202b的變形也可緩和該振動,而可減低基板的破損。Further, in the present embodiment, the configuration in which the substrate is placed on the tray is not conventionally used, and the pressure is applied to the end surface 102a of the substrate 102 by the positioning frame 202 as the pressure applying mechanism to form the holding substrate 102. Therefore, the first tray 106 is thus constantly stable to hold the substrate 102. Therefore, for example, the transport speed of the tray 110 is increased, or the weight of the substrate 102 is increased, and even if the inertia applied to the substrate 102 is increased, the displacement or falling of the substrate 102 can be reduced. Moreover, the interface between the end surface 202e of the resin 202c and the end surface of the end surface 102a of the substrate 102 can be flexibly displaced in the arrow direction P by the presence of the elastic body 202b. Therefore, even if the vibration of the tray 110 during transportation becomes large, This vibration can also be alleviated by the deformation of the elastic body 202b, and the damage of the substrate can be reduced.

又,在本實施形態極重要的情形,為藉由給壓機構,將一旦配置於第一托盤106上的基板102正確地定位於基板配置領域111上,且在被定位於該基板配置領域111的基板102的端面102a給予所定壓力。若可發揮此種作用,則給壓機構是並不被限定於上述定位架202。例如,也可採用以電磁性驅動機構可將樹脂202c移動至定位架202的構成(例如,設置致動器等的驅動機構,而利用控制裝置來控制該驅動機構的構成等)。Further, in the case where it is extremely important in the present embodiment, the substrate 102 once disposed on the first tray 106 is correctly positioned on the substrate arrangement area 111 by the pressure applying mechanism, and is positioned in the substrate arrangement area 111. The end face 102a of the substrate 102 is given a predetermined pressure. If such an action is exerted, the pressure applying mechanism is not limited to the above-described positioning frame 202. For example, a configuration in which the resin 202c can be moved to the positioning frame 202 by an electromagnetic driving mechanism (for example, a driving mechanism such as an actuator is provided, and a configuration of the driving mechanism is controlled by a control device) may be employed.

基板保持針腳201是具有在接觸面積窄小的狀態下可保持基板102的功能,又,例如加熱基板102時,真空中的氣體放出較少者較佳。此時,基板保持針腳201是與基板102的接觸面積窄小,而被傳輸至第一托盤106的熱量流失較少之故,因而可提昇基板加熱的均勻性。The substrate holding stitch 201 has a function of holding the substrate 102 in a state where the contact area is narrow. Further, for example, when the substrate 102 is heated, it is preferable that the gas in the vacuum is released less. At this time, the substrate holding stitch 201 has a narrow contact area with the substrate 102, and the heat transferred to the first tray 106 is less lost, so that the uniformity of heating of the substrate can be improved.

對於基板102之加熱,是從基板102的處理面側,或是從基板102的非處理面306側也可以,而從非處理面306側以未圖示的加熱手段進行加熱基板106時,如圖示於第2圖地,在第一托盤106,形成有開口部210較佳。The heating of the substrate 102 may be from the processing surface side of the substrate 102 or from the non-processing surface 306 side of the substrate 102, and when the substrate 106 is heated from a non-processing surface 306 side by a heating means (not shown), As shown in Fig. 2, it is preferable that the opening portion 210 is formed in the first tray 106.

又,作為形成與基板102接觸的基板保持針腳201的樹脂,例如可使用聚醚醚酮(polyether ether ketone:PEEK)樹脂,聚醯亞胺(polyimide:PI)樹脂等的耐熱性,耐藥品性高的樹脂。Further, as the resin for forming the substrate holding stitch 201 that is in contact with the substrate 102, for example, polyether ether ketone (PEEK) resin, heat resistance of a polyimide (polyimide: PI) resin, or the like can be used. High resin.

又,基板保持針腳201的形狀是例如考量為高度1cm,直徑2cm的圓柱狀者,惟並不被限定於此者。作為配置於第一托盤106上的個數,通常為支撐基板102的四個角為4支以上,惟藉由被處理的基板102的大小等在搬送等不會產生障礙的個數被決定。Further, the shape of the substrate holding stitch 201 is, for example, a cylindrical shape having a height of 1 cm and a diameter of 2 cm, but is not limited thereto. The number of the four substrates to be placed on the first tray 106 is usually four or more, and the number of the substrates 102 to be processed is determined by the number of substrates to be processed, and the like.

在本實施形態中,如上述地,在第2圖中,上述定位架202是與定位之同時對於基板102的端面102a,給予不會產生變形程度的壓力,而基板102對於第一托盤106移載時的基板搬送機器人部103的要求精度被緩和,而且對於依搬送時的振動所致的基板102可恢復成所定的初期位置。In the present embodiment, as described above, in the second drawing, the positioning frame 202 is given a pressure which does not cause deformation to the end surface 102a of the substrate 102 while being positioned, and the substrate 102 is moved to the first tray 106. The required accuracy of the substrate transfer robot unit 103 at the time of loading is alleviated, and the substrate 102 due to the vibration at the time of transport can be restored to a predetermined initial position.

又,定位架202是在與基板102的端面102a的接觸部分使用樹脂202c,還有搭配彈性體202b而對於基板102給予壓力,並不是完全地進行固定之故,因而成為可抑制依搬送時的振動等所致的基板102的損傷之情形。Further, the positioning frame 202 uses the resin 202c at the portion in contact with the end surface 102a of the substrate 102, and also applies pressure to the substrate 102 in conjunction with the elastic body 202b, and is not completely fixed. Therefore, it is possible to suppress the conveyance. The damage of the substrate 102 due to vibration or the like.

又,第一托盤106是具備抑制依搬送時的振動所致的基板102對於處理面方向的變位的基板變位防止板203也可以。藉由該基板變位防止板203,來押制搬送中的基板102對於處理面方向的變位,俾抑制基板102的破損、脫落。In addition, the first tray 106 may include a substrate displacement preventing plate 203 that suppresses displacement of the substrate 102 in the processing plane direction due to vibration during transportation. By the substrate displacement preventing plate 203, the substrate 102 being conveyed is displaced in the direction of the processing surface, and the substrate 102 is prevented from being damaged or peeled off.

又,基板變位防止板203是也可同時地減輕藉由基板102的變位所發生的與第一托盤106之摩擦,成為可抑制對成膜後的品質給予影響的粒子之發生。Further, the substrate displacement preventing plate 203 can simultaneously reduce the friction with the first tray 106 caused by the displacement of the substrate 102, and can suppress the occurrence of particles that affect the quality after film formation.

基板變位防止板203是以樹脂所形成,設置複數個第一托盤106上,且基板102與基板變位防止板203是設置些微間隙而以非接觸狀態被設置。因此,發生依搬送時的振動所致的變位時,與基板102以面接觸而可抑制變位。The substrate displacement preventing plate 203 is formed of a resin, and a plurality of first trays 106 are provided, and the substrate 102 and the substrate displacement preventing plate 203 are provided with a slight gap and are disposed in a non-contact state. Therefore, when displacement due to vibration at the time of conveyance occurs, the substrate 102 is brought into surface contact to suppress displacement.

又,基板變位防止板203是為了基板102的裝設及裝卸,具備朝基板102的處理面方向開閉的構造(未圖示)。Further, the substrate displacement preventing plate 203 is provided with a structure (not shown) that opens and closes toward the processing surface of the substrate 102 for mounting and attaching and detaching the substrate 102.

還有,第一托盤106是具備抑制依搬送時的振動所致的基板102對於非處理面方向的振動的基板變位防止桿204也可以。In addition, the first tray 106 may include a substrate displacement preventing lever 204 that suppresses vibration of the substrate 102 in the non-processed surface direction due to vibration during transportation.

基板變位防止桿204是以彎曲於第一托盤106的構造具備複數支,且在與基板102接觸的部分具備複數個樹脂製基板支撐部205。藉由此種基板變位防止桿204及基板維持部205,可抑制在大型處理基板所發生的基板中央部對於非處理面方向的彎曲,而可抑制基板102的脫落及破損。The substrate displacement preventing lever 204 has a plurality of branches that are bent in the first tray 106, and a plurality of resin substrate supporting portions 205 are provided in a portion in contact with the substrate 102. By the substrate displacement preventing lever 204 and the substrate holding portion 205, it is possible to suppress the bending of the substrate 102 in the direction of the non-processed surface in the central portion of the substrate which is generated by the large-sized processing substrate, and it is possible to suppress the falling and breakage of the substrate 102.

如上述地,在本實施形態中,推壓部朝著第一托盤106的內側及外側可移動,且可推壓基板102的端面102a所構成的定位架202是擔負正確地定位基板102的功能,及保持基板的功能。因此,即使基板搬送機器人部103未將基板102正確地配置在須設置第一托盤106的領域(基板配置領域111),也可藉由定位架202將該基板102位於基板配置領域111上。As described above, in the present embodiment, the pressing portion is movable toward the inside and the outside of the first tray 106, and the positioning frame 202 formed by pressing the end surface 102a of the substrate 102 is capable of properly positioning the substrate 102. And maintain the function of the substrate. Therefore, even if the substrate transfer robot unit 103 does not correctly arrange the substrate 102 in the field in which the first tray 106 is to be provided (substrate arrangement area 111), the substrate 102 can be placed on the substrate arrangement area 111 by the positioning frame 202.

又,從水平地配置托盤的狀態以豎立狀態,欲將基板配置於托盤時,藉由基板搬送機器人部103,必須將基板以垂直地保持的狀態設置於托盤。因此,即使在本說明使用定位架202,欲將基板正確地配置也有困難的情形。In addition, when the substrate is placed in the tray in a state where the tray is horizontally placed, when the substrate is to be placed on the tray, the substrate transport robot 103 needs to be placed on the tray in a state of being vertically held. Therefore, even if the positioning frame 202 is used in the present description, it is difficult to properly arrange the substrate.

對此,在本實施形態中,使用與搬送機構連接的第二托盤107,及與該第二托盤107可裝卸的第一托盤106,而將該第二托盤107以豎立基板的狀態予以保持的方式作成與搬送機構相關聯之狀態。因此,在配置基板時可將第一托盤106從與搬送機構卡合的第二托盤107加以分離。因此,配置基板102之際,水平地可配置第一托盤106,而藉由基板搬送機器人部103對於第一托盤106簡單地可配置基板102。又,與第一托盤106可裝卸的第二托盤107是將第一托盤106從水平保持在豎立的狀態下事先有關聯於搬送機構之故,因而將第一托盤106僅裝設於第二托盤107就可以以傾斜姿勢或垂直姿勢來搬送基板102。亦即,即使基板配置至第一托盤106時,也將與第一托盤106不相同的第二托盤107,從水平地配置托盤配置面305的狀態維持豎立的狀態的方式,被連結於搬送機構,因此,每當配置基板至托盤時,並不需要基板以所期望的角度豎立的方式將托盤連結於搬送機構。On the other hand, in the present embodiment, the second tray 107 connected to the transport mechanism and the first tray 106 detachably attached to the second tray 107 are used, and the second tray 107 is held in a state of being erected on the substrate. The mode is made in association with the transport mechanism. Therefore, the first tray 106 can be separated from the second tray 107 engaged with the transport mechanism when the substrate is placed. Therefore, when the substrate 102 is placed, the first tray 106 can be horizontally disposed, and the substrate transfer robot portion 103 can simply arrange the substrate 102 for the first tray 106. Moreover, the second tray 107 detachably attached to the first tray 106 is associated with the transport mechanism in advance in a state in which the first tray 106 is held horizontally, and thus the first tray 106 is attached only to the second tray. The substrate 102 can be transported in an inclined posture or a vertical posture. In other words, even when the substrate is placed on the first tray 106, the second tray 107 that is different from the first tray 106 is connected to the transport mechanism so that the state in which the tray arrangement surface 305 is horizontally placed is maintained in an upright state. Therefore, whenever the substrate is placed on the tray, the tray is not required to be attached to the transport mechanism at a desired angle.

如此地,在本實施形態中,將托盤分離成也可作成水平地設置基板的第1功能,及豎立地保持基板所用的第2功能,針對於第1功能作成利用第一托盤106就可實現,而針對於第2功能作成利用第二托盤107來實現。As described above, in the present embodiment, the tray is separated into a first function for horizontally providing the substrate, and a second function for holding the substrate upright, and the first function can be realized by using the first tray 106 for the first function. The second function is created for the second function by using the second tray 107.

(實施例)(Example)

在730mm×920mm大小的基板,使用在第1圖、第2圖、第3圖、第5圖及第6圖進行說明的本發明的一實施形態的基板處理裝置,而作為成膜方法的一例子,在以下條件的範圍內進行製作顯示用元件的ITO透明導電膜。In the substrate of 730 mm × 920 mm, the substrate processing apparatus according to the embodiment of the present invention described in FIG. 1 , FIG. 2 , FIG. 3 , FIG. 5 , and FIG. 6 is used as a film forming method. As an example, an ITO transparent conductive film for producing a display element was produced within the following conditions.

又,成膜處理是藉由分別使用磁控方式的陰極的濺鍍進行濺鍍,而在任何條件的範圍內,作為電子裝置都可得到良好的特性。Further, the film formation treatment is performed by sputtering using a magnetron-type cathode, and excellent characteristics can be obtained as an electronic device within any range of conditions.

‧壓力:0.3~0.7[Pa]‧ Pressure: 0.3 to 0.7 [Pa]

‧電力:36[kW]‧Electricity: 36[kW]

‧基板溫度:室溫~120[℃]‧ substrate temperature: room temperature ~ 120 [°C]

又,作為電子裝置的製造方法的一例子,列舉有上述顯示用元件的製造方法,惟針對於上述成膜方法的部分以外,利用一般方法就可加以製造。Moreover, as an example of the manufacturing method of the electronic device, the manufacturing method of the above-mentioned display element is mentioned, but it can manufacture by the normal method with respect to the part of the above-mentioned film-forming method.

以上,參照所附圖式來說明本發明的較佳實施形態,實施例,惟本發明是並不被限定於該實施形態,實施例者,在由申請專利範圍所述所把握的技術性範圍內可變更成各種形態。The preferred embodiments of the present invention have been described above with reference to the accompanying drawings, but the present invention is not limited to the embodiments, and the technical scope as defined in the claims It can be changed into various forms.

101...晶盒部101. . . Crystal box

102...基板102. . . Substrate

103...基板搬送機器人部103. . . Substrate transfer robot

104...閘閥104. . . gate

105...平台105. . . platform

106...第一托盤106. . . First tray

107...第二托盤107. . . Second tray

108...真空隔絕腔108. . . Vacuum isolation chamber

109...製程腔109. . . Process chamber

110...托盤110. . . tray

111...基板配置領域111. . . Substrate configuration field

201...基板保持針腳201. . . Substrate hold pin

202...定位架202. . . Positioning frame

202a...支撐板202a. . . Support plate

202b...彈性體202b. . . Elastomer

202c...樹脂202c. . . Resin

202d...把手202d. . . handle

202e...端面202e. . . End face

203...基板變位防止板203. . . Substrate displacement preventing plate

204...基板變位防止桿204. . . Substrate displacement preventing rod

205...基板維持部205. . . Substrate maintenance unit

302...搬送軌302. . . Transport rail

303...搬送滾子303. . . Transport roller

304...保持部304. . . Holding department

305...托盤設置面305. . . Tray setting surface

306...非處理面306. . . Non-processing surface

402...基板402. . . Substrate

404...閘閥404. . . gate

406...托盤406. . . tray

408...真空隔絕腔408. . . Vacuum isolation chamber

409...製程腔409. . . Process chamber

第1圖是表示本發明的一實施形態的基板搬送系統及基板處理裝置的概略圖。Fig. 1 is a schematic view showing a substrate transfer system and a substrate processing apparatus according to an embodiment of the present invention.

第2圖是本發明的一實施形態的托盤的概略圖。Fig. 2 is a schematic view of a tray according to an embodiment of the present invention.

第3圖是本發明的一實施形態的托盤的概略圖,(a)是表示第一托盤與第二托盤的分離的狀態的圖式,(b)是表示一體化第一托盤與第二托盤的狀態的圖式。Fig. 3 is a schematic view of a tray according to an embodiment of the present invention, wherein (a) is a view showing a state in which the first tray and the second tray are separated, and (b) is a view showing the integrated first tray and the second tray. The schema of the state.

第4圖是表示作為習知的代表性的基板處理技術的一例子,豎立基板進行搬送的縱型搬送的線內型基板處理裝置的概略機構的圖式。Fig. 4 is a view showing a schematic mechanism of an in-line type substrate processing apparatus for vertically transporting a substrate by an example of a typical substrate processing technique.

第5圖是本發明的一實施形態的給壓機構的模式圖。Fig. 5 is a schematic view showing a pressure applying mechanism according to an embodiment of the present invention.

第6圖是說明本發明的一實施形態的基板設於第一托盤所用的圖式Figure 6 is a view for explaining a pattern in which a substrate is provided on a first tray according to an embodiment of the present invention.

101...晶盒部101. . . Crystal box

102...基板102. . . Substrate

103...基板搬送機器人部103. . . Substrate transfer robot

104...閘閥104. . . gate

105...平台105. . . platform

106...第一托盤106. . . First tray

107...第二托盤107. . . Second tray

108...真空隔絕腔108. . . Vacuum isolation chamber

109...製程腔109. . . Process chamber

Claims (5)

一種托盤式基板搬送系統,是使用托盤進行搬送基板的托盤式基板搬送系統,其特徵為:具備:可裝載上述基板的第一托盤;及於上述第一托盤裝載有上述基板之際,於該基板的端面給予壓力而於上述第一托盤保持該基板的給壓機構;及上述第一托盤被裝卸的第二托盤;及從水平地配置被裝載於上述第一托盤的基板的狀態以豎立的狀態進行搬送裝設有上述第一托盤的上述第二托盤的搬送機構。A tray type substrate transport system is a tray type substrate transport system that transports a substrate using a tray, and includes: a first tray on which the substrate can be mounted; and a first tray on which the substrate is loaded a pressure feeding mechanism that holds the pressure on the end surface of the substrate and holds the substrate in the first tray; and a second tray on which the first tray is detached; and a state in which the substrate mounted on the first tray is horizontally arranged to be erected In the state, the transport mechanism of the second tray of the first tray is transported. 一種基板處理裝置,其特徵為:具備申請專利範圍第1項所述的托盤式基板搬送系統。A substrate processing apparatus comprising the tray substrate transfer system according to claim 1 of the patent application. 一種成膜方法,其特徵為:具有:於第一托盤裝載基板的步驟;及於被裝載於上述第一托盤的上述基板的端面給予壓力而於該第一托盤保持上述基板的步驟;及將保持上述基板的第一托盤裝設於第二托盤的步驟;及從水平地配置被保持於上述第一托盤的基板的狀態以豎立狀態搬送裝設有上述第一托盤的上述第二托盤至腔內的步驟;及在上述腔內,利用上述第二托盤被搬送,對於被保持在與該第二托盤一體化的上述第一托盤的基板,施以所定處理的步驟。A film forming method comprising: a step of loading a substrate on a first tray; and a step of applying pressure to an end surface of the substrate loaded on the first tray to hold the substrate in the first tray; and a step of holding the first tray of the substrate on the second tray; and transporting the second tray to the chamber in which the first tray is mounted in an upright state from a state in which the substrate held by the first tray is horizontally disposed And a step of performing a predetermined process on the substrate held by the first tray integrated with the second tray in the chamber by the second tray being conveyed. 一種電子裝置的製造方法,其特徵為:包括申請專利範圍第3項所述的成膜方法。A method of manufacturing an electronic device, comprising: the film forming method according to claim 3 of the patent application. 一種托盤,是保持基板而用以搬送的托盤,其特徵為:具備:可裝載基板的第一托盤;及設於上述第一托盤,在上述基板被裝載於該第一托盤之際具有與該基板的端面接觸的面的給壓機構,藉由該面將壓力給予上述基板的端面的方式所構成,且上述面可變位地構成於上述第一托盤的內側及外側的給壓機構;及可裝卸地構成上述第一托盤的第二托盤。A tray for holding a substrate and transporting the tray, comprising: a first tray on which a substrate can be loaded; and a first tray provided on the first tray, wherein the substrate is mounted on the first tray a pressure applying mechanism for a surface on which the end surface of the substrate contacts; the pressure is applied to the end surface of the substrate by the surface, and the surface is variably formed on the inner side and the outer side of the first tray; and The second tray of the first tray is detachably constructed.
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KR102006874B1 (en) 2011-11-30 2019-08-05 삼성디스플레이 주식회사 A tray for flat display panel
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Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4059549B2 (en) * 1997-09-20 2008-03-12 キヤノンアネルバ株式会社 Substrate support device
JP3629371B2 (en) * 1998-10-29 2005-03-16 シャープ株式会社 Film forming apparatus and film forming method
JP3913038B2 (en) * 2001-10-31 2007-05-09 三菱重工業株式会社 Substrate transfer cart and substrate transfer system
JP4306322B2 (en) * 2003-05-02 2009-07-29 株式会社Ihi Substrate transfer device for thin film forming equipment
JP4471708B2 (en) * 2004-03-31 2010-06-02 キヤノンアネルバ株式会社 Substrate transfer device
JP4456974B2 (en) * 2004-10-14 2010-04-28 株式会社アルバック Vacuum processing equipment
KR200375426Y1 (en) 2004-11-16 2005-03-09 대영산업주식회사 Apparatus for compensating gap of plate in tailor welded blank system
KR100583522B1 (en) * 2005-01-05 2006-05-25 삼성에스디아이 주식회사 Holding tray for substrate, substrate alignment system using the same and method thereof
JP5145640B2 (en) * 2006-02-03 2013-02-20 大日本印刷株式会社 Substrate holder and film forming apparatus
JP5028837B2 (en) * 2006-03-29 2012-09-19 大日本印刷株式会社 Substrate holder and film forming apparatus
US8128793B2 (en) * 2006-04-19 2012-03-06 Ulvac, Inc. Vertical substrate transfer apparatus and film-forming apparatus
KR100866645B1 (en) 2007-03-30 2008-11-03 미래산업 주식회사 A test handler and a method for transferring a test tray thereof
CN101641272B (en) * 2007-04-16 2011-11-16 株式会社爱发科 Conveyor, and film-forming apparatus and maintenance method thereof
JP2010103226A (en) * 2008-10-22 2010-05-06 Ulvac Japan Ltd Carrier and substrate carrier device
KR100935616B1 (en) 2009-04-30 2010-01-07 유진디스컴 주식회사 Automated lcm assembly apparatus

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TW201203431A (en) 2012-01-16
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KR101221527B1 (en) 2013-01-11
JP5731838B2 (en) 2015-06-10

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