TWI412619B - A Bi-Ge-O sintered body sputtering target, a method for manufacturing the same, and an optical recording medium - Google Patents

A Bi-Ge-O sintered body sputtering target, a method for manufacturing the same, and an optical recording medium Download PDF

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TWI412619B
TWI412619B TW99134164A TW99134164A TWI412619B TW I412619 B TWI412619 B TW I412619B TW 99134164 A TW99134164 A TW 99134164A TW 99134164 A TW99134164 A TW 99134164A TW I412619 B TWI412619 B TW I412619B
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geo
target
powder
sintered body
recording medium
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TW201142058A (en
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Atsushi Nara
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Jx Nippon Mining & Metals Corp
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
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    • C04B35/453Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
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    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
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    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
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    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3298Bismuth oxides, bismuthates or oxide forming salts thereof, e.g. zinc bismuthate
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    • G11B2007/24302Metals or metalloids
    • G11B2007/24312Metals or metalloids group 14 elements (e.g. Si, Ge, Sn)
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    • G11B2007/24302Metals or metalloids
    • G11B2007/24314Metals or metalloids group 15 elements (e.g. Sb, Bi)
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    • G11B2007/2432Oxygen
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    • G11B7/004Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/0045Recording
    • G11B7/00451Recording involving ablation of the recording layer
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Abstract

Provided are: a sintered target comprising bismuth (Bi), germanium (Ge), and oxygen (O); a manufacturing method therefor; and an optical recording medium. Said Bi-Ge-O sintered sputtering target is characterized in that the relationship between the number of bismuth atoms and the number of germanium atoms satisfies the relation 0.57 < (Bi/(Bi+Ge)) 12GeO20, Bi4Ge3O12, and GeO2. The provided target does not crack upon sputtering, generates few particulates, allows fabrication of stably high-quality thin films, and makes it possible to obtain an optical recording medium with no errors in recorded bits.

Description

Bi-Ge-O系燒結體濺鍍靶及其製造方法以及光記錄媒體Bi-Ge-O sintered body sputtering target, manufacturing method thereof and optical recording medium

本發明係關於一種Bi-Ge-O系燒結體濺鍍靶及該靶之製造方法以及光記錄媒體,特別係關於在濺鍍時不會產生靶之裂縫,粒子(particle)之產生少,可穩定地製作高品質之薄膜,且可獲得不會產生記錄位元誤碼之光記錄媒體的Bi-Ge-O系燒結體濺鍍靶及該靶之製造方法以及光記錄媒體。The present invention relates to a Bi-Ge-O sintered body sputtering target, a method for producing the same, and an optical recording medium, and particularly relates to a crack that does not occur at the time of sputtering, and the generation of particles is small. A Bi-Ge-O sintered sputtering target which can stably produce a high-quality film and obtain an optical recording medium which does not cause recording bit error, a method for producing the target, and an optical recording medium.

追記型(WORM,Write Once Read Many)光記錄媒體,係即便是藍色波長區域(350~500nm)之雷射光亦可進行高密度之記錄之光記錄媒體,特別係具有高記錄感度且具有多層記錄層之光記錄媒體。The WORM (Write Once Read Many) optical recording medium is an optical recording medium capable of high-density recording even in laser light of a blue wavelength region (350 to 500 nm), particularly having high recording sensitivity and having multiple layers. An optical recording medium of the recording layer.

光碟為了因應高密度化之要求,正在藉由多層化來實現高密度化。於使用藍色LD之光碟中亦同樣地正在進行高密度記錄用之光記錄媒體之開發。In order to meet the demand for higher density, the optical disc is being made denser by multi-layering. The development of an optical recording medium for high-density recording is also being carried out in a disc using a blue LD.

為了實現可高密度多層記錄之追記型光記錄媒體,具有穩定之組成、構造之材料自不必言,而且亦需要透光特性優異之膜,此種材料多為氧化物,一般由於熔點高,因而較多使用濺鍍法作為成膜法。In order to realize a recordable optical recording medium capable of high-density multilayer recording, a material having a stable composition and structure is not necessary, and a film having excellent light transmission characteristics is also required, and such a material is mostly an oxide, and generally has a high melting point. Sputtering is often used as a film forming method.

因此,需要適於獲得此種膜之濺鍍靶。然而,由於構成靶之化合物之形態、構造等,亦會對濺鍍特性造成影響,因此於將構成靶之化合物作為適於所需之膜之特性者時,存在是否可穩定地進行良好之濺鍍之問題。Therefore, there is a need for a sputtering target suitable for obtaining such a film. However, since the form, structure, and the like of the compound constituting the target also affect the sputtering characteristics, it is possible to stably perform good sputtering when the compound constituting the target is made to be suitable for the characteristics of the desired film. Plating problem.

於使用濺鍍法將光記錄媒體用薄膜形成在基板之情形時,有時會因靶材料,造成粒子的發生變多,而使品質降低。特別是於高記錄密度媒體中,由粒子等所導致之記錄位元誤碼是嚴重的問題。因此原因成為不合格品,而發生良率降低之問題。When a film for an optical recording medium is formed on a substrate by a sputtering method, the occurrence of particles may increase due to the target material, and the quality may be degraded. Especially in high recording density media, recording bit errors caused by particles or the like are a serious problem. Therefore, the cause becomes a defective product, and the problem of a decrease in yield occurs.

先前,所提出之光記錄媒體,提出有多種材料。例如專利文獻1中記載有一種光記錄媒體,其係於基板上至少形成有記錄層者,記錄層之構成元素之主成分為Bi及O(氧),含有B,並且含有選自Ge、Li、Sn、Cu、Fe、Pd、Zn、Mg、Nd、Mn、Ni中之至少一種元素X。Previously, the proposed optical recording medium was proposed with a variety of materials. For example, Patent Document 1 discloses an optical recording medium in which at least a recording layer is formed on a substrate, and main components of constituent elements of the recording layer are Bi and O (oxygen), contain B, and contain Ge and Li selected from the group consisting of Ge and Li. At least one element X of Sn, Cu, Fe, Pd, Zn, Mg, Nd, Mn, Ni.

又,專利文獻2中記載有一種追記型光記錄媒體,其特徵在於:記錄層含有Bi、M(M為Mg、Al、Cr、Mn、Co、Fe、Cu、Zn、Li、Si、Ge、Zr、Ti、Hf、Sn、Mo、V、Nb、Y、Ta中之至少一種元素)及氧,記錄有資訊之記錄標記部包含該記錄層所含有之元素之結晶及/或該等元素之氧化物之結晶。Further, Patent Document 2 describes a write-once optical recording medium characterized in that the recording layer contains Bi and M (M is Mg, Al, Cr, Mn, Co, Fe, Cu, Zn, Li, Si, Ge, And at least one of Zr, Ti, Hf, Sn, Mo, V, Nb, Y, and Ta) and oxygen, and the recording mark portion on which the information is recorded includes crystals of the elements contained in the recording layer and/or the elements Crystallization of oxides.

此外,亦提出有專利文獻3~專利文獻8。於該等之中,考慮有由鉍(Bi)、鍺(Ge)、氧(O)構成之光記錄媒體之組合,又,亦記載有藉由燒結體靶之濺鍍,形成該等光記錄媒體。然而,所謂該Bi-Ge-O系燒結體濺鍍靶,存在如下之問題:熱衝擊弱,以高功率進行濺鍍時常會產生裂縫、龜裂,因此而導致粒子的發生,損害記錄膜等之品質。Further, Patent Document 3 to Patent Document 8 have also been proposed. Among these, a combination of an optical recording medium composed of bismuth (Bi), germanium (Ge), and oxygen (O) is also considered, and it is also described that the optical recording is formed by sputtering of a sintered target. media. However, the Bi-Ge-O sintered body sputtering target has a problem that the thermal shock is weak, and cracks and cracks are often generated when sputtering is performed at high power, thereby causing generation of particles and impairing the recording film. Quality.

專利文獻1:日本特開2008-210492號公報Patent Document 1: Japanese Laid-Open Patent Publication No. 2008-210492

專利文獻2:日本特開2006-116948號公報Patent Document 2: Japanese Laid-Open Patent Publication No. 2006-116948

專利文獻3:日本特開2003-48375號公報Patent Document 3: Japanese Patent Laid-Open Publication No. 2003-48375

專利文獻4:日本特開2005-161831號公報Patent Document 4: Japanese Laid-Open Patent Publication No. 2005-161831

專利文獻5:日本特開2005-108396號公報Patent Document 5: Japanese Laid-Open Patent Publication No. 2005-108396

專利文獻6:日本特開2007-169779號公報Patent Document 6: Japanese Laid-Open Patent Publication No. 2007-169779

專利文獻7:日本特開2008-273167號公報Patent Document 7: Japanese Laid-Open Patent Publication No. 2008-273167

專利文獻8:日本第4271063號公報Patent Document 8: Japanese Patent No. 4271063

本發明之課題,係關於一種Bi-Ge-O系燒結體濺鍍靶及該靶之製造方法以及光記錄媒體,特別是提供一種於濺鍍時不會產生靶之裂縫、粒子之產生少、可穩定地製作高品質之薄膜、且可獲得不會產生記錄位元誤碼之光記錄媒體的Bi-Ge-O系燒結體濺鍍靶及該靶之製造方法以及光記錄媒體。An object of the present invention is to provide a Bi-Ge-O sintered body sputtering target, a method for producing the same, and an optical recording medium, and more particularly to provide a crack that does not cause a target during sputtering, and which generates less particles. A Bi-Ge-O sintered sputtering target which can stably produce a high-quality thin film and which can produce an optical recording medium in which recording bit errors are not generated, a method for producing the target, and an optical recording medium can be obtained.

為了解決上述課題,本發明人等進行潛心研究的結果,得到如下之知識見解:可選擇適當組成之Bi-Ge-O系燒結體來控制結晶相,抑制靶之熱衝擊而防止靶之裂縫,而可在濺鍍時有效地抑制粒子之產生。In order to solve the problem, the present inventors have conducted intensive studies and obtained the following knowledge: a Bi-Ge-O sintered body having an appropriate composition can be selected to control the crystal phase, and the thermal shock of the target can be suppressed to prevent the crack of the target. It can effectively suppress the generation of particles during sputtering.

根據該知識見解,本發明提供:Based on this knowledge, the present invention provides:

1)一種Bi-Ge-O系燒結體濺鍍靶,係由鉍(Bi)、鍺(Ge)、氧(O)所構成,其特徵在於:Bi與Ge之原子數比為0.57<(Bi/(Bi+Ge))<0.92,含有Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相作為結晶相;1) A Bi-Ge-O based sintered body sputtering target comprising bismuth (Bi), germanium (Ge), and oxygen (O), characterized in that the atomic ratio of Bi to Ge is 0.57 < (Bi) /(Bi+Ge))<0.92, containing three phases of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 , and GeO 2 as a crystal phase;

2)如上述1)之燒結體濺鍍靶,其中,對靶施加200℃、30分鐘加熱之熱衝擊時,該熱衝擊前後之平均彎曲強度降低率為50%以下;2) The sintered body sputtering target according to the above 1), wherein, when a thermal shock of heating at 200 ° C for 30 minutes is applied to the target, the average bending strength reduction rate before and after the thermal shock is 50% or less;

3)一種光記錄媒體,其係使用上述1)或2)之靶進行濺鍍而形成。3) An optical recording medium formed by sputtering using the target of the above 1) or 2).

又,本發明提供:Also, the present invention provides:

4)一種Bi-Ge-O系燒結體濺鍍靶之製造方法,其特徵在於:將GeO2 粉0.03~89mol%、Bi12 GeO20 粉11~99.97mol%作為起始原料,以Bi與Ge之原子數比成為0.57<(Bi/(Bi+Ge))<0.92之方式混合該等原料之後,於600~840℃、加壓力150~400kg/cm2 下熱壓,藉此製作含有Bi12 GeO20 、Bi4 Ge3 O12 及GeO2 之3相之結晶相的燒結體;4) A Bi-GeO based sintered body sputtering target manufacturing method of plating, comprising: a GeO 2 powder 0.03 ~ 89mol%, Bi 12 GeO 20 11 ~ 99.97mol% powder as a starting material containing Bi and Ge After mixing the raw materials so that the atomic ratio is 0.57 < (Bi / (Bi + Ge)) < 0.92, the raw materials are hot-pressed at 600 to 840 ° C and a pressure of 150 to 400 kg / cm 2 to prepare Bi 12 . a sintered body of a crystal phase of three phases of GeO 20 , Bi 4 Ge 3 O 12 and GeO 2 ;

5)如上述4)之Bi-Ge-O系燒結體濺鍍靶之製造方法,其中,混合GeO2 粉14.3mol%與Bi2 O3 粉85.7mol%之後,進行固相反應而製作Bi12 GeO20 粉末;(5) The method for producing a Bi-Ge-O sintered body sputtering target according to the above 4), wherein the FeO 2 powder is mixed with 14.3 mol% and the Bi 2 O 3 powder is 85.7 mol%, and then a solid phase reaction is carried out to prepare Bi 12 . GeO 20 powder;

6)如上述4)或5)之Bi-Ge-O系燒結體濺鍍靶之製造方法,其中,使用平均結晶粒徑為10~50μm之氧化鍺之燒結原料粉末進行燒結。(6) The method for producing a Bi-Ge-O sintered body sputtering target according to the above 4) or 5), wherein the sintering raw material powder having a cerium oxide having an average crystal grain size of 10 to 50 μm is sintered.

本發明之Bi-Ge-O系燒結體濺鍍靶具有如下優異之效果:於濺鍍時不會產生靶之裂縫,粒子之產生少,可穩定地製作高品質之薄膜,且可獲得不會產生記錄位元誤碼之光記錄媒體。The Bi-Ge-O sintered body sputtering target of the present invention has an excellent effect of not causing cracks in the target during sputtering, and there is little generation of particles, and a high-quality film can be stably produced, and it is not obtained. An optical recording medium that records bit error is generated.

本發明之Bi-Ge-O系燒結體濺鍍靶係由鉍(Bi)、鍺(Ge)、氧(O)構成,其特徵在於:Bi與Ge之原子數比為0.57<(Bi/(Bi+Ge))<0.92,含有Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相作為結晶相。利用該組成之記錄膜為可藉由多層化達成高密度記錄之較佳組成,可穩定地進行良好之濺鍍成膜。The Bi-Ge-O sintered body sputtering target of the present invention is composed of bismuth (Bi), germanium (Ge), and oxygen (O), and is characterized in that the atomic ratio of Bi to Ge is 0.57 < (Bi/( Bi+Ge))<0.92, containing three phases of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 and GeO 2 as a crystal phase. The recording film having such a composition is a preferable composition capable of achieving high-density recording by multilayering, and it is possible to stably perform good sputtering film formation.

一般於將三氧化二鉍(Bi2 O3 )與氧化鍺(GeO2 )之粉末作為起始原料,燒結該起始原料,製作該組成靶之情形時,會成為Bi12 GeO20 與Bi4 Ge3 O12 之2相共存組成。Generally, a powder of bismuth trioxide (Bi 2 O 3 ) and cerium oxide (GeO 2 ) is used as a starting material to sinter the starting material, and when the composition target is produced, Bi 12 GeO 20 and Bi 4 are formed. The two phases of Ge 3 O 12 coexist.

然而,由於Bi12 GeO20 與Bi4 Ge3 O12 之熱膨脹係數差大,因此會發生對熱衝擊極弱、高功率下之濺鍍成膜時產生裂縫之問題。However, since the difference in thermal expansion coefficient between Bi 12 GeO 20 and Bi 4 Ge 3 O 12 is large, there is a problem that cracks occur when the thermal shock is extremely weak and the film is formed by sputtering under high power.

因此,於本發明中,將熱膨脹係數取Bi12 GeO20 與Bi4 Ge3 O12 之間之值的GeO2 作為中間相,並將其製成燒結體中3相共存之組織,藉此使GeO2 相成為緩衝相,耐熱衝擊性大大提高。此外,Bi12 GeO20 之熱膨脹係數為1.39×10-5 、Bi4 Ge3 O12 之熱膨脹係數為6.00×10-6 。另一方面,GeO2 之熱膨脹係數為7.59×10-6 ,為具有前2者之間的熱膨脹係數之相,因此可作為有效之緩衝相。Accordingly, in the present invention, the thermal expansion coefficient of Bi 12 GeO 20 takes a value of between 12 Bi 4 Ge 3 O of GeO 2 as an intermediate phase, and a sintered body tissue of 3 phases coexist, whereby The GeO 2 phase becomes a buffer phase and the thermal shock resistance is greatly improved. Further, the thermal expansion coefficient of Bi 12 GeO 20 is 1.39 × 10 -5 , and the thermal expansion coefficient of Bi 4 Ge 3 O 12 is 6.00 × 10 -6 . On the other hand, GeO 2 has a thermal expansion coefficient of 7.59 × 10 -6 , which is a phase having a thermal expansion coefficient between the first two, and thus can be used as an effective buffer phase.

其結果可獲得如下之大優點:靶之耐熱衝擊性獲得提高,藉此可於高功率下成膜,可提升生產效率。As a result, the following advantages can be obtained: the thermal shock resistance of the target is improved, whereby the film can be formed at a high power, and the production efficiency can be improved.

又,可獲得如下之效果:因裂縫或龜裂所引起之粒子的產生顯著減少,可製作穩定之高品質之薄膜,並且可製造不會產生記錄位元誤碼且能夠達成高記錄密度之光記錄媒體。Further, it is possible to obtain an effect that the generation of particles due to cracks or cracks is remarkably reduced, a stable high-quality film can be produced, and light which can produce a recording density without causing recording bit errors and achieving high recording density can be obtained. Record media.

將靶之結晶平均粒度設為100μm以下,對防止濺鍍時之粒子產生亦有效。It is also effective to prevent the generation of particles at the time of sputtering by setting the average crystal grain size of the target to 100 μm or less.

又,本發明之Bi-Ge-O系燒結體濺鍍靶,對靶施加200℃、30分鐘加熱之熱衝擊之情形時,該熱衝擊前後之平均彎曲強度降低率為50%以下。Further, in the case where the Bi-Ge-O based sintered body sputtering target of the present invention is subjected to a thermal shock of heating at 200 ° C for 30 minutes, the average bending strength reduction rate before and after the thermal shock is 50% or less.

於先前製品之Bi12 GeO20 與Bi4 Ge3 O12 之2相共存組成的靶之情形時,上述熱衝擊前後之平均彎曲強度降低率超過80%,相對於此而具有大幅的改善效果。由此,既抑制由熱衝擊所引起靶之裂縫,亦可直接地評價靶之特性。In the case of a target in which two phases of Bi 12 GeO 20 and Bi 4 Ge 3 O 12 of the prior art are present, the average bending strength reduction rate before and after the thermal shock exceeds 80%, which is a significant improvement effect. Thereby, the crack of the target caused by the thermal shock is suppressed, and the characteristics of the target can be directly evaluated.

又,上述靶之Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相之比率,可於本發明之製造條件範圍內任意調整。該比率亦取決於濺鍍時靶所受熱衝擊之程度,即成膜速度(生產速度)或濺鍍裝置之構造,成為用以緩和熱衝擊之指標。Further, the ratio of the three phases of the target Bi 12 GeO 20 , Bi 4 Ge 3 O 12 and GeO 2 can be arbitrarily adjusted within the range of the production conditions of the present invention. This ratio also depends on the degree of thermal shock of the target during sputtering, that is, the film forming speed (production speed) or the structure of the sputtering apparatus, and is an index for mitigating thermal shock.

使用上述靶進行濺鍍而成膜之光記錄媒體為穩定之高品質之薄膜,可獲得不會產生記錄位元誤碼之光記錄媒體。The optical recording medium formed by sputtering using the above target is a stable high-quality film, and an optical recording medium which does not cause recording bit errors can be obtained.

當製造Bi-Ge-O系燒結體濺鍍靶時,將三氧化二鉍與氧化鍺之粉末作為起始原料,以Bi與Ge之原子數比成為0.57<(Bi/(Bi+Ge))<0.92之方式混合該等原料。然後,將該混合粉末於600~840℃、加壓力150~400kg/cm2 下熱壓。藉此可製作含有Bi12 GeO20 、Bi4 Ge3 O12 及GeO2 之3相之結晶相的燒結體。When a Bi-Ge-O sintered body sputtering target is produced, a powder of antimony trioxide and cerium oxide is used as a starting material, and the atomic ratio of Bi to Ge is 0.57<(Bi/(Bi+Ge)). These materials were mixed in a manner of <0.92. Then, the mixed powder was hot-pressed at 600 to 840 ° C under a pressing pressure of 150 to 400 kg/cm 2 . Thereby, a sintered body containing a crystal phase of three phases of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 and GeO 2 can be produced.

該燒結條件為可獲得均勻組成之靶之較佳條件。雖亦可於偏離上述範圍之燒結條件下製造靶,但由於靶品質之再現性差,故宜為在上述之範圍。又,將上述原料階段之Bi與Ge之原子數比即0.57<(Bi/(Bi+Ge))<0.92直接反映於靶中,可獲得該組成比之靶。The sintering conditions are preferred conditions for obtaining a target of uniform composition. Although the target can be produced under the sintering conditions deviating from the above range, the reproducibility of the target quality is poor, and therefore it is preferably within the above range. Further, the ratio of the atomic ratio of Bi to Ge in the raw material phase, that is, 0.57 < (Bi / (Bi + Ge)) < 0.92, is directly reflected in the target, and the target of the composition ratio can be obtained.

當製造Bi-Ge-O系燒結體濺鍍靶時,作為三氧化二鉍與氧化鍺之燒結原料,宜為使用GeO2 粉0.03~89mol%、Bi12 GeO20 粉11~99.97mol%。其亦係用以高效率地獲得含有Bi12 GaO20 、Bi4 Ge3 O12 及GeO2 之3相之結晶相的燒結體之重要條件。When manufacturing a Bi-GeO based sintered compact sputtering target, a sintering bismuth trioxide and germanium oxide raw material powder is suitably used GeO 2 0.03 ~ 89mol%, Bi 12 GeO 20 powder 11 ~ 99.97mol%. It is also an important condition for efficiently obtaining a sintered body containing a crystal phase of three phases of Bi 12 GaO 20 , Bi 4 Ge 3 O 12 and GeO 2 .

又,宜為使用平均結晶粒徑為10~50μm之氧化鍺(GeO2 )粉末進行燒結。原因在於:於未達上述下限值時,容易產生粉末之凝聚,而難以獲得均勻之燒結體。又,若超過上述上限值,則經燒結之靶中會產生粗大粒子,變得容易偏析,故宜為上述之範圍。該範圍為更佳之粉末之條件,但藉由調整燒結條件,亦可使用該範圍以外之粉末。Further, it is preferred to use a cerium oxide (GeO 2 ) powder having an average crystal grain size of 10 to 50 μm for sintering. The reason is that when the lower limit value is not reached, aggregation of the powder tends to occur, and it is difficult to obtain a uniform sintered body. Moreover, when it exceeds the above-mentioned upper limit, coarse particles are generated in the sintered target, and it is easy to segregate, so it is preferable to be in the above range. This range is a better powder condition, but powders outside this range can also be used by adjusting the sintering conditions.

關於Bi12 GeO20 粉,可於混合GeO2 粉14.3mol%與Bi2 O3 粉85.7mol%之後,進行固相反應,將其粉碎而事先製作。關於Bi12 GeO20 粉之粒徑,並無特別限制,只要約為100μm以下,則不存在問題。其原因在於,在本發明之燒結條件下,不存在如GeO2 之凝聚。The Bi 12 GeO 20 powder can be prepared by previously mixing a GeO 2 powder of 14.3 mol% and a Bi 2 O 3 powder of 85.7 mol%, followed by pulverization. The particle diameter of the Bi 12 GeO 20 powder is not particularly limited, and is not less than 100 μm. The reason for this is that under the sintering conditions of the present invention, there is no agglomeration such as GeO 2 .

實施例Example

以下,根據實施例及比較例進行說明。再者,本實施例僅為一例,並不受到該例任何限制。即,本發明僅受到申請專利範圍限制,且包括本發明所含之實施例以外之各種變形。Hereinafter, description will be given based on examples and comparative examples. Furthermore, this embodiment is only an example and is not limited by this example. That is, the present invention is limited only by the scope of the patent application, and includes various modifications other than the embodiments included in the invention.

(實施例1)(Example 1)

將純度3N(99.9%)之三氧化二鉍與氧化鍺之粉末作為起始原料,並且預先準備平均粒徑為12μm之GeO2 粉及平均粒徑為20μm之Bi12 GeO20 粉,分別將該等以Bi與Ge之原子數比成為0.67之方式調合GeO2 粉83.3mol%、Bi12 GeO20 粉16.7mol%之後,加以混合,進而將混合後之粉末填充於碳製模具,於溫度700℃、壓力250kg/cm2 之條件下進行熱壓。A powder of 3N (99.9%) of antimony trioxide and cerium oxide was used as a starting material, and GeO 2 powder having an average particle diameter of 12 μm and Bi 12 GeO 20 powder having an average particle diameter of 20 μm were prepared in advance, respectively. When the atomic ratio of Bi to Ge is 0.67, the GeO 2 powder is 83.3 mol%, and the Bi 12 GeO 20 powder is 16.7 mol%, and then mixed, and the mixed powder is filled in a carbon mold at a temperature of 700 ° C. The hot pressing was carried out under the conditions of a pressure of 250 kg/cm 2 .

再者,於本實施例中,以達成上述莫耳比之方式添加GeO2 粉、Bi12 GeO20 粉,該等添加之綜合比係以成為與GeO2 50.0mol%、Bi2 O3 50.0mol%一致之摻合比之方式進行調整。Further, in the present embodiment, GeO 2 powder and Bi 12 GeO 20 powder are added in such a manner as to achieve the above molar ratio, and the combined ratios of the additions are 50.0 mol% with GeO 2 and 50.0 mol of Bi 2 O 3 . % consistent blending is adjusted in a manner similar to that.

對熱壓後之燒結體進行精加工而製成靶。靶之相對密度為102%(100%密度時為7.44g/cm3 )。The sintered body after hot pressing is finished to form a target. The relative density of the target was 102% (7.44 g/cm 3 at 100% density).

藉由該燒結體之X射線繞射測定,確認為Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相構造。將其結果示於表1。The X-ray diffraction measurement of the sintered body confirmed the three-phase structure of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 , and GeO 2 . The results are shown in Table 1.

接著,對該靶施加200℃、30分鐘加熱之熱衝擊。然後,實施JIS標準1601之彎曲試驗(自靶中之任意部位5處,選取寬度為4±0.1mm、高度為3±0.1mm、長度為40~50mm之試驗片進行測定,求出5處之測定結果之平均值),測定該熱衝擊前後之平均彎曲強度比(強度之降低率)。因測定部位不同而產生稍許偏差,但任一者均未達50%,強度之降低率低。Next, a thermal shock of heating at 200 ° C for 30 minutes was applied to the target. Then, the bending test of JIS Standard 1601 was carried out (measured from 5 points at any position in the target, and a test piece having a width of 4 ± 0.1 mm, a height of 3 ± 0.1 mm, and a length of 40 to 50 mm was selected, and 5 points were determined. The average value of the measurement results was measured, and the average bending strength ratio (the rate of decrease in strength) before and after the thermal shock was measured. A slight deviation occurred due to the difference in the measurement site, but either of them was less than 50%, and the rate of decrease in strength was low.

其次,使用該靶,以2kW之功率進行濺鍍。其結果,靶未產生裂縫或龜裂,與下述之比較例相比,粒子之產生顯著變少。Next, using this target, sputtering was performed at a power of 2 kW. As a result, cracks or cracks did not occur in the target, and the generation of particles was remarkably smaller than in the comparative examples described below.

其結果,本發明之實施例係具有如下優異效果的良好之靶:不會產生裂縫,可提高生產效率且可穩定地製作高品質之薄膜,能夠獲得不會產生記錄位元誤碼之光記錄媒體。As a result, the embodiment of the present invention is a good target having excellent effects of not causing cracks, improving production efficiency, and stably producing a high-quality film, and obtaining an optical record which does not cause recording bit error. media.

(實施例2)(Example 2)

將純度3N(99.9%)之三氧化二鉍與氧化鍺之粉末作為起始原料,並且預先準備平均粒徑為12μm之GeO2 粉及平均粒徑為20μm之Bi12 GeO20 粉,分別將該等以Bi與Ge之原子數比成為0.80之方式調合GeO2 粉66.7mol%、Bi12 GeO20 粉33.3mol%之後,加以混合,進而將混合後之粉末填充於碳製模具,於溫度700℃、壓力250kg/cm2 之條件下進行熱壓。A powder of 3N (99.9%) of antimony trioxide and cerium oxide was used as a starting material, and GeO 2 powder having an average particle diameter of 12 μm and Bi 12 GeO 20 powder having an average particle diameter of 20 μm were prepared in advance, respectively. When the ratio of the atomic ratio of Bi to Ge is 0.80, the content of GeO 2 powder is 66.7 mol%, and the powder of Bi 12 GeO 20 is 33.3 mol%, and then mixed, and the mixed powder is filled in a carbon mold at a temperature of 700 ° C. The hot pressing was carried out under the conditions of a pressure of 250 kg/cm 2 .

再者,於本實施例中,以達成上述莫耳比之方式添加GeO2 粉、Bi12 GeO20 粉,該等添加之綜合比係以成為與GeO2 33.3mol%、Bi2 O3 66.7mol%一致之摻合比之方式進行調整。Further, in the present embodiment, GeO 2 powder and Bi 12 GeO 20 powder are added in such a manner as to achieve the above molar ratio, and the combined ratios of the additions are 33.3 mol% with GeO 2 and 66.7 mol of Bi 2 O 3 . % consistent blending is adjusted in a manner similar to that.

對熱壓後之燒結體進行精加工而製成靶。靶之相對密度為95.9%(100%密度時為7.58g/cm3 )。The sintered body after hot pressing is finished to form a target. The relative density of the target was 95.9% (7.58 g/cm 3 at 100% density).

藉由該燒結體之X射線繞射測定,確認為Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相構造。將其結果示於表1。The X-ray diffraction measurement of the sintered body confirmed the three-phase structure of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 , and GeO 2 . The results are shown in Table 1.

其次,對該靶施加200℃、30分鐘加熱之熱衝擊。然後,實施JIS標準1601之彎曲試驗,測定該熱衝擊前後之平均彎曲強度比(強度之降低率)。因測定部位不同而產生稍許偏差,但任一者均未達50%,強度之降低率低。Next, a thermal shock of heating at 200 ° C for 30 minutes was applied to the target. Then, a bending test of JIS Standard 1601 was carried out, and the average bending strength ratio (rate of reduction of strength) before and after the thermal shock was measured. A slight deviation occurred due to the difference in the measurement site, but either of them was less than 50%, and the rate of decrease in strength was low.

其次,使用該靶,以2kW之功率進行濺鍍。其結果,靶未產生裂縫或龜裂,粒子之產生亦少。Next, using this target, sputtering was performed at a power of 2 kW. As a result, the target does not generate cracks or cracks, and the generation of particles is small.

其結果,本發明之實施例係具有如下優異效果的良好之靶:不會產生裂縫,可提高生產效率且可穩定地製作高品質之薄膜,能夠獲得不會產生記錄位元誤碼之光記錄媒體。As a result, the embodiment of the present invention is a good target having excellent effects of not causing cracks, improving production efficiency, and stably producing a high-quality film, and obtaining an optical record which does not cause recording bit error. media.

(比較例1)(Comparative Example 1)

將純度3N(99.9%)之三氧化二鉍與氧化鍺之粉末作為起始原料,分別將該等以Bi與Ge之原子數比成為0.67之方式調合平均粒徑為5μm之GeO2 粉50.0mol%、平均粒徑為20μm之Bi2 O3 粉50.0mol%之後,加以混合,進而將混合後之粉末填充於碳製模具,於溫度730℃、壓力250kg/cm2 之條件下進行熱壓。A powder of 3N (99.9%) of antimony trioxide and cerium oxide was used as a starting material, and 50.0 mol of GeO 2 powder having an average particle diameter of 5 μm was blended so that the atomic ratio of Bi to Ge was 0.67. After the mixture and the Bi 2 O 3 powder having an average particle diameter of 20 μm, 50.0 mol%, the mixture was mixed, and the mixed powder was filled in a carbon mold, and hot pressed at a temperature of 730 ° C and a pressure of 250 kg/cm 2 .

對熱壓後之燒結體進行精加工而製成靶。靶之相對密度為103%(100%密度時為7.44g/cm3 )。The sintered body after hot pressing is finished to form a target. The relative density of the target was 103% (7.44 g/cm 3 at 100% density).

藉由該燒結體之X射線繞射測定,確認靶之結晶相為Bi12 GeO20 、Bi4 Ge3 O12 之2相構造。The X-ray diffraction measurement of the sintered body confirmed that the crystal phase of the target was a two-phase structure of Bi 12 GeO 20 and Bi 4 Ge 3 O 12 .

其次,對該靶施加200℃、30分鐘加熱之熱衝擊。然後,實施JIS1601之平均彎曲強度試驗。同樣地將該熱衝擊前後之平均彎曲強度比(強度之降低率)之測定結果示於表1。Next, a thermal shock of heating at 200 ° C for 30 minutes was applied to the target. Then, the average bending strength test of JIS1601 was carried out. Similarly, the measurement results of the average bending strength ratio (the rate of decrease in strength) before and after the thermal shock are shown in Table 1.

其結果,平均彎曲強度之降低率為82%。使用該靶,以2kW之功率進行濺鍍。其結果,濺鍍中靶產生裂縫。又,與實施例相比,粒子之產生顯著增加。認為其原因係濺鍍中之靶之裂縫。As a result, the average bending strength reduction rate was 82%. Using this target, sputtering was performed at a power of 2 kW. As a result, cracks are generated in the target during sputtering. Moreover, the generation of particles was significantly increased as compared with the examples. The cause is considered to be a crack in the target in the sputtering.

(比較例2)(Comparative Example 2)

將純度3N(99.9%)之三氧化二鉍與氧化鍺之粉末作為起始原料,並且預先準備平均粒徑為5μm之GeO2 粉及平均粒徑為20μm之Bi12 GeO20 粉,分別將該等以Bi與Ge之原子數比成為0.67之方式調合GeO2 粉83.3mol%、Bi12 GeO20 粉16.7mo1%之後,加以混合,進而將混合後之粉末填充於碳製模具,於溫度700℃、壓力250kg/cm2 之條件下進行熱壓。A powder of 3N (99.9%) of antimony trioxide and cerium oxide was used as a starting material, and GeO 2 powder having an average particle diameter of 5 μm and Bi 12 GeO 20 powder having an average particle diameter of 20 μm were prepared in advance, respectively. When the ratio of the atomic ratio of Bi to Ge is 0.67, the GeO 2 powder is 83.3 mol%, and the Bi 12 GeO 20 powder is 16.7 mol%, and then mixed, and the mixed powder is filled in a carbon mold at a temperature of 700 ° C. The hot pressing was carried out under the conditions of a pressure of 250 kg/cm 2 .

再者,於本實施例中,以達成上述莫耳比之方式添加GeO2 粉、Bi12 GeO20 粉,該等添加之綜合比係以成為與GeO2 50.0mol%、Bi2 O3 50.0mol%一致之摻合比之方式進行調整。Further, in the present embodiment, GeO 2 powder and Bi 12 GeO 20 powder are added in such a manner as to achieve the above molar ratio, and the combined ratios of the additions are 50.0 mol% with GeO 2 and 50.0 mol of Bi 2 O 3 . % consistent blending is adjusted in a manner similar to that.

對熱壓後之燒結體進行精加工而製成靶。靶之相對密度為103%(100%密度時為7.58g/cm3 )。The sintered body after hot pressing is finished to form a target. The relative density of the target was 103% (7.58 g/cm 3 at 100% density).

藉由該燒結體之X射線繞射測定,確認GeO全量反應,且為Bi12 GeO20 、Bi4 Ge3 O12 之2相構造。The X-ray diffraction measurement of the sintered body confirmed the total amount of GeO reaction, and was a two-phase structure of Bi 12 GeO 20 and Bi 4 Ge 3 O 12 .

其次,對該靶施加200℃、30分鐘加熱之熱衝擊。然後,實施JIS1601之平均彎曲強度試驗。同樣地將該熱衝擊前後之平均彎曲強度比(強度之降低率)之測定結果示於表1。Next, a thermal shock of heating at 200 ° C for 30 minutes was applied to the target. Then, the average bending strength test of JIS1601 was carried out. Similarly, the measurement results of the average bending strength ratio (the rate of decrease in strength) before and after the thermal shock are shown in Table 1.

其結果,平均彎曲強度之降低率為80%。使用該靶,以2kW之功率進行濺鍍。其結果,濺鍍中靶產生裂縫。又,與實施例相比,粒子之產生顯著增加。認為其原因係濺鍍中之靶之裂縫。As a result, the rate of decrease in the average bending strength was 80%. Using this target, sputtering was performed at a power of 2 kW. As a result, cracks are generated in the target during sputtering. Moreover, the generation of particles was significantly increased as compared with the examples. The cause is considered to be a crack in the target in the sputtering.

產業上之可利用性Industrial availability

根據本發明之Bi-Ge-O系燒結體濺鍍靶及該靶之製造方法,具有如下之優異效果:於濺鍍時不會產生靶之裂縫,粒子之產生少,可穩定地製作高品質之薄膜,且可獲得不會產生記錄位元誤碼之光記錄媒體。可提供一種能夠提高光記錄媒體之成膜之生產效率,適於製造光記錄媒體之靶。According to the Bi-Ge-O sintered body sputtering target of the present invention and the method for producing the target, there is an excellent effect that cracks of the target are not generated during sputtering, and generation of particles is small, and high quality can be stably produced. The film is obtained, and an optical recording medium that does not cause a recording bit error is obtained. It is possible to provide a target which is capable of improving the production efficiency of film formation of an optical recording medium and is suitable for manufacturing an optical recording medium.

Claims (6)

一種Bi-Ge-O系燒結體濺鍍靶,係由鉍(Bi)、鍺(Ge)、氧(O)構成,其特徵在於:Bi與Ge之原子數比為0.57<(Bi/(Bi+Ge))<0.92,含有Bi12 GeO20 、Bi4 Ge3 O12 、GeO2 之3相作為結晶相。A Bi-Ge-O sintered body sputtering target consisting of bismuth (Bi), germanium (Ge), and oxygen (O), characterized in that the atomic ratio of Bi to Ge is 0.57<(Bi/(Bi) +Ge)) < 0.92, containing three phases of Bi 12 GeO 20 , Bi 4 Ge 3 O 12 and GeO 2 as a crystal phase. 如申請專利範圍第1項之燒結體濺鍍靶,其中,對靶施加200℃、30分鐘加熱之熱衝擊時,該熱衝擊前後之平均彎曲強度降低率為50%以下。The sintered body sputtering target according to claim 1, wherein when the target is subjected to a thermal shock of heating at 200 ° C for 30 minutes, the average bending strength reduction rate before and after the thermal shock is 50% or less. 一種光記錄媒體,其係使用申請專利範圍第1或2項之靶進行濺鍍而形成。An optical recording medium formed by sputtering using a target of claim 1 or 2. 一種Bi-Ge-O系燒結體濺鍍靶之製造方法,其特徵在於:將GeO2 粉0.03~89mol%、Bi12 GeO20 粉11~99.97mol%作為起始原料,以Bi與Ge之原子數比成為0.57<(Bi/(Bi+Ge))<0.92之方式混合該等原料之後,於600~840℃、加壓力150~400kg/cm2 下熱壓,藉此製作含有Bi12 GeO20 、Bi4 Ge3 O12 及GeO2 之3相之結晶相的燒結體。Bi-GeO one kind of sintered body sputtering target manufacturing method of plating, comprising: a GeO 2 powder 0.03 ~ 89mol%, Bi 12 GeO 20 11 ~ 99.97mol% powder as a starting material, the atoms of Bi and Ge After mixing the raw materials in such a manner that the number ratio is 0.57 < (Bi / (Bi + Ge)) < 0.92, the raw material is hot-pressed at 600 to 840 ° C and a pressure of 150 to 400 kg / cm 2 to prepare Bi 12 GeO 20 . A sintered body of a crystal phase of three phases of Bi 4 Ge 3 O 12 and GeO 2 . 如申請專利範圍第4項之Bi-Ge-O系燒結體濺鍍靶之製造方法,其中,將GeO2 粉14.3mol%與Bi2 O3 粉85.7mol%混合之後,進行固相反應而製作Bi12 GeO20 粉末。A method for producing a Bi-Ge-O sintered body sputtering target according to the fourth aspect of the invention, wherein the GeO 2 powder is 14.3 mol% and the Bi 2 O 3 powder is 85.7 mol%, and then a solid phase reaction is performed. Bi 12 GeO 20 powder. 如申請專利範圍第4或5項之Bi-Ge-O系燒結體濺鍍靶之製造方法,其中,使用平均結晶粒徑為10~50μm之氧化鍺之燒結原料粉末進行燒結。The method for producing a Bi-Ge-O sintered body sputtering target according to the fourth or fifth aspect of the invention, wherein the sintered raw material powder having a mean crystal grain size of 10 to 50 μm is sintered.
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