TW201142058A - Bi-ge-o sintered sputtering target, manufacturing method therefor, and optical recording medium - Google Patents
Bi-ge-o sintered sputtering target, manufacturing method therefor, and optical recording medium Download PDFInfo
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- TW201142058A TW201142058A TW099134164A TW99134164A TW201142058A TW 201142058 A TW201142058 A TW 201142058A TW 099134164 A TW099134164 A TW 099134164A TW 99134164 A TW99134164 A TW 99134164A TW 201142058 A TW201142058 A TW 201142058A
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- Prior art keywords
- powder
- target
- sintered body
- recording medium
- optical recording
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- 230000003287 optical effect Effects 0.000 title claims abstract description 30
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 23
- 238000005477 sputtering target Methods 0.000 title claims abstract description 17
- 238000004544 sputter deposition Methods 0.000 claims abstract description 23
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium dioxide Chemical compound O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 claims abstract description 22
- 229910052797 bismuth Inorganic materials 0.000 claims abstract description 11
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims abstract description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims abstract description 6
- 229910052732 germanium Inorganic materials 0.000 claims abstract description 6
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 6
- 239000001301 oxygen Substances 0.000 claims abstract description 6
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims abstract description 4
- 239000000843 powder Substances 0.000 claims description 46
- 239000012071 phase Substances 0.000 claims description 31
- 230000035939 shock Effects 0.000 claims description 21
- 238000005452 bending Methods 0.000 claims description 14
- 239000013078 crystal Substances 0.000 claims description 14
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 9
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 9
- 239000002994 raw material Substances 0.000 claims description 8
- 239000007858 starting material Substances 0.000 claims description 8
- 238000005245 sintering Methods 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 5
- 229910052746 lanthanum Inorganic materials 0.000 claims description 5
- 238000002156 mixing Methods 0.000 claims description 5
- 238000007747 plating Methods 0.000 claims description 3
- 238000003746 solid phase reaction Methods 0.000 claims description 3
- 239000010985 leather Substances 0.000 claims 1
- 239000010409 thin film Substances 0.000 abstract 1
- 239000002245 particle Substances 0.000 description 24
- 239000000203 mixture Substances 0.000 description 14
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Chemical compound O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000007731 hot pressing Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 239000011812 mixed powder Substances 0.000 description 4
- 238000007792 addition Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000005336 cracking Methods 0.000 description 3
- 238000005054 agglomeration Methods 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 229910052735 hafnium Inorganic materials 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 239000008267 milk Substances 0.000 description 2
- 235000013336 milk Nutrition 0.000 description 2
- 210000004080 milk Anatomy 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- FYELSNVLZVIGTI-UHFFFAOYSA-N 2-[4-[2-(2,3-dihydro-1H-inden-2-ylamino)pyrimidin-5-yl]-5-ethylpyrazol-1-yl]-1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethanone Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C=1C=NN(C=1CC)CC(=O)N1CC2=C(CC1)NN=N2 FYELSNVLZVIGTI-UHFFFAOYSA-N 0.000 description 1
- 241000548230 Crassostrea angulata Species 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 235000000177 Indigofera tinctoria Nutrition 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 239000011362 coarse particle Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004945 emulsification Methods 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 239000012943 hotmelt Substances 0.000 description 1
- 229940097275 indigo Drugs 0.000 description 1
- COHYTHOBJLSHDF-UHFFFAOYSA-N indigo powder Natural products N1C2=CC=CC=C2C(=O)C1=C1C(=O)C2=CC=CC=C2N1 COHYTHOBJLSHDF-UHFFFAOYSA-N 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 230000000116 mitigating effect Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000009725 powder blending Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000004826 seaming Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/622—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/626—Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
- C04B35/62605—Treating the starting powders individually or as mixtures
- C04B35/62685—Treating the starting powders individually or as mixtures characterised by the order of addition of constituents or additives
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- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
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- C04B35/645—Pressure sintering
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- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
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- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
- G11B7/266—Sputtering or spin-coating layers
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- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3287—Germanium oxides, germanates or oxide forming salts thereof, e.g. copper germanate
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- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/30—Constituents and secondary phases not being of a fibrous nature
- C04B2235/32—Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
- C04B2235/3298—Bismuth oxides, bismuthates or oxide forming salts thereof, e.g. zinc bismuthate
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- C04B2235/02—Composition of constituents of the starting material or of secondary phases of the final product
- C04B2235/50—Constituents or additives of the starting mixture chosen for their shape or used because of their shape or their physical appearance
- C04B2235/54—Particle size related information
- C04B2235/5418—Particle size related information expressed by the size of the particles or aggregates thereof
- C04B2235/5436—Particle size related information expressed by the size of the particles or aggregates thereof micrometer sized, i.e. from 1 to 100 micron
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- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/74—Physical characteristics
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- C04B2235/70—Aspects relating to sintered or melt-casted ceramic products
- C04B2235/80—Phases present in the sintered or melt-cast ceramic products other than the main phase
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- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
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- C04B2235/00—Aspects relating to ceramic starting mixtures or sintered ceramic products
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- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
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- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24302—Metals or metalloids
- G11B2007/24312—Metals or metalloids group 14 elements (e.g. Si, Ge, Sn)
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24302—Metals or metalloids
- G11B2007/24314—Metals or metalloids group 15 elements (e.g. Sb, Bi)
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- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/241—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
- G11B7/242—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers
- G11B7/243—Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of recording layers comprising inorganic materials only, e.g. ablative layers
- G11B2007/24318—Non-metallic elements
- G11B2007/2432—Oxygen
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- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
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- G11B7/004—Recording, reproducing or erasing methods; Read, write or erase circuits therefor
- G11B7/0045—Recording
- G11B7/00451—Recording involving ablation of the recording layer
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/2403—Layers; Shape, structure or physical properties thereof
- G11B7/24035—Recording layers
- G11B7/24038—Multiple laminated recording layers
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- Ceramic Engineering (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Physical Vapour Deposition (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
Description
201142058 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種Bi — Ge — 0系燒結體濺鍍靶及該靶 之製造方法以及光記錄媒體,特別係關於在濺鍍時不會產 生乾之裂縫’粒子(particle)之產生少,可穩定地製作高品質 之薄膜’且可獲得不會產生記錄位元誤碼之光記錄媒體的BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a Bi-Ge 0 -based sintered body sputtering target, a method of manufacturing the same, and an optical recording medium, particularly in the case of sputtering. The dry crack 'has a small amount of particles, can stably produce a high-quality film' and obtains an optical recording medium that does not cause recording bit errors.
Bi — Ge — 〇系燒結體濺鍍靶及該靶之製造方法以及光記錄 媒體。 【先前技術】 追 s己型(WORM ’ Write Once Read Many)光記錄媒體, 係即便疋藍色波長區域(350〜5〇〇nm)之雷射光亦可進行汽 密度之記錄之光記錄媒體,特別係具有高記錄感度且具有 多層記錄層之光記錄媒體。 光碟為了因應高密度化之要求,正在藉由多層化來實 現高密度化。於使用藍色LD之光碟中亦同樣地正在進行高 密度記錄用之光記錄媒體之開發。 為了實現可高密度多層記錄之追記型光記錄媒體,具 有穩定之組成、構造之材料自不必言,而且亦需要透光特 I·生優異之膜jt匕種材料多為氧化物,一般由於炫點高,因 而較多使用濺鍍法作為成膜法。 因此,需要適於獲得此種膜之鴻^把。’然而,由於構 成靶之化合物之形態、構造等,亦會對濺鍍特性造成影響, 因此於將構絲之化合物作為適於所需之膜之特性者時曰, 存在是否可穩定地進行良好之濺鍍之問題。 201142058 於使用濺鍍法將光記錄媒體用薄膦形Λ、士 *』 ± y *腰形成在基板之情形 時’有時會因把材料,造成粒子的發在 |生變多,而使品質降 低。特別是於高記錄密度媒體中,由私2 ^ 田粒子等所導致之記錄 位元誤碼是嚴重的問題。因此原因成盍 又雨不合格品,而發生 良率降低之問題。 先前,所提出之光記錄媒體,提出有多種材料。例如 專利文獻1中記載有-種光記錄媒體,其係於基板上至少 形成有記錄層者,記錄層之構成元素 主成分為Βι及 0(氧),含有B,並且含有選自Ge、u 1 bn、Cu、Fe、Pd、Bi — Ge — a bismuth sintered body sputtering target, a method of producing the same, and an optical recording medium. [Prior Art] The WORM 'Write Once Read Many' optical recording medium is an optical recording medium that can record the vapor density even if the laser light in the indigo wavelength region (350 to 5 〇〇 nm) is used. In particular, it is an optical recording medium having a high recording sensitivity and having a plurality of recording layers. In order to meet the demand for higher density, the optical disc is being made denser by multi-layering. The development of an optical recording medium for high-density recording is also being carried out in a disc using a blue LD. In order to realize a recordable optical recording medium capable of high-density multi-layer recording, a material having a stable composition and structure is self-evident, and it is also required to have a light-transmissive film which is excellent in oxide film, and is generally an oxide. The point is high, so the sputtering method is often used as a film forming method. Therefore, there is a need for a suitable method for obtaining such a film. 'However, since the form, structure, and the like of the compound constituting the target also affect the sputtering characteristics, whether or not the compound of the koji is suitable for the characteristics of the desired film is stable or not. The problem of sputtering. 201142058 When using a sputtering method to form an optical recording medium with a thin phosphine-shaped yttrium, a ± y * y * waist on the substrate, it may cause a decrease in the quality of the particles due to the material. . Especially in high-recording density media, recording bit errors caused by private cells or the like are serious problems. Therefore, the cause is that the rain is not good, and the yield is reduced. Previously, the proposed optical recording medium was proposed with a variety of materials. For example, Patent Document 1 discloses an optical recording medium in which at least a recording layer is formed on a substrate, and constituent elements of the recording layer are Βι and 0 (oxygen), contain B, and contain a material selected from Ge and u. 1 bn, Cu, Fe, Pd,
Zn、Mg、Nd、Mn、Ni中之至少一種元素x。 又,專利文獻2中記載有一種抬 ’禋追圮型光記錄媒體,其 特徵在於:記錄層含有Bi、M(MA 1U〇 a 馬 、Α卜 Cr、Μη、Co、At least one element x of Zn, Mg, Nd, Mn, Ni. Further, Patent Document 2 describes an optical recording medium of a type of tracking type, which is characterized in that the recording layer contains Bi and M (MA 1U 〇 a horse, Cr Cr Cr, Μη, Co,
Fe、Cu、Zn、Li、Si ' Ge、Zr、Ti、Hf c 11 Hf、Sn、Mo、V、Nb、 m中之至少一種元素)及氧’記錄有資訊之記錄標記部 包含該記錄層所含有之元素之結晶及/或該等元素之氧化 物之結晶。 此外,亦提出有專利文愈! 1 奎 』又獻3〜專利文獻8。於該等之中, 考慮有由鉍(Bi)、鍺(Ge)、氧(⑴播士、 乳(0)構成之光記錄媒體之組合, 又,亦記載有藉由燒結體鞑夕:热 ^ . 趙靶之濺鍍,形成該等光記錄媒體。 J 而,所謂該 B i — (} e 〇 彡,g $ υ糸燒結體濺鍍靶,存在如下之問 題:熱衝擊弱,以高功率推> 门力早進仃濺鍍時常會產生裂縫、龜裂, 因此而導致粒子的發生,沪 |生知害記錄膜等之品質。 專利文獻1 :日木柱pq 1 Λ Λ η 特開2008 — 210492號公報 專利文獻2 :日本牡Μ ο Λ λ γ 特開2006 ~ 1 16948號公報 201142058 專利文獻3 :日本特開2003 — 48375號公報 專利文獻4 :日本特開2005 — 161 83 1號公報 專利文獻5 :日本特開2005 — 108396號公報 專利文獻6 :日本特開2007 — 169779號公報 專利文獻7 :日本特開2008 — 273167號公報 專利文獻8 :日本第4271〇63號公報 【發明内容】 本發明之課題’係關於一種Bi—Ge_〇系燒結體濺鍍 靶及該靶之製造方法以及光記錄媒體,特別是提供一種於 滅鍵時不會產生把之裂縫、粒子之產生少、可穩定地製作 高品質之薄膜、且可獲得不會產生記錄位元誤碼之光記錄 媒體的Bi — Ge — 〇系燒結體濺鍍靶及該靶之製造方法以及 光記錄媒體。 為了解決上述課題,本發明人等進行潛心研究的結 果,得到如下之知識見解:可選擇適當組成之Bi—^― 〇 系燒結體來控制結晶相,抑制靶之熱衝擊而防止靶之裂 縫’而可在濺鍍時有效地抑制粒子之產生。 根據該知識見解,本發明提供: U一種Bi - Ge — Ο系燒結體濺鍍靶,係由鉍(Bi)、鍺 (Ge)、乳(〇)所構成,其特徵在於:⑴與以之原子數比為 〇-57<(Bl/(Bi+Ge))<〇 92,含有 Bii2Ge〇2〇、Bi4Ge3〇 2、Fe, Cu, Zn, Li, Si 'Ge, Zr, Ti, Hf c 11 Hf, Sn, Mo, V, Nb, m at least one element) and oxygen 'recording mark portion containing information includes the recording layer Crystals of the elements contained and/or crystals of oxides of the elements. In addition, it is also proposed to have patents! 1 Kui 』 also offers 3 ~ Patent Document 8. Among these, a combination of an optical recording medium composed of bismuth (Bi), bismuth (Ge), oxygen ((1) sergeant, and milk (0) is also considered, and a sintered body is also described. ^. The sputtering of the target is formed to form the optical recording medium. J, the so-called B i — (} e 〇彡, g $ υ糸 sintered sputtering target has the following problems: the thermal shock is weak, and the high Power Push> When the door force advances and splashes, cracks and cracks often occur, which leads to the occurrence of particles, and the quality of the recording film of Shanghai. The patent document 1: Japanese wood pq 1 Λ Λ η Japanese Patent Publication No. 2008-210492 Patent Document 2: Japanese Oysters ο λ λ γ 特 2006 2006 1 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 420 — — — — — — — Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. SUMMARY OF THE INVENTION The subject of the present invention is related to a Bi-Ge_〇 In particular, the present invention provides a method for producing a target, a method for producing the target, and an optical recording medium, and in particular, provides a film which does not cause cracks and particle generation when the key is extinguished, and can stably produce a high-quality film without obtaining a high-quality film. In the optical recording medium of the optical recording medium in which the bit error is recorded, the bismuth-based sintered body sputtering target, the method for producing the target, and the optical recording medium have been developed. The inventors of the present invention have conducted intensive studies to obtain the following results. Knowledge insight: Bi-^- 〇-based sintered body of appropriate composition can be selected to control the crystal phase, suppress the thermal shock of the target and prevent the crack of the target, and can effectively suppress the generation of particles during sputtering. The present invention provides: U a Bi-Ge-lanthanum sintered body sputtering target composed of bismuth (Bi), bismuth (Ge), and milk (〇), characterized in that: (1) the atomic ratio is 〇-57<(Bl/(Bi+Ge))<〇92, containing Bii2Ge〇2〇, Bi4Ge3〇2
Ge〇1之3相作為結晶相; 1 如上述丨)之燒結體濺鍍靶,其中,對耙施加2〇〇。(:、 3〇分鐘加熱之熱衝擊時,該熱衝擊前後之平均彎曲強度降 201142058 低率為50%以下; 3)—種光記錄媒體,其係使用上述丨)或2)之乾進行:賤 鑛而形成。 又,本發明提供: ‘ 4) 一種Bi—Ge—Ο系燒結體濺鍍靶之製造方法,其特 徵在於:將 Ge02 粉 〇.〇3 〜89mol%' Bil2Ge02G 粉 π〜 99_97mol%作為起始原料,以Bi與Ge之原子數比成為〇 57 <(Bi/(Bi+Ge))<0.92之方式混合該等原料之後,於 〜840°C、加壓力150〜400kg/cm2下熱壓,藉此製作含有 BiuGeOu、BUGe^Ou及Ge〇2之3相之結晶相的燒結體; 5) 如上述4)之Bi—Ge—Ο系燒結體濺鍍靶之製造方 法’其中’混合Ge〇2粉14.3mol%與別2〇3粉85 7m〇i%之 後,進行固相反應而製作Bil2GeO20粉末; 6) 如上述4)或5)之Bi— Ge— Ο系燒結體濺鍍靶之製造 方法,其中,使用平均結晶粒徑為10〜5〇//m之氧化鍺之 燒結原料粉末進行燒結。 本發明之Bi — Ge—Ο系燒結體濺鍍靶具有如下優異之 效果:於濺鍍時不會產生靶之裂縫,粒子 m于之產生少,可穩 定地製作高品質之薄膜’且可獲得不會產生 I玍5己錄位7L誤碼 之光記錄媒體。 【實施方式】 本發明之Bi—Ge—O系燒結體濺鍍靶係由鉍鍺 (Ge)、氧(0)構成,其特徵在於:Bi與Ge之原子數比為〇力 < (Bi/(Bi+Ge))< 〇.92,含有 Bi,2Ge〇2〇、Bi4Ge3〇 2、Ge〇 6 201142058 之3相作為結晶相。利用該組成之記錄膜為可藉由多層化 達成高密度記錄之較佳組成,可穩定地進行良好之濺鍍成 膜。 Λ 一般於將三氧化二鉍(Βΐ2〇3)與氧化鍺(Ge〇2)之粉末作 為起始原料,燒結該起始原料,製作該組成靶之情形時, 會成為Bi12Ge02G與Bi4Ge3012之2相共存組成。 然而,由於BkGeO^ 之熱膨脹係數差大, 因此會發线熱衝擊極弱、高功率下之_成膜時產生裂 囚此 於本發明中,將熱膨脹係數取BhGeOw與 =4Ge3〇12之間之值的Ge〇2作為中間相,並將其製成燒結體 3相共存之_,藉此使以〇2相成為緩衝相,耐熱衝擊 性大大提高。此外,Bil2Ge〇2〇之熱膨服係數為i 39χΐ〇 5、 :一 2之熱膨脹係數為6.〇〇χ1〇—、另一方面,响之 數為7.59Χ1(Γ6,為具有前2者之間的熱膨服係數 之相,因此可作為有效之緩衝相。 * 果可獲得如下之大優點:靶之耐熱衝擊性獲得提 ㈤,藉此可於高功率下成膜,可提升生產效率。 :獲什如下之效果:因裂縫或龜裂所引起之粒 的產生顯著減少,可製作 ; 造不會產生記錄位元= 之薄膜’並且可製 媒體。 "、此夠達成南記錄密度之光記錄 將靶之結晶平均粒度設為 之粒子產生亦有效。 100//m以下,對防止濺鍍時 201142058 2。。。广:本發明m°系燒結體_乾,對㈣加 广0分鐘加熱之熱衝擊之情形時,該熱衝擊前後之平 均彎曲強度降低率為50%以下。 於先前製品之Bi|2GeC>2。與Bi4Ge3〇ik 2相共存組成 '清形時’上述熱衝擊前後之平均彎曲強度降低率超 $㈣’相對於此而具有大幅的改善效果。由此,既抑制 熱衝擊所引起乾之裂縫,亦可直接地評價m 又,上述靶之 Bil2Ge〇2Q ' Bi4Ge3〇i2 ' Ge〇2 之 3 相之 率可於本發明之製造條件範圍内任意調整。該比率亦 取决於錢鍍時乾所受熱衝擊之程度,即成膜速度(生產速度) 或濺鍍裝置之構造’成為用以緩和熱衝擊之指標。 。片使用上述無進行濺鑛而成膜之光記錄媒體為穩定之高 时質3膜’可獲得不會產生記錄位元誤碼之光記錄媒體。 一當製造Bi-Ge—〇系燒結體濺鍍靶時,將三氧化二鉍 與氧化鍺之粉末作為起始原料,以⑴與&之原子數比成 為〇.57<(Bi/(Bi+Ge))<〇 %之方式混合該等原料。然 後’將該混合粉末於_〜84『c、加壓力i 5〇〜彻 下熱壓。藉此可製作含有Bii2Ge〇2〇、叫叫〇|2及Ge〇2之 3相之結晶相的燒結體。 。該燒結條件為可獲得均勻組成之乾之較佳條件。雖亦 可於偏離上述範圍之燒結條件下製造&,但由於靶品質之 再現性差’故宜為在上述之範圍。又,將上述原料階段之 1與Ge之原子數比即〇 57<(Bi/(Bi+Ge》<〇%直接反 映於乾中,可獲得該組成比之靶。 8 201142058 當製造Bi_Ge—〇系燒結體濺鍍靶時,作為三氧化二 叙與乳化鍺之燒結原料,宜為使用G e 〇 Λ λ。 且兩便用粉0.03〜89mol%、A three-phase phase of Ge〇1 is used as a crystal phase; and a sintered body sputtering target of the above-mentioned 丨), wherein 2〇〇 is applied to the crucible. (:, 3 minutes of thermal shock during heating, the average bending strength before and after the thermal shock is 201142058, the low rate is less than 50%; 3) - an optical recording medium, which is carried out using the above 丨) or 2): Formed from antimony ore. Further, the present invention provides: '4) A method for producing a Bi-Ge-lanthanum sintered body sputtering target, characterized in that: Ge02 powder 〇.3~89 mol% 'Bil2Ge02G powder π~99_97 mol% is used as a starting material After mixing the raw materials in such a manner that the atomic ratio of Bi to Ge is 〇57 <(Bi/(Bi+Ge))<0.92, hot pressing is carried out at ~840 ° C under a pressing pressure of 150 to 400 kg/cm 2 . Thus, a sintered body containing a crystal phase of three phases of BiuGeOu, BUGe^Ou, and Ge〇2 is produced; 5) A method for producing a Bi-Ge-lanthanum sintered body sputtering target as described in 4) above, in which 'mixed Ge 12 powder 14.3mol% and other 2〇3 powder 85 7m〇i%, then solid phase reaction to produce Bil2GeO20 powder; 6) Bi-Ge- Ο sintered body sputtering target as in 4) or 5) above In the production method, sintering is performed using a sintered raw material powder of cerium oxide having an average crystal grain size of 10 to 5 Å/m. The Bi-Ge-bismuth sintered body sputtering target of the present invention has an excellent effect of not causing cracks in the target during sputtering, and the particles m are less generated therein, and a high-quality film can be stably produced and obtained. It does not produce an optical recording medium in which I玍5 has recorded a 7L bit error. [Embodiment] The Bi-Ge-O sintered body sputtering target of the present invention is composed of germanium (Ge) and oxygen (0), and is characterized in that the atomic ratio of Bi to Ge is a force < (Bi /(Bi+Ge))< 〇.92, containing 3 phases of Bi, 2Ge〇2〇, Bi4Ge3〇2, and Ge〇6 201142058 as a crystal phase. The recording film of this composition is a preferable composition which can achieve high-density recording by multilayering, and can stably perform good sputtering film formation. Λ Generally, a powder of antimony trioxide (Βΐ2〇3) and cerium oxide (Ge〇2) is used as a starting material to sinter the starting material, and when the composition target is produced, it will become a phase of Bi12Ge02G and Bi4Ge3012. Coexistence composition. However, since the difference in thermal expansion coefficient of BkGeO^ is large, the thermal shock of the hairline is extremely weak, and cracking occurs during film formation at high power. In the present invention, the coefficient of thermal expansion is taken between BhGeOw and =4Ge3〇12. The value of Ge 〇 2 is used as an intermediate phase, and it is made into a phase in which the sintered body 3 phase coexists, whereby the 〇 2 phase becomes a buffer phase, and the thermal shock resistance is greatly improved. In addition, the thermal expansion coefficient of Bil2Ge〇2〇 is i 39χΐ〇5, the thermal expansion coefficient of one to two is 6.〇〇χ1〇—on the other hand, the number of sounds is 7.59Χ1 (Γ6, which is the first two) The phase between the thermal expansion coefficient can be used as an effective buffer phase. * The following advantages can be obtained: the thermal shock resistance of the target is obtained (5), thereby forming a film at high power, which can improve production efficiency. : The effect is as follows: the production of particles caused by cracks or cracks is significantly reduced, and can be produced; the film can be produced without recording bits = and the medium can be made. " The light recording is also effective for the particle average particle size of the target. 100//m or less, for the prevention of sputtering 201142058 2. Wide: The m° sintered body of the present invention _ dry, right (four) wide 0 In the case of thermal shock of minute heating, the average bending strength reduction rate before and after the thermal shock is 50% or less. Bi|2GeC>2 of the prior product coexists with Bi4Ge3〇ik 2 phase to form the above-mentioned thermal shock The average bending strength reduction rate before and after is over $(four)' relative to this A large improvement effect is obtained, thereby suppressing dry cracks caused by thermal shock, and directly evaluating m, the ratio of the three phases of the target Bil2Ge〇2Q 'Bi4Ge3〇i2 'Ge〇2 can be used in the present invention. Any adjustment within the scope of the manufacturing conditions. The ratio also depends on the degree of thermal shock of the dry plating during the money plating, that is, the film forming speed (production speed) or the structure of the sputtering device becomes an indicator for mitigating thermal shock. The use of the above-mentioned optical recording medium without sputtering is a stable high-quality 3 film' to obtain an optical recording medium which does not cause recording bit error. When manufacturing a Bi-Ge-yttrium sintered body sputtering In the case of the target, the powder of antimony trioxide and cerium oxide is used as a starting material, and the atomic ratio of (1) and & is 〇.57 <(Bi/(Bi+Ge))<〇%. Then, the mixture is powdered at _~84『c, pressure i 5〇~ under hot pressing. This makes it possible to produce a crystal containing three phases of Bii2Ge〇2〇, called 〇|2 and Ge〇2. The sintered body of the phase. The sintering condition is a preferred condition for obtaining a dry composition of uniform composition. It is preferable to produce & in the range of sintering conditions of the above range, but the reproducibility of the target quality is poor, so it is preferably in the above range. Further, the ratio of the atomic number of 1 in the above-mentioned raw material phase to Ge is 〇57<(Bi/(Bi +Ge"<〇% is directly reflected in the dry, and the composition ratio target can be obtained. 8 201142058 When manufacturing a Bi_Ge-lanthanum sintered body sputtering target, it is preferable to use as a sintering raw material for the third-phase oxidation and emulsification. Use G e 〇Λ λ. and use two powders of 0.03~89mol%,
Bi12GeO20j(^ 11 〜99.97mni〇/ 甘·*·/么 m 〇。/、亦係用以高效率地獲得含 有 Bi12Ga〇20、Bi4Ge3〇i2 及 Ge 之重要條件。 之、、,〇日日相的燒結體 又,宜為使用平均結晶粒徑為10〜50# m之氧化錯 (Ge〇2)粉末進行燒結。原因在於:於未達上述下限值時,容 易產生粉末之凝聚,而難以獲得均勻之燒結體。又,若超 過上述上限值,則經燒結之乾中會產生粗大粒子,變得容 易偏析’故宜為上述之範圍。該範圍為更佳之粉末之條件, 但藉由調整燒結條件,亦可使用該範圍以外之粉末。 關於Bll2Ge〇20粉,可於混合Ge〇2粉14 3则1%與β说 粉85.7m〇1%之後,進行固相反應,將其粉碎而事先製作。 關於B i丨2 Ge Ο 2〇粉之粒徑,並益拉泊丨职庄丨 亚無特別限制,只要約為1〇〇 m以下,則不存在問題。其 ' 在於,在本發明之燒結條件 下’不存在如Ge02之凝聚。 實施例 以下,根據實施例及比較例進行說明。再者,本實施 例僅為一例,並不受到該例任 』丨艮制即,本發明僅受到 申㈣專利範圍限制,且包括本發 種變形。 “之貫把例以外之各 (實施例1) 將純度3N(99_9%)之=氣化-心匕 一軋化一鉍與氧化鍺之粉 起始原料,並且預先準備平均粒徑 下為 仅芍12以m之Ge〇2粉及平 201142058 均粒徑為2〇em之Bii2Ge02〇粉,分別將該等以Bi與Ge 之原子數比成為〇_67之方式調合Ge02粉83.3mol%、 Bii2GeO20粉16.7mol%之後,加以混合,進而將混合後之粉 末填充於碳製模具,於溫度700°C、壓力250kg/cm2之條 件下進行熱壓。 再者’於本實施例中’以達成上述莫耳比之方式添加 Ge〇2粉、Bi^GeOzo粉’該等添加之綜合比係以成為與 GeO250.0mol%、Bi2〇350.〇mol%—致之換合比之方式進行調 整0 對熱壓後之燒結體進行精加工而製成靶。把之相對密 度為 102%(1〇〇%密度時為 7.44g/cm3)。 藉由該燒結體之X射線繞射測定,確認為Bi12Ge〇20、Bi12GeO20j (^ 11 to 99.97mni〇 / 甘·*·/ m 〇./, is also used to efficiently obtain important conditions including Bi12Ga〇20, Bi4Ge3〇i2 and Ge. The sintered body is preferably sintered by using an oxidized erbium (Ge〇2) powder having an average crystal grain size of 10 to 50 m. The reason is that when the lower limit value is not reached, the agglomeration of the powder is liable to occur, which is difficult. A uniform sintered body is obtained. When the above-mentioned upper limit is exceeded, coarse particles are generated in the dried sintering, and it is easy to segregate. Therefore, it is preferably in the above range. This range is a condition of a better powder, but by The powder can be used in addition to the range. For the Bll2Ge〇20 powder, the solid phase reaction can be carried out after mixing the Ge〇2 powder 14 3 and the β powder with the powder of 85.7 m〇1%. In advance, there is no special limitation on the particle size of B i丨2 Ge Ο 2〇 powder, and there is no special problem as long as it is less than 1〇〇m. It’s in Under the sintering conditions of the present invention, 'there is no agglomeration such as Ge02. Examples Hereinafter, according to The embodiment and the comparative example are described. Furthermore, the present embodiment is merely an example, and the present invention is not limited by the example, and the present invention is limited only by the scope of the patent application (4), and includes variations of the present invention. In addition to the examples (Example 1), the purity of 3N (99_9%) = gasification-cardioin was rolled into a starting material of cerium oxide and cerium oxide powder, and the average particle diameter was prepared in advance to be only 芍12.之Ge〇2 powder and flat 201142058 Bii2Ge02 〇 powder with a uniform particle size of 2〇em, respectively, the Ge02 powder is 83.3mol% and the Bii2GeO20 powder is 16.7mol in such a manner that the atomic ratio of Bi to Ge is 〇_67. After that, the mixture was mixed, and the mixed powder was filled in a carbon mold, and hot pressed at a temperature of 700 ° C and a pressure of 250 kg/cm 2 . Further, in the present embodiment, the above molar ratio was achieved. The method of adding Ge〇2 powder and Bi^GeOzo powder's added ratio is adjusted to be a ratio of GeO250.0 mol% and Bi2〇350.〇mol%, and the ratio is adjusted to 0. The sintered body is finished to be a target, and the relative density is 102% (7.44 g/cm3 at a density of 1%) By the X-ray diffraction measurement of the sintered body was confirmed as Bi12Ge〇20,
Bi4Ge3〇12、Ge02之3相構造。將其結果示於表i。 接著,對該靶施加2001、30分鐘加熱之熱衝擊。然 後,實施JIS標準1601之彎曲試驗(自靶中之任意部位5處, 選取寬度為4±0_lmm、高度為3±0.lmm、長度為4〇〜5〇mm 之試驗片進行測定,求出5處之測定結果之平均值),測定 該熱衝擊前後之平均彎曲強度比(強度之降低率)。因測定部 位不同而產生稍許偏差,但任一者均未達5〇%,強度之降 低率低。 其次,使用該靶,以2kW之功率進行濺鍍。其結果, 靶未產生裂縫或龜裂,與下述之比較例相比,粒子之產生 顯者變少。 其結果,本發明之實施例係具有如下優異效果的良好 201142058 之靶:不會產生裂縫,可提高生產效率且可穩定地製作高 品質之薄膜,能夠獲得不會產生記錄位元誤碼之光記錄媒 體。 11 201142058 平均彎曲強度 降低率(%) 5 § Ge〇2粒徑 (^m) <N (N Bi4Ge3〇i2 〇 〇 〇 〇 結晶相 Bii2Ge〇2〇 〇 〇 〇 〇 Ge〇2 〇 〇 1 1 Bi2〇3 1 1 1 1 原料粉摻合量/mol% B12O3 Ge〇2 Bii2Ge〇2〇 16.7 33.3 1 16.7 83.3 66.7 0 83.3 1 1 1 Bi/(Bi + Ge) 0.67 0.80 0.67 0.67 乾組成/mol% B12O3 Ge〇2 〇 33.3 66.7 I實施例11 1實施例2 1 比較例1 比較例2 201142058 (實施例2) 將純度3Ν(99·9%)之二氧化二纽與氧化鍺之粉末作為 起始原料,並且預先準備平均粒徑為〗2 # m之Ge〇2粉及平 均粒控為20 # m之ΒίκόεΟπ粉’分別將該等以Bi與〜 之原子數比成為0.80之方式調合〇6〇2粉66 7m〇1%、 BiuGeOuS 33.3mol%之後,加以混合,進而將混合後之粉 末填充於碳製模具,於溫度700t:、壓力25〇kg/cm2之條 件下進行熱壓。 咬取上返昊耳比之方式添加 丹者,於本實 以〇2粉、Bl|2Ge〇2G #,該等添加之综合比係以成為與Biphase structure of Bi4Ge3〇12 and Ge02. The results are shown in Table i. Next, a thermal shock of heating for 2001 and 30 minutes was applied to the target. Then, the bending test of JIS Standard 1601 was carried out (measured from 5 points at any position in the target, and a test piece having a width of 4 ± 0_1 mm, a height of 3 ± 0.1 mm, and a length of 4 〇 to 5 〇 mm was selected and determined. The average of the measurement results at 5 points), and the average bending strength ratio (rate of reduction of strength) before and after the thermal shock was measured. There is a slight deviation due to the difference in the measurement position, but none of them is less than 5〇%, and the rate of decrease in strength is low. Next, using this target, sputtering was performed at a power of 2 kW. As a result, cracks or cracks did not occur in the target, and the generation of particles was less likely to occur than in the comparative examples described below. As a result, the embodiment of the present invention is a target of good 201142058 which has the following excellent effects: no crack is generated, productivity can be improved, and a high-quality film can be stably produced, and light which does not cause recording bit error can be obtained. Record media. 11 201142058 Average bending strength reduction rate (%) 5 § Ge〇2 particle size (^m) <N (N Bi4Ge3〇i2 〇〇〇〇 crystal phase Bii2Ge〇2〇〇〇〇〇Ge〇2 〇〇1 1 Bi2〇3 1 1 1 1 Raw material powder blending amount/mol% B12O3 Ge〇2 Bii2Ge〇2〇16.7 33.3 1 16.7 83.3 66.7 0 83.3 1 1 1 Bi/(Bi + Ge) 0.67 0.80 0.67 0.67 Dry composition/mol% B12O3 Ge〇2 〇33.3 66.7 I Example 11 1 Example 2 1 Comparative Example 1 Comparative Example 2 201142058 (Example 2) A powder having a purity of 3 Ν (99·9%) of dioxon and cerium oxide was used as a starting point Raw materials, and Ge 〇 2 powder having an average particle diameter of 〖2 # m and Βίκό ε Ο π powder having an average particle size of 20 # m are prepared in advance, and the ratio of the atomic ratio of Bi to ~ is 0.80, respectively. 2 powder 66 7 m〇1% and BiuGeOuS 33.3 mol%, and then mixed, and the mixed powder was filled in a carbon mold, and hot pressed at a temperature of 700 t: and a pressure of 25 〇 kg/cm 2 . In the case of returning to the ear, the addition of Dan is in the form of 〇2 powder, Bl|2Ge〇2G #, and the added ratio of these additions is
Ge〇233.3mol%、Bi2〇366.7mol%一致之摻合比之方式進行 整。 . °° 對熱壓後之燒結體進行精加工而製成把。乾之相對密 度為 95.9%(1〇〇%密度時為 7 58g/cm3)。 藉由該燒結體之X射線繞射測定,確認為Bi|2Ge〇2、 、Ge〇2之3相構造。將其結果示於表1。 20 其次’對該乾施加200t、30分鐘加熱之 。缺 後’霄施JIS標準1601之彎曲試驗,測定該熱衝 =曲f度比(強度之降低率)。因測定部位不同而產生稀 許偏差,但任一者均未達5〇% ’強度之降低率低。生稍 其次,使用該乾,以2kW之功率進㈣H 靶未產生裂縫或龜裂,粒子之產生亦少。 ,、、、、。果, 其結果,本發明之實施例係具有如下優 之靶:不會產生裂、縫,可提高生產效 二:良好 慑义地製作高 13 201142058 品質之薄膜’能夠獲得不會產生記錄位元誤碼之光記錄媒 體。 (比較例1) 將純度3N(99.9%)之三氧化二鉍與氧化鍺之粉末作為 起始原料,分別將該等以Bi與Ge之原子數比成為〇 67之 方式調合平均粒徑為5以m之GeCh粉50_〇m〇l%、平均粒徑 為20 // m之Bi2〇3粉50.0mol%之後,加以混合,進而將混 合後之粉末填充於碳製模具,於溫度73(rc、壓力25〇kg/ cm2之條件下進行熱壓。 對熱壓後之燒結體進行精加工而製成靶。靶之相對密 度為 103%(100%密度時為 7.44g/cm3)。 藉由該燒結體之X射線繞射測走,確認靶之結晶相為The blend ratio of Ge〇233.3 mol% and Bi2〇366.7 mol% was adjusted. ° ° The sintered body after hot pressing is finished to make a handle. The relative density of the dry is 95.9% (7 58 g/cm3 at 1% density). The X-ray diffraction measurement of the sintered body confirmed the three-phase structure of Bi|2Ge〇2 and Ge〇2. The results are shown in Table 1. 20 Next, apply 200t for 30 minutes and heat for 30 minutes. In the absence of the bending test of JIS Standard 1601, the thermal shock = the ratio of the curvature f (the rate of decrease in strength) was measured. Difficult deviations occur due to differences in measurement sites, but none of them are as low as 5〇%. Secondly, using this dry material, the (4) H target is not cracked or cracked at a power of 2 kW, and the generation of particles is small. ,,,,,. As a result, the embodiment of the present invention has the following excellent targets: no cracking or seaming can be produced, and the production efficiency can be improved. 2: Producing a high-quality film of 201142058 quality can be obtained without generating recording bits. Error light recording media. (Comparative Example 1) A powder having a purity of 3N (99.9%) of antimony trioxide and cerium oxide was used as a starting material, and the average particle diameter was 5 such that the atomic ratio of Bi to Ge was 〇67. After the GeCh powder of 50 m_〇m〇l% and the Bi2〇3 powder having an average particle diameter of 20 // m 50.0 mol%, the mixture was mixed, and the mixed powder was filled in a carbon mold at a temperature of 73 ( The hot melt was performed under the conditions of rc and a pressure of 25 〇kg/cm2. The sintered body after the hot pressing was finished to obtain a target, and the relative density of the target was 103% (7.44 g/cm3 at 100% density). The X-ray diffraction of the sintered body was measured and confirmed, and the crystal phase of the target was confirmed to be
Bii2Ge02〇、Bi4Ge3012 之 2 相構造。 其次,對該靶施加20CTC、30分鐘加熱之熱衝擊。然 後,實施JIS1601之平均彎曲強度試驗❺同樣地將該熱衝擊 前後之平均彎曲強度比(強度之降低率)之測定結果示於表 1。 ' 其結果’平均彎曲強度之降低率為82%。使用該把, 以2kW之功率進行濺鍍。其結果,濺鍍中靶產生裂縫。又, 與實施例相比,粒子之產生顯著增加。認為其原因係濺鍍 中之靶之裂縫》 又 (比較例2) 將純度3N(99_9%)之三氧化二鉍與氧化鍺之粉末作為 起始原料,並且預先準備平均粒徑為Ge〇2粉及平 201142058 均粒徑為20 μ m之Bi丨2Ge02〇粉,分別將該等以Bi與Ge 之原子數比成為0·67之方式調合Ge02粉83.3mol% ' Bi12GeO20粉16.7mol%之後,力σ以混合,進而將混合後之粉 末填充於碳製模具,於溫度700°C、壓力250kg/cm2之條 件下進行熱壓。 再者,於本實施例中,以達成上述莫耳比之方式添加 GeCh粉、Bi^GeOu粉,該等添加之综合比係以成為與 GeO25 0.0m〇l%、Bi20350.0mol%—致之摻合比之方式進行調 整0 對熱壓後之燒結體進行精加工而製成靶。靶之相對密 度為 103%(10〇%密度時為 7.58g/cm3)。 藉由該燒結體之X射線繞射測定,確認Ge〇全量反 應’且為 Bil2Ge〇2Q、Bi4Ge3〇i2 之 2 相構造。 其久’對s亥乾施加2 0 0 C、3 0分鐘加熱之熱衝擊。然 後’實施JIS 1 60 1之平均彎曲強度試驗。同樣地將該熱衡擊 月後之平均彎曲強度比(強度之降低率)之測定結果示於表 1 ° 其結果’平均彎曲強度之降低率為80%。使用該靶’ 以2kW之功率進行濺鍍。其結果,濺鍍中靶產生裂縫。又, 與實施例相比,粒子之產生顯著增加。認為其原因係濺鍍 中之靶之裂縫。 產業上之可利用性 根據本發明之Bl — Ge 一 〇系燒結體濺鍍靶及該靶之製 迖方法’具有如下之優異效果:於濺鍍時不會產生靶之裂 15 201142058 縫,粒子之產生少,可穩定地製作高品質之薄膜,且可獲 得不會產生記錄位元誤碼之光記錄媒體。可提供一種能夠 提高光記錄媒體之成膜之生產效率,適於製造光記錄媒體 之乾。 【圖式簡單說明】 無 【主要元件符號說明】 無 162-phase structure of Bii2Ge02〇 and Bi4Ge3012. Next, a thermal shock of 20 CTC and heating for 30 minutes was applied to the target. Then, the average bending strength test of JIS1601 was carried out, and the measurement results of the average bending strength ratio (reduction rate of strength) before and after the thermal shock were similarly shown in Table 1. 'The result' The average bending strength reduction rate was 82%. Using this handle, sputtering was performed at a power of 2 kW. As a result, cracks are generated in the target during sputtering. Moreover, the generation of particles is significantly increased as compared with the examples. It is considered that the cause is a crack in the target in sputtering. (Comparative Example 2) A powder of trioxide and cerium oxide having a purity of 3N (99% to 9%) is used as a starting material, and an average particle diameter of Ge 〇 2 is prepared in advance. Powder and flat 201142058 Bi丨2Ge02〇 powder with a particle size of 20 μm, respectively, after blending the Ge02 powder 83.3mol% 'Bi12GeO20 powder 16.7mol% with the atomic ratio of Bi to Ge to be 0.66, The force σ was mixed, and the mixed powder was filled in a carbon mold, and hot pressed at a temperature of 700 ° C and a pressure of 250 kg/cm 2 . Furthermore, in the present embodiment, GeCh powder and Bi^GeOu powder are added in such a manner as to achieve the above molar ratio, and the combined ratios of the additions are 0.0m〇l% and Bi20350.0mol% of GeO25. Adjustment by blending method 0 The sintered body after hot pressing is finished to form a target. The relative density of the target was 103% (7.58 g/cm3 at 10% density). From the X-ray diffraction measurement of the sintered body, it was confirmed that the Ge 〇 total amount reacted and was a two-phase structure of Bil2Ge〇2Q and Bi4Ge3〇i2. For a long time, it applied a thermal shock of 200 ° C for 30 minutes to dry. Then, the average bending strength test of JIS 1 60 1 was carried out. Similarly, the measurement result of the average bending strength ratio (reduction rate of the strength) after the heat balance was shown in Table 1 °, and the result of the decrease in the average bending strength was 80%. This target was used to perform sputtering at a power of 2 kW. As a result, cracks are generated in the target during sputtering. Moreover, the generation of particles is significantly increased as compared with the examples. The cause is considered to be a crack in the target in the sputtering. INDUSTRIAL APPLICABILITY The B1-Ge-bismuth sintered body sputtering target and the method for preparing the target according to the present invention have the following excellent effects: no cracking of the target occurs during sputtering 15 201142058 slit, particle The production is small, and a high-quality film can be stably produced, and an optical recording medium that does not cause a recording bit error can be obtained. It is possible to provide a production efficiency capable of improving the film formation of an optical recording medium, and is suitable for manufacturing an optical recording medium. [Simple diagram description] None [Main component symbol description] None 16
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