TWI409136B - 表面具微溝槽之化學機械平坦化墊 - Google Patents
表面具微溝槽之化學機械平坦化墊 Download PDFInfo
- Publication number
- TWI409136B TWI409136B TW096126187A TW96126187A TWI409136B TW I409136 B TWI409136 B TW I409136B TW 096126187 A TW096126187 A TW 096126187A TW 96126187 A TW96126187 A TW 96126187A TW I409136 B TWI409136 B TW I409136B
- Authority
- TW
- Taiwan
- Prior art keywords
- pad
- insoluble
- grooves
- micro
- polishing
- Prior art date
Links
- 239000000126 substance Substances 0.000 title claims description 9
- 238000005498 polishing Methods 0.000 claims abstract description 82
- 239000000835 fiber Substances 0.000 claims abstract description 81
- 238000000034 method Methods 0.000 claims abstract description 18
- 238000007517 polishing process Methods 0.000 claims abstract description 6
- 239000002002 slurry Substances 0.000 claims description 36
- 238000002844 melting Methods 0.000 claims description 19
- 239000004744 fabric Substances 0.000 claims description 17
- 230000008018 melting Effects 0.000 claims description 16
- 239000000203 mixture Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 11
- 229920000642 polymer Polymers 0.000 claims description 6
- 239000000853 adhesive Substances 0.000 claims description 4
- 230000001070 adhesive effect Effects 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 4
- 239000003795 chemical substances by application Substances 0.000 claims description 4
- 239000011230 binding agent Substances 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 3
- 239000002952 polymeric resin Substances 0.000 claims description 3
- 229920003002 synthetic resin Polymers 0.000 claims description 3
- 239000003054 catalyst Substances 0.000 claims description 2
- 230000003993 interaction Effects 0.000 claims description 2
- 239000006174 pH buffer Substances 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims description 2
- 239000004094 surface-active agent Substances 0.000 claims description 2
- 239000002759 woven fabric Substances 0.000 claims description 2
- 238000000137 annealing Methods 0.000 claims 1
- 238000010030 laminating Methods 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 16
- 239000004745 nonwoven fabric Substances 0.000 description 14
- 229910003460 diamond Inorganic materials 0.000 description 6
- 239000010432 diamond Substances 0.000 description 6
- -1 polyethylene Polymers 0.000 description 5
- 239000004734 Polyphenylene sulfide Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229920000069 polyphenylene sulfide Polymers 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 238000000465 moulding Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 235000012431 wafers Nutrition 0.000 description 3
- 229920001730 Moisture cure polyurethane Polymers 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 239000002195 soluble material Substances 0.000 description 2
- 238000009966 trimming Methods 0.000 description 2
- 229920000742 Cotton Polymers 0.000 description 1
- 229920000858 Cyclodextrin Polymers 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- 229920000297 Rayon Polymers 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229920002125 Sokalan® Polymers 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000002657 fibrous material Substances 0.000 description 1
- 238000007730 finishing process Methods 0.000 description 1
- 150000004676 glycans Chemical class 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000000017 hydrogel Substances 0.000 description 1
- 239000011344 liquid material Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 238000005289 physical deposition Methods 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 239000004584 polyacrylic acid Substances 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920001282 polysaccharide Polymers 0.000 description 1
- 239000005017 polysaccharide Substances 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000002964 rayon Substances 0.000 description 1
- 239000004627 regenerated cellulose Substances 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 239000005871 repellent Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- HFHDHCJBZVLPGP-UHFFFAOYSA-N schardinger α-dextrin Chemical compound O1C(C(C2O)O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC(C(O)C2O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC2C(O)C(O)C1OC2CO HFHDHCJBZVLPGP-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83159506P | 2006-07-19 | 2006-07-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200810878A TW200810878A (en) | 2008-03-01 |
| TWI409136B true TWI409136B (zh) | 2013-09-21 |
Family
ID=38957633
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096126187A TWI409136B (zh) | 2006-07-19 | 2007-07-18 | 表面具微溝槽之化學機械平坦化墊 |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US8137166B2 (enExample) |
| EP (1) | EP2040878A4 (enExample) |
| JP (1) | JP5460316B2 (enExample) |
| KR (1) | KR101409377B1 (enExample) |
| CN (1) | CN101511533B (enExample) |
| CA (1) | CA2658127A1 (enExample) |
| MY (1) | MY151014A (enExample) |
| TW (1) | TWI409136B (enExample) |
| WO (1) | WO2008011535A2 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI754275B (zh) * | 2015-10-16 | 2022-02-01 | 美商應用材料股份有限公司 | 拋光墊及形成其之方法 |
| US11772229B2 (en) | 2016-01-19 | 2023-10-03 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
Families Citing this family (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9180570B2 (en) | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
| CN101990483B (zh) * | 2008-04-01 | 2013-10-16 | 音诺帕德股份有限公司 | 具有经控制的孔隙形态的抛光垫 |
| JP2011517111A (ja) * | 2008-04-11 | 2011-05-26 | イノパッド,インコーポレイテッド | ボイドネットワークを有する化学機械的平坦化パッド |
| TWI409137B (zh) * | 2008-06-19 | 2013-09-21 | Bestac Advanced Material Co Ltd | 研磨墊及其微型結構形成方法 |
| US9276747B2 (en) * | 2008-08-04 | 2016-03-01 | Technology Policy Associates, Llc | Remote profile security system |
| US8435099B2 (en) | 2009-01-27 | 2013-05-07 | Innopad, Inc. | Chemical-mechanical planarization pad including patterned structural domains |
| SG173547A1 (en) | 2009-02-12 | 2011-09-29 | Innopad Inc | Three-dimensional network in cmp pad |
| USD678745S1 (en) * | 2011-07-07 | 2013-03-26 | Phuong Van Nguyen | Spinning insert polishing pad |
| US20130205679A1 (en) * | 2012-02-14 | 2013-08-15 | Innopad, Inc. | Method of manufacturing a chemical mechanical planarization pad |
| US9308620B2 (en) | 2013-09-18 | 2016-04-12 | Texas Instruments Incorporated | Permeated grooving in CMP polishing pads |
| KR102347711B1 (ko) | 2014-04-03 | 2022-01-06 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법 |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| CN107078048B (zh) | 2014-10-17 | 2021-08-13 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US9643294B2 (en) * | 2015-07-14 | 2017-05-09 | K&D Pads LLC | Buffing pad and methods of making and using the same |
| KR20230169424A (ko) | 2015-10-30 | 2023-12-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 원하는 제타 전위를 가진 연마 제품을 형성하는 장치 및 방법 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| JP6829037B2 (ja) * | 2016-09-30 | 2021-02-10 | 富士紡ホールディングス株式会社 | 研磨パッド及びその製造方法 |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| JP7273796B2 (ja) * | 2017-08-25 | 2023-05-15 | スリーエム イノベイティブ プロパティズ カンパニー | 表面突起研磨パッド |
| JP6980509B2 (ja) * | 2017-12-12 | 2021-12-15 | 富士紡ホールディングス株式会社 | 研磨パッド及び研磨加工物の製造方法 |
| CN112654655A (zh) | 2018-09-04 | 2021-04-13 | 应用材料公司 | 先进抛光垫配方 |
| KR102674356B1 (ko) * | 2019-06-19 | 2024-06-11 | 주식회사 쿠라레 | 연마 패드, 연마 패드의 제조 방법 및 연마 방법 |
| CN111515872B (zh) * | 2020-04-10 | 2022-01-11 | 广东大市智能装备有限公司 | 一种中空金刚石的粉末冶金一体成型方法 |
| CN112809550B (zh) * | 2020-12-31 | 2022-04-22 | 湖北鼎汇微电子材料有限公司 | 一种抛光垫 |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| US11951590B2 (en) | 2021-06-14 | 2024-04-09 | Applied Materials, Inc. | Polishing pads with interconnected pores |
| USD1004393S1 (en) * | 2021-11-09 | 2023-11-14 | Ehwa Diamond Industrial Co., Ltd. | Grinding pad |
| CN117103107A (zh) * | 2022-05-16 | 2023-11-24 | 成都高真科技有限公司 | 还原料浆用抛光装置 |
| USD1000928S1 (en) * | 2022-06-03 | 2023-10-10 | Beng Youl Cho | Polishing pad |
| CN114918824B (zh) * | 2022-06-29 | 2024-08-20 | 万华化学集团电子材料有限公司 | 一种具有径向微沟槽的抛光垫 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5584146A (en) * | 1995-04-10 | 1996-12-17 | Applied Materials, Inc. | Method of fabricating chemical-mechanical polishing pad providing polishing uniformity |
| US20030207661A1 (en) * | 2002-05-01 | 2003-11-06 | Alexander Tregub | Annealing of CMP polishing pads |
| US20040224622A1 (en) * | 2003-04-15 | 2004-11-11 | Jsr Corporation | Polishing pad and production method thereof |
| US20050255794A1 (en) * | 2004-05-11 | 2005-11-17 | Jean Vangsness | Polishing pad |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2668016B2 (ja) * | 1988-09-21 | 1997-10-27 | スピードファム株式会社 | ポリッシングパッド及びその製造方法 |
| US6337280B1 (en) * | 1998-05-11 | 2002-01-08 | Kabushiki Kaisha Toshiba | Polishing cloth and method of manufacturing semiconductor device using the same |
| US6656018B1 (en) * | 1999-04-13 | 2003-12-02 | Freudenberg Nonwovens Limited Partnership | Polishing pads useful in chemical mechanical polishing of substrates in the presence of a slurry containing abrasive particles |
| US6953388B2 (en) * | 1999-12-22 | 2005-10-11 | Toray Industries, Inc. | Polishing pad, and method and apparatus for polishing |
| US6712681B1 (en) | 2000-06-23 | 2004-03-30 | International Business Machines Corporation | Polishing pads with polymer filled fibrous web, and methods for fabricating and using same |
| US6383066B1 (en) | 2000-06-23 | 2002-05-07 | International Business Machines Corporation | Multilayered polishing pad, method for fabricating, and use thereof |
| US6964604B2 (en) * | 2000-06-23 | 2005-11-15 | International Business Machines Corporation | Fiber embedded polishing pad |
| CA2441419A1 (en) * | 2000-11-20 | 2002-12-19 | International Business Machines Corporation | Polishing pads with polymer filled fibrous web, and methods for fabricating and using same |
| WO2003058698A1 (en) * | 2001-12-28 | 2003-07-17 | Asahi Kasei Emd Corporation | Polishing pad, process for producing the same, and method of polishing |
| US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
| KR100669301B1 (ko) * | 2002-06-03 | 2007-01-16 | 제이에스알 가부시끼가이샤 | 연마 패드 및 복층형 연마 패드 |
| TWI228768B (en) * | 2002-08-08 | 2005-03-01 | Jsr Corp | Processing method of polishing pad for semiconductor wafer and polishing pad for semiconductor wafer |
| JP2004071985A (ja) | 2002-08-08 | 2004-03-04 | Jsr Corp | 半導体ウェハ用研磨パッドの加工方法及び半導体ウェハ用研磨パッド |
| JP4039214B2 (ja) * | 2002-11-05 | 2008-01-30 | Jsr株式会社 | 研磨パッド |
| TW592894B (en) * | 2002-11-19 | 2004-06-21 | Iv Technologies Co Ltd | Method of fabricating a polishing pad |
| KR20040093402A (ko) | 2003-04-22 | 2004-11-05 | 제이에스알 가부시끼가이샤 | 연마 패드 및 반도체 웨이퍼의 연마 방법 |
| JP2008000831A (ja) * | 2006-06-20 | 2008-01-10 | Saitama Univ | 研磨パッドの製造方法 |
| FR2933004B1 (fr) | 2008-06-27 | 2010-08-20 | Inst Francais Du Petrole | Solution absorbante contenant un inhibiteur de degradation derive du thiadiazole et methode pour limiter la degradation d'une solution absorbante |
-
2007
- 2007-07-18 TW TW096126187A patent/TWI409136B/zh active
- 2007-07-19 JP JP2009521007A patent/JP5460316B2/ja active Active
- 2007-07-19 US US11/780,373 patent/US8137166B2/en active Active
- 2007-07-19 WO PCT/US2007/073921 patent/WO2008011535A2/en not_active Ceased
- 2007-07-19 CA CA002658127A patent/CA2658127A1/en not_active Abandoned
- 2007-07-19 MY MYPI20090236 patent/MY151014A/en unknown
- 2007-07-19 CN CN2007800324668A patent/CN101511533B/zh active Active
- 2007-07-19 KR KR1020097003292A patent/KR101409377B1/ko active Active
- 2007-07-19 EP EP07813129A patent/EP2040878A4/en not_active Withdrawn
-
2012
- 2012-03-16 US US13/422,165 patent/US8900036B2/en active Active
-
2014
- 2014-11-04 US US14/532,232 patent/US9375822B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5584146A (en) * | 1995-04-10 | 1996-12-17 | Applied Materials, Inc. | Method of fabricating chemical-mechanical polishing pad providing polishing uniformity |
| US20030207661A1 (en) * | 2002-05-01 | 2003-11-06 | Alexander Tregub | Annealing of CMP polishing pads |
| US20040224622A1 (en) * | 2003-04-15 | 2004-11-11 | Jsr Corporation | Polishing pad and production method thereof |
| US20050255794A1 (en) * | 2004-05-11 | 2005-11-17 | Jean Vangsness | Polishing pad |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI754275B (zh) * | 2015-10-16 | 2022-02-01 | 美商應用材料股份有限公司 | 拋光墊及形成其之方法 |
| US11772229B2 (en) | 2016-01-19 | 2023-10-03 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
Also Published As
| Publication number | Publication date |
|---|---|
| US8137166B2 (en) | 2012-03-20 |
| WO2008011535A3 (en) | 2008-10-02 |
| EP2040878A2 (en) | 2009-04-01 |
| JP2009543709A (ja) | 2009-12-10 |
| US20120178348A1 (en) | 2012-07-12 |
| WO2008011535A2 (en) | 2008-01-24 |
| MY151014A (en) | 2014-03-31 |
| US20080085661A1 (en) | 2008-04-10 |
| TW200810878A (en) | 2008-03-01 |
| JP5460316B2 (ja) | 2014-04-02 |
| CA2658127A1 (en) | 2008-01-24 |
| US20150056894A1 (en) | 2015-02-26 |
| US8900036B2 (en) | 2014-12-02 |
| CN101511533A (zh) | 2009-08-19 |
| EP2040878A4 (en) | 2012-09-12 |
| KR20090031629A (ko) | 2009-03-26 |
| US9375822B2 (en) | 2016-06-28 |
| KR101409377B1 (ko) | 2014-06-20 |
| CN101511533B (zh) | 2012-10-10 |
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