TWI408781B - Apparatus for forming protective tape on chip scale package and method of the same - Google Patents
Apparatus for forming protective tape on chip scale package and method of the same Download PDFInfo
- Publication number
- TWI408781B TWI408781B TW100102733A TW100102733A TWI408781B TW I408781 B TWI408781 B TW I408781B TW 100102733 A TW100102733 A TW 100102733A TW 100102733 A TW100102733 A TW 100102733A TW I408781 B TWI408781 B TW I408781B
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- protective film
- support plate
- substrate
- forming
- Prior art date
Links
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
本發明係有關於一種晶片級封裝,更特定而言,是有關於一種形成保護膜於晶片級封裝上之方法。This invention relates to a wafer level package and, more particularly, to a method of forming a protective film on a wafer level package.
在半導體元件領域中,元件之密度持續增加,且體積逐漸減小。高密度元件之封裝或交互連接技術的需求亦日益增加,以符合上述情況。晶粒封裝之功能包含電源分配、訊號分配、散熱、保護及支撐等。由於半導體結構趨向複雜化,而一般傳統技術,例如導線封裝(lead frame package)、軟性封裝(flex package)、剛性封裝(rigid package)技術,已無法達成於晶粒上產生具有高密度元件之小型晶粒。再者,由於晶粒封裝技術與積體電路之發展有密切關聯,因此封裝技術對於電子元件之尺寸要求越來越高。基於上述之理由,現今之封裝技術已逐漸趨向採用球柵陣列封裝(ball grid array,BGA)、覆晶球柵陣列封裝(flip chip ball grid array,FC-BGA)、晶片尺寸封裝(chip scale package,CSP)之技術。In the field of semiconductor components, the density of components continues to increase, and the volume gradually decreases. The need for packaging or interconnect technology for high density components is also increasing to meet the above. The functions of the die package include power distribution, signal distribution, heat dissipation, protection and support. Due to the complication of semiconductor structures, conventional technologies such as lead frame packages, flex packages, and rigid package technologies have been unable to achieve small-sized devices with high-density components. Grain. Moreover, since the die-packaging technology is closely related to the development of the integrated circuit, the packaging technology is increasingly required for the size of the electronic component. For the above reasons, today's packaging technologies have gradually adopted ball grid array (BGA), flip chip ball grid array (FC-BGA), chip scale package. , CSP) technology.
晶片級封裝可以使得晶片面積與封裝面積約為球柵陣列封裝的1/3,或者相當於小型化封裝記憶體晶片面積的1/6。因此,在晶片級封裝之下,相同體積可以配置更多的積體電路晶片,從而增大單位容量。換言之,與球陣列封裝相比,相同空間下的晶片級封裝可以將儲存容量提升約三倍。晶片級封裝不但具有體積小的優點,同時封裝厚度更薄,通常其金屬基板到散熱體的最有效散熱路徑僅有0.2mm或者更小,大大提升了晶片在長時間運作後的可靠性,並且線路阻抗顯著減小,元件的運作速度也隨之得到大幅度的提升。The wafer level package can have a wafer area and package area of about 1/3 of the ball grid array package, or 1/6 of the area of the miniaturized package memory chip. Therefore, under the wafer level package, the same volume can be configured with more integrated circuit chips, thereby increasing the unit capacity. In other words, wafer-level packaging in the same space can increase storage capacity by a factor of about three compared to ball array packages. The wafer-level package not only has the advantage of small size, but also has a thinner package thickness. Generally, the most effective heat dissipation path of the metal substrate to the heat sink is only 0.2 mm or less, which greatly improves the reliability of the wafer after long-term operation, and The line impedance is significantly reduced and the operating speed of the components is greatly improved.
晶片級封裝的封裝單元在運送的過程中容易造成刮傷、靜電或是粉塵(particles)的污染,刮傷、靜電或是粉塵污染會影響其影像擷取品質甚至電性失效,所以在晶片級封裝的晶片之上形成一保護膜以防止粉塵的污染。然而,傳統的晶片級封裝之晶片之上形成保護膜的方法,係透過手動方式一個一個地(piece by piece)將保護膜貼附於晶片上。此種方法不容易將單一保護膜準確地對準晶片,容易產生保護膜貼合製程的不良率,並且對於大量的晶片級封裝之晶片之保護膜貼附需花費較多時間。Wafer-level packaged packaging units are prone to scratches, static electricity, or contamination of particles during transport. Scratches, static electricity, or dust contamination can affect image capture quality or even electrical failure, so at the wafer level. A protective film is formed over the packaged wafer to prevent dust contamination. However, a conventional method of forming a protective film on a wafer of a wafer level package is to attach a protective film to a wafer by hand by piece. This method does not easily align a single protective film to the wafer accurately, which tends to cause a defective rate of the protective film bonding process, and it takes a lot of time to attach a protective film to a large number of wafer-level packaged wafers.
因此,鑑於傳統保護膜於晶片級封裝之晶片上之形成方法具有上述缺點,本發明提供一種優於習知保護膜貼附於晶片級封裝之晶片上之方法以克服上述缺點。Therefore, in view of the above-described disadvantages of the conventional protective film formation method on a wafer-level packaged wafer, the present invention provides a method of attaching a conventional protective film to a wafer of a wafer level package to overcome the above disadvantages.
有鑑於此,本發明之主要目的在於提供一種形成保護膜於晶片尺寸封裝(CSP)之晶片上之裝置及其形成方法,其係利用多種治具之搭配以提升保護膜的貼附效率與組裝的精確度。In view of the above, the main object of the present invention is to provide a device for forming a protective film on a wafer size package (CSP) and a method for forming the same, which utilizes a plurality of jigs to improve the adhesion efficiency and assembly of the protective film. The accuracy.
本發明之另一目的在於提供一種保護膜於晶片上之形成方法,其可以容易貼附保護膜於晶片上,使保護膜均勻、準確地附著於晶片上。Another object of the present invention is to provide a method for forming a protective film on a wafer, which can easily attach a protective film to a wafer to uniformly and accurately adhere the protective film to the wafer.
本發明之再一目的在於提供一種保護膜於晶片上之形成方法,其可以允許保護膜依群組的方式放(配)置。It is still another object of the present invention to provide a method of forming a protective film on a wafer which allows the protective film to be placed in a group.
本發明之又一目的就是在提供一種保護膜於晶片上之形成方法,利用更低的成本組裝保護膜於晶片上,以節省產品的成本。It is still another object of the present invention to provide a method of forming a protective film on a wafer by assembling a protective film on the wafer at a lower cost to save product cost.
綜上所述,依據本發明之一觀點,提出一種形成保護膜於晶片上之裝置,包括一外罩組件,其包括一外罩、至少一導引桿及至少一壓桿,導引桿配置於外罩之二側,壓桿接合於導引桿上以利於在導引桿上滑動;一晶片盤,係用於承載複數個晶片,其上具有複數個凹洞以利於複數個晶片嵌入於其中;一基板組件,係用於支撐晶片盤及固定外罩組件,基板組件包括一基板、至少一夾具及一支撐板,基板係用於承載支撐板與夾具,夾具係配置於基板的二側之上以利於夾緊外罩組件,支撐板具有至少一彈性元件以用於支撐晶片盤;以及一轉貼膜,係用於承載複數個保護膜單元,以利於將複數個保護膜單元附著於複數個晶片之上。In summary, according to one aspect of the present invention, a device for forming a protective film on a wafer is provided, comprising a cover assembly including an outer cover, at least one guiding rod and at least one pressing rod, the guiding rod being disposed on the outer cover On the second side, the pressing rod is coupled to the guiding rod to facilitate sliding on the guiding rod; a wafer disc is used to carry a plurality of wafers having a plurality of recesses therein to facilitate embedding a plurality of wafers therein; The substrate assembly is used for supporting the wafer tray and the fixed cover assembly. The substrate assembly comprises a substrate, at least one clamp and a support plate. The substrate is used for carrying the support plate and the clamp, and the clamp is disposed on two sides of the substrate to facilitate The outer cover assembly is clamped, the support plate has at least one elastic member for supporting the wafer disk, and a transfer film for carrying a plurality of protective film units to facilitate attaching the plurality of protective film units to the plurality of wafers.
上述裝置更包含一導引桿支架用於支撐導引桿而一起配置於外罩之二側,以及一軟墊置放於支撐板之上,以支撐複數個晶片。The device further includes a guiding rod bracket for supporting the guiding rod and disposed on two sides of the outer cover, and a cushion placed on the supporting plate to support the plurality of wafers.
依據本發明之另一觀點,提出一種保護膜於晶片上之形成方法,其包括首先提供一支撐板,用於承載一晶片盤,以固定晶片盤的位置,晶片盤上可配置複數個晶片;然後,提供一轉貼膜,具有複數個保護膜單元附著於其底面上,將轉貼膜置放於一外罩組件之上;之後,將外罩組件置放於支撐板之上,使轉貼膜上的複數個保護膜單元對準晶片盤上的該複數個晶片;接下來,利用一夾具以下壓外罩組件,使得複數個保護膜單元貼附於複數個晶片之表面;然後,利用一導引桿,使得一壓桿於外罩組件上從第一端移動至第二端;將轉貼膜之一端壓合於第一壓桿與第二壓桿之間;利用移動轉貼膜,以分離轉貼膜與外罩;最後,移開夾具,並分離外罩組件與支撐板,以完成轉印轉貼膜上之複數個保護膜單元於複數個晶片之上。According to another aspect of the present invention, a method for forming a protective film on a wafer is provided, which comprises first providing a support plate for carrying a wafer disk to fix the position of the wafer disk, and a plurality of wafers can be disposed on the wafer disk; Then, a transfer film is provided, a plurality of protective film units are attached to the bottom surface thereof, and the transfer film is placed on a cover assembly; after that, the cover assembly is placed on the support plate to make the plurality of transfer films The protective film unit is aligned with the plurality of wafers on the wafer tray; next, the outer cover assembly is pressed by a clamp to attach a plurality of protective film units to the surface of the plurality of wafers; and then, using a guide rod a pressing rod is moved from the first end to the second end on the outer cover assembly; one end of the transfer film is pressed between the first pressing rod and the second pressing rod; and the transfer film and the outer cover are separated by using the moving transfer film; The jig is removed, and the cover assembly and the support plate are separated to complete a plurality of protective film units on the transfer transfer film over the plurality of wafers.
本發明之保護膜於晶片上之形成方法與裝置不但克服先前技術之缺點,且可有效增加保護膜於晶片上之形成方法之效率及可靠度,並可大幅降低成本。The method and apparatus for forming the protective film of the present invention on the wafer not only overcome the disadvantages of the prior art, but also effectively increase the efficiency and reliability of the method for forming the protective film on the wafer, and can greatly reduce the cost.
本發明將配合其較佳實施例與隨附之圖示詳述於下。應可理解者為本發明中所有之較佳實施例僅為例示之用,並非用以限制。因此除文中之較佳實施例外,本發明亦可廣泛地應用在其他實施例中。且本發明並不受限於任何實施例,應以隨附之申請專利範圍及其同等領域而定。The invention will be described in detail below in conjunction with its preferred embodiments and the accompanying drawings. It should be understood that all of the preferred embodiments of the invention are intended to be illustrative only and not limiting. Therefore, the invention may be applied to other embodiments in addition to the preferred embodiments. The invention is not limited to any embodiment, but should be determined by the scope of the appended claims and their equivalents.
以下,將搭配參照相應之圖式,詳細說明依照本發明之較佳實施例。關於本發明新穎概念之更多觀點以及優點,將在以下的說明提出,並且使熟知或具有此領域通常知識者可瞭解其內容並且據以實施。Hereinafter, preferred embodiments in accordance with the present invention will be described in detail with reference to the accompanying drawings. Further views and advantages of the novel inventive concept will be set forth in the description which follows, and the <RTIgt;
本發明提供一種於晶片級封裝之晶片上之形成保護膜之裝置與方法,其可以應用於晶片級封裝(CSP)晶片、矽晶穿孔(through-silicon via:TSV)晶片、帶引腳陶瓷片式載體(ceramic leaded chip carrier:CLCC)、或MiniPak開關二極體等產品。The present invention provides a device and method for forming a protective film on a wafer on a wafer level package, which can be applied to a wafer level package (CSP) wafer, a through-silicon via (TSV) wafer, and a leaded ceramic wafer. Products such as ceramic leaded chip carrier (CLCC) or MiniPak switch diode.
如第一圖所示,其顯示根據本發明之用於晶片級封裝之保護膜貼附裝置(protective tape mount apparatus)之構成部件之示意圖。此裝置僅為本發明之一實施例,並非用以限制本發明,此裝置包括一外罩組件(housing plate set)、基板組件(base plate set)、晶片盤(chip tray)104以及轉貼膜(transfer tape)110。其中外罩組件係用於使晶片位置更精確,並且緊縮晶片於平面上(X,Y軸)的位置容差。此外,外罩組件之另一功能係用於處理保護膜移轉程序(taping process)。外罩組件包括一外罩107、導引桿108及導引桿支架(guide rod holder)106、一壓桿(press bar)109及一壓桿111等部件,其中外罩107可針對不同的產品而改變其構造,外罩107具有栓部107b及107c以利於對位,以及複數個凹洞107a,而凹洞107a的數目係基於晶片盤上容許晶片置放的數量。導引桿支架106係用於支撐導引桿108而一起配置(固定)於外罩107之二側,壓桿109及壓桿111接合於導引桿108以利於在導引桿108上滑動。導引桿108及導引桿支架106的設計可以類似滑軌(rail)。壓桿109係用於緊壓轉貼膜110,使保護膜可以精確地附著於晶片表面;而壓桿111係於移除轉貼膜110之前,置放在壓桿109之上,目的係在於移除轉貼膜110的期間限制晶片於垂直方向(Z軸)的自由度,使得晶片於移除轉貼膜110之後仍維持於晶片盤之中。基於壓桿109及壓桿111的設計,保護膜單元可以附著於外罩107表面之上,並且快速地移除轉貼膜110。基板組件係用於支撐盤模組(tray module)並且精確地固定外罩組件,盤模組例如係為晶片盤104與其上的晶片105而組成。基板組件包括一基板100、至少一對肘節夾具(toggle clamp)103、一支撐板(support)101以及一軟墊102等部件,其中支撐板101係配置於基板100之上(例如位於中央(心)區域),而肘節夾具103係配置於基板100的二側之上,於保護膜單元移轉期間,可以利用肘節夾具103將外罩107夾緊於支撐板101之上。軟墊102,例如為橡膠墊(rubber)102,係位於支撐板101之上(例如位於其中央(心)區域),其上具有複數個凸起部102a對應於晶片104置放位置,而於保護膜單元附著程序期間支撐(高)晶片104,並限制晶片104於垂直方向(Z軸)移動。基板100係用於承載及裝配支撐板101與肘節夾具103。As shown in the first figure, it shows a schematic view of constituent components of a protective tape mounting apparatus for wafer level packaging according to the present invention. This device is merely an embodiment of the present invention and is not intended to limit the present invention. The device includes a housing plate set, a base plate set, a chip tray 104, and a transfer film (transfer). Tape) 110. The cover assembly is used to make the wafer position more precise and to tighten the positional tolerance of the wafer on the plane (X, Y axis). In addition, another function of the housing assembly is to handle the protective film taping process. The cover assembly includes a cover 107, a guide rod 108 and a guide rod holder 106, a press bar 109 and a press bar 111, wherein the cover 107 can be changed for different products. The outer cover 107 has pegs 107b and 107c to facilitate alignment and a plurality of dimples 107a, and the number of dimples 107a is based on the number of wafers allowed on the wafer disc. The guide rod bracket 106 is used to support the guide rod 108 and is disposed (fixed) on both sides of the outer cover 107. The pressing rod 109 and the pressing rod 111 are engaged with the guiding rod 108 to facilitate sliding on the guiding rod 108. The design of the guide rod 108 and the guide rod bracket 106 can be similar to a rail. The pressing rod 109 is used to press the transfer film 110 so that the protective film can be accurately attached to the surface of the wafer; and the pressing rod 111 is placed on the pressing rod 109 before the transfer film 110 is removed, in order to remove The period during which the film 110 is transferred is limited to the degree of freedom of the wafer in the vertical direction (Z-axis) so that the wafer remains in the wafer tray after the transfer film 110 is removed. Based on the design of the pressing rod 109 and the pressing rod 111, the protective film unit can be attached to the surface of the outer cover 107, and the transfer film 110 is quickly removed. The substrate assembly is used to support a tray module and to accurately secure the housing assembly, such as the wafer tray 104 and the wafer 105 thereon. The substrate assembly includes a substrate 100, at least one pair of toggle clamps 103, a support 101, and a cushion 102. The support plate 101 is disposed on the substrate 100 (for example, at the center ( The toggle clamps 103 are disposed on both sides of the substrate 100. During the transfer of the protective film unit, the cover 107 can be clamped onto the support plate 101 by the toggle clamps 103. The cushion 102, such as a rubber 102, is located above the support plate 101 (e.g., in the center (heart) region thereof) having a plurality of raised portions 102a corresponding to the placement of the wafer 104, and The wafer 104 is supported (high) during the protective film unit attachment process, and the wafer 104 is restricted from moving in the vertical direction (Z-axis). The substrate 100 is used to carry and assemble the support plate 101 and the toggle clamp 103.
此外,上述部(構)件之構造、用途與目的將於底下組裝方法中一併敘述。In addition, the structure, use, and purpose of the above-described components will be described together in the underlying assembly method.
如第二圖所示,其顯示根據本發明之支撐板之示意圖。支撐板101係用於限制晶片盤104(請參考第一圖)於X,Y軸中的位置,支撐板中設計至少一懸吊栓(suspension pin)或彈性元件101a以用於支撐晶片盤104,其位於支撐板101之每一角落。根據外罩板組件的操作,並基於懸吊栓101a的設計,晶片盤104將平滑地向上及向下移動。值得注意者乃本發明之支撐板101包括容置空間101b位於中央(心)區域,例如為支撐板空腔101b,以利於承載橡膠墊102及晶片盤104,並固定晶片盤104的位置。As shown in the second figure, it shows a schematic view of a support plate according to the invention. The support plate 101 is used to limit the position of the wafer tray 104 (please refer to the first figure) in the X, Y axis, and at least one suspension pin or elastic member 101a is designed in the support plate for supporting the wafer disk 104. It is located at each corner of the support plate 101. Depending on the operation of the cover panel assembly, and based on the design of the suspension pin 101a, the wafer tray 104 will move smoothly upward and downward. It is noted that the support plate 101 of the present invention includes the accommodating space 101b in a central (heart) region, such as the support plate cavity 101b, to facilitate carrying the rubber pad 102 and the wafer disk 104, and to fix the position of the wafer disk 104.
如第三圖所示,其顯示根據本發明之晶片盤之設計示意圖。晶片盤104係用於承載晶片105(請參考第一圖),其上包括複數個凹洞104a以利於複數個晶片105嵌入於其中,此凹洞104a例如為格狀凹洞,凹洞104a之深度可以使晶片105得以穿出其上。晶片盤104之凹洞104a係一對一容納(對應)晶片105之放置,此凹洞104a中之孔洞104b係對應於軟墊102之凸起部102a(請參考第一圖)。晶片105例如為晶片級封裝之晶片、矽晶穿孔(TSV)晶片、帶引腳陶瓷片式載體(CLCC)、或MiniPak開關二極體等。晶片105係以陣列方式配置於晶片盤104之上。當晶片盤104向下壓時,軟墊102之凸起部102a可穿過晶片盤104之凹洞104a中之孔洞104b,將位於凹洞104a中之晶片105撐高。換言之,本發明之晶片盤104之凹洞104a中包含至少一穿孔(洞)104b,在晶片盤104下壓過程中,軟墊102之凸起部102a可通過該至少一穿孔104b,將晶片105撐起,使晶片105表面接近外罩107(請參考第一圖)之上表面。As shown in the third figure, it shows a schematic view of the design of the wafer disc according to the present invention. The wafer tray 104 is used to carry the wafer 105 (please refer to the first figure), and includes a plurality of recesses 104a for facilitating the embedding of a plurality of wafers 105 therein. The recesses 104a are, for example, lattice recesses, and the recesses 104a The depth allows the wafer 105 to pass over it. The recess 104a of the wafer tray 104 is placed one-to-one to accommodate (corresponding) the wafer 105. The hole 104b in the recess 104a corresponds to the raised portion 102a of the cushion 102 (please refer to the first figure). The wafer 105 is, for example, a wafer of a wafer level package, a twinned via (TSV) wafer, a leaded ceramic chip carrier (CLCC), or a MiniPak switch diode. The wafers 105 are arranged on the wafer disk 104 in an array. When the wafer tray 104 is pressed down, the raised portion 102a of the cushion 102 can pass through the hole 104b in the recess 104a of the wafer tray 104 to raise the wafer 105 in the recess 104a. In other words, the recess 104a of the wafer disc 104 of the present invention includes at least one through hole (hole) 104b through which the raised portion 102a of the cushion 102 can pass the wafer 105 during the pressing of the wafer disc 104. The support is raised so that the surface of the wafer 105 approaches the upper surface of the outer cover 107 (please refer to the first figure).
如第四圖所示,其顯示根據本發明之轉貼膜組件之結構之示意圖。舉一實施例而言,轉貼膜組件係由二層材料層所構成,第一層為聚亞醯胺膜層(polyimide layer)作為轉貼膜110,係用於承載複數個保護膜單元(protective film unit)110a,第二層為離型膜(liner)110d與轉貼膜110互相貼合,其中複數個保護膜單元110a黏附或貼合於轉貼膜110與離型膜110d之間。轉貼膜110,例如為保護膠帶110,具有複數個保護膜單元110a附著於其底面上。轉貼膜110之結構中,其上下二端包括轉貼膜開口110b及110c,以利於分別與外罩107上之栓部107b及107c(請參考第一圖)對位與接合,參考第六圖。轉貼膜110之尺寸大小端視晶片盤104上的晶片矩陣大小(或凹洞104a大小)而定,請參考第一圖。As shown in the fourth figure, it shows a schematic view of the structure of the transfer film module according to the present invention. In one embodiment, the transfer film assembly is composed of a two-layer material layer, and the first layer is a polyimide layer as a transfer film 110 for carrying a plurality of protective film units (protective film) The first layer 110a is a release film 110d and the transfer film 110 are bonded to each other, and a plurality of protective film units 110a are adhered or bonded between the transfer film 110 and the release film 110d. The transfer film 110, for example, the protective tape 110, has a plurality of protective film units 110a attached to the bottom surface thereof. In the structure of the transfer film 110, the upper and lower ends thereof include the transfer film openings 110b and 110c to facilitate alignment and bonding with the plug portions 107b and 107c (refer to the first figure) on the outer cover 107, respectively, with reference to the sixth drawing. The size of the transfer film 110 depends on the size of the wafer matrix on the wafer tray 104 (or the size of the recess 104a), please refer to the first figure.
底下接著敘述晶片上形成保護膜之方法。首先,晶片盤104置放於支撐板101上之彈性元件101a上,晶片盤104中具有晶片105放置於其中,參考第五圖。承載有晶片105之晶片盤104藉由彈性元件101a而支撐於支撐板101之上。Next, a method of forming a protective film on a wafer will be described next. First, the wafer tray 104 is placed on the elastic member 101a on the support plate 101, and the wafer wafer 104 has the wafer 105 placed therein, with reference to the fifth drawing. The wafer disk 104 carrying the wafer 105 is supported on the support plate 101 by the elastic member 101a.
下一步驟為取一片轉貼膜組件,移除離型膜110d,以留下轉貼膜110及附著於其上之複數個保護膜單元110a;之後,轉貼膜110置放於外罩107上,藉由外罩107上的栓部107b及107c對位轉貼膜110之轉貼膜開口110b及110c(請參考第四圖),使得外罩107與轉貼膜110互相接合,而將具有複數個保護膜單元110a附著於其底面上之轉貼膜110置放於外罩組件(包含外罩107)之上,參考第六圖。此時,外罩107上的凹洞107a約略對準轉貼膜110上的保護膜單元110a。舉例而言,外罩107上的凹洞107a之大小與保護膜單元110a之大小約略相等,複數個凹洞107a之配置與複數個保護膜單元110a一一對應。The next step is to take a piece of the transfer film assembly, and remove the release film 110d to leave the transfer film 110 and the plurality of protective film units 110a attached thereto; after that, the transfer film 110 is placed on the cover 107 by The plug portions 107b and 107c on the outer cover 107 are aligned with the film opening 110b and 110c of the transfer film 110 (please refer to the fourth figure), so that the outer cover 107 and the transfer film 110 are bonded to each other, and the plurality of protective film units 110a are attached to each other. The transfer film 110 on the bottom surface is placed on the cover assembly (including the cover 107), with reference to the sixth figure. At this time, the recess 107a on the outer cover 107 is approximately aligned with the protective film unit 110a on the transfer film 110. For example, the size of the recess 107a in the outer cover 107 is approximately equal to the size of the protective film unit 110a, and the arrangement of the plurality of recesses 107a is in one-to-one correspondence with the plurality of protective film units 110a.
接下來,將與轉貼膜110接合之外罩組件(包含外罩107)置放或固定於支撐板101之上,參考第七圖。外罩組件將藉由晶片盤104(請參考第五圖)而得到支撐。此時,轉貼膜110上的保護膜單元110a微微地對準與貼合晶片盤104上的晶片105。轉貼膜110配置於壓桿109之下方。Next, the cover assembly (including the cover 107) to be bonded to the transfer film 110 is placed or fixed on the support plate 101, with reference to the seventh figure. The cover assembly will be supported by the wafer tray 104 (see Figure 5). At this time, the protective film unit 110a on the transfer film 110 is slightly aligned and bonded to the wafer 105 on the wafer wafer 104. The transfer film 110 is disposed below the pressure bar 109.
之後,先下壓外罩組件以約略維持一定壓力,再推動基板組件上的至少一對肘節夾具103以下壓外罩組件,使得保護膜單元110a貼附並覆蓋晶片盤104上的晶片105之表面,參考第八圖。Thereafter, the cover assembly is first depressed to maintain a certain pressure, and then the at least one pair of toggle clamps 103 on the substrate assembly are pushed down to press the cover assembly such that the protective film unit 110a is attached and covers the surface of the wafer 105 on the wafer tray 104. Refer to the eighth picture.
然後,沿著導引桿108而從位於外罩107上之一端推動(移)壓桿109至其另一端,導引桿108即達至外罩107上之另一端,參考第九圖。基於轉貼膜110係配置於壓桿109之下方,使得推動(移)壓桿109時不會接觸到下方的保護膜單元110a(請參考第八圖),以避免保護膜單元110a受到損害。Then, the pressing rod 109 is pushed (moved) from one end on the outer cover 107 to the other end along the guiding rod 108, and the guiding rod 108 reaches the other end on the outer cover 107, with reference to the ninth drawing. The transfer film 110 is disposed below the pressure bar 109 so that the lower pressure protection film unit 110a is not touched when the pressure bar 109 is pushed (refer to FIG. 8) to prevent the protection film unit 110a from being damaged.
接著,舉起轉貼膜110之一端110d而接觸壓桿109之上方,參考第九圖及十a圖。然後,將壓桿111置放於壓桿109之上方,藉由壓桿111下方的壓桿栓部111a(請參考第一圖)對位壓桿109之壓桿開口109a,使得壓桿111與壓桿109互相接合,此時轉貼膜110之一端位於壓桿109與壓桿111之間,並且轉貼膜110緊緊壓合於壓桿109與壓桿111之間,參考第十b圖。Next, lift one end 110d of the transfer film 110 to contact the upper side of the presser bar 109, refer to the ninth diagram and the tenth diagram. Then, the pressing rod 111 is placed above the pressing rod 109, and the pressing rod opening 111a of the positioning pressing rod 109 is pressed by the pressing rod plug portion 111a (refer to the first figure) below the pressing rod 111, so that the pressing rod 111 is The pressing rods 109 are engaged with each other. At this time, one end of the transfer film 110 is located between the pressing rod 109 and the pressing rod 111, and the transfer film 110 is tightly pressed between the pressing rod 109 and the pressing rod 111, refer to the tenth b diagram.
下一步驟為分離轉貼膜110與外罩107。其係透過拉動轉貼膜110,而基於轉貼膜110緊壓於壓桿109與壓桿111之間,因此壓桿109與壓桿111將連同轉貼膜110的拉動而沿著導引桿108一起從轉貼膜110壓合處移動。而當壓桿109與壓桿111從轉貼膜110壓合處移動至另一端時,轉貼膜110可以從外罩107上移除,參考第十一圖。The next step is to separate the transfer film 110 and the outer cover 107. The tensioning film 110 is pressed between the pressing rod 109 and the pressing rod 111 by the transfer film 110, so that the pressing rod 109 and the pressing rod 111 will be pulled along the guiding rod 108 together with the pulling of the transfer film 110. The transfer film 110 moves at the press-fit. When the pressing rod 109 and the pressing rod 111 are moved from the transfer film 110 to the other end, the transfer film 110 can be removed from the outer cover 107, referring to FIG.
最後,移開肘節夾具103,參考第十二a圖。並移除整個外罩組件,以分離外罩組件與支撐板101,此時晶片105(請參考第五圖)上完成乾淨的保護膜單元110a黏附於其上以保護其免於粉塵粒子的污染,參考第十二b圖。Finally, remove the toggle clamp 103, see Figure 12a. And removing the entire cover assembly to separate the cover assembly and the support plate 101. At this time, the wafer 105 (refer to FIG. 5) is adhered to the clean protective film unit 110a to protect it from dust particles. Twelfth b.
值得注意者乃本發明之上述部(構)件之間的移動、推動、下壓、對位、結合與分離等步驟可以透過手動或自動的方式完成。It should be noted that the steps of moving, pushing, pressing, aligning, combining and separating between the above-mentioned parts of the present invention can be accomplished manually or automatically.
傳統式保護膜於晶片上之形成方法存在諸多缺點,本發明之保護膜於晶片上之形成方法優於傳統式保護膜於晶片上之形成方法,並且具有傳統式保護膜於晶片上之形成方法無法預期的效果。The method for forming a conventional protective film on a wafer has many disadvantages. The method for forming a protective film on a wafer of the present invention is superior to the method for forming a conventional protective film on a wafer, and has a method for forming a conventional protective film on a wafer. Unpredictable effects.
從上述可知本發明之保護膜於晶片上之裝置及其形成方法,其特徵以及優點包括:From the above, the apparatus for forming a protective film of the present invention on a wafer and a method of forming the same, the features and advantages thereof include:
1. 利用多種治具之搭配,因此可以提升保護膜的貼附效率與組裝的精確度。1. With a variety of fixtures, it can improve the adhesion efficiency and assembly accuracy of the protective film.
2. 利用治具貼附方式,可以容易貼附保護膜於晶片上,並使保護膜均勻且準確地附著於晶片上。2. With the attachment method of the jig, the protective film can be easily attached to the wafer, and the protective film can be uniformly and accurately attached to the wafer.
3. 可以允許保護膜依一群的方式放(配)置,而非傳統的個別置放單一保護膠帶於單一晶片上。3. The protective film can be allowed to be placed in a group rather than a conventional single protective tape placed on a single wafer.
4. 利用更低的成本貼附保護膜於晶片上,以節省產品的成本。4. Attach a protective film to the wafer at a lower cost to save product cost.
對熟悉此領域技藝者,本發明雖以較佳實例闡明如上,然其並非用以限定本發明之精神。在不脫離本發明之精神與範圍內所作之修改與類似的配置,均應包含在下述之申請專利範圍內,此範圍應覆蓋所有類似修改與類似結構,且應做最寬廣的詮釋。The present invention has been described above by way of a preferred example, and is not intended to limit the spirit of the invention. Modifications and similar configurations made within the spirit and scope of the invention are intended to be included within the scope of the appended claims.
100...基板100. . . Substrate
101...支撐板101. . . Support plate
101a...懸吊栓101a. . . Suspension bolt
101b...容置空間101b. . . Housing space
102...軟墊102. . . Padded
102a...凸起部102a. . . Raised portion
103...肘節夾具103. . . Elbow clamp
104...晶片盤104. . . Chip tray
104a...凹洞104a. . . pit
104b...孔洞104b. . . Hole
105...晶片105. . . Wafer
106...導引桿支架106. . . Guide rod bracket
107...外罩107. . . Cover
107a...凹洞107a. . . pit
107b、107c...栓部107b, 107c. . . Bolt
108...導引桿108. . . Guide rod
109、111...壓桿109, 111. . . Pressure bar
109a...壓桿開口109a. . . Pressure bar opening
110...轉貼膜110. . . Transfer film
110a...保護膜單元110a. . . Protective film unit
110b、110c...轉貼膜開口110b, 110c. . . Transfer film opening
111a...壓桿栓部111a. . . Pressure bar plug
上述元件,以及本發明其他特徵與優點,藉由閱讀實施方式之內容及其圖式後,將更為明顯:The above elements, as well as other features and advantages of the present invention, will become more apparent after reading the contents of the embodiments and the drawings thereof:
第一圖係根據本發明之用於晶片級封裝之保護帶裝配裝置之構成部件之示意圖。The first figure is a schematic view of constituent components of a protective tape assembling device for wafer level packaging according to the present invention.
第二圖係根據本發明之支撐板之示意圖。The second figure is a schematic view of a support plate according to the invention.
第三圖係根據本發明之晶片盤之示意圖。The third figure is a schematic view of a wafer disk in accordance with the present invention.
第四圖係根據本發明之轉貼膜組件之示意圖。The fourth figure is a schematic view of a transfer film module in accordance with the present invention.
第五圖係根據本發明之晶片盤置放於支撐板上之示意圖。The fifth drawing is a schematic view of a wafer disc placed on a support plate according to the present invention.
第六圖係根據本發明之轉貼膜對位外罩之示意圖。Figure 6 is a schematic illustration of a transfer film alignment cover in accordance with the present invention.
第七圖係根據本發明之外罩組件置放於支撐板之上之示意圖。The seventh figure is a schematic view of the outer cover assembly placed on the support plate in accordance with the present invention.
第八圖係根據本發明之對肘節夾具下壓外罩組件之示意圖。The eighth figure is a schematic view of a pusher cover assembly for a toggle clamp in accordance with the present invention.
第九圖係根據本發明之推動(移)壓桿至其另一端之示意圖。The ninth drawing is a schematic view of the push (shift) pressure bar to the other end thereof according to the present invention.
第十a與十b圖係根據本發明之轉貼膜壓合於二壓桿之間之示意圖。The tenth and tenth bth drawings are schematic views of the transfer film according to the present invention being pressed between the two pressure bars.
第十一圖係根據本發明之分離轉貼膜與外罩之示意圖。The eleventh drawing is a schematic view of a separate transfer film and a cover according to the present invention.
第十二a與十二b圖係根據本發明之分離外罩組件與支撐板之示意圖。The twelfth and a twelfth drawings are schematic views of the separation cover assembly and the support plate according to the present invention.
100...基板100. . . Substrate
101...支撐板101. . . Support plate
102...軟墊102. . . Padded
102a...凸起部102a. . . Raised portion
103...肘節夾具103. . . Elbow clamp
104...晶片盤104. . . Chip tray
105...晶片105. . . Wafer
106...導引桿支架106. . . Guide rod bracket
107...外罩107. . . Cover
107a...凹洞107a. . . pit
107b、107c...栓部107b, 107c. . . Bolt
108...導引桿108. . . Guide rod
109、111...壓桿109, 111. . . Pressure bar
109a...壓桿開口109a. . . Pressure bar opening
110...轉貼膜110. . . Transfer film
110a...保護膜單元110a. . . Protective film unit
110b、110c...轉貼膜開口110b, 110c. . . Transfer film opening
111a...壓桿栓部111a. . . Pressure bar plug
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100102733A TWI408781B (en) | 2011-01-25 | 2011-01-25 | Apparatus for forming protective tape on chip scale package and method of the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100102733A TWI408781B (en) | 2011-01-25 | 2011-01-25 | Apparatus for forming protective tape on chip scale package and method of the same |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201232717A TW201232717A (en) | 2012-08-01 |
TWI408781B true TWI408781B (en) | 2013-09-11 |
Family
ID=47069681
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100102733A TWI408781B (en) | 2011-01-25 | 2011-01-25 | Apparatus for forming protective tape on chip scale package and method of the same |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI408781B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108550680A (en) * | 2018-04-19 | 2018-09-18 | 如皋市大昌电子有限公司 | A kind of light emitting diode and preparation method thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105564706B (en) * | 2014-10-14 | 2019-01-15 | 富鼎电子科技(嘉善)有限公司 | Coating device and its application method |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW434852B (en) * | 1999-11-03 | 2001-05-16 | Festec Co Ltd | A plastic package having an air cavity and manufacturing method thereof |
US6873044B2 (en) * | 2000-09-11 | 2005-03-29 | Xytrans, Inc. | Microwave monolithic integrated circuit package |
TW200739838A (en) * | 2006-01-23 | 2007-10-16 | Tessera Tech Hungary Kft | Wafer level chip packaging |
US20100084665A1 (en) * | 2004-03-29 | 2010-04-08 | John James Daniels | Solid state light sheet and encapsulated bare die semiconductor circuits |
TWI330392B (en) * | 2006-06-09 | 2010-09-11 | Fujitsu Semiconductor Ltd | Semiconductor device, manufacturing method of the semiconductor device, and mounting method of the semiconductor device |
US7848002B2 (en) * | 2006-12-26 | 2010-12-07 | Silicon Quest Kabushiki-Kaisha | Method for aligning die to substrate |
-
2011
- 2011-01-25 TW TW100102733A patent/TWI408781B/en active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW434852B (en) * | 1999-11-03 | 2001-05-16 | Festec Co Ltd | A plastic package having an air cavity and manufacturing method thereof |
US6873044B2 (en) * | 2000-09-11 | 2005-03-29 | Xytrans, Inc. | Microwave monolithic integrated circuit package |
US20100084665A1 (en) * | 2004-03-29 | 2010-04-08 | John James Daniels | Solid state light sheet and encapsulated bare die semiconductor circuits |
TW200739838A (en) * | 2006-01-23 | 2007-10-16 | Tessera Tech Hungary Kft | Wafer level chip packaging |
TWI330392B (en) * | 2006-06-09 | 2010-09-11 | Fujitsu Semiconductor Ltd | Semiconductor device, manufacturing method of the semiconductor device, and mounting method of the semiconductor device |
US7848002B2 (en) * | 2006-12-26 | 2010-12-07 | Silicon Quest Kabushiki-Kaisha | Method for aligning die to substrate |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108550680A (en) * | 2018-04-19 | 2018-09-18 | 如皋市大昌电子有限公司 | A kind of light emitting diode and preparation method thereof |
CN108550680B (en) * | 2018-04-19 | 2020-04-14 | 如皋市大昌电子有限公司 | Light emitting diode and preparation method thereof |
Also Published As
Publication number | Publication date |
---|---|
TW201232717A (en) | 2012-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI523162B (en) | Chip-scale packaging with protective heat spreader | |
US8164181B2 (en) | Semiconductor device packaging structure | |
US7294531B2 (en) | Wafer level chip stack method | |
TWI420640B (en) | Semiconductor package device, semiconductor package structure, and method for fabricating the same | |
US6653731B2 (en) | Semiconductor device and method for fabricating same | |
US7842548B2 (en) | Fixture for P-through silicon via assembly | |
KR100708283B1 (en) | Testing device and testing method of a semiconductor device | |
JP2009010352A (en) | Cmos image sensor chip scale package with die receiving through-hole and method of the package | |
KR20090030540A (en) | Semiconductor package, apparatus and method for manufacturing the same, and electronic device equipped with the semiconductor package | |
TWI408781B (en) | Apparatus for forming protective tape on chip scale package and method of the same | |
JP2019521526A (en) | Chuck plate for semiconductor post-processing, chuck structure having the same, and chip separating apparatus having the chuck structure | |
US20090025882A1 (en) | Die molding for flip chip molded matrix array package using uv curable tape | |
KR100571512B1 (en) | Transfering method of semiconductor package and system thereof | |
JPH10319087A (en) | Die inspecting method and its device | |
JP2019186462A (en) | Mold, resin molding apparatus, resin molding method, and conveying tool | |
JP5345161B2 (en) | Wafer carrier for power device and inspection apparatus using this wafer carrier | |
TWI710034B (en) | Semiconductor manufacturing device and semiconductor device manufacturing method | |
US8232183B2 (en) | Process and apparatus for wafer-level flip-chip assembly | |
JP2008124422A (en) | Wafer-level package | |
US7378616B2 (en) | Heating apparatus and method for semiconductor devices | |
TWI451503B (en) | Apparatus for forming protective tape on chip package and method of the same | |
CN102623300B (en) | Apparatus for forming protection film on chip-scale package and formation method thereof | |
TW400597B (en) | Method and apparatus for testing die | |
JP2010109386A (en) | Method of manufacturing semiconductor device, and inspection socket | |
KR100621437B1 (en) | Mounting structure of easily reparable semiconductor package, stack package and semiconductor module |