TWI400471B - Optoelectronic sensor and optoelectronic sensor system - Google Patents

Optoelectronic sensor and optoelectronic sensor system Download PDF

Info

Publication number
TWI400471B
TWI400471B TW99107919A TW99107919A TWI400471B TW I400471 B TWI400471 B TW I400471B TW 99107919 A TW99107919 A TW 99107919A TW 99107919 A TW99107919 A TW 99107919A TW I400471 B TWI400471 B TW I400471B
Authority
TW
Taiwan
Prior art keywords
light
signal
light receiving
group
detected
Prior art date
Application number
TW99107919A
Other languages
Chinese (zh)
Other versions
TW201133022A (en
Inventor
Yoshitane Saitou
Kenji Nishikido
Original Assignee
Anywire Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anywire Corp filed Critical Anywire Corp
Priority to TW99107919A priority Critical patent/TWI400471B/en
Publication of TW201133022A publication Critical patent/TW201133022A/en
Application granted granted Critical
Publication of TWI400471B publication Critical patent/TWI400471B/en

Links

Landscapes

  • Geophysics And Detection Of Objects (AREA)

Description

光電感測器及光電感測系統Photoelectric detector and photo-sensing system

本發明有關於根據在投光元件與受光元件之間有被檢測體存在時之受光信號位準的差來檢測出被檢測體之有無的光電感測器及光電感測系統。The present invention relates to an optical sensor and a photo-sensing system for detecting the presence or absence of a subject based on a difference in the level of a light-receiving signal when a light-emitting element and a light-receiving element are present.

在根據在投光元件與受光元件之間有被檢測體存在時之受光信號位準的差來檢測出被檢測體之有無的光電感測器及光電感測系統中,成對之投光元件與受光元件一般配置成從投光元件至受光元件的光路徑與被檢測體的軸線平行。然而,在被檢測體之厚度薄的情況,例如被檢測體是薄平板的情況,與被檢測體之軸線平行的光路徑不會被該被檢測體遮蔽,因而可能無法檢測出被檢測體。因此,在特開平8-148981號公報(專利文獻1),已提議一種檢測方法,其係在複數個投光部與受光部相對向地配置之多光軸光電感測器中,利用配置於與發出投光信號之投光部相異的段之受光部來進行檢測。In the photodetector and photo-sensing system for detecting the presence or absence of the object to be detected based on the difference between the light-receiving signal level when the object to be detected exists between the light-emitting element and the light-receiving element, the pair of light-emitting elements The light receiving element is generally disposed such that the light path from the light projecting element to the light receiving element is parallel to the axis of the object to be detected. However, when the thickness of the subject is thin, for example, when the subject is a thin flat plate, the optical path parallel to the axis of the subject is not blocked by the subject, and thus the subject may not be detected. In JP-A-H08-148981 (Patent Document 1), a detection method has been proposed which is disposed in a multi-optical-axis photodetector in which a plurality of light projecting portions and a light receiving portion are opposed to each other. The light-receiving portion of the segment different from the light projecting portion that emits the light-emitting signal is detected.

若依據此方法,因為從投光部至受光部的光路徑相對於水平方向具有角度,即傾斜,所以即使是薄平板狀之被檢測體配置成其軸線水平的情況,光路徑亦被被檢測體遮蔽而可實現該檢測。According to this method, since the light path from the light projecting portion to the light receiving portion has an angle with respect to the horizontal direction, that is, the tilt, even if the thin flat object is disposed such that its axis is horizontal, the light path is detected. This detection can be achieved by body shading.

[專利文獻1]特開平8-148981號公報[Patent Document 1] Japanese Patent Publication No. 8-148981

然而,在被檢測體是極薄的情況,有利用在該專利文獻1所揭示的方法亦無法檢測的情況。又,即使是被檢測體遮蔽光路徑的情況,如果被檢測體是半透明,則具有在受光部之受光位準的變化小並受到在受光部周邊之照明或反射等之擾亂的影響而檢測結果變成不正確的問題。However, in the case where the object to be detected is extremely thin, there is a case where it cannot be detected by the method disclosed in Patent Document 1. Further, even when the subject is shielded from the light path, if the subject is translucent, the change in the light receiving level of the light receiving unit is small, and the detection is affected by the disturbance of illumination or reflection around the light receiving unit. The result becomes an incorrect question.

因此,本發明之目的在於得到即使是被檢測體是極薄的情況,亦不會受到擾亂的影響而可正確地檢測出被檢測體之光電感測器及光電感測系統。Therefore, an object of the present invention is to provide a photodetector and a photo-sensing system that can accurately detect a subject without being disturbed even when the subject is extremely thin.

本發明之光電感測器的第一型具有相對向設置之投光部與受光部,並以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無,而該受光部具有與該投光部之投光時序信號同步地動作的第1受光元件與第2受光元件。又,該投光部具有第1投光元件,係配置成投光信號在沒有與該被檢測體交叉的情況下到達該第1受光元件,在與該被檢測體交叉的情況下到達該第2受光元件;及第2投光元件,係配置成投光信號在沒有與該被檢測體交叉的情況下到達該第2受光元件,在與該被檢測體交叉的情況下到達該第1受光元件。然後,將該第1投光元件與該第1受光元件的一對、及該第1投光元件與該第2受光元件的一對設為第1組,將該第2投光元件與該第1受光元件的一對、及該第2投光元件與該第2受光元件的一對設為第2組,並在該第1組,比較不會因該被檢測體而衰減之該第1受光元件的受光信號、與會因該被檢測體而衰減之該第2受光元件之受光信號的位準差,以檢測出該被檢測體的有無資訊。又,在該第2組,比較會因該被檢測體而衰減之該第1受光元件的受光信號、與不會因該被檢測體而衰減之該第2受光元件之受光信號的位準差,以檢測出該被檢測體的有無資訊,雙重地比對檢測出從該第1組所得之該被檢測體的有無資訊與從該第2組所得之該被檢測體的有無資訊。In the first aspect of the photodetector of the present invention, the light projecting portion and the light receiving portion are provided to face each other, and the intensity of the light receiving signal of the light receiving portion is detected to be detected between the light projecting portion and the light receiving portion. The presence or absence of the object to be detected in the space, and the light receiving unit has the first light receiving element and the second light receiving element that operate in synchronization with the light emission timing signal of the light projecting unit. Further, the light projecting unit includes a first light projecting element, and the light projecting signal is arranged such that the light projecting signal reaches the first light receiving element without intersecting with the object to be detected, and reaches the first light receiving element when intersecting with the object to be detected. The second light-receiving element and the second light-emitting element are arranged such that the light-emitting signal reaches the second light-receiving element without crossing the object, and reaches the first light-receiving device when intersecting with the object. element. Then, a pair of the first light projecting element and the first light receiving element, and a pair of the first light projecting element and the second light receiving element are referred to as a first group, and the second light projecting element and the pair A pair of the first light-receiving elements and a pair of the second light-emitting elements and the second light-receiving element are set to the second group, and in the first group, the first group is not attenuated by the object. The positional difference between the light receiving signal of the light receiving element and the light receiving signal of the second light receiving element that is attenuated by the object to detect the presence or absence of the object. Further, in the second group, the light receiving signal of the first light receiving element attenuated by the object and the level difference of the light receiving signal of the second light receiving element which is not attenuated by the object are compared. In order to detect the presence or absence of the subject, the information on the presence or absence of the subject obtained from the first group and the presence or absence of the subject obtained from the second group are detected in a double comparison.

在此情況,亦可在該第1投光元件的投光時序進行在該第1組之該位準差的比較,並在該第2投光元件的投光時序進行在該第2組之該位準差的比較。此外,在此光電感測器係以二個受光元件接收來自一個投光元件的投光信號,而在以下的說明有時將此型式稱為第一光電感測器。In this case, the comparison of the level differences in the first group may be performed at the light emission timing of the first light projecting element, and the light emission timing of the second light projecting element may be performed in the second group. Comparison of this bit difference. Further, in this photodetector, the light-receiving signals from one of the light-emitting elements are received by the two light-receiving elements, and this type is sometimes referred to as a first photo-electrical sensor in the following description.

本發明之光電感測器的第二型具有相對向設置之投光部與受光部,並以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無,而該投光部具投射在沒有與該被檢測體交叉的情況下到達該受光部的投光信號之第1投光元件;及投射在與該被檢測體交叉的情況下到達該受光部的投光信號之第2投光元件。然後,比較接收來自該第1投光元件之不會因該被檢測體而衰減之投光信號而產生之分時受光信號、與接收來自該第2投光元件之會因該被檢測體而衰減之投光信號而產生之另一個分時受光信號的位準差,以檢測出被檢測體的有無資訊。在此情況,以一個受光元件接收來自二個相異之投光元件的投光信號,在以下的說明,有時將此型式稱為第二光電感測器。此外,雖從一個受光元件來產生二個受光信號,但受光信號係被分為來自其中一個投光元件之受光時間與來自另一個投光元件之受光時間,即進行分時受光,而其中使前者之受光時間為分時受光信號,並使後者之受光時間為另一個分時受光信號。本發明之光電感測器的第三型是具有相對向設置之投光部與受光部,並以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無,而該投光部具有第1投光元件與第2投光元件。又,該受光部具有接收來自該第1投光元件之不會因該被檢測體而衰減的投光信號及來自該第2投光元件之會因該被檢測體而衰減的投光信號之第1受光元件;及接收來自該第2投光元件之不會因該被檢測體而衰減的投光信號及來自該第1投光元件之會因該被檢測體而衰減的投光信號之第2受光元件。而且,將該第1投光元件與該第1受光元件的一對、及該第2投光元件與該第1受光元件的一對設為第1組,將該第2投光元件與該第2受光元件的一對、及該第1投光元件與該第2受光元件的一對設為第2組,並在該第1組比較不會因該被檢測體而衰減之該第1受光元件的分時受光信號、與會因該被檢測體而衰減之該第1受光元件之另一個分時受光信號的位準差,以檢測出該被檢測體的有無資訊。並且,在該第2組,比較會因該被檢測體而衰減之該第2受光元件的分時受光信號、與不會因該被檢測體而衰減之該第2受光元件之另一個分時受光信號的位準差,以檢測出該被檢測體的有無資訊,雙重地比對檢測出從該第1組所得之該被檢測體的有無資訊與從該第2組所得之該被檢測體的有無資訊。In the second aspect of the photodetector of the present invention, the light projecting portion and the light receiving portion are provided to face each other, and the intensity of the light receiving signal of the light receiving portion is detected to be detected between the light projecting portion and the light receiving portion. The presence or absence of the object to be detected in the space, and the light projecting portion is projected on the first light projecting element that has reached the light projecting signal of the light receiving unit without intersecting the object to be detected; and is projected to intersect the object to be detected. In the case of the second light projecting element that reaches the light projecting signal of the light receiving unit. Then, the time-division light-receiving signal generated by receiving the light-emission signal that is not attenuated by the object from the first light-emitting element is compared, and the object from the second light-emitting element is received by the object. The level difference of the other time-division received light signal generated by the attenuated light projecting signal to detect the presence or absence of the detected object. In this case, the light-emitting elements receive the light-emitting signals from the two different light-emitting elements. In the following description, this type may be referred to as a second photo-electric detector. Further, although two light-receiving signals are generated from one light-receiving element, the light-receiving signal is divided into a light-receiving time from one of the light-emitting elements and a light-receiving time from the other light-emitting element, that is, time-division light is received, and The light receiving time of the former is a time-sharing light signal, and the light receiving time of the latter is another time-sharing light signal. A third aspect of the photodetector of the present invention has a light projecting portion and a light receiving portion that are disposed opposite to each other, and is detected between the light projecting portion and the light receiving portion by a change in intensity of a light receiving signal of the light receiving portion. The presence or absence of the object to be detected in the space includes the first light projecting element and the second light projecting element. Further, the light receiving unit has a light projecting signal that receives the light from the first light projecting element that is not attenuated by the object, and a light projecting signal that is attenuated by the object from the second light projecting element. a first light receiving element; and a light projecting signal from the second light projecting element that is not attenuated by the object and a light projecting signal that is attenuated by the object from the first light projecting element; The second light receiving element. Further, a pair of the first light projecting element and the first light receiving element, and a pair of the second light projecting element and the first light receiving element are referred to as a first group, and the second light projecting element and the pair A pair of the second light-receiving elements and a pair of the first light-emitting elements and the second light-receiving elements are set to the second group, and the first group is not attenuated by the first object. The time-division light-receiving signal of the light-receiving element and the level difference of the other time-division light-receiving signal of the first light-receiving element that is attenuated by the object to be detected are detected to detect the presence or absence of the object. Further, in the second group, the time-division light-receiving signal of the second light-receiving element attenuated by the object and the other time-sharing of the second light-receiving element that is not attenuated by the object are compared. The position difference of the received light signal is used to detect the presence or absence of the object, and the presence or absence of the object obtained from the first group and the object obtained from the second group are detected in a double comparison. Whether or not there is information.

在此情況,亦可在該第1投光元件及該第2投光元件的分時投光時序進行該位準差的比較。In this case, the comparison of the level differences may be performed at the time division projection timing of the first light projecting element and the second light projecting element.

此外,因為在此光電感測器,亦以二個受光元件接收來自一個投光元件的投光信號,在以下的說明,與該本發明的第二型一樣,有時稱為第二光電感測器。In addition, since the photodetector also receives the light projecting signal from one of the light projecting elements by the two light receiving elements, the following description is the same as the second type of the present invention, sometimes referred to as the second photo inductor. Detector.

又,在該投光部具有第1及第2投光元件並具有該第1及第2組的情況,亦可從在該第1組所得之該被檢測體的有無資訊與在該第2組所得之該被檢測體的有無資訊雙重地比對該被檢測體的有無資訊,而在未檢測出該被檢測體之有無的情況,檢測出該被檢測體的異常狀態及/或感測器故障。Further, when the light projecting unit has the first and second light projecting elements and has the first and second groups, the presence or absence of the object and the second information obtained in the first group may be The presence/absence information of the subject obtained by the group is double compared to the presence or absence of the subject, and the abnormal state and/or the sensing of the subject is detected without detecting the presence or absence of the subject. The device is faulty.

並且,亦可多段地構成該光電感測器,並作成檢測複數個該被檢測體的光電感測器,亦可共用在該第2組的該第2投光元件及用於與被進行與該第2組有關的檢測之被檢測體相鄰之其他的被檢測體之在該第1組的該第1投光元件,並共用在該第2組的該第2受光元件及用於該其他的被檢測體之在該第1組的該第1受光元件。或者,亦可該第2投光元件被共用作為用於與跟投光信號交叉之被檢測體相鄰之其他的被檢測體之該第1投光元件,該第2受光元件被共用作為用於與該其他的被檢測體之該第1受光元件。Further, the photodetector may be configured in a plurality of stages, and a photodetector for detecting a plurality of the objects to be detected may be formed, or may be shared by the second group of light projecting elements of the second group and used for The second light-emitting elements of the first group are shared by the second light-receiving elements of the second group and the other light-receiving elements of the first group adjacent to the detected object in the second group and used for the The other object to be detected is the first light receiving element of the first group. Alternatively, the second light projecting element may share the first light projecting element as another object to be detected adjacent to the object to which the light is projected, and the second light receiving element may be shared. The first light receiving element of the other object to be detected.

再者,亦可在上述之任一種情況,將成對之投光部與受光部進行單元化。Furthermore, in either case, the pair of light projecting sections and the light receiving sections may be unitized.

本發明的光電感測系統,具備有複數個上述之光電感測器的任一型,並具備與一連串之該投光部連接的第1管理子站、及與對應於該投光部之一連串之該受光部連接的第2管理子站。而且,該第1管理子站產生該投光時序信號,而該第2管理子站產生與該投光時序信號同步之受光信號的時序信號。The photo-sensing system of the present invention includes any one of the plurality of photo-sensing devices described above, and includes a first management sub-station connected to the series of the light-emitting portions and a series of ones corresponding to the light-emitting portions The second management substation to which the light receiving unit is connected. Further, the first management substation generates the light emission timing signal, and the second management substation generates a timing signal of the light receiving signal synchronized with the light emission timing signal.

又,本發明的光電感測系統亦可係複數個一連串之該投光部與一連串之該受光部連接於共同的資料信號線,並向上階母站傳達該被檢測體的有無資訊、該被檢測體的異常狀態及/或感測器故障資訊。Moreover, the photo-sensing system of the present invention may be configured such that a plurality of the light projecting portions and a series of the light-receiving portions are connected to a common data signal line, and the presence or absence of information of the object to be detected is transmitted to the parent station. Detection of abnormal state of the body and / or sensor failure information.

並且,本發明的光電感測系統亦可係在具備該投光部具有第1及第2投光元件且具有該第1及第2組之光電感測器的情況,從在該第1組所得之該被檢測體的有無資訊與在該第2組所得之該被檢測體的有無資訊雙重地比對該被檢測體的有無資訊,而未檢測出該被檢測體之有無的情況,檢測出該被檢測體的異常狀態及/或感測器故障。Further, the photo-sensing system of the present invention may be provided in the first group and the second group of light-emitting elements having the first and second light-emitting elements, and the first and second groups of optical-inductance sensors may be provided in the first group. The presence or absence of the obtained information of the subject and the presence or absence of the subject obtained in the second group are compared with the presence or absence of the subject, and the presence or absence of the subject is not detected. An abnormal state of the object to be detected and/or a sensor failure.

本發明的光電感測器使受光部作用為基準感測器及檢測感測器即作用為接收不會被被檢測體遮蔽之投光信號的感測器(基準感測器)、與接收在被檢測體位於投光部與受光部之間時被被檢測體遮蔽之投光信號的感測器(檢測感測器),並藉由比較這些基準感測器與檢測感測器,以檢測出被檢測體的有無。此時,因為作為檢測感測器的受光部接收從投光部在與被檢測體交叉的情況下到達受光部的投光信號,所以該受光信號在被檢測體存在的情況衰減。又,藉由比較2個檢測結果即藉由取得2個受光信號的差分,可排除擾亂的影響。因此,即使是被檢測體極薄的情況,亦不會受到擾亂的影響,可正確地檢測出被檢測體。The photodetector of the present invention causes the light receiving portion to function as a reference sensor and a detecting sensor, that is, a sensor (reference sensor) that functions to receive a light projecting signal that is not blocked by the object to be detected, and is received by A sensor (detection sensor) that emits a light signal that is blocked by the object when the object is positioned between the light projecting portion and the light receiving portion, and detects by comparing the reference sensor and the detecting sensor The presence or absence of the detected object. At this time, since the light receiving unit that is the detecting sensor receives the light projecting signal that reaches the light receiving unit when the light projecting portion intersects with the object to be detected, the light receiving signal is attenuated when the object is present. Further, by comparing the two detection results, that is, by obtaining the difference between the two received light signals, the influence of the disturbance can be eliminated. Therefore, even when the object to be detected is extremely thin, it is not affected by the disturbance, and the object to be detected can be accurately detected.

又,將在受光部所接收之不會因被檢測體而衰減的受光信號、與因被檢測體而衰減之受光信號之位準差的比較在兩受光信號的受光結束時序進行,即若是第一光電感測器則在投光部之投光時序,而若是第二光電感測器則在第2投光元件之投光時序進行的情況,就在各段檢測出被檢測體的有無。因而,至被檢測體之檢測出的響應時間短,而可得到高速的響應速度。Moreover, the comparison between the received light signal that is received by the light receiving unit and is not attenuated by the object and the level difference of the light receiving signal that is attenuated by the object is performed at the end of the light receiving end of the received light signals, that is, When the photodetector is in the light projecting timing of the light projecting portion, and the second photodetector is in the light projecting timing of the second light projecting element, the presence or absence of the object to be detected is detected in each segment. Therefore, the response time to the detected object is short, and a high-speed response speed can be obtained.

並且,投光部採用具有第1及第2投光元件者,受光部採用具有第1及第2受光元件者,將第1投光元件與第1受光元件的一對、及第1投光元件與第2受光元件的一對設為第1組,將第2投光元件與第1受光元件的一對、及第2投光元件與第2受光元件的一對設為第2組,藉由使檢測構造雙重化,可使被檢測體的檢測精度變成更高。此外,在此情況,在第一光電感測器,在第1投光元件的投光時序進行在第1組之位準差的比較,在第2投光元件的投光時序進行在第2組之位準差的比較,又,若在第二光電感測器,則在第2投光元件的投光時序進行,藉此,在各段檢測出被檢測體的有無。因而,至被檢測體之檢測出的響應時間短,可得到高速的響應速度。又,雙重地比對被檢測體的有無資訊,在未檢測出被檢測體之有無的情況,根據從複數個受光信號進行邏輯判斷的結果所得之邏輯值,可檢測出被檢測體的異常保持或保管狀態(斜放置)、或者感測器故障。Further, in the light projecting unit, the first and second light projecting elements are used, and the light receiving unit includes the first and second light receiving elements, and the pair of the first light projecting element and the first light receiving element, and the first light projecting unit. A pair of the element and the second light receiving element is the first group, and a pair of the second light projecting element and the first light receiving element and a pair of the second light projecting element and the second light receiving element are set to the second group. By double the detection structure, the detection accuracy of the subject can be made higher. Further, in this case, in the first photodetector, the collimation timing of the first light projecting element is compared with the level difference of the first group, and the light projection timing of the second light projecting element is performed for the second time. In the comparison of the positional difference of the group, in the second photodetector, the light projection timing of the second light projecting element is performed, whereby the presence or absence of the object to be detected is detected in each segment. Therefore, the response time to the detected object is short, and a high-speed response speed can be obtained. Further, by comparing the presence or absence of the object to be detected, if the presence or absence of the object is not detected, the abnormal value of the object can be detected based on the logical value obtained by logically determining the plurality of received light signals. Or storage status (inclined placement), or sensor failure.

此外,在投光部具有第1及第2投光元件,而投光元件及受光元件具有第1及第2組的情況,若利用來自投光元件的散射光,則共用在第2組的第2投光元件及用於與與在第2組被檢測之被檢測體相鄰之其他的被檢測體之在第1組的該第1投光元件,已使投光元件減半,成為更簡單之構造。Further, the light projecting unit has the first and second light projecting elements, and the light projecting element and the light receiving element have the first and second groups. When the scattered light from the light projecting element is used, the light is shared by the second group. The second light projecting element and the first light projecting element in the first group of the other object to be detected adjacent to the object to be detected in the second group have halved the light projecting element. Simpler construction.

此外,若使成對的投光部與受光部單元化,則因為可自由地設定各段的間隔,所以具有可應用於各種厚度或大小的被檢測體又可大為擴大對被檢測體之形狀相異之情況的應用範圍。Further, when the pair of light projecting portions and the light receiving portion are unitized, since the interval between the respective segments can be freely set, the object to be detected can be applied to various thicknesses or sizes, and the object to be detected can be greatly enlarged. The range of applications where the shapes are different.

在本發明之光電感測系統,因為具備有該本發明的光電感測器,所以即使是被檢測體極薄的情況,亦不會受到擾亂的影響,可正確地檢測出被檢測體。又,使被檢測體之有無的響應時間變快,並且使檢測構造雙重化,藉此得到可確實檢測出被檢測體之有無的改善。又,根據從複數個受光信號進行邏輯判斷的結果所得之邏輯值,可檢測出被檢測體的異常保持或保管狀態(斜放置)、或者感測器故障,可提高可靠性。此外,因為各段的間隔可自由地設定,所以可大為擴大對厚度或大小相異的被檢測體、或被檢測體之形狀相異之情況的應用範圍。In the photo-sensing system of the present invention, since the photodetector of the present invention is provided, even when the object to be detected is extremely thin, it is not affected by the disturbance, and the object to be detected can be accurately detected. Moreover, the response time of the presence or absence of the subject is increased, and the detection structure is doubled, thereby obtaining an improvement that the presence or absence of the subject can be reliably detected. Further, based on the logical value obtained by logically determining the plurality of received light signals, the abnormality holding or storage state (oblique placement) of the object or the sensor failure can be detected, and reliability can be improved. Further, since the interval between the segments can be freely set, it is possible to greatly expand the range of application to the case where the thickness or the size of the object to be detected differs from the shape of the object to be detected.

此外,因為亦可利用光電感測器進行用以檢測出被檢測體的異常保持或保管狀態(斜置)、或者感測器故障的邏輯判斷,又亦可利用光電感測系統所具備之判斷裝置(PLC或主電腦等)進行。In addition, since the optical inductance detector can be used to detect the abnormality of the object to be detected or stored (oblique) or the logic of the sensor failure, the judgment of the photo-sensing system can also be utilized. The device (PLC or main computer, etc.) is performed.

以下,一面參照圖式一面說明本發明之第1光電感測器及具備該光電感測器之光電感測系統的實施形態。Hereinafter, an embodiment of a first photodetector and a photo-sensing system including the photo-electrical sensor of the present invention will be described with reference to the drawings.

第1圖係本發明之光電感測系統之實施例的整體圖,第2圖係該光電感測系統的方塊圖。此光電感測系統係將複數個光電感測器11與是共用之資料信號線的DP信號線7、DN信號線8連接。光電感測器11由管理子站10a、10b、從管理子站10b所串接之複數個子站輸入部12b及從管理子站10a所串接之複數個子站輸出部12a所構成。子站輸入部12b相當於本發明的投光部,子站輸出部12a相當於本發明的受光部,用以檢測有無被收容於子站輸出部12a與子站輸入部12b之間的被檢測體。例如,在掌握被檢測體位於棚架構造之棚架之哪個位置的系統中,是掌握半導體晶圓或液晶面板等之被保管的棚架位置或狀況。但,被檢測體未限定如此,亦可是未定型或形狀相異的被檢測體。1 is an overall view of an embodiment of a photo-sensing system of the present invention, and FIG. 2 is a block diagram of the photo-sensing system. The photo-sensing system connects a plurality of photo-inductors 11 to a DP signal line 7 and a DN signal line 8 which are shared data signal lines. The photodetector 11 is composed of a management substation 10a, 10b, a plurality of substation input units 12b connected in series from the management substation 10b, and a plurality of substation output units 12a connected in series from the management substation 10a. The substation input unit 12b corresponds to the light projecting unit of the present invention, and the substation output unit 12a corresponds to the light receiving unit of the present invention for detecting the presence or absence of being detected between the substation output unit 12a and the substation input unit 12b. body. For example, in a system in which the position of the scaffold in which the object to be detected is located in the scaffolding structure is grasped, the position or condition of the scaffold in which the semiconductor wafer, the liquid crystal panel, or the like is stored is grasped. However, the object to be detected is not limited to this, and may be an object that is not shaped or has a different shape.

構成光電感測器11的管理子站10a、10b、子站輸入部12b及子站輸出部12a共用母站6及資料,母站6以並行信號與控制部1進行資料的收發。即,從控制部1的輸出單元2向母站6送出是並行(平行)輸出信號的控制部輸出信號4,輸入單元3從母站6將並行輸入信號作為控制部輸入信號5來接收,是主系統之控制部1與母站6之間的通信是收發並行信號並以高速進行信號傳輸。母站6與DP信號線7、DN信號線8連接,而與此信號線所連接的光電感測器11連接。又,構成光電感測器11的子站輸入部12b及子站輸出部12a亦與DP信號線7、DN信號線8連接。而,成為控制部1可經由母站6掌握全部之控制、監視資料的構成。此外,在第1圖,雖然管理子站10a、10b包含於光電感測器11之構成中,但是亦可與光電感測器11分開。The management substation 10a, 10b, the substation input unit 12b, and the substation output unit 12a constituting the photodetector 11 share the parent station 6 and the data, and the parent station 6 transmits and receives data to and from the control unit 1 in parallel signals. That is, the control unit output signal 4 which is a parallel (parallel) output signal is sent from the output unit 2 of the control unit 1 to the parent station 6, and the input unit 3 receives the parallel input signal from the parent station 6 as the control unit input signal 5, and is received. The communication between the control unit 1 of the main system and the parent station 6 is to transmit and receive parallel signals and perform signal transmission at high speed. The mother station 6 is connected to the DP signal line 7, the DN signal line 8, and is connected to the photodetector 11 to which the signal line is connected. Further, the substation input unit 12b and the substation output unit 12a constituting the photodetector 11 are also connected to the DP signal line 7 and the DN signal line 8. In addition, the control unit 1 can grasp the configuration of all the control and monitoring data via the parent station 6. Further, in the first diagram, although the management sub-stations 10a and 10b are included in the configuration of the photodetector 11, they may be separated from the photo-inductance detector 11.

在第3圖放大表示光電感測器之構成。如第3圖所示,光電感測器11連結由一對子站輸出部12a與子站輸入部12b所構成之複數個感測部11a、11b。此外,對感測部的個數無限制,可因應於需要而連結所需要的個數,此光電感測器亦連結多個感測部,但是在第3圖權宜上僅表示2個感測部。The structure of the photodetector is shown enlarged in Fig. 3. As shown in Fig. 3, the photodetector 11 is connected to a plurality of sensing portions 11a and 11b composed of a pair of substation output unit 12a and substation input unit 12b. In addition, the number of sensing units is not limited, and the required number can be connected according to needs. The photo-sensing device also connects a plurality of sensing units, but only two sensing units are indicated on the third figure. unit.

管理子站10a、管理子站10b與感測部11a之間由橋接配線13連接,並且感測部11a與下一段的感測部11b由子站間連接34連接。而,感測部11b以後之段的感測部間亦一樣地由子站間連接34連接。The management substation 10a, the management substation 10b, and the sensing portion 11a are connected by the bridge wiring 13, and the sensing portion 11a and the sensing portion 11b of the next segment are connected by the inter-substation connection 34. Further, the sensing units of the subsequent sections of the sensing unit 11b are connected by the inter-substation connection 34 in the same manner.

在藉橋接配線13或子站間連接34的連接,使用連接器33。以簡化連接。此外,在複數個子站間連接34是等間隔的情況,藉由將子站間連接34之長度進行規格化,以簡化配線,而在不是等間隔的情況,藉由使子站間連接34之長度配合間隔,而可簡化配線作業、連接作業。The connector 33 is used by the connection of the bridge wiring 13 or the sub-station connection 34. To simplify the connection. Further, in the case where the plurality of sub-station connections 34 are equally spaced, the length of the inter-substation connection 34 is normalized to simplify wiring, and in the case of not being equally spaced, by connecting the sub-station 34 The length is matched with the interval to simplify wiring work and connection work.

管理子站10a是投光側的管理子站,向對管理子站10a串接而附屬之複數個子站輸出部12a送出串接信號,而設定複數個子站輸出部12a的動作時序。另一方面,管理子站10b是受光側的管理子站。向對管理子站10b串接而附屬之複數個子站輸出部12b送出串接信號,而設定複數個子站輸出部12b的動作時序。The management substation 10a is a management substation on the light projecting side, and sends a serial connection signal to a plurality of substation output units 12a that are connected in series to the management substation 10a, and sets an operation sequence of the plurality of substation output units 12a. On the other hand, the management substation 10b is a management substation on the light receiving side. The serial sequence signal is sent to a plurality of substation output units 12b connected in series to the management substation 10b, and the operation timing of the plurality of substation output units 12b is set.

由是投光部之子站輸出部12a與是受光部之子站輸入部12b所構成的感測部11a、11b本身是透過式感測器,被檢測體35a被收容於子站輸出部12a與子站輸入部12b之間。感測部11a的子站輸入部12b具有:第1受光元件PD1d,係從子站輸出部12a的投光元件LD1d接收在沒有與被檢測體35a交叉的情況下到達子站輸入部12b的投光信號;及第2受光元件PD1u,係從投光元件LD1d接收在與被檢測體35a交叉的情況下到達子站輸入部12b的投光信號。又,子站輸出部12a不僅該投光元件LD1d,還具有第2投光元件LD1u,其配置成投光信號在沒有與被檢測體35a交叉的情況下到達第2受光元件PD1u,並在與被檢測體35a交叉的情況下到達第1受光元件PD1d。感測部11a之下一段所連結的感測部11b等亦是一樣之構成。此外,在以下的說明,發光元件及受光元件之編號係對初段的感測部11a賦予1,對下一段的感測部11b賦予2,對第n段的光電感測器11n賦予n。因此,例如感測部11b的第2投光元件成為LD2u,感測部11n的第2投光元件成為LDnu。The sensor units 11a and 11b which are the sub-station output unit 12a of the light projecting unit and the sub-station input unit 12b that is the light-receiving unit are themselves transmissive sensors, and the subject 35a is accommodated in the sub-station output unit 12a and the sub-unit. Between the station input units 12b. The substation input unit 12b of the sensor unit 11a has the first light receiving element PD1d received from the light projecting element LD1d of the substation output unit 12a and reaches the substation input unit 12b without crossing the subject 35a. The optical signal and the second light receiving element PD1u receive a light projecting signal that reaches the substation input unit 12b when intersecting with the subject 35a from the light projecting element LD1d. Further, the substation output unit 12a includes the second light projecting element LD1u in addition to the light projecting element LD1d, and is arranged such that the light projecting signal reaches the second light receiving element PD1u without crossing the object 35a, and When the subject 35a crosses, the first light receiving element PD1d is reached. The sensing portion 11b and the like connected to the lower portion of the sensing portion 11a are also configured in the same manner. In the following description, the numbers of the light-emitting elements and the light-receiving elements are given 1 to the first-stage sensing portion 11a, 2 to the next-stage sensing portion 11b, and n to the n-th photo-inductor 11n. Therefore, for example, the second light projecting element of the sensor unit 11b is LD2u, and the second light projecting element of the sensor unit 11n is LDnu.

從發光元件LDnd至第1受光元件PDnd的投光信號是不會被被檢測體35a遮蔽的受光信號,並成為對投光信號被被檢測體35a遮蔽之情況比較的基準信號。又,從發光元件LDnd向第2受光元件PDnu斜分散的投光信號被被檢測體35a遮蔽,而在第2受光元件PDnu的受光信號衰減,成為微小位準的檢測信號。然後,比較這些基準信號與檢測信號的位準差,而檢測有無被檢測體35a的資訊。因而,具有難受到受光元件周邊之影響的特徵。The light-emitting signal from the light-emitting element LDnd to the first light-receiving element PDnd is a light-receiving signal that is not blocked by the object 35a, and is a reference signal that is compared with the case where the light-emitting signal is shielded by the object 35a. In addition, the light-emitting signal obliquely dispersed from the light-emitting element LDnd to the second light-receiving element PDnu is blocked by the object 35a, and the light-receiving signal of the second light-receiving element PDnu is attenuated, and becomes a detection signal of a minute level. Then, the level difference between the reference signal and the detection signal is compared, and the presence or absence of the information of the subject 35a is detected. Therefore, there is a feature that is hard to be affected by the periphery of the light receiving element.

根據基準信號與檢測信號之比較的檢測判斷係在投光部之投光時序進行。此外,對進行檢測判斷的時序無限制,例如亦可藉各感測部所內建的定時器動作進行,或者亦可在全部感測部巡迴後進行。但,在投光部之投光時序進行根據基準信號與檢測信號之比較之檢測判斷的情況與在全部感測部巡迴後進行檢測判斷的情況相比,至檢測出被檢測體的響應時間縮短,而可實現高速的響應速度。此外,檢測判斷的細節將後述。又,在藉各感測部所內建的定時器動作進行檢測判斷的情況,預先設置記憶保持基準信號與檢測信號的區域,並以子站輸入部12b進行比較計算,關於記憶保持區域將後述。The detection determination based on the comparison of the reference signal and the detection signal is performed at the light projection timing of the light projecting portion. Further, the timing for performing the detection determination is not limited, and may be performed by, for example, a timer operation built in each of the sensing units, or may be performed after all the sensing units are patrolled. However, when the detection timing of the light projection timing of the light projecting unit is compared with the detection signal and the detection signal, the response time of the detected object is shortened as compared with the case where the detection determination is performed after all the sensing units are patrolled. , and can achieve high speed response speed. In addition, the details of the detection judgment will be described later. In addition, when the detection determination is performed by the timer operation built in each of the sensing units, the area in which the memory retention reference signal and the detection signal are set is set in advance, and the comparison is performed by the substation input unit 12b, and the memory holding area will be described later. .

另一方面,從第2投光元件LDnu至第2受光元件PDnu的投光信號是不會被被檢測體35a遮蔽的受光信號,並成為對投光信號被被檢測體35a遮蔽之情況比較的基準信號,從第2投光元件LDnu向第1受光元件PDnd斜分散的投光信號被檢測體35遮蔽,而在第1受光元件PDnd的受光信號衰減,成為微小位準的檢測信號。因此,將投光元件LDnd與第1受光元件PDnd的一對、及投光元件LDnd與第2受光元件PDnu的一對作為第1組,將第2投光元件LDnu與第1受光元件PDnd的一對、及第2投光元件LDnu與第2受光元件PDnu的一對作為第2組,可雙重地比對檢測出從第1組所得之該被檢測體的有無資訊與從第2組所得之該被檢測體的有無資訊。因而,能以可靠性高之感測器的檢測準確性檢測出被檢測體35a。此外,在第1組之基準信號與檢測信號之位準差的比較係在投光元件LDnd之投光時序進行,而在第2組之基準信號與檢測信號之位準差的比較係在第2投光元件LDnu之投光時序進行。On the other hand, the light projection signal from the second light projecting element LDnu to the second light receiving element PDnu is a light receiving signal that is not blocked by the object 35a, and is compared with the case where the light projecting signal is shielded by the object 35a. In the reference signal, the light-emitting signal obliquely dispersed from the second light-emitting element LDnu to the first light-receiving element PDnd is blocked by the detector 35, and the light-receiving signal of the first light-receiving element PDnd is attenuated to become a minute level detection signal. Therefore, a pair of the light projecting element LDnd and the first light receiving element PDnd, and a pair of the light projecting element LDnd and the second light receiving element PDnu are the first group, and the second light projecting element LDnu and the first light receiving element PDnd are A pair and a pair of the second light projecting element LDnu and the second light receiving element PDnu are used as the second group, and the presence or absence of the information of the object obtained from the first group and the information obtained from the second group can be detected by double comparison. The presence or absence of information on the subject. Therefore, the subject 35a can be detected with the detection accuracy of the highly reliable sensor. Further, the comparison of the level difference between the reference signal of the first group and the detection signal is performed at the light projection timing of the light projecting element LDnd, and the comparison of the level difference between the reference signal of the second group and the detection signal is performed. 2 The light projection timing of the light projecting element LDnu is performed.

如上述所示,管理子站10a及管理子站10b各自在同一時序向各自之後續的子站輸出部12a、子站輸入部12b送出串接信號(以下有時稱為TDn信號)。子站輸入部12b或子站輸出部12a接收根據此TDn信號所傳來的本站的位址時序。此外,管理子站10a、10b如上述所示,因為各自與DP信號線7、DN信號線8連接,所以可從後述之傳送時鐘信號產生決定光電感測器11之動作時序的TD0信號。因而,即使子站輸出部12a與子站輸入部12b之間是長距離,管理子站10a、10b亦產生自己的位址時序,而可向成對之子站輸出部12a與子站輸入部12b同時送出串接信號。As described above, the management substation 10a and the management substation 10b each transmit a serial signal (hereinafter sometimes referred to as a TDn signal) to each of the subsequent substation output unit 12a and the substation input unit 12b at the same timing. The substation input unit 12b or the substation output unit 12a receives the address timing of the own station transmitted based on the TDn signal. Further, as described above, since the management sub-stations 10a and 10b are connected to the DP signal line 7 and the DN signal line 8, respectively, the TD0 signal for determining the operation timing of the photo-detector 11 can be generated from the transfer clock signal to be described later. Therefore, even if the substation output unit 12a and the substation input unit 12b are long distances, the management substation 10a, 10b generates its own address timing, and can be supplied to the paired substation output unit 12a and the substation input unit 12b. The serial signal is sent at the same time.

收到TD0信號的子站輸入部12a或子站輸出部12a產生在後續之子站間連接34間所串接之下一個子站輸入部12b或子站輸出部12b的位址時序。例如,將複數個子站輸出部12a的位址時序設為#A0、#A1、#A2、...,例如將複數個子站輸入部12b的位址時序設為#B0、#B1、#B2、...的情況,從管理子站10a收到串接信號(TD0信號)之#A0的子站輸出部12a在TDn信號的時序以輸出信號從投光元件向子站輸入部12a、12b投光。從管理子站10b收到串接信號(TD0信號)之#B0的子站輸入部12b在TDn信號的時序從受光元件接收投光信號。依此方式,#A0的子站輸出部12a與#B0的子站輸入部12b成對地動作。接著#A0之子站輸出部12a之#A1的子站輸出部12a與接著#B0之子站輸入部12b之#B1的子站輸入部12b亦一樣成對地在同一時序投光、受光。即,在本實施形態,複數個成對之子站輸出部12a與子站輸入部12b構成在串接信號(TDn信號)的時序依序切換並檢測出被檢測體的多光軸光電感測器。而且,根據受光信號之強度變化而檢測在是投光部之子站輸出部12a與是受光部的子站輸入部12b之間有無被檢測體。The substation input unit 12a or the substation output unit 12a that has received the TD0 signal generates an address sequence of the next substation input unit 12b or the substation output unit 12b that is connected in series between the subsequent inter-substation connections 34. For example, the address sequence of the plurality of substation output units 12a is set to #A0, #A1, #A2, ..., for example, the address timing of the plurality of substation input units 12b is set to #B0, #B1, #B2. In the case of ..., the substation output unit 12a of #A0 that receives the concatenation signal (TD0 signal) from the management substation 10a outputs the output signal from the light projecting element to the substation input units 12a, 12b at the timing of the TDn signal. Cast light. The substation input unit 12b that receives the #B0 of the concatenated signal (TD0 signal) from the management substation 10b receives the light emission signal from the light receiving element at the timing of the TDn signal. In this manner, the substation output unit 12a of #A0 and the substation input unit 12b of #B0 operate in pairs. Then, the substation output unit 12a of #A1 of the substation output unit 12a of the #A0 and the substation input unit 12b of the #B1 of the substation input unit 12b of the #B0 are also projecting and receiving light at the same timing in the same manner. In other words, in the present embodiment, the plurality of pairs of sub-station output units 12a and sub-station input units 12b constitute a multi-optical-axis photo-inductor that sequentially switches the timing of the serial signal (TDn signal) and detects the detected object. . Then, whether or not there is a subject between the substation output unit 12a of the light projecting unit and the substation input unit 12b which is the light receiving unit is detected based on the intensity change of the light receiving signal.

在此,如第1圖所示,在本光電感測系統,因為連接複數個由一連串的感測部11a、11b、...所構成的光電感測器11,所以成對(同一感測部)之子站輸出部12a與子站輸入部12b各自之管理子站10a、10b的位址(意指用以區別複數個光電感測器11的位址)必須相同,在子站輸出部12a與子站輸入部12b各自之管理子站10a、10b所產生的串接信號(從TD1信號至TDn信號)係在同一時序從#A0至#An的子站輸出部12a向#B0至#Bn的子站輸入部12b傳送,投光、受光的時序可同步地動作。此外,在第2圖,從#An的子站輸出部12a向#Bn的子站輸入部12b(從#A0的子站輸出部12a向#B0的子站輸入部12b、從#A1的子站輸出部12a向#B1的子站輸入部12b等)所寫的投光信號(箭號)表示複數個子站輸出部12a與子站輸入部12b同步地在串接信號的時序進行投光、受光。Here, as shown in Fig. 1, in the photo-sensing system, since a plurality of photo-inductors 11 composed of a series of sensing portions 11a, 11b, ... are connected, they are paired (same sensing) The address of the management substation 10a, 10b of each of the substation output unit 12a and the substation input unit 12b (meaning the address for distinguishing the plurality of photodetectors 11) must be the same, and the substation output unit 12a The serial signals (from the TD1 signal to the TDn signal) generated by the respective management sub-stations 10a and 10b of the sub-station input unit 12b are at the same timing from the sub-station output unit 12a of #A0 to #An to #B0 to #Bn. The substation input unit 12b transmits the timings of the light projection and the light reception in synchronization. In addition, in the second drawing, the substation input unit 12a of #An is turned to the substation input unit 12b of #Bn (from the substation output unit 12a of #A0 to the substation input unit 12b of #B0, and the child of ##1 The light projection signal (arrow) written by the station output unit 12a to the substation input unit 12b of #B1, etc., indicates that the plurality of substation output units 12a and the substation input unit 12b are simultaneously projecting at the timing of the serial signal. Received light.

第4圖係此光電感測系統中之管理子站的功能方塊圖,第5圖係管理子站的系統方塊圖。此外,因為子站輸出部12a所連接的管理子站10a與子站輸入部12b所連接的管理子站10b的功能方塊圖相同,所以在第4圖、第5圖表示雙方,而將表示管理子站的符號設為10。Figure 4 is a functional block diagram of the management substation in the photo-sensing system, and Figure 5 is a system block diagram of the management sub-station. Further, since the management sub-station 10a to which the sub-station output unit 12a is connected is the same as the functional block diagram of the management sub-station 10b to which the sub-station input unit 12b is connected, both the fourth and fifth figures show the management. The symbol of the substation is set to 10.

如第4圖所示,DP信號線7、DN信號線8與管理子站10經由DP、DN連接端子連接。在管理子站10中,首先,利用用以從傳送信號得到本站的電力之由電容器與二極體所構成的電源部產生電力,而該傳送信號係自DP信號線7、DN信號線8所傳來並重疊了電力。信號線所重疊之電力經由二極體向電容器充電,而得到電源電壓Vcc。供給此電源電壓Vcc,作為管理子站10內的電源。將電力與此傳送信號重疊而得到本站之電力的方式省略配線,而實現所謂的省配線。同時,管理子站10從DP信號線7、DN信號線8抽出CK信號,並交給MCU15。又,管理子站10具有位址設定14,並利用此位址設定功能進行自己的位址設定。As shown in Fig. 4, the DP signal line 7 and the DN signal line 8 are connected to the management substation 10 via DP and DN connection terminals. In the management substation 10, first, power is generated by a power supply unit composed of a capacitor and a diode for obtaining power of the own station from the transmission signal, and the transmission signal is from the DP signal line 7, the DN signal line 8. It was transmitted and overlapped with electricity. The power superposed by the signal lines charges the capacitor via the diode to obtain the power supply voltage Vcc. This power supply voltage Vcc is supplied as a power source in the management substation 10. The wiring is omitted in such a manner that the power is superimposed on the transmission signal to obtain the power of the own station, and the so-called wiring is realized. At the same time, the management substation 10 extracts the CK signal from the DP signal line 7, the DN signal line 8, and hands it to the MCU 15. Further, the management substation 10 has an address setting 14 and uses the address setting function to perform its own address setting.

MCU15根據經由DP信號線7、DN信號線8所傳來之傳送信號所包含的時鐘信號CK分析輸出入信號,並將各子站的資料資訊保持於記憶處。時鐘信號CK包含長週期的起始信號與短週期的傳送時鐘。MCU15識別起始信號後,計數傳送時鐘數,並將與在本站位址之位址設定14所設定之位址一致的時刻作為本站動作時序。在管理子站10,根據傳送時鐘從CK信號得到本站的位址時序,並從Tout端子將TD0信號作為串接信號向接著管理子站10之#B0的子站輸入部12b或#A0的子站輸出部12a送出。此MCU15由CPU18、RAM19及ROM20所構成,並根據ROM20內部所記憶保持的程式,按照後述之程式流程圖的流程動作。CPU18具有內部時鐘產生電路,並根據此內部時鐘執行MCU15內的控制。The MCU 15 analyzes the input and output signals based on the clock signal CK included in the transmission signal transmitted via the DP signal line 7 and the DN signal line 8, and holds the data information of each substation in the memory. The clock signal CK includes a long period start signal and a short period transfer clock. After the MCU 15 recognizes the start signal, it counts the number of transmission clocks and sets the time coincident with the address set in the address setting 14 of the own station address as the own station operation timing. In the management substation 10, the address timing of the own station is obtained from the CK signal according to the transmission clock, and the TD0 signal is used as a serial signal from the Tout terminal to the substation input unit 12b or #A0 of #B0 which is subsequently managed by the substation 10. The substation output unit 12a sends out. The MCU 15 is composed of a CPU 18, a RAM 19, and a ROM 20, and operates in accordance with a flow of a program flow chart to be described later based on a program stored and stored in the ROM 20. The CPU 18 has an internal clock generating circuit and performs control in the MCU 15 in accordance with this internal clock.

構成橋接配線13或子站間連接34之DP信號線7、DN信號線8及傳送TDn信號的串接線17如上述所示,利用連接器33與後續之#B0的子站輸入部12b或#A0的子站輸出部12a連接,成為易於進行配線作業之構造。The DP signal line 7 and the DN signal line 8 constituting the bridge wiring 13 or the inter-substation connection 34, and the string wiring 17 for transmitting the TDn signal are as described above, and the sub-station input portion 12b or # of the subsequent #B0 is utilized by the connector 33. The substation output unit 12a of A0 is connected, and has a structure in which wiring work can be easily performed.

如第5圖所示,CPU18利用MCU15的內部匯流排與RAM19及ROM20連接,並具有內部時鐘,根據此時鐘時序與RAM19及ROM20交換資料。又,CPU18與I/O匯流排21連接。MCU15與投入電源時之起動同時利用ROM20內部的起始化程式被起始化後,利用ROM20內所記憶之程式PRG1,系統開始動作。RAM19具有資料區域,保持從CK信號所得之資料,同時在於從位址設定部所收到之ADRS信號的時序,將是往後續之子站的串接信號之Tout信號分別經由I/O匯流排21與外部進行資料收發。As shown in Fig. 5, the CPU 18 is connected to the RAM 19 and the ROM 20 by the internal bus of the MCU 15, and has an internal clock for exchanging data with the RAM 19 and the ROM 20 in accordance with the clock timing. Further, the CPU 18 is connected to the I/O bus bar 21. When the MCU 15 is initialized by the initialization program in the ROM 20 at the same time as the startup of the power supply, the system starts operating using the program PRG1 stored in the ROM 20. The RAM 19 has a data area, holds the data obtained from the CK signal, and at the same time, the timing of the ADRS signal received from the address setting unit, and the Tout signal of the serial signal to the subsequent substation respectively passes through the I/O bus 21 Send and receive data with the outside.

第6圖係#An之子站輸出部的系統構成圖,第7圖係子站輸出部的系統方塊圖。此外,對具備與管理子站相同之功能的構成部分賦予相同的符號。Fig. 6 is a system configuration diagram of the output unit of #An's substation, and Fig. 7 is a system block diagram of the substation output unit. In addition, the same reference numerals are given to components having the same functions as those of the management substation.

如第6圖所示,子站輸出部12a亦與管理子站10一樣,本站電源係從經由DP信號線7、DN信號線8所傳來的傳送信號產生。接著管理子站10a所連接之#A0的子站輸出部12a自管理子站10a從Ti0端子27接收是串接信號的TD0信號,並經由Tout端子24向接著之#A1的子站輸出部12a送出TD1信號。一樣地,#An的子站輸出部12a從#An+1的子站輸出部12a從Tin端子27接收是串接信號的TDn信號,並經由Tout端子24向接著之#An+1的子站輸出部12a送出TDn+1信號。即,對下一段所串接的子站輸出部12a,作為TDn信號輸出對本站的位址加上1的串接信號。MCU15具有獨自的時鐘信號產生電路,並根據此時鐘信號經由RAM19、ROM20及I/O匯流排21進行I/O控制。As shown in Fig. 6, the substation output unit 12a is also generated similarly to the management substation 10, and the own station power is generated from the transmission signals transmitted via the DP signal line 7 and the DN signal line 8. Next, the substation output unit 12a of the #A0 connected to the management substation 10a receives the TD0 signal which is the serial signal from the Ti0 terminal 27 from the management substation 10a, and proceeds to the substation output unit 12a of the following #A1 via the Tout terminal 24. Send the TD1 signal. Similarly, the sub-station output unit 12a of #An receives the TDn signal which is the concatenated signal from the Tin terminal 27 from the sub-station output unit 12a of #An+1, and goes to the sub-station of #An+1 via the Tout terminal 24 The output unit 12a sends a TDn+1 signal. In other words, the substation output unit 12a connected in the next stage outputs a serial signal of 1 to the address of the own station as a TDn signal. The MCU 15 has its own clock signal generating circuit, and performs I/O control via the RAM 19, the ROM 20, and the I/O bus bar 21 based on the clock signal.

在收到TDn信號的子站輸出部12a,按照從管理子站10a所送出之串接信號的順序,在收到TDn信號的時序CPU18從Ld端子32向發光二極體LDnd送出信號,發光二極體LDnd產生第1投光信號。而,在產生第1投光信號後,從LU端子30向發光二極體LDnu送出信號,而產生第2投光信號。此外,雖然LU端子30與發光二極體LDnu成為由虛線所包圍的表示,但是這意指根據實施形態而可省略。關於省略了發光二極體LDnu之情況的實施形態,將後述。The substation output unit 12a that has received the TDn signal transmits a signal from the Ld terminal 32 to the light emitting diode LDnd at the timing of receiving the TDn signal in the order of the serial signal sent from the management substation 10a, and emits a signal. The polar body LDnd generates a first light projecting signal. On the other hand, after the first light projecting signal is generated, a signal is sent from the LU terminal 30 to the light emitting diode LDnu to generate a second light projecting signal. Further, although the LU terminal 30 and the light-emitting diode LDnu are surrounded by a broken line, this means that it can be omitted according to the embodiment. An embodiment in which the light-emitting diode LDnu is omitted will be described later.

如第7圖所示,CPU18根據獨自的內部時鐘信號執行程式,並適當地經由系統與RAM19及ROM20進行資料收發。CPU18與I/O匯流排21連接。MCU15與起動同時利用ROM20內部之起始化程式被起始化後,利用ROM20內所記憶之程式PRG2L,系統開始動作。又,MCU15在RAM19內具有資料區域,經由I/O匯流排21,受理CK信號或來自Tin端子27的TDn信號,並進行Tout端子24及LU端子30與Ld端子32的輸出動作,與外部進行信號的交換。CPU18監視CK端子22,確認已從Tin端子27取入是本站之投光時序的TDn信號,並從Ld端子32向發光二極體LDnd送出信號,產生第1投光信號後,再從LU端子30向發光二極體LDnu送出信號,產生第2投光信號。在此,LU端子30與發光二極體Ldnu係亦以虛線表示根據實施形態而可省略。As shown in Fig. 7, the CPU 18 executes the program based on the unique internal clock signal, and appropriately transmits and receives data to and from the RAM 19 and the ROM 20 via the system. The CPU 18 is connected to the I/O bus bar 21. When the MCU 15 is initialized by the initialization program in the ROM 20 at the same time as the startup, the system starts operating using the program PRG2L stored in the ROM 20. Further, the MCU 15 has a data area in the RAM 19, receives the CK signal or the TDn signal from the Tin terminal 27 via the I/O bus bar 21, and performs an output operation of the Tout terminal 24, the LU terminal 30, and the Ld terminal 32, and performs external operation. Signal exchange. The CPU 18 monitors the CK terminal 22, confirms that the TDn signal which is the light projection timing of the own station has been taken in from the Tin terminal 27, and sends a signal from the Ld terminal 32 to the light emitting diode LDnd to generate the first light projection signal, and then from the LU. The terminal 30 sends a signal to the light emitting diode LDnu to generate a second light projecting signal. Here, the LU terminal 30 and the light-emitting diode Ldnu are also indicated by broken lines and may be omitted according to the embodiment.

第8圖係子站輸入部的系統構成圖,第9圖係子站輸入部的系統方塊圖,以模式表示連接構成子站輸入部之電路元件的信號匯流排。此外,與第6圖、第7圖一樣,對具備與管理子站相同之功能的構成部分賦予相同的符號。Fig. 8 is a system configuration diagram of the substation input unit, and Fig. 9 is a system block diagram of the substation input unit, and shows a signal busbar connecting the circuit elements constituting the substation input unit in a mode. In addition, as in the sixth and seventh figures, the same components as those having the same functions as those of the management substation are denoted by the same reference numerals.

如第8圖所示,子站輸入部12b經由DP、DN連接端子與DP信號線7、DN信號線8連接。子站輸入部12b亦與管理子站10或子站輸出部12a一樣,從重疊了電源電壓的傳送信號產生本站的電力。接收作為MCU15之輸入信號並是感測系統之傳送時鐘信號的CK信號,又,從Tin端子27接收TDn信號,在該時序進行輸入處理,同時從Tout端子24送出TDn+1信號。又,以A/D變換器16將從是受光元件的發光二極體PDnu及PDnd所收到的受光信號(類比信號)變換成數位信號,並作為輸入信號ADATu信號的資料及ADATd信號的資料記憶保持於RAM19。CPU18計算該記憶保持於RAM19之ADATu信號的資料及ADATd信號之資料的差分,再將被檢測體35之有無判定結果記憶保持於RAM19的記憶區域。例如,在第3圖的感測部11a、11b,檢測出有被檢測體35。在此,在第8圖,是受光元件之發光二極體PDnu與A/D變換器16亦以虛線表示根據實施形態而可省略。As shown in Fig. 8, the substation input unit 12b is connected to the DP signal line 7 and the DN signal line 8 via DP and DN connection terminals. Similarly to the management substation 10 or the substation output unit 12a, the substation input unit 12b generates electric power of the own station from a transmission signal in which the power supply voltage is superimposed. The CK signal, which is the input signal of the MCU 15 and is the transfer clock signal of the sensing system, is received, and the TDn signal is received from the Tin terminal 27, and the input processing is performed at this timing, and the TDn+1 signal is sent from the Tout terminal 24. Further, the A/D converter 16 converts the received light signal (analog signal) received from the light-emitting diodes PDnu and PDnd of the light-receiving element into a digital signal, and serves as data of the input signal ADATu signal and data of the ADATd signal. The memory is kept in the RAM 19. The CPU 18 calculates the difference between the data of the ADATu signal and the data of the ADATd signal stored in the RAM 19, and stores the result of the determination of the object 35 in the memory area of the RAM 19. For example, in the sensing units 11a and 11b of Fig. 3, the subject 35 is detected. Here, in Fig. 8, the light-emitting diodes PDnu and the A/D converter 16 of the light-receiving element are also indicated by broken lines, and may be omitted according to the embodiment.

又,MCU15向A/D變換器u及A/D變換器d送出作為輸入ADATu信號及ADATd信號之有效動作信號的ENu信號及ENd信號,並取入來自A/D變換器u及A/D變換器d的信號。並且,對在下一段側所串接的子站輸入部12b,作為串接信號(TDn信號),在從本站的位址時序開始計數2次CK信號之下降緣時輸出串接信號串接信號(TDn+1信號)。此外,受光元件PDnd的受光信號在是來自該投光元件LDnd之受光信號的情況成為基準信號,另一方之受光元件PDnu的受光信號成為用以檢測出被檢測體之有無的檢測信號。Further, the MCU 15 sends the ENu signal and the ENd signal as the effective operation signals for inputting the ADATu signal and the ADATd signal to the A/D converter u and the A/D converter d, and takes in the signals from the A/D converter u and the A/D. The signal of converter d. Further, the substation input unit 12b connected in series on the next stage side outputs a serial signal concatenated signal when the falling edge of the CK signal is counted twice from the address timing of the own station as the serial signal (TDn signal). (TDn+1 signal). Further, the light receiving signal of the light receiving element PDnd is a reference signal when it is a light receiving signal from the light projecting element LDnd, and the light receiving signal of the other light receiving element PDnu is a detection signal for detecting the presence or absence of the object.

子站輸入部12b的動作由第9圖所示ROM20所記憶的程式PRG2P決定,與電源的投入同時被起始化,並根據後述之程式流程圖的流程動作,並且利用後述的信號計算,進行用以檢測出被檢測體35的判定或異常檢測的判定。MCU15由CPU18、經由內部匯流排與CPU18進行資料收發的RAM19與ROM20、以及I/O匯流排21所構成。CPU18具有獨自的時鐘信號產生電路,與電源的投入同時根據ROM20所記憶的程式PRG2P動作。此外,程式PRG2P之主要功能是受理作為輸入信號的CK信號、從Tin端子27接收TDn信號、受理ADATu信號及ADATd信號、進行受理各個信號時的判斷、從Tout端子24送出輸出信號、向A/D變換器16送出ENu信號、ENd信號以及從Iout端子31送出輸出信號。The operation of the substation input unit 12b is determined by the program PRG2P stored in the ROM 20 shown in Fig. 9, and is initialized at the same time as the input of the power supply, and is operated in accordance with the flow of the program flow chart to be described later, and is calculated by the signal calculation described later. It is used to detect the determination of the subject 35 or the determination of the abnormality. The MCU 15 is composed of a CPU 18, a RAM 19 and a ROM 20 for transmitting and receiving data to and from the CPU 18 via an internal bus bar, and an I/O bus bar 21. The CPU 18 has its own clock signal generating circuit, and operates in accordance with the program PRG2P stored in the ROM 20 at the same time as the input of the power source. Further, the main function of the program PRG2P is to receive the CK signal as the input signal, receive the TDn signal from the Tin terminal 27, accept the ADATu signal and the ADATd signal, determine the reception of each signal, and send the output signal from the Tout terminal 24 to A/. The D converter 16 sends out the ENu signal, the ENd signal, and the output signal from the Iout terminal 31.

一面參照第10圖,一面說明該信號的收發時序。第10圖係傳送信號的時序圖。The transmission and reception timing of the signal will be described with reference to FIG. Figure 10 is a timing diagram of the transmitted signal.

在第10圖,最上段表示重疊了電源的DP信號線7、DN信號線8上的傳送信號。在傳送信號的起始部分,以是週期比一般之光電感測系統時鐘週期長的起始位元(Start Bit)的信號STB0為起點進行週期動作。即,在起始位元(Start Bit)後之位址的資料長度是1位元的情況,如第10圖所示,第1位元成為位址1(ADRS1),第2位元成為位址2(ADRS2),僅持續子站輸入部或子站輸出部的個數,再回到起始位元(Start Bit)。在位址之資料長度具有寬度的情況之位址資料成為各位址寬度之資料的劃分,而在此表示位址之資料長度是1位元的情況。第2段的CK信號是傳送時鐘信號,具有從0至5V的波峰值。接著之TD0信號表示在起始位元(Start Bit)後從管理子站10所送出的TD0信號。In Fig. 10, the uppermost stage shows the transmission signals on the DP signal line 7 and the DN signal line 8 on which the power source is superimposed. At the beginning of the transmission signal, the periodic operation is performed starting from the signal STB0 which is a start bit longer than the clock period of the general photo-sensing system. That is, in the case where the data length of the address after the start bit (Start Bit) is 1 bit, as shown in FIG. 10, the 1st bit becomes the address 1 (ADRS1), and the 2nd bit becomes the bit. Address 2 (ADRS2), only the number of sub-station input units or sub-station output units, and then back to the start bit (Start Bit). The address data in the case where the data length of the address has a width becomes the division of the data of the address width, and here, the case where the data length of the address is one bit is indicated. The CK signal of the second stage is a transfer clock signal having a peak value from 0 to 5V. The next TD0 signal indicates the TD0 signal sent from the management substation 10 after the start bit (Start Bit).

如第10圖所示,在位址之資料長度是1位元的情況,在TD0信號之後,從TD1信號至TDn-1信號的各信號作為串接信號,每2位元連續。又,與CK信號的下降緣同步地LD1d信號上昇,成為半時鐘的投光信號。在接著之傳送時鐘週期,LD1u信號上昇,成為半時鐘的投光信號。並且在接著之傳送時鐘週期,LD2d信號上昇,成為半時鐘的投光信號。以後一樣,至LDnu信號上昇。LDnu信號亦成為半時鐘的投光信號。投光信號在被檢測體反射或透過的信號由受光元件接收,而產生PD1d信號、PD1u信號、PD2d信號、PD2u信號,以後一樣,至PDnu信號產生受光信號。受光信號PD1d信號是接收投光信號LD1d或LD1u信號的結果所產生,接著之PD1u信號亦是接收投光信號LD1d或LD1u信號的結果所產生。在這些PD1d信號及PD1u信號,亦包含在接收與被檢測體交叉之投光信號的情況所產生之信號。接著之受光信號PD2d信號亦與PD1d信號一樣,是接收投光信號LD2d或LD2u信號的結果所產生。在這些PD1d信號及PD1u信號,亦包含在接收與被檢測體交叉之投光信號的情況所產生之信號。並且至PDn信號,受光信號是接收LDnd或LDnu信號的結果所產生,各自將受光位準記憶於記憶區域。在圖10中之從PD1d信號至PD2u信號,波峰值低的部分表示因被檢測體而投光信號衰減之狀態。As shown in Fig. 10, in the case where the data length of the address is 1 bit, after the TD0 signal, each signal from the TD1 signal to the TDn-1 signal is connected as a serial signal every 2 bits. Further, the LD1d signal rises in synchronization with the falling edge of the CK signal, and becomes a half-clock projection signal. In the subsequent transfer clock cycle, the LD1u signal rises to become a half-clock spread signal. And in the subsequent transmission clock cycle, the LD2d signal rises to become a half-clock projection signal. As before, the LDnu signal rises. The LDnu signal also becomes a half-clock projection signal. The signal reflected or transmitted by the light-emitting signal on the object to be detected is received by the light-receiving element, and the PD1d signal, the PD1u signal, the PD2d signal, and the PD2u signal are generated, and thereafter, the PDnu signal is generated by the PDnu signal. The received light signal PD1d signal is generated as a result of receiving the light emitting signal LD1d or LD1u signal, and then the PD1u signal is also generated as a result of receiving the light emitting signal LD1d or LD1u signal. The PD1d signal and the PD1u signal also include signals generated when a light projecting signal that intersects with the object is received. The received light signal PD2d signal is also generated as a result of receiving the light projecting signal LD2d or LD2u signal, similarly to the PD1d signal. The PD1d signal and the PD1u signal also include signals generated when a light projecting signal that intersects with the object is received. And to the PDn signal, the received light signal is generated as a result of receiving the LDnd or LDnu signal, and each of the received light levels is memorized in the memory area. In the PD1d signal to the PD2u signal in Fig. 10, the portion where the peak value is low indicates the state in which the light projection signal is attenuated due to the subject.

其次,按照程式PRG1的流程說明關於在該管理子站之信號受理、信號輸出之具體的動作。第11圖係管理子站程式PRG1的流程圖。Next, the specific operation of the signal reception and signal output at the management substation will be described in accordance with the flow of the program PRG1. Figure 11 is a flow chart of the management subroutine program PRG1.

程式PRG1在電源的上昇緣起動,進行起始處理S1。接著,判定是傳送時鐘的CK信號是否是起始位元(S2)。在下一個時鐘CK信號的下降緣對位址計數器加1(S3),再判定是否是該管理子站的位址設定值(S4)。在不是該管理子站之位址設定值的情況,至成為該管理子站的位址,在下一個時鐘CK信號的下降緣將位址計數器持續加1(從S3至S4)。在是該管理子站之位址設定值的情況,將Tout信號(來自Tout端子24的輸出信號,以下關於「信號」可能採用一樣的表達)設為「on」(S5),在下一個時鐘CK信號的下降緣對位址計數器加1(S6),再判斷是否成為位址設定值+2(S7),若不是位址設定值+2,回到步驟S6的最前面,若是位址設定值+2,將Tout信號設為「off」,並回到步驟S2的最前面。依此方式,管理子站內部的程式按照流程圖動作。The program PRG1 is started at the rising edge of the power supply, and the initial processing S1 is performed. Next, it is determined whether or not the CK signal of the transfer clock is the start bit (S2). The address counter is incremented by 1 at the falling edge of the next clock CK signal (S3), and it is determined whether it is the address setting value of the management substation (S4). In the case where the address of the management substation is not set, the address counter is incremented by 1 (from S3 to S4) on the falling edge of the next clock CK signal to the address of the management substation. In the case of the address setting value of the management substation, the Tout signal (the output signal from the Tout terminal 24, the following expression about "signal" may be the same expression) is set to "on" (S5), on the next clock CK. The falling edge of the signal adds 1 to the address counter (S6), and then determines whether it becomes the address setting value +2 (S7). If it is not the address setting value +2, it returns to the top of step S6, if it is the address setting value. +2, set the Tout signal to "off" and return to the top of step S2. In this way, the program inside the management substation operates according to the flowchart.

接著,按照程式PRG2L的流程說明關於在該子站輸出部的信號受理、信號輸出之具體的動作。第12圖、第13圖是子站輸出部程式PRG2L的流程圖。Next, the specific operation of the signal reception and signal output at the substation output unit will be described in accordance with the flow of the program PRG2L. Fig. 12 and Fig. 13 are flowcharts of the substation output unit program PRG2L.

程式PRG2L在電源的上昇緣起動,進行起始處理S9。接著,判定是傳送時鐘的CK信號(在以下的說明有時稱為CK)是否是起始位元(S10)。在下一個時鐘CK信號的下降緣對位址計數器加1,並判定Tin信號是否是「on」(S11)。若Tin信號不是「on」,再對位址計數器加1,並重複Tin信號是否是「on」的判斷(S11)。確認Tin信號是「on」時,將位址計數器的值設定成位址值(S11)。接著,將LDnd設為「on」(S13)。判斷CK是否是「on」(S14),若CK不是「on」,則回到步驟S13的最前面。若CK是「on」,則將LDnd設為「off」(S15)。在下一個時鐘CK信號的下降緣對位址計數器加1(S16)。接著,將LDnu設為「on」(S17)。接著,判定CK是否是「on」(S18),若CK不是「on」,回到步驟S17的最前面。若CK是「on」,將LDnu設為「off」。The program PRG2L is started at the rising edge of the power supply, and the initial processing S9 is performed. Next, it is determined whether or not the CK signal (hereinafter referred to as CK in the following description) of the transfer clock is the start bit (S10). The address counter is incremented by 1 at the falling edge of the next clock CK signal, and it is determined whether or not the Tin signal is "on" (S11). If the Tin signal is not "on", the address counter is incremented by one, and the judgment of whether the Tin signal is "on" is repeated (S11). When it is confirmed that the Tin signal is "on", the value of the address counter is set to the address value (S11). Next, LDnd is set to "on" (S13). It is determined whether CK is "on" (S14), and if CK is not "on", the process returns to the top of step S13. If CK is "on", LDnd is set to "off" (S15). The address counter is incremented by 1 at the falling edge of the next clock CK signal (S16). Next, set LDnu to "on" (S17). Next, it is determined whether CK is "on" (S18), and if CK is not "on", the process returns to the top of step S17. If CK is "on", set LDnu to "off".

接著,在下一個時鐘CK信號的下降緣對位址計數器加1(S20)。接著,判斷位址計數器是否是(位址值+位址資料寬2)(S21)。若是(位址值+位址資料寬2),將Tout信號設為「on」(S22),若不是(位址值+位址資料寬2),回到步驟S20的最前面。在下一個時鐘CK信號的下降緣再對位址計數器加1(S23)。判斷位址計數器是否是(位址值+位址資料寬2+1)(S24)。若位址計數器不是(位址值+位址資料寬2+2),回到步驟S23的最前面,並等待下一個時鐘CK信號。若位址計數器是(位址值+位址資料寬2+2),將Tout信號設為「off」(S25)。然後,回到該步驟S10的最前面。Next, the address counter is incremented by 1 at the falling edge of the next clock CK signal (S20). Next, it is judged whether or not the address counter is (address value + address data width 2) (S21). If it is (address value + address data width 2), the Tout signal is set to "on" (S22), and if not (address value + address data width 2), the process returns to the top of step S20. The address counter is incremented by 1 at the falling edge of the next clock CK signal (S23). It is judged whether or not the address counter is (address value + address data width 2 + 1) (S24). If the address counter is not (address value + address data width 2+2), it returns to the top of step S23 and waits for the next clock CK signal. If the address counter is (address value + address data width 2+2), set the Tout signal to "off" (S25). Then, it returns to the forefront of this step S10.

其次,按照程式PRG2P的流程說明關於在該管理子站之信號受理、信號輸出之具體的動作。第14圖~第18圖是子站輸入部程式PRG2P的流程圖。Next, the specific operation of the signal reception and signal output at the management substation will be described in accordance with the flow of the program PRG2P. Fig. 14 to Fig. 18 are flowcharts of the substation input unit program PRG2P.

程式PRG2P與系統電源的投入同時進行電源ON起動。接著,進行起始處理(S26)。從CK信號判斷是否是起始位元(Start Bit)(STB0)(S27)。若是起始位元(STB0),在下一個時鐘CK信號的下降緣對位址計數器值加1(S28)。若不是起始位元(STB0),回到步驟S27的最前面。接著,判斷Tin信號是否是「on」(S29)。若Tin信號不是「on」,回到步驟S28的最前面,並等待下一個時鐘CK信號。若Tin信號是「on」,將位址計數器值記憶於位址值記憶位址(S30)。接著,進行A/D變換器d及A/D變換器u的動作(S31)。The program PRG2P starts the power ON at the same time as the input of the system power. Next, initial processing is performed (S26). It is judged from the CK signal whether it is a start bit (STB0) (S27). In the case of the start bit (STB0), the address counter value is incremented by 1 at the falling edge of the next clock CK signal (S28). If it is not the start bit (STB0), it returns to the top of step S27. Next, it is judged whether or not the Tin signal is "on" (S29). If the Tin signal is not "on", it returns to the forefront of step S28 and waits for the next clock CK signal. If the Tin signal is "on", the address counter value is stored in the address value memory address (S30). Next, the operation of the A/D converter d and the A/D converter u is performed (S31).

然後,將是A/D變換器d之資料的ADATd作為ADATndd記憶(S32)。Then, the ADATd which is the data of the A/D converter d is used as the ADATndd memory (S32).

並且,將是A/D變換器u之資料的ADATu作為ADATnud記憶(S33)。Further, ADATu which is the data of the A/D converter u is used as the ADATnud memory (S33).

接著,判斷物體檢測資料Dna「on/off」是否是「on」(S34)。若物體檢測資料Dna「on/off」不是「on」,將Iout信號設為「off」(S35)。另一方面,若物體檢測資料Dna「on/off」是「on」,將Iout信號設為「on」(S36)。即,在步驟S30的位址,從子站輸入部12b向母站6傳送物體檢測資料Dna「on/off」資訊。Next, it is judged whether or not the object detection data Dna "on/off" is "on" (S34). If the object detection data Dna "on/off" is not "on", set the Iout signal to "off" (S35). On the other hand, if the object detection data Dna "on/off" is "on", the Iout signal is set to "on" (S36). That is, at the address of step S30, the object detection data Dna "on/off" information is transmitted from the substation input unit 12b to the parent station 6.

接著,如第15圖所示,在下一個時鐘CK信號的下降緣對位址計數器值加1(S37)。並且將Iout信號設為「off」(S38)。接著,進行A/D變換器d與A/D變換器u的動作(S39),將是A/D變換器d之資料的ADATd作為ADATndu記憶(S40)。並且,將是A/D變換器u之資料的ADATu作為ADATnuu記憶(S41)。接著,判斷異常檢測資料An「on/off」是否是「on」(S42)。若異常檢測資料An「on/off」不是「on」,將Iout信號設為「off」(S43)。Next, as shown in Fig. 15, the address counter value is incremented by 1 at the falling edge of the next clock CK signal (S37). And the Iout signal is set to "off" (S38). Next, the operation of the A/D converter d and the A/D converter u is performed (S39), and the ADATd which is the data of the A/D converter d is stored as ADATndu (S40). Further, ADATu which is the data of the A/D converter u is used as the ADATnuu memory (S41). Next, it is judged whether or not the abnormality detection data An "on/off" is "on" (S42). If the abnormality detection data An "on/off" is not "on", the Iout signal is set to "off" (S43).

若異常檢測資料An「on/off」是「on」,將Iout信號設為「on」(S44)。接著,將Tout設為「on」(S45)。在下一個時鐘CK信號的下降緣對位址計數器值加1(S46),再將Iout信號設為「off」(S47)。接著,判斷是否是(位址值+位址資料寬2+2)(S48)。若不是(位址值+位址資料寬2+2),回到步驟S46的最前面,若是(位址值+位址資料寬2+2),將Tout設為「off」(S49)。即,在步驟S37的位址從子站輸入部12b向母站6傳送異常檢測資料An「on/off」資訊。If the abnormality detection data An "on/off" is "on", the Iout signal is set to "on" (S44). Next, Tout is set to "on" (S45). The address counter value is incremented by 1 at the falling edge of the next clock CK signal (S46), and the Iout signal is set to "off" (S47). Next, it is judged whether or not (address value + address data width 2+2) (S48). If not (address value + address data width 2+2), return to the top of step S46. If (address value + address data width 2+2), set Tout to "off" (S49). That is, the abnormality detection data An "on/off" information is transmitted from the substation input unit 12b to the parent station 6 at the address of step S37.

接著,如第16圖所示,判斷是否是ADATnuu≧S(S50)。在此,S是用以判斷是未被被檢測體遮蔽之基準信號的ADATnuu是既定以上之值的臨限值資料。Next, as shown in Fig. 16, it is judged whether or not it is ADATnuu≧S (S50). Here, S is a threshold data for determining that the ADATnuu which is a reference signal that is not masked by the subject is a predetermined value or more.

若是ADATnuu≧S,則將直邏輯判定值Snu「on/off」(根據第2組之基準信號與S之比較的邏輯信號)設為「on」(S51)。若不是ADATnuu≧S,則將Snu「on/off」設為「off」(S52)。In the case of ADATnuu≧S, the straight logic determination value Snu "on/off" (the logical signal based on the comparison between the reference signal of the second group and S) is set to "on" (S51). If it is not ADATnuu≧S, set Snu "on/off" to "off" (S52).

接著,判斷是否是ADATndd≧S(S53)。在此,S是用以判斷是未被被檢測體遮蔽之基準信號的ADATndd是既定以上之值的臨限值資料。Next, it is judged whether or not it is ADATndd≧S (S53). Here, S is a threshold data for determining that the ADATndd which is a reference signal which is not blocked by the subject is a predetermined value or more.

若是ADATndd≧S,則將直邏輯判定值Snd「on/off」(根據第1組之基準信號與S之比較的邏輯信號)設為「on」(S54)。若不是ADATndd≧S,則將Snd「on/off」設為「off」(S55)。In the case of ADATndd≧S, the straight logic determination value Snd "on/off" (the logical signal based on the comparison of the reference signal of the first group and S) is set to "on" (S54). If it is not ADATndd≧S, set Snd "on/off" to "off" (S55).

接著,如第17圖所示,將[ADATnuu-ADATndu]的計算結果記憶於△ADATnd(S56)。Next, as shown in Fig. 17, the calculation result of [ADATnuu-ADATndu] is memorized in ΔADATnd (S56).

並且,將[ADATndd-ADATnud]的計算結果記憶於△ADATnu(S57)。Further, the calculation result of [ADATndd-ADATnud] is memorized in ΔADATnu (S57).

然後,判斷是否是△ADATnd≧C(S58)。在此,C是用以判斷是基準信號之ADATnuu與是該檢測信號之ADATndu的位準差是既定以上之值的臨限值資料。Then, it is judged whether or not it is ΔADATnd≧C (S58). Here, C is a threshold data for judging that the ADMTnuu which is the reference signal and the level difference of the ADATndu which is the detection signal are predetermined values or more.

若是△ADATnd≧C,則將交叉邏輯判定值Cnd「on/off」(根據第2組之基準信號與檢測信號之位準差與C之比較的邏輯信號)設為「on」(S59)。若不是△ADATnd≧C,則將交叉邏輯判定值Cnd「on/off」設為「off」(S60)。一樣地,判斷是否是△ADATnu≧C(S61)。在此,C是用以判斷是該基準信號之ADATndd與是該檢測信號之ADATnud的位準差是既定以上之值的臨限值資料。In the case of ΔADATnd≧C, the cross logic determination value Cnd "on/off" (the logic signal based on the comparison between the reference signal of the second group and the level difference of the detection signal and C) is "on" (S59). If it is not ΔADATnd≧C, the cross logic determination value Cnd "on/off" is set to "off" (S60). Similarly, it is judged whether or not it is ΔADATnu≧C (S61). Here, C is a threshold data for judging that the ADMTndd of the reference signal and the level difference of the ADATnud of the detection signal are equal to or greater than a predetermined value.

若是△ADATnu≧C,則將交叉邏輯判定值Cnu「on/off」(根據第1組之基準信號與檢測信號之位準差與C之比較的邏輯信號)設為「on」(S62)。若不是△ADATnu≧C,則將交叉邏輯判定值Cnu「on/off」設為「off」(S63)。In the case of ΔADATnu≧C, the cross logic determination value Cnu "on/off" (the logic signal based on the comparison between the reference signal of the first group and the level difference of the detection signal and C) is "on" (S62). If it is not ΔADATnu≧C, the cross logic determination value Cnu "on/off" is set to "off" (S63).

接著,如第18圖所示,將物體檢測資料Dne「on/off」設為「off」,並且將物體不存在檢測資料Dna「on/off」設為「off」(S64)。接著,對如下之邏輯計算第(1)式判斷(S65)。Then, as shown in Fig. 18, the object detection data Dne "on/off" is set to "off", and the object non-existence detection data Dna "on/off" is set to "off" (S64). Next, the judgment of the formula (1) is calculated for the following logic (S65).

[數學式1][Math 1]

Snd ×Cnu ×Cnd ×Snu ="on "…(1) Snd × Cnu × Cnd × Snu =" on "...(1)

若是「on」,則將物體檢測資料Dne「on/off」設為「on」(S66)。若不是「on」,則向步驟S67跳越。對如下之邏輯計算第(2)式判斷(S67)。If it is "on", the object detection data Dne "on/off" is set to "on" (S66). If it is not "on", it jumps to step S67. The judgment of the formula (2) is calculated for the following logic (S67).

[數學式2][Math 2]

:Cnu 之反邏輯 : Anti-Logic of Cnu

:Cnd 之反邏輯 : The inverse logic of Cnd

在滿足該邏輯計算第(2)式的情況,將物體不存在檢測資料Dna「on/off」設為「on」(S68)。若不是「on」,則向步驟S69跳越。對如下之邏輯計算第(3)式判斷(S69)。When the logic calculation formula (2) is satisfied, the object non-existence detection data Dna "on/off" is set to "on" (S68). If it is not "on", it jumps to step S69. The equation (3) is judged (S69) for the following logic.

[數學式3][Math 3]

:Dna 之反邏輯 : Dna 's inverse logic

:Dne 之反邏輯 : Dne 's inverse logic

在滿足該邏輯計算第(3)式的情況,將異常檢測資料An「on/off」設為「off」(S70),並回到步驟S27的最前面。When the logic calculation formula (3) is satisfied, the abnormality detection data An "on/off" is set to "off" (S70), and the process returns to the top of step S27.

又,在不滿足該邏輯計算第(3)式的情況,將異常檢測資料An「on/off」設為「on」(S71),並回到步驟S27的最前面。When the equation (3) of the logic calculation is not satisfied, the abnormality detection data An "on/off" is set to "on" (S71), and the process returns to the forefront of step S27.

從該步驟S50以後至步驟S71,成為判定被檢測體之有無的計算處理,而關於該邏輯判定的概略,一面參照第19圖一面說明。若直邏輯判定值Snu「on/off」是「on」及Snd「on/off」是「on」,且交叉邏輯判定值Cnu「on/off」是「on」及Cnd「on/off」是「on」,則可檢測出有被檢測體。又,若直邏輯判定值Snu「on/off」是「on」及Snd「on/off」是「on」,且交叉邏輯判定值Cnu「on/off」是「off」及Cnd「on/off」是「off」,則可檢測出無被檢測體。在邏輯判定值是除此以外之邏輯的情況,檢測出異常狀態。From the step S50 to the step S71, the calculation processing for determining the presence or absence of the object to be detected is described, and the outline of the logic determination will be described with reference to Fig. 19. If the straight logic decision value Snu "on/off" is "on" and Snd "on/off" is "on", and the cross logic determination value Cnu "on/off" is "on" and Cnd "on/off" is "on" can detect the detected object. Further, if the straight logic determination value Snu "on/off" is "on" and Snd "on/off" is "on", and the cross logic determination value Cnu "on/off" is "off" and Cnd "on/off" If it is "off", it can detect that there is no object to be detected. When the logical decision value is other than the other logic, an abnormal state is detected.

並且,以#Bn(第n個)的子站輸入部12b為例,說明該計算處理。此外,在以下的說明,△(三角形)記號表示差分資料。The calculation process will be described using the #Bn (nth) substation input unit 12b as an example. Further, in the following description, the Δ (triangle) symbol indicates differential data.

將第n個基準信號與第n個檢測信號的差分計算結果設為△ADATnd。將第n個第2組的基準信號設為ADATnuu,並將第n個第2組的檢測信號設為ADATndu時,記憶保持△ADATnd=ADATnuu-ADATndu。The difference calculation result between the nth reference signal and the nth detection signal is set to ΔADATnd. When the reference signal of the nth second group is set to ADATnuu, and the detection signal of the nth second group is set to ADATndu, the memory holds ΔADATnd=ADATnuu-ADATndu.

將第n個第1組的基準信號設為ADATndd,並將第n個第1組的檢測信號設為ADATnud時,記憶保持△ADATndu=ADATndd-ADATnud。When the reference signal of the nth first group is set to ADATndd, and the detection signal of the nth first group is set to ADATnud, the memory holds ΔADATndu=ADATndd-ADATnud.

若是第n個第2組之基準信號的ADATnuu大於用以判斷是既定以上之值的臨限值資料S,則直邏輯判定值Snu「on/off」狀態變成「on」,判斷第n個第2組之基準信號正常地動作。If the ADATnuu of the reference signal of the nth second group is larger than the threshold data S for judging that it is a predetermined value or more, the straight logic determination value Snu "on/off" state becomes "on", and the nth number is judged. The reference signals of the two groups operate normally.

若是第n個第2組之基準信號的ADATnuu小於用以判斷是既定以上之值的臨限值資料S,則直邏輯判定值Snu「on/off」狀態變成「off」,判斷第n個第2組之基準信號未正常地動作。If the ADATnuu of the reference signal of the nth second group is smaller than the threshold data S for judging that it is a predetermined value or more, the state of the straight logic determination value Snu "on/off" becomes "off", and the nth number is judged. The reference signals of the two groups did not operate normally.

若是第n個第1組之基準信號的ADATndd大於用以判斷是既定以上之值的臨限值資料S,則直邏輯判定值Snd「on/off」狀態變成「on」,判斷第n個第1組之基準信號正常地動作。If the ADATndd of the reference signal of the nth first group is larger than the threshold data S for judging that it is a predetermined value or more, the state of the straight logic determination value Snd "on/off" becomes "on", and the nth number is judged. The reference signal of one group operates normally.

若是第n個第1組之基準信號的ADATndd小於用以判斷是既定以上之值的臨限值資料S,則直邏輯判定值Snd「on/off」狀態變成「off」,判斷第n個第1組之基準信號未正常地動作。If the ADATndd of the reference signal of the nth first group is smaller than the threshold data S for judging that it is a predetermined value or more, the state of the straight logic determination value Snd "on/off" becomes "off", and the nth number is judged. The reference signal of group 1 does not operate normally.

又,若△ADATnd大於用以判斷是既定以上之值的臨限值資料C,則交叉邏輯判定值Cnd「on/off」狀態變成「on」,意指在第2組存在被檢測體。Further, when ΔADATnd is larger than the threshold data C for determining that the value is equal to or greater than the predetermined value, the cross logic determination value Cnd "on/off" state becomes "on", which means that the subject is present in the second group.

又,若△ADATnd小於用以判斷是既定以上之值的臨限值資料C,則交叉邏輯判定值Cnd「on/off」狀態變成「off」,意指在第2組未存在被檢測體。In addition, when ΔADATnd is smaller than the threshold data C for determining that the value is equal to or greater than the predetermined value, the cross logic determination value Cnd "on/off" state becomes "off", which means that the subject does not exist in the second group.

又,若△ADATnu大於用以判斷是既定以上之值的臨限值資料C,則交叉邏輯判定值Cnu「on/off」狀態變成「on」,意指在第1組存在被檢測體的可能性。Further, if ΔADATnu is larger than the threshold data C for judging that it is a predetermined value or more, the cross logic determination value Cnu "on/off" state becomes "on", which means that there is a possibility that the subject exists in the first group. Sex.

又,若△ADATnu小於用以判斷是既定以上之值的臨限值資料C,則交叉邏輯判定值Cnu「on/off」狀態變成「off」,意指在第1組未存在被檢測體的可能性。Further, if ΔADATnu is smaller than the threshold data C for judging that it is a predetermined value or more, the cross logic determination value Cnu "on/off" state becomes "off", meaning that there is no subject in the first group. possibility.

在如下之第(4)式的邏輯值是「on」時,將物體檢測資料Dne「on/off」設為「on」。這意指被檢測體完全存在之狀態。When the logical value of the following formula (4) is "on", the object detection data Dne "on/off" is set to "on". This means the state in which the subject is completely present.

[數學式4][Math 4]

Snd ×Cnu ×Cnd ×Snu …(4) Snd × Cnu × Cnd × Snu ...(4)

該第(4)式的邏輯值是「off」時,物體檢測資料Dne「on/off」依然是「off」。這意指被檢測體完全未存在之狀態。When the logical value of the equation (4) is "off", the object detection data Dne "on/off" is still "off". This means a state in which the subject is completely absent.

該Dne「on/off」之「on」、「off」狀態被記憶保持。The "on" and "off" states of the Dne "on/off" are memorized.

在如下之第(5)式的邏輯值是「on」時,將物體不存在檢測資料Dna「on/off」設為「on」。這意指被檢測體完全不存在之狀態。When the logical value of the following formula (5) is "on", the object non-existent detection data Dna "on/off" is set to "on". This means a state in which the subject is completely absent.

[數學式5][Math 5]

:Cnu 之反邏輯 : Anti-Logic of Cnu

:Cnd 之反邏輯 : The inverse logic of Cnd

在該第(5)式的邏輯值是「off」時,物體不存在檢測資料Dna「on/off」依然是「off」。這意指被檢測體不是不存在之狀態。When the logical value of the equation (5) is "off", the object detection data Dna "on/off" is still "off". This means that the subject is not in a non-existent state.

該Dna「on/off」之「on」、「off」狀態被記憶保持。即,表示被檢測體完全存在之狀態的物體檢測資料Dne「on/off」與表示被檢測體完全不存在之狀態的物體不存在檢測資料Dna「on/off」的邏輯成為互斥之關係。The "on" and "off" states of the Dna "on/off" are memorized. In other words, the logic of the object detection data Dne "on/off" indicating that the object is completely present and the object indicating that the object is completely absent does not have the detection data Dna "on/off" become mutually exclusive.

數學第(6)式的互斥邏輯與是「on」時,將異常檢測資料An「on/off」設為「off」。When the mutual exclusion logic of the equation (6) of the mathematics is "on", the abnormality detection data An "on/off" is set to "off".

[數學式6][Math 6]

:Dna 之反邏輯 : Dna 's inverse logic

:Dne 之反邏輯 : Dne 's inverse logic

在數學第(6)式的互斥邏輯與不是「on」時,將異常檢測資料An「on/off」設為「on」。即,物體檢測資料Dne「on/off」與物體不存在檢測資料Dna「on/off」的邏輯不是互斥之關係時,將異常檢測資料An「on/off」設為「on」。在異常檢測資料An「on/off」是「on」時,表示投光單元36及受光單元37之故障狀態、或保持被檢測體之異常之狀態。When the mutual exclusion logic of the equation (6) of the mathematics is not "on", the abnormality detection data An "on/off" is set to "on". In other words, when the object detection data Dne "on/off" and the logic of the object non-existent detection data Dna "on/off" are not mutually exclusive, the abnormality detection data An "on/off" is set to "on". When the abnormality detection data An "on/off" is "on", it indicates a failure state of the light projecting unit 36 and the light receiving unit 37, or a state in which the abnormality of the object to be detected is maintained.

第20圖係是在#Bn之子站輸入部之記憶處的RAM記憶圖。在此圖,成為從位於最下段之1通道的資料向上至n通道的資料排列,資料項目從左分別是發光二極體(受光元件)的信號資料(A/D變換後的資料)、交叉差分資料、直邏輯判定資料、交叉邏輯判定資料、物體檢測資料及異常檢測資料。這些資料是CPU18每次使RAM19之既定的記憶位址記憶者。Figure 20 is a RAM memory map at the memory of the input of the substation of #Bn. In this figure, the data is arranged from the data in the lowermost channel to the n channel, and the data items are the signal data (A/D converted data) and crossover of the light-emitting diode (light-receiving element) from the left. Differential data, straight logic decision data, cross logic decision data, object detection data, and anomaly detection data. These data are the memory address memories that the CPU 18 makes for the RAM 19 each time.

第21圖係表示在#Bn之子站輸入部的計算資料之各資料名稱的圖。在此圖,亦與第20圖一樣,成為從位於最下段之1通道的計算資料向上至n通道的資料排列。資料項目從左分別是投光器LD依序發光狀態、發光二極體(受光元件)的信號資料、交叉差分資料、直邏輯判定資料、交叉邏輯判定資料、物體檢測資料及異常檢測資料。這些資料亦是CPU18每次使RAM19之既定的記憶位址記憶者。Fig. 21 is a view showing the names of the respective materials of the calculation data at the sub-station input unit of #Bn. In this figure, as in the 20th figure, it is an arrangement of data from the calculation data of the first channel located at the lowermost stage to the n channel. From the left, the data items are the sequential illumination state of the emitter LD, the signal data of the light-emitting diode (light-receiving element), the cross-difference data, the straight logic determination data, the cross logic determination data, the object detection data, and the anomaly detection data. These data are also the memory address memory that the CPU 18 makes for the RAM 19 each time.

在此光電感測系統,如上述所示,將投光元件LDnd與第1受光元件PDnd的一對及投光元件LDnd與第2受光元件PDnu的一對設為第1組,將第2投光元件LDnu與第1受光元件PDnd的一對及第2投光元件LDnu與第2受光元件PDnu的一對設為第2組,並雙重地比對檢測出從第1組所得之被檢測體的有無資訊與從第2組所得之被檢測體的有無資訊。然而,在兼顧所要求之精度而不必雙重地比對檢測出的情況,亦可僅使用第1組或第2組之任一方來檢測。在此情況,子站輸出部僅具有1個投光元件即可。In the photo-sensing system, as described above, the pair of the light-emitting element LDnd and the first light-receiving element PDnd and the pair of the light-emitting element LDnd and the second light-receiving element PDnu are set to the first group, and the second projection is performed. A pair of the optical element LDnu and the first light receiving element PDnd and a pair of the second light projecting element LDnu and the second light receiving element PDnu are set to the second group, and the object obtained from the first group is detected in a double alignment. The presence or absence of information and the presence or absence of information on the subject obtained from the second group. However, it is also possible to detect using only one of the first group or the second group without taking into consideration the required accuracy. In this case, the substation output unit may have only one light projecting element.

又,雖然在此光電感測系統所使用的感測部11n是由構成子站輸出部12a的投光單元36與構成子站輸出部的受光單元37所組合並單元化者,但是單元化係因應於需要進行即可,但,在進行單元化的情況,因為各段的間隔可自由地設定,所以具有可擴大應用範圍的優點。In addition, the sensor unit 11n used in the photo-sensing system is combined and unitized by the light-projecting unit 36 constituting the sub-station output unit 12a and the light-receiving unit 37 constituting the sub-station output unit. In the case of unitization, since the interval of each segment can be freely set, there is an advantage that the range of application can be expanded.

並且,在未檢測出被檢測體35a之有無的情況,亦可當作檢測出被檢測體35a的異常狀態或感測器故障、或者雙方。在此情況的邏輯計算亦可由各子站輸入部12b進行,或者亦可由母站6或控制部1進行。Further, when the presence or absence of the subject 35a is not detected, it is also possible to detect an abnormal state of the subject 35a, a sensor failure, or both. The logical calculation in this case may be performed by each substation input unit 12b, or may be performed by the parent station 6 or the control unit 1.

此外,雖然在此光電感測系統作為子站輸入部12b使用具有2個受光元件PDnu、PDnd者,但是如上述所示,亦可省略其中1個。即,作為子站輸入部12b,亦可使用僅具有1個受光元件者。第22圖係表示本發明之光電感測器之其他的實施形態之構成圖。此外,對與第1圖~第21圖所示之實施形態實質上相同的部分賦予相同的符號,並簡化或省略其說明。又,使用此光電感測器的光電感測系統亦因為成為與第1圖~第21圖所示之光電感測系統實質上相同的構成,所以省略系統的圖示。Further, in the photo-sensing system, the two light-receiving elements PDnu and PDnd are used as the sub-station input unit 12b. However, as described above, one of them may be omitted. In other words, as the substation input unit 12b, one having only one light receiving element can be used. Fig. 22 is a view showing the configuration of another embodiment of the photo-electrical sensor of the present invention. It is to be noted that the same reference numerals are given to the portions that are substantially the same as those in the first embodiment to the first embodiment, and the description thereof will be simplified or omitted. Further, since the photo-sensing system using the photo-sensing device has substantially the same configuration as the photo-sensing system shown in FIGS. 1 to 21, the illustration of the system is omitted.

第22圖所示的光電感測器11連結複數個由具有單一之投光元件LDnd的子站輸出部12a與具有單一之受光元件PDnd的子站輸入部12b所構成的感測部。對感測部的個數無限制,可因應於需要而連結所需的個數,雖然此光電感測器亦連結多個感測部,但是在第22圖權宜上僅表示5個感測部11a、11b、11c、11d、11e(以下有時將這些總稱為感測部11)。The photodetector 11 shown in Fig. 22 is connected to a plurality of sensing units including a substation output unit 12a having a single light projecting element LDnd and a substation input unit 12b having a single light receiving element PDnd. There is no limit to the number of sensing units, and the required number can be connected as needed. Although the photo-sensing device is also connected to a plurality of sensing units, only the five sensing units are indicated on the right in FIG. 11a, 11b, 11c, 11d, and 11e (hereinafter, these are collectively referred to as the sensing unit 11 in some cases).

又,光電感測器11經由投光側的管理子站10a及受光側的管理子站10b與DP信號線7、DN信號線8連接,並可經由母站6控制。投光側的管理子站10a與受光側的管理子站10b經由橋接配線13與感測部11a連接,從感測部11a至感測部11e各自利用子站間連接34串接。此外,各個感測部11與DP信號線7、DN信號線8連接,從各個感測部11向DP信號線7、DN信號線8送出被檢測體之有無的檢測信號。Further, the photodetector 11 is connected to the DP signal line 7 and the DN signal line 8 via the management sub-station 10a on the light-emitting side and the management sub-station 10b on the light-receiving side, and can be controlled via the parent station 6. The management sub-station 10a on the light-emitting side and the management sub-station 10b on the light-receiving side are connected to the sensing unit 11a via the bridge wiring 13, and are connected in series from the sensing unit 11a to the sensing unit 11e by the inter-substation connection 34. Further, each of the sensing units 11 is connected to the DP signal line 7 and the DN signal line 8, and sends a detection signal of the presence or absence of the object to the DP signal line 7 and the DN signal line 8 from each of the sensing units 11.

在此光電感測器11,從發光元件LDnd至相同之感測部11n的受光元件PDnd之投光信號成為不會被被檢測體35a遮蔽的受光信號,即基準信號。又,從發光元件LDnd向與具有發光元件LDnd的感測部11n相鄰之感測部11n+1(上段側)的受光元件PD(n+1)d斜分散之投光信號被被檢測體35a遮蔽,而在受光元件PD(n+1)d的受光信號衰減,成為微小位準的檢測信號。然後,比較這些基準信號與檢測信號的位準差,而檢測出被檢測體35a的有無資訊。此外,與具有發光元件LDnd的感測部11n相鄰之感測部亦可是感測部11n-1(初段側)。但,因為是任一方的感測部都無量質上的差異,所以以下僅說明感測部11n+1的情況。In the photo-detector 11, the light-emitting signal from the light-emitting element LDnd to the light-receiving element PDnd of the same sensing portion 11n becomes a light-receiving signal that is not blocked by the object 35a, that is, a reference signal. Further, a light-emitting signal obliquely dispersed from the light-emitting element LDnd to the light-receiving element PD(n+1)d of the sensing portion 11n+1 (upper side) adjacent to the sensing portion 11n having the light-emitting element LDnd is a subject 35a is shielded, and the light receiving signal of the light receiving element PD(n+1)d is attenuated, and becomes a minute level detection signal. Then, the level difference between the reference signal and the detection signal is compared, and the presence or absence of the object 35a is detected. Further, the sensing portion adjacent to the sensing portion 11n having the light emitting element LDnd may be the sensing portion 11n-1 (the first stage side). However, since there is no difference in mass between the sensing portions of either one, only the case of the sensing unit 11n+1 will be described below.

依此方式,即使子站輸入部12b未具有2個受光元件,亦藉由利用相鄰之子站輸入部12b的受光元件,而可作用為與使用具有2個受光元件之子站輸入部的情況相同。In this manner, even if the substation input unit 12b does not have two light receiving elements, it can be used as the case of using the substation input unit having the two light receiving elements by using the light receiving elements of the adjacent substation input unit 12b. .

管理子站10a及管理子站10b各自在同一時序向各自所連續的子站輸出部12a、子站輸入部12b送出串接信號(以下有時稱為TDn信號)。子站輸入部12b或子站輸出部12a接收利用此TDn信號所傳來之本站的位址時序,並向下一段側所串接的子站輸入部12b輸出串接信號(TDn+1信號)。此時,是串接信號的TDn+1信號係在計數了CK信號的下降緣2次時向本站的位址輸出。TDn信號與第1圖~第21圖所示的光電感測系統一樣,成為後續之子站輸出部或子站輸入部的位址時序信號。例如,若是感測部11b的子站輸入部12b,其受光時序成為感測部11a之投光元件LD1d的投光時序與感測部11b之投光元件LD2d的投光時序。在投光元件LD1d的投光時序,受光元件PD1d的受光信號成為基準信號,受光元件PD2d的受光信號成為檢測信號。又,在投光元件LD2d的投光時序,受光元件PD1d的受光信號成為檢測信號,受光元件PD2d的受光信號成為基準信號。即,感測部11n在LD(n-1)d的投光時序與LDnd的投光時序受理受光信號。受光信號與第1圖~第21圖所示的光電感測系統一樣,每次利用A/D變換器將受光信號變換成數位信號資料,並記憶於各個記憶區域。Each of the management sub-station 10a and the management sub-station 10b transmits a serial signal (hereinafter sometimes referred to as a TDn signal) to the respective sub-station output unit 12a and the sub-station input unit 12b at the same timing. The substation input unit 12b or the substation output unit 12a receives the address timing of the own station transmitted by the TDn signal, and outputs the serial connection signal (TDn+1 signal) to the substation input unit 12b connected in series to the next stage side. ). At this time, the TDn+1 signal which is the serial signal is output to the address of the own station when the falling edge of the CK signal is counted twice. The TDn signal is the same as the photo-sensing system shown in Figs. 1 to 21, and becomes the address timing signal of the subsequent substation output or substation input. For example, in the substation input unit 12b of the sensing unit 11b, the light receiving timing is the light projection timing of the light projecting element LD1d of the sensing unit 11a and the light projection timing of the light projecting element LD2d of the sensing unit 11b. At the light emission timing of the light projecting element LD1d, the light receiving signal of the light receiving element PD1d becomes a reference signal, and the light receiving signal of the light receiving element PD2d becomes a detection signal. Moreover, at the light emission timing of the light projecting element LD2d, the light receiving signal of the light receiving element PD1d becomes a detection signal, and the light receiving signal of the light receiving element PD2d becomes a reference signal. In other words, the sensing unit 11n receives the light receiving signal at the light emission timing of the LD(n-1)d and the light emission timing of the LDnd. The received light signal is the same as the photo-sensing system shown in Figs. 1 to 21, and the received light signal is converted into digital signal data by the A/D converter and stored in each memory area.

又,在此光電感測器11,亦可雙重地比對檢測出被檢測體35a的有無資訊。在此情況,亦將感測部11n之投光元件LDn與受光元件PDn的一對、及感測部11n之投光元件LDn與感測部11n+1之受光元件PDn+1的一對設為第1組,並將感測部11n+1之投光元件LDn+1與感測部11n之受光元件PDn的一對、及感測部11n+1之投光元件LDn+1與受光元件PDn+1的一對設為第2組即可。Further, in the photodetector 11, the presence or absence of information of the subject 35a can be detected in a double comparison. In this case, a pair of the light projecting element LDn and the light receiving element PDn of the sensing unit 11n, and a pair of light receiving elements LDn of the sensing unit 11n and the light receiving element PDn+1 of the sensing unit 11n+1 are also provided. In the first group, the pair of light projecting elements LDn+1 of the sensing portion 11n+1 and the light receiving element PDn of the sensing portion 11n, and the light projecting element LDn+1 of the sensing portion 11n+1 and the light receiving element A pair of PDn+1 may be set as the second group.

此外,因為此光電感測器11中之子站輸入部12b的基本構成與第1圖~第21圖所示之光電感測系統的相同,所以參照第8圖之子站輸入部的系統構成圖。Further, since the basic configuration of the substation input unit 12b in the photodetector 11 is the same as that of the photo-sensing system shown in Figs. 1 to 21, the system configuration diagram of the substation input unit in Fig. 8 is referred to.

此子站輸入部12b省略在第8圖以虛線所示之受光元件PDnu,而僅具有受光元件PDnd。The substation input unit 12b omits the light receiving element PDnu indicated by a broken line in Fig. 8, and has only the light receiving element PDnd.

雖然相鄰的感測部是感測部11n+1,但是在將檢測比對雙重化的情況,成為感測部11n-1與感測部11n+1。The adjacent sensing unit is the sensing unit 11n+1. However, when the detection is doubled, the sensing unit 11n-1 and the sensing unit 11n+1 are provided.

其次,按照第22圖說明該光電感測器11的動作。首先,從管理子站10a及10b送出TD0時序信號,在此時刻,感測部11a的受光元件PD1d與感測部11b的受光元件PD2d以各自之感測部的A/D變換器16將受光信號進行類比信號的數化信號化,並作為ADAT的資料位準,記憶保持於各自的RAM19。此時,受光元件PD1d的受光信號作為ADATd信號的資料位準,受光元件PD2d的受光信號作為ADATu信號的資料位準,記憶保持於RAM19。各自的CPU18從該記憶保持於RAM19之ADATu信號的資料位準計算與ADATd之資料位準的差分,並將被檢測體35a的有無判定結果記憶保持於RAM19的記憶區域。在此光電感測器11的例子,檢測出在感測部11a與感測部11b之間有被檢測體35a。Next, the operation of the photodetector 11 will be described with reference to Fig. 22. First, the TD0 timing signal is sent from the management sub-stations 10a and 10b. At this time, the light-receiving element PD1d of the sensing unit 11a and the light-receiving element PD2d of the sensing unit 11b receive light by the A/D converter 16 of each sensing unit. The signal is digitized and signaled by the analog signal, and as the data level of the ADAT, the memory is kept in the respective RAM 19. At this time, the light receiving signal of the light receiving element PD1d is used as the data level of the ADATd signal, and the light receiving signal of the light receiving element PD2d is used as the data level of the ADATu signal, and is stored and held in the RAM 19. The respective CPUs 18 calculate the difference between the data level of the ADATu signal held in the RAM 19 and the data level of the ADATd, and retains the result of the presence or absence of the object to be detected 35a in the memory area of the RAM 19. In the example of the photodetector 11, it is detected that the object 35a is detected between the sensing portion 11a and the sensing portion 11b.

在第22圖,以虛線所示的被檢測體35b表示若是正常之狀態應被收容的被檢測體未存在。關於此被檢測體35b的位置,感測部11b之受光元件PD2d的受光信號作為ADATd信號的資料位準,感測部11c之受光元件PD3d的受光信號作為ADATu信號的資料位準,各自被A/D變換器16進行數位信號化,並記憶保持於RAM19。感測部11b與11c各自的CPU18進行求得RAM19所記憶保持之ADATu信號的資料位準與ADATd信號之資料位準之差分的計算處理。在此光電感測器的例子,被檢測體不存在,從感測部11b之投光元件LD2d至受光元件PD2d及受光元件PD3d的投光信號都不衰減。因而,該差分成為接近0的值,被檢測體35b被判定無,該判定結果被記憶保持於RAM19的記憶區域。In Fig. 22, the subject 35b indicated by a broken line indicates that the subject to be accommodated in a normal state does not exist. The position of the subject 35b is such that the light receiving signal of the light receiving element PD2d of the sensing unit 11b is the data level of the ADATd signal, and the light receiving signal of the light receiving element PD3d of the sensing unit 11c is used as the data level of the ADATu signal, and is respectively A. The /D converter 16 performs digital signalization and is memory-held in the RAM 19. The CPU 18 of each of the sensing units 11b and 11c performs calculation processing for determining the difference between the data level of the ADATu signal memorized and held by the RAM 19 and the data level of the ADATd signal. In the example of the photo-electrical sensor, the object to be detected does not exist, and the light-emitting signals from the light projecting element LD2d of the sensing unit 11b to the light-receiving element PD2d and the light-receiving element PD3d are not attenuated. Therefore, the difference becomes a value close to 0, and the subject 35b is judged to be absent, and the result of the determination is stored in the memory area of the RAM 19.

關於被檢測體35c,感測部11c與感測部11d進行與關於被檢測體35之感測部11a、11b一樣的動作,被檢測出有。With respect to the subject 35c, the sensing unit 11c and the sensing unit 11d perform the same operation as the sensing units 11a and 11b of the subject 35, and are detected.

被檢測體35d被保持成異常地具有傾斜,從在正常的情況不會被遮蔽之感測部11d的投光元件LD4d至受光元件PD4d的投光信號成為被被檢測體35d遮蔽之狀態。另一方面,從投光元件LD4d至感測部11e之受光元件PD5d的投光信號成為被被檢測體35d遮蔽之狀態。因為基準信號與檢測信號之雙方被遮蔽,所以檢測出被檢測體35d的異常保持或保管狀態(斜放置)異常。The subject 35d is held in an abnormally inclined state, and the light projecting signal from the light projecting element LD4d to the light receiving element PD4d of the sensor unit 11d that is not normally blocked is in a state of being shielded by the subject 35d. On the other hand, the light projection signal from the light projecting element LD4d to the light receiving element PD5d of the sensing unit 11e is in a state of being shielded by the object 35d. Since both the reference signal and the detection signal are shielded, it is detected that the abnormality of the detected object 35d or the storage state (inclined placement) is abnormal.

一面參照第23圖,一面說明在此光電感測器11之信號的收發時序。第23圖係傳送信號的時序圖。此外,因為第23圖的時序圖與第10圖的時序圖之主要的相異點是投光信號及受光信號,關於除此以外的信號實質上相同,所以在此,僅說明是受光信號的PD1d信號、PD2d信號及PD3d信號。Referring to Fig. 23, the timing of transmitting and receiving signals of the photodetector 11 will be described. Figure 23 is a timing diagram of the transmitted signal. In addition, since the main difference between the timing chart of FIG. 23 and the timing chart of FIG. 10 is the light projecting signal and the light receiving signal, the other signals are substantially the same, and therefore, only the light receiving signal is described here. PD1d signal, PD2d signal and PD3d signal.

受光信號PD1d信號是接收LD1d信號或LD2d信號的結果所產生,接下來的受光信號PD2d信號是接收LD1d信號、LD2d及LD3d信號(未圖示)。在這些PD1d信號及PD2d信號,亦包含在接收與被檢測體交叉之投光信號的情況所產生之信號。後續之受光信號PD3d信號亦與PD2d信號一樣,是接收LD2d信號、LD3d信號(未圖示)及LD4d信號(未圖示)的結果所產生。在此PD3d信號,亦包含在接收與被檢測體交叉之投光信號的情況所產生之信號。並且至PDnd信號,是接收LD(n-1)d信號、LDnd信號及LD(n+1)信號的結果所產生,各自將受光位準記憶於記憶區域。在圖中的PD3d信號,波高值低之以虛線表示的部分表示收容被檢測體的情況,即一般投光信號成為衰減之狀態。The received light signal PD1d signal is generated as a result of receiving the LD1d signal or the LD2d signal, and the next received light signal PD2d signal is the received LD1d signal, LD2d and LD3d signals (not shown). The PD1d signal and the PD2d signal also include signals generated when a light projecting signal that intersects with the object is received. The subsequent received light signal PD3d signal is also generated as a result of receiving the LD2d signal, the LD3d signal (not shown), and the LD4d signal (not shown), similarly to the PD2d signal. The PD3d signal also includes a signal generated in the case of receiving a light projecting signal that intersects the object to be detected. And the PDnd signal is generated as a result of receiving the LD(n-1)d signal, the LDnd signal, and the LD(n+1) signal, and each of the received light levels is memorized in the memory area. In the PD3d signal in the figure, a portion indicated by a broken line having a low wave height value indicates a case where the object to be detected is accommodated, that is, a state in which the general light projecting signal is attenuated.

此光電感測器中的感測部11n與第1圖~第21圖所示者相同,是由構成子站輸出部12a的投光單元36與構成子站輸出部的受光單元37所組合並單元化者。因而,具有可自由地設定各段的間隔,並應用於各種厚度或大小的被檢測體,又,可大為擴大對被檢測體之形狀相異的情況之應用範圍的優點。The sensor unit 11n in the photodetector is the same as that shown in FIGS. 1 to 21, and is composed of a light projecting unit 36 constituting the substation output unit 12a and a light receiving unit 37 constituting the substation output unit. Unitizer. Therefore, it is possible to freely set the interval of each segment and apply it to various thicknesses or sizes of the object to be detected, and it is possible to greatly expand the range of application in the case where the shape of the object to be detected is different.

此外,在該實施形態,都以2個受光元件接收來自一個投光元件的投光信號,那些受光元件各自產生基準信號與檢測信號。然而,亦可採用以一個受光元件在各自之分時投光時序接收來自2個相異之投光元件的投光信號,並各自之分時投光時序產生基準信號與檢測信號。在此情況,成為本發明之第2光電感測器的實施形態。在第2光電感測器,除了可得到上述之效果以外,並且即使受光部是具備有單一之受光元件者,亦不必與相鄰的受光部進行信號的收發,就可得到基準信號與檢測信號的位準差,亦具有可使電路或計算變成更簡單之優點。Further, in this embodiment, the light-emitting signals from one light-emitting element are received by the two light-receiving elements, and each of the light-receiving elements generates a reference signal and a detection signal. However, it is also possible to use one light-receiving element to receive the light-emitting signals from the two different light-emitting elements at their respective time-division projection timings, and to generate the reference signal and the detection signal for each of the time-division projection timings. In this case, it is an embodiment of the second photodetector of the present invention. In the second photodetector, in addition to the above-described effects, even if the light receiving unit includes a single light receiving element, it is not necessary to transmit and receive signals to and from the adjacent light receiving unit, and the reference signal and the detection signal can be obtained. The bit difference also has the advantage of making the circuit or calculation simpler.

1...控制部1. . . Control department

2...輸出單元2. . . Output unit

3...輸入單元3. . . Input unit

4...控制信號4. . . control signal

5...監視信號5. . . Surveillance signal

6...母站6. . . Mother station

7...DP信號線7. . . DP signal line

8...DN信號線8. . . DN signal line

10...管理子站10. . . Management substation

11...光電感測器11. . . Photoelectric detector

11a、…、11n...感測部11a,...,11n. . . Sensing department

12...子站輸入部、子站輸出部12. . . Substation input unit, substation output unit

13...橋接配線13. . . Bridge wiring

14...位址設定14. . . Address setting

15...MCU15. . . MCU

16...A/D變換器16. . . A/D converter

17...串接線17. . . String wiring

18...CPU18. . . CPU

19...RAM19. . . RAM

20...ROM20. . . ROM

21...I/O匯流排twenty one. . . I/O bus

22...CK端子twenty two. . . CK terminal

24...Tout端子twenty four. . . Tout terminal

27...Tin端子27. . . Tin terminal

30...LU端子30. . . LU terminal

31...Iout端子31. . . Iout terminal

32...Ld端子32. . . Ld terminal

33...連接器33. . . Connector

34...子站間連接34. . . Substation connection

35...被檢測體35. . . Subject

36...投光單元36. . . Projection unit

37...受光單元37. . . Light receiving unit

第1圖係本發明之光電感測系統之實施形態的系統整體圖。Fig. 1 is a system overall view showing an embodiment of the photo-electrical sensing system of the present invention.

第2圖係該光電感測系統的方塊圖。Figure 2 is a block diagram of the photo-sensing system.

第3圖係該光電感測系統中之光電感測器的構成圖。Figure 3 is a block diagram of the photo-electrical sensor in the photo-sensing system.

第4圖係該光電感測系統中之管理子站的功能方塊圖。Figure 4 is a functional block diagram of the management substation in the photo-sensing system.

第5圖係該光電感測系統中之管理子站的系統方塊圖。Figure 5 is a system block diagram of the management substation in the photo-sensing system.

第6圖係該光電感測系統中之子站輸出部的系統構成圖。Fig. 6 is a system configuration diagram of the output unit of the substation in the photo-sensing system.

第7圖係該光電感測系統中之子站輸出部的系統方塊圖。Figure 7 is a system block diagram of the output of the substation in the photo-sensing system.

第8圖係該光電感測系統中之子站輸入部的系統構成圖。Fig. 8 is a system configuration diagram of a substation input unit in the photo-sensing system.

第9圖係該光電感測系統中之子站輸入部的系統方塊圖。Figure 9 is a system block diagram of the input of the substation in the photo-sensing system.

第10圖係該光電感測系統中之傳送信號的時序圖。Figure 10 is a timing diagram of the transmitted signals in the photo-sensing system.

第11圖係該光電感測系統中之管理子站程式流程圖。Figure 11 is a flow chart of the management substation program in the photo-sensing system.

第12圖係該光電感測系統中之子站輸出部的程式流程圖。Figure 12 is a flow chart of the program output of the substation in the photo-sensing system.

第13圖係接著第12圖之該光電感測系統中之子站輸出部的程式流程圖。Fig. 13 is a flow chart showing the program of the substation output portion of the photo-sensing system of Fig. 12;

第14圖係該光電感測系統中之子站輸入部程式流程圖。Figure 14 is a flow chart of the substation input program in the photo-sensing system.

第15圖係接著第14圖之該光電感測系統中之子站輸入部的程式流程圖。Fig. 15 is a flow chart showing the program of the substation input unit in the photo-sensing system of Fig. 14.

第16圖係接著第15圖之該光電感測系統中之子站輸入部的程式流程圖。Fig. 16 is a flow chart showing the program of the substation input section in the photo-sensing system of Fig. 15.

第17圖係接著第16圖之該光電感測系統中之子站輸入部的程式流程圖。Fig. 17 is a flow chart showing the program of the substation input unit in the photo-sensing system of Fig. 16.

第18圖係接著第17圖之該光電感測系統中之子站輸入部的程式流程圖。Fig. 18 is a flow chart showing the program of the substation input section in the photo-sensing system of Fig. 17;

第19圖係在該光電感測系統的邏輯判定圖。Figure 19 is a logic diagram of the photo-sensing system.

第20圖係該光電感測系統中之#Bn之子站輸入部的RAM記憶圖。Figure 20 is a RAM memory diagram of the input of the substation #Bn in the photo-sensing system.

第21圖係該光電感測系統中之#Bn之子站輸入部的計算資料。Figure 21 is the calculation data of the input section of the #Bn substation in the photo-sensing system.

第22圖係本發明之光電感測系統之其他的實施形態之光電感測器的構成圖。Fig. 22 is a view showing the configuration of a photo-electrical sensor according to another embodiment of the photo-sensing system of the present invention.

第23圖係在使用該光電感測器之光電感測系統之傳送信號的時序圖。Figure 23 is a timing diagram of the transmitted signals of the photo-sensing system using the photo-electrical sensor.

1...控制部1. . . Control department

2...輸出單元2. . . Output unit

3...輸入單元3. . . Input unit

6...母站6. . . Mother station

7...DP信號線7. . . DP signal line

8...DN信號線8. . . DN signal line

11...光電感測器11. . . Photoelectric detector

Claims (12)

一種光電感測器,其特徵為:具有相對向設置之投光部與受光部,以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無;該受光部具有與該投光部之投光時序信號同步地動作的第1受光元件與第2受光元件;該投光部具有:第1投光元件,係配置成投光信號在沒有與該被檢測體交叉的情況下到達該第1受光元件,在與該被檢測體交叉的情況下到達該第2受光元件;及第2投光元件,係配置成投光信號在沒有與該被檢測體交叉的情況下到達該第2受光元件,在與該被檢測體交叉的情況下到達該第1受光元件;將該第1投光元件與該第1受光元件的一對、及該第1投光元件與該第2受光元件的一對設為第1組;將該第2投光元件與該第1受光元件的一對、及該第2投光元件與該第2受光元件的一對設為第2組;在該第1組,比較不會因該被檢測體而衰減之該第1受光元件的受光信號、與會因該被檢測體而衰減之該第2受光元件之受光信號的位準差,以檢測出該被檢測體的有無資訊;而且, 在該第2組,比較會因該被檢測體而衰減之該第1受光元件的受光信號、與不會因該被檢測體而衰減之該第2受光元件之受光信號的位準差,以檢測出該被檢測體的有無資訊;雙重地比對檢測出從該第1組所得之該被檢測體的有無資訊與從該第2組所得之該被檢測體的有無資訊。 An optical sensor having a light projecting portion and a light receiving portion that are disposed opposite to each other, and detecting a space accommodated between the light projecting portion and the light receiving portion by a change in intensity of a light receiving signal of the light receiving portion The presence or absence of the object to be detected; the light receiving unit has a first light receiving element and a second light receiving element that operate in synchronization with a light emission timing signal of the light projecting unit; and the light projecting unit has a first light projecting element configured to be cast The optical signal reaches the first light receiving element without crossing the object, and reaches the second light receiving element when intersecting the object; and the second light projecting element is configured to emit a light signal When the second light-receiving element is not crossed, the second light-receiving element is reached, and when the object is crossed, the first light-receiving element is reached, and the first light-emitting element and the first light-receiving element are And a pair of the first light projecting element and the second light receiving element is a first group; a pair of the second light projecting element and the first light receiving element; and the second light projecting element The pair of the second light receiving elements is set to the second group; in the first group, the comparison is not a light-receiving signal of the first light-receiving element attenuated by the object and a level difference of a light-receiving signal of the second light-receiving element that is attenuated by the object to detect the presence or absence of the object; and, In the second group, the level difference between the light receiving signal of the first light receiving element attenuated by the object and the light receiving signal of the second light receiving element which is not attenuated by the object is compared. The presence or absence of the subject is detected, and the presence or absence of the subject obtained from the first group and the presence or absence of the subject obtained from the second group are detected in a double comparison. 如申請專利範圍第1項之光電感測器,其中在該第1投光元件的投光時序進行在該第1組之該位準差的比較,並在該第2投光元件的投光時序進行在該第2組之該位準差的比較。 The optical inductance detector according to claim 1, wherein the comparison of the level difference in the first group is performed on a light projection timing of the first light projecting element, and the light is projected on the second light projecting element. Timing is performed on the comparison of the bit differences in the second group. 一種光電感測器,其特徵為:具有相對向設置之投光部與受光部,以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無;該投光部具有:第1投光元件,係投射在沒有與該被檢測體交叉的情況下到達該受光部的投光信號;及第2投光元件,投射在與該被檢測體交叉的情況下到達該受光部的投光信號;比較接收來自該第1投光元件之不會因該被檢測體而衰減之投光信號而被產生之分時受光信號、與接收來自該第2投光元件之會因該被檢測體而衰減之投光信號而被產生之另一個分時受光信號的位準差,以檢測出該被檢測體的有無資訊。 An optical sensor having a light projecting portion and a light receiving portion that are disposed opposite to each other, and detecting a space accommodated between the light projecting portion and the light receiving portion by a change in intensity of a light receiving signal of the light receiving portion The presence or absence of the object to be detected; the light projecting unit includes: a first light projecting element that projects a light projecting signal that reaches the light receiving unit when there is no intersection with the object; and a second light projecting element that projects a light-emitting signal that reaches the light-receiving unit when the object is crossed, and a time-division light-receiving signal that is generated by receiving a light-emitting signal that is not attenuated by the object from the first light-emitting element, and The level difference of the other time-division light-receiving signal generated from the second light-emitting element due to the light-emitting signal attenuated by the object is received to detect the presence or absence of the object. 一種光電感測器,其特徵為: 具有相對向設置之投光部與受光部,以受光部之受光信號的強度變化來檢測出被收容於該投光部與該受光部之間的空間之被檢測體的有無;該投光部具有第1投光元件與第2投光元件;該受光部具有:第1受光元件,接收來自該第1投光元件之不會因該被檢測體而衰減的投光信號及來自該第2投光元件之會因該被檢測體而衰減的投光信號;及第2受光元件,接收來自該第2投光元件之不會因該被檢測體而衰減的投光信號及來自該第1投光元件之會因該被檢測體而衰減的投光信號;將該第1投光元件與該第1受光元件的一對、及該第2投光元件與該第1受光元件的一對設為第1組;將該第2投光元件與該第2受光元件的一對、及該第1投光元件與該第2受光元件的一對設為第2組;在該第1組,比較不會因該被檢測體而衰減之該第1受光元件的分時受光信號、與會因該被檢測體而衰減之該第1受光元件之另一個分時受光信號的位準差,以檢測出該被檢測體的有無資訊;而且,在該第2組,比較會因該被檢測體而衰減之該第2受光元件的分時受光信號、與不會因該被檢測體而衰減之該第2受光元件之另一個分時受光信號的位準差,以檢測出該被檢測體的有無資訊;雙重地比對檢測出從該第1組所得之該被檢測體的 有無資訊與從該第2組所得之該被檢測體的有無資訊。 A photoinductor characterized by: a light projecting unit and a light receiving unit that are disposed to face each other, and detect the presence or absence of the object to be detected in the space between the light projecting unit and the light receiving unit by the intensity change of the light receiving signal of the light receiving unit; a first light projecting element and a second light projecting element; the light receiving unit includes: a first light receiving element; and receives a light projecting signal from the first light projecting element that is not attenuated by the object, and the second light emitting signal a light projecting signal that is attenuated by the object to be detected by the light-emitting element; and a second light-receiving element that receives a light-emitting signal from the second light-emitting element that is not attenuated by the object and from the first a light projecting signal that is attenuated by the object to be detected by the light-emitting element; a pair of the first light-emitting element and the first light-receiving element; and a pair of the second light-emitting element and the first light-receiving element a first group; a pair of the second light projecting element and the second light receiving element; and a pair of the first light projecting element and the second light receiving element are referred to as a second group; Comparing the time-division light-receiving signal of the first light-receiving element that is not attenuated by the object to be detected, and the object to be detected Attenuating the level difference of the other time-division light receiving signal of the first light receiving element to detect the presence or absence of the object; and, in the second group, comparing the attenuation of the object by the second group (2) a time-division light receiving signal of the light receiving element and a level difference of another time-division light receiving signal of the second light receiving element that is not attenuated by the object to detect the presence or absence of the object; Aligning the detected object from the first group Information on whether or not there is information on the presence or absence of the subject obtained from the second group. 如申請專利範圍第4項之光電感測器,其中在該第1投光元件及該第2投光元件的分時投光時序進行該位準差的比較。 The optical inductance detector of claim 4, wherein the comparison of the level difference is performed at a time division projection timing of the first light projecting element and the second light projecting element. 如申請專利範圍第1、2、4或5項之光電感測器,其中從在該第1組所得之該被檢測體的有無資訊與在該第2組所得之該被檢測體的有無資訊雙重地比對該被檢測體的有無資訊,而在未檢測出該被檢測體之有無的情況,檢測出該被檢測體的異常狀態及/或感測器故障。 An optical sensor according to claim 1, 2, 4 or 5, wherein the information on the presence or absence of the object obtained in the first group and the presence or absence of the object in the second group are The information on the presence or absence of the object is doubled, and when the presence or absence of the object is not detected, the abnormal state of the object and/or the sensor failure are detected. 一種光電感測器,其多段地構成如申請專利範圍第1、2、4、5或6項之光電感測器,並檢測出複數個該被檢測體,該光電感測器的特徵為:共用該第2組的該第2投光元件及關於其他的被檢測體之該第1組的該第1投光元件,該其他的被檢測體之該第1組的該第1投光元件係與被進行與該第2組有關的檢測之被檢測體相鄰;共用該第2組的該第2受光元件及關於該其他的被檢測體之該第1組的該第1受光元件。 An optical sensor comprises a plurality of optical photodetectors as claimed in claim 1, 2, 4, 5 or 6 and detects a plurality of the detected objects. The photodetector is characterized by: Sharing the second light projecting element of the second group and the first light projecting element of the first group of the other subject, the first light projecting element of the first group of the other subject It is adjacent to the subject to be tested for the second group; the second light receiving element of the second group and the first light receiving element of the first group of the other subject are shared. 一種光電感測器,其多段地構成申請專利範圍第3項之該光電感測器,並檢測出複數個該被檢測體,該光電感測器的特徵為:該第2投光元件係被共用作為關於與投光信號所交叉之被檢測體相鄰之其他的被檢測體之該第1投光元件;該第2受光元件係被共用作為關於該其他的被檢測 體之該第1受光元件。 An optical-inductance detector which comprises the optical-inductance detector of claim 3 in a plurality of stages, and detects a plurality of the objects to be detected. The photo-electrical sensor is characterized in that the second light-emitting element is The first light projecting element that is another object to be detected adjacent to the object to which the light projecting signal intersects is shared; the second light receiving element is shared as the other detected object The first light receiving element of the body. 如申請專利範圍第1、3、4、7或8項之光電感測器,其中將成對之該投光部與該受光部單元化。 An optical-inductance detector according to claim 1, 3, 4, 7 or 8 wherein the pair of light projecting portions and the light receiving portion are unitized. 一種光電感測系統,具備有複數個如申請專利範圍第1至9項中任一項之光電感測器;具備與一連串之該投光部連接的第1管理子站、及與對應於該投光部之一連串之該受光部連接的第2管理子站;該第1管理子站產生該投光時序信號,而該第2管理子站產生與該投光時序信號同步之受光信號的時序信號。 A photo-sensing system comprising: a plurality of optical detectors according to any one of claims 1 to 9; a first management sub-station connected to the series of the light-emitting portions, and corresponding to the a second management substation connected to the light receiving unit by one of the light projecting units; the first management substation generates the light emission timing signal, and the second management substation generates a timing of the light receiving signal synchronized with the light emission timing signal signal. 如申請專利範圍第10項之光電感測系統,其中複數個一連串之該投光部與一連串之該受光部與共同的資料信號線連接,並向上階母站傳達該被檢測體的有無資訊、該被檢測體的異常狀態及/或感測器故障資訊。 The optical-inductance measuring system of claim 10, wherein the plurality of light-emitting portions and the series of the light-receiving portions are connected to a common data signal line, and the information about the presence or absence of the object is communicated to the parent station. Abnormal state of the detected object and/or sensor failure information. 一種光電感測系統,具備有如申請專利範圍第1、2、4或5項之光電感測器;從在該第1組所得之該被檢測體的有無資訊與在該第2組所得之該被檢測體的有無資訊雙重地比對該被檢測體的有無資訊,而在未檢測出該被檢測體之有無的情況,檢測出該被檢測體的異常狀態及/或感測器故障。A photo-sensing system comprising an optical detector as claimed in claim 1, 2, 4 or 5; information on the presence or absence of the object obtained in the first group and the result obtained in the second group The presence or absence of the object is double compared to the presence or absence of the object, and when the presence or absence of the object is not detected, the abnormal state of the object and/or the sensor failure are detected.
TW99107919A 2010-03-18 2010-03-18 Optoelectronic sensor and optoelectronic sensor system TWI400471B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99107919A TWI400471B (en) 2010-03-18 2010-03-18 Optoelectronic sensor and optoelectronic sensor system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99107919A TWI400471B (en) 2010-03-18 2010-03-18 Optoelectronic sensor and optoelectronic sensor system

Publications (2)

Publication Number Publication Date
TW201133022A TW201133022A (en) 2011-10-01
TWI400471B true TWI400471B (en) 2013-07-01

Family

ID=46751030

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99107919A TWI400471B (en) 2010-03-18 2010-03-18 Optoelectronic sensor and optoelectronic sensor system

Country Status (1)

Country Link
TW (1) TWI400471B (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06177737A (en) * 1992-12-03 1994-06-24 Omron Corp Photoelectric switch
JPH08148981A (en) * 1992-08-10 1996-06-07 Takenaka Denshi Kogyo Kk Multi-optical axis photoelectric sensor
JP2001267399A (en) * 2000-03-14 2001-09-28 Canon Inc Method for detecting of substrate and substrate storing equipment
JP2002261153A (en) * 2001-03-06 2002-09-13 Hitachi Kokusai Electric Inc Substrate treating device
JP2004245587A (en) * 2003-02-10 2004-09-02 Itoki Crebio Corp Object detection device and moving shelf apparatus
JP2008058291A (en) * 2006-07-31 2008-03-13 Sunx Ltd Photoelectric sensor
WO2008081550A1 (en) * 2006-12-28 2008-07-10 Anywire Corporation Sensor child station system
JP2009002830A (en) * 2007-06-22 2009-01-08 Hitachi Omron Terminal Solutions Corp Optical sensor having correctable quantity of light emission, sheet identifying apparatus using the same, and correction method for the same

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08148981A (en) * 1992-08-10 1996-06-07 Takenaka Denshi Kogyo Kk Multi-optical axis photoelectric sensor
JPH06177737A (en) * 1992-12-03 1994-06-24 Omron Corp Photoelectric switch
JP2001267399A (en) * 2000-03-14 2001-09-28 Canon Inc Method for detecting of substrate and substrate storing equipment
JP2002261153A (en) * 2001-03-06 2002-09-13 Hitachi Kokusai Electric Inc Substrate treating device
JP2004245587A (en) * 2003-02-10 2004-09-02 Itoki Crebio Corp Object detection device and moving shelf apparatus
JP2008058291A (en) * 2006-07-31 2008-03-13 Sunx Ltd Photoelectric sensor
WO2008081550A1 (en) * 2006-12-28 2008-07-10 Anywire Corporation Sensor child station system
JP2009002830A (en) * 2007-06-22 2009-01-08 Hitachi Omron Terminal Solutions Corp Optical sensor having correctable quantity of light emission, sheet identifying apparatus using the same, and correction method for the same

Also Published As

Publication number Publication date
TW201133022A (en) 2011-10-01

Similar Documents

Publication Publication Date Title
KR101165943B1 (en) Photo electric sensor and photo electric sensor system
CN102736121B (en) Modularity light curtain and the optical unit for light curtain
JP6205756B2 (en) Synchronous measurement system
TWI702574B (en) Sensing system
EP2808706B1 (en) Transceiver element for an optical unit of a photoelectric barrier and photoelectric light curtain
US9201162B2 (en) Optical unit, light curtain and method for allocating an individual address
TWI400471B (en) Optoelectronic sensor and optoelectronic sensor system
CN103226885B (en) Invade detection device, mechanical hand and invade detection method
CN110208560A (en) Test tube detecting device and test tube detection method
US6858832B2 (en) Photoelectric sensor having time changing means
CN101953118B (en) Transmission control system
JP2008116217A (en) Multiple optical axis photoelectric sensor
KR102237695B1 (en) Multi-beam photoelectric sensor
CN109968378A (en) Robot and its distance measuring method, storage device
JP4808291B1 (en) Sensor head structure
KR102152255B1 (en) Method and apparatus for counting pills
CN108871658A (en) Fibre optic compression sensor, fiber-optic pressure sensor system and pressure measurement method
US20060034613A1 (en) System and method of configuring fiber optic communication channels between arrays of emitters and detectors
JP5377802B2 (en) Area sensor system
JP2005071657A (en) Multiple optical-axis photoelectric sensor
CA3162936A1 (en) Device and method for generating test data for testing a distance determination in an optical time-of-flight measurement
KR101167062B1 (en) photoelectricity sensor system
CN103464527A (en) Pipe position detection device and method
JP2018185161A (en) Photoelectric sensor
WO2018142897A1 (en) Photoelectric sensor