JP2008058291A - Photoelectric sensor - Google Patents

Photoelectric sensor Download PDF

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JP2008058291A
JP2008058291A JP2006297130A JP2006297130A JP2008058291A JP 2008058291 A JP2008058291 A JP 2008058291A JP 2006297130 A JP2006297130 A JP 2006297130A JP 2006297130 A JP2006297130 A JP 2006297130A JP 2008058291 A JP2008058291 A JP 2008058291A
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light
light receiving
detection
light projecting
projection
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Koshi Ito
耕嗣 伊藤
Hiroaki Furukawa
裕明 古川
Yoko Higuchi
陽子 樋口
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Panasonic Industrial Devices SUNX Co Ltd
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Sunx Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a photoelectric sensor capable of executing a detection operation and a diagnostic operation for an object at the same time. <P>SOLUTION: An operation switch includes a plurality of sets of light projection elements 11a, 11b and light receiving elements 12a, 12b, and one-portions of projection lights from the respective sets of light projection elements 11a, 11b are photoreceived by the other sets of light receiving elements 12a, 12b by an optical waveguide. A CPU 21 of the operation switch light-projection-drives sequentially the respective sets of light projection elements 11a, 11b, and detects an object to be detected, based on a detection signal X1 output from a detecting comparator 24, in response to light receiving quantities of the light receiving elements 12a, 12b arranged opposedly to the light-projection-driven light projection elements 11a, 11b, in light projection timings in the respective sets. The CPU 21 further judges a failure, based on a determination signal X2 output from a failure determining comparator 25, in response to light receiving quantities of the other sets of light receiving elements 12a, 12b for receiving the one-portions of the projection lights from the respective sets of light-projection-driven light projection elements 11a, 11b, in the light projection timings in the respective sets. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、入光量によって物体を有無を検出する光電センサに関するものである。   The present invention relates to a photoelectric sensor that detects the presence / absence of an object by the amount of incident light.

従来、物体の有無を検出するために、光電センサが用いられている。光電センサは、対向配置される投光素子と受光素子とを備え、受光素子における受光量の変化に応じた信号を出力する。この信号のレベルと判定レベルとを比較することにより、物体の有無を検出することができる。   Conventionally, a photoelectric sensor is used to detect the presence or absence of an object. The photoelectric sensor includes a light projecting element and a light receiving element that are arranged to face each other, and outputs a signal corresponding to a change in the amount of light received by the light receiving element. The presence / absence of an object can be detected by comparing the level of this signal with the determination level.

ところで、投光素子や受光素子が故障したり、投光素子が劣化したりすると、物体の検出に支障をきたす。このため、光電センサには、投光素子に供給する駆動電流を減少させ、感度低下を検出するものがある(例えば、特許文献1参照)。
実開昭57−102875号公報
By the way, if the light projecting element or the light receiving element fails or the light projecting element deteriorates, the detection of the object is hindered. For this reason, some photoelectric sensors detect a decrease in sensitivity by reducing the drive current supplied to the light projecting element (see, for example, Patent Document 1).
Japanese Utility Model Publication No. 57-102875

しかしながら、上記光電センサでは、投光素子に供給する駆動電流を減少させて受光素子に向かって照射する光量を減少させているため、物体の検出動作と感度低下の検出動作とを同時に行うことができない、という問題がある。   However, since the photoelectric sensor reduces the drive current supplied to the light projecting element to reduce the amount of light irradiated toward the light receiving element, the object detection operation and the sensitivity decrease detection operation can be performed simultaneously. There is a problem that it is not possible.

本発明は上記問題点を解決するためになされたものであって、その目的は、物体の検出動作と診断動作とを同時に行うことができる光電センサを提供することにある。   The present invention has been made to solve the above problems, and an object of the present invention is to provide a photoelectric sensor capable of simultaneously performing an object detection operation and a diagnosis operation.

上記目的を達成するため、請求項1に記載の発明は、検出領域へ向けて光を照射する投光手段と、当該投光手段と対となって検出領域からの光を受光する受光手段を複数組備え、前記検出領域の被検出物を検出する光電センサにおいて、各組の前記投光手段からの光の一部をその投光手段と異なる組の受光手段にて前記検出領域を介さずに受光可能とし、各組の投光手段を順番に投光駆動する駆動手段と、各組の投光タイミングにおける、投光駆動される投光手段と対となる受光手段の受光量に基づいて被検出物の検出を行う検出手段と、各組の投光タイミングにおける、投光駆動される投光手段の光の一部が受光可能とされた他の組の受光手段の受光量に基づいて故障判断を行う故障判断手段と、を備えたものである。   In order to achieve the above object, the invention described in claim 1 includes: a light projecting unit that irradiates light toward the detection region; and a light receiving unit that receives light from the detection region in a pair with the light projecting unit. In a photoelectric sensor that includes a plurality of sets and detects an object to be detected in the detection area, a part of the light from the light projecting means of each set is not passed through the detection area by a light receiving means different from the light projecting means. Based on the amount of light received by the light receiving means paired with the light projecting means to be projected and driven at the light projecting timing of each set. Based on the amount of light received by the detecting means for detecting the detected object and the light receiving means of the other set in which a part of the light of the light projecting means driven for light projection can be received at the light projecting timing of each set. Failure determination means for performing failure determination.

この構成によれば、一の組の投光手段及び受光手段にて被検出物の検出動作を行うときに、その組の投光手段からの光の一部を受光可能な受光手段にて故障判別を行うため、通常の検出動作を続けながら、故障判断も行うことができる。   According to this configuration, when the detection object is detected by one set of light projecting means and light receiving means, the light receiving means capable of receiving a part of the light from the light projecting means of the set fails. In order to perform the determination, it is possible to determine the failure while continuing the normal detection operation.

請求項2に記載の発明は、請求項1記載の光電センサにおいて、各組の投光手段及び受光手段は前記検出領域を挟んで対向配置されてなるものである。この構成によれば、投光素子及び受光素子によって検出領域を通過する光軸が形成され、該光軸を被検出物が遮断することにより被検出物が容易に検出される。   According to a second aspect of the present invention, in the photoelectric sensor according to the first aspect, each set of the light projecting means and the light receiving means is arranged to face each other with the detection region interposed therebetween. According to this configuration, the light projecting element and the light receiving element form an optical axis that passes through the detection region, and the detected object is easily detected by blocking the detected object.

請求項3に記載の発明は、請求項2記載の光電センサにおいて、各組毎に前記投光手段と前記受光手段とが互い違いに配置されているものである。この構成によれば、組が異なる投光手段と受光手段とが隣り合って配置されるため、投光手段からの光の一部をモニタ光として受光可能とさせるのが容易である。   According to a third aspect of the present invention, in the photoelectric sensor according to the second aspect, the light projecting means and the light receiving means are alternately arranged for each set. According to this configuration, since the light projecting unit and the light receiving unit in different sets are arranged adjacent to each other, it is easy to receive a part of the light from the light projecting unit as the monitor light.

請求項4に記載の発明は、請求項1〜3のうちの何れか一項に記載の光電センサにおいて、隣り合う組の投光手段と受光手段との間に、該投光手段からの光の一部を該受光手段に導く導光手段を備えたものである。この構成によれば、導光手段によって投光手段からの光の一部が受光される。   According to a fourth aspect of the present invention, in the photoelectric sensor according to any one of the first to third aspects, the light from the light projecting unit is disposed between the adjacent light projecting unit and the light receiving unit. Is provided with light guiding means for guiding a part of the light to the light receiving means. According to this configuration, a part of the light from the light projecting unit is received by the light guide unit.

請求項5に記載の発明は、請求項1〜3のうちの何れか一項に記載の光電センサにおいて、各組の前記投光手段は、他の組の受光手段と前記検出領域を介さずに対向配置され、各組の前記受光手段は、他の組の投光手段と前記検出領域を介さずに対向配置されてなるものである。この構成によれば、各組の投光手段から出射された光が、検出領域内の被検出物によって遮られることなく他の組の受光手段に直接的に入射されるため、検出動作と同時に故障判断が可能となる。   According to a fifth aspect of the present invention, in the photoelectric sensor according to any one of the first to third aspects, each set of the light projecting unit does not pass through the other region of the light receiving unit and the detection region. The light receiving means of each set is arranged to face the other light projecting means without passing through the detection area. According to this configuration, the light emitted from each set of light projecting means is directly incident on another set of light receiving means without being blocked by the detected object in the detection region, so that the detection operation is performed simultaneously. Failure determination is possible.

請求項6に記載の発明は、請求項1〜5のうちの何れか一項に記載の光電センサにおいて、前記受光手段の出力信号レベルと比較判定レベルとを比較し、該比較結果に応じた検出信号を出力する検出用コンパレータと、前記受光手段の出力信号レベルと故障判別レベルとを比較し、該比較結果に応じた判別信号を出力する故障判別用コンパレータと、前記各組の受光手段のそれぞれと前記検出用コンパレータと前記故障判別用コンパレータに接続された開閉手段と、前記各組の受光手段を前記検出用コンパレータに順次接続するとともに、前記検出用コンパレータに接続された受光手段と対向配置された投光手段からの光の一部が受光可能とされた他の組の受光手段を前記故障判別用コンパレータに接続するよう、前記開閉手段を制御する制御手段と、を備えたものである。   According to a sixth aspect of the present invention, in the photoelectric sensor according to any one of the first to fifth aspects, the output signal level of the light receiving means is compared with a comparison determination level, and the comparison result is determined. A comparator for detection that outputs a detection signal, a comparator for failure determination that compares an output signal level of the light receiving means and a failure determination level, and outputs a determination signal according to the comparison result, and each of the sets of light receiving means Opening / closing means connected to each of the detection comparator and the failure determination comparator, and each set of light receiving means are sequentially connected to the detection comparator, and arranged opposite to the light receiving means connected to the detection comparator. The control means for controlling the opening / closing means to connect another set of light receiving means capable of receiving a part of the light from the projected light projecting means to the failure determination comparator. Those having a means.

この構成によれば、各組の受光手段が検出用コンパレータと故障判別用コンパレータに順次接続されるため、各組毎に検出用コンパレータと故障判別用コンパレータを設ける必要がなく、光電センサ全体の規模の拡大を抑えることができる。   According to this configuration, since each set of light receiving means is sequentially connected to the detection comparator and the failure determination comparator, it is not necessary to provide a detection comparator and a failure determination comparator for each set, and the scale of the entire photoelectric sensor Can be suppressed.

以上記述したように、本発明によれば、物体の検出動作と診断動作とを同時に行うことが可能な光電センサを提供することができる。   As described above, according to the present invention, it is possible to provide a photoelectric sensor capable of simultaneously performing an object detection operation and a diagnosis operation.

以下、本発明の光電センサを操作スイッチに具体化した一実施の形態を図1〜図4に従って説明する。
図1に示すように、操作スイッチ1は、加工装置の操作台Sに設けられている。この操作スイッチ1は、作業者によって加工装置の起動及び停止を行わせるべく操作される。
Hereinafter, an embodiment in which the photoelectric sensor of the present invention is embodied as an operation switch will be described with reference to FIGS.
As shown in FIG. 1, the operation switch 1 is provided on the operation table S of the processing apparatus. The operation switch 1 is operated by an operator to start and stop the machining apparatus.

操作スイッチ1は、下側に開口する中空状のケース2を備え、そのケース2の開口は図示しないネジにより構成された板状の基台3によりを閉塞されている。ケース2は、光透過性材料からなり、下側が開口し平面視略正方形の箱状に形成されたベース部4と、該ベース部4から上側に向かって延びる略直方体箱状に形成された凸設部5とを有している。   The operation switch 1 includes a hollow case 2 that opens to the lower side, and the opening of the case 2 is closed by a plate-like base 3 constituted by screws (not shown). The case 2 is made of a light-transmitting material, and has a base portion 4 that is open in the lower side and formed in a substantially square box shape in plan view, and a protrusion that is formed in a substantially rectangular parallelepiped box shape that extends upward from the base portion 4. And a setting part 5.

ベース部4内には、第1の基板6が固定され、凸設部5内には、第1の基板6と直交するように第2の基板7が固定されている。図2に示すように、ケース2内には、複数対(本実施形態では2対)の投光手段としての投光素子11a,11bと受光手段としての受光素子12a,12bが配設されている。対向する2対の投受光素子(第1投光素子11aと第1受光素子12a、第2投光素子11bと第2受光素子12b)は、隣接するとともに、各組毎に投光素子と受光素子とが互い違いに配置されてなる。   A first substrate 6 is fixed in the base portion 4, and a second substrate 7 is fixed in the protruding portion 5 so as to be orthogonal to the first substrate 6. As shown in FIG. 2, a plurality of pairs (two pairs in this embodiment) of light projecting elements 11a and 11b and light receiving elements 12a and 12b as light receiving means are disposed in the case 2. Yes. Two pairs of light projecting / receiving elements facing each other (the first light projecting element 11a and the first light receiving element 12a, the second light projecting element 11b and the second light receiving element 12b) are adjacent to each other, and the light projecting element and the light receiving element for each set. The elements are arranged alternately.

詳述すると、第1の基板6には、第1投光素子11aと第2受光素子12bとが実装され、第2の基板7には、第1受光素子12aと第2投光素子11bとが配置されている。更に、第1の基板6上に搭載された第1投光素子11a及び第2受光素子12bは、ベース部4の辺に沿って配列され、第2の基板7上に搭載された第2投光素子11b及び第1受光素子12aは、凸設部5の上端近傍に配設されている。そして、第1の基板6上に搭載された第1投光素子11aからの投射光は、ベース部4の上面(外側面4a)を透過してケース2の外側に出射され、凸設部5の外側面5aを透過してケース2内部(凸設部5内部)に配設された第1受光素子12aに入射される。また、第2の基板7上に搭載された第2投光素子11bからの出射光は、外側面5aを透過してケース2の外部に出射され、外側面4aを透過してケース2内部(ベース部4内部)に配設された第2受光素子12bに入射される。   More specifically, the first light emitting element 11a and the second light receiving element 12b are mounted on the first substrate 6, and the first light receiving element 12a and the second light projecting element 11b are mounted on the second substrate 7. Is arranged. Further, the first light projecting element 11 a and the second light receiving element 12 b mounted on the first substrate 6 are arranged along the side of the base portion 4, and the second light projecting element mounted on the second substrate 7. The optical element 11 b and the first light receiving element 12 a are disposed in the vicinity of the upper end of the protruding portion 5. And the projection light from the 1st light projection element 11a mounted on the 1st board | substrate 6 permeate | transmits the upper surface (outer surface 4a) of the base part 4, and is radiate | emitted on the outer side of the case 2, and the convex part 5 Is incident on the first light receiving element 12a disposed inside the case 2 (inside the projecting portion 5). Further, the light emitted from the second light projecting element 11b mounted on the second substrate 7 is transmitted through the outer surface 5a to be emitted to the outside of the case 2, and is transmitted through the outer surface 4a to pass through the inside of the case 2 ( The light is incident on the second light receiving element 12b disposed in the base portion 4).

そして、図1に示すように、ベース部4と凸設部5は、それぞれの外側面4a、外側面5aとが略直角をなす、更に詳しくは直角以上の角度をなすように形成されている。そして、両外側面4a,5a間に形成される空間に対向する投光素子11a,11bと受光素子12a,12bとの間の光軸L1,L2が形成される。詳しくは、第1の基板6上の投光素子11aからの投射光が第2の基板7上の受光素子12aに受光される第1の光軸L1が形成される。同様に、第2の基板7上の投光素子11bからの投射光が第1の基板6上の受光素子12bに受光される第2の光軸L2が形成される。   As shown in FIG. 1, the base portion 4 and the projecting portion 5 are formed such that the outer surface 4a and the outer surface 5a form a substantially right angle, more specifically, an angle equal to or greater than a right angle. . Then, optical axes L1 and L2 are formed between the light projecting elements 11a and 11b and the light receiving elements 12a and 12b facing the space formed between the outer side surfaces 4a and 5a. Specifically, a first optical axis L1 is formed in which the projection light from the light projecting element 11a on the first substrate 6 is received by the light receiving element 12a on the second substrate 7. Similarly, a second optical axis L2 is formed in which the projection light from the light projecting element 11b on the second substrate 7 is received by the light receiving element 12b on the first substrate 6.

そして、作業者が手で凸設部5を掴むと、指が両外側面4a,5a間に形成される空間に入り、第1の光軸L1と第2の光軸L2の少なくとも何れか一方を遮る。すると、投光素子11a,11bからの投射光が対向する受光素子12a,12bに受光されなくなるため、該受光素子12a,12bの出力信号に基づいて、物体(この場合では作業者の指)を非接触にて検出することができる。   When the operator grips the convex portion 5 with his / her hand, the finger enters the space formed between the outer side surfaces 4a and 5a, and at least one of the first optical axis L1 and the second optical axis L2 Block. Then, since the projection light from the light projecting elements 11a and 11b is not received by the opposing light receiving elements 12a and 12b, the object (in this case, the operator's finger) is moved based on the output signals of the light receiving elements 12a and 12b. It can be detected without contact.

更に、両外側面4a,5aは、直角以上の角度をなすように形成されているため、太い指や手袋をはめた状態であっても空間に入りやすく、第1及び第2の光軸L1,L2の少なくとも一方が遮られるため、確実に作業者の手を検出することができる。   Furthermore, since the outer side surfaces 4a and 5a are formed so as to form an angle equal to or greater than a right angle, the outer side surfaces 4a and 5a can easily enter the space even when wearing thick fingers or gloves, and the first and second optical axes L1. , L2 is blocked, so that the operator's hand can be detected reliably.

第1の基板6上には、第1投光素子11aと第2受光素子12bとの間に、該投光素子11aからの投射光の一部を受光素子12bに導く導光手段としての光導波路13aが配設されている。同様に、第2の基板7上には、第2投光素子11bと第1受光素子12aとの間に、該投光素子11bからの投射光の一部を受光素子12aに導く導光手段としての光導波路13bが配設されている。   On the first substrate 6, between the first light projecting element 11a and the second light receiving element 12b, light as a light guide means for guiding a part of the projection light from the light projecting element 11a to the light receiving element 12b. A waveguide 13a is provided. Similarly, on the second substrate 7, between the second light projecting element 11b and the first light receiving element 12a, light guiding means for guiding a part of the projection light from the light projecting element 11b to the light receiving element 12a. An optical waveguide 13b is provided.

従って、第1の基板6に搭載された第1投光素子11aからの投射光は、物体(本実施形態では手)を検出する検出領域A1を介して第2の基板7に搭載された第1受光素子12aに受光され、上記検出領域A1を介さずに第1の基板6に搭載された第2受光素子12bに受光される。同様に、第2の基板7に搭載された第2投光素子11bからの投射光は、検出領域A1を介して第1の基板6に搭載された第2受光素子12bに受光され、検出領域A1を介さずに第2の基板7に搭載された第1受光素子12aに受光される。つまり、第1投光素子11aと第2受光素子12bとの間に光軸L12が形成され、第2投光素子11bと第1受光素子12aとの間に光軸L21が形成される。尚、図1,2には、検出領域A1を概略的に示す。   Therefore, the projection light from the first light projecting element 11a mounted on the first substrate 6 is the first light mounted on the second substrate 7 via the detection region A1 for detecting an object (a hand in the present embodiment). The light is received by the first light receiving element 12a and is received by the second light receiving element 12b mounted on the first substrate 6 without passing through the detection region A1. Similarly, the projection light from the second light projecting element 11b mounted on the second substrate 7 is received by the second light receiving element 12b mounted on the first substrate 6 via the detection area A1, and is detected in the detection area. The light is received by the first light receiving element 12a mounted on the second substrate 7 without passing through A1. That is, the optical axis L12 is formed between the first light projecting element 11a and the second light receiving element 12b, and the optical axis L21 is formed between the second light projecting element 11b and the first light receiving element 12a. 1 and 2 schematically show the detection region A1.

次に、操作スイッチ1の電気的構成を説明する。
図3に示すように、操作スイッチ1は、CPU21、第1及び第2投光回路22a,22b、第1及び第2受光回路23a,23b、検出用コンパレータ24、故障判別用コンパレータ25、開閉手段としての第1〜第4スイッチSW1〜SW4、第1及び第2投光素子11a,11b、第1及び第2受光素子12a,12bを備えている。これらを接続した回路は、第1の基板6と第2の基板7に搭載された図示しない電子部品を接続することにより構成されている。
Next, the electrical configuration of the operation switch 1 will be described.
As shown in FIG. 3, the operation switch 1 includes a CPU 21, first and second light projecting circuits 22a and 22b, first and second light receiving circuits 23a and 23b, a detection comparator 24, a failure determination comparator 25, and an opening / closing means. 1 to 4 switches SW1 to SW4, first and second light projecting elements 11a and 11b, and first and second light receiving elements 12a and 12b. The circuit to which these are connected is configured by connecting electronic components (not shown) mounted on the first substrate 6 and the second substrate 7.

駆動手段、検出手段、故障判断手段、制御手段としてのCPU21には、投光手段としての第1及び第2投光回路22a,22bが接続されている。CPU21は、第1及び第2投光回路22a,22bに第1及び第2投光信号P1,P2を交互に出力する。第1及び第2投光回路22a,22bには第1及び第2投光素子11a,11bがそれぞれ接続されている。第1及び第2投光回路22a,22bは、第1及び第2投光信号P1,P2に応答して第1及び第2投光素子11a,11bを駆動する。従って、第1及び第2投光素子11a,11bは交互に点灯する。   First and second light projecting circuits 22a and 22b serving as light projecting means are connected to the CPU 21 serving as the drive means, the detecting means, the failure judging means, and the control means. The CPU 21 alternately outputs the first and second light projection signals P1 and P2 to the first and second light projection circuits 22a and 22b. First and second light projecting elements 11a and 11b are connected to the first and second light projecting circuits 22a and 22b, respectively. The first and second light projecting circuits 22a and 22b drive the first and second light projecting elements 11a and 11b in response to the first and second light projecting signals P1 and P2. Accordingly, the first and second light projecting elements 11a and 11b are alternately lit.

上記したように、第1投光素子11aからの投射光は第1及び第2受光素子12a,12bに受光され、第2投光素子11bからの投射光は第1及び第2受光素子12a,12bに受光される。第1及び第2受光素子12a,12bは受光手段としての第1及び第2受光回路23a,23bにそれぞれ接続されている。第1及び第2受光回路23a,23bは、第1及び第2受光素子12a,12bに流れる電流に応じた信号K1,K2を出力する。   As described above, the projection light from the first light projecting element 11a is received by the first and second light receiving elements 12a and 12b, and the projection light from the second light projecting element 11b is received by the first and second light receiving elements 12a, 12a. The light is received by 12b. The first and second light receiving elements 12a and 12b are respectively connected to first and second light receiving circuits 23a and 23b as light receiving means. The first and second light receiving circuits 23a and 23b output signals K1 and K2 corresponding to the currents flowing through the first and second light receiving elements 12a and 12b.

第1受光回路23aは、第1スイッチSW1を介して検出用コンパレータ24に接続されるとともに、第3スイッチSW3を介して故障判別用コンパレータ25に接続されている。第2受光回路23bは、第2スイッチSW2を介して検出用コンパレータ24に接続されるとともに、第4スイッチSW4を介して故障判別用コンパレータ25に接続されている。   The first light receiving circuit 23a is connected to the detection comparator 24 via the first switch SW1, and is connected to the failure determination comparator 25 via the third switch SW3. The second light receiving circuit 23b is connected to the detection comparator 24 through the second switch SW2, and is connected to the failure determination comparator 25 through the fourth switch SW4.

第1〜第4スイッチSW1〜SW4はCPU21に接続され、該CPU21から出力される制御信号S1〜S4に応答してオンオフする。CPU21は、第1及び第2受光回路23a,23bの出力信号K1,K2が、検出用コンパレータ24と故障判別用コンパレータ25とに相補的に入力されるよう、第1〜第4スイッチSW1〜SW4を制御する。詳述すると、CPU21は、第1スイッチSW1をオンして第1受光回路23aの出力信号K1を検出用コンパレータ24に入力させるとともに、第4スイッチSW4をオンして第2受光回路23bの出力信号K2を故障判別用コンパレータ25に入力させる。また、CPU21は、第2スイッチSW2をオンして第2受光回路23bの出力信号K2を検出用コンパレータ24に入力させるとともに、第3スイッチSW3をオンして第1受光回路23aの出力信号K1を故障判別用コンパレータ25に入力させる。   The first to fourth switches SW1 to SW4 are connected to the CPU 21 and are turned on / off in response to control signals S1 to S4 output from the CPU 21. The CPU 21 uses the first to fourth switches SW1 to SW4 so that the output signals K1 and K2 of the first and second light receiving circuits 23a and 23b are complementarily input to the detection comparator 24 and the failure determination comparator 25. To control. More specifically, the CPU 21 turns on the first switch SW1 to input the output signal K1 of the first light receiving circuit 23a to the detection comparator 24, and turns on the fourth switch SW4 to output the signal from the second light receiving circuit 23b. K2 is input to the failure determination comparator 25. Further, the CPU 21 turns on the second switch SW2 to input the output signal K2 of the second light receiving circuit 23b to the detection comparator 24, and turns on the third switch SW3 to give the output signal K1 of the first light receiving circuit 23a. Input to the failure determination comparator 25.

検出用コンパレータ24は、第1又は第2受光回路23a,23bの出力信号K1,K2のレベルと検出判定レベルとを比較し、該比較結果に応じた検出信号X1を出力する。例えば、検出用コンパレータ24は、出力信号K1,K2のレベルが検出判定レベル以上、即ち第1又は第2受光素子12a,12bに入射される光量が所定レベル以上の場合にHレベルの検出信号X1を出力し、出力信号K1,K2のレベルが検出判定レベルより小さい、即ち入射光量が所定レベルより少ない場合にLレベルの検出信号X1を出力する。   The detection comparator 24 compares the levels of the output signals K1 and K2 of the first or second light receiving circuits 23a and 23b with the detection determination level, and outputs a detection signal X1 corresponding to the comparison result. For example, the detection comparator 24 detects the H level detection signal X1 when the levels of the output signals K1 and K2 are equal to or higher than the detection determination level, that is, when the amount of light incident on the first or second light receiving element 12a or 12b is equal to or higher than a predetermined level. When the level of the output signals K1 and K2 is smaller than the detection determination level, that is, the incident light quantity is less than the predetermined level, the L level detection signal X1 is output.

CPU21は、第1又は第2投光信号P1,P2に対応するタイミング(判定期間)において、その検出信号X1に基づいて、物体の有無を判定する。上記の例では、CPU21は、Hレベルの検出信号X1により光軸L1,L2上に物体が存在しないと判定し、Lレベルの検出信号X1により光軸L1,L2上に物体が存在すると判定する。   The CPU 21 determines the presence or absence of an object based on the detection signal X1 at the timing (determination period) corresponding to the first or second light projection signals P1 and P2. In the above example, the CPU 21 determines that no object exists on the optical axes L1 and L2 based on the detection signal X1 at the H level, and determines that an object exists on the optical axes L1 and L2 based on the detection signal X1 at the L level. .

故障判別用コンパレータ25は、第1又は第2受光回路23a,23bの出力信号K1,K2のレベルと故障判別レベルとを比較し、該比較結果に応じた判別信号X2を出力する。例えば、検出用コンパレータ24は、出力信号K1,K2のレベルが故障判別レベル以上、即ち第1又は第2受光素子12a,12bに入射される光量が所定レベル以上の場合にHレベルの判別信号X2を出力し、出力信号K1,K2のレベルが故障判別レベルより小さい、即ち入射光量が所定レベルより少ない場合にLレベルの判別信号X2を出力する。   The failure determination comparator 25 compares the levels of the output signals K1 and K2 of the first or second light receiving circuits 23a and 23b with the failure determination level, and outputs a determination signal X2 corresponding to the comparison result. For example, the detection comparator 24 determines the H level determination signal X2 when the levels of the output signals K1 and K2 are equal to or higher than the failure determination level, that is, when the amount of light incident on the first or second light receiving element 12a, 12b is equal to or higher than a predetermined level. When the level of the output signals K1 and K2 is lower than the failure determination level, that is, the incident light quantity is lower than the predetermined level, the L level determination signal X2 is output.

CPU21は、その判別信号X2に基づいて、故障の有無を判別する。上記の例では、CPU21は、Hレベルの判別信号X2によりその時の受光素子に入射光がある、即ち、その時の投光素子と、故障判別用コンパレータ25に接続される受光回路及び受光素子が故障していないと判別する。一方、CPU21は、Lレベルの判別信号X2によりその時の受光素子に入射光がない、又は受光回路又は故障判別用コンパレータ25に信号が入力されない、即ち、故障が発生していると判別する。   The CPU 21 determines whether or not there is a failure based on the determination signal X2. In the above example, the CPU 21 has incident light on the light receiving element at that time based on the H level determination signal X2, that is, the light emitting element at that time and the light receiving circuit and the light receiving element connected to the failure determination comparator 25 have failed. It is determined that it is not. On the other hand, the CPU 21 determines based on the L level determination signal X2 that there is no incident light in the light receiving element at that time, or that no signal is input to the light receiving circuit or the failure determination comparator 25, that is, a failure has occurred.

上記のように構成された操作スイッチ1の動作を図4のタイミングチャートに従って説明する。
所定のタイミングにおいて、CPU21は、第1投光信号P1を出力し、第1投光回路22aは第1投光素子11aを駆動する。更に、CPU21は、第1及び第4制御信号S1,S4を出力し、第1受光回路23aを検出用コンパレータ24に接続し、第2受光回路23bを故障判別用コンパレータ25に接続する。
The operation of the operation switch 1 configured as described above will be described with reference to the timing chart of FIG.
At a predetermined timing, the CPU 21 outputs the first light projecting signal P1, and the first light projecting circuit 22a drives the first light projecting element 11a. Further, the CPU 21 outputs first and fourth control signals S1 and S4, connects the first light receiving circuit 23a to the detection comparator 24, and connects the second light receiving circuit 23b to the failure determination comparator 25.

第1投光素子11aからの投射光は、物体が光軸L1上に存在しない場合に第1受光素子12aに入射され、物体が光軸L1上に存在する場合に第1受光素子12aに入射されない。また、第1投光素子11aからの投射光は、光導波路13aを介して第2受光素子12bに入射される。   The projection light from the first light projecting element 11a enters the first light receiving element 12a when the object does not exist on the optical axis L1, and enters the first light receiving element 12a when the object exists on the optical axis L1. Not. Further, the projection light from the first light projecting element 11a is incident on the second light receiving element 12b via the optical waveguide 13a.

物体が光軸L1上に存在しない場合、検出用コンパレータ24からHレベルの検出信号X1が出力される。また、故障判別用コンパレータ25からHレベルの判別信号X2が出力される。従って、CPU21は、Hレベルの検出信号X1に基づいて、物体が存在しないと判断する。また、CPU21は、Hレベルの判別信号X2に基づいて、故障していないと判別する。   When no object is present on the optical axis L1, the detection comparator 24 outputs an H level detection signal X1. Further, the failure determination comparator 25 outputs an H level determination signal X2. Therefore, the CPU 21 determines that no object exists based on the detection signal X1 at the H level. The CPU 21 determines that there is no failure based on the determination signal X2 at the H level.

次に、CPU21は、同様に、第2投光信号P2を出力し、第2投光回路22bは第2投光素子11bを駆動する。更に、CPU21は、第2及び第3制御信号S2,S3を出力し、第2受光回路23bを検出用コンパレータ24に接続し、第1受光回路23aを故障判別用コンパレータ25に接続する。   Next, the CPU 21 similarly outputs the second light projection signal P2, and the second light projection circuit 22b drives the second light projection element 11b. Further, the CPU 21 outputs the second and third control signals S2 and S3, connects the second light receiving circuit 23b to the detection comparator 24, and connects the first light receiving circuit 23a to the failure determination comparator 25.

第2投光素子11bからの投射光は、物体が光軸L2上に存在しない場合に第2受光素子12bに入射され、物体が光軸L2上に存在する場合に第2受光素子12bに入射されない。また、第2投光素子11bからの投射光は、光導波路13bを介して第1受光素子12aに入射される。   The projection light from the second light projecting element 11b enters the second light receiving element 12b when the object does not exist on the optical axis L2, and enters the second light receiving element 12b when the object exists on the optical axis L2. Not. Further, the projection light from the second light projecting element 11b is incident on the first light receiving element 12a through the optical waveguide 13b.

物体が光軸L2上に存在しない場合、検出用コンパレータ24からHレベルの検出信号X1が出力される。また、故障判別用コンパレータ25からHレベルの判別信号X2が出力される。従って、CPU21は、Hレベルの検出信号X1に基づいて、物体が存在しないと判断する。また、CPU21は、Hレベルの判別信号X2に基づいて、故障していないと判別する。   When the object does not exist on the optical axis L2, the detection comparator 24 outputs an H level detection signal X1. Further, the failure determination comparator 25 outputs an H level determination signal X2. Therefore, the CPU 21 determines that no object exists based on the detection signal X1 at the H level. The CPU 21 determines that there is no failure based on the determination signal X2 at the H level.

上記に対して、Lレベルの検出信号X1とHレベルの判別信号X2が入力された場合、CPU21は、判別信号X2に基づいて故障していないと判別し、Lレベルの検出信号X1に基づいて光軸L1(L2)上に物体が存在していると判断する。   On the other hand, when the L level detection signal X1 and the H level determination signal X2 are input, the CPU 21 determines that there is no failure based on the determination signal X2, and based on the L level detection signal X1. It is determined that an object exists on the optical axis L1 (L2).

第1投光信号P1と第2投光信号P2との少なくとも一方の信号を出力した場合に、Lレベルの判別信号X2が入力された場合、CPU21は、故障が発生していると判断する。例えば、第1投光信号P1を出力した時にLレベルの判別信号X2が入力された場合、CPU21から第1投光素子11a、第2受光素子12bを介して判別信号X2が入力される経路上において、故障又は断線していると判別することができる。   When at least one of the first light projection signal P1 and the second light projection signal P2 is output and the L level determination signal X2 is input, the CPU 21 determines that a failure has occurred. For example, when an L-level discrimination signal X2 is input when the first light projection signal P1 is output, on the path through which the discrimination signal X2 is input from the CPU 21 via the first light projecting element 11a and the second light receiving element 12b. It can be determined that a failure or disconnection has occurred.

更に、検出信号X1を利用することにより、故障箇所を判別することが可能である。例えば、第1投光信号P1を出力したときに、Hレベルの検出信号X1とLレベルの判別信号X2が入力された場合、第1投光素子11aからの投射光が第1受光素子12aに入射されている。従って、第2受光素子12bからCPU21までの間において故障又は断線していると判断することができる。   Further, the failure location can be determined by using the detection signal X1. For example, when the first light projecting signal P1 is output and the H level detection signal X1 and the L level discrimination signal X2 are input, the projection light from the first light projecting element 11a is applied to the first light receiving element 12a. Incident. Therefore, it can be determined that a failure or disconnection occurs between the second light receiving element 12b and the CPU 21.

以上記述したように、本実施の形態によれば、以下の効果を奏する。
(1)操作スイッチ1は複数組の投光素子11a,11b及び受光素子12a,12bを備え、各組の投光素子11a,11bからの投射光の一部を光導波路13a,13bにより他の組の受光素子12b,12aに受光可能とした。そして、操作スイッチ1のCPU21は、各組の投光素子11a,11bを順次投光駆動し、各組の投光タイミングにおける、投光駆動する投光素子11a,11bと対向配置された受光素子12a,12bの受光量に応じて検出用コンパレータ24から出力される検出信号X1に基づいて被検出物の検出を行う。更に、CPU21は、各組の投光タイミングにおける、投光駆動する投光素子11a,11bからの投射光の一部を受光する他の組の受光素子12b,12aの受光量に応じて故障判別用コンパレータ25から出力される判別信号X2に基づいて故障判断を行うようにした。
As described above, according to the present embodiment, the following effects can be obtained.
(1) The operation switch 1 includes a plurality of sets of light projecting elements 11a and 11b and light receiving elements 12a and 12b. The pair of light receiving elements 12b and 12a can receive light. Then, the CPU 21 of the operation switch 1 sequentially projects the light projecting elements 11a and 11b of each group, and receives the light projecting elements 11a and 11b that are driven to project at the light projecting timing of each group. The detection object is detected based on the detection signal X1 output from the detection comparator 24 in accordance with the amount of received light 12a and 12b. Further, the CPU 21 determines a failure according to the amount of light received by the other light receiving elements 12b and 12a that receive a part of the projection light from the light projecting elements 11a and 11b that perform light emission driving at the light projection timing of each group. The failure is determined on the basis of the determination signal X2 output from the comparator 25.

従って、一の組の投光素子及び受光素子(例えば投光素子11aと受光素子12a)にて被検出物の検出動作を行うときに、その組の投光素子11aからの投射光の一部を光導波路13aにて受光素子12b受光させてその受光素子12bの受光量に基づいて故障判別を行うため、通常の検出動作を続けながら、故障判断も行うことができる。   Therefore, when a detection object is detected by one set of light projecting element and light receiving element (for example, the light projecting element 11a and the light receiving element 12a), a part of the projection light from the light projecting element 11a. Is received by the light receiving element 12b by the optical waveguide 13a, and the failure is determined based on the amount of light received by the light receiving element 12b. Therefore, the failure can be determined while continuing the normal detection operation.

(2)各組毎に投光素子11a,11bと受光素子12a,12bとが互い違いに配置されてなり、隣り合う組の投光素子11aと受光素子12b、投光素子11bと受光素子12aとの間に、該投光素子11a,11bからの投射光の一部を該受光素子12b,12aに導く光導波路13a,13bを備えた。従って、投光素子11a,11bからの投射光を隣の組の受光素子12b,12aにて直接的に受光可能であるため、外乱光等の影響が少なく、故障判別を行うことができる。   (2) The light projecting elements 11a and 11b and the light receiving elements 12a and 12b are alternately arranged for each group, and the light projecting element 11a and the light receiving element 12b, the light projecting element 11b and the light receiving element 12a, which are adjacent to each other. Are provided with optical waveguides 13a and 13b for guiding a part of the projection light from the light projecting elements 11a and 11b to the light receiving elements 12b and 12a. Accordingly, since the projection light from the light projecting elements 11a and 11b can be directly received by the adjacent light receiving elements 12b and 12a, it is possible to determine a failure with little influence of disturbance light or the like.

(3)各組の受光素子12a,12bに接続された受光回路23a,23bと検出用コンパレータ24及び故障判別用コンパレータ25との間にスイッチSW1〜SW4を設け、各スイッチSW1〜SW4を制御して受光回路23a,23bを検出用コンパレータ24と故障判別用コンパレータ25とに順次切り替え接続するようにした。従って、受光回路23a,23bのそれぞれに対して検出用コンパレータと故障判別用コンパレータとを設ける必要がなく、操作スイッチ1全体の規模の拡大を抑えることができる。   (3) Switches SW1 to SW4 are provided between the light receiving circuits 23a and 23b connected to the light receiving elements 12a and 12b and the detection comparator 24 and the failure determination comparator 25 to control the switches SW1 to SW4. Thus, the light receiving circuits 23a and 23b are sequentially switched and connected to the detection comparator 24 and the failure determination comparator 25. Therefore, it is not necessary to provide a detection comparator and a failure determination comparator for each of the light receiving circuits 23a and 23b, and an increase in the scale of the entire operation switch 1 can be suppressed.

尚、上記各実施の形態は、以下の態様で実施してもよい。
・上記実施形態では、光電センサを2組の投光素子11a,11b及び受光素子12a,12bを備えた操作スイッチに具体化したが、3組以上の投光素子及び受光素子を備えた多光軸光電センサに具体化してもよい。3組以上の投光素子及び受光素子を備えた光電センサの場合、上記実施形態と同様に、投光素子からの投射光の一部を隣接する他の組の受光素子に受光可能とするようにしてもよい。また、2組毎に互いの投光素子からの投射光を受光可能とする、即ち、図2に示す構成を複数備えるようにしてもよい。
In addition, you may implement each said embodiment in the following aspects.
In the above embodiment, the photoelectric sensor is embodied as an operation switch including two sets of light projecting elements 11a and 11b and light receiving elements 12a and 12b. However, the multi-light including three or more sets of light projecting elements and light receiving elements is provided. It may be embodied in an axial photoelectric sensor. In the case of a photoelectric sensor including three or more sets of light projecting elements and light receiving elements, a part of the projection light from the light projecting elements can be received by another adjacent light receiving element as in the above embodiment. It may be. Further, it is possible to receive the projection light from each light projecting element every two sets, that is, a plurality of configurations shown in FIG. 2 may be provided.

・上記実施形態では、光導波路13a,13bにより、検出動作のための投光素子11a,11bからの投射光を、検出動作を行わない受光素子12b,12aに検出領域A1を介さずに導くようにしたが、光ファイバ等の他の導光手段を用いてもよい。   In the above embodiment, the optical waveguides 13a and 13b guide the projection light from the light projecting elements 11a and 11b for the detection operation to the light receiving elements 12b and 12a that do not perform the detection operation without passing through the detection region A1. However, other light guiding means such as an optical fiber may be used.

・上記実施形態では、第1の基板6に投光素子11aと受光素子12bと光導波路13aとを備え、第2の基板7に投光素子11bと受光素子12aと光導波路13bとを備えたが、図5に示すように、第1の基板6に投光素子11a,11bを備え、第2の基板7に受光素子12a,12bを備える構成としてもよい。そして、導光手段としての図示しない光ファイバ等により、第1投光素子11aからの投射光の一部を第2受光素子12bに受光させ、第2投光素子11bからの投射光の一部を第1受光素子12aに受光させるようにしてもよい。   In the above embodiment, the first substrate 6 includes the light projecting element 11a, the light receiving element 12b, and the optical waveguide 13a, and the second substrate 7 includes the light projecting element 11b, the light receiving element 12a, and the optical waveguide 13b. However, as shown in FIG. 5, it is good also as a structure which equips the 1st board | substrate 6 with light projection element 11a, 11b, and equips the 2nd board | substrate 7 with light receiving element 12a, 12b. Then, a part of the projection light from the first light projecting element 11a is received by the second light receiving element 12b by an optical fiber (not shown) as a light guide means, and a part of the projection light from the second light projecting element 11b. May be received by the first light receiving element 12a.

・上記実施形態では、被検出物による光の遮断の有無により当該被検出物の有無を検出するように投光素子11a,11b及び受光素子12a,12bを配置した、所謂透過型の光センサを用いた操作スイッチ1に具体化した。つまり、複数対の投光素子及び受光素子を用いて被検出物を検出するとともに故障検出が可能な操作スイッチであって被検出物の有無によって受光素子の入射光量が変化すればよく、例えば、被検出物による光の反射の有無により当該被検出物の有無を検出する、所謂反射型の光センサを用いた操作スイッチに具体化してもよい。また、投光素子及び受光素子からの距離が所定の範囲内における被検出物の有無を検出する、所謂限定反射型の光センサを用いた操作スイッチに具体化してもよい。尚、故障検出のための構成及び動作は、上記実施形態と同じであればよい。   In the above-described embodiment, a so-called transmission type optical sensor in which the light projecting elements 11a and 11b and the light receiving elements 12a and 12b are arranged so as to detect the presence / absence of the detected object by the presence / absence of light blocking by the detected object The operation switch 1 used is embodied. In other words, it is an operation switch that can detect a detected object and detect a failure using a plurality of pairs of light projecting elements and light receiving elements, and the incident light amount of the light receiving element may be changed depending on the presence or absence of the detected object. An operation switch using a so-called reflection-type optical sensor that detects the presence or absence of the detection object based on the presence or absence of reflection of light by the detection object may be embodied. Further, the present invention may be embodied in an operation switch using a so-called limited reflection type optical sensor that detects the presence or absence of an object to be detected within a predetermined range from the light projecting element and the light receiving element. The configuration and operation for detecting a failure may be the same as those in the above embodiment.

図6に示すように、投光素子11a及び受光素子12aを、その投光素子11aから検出領域A2内に光が出射され、検出領域A2内の被検出物による反射光が受光素子12aに入射されるように配置する。同様に、投光素子11b及び受光素子12bを、その投光素子11bから検出領域A2内に光が出射され、検出領域A2内の被検出物による反射光が受光素子12bに入射されるように配置する。更に、投光素子11aと受光素子12bとを検出領域A2を介さずに対向配置し、投光素子11bと受光素子12aとを検出領域A2を介さずに対向配置する。この構成によれば、上記実施形態と同様に、故障判断のための光が検出領域A2を介さずに受光素子12a,12bに入射されるため、被検出物が検出領域A2内に存在しているときにもその被検出物にて遮られることなく故障判断の光を受光する、つまり通常の検出動作を続けながら故障判断も行うことができる。更に、上記実施形態における光導波路13a,13bを必要としないため、部品点数が少なく、製造が容易で、コストダウンを図ることができる。   As shown in FIG. 6, light is emitted from the light projecting element 11a and the light receiving element 12a into the detection area A2, and the reflected light from the object to be detected in the detection area A2 enters the light receiving element 12a. To be arranged. Similarly, light is emitted from the light projecting element 11b and the light receiving element 12b to the detection area A2 from the light projecting element 11b, and the reflected light from the object to be detected in the detection area A2 is incident on the light receiving element 12b. Deploy. Further, the light projecting element 11a and the light receiving element 12b are arranged to face each other without using the detection area A2, and the light projecting element 11b and the light receiving element 12a are arranged to face each other without using the detection area A2. According to this configuration, as in the above-described embodiment, the light for failure determination is incident on the light receiving elements 12a and 12b without passing through the detection area A2, so that the detected object exists in the detection area A2. It is possible to receive failure determination light without being obstructed by the detected object even when the vehicle is being detected, that is, to perform failure determination while continuing normal detection operation. Furthermore, since the optical waveguides 13a and 13b in the above embodiment are not required, the number of parts is small, the manufacturing is easy, and the cost can be reduced.

尚、図6は、検出領域A2に対する投光素子11a,11b及び受光素子12a,12bの配置、被検出物を検出するための光軸L1,L2、及び故障判定のための光軸L12,L21を概略的に示すものである。この検出領域、投光素子11a,11b、及び受光素子12a,12bの配置関係を例えば図1,2に示す形状の光電スイッチに適用した場合、例えば、第1の基板6に投光素子11aと受光素子12bとを備え、第2の基板7に投光素子11bと受光素子12aとを備えるようにする。尚、図1,2に示す光電スイッチは一例にすぎず、光電スイッチの外形形状を適宜変更してもよいことは言うまでもない。   6 shows the arrangement of the light projecting elements 11a and 11b and the light receiving elements 12a and 12b with respect to the detection area A2, the optical axes L1 and L2 for detecting the detected object, and the optical axes L12 and L21 for determining the failure. Is schematically shown. When the arrangement relationship of the detection area, the light projecting elements 11a and 11b, and the light receiving elements 12a and 12b is applied to, for example, the photoelectric switch having the shape shown in FIGS. The light receiving element 12b is provided, and the light projecting element 11b and the light receiving element 12a are provided on the second substrate 7. The photoelectric switch shown in FIGS. 1 and 2 is merely an example, and it goes without saying that the outer shape of the photoelectric switch may be changed as appropriate.

・上記実施形態は、投光素子及び受光素子を複数組備え、各組の投光素子及び受光素子にて検出領域内の被検出物を検出し、互いに異なる組の投光素子及び受光素子による故障判断のための光軸が検出領域を介さずに形成されればよく、投光素子及び受光素子の配置については限定されない。例えば、透過型の光センサを構成する複数組の投光素子11a,11b及び受光素子12a,12bを、図7に示すように、互いに異なる組の投光素子11aと受光素子12b、投光素子11bと受光素子12aとを検出領域A2を介さずに対向配置する。図7において、被検出物を検出するために形成される光軸L1,L2は、検出領域A2内で交差するが、2つの投光素子11a,11bは交互に投光制御されるため、光が干渉することはない。この構成によれば、上記実施形態と同様に、故障判断のための光が検出領域A2を介さずに受光素子12a,12bに入射されるため、被検出物が検出領域A2内に存在しているときにもの被検出物にて遮られることなく故障判断の光を受光する、つまり通常の検出動作を続けながら故障判断も行うことができる。更に、上記実施形態における光導波路13a,13bを必要としないため、部品点数が少なく、製造が容易で、コストダウンを図ることができる。   In the above embodiment, a plurality of sets of light projecting elements and light receiving elements are provided, and the detected object in the detection area is detected by each set of light projecting elements and light receiving elements. The optical axis for determining the failure may be formed without passing through the detection region, and the arrangement of the light projecting element and the light receiving element is not limited. For example, as shown in FIG. 7, a plurality of sets of light projecting elements 11a and 11b and light receiving elements 12a and 12b that constitute a transmission type optical sensor are arranged in different sets of light projecting elements 11a and 12b, and light projecting elements. 11b and the light receiving element 12a are arranged to face each other without the detection region A2. In FIG. 7, the optical axes L1 and L2 formed to detect the detection object intersect within the detection area A2, but the two light projecting elements 11a and 11b are alternately controlled to project light. Will not interfere. According to this configuration, as in the above-described embodiment, the light for failure determination is incident on the light receiving elements 12a and 12b without passing through the detection area A2, so that the detected object exists in the detection area A2. The failure determination light can be received without being interrupted by the object to be detected, that is, the failure determination can be performed while continuing the normal detection operation. Furthermore, since the optical waveguides 13a and 13b in the above embodiment are not required, the number of parts is small, the manufacturing is easy, and the cost can be reduced.

尚、図7は、図6と同様に、検出領域A2に対する投光素子11a,11b及び受光素子12a,12bの配置、被検出物を検出するための光軸L1,L2、及び故障判定のための光軸L12,L21を概略的に示すものであり、光電スイッチの外形形状に応じて配置されることは言うまでもない。   7, as in FIG. 6, the arrangement of the light projecting elements 11 a and 11 b and the light receiving elements 12 a and 12 b with respect to the detection area A <b> 2, the optical axes L <b> 1 and L <b> 2 for detecting an object to be detected, and failure determination These optical axes L12 and L21 are schematically shown, and needless to say, they are arranged according to the outer shape of the photoelectric switch.

操作スイッチの概略構成を示す側面図。The side view which shows schematic structure of an operation switch. 操作スイッチの概略構成を示す正面図。The front view which shows schematic structure of an operation switch. 操作スイッチの電気的構成を示すブロック図。The block diagram which shows the electric constitution of an operation switch. 操作スイッチの動作を示すタイミングチャート。The timing chart which shows operation | movement of an operation switch. 投光素子と受光素子の配置を示す説明図。Explanatory drawing which shows arrangement | positioning of a light projection element and a light receiving element. 別の投光素子と受光素子の配置を示す説明図。Explanatory drawing which shows arrangement | positioning of another light projecting element and a light receiving element. 別の投光素子と受光素子の配置を示す説明図。Explanatory drawing which shows arrangement | positioning of another light projecting element and a light receiving element.

符号の説明Explanation of symbols

11a,11b…投光素子、12a,12b…受光素子、13a,13b…光導波路、21…CPU、22a,22b…投光回路、23a,23b…受光回路、24…検出用コンパレータ、25…故障判別用コンパレータ、A1,A2…検出領域、SW1〜SW4…スイッチ、P1,P2…投光信号、X1…検出信号、X2…判別信号、S1〜S4…制御信号。   11a, 11b ... light projecting element, 12a, 12b ... light receiving element, 13a, 13b ... optical waveguide, 21 ... CPU, 22a, 22b ... light projecting circuit, 23a, 23b ... light receiving circuit, 24 ... detection comparator, 25 ... failure Discriminating comparator, A1, A2... Detection region, SW1 to SW4... Switch, P1, P2... Projection light, X1.

Claims (6)

検出領域へ向けて光を照射する投光手段と、当該投光手段と対となって検出領域からの光を受光する受光手段を複数組備え、前記検出領域の被検出物を検出する光電センサにおいて、
各組の前記投光手段からの光の一部をその投光手段と異なる組の受光手段にて前記検出領域を介さずに受光可能とし、
各組の投光手段を順番に投光駆動する駆動手段と、
各組の投光タイミングにおける、投光駆動される投光手段と対となる受光手段の受光量に基づいて被検出物の検出を行う検出手段と、
各組の投光タイミングにおける、投光駆動される投光手段の光の一部が受光可能とされた他の組の受光手段の受光量に基づいて故障判断を行う故障判断手段と、
を備えることを特徴とする光電センサ。
A photoelectric sensor comprising a plurality of sets of light projecting means for irradiating light toward the detection area and light receiving means for receiving light from the detection area in pairs with the light projecting means, and detecting an object to be detected in the detection area In
A part of light from the light projecting means of each set can be received by the light receiving means of a set different from the light projecting means without passing through the detection region
Driving means for sequentially projecting and driving each set of light projecting means;
Detecting means for detecting an object to be detected based on the amount of light received by the light receiving means paired with the light projecting means driven by light projection at each set of light projection timing;
A failure determination means for performing a failure determination based on the amount of light received by another set of light receiving means capable of receiving a part of the light of the light projecting means to be projected and driven at the light projection timing of each set;
A photoelectric sensor comprising:
請求項1記載の光電センサにおいて、
各組の投光手段及び受光手段は前記検出領域を挟んで対向配置されてなることを特徴とする光電センサ。
The photoelectric sensor according to claim 1,
Each set of light projecting means and light receiving means are arranged to face each other with the detection area interposed therebetween.
請求項2記載の光電センサにおいて、
各組毎に前記投光手段と前記受光手段とが互い違いに配置されていることを特徴とする光電センサ。
The photoelectric sensor according to claim 2,
The photoelectric sensor, wherein the light projecting means and the light receiving means are alternately arranged for each set.
請求項1〜3のうちの何れか一項に記載の光電センサにおいて、
隣り合う組の投光手段と受光手段との間に、該投光手段からの光の一部を該受光手段に導く導光手段を備えたことを特徴とする光電センサ。
In the photoelectric sensor as described in any one of Claims 1-3,
A photoelectric sensor comprising a light guide means for guiding a part of light from the light projecting means to the light receiving means between adjacent pairs of light projecting means and light receiving means.
請求項1〜3のうちの何れか一項に記載の光電センサにおいて、
各組の前記投光手段は、他の組の受光手段と前記検出領域を介さずに対向配置され、
各組の前記受光手段は、他の組の投光手段と前記検出領域を介さずに対向配置されてなる、ことを特徴とする光電センサ。
In the photoelectric sensor as described in any one of Claims 1-3,
The light projecting means of each set is disposed opposite to the other light receiving means without the detection area,
Each set of the light receiving means is disposed to face another set of light projecting means without passing through the detection area.
請求項1〜5のうちの何れか一項に記載の光電センサにおいて、
前記受光手段の出力信号レベルと比較判定レベルとを比較し、該比較結果に応じた検出信号を出力する検出用コンパレータと、
前記受光手段の出力信号レベルと故障判別レベルとを比較し、該比較結果に応じた判別信号を出力する故障判別用コンパレータと、
前記各組の受光手段のそれぞれと前記検出用コンパレータと前記故障判別用コンパレータに接続された開閉手段と、
前記各組の受光手段を前記検出用コンパレータに順次接続するとともに、前記検出用コンパレータに接続された受光手段と対向配置された投光手段からの光の一部が受光可能とされた他の組の受光手段を前記故障判別用コンパレータに接続するよう、前記開閉手段を制御する制御手段と、
を備えたことを特徴とする光電センサ。
In the photoelectric sensor as described in any one of Claims 1-5,
A comparator for detection that compares an output signal level of the light receiving means with a comparison determination level, and outputs a detection signal according to the comparison result;
A failure determination comparator that compares the output signal level of the light receiving means and a failure determination level, and outputs a determination signal according to the comparison result;
Opening / closing means connected to each of the light receiving means of each set, the detection comparator and the failure determination comparator,
Each set of light receiving means is connected to the detection comparator in turn, and another set in which a part of the light from the light projecting means arranged opposite to the light receiving means connected to the detection comparator can be received. Control means for controlling the opening and closing means to connect the light receiving means to the failure determination comparator,
A photoelectric sensor comprising:
JP2006297130A 2006-07-31 2006-10-31 Photoelectric sensor Pending JP2008058291A (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4472784B1 (en) * 2009-02-10 2010-06-02 株式会社 エニイワイヤ Photoelectric sensor and photoelectric sensor system
TWI400471B (en) * 2010-03-18 2013-07-01 Anywire Corp Optoelectronic sensor and optoelectronic sensor system
JP2013195355A (en) * 2012-03-22 2013-09-30 Mitsubishi Electric Corp Photoelectric sensor and failure detection method for photoelectric sensor
CN104865611A (en) * 2014-02-23 2015-08-26 欧姆龙株式会社 Photoelectric sensor
KR20200055357A (en) * 2018-11-13 2020-05-21 주식회사 우리기술 Obstacle detection apparatus with a dualized optical sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4472784B1 (en) * 2009-02-10 2010-06-02 株式会社 エニイワイヤ Photoelectric sensor and photoelectric sensor system
TWI400471B (en) * 2010-03-18 2013-07-01 Anywire Corp Optoelectronic sensor and optoelectronic sensor system
JP2013195355A (en) * 2012-03-22 2013-09-30 Mitsubishi Electric Corp Photoelectric sensor and failure detection method for photoelectric sensor
CN104865611A (en) * 2014-02-23 2015-08-26 欧姆龙株式会社 Photoelectric sensor
KR20200055357A (en) * 2018-11-13 2020-05-21 주식회사 우리기술 Obstacle detection apparatus with a dualized optical sensor
KR102251602B1 (en) * 2018-11-13 2021-05-13 주식회사 우리기술 Obstacle detection apparatus with a dualized optical sensor

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