TWI399256B - Laser cutting method and laser cutting device - Google Patents
Laser cutting method and laser cutting device Download PDFInfo
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- TWI399256B TWI399256B TW099113630A TW99113630A TWI399256B TW I399256 B TWI399256 B TW I399256B TW 099113630 A TW099113630 A TW 099113630A TW 99113630 A TW99113630 A TW 99113630A TW I399256 B TWI399256 B TW I399256B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
- B23K26/082—Scanning systems, i.e. devices involving movement of the laser beam relative to the laser head
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/16—Removal of by-products, e.g. particles or vapours produced during treatment of a workpiece
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Description
本發明係有關一種使用雷射光束切割印刷電路板的雷射切斷方法及雷射切斷裝置。The present invention relates to a laser cutting method and a laser cutting device for cutting a printed circuit board using a laser beam.
雷射光束因定向性、聚光性優越,易於用透鏡向微小定點聚光,可得高能量密度。又可用鏡片等使雷射光束之聚光位置移動至工件上之任意位置,得以加工細微且複雜之形狀。因此雷射加工機在切斷加工之領域中被廣泛利用。The laser beam is excellent in orientation and condensing property, and it is easy to collect light at a small fixed point with a lens, and a high energy density can be obtained. Further, the condensing position of the laser beam can be moved to an arbitrary position on the workpiece by a lens or the like to process a fine and complicated shape. Therefore, laser processing machines are widely used in the field of cutting processing.
印刷電路板係由導體層與絕緣層之積層構造所構成。一般而言,導體層係由銅等金屬所成,絕緣層為有機化合物之樹脂所成。因此要以雷射光束切斷印刷電路板時,如雷射光束之功率大時,會從印刷電路板所含成分中產生碳化物等之加工渣,且附著於工件切斷面。加工渣將顯著降低印刷電路板之絕緣可靠性。又,經剝離的加工渣有時會成為灰塵堆積在印刷電路上。如是,加工渣將造成印刷電路板之動作不良的原因。又,工件為金屬、矽、木材等所構成時,也與印刷電路板同樣,加工渣也會附著於切斷面。The printed circuit board is composed of a laminated structure of a conductor layer and an insulating layer. In general, the conductor layer is made of a metal such as copper, and the insulating layer is made of a resin of an organic compound. Therefore, when the printed circuit board is cut by the laser beam, if the power of the laser beam is large, machining slag such as carbide is generated from the components contained in the printed circuit board, and adheres to the cut surface of the workpiece. Processing slag will significantly reduce the insulation reliability of printed circuit boards. Moreover, the peeled process slag sometimes causes dust to accumulate on the printed circuit. If so, the processing slag will cause the malfunction of the printed circuit board. Further, when the workpiece is made of metal, tantalum, wood, or the like, the processed slag adheres to the cut surface as in the case of the printed circuit board.
作為以抑制加工渣附著在工件切斷面為目的之習知雷射切斷方法,有一種沿工件上之同一軌道使雷射光束多次掃描者(例如參照專利文獻1)。As a conventional laser cutting method for suppressing adhesion of the machining slag to the workpiece cut surface, there is a case where the laser beam is scanned a plurality of times along the same track on the workpiece (see, for example, Patent Document 1).
作為以抑制加工渣附著在工件切斷面為目的之習知雷射切斷方法,又有一種在切斷完後,對於切斷面照射功率較弱之雷射光束者(例如參照專利文獻2)。As a conventional laser cutting method for suppressing the adhesion of the processing slag to the workpiece cut surface, there is a laser beam having a weak irradiation power to the cut surface after the cutting (for example, refer to Patent Document 2) ).
(專利文獻1) 日本特開2005-303322號公報(Patent Document 1) Japanese Patent Laid-Open Publication No. 2005-303322
(專利文獻2) 日本特開平5-343832號公報(Patent Document 2) Japanese Patent Laid-Open No. Hei 5-343832
但是在專利文獻1之雷射切斷方法之情形,因要在工件同一切斷面反覆照射雷射光束,而有對同一切斷面反覆進行加熱與冷卻作業以致發生加工渣堆積之問題。However, in the case of the laser cutting method of Patent Document 1, since the laser beam is repeatedly irradiated on the same cut surface of the workpiece, there is a problem in that the same cut surface is repeatedly heated and cooled so that the processing slag is accumulated.
又,在專利文獻2之雷射切斷方法之情形,當切斷完成時,附著於工件切斷面之加工渣,因在照射功率較弱之雷射光束時己被冷卻,故而會起因於工件材料之變質等,造成難以吸收雷射光束。因此,所發生之加工渣要以功率較弱之雷射光束去除實有困難。Further, in the case of the laser cutting method of Patent Document 2, when the cutting is completed, the processing slag adhering to the cut surface of the workpiece is cooled by the laser beam having a weak irradiation power, which is caused by Deterioration of the workpiece material, etc., makes it difficult to absorb the laser beam. Therefore, it is difficult to remove the processed slag from the laser beam with weak power.
本發明之雷射切斷方法,其特徵在於:一邊使預定功率之雷射光束對工件之掃描位置在每次掃描時逐次移動預定移動量,一邊對上述工件多次掃描上述預定功率之雷射光束,藉此切斷上述工件。The laser cutting method of the present invention is characterized in that a laser beam of the predetermined power is scanned a plurality of times on the workpiece while moving a scanning beam of a predetermined power to a scanning position of the workpiece one by one for each scanning. The light beam thereby cuts off the workpiece.
又,本發明之雷射切斷裝置,其特徵在於,具備:雷射振盪器,射出雷射光束;聚光透鏡,將上述雷射振盪器射出之雷射光束聚光在工件上;及控制裝置,控制雷射光束之功率及雷射光束對上述工件之掃描位置,且一邊使預定功率之雷射光束對上述工件之掃描位置在每次掃描時逐次移動預定移動量,一邊對上述工件多次掃描上述預定功率之雷射光束,藉此切斷上述工件。Further, a laser cutting device according to the present invention includes: a laser oscillator that emits a laser beam; and a collecting lens that condenses a laser beam emitted from the laser oscillator on a workpiece; and controls a device for controlling the power of the laser beam and the scanning position of the laser beam to the workpiece, and moving the scanning position of the laser beam of the predetermined power to the scanning position of the workpiece one by one by a predetermined amount of movement during each scanning The laser beam of the predetermined power is scanned a second time, thereby cutting off the workpiece.
依據本發明,可抑制加工渣附著在切斷工件所形成之切斷面。According to the present invention, it is possible to suppress the processing slag from adhering to the cut surface formed by cutting the workpiece.
(實施方式1)(Embodiment 1)
參照第1圖至第5圖說明實施方式1。Embodiment 1 will be described with reference to Figs. 1 to 5 .
第1圖為實施方式1之雷射切斷裝置之構成圖。實施方式1之雷射切斷裝置係具備:雷射振盪器1,可射出雷射光束2;多數個傳輸鏡片3、4、5,將雷射振盪器1射出之雷射光束2傳輸至工件7;聚光透鏡6,將所傳輸之雷射光束2聚光在工件7上;XY工作台8,裝載工件7可向X軸與Y軸方向移動;及控制裝置9,依據數據10控制雷射振盪器1與XY工作台8。數據10為加工程式、後述之光束直徑D及掃描之總次數n等的資訊,且在輸入至雷射切斷裝置後,儲存於未圖示之記憶體。再者,雷射光束2可為無停機時間之CW振盪,或可為在每預定時間有停機時間之脈波振盪。Fig. 1 is a configuration diagram of a laser cutting device according to a first embodiment. The laser cutting device of the first embodiment includes a laser oscillator 1 that emits a laser beam 2, and a plurality of transmission lenses 3, 4, and 5 that transmit the laser beam 2 emitted from the laser oscillator 1 to the workpiece. 7; a collecting lens 6, condensing the transmitted laser beam 2 on the workpiece 7; the XY table 8, loading the workpiece 7 to move in the X-axis and the Y-axis direction; and the control device 9, controlling the lightning according to the data 10 The oscillator 1 is coupled to the XY table 8. The data 10 is information such as a processing program, a beam diameter D to be described later, and the total number n of scans, and is stored in a memory (not shown) after being input to the laser cutting device. Furthermore, the laser beam 2 can be a CW oscillation without downtime, or can be a pulse wave oscillation with a downtime every predetermined time.
第2圖為實施方式1之XY工作台之規格之說明圖。XY工作台8有較藉由切斷工件7所形成之加工形狀7a為大之開口部8a。由此,工件7被切斷時,可防止因雷射光束2通過工件7照射到XY工作台8而損傷XY工作台8。也可防止因通過工件7之雷射光束2在XY工作台8反射而照射工件7之背面。Fig. 2 is an explanatory view showing the specifications of the XY table of the first embodiment. The XY table 8 has a larger opening portion 8a than the processed shape 7a formed by cutting the workpiece 7. Thereby, when the workpiece 7 is cut, it is possible to prevent the XY table 8 from being damaged by the laser beam 2 being irradiated onto the XY table 8 through the workpiece 7. It is also possible to prevent the back side of the workpiece 7 from being irradiated by the laser beam 2 passing through the workpiece 7 on the XY table 8.
其次說明實施方式1之雷射切斷方法。另外,在隨後之說明中,設定於雷射光束2之聚光位置之光束直徑為D(mm),且雷射光束2之功率為P1 (W)時,藉由雷射光束2掃描1次即可切斷工件7。Next, the laser cutting method of the first embodiment will be described. In addition, in the following description, when the beam diameter set at the condensing position of the laser beam 2 is D (mm), and the power of the laser beam 2 is P 1 (W), the laser beam 2 is scanned 1 The workpiece 7 can be cut off once.
於本實施方式,係藉由使雷射光束2掃描多次來切斷工件7。又,在每次掃描時使雷射光束2之掃描位置移動。此時,如下式(1)所示,將每次掃描之掃描位置之移動量S(mm)設定在大於0而D/n以下之值。另外,n為掃描之總次數(n≧2)。In the present embodiment, the workpiece 7 is cut by scanning the laser beam 2 a plurality of times. Also, the scanning position of the laser beam 2 is moved at each scanning. At this time, as shown in the following formula (1), the movement amount S (mm) of the scanning position for each scan is set to a value larger than 0 and D/n or less. In addition, n is the total number of scans (n≧2).
0<(每次掃描之掃描位置之移動量S)≦D/n…式(1)0<(moving amount S of scanning position per scan)≦D/n...(1)
在此,移動量S係在以前次掃描路徑上之任意點為A點,且以A點之與前次掃描路徑之切線正交之直線和此次之掃描路徑之交點為B點時,等於A點與B點之距離。Here, the movement amount S is an point at any point on the previous scanning path, and is equal to the point where the line orthogonal to the tangent of the previous scanning path of point A and the current scanning path are point B, which is equal to The distance between point A and point B.
再者,如以下式(2)所示,將每次掃描之雷射光束2之功率P2 (W)設定在P1 /n以上而未滿P1 之值。Further, as shown in the following formula (2), the power P 2 (W) of the laser beam 2 per scan is set to be P 1 /n or more and less than the value of P 1 .
P1 >(每次掃描之雷射光束2之功率P2 )≧P1 /n…式(2)再者,根據式(1)及式(2)決定S與P2 ,係由雷射切斷裝置之操作人員或由控制裝置9進行。P 1 >(power P 2 of laser beam 2 per scan) ≧P 1 /n... (2) Further, S and P 2 are determined according to equations (1) and (2), which are laser The operator of the cutting device is either operated by the control device 9.
茲參照第3圖與第4圖說明實施方式1之具體例。第3圖為實施方式1之具體例中的工件之規格與加工形狀之例之說明圖。第3圖(a)為工件7之上視圖,第3圖(b)為工件7之剖面圖。工件7為60mm×60mm之正方形所成,且具有1 mm厚。又,切斷工件7形成之加工形狀7a為30mm×30mm之正方形狀所構成。工件7為由玻璃纖維布13浸漬於環氧樹脂14之絕緣層與導體層之積層構造所構成的印刷電路板。A specific example of the first embodiment will be described with reference to Figs. 3 and 4 . Fig. 3 is an explanatory view showing an example of a specification and a processed shape of a workpiece in a specific example of the first embodiment. Fig. 3(a) is a top view of the workpiece 7, and Fig. 3(b) is a cross-sectional view of the workpiece 7. The workpiece 7 is made of a square of 60 mm × 60 mm and has a thickness of 1 mm. Further, the processed shape 7a formed by cutting the workpiece 7 is formed into a square shape of 30 mm × 30 mm. The workpiece 7 is a printed circuit board in which a glass fiber cloth 13 is immersed in a laminated structure of an insulating layer and a conductor layer of the epoxy resin 14.
下表1為使用以往之雷射切斷方法掃描1次時之實驗結果。於表1之實驗,設定D=0.2 mm,且P2 =80、100、120(W)之3種,在第3圖所示工件7只掃描1次雷射光束2。再者,在此實驗所用雷射切斷方法係相當於以往之雷射切斷方法。表1為在各實驗之結果,顯示是否能切斷工件7、及是否加工渣以可目視之程度附著在切斷面。在此能切斷工件7係指雷射光束2有貫通工件7,不包含雷射光束2僅到工件7之表面與背面之間的中間點之情形。Table 1 below shows the results of the experiment when scanning once using the conventional laser cutting method. In the experiment of Table 1, three types of D = 0.2 mm and P 2 = 80, 100, and 120 (W) were set, and the workpiece 7 was scanned only once for the laser beam 2 as shown in Fig. 3. Furthermore, the laser cutting method used in this experiment is equivalent to the conventional laser cutting method. Table 1 shows the results of the respective experiments, showing whether the workpiece 7 can be cut and whether the slag is attached to the cut surface to a visual extent. The cutting of the workpiece 7 here means that the laser beam 2 has penetrated the workpiece 7, and does not include the case where the laser beam 2 is only at an intermediate point between the surface and the back surface of the workpiece 7.
如表1所示,設定P2 =80(W)時,切斷面雖無附著加工渣,但是無法切斷工件7。另一方面,P2 =100、120(W)時,雖可切斷工件7,但是在切斷面附著有加工渣。因此,使用以往之雷射切斷方法時,無關於雷射光束之功率P2 之值,無法獲得能切斷工件7,且在切斷面不附著加工渣之良好結果。以下依據此實驗結果設定P1 =100(W)。As shown in Table 1, when P 2 = 80 (W) was set, the workpiece was not cut, but the workpiece 7 could not be cut. On the other hand, when P 2 = 100 or 120 (W), the workpiece 7 can be cut, but the processing slag adheres to the cut surface. Therefore, when the conventional laser cutting method is used, the value of the power P 2 of the laser beam is not obtained, and the workpiece 7 can be cut, and the machining slag is not adhered to the cut surface. The following is based on the results of this experiment to set P 1 =100 (W).
以下之表2為使用實施方式1之雷射切斷方法掃描2次時之實驗結果。於表2之實驗,係採用實施方式1之雷射切斷方法,對第3圖所示之工件7掃描2次雷射光束2。又,設定D=0.2(mm)及P2 =40、50、60(W)之3種,進而在各自的P2 之值中設定S=0.08、0.10、0.12(mm)之3種。表2如同表1,為各實驗之結果,其顯示是否能切斷工件7、及是否加工渣以可目視的程度附著在切斷面。Table 2 below shows the results of the experiment when scanning twice using the laser cutting method of the first embodiment. In the experiment of Table 2, the laser beam 2 was scanned twice for the workpiece 7 shown in Fig. 3 by the laser cutting method of the first embodiment. Further, three types of D = 0.2 (mm) and P 2 = 40, 50, and 60 (W) are set, and three types of S = 0.08, 0.10, and 0.12 (mm) are set in the respective values of P 2 . Table 2 is the result of each experiment as shown in Table 1, which shows whether the workpiece 7 can be cut and whether the slag is attached to the cut surface to a visual extent.
以下之表3為使用實施方式1之雷射切斷方法掃描4次時之實驗結果。於表3之實驗,係採用實施方式1之雷射切斷方法,對第3圖所示之工件7掃描4次雷射光束2。又,設定D=0.2(mm)及P2 =20、25、30(W)之3種,進而在各自的P2 之值中設定S=0.04、0.05、0.06(mm)之3種。表3如同表1,為各實驗之結果,其顯示是否能切斷工件7、及是否加工渣以可目視的程度附著在切斷面。Table 3 below shows the results of the experiment when the scanning was performed four times using the laser cutting method of the first embodiment. In the experiment of Table 3, the laser beam 2 was scanned four times for the workpiece 7 shown in Fig. 3 by the laser cutting method of the first embodiment. Further, three types of D = 0.2 (mm) and P 2 = 20, 25 , and 30 (W) are set, and three types of S = 0.04, 0.05, and 0.06 (mm) are set in the respective values of P 2 . Table 3 is the result of each experiment as shown in Table 1, which shows whether the workpiece 7 can be cut and whether the slag is attached to the cut surface to a visual extent.
於表3之實驗,n=4(次)、P1 =100(W),因此D/n=0.05(mm)、P1 /n=25(W)。所以滿足式(1)之S=0.04、0.05(mm),且滿足式(2)之P2 =25、=30(W)時,可獲得良好結果。In the experiment of Table 3, n = 4 (times), P 1 = 100 (W), so D / n = 0.05 (mm), P 1 / n = 25 (W). Therefore, when S = 0.04, 0.05 (mm) of the formula (1) is satisfied, and P 2 = 25 and = 30 (W) of the formula (2) are satisfied, good results can be obtained.
第4圖為藉由雷射光束掃描4次,並採用實施方式1之雷射切斷方法將第3圖所示工件切斷之樣態圖。此時之n=4(次)、D=0.2(mm)、P1 =100(W)。所以依據式(1)與式(2),需滿足S≦0.05、P2 ≧25。於是,第4圖之例設定S=0.05(mm)、P2 =25(W)。Fig. 4 is a view showing a state in which the workpiece shown in Fig. 3 is cut by scanning the laser beam four times and using the laser cutting method of the first embodiment. At this time, n=4 (times), D=0.2 (mm), and P 1 =100 (W). Therefore, according to formula (1) and formula (2), it is necessary to satisfy S≦0.05 and P 2 ≧25. Therefore, in the example of Fig. 4, S = 0.05 (mm) and P 2 = 25 (W) are set.
第4圖(a)為顯示第1次掃描時,第4圖(b)為顯示第2次掃描時,第4圖(c)為顯示第3次掃描時,第4圖(d)為顯示第4次掃描時之情形。又於第4圖(a)至第4圖(d)之各圖,上圖為自上面看工件7之圖,以2點鏈線顯示加工形狀7a,且以粗線箭頭顯示雷射光束2之掃描位置20。另一方面,於第4圖(a)至第4圖(d)之各圖,下圖為工件7之剖面圖,且顯示平面方向之掃描位置21與由掃描形成之切斷面22。Figure 4 (a) shows the first scan, Figure 4 (b) shows the second scan, Figure 4 (c) shows the third scan, and Figure 4 (d) shows The situation at the time of the fourth scan. Further, in each of Figs. 4(a) to 4(d), the upper view is a view of the workpiece 7 as seen from above, the processed shape 7a is shown by a 2-point chain line, and the laser beam 2 is shown by a thick line arrow. Scan position 20. On the other hand, in the respective drawings of Figs. 4(a) to 4(d), the lower drawing shows a cross-sectional view of the workpiece 7, and shows the scanning position 21 in the plane direction and the cut surface 22 formed by scanning.
於第4圖(a)之情形,掃描位置20係以S之1.5倍之0.075 mm位於加工形狀7a之外側。於第4圖(b)之情形,掃描位置20係以S之0.5倍之0.025 mm位於加工形狀7a之外側。於第4圖(c)之情形,掃描位置20係以S之0.5倍之0.025 mm位於加工形狀7a之內側。於第4圖(d)之情形,掃描位置20係以S之1.5倍之0.075 mm位於加工形狀7a之內側。如此,於第4圖之例,係使雷射光束2之掃描位置20,在每次掃描時於加工形狀7a之周邊逐次向內側方向移動0.05 mm,藉此切斷工件7而形成加工形狀7a。In the case of Fig. 4(a), the scanning position 20 is located at the outer side of the processed shape 7a at a ratio of 0.075 mm which is 1.5 times S. In the case of Fig. 4(b), the scanning position 20 is located on the outer side of the processed shape 7a by 0.025 mm which is 0.5 times S. In the case of Fig. 4(c), the scanning position 20 is located inside the processed shape 7a at 0.025 mm which is 0.5 times S. In the case of Fig. 4(d), the scanning position 20 is located inside the processed shape 7a at a ratio of 0.075 mm which is 1.5 times S. Thus, in the example of Fig. 4, the scanning position 20 of the laser beam 2 is shifted by 0.05 mm in the inner direction from the periphery of the processed shape 7a at each scanning, thereby cutting the workpiece 7 to form the processed shape 7a. .
第5圖為使用以往之雷射切斷方法時之切斷面,和使用實施方式1之雷射切斷方法時之切斷面之照片。第5圖(a)為使用以往之雷射切斷方法,而n=1(次),D=0.2(mm),P2 =100(W)時之工件7之切斷面22之照片。於第5圖(a)係對切斷面22照射之雷射光束2之功率大至100W,所以碳化物所成之加工渣大量附著於切斷面22。Fig. 5 is a photograph of a cut surface when a conventional laser cutting method is used and a cut surface when the laser cutting method of the first embodiment is used. Fig. 5(a) is a photograph of the cut surface 22 of the workpiece 7 when n = 1 (times), D = 0.2 (mm), and P 2 = 100 (W) using the conventional laser cutting method. In Fig. 5(a), the power of the laser beam 2 irradiated to the cut surface 22 is as large as 100 W, so that a large amount of processed slag formed by carbide adheres to the cut surface 22.
另一方面,第5圖(b)係使用實施方式1之雷射切斷方法,而n=4(次),D=0.2(mm),S=0.05(mm),P2 =25(W)時之工件7之切斷面22之照片。於第5圖(b),為對每次掃描所形成之切斷面22照射之雷射光束2之功率小至25W之故,在每次掃描時之切斷面22幾乎不附著加工渣。再者,在每次掃描時雷射光束2之掃描位置因會逐次移動0.2 mm,故在同一切斷面22會照射多次25W之雷射光束2,因此可抑制發生加工渣之附著。如是,在最後形成之切斷面22,僅照射最終次之第4次掃描之25W的雷射光束功率。因此最後所形成之切斷面22幾乎不附著加工渣。On the other hand, Fig. 5(b) uses the laser cutting method of the first embodiment, and n = 4 (times), D = 0.2 (mm), S = 0.05 (mm), and P 2 = 25 (W). A photograph of the cut surface 22 of the workpiece 7 at the time. In Fig. 5(b), the power of the laser beam 2 irradiated to the cut surface 22 formed for each scan is as small as 25 W, so that the cut surface 22 hardly adheres to the slag at each scanning. Further, since the scanning position of the laser beam 2 is shifted by 0.2 mm in each scanning, the laser beam 2 of 25 W is irradiated a plurality of times on the same cut surface 22, so that the adhesion of the machining slag can be suppressed. If so, at the last cut surface 22, only the laser beam power of 25 W of the fourth and fourth scans is irradiated. Therefore, the cut surface 22 formed lastly hardly adheres to the processing slag.
再者,於式(1),S=D/6n以上為佳。即能滿足以下之式(3)與式(2)時,可有效抑制加工渣之附著。Furthermore, in the formula (1), S=D/6n or more is preferable. In other words, when the following formulas (3) and (2) are satisfied, the adhesion of the processing slag can be effectively suppressed.
D/6n≦(每次掃描之掃描位置之移動量S)≦D/n…式(3)D/6n≦ (movement amount S of scanning position per scan)≦D/n...(3)
又,於如上具體例之說明,係將雷射光束之掃描位置,在每次掃描時在加工形狀7a之周邊逐次向內側平行移動0.05 mm用以切斷工件7而形成加工形狀7a,但是並不限於此。即,例如,使雷射光束之掃描位置,每次掃描時在加工形狀7a之周邊逐次向外側方向平行移動0.05 mm用以切斷工件7,來形成加工形狀7a亦可。Further, in the above specific example, the scanning position of the laser beam is sequentially moved to the inner side by 0.05 mm in the periphery of the processed shape 7a at each scanning to cut the workpiece 7 to form the processed shape 7a. Not limited to this. In other words, for example, the scanning position of the laser beam may be shifted by 0.05 mm in the outer direction in the outer direction of the processed shape 7a at each scanning to cut the workpiece 7 to form the processed shape 7a.
再者,在如上之說明,工件7雖為印刷電路板所構成,但是只要是用雷射光束照射會發生加工渣者,不管由何種材料所構成均可。即,工件可為金屬、矽、木材等所構成。Further, as described above, the workpiece 7 is formed of a printed circuit board, but it may be formed of any material as long as it is processed by a laser beam. That is, the workpiece may be made of metal, tantalum, wood, or the like.
依據實施方式1,在切斷工件之期間可抑制產生加工渣。因此可抑制在切斷工件所形成之切斷面附著加工渣。According to the first embodiment, the generation of the machining slag can be suppressed during the cutting of the workpiece. Therefore, it is possible to suppress the adhesion of the processing slag to the cut surface formed by cutting the workpiece.
再者,在實施方式1,說明每次掃描之掃描位置之移動量S,與每次掃描之雷射光束2之功率P2 ,在每次掃描為一定之情形者,但是並不限於此。即,只要能滿足式(1)與式(2),每次掃描時之S與P2 不同亦可。此時亦可獲得如與實施方式1同樣效果。Further, in the first embodiment, the amount of movement S of the scanning position for each scanning and the power P 2 of the laser beam 2 for each scanning are described as being constant for each scanning, but the present invention is not limited thereto. That is, as long as the formulas (1) and (2) can be satisfied, S and P 2 may be different for each scan. At this time, the same effects as in the first embodiment can be obtained.
(實施方式2)(Embodiment 2)
參照第6圖說明實施方式2。另外,以與實施方式1不同的部分為中心加以說明,與實施方式相同部分則省略其說明。Embodiment 2 will be described with reference to Fig. 6 . It is to be noted that the portions that are different from the first embodiment will be mainly described, and the description of the same portions as those of the embodiment will be omitted.
於實施方式1之在第1圖所示之雷射切斷裝置,係藉由XY工作台8之X軸方向及Y軸方向之移動,使雷射光束2對工件7之聚光位置移動。但是XY工作台8本體甚重,以致聚光位置之移動變慢,拉長完成工件7之切斷所需的時間。於實施方式2,一邊使用實施方式1所說明之雷射切斷方法,一邊用以縮短切斷工件所需之時間者。In the laser cutting device shown in Fig. 1 of the first embodiment, the laser beam 2 is moved to the condensing position of the workpiece 7 by the movement of the XY table 8 in the X-axis direction and the Y-axis direction. However, the body of the XY table 8 is so heavy that the movement of the condensing position becomes slow, and the time required to complete the cutting of the workpiece 7 is elongated. In the second embodiment, the time required to cut the workpiece is shortened while using the laser cutting method described in the first embodiment.
第6圖為在實施方式2之雷射切斷裝置之構成圖。於實施方式2之雷射切斷裝置係具備:雷射振盪器1,可射出雷射光束2;多數個傳輸鏡片3、4,將雷射振盪器1射出之雷射光束2傳輸至後述之驅動鏡片30;可旋轉之驅動鏡片30,將傳輸到之雷射光束2以任意角度偏向傳輸至工件7;聚光透鏡6,將所傳輸之雷射光束2聚光在工件7上;控制裝置31,控制雷射振盪器1與驅動鏡片30;及固定工作台32,裝載工件7。Fig. 6 is a view showing the configuration of a laser cutting device according to a second embodiment. The laser cutting device according to the second embodiment includes a laser oscillator 1 that emits a laser beam 2, and a plurality of transmission lenses 3 and 4 that transmit the laser beam 2 emitted from the laser oscillator 1 to a later-described one. Driving the lens 30; rotating the driving lens 30, transmitting the transmitted laser beam 2 to the workpiece 7 at an arbitrary angle; the collecting lens 6 condensing the transmitted laser beam 2 on the workpiece 7; 31. Control the laser oscillator 1 and the driving lens 30; and fix the table 32 to load the workpiece 7.
於實施方式2之雷射切斷裝置,係由驅動鏡片30之旋轉而移動雷射光束2對工件7之聚光位置。使用此雷射切斷裝置,以n=4(次),D=0.2(mm),S=0.05(mm),P2 =25(W),使用實施方式1之雷射切斷方法進行雷射切斷之結果,能切斷工件7之同時,在切斷面幾乎無附著碳化物。再者,因驅動鏡片30較XY工作台8之重量為輕,聚光位置之移動快速。如是,與使用實施方式1之雷射切斷裝置比較,可縮短切斷所需時間達1/4倍。In the laser cutting device of the second embodiment, the condensing position of the laser beam 2 to the workpiece 7 is moved by the rotation of the driving lens 30. Using this laser cutting device, using the laser cutting method of Embodiment 1 with n=4 (times), D=0.2 (mm), S=0.05 (mm), P 2 =25 (W) As a result of the cutting, the workpiece 7 can be cut, and almost no carbide adheres to the cut surface. Furthermore, since the weight of the driving lens 30 is lighter than that of the XY table 8, the movement of the condensing position is fast. As a result, compared with the use of the laser cutting device of the first embodiment, the time required for cutting can be shortened by a factor of 1/4.
依據實施方式2,除有實施方式1之效果之外,尚可縮短雷射切斷所需之時間。According to the second embodiment, in addition to the effects of the first embodiment, the time required for the laser cutting can be shortened.
再者,於實施方式2,由驅動鏡片30之旋轉,移動雷射光束2對工件7之聚光位置,但並不限於此。例如亦可將驅動鏡片30向X軸方向與Y軸方向移動,移動雷射光束2對工件7之聚光位置。此時也可獲得如同實施方式2之效果。Further, in the second embodiment, the position where the laser beam 2 is focused on the workpiece 7 is moved by the rotation of the driving lens 30, but is not limited thereto. For example, the driving lens 30 may be moved in the X-axis direction and the Y-axis direction to move the condensing position of the laser beam 2 to the workpiece 7. The effect as in Embodiment 2 can also be obtained at this time.
又,在第6圖所示雷射切斷裝置,加上第1圖所示之XY工作台8,使控制裝置31控制雷射振盪器1、驅動鏡片30、及XY工作台8亦可。此時也可獲得如同實施方式2之效果。Further, in the laser cutting device shown in Fig. 6, the XY table 8 shown in Fig. 1 is added, and the control device 31 controls the laser oscillator 1, the driving lens 30, and the XY table 8. The effect as in Embodiment 2 can also be obtained at this time.
(實施方式3)(Embodiment 3)
參照第7圖說明實施方式3。另外,以與實施方式2不同部分為中心加以說明,與實施方式2相同部分則省略其說明。Embodiment 3 will be described with reference to Fig. 7. It is to be noted that the differences from the second embodiment will be mainly described, and the description of the same portions as those of the second embodiment will be omitted.
於實施方式2之第6圖所示的雷射切斷裝置,係使利用可旋轉之驅動鏡片30而偏向之雷射光束2,藉由聚光透鏡6聚光於工件7表面。因此,由於雷射光束2對工件7之表面之照射非垂直,使切斷面與工件7表面不成垂直而無法提高切斷精度。實施方式3,係一邊採用在實施方式1說明之雷射切斷方法,一邊提高工件切斷之精度。In the laser cutting device shown in Fig. 6 of the second embodiment, the laser beam 2 deflected by the rotatable driving lens 30 is condensed on the surface of the workpiece 7 by the collecting lens 6. Therefore, since the irradiation of the surface of the workpiece 7 by the laser beam 2 is not perpendicular, the cut surface is not perpendicular to the surface of the workpiece 7, and the cutting accuracy cannot be improved. In the third embodiment, the accuracy of the workpiece cutting is improved while the laser cutting method described in the first embodiment is employed.
第7圖為於實施方式3之雷射切斷裝置之構成圖。於實施方式3之雷射切斷裝置係具備:雷射振盪器1,可射出雷射光束2;多數個傳輸鏡片3、4,將雷射振盪器1射出之雷射光束2傳輸至後述之驅動鏡片30;可旋轉之驅動鏡片30,將傳輸到之雷射光束2以任意角度偏向傳輸至工件7;遠心f θ透鏡(telecentric lens)40,將所傳輸之雷射光束2聚光在工件7上;控制裝置31,控制雷射振盪器1與驅動鏡片30;及固定工作台32,可裝載工件7。Fig. 7 is a view showing the configuration of a laser cutting device according to a third embodiment. The laser cutting device according to the third embodiment includes a laser oscillator 1 that emits a laser beam 2, and a plurality of transmission lenses 3 and 4 that transmit the laser beam 2 emitted from the laser oscillator 1 to a later-described one. Driving the lens 30; rotating the driving lens 30, transmitting the transmitted laser beam 2 to the workpiece 7 at an arbitrary angle; the telecentric lens 40, concentrating the transmitted laser beam 2 on the workpiece 7; a control device 31 for controlling the laser oscillator 1 and the driving lens 30; and a fixed table 32 for loading the workpiece 7.
遠心f θ透鏡40,係具有在設定像高為Y、焦距為f、入射角度為θ時,滿足Y=f×θ之特性。並且遠心f θ透鏡40是一種可使藉由驅動鏡片30而偏向之雷射光束2對工件7垂直照射的遠心透鏡。The telecentric f θ lens 40 has a characteristic of satisfying Y=f×θ when the set image height is Y, the focal length is f, and the incident angle is θ. And the telecentric f θ lens 40 is a telecentric lens that can vertically illuminate the workpiece 7 by the laser beam 2 deflected by the driving lens 30.
於實施方式3之雷射切斷裝置,係使藉由驅動鏡片30而偏向之雷射光束2,經由遠心f θ透鏡40對工件7表面垂直聚光。使用此雷射切斷裝置,以n=4(次),D=0.2(mm),S=0.05(mm),P2 =25(W),並使用實施方式1之雷射切斷方法進行雷射切斷之結果,除有實施方式2之效果之外,還可獲得對工件7之表面垂直之切斷面。In the laser cutting device of the third embodiment, the laser beam 2 deflected by the driving lens 30 is vertically condensed on the surface of the workpiece 7 via the telecentric f θ lens 40. Using this laser cutting device, n=4 (times), D=0.2 (mm), S=0.05 (mm), P 2 =25 (W), and using the laser cutting method of Embodiment 1 As a result of the laser cutting, in addition to the effects of the second embodiment, a cut surface perpendicular to the surface of the workpiece 7 can be obtained.
依據實施方式3,除了可獲得實施方式2之效果之外,尚可得到對工件7之表面垂直之切斷面,得以提高雷射切斷之精密度。According to the third embodiment, in addition to the effect of the second embodiment, the cut surface perpendicular to the surface of the workpiece 7 can be obtained, and the precision of the laser cut can be improved.
1...雷射振盪器1. . . Laser oscillator
2...雷射光束2. . . Laser beam
3、4、5...傳輸鏡片3, 4, 5. . . Transmission lens
6...聚光透鏡6. . . Condenser lens
7...工件7. . . Workpiece
7a...加工形狀7a. . . Processing shape
8...XY工作台8. . . XY table
8a...開口部8a. . . Opening
9...控制裝置9. . . Control device
10...數據10. . . data
13...玻璃纖維布13. . . Glass fiber cloth
14...環氧樹脂14. . . Epoxy resin
20...掃描位置20. . . Scan position
21...掃描位置twenty one. . . Scan position
22...切斷面twenty two. . . Cut surface
30...驅動鏡片30. . . Driving lens
31...控制裝置31. . . Control device
32...固定工作台32. . . Fixed workbench
D...光束直徑D. . . Beam diameter
第1圖為實施方式1之雷射切斷裝置之構成圖。Fig. 1 is a configuration diagram of a laser cutting device according to a first embodiment.
第2圖為實施方式1之XY工作台之規格說明圖。Fig. 2 is a specification diagram of the XY table of the first embodiment.
第3圖(a)及(b)為實施方式1之具體例之說明工件規格與加工形狀的例示圖。Fig. 3 (a) and (b) are diagrams showing an example of a workpiece specification and a processed shape in a specific example of the first embodiment.
第4圖(a)至第4圖(d)係顯示藉由雷射光束掃描4次,並採用實施方式1之雷射切斷方法切斷第3圖所示之工件的樣態圖。4(a) to 4(d) are views showing a state in which the workpiece shown in Fig. 3 is cut by the laser beam cutting method of the first embodiment by scanning the laser beam four times.
第5圖(a)及(b)為採用習知雷射切斷方法時之切斷面及採用實施方式1之雷射切斷方法時之切斷面之照像圖。Fig. 5 (a) and (b) are photographs showing a cut surface when a conventional laser cutting method is employed and a cut surface when the laser cutting method of the first embodiment is employed.
第6圖為實施方式2之雷射切斷裝置之構成圖。Fig. 6 is a view showing the configuration of a laser cutting device according to a second embodiment.
第7圖為實施方式3之雷射切割裝置之構成圖。Fig. 7 is a view showing the configuration of a laser cutting device of the third embodiment.
1...雷射振盪器1. . . Laser oscillator
2...雷射光束2. . . Laser beam
3、4、5...傳輸鏡片3, 4, 5. . . Transmission lens
6...聚光透鏡6. . . Condenser lens
7...工件7. . . Workpiece
8...XY工作台8. . . XY table
9...控制裝置9. . . Control device
10...數據10. . . data
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US9808572B2 (en) | 2010-01-22 | 2017-11-07 | Deka Products Limited Partnership | System, method and apparatus for clamping |
US10082241B2 (en) | 2011-12-21 | 2018-09-25 | Deka Products Limited Partnership | System, method, and apparatus for clamping |
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USD754065S1 (en) | 2015-02-10 | 2016-04-19 | Deka Products Limited Partnership | AC-to-DC power supply |
JP6671145B2 (en) | 2015-10-30 | 2020-03-25 | 株式会社レーザーシステム | Method for manufacturing processed resin substrate and laser processing apparatus |
JP2018006509A (en) * | 2016-06-30 | 2018-01-11 | 三星ダイヤモンド工業株式会社 | Processing method of substrate and processing device |
KR102570318B1 (en) * | 2016-07-04 | 2023-08-24 | 삼성디스플레이 주식회사 | Laser Processing Apparatus |
CN111843242A (en) * | 2020-08-24 | 2020-10-30 | 深圳市超越激光智能装备股份有限公司 | Double-head laser cutting machine |
CN113133208A (en) * | 2021-04-13 | 2021-07-16 | 深圳市三维电路科技有限公司 | Circuit processing method based on laser etching |
KR102506881B1 (en) | 2022-10-24 | 2023-03-07 | 주식회사 조호레이저 | Laser Cutting Method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009023215A (en) * | 2007-07-19 | 2009-02-05 | Panasonic Electric Works Co Ltd | Dividing method of laminate |
TW201008062A (en) * | 2008-05-23 | 2010-02-16 | Mitsubishi Electric Corp | Laser processing controlling device and laser processing device |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59127987A (en) * | 1983-01-10 | 1984-07-23 | Mitsubishi Electric Corp | Laser cutting device |
JPS6397391A (en) * | 1986-10-13 | 1988-04-28 | Ohbayashigumi Ltd | Fusion cutting method for concrete by laser beam |
JPH0771758B2 (en) * | 1991-11-05 | 1995-08-02 | 京葉ブランキング工業株式会社 | Material transport method and laser transport equipment for laser cutting equipment |
JP2005294325A (en) * | 2004-03-31 | 2005-10-20 | Sharp Corp | Method and apparatus for manufacturing substrate |
CN100593447C (en) * | 2007-04-19 | 2010-03-10 | 深圳市大族激光科技股份有限公司 | Laser device for cutting |
TWI409122B (en) * | 2007-07-13 | 2013-09-21 | Mitsuboshi Diamond Ind Co Ltd | A method for processing a brittle material substrate and a crack forming apparatus for the method |
CN101386112B (en) * | 2007-09-13 | 2013-06-05 | 常州英诺激光科技有限公司 | Laser cutting method based on inner carving |
-
2010
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009023215A (en) * | 2007-07-19 | 2009-02-05 | Panasonic Electric Works Co Ltd | Dividing method of laminate |
TW201008062A (en) * | 2008-05-23 | 2010-02-16 | Mitsubishi Electric Corp | Laser processing controlling device and laser processing device |
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JP5367162B2 (en) | 2013-12-11 |
KR20120136419A (en) | 2012-12-18 |
KR101409520B1 (en) | 2014-06-20 |
WO2011128929A1 (en) | 2011-10-20 |
CN102858489A (en) | 2013-01-02 |
JPWO2011128929A1 (en) | 2013-07-11 |
CN102858489B (en) | 2014-12-31 |
TW201134591A (en) | 2011-10-16 |
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