TWI396779B - Copper foil and its manufacturing method, and flexible printed circuit board - Google Patents

Copper foil and its manufacturing method, and flexible printed circuit board Download PDF

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TWI396779B
TWI396779B TW095104208A TW95104208A TWI396779B TW I396779 B TWI396779 B TW I396779B TW 095104208 A TW095104208 A TW 095104208A TW 95104208 A TW95104208 A TW 95104208A TW I396779 B TWI396779 B TW I396779B
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copper foil
plating
copper
foil
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TW200636097A (en
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Suzuki Akitoshi
Fukuda Shin
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Laminated Bodies (AREA)
  • Electroplating And Plating Baths Therefor (AREA)

Description

銅箔及其製造方法、以及可撓性印刷電路板Copper foil and its manufacturing method, and flexible printed circuit board

本發明係關於銅箔及其製造方法,及可撓性印刷電路板,尤其是適用於可撓性印刷電路板(以下簡稱FPC)之銅箔及其製造方法,及使用該銅箔的FPC。The present invention relates to a copper foil and a method of manufacturing the same, and a flexible printed circuit board, particularly a copper foil suitable for a flexible printed circuit board (hereinafter referred to as FPC), a method for producing the same, and an FPC using the copper foil.

最近的FPC通常分為2種。其中之一為將銅箔以黏著樹脂貼附於絕緣膜(聚醯亞胺、聚酯等),施以蝕刻處理而賦予圖案者。此形式的FPC通常稱為三層FPC,相對於此,另一形式為不使用黏著劑而將銅箔直接疊層於絕緣膜(聚醯亞胺、聚酯等)之FPC。該等通常被稱為二層FPC。如該FPC主要使用於液晶顯示器、電漿顯示器等平面顯示器、照相機、AV機器、個人電腦、電腦終端機、HDD、行動電話、車用電子儀器等之內部配線。該等配線由於被折彎而安裝於機器中,或使用在反覆彎折的處所,因此,就FPC用銅箔所要求的特性而言,彎曲性優異為一重要的特性。The most recent FPCs are usually divided into two types. One of them is to attach a copper foil to an insulating film (polyimide, polyester, etc.) with an adhesive resin, and apply an etching treatment to the pattern. This form of FPC is generally referred to as a three-layer FPC. On the other hand, another form is an FPC in which a copper foil is directly laminated on an insulating film (polyimine, polyester, or the like) without using an adhesive. These are often referred to as two-layer FPCs. For example, the FPC is mainly used for internal wiring such as a flat panel display such as a liquid crystal display or a plasma display, a camera, an AV device, a personal computer, a computer terminal, an HDD, a mobile phone, and a vehicle electronic device. Since these wirings are attached to the machine by being bent or used in a place where the bending is repeated, it is an important characteristic that the bending property is excellent in the characteristics required for the copper foil for FPC.

該FPC用銅箔可大別為2種。其中之一為將由鑄造所製造的銅的鑄塊施以壓延加工而成為箔狀的壓延銅箔。另一種為電解銅箔。於該情形,如圖1所示,於設有陽極1的電解槽中,充填以硫酸銅為主成分的電解液3,以電鍍法自該電解液3中,使銅以箔狀析出於旋轉中的陰極(鈦製鼓狀物)2之上。之後,將該析出的箔狀的銅連續地剝開而製造未處理銅箔4,並對該未處理銅箔施以表面處理,藉此得到電解銅箔。The FPC copper foil can be used in two types. One of them is a rolled copper foil which is formed into a foil shape by subjecting an ingot of copper produced by a foundry to a rolling process. The other is electrolytic copper foil. In this case, as shown in FIG. 1, in the electrolytic cell provided with the anode 1, an electrolytic solution 3 containing copper sulfate as a main component is filled, and the copper is precipitated in a foil form by electroplating. Above the cathode (titanium drum) 2. Thereafter, the precipitated foil-like copper was continuously peeled off to produce an untreated copper foil 4, and the untreated copper foil was subjected to surface treatment to obtain an electrolytic copper foil.

FPC用銅箔由於被要求優異的彎曲性,因此自以往,使用壓延銅箔的比例高。就其理由而言,係由於壓延銅箔如果於FPC製造時之將銅箔與聚醯亞胺貼合的步驟被加熱,則會於120℃~160℃的較低溫被燒鈍而軟化,使彎曲性及延伸性增大。Since copper foil for FPC is required to have excellent bendability, the ratio of using rolled copper foil has been high since the past. For this reason, since the rolled copper foil is heated in the step of bonding the copper foil and the polyimide during the production of the FPC, it is blunt and softened at a lower temperature of 120 ° C to 160 ° C. Bending and elongation are increased.

但是,壓延銅箔與電解銅箔相比,較為昂貴,尤其是,約薄至12 μ m、9 μ m之時,成本會大幅地躍升。其原因為,製成薄物時,要將厚的銅箔反複壓延多次而製造。However, the rolled copper foil is more expensive than the electrolytic copper foil, and in particular, when the thickness is as thin as 12 μm or 9 μm, the cost is greatly increased. The reason for this is that when a thin object is formed, a thick copper foil is repeatedly rolled and manufactured.

又,藉由壓延所製造之銅箔的寬度通常窄至600mm左右,有在FPC製造時之生產性不佳的缺點。Further, the width of the copper foil produced by rolling is generally as narrow as about 600 mm, which has the disadvantage of poor productivity in the production of FPC.

相對於此,電解銅箔比壓延銅箔為廉價,且通常可以製成1000mm以上的寬度,因此在FPC製造時有生產性優異的好處。然而,以習知的製造方法所製造的電解銅箔與壓延銅箔相比,即使加熱至200℃以上仍不會燒鈍、軟化,彎曲性差,因此,就FPC用之銅箔而言,只使用在有限的用途。On the other hand, the electrodeposited copper foil is cheaper than the rolled copper foil, and generally has a width of 1000 mm or more. Therefore, it is advantageous in productivity at the time of FPC production. However, the electrolytic copper foil produced by the conventional manufacturing method is not blunt and softened even if heated to 200 ° C or higher, and has poor bendability. Therefore, in the case of the copper foil for FPC, only Used in limited use.

本案申請人解決了如上的習知的電解銅箔的缺點,並開發彎曲性優異的銅箔(參照專利文獻1)。專利文獻1所示的未處理銅箔之特徵為:其粗糙面(以下記為M面)側的表面粗糙度Rz為2.1 μ m以下,且光澤面(以下記為S面)的表面粗糙度Rz為相同或更小,係使用添加了具巰基之化合物、氯化物離子及分子量10000以下的低分子膠(glue)、及高分子多糖類的電解液而電解製箔者(又,在此,未處理銅箔指如銅箔工業會規格印刷電路板用銅箔用語CFIA 0001-1999所記載,施以表面處理前的銅箔。)The applicant of the present invention solved the disadvantages of the conventional electrolytic copper foil as described above, and developed a copper foil having excellent flexibility (see Patent Document 1). The untreated copper foil shown in Patent Document 1 is characterized in that the surface roughness Rz of the rough surface (hereinafter referred to as M surface) is 2.1 μm or less, and the surface roughness of the shiny surface (hereinafter referred to as S surface). Rz is the same or smaller, and is made by electrolyzing a foil using a compound having a mercapto group, a chloride ion, a low molecular weight of 10,000 or less, and a polymer polysaccharide. (In addition, here, Untreated copper foil refers to the copper foil before the surface treatment, as described in the copper foil terminology used in the copper foil industry standard printed circuit board, CFIA 0001-1999.

該未處理電解銅箔具有與壓延銅箔為同等程度的彎曲性。This untreated electrolytic copper foil has the same degree of flexibility as the rolled copper foil.

另一方面,近年來由於電子儀器的技術革新顯著,機器之小型化一直在進展。因此,用於該等機器之FPC為了對應於機器的小型化,其多插角(pin)化、細間隔(fine pitch)化也急速地進展。並且,為了在滿足該等要求之下,同時提高可靠度,銅箔被要求有更長的彎曲壽命。On the other hand, in recent years, the technological innovation of electronic instruments has been remarkable, and the miniaturization of machines has been progressing. Therefore, in order to reduce the size of the machine, the FPC for these machines has rapidly progressed in pinning and fine pitching. Also, in order to meet these requirements while improving reliability, copper foil is required to have a longer bending life.

如上所述,FPC為在絕緣膜(聚醯亞胺、聚酯、液晶聚合物等)上,在貼附有銅箔的包銅疊層板(copper clad laminate,以下,有時簡稱CCL)上形成電路之具柔軟性的印刷電路板。As described above, the FPC is on an insulating film (polyimine, polyester, liquid crystal polymer, etc.) on a copper clad laminate (hereinafter sometimes referred to as CCL) to which a copper foil is attached. A flexible printed circuit board that forms a circuit.

使用於該等的壓延銅箔及電解銅箔,為了提高與絕緣膜的黏著力,都至少會於銅箔之與膜黏著的面上,施以將銅粒以電鍍附著的粗糙化處理。並且,於另一面則施以防銹或抑制耐熱變色之鍍鋅處理、鉻酸處理。In order to improve the adhesion to the insulating film, the rolled copper foil and the electrolytic copper foil used in the present invention are subjected to a roughening treatment in which copper particles are adhered by plating at least on the surface of the copper foil adhered to the film. Further, on the other side, galvanizing treatment or chromic acid treatment for preventing rust or suppressing heat discoloration is applied.

又,於電解銅箔的情形,通常於M面施以粗糙化處理,於S面通常不施以粗糙化處理,而施以防銹或抑制耐熱變色之鍍鋅處理、鉻酸處理。Further, in the case of electrolytic copper foil, a roughening treatment is usually applied to the M surface, and a galvanizing treatment or a chromic acid treatment for preventing rust or suppressing heat discoloration is usually applied to the S surface without roughening treatment.

製造CCL時,係藉由將膜透過黏著樹脂熱壓著於該粗糙化處理面(三層FPC)或不透過黏著樹脂而直接澆鑄或以熱壓著法將絕緣膜疊層於銅箔之粗糙化面(二層FPC),以製成CCL。When the CCL is produced, the film is directly cast by heat-pressing the film through the adhesive resin on the roughened surface (three-layer FPC) or not by the adhesive resin, or the insulating film is laminated on the rough of the copper foil by hot pressing. Face (two-layer FPC) to make CCL.

然後,於以該方式製成的CCL上以蝕刻法形成電路,在其電路側黏著絕緣膜的保護膜,製成FPC。Then, a circuit was formed by etching on the CCL fabricated in this manner, and a protective film of an insulating film was adhered to the circuit side to form an FPC.

以該方式製作的FPC被彎折而安裝,或使用在反複彎曲的處所。因此,FPC用銅箔的彎曲性必需是優異的。The FPC produced in this manner is bent and mounted, or used in a place where it is repeatedly bent. Therefore, the bendability of the copper foil for FPC must be excellent.

又,彎曲性之試驗方法係以JIS C 5016-1994所記載的耐折性試驗或耐彎曲性試驗等進行。尤其是,耐彎曲性試驗被認為接近實際上使用FPC的彎曲模式,為一般所使用的。Further, the test method for the bendability was carried out by a folding endurance test, a bending resistance test, or the like described in JIS C 5016-1994. In particular, the bending resistance test is considered to be close to the bending mode in which the FPC is actually used, and is generally used.

依照如上耐彎曲性試驗法進行FPC之彎曲試驗,則隨著彎曲次數增多,自銅箔表面會出現龜裂,並以該龜裂為起點而最後銅箔斷裂。如果仔細地觀察產生龜裂的過程,於銅箔為電解銅箔的情形,龜裂並不自M面側而來,自S面側進入的情形是壓倒性的多數。When the FPC bending test was carried out in accordance with the above-mentioned bending resistance test method, cracks occurred on the surface of the copper foil as the number of bending times increased, and the copper foil was broken at the end of the crack. When the process of cracking is observed carefully, in the case where the copper foil is an electrolytic copper foil, the crack does not come from the M surface side, and the entry from the S surface side is an overwhelming majority.

對該現象加以解析,可得知以專利文獻1之製造方法所製作的銅箔,尤其於S面的表面粗糙度大的情形進行耐彎曲性試驗時,會有容易斷裂的傾向。When the copper foil produced by the manufacturing method of the patent document 1 is analyzed, especially when the surface roughness of the S surface is large, it is easy to fracture.

電解銅箔之S面以肉眼來觀察,為具有光澤的面,但以SEM(掃瞄式電子顯微鏡,Scanning Electron Microscope)觀察則呈現凹凸條紋多的表面。The S surface of the electrolytic copper foil was observed by the naked eye and had a glossy surface. However, when observed by a SEM (Scanning Electron Microscope), the surface having many irregularities was observed.

電解銅箔係如圖1所示,由以硫酸銅為主成分的電解液3使銅以箔狀析出於旋轉中的陽極(鈦製鼓狀物)2,並藉由將該等連續地剝開而製造未處理銅箔4。該製箔後的未處理銅箔的S面由於為與鈦製鼓狀物相接的面,因此,該表面恰複印了鈦製鼓狀物2之面的狀態。As shown in Fig. 1, the electrolytic copper foil is obtained by depositing copper in a foil form into a rotating anode (titanium drum) 2 by an electrolytic solution 3 containing copper sulfate as a main component, and continuously peeling the copper by the same. The untreated copper foil 4 is opened. Since the S surface of the untreated copper foil after the foil formation is a surface that is in contact with the titanium drum, the surface is just copied to the surface of the titanium drum 2.

該鈦製鼓狀物由於定期地研磨,因此在該鼓狀物剛研磨後會比較平滑,而研磨條紋較淺,但由於使用強酸性的電解液進行電鍍,因此隨著時間經過,研磨條紋會加深。此會以原狀態複印為電解銅箔的S面的形狀。Since the titanium drum is periodically ground, the drum is relatively smooth after being ground, and the polishing stripe is shallow, but since the plating is performed using a strongly acidic electrolyte, the polishing strip will pass over time. deepen. This will be copied in the original state into the shape of the S surface of the electrolytic copper foil.

如對於具有被複印了鈦製鼓狀物之研磨條紋的S面的電解銅箔,進行耐彎曲性試驗,則可得知於S面被複印的條紋的部分成為銅箔發生龜裂的起點。When the bending resistance test was performed on the electrolytic copper foil having the S surface on which the polishing streaks of the titanium drum were printed, it was found that the portion of the stripe which was copied on the S surface became the starting point of cracking of the copper foil.

尤其是,相對於條紋以平行彎曲的情形,相對於條紋以垂直彎曲的情形,比較容易斷裂。In particular, in the case where the stripes are bent in parallel, it is relatively easy to break with respect to the case where the stripes are bent vertically.

[專利文獻1]日本專利第3313277號公報[專利文獻2]日本專利第3608840號公報[Patent Document 1] Japanese Patent No. 3,313,277 [Patent Document 2] Japanese Patent No. 3608840

本發明係以使上述習知之電解銅箔之彎曲壽命更長為目的進行研究而完成。The present invention has been completed for the purpose of making the bending life of the above-mentioned conventional electrolytic copper foil longer.

因此,本發明之目的為提供一種電解銅箔,其與絕緣膜黏著的黏著性優異,且與絕緣膜黏著後之耐彎曲性優異。Accordingly, an object of the present invention is to provide an electrodeposited copper foil which is excellent in adhesion to an insulating film and excellent in bending resistance after adhesion to an insulating film.

為了解決上述問題,本發明之銅箔為於未處理電解銅箔之光澤面施以平滑電鍍者,前述平滑電鍍係使形成粒狀的結晶組織。In order to solve the above problems, the copper foil of the present invention is subjected to smooth plating on the shiny side of the untreated electrolytic copper foil, and the smooth plating is performed to form a granular crystal structure.

上述銅箔之中,較佳為,前述未處理電解銅箔在粗糙面側的表面粗糙度Rz為2.1 μ m以下,且光澤面側之表面粗糙度Rz為相同或更小。In the copper foil, it is preferable that the surface roughness Rz of the untreated electrodeposited copper foil on the rough surface side is 2.1 μm or less, and the surface roughness Rz on the gloss surface side is the same or smaller.

上述銅箔之中,較佳為前述未處理銅箔係使用添加了具巰基的化合物、氯化物離子、及分子量10000以下的低分子量膠及高分子多糖類的電解液而電解製箔而成。Among the above-mentioned copper foils, it is preferred that the untreated copper foil is formed by electrolytically forming a foil using a compound having a mercapto group, a chloride ion, and a low molecular weight gel having a molecular weight of 10,000 or less and a polymer polysaccharide.

上述銅箔之中,較佳為在未處理電解銅箔之光澤面施加的平滑電鍍係前述結晶組織之平均結晶粒徑為2 μ m以下的銅鍍層。Among the above-mentioned copper foils, a smooth plating which is applied to the shiny side of the untreated electrolytic copper foil is preferably a copper plating layer having an average crystal grain size of 2 μm or less.

上述銅箔之中,較佳為在未處理電解銅箔之光澤面施加的平滑電鍍係碳量18ppm以下,且再結晶溫度200℃以下的銅鍍層。Among the copper foils, a copper plating layer having a smooth plating weight of 18 ppm or less and a recrystallization temperature of 200 ° C or less is preferably applied to the shiny surface of the untreated electrolytic copper foil.

又,為使用上述可撓性印刷電路板用銅箔製作的可撓性印刷電路板。Further, it is a flexible printed circuit board produced by using the above-described copper foil for a flexible printed circuit board.

本發明可提供彎曲壽命長、與絕緣膜黏著之黏著性優異且與絕緣膜黏著後之耐彎曲性優異的銅箔及其製造方法。又,本發明可提供耐彎曲性優異的FPC。The present invention can provide a copper foil which is excellent in bending life, excellent in adhesion to an insulating film, and excellent in bending resistance after adhesion to an insulating film, and a method for producing the same. Further, the present invention can provide an FPC excellent in bending resistance.

本發明之實施形態之中,未處理電解銅箔係使用添加了具巰基的化合物、氯化物離子、及分子量10000以下的低分子量膠及高分子多糖類的電解液而電解製箔而成,粗糙面側的表面粗糙度Rz為2.1 μ m以下,且光澤面側之表面粗糙度Rz為相同或更小。在此,表面粗糙度Rz為十點平均粗糙度(Rz),表示於JIS B 0601-1994。In the embodiment of the present invention, the untreated electrolytic copper foil is formed by electrolyzing a foil using a compound having a mercapto group, a chloride ion, and a low molecular weight gel having a molecular weight of 10,000 or less and a polymer polysaccharide. The surface roughness Rz of the surface side is 2.1 μm or less, and the surface roughness Rz of the glossy surface side is the same or smaller. Here, the surface roughness Rz is a ten-point average roughness (Rz) and is shown in JIS B 0601-1994.

本發明之實施形態中,於未處理電解銅箔之光澤面施以平滑電鍍之理由為,為了在將銅箔製箔時使複印於前述鼓狀物之研磨條紋補平而平滑化。藉由補平S面的條紋,相對於彎曲時,銅箔不易龜裂。In the embodiment of the present invention, the reason why the glossy surface of the untreated electrolytic copper foil is subjected to smooth plating is to smooth the polishing fringe that is copied onto the drum when the copper foil is foiled. By filling the stripe on the S surface, the copper foil is not easily cracked when it is bent.

而對未處理電解銅箔之光澤面施加的平滑電鍍係使形成粒狀的結晶組織,為平均結晶粒徑為2 μ m以下的銅鍍層。On the other hand, the smooth plating applied to the shiny surface of the untreated electrolytic copper foil forms a granular crystal structure and is a copper plating layer having an average crystal grain size of 2 μm or less.

由該電鍍形成的銅的結晶組織,依照電鍍液的組成,有時會成為柱狀的結晶組織。但是,就對於未處理電解銅箔之S面進行之電鍍而言,柱狀組織的電鍍不適合需要高耐彎曲性的情形。The crystal structure of copper formed by the plating may become a columnar crystal structure depending on the composition of the plating solution. However, in the plating of the S surface of the untreated electrolytic copper foil, the plating of the columnar structure is not suitable for the case where high bending resistance is required.

其理由為,對銅箔施加彎曲應力時,如果為柱狀的結晶組織時,會沿著柱狀的結晶粒邊界龜裂,反而容易斷裂的可能性高。The reason for this is that when a bending stress is applied to the copper foil, if it is a columnar crystal structure, the columnar crystal grain boundary is cracked, and the possibility of being easily broken is high.

又,為了補平S面,較佳為使平均結晶粒徑為2 μ m以下,如果平均結晶粒徑超過2 μ m,則補平S面的條紋的效果低,要增加於銅箔產生龜裂為止的彎曲次數變得困難。Further, in order to fill the S surface, it is preferred that the average crystal grain size is 2 μm or less, and if the average crystal grain size exceeds 2 μm, the effect of filling the S surface stripe is low, and the copper foil is increased. The number of bends until the crack becomes difficult.

又,本發明所指的平均粒徑係先以穿透式顯微鏡對形成有結晶粒的表面拍照,實際測定該照片中結晶粒的面積10點以上以後,計算該面積為正圓時的直徑所算出。Further, in the average particle diameter referred to in the present invention, the surface on which the crystal grains are formed is first photographed by a transmission microscope, and after actually measuring the area of the crystal grains in the photograph by 10 or more, the diameter of the area is calculated as a perfect circle. Calculated.

又,本發明之中,於未處理電解銅箔之光澤面(S面)施加的平滑電鍍,為碳量18ppm以下且再結晶溫度為200℃以下的銅鍍層。於該情形,就使用的電鍍液而言,例如較佳為使用專利文獻2(日本專利第3608840號公報)所記載的銅電鍍液。Further, in the present invention, the smooth plating applied to the shiny surface (S surface) of the untreated electrolytic copper foil is a copper plating layer having a carbon amount of 18 ppm or less and a recrystallization temperature of 200 ° C or lower. In this case, for example, the copper plating solution described in Patent Document 2 (Japanese Patent No. 3608840) is preferably used.

為了使碳量為18ppm以下,必需使電鍍液中所添加的有機添加劑為極微量或完全不添加。由該種銅電鍍液形成的銅鍍層,在剛電鍍後的狀態為柱狀的結晶組織。但是,由於存在於結晶粒邊界的有機添加劑成分少(有機添加劑量可藉由測定銅中之碳量來定量),因此於200℃之較低溫度會再結晶而轉變為粒狀的結晶組織。也就是說,為了於200℃以下的溫度再結晶,必需使銅箔中的碳量為18ppm以下。In order to make the amount of carbon 18 ppm or less, it is necessary to make the organic additive added to the plating solution extremely small or not added at all. The copper plating layer formed of the copper plating solution is a columnar crystal structure immediately after plating. However, since the amount of the organic additive present at the boundary of the crystal grain is small (the amount of the organic additive can be quantified by measuring the amount of carbon in the copper), it is recrystallized at a lower temperature of 200 ° C to be converted into a granular crystal structure. That is, in order to recrystallize at a temperature of 200 ° C or lower, it is necessary to make the amount of carbon in the copper foil 18 ppm or less.

以該方式形成之銅鍍層,在製造三層包銅疊層板時,藉由加熱至約150℃會再結晶,而變化為粒狀的結晶組織。The copper plating layer formed in this manner is recrystallized by heating to about 150 ° C when the three-layer copper-clad laminate is produced, and is changed into a granular crystal structure.

該等於製造二層包銅疊層板也是同樣的情形。又,製造二層包銅疊層板時,通常會用到300℃以上的溫度,因此,與三層包銅疊層板同樣,鍍銅層會再結晶而轉變為粒狀的結晶組織。This is the same situation as manufacturing a two-layer copper-clad laminate. Further, when a two-layer copper-clad laminate is produced, a temperature of 300 ° C or higher is usually used. Therefore, similarly to the three-layer copper-clad laminate, the copper plating layer is recrystallized and converted into a granular crystal structure.

以該方式,再結晶而轉變為粒狀之結晶組織的鍍銅層,即使對FPC施以彎曲應力的情形也能防止銅箔發生龜裂,能增加到達銅箔之彎曲斷裂為止的彎曲次數。In this manner, the copper plating layer which is recrystallized and converted into a granular crystal structure can prevent the copper foil from being cracked even when the bending stress is applied to the FPC, and the number of times of bending until the bending fracture of the copper foil can be increased.

又,進行該電鍍時,係以補平S面之條紋的方式挑選電鍍液之組成、溫度、電流密度條件等電鍍條件。Further, in the case of performing the plating, plating conditions such as composition of the plating solution, temperature, and current density conditions are selected so as to fill the stripes of the S surface.

平滑電鍍的厚度較佳為自0.05 μ m至與原箔(未處理電解銅箔)之厚度為相同的範圍。也就是說,當原箔厚度為9 μ m時,則施以電鍍至厚度為0.05 μ m至9 μ m即可。該等之原因為,即使進行了不滿0.05 μ m之電鍍也沒有補平S面的效果。The thickness of the smooth plating is preferably from 0.05 μm to the same range as the thickness of the original foil (untreated electrolytic copper foil). That is to say, when the original foil thickness is 9 μm, plating is applied to a thickness of 0.05 μm to 9 μm. The reason for this is that even if plating of less than 0.05 μm is performed, there is no effect of filling the S surface.

又,有時在對未處理電解銅箔的S面進行平滑電鍍時,較佳為對M面也施以平滑電鍍。又,當製造原箔使用的銅電鍍液與對S面施以平滑電鍍的銅電鍍液為相同時,不需對於M面再進行平滑電鍍。Further, when smooth plating is applied to the S surface of the untreated electrolytic copper foil, it is preferable to apply smooth plating to the M surface. Further, when the copper plating solution used for the production of the original foil is the same as the copper plating solution for smooth plating of the S surface, it is not necessary to perform smooth plating on the M surface.

但是,如果製造原箔使用的銅電鍍液與對S面施以平滑電鍍的銅電鍍液為不同時,對M面也進行平滑電鍍有時可以提高彎曲性。However, if the copper plating solution used for the production of the original foil is different from the copper plating solution for smooth plating of the S surface, the smooth plating of the M surface may improve the bendability.

以該方式對M面也施以平滑電鍍的理由為,由S面之電鍍所使用之銅電鍍液所電析之銅的特徵值(拉伸強度、伸長率等)與原箔的特徵值(拉伸強度、伸長率等)有時差距大,因此,於只對S面施以上述電鍍時,有時S面與M面會不能取得平衡而造成問題。於該情形,必需使M面與S面同時施以電鍍,取得S面與M面間的平衡。The reason why the M surface is also subjected to smooth plating in this manner is the characteristic value (tensile strength, elongation, etc.) of the copper which is electrolyzed by the copper plating solution used for the plating of the S surface, and the characteristic value of the original foil ( The tensile strength, the elongation, and the like may be large. Therefore, when the plating is applied only to the S surface, the S surface and the M surface may not be balanced, which may cause a problem. In this case, it is necessary to apply electroplating simultaneously to the M surface and the S surface to obtain a balance between the S surface and the M surface.

以下對於本發明之實施形態藉由實施例進一步詳細地說明。Hereinafter, embodiments of the present invention will be described in further detail by way of examples.

[實施例1][Example 1]

本實施例中,如圖1所示,係將配置有下列裝置:旋轉之鼓狀的陰極(鈦製)2及相對於該陰極為同心圓狀的陽極(DSA製)1之電解槽中,充填電解液3,然後於該兩極間使電流通過而製造未處理電解銅箔4。在此,所使用之銅電鍍液為下列組成1,並以箔厚為35 μ m的方式形成未處理電解銅箔4。之後,使用組成1之電鍍液,於S面形成厚0.07 μ m的銅鍍層以作為平滑電鍍。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。In the present embodiment, as shown in Fig. 1, the following devices are disposed: a rotating drum-shaped cathode (made of titanium) 2 and an electrolytic cell having a concentric shape (manufactured by DSA) 1 with respect to the cathode. The electrolytic solution 3 is filled, and then an electric current is passed between the two electrodes to produce an untreated electrolytic copper foil 4. Here, the copper plating solution used was the following composition 1, and the untreated electrolytic copper foil 4 was formed so as to have a foil thickness of 35 μm. Thereafter, a plating solution of composition 1 was used to form a copper plating layer having a thickness of 0.07 μm on the S surface as smooth plating. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

電鍍液組成1:電鍍浴:Cu 70~130g/L H2 SO4 80~140g/L 3-巰基-1-丙烷磺酸鈉 0.5~5ppm羥基乙基纖維素 1~10ppm低分子量膠(分子量3000) 1~10ppm氯化物離子 5~50ppm電流密度:10~100A/dm2 浴溫:40~60℃Electroplating solution composition 1: Electroplating bath: Cu 70~130g/LH 2 SO 4 80~140g/L 3-mercapto-1-propane sulfonate 0.5~5ppm hydroxyethyl cellulose 1~10ppm low molecular weight glue (molecular weight 3000) 1~10ppm chloride ion 5~50ppm current density: 10~100A/dm 2 bath temperature: 40~60°C

[實施例2][Embodiment 2]

於實施例1之條件中,以厚度成為34 μ m的方式製造之未處理電解銅箔4的S面上,以實施例1同樣的方式形成作為平滑電鍍的厚度1 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a copper plating layer having a thickness of 1 μm as a smooth plating was formed in the same manner as in Example 1 on the S surface of the untreated electrolytic copper foil 4 having a thickness of 34 μm. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[實施例3][Example 3]

於實施例1之條件中,以厚度成為32 μ m的方式製造之未處理電解銅箔4的S面上,以實施例1同樣的方式形成作為平滑電鍍的厚度3 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a copper plating layer having a thickness of 3 μm as a smooth plating was formed in the same manner as in Example 1 on the S surface of the untreated electrolytic copper foil 4 having a thickness of 32 μm. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[實施例4][Example 4]

於實施例1之條件中,以厚度成為17.5 μ m的方式製造之未處理電解銅箔4的S面上,以實施例1同樣的方式形成作為平滑電鍍的厚度17.5 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a copper plating layer having a thickness of 17.5 μm as a smooth plating was formed in the same manner as in Example 1 on the S surface of the untreated electrolytic copper foil 4 having a thickness of 17.5 μm. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[實施例5][Example 5]

於實施例1之條件中,以厚度成為34 μ m的方式製造之未處理電解銅箔4的S面上,使用組成2的電鍍液形成作為平滑電鍍的厚度1 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a copper plating layer having a thickness of 1 μm as a smooth plating was formed on the S surface of the untreated electrolytic copper foil 4 manufactured to have a thickness of 34 μm using the plating liquid of composition 2. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

電鍍液組成2:電鍍浴:Cu 70~130g/L H2 SO4 80~140g/L電流密度:10~100A/dm2 浴溫:40~60℃Electroplating solution composition 2: Electroplating bath: Cu 70~130g/LH 2 SO 4 80~140g/L Current density: 10~100A/dm 2 Bath temperature: 40~60°C

於以上述電鍍液組成2施以平滑銅鍍層之銅箔中,對其平滑銅鍍層的碳量加以測定,結果C=6.0ppm。In the copper foil to which the smooth plating copper plating layer was applied with the plating liquid composition 2 described above, the amount of carbon of the smooth copper plating layer was measured, and as a result, C = 6.0 ppm.

又,碳量係以堀場製作所EMIA-U511測定。Further, the amount of carbon was measured by EMIA-U511, a market maker.

該測定係藉由測定經過脫脂的銅箔於氧環境氣氛的電爐中燃燒所發生的CO2 氣體的紅外吸收,並換算為碳量。This measurement is performed by measuring the infrared absorption of the CO 2 gas generated by burning the degreased copper foil in an electric furnace in an oxygen atmosphere, and converting it into carbon.

標準試樣名:JSS200-11標準值:56.00ppm助燃劑:測定時無,校正時:Sn 0.5g燃燒條件:1250℃Standard sample name: JSS200-11 Standard value: 56.00ppm Combustion agent: None at the time of measurement, when calibrated: Sn 0.5g Burning condition: 1250 °C

[實施例6][Embodiment 6]

於實施例1之條件中,以厚度成為32 μ m的方式製造之未處理電解銅箔4的S面上,使用電鍍液組成2的電鍍液,形成厚度3 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a plating solution having a plating liquid composition 2 was used on the S surface of the untreated electrolytic copper foil 4 having a thickness of 32 μm to form a copper plating layer having a thickness of 3 μm. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[實施例7][Embodiment 7]

於實施例1之條件中,以厚度成為29 μ m的方式製造之未處理電解銅箔4的S面上,使用電鍍液組成2的電鍍液,形成厚度3 μ m的銅鍍層,同時,於M面也形成厚度3 μ m的銅鍍層。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a plating solution of a plating solution composition 2 was used on the S surface of the untreated electrolytic copper foil 4 having a thickness of 29 μm to form a copper plating layer having a thickness of 3 μm, and at the same time, The M side also forms a copper plating layer having a thickness of 3 μm. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[比較例1][Comparative Example 1]

於實施例1之條件中,製作厚度35 μ m的未處理電解銅箔4。之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, an untreated electrolytic copper foil 4 having a thickness of 35 μm was produced. Thereafter, a roughening treatment for improving the adhesion and a rustproof treatment were carried out using a surface treatment apparatus to obtain a copper foil having a thickness of 35 μm.

[比較例2][Comparative Example 2]

於實施例1之條件中,製作厚度34 μ m的銅箔,於其S面上,使用電鍍液組成3的電鍍液,形成厚度1 μ m的銅鍍層之後,使用表面處理裝置,進行用以提高緊黏性的粗糙化處理、防銹處理,得到厚度35 μ m的銅箔。Under the conditions of Example 1, a copper foil having a thickness of 34 μm was formed, and on the S surface, a plating solution of a plating liquid composition of 3 was used to form a copper plating layer having a thickness of 1 μm, and then a surface treatment apparatus was used. A roughening treatment for roughening and rust-preventing treatment is carried out to obtain a copper foil having a thickness of 35 μm.

電鍍液組成3:電鍍浴:Cu 70~130g/L H2 SO4 80~140g/L膠 1~10ppm氯化物離子 5~50ppm電流密度:10~100A/dm2 浴溫:40~60℃Electroplating solution composition 3: Electroplating bath: Cu 70~130g/LH 2 SO 4 80~140g/L glue 1~10ppm chloride ion 5~50ppm Current density: 10~100A/dm 2 Bath temperature: 40~60°C

(耐彎曲性評價試驗片之製作)將實施例1~6及比較例1~2所示的銅箔以Nikkan工業(股)公司製之尼加服雷克司CISV-2525(聚醯亞胺膜25 μ m,黏著劑厚度25 μ m),以150℃、40kg/cm2 、55分鐘的條件疊層後,製作成JIS C 5016-1994記載的線/間距(line/space)=1.5mm/1.0mm的耐彎曲性試樣。之後,將尼加服雷克司CISV-2525疊層以作為保護膜。(Production of Bending Resistance Evaluation Test Piece) The copper foils shown in Examples 1 to 6 and Comparative Examples 1 and 2 were manufactured by Nikkan Industrial Co., Ltd., and the Nikes Rex CISV-2525 (polyimine film). 25 μ m, adhesive thickness 25 μm), laminated at 150 ° C, 40 kg/cm 2 , 55 minutes, and prepared as line/space = 1.5 mm/JIS C 5016-1994 1.0 mm bending resistance specimen. Thereafter, Nikki Rex CISV-2525 was laminated as a protective film.

耐彎曲性試驗將上述耐彎曲性評價試驗片(FPC)安裝於信越工程(股)公司製的FPC高速彎曲試驗機SEK-31B2S,以曲率半徑1.5mm、移動行程(stroke)長度20.0mm、彎曲次數2000次/分鐘之條件,進行耐彎曲性的測定。於該測定之中,經時地測定電路電阻,計數至斷裂為止的次數。該試驗結果記載於表1。Bending resistance test The above-mentioned bending resistance evaluation test piece (FPC) was attached to an FPC high-speed bending tester SEK-31B2S manufactured by Shin-Etsu Engineering Co., Ltd., and had a curvature radius of 1.5 mm, a stroke length of 20.0 mm, and bending. The bending resistance was measured under the conditions of 2000 times/min. In this measurement, the circuit resistance was measured over time, and the number of times until the break was counted. The test results are shown in Table 1.

由表1所示實施例1~7的試驗結果可得知,於S面進行了粒狀結晶之平滑電鍍者與未施以平滑電鍍的比較例1相比,至斷裂為止的次數較多。As a result of the tests of Examples 1 to 7 shown in Table 1, it was found that the smooth plating of the granular crystal on the S surface was more frequent than the comparative example 1 to which the smooth plating was not applied.

又,如比較例2之於S面所施以的平滑電鍍為柱狀結晶的情形,與比較例1相比,反而斷裂的週期數較少。該等是由於電路彎曲時,自柱狀結晶的結晶粒界會發生裂痕,反而容易斷裂。Further, in the case where the smooth plating applied to the S surface of Comparative Example 2 was a columnar crystal, the number of cycles of the fracture was smaller than that of Comparative Example 1. These are caused by cracks in the crystal grain boundaries of the columnar crystals when the circuit is bent, and are easily broken.

又,於彎曲性試驗中到達斷裂的次數,對應於平滑電鍍的厚度而變多,有所改善。例如,平滑電鍍的厚度為0.03 μ m的情形,雖沒有大幅地改善,但是,如實施例1所示,為0.07 μ m的情形,有大幅地改善。Moreover, the number of times of reaching the fracture in the bendability test was increased in accordance with the thickness of the smooth plating, and was improved. For example, in the case where the thickness of the smooth plating is 0.03 μm, although it is not greatly improved, as shown in the first embodiment, the case of 0.07 μm is greatly improved.

如上,本發明之電解銅箔的耐彎曲性優異,具有與壓延銅箔為同等或更好的性能。再者,與壓延銅箔相比,較為廉價,能製造寬的箔片,因此生產性也能提升。As described above, the electrodeposited copper foil of the present invention is excellent in bending resistance and has the same performance as or better than that of the rolled copper foil. Further, compared with the rolled copper foil, it is relatively inexpensive, and a wide foil can be produced, so that productivity can be improved.

1...電解製箔裝置的陽極(DSA)1. . . Electrolytic foil device anode (DSA)

2...電解製箔裝置的陰極(鈦製鼓狀物)2. . . Cathode of electrolytic foil-making device (titanium drum)

3...電解液3. . . Electrolyte

4...未處理銅箔4. . . Untreated copper foil

圖1表示電解製箔裝置的構造說明圖。Fig. 1 is a view showing the configuration of an electrolytic foil-making apparatus.

1...電解製箔裝置的陽極(DSA)1. . . Electrolytic foil device anode (DSA)

2...電解製箔裝置的陰極(鈦製鼓狀物)2. . . Cathode of electrolytic foil-making device (titanium drum)

3...電解液3. . . Electrolyte

4...未處理銅箔4. . . Untreated copper foil

Claims (6)

一種銅箔,於未處理電解銅箔的光澤面施以平滑電鍍,其中,該平滑電鍍係碳量18ppm以下、且再結晶溫度為200℃以下所形成之銅鍍層,且該平滑電鍍為粒狀的結晶組織。A copper foil which is subjected to smooth plating on a glossy surface of an untreated electrolytic copper foil, wherein the smooth plating is a copper plating layer having a carbon content of 18 ppm or less and a recrystallization temperature of 200 ° C or less, and the smooth plating is granular Crystal structure. 如申請專利範圍第1項之銅箔,其中,該未處理電解銅箔的粗糙面側的表面粗糙度Rz為2.1μm以下,且與光澤面側的表面粗糙度Rz為相同或更小。The copper foil of the first aspect of the invention, wherein the surface roughness Rz of the rough surface side of the untreated electrolytic copper foil is 2.1 μm or less, and the surface roughness Rz on the glossy surface side is the same or smaller. 如申請專利範圍第2項之銅箔,其中,該未處理電解銅箔係藉由將添加有具巰基的化合物、氯化物離子及分子量10000以下之低分子量膠及高分子多糖類的電解液而電解製箔所形成。The copper foil according to claim 2, wherein the untreated electrolytic copper foil is obtained by adding an electrolyte having a mercapto group, a chloride ion, a low molecular weight gel having a molecular weight of 10,000 or less, and a polymer polysaccharide. Electrolytic foil is formed. 如申請專利範圍第3項之銅箔,其中,該平滑電鍍係該結晶組織的平均結晶粒徑為2μm以下的銅鍍層。The copper foil according to claim 3, wherein the smooth plating is a copper plating layer having an average crystal grain size of the crystal structure of 2 μm or less. 一種銅箔之製造方法,藉由於未處理電解銅箔的光澤面上施以平滑電鍍以製造,其中,該平滑電鍍係以成為碳量18ppm以下、且再結晶溫度為200℃以下所形成之銅鍍層的粒狀結晶組織的方式形成。A method for producing a copper foil produced by smooth plating on a glossy surface of an untreated electrolytic copper foil, wherein the smooth plating is copper formed to have a carbon content of 18 ppm or less and a recrystallization temperature of 200 ° C or lower. The granular crystal structure of the plating layer is formed. 一種可撓性印刷電路版,使用申請專利範圍第1項至第4項之中任一項的銅箔製作。A flexible printed circuit board produced by using a copper foil according to any one of claims 1 to 4.
TW095104208A 2005-02-21 2006-02-08 Copper foil and its manufacturing method, and flexible printed circuit board TWI396779B (en)

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