TWI381257B - Substrate-check equipment and checking method - Google Patents

Description

Substrate detecting device and method for automatically adjusting illumination intensity

The invention relates to a substrate detecting device for automatically adjusting the illumination intensity, in particular to a substrate detecting device which avoids time-consuming adjustment of the lens aperture by changing the strength of the lighting device, so that the substrate detecting process is simple and fast.

Since the synthetic material (substrate) is widely used, the substrate can be covered with a layer of resin or multi-layer fiber, paper and glass material by using an impregnation procedure, and can be made into a thermosetting sheet-like finished product. It is necessary to have excellent quality in the production of articles to produce high-value products.

Generally, it is necessary to detect whether the substrate is defective or not, and it is necessary to detect whether the upper and lower surfaces of the substrate are defective. Therefore, in order to improve the conventional time-consuming inspection procedure for manually turning the surface, there has been an automatic detection of the substrate. Detection device for the lower surface.

The device for automatically detecting a substrate comprises at least two transparent conveying belts for conveying a substrate, at least two groups of image capturing units, at least two sets of lighting devices respectively for supporting the image capturing unit, and a control belt. The image capturing unit and the computer control unit of the lighting device control the conveyor belt by the computer control unit to allow the conveyor belt to transport the substrate, and at the same time, the computer control unit also activates the lighting device and the image capturing unit to turn the lighting device Aligning the upper and lower surfaces of the substrate, and directing the light source to the substrate, causing the light source to produce different reflection changes on the surface of the substrate, and being captured by the image capturing unit, the result is transmitted back to the computer control unit. After analyzing and comparing, you can judge The quality of the substrate.

However, since each substrate may have a different thickness depending on the product requirements, the image capturing unit currently used is a photographic device having a linear charge coupled device (Linear CCD), and thus is in a light source. When the irradiation intensity is fixed, the light reflected from the thicker portion of the substrate is darker, which may affect the detection of the CCD, resulting in errors in the results recorded by the photographic equipment.

At present, this error can be solved by adjusting the aperture of the photographic equipment. When the substrate is thick, a large aperture is used, and when the substrate is thin, a small aperture is used. However, the movement of the aperture must be artificial. To implement, adjust, and the conditions in the computer control unit must also be changed, these changes sometimes take more than half a day, so it is very time-consuming and laborious, complicate the detection process, and cause operational inconvenience.

The present inventors have invented the substrate detection for automatically adjusting the illumination intensity after continuous thinking and research, in view of the fact that the existing detection device is time-consuming and laborious in measuring substrates of different thicknesses, and therefore cannot be quickly detected. Device.

It is an object of the present invention to provide a substrate detecting apparatus which avoids time-consuming adjustment of the lens aperture by changing the strength of the lighting apparatus, so that the substrate detecting process is simple and fast.

In order to achieve the above object, the substrate detecting device for automatically adjusting the illumination intensity of the present invention comprises: at least one conveyor belt for conveying a substrate; At least two sets of lighting devices are respectively disposed above and below the conveyor belt, and each has an adjusting unit for automatically adjusting the lighting intensity; at least two sets of image capturing devices are respectively disposed on the conveyor belt for the lighting device Up and down to capture an image of the substrate; a control device coupled to the illumination device and the image capture device to control an adjustment unit of the illumination device and receive an image obtained by the image capture device.

The invention further provides a substrate detecting method for automatically adjusting the illumination intensity, which comprises: transporting a substrate by a conveyor belt; providing a control device for connecting and controlling a lighting device and an image capturing device, and adjusting the lighting device The illumination intensity allows the image capture device to capture an image of the surface of the substrate and pass the image back to the control device.

When the substrate is thick, the adjusting unit in the lighting device is controlled by the control device to increase the lighting intensity of the lighting device. Conversely, when the substrate is thin, the adjusting unit is adjusted to weaken the lighting of the lighting device. Intensity, therefore, the present invention can avoid manual adjustment of the image capturing device by adjusting the illumination intensity of the lighting device, thereby speeding up the detection speed, simplifying and automating the detection process, thereby saving time and labor, and facilitating Industrial use.

Referring to the first and second figures, the substrate detecting device for automatically adjusting the illumination intensity of the present invention comprises: a light transmissive conveyor belt (10) for carrying and conveying the substrate. (20); at least two sets of lighting devices (30), please additionally refer to the third figure, which are respectively disposed above and below the conveyor belt (10), and each group of lighting devices (30) includes an LED lamp ( 31) and an adjustment unit (32) for connecting the light-emitting diode lamp (LED lamp, 31) and automatically adjusting the intensity of the LED lamp (31), the preferred LED lamp (31) is a DC-powered long LED lamp, The adjusting unit (32) may be disposed in the LED lamp (31) or may be separately provided; at least two sets of image capturing devices (40) corresponding to the lighting device (30) and installed in the conveying Above and below the strip (10), each group of image capturing device (40) is a camera with a linear charge coupled device (Linear CCD), which allows the camera to take the substrate in a linear scanning manner ( 20) The entire image of the surface, the camera has a fixed aperture size lens (41); a control device (50), built-in image processing program, and the conveyor belt (10), lighting equipment (30) and The image capturing device (40) is connected to respectively control the LED lamp (31) and the adjusting unit (32) of the lighting device (30) And the operation of the image capturing device (40), the control device (50) receives the linear image data captured by the camera of the image capturing device (40), performs image processing, and determines the substrate ( 20) the quality, and because the linear image captured by the camera with the CCD in the image capturing device (40) is only a small portion of the image of the substrate (20), the collected linearity Since the amount of image data is small, the processing speed of the image analyzing and determining program by the control device (50) can be speeded up, thereby improving the judging speed and improving the detecting speed of determining the quality of the substrate (20); A support frame (60), please also refer to the third figure, which is fixed on both sides of the conveyor belt (10) for fixing the image capturing device (40) and the lighting device (30) on the conveyor belt The upper and lower positions of (10) are pivotally fixed to the support frame (60) by the pivoting component (61), and the camera and the illumination device (30) of the image capturing device (40) are mounted on the support frame (60). 60) an actuator (not shown) is disposed between each pivoting member (61), and the camera or LED lamp in the image capturing device (40) is controlled by controlling the pivoting member (61) to rotate. (31) The angle with respect to the conveyor belt (10) is adjustable, and each actuator is respectively connected to the control device (50), driven by the control device (50), thereby adjusting the camera and/or the LED lamp (31). ) relative to the angle of the conveyor belt (10).

The substrate detecting method for automatically adjusting the illumination intensity of the present invention comprises: providing the substrate detecting device for automatically adjusting the illumination intensity; starting the conveyor belt (10) to transport the substrate (20); and when the substrate (20) When the thickness is increased, the illumination intensity of the LED lamp (31) of the lighting device (30) is increased, and when the thickness of the substrate (20) is decreased, the illumination intensity of the LED lamp (31) of the lighting device (30) is lowered. And the image capturing device (40) captures an image of the surface of the substrate (20) and transmits the image back to the control device (50).

When the substrate detecting device for automatically adjusting the illumination intensity of the present invention is used, the conveyor belt (10) is activated by the control device (50) to transport the substrate (20), and the LED lamps in the lighting device (30) are also activated ( 31) and a camera of the image capturing device (40) for irradiating light onto the substrate (20), and causing the camera to capture a linear image of the surface of the substrate (20), and returning the linear image data It is transmitted to the control device (50) for image analysis and judgment.

When the thickness of the substrate (20) to be inspected is different, the control device (50) can adjust the brightness of the LED lamp (31) by controlling the adjusting unit (32) in the lighting device (30). When the substrate (20) is thick, the illumination intensity of the LED lamp (31) is improved, and when the substrate (20) is thin, the illumination intensity of the LED lamp (31) is weakened, so that each can be avoided. By manually adjusting the aperture of the camera without having to reset the control device (50), the present invention can speed up and automate the inspection process of the substrate (20).

(10)‧‧‧Conveyor belt

(20)‧‧‧Substrate

(30) ‧‧‧Lighting equipment

(31)‧‧‧LED lamps

(32) ‧‧‧Adjustment unit

(40) ‧‧‧Image capture device

(41)‧‧‧ lens

(50)‧‧‧Control devices

(60)‧‧‧Support frame

(61) ‧‧‧ pivotal components

The first figure is a side view of the invention.

The second drawing is a schematic perspective view of the present invention.

The third figure is a schematic diagram of the system of the present invention.

(10)‧‧‧Conveyor belt

(30) ‧‧‧Lighting equipment

(31)‧‧‧LED lamps

(32) ‧‧‧Adjustment unit

(40) ‧‧‧Image capture device

(50)‧‧‧Control devices

Claims (9)

A substrate detecting device for automatically adjusting illumination intensity, comprising: at least one conveyor belt for conveying a substrate; at least two groups of lighting devices respectively disposed above and below the conveyor belt, and each having a An adjusting unit for automatically adjusting the illumination intensity and an LED lamp, wherein the adjusting unit is connected to the LED lamp; at least two sets of image capturing devices are respectively disposed on the upper and lower sides of the conveyor belt for the lighting device Taking an image of the substrate; a control device connected to the illumination device and the image capture device to control the adjustment unit of the illumination device, and adjusting the brightness of the LED lamp by adjusting the unit, when the substrate is thick When the brightness of the LED lamp is increased, when the substrate is thin, the illumination intensity of the LED lamp is weakened, and the image obtained by the image capturing device is received. The substrate detecting device for automatically adjusting the illumination intensity as described in claim 1, wherein the conveyor belt is permeable to light. The substrate detecting device for automatically adjusting the illumination intensity as described in claim 2, wherein the LED lamp is a DC-powered long LED lamp. The substrate detecting device for automatically adjusting the illumination intensity according to any one of claims 1 to 3, wherein each group of image capturing devices is a camera having a linear charge coupling element, and the camera has a fixed Aperture-sized lens. Automatic as described in any one of claims 1 to 3 A substrate detecting device for adjusting the intensity of illumination further has a support frame fixed to both sides of the conveyor belt for fixing the image capturing device and the lighting device at upper and lower positions of the conveyor belt. The substrate detecting device for automatically adjusting the illumination intensity according to claim 5, wherein the support frame has a plurality of pivoting members for pivotally fixing the image capturing device and the lighting device to the support frame, and An actuator connected to the control device is disposed between the support frame and each of the pivoting members to adjust the angle of the image capturing device and the illumination device relative to the conveyor belt. The substrate detecting device for automatically adjusting the illumination intensity as described in claim 4, further comprising a support frame fixed on both sides of the conveyor belt for fixing the camera and the illumination device to the conveyor belt Upper and lower positions. The substrate detecting device for automatically adjusting the illumination intensity as described in claim 7, wherein the support frame has a plurality of pivoting members for pivotally fixing the camera and the illumination device to the support frame, and the support is An actuator connected to the control device is disposed between the frame and each of the pivoting members to adjust the angle of the camera and the illumination device relative to the conveyor belt. A substrate detecting method for automatically adjusting illumination intensity, comprising: transporting a substrate by a conveyor belt; providing a control device for connecting and controlling a lighting device and an image capturing device, and adjusting the illumination intensity of the lighting device, Having the image capture device capture an image of the surface of the substrate and return the image to the control device. Wherein the lighting device comprises an LED lamp, and when the thickness of the substrate is increased, the illumination intensity of the LED lamp of the lighting device is increased, and when the thickness of the substrate is lowered, the illumination intensity of the LED lamp of the lighting device is reduced.