1281540 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種輸送基材之檢測系統及大 、 乃决，尤其 是一種利用一主機來同時完成複數輸送裝置上 八 心不同基材 的品管檢測，以減少人員配置及提升基材缺陷檢測的準確 性者。 【先前技術】 科技的進步促使對產品品質的要求日益提高，不論是 織品、布料或電路板等各式基材，在成品完成銷售前Y2 定要經過檢測的步驟，即用來檢驗該些產品是否有凹陷、 破損、異物或顏色不均勻等缺陷，藉由檢驗的步驟，將不 良產品加以排除，以提升產品的品質。 在檢測的步驟中，主要將所欲檢測的基材置放在輸送 帶上，經啟動該輸送帶後，基材會由輸送帶的一端傳送至 其另一端，即由送料端傳送至收料端，藉由基材在輸送帶 上傳送的過程中，來加以檢測該基材表面是否有缺陷的存 在。 現今用來檢測的方法主要有兩種：第一種為一檢測者 利用人眼觀察一輸送帶的方式，即檢測者逐一觀測通過該 檢測者身旁輸送帶上的基材是否有缺陷，當檢測完基材之 一面後，會將原基材轉換成另一面，再以相同步驟及方法 檢測一次，但因此種方法所需耗費人力十分龐大，且會受 檢測者生理狀態的影響，使檢測結果容易產生誤差。 3 1281540 第二種檢測方法如第四阁如- 弟四圖所不，乃藉由基材（4〇) 通過一設置在輸送帶（4 ]) 、a i )之影像擷取裝置（4 2 )， 其中該影像擷取裝置（4 P )在/#认 、4 Z )係在该輸送帶（4 1 )的上 方及下方各設有一攝影機（4 2 / 及一燈管（422)， 經由該些攝影機（4 2 1 )將其鉍旦^多难 ^將基材影像傳送至主機（4 3 ) 的顯示裝置上，利用人眼觀容 規务的方式，來判斷該基材（4 表面及下表面是否有缺陷產±，此種同時檢測基 材上：下表面的方式來減少檢測時所需時間，但所需耗費 硬體資源成本較大，且同# ^ 、 U樣叉限於檢測者人數眾多及易受 檢測者生理狀態的影響而無法做有效的檢測。 上述該些利用人眼判斷 妁松測方式，除了容易受檢測 者生理狀態的人為因辛影塑 ^ ^ ^ 、、， 、口言〜妻，而造成判斷錯誤外，每一輸 运▼皆須有一檢測者來加 十分龐大的花費。 對成本而言，亦是-項 【發明内容】 為此，本發明的主要 ^ ^ 要目的係棱供一種輸送基材之檢測 同其私A —用主機來同時完成複數輸送裝置上之不 同基材的品管檢測， 姑旦 、 、 9 機所取得輸送裝置上不同基 材衫像’並與肩妒+百』凡 物詈…良好基材影像作比對，自動判斷 祝^展置上基材的品 陷檢測的準確性。 ^人貝的配置及提升基材缺 欲達到前述目的由田a i 統包含有： 0所使用的主要技術手段係令該檢測系 4 1281540 =夕衫像控制裝置，各影像控制裝 ，像，處’用以擷取基材的上/下表面 象〃中各衫像控制裝置係包含有·· :上影像掏取裝置，係設置於該輪送裝置的上方，宜 操取輸送裝置上方基材的上表面攝广攝影機係用以 以=景Γ象，取裝置，係設置於該輸送裝置的下方，其 擷取於逆梦番,1攝影機以 掘取輪达裝置上方基材的下表面；以及 連接與各影像控制裝置的上/下影像擷取裝置 / 中的控制器來控制發光源及攝影機，並接 收攝影機輸出影像作辨至 、’接 優劣。 7紅5虎，再依照取得的影像信號判斷基材 上=機透過影像控制裝置對輸送裝置輸 並輸出包含有原始預設之良好 ： 予影像控制裝置，經由啟動影像控制褒置，來^曰參數 影像擷取裝置所得到之基材影像，:上/下 ^㈣”設之良好基材影像進行 像與原始預設之良好影像比對 *取付的衫 俨骑廿作L认 座生决差，則發出檠示 “虎並分止輸送裝置㈣及將比對資料 》 更換有缺陷之基材。 主祛，以便 由上述可知，當本發明庫 利m 月應用在複數輸送裝置時 利用一主機配合複數影像控制 τ 置上的不同美…/置末取得其對應之輸送裝 材心像’⑼影像分析判斷各種基材的優 5 1281540 劣’是以’本發明僅由一主機即可監控複數輸送裝置上基 材的檢測，藉由此種品管檢測方式來減少人員的配置及提 升基材缺陷檢測的準確度。 【實施方式】 本發明係提供一種輸送基材之檢測系統及方法，利用 一主機即可同時監控複數輸送裝置上之不同基材的檢測， 經由主機監控的方式’藉由基材影像比對的方&，來達到 降低成本及提升基材檢測的準確性。 、、請參閱第-圖、第二圖及第三圖所示，係為本發明之 輸送基材之檢測系統及方法的示意圖，該系統係包含有： 至少一影像控制裝置（13)，各影像控制裝置㈠ 3 )係設置於對應用以輸送基材的輸送裝£ (丄 用以細取基材的上/τ表面影像，其中各影像控制裳置（1 3 )係包含有·· 上影像擷取裝£ ( 1 1 )，係言史置於該輸送裳置（工 〇)的上方’其包含有-控制器（S 1 )、一發光" 1)及-攝影機（Ci)，該攝影機（c工 ： 贿置（1(Π上方基材的上表面；及、擷取 〇)的象：取裝置（1 2)，係設置於該輸送裝置（1</ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> </ RTI> <RTIgt; Tube inspection to reduce staffing and improve the accuracy of substrate defect detection. [Prior Art] Advances in technology have led to an increasing demand for product quality. Whether it is a variety of substrates such as fabrics, fabrics or circuit boards, Y2 must be tested before the finished product is sold, that is, to test the products. Whether there are defects such as dents, breakage, foreign matter or uneven color, the defective products are excluded by the inspection steps to improve the quality of the products. In the detecting step, the substrate to be tested is mainly placed on the conveyor belt, and after the conveyor belt is started, the substrate is conveyed from one end of the conveyor belt to the other end, that is, from the feeding end to the receiving end. At the end, the surface of the substrate is detected to be defective by the substrate during transport on the conveyor belt. There are two main methods used for detection today: the first one is a way for a detector to observe a conveyor belt by the human eye, that is, the detector observes one by one whether the substrate on the conveyor belt beside the detector is defective. After detecting one side of the substrate, the original substrate is converted into the other side, and then detected in the same step and method. However, the method requires a lot of manpower and is affected by the physiological state of the tester, so that the detection is performed. The result is prone to errors. 3 1281540 The second detection method, such as the fourth cabinet, as shown in Figure 4, is through a substrate (4〇) through an image capture device (4 2 ) disposed on the conveyor belt (4 ]), ai) The image capturing device (4P) is provided with a camera (4 2 / and a light tube (422) above and below the conveyor belt (4 1 ), via the image capturing device (4 P ) Some cameras (4 2 1) will transfer the substrate image to the display device of the host (4 3 ), and use the human eye to look at the prescription to judge the substrate (4 surface and Whether the lower surface is defective or not, this method of detecting the lower surface of the substrate at the same time reduces the time required for the detection, but the cost of the hardware resource is large, and the same as the #^, U-shaped fork is limited to the detector. The number of people is large and vulnerable to the physiological state of the tester and cannot be effectively tested. The above-mentioned methods of judging the sputum looseness by the human eye, in addition to the human body that is susceptible to the physiological state of the tester, are ^^^, ,, Speaking to wife, and causing judgment errors, each transport must have a detector to add a very large In terms of cost, it is also - item [Summary of the Invention] For this reason, the main object of the present invention is to provide a detection of a transport substrate with its own private A - using a host to simultaneously complete a plurality of transport devices Quality inspection of different substrates, different substrate shirts on the conveyors obtained by Gudan, 9 machine, and 'shoulders + hundred' of everything... good substrate image comparison, automatic judgment Accuracy of the detection of the defect on the upper substrate. ^The configuration of the shell and the lack of substrate to achieve the above objectives are covered by the Tian Ai system: 0 The main technical means used to make the detection system 4 1281540 = eve image control The device, the image control device, the image, the 'upper/lower surface image for picking up the substrate, each of the shirt image control devices includes: · the upper image capturing device is disposed on the wheeling device Above, it is advisable to operate the upper surface of the substrate above the conveying device. The camera is used to take the device, and the device is placed under the conveying device, which is taken in the reverse dream, 1 camera to dig The lower surface of the substrate above the wheeled device; And the controller of the upper/lower image capturing device of each image control device controls the light source and the camera, and receives the output image of the camera to distinguish it, and the sound is good. 7 Red 5 tiger, and then judge according to the obtained image signal On the substrate, the machine transmits and outputs the transmission device through the image control device, including the original preset: the image control device controls the image of the substrate obtained by the parameter image capturing device through the image control device. :Upper/down^(4)" is set to a good substrate image for comparison with the original image of the original preset. * The payable 俨 俨 廿 廿 认 认 认 认 认 认 认 认 认 认 认 认 虎 虎 虎 虎 虎 虎(4) and the comparison data will be replaced with defective substrates. Mainly, so that it can be seen from the above that when the present invention is applied to a plurality of conveying devices, a host is used to match the different image control τ on the different beauty ... / to obtain the corresponding conveying material heart image '(9) image analysis Judging the superiority of various substrates 5 1281540 is inferior to the detection of the substrate on the plurality of conveying devices by only one host, and the quality inspection method is adopted to reduce the configuration of the personnel and improve the defect detection of the substrate. Accuracy. [Embodiment] The present invention provides a detection system and method for transporting a substrate, which can simultaneously monitor the detection of different substrates on a plurality of transport devices by means of a host, and monitor the manner of the substrate by means of a host image. Fang & to reduce costs and improve the accuracy of substrate testing. Please refer to the first, second and third figures, which are schematic diagrams of a detection system and method for a transport substrate of the present invention, the system comprising: at least one image control device (13), each The image control device (1) 3) is disposed on the transporting device for transporting the substrate (for extracting the upper/tau surface image of the substrate, wherein each image control device (1 3) is included in the image. The image capture is loaded with £1 (1 1 ), and the history is placed above the transporter (worker), which contains the controller (S 1 ), a glow " 1) and the camera (Ci). The camera (c work: bribe (1 (the upper surface of the upper substrate; and, picking up the 〇) image: take device (12), is set in the transport device (1
1 )及-攝二：包含有一控制器（S 1 )、-發光源（L 輸送裳置Γ幾/C1)，該攝影機（C1)係用以擷取 (1 0)上方基材的下表面；以及 的上 一主機（1 4 )，係與各影像控制裝置（丄3 ) 6 1281540 /下影像擷取裝置（11，12)、 制器（s 1 )來控制發光源（⑸二以透過其中的控 並接收攝影機（C1)輸出影像信1及=影機（CD， 信號判斷基材優劣。 化 依肤取侍的影像 猎由該影像控制裝置（1 2 )來判斷 裝置（n，12)所接收之基材像掏取 輸入之原始預設之良好基材影像二、主機（1 4)所 同，則表示該基材無缺陷，反之，若 子-果相 產生’則該影像控制裝置（13)除’有差異 停止輸送裝置（1 0)運轉外 “ θ生警示信號並 主機（1 4 1 Ρ夺έ將異常資料傳送至 4 )，以協助檢測者判斷缺陷情況。 其中該輸送基材之檢測方法係建構於該主機〇 至^ 一影像控制裝置（丄2 )上，i 一 請參閱如第二圖所示，係為…方法如下所述： 2)之方法係包含有 為4内建於影像控制裝置（！ 啟動影像控制裝置（2〇); 執订系統自我檢測（21 〇 )，係用 置是否正常（211)，若不正斷影像控制裝 生警示作，Γ 、 吊，則该影像控制裝置會產 σ k 21 2 )並傳送檢測資料結 影像控制裝置之運作（213); 主枝及分止该 判斷是否啟動輸送裝置（22〇)， 號（221 )再斜兮#味^ 、 ’、▲由接收主機信 ^ ( 222 ) ^ 丁止孩衫像控制裝置之運作 影像控制裝置Γ 224 ) ，“ ^ )並關閉该 ，若该主機傳送啟動信號， 7 1281540 則經由该影像控制裝置來啟動該輸送裝置。 輸入參數及啟動輸送裝置（ 230 )，係由主機傳送啟 動輸送裝置之信號後1以輸人該主機所設定之基材參 數’其中该參數主要包含有基材種類及基材影像資訊等； 掃描基材影像（240 )，係在輸入參數及啟動輸送裝 置v驟（230 )後’經由上/下影像擷取裝置來取得基材1) and - 2: Contains a controller (S 1 ), a light source (L transporter / C1), the camera (C1) is used to draw (1 0) the lower surface of the upper substrate And the previous host (1 4 ), and each image control device (丄3) 6 1281540 / lower image capturing device (11, 12), controller (s 1) to control the light source ((5) two to penetrate The control and receiving camera (C1) outputs the image letter 1 and the = camera (CD, the signal judges the quality of the substrate. The image hunting device of the skin care device is judged by the image control device (1 2 ) (n, 12) The received substrate is the same as the original preset good substrate image of the input. 2. The same as the host (1 4), the substrate is free of defects, and if the sub-fruit phase is generated, the image control device (13) In addition to 'there is a difference in stopping the transport device (10) operation, the θsheng warning signal is transmitted to the host (1 4 1 to transfer the abnormal data to 4) to assist the tester in judging the defect. The detection method of the material is constructed on the host to the image control device (丄2), i. Please refer to the second figure. The method is as follows: 2) The method includes 4 built in image control device (! Start image control device (2〇); binding system self-test (21 〇), whether it is used Normal (211), if the image control device is not properly blocked, Γ, 吊, the image control device will produce σ k 21 2 ) and transmit the operation of the detection data image control device (213); Whether to start the conveying device (22〇), the number (221) and then the slanting #味^, ', ▲ by the receiving host letter ^ ( 222 ) ^ Ding stop child image control device operation image control device 224 224 ) " ^ ) and close it, if the host transmits a start signal, 7 1281540 activates the transport device via the image control device. The input parameter and the starting conveyor (230) are transmitted by the host computer to activate the signal of the conveyor device. 1 is to input the substrate parameter set by the host computer. The parameter mainly includes the substrate type and the substrate image information; The substrate image (240) is obtained by the upper/lower image capturing device after inputting parameters and starting the transport device v (230).
知像刀析及比對（25〇 )，係由影像控制裝置來將上 /下影像擷取裝置所取得之影像加以分析（251)，並與 原始預設之良好基材影像資料進行比對（252 );以及” 產生警示（ 260 )，若取得影像與原始預設之良好基 材影像比對結果產生誤差’則發出警示信號並停止輸送裝 置運轉及將比對資料結果傳送至主機（261 )，反之，則 繼續執行掃描基材影像步驟（24〇)。 再請苓閱第三圖所示，係為該内建於主機（丨3 )之方 法係包含有： 啟動主機（30 ); 執行系統自我檢測（310)，係在啟動主機（3〇)之 後發生’用以判斷主機是否正常（311)，若不正常，則 產生警示信號（312 )’用以告知檢測者’反之，則讀取 涊二由數個影像控制装置所構成之影像控制Image analysis and comparison (25〇) is performed by the image control device to analyze the image obtained by the upper/lower image capturing device (251) and compare it with the original preset good substrate image data. (252); and "generating an alert (260), if an error occurs in the comparison of the image with the original preset good substrate image", a warning signal is issued and the operation of the transport device is stopped and the result of the comparison data is transmitted to the host (261 ), on the contrary, continue to perform the scanning substrate image step (24〇). Please refer to the third figure, the method built into the host (丨3) includes: starting the host (30); Execution system self-test (310) occurs after the host (3〇) is started to determine whether the host is normal (311). If not, a warning signal (312) is generated to inform the detector that the other side is opposite. Reading image control composed of several image control devices
斷該些信號是否正常（313)，藉此—牛J ^ ^ ； 稚此步驟來掌控該些影 像控制裝置的狀態，若該些週邊影像控制裝置信號不正 常，則加以判斷是否可忽略（31 4 )，因若有未啟動之影 1281540 像控制裝置，gp尤 在讀取資㈣過程影像控制裝置，則主機 號，則會有判斷錯誤之信號;生，：:”，制 忽略，即該些週邊影像裝置所回”：=信號可以 控制裝置所回覆’則可繼續進行下—；；為：使用之影像 欲使用之f彡像控㈣置所 《’若為所 信號（315) 。 ，·日决成心，則會產生警示 設定參數（330 )，係在Φ嬙认么 正常後發生，可針斜牲 的系統自我檢測（310) 苴夫數 對特疋影像控制裳置及特定基材來設定 兵參數，以設定適杏糞 个又火 置，苴中談夂激士田土多至該對應之影像控制裝 測之絲Π |包含㈣像控制裝置之編號及所欲檢 測之基材原始影像資料等； 輸出資料至影像控告丨#署广w π、 y 之後發生，將在主= = ’:在設定參數(3⑷ 像控制裝置；以及疋之參數傳送至該相對應之影 ，斷是否有異常訊號產生（35〇)，係在輸出資料至 =控制裝置步驟⑽）之後發生，為影像控制裝置傳 =主機之信號’藉由判斷影像控制裝置在其影像分析及 =的步驟（ 250 )中是否有異常信號產生，若有，則啟 吕不並顯不該異常影像控制裝置編號（36〇 )，反之’ 則繼：執行此-步驟，直到關閉主機為止（ 370 )。 —▲其中，可在執行系統自我檢測步驟之後（31 0 )及設 =^數（ 330 )步驟之前增設一紀錄使用者步驟（32〇)， 即可精由輸入密碼（321 )並判斷該密碼是否正確（322 ) 1281540 之步驟，來紀錄此一檢測系統之使用者資料。 由上述說明可知，本發明確實可以有效的檢測出基材 的缺陷，排除人為„的料，相提升基材檢測之準確 度並減少人員的配置。 【圖式簡單說明】 ^ -圖··係本發明輸送基材之檢測系統示意圖。 第一圖·係本發明輸送基材之檢測方法中，係内建在 影像控制裝置部分的方法流程圖。 弟二圖··係本發明輸送基材之檢測方法中，係内建在 主機之控制程式流程圖。 弟四圖：孫羽A m ’、α用以‘檢測輸送帶基材之裝置配置示意 圖0 一 (4 (4 (4 【主要元件符號說明】 (1 〇)輸送裝置 (12 )下影像擷取裝置 (14)主機 輸送帶 )攝影機 主機 (1 1 )上影像梅取裝置 (1 3 )影像控制裝置 (4 0 )基材 (4 2 )影像擷取裝置 (4 2 2 )燈管 10Whether the signals are normal (313) is broken, thereby taking care of the state of the image control devices, and if the signals of the peripheral image control devices are abnormal, it is judged whether it is negligible (31). 4), because if there is an unstarted shadow 1281540 like a control device, gp is especially reading the (4) process image control device, then the host number, there will be a signal to judge the error; raw, :::, system ignore, that is Some peripheral imaging devices return ": = signal can be controlled by the device to reply" can continue to proceed;;; is: the image to be used to use the image control (four) set "" if the signal (315). If the day is determined, the warning setting parameter (330) will be generated, which will occur after the Φ 嫱 么 normal, and the system can be self-detected (310). The number of cops is controlled by the special image control and specific The basement is used to set the parameters of the arsenal to set the suitable apricot and the fire, and the 田 夂 夂 夂 田 田 多 多 多 多 多 多 Π Π Π Π Π Π Π Π Π Π Π Π Π Π 包含 包含 包含 包含 包含 包含 包含 包含 包含 包含 包含 包含 包含The raw image data, etc.; output data to the image control 丨 #署广w π, y occurs after the main = = ': in the setting parameters (3 (4) image control device; and 疋 parameters are transmitted to the corresponding shadow, Whether or not there is an abnormal signal generation (35〇) occurs after the output data to the control device step (10)), and the image control device transmits the signal to the host unit by determining the image control device in its image analysis and = step ( 250) Whether there is an abnormal signal generated, if any, then the display does not indicate the abnormal image control device number (36〇), otherwise the following: execute this step until the host is turned off (370). —▲ Among them, a record user step (32〇) can be added before the system self-test step (31 0) and the set-up number (330) step, and the password can be entered (321) and the password can be judged. Is it correct (322) 1281540 to record the user data of this detection system. As can be seen from the above description, the present invention can effectively detect the defects of the substrate, eliminate the artificial materials, improve the accuracy of the substrate detection and reduce the configuration of the personnel. [Simplified illustration] ^ -图·· The schematic diagram of the detection system of the transport substrate of the present invention. The first diagram is a method for detecting the transport substrate of the present invention, which is a method flow diagram built in the image control device part. In the detection method, the flow chart of the control program built in the host is shown in the figure: Si Si: Sun Yu A m ', α is used to 'detect the conveyor belt substrate configuration diagram 0 (4 (4 (4 [main component symbol Description] (1 〇) conveying device (12) lower image capturing device (14) main conveyor belt) camera main unit (1 1) upper image capturing device (1 3 ) image control device (40) substrate (4 2 Image capture device (4 2 2 ) lamp 10