M285884 八、新型說明： 【新型所屬之技術領域] 本創作係關於一種可快速判斷基材優劣的檢測裝置， 尤指一種藉由線性攝影機所取得之基材表面影像，來判斷 基材表面是否有缺陷的存在，以達到提升基材檢測速度及 準確性。 • 【先前技術】 科技的發達促使產業的發展迅速，為了提高產能及產 口口 負，不僅疋加快了生產線的生產速度，在產品品質的 維痩亦十分的重要，故在產品製作的過程中，該些產品的 基材均會經過檢測的步驟，用以判斷該些基材是否有所缺 陷，例如：凹陷、破損、擦傷、異物吸附及顏色分布不均 等問題，再將檢測後不良基材之受損部位加以改善或清 除，以利基材進行染色、浸泡及鑽孔等作業，藉此一撿測 饞 基材的步驟來提升產品品質。 判斷基材優劣需要藉由分別檢測基材的上、下表面是 否有所缺陷，故為改良人工線上翻面費時的檢測程序，目 月j已有一種自動檢測基材之上、下表面的檢測裝置，如第 I圖所示’主要是將所需檢測之基材（50)，經由通過 —設置在可透光輸送帶（5 1 )上之影像擷取裝置（5 2 )， 其中該影像擷取裝置（5 2 )係在該輸送帶（5丄）的上 方及下方分別各設有一攝影機（5 2 1 )及一燈管（5 2 2 )，經由該些燈管（5 2 2 )對所需檢測的基材（5 〇 3 M285884 進行曝光，再藉由攝影機（521)來取得該基材（ 的表面面㈣像’並將該影像傳送至主機（5 3 分析運算並判斷該A 中加以 斷該基材（5 0):=所缺陷，利用此種方式來判 • 上表面及下表面是否有缺陷產生。 上述該方式雖可減少人工檢測時間，㈣影像 置中之攝影機係採用面掃描（一an) : 擷取，隨著產品尺寸的加大、生錢速度的提高、產丁 = 的要求下，面掃描攝影機的解析度及影像取樣 、又、法滿足上述該些要求，因而該檢測基材之掌置 有需要加以改善。 I ^ 【新型内容】 、為此’本創作的主要目的係提供—種可快速判斷 優另的檢測裝置，經由線性（Line_sean)攝影機來對 影像作小面積的線性掃描，以提高後端電腦系統的處理速 度，使其能加速判斷基材的優劣，進而提高基材的產能。 欲達到前述目的戶斤^ 所使用的主要技術手段係令該檢測裝 置主要設置於一用以輸送並承載基材之可透光輸送帶的 上、下方，其檢測裝置包含有·· 一上影㈣取裝置’係包含有—發光源及—線性攝影 機’《先源與該線性攝影機係裝設於該輸送帶輸送帶之 上方’其中該發光源係照射該輸送帶上方基材的上表面， 令線性攝影機以線性掃描方式拍攝該基材上表面的全部影 像； 4 M285884 厂影像揭取裝置’係包含有一發光源及一線性攝影 ”亥I*源及該線性攝影機係裝言曼於該可透光輸送帶之 下方’其中該發光源係照射輸送帶上方基材的下表面，入 錢性攝影機以線性掃描的方式拍攝該基材 ㈣ 影像；以及 幻全4 U裝置’係内建有影像處理程式，並與上/下聲 像榻取裳置相遠接， ·、’ 接 刀別控制上/下影像擷取裝置的動 作，又該控制裝置#桩 m 置係接收上/下影像擷取裝置中線性攝影 栈所輸出的線性影像資料，來進行基材優劣的判斷。 本創作係利用控制裝置來控制上/下影取 動作，即藉由卜/ nr w A 1 ϋ白勺 衫像擷取裝置中之線性攝影機進行掃 為拍攝，取得基材表面 你 本 、、表生衫像，進行分析判斷該基封 表面疋否有缺陷存在，由 材 由於该些線性攝影機所擷取之影像 面積較小，故該控制裝置呈 丁衫像^刀析判斷的處理資料量 和對較小，因而加快i拿 里 測速度。 4斷迷度，提升判斷基材優劣的檢 戶 人要目的在於提高基材檢測中影像的清晰 準確率不·，若光源產生光:用的影響，而使得判斷 有閃燦現象），則合造成:=( 電源發光源易 杈糊，進而造成判斷錯誤， 〜像 ^ u + 、為減少該線性攝影機擷取到# ^像，上述發光源可採用以直流供電之長型 &供線性攝影機一個移定 ’、 %疋的指向性照明光源。 本創作之另一次要目的為提高基材檢測的準確性’即 5 M285884 本創作的上/下影像擷取裝置可透過一固定‘於可透光輸送 • τ兩側的支撐架，固定在可透光輸送帶的上/下方位置， 其中各影像擷取裝置的線性攝影機及發光源係配合樞接元 件口疋在支撐架上，再於各樞接元件位置設置一致動器， 、經由控制該樞接元件轉動，進而使得線性攝影機或發光源 相對於輸运帶的角度為可調。又，各致動器分別與控制裝 置連接，文忒控制裝置驅動，進而可調整^ ^ ^ φ光_於_的角度。因不同的基材料== 之吸收及反射程度不同，使得上/下影像擷取裝置中之線 性攝影機所接收之入光量也有所不同，為使該些線性攝影 機不受不同基材的影響而吸收到相同的入光量，因而藉由 該控制裝置來調控上/下影像擷取裝置中之線性攝影機的 取樣角度及發光源的照射角度，使得發光源可以提供一特 定之指向性光線，讓線性攝影機不受基材種類的影響，皆 可接收到一定的入光量，以利於快速評斷分析基材是否有 _ 所缺陷並增加此一檢測裝置的準確性。 【實施方式】 睛爹考第一圖及第二圖所示，係為本創作可快速判斷 基材優劣的檢測裝置之側視及立體示意圖，該裳置主要設 置在一可透光輸送帶（1 〇)上，該可透光輪送帶（丄〇 ) 用來輸送並承載基材（1 1 )，故該檢測裝置包人有· 一上影像擷取裝置（2 1 )’係包含有一發光源（2 1 0 )及一線性攝影機（2 1 1 )，該發光源1 2丄〇 ) 6 M285884 與該線性攝影機（21 1)係裝設於該可透光輸送帶（] 〇)之上方，其中該發光源（2工〇)係照射該輸送帶（] 〇 :>上方基材（i」）的上表面，令線性攝影機（2 u 以線性掃摇方式拍攝該基材（11)上表面的全部影像. -下影像擷取裝置（22)，係包含有一發光源（2 2 0 )及—線性攝影機（2 2 1 )，該發u ( 2 2 及該線性攝㈣（2 2 1 )係裝設於該可透光輸送帶（丄 〇)之下方，丨中該發光源（220)係照射輪送帶 0) 上方基材（11)的下. J的下表面，令該線性攝影機（2 1) 以線性掃描的方式拍攝該基 、丄丄J卜衣面的全部 衫像， -控制裝置（30)，係内建有影像處理程式，並盘 上’下影像擷取裝i ( 2 1 ’ 2 2 )相連接，以分別控制 上/下影像#1取裝1 ( 2 1，2 2 )的動作，該控制 (3 0 )係接收上/下影像掏取裝置（2 χ，2 、 性攝影機（2 1 1，2 ? ? 1、& μ , 綠 2 2 1 )所輸出的線性影像資 來進行基材（1 1 )優劣的判斷；以及 -支撐架（20)，係固定於可透光輸送帶（ 兩側，用以將上/下影像擷取裝置（2丄，以 可透光輸送帶（10)的上/下古办罢—丄 疋在 幻上/下方位置，藉由樞接元件 〇 1 )將上/下影像擷取裝置（ 機（2n，22l)及發光』，） 攝影 ;及毛先源（2 1 〇 ，2 2 0 )枢拯 固定在支撐架（20)上。 ^ 其中可在支撐架（2〇)與各樞接元件位置（2 7 M285884 設置有一致動器（圖中去+γ丄 未不），經由控制該樞接元件（2 〇1)轉動，進而使得上/下％徨 τ工/下衫像擷取裝置（2丄，2 2) 中之線性攝影機（2 1 1，ρ ρ Ί 丄2 2 1 )或發光源（2 1 〇 ， 220)相對於輸送帶（1 〇)的自 、丄υ」的角度為可調，且各致動 器分別與控制裝置（30)連接，受該控制…3〇) 驅動’進而調整線性攝影機（2 2 2，2 2丄）或發光源 (2 1 0 ’ 2 2 0 )相對於輸送帶（工〇 )的角度。 上述上/下影像擷取裝置（2丄， (2…”㈧可採用以直流供電的長型二源 提供線性攝影機（2 1 1，2 2 1 ) 彳m^ 丄z z丄）一個穩定的指向性照 明光源’以提升基材（1 i )檢測中影像的清晰度。 在該可透光輸送帶（i 0)運轉的過程中，上/下影 像擷取裝置（2 1，2 2 )中之發光源（2丄〇，2 2 〇% 分別對該可透光輸送帶（i 〇 )上基材（1 i )的上 '下 表面提供一特定之指向性光源，而上/下影像擷取裝置（2 1，2 2 )中之線性攝影機（2 i工‘，2 2工）則分別描 掃擷取該可透光輸送帶（1 〇 )上基材（1 i )之上、下 表面的線性影像資料，並將該些線性影像資料回傳至控制 裝置（3 0 )來進行影像分析判斷。因上/下影像擷取裝 置（2 1 ，2 2 )中之線性攝影機（2 1 1 ，2 2 1 )單 次顧取之線性影像僅為該基材的一小部份影像，是以其^Γ 線性影像資料量較小，使得控制裝置（3 0 )進行影像分 析判斷程序時的處理速度可加快，因而提高其判斷速度， 提升判斷基材（1 1 )優劣的檢測速度，且在生產線速产 8 M285884 加快的情況下，仍可同時檢測基材（丄 丄夕 丄 卜表面 :貝料，並可維持其基材（11)檢測的準確性。 以下謹進-步說明上述影像分析判斷方式，請參閱第 三圖所示，係為本創作之檢測裝置在檢測基材上表面有異 物的實施狀態示意圖.，若基材（工1〇上有一突起之里物 (4 0 ) ’在可透光輸送帶（1〇)輸送基材（i i)的 過程中，因光線照射在該異物（4 0)與正常基材（工η 表面時所產生的反射光角度及反射光強度皆不相同，所以 對已預設-特定角度之線性攝影機（2工工）而言，在該 異物（4 Q )通過線性攝影機（2 i工）之掃描區域時，〆 會使光線產生的反射光光量不一樣’使得所擁取到的影像 資料有顯著的差異’故不論該基材（2工）表面有凹陷或 凸塊，更甚者有破損之基材（1 1)表面，皆可藉此一方 法來加以檢測基材（η)表面是否有所缺陷。 由上述說明可知，本創作之可快速判斷基材優劣的檢 測裝置經由線性攝影機所擷取的小面積線性影像來降低資 枓處理量及提高基材檢測的判讀速度，並輔以可提供穩定 光源之長型LED光源’來提升影像的清晰度，又可經由控 制裝置控制外加之致動器來加以調控上/下影像擷取裳置 的角度’使線性攝影機或發光源相對於輸送帶的角度呈可 調、，如此即可令本創作適用於各種基材撿測，均能保有其 檢測正確性，因而提高了基材檢測的準確度。 【圖式簡單說明】 9 M285884 第一圖：係本創作檢測裝置之側視示意圖。 第二圖：係本創作檢測裝置之立體示意圖。 第三圖··係本創作檢測基材上表面之異物的實施狀態 示意圖。 第四圖：係習用之檢測裝置側視示意圖。 【主要元件符號說明 (1〇)可透光輸送帶 (2 0 )支撐架 (2 1 )上影像擷取裝置 (2 1 1 )線性攝影機 (2 2 0 )發光源 (3 0 )控制裝置 (5 0 )基材 (5 2 )影像擷取裝置 (5 2 2 )燈管 (11)基材 (2 0 1 )樞接元件 (2 1 0 )發光源 (2 2 )下影像擷取裝置 (2 2 1 )線性攝影機 (4 0 )異物 (5 1 )輸送帶 (5 2 1 )攝影機 (5 3 )主機 10M285884 VIII. New description: [New technical field] This creation is about a detection device that can quickly judge the quality of a substrate, especially a surface image of a substrate obtained by a linear camera to determine whether the surface of the substrate has Defects exist to improve the speed and accuracy of substrate inspection. • [Previous technology] The development of science and technology has promoted the rapid development of the industry. In order to increase the production capacity and the burden of production, not only has the production speed of the production line been accelerated, but also the maintenance of product quality is very important, so in the process of product production. The substrates of the products are subjected to a test step for determining whether the substrates are defective, such as defects, breakage, scratches, foreign matter adsorption, and uneven color distribution, and then the defective substrate after the detection. The damaged parts are improved or removed to facilitate the dyeing, soaking and drilling of the substrate, thereby improving the quality of the product by measuring the substrate. Judging whether the substrate is good or bad needs to detect whether there are defects on the upper and lower surfaces of the substrate, so as to improve the time-consuming detection procedure of the artificial line, there is an automatic detection of the upper and lower surfaces of the substrate. The device, as shown in FIG. 1, is mainly an image capturing device (52) which is disposed on the permeable conveyor belt (5 1 ) through the substrate (50) to be detected, wherein the image The capturing device (52) is respectively provided with a camera (5 2 1 ) and a lamp tube (52 2 2) above and below the conveyor belt (5丄), via the lamps (5 2 2 ) Exposing the substrate to be tested (5 〇 3 M285884, and then taking the surface (four) image of the substrate by the camera (521) and transferring the image to the host (5 3 analysis operation and judging the A In the case of breaking the substrate (50): = defects, using this method to determine whether the upper surface and the lower surface are defective. Although the above method can reduce the manual detection time, (4) the camera is placed in the image. Face scan (an an): capture, as the product size increases, the rate of money Under the requirements of improvement and production, the resolution and image sampling of the surface scanning camera and the method meet the above requirements, so the detection substrate needs to be improved. I ^ [New content] This 'the main purpose of this creation is to provide a kind of detection device that can quickly judge the superior, and use a linear (Line_sean) camera to scan the image in a small area to improve the processing speed of the back-end computer system, so that it can accelerate Judging the advantages and disadvantages of the substrate, thereby increasing the productivity of the substrate. The main technical means used to achieve the above purpose is to place the detection device mainly on a permeable conveyor belt for conveying and carrying the substrate. In the lower part, the detecting device comprises: · an upper shadow (four) taking device 'includes a light source and a linear camera', "the source and the linear camera are mounted above the conveyor belt", wherein the illumination The source system illuminates the upper surface of the substrate above the conveyor belt, so that the linear camera captures the entire image of the upper surface of the substrate in a linear scanning manner; 4 M285884 Factory Image The picking device includes a light source and a linear camera, and the linear camera is mounted under the light transmissive conveyor belt, wherein the light source illuminates the lower surface of the substrate above the conveyor belt. The money camera shoots the substrate (4) image in a linear scan mode; and the magic full 4 U device has an image processing program built in, and is connected to the upper/lower sound image, and is connected The knife does not control the operation of the upper/lower image capturing device, and the control device # receives the linear image data outputted by the linear imaging stack of the upper/lower image capturing device to judge the quality of the substrate. The creation department uses the control device to control the upper/lower shadow capture action, that is, by sweeping the linear camera in the drawing device like a nr w A 1 ϋ 勺 , , , , , 取得 取得 取得 取得 取得 取得 取得The image of the shirt is analyzed to determine whether the surface of the base seal is defective. The area of the image taken by the linear camera is small, so the control device is processed and determined by the method of the figure. Smaller, thus Speed up the speed of the i. 4 breaking the degree of obstacle, improving the quality of the substrate to check the quality of the substrate is to improve the accuracy of the image in the substrate detection. If the light source produces light: the effect of the use, so that the judgment is flashing, then Cause: = (The power source is easy to paste, which causes judgment errors, ~ ^ ^ ^, to reduce the linear camera to capture # ^ image, the above light source can be DC-powered long & for linear camera A directional light source that shifts '% 。. Another purpose of this creation is to improve the accuracy of substrate inspection'. 5 M285884 The upper/lower image capturing device of this creation can be permeable through a fixed Light transport • The support brackets on both sides of the τ are fixed at the upper/lower position of the permeable conveyor belt, wherein the linear camera and the illuminating source of each image capturing device are matched with the pivoting component port on the support frame, and then The pivoting element position is arranged to be an actuator, and the angle of the linear camera or the light source relative to the transport belt is adjustable by controlling the pivoting element to rotate, and each actuator is respectively connected to the control device. The 忒 control device drives, and thus the angle of ^ ^ ^ φ light _ _ can be adjusted. Because of the different absorption and reflection degrees of different base materials ==, the linear camera received in the upper/lower image capturing device receives The amount of light is also different. In order to prevent the linear cameras from being absorbed by the different substrates, the same amount of light is absorbed, so that the sampling angle and the illumination of the linear camera in the upper/lower image capturing device are controlled by the control device. The illumination angle of the source enables the illumination source to provide a specific directional light, so that the linear camera is not affected by the type of the substrate, and can receive a certain amount of light incident, so as to quickly determine whether the substrate has _ defects and Increasing the accuracy of the detection device. [Embodiment] The first and second figures of the eye examination are a side view and a three-dimensional diagram of the detection device capable of quickly determining the quality of the substrate. It is disposed on a light-transmissive conveyor belt (1 〇), which is used for conveying and carrying the substrate (1 1 ), so the detection device includes an upper image 撷The taking device (2 1 )' includes a light source (2 1 0 ) and a linear camera (2 1 1 ), and the light source 1 2丄〇) 6 M285884 is mounted on the linear camera (21 1) Above the permeable conveyor belt () ,), the illuminating source (2 〇) is irradiated onto the upper surface of the conveyor belt (] 〇: > upper substrate (i"), so that the linear camera (2 u The entire image of the upper surface of the substrate (11) is taken by a linear sweeping method. The lower image capturing device (22) includes a light source (2 2 0 ) and a linear camera (2 2 1 ). (2 2 and the linear camera (4) (2 2 1 ) are installed under the permeable belt (丄〇), the illuminating source (220) is illuminating the belt 0) the upper substrate (11 The lower surface of the J. The linear camera (2 1) captures all the shirt images of the base and the 衣J 衣 面 in a linear scan, - the control device (30), which has built-in image processing Program, and connect the 'next image capture device i ( 2 1 ' 2 2 ) to control the up/down image #1 to take the 1 ( 2 1,2 2 ) action, the control (3 0 ) Received / The linear image of the image capturing device (2 χ, 2, sex camera (2 1 1, 2 ? 1 , & μ, green 2 2 1 ) is used to judge the quality of the substrate (1 1 ); - The support frame (20) is fixed on the permeable conveyor belt (on both sides for the upper/lower image capturing device (2丄, to the upper/lower permeable belt (10))丄疋In the phantom/lower position, the upper/lower image capturing device (machine (2n, 22l) and illuminating) is photographed by the pivoting component 〇1); and Mao Xianyuan (2 1 〇, 2 2 0 ) The pivot is fixed on the support frame (20). ^ Among them, the support frame (2〇) and the position of each pivoting component (2 7 M285884 is provided with an actuator (the figure is +γ丄), and the pivoting element (2 〇1) is controlled to rotate. Making the upper/lower % 徨τ/lower shirts like the linear camera (2 1 1, ρ ρ Ί 丄 2 2 1 ) or the illumination source (2 1 〇, 220) in the capture device (2丄, 2 2) The angle of the conveyor belt (1 〇) is adjustable, and the actuators are respectively connected to the control device (30), and are controlled by the control...3〇) to adjust the linear camera (2 2 2 , 2 2丄) or the angle of the light source (2 1 0 ' 2 2 0 ) relative to the conveyor belt (worker). The above-mentioned upper/lower image capturing device (2丄, (2..." (8) can be provided with a linear camera (2 1 1, 2 2 1 ) 彳m^ 丄zz丄) with a DC-powered long-type source to provide a stable pointing The illumination source 'to enhance the sharpness of the image in the substrate (1 i ). During the operation of the permeable belt (i 0), the upper/lower image capturing device (2 1,2 2 ) The illumination source (2丄〇, 2 2 〇% respectively provides a specific directional light source to the upper 'lower surface of the substrate (1 i ) on the permeable transmission belt (i 〇), and the upper/lower image 撷The linear camera (2 i work ', 2 2 work) in the taking device (2 1, 2 2 ) respectively scans and draws the substrate (1 i ) above and below the light transmissive conveyor belt (1 〇) Linear image data of the surface, and the linear image data is transmitted back to the control device (30) for image analysis and judgment. The linear camera in the upper/lower image capturing device (2 1 , 2 2 ) (2 1 1 , 2 2 1 ) The linear image of a single capture is only a small part of the image of the substrate, so that the amount of linear image data is small, so that the control device (30) The processing speed of the image analysis judgment program can be speeded up, so that the judgment speed is improved, the detection speed of the judgment substrate (1 1 ) is improved, and the substrate can be simultaneously detected while the production line speed of 8 M285884 is accelerated.丄夕丄卜 surface: shell material, and can maintain the accuracy of the detection of its substrate (11). The following is a step-by-step description of the above image analysis and judgment method, please refer to the third figure, which is the detection device of this creation. A schematic diagram of an implementation state in which a foreign object is detected on a surface of a substrate. If the substrate (there is a protrusion (4 0 ) on the substrate), the process of transporting the substrate (ii) in the permeable transmission belt (1 〇) In the case where the light is irradiated on the foreign object (40) and the normal substrate (the angle of the reflected light and the intensity of the reflected light are different, so the preset-specific angle linear camera (2 workers) In the case where the foreign object (4 Q ) passes through the scanning area of the linear camera (2 i), the amount of reflected light generated by the light is different, so that there is a significant difference in the image data that is captured. Regardless of the substrate (2 work The surface of the substrate (11) can be detected by a method. The above description shows that the surface of the substrate (11) is defective. The detection device that can quickly judge the superiority and inferiority of the substrate can reduce the amount of resource processing and increase the interpretation speed of the substrate detection through the small-area linear image captured by the linear camera, and is supplemented by a long-type LED light source that can provide a stable light source. The sharpness of the image can be controlled by the control device to control the upper/lower image to capture the angle of the skirt. The angle of the linear camera or the light source relative to the conveyor belt can be adjusted. This design is suitable for a variety of substrate speculation, can ensure its correctness of detection, thus improving the accuracy of substrate detection. [Simple description of the diagram] 9 M285884 First picture: A side view of the creation detection device. The second picture is a three-dimensional diagram of the creation detection device. The third figure is a schematic diagram showing the implementation state of the foreign matter on the upper surface of the substrate. Figure 4: A side view of a conventional detection device. [Main component symbol description (1〇) permeable conveyor belt (20) support frame (2 1) image capture device (2 1 1) linear camera (2 2 0 ) illumination source (30) control device ( 5 0) substrate (5 2 ) image capturing device (5 2 2 ) lamp tube (11) substrate (2 0 1 ) pivoting component (2 1 0 ) illuminating source (2 2 ) image capturing device ( 2 2 1) Linear camera (4 0) Foreign object (5 1 ) Conveyor belt (5 2 1 ) Camera (5 3 ) Host 10