TWI350555B - - Google Patents
Info
- Publication number
- TWI350555B TWI350555B TW096111663A TW96111663A TWI350555B TW I350555 B TWI350555 B TW I350555B TW 096111663 A TW096111663 A TW 096111663A TW 96111663 A TW96111663 A TW 96111663A TW I350555 B TWI350555 B TW I350555B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
- F27B17/00—Furnaces of a kind not covered by any preceding group
- F27B17/0016—Chamber type furnaces
- F27B17/0025—Especially adapted for treating semiconductor wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006109706A JP5105396B2 (ja) | 2006-04-12 | 2006-04-12 | 加熱処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200805438A TW200805438A (en) | 2008-01-16 |
TWI350555B true TWI350555B (zh) | 2011-10-11 |
Family
ID=38759255
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096111663A TW200805438A (en) | 2006-04-12 | 2007-04-02 | Heat treatment apparatus |
Country Status (5)
Country | Link |
---|---|
US (1) | US7943886B2 (zh) |
JP (1) | JP5105396B2 (zh) |
KR (1) | KR100875597B1 (zh) |
CN (1) | CN101055433B (zh) |
TW (1) | TW200805438A (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8509688B2 (en) * | 2009-04-23 | 2013-08-13 | Samsung Electronics Co., Ltd. | Apparatus and method for mac logical channel selection for operating piconets in body area networks |
JP5891013B2 (ja) * | 2011-11-18 | 2016-03-22 | 東京応化工業株式会社 | 紫外線照射装置及び基板処理装置 |
JP5856890B2 (ja) * | 2012-03-29 | 2016-02-10 | 株式会社Screenホールディングス | 熱処理装置 |
CN102707586B (zh) * | 2012-05-21 | 2013-12-18 | 京东方科技集团股份有限公司 | 一种前烘设备及其排气方法 |
US10804121B2 (en) * | 2016-02-25 | 2020-10-13 | Shibaura Mechatronics Corporation | Substrate treatment apparatus, substrate treatment method, and method for manufacturing substrate |
JP6845696B2 (ja) * | 2016-02-25 | 2021-03-24 | 芝浦メカトロニクス株式会社 | 基板処理装置、基板処理方法及び基板の製造方法 |
CN106783684A (zh) * | 2016-12-19 | 2017-05-31 | 惠科股份有限公司 | 基板烘烤机台及其烘烤作业方法 |
JP6879808B2 (ja) * | 2017-04-13 | 2021-06-02 | 株式会社Screenホールディングス | 熱処理装置 |
JP7070313B2 (ja) * | 2018-10-11 | 2022-05-18 | 三菱電機株式会社 | 半導体ウエハ基板の熱処理装置及び熱処理方法 |
CN110133969B (zh) * | 2019-04-26 | 2024-08-30 | 厦门通富微电子有限公司 | 一种用于烘烤光刻胶的烘烤设备、烘烤系统及烘烤方法 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5959876A (ja) * | 1982-09-30 | 1984-04-05 | Ushio Inc | 光照射炉の運転方法 |
US5444217A (en) * | 1993-01-21 | 1995-08-22 | Moore Epitaxial Inc. | Rapid thermal processing apparatus for processing semiconductor wafers |
JP3324902B2 (ja) | 1995-03-29 | 2002-09-17 | 東京応化工業株式会社 | 加熱処理装置及び加熱処理方法 |
KR100245260B1 (ko) * | 1996-02-16 | 2000-02-15 | 엔도 마코토 | 반도체 제조장치의 기판 가열장치 |
JPH1012522A (ja) | 1996-06-21 | 1998-01-16 | Tokyo Ohka Kogyo Co Ltd | 加熱処理装置 |
US6054688A (en) * | 1997-06-25 | 2000-04-25 | Brooks Automation, Inc. | Hybrid heater with ceramic foil serrated plate and gas assist |
US5911896A (en) * | 1997-06-25 | 1999-06-15 | Brooks Automation, Inc. | Substrate heating apparatus with glass-ceramic panels and thin film ribbon heater element |
JP2000180071A (ja) * | 1998-12-16 | 2000-06-30 | Dainippon Screen Mfg Co Ltd | 熱処理装置 |
JP3833439B2 (ja) * | 2000-05-02 | 2006-10-11 | 株式会社ノリタケカンパニーリミテド | 大型基板用多段加熱炉、及び両面加熱式遠赤外線パネルヒーター、並びに該加熱炉内の給排気方法 |
JP3696156B2 (ja) * | 2000-12-26 | 2005-09-14 | 株式会社東芝 | 塗布膜の加熱装置、レジスト膜の処理方法 |
US6765178B2 (en) * | 2000-12-29 | 2004-07-20 | Applied Materials, Inc. | Chamber for uniform substrate heating |
US6528767B2 (en) * | 2001-05-22 | 2003-03-04 | Applied Materials, Inc. | Pre-heating and load lock pedestal material for high temperature CVD liquid crystal and flat panel display applications |
JP2003007594A (ja) * | 2001-06-21 | 2003-01-10 | Dainippon Screen Mfg Co Ltd | 基板熱処理装置 |
JP2003262469A (ja) * | 2002-03-06 | 2003-09-19 | Showa Mfg Co Ltd | ガラス基板用熱処理装置 |
JP4124448B2 (ja) * | 2003-03-17 | 2008-07-23 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理装置 |
JP4251887B2 (ja) * | 2003-02-26 | 2009-04-08 | 東京エレクトロン株式会社 | 真空処理装置 |
US20040226513A1 (en) * | 2003-05-12 | 2004-11-18 | Applied Materials, Inc. | Chamber for uniform heating of large area substrates |
JP4384538B2 (ja) * | 2003-06-16 | 2009-12-16 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
JP2005183596A (ja) * | 2003-12-18 | 2005-07-07 | Seiko Epson Corp | 熱処理装置および半導体装置の製造方法 |
JP2005183638A (ja) * | 2003-12-18 | 2005-07-07 | Dainippon Screen Mfg Co Ltd | 基板熱処理装置 |
JP2005209970A (ja) * | 2004-01-26 | 2005-08-04 | Matsushita Electric Ind Co Ltd | レジスト被塗布体の加熱装置およびそのモニタリング方法 |
JP4343151B2 (ja) * | 2004-08-11 | 2009-10-14 | 東京エレクトロン株式会社 | 加熱プレートの温度測定方法、基板処理装置及び加熱プレートの温度測定用のコンピュータプログラム |
-
2006
- 2006-04-12 JP JP2006109706A patent/JP5105396B2/ja not_active Expired - Fee Related
-
2007
- 2007-04-02 TW TW096111663A patent/TW200805438A/zh not_active IP Right Cessation
- 2007-04-03 KR KR1020070032731A patent/KR100875597B1/ko active IP Right Grant
- 2007-04-10 CN CN2007100958538A patent/CN101055433B/zh not_active Expired - Fee Related
- 2007-04-11 US US11/786,203 patent/US7943886B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN101055433B (zh) | 2012-05-02 |
JP2007287717A (ja) | 2007-11-01 |
US20080128402A1 (en) | 2008-06-05 |
CN101055433A (zh) | 2007-10-17 |
KR20070101771A (ko) | 2007-10-17 |
JP5105396B2 (ja) | 2012-12-26 |
KR100875597B1 (ko) | 2008-12-23 |
US7943886B2 (en) | 2011-05-17 |
TW200805438A (en) | 2008-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |