TWI346435B - Apparatus for reducing current leakage - Google Patents
Apparatus for reducing current leakageInfo
- Publication number
- TWI346435B TWI346435B TW095139415A TW95139415A TWI346435B TW I346435 B TWI346435 B TW I346435B TW 095139415 A TW095139415 A TW 095139415A TW 95139415 A TW95139415 A TW 95139415A TW I346435 B TWI346435 B TW I346435B
- Authority
- TW
- Taiwan
- Prior art keywords
- current leakage
- reducing current
- reducing
- leakage
- current
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
- H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
- H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
- H02H9/046—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere responsive to excess voltage appearing at terminals of integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Logic Circuits (AREA)
- Train Traffic Observation, Control, And Security (AREA)
- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/257,839 US7639463B2 (en) | 2005-10-25 | 2005-10-25 | Apparatus and method for reducing leakage between an input terminal and power rail |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200729660A TW200729660A (en) | 2007-08-01 |
TWI346435B true TWI346435B (en) | 2011-08-01 |
Family
ID=37968651
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095139415A TWI346435B (en) | 2005-10-25 | 2006-10-25 | Apparatus for reducing current leakage |
Country Status (6)
Country | Link |
---|---|
US (1) | US7639463B2 (zh) |
EP (1) | EP1949518A4 (zh) |
JP (1) | JP2009513033A (zh) |
CN (1) | CN101379672B (zh) |
TW (1) | TWI346435B (zh) |
WO (1) | WO2007051114A2 (zh) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1811568B1 (fr) * | 2006-01-24 | 2010-03-17 | Stmicroelectronics Sa | Dispositif de protection d'un circuit intégré contre les phénomènes de déclenchement parasite |
US7724486B2 (en) * | 2007-08-30 | 2010-05-25 | Infineon Technologies Ag | Sensing a current signal in an integrated circuit |
US7978449B2 (en) * | 2007-11-30 | 2011-07-12 | National Semiconductor Corporation | Integrated electrostatic discharge (ESD) protection circuitry for signal electrode |
EP2410566A1 (en) * | 2010-07-22 | 2012-01-25 | Nxp B.V. | An integrated circuit, comprising ESD circuitry for protecting a terminal of the integrated circuit |
US8780512B2 (en) * | 2011-04-01 | 2014-07-15 | Neurosky, Inc. | Low leakage ESD structure for non-contact bio-signal sensors |
US8576526B2 (en) | 2012-02-16 | 2013-11-05 | International Business Machines Corporation | Reduced current leakage in RC ESD clamps |
US8643987B2 (en) | 2012-05-04 | 2014-02-04 | International Business Machines Corporation | Current leakage in RC ESD clamps |
US9219473B2 (en) * | 2013-03-15 | 2015-12-22 | International Business Machines Corporation | Overvoltage protection circuit |
US20200059092A1 (en) * | 2018-08-20 | 2020-02-20 | Superc-Touch Corporation | Esd protection circuit with reduced parasite capacitance and method for reducing esd parasite capacitance |
CN111404135B (zh) * | 2020-03-24 | 2022-04-15 | 思瑞浦微电子科技(苏州)股份有限公司 | 用于超低漏电的esd保护电路 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4068278A (en) * | 1976-05-27 | 1978-01-10 | Williams Bruce T | Overload protection circuit for amplifiers |
US4048584A (en) * | 1976-11-26 | 1977-09-13 | Motorola, Inc. | Input protection circuit for cmos oscillator |
US5563757A (en) * | 1995-02-27 | 1996-10-08 | Texas Instruments Incorporated | Low leakage ESD network for protecting semiconductor devices and method of construction |
US5973897A (en) * | 1997-07-09 | 1999-10-26 | National Semiconductor Corporation | Electrostatic discharge (ESD) protection circuit with reduced node capacitance |
JP4037029B2 (ja) * | 2000-02-21 | 2008-01-23 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
JP2002100761A (ja) * | 2000-09-21 | 2002-04-05 | Mitsubishi Electric Corp | シリコンmosfet高周波半導体デバイスおよびその製造方法 |
US6639772B2 (en) * | 2002-01-07 | 2003-10-28 | Faraday Technology Corp. | Electrostatic discharge protection circuit for protecting input and output buffer |
US7315438B2 (en) * | 2003-06-10 | 2008-01-01 | Seiko Epson Corporation | Technique to reduce ESD loading capacitance |
JP4421849B2 (ja) * | 2003-07-22 | 2010-02-24 | 株式会社デンソー | 入力保護回路 |
US7002216B2 (en) * | 2004-06-08 | 2006-02-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | ESD performance using separate diode groups |
US7064593B2 (en) * | 2004-09-20 | 2006-06-20 | Texas Instruments Incorporated | Bus-hold circuit |
JP4282581B2 (ja) * | 2004-09-29 | 2009-06-24 | 株式会社東芝 | 静電保護回路 |
US7609495B2 (en) * | 2006-10-31 | 2009-10-27 | Infineon Technologies Ag | Electrostatic discharge (ESD) protection arrangement and ESD protection method |
US7978449B2 (en) * | 2007-11-30 | 2011-07-12 | National Semiconductor Corporation | Integrated electrostatic discharge (ESD) protection circuitry for signal electrode |
-
2005
- 2005-10-25 US US11/257,839 patent/US7639463B2/en active Active
-
2006
- 2006-10-25 WO PCT/US2006/060207 patent/WO2007051114A2/en active Application Filing
- 2006-10-25 TW TW095139415A patent/TWI346435B/zh active
- 2006-10-25 JP JP2008538152A patent/JP2009513033A/ja not_active Abandoned
- 2006-10-25 EP EP06846146.6A patent/EP1949518A4/en not_active Ceased
- 2006-10-25 CN CN2006800400366A patent/CN101379672B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN101379672B (zh) | 2012-05-30 |
TW200729660A (en) | 2007-08-01 |
WO2007051114A2 (en) | 2007-05-03 |
US7639463B2 (en) | 2009-12-29 |
US20070091526A1 (en) | 2007-04-26 |
CN101379672A (zh) | 2009-03-04 |
EP1949518A2 (en) | 2008-07-30 |
WO2007051114A3 (en) | 2008-08-28 |
JP2009513033A (ja) | 2009-03-26 |
EP1949518A4 (en) | 2017-04-12 |
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