TWI325717B - Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor - Google Patents

Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor Download PDF

Info

Publication number
TWI325717B
TWI325717B TW095113101A TW95113101A TWI325717B TW I325717 B TWI325717 B TW I325717B TW 095113101 A TW095113101 A TW 095113101A TW 95113101 A TW95113101 A TW 95113101A TW I325717 B TWI325717 B TW I325717B
Authority
TW
Taiwan
Prior art keywords
circuit
sampling
circuits
match
imaging device
Prior art date
Application number
TW095113101A
Other languages
English (en)
Chinese (zh)
Other versions
TW200708065A (en
Inventor
Hai Yan
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of TW200708065A publication Critical patent/TW200708065A/zh
Application granted granted Critical
Publication of TWI325717B publication Critical patent/TWI325717B/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Picture Signal Circuits (AREA)
TW095113101A 2005-04-13 2006-04-13 Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor TWI325717B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/104,434 US7554066B2 (en) 2005-04-13 2005-04-13 Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor

Publications (2)

Publication Number Publication Date
TW200708065A TW200708065A (en) 2007-02-16
TWI325717B true TWI325717B (en) 2010-06-01

Family

ID=36694982

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095113101A TWI325717B (en) 2005-04-13 2006-04-13 Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor

Country Status (7)

Country Link
US (2) US7554066B2 (enExample)
EP (1) EP1872569A1 (enExample)
JP (1) JP2008537406A (enExample)
KR (1) KR20080005243A (enExample)
CN (1) CN101160952A (enExample)
TW (1) TWI325717B (enExample)
WO (1) WO2006113202A1 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060268137A1 (en) * 2005-05-31 2006-11-30 Charles Grant Myers System and method for reducing read-out noise in a pixel array
CN101197921B (zh) * 2006-12-07 2010-11-03 比亚迪股份有限公司 一种图像信号采样电路及其方法
DE102007014034B3 (de) * 2007-03-23 2008-09-25 Continental Automotive Gmbh Optischer Sensorchip und Einklemmschutzvorrichtung mit einem solchen
DE102007027463B4 (de) * 2007-06-14 2021-03-25 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US7746400B2 (en) * 2007-07-31 2010-06-29 Aptina Imaging Corporation Method, apparatus, and system providing multi-column shared readout for imagers
US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
JP4386118B2 (ja) 2007-08-31 2009-12-16 ソニー株式会社 撮像回路
US7569803B2 (en) * 2007-10-04 2009-08-04 Aptina Imaging Corporation Biasing apparatus, systems, and methods
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
JP5102115B2 (ja) * 2008-06-05 2012-12-19 キヤノン株式会社 撮像装置、及び撮像システム
JP5311954B2 (ja) * 2008-09-30 2013-10-09 キヤノン株式会社 固体撮像装置の駆動方法
JP5625284B2 (ja) * 2009-08-10 2014-11-19 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法および電子機器
US8199225B2 (en) * 2009-12-31 2012-06-12 Omnivision Technologies, Inc. Generating column offset corrections for image sensors
KR101785131B1 (ko) 2010-03-22 2017-10-12 홀로직, 인크. 디지털 촬상을 위한 상관해제된 채널 샘플링
US8248490B2 (en) * 2010-04-21 2012-08-21 Omnivision Technologies, Inc. Imaging sensor having reduced column fixed pattern noise
US8149151B2 (en) * 2010-04-26 2012-04-03 Robert Bosch Gmbh Second order dynamic element rotation scheme
US8462240B2 (en) * 2010-09-15 2013-06-11 Aptina Imaging Corporation Imaging systems with column randomizing circuits
DE102010051440A1 (de) * 2010-11-15 2012-05-16 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US8830334B2 (en) 2010-11-30 2014-09-09 Aptina Imaging Corporation Systems and methods for providing shiftable column circuitry of imager pixel arrays
CN102131059B (zh) * 2011-04-20 2016-03-02 中国科学院半导体研究所 面向实时视觉芯片的高速行并行图像传感器
JP5721518B2 (ja) * 2011-04-21 2015-05-20 キヤノン株式会社 撮像素子及び撮像装置
KR101263826B1 (ko) * 2011-09-21 2013-05-13 주식회사 뷰웍스 X선 평면검출기의 전하-전압 변환장치
EP2665257B1 (en) * 2012-05-16 2014-09-10 Harvest Imaging bvba Image sensor and method for power efficient readout of sub-picture
GB2504111A (en) * 2012-07-18 2014-01-22 Stfc Science & Technology Image sensor device with external addressing and readout circuitry located along same edge of the sensor device
US9066030B2 (en) * 2012-09-19 2015-06-23 Semiconductor Components Industries, Llc Image sensors with column failure correction circuitry
CN106233723B (zh) * 2014-02-26 2018-04-06 欧姆龙株式会社 用于检测图像传感器中的定址故障的方法和装置
WO2016027683A1 (ja) * 2014-08-19 2016-02-25 ソニー株式会社 固体撮像素子および電子機器
EP3253047B1 (en) * 2015-01-28 2018-11-28 Panasonic Intellectual Property Management Co., Ltd. Solid-state imaging device and camera
CN107431776B (zh) * 2015-04-16 2020-12-22 普里露尼库斯股份有限公司 固体摄像装置、固体摄像装置的驱动方法以及电子设备
KR102490299B1 (ko) * 2016-01-29 2023-01-20 에스케이하이닉스 주식회사 이미지 센싱 장치 및 그의 구동 방법
US10291868B2 (en) 2016-01-29 2019-05-14 SK Hynix Inc. Image sensing device
EP3367668B1 (en) * 2017-02-24 2019-10-02 Melexis Technologies NV Noise reduction in sample and hold systems
JP2018195991A (ja) * 2017-05-17 2018-12-06 ソニーセミコンダクタソリューションズ株式会社 撮像素子、および撮像素子の制御方法、撮像装置、並びに電子機器
CN109842769B (zh) * 2017-11-28 2021-07-16 比亚迪半导体股份有限公司 固定模式噪声消除方法、装置、图像传感器及电子设备
CN110933338B (zh) * 2019-10-28 2022-03-04 成都微光集电科技有限公司 一种降低固定列噪声的图像传感器
KR20210076552A (ko) * 2019-12-16 2021-06-24 에스케이하이닉스 주식회사 이미지 센싱 장치
KR102838191B1 (ko) * 2020-02-10 2025-07-25 삼성전자주식회사 듀얼 컨버전 게인을 이용하여 hdr 이미지를 구현하기 위한 이미지 센서
CN111918008B (zh) * 2020-08-05 2022-11-04 成都微光集电科技有限公司 一种图像传感器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5790191A (en) * 1996-03-07 1998-08-04 Omnivision Technologies, Inc. Method and apparatus for preamplification in a MOS imaging array
US5965871A (en) * 1997-11-05 1999-10-12 Pixart Technology, Inc. Column readout multiplexer for CMOS image sensors with multiple readout and fixed pattern noise cancellation
WO2001024104A1 (en) * 1999-09-30 2001-04-05 California Institute Of Technology High-speed on-chip windowed centroiding using photodiode-based cmos imager
US6831690B1 (en) 1999-12-07 2004-12-14 Symagery Microsystems, Inc. Electrical sensing apparatus and method utilizing an array of transducer elements
JP3890210B2 (ja) * 2000-08-11 2007-03-07 キヤノン株式会社 画像撮影装置及び画像撮影装置の制御方法
US7154548B2 (en) * 2001-01-29 2006-12-26 Valley Oak Semiconductor Multiplexed and pipelined column buffer for use with an array of photo sensors
JP2002320235A (ja) * 2001-04-19 2002-10-31 Fujitsu Ltd 空間解像度の低下を抑えて縮小画像信号を生成するcmosイメージセンサ
US6787752B2 (en) * 2001-07-19 2004-09-07 Micron Technology, Inc. Pseudorandom assignment between elements of the image processor and the A/D converter cells
TW538626B (en) * 2001-12-07 2003-06-21 Twin Han Technology Co Ltd CMOS image sensor structure of mixed irradiation region and potential reading method thereof
US7212730B2 (en) * 2002-06-27 2007-05-01 International Business Machines Corporation System and method for enhanced edit list for recording options
US7471324B2 (en) * 2002-08-28 2008-12-30 Aptina Imaging Corporation Amplifier shared between two columns in CMOS sensor
US7408443B2 (en) * 2003-01-13 2008-08-05 Samsung Electronics Co., Ltd. Circuit and method for reducing fixed pattern noise
US6953923B2 (en) * 2003-02-18 2005-10-11 Omnivision Technologies, Inc. CMOS image sensor having reduced numbers of column readout circuits
US20050062866A1 (en) * 2003-09-23 2005-03-24 Ang Lin Ping Multiplexed pixel column architecture for imagers
US7852391B2 (en) * 2004-12-14 2010-12-14 Bae Systems Information And Electronic Systems Integration Inc. Substitution of defective readout circuits in imagers

Also Published As

Publication number Publication date
US20060231732A1 (en) 2006-10-19
US7554066B2 (en) 2009-06-30
EP1872569A1 (en) 2008-01-02
US20090242738A1 (en) 2009-10-01
TW200708065A (en) 2007-02-16
JP2008537406A (ja) 2008-09-11
CN101160952A (zh) 2008-04-09
KR20080005243A (ko) 2008-01-10
US7858916B2 (en) 2010-12-28
WO2006113202A1 (en) 2006-10-26

Similar Documents

Publication Publication Date Title
TWI325717B (en) Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor
US10721428B2 (en) Imaging device
US8803990B2 (en) Imaging system with multiple sensors for producing high-dynamic-range images
JP5955007B2 (ja) 撮像装置及び撮像方法
US8085329B2 (en) Solid-state imaging device, driving control method, and imaging apparatus
CN103905048B (zh) 用于减少像素阵列读出时间的转换电路
US9398239B2 (en) Solid-state imaging device having an enlarged dynamic range, and electronic system
CN104349087B (zh) 图像传感器、控制方法以及电子设备
CN101926162A (zh) 图像传感器的取样与读出
TWI758286B (zh) 處理裝置、影像感測器及系統
CN110557585B (zh) 图像传感器、操作图像传感器的方法及系统
US8982259B2 (en) Analog-to-digital converters and related image sensors
US8896736B2 (en) Solid-state imaging device, imaging apparatus and signal reading method having photoelectric conversion elements that are targets from which signals are read in the same group
CN108696704A (zh) 图像传感器和包括图像传感器的图像处理装置
CN103634538A (zh) 图像感测装置
US8081837B2 (en) Image sensor array leakage and dark current compensation
IL257177A (en) Image sensor, control method and electronic device
US10873714B2 (en) Image sensor with multiple pixel access settings
CN1984230A (zh) 利用具有宽动态范围的图像传感器来获取图像的方法
US9918029B2 (en) Imaging systems with switchable column power control
US20130308028A1 (en) Offset injection in an analog-to-digital converter
CN103517003A (zh) 固态成像装置及其驱动方法和电子设备
US20050237407A1 (en) CMOS image sensor for processing analog signal at high speed
US12137293B2 (en) Imaging system and method for improved image detection
US9445061B2 (en) Image sensors with pixel array sub-sampling capabilities