JP2008537406A - 固体撮像装置における固定パターン雑音の低減方法及び装置 - Google Patents

固体撮像装置における固定パターン雑音の低減方法及び装置 Download PDF

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JP2008537406A
JP2008537406A JP2008506566A JP2008506566A JP2008537406A JP 2008537406 A JP2008537406 A JP 2008537406A JP 2008506566 A JP2008506566 A JP 2008506566A JP 2008506566 A JP2008506566 A JP 2008506566A JP 2008537406 A JP2008537406 A JP 2008537406A
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circuit
sample
combination
hold circuits
imaging apparatus
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JP2008537406A5 (enExample
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ヤン，ハイ
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マイクロン テクノロジー， インク．
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Publication of JP2008537406A publication Critical patent/JP2008537406A/ja
Publication of JP2008537406A5 publication Critical patent/JP2008537406A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Picture Signal Circuits (AREA)
JP2008506566A 2005-04-13 2006-04-10 固体撮像装置における固定パターン雑音の低減方法及び装置 Pending JP2008537406A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/104,434 US7554066B2 (en) 2005-04-13 2005-04-13 Method and apparatus employing dynamic element matching for reduction of column-wise fixed pattern noise in a solid state imaging sensor
PCT/US2006/013270 WO2006113202A1 (en) 2005-04-13 2006-04-10 Method and apparatus for reduction of fixed pattern noise in a solid state imaging sensor

Publications (2)

Publication Number Publication Date
JP2008537406A true JP2008537406A (ja) 2008-09-11
JP2008537406A5 JP2008537406A5 (enExample) 2010-07-08

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JP2008506566A Pending JP2008537406A (ja) 2005-04-13 2006-04-10 固体撮像装置における固定パターン雑音の低減方法及び装置

Country Status (7)

Country Link
US (2) US7554066B2 (enExample)
EP (1) EP1872569A1 (enExample)
JP (1) JP2008537406A (enExample)
KR (1) KR20080005243A (enExample)
CN (1) CN101160952A (enExample)
TW (1) TWI325717B (enExample)
WO (1) WO2006113202A1 (enExample)

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KR101263826B1 (ko) * 2011-09-21 2013-05-13 주식회사 뷰웍스 Ｘ선 평면검출기의 전하-전압 변환장치
WO2016167290A1 (ja) * 2015-04-16 2016-10-20 ブリルニクスインク 固体撮像装置、固体撮像装置の駆動方法、および電子機器
WO2018211985A1 (ja) * 2017-05-17 2018-11-22 ソニーセミコンダクタソリューションズ株式会社 撮像素子、および撮像素子の制御方法、撮像装置、並びに電子機器

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DE102007027463B4 (de) * 2007-06-14 2021-03-25 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
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US20090040351A1 (en) * 2007-08-09 2009-02-12 Micron Technology, Inc. Method and apparatus for reducing noise in a pixel array
JP4386118B2 (ja) 2007-08-31 2009-12-16 ソニー株式会社 撮像回路
US7569803B2 (en) * 2007-10-04 2009-08-04 Aptina Imaging Corporation Biasing apparatus, systems, and methods
DE102007058973A1 (de) * 2007-12-07 2009-06-18 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
JP5311954B2 (ja) * 2008-09-30 2013-10-09 キヤノン株式会社 固体撮像装置の駆動方法
JP5625284B2 (ja) * 2009-08-10 2014-11-19 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法および電子機器
US8199225B2 (en) * 2009-12-31 2012-06-12 Omnivision Technologies, Inc. Generating column offset corrections for image sensors
KR101785131B1 (ko) 2010-03-22 2017-10-12 홀로직, 인크. 디지털 촬상을 위한 상관해제된 채널 샘플링
US8248490B2 (en) * 2010-04-21 2012-08-21 Omnivision Technologies, Inc. Imaging sensor having reduced column fixed pattern noise
US8149151B2 (en) * 2010-04-26 2012-04-03 Robert Bosch Gmbh Second order dynamic element rotation scheme
US8462240B2 (en) * 2010-09-15 2013-06-11 Aptina Imaging Corporation Imaging systems with column randomizing circuits
DE102010051440A1 (de) * 2010-11-15 2012-05-16 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
US8830334B2 (en) 2010-11-30 2014-09-09 Aptina Imaging Corporation Systems and methods for providing shiftable column circuitry of imager pixel arrays
CN102131059B (zh) * 2011-04-20 2016-03-02 中国科学院半导体研究所 面向实时视觉芯片的高速行并行图像传感器
JP5721518B2 (ja) * 2011-04-21 2015-05-20 キヤノン株式会社 撮像素子及び撮像装置
EP2665257B1 (en) * 2012-05-16 2014-09-10 Harvest Imaging bvba Image sensor and method for power efficient readout of sub-picture
GB2504111A (en) * 2012-07-18 2014-01-22 Stfc Science & Technology Image sensor device with external addressing and readout circuitry located along same edge of the sensor device
US9066030B2 (en) * 2012-09-19 2015-06-23 Semiconductor Components Industries, Llc Image sensors with column failure correction circuitry
CN106233723B (zh) * 2014-02-26 2018-04-06 欧姆龙株式会社 用于检测图像传感器中的定址故障的方法和装置
WO2016027683A1 (ja) * 2014-08-19 2016-02-25 ソニー株式会社 固体撮像素子および電子機器
EP3253047B1 (en) * 2015-01-28 2018-11-28 Panasonic Intellectual Property Management Co., Ltd. Solid-state imaging device and camera
KR102490299B1 (ko) * 2016-01-29 2023-01-20 에스케이하이닉스 주식회사 이미지 센싱 장치 및 그의 구동 방법
US10291868B2 (en) 2016-01-29 2019-05-14 SK Hynix Inc. Image sensing device
EP3367668B1 (en) * 2017-02-24 2019-10-02 Melexis Technologies NV Noise reduction in sample and hold systems
CN109842769B (zh) * 2017-11-28 2021-07-16 比亚迪半导体股份有限公司 固定模式噪声消除方法、装置、图像传感器及电子设备
CN110933338B (zh) * 2019-10-28 2022-03-04 成都微光集电科技有限公司 一种降低固定列噪声的图像传感器
KR20210076552A (ko) * 2019-12-16 2021-06-24 에스케이하이닉스 주식회사 이미지 센싱 장치
KR102838191B1 (ko) * 2020-02-10 2025-07-25 삼성전자주식회사 듀얼 컨버전 게인을 이용하여 hdr 이미지를 구현하기 위한 이미지 센서
CN111918008B (zh) * 2020-08-05 2022-11-04 成都微光集电科技有限公司 一种图像传感器

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US20040041931A1 (en) * 2002-08-28 2004-03-04 Nick Tu Amplifier shared between two columns in CMOS sensor

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JP3890210B2 (ja) * 2000-08-11 2007-03-07 キヤノン株式会社 画像撮影装置及び画像撮影装置の制御方法
US7154548B2 (en) * 2001-01-29 2006-12-26 Valley Oak Semiconductor Multiplexed and pipelined column buffer for use with an array of photo sensors
JP2002320235A (ja) * 2001-04-19 2002-10-31 Fujitsu Ltd 空間解像度の低下を抑えて縮小画像信号を生成するｃｍｏｓイメージセンサ
US6787752B2 (en) * 2001-07-19 2004-09-07 Micron Technology, Inc. Pseudorandom assignment between elements of the image processor and the A/D converter cells
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US5790191A (en) * 1996-03-07 1998-08-04 Omnivision Technologies, Inc. Method and apparatus for preamplification in a MOS imaging array
US20040041931A1 (en) * 2002-08-28 2004-03-04 Nick Tu Amplifier shared between two columns in CMOS sensor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009296364A (ja) * 2008-06-05 2009-12-17 Canon Inc 撮像装置、及び撮像システム
KR101263826B1 (ko) * 2011-09-21 2013-05-13 주식회사 뷰웍스 Ｘ선 평면검출기의 전하-전압 변환장치
WO2016167290A1 (ja) * 2015-04-16 2016-10-20 ブリルニクスインク 固体撮像装置、固体撮像装置の駆動方法、および電子機器
JPWO2016167290A1 (ja) * 2015-04-16 2018-02-15 ブリルニクス インク 固体撮像装置、固体撮像装置の駆動方法、および電子機器
WO2018211985A1 (ja) * 2017-05-17 2018-11-22 ソニーセミコンダクタソリューションズ株式会社 撮像素子、および撮像素子の制御方法、撮像装置、並びに電子機器

Also Published As

Publication number Publication date
US20060231732A1 (en) 2006-10-19
US7554066B2 (en) 2009-06-30
EP1872569A1 (en) 2008-01-02
US20090242738A1 (en) 2009-10-01
TW200708065A (en) 2007-02-16
CN101160952A (zh) 2008-04-09
KR20080005243A (ko) 2008-01-10
US7858916B2 (en) 2010-12-28
WO2006113202A1 (en) 2006-10-26
TWI325717B (en) 2010-06-01

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