TWI319441B - Highly ionized pvd with moving magnetic field envelope for uniform coverage of feature structure and wafer - Google Patents

Highly ionized pvd with moving magnetic field envelope for uniform coverage of feature structure and wafer

Info

Publication number
TWI319441B
TWI319441B TW094119068A TW94119068A TWI319441B TW I319441 B TWI319441 B TW I319441B TW 094119068 A TW094119068 A TW 094119068A TW 94119068 A TW94119068 A TW 94119068A TW I319441 B TWI319441 B TW I319441B
Authority
TW
Taiwan
Prior art keywords
wafer
magnetic field
feature structure
moving magnetic
uniform coverage
Prior art date
Application number
TW094119068A
Other languages
English (en)
Other versions
TW200607875A (en
Inventor
Jozef Brcka
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200607875A publication Critical patent/TW200607875A/zh
Application granted granted Critical
Publication of TWI319441B publication Critical patent/TWI319441B/zh

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04—Coating on selected surface areas, e.g. using masks
    • C23C14/046—Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61P—SPECIFIC THERAPEUTIC ACTIVITY OF CHEMICAL COMPOUNDS OR MEDICINAL PREPARATIONS
    • A61P31/00—Antiinfectives, i.e. antibiotics, antiseptics, chemotherapeutics
    • A61P31/04—Antibacterial agents
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3492—Variation of parameters during sputtering
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • C23C14/354—Introduction of auxiliary energy into the plasma
    • C23C14/358—Inductive energy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405—Magnetron sputtering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411—Constructional aspects of the reactor
    • H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
    • H01J37/3455—Movable magnets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32—Processing objects by plasma generation
    • H01J2237/33—Processing objects by plasma generation characterised by the type of processing
    • H01J2237/332—Coating
    • H01J2237/3322—Problems associated with coating
    • H01J2237/3327—Coating high aspect ratio workpieces

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Oncology (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Chemical & Material Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pharmacology & Pharmacy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Communicable Diseases (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
TW094119068A 2004-06-22 2005-06-09 Highly ionized pvd with moving magnetic field envelope for uniform coverage of feature structure and wafer TWI319441B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/873,908 US7556718B2 (en) 2004-06-22 2004-06-22 Highly ionized PVD with moving magnetic field envelope for uniform coverage of feature structure and wafer

Publications (2)

Publication Number Publication Date
TW200607875A TW200607875A (en) 2006-03-01
TWI319441B true TWI319441B (en) 2010-01-11

Family

ID=35033508

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094119068A TWI319441B (en) 2004-06-22 2005-06-09 Highly ionized pvd with moving magnetic field envelope for uniform coverage of feature structure and wafer

Country Status (4)

Country Link
US (1) US7556718B2 (zh)
JP (1) JP2008503898A (zh)
TW (1) TWI319441B (zh)
WO (1) WO2006009667A2 (zh)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8778144B2 (en) * 2004-09-28 2014-07-15 Oerlikon Advanced Technologies Ag Method for manufacturing magnetron coated substrates and magnetron sputter source
GB0608582D0 (en) * 2006-05-02 2006-06-07 Univ Sheffield Hallam High power impulse magnetron sputtering vapour deposition
US7935393B2 (en) * 2007-08-07 2011-05-03 Tokyo Electron Limited Method and system for improving sidewall coverage in a deposition system
JPWO2009090994A1 (ja) * 2008-01-15 2011-05-26 株式会社アルバック 基板ステージ、これを備えたスパッタ装置及び成膜方法
JP5367689B2 (ja) * 2008-03-07 2013-12-11 株式会社アルバック プラズマ処理方法
US20090242396A1 (en) * 2008-03-31 2009-10-01 Tokyo Electron Limited Adjustable magnet pack for semiconductor wafer processing
WO2013151763A1 (en) * 2012-04-04 2013-10-10 The Trustees Of Columbia University In The City Of New York Systems and methods for high and ultra-high vacuum physical vapor deposition with in-situ magnetic field
CN102789938B (zh) * 2011-05-18 2016-06-08 北京北方微电子基地设备工艺研究中心有限责任公司 一种磁控管、磁控管的制造方法及物理沉积室
CN102290347B (zh) * 2011-09-13 2014-04-16 徐州同鑫光电科技有限公司 一种刻蚀系统
KR20130072941A (ko) * 2011-12-22 2013-07-02 삼성전자주식회사 플라즈마 식각 장치
US9620339B2 (en) * 2013-03-15 2017-04-11 Applied Materials, Inc. Sputter source for semiconductor process chambers
CN103205711B (zh) * 2013-04-16 2015-09-16 温州职业技术学院 一种非平衡动态拱形兼容轴向导引磁场辅助离子镀装置
CN108780742B (zh) 2016-03-05 2023-07-18 应用材料公司 用于在物理气相沉积工艺中控制离子分数的方法和设备
JP6710134B2 (ja) * 2016-09-27 2020-06-17 東京エレクトロン株式会社 ガス導入機構及び処理装置
CN111954921B (zh) 2018-04-09 2024-05-31 应用材料公司 用于图案化应用的碳硬掩模及相关的方法
CN112889128B (zh) * 2018-11-05 2024-04-12 应用材料公司 磁性壳体系统
JP2022534885A (ja) 2019-05-24 2022-08-04 アプライド マテリアルズ インコーポレイテッド 基板処理チャンバ
SG11202112708YA (en) 2019-06-07 2021-12-30 Applied Materials Inc Seamless electrical conduit
US11421324B2 (en) 2020-10-21 2022-08-23 Applied Materials, Inc. Hardmasks and processes for forming hardmasks by plasma-enhanced chemical vapor deposition
US12020965B2 (en) 2020-10-21 2024-06-25 Applied Materials, Inc. Magnetic holding structures for plasma processing applications
US11952655B2 (en) 2022-03-29 2024-04-09 Applied Materials, Inc. Electromagnet pulsing effect on PVD step coverage

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2602276B2 (ja) * 1987-06-30 1997-04-23 株式会社日立製作所 スパツタリング方法とその装置
US4842703A (en) * 1988-02-23 1989-06-27 Eaton Corporation Magnetron cathode and method for sputter coating
US4810347A (en) * 1988-03-21 1989-03-07 Eaton Corporation Penning type cathode for sputter coating
US5130005A (en) * 1990-10-31 1992-07-14 Materials Research Corporation Magnetron sputter coating method and apparatus with rotating magnet cathode
AU1240692A (en) * 1991-05-21 1992-12-30 Materials Research Corporation Cluster tool soft etch module and ecr plasma generator therefor
US6224724B1 (en) * 1995-02-23 2001-05-01 Tokyo Electron Limited Physical vapor processing of a surface with non-uniformity compensation
US6132564A (en) * 1997-11-17 2000-10-17 Tokyo Electron Limited In-situ pre-metallization clean and metallization of semiconductor wafers
US5855744A (en) * 1996-07-19 1999-01-05 Applied Komatsu Technology, Inc. Non-planar magnet tracking during magnetron sputtering
US6042700A (en) * 1997-09-15 2000-03-28 Applied Materials, Inc. Adjustment of deposition uniformity in an inductively coupled plasma source
US6080287A (en) * 1998-05-06 2000-06-27 Tokyo Electron Limited Method and apparatus for ionized physical vapor deposition
US6287435B1 (en) * 1998-05-06 2001-09-11 Tokyo Electron Limited Method and apparatus for ionized physical vapor deposition
US6197165B1 (en) * 1998-05-06 2001-03-06 Tokyo Electron Limited Method and apparatus for ionized physical vapor deposition
US6100200A (en) 1998-12-21 2000-08-08 Advanced Technology Materials, Inc. Sputtering process for the conformal deposition of a metallization or insulating layer
AU4047400A (en) * 1999-04-01 2000-10-23 Foto-Wear, Inc. Polymeric composition and printer/copier transfer sheet containing the composition
TW421819B (en) 1999-09-07 2001-02-11 Taiwan Semiconductor Mfg Sweeping magnetron sputtering apparatus
US6277249B1 (en) * 2000-01-21 2001-08-21 Applied Materials Inc. Integrated process for copper via filling using a magnetron and target producing highly energetic ions
US7378001B2 (en) 2000-07-27 2008-05-27 Aviza Europe Limited Magnetron sputtering
EP1384257A2 (en) 2001-05-04 2004-01-28 Tokyo Electron Limited Ionized pvd with sequential deposition and etching
US7744735B2 (en) * 2001-05-04 2010-06-29 Tokyo Electron Limited Ionized PVD with sequential deposition and etching
KR20040028985A (ko) 2001-09-14 2004-04-03 동경 엘렉트론 주식회사 플라즈마 반응기 코일자석시스템
TW574407B (en) * 2002-06-18 2004-02-01 Hannstar Display Corp Magnetron oscillatory scanning-type sputtering device
US20040028837A1 (en) * 2002-06-28 2004-02-12 Tokyo Electron Limited Method and apparatus for plasma processing

Also Published As

Publication number Publication date
TW200607875A (en) 2006-03-01
US7556718B2 (en) 2009-07-07
WO2006009667A2 (en) 2006-01-26
JP2008503898A (ja) 2008-02-07
WO2006009667A3 (en) 2006-06-22
US20050279624A1 (en) 2005-12-22

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Legal Events

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