TWI302607B - - Google Patents

Download PDF

Info

Publication number
TWI302607B
TWI302607B TW95124577A TW95124577A TWI302607B TW I302607 B TWI302607 B TW I302607B TW 95124577 A TW95124577 A TW 95124577A TW 95124577 A TW95124577 A TW 95124577A TW I302607 B TWI302607 B TW I302607B
Authority
TW
Taiwan
Prior art keywords
elastic
probe
positioning
probes
hole
Prior art date
Application number
TW95124577A
Other languages
English (en)
Chinese (zh)
Other versions
TW200804821A (en
Inventor
Wei-Fang Fan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW95124577A priority Critical patent/TW200804821A/zh
Publication of TW200804821A publication Critical patent/TW200804821A/zh
Application granted granted Critical
Publication of TWI302607B publication Critical patent/TWI302607B/zh

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
TW95124577A 2006-07-06 2006-07-06 Improved structure for two-sheet type modular elastic probe TW200804821A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95124577A TW200804821A (en) 2006-07-06 2006-07-06 Improved structure for two-sheet type modular elastic probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95124577A TW200804821A (en) 2006-07-06 2006-07-06 Improved structure for two-sheet type modular elastic probe

Publications (2)

Publication Number Publication Date
TW200804821A TW200804821A (en) 2008-01-16
TWI302607B true TWI302607B (https=) 2008-11-01

Family

ID=44765935

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95124577A TW200804821A (en) 2006-07-06 2006-07-06 Improved structure for two-sheet type modular elastic probe

Country Status (1)

Country Link
TW (1) TW200804821A (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI592068B (zh) * 2014-10-31 2017-07-11 Mpi Corp Multilayer circuit board
TWI592071B (zh) * 2014-11-14 2017-07-11 Mpi Corp Multilayer circuit board
CN114678715A (zh) * 2022-04-22 2022-06-28 苏州华旃航天电器有限公司 螺旋式浮动接触元件

Also Published As

Publication number Publication date
TW200804821A (en) 2008-01-16

Similar Documents

Publication Publication Date Title
EP1691414A3 (en) Semiconductor device, method of manufacturing the same, capacitor structure, and method of manufacturing the same
TWI447414B (zh) 測試裝置及測試方法
US20140354318A1 (en) Interconnects including liquid metal
CN106556627B (zh) 基于纳米材料的传感器
JP2001235486A (ja) 検査用プローブ、及び該検査用プローブを備えた検査装置
CN101576571B (zh) Pcb测试机用密度转换装置
US20130182395A1 (en) Integrated module, integrated system board, and electronic device
TWI302607B (https=)
US9545002B2 (en) Multilayer circuit board
JP2010157472A (ja) ボールグリッドアレイパッケージ用ガイド付きコネクタ
CN103645215A (zh) 一种基于柔性衬底的传感器模块
TW200408090A (en) Chip-mounted contact springs
CN204536433U (zh) 一种三维微波组件测试装置
CN108037331A (zh) 适用于数模混合电路在片测试的探卡及设计制作方法
JP2011169670A (ja) プローブ装置
CN204925180U (zh) 一种用于双面引脚阵列半导体芯片的测试插座
US7523369B2 (en) Substrate and testing method thereof
CN203216971U (zh) 开合式pcb型空心线圈电流传感器
JP2018185170A (ja) 検査冶具の製造方法
CN206271679U (zh) 具有保护晶圆的独立静电载具机构
US7960190B2 (en) Temporary package for at-speed functional test of semiconductor chip
JP2008504963A5 (https=)
CN2938109Y (zh) 一体成型的电导探针改良结构
CN206920483U (zh) 探针卡及半导体测试装置
CN216285579U (zh) 用于EMCP移动终端的eMMC测试电路板和测试组件

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees