TWI301543B - - Google Patents
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- Publication number
- TWI301543B TWI301543B TW95130518A TW95130518A TWI301543B TW I301543 B TWI301543 B TW I301543B TW 95130518 A TW95130518 A TW 95130518A TW 95130518 A TW95130518 A TW 95130518A TW I301543 B TWI301543 B TW I301543B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- signal
- grounding
- probes
- frequency
- Prior art date
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
SG200702127-2A SG140520A1 (en) | 2006-08-18 | 2007-03-22 | Vertical type high frequency probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200811444A TW200811444A (en) | 2008-03-01 |
TWI301543B true TWI301543B (ja) | 2008-10-01 |
Family
ID=39205053
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
Country Status (2)
Country | Link |
---|---|
SG (1) | SG140520A1 (ja) |
TW (1) | TW200811444A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416121B (zh) * | 2009-11-04 | 2013-11-21 | Mjc Probe Inc | 探針卡 |
TWI420114B (ja) * | 2011-03-22 | 2013-12-21 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI385392B (zh) * | 2008-12-12 | 2013-02-11 | High-frequency vertical probe device and its application of high-speed test card | |
KR20200026362A (ko) * | 2018-08-29 | 2020-03-11 | 삼성디스플레이 주식회사 | 프로브 카드 및 이를 포함하는 테스트 장치 |
TW202035995A (zh) * | 2019-03-18 | 2020-10-01 | 旺矽科技股份有限公司 | 探針裝置 |
CN112710878B (zh) * | 2019-10-24 | 2024-02-27 | 台湾中华精测科技股份有限公司 | 可拆式高频测试装置及其垂直式探针头 |
-
2006
- 2006-08-18 TW TW95130518A patent/TW200811444A/zh not_active IP Right Cessation
-
2007
- 2007-03-22 SG SG200702127-2A patent/SG140520A1/en unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416121B (zh) * | 2009-11-04 | 2013-11-21 | Mjc Probe Inc | 探針卡 |
TWI420114B (ja) * | 2011-03-22 | 2013-12-21 |
Also Published As
Publication number | Publication date |
---|---|
TW200811444A (en) | 2008-03-01 |
SG140520A1 (en) | 2008-03-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |