TWI301543B - - Google Patents

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Publication number
TWI301543B
TWI301543B TW95130518A TW95130518A TWI301543B TW I301543 B TWI301543 B TW I301543B TW 95130518 A TW95130518 A TW 95130518A TW 95130518 A TW95130518 A TW 95130518A TW I301543 B TWI301543 B TW I301543B
Authority
TW
Taiwan
Prior art keywords
probe
signal
grounding
probes
frequency
Prior art date
Application number
TW95130518A
Other languages
English (en)
Chinese (zh)
Other versions
TW200811444A (en
Inventor
xin-hong Lin
wei-zheng Gu
Jian-Liang Chen
shi-chang Wu
ming chu Chen
Original Assignee
Microelectonics Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microelectonics Technology Inc filed Critical Microelectonics Technology Inc
Priority to TW95130518A priority Critical patent/TW200811444A/zh
Priority to SG200702127-2A priority patent/SG140520A1/en
Publication of TW200811444A publication Critical patent/TW200811444A/zh
Application granted granted Critical
Publication of TWI301543B publication Critical patent/TWI301543B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW95130518A 2006-08-18 2006-08-18 Vertical high frequency probe card TW200811444A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW95130518A TW200811444A (en) 2006-08-18 2006-08-18 Vertical high frequency probe card
SG200702127-2A SG140520A1 (en) 2006-08-18 2007-03-22 Vertical type high frequency probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95130518A TW200811444A (en) 2006-08-18 2006-08-18 Vertical high frequency probe card

Publications (2)

Publication Number Publication Date
TW200811444A TW200811444A (en) 2008-03-01
TWI301543B true TWI301543B (ja) 2008-10-01

Family

ID=39205053

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95130518A TW200811444A (en) 2006-08-18 2006-08-18 Vertical high frequency probe card

Country Status (2)

Country Link
SG (1) SG140520A1 (ja)
TW (1) TW200811444A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416121B (zh) * 2009-11-04 2013-11-21 Mjc Probe Inc 探針卡
TWI420114B (ja) * 2011-03-22 2013-12-21

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (zh) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card
KR20200026362A (ko) * 2018-08-29 2020-03-11 삼성디스플레이 주식회사 프로브 카드 및 이를 포함하는 테스트 장치
TW202035995A (zh) * 2019-03-18 2020-10-01 旺矽科技股份有限公司 探針裝置
CN112710878B (zh) * 2019-10-24 2024-02-27 台湾中华精测科技股份有限公司 可拆式高频测试装置及其垂直式探针头

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI416121B (zh) * 2009-11-04 2013-11-21 Mjc Probe Inc 探針卡
TWI420114B (ja) * 2011-03-22 2013-12-21

Also Published As

Publication number Publication date
TW200811444A (en) 2008-03-01
SG140520A1 (en) 2008-03-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees