TWI285416B - Package structure of bipolar transient voltage suppressor - Google Patents

Package structure of bipolar transient voltage suppressor Download PDF

Info

Publication number
TWI285416B
TWI285416B TW094116342A TW94116342A TWI285416B TW I285416 B TWI285416 B TW I285416B TW 094116342 A TW094116342 A TW 094116342A TW 94116342 A TW94116342 A TW 94116342A TW I285416 B TWI285416 B TW I285416B
Authority
TW
Taiwan
Prior art keywords
tvs
wafer
junction
rectifying diode
chip
Prior art date
Application number
TW094116342A
Other languages
Chinese (zh)
Other versions
TW200642048A (en
Inventor
Meng-Lung Sung
Original Assignee
Littelfuse Concord Semiconduct
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Littelfuse Concord Semiconduct filed Critical Littelfuse Concord Semiconduct
Priority to TW094116342A priority Critical patent/TWI285416B/en
Publication of TW200642048A publication Critical patent/TW200642048A/en
Application granted granted Critical
Publication of TWI285416B publication Critical patent/TWI285416B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

A novel package structure of bipolar transient voltage suppressor (TVS) is proposed. The first embodiment is a series package structure. A first TVS chip, two rectifying diode chips in parallel and a second TVS chip of opposite polarity to the first TVS chip are bonded in cascaded manner between a positive lead frame and a negative lead frame. The second embodiment is a parallel package structure. A first TVS chip is bonded to a first rectifying diode chip in cascaded and a second TVS chip is bonded to a second rectifying diode chip in cascaded, then these two groups are bonded in parallel with opposite polarity between a positive lead frame and a negative lead frame. These package structures can suppress both positive and negative transient voltage.

Description

1285416 七、指定代表圖: (一) 本案指定代表圖為:第( )圖。 (二) 本代表圖之元件符號簡單說明:1285416 VII. Designated representative map: (1) The representative representative of the case is: ( ). (2) A brief description of the symbol of the representative figure:

八、本案若有化學式時,請揭示最能顯示發明特徵的化學式:8. If there is a chemical formula in this case, please disclose the chemical formula that best shows the characteristics of the invention:

九、發明說明: 【發明所屬之技術領域】 本發明係有關於一種突波電壓抑制器技術。特別是,本發明係有 1285416 關於一種雙極性突波電壓抑制器之封裝结構。 【先前技術】 在電力系狀線路上經常產生各種突波(surge)或暫態電壓 (fansient voltage),此種突波或暫態電壓常常導致電子零件被破 壞’致電子系統不能運作,有時形成災難性之結果,為保護電子 免,暫,電壓破壞,不少先前技術曾提出解決方案。大多數 先前技術為單雕元件’亦即’突波抑彻通常為—個半導體之 PN接面’僅能用以保護正突波或負突波,如第i圖⑴所示。在 及電:電路1〇4之間,連接一個突波抑制器1〇6以抑制 ,犬波。此先前技術見於美國專利案號4/6〇〇 96〇,授予克拉克 中,—個四端突波抑偏以串聯連接至兩條電力 二雙極性保護’需兩個相反極性之突波抑制器連接於訊 子電路之間。此可見於第i圖⑻。在訊號112與電子電 間:需要正雛保護之突波抑制器116及負極性保護之 兩個突波抑制器。如此在桃板或積體電路上需 安排兩個突波抑制器。—個先前技術可見於美國 063,授懷自(嶋)等人之專射,此專利係 (Metal 〇Xide Semiconductor* MOS) GBT^i ^ θ^( InSUlBting Gate Bip〇lar T^nsistor, 電壓之突波或侧壓。然而,此元件僅可用於低 壓能封裝内㈣^ 哭之情先前技術之缺點,提出一種雙極性突波電壓抑制 為之封裝结構’以解關題。 ’ 【發明内容】 壯禮本ΐϊ之目的在提供-種雙極性突波電壓抑制器之封I ^ %夠以單獨—個突波電壓抑制ϋ有效抑制正向及負向之^ 1285416 態電壓’並減少電路或電路板所需空間。 本發明之再一目的在提供一種雙極性突波電壓抑制器之封裝 结構,可由增設兩個並聯之整流二極體使其與突波電壓&制器^ 串聯連结而降低抑制器之電容。 w 為達成上述目的及其他目的,本發明之第一觀點教導一種雙 白犬波抑制器之串接封裝結構’包含二個突波電壓抑制器(tvs)晶 片及一個整流'一極體晶片,封裝於正極插腳基座(frame )IX. INSTRUCTIONS: TECHNICAL FIELD OF THE INVENTION The present invention relates to a surge voltage suppressor technique. In particular, the present invention is related to a package structure for a bipolar surge voltage suppressor. [Prior Art] Various surges or fansient voltages are often generated on power line circuits. Such surges or transient voltages often cause electronic components to be destroyed. 'The calling subsystem cannot operate, sometimes The formation of catastrophic results, in order to protect electronic immunity, temporary, voltage damage, many previous technologies have proposed solutions. Most of the prior art is a single-edged component, i.e., the spur suppression is generally used to protect a positive or negative spur, as shown in Fig. 1 (1). In the power: circuit 1〇4, a surge suppressor 1〇6 is connected to suppress the dog wave. This prior art is found in U.S. Patent No. 4/6〇〇96〇, awarded to Clarke, a four-terminal surge is connected in series to two powers, two bipolar protections, and two opposite polarity surge suppressors are required. Connected between the signal circuits. This can be seen in Figure i (8). In the signal 112 and the electronic power: a surge suppressor 116 for protection and a surge suppressor for negative polarity protection are required. In this way, two surge suppressors need to be arranged on the peach board or integrated circuit. A prior art can be found in the United States 063, licensed from (嶋) and others, this patent (Metal 〇 Xide Semiconductor * MOS) GBT ^ i ^ θ ^ (InSUlBting Gate Bip〇lar T^nsistor, voltage Surge or side pressure. However, this component can only be used in the low-voltage energy package (4) ^ crying the shortcomings of the prior art, and propose a bipolar surge voltage suppression for the package structure 'to solve the problem.' [Summary of the invention] The purpose of the Zhuangli Benedict is to provide a bipolar surge suppressor that is capable of suppressing the positive and negative voltages of the '1285416 state' and reducing the circuit or circuit. A further object of the present invention is to provide a package structure of a bipolar surge voltage suppressor, which can be connected in series with a surge voltage & Reducing the capacitance of the suppressor. To achieve the above and other objects, the first aspect of the present invention teaches a tandem package structure of a dual white dog wave suppressor comprising two surge voltage suppressor (tvs) wafers and a rectification 'One pole Tablets, packaged in a positive electrode base pin (Frame)

TVS 面有一個正電極、反面有一個負電極;第二TVS晶片,具有一個 PN接面、正面有一個正電極、反面有一個負電極,金第一 tvs晶 片,背堆疊排列,第- TVS晶片及第二TVS晶片。電極面對 ,,第々整流一極體晶片,以晶片焊接(die一b〇nd)於第一 tvs 晶片及第二tvs晶片之間,正電極烊接於第一 TVS晶片 二第一整^一極體晶片並排,亦以晶片焊接於第一 TVS晶片及第 間,正電極焊接於第二TVS晶片之負電極而負電極The TVS surface has a positive electrode and the reverse side has a negative electrode; the second TVS wafer has a PN junction, a positive electrode on the front side, a negative electrode on the reverse side, a gold first tvs wafer, a back stack arrangement, and a TVS wafer. And a second TVS wafer. The electrode faces, the third rectifying one-pole wafer is soldered (die-b〇nd) between the first tvs wafer and the second tvs wafer, and the positive electrode is connected to the first TVS wafer two. One pole wafer is side by side, and is also soldered to the first TVS wafer and the first wafer, and the positive electrode is soldered to the negative electrode of the second TVS wafer and the negative electrode

ίί二tUh之負電極;一個正極插腳基座(lead f臟), if θ、ΐ TVS曰曰片之正電極;一個負極插腳基座,焊接於第二 曰ϋ日日電極,一個環氧樹酯(epoxy)外殼,將該第一 TVS Ϊ械性i tin片及該二健流二極體晶片密封於内,以作 構,教導一種雙向突波抑制器之並聯封裝結 構—個犬波電壓抑制器(Tvs) 日 封裝於正極插腳基座(leari仏、们纽—位篮日日月 :巧i二2:個PN接面、正面有-個正電極、反面有- - TV;曰片刍;::7極體晶片以晶片焊接(die_bond)於第 TVS日日片,負電極焊接於第一 片,具有一個PN接面、正二=曰曰片之負電極,弟一 TVS晶 第二整流二極體晶片,^極、反面有—個負電極; 丌以阳片知接於第二TVS晶片,負電極焊 1285416 接^第二TVS晶片之負電極;堆疊焊接之第一 TVS晶片及第一整 ‘ 流二極體晶片與堆疊焊接之第二TVS晶片及第二整流二極體晶片 並,封裝於正極插腳基座及負極插腳基座之間,第一 tvs晶片之 ,電極及第二整流二極體晶片之正電極焊接於該正極插腳基座而 ‘第一整流二極體晶片之正電極及第二TVS晶片之正電極焊接於該 負t亟插腳基座;一個環氧樹醋(epoxy )外殼,將該第一 TVS晶片、 該第二TVS晶片及該二個整流二極體晶片密封於内,以作機械性 及電性之保護。 本發明之以上及其他目的及優點參考以下之參照圖示及最佳 φ 實施例之說明而更易完全瞭解。 【實施方式】 參考第2圖,第2圖顯示一種傳統之突波抑制器(TVS)晶片 200之示意圖。在矽基板2〇4中,一個pn接面或NP接面206以擴 散^或離子佈植法形成PN接面,其參雜濃度由突波抑制器之崩潰 ,壓決疋。形成一個U型溝槽(u-gr〇〇ve) 208以增加逆偏壓耐崩 潰特性。在正面及反面分別形成正電極21〇及負電極212。 ^參考第3圖,第3圖顯示依據本發明之一實施例之突波抑制 器之串接封裝結構300。第一 TVS晶片304及第二TVS晶片314 • 以背對背堆疊排列。假設兩個晶片皆為PN接面307及313。第一 TVS晶片304用以抑制負向突波而第二TVS晶片314則用以抑制正 向突波。在TVS晶片304及314之間,兩個整流二極體308及310 以晶片焊接(die-bond)並排但極性相反的焊接於TVS晶片304 及314之銲錫凸塊(s〇ider bump) 306及312上。正極插腳基座 (lead frame) 302焊接於第一 TVS晶片304之正極銲錫突塊303 上,而負極插腳基座316焊接於第二TVS晶片314之正極銲錫凸 塊315上。敢後,整個封裝用環氧樹|旨(印⑽^) gig密封以作機 械性及電性之保護。ίί2tUh negative electrode; a positive pin base (lead f dirty), if θ, ΐ TVS 之 positive electrode; a negative pin pedestal, welded to the second day electrode, an epoxy tree An epoxy outer casing sealing the first TVS mechanical i tin sheet and the two health flow diode wafers for construction, teaching a parallel package structure of a two-way surge suppressor - a dog wave voltage The suppressor (Tvs) is packaged on the positive pin base (leari仏, 纽纽-位 basket day and month: Qiao i 2: PN junction, front has a positive electrode, reverse has - TV;刍;:: 7-pole wafer is die-bonded (die_bond) to the TVS day, the negative electrode is soldered to the first piece, has a PN junction, positive two = negative electrode of the diaphragm, and a TVS crystal second The rectifier diode has a negative electrode on the opposite side and the opposite side; the anode is connected to the second TVS wafer, the negative electrode is welded 1285416 to the negative electrode of the second TVS wafer, and the first TVS wafer is stacked and soldered. a first integral 'diode wafer and a second soldered second TVS wafer and a second rectified diode wafer are packaged on the positive electrode Between the pin base and the negative pin base, the first tvs chip, the positive electrode of the electrode and the second rectifying diode chip are soldered to the positive pin base and the positive electrode of the first rectifying diode chip and the first a positive electrode of the two TVS wafer is soldered to the negative t亟 pin base; an epoxy vinegar outer casing seals the first TVS wafer, the second TVS wafer and the two rectifying diode chips The above and other objects and advantages of the present invention will be more fully understood from the following description of the drawings and the description of the preferred <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; The figure shows a schematic diagram of a conventional surge suppressor (TVS) wafer 200. In the germanium substrate 2〇4, a pn junction or NP junction 206 is formed by diffusion or ion implantation to form a PN junction, which is mixed. The concentration is collapsed by the surge suppressor, and a U-shaped trench (u-gr〇〇ve) 208 is formed to increase the reverse bias and collapse resistance. The positive electrode 21〇 and the negative electrode are formed on the front side and the back side, respectively. 212. ^ Referring to Figure 3, Figure 3 shows the invention in accordance with the present invention In one embodiment, the surge suppressor is connected in series with the package structure 300. The first TVS wafer 304 and the second TVS wafer 314 are arranged in a back-to-back stack. It is assumed that both wafers are PN junctions 307 and 313. The first TVS wafer 304 The second TVS wafer 314 is used to suppress the forward surge. Between the TVS wafers 304 and 314, the two rectifying diodes 308 and 310 are die-bonded side by side. The opposite polarity is soldered to the solder bumps 306 and 312 of the TVS wafers 304 and 314. A positive lead frame 302 is soldered to the positive solder bump 303 of the first TVS wafer 304, and a negative pin base 316 is soldered to the positive solder bump 315 of the second TVS wafer 314. After dare, the entire package is made of epoxy tree | (print (10)^) gig seal for mechanical and electrical protection.

參考第4圖。第4圖顯示依據本發明之一實施例之串接TVS 1285416 ^作情形。第4圖(A)顯示負向暫態電壓突波發生時之電流。 連接於電路(未圖示)上之後,在輸人縣有—個負暫態 ^壓犬波402發生,第―TVS綱為逆向偏壓至其崩潰電壓 才亟Ϊ細亦處於逆向偏壓,但未崩潰而不導通;整流二極體 則處於順向偏壓而導通,整流二極體31()制以減少抑制器 之電容量,因第—TVS 304之逆向偏壓電容係與整流二極^ 3i〇 ^順向偏壓電容串聯。第二頂314亦為順向偏壓而導通。暫 悲電壓突波402即被經過第一 TVS綱、整流二極體3 TVS 314之電流404所抑制。 弟一Refer to Figure 4. Figure 4 shows a series connection of TVS 1285416 in accordance with an embodiment of the present invention. Figure 4 (A) shows the current at the time of the occurrence of a negative transient voltage surge. After being connected to a circuit (not shown), there is a negative transient state in the input county, and the dog wave 402 occurs. The first TVS is reverse biased until its breakdown voltage is thin and reverse biased. However, it does not collapse and is not turned on; the rectifying diode is turned on in the forward bias, and the rectifying diode 31 is used to reduce the capacitance of the suppressor, because the reverse bias capacitor and rectification of the first TVS 304 Two poles ^ 3i 〇 ^ forward bias capacitors in series. The second top 314 is also turned on for forward biasing. The temporary sad voltage surge 402 is suppressed by the current 404 passing through the first TVS class, the rectifying diode 3 TVS 314. Brother one

參考第4圖(B)。第4圖⑻顯示正向暫態電壓突波生 時,電流。^ TVS連接於電路(未圖示)上之後,在輸入端若有 二個正向暫態電壓突波侧發生,第二TVS 314為逆向偏壓至其 崩潰電壓,整流二極體310亦處於逆向偏壓,但未崩潰而不導通、; 整流二極體3G8則處於順向偏壓而導通,整流二極體係用以 減少抑制器、300之電容量,因第丄TVS 314之逆向偏壓電容係與 ,流二極體〒之順向偏壓電容串聯。第一 TVS謝亦為順向偏 壓而導通。暫態電壓突波406即被經過第二TVS 314,整流二極體 308及第一 TVS 304之電流408所抑制。 參考弟5圖,苐5圖顯示依據本發明之一實施例之利用兩個 雙極性突波抑制晶片之突波抑制器串接封裝結構5〇〇。第一雙極性 TVS晶片504及第二雙極性TVS晶片514以背對背堆疊排列。假設 兩個晶片皆為PN接面505、507及511、513。第一雙極性TVS晶 片504之接面505及第二雙極性TVS晶片514之接面511用以抑 制負向突波而第一雙極性TVS晶片504之接面5〇7及第二雙極性 TVS晶片514之接面513則用以抑制正向突波。在雙極性TVS晶片 504及514之間,兩個整流二極體5〇8及51〇以晶片焊接 (die-bond)並排但極性相反的焊接於雙極性TVS晶片5〇4及514 之銲錫凸塊(solder bump) 506及512上。正極插腳基座(iead frame) 502焊接於第一雙極性TVS晶片504之正極銲錫凸塊503Refer to Figure 4 (B). Figure 4 (8) shows the current in the forward transient voltage spur. ^ After the TVS is connected to the circuit (not shown), if two positive transient voltage surges occur on the input side, the second TVS 314 is reverse biased to its breakdown voltage, and the rectifying diode 310 is also Reverse bias, but not collapsed and not turned on; rectifier diode 3G8 is forward biased and turned on, rectifying diode system is used to reduce the capacitance of suppressor, 300, due to the reverse bias of the second TVS 314 The capacitor is connected in series with the forward bias capacitor of the current diode. The first TVS Xie is also turned on for forward bias. Transient voltage surge 406 is suppressed by current 408 through second TVS 314, rectifying diode 308 and first TVS 304. Referring to Figure 5, Figure 5 shows a surge suppressor serial package structure 5 using two bipolar surge suppression wafers in accordance with one embodiment of the present invention. The first bipolar TVS wafer 504 and the second bipolar TVS wafer 514 are arranged in a back-to-back stack. Assume that both wafers are PN junctions 505, 507 and 511, 513. The junction 505 of the first bipolar TVS wafer 504 and the junction 511 of the second bipolar TVS wafer 514 are used to suppress the negative surge and the junction 5〇7 and the second bipolar TVS of the first bipolar TVS wafer 504. The junction 513 of the wafer 514 is used to suppress the forward glitch. Between the bipolar TVS wafers 504 and 514, the two rectifying diodes 5〇8 and 51〇 are die-bonded but opposite in polarity soldered to the bipolar TVS wafers 5〇4 and 514. Solder bumps 506 and 512. A positive lead tab 502 is soldered to the positive solder bump 503 of the first bipolar TVS wafer 504

1285416 514 ^ 以作機械性及電性之保護。玎戒用糸軋枒酯(epoxy) 518密封 性τν$之運作^形第第6 6圖據,發明之一實施例之串接雙極 負暫態電數㈣2發生若有一個 ^^iTVS 514&lt;ΡΝ^φ 511 磬、、* -極# Rin在上’正机一極體510則處於順向偏壓而導通, 體510係用以減少抑制器_之電容量,因雙極性TVS 、^ΡΝ接面505、511之逆向偏壓電容係與整流二極體51〇 電容串聯。暫態電壓突波602即被經過第一雙極性TVS 二極體510及第二雙極性TVS 514之電流604所抑制。 ^ 6圖(β)。第6圖(B)顯示負向暫態電壓突波發生 時之電流。於TVS連接於電路(未圖示)上之後,在輸入端若有 一個正向暫態電壓突波606發生,第一雙極性TVS5〇42PN接面 5胃〇7及第二雙極性TVS 514之PN接面513為逆向偏壓至其崩潰電 壓’PN,面505、511為順向偏壓而導通。整流二極體51〇亦處於 逆內偏壓,但未崩潰而不導通;整流二極體5〇8則處於順向偏壓 而導通,整流二極體508係用以減少抑制器5〇〇之電容量,因第 一雙極性TVS 504、514之PN接面507、513之逆向偏壓電容係與 整流二極體508之順向偏壓電容串聯。暫態電壓突波606即被經 過第二雙極性TVS 514、整流二極體508及第一雙極性TVS 514 之電流608所抑制。 參考第7圖,第7圖顯示依據本發明之一實施例之利用兩個雙 極性突波抑制晶片之突波抑制器並聯封裝結構5〇〇。假設兩個晶片 皆為PN接面。第一 TVS晶片704之負極銲錫突塊706以晶片焊接 焊接於第一整流二極體708之負電極上,第一整流二極體708之 1285416 正電極焊接於負極插腳基座7Q2上。第 接焊接於第二整流二極趙718之負二: 默广二1:名08之正·焊接於負極插腳基座702上。第二 2二奸腳其=極鲜錫突塊716焊接於負極插腳基S 702上。秋 U極^基=22,接於第一 TVS晶請之正轉锡突塊703 18之負電極720上。最後,整個封裝用環氧 樹酉日(印oxy) 724密封以作機械性及電性之保護。 名軋1285416 514 ^ For mechanical and electrical protection.玎 糸 ep ep 518 518 518 518 518 518 518 518 518 518 518 518 518 518 518 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作 运作;ΡΝ^φ 511 磬,,* - pole# Rin is on the 'positive pole 510, which is forward biased and turned on, body 510 is used to reduce the capacitance of the suppressor _, because of bipolar TVS, ^ The reverse bias capacitors of the lands 505 and 511 are connected in series with the 二 capacitor of the rectifier diode 51. Transient voltage surge 602 is suppressed by current 604 through first bipolar TVS diode 510 and second bipolar TVS 514. ^ 6 figure (β). Figure 6 (B) shows the current when a negative transient voltage spur occurs. After the TVS is connected to the circuit (not shown), if a forward transient voltage surge 606 occurs at the input end, the first bipolar TVS5〇42PN junction 5 stomach 7 and the second bipolar TVS 514 The PN junction 513 is reverse biased to its breakdown voltage 'PN, and the faces 505, 511 are turned on in a forward bias. The rectifying diode 51 is also in the reverse internal bias, but does not collapse and is not turned on; the rectifying diode 5 〇 8 is forward biased and turned on, and the rectifying diode 508 is used to reduce the suppressor 5 〇〇 The capacitance of the PN junctions 507, 513 of the first bipolar TVS 504, 514 is in series with the forward bias capacitance of the rectifier diode 508. Transient voltage surge 606 is suppressed by current 608 through second bipolar TVS 514, rectifying diode 508, and first bipolar TVS 514. Referring to Figure 7, Figure 7 shows a surge suppressor parallel package structure 5 using two bipolar surge suppression wafers in accordance with one embodiment of the present invention. Assume that both wafers are PN junctions. The negative solder bump 706 of the first TVS wafer 704 is soldered to the negative electrode of the first rectifying diode 708 by wafer soldering, and the 1285416 positive electrode of the first rectifying diode 708 is soldered to the negative pin base 7Q2. The first is soldered to the second of the second rectifying diode Zhao 718: Mou 2: No. 08 is soldered to the negative pin base 702. The second and second traits are extremely fine tin bumps 716 welded to the negative pin base S 702. Autumn U pole ^ base = 22, connected to the negative electrode 720 of the positive TV bump 703 18 of the first TVS crystal. Finally, the entire package is sealed with epoxy 酉 704 for mechanical and electrical protection. Rolling

# ΊΓνίΐϋί °Λ8 _示依據本發明之一實施例之並聯雙極 電流。於第8圖(Α)顯示貞向暫態電壓突波發生時之 負$離路(未圖示)上之後’在輸人端若有-個 偏&amp;生’第一雙極性TVS7G4之PN接面為逆向 、、“朽二:整流二極體708則處於順向偏壓而導通,整 處於逆向偏壓,但未崩潰而不導通;整流二極體 708係減少抑制器之電容量,因雙極性頂之抓接 偏壓電容係與整流二極體之順向偏壓電容串聯。暫 ===被經過第一雙極性卿4及整流二極請 士 $考第8圖(B)。第8圖(B)顯示正向暫態電壓突波發生 於TVS連接於電路(未圖示)上之後,在輸入端若有 、„%電壓突波826發生,第二雙極性TVS71〇^pN接面為 壓至其赌賴,整流二極體Ή8則祕軸偏壓而導通, =一極體708亦處於逆向偏壓,但未崩潰而不導通;整流二極 垃8係用以減少抑制器700之電容量,因雙極性TVS 710之PN 逆向偏壓電容係與整流二極體718之順向偏壓電容串聯。 皙悲電壓突波826即被經過第二雙極性TVS 710及整流二極體718 之電流830所抑制。 藉由以上較佳之具體實施例之詳述,係希望能更加清楚描述 jMf之特徵,而並非以上述所揭露的較佳具體實例來對本發明 之範臂加以限制。相反的,其目的是希望能涵蓋各種改變及具相# ΊΓνίΐϋί ° 8 shows a parallel bipolar current in accordance with an embodiment of the present invention. Figure 8 (Α) shows the PN to the first bipolar TVS7G4 at the input end if there is a negative $way (not shown) when the transient voltage surge occurs. The junction is reversed, "Zero 2: the rectifying diode 708 is in forward bias and is turned on, and is in reverse bias, but does not collapse and does not conduct; the rectifying diode 708 reduces the capacitance of the suppressor, Because the bipolar top grab bias capacitor is connected in series with the forward bias capacitor of the rectifier diode. Temporary === is passed through the first bipolar Qing 4 and the rectified poles. B) Figure 8 (B) shows that the forward transient voltage surge occurs after the TVS is connected to the circuit (not shown). If there is a „% voltage surge 826 at the input, the second bipolar TVS71 〇^pN junction is pressed to its bet, rectified diode Ή8 is tightly biased and turned on, = one pole 708 is also in reverse bias, but does not collapse without conduction; rectified two-pole 8 To reduce the capacitance of the suppressor 700, the PN reverse bias capacitance of the bipolar TVS 710 is in series with the forward bias capacitance of the rectifier diode 718. The sad voltage surge 826 is suppressed by the current 830 passing through the second bipolar TVS 710 and the rectifying diode 718. The detailed description of the preferred embodiments above is intended to provide a more detailed description of the features of the present invention and is not intended to limit the scope of the invention. On the contrary, the purpose is to cover various changes and phases.

Claims (1)

1285416 十、申請專利範圍: 1. 一種雙向突波抑制器之串接封裝結構,包含二個突 壓抑制器(TVS)晶片及二個整流二極體晶片,封裝於正極插腳基座 (lead frame)及負極插腳基座之間,至少包含: 弟一 TVS晶片’具有一個PN接面、 面有一個負電極; 正面有一個正電極、反 第二TVS晶片,具有一個PN接面、正面有一個正 、 面有一個負電極,與第一 TVS晶片背對背堆疊排列,第一 TVS曰 片及第二TVS晶片之負電極面對面; aa 第一整流二極體晶片’以晶片焊接(die一b〇nd)於第一 tvs 晶片及第二TVS晶片之間’正1:極焊接於第一 Tvs晶片之 而負電極焊接於第二TVS晶片之負電極; 、 第二整流二極體晶片,與第一整流二極體晶片並排, 晶片焊接於第一 TVS晶片及第二TVS晶片之間正焊接 一 TVS晶片之負電極而負電極焊接於第一 tvs晶片之負電極; 個正極插腳基座(lead frame),焊接於第二tvs晶片 一個負極插腳基座,焊接於第二Tvs晶片之正電極; 一個環氧樹酯(印OXy)外殼,將該第一 Tvs晶片、 =晶片及該二健流二極體晶片密封於内,以作機械性及^性^ 保獲。 2. 如申請專利範圍第1項之串接封裝結構 TVS晶片及該第二TVS晶片為PN接面晶片。 3. 如申請專利範圍第j項之串接封裝結 TVS晶片及該第二TVS晶片為Np接面晶片。 ,其中該第一 ,其中該夢一 4·、如申請專利範圍第丨項之串接封裝結構,其 TVS晶片為PN接面晶片而該第二TO晶片為Np接面晶片。 TVS曰Ltrt請專利範輯1項之串賊裝結構,其中該第一 日日以第一TVS晶片為雙極性(bi-directi〇nal)TVS晶片, 13 1285416 在正面及反面皆有一個PN接面。 - 6·如申請專利範圍第1項之串接封襄結構,盆中該第一 TVS晶片及該第二TVS晶片為雙極性(bi-directionanTVS晶 - 在正面及反面皆有一個NP接面。 aa * 7·如申請專利範圍第1項之串接封裝結構,JL中該第一整 流二極體晶片及該第二整流二極體晶片為ΡΝ接面晶/片。 8·如申睛專利她圍第1項之串接封裝結構,豆中該第一整 流二極體晶片及該第二整流二極體晶片為Νρ接面晶/片。β 9· 一種雙向突波抑制器之並聯封裝結構,包含二個突波電 壓抑制器(TVS)晶片及二個整流二極體晶片,封裝於正極插腳基座 (lead frame)及負極插腳基座之間,至少包含: 第一 TVS晶片,具有一個PN接面、正面有一個正電極、反 面有一個負電極; 第一整流二極體晶片,以晶片焊接(die一b〇nd)於第一 TVS 晶片’負電極焊接於第一 TVS晶片之負電極; 第一 TVS晶片,具有一個PN接面、正面有一個正電極、反 面有一個負電極; 第二整流二極體晶片,亦以晶片焊接於第二TVS晶片,負 電極焊接於第二TVS晶片之負電極;、 # 堆疊焊接之第一 TVS晶片及第一整流二極體晶片與堆疊焊 接之第二TVS晶片及第二整流二極體晶片並聯封裝於正極插腳基 座及負極插腳基座之間,第一 TVS晶片之正電極及第二整流二極 體晶片之正電極焊接於該正極插腳基座而第一整流二極體晶片之 正電極及第二TVS晶片之正電極焊接於該負極插腳基座; 一個環氧樹酯(epoxy)外殼,將該第一 TVS晶片、該第二 TVS晶片及該二個整流二極體晶片密封於内,以作機械性及電性之 保護。 10·如申請專利範圍第9項之並聯封裝結構,其中該第一 TVS晶片及該第二TVS晶片為pn接面晶片。 1285416 11. 如申請專利範圍第9項之並聯封裝結構,其中該第一 TVS晶片及該第二TVS晶片為NP接面晶片。 12. 如申請專利範圍第9項之並聯封裝結構,其中該第一 TVS晶片為PN接面晶片而該第二TVS晶片為NP接面晶片。 13. 如申請專利範圍第9項之並聯封裝結構,其中該第一 整流二極體晶片及該第二整流二極體晶片為PN接面晶片。 14. 如申請專利範圍第9項之並聯封裝結構,其中該第一 整流二極體晶片及該第二整流二極體晶片為PN接面晶片。1285416 X. Patent application scope: 1. A two-way surge suppressor serial package structure, comprising two voltage suppression suppressor (TVS) chips and two rectifying diode chips, packaged on a positive pin base (lead frame) And the negative pin base between the at least: the brother-TVS chip has a PN junction and a negative electrode on the surface; the front has a positive electrode, a second TVS wafer, has a PN junction, and has a front surface The positive and the surface have a negative electrode arranged in a back-to-back arrangement with the first TVS wafer, the negative electrode of the first TVS chip and the second TVS wafer face each other; aa the first rectifier diode chip is soldered by the die (die-b〇nd) Between the first tvs wafer and the second TVS wafer, a positive electrode is soldered to the first Tvs wafer and a negative electrode is soldered to the negative electrode of the second TVS wafer; and a second rectifying diode wafer is first The rectifier diode chips are side by side, the wafer is soldered between the first TVS wafer and the second TVS wafer, and the negative electrode of the TVS wafer is soldered to the negative electrode of the first tvs wafer; the positive electrode pin base (lead fram) e) soldering to a negative pin base of the second tvs wafer, soldering to the positive electrode of the second Tvs wafer; an epoxy resin (printed OXy) outer casing, the first Tvs wafer, the = wafer, and the second flow The diode chip is sealed inside for mechanical and mechanical protection. 2. The serially packaged structure TVS wafer and the second TVS wafer as claimed in claim 1 are PN junction wafers. 3. The tandem packaged TVS wafer and the second TVS wafer are the Np junction wafer as claimed in the scope of claim j. In the first, wherein the dream is a tandem package structure according to the scope of the patent application, the TVS wafer is a PN junction wafer and the second TO wafer is an Np junction wafer. TVS曰Ltrt asks for a series of thief-packed structures in the patent series, in which the first TVS wafer is a bi-polari(R) TVS chip on the first day, and 13 1285416 has a PN connection on both the front and the back. surface. - 6. According to the tandem sealing structure of claim 1, the first TVS wafer and the second TVS wafer are bipolar (bi-directionanTVS crystal - both have an NP junction on both the front side and the back side). Aa * 7 · In the series connection package structure of claim 1, the first rectifying diode chip and the second rectifying diode chip in JL are spliced surface crystals/pieces. She surrounds the package structure of the first item, in which the first rectifying diode chip and the second rectifying diode chip are Νρ junction crystal/chip. β 9· a parallel package of bidirectional surge suppressors The structure comprises two surge voltage suppressor (TVS) chips and two rectifying diode chips, and is packaged between the positive lead frame and the negative pin base, and comprises at least: a first TVS chip having a PN junction having a positive electrode on the front side and a negative electrode on the reverse side; the first rectifying diode wafer is soldered to the first TVS wafer by wafer soldering on the first TVS wafer a negative electrode; a first TVS wafer having a PN junction and a front surface a positive electrode and a negative electrode on the reverse side; a second rectifying diode wafer, which is also soldered to the second TVS wafer, and a negative electrode is soldered to the negative electrode of the second TVS wafer; ##Stacked first TVS wafer and The first rectifying diode chip is stacked in parallel with the stacked second TVS chip and the second rectifying diode chip between the positive pin base and the negative pin base, and the positive electrode and the second rectifying electrode of the first TVS chip a positive electrode of the polar body wafer is soldered to the positive pin base, and a positive electrode of the first rectifying diode chip and a positive electrode of the second TVS chip are soldered to the negative pin base; an epoxy resin outer casing; The first TVS wafer, the second TVS wafer, and the two rectifying diode chips are sealed for mechanical and electrical protection. 10 · The parallel package structure of claim 9 The first TVS wafer and the second TVS wafer are pn junction wafers. 1285416 11. The parallel package structure of claim 9, wherein the first TVS wafer and the second TVS wafer are NP junction wafers. 12. The parallel package structure of claim 9 wherein the first TVS wafer is a PN junction wafer and the second TVS wafer is an NP junction wafer. 13. The parallel package structure of claim 9 wherein The first rectifying diode chip and the second rectifying diode chip are PN junction wafers. 14. The parallel package structure of claim 9, wherein the first rectifying diode chip and the second rectifying The diode wafer is a PN junction wafer. 1515
TW094116342A 2005-05-19 2005-05-19 Package structure of bipolar transient voltage suppressor TWI285416B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW094116342A TWI285416B (en) 2005-05-19 2005-05-19 Package structure of bipolar transient voltage suppressor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094116342A TWI285416B (en) 2005-05-19 2005-05-19 Package structure of bipolar transient voltage suppressor

Publications (2)

Publication Number Publication Date
TW200642048A TW200642048A (en) 2006-12-01
TWI285416B true TWI285416B (en) 2007-08-11

Family

ID=39456715

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094116342A TWI285416B (en) 2005-05-19 2005-05-19 Package structure of bipolar transient voltage suppressor

Country Status (1)

Country Link
TW (1) TWI285416B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI492359B (en) * 2013-02-22 2015-07-11 Anova Technologies Co Ltd Semiconductor lightening and surge protector
US10062682B1 (en) * 2017-05-25 2018-08-28 Alpha And Omega Semiconductor (Cayman) Ltd. Low capacitance bidirectional transient voltage suppressor
CN108878270A (en) * 2017-11-09 2018-11-23 上海长园维安微电子有限公司 A kind of high power density TVS device and its manufacturing method

Also Published As

Publication number Publication date
TW200642048A (en) 2006-12-01

Similar Documents

Publication Publication Date Title
US9076807B2 (en) Overvoltage protection for multi-chip module and system-in-package
US10825757B2 (en) Semiconductor device and method with clip arrangement in IC package
US20150287712A1 (en) Semiconductor device
TWI285416B (en) Package structure of bipolar transient voltage suppressor
JP2018117054A (en) Semiconductor device and power conversion device
TWI477018B (en) Transient voltage suppressor circuit, and diode device therefor and manufacturing method thereof
CN210837732U (en) Packaging structure of gallium nitride HEMT
US20130175670A1 (en) Zener diode structure and manufacturing method thereof
TWI788213B (en) Bidirectional electrostatic discharge (esd) protection device
CN107359158B (en) A kind of mixed type Transient Voltage Suppressor
CN210956661U (en) Stacked chip structure
JP2018041949A (en) Bridge leg circuit assembly and full-bridge circuit assembly
CN215069934U (en) TVS pipe packaging structure
CN210325788U (en) Big low residual voltage TVS surge protector of circulation
CN209496880U (en) Transient Suppression Diode
TWI743981B (en) Bidirectional electrostatic discharge (esd) protection device
JP2015231022A (en) Semiconductor device
CN210640257U (en) Bidirectional transient voltage suppression device
CN212230430U (en) ESD device structure
WO2014115484A1 (en) Semiconductor device having esd protection element
CN218215295U (en) High-reliability surface-mounted diode
US7885046B1 (en) Low capacitance ESD protection structure for high speed input pins
CN107342283B (en) Transient Voltage Suppressor and preparation method thereof
JPS6135568A (en) Gate protecting diode
CN117316947A (en) ESD protection device

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees