1280361 九、發明說明： 【發明所屬之技術領域】 本电明係關於-種物件相面檢測 別 广影像反射元件形成具有一漏斗狀倒錐面及= =置以便反射一待測元件之外周面影像之物件外周面 【先前技術】1280361 IX. Description of the invention: [Technical field of the invention] The invention relates to the detection of the surface of the object, and the wide image reflection element is formed with a funnel-shaped inverted cone surface and == placed to reflect a peripheral surface of the element to be tested Image peripheral surface of the image [previous technique]
「習:物件外周面檢職置，如中華民國公告廳刪 唬五金零件檢測機」新型專利，其包含—震動般、一軌 道、:轉盤、-檢測機構、一零件排出機構及一控制裝置 。该展動盤承接並排列剌元件，並透過該誠之作動依 系)序將待測7G件置於轉盤上進行檢測程序；該 單元直，擷取檢測待測元件不同位置之外觀、形狀及/或 顏色之影像’如此該電餘合單元所娜之影像係分別為 1一《耦合單元(Charge_C〇upled⑽叫CCD)與一光源^ 生益’且該電荷輕合單元與光源產生器係位於同-方向， 使-待測元件通過該檢測機構時，光源產生器之光源可直 接投射於5亥待測几件上，並以傾斜方式透過該電荷麵合單 元取得反射彡像’續騎測元件之螺距外觀、形狀及/ ，顏色#者n貞彳機構可用於螺絲、螺帽、螺栓或薄 e等元件之檢測’該檢測機構更包含兩組侧視鏡頭檢測裝 置’以f分別檢測待測元件不同位置之外觀、形狀及/或 顏色，提局檢測精度。該兩組侧視鏡頭檢測裝置可相對設 置或非同側的傾斜設置於該檢測機構，以利用該電荷輕合 C:\Linda\PK PatNPKfl'JiaUoc —6 — 05/12/28/||：3〇 ΛΜ 1280361 該待測元件之相對或非同側之側影像。 :然而，在量測過程中，該側視鏡頭檢測裝置係以傾 斜=式自該待測元件取得部分影像，藉由該影像判別其形 狀完整性。如此一來，偏離中心過遠之部分影像會因傾斜 拍攝角度不同的緣故，造成後續電腦運算誤差過大而無法 使用該影像進行成品良率計算。再者，對於需要施行^ 面缺陷檢測之待測元件而言，兩組相對或非同側之側視圖 的影像資料仍無法足證待測元件係為良品或劣品，因此透 過該習用技術之檢測裝置判讀之良率與實際良率之間可能 存在過大偏差。另外，若設備組裝過程中使用出現於良品 區但未筛選去除的劣質元件時，恐影響設備之檢測可靠度 城兩組側視鏡頭檢測裝置因裝置元件數量較多，故衍 出相對〜加||置成本、降低辨識效率與徒增辨識複雜度 荨問題。基於上述原因，其確實有必要進一步改良上述習 用物件外周面檢測裝置。 有鐘於此，本發明改良上述之缺點，其係提供一影 反射7G件，其係、由—上開σ往—下開口縮徑形成一倒錐 射空間’當-待測元件對位並進人該倒錐反射間内時 雜該待測元件之相面之度影像可完整_示於該倒 、，反射空間之-料狀娜面，並反射至—影像擷取單元 進行影像_，因歧斯整體#聰麵、效率及可量 测袼度。 【發明内容】 本务明主要目的係提供—種物件外周面檢測裝置， C:\Lindn\PK PhtVPKgo^ ^"Xi: The external patent inspection of the object, such as the Republic of China Announcement Hall to remove the hardware parts inspection machine" new patent, which includes - vibration, a track,: turntable, - detection mechanism, a part discharge mechanism and a control device . The display disc receives and arranges the 剌 component, and the 7G piece to be tested is placed on the turntable through the order of the action of the singularity to perform the detection process; the unit is straight, and the appearance, shape and/or position of detecting different positions of the component to be tested are taken. Or the image of the color 'The image system of the electric remnant unit is 1 "the coupling unit (Charge_C〇upled (10) is called CCD) and a light source ^shengyi" and the charge coupling unit is located in the same way as the light source generator - direction, when the component to be tested passes the detecting mechanism, the light source of the light source generator can be directly projected on the 5 pieces to be tested, and the reflected surface image is taken through the electric charging surface unit in an inclined manner. The appearance, shape and/or color of the pitch can be used for the detection of components such as screws, nuts, bolts or thin e. The detection mechanism further includes two sets of side-view lens detecting devices to detect the test to be tested separately. The appearance, shape and/or color of the different positions of the components are used to improve the detection accuracy. The two sets of side view lens detecting devices may be disposed on the detecting mechanism with respect to the opposite or non-same side tilting to utilize the charge C:\Linda\PK PatNPKfl'JiaUoc —6 — 05/12/28/||: 3〇ΛΜ 1280361 The opposite or non-same side image of the component under test. However, during the measurement process, the side view lens detecting device acquires a partial image from the device to be tested by tilting, and discriminates its shape integrity by the image. As a result, some of the images that are too far from the center will be caused by different tilting angles, which may cause the subsequent computer operation error to be too large to use the image for the yield yield calculation. Furthermore, for the components to be tested that need to perform the surface defect detection, the image data of the two sets of opposite or non-same side views still cannot prove that the component to be tested is good or inferior, so the conventional technology is used. There may be an excessive deviation between the yield of the detection device and the actual yield. In addition, if the inferior components that appear in the good product area but are not screened and removed are used in the assembly process, the detection reliability of the equipment may be affected. The two sets of side-view lens detecting devices of the two groups have a relatively large number of device components, so the relative value is increased. ||Setting costs, reducing the efficiency of identification and increasing the complexity of identification. For the above reasons, it is indeed necessary to further improve the above-described conventional article peripheral peripheral detecting device. In view of the above, the present invention improves the above-mentioned shortcomings, and provides a shadow reflecting 7G member, which is formed by a σ-to-lower opening diameter to form an inverted cone-shaped space 'When - the component to be tested is aligned The angle image of the phase of the component to be tested in the inverted cone reflection can be complete_shown in the inverted, the reflective surface of the material, and reflected to the image capturing unit for image_, because Qisi overall #聪面, efficiency and measurable twist. SUMMARY OF THE INVENTION The main purpose of the present invention is to provide an apparatus for detecting the peripheral surface of an object, C:\Lindn\PK PhtVPKgo^ ^
05/12/28/11:30 AM —7 — .1280361 ·· 錢藉由—影像反料件貫㈣成-倒錐反㈣間，以將 -—制元件完整的度外缺駐1像娜單元，使 得本發明具有提升量測效率之功效。 /本1明_人要目的係提供—種物件外周面檢測裝置， . ;錢將—影像擷取單元、-光賴喊1像反射元件固 設於-可動式制座上，並轉其相對距離固 定不變，並 可同步移動，以減少擷取影像的誤差及校正次數，使得本 _ 發明具有提升量測精度及簡化量測步驟之功效。 根據本發明之物件外周面檢測裝置，其包含一影像 反射元件、一光源模組、一影像擷取單元及-輸送機構。 該影像反射元件具有-上開口及一下開口，並由該上開口 _往下開口縮徑形成一倒錐反射空間，其具有一漏斗狀倒錐 面。該光源模組及影像擷取單元設置於該影像反射元件上 方。該輸送機構設置於該影像反射元件下方，其輸送一待 測疋件至一預定檢測位置。在檢測過程中，該待測元件對 • 纟於該影像反射元件之倒錐反射空間’該光源模組提供一 光線投射至該倒錐反射空間之漏斗狀倒錐面，以反射該待 測7C件之影像，使該影像擷取單元取得該待測元件之外周 面影像。 ° 【實施方式】 -為讓本發明之上述及其他目的、特徵、優點能更明 顯易懂，下文特舉本發明之較佳實施例，並配合所附圖式 ，作詳細說明如下： 睛參照第1圖所示，本發明第一實施例之物件外周 C;\Lindn\PX PatNPK994a .loc —8 — »5/12/28/1! ;3〇 1280361 面檢測裝置係包含一影像反射元件丨、一光源模組2 影像掏取單元3、-基座4及-輪送機構5。該影像反射 元件1具有一上開口 1卜一下開口 12、一倒錐反射空間 13及一漏斗狀倒錐面14。該上開口 u之孔徑相對大於該 下開口 12之孔徑，該上開口 u係往該下開口 12縮徑形 j該倒錐反射空間13，使該倒錐反射空間13内部形成上 寬下窄的該漏斗狀倒錐面14。該倒錐反射空間13评一 待，元件6透過該下開口 12進入該影像反射元件i内、， 以足位於-預定量測位置。該漏斗狀倒錐面14可醉由選 用高光學反射之金屬材質、鑛層或塗層，以獲得鏡^反射 效果。再者，該料狀娜面Η相對水平®奸具有一 麵傾:角度，該角度介於30。至6〇。之間。因此二該待測 几件6之度外觀可完整的成像於顧斗狀倒錐面14 ^亚將影像向上反射至該影像擷取較3，進行影像辨 二參：第！圖所示，本發明第一實施例之光源模 =2包^光源21及—半透制22。該光源可 曰供具有單—波長或複合波長之可見光，其較佳係 光二極體〔LED〕或雷射光源。該半透鏡片22具有一^ 表面可供反射部份光線及透射部份光線。該半透 ==身1如之漏斗狀倒錐面14及影像擷取 兀3之連線形成傾斜，該半透鏡片22之傾斜角 "於mo。之間，特別是選擇為45。。該光源^ 目對5又於斜透鏡片22之—側，該光源21提供-光線，05/12/28/11:30 AM —7 — .1280361 ·· Money is used—the image is reversed (four) into the inverted cone (four), so that the completeness of the component is not included in the image. The unit makes the invention have the effect of improving the measurement efficiency. / Ben 1 Ming _ people want to provide - the object peripheral surface detection device, . ; money - image capture unit, - light Lai shing 1 like reflective element fixed on the - movable seat, and turn it relative The distance is fixed and can be moved synchronously to reduce the error of the captured image and the number of corrections, so that the invention has the advantages of improving the measurement accuracy and simplifying the measurement steps. The object peripheral surface detecting device according to the present invention comprises an image reflecting element, a light source module, an image capturing unit and a conveying mechanism. The image reflecting element has an upper opening and a lower opening, and is reduced in diameter from the upper opening _ downward opening to form a reverse cone reflecting space having a funnel-shaped inverted cone surface. The light source module and the image capturing unit are disposed above the image reflecting element. The conveying mechanism is disposed under the image reflecting element, and conveys a member to be tested to a predetermined detecting position. During the detection process, the device under test is opposite to the inverted cone reflection space of the image reflection element. The light source module provides a light-projection to the funnel-shaped inverted cone surface of the inverted cone reflection space to reflect the 7C to be tested. The image of the device causes the image capturing unit to obtain an image of the outer surface of the component to be tested. [Embodiment] The above and other objects, features, and advantages of the present invention will become more <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; As shown in Fig. 1, the outer periphery of the object of the first embodiment of the present invention C; \Lindn\PX PatNPK994a .loc — 8 — » 5/12/28/1! ; 3〇1280361 The surface detecting device includes an image reflecting element丨, a light source module 2, an image capturing unit 3, a base 4 and a wheeling mechanism 5. The image reflecting element 1 has an upper opening 1 and an opening 12, a reverse cone reflecting space 13 and a funnel-shaped inverted tapered surface 14. The aperture of the upper opening u is relatively larger than the aperture of the lower opening 12, and the upper opening u is reduced in diameter to the lower opening 12, and the inside of the inverted cone reflection space 13 is formed to be wider and narrower. The funnel-shaped inverted cone surface 14. The inverted cone reflection space 13 is evaluated, and the component 6 enters the image reflection element i through the lower opening 12 to be at a predetermined measurement position. The funnel-shaped inverted cone surface 14 can be drunk by using a highly optically reflective metal material, a mineral layer or a coating to obtain a mirror reflection effect. Furthermore, the material Natto has a face-to-face angle: the angle is 30. To 6 〇. between. Therefore, the appearance of several pieces of 6 to be measured can be completely imaged on the inverted cone surface 14 ^ The image of the sub-reflection is reflected upward to the image to capture 3, for image discrimination. As shown in the figure, the light source module of the first embodiment of the present invention has a light source 21 and a semi-transparent film 22. The light source can be used for visible light having a single wavelength or a composite wavelength, and is preferably a light diode (LED) or a laser light source. The half lens sheet 22 has a surface for reflecting part of the light and transmitting part of the light. The semi-transparent == body 1 such as the funnel-shaped inverted cone surface 14 and the image capturing 兀 3 line are inclined, and the tilt angle of the half lens sheet 22 is < In particular, the choice is 45. . The light source is opposite to the side of the oblique lens sheet 22, and the light source 21 provides - light.
C:\LinUa\PK 一 9—— "5/12/28/1 ι；ιίη λ 1280361 該光線可經由該半透鏡片22之下表面反射至該影像反射 元件1之倒錐反射空間13内。C:\LinUa\PK - 9 - "5/12/28/1 ι; ιίη λ 1280361 The light can be reflected through the lower surface of the half mirror sheet 22 into the inverted cone reflection space 13 of the image reflecting element 1 .
清再參照第1圖所示，本發明第_實施例之影像擷 取單兀3車父佳係可選自電荷麵合元件型（charge_c〇叩— Device, CCD)或互補式氧化金屬半導體型(c〇mplementary Metal-Oxide Semiconductor，CMOS)之數位影像擷取單元 。該影像擷取單元3、半透鏡片22及漏斗狀倒錐面14間 隔有固定之距離及高度’以便該_元件6之反射影像經 該半透鏡片22透射後，精確投射於該影像擷取單元3， 该影像擷取單元3可將取得之影像經一傳輸介面傳送至一 電月6J或一微處理機進行分析。 請再參照第1圖所示，本發明第一實施例之基座4 包含一可動式量測座41。該可動式量測座41可由下而上 依序設置該影像反射元件i、統模組2及影像擷取單元 3 "亥基座4具有一滑執〔未緣示〕，因此該可動式量測 座41相對該基座4進行升降移動，以便該影像反射元件 1 一、光源模組2及影像擷取單元3快速調整相對於該待測 元件6之高度位置。 明再參照第1圖所示，本發明第一實施例之輸送機 構5可選自履帶式輸送帶、輸送轉盤及機械手臂式夾具， 其可供週期性輸送該待測元件6至該影像反射元件丨下方 之預疋檢測位置，以便後續進行檢測。再者，該待測元 件6。該待測元件6係選自螺絲、螺帽、鉚釘、鉤扣件或 1C封襄元件等量產化生產之各式小型物件。該待測元件6 C:\Linrla\Plf Pat\I>K9!)42.<1«χ： 05/12/28/,,..,fl ——10—— 1280361 貝疋待測位置時’後續將利用該影像反射元件卜光 =^擷取單元3對該待測元件6之外觀進行完 整的外周面影像檢測流程。 件外届月^第1及2圖所示，當本發明第一實施例之物 。〜職置處於進行檢觸作時，該輸送機構5將 1測元件.6〔例如螺絲〕輪送往該可動式量測座41處 ’使该待測元件6正好位於該影像反射元件〗之下開口 Η 的^。在該制元件6就量測位置後，該可動式量測座 相對下降’以，降倾影像反射元件1、 ^源^組2及影像擷取料3之高度，直至該待測元件6 卜^㈣部位進人該下，12，並對位於該倒錐反射空 ^核娜面14。此時，該光源模組2之光源21 ΐ=Γ由該半透鏡片22向下反射，因而投射於該 面14上。接著，該光線經由該漏斗狀倒錐面 向反射至該侧元件6之相面〔例如螺絲頭之外 =丄Γ此’該待測树6之外周面產生反射影像，並 =向㈣㈣漏斗狀倒錐面14，接著再經過該漏斗狀倒 H面4向上反射至該半透鏡片22，並透射穿過該半透鏡 片22 ’如此該反射影像即可由該影像擁取單元3 = 所擷取。此時，該影俊#" 傳送至電腦，賴IΓ 卩可將贼之影像訊號 傳达至4以順利取得該待測元件6完整360。之外周 面影像，讀後續進行外雜麻尺寸鮮。 ° 更詳言之，本發明可取得之外部影像係呈完整360。 之環狀外周面影像，其有助於完整顯示該待測元件6之外 C:\Untlrt\PK PntNPKOO^Joc —11 — «5/Ι2/28/Π ；;j 1280361 周面輪廓。例如，螺絲之螺絲頭及螺紋部之輪廓、螺距及 構造7G整性等。藉此，將大幅提升檢測效率及良率的判讀 正確性；再者，由於該影像反射元件1、光源模組2及影 像擷取單兀3由下而上依序固設於該可動式量測座2上， 其相對距離固定不變，因此相對減少擷取影像之變因、誤 差及不便性，亦即相對簡化影像數位換算為真實尺寸之計 算過程’進而大幅提升取得數值之精確性及可信度；另外 ，當該漏斗狀倒錐面14對位於該待測元件6進行反射影 像時’無需傾斜該影像擷取單元3，因此即使應用於量測 各種㈣之待測元件6，本發明仍可順利進行精密檢測， 明顯增加量測裕度及適用範圍。Referring again to FIG. 1, the image capturing unit of the first embodiment of the present invention can be selected from the group consisting of a charge-type device (CCD) or a complementary metal oxide semiconductor type. (c〇mplementary Metal-Oxide Semiconductor, CMOS) digital image capture unit. The image capturing unit 3, the half lens sheet 22 and the funnel-shaped inverted cone surface 14 are spaced apart by a fixed distance and height ' so that the reflected image of the element 6 is transmitted through the half lens sheet 22, and is accurately projected onto the image capturing device. Unit 3, the image capturing unit 3 can transmit the acquired image to a power circuit 6J or a microprocessor for analysis through a transmission interface. Referring again to FIG. 1, the susceptor 4 of the first embodiment of the present invention includes a movable measuring seat 41. The movable measuring seat 41 can sequentially and vertically set the image reflecting element i, the unit module 2 and the image capturing unit 3 " the pedestal 4 has a sliding handle (not shown), so the movable type The measuring block 41 is moved up and down with respect to the base 4, so that the image reflecting element 1, the light source module 2 and the image capturing unit 3 quickly adjust the height position relative to the detecting element 6. Referring to FIG. 1 again, the conveying mechanism 5 of the first embodiment of the present invention may be selected from the group consisting of a crawler belt, a conveying carousel and a robotic arm clamp for periodically conveying the element to be tested 6 to the image reflection. The pre-detection detection position below the component 以便 for subsequent detection. Furthermore, the component to be tested 6 is tested. The member to be tested 6 is selected from various small-sized articles produced by mass production such as screws, nuts, rivets, hook fasteners or 1C sealing components. The device to be tested 6 C:\Linrla\Plf Pat\I>K9!) 42.<1«χ: 05/12/28/,,..,fl ——10—— 1280361 'The image reflection element will be used later to perform a complete peripheral image detection process on the appearance of the element 6 to be tested. The outer month ^1 and 2 are shown as the first embodiment of the present invention. When the job is in the process of detecting, the transport mechanism 5 sends a measuring component .6 (for example, a screw) to the movable measuring seat 41 to make the detecting component 6 be located at the image reflecting component. ^ under the opening Η. After the component 6 is in the measurement position, the movable measuring seat is relatively lowered, so that the height of the tilting image reflecting element 1, the source group 2 and the image capturing material 3 is up to the detecting element 6 ^ (4) The part enters the lower part, 12, and is located in the inverted cone reflecting the empty nuclear surface 14. At this time, the light source 21 ΐ=Γ of the light source module 2 is reflected downward by the half lens sheet 22, and thus is projected onto the surface 14. Then, the light is reflected to the opposite surface of the side member 6 via the funnel-shaped inverted cone surface (for example, outside the screw head = 丄Γ this 'the peripheral surface of the tree 6 to be tested produces a reflection image, and = (4) (four) funnel-shaped The tapered surface 14 is then reflected upwardly through the funnel-shaped inverted H-face 4 to the half-lens sheet 22 and transmitted through the half-lens sheet 22' so that the reflected image can be captured by the image capturing unit 3 = . At this time, the shadow Jun #" is transmitted to the computer, and the image signal of the thief can be transmitted to 4 to smoothly obtain the complete 360 of the component to be tested 6 . Outside the peripheral image, read the subsequent foreign hemp size. ° In more detail, the external image that can be obtained by the present invention is a complete 360. The annular outer peripheral image helps to completely display the outside of the component to be tested 6 C:\Untlrt\PK PntNPKOO^Joc —11 — «5/Ι2/28/Π ;; j 1280361 circumferential contour. For example, the screw head and threaded portion of the screw, the pitch and the 7G integrity of the structure. Therefore, the correctness of the detection efficiency and the yield is greatly improved. Furthermore, the image reflection element 1, the light source module 2, and the image capturing unit 3 are sequentially fixed from the bottom to the top in the movable amount. On the test stand 2, the relative distance is fixed, so the relative cause, error and inconvenience of the captured image are relatively reduced, that is, the calculation process of relatively simplifying the conversion of the image digital number into the real size', thereby greatly improving the accuracy of obtaining the numerical value and Confidence; in addition, when the funnel-shaped inverted tapered surface 14 is used to reflect the image on the element to be tested 6, it is not necessary to tilt the image capturing unit 3, so even if it is applied to measure various (four) elements to be tested 6, The invention can still carry out precision detection smoothly, and significantly increases the measurement margin and the applicable range.
你:V、、第3及4圖所不，其揭示本發明第二實施例 之物件外周面檢測裝置。相較於第— =像反射元件!、光源模組2及影像操取單元3二 則可選擇相對鄉敍射元件丨置先輸送機構5’ :二=Γ降之動作，如此該輸送機構5,可承載 及心升該相讀6，频送機構5，之精 滑塊、齒輪、螺旋或油壓等升降 >廷自 件卜直至該待測元件6進=::^^^ ，漏斗狀_面14 ’以取得該待測元^^ 13亚對位 影像。藉此，本發明提供另一種量 之卜。p反射 進行精密檢測、增加量測裕度。、式，其同樣可順利 CALimlaM'K ΙΆΙ\ΡΚ90^ doc —12 ~ 05/12/28/1 |;>i 1280361 如上所述，相較於習用之五金零件檢測機造利用該 影像擷取單元以傾斜角度取得該待測元件影像，使得該取 得之局部傾斜影像缺乏完整性與精確性，進而導致無法有 效提升该五金零件檢測機之量測精度及簡化量測步驟之功 t 效等缺點，本發明之第1圖藉由-影像反射元件1之倒錐 反射空間13的漏斗狀倒錐面14將該待測元件仏烟度 卜，面凡整的呈現於該漏斗狀倒錐面14 i，其確實可提 • 升！測精度、簡化檢測步驟及增進檢測效率。 雖，本發明已利用上述較佳實施例揭示，然其並非 铲袖,2柄明，任何熟習此技藝者，在不脫離本發明之 ：續二祀，之内’當可作各種更動與修改 ，因此本發明之 嗎储闕當視後附之申物範_界定者為準。You: V, Figs. 3 and 4, which disclose the outer peripheral surface detecting device of the object according to the second embodiment of the present invention. Compared with the first -=image reflection element!, the light source module 2 and the image manipulation unit 3, the first transmission element 5' can be selected as the first delivery mechanism 5': the second = the lowering action, so the conveying mechanism 5 , can carry and rise the phase reading 6, frequency sending mechanism 5, fine slider, gear, screw or oil pressure, etc., from the piece until the component to be tested 6 into =:: ^^^, funnel Shape_face 14' to obtain the sub-alignment image of the object to be tested. Thus, the present invention provides another measure. p reflection Performs precise detection and increases measurement margin. , the formula, it can also be smooth CALimlaM'K ΙΆΙ \ ΡΚ 90 ^ doc — 12 ~ 05/12/28 / 1 |; > 1280361 As described above, compared to the conventional hardware parts inspection machine The unit obtains the image of the device to be tested at an oblique angle, so that the obtained partial tilt image lacks integrity and accuracy, thereby leading to the inability to effectively improve the measurement accuracy of the hardware component inspection machine and simplify the measurement steps of the measurement step. In the first embodiment of the present invention, the funnel-like inverted tapered surface 14 of the inverted cone reflecting space 13 of the image reflecting element 1 is used to display the smoke of the element to be tested, and the surface of the funnel-shaped inverted tapered surface 14 is presented. i, it really can be raised! Accuracy, simplified detection steps and improved detection efficiency. Although the present invention has been disclosed by the above-described preferred embodiments, it is not a shovel sleeve, and the handle of the present invention can be used for various changes and modifications without departing from the invention. Therefore, the present invention is subject to the definition of the object attached to it.
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05/12/28/11:^0 AM — 13 —— 128036105/12/28/11:^0 AM — 13 —— 1280361
【圖式簡單說明】 第1圖：本發明第一實施例之物件外周面檢測裝置之 侧視圖。 第2圖：本發明第一實施例之物件外周面檢測裝置在 進行檢測作業之側視圖。 第3圖：本發明第二實施例之物件外周面檢測裝置之 側視圖。 第4圖··本發明第二實施例之物件外周面檢測裝置在 進行檢測作業之側視圖。 【主要元件符號說明】 影像反射元件 11 上開口 12 下開口 14 漏斗狀倒錐面 21 光源 3 影像擷取單元 4’基座 41’支架 5’輸送機構 6’ 待測元件 13 倒錐反射空間 2 光源模組 22 半透鏡片 4 基座 41 可動式量測座 5 輸送機構 6 待測元件BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a side view of an outer peripheral surface detecting device of an object according to a first embodiment of the present invention. Fig. 2 is a side view showing the detecting operation of the outer peripheral surface detecting device of the first embodiment of the present invention. Fig. 3 is a side view showing the outer peripheral surface detecting device of the object according to the second embodiment of the present invention. Fig. 4 is a side view showing the object peripheral detecting device of the second embodiment of the present invention. [Main component symbol description] Image reflection element 11 Upper opening 12 Lower opening 14 Funnel-shaped inverted cone surface 21 Light source 3 Image capturing unit 4' Base 41' Bracket 5' conveying mechanism 6' Element to be tested 13 Reverse cone reflection space 2 Light source module 22 Half lens sheet 4 Base 41 Movable measuring seat 5 Transport mechanism 6 Components to be tested