TWI266910B - Embedded waveguide detectors - Google Patents
Embedded waveguide detectorsInfo
- Publication number
- TWI266910B TWI266910B TW093115564A TW93115564A TWI266910B TW I266910 B TWI266910 B TW I266910B TW 093115564 A TW093115564 A TW 093115564A TW 93115564 A TW93115564 A TW 93115564A TW I266910 B TWI266910 B TW I266910B
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor layer
- forming
- trench
- doped
- substrate
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 abstract 10
- 239000000758 substrate Substances 0.000 abstract 4
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/12004—Combinations of two or more optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/028—Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic System
- H01L31/0288—Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic System characterised by the doping material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
- H01L31/105—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the PIN type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
- H01L31/1812—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System including only AIVBIV alloys, e.g. SiGe
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B2006/12035—Materials
- G02B2006/12061—Silicon
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US47414503P | 2003-05-29 | 2003-05-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200513694A TW200513694A (en) | 2005-04-16 |
TWI266910B true TWI266910B (en) | 2006-11-21 |
Family
ID=33551479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093115564A TWI266910B (en) | 2003-05-29 | 2004-05-31 | Embedded waveguide detectors |
Country Status (7)
Country | Link |
---|---|
US (3) | US7075165B2 (zh) |
EP (1) | EP1636615A4 (zh) |
JP (1) | JP2007516607A (zh) |
KR (1) | KR20060033721A (zh) |
CN (1) | CN1856860A (zh) |
TW (1) | TWI266910B (zh) |
WO (1) | WO2005001519A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI411120B (zh) * | 2009-06-30 | 2013-10-01 | Intel Corp | 側壁光偵測器 |
Families Citing this family (27)
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WO2005033784A1 (ja) * | 2003-10-03 | 2005-04-14 | Ntt Electronics Corporation | 半導体光電子導波路 |
JP2006133723A (ja) * | 2004-10-08 | 2006-05-25 | Sony Corp | 光導波モジュール及び光・電気複合デバイス、並びにこれらの製造方法 |
US7329556B2 (en) * | 2004-12-30 | 2008-02-12 | Korean Electronics Technology Institute | High-sensitivity image sensor and fabrication method thereof |
US20070170476A1 (en) * | 2006-01-20 | 2007-07-26 | Giziewicz Wojciech P | Lateral photodetectors with transparent electrodes |
US7553687B2 (en) * | 2006-06-28 | 2009-06-30 | Intel Corporation | Dual seed semiconductor photodetectors |
EP2051294A3 (en) * | 2007-10-16 | 2012-10-31 | Honeywell International Inc. | Hypersensitive sensor comprising SOI flip-chip |
US20090170256A1 (en) * | 2007-12-26 | 2009-07-02 | Texas Instruments Incoporated | Annealing method for sige process |
DE102008011816B4 (de) * | 2008-02-29 | 2015-05-28 | Advanced Micro Devices, Inc. | Temperaturüberwachung in einem Halbleiterbauelement unter Anwendung eines pn-Übergangs auf der Grundlage von Silizium/Germaniummaterial |
US8290325B2 (en) * | 2008-06-30 | 2012-10-16 | Intel Corporation | Waveguide photodetector device and manufacturing method thereof |
US7858503B2 (en) * | 2009-02-06 | 2010-12-28 | Applied Materials, Inc. | Ion implanted substrate having capping layer and method |
US8178430B2 (en) | 2009-04-08 | 2012-05-15 | International Business Machines Corporation | N-type carrier enhancement in semiconductors |
WO2011011393A1 (en) * | 2009-07-20 | 2011-01-27 | Mcmaster University | Optical modulators employing charge state control of deep levels |
US20110186940A1 (en) * | 2010-02-03 | 2011-08-04 | Honeywell International Inc. | Neutron sensor with thin interconnect stack |
US8304272B2 (en) | 2010-07-02 | 2012-11-06 | International Business Machines Corporation | Germanium photodetector |
US8310021B2 (en) | 2010-07-13 | 2012-11-13 | Honeywell International Inc. | Neutron detector with wafer-to-wafer bonding |
US8545689B2 (en) | 2010-09-02 | 2013-10-01 | International Business Machines Corporation | Gallium electrodeposition processes and chemistries |
US20120055612A1 (en) | 2010-09-02 | 2012-03-08 | International Business Machines Corporation | Electrodeposition methods of gallium and gallium alloy films and related photovoltaic structures |
WO2013066325A1 (en) * | 2011-11-02 | 2013-05-10 | Intel Corporation | Waveguide avalanche photodetectors |
JP5831165B2 (ja) * | 2011-11-21 | 2015-12-09 | 富士通株式会社 | 半導体光素子 |
JP6648008B2 (ja) | 2013-06-12 | 2020-02-14 | マサチューセッツ インスティテュート オブ テクノロジー | 光変調器、波長分割多重システムおよび光変調器デバイス |
WO2017058319A2 (en) * | 2015-06-30 | 2017-04-06 | Massachusetts Institute Of Technology | Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same |
US11105974B2 (en) | 2015-06-30 | 2021-08-31 | Massachusetts Institute Of Technology | Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same |
KR102601212B1 (ko) | 2018-10-10 | 2023-11-10 | 삼성전자주식회사 | 광전 소자를 포함하는 집적 회로 소자 |
CN112750847A (zh) * | 2019-10-31 | 2021-05-04 | 台湾积体电路制造股份有限公司 | 半导体装置及其形成方法 |
US11641003B2 (en) * | 2019-12-03 | 2023-05-02 | Northwestern University | Methods of fabricating planar infrared photodetectors |
EP4136678A1 (en) * | 2020-04-17 | 2023-02-22 | The Regents of University of California | Method for removing a device using an epitaxial lateral overgrowth technique |
US11624941B2 (en) | 2020-06-11 | 2023-04-11 | Massachusetts Institute Of Technology | Bipolar junction transistor optical modulator |
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US3968450A (en) * | 1974-03-29 | 1976-07-06 | Sony Corporation | Transistor amplifier |
JPS5638064B2 (zh) * | 1974-04-02 | 1981-09-03 | ||
JPS5646267B2 (zh) * | 1974-05-10 | 1981-10-31 | ||
EP0067566A3 (en) * | 1981-06-13 | 1985-08-07 | Plessey Overseas Limited | Integrated light detection or generation means and amplifying means |
US4486765A (en) * | 1981-12-07 | 1984-12-04 | At&T Bell Laboratories | Avalanche photodetector including means for separating electrons and holes |
JPS63224252A (ja) * | 1987-02-06 | 1988-09-19 | シーメンス、アクチエンゲゼルシヤフト | 導波路−ホトダイオードアレー |
JPH0226083A (ja) * | 1988-07-15 | 1990-01-29 | Sumitomo Electric Ind Ltd | プレーナ型受光素子及びその製造方法 |
US5122852A (en) * | 1990-04-23 | 1992-06-16 | Bell Communications Research, Inc. | Grafted-crystal-film integrated optics and optoelectronic devices |
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US6011271A (en) * | 1994-04-28 | 2000-01-04 | Fujitsu Limited | Semiconductor device and method of fabricating the same |
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US5793913A (en) * | 1996-07-10 | 1998-08-11 | Northern Telecom Limited | Method for the hybrid integration of discrete elements on a semiconductor substrate |
JP2833588B2 (ja) * | 1996-07-30 | 1998-12-09 | 日本電気株式会社 | フォトディテクタおよびその製造方法 |
JP3016371B2 (ja) * | 1997-03-26 | 2000-03-06 | 日本電気株式会社 | 光検出器の製造方法 |
JPH10290023A (ja) * | 1997-04-15 | 1998-10-27 | Nec Corp | 半導体光検出器 |
JPH11238902A (ja) * | 1998-02-19 | 1999-08-31 | Nec Corp | 半導体光検出装置及び半導体光検出装置の製造方法 |
FR2791810B1 (fr) * | 1999-03-31 | 2001-06-22 | France Telecom | Procede de fabrication d'une heterostructure planaire |
GB2351390A (en) * | 1999-06-16 | 2000-12-27 | Sharp Kk | A semiconductor material comprising two dopants |
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DE10134938A1 (de) * | 2001-07-18 | 2003-02-06 | Bosch Gmbh Robert | Halbleiterbauelement sowie ein Verfahren zur Herstellung des Halbleiterbauelements |
AU2002356330A1 (en) * | 2001-12-27 | 2003-07-30 | Bookham Technology Plc | An in-line waveguide photo detector |
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KR100460703B1 (ko) * | 2002-08-21 | 2004-12-09 | 한국전자통신연구원 | 일체화된 광송수신 모듈과 광도파로를 구비하는 광백플레인 |
US6713365B2 (en) * | 2002-09-04 | 2004-03-30 | Macronix International Co., Ltd. | Methods for filling shallow trench isolations having high aspect ratios |
JP2007503130A (ja) * | 2003-05-29 | 2007-02-15 | アプライド マテリアルズ インコーポレイテッド | 不純物に基づく導波路検出器 |
US20050214964A1 (en) * | 2003-10-07 | 2005-09-29 | Applied Materials, Inc. Patent Counsel, Legal Affairs Dept. | Sige super lattice optical detectors |
-
2004
- 2004-05-28 EP EP04776187A patent/EP1636615A4/en not_active Withdrawn
- 2004-05-28 JP JP2006533517A patent/JP2007516607A/ja active Pending
- 2004-05-28 CN CNA2004800145541A patent/CN1856860A/zh active Pending
- 2004-05-28 KR KR1020057022858A patent/KR20060033721A/ko not_active Application Discontinuation
- 2004-05-28 US US10/856,750 patent/US7075165B2/en not_active Expired - Fee Related
- 2004-05-28 WO PCT/US2004/017061 patent/WO2005001519A2/en active Application Filing
- 2004-05-31 TW TW093115564A patent/TWI266910B/zh not_active IP Right Cessation
-
2006
- 2006-07-10 US US11/484,009 patent/US20070018270A1/en not_active Abandoned
-
2009
- 2009-04-08 US US12/420,558 patent/US20090269878A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI411120B (zh) * | 2009-06-30 | 2013-10-01 | Intel Corp | 側壁光偵測器 |
Also Published As
Publication number | Publication date |
---|---|
WO2005001519A3 (en) | 2006-04-06 |
US20090269878A1 (en) | 2009-10-29 |
KR20060033721A (ko) | 2006-04-19 |
WO2005001519A2 (en) | 2005-01-06 |
US20050051767A1 (en) | 2005-03-10 |
CN1856860A (zh) | 2006-11-01 |
EP1636615A4 (en) | 2007-03-14 |
JP2007516607A (ja) | 2007-06-21 |
EP1636615A2 (en) | 2006-03-22 |
TW200513694A (en) | 2005-04-16 |
US7075165B2 (en) | 2006-07-11 |
US20070018270A1 (en) | 2007-01-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |