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測用板針，尤指一種係在探針的 方式設有一彈性體，並在探針底 於電路測試機之導線所構成的檢 以彈性伸縮作動形態實施檢測運 作更形簡潔、方便與經濟之效， 更為節省、導電性更佳及訊號更 〇 待測點 元件或 俾藉以 間所採 等待測 設置有 底面之 方係設 ’而該 導通。 係預先 應放置 之待測 路或不 之諸待 五、發明說明（1) 〔本發明所屬之技術領域 本發明係有關一種檢 上、下端之間以一體成型 端位置直接裝接有一連設 測用探針。藉以，該必需 作的探針，將不但具有製 尤其’更是具有構成材料 不失真的積極效果提供者 〔先前技術〕 按，一般具有複數個 印刷電路板、半導體封裝 一種專用治具予以檢測， 路現象。又，按習知產業 、半導體封裝元件或晶圓 所示，係在一治具1 〇上表 探針2 0且係配合待測物3 〇 設置；另，在治具1 〇的下 的四周乃係配置有接頭1 2 機之排線（圖未示）相連接 當檢測待測物3 0時， 接頭1 2，續將待測物3 〇對 由探針20與待測物30底面 可顯示待測物3 0是否有斷 又，為使該待測物3 0 (如電子元件接點）的諸如 晶圓等製成後，均需透過 確認是否為良品或有無斷 用檢測該諸如印刷電路板 物的方式，大抵如第一圖 若干支探針20，該若干支 各待測點（圖未示）的位置 有一底座11，及在底座11 等接頭1 2且係與電路測試 將電路測試機之排線插入 在治具1 0的探針2 〇上，藉 點接觸後，電路測試機便 良等現象。 測點的檢測具有確實性，The test pin, especially an elastic body attached to the probe, is mounted on the probe under the wire of the circuit tester, and the test operation is carried out with elastic expansion and contraction. The operation is more compact, convenient and economical. It is more efficient, more economical, better conductive, and more reliable. The point component to be tested or the system that has a bottom surface is used to wait for the test. It is the road to be tested or not to be placed in advance. V. Description of the invention (1) [Technical field to which the present invention belongs The present invention relates to a kind of testing device that is directly connected to the upper and lower ends with an integral molding position. With a probe. Therefore, the necessary probe will not only have the system, but also the positive effect of the material without distortion. [Previous technology] According to the general, there are a number of printed circuit boards, a special package for semiconductor packaging to test, Road phenomenon. In addition, as shown in the conventional industry, semiconductor package components, or wafers, the probe 20 is attached to a jig 10, and is set to cooperate with the object to be tested 30. In addition, it is arranged around the lower part of the jig 10. It is connected with a cable (not shown) equipped with a connector 12 when the test object 30 is tested, the connector 12 is continued, and the test object 30 is continued. The pair of probes 20 and 30 can be measured from the bottom surface. Shows whether the object under test 30 is broken or not. In order to make the object under test 30 (such as electronic component contacts) such as wafers, it is necessary to test whether the product is printed or not by checking whether it is good or broken. The way of the circuit board object is probably as shown in the first figure. Several probes 20 have a base 11 at the positions of the points to be tested (not shown), and connectors 12 such as the base 11 are connected to the circuit to test the circuit. The cable of the testing machine is inserted into the probe 20 of the fixture 10, and the circuit testing machine will be fine after borrowing a point of contact. The detection of the measuring points is reliable,
第5頁 五、發明說明（2) ____ 及為了使待測物3 〇下麼於描斜？ n眚力 待測點传不合恭[=於^針2〇貫知檢測時，該探針20或 符劂點係不會發生被破壞之現象，該 ^ 可彈性伸縮作動。即，如第二、三圖叙針20且係設置主 分別插置在一探針套芮21 ^ n 4不，該諸探針2〇是 置定位在盘待= 該堵探針套筒21係分別插 H 諸探針套筒21的底端係分別按置ι導 ;並連e於相對應之接，及在裡部二按二一導彈 貫2 3，而探針2 〇插入探針套筒2 1德，A ’、又 頂承而可產生彈性伸；：；? “底端並恰為彈菁23 可達：：:上述該探針的設成暨其按置的方式，確實 叮達到檢測待測物的應時效果，惟，在歷妹 卻明顯的發覺有下述缺失可待改善，gp ; 後’業者 以頂疋的插孔131位置將必需逐一按置—探 首1裡部乃必需設置有彈簣23，然，由於該檢測 21直徑俜連yf極細，故該提供其插置容納的探針套筒 然的，不但在彈菁23製作的成本】=較 帶且；較;=裝於探針套筒21的實施性而言，該亦是連 八心為複雜、繁瑣、不便與不經濟之現象。 ^ ' Λ"'/ ^ l+ 2 0 # ^ ^ ^ ^ ^ ^ ^'J ^ 3 0 t T 1 八H r動作，及該頂承的彈簧23又係極細而會有使用壽 : = 故-旦彈㈣生斷裂或彈性疲 令別物的檢測效果便必然會有大打折扣之情事發生。 1237337 五、發明說明（3) 3、套1/套=1探及?I提供檢測效果，該包含構件之探 較為麻煩'、==22’除了在製作、組裝上係有 有相對增加之不經濟之】7外，對於整體使用的材料亦 構件，除了探針/之由於該導使探針20發揮檢測效果的 = 2:1間；訊號的導線22,又係= 較長之長度等情Γΐ§亥捲繞成型的彈簣23又係具有 寻if 1下’自然的，該產生 ，而有產生導電性# #i Μ A ,座生的阻抗必然會較大 當缺，：：ίΐ 檢測訊號發生失真之虞。 如第四:、五2 缺失’此間業者亦曾提供出-種 的探針套筒=;探針構造，其主要係將原供彈菁容納 及私針20下端穿過數層夾板4 c插孔131並為彈簧23頂端的丄 導線22則係將—端直接設於彈箬以底 係 以 於電路檢測機桩 — 另知係直接連接 將可經由彈笼2S道藉以，該探針20對待測物檢測的訊號 2 Ϊ 導線22而直接傳輪到電路測試機。 ^ W，是種設成方式，由於係省略 故在製作上除了較習知具有直接的 5方，由於該探針20及彈簧23係不 達改善效果;彈：二二與不經濟的缺失亦可 田…、該彈頁23係可藉以設為較大的情形下 第7頁 1237337 五、發明說明（4) ::有易、經濟及使用壽命較為延長的效果者 不足的缺：Γ:可ΐ力業者亦發現該仍有些許美中 待且义品加以改善，即； 9/1 由於該祛針20仍然必需藉助另設的彈筈23及承坡 頂承配合方具彈性伸缩作動性，故上、 ‘ =生=成本增力…各構件必需3 的麻煩、不便與不經濟性。 衣作、、且裝 22亦是連接於電路測試 蛀等間接構件，且該導線 檢測實施上，該構件之彈簣23之間，故在 繞成型之彈簧23係同樣具“dn點多’及該捲 加、導電性較差與檢測訊 ^進而造成阻抗增 到改善之效果。 易失真寺缺失，乃同樣無法達 導體封裝：ί::圓測:堵如印刷電路板、半 的美”缺失，而可予心m:顯然仍有實際實施上 待測物具有ί:上以確實且有效的改善’並使 並配合學理的運用，終於提二u ’發明人乃潛心精研 〔本發明之内容〕、於鈇供出本發明。 其中，藉目；：乃在，供-種檢測用探針， 並在探針底端直接裝接有一 d: 3型有-彈性體， 導線連5又於電路測試機，則探 1237337 五、發明說明（5) 針分別定位於針板插孔實施檢測 接提供探針彈性伸縮的作動性，同時，該彈性體自可直 直接經由導線準確的傳輸至電路；=，該檢測的訊號亦可 本發明之另-目的，乃在提供f機者。 ，藉該探針與彈性體係一體成型，種檢'則用探針，其中 效果的實施，不但在製作、組裝上j = f針達到彈性伸縮 方便、快速及經濟之效，同_，就：：：具有更形簡易、 可達到實質節省而具經濟性的積=材料而言，該亦 本發明之進一目的，乃在提供一 輸訊號的導線又係直接連設於探針與電路测試=孩傳 不透過間接構件，則實施檢測運作 待’二而 號自叮以較不失真的極佳準確性傳輸於電路測試機者。 為使貴審查委員對於本發明之目的、特徵及功效 更進一步的了解與認同，茲配合圖式詳細說明於后： 〔本發明之實施方式〕 σ 首先’請參閱第六圖所示，清晰顯示，本發明一種 測用探針，係指在探針2 〇的上、下端之間一體成型有一 ^ 性體20 2，並藉以形成上段探測部2〇3與下段接線部2〇4， 及在探針20下端接線部2 〇4位置係連設有一導線22所構成 。其中，該成型於探針20之彈性體2 02的形狀，乃係以可 致探針20上、下端產生彈性伸縮作動的任何形狀均可，如 第六、七、八、九、十圖所示之實施例，係可分別設為螺 旋形或Ζ字形或半弧形或s形或波浪形· ··等各種形狀Page 5 V. Explanation of the invention (2) ____ and in order to make the object under test 30 ° oblique? The force to be measured is disproportionate to the point [= at ^ pin 20, the probe 20 or the run-in point will not be destroyed during the detection, and the ^ can be flexibly retracted. That is, as shown in the second and third illustrations of the needle 20, the main probes are respectively inserted into a probe cover 21 ^ n 4 No, the probes 20 are placed and positioned on the disk waiting = the plug probe sleeve 21 The bottom ends of the probe sleeves 21 are inserted respectively, and are respectively connected to the corresponding ends, and the two are guided by the 21 missiles in the inside, and the probe 2 is inserted into the probe. Sleeve 21, Germany, A ', can bear the elastic extension ;: "? The bottom end is exactly the elastic Jing 23 reachable ::: The above-mentioned setting of the probe and the way it is placed, indeed Ding achieves the timely effect of detecting the test object, but in Limei, it is obvious that there are the following defects that need to be improved, gp; the operator's position 131 with the jack 131 will have to be pressed one by one-Probe 1 The inner part must be provided with a bomb 23, however, because the diameter 21 of the detection 21 is extremely thin, so it is necessary to provide a probe sleeve for its insertion and accommodation, not only the cost of making the bomb 23] ; Compared to; = In terms of the implementation of the probe sleeve 21, it is also complicated, cumbersome, inconvenient and uneconomical. ^ 'Λ "' / ^ l + 2 0 # ^ ^ ^ ^ ^ ^ ^ 'J ^ 3 0 The action of t T 1 and eight H r, and the spring 23 of the top bearing are extremely thin and have a longevity: = Therefore, the detection effect of the fracture caused by elastic fracture or elastic fatigue will inevitably cause a great discount. 1237337 V. Description of the invention (3) 3. Set 1 / set = 1 probe and? I provide detection effect, the probe containing the component is more troublesome, '== 22' except for the relative increase in production and assembly. Economical] 7 In addition, the material used for the whole is also a component, in addition to the probe / which caused the probe 20 to perform the detection effect = 2: 1; the signal wire 22, and the long = etc. Γ ΐ § The coil 23 formed by coil winding has the function of "if 1", which is natural, and there is conductivity # #i Μ A, the impedance of the base will inevitably be larger when it is:: ΐ The signal may be distorted. For example, the fourth: 5 and 2 are missing. 'The industry has also provided a probe sleeve of this kind =; probe structure, which is mainly used to accommodate the original supply of elastic crystal and the lower end of the private needle 20 The splint 4 c jack 131 is the top end of the spring 23 and the 丄 lead 22 is set at the end directly to the bottom of the spring. Testing machine pile-It is also known that the direct connection will be available through the cage 2S. The probe 20 will directly pass the signal 2 Ϊ wire 22 to the circuit test machine. ^ W is a design method. Because the system is omitted, in addition to being more straightforward in production, the probe 20 and the spring 23 are not able to improve the effect; the bullet: the lack of two or two and the uneconomical can also be field ..., the bullet 23 It can be set to be larger. Page 7 1237337 V. Description of the invention (4) :: Insufficient people who have the effect of easy, economical and longer service life: Γ: Ke Li also found that it is still a little bit beautiful Wait for the improvement of the goods, that is, 9/1. Because the needle 20 must still be elastically retractable with the help of the additional spring 23 and the bearing support of the slope, so, '= Health = Cost increase ... Each component must be cumbersome, inconvenient, and uneconomical. Clothing, and equipment 22 are also connected to indirect components such as circuit test cymbals, and in the implementation of the wire detection, the springs 23 of the component, so the formed spring 23 series also has "dn point more" and The rollup, poor conductivity, and detection signal ^ lead to the effect of increasing the impedance. The easy distortion temple is missing, but it is also unable to reach the conductor package: ί :: Circle measurement: plugging such as a printed circuit board, half the beauty "is missing, and Desirable m: Obviously there is still a practical implementation of the test object with: "A positive and effective improvement" and the use of scientific theory, finally mentioning u "The inventor is diligently refined [contents of the present invention] Yu Yu provided the invention. Among them, the head is: is, for-a kind of detection probe, and directly attached to the bottom of the probe with a d: 3 type-elastomer, the lead is connected to the circuit test machine, then explore 1237337 Description of the invention (5) The needles are respectively positioned at the pin plate jacks to perform the detection and provide the elastic expansion and contraction of the probes. At the same time, the elastic body can be directly transmitted to the circuit directly through the wire; =, the detection signal can also be Another object of the present invention is to provide a machine. The probe is integrated with the elastic system by using the probe, and the probe is used for the species inspection. The effect of the implementation is not only in the production and assembly of j = f needle, which achieves the elastic, convenient, rapid, and economical elasticity. :: It has a simpler shape, can achieve substantial savings, and is economical. Product = In terms of materials, a further object of the present invention is to provide a wire for transmitting signals directly connected to the probe and circuit test. = Child transmission does not pass through indirect components, and the detection operation is performed until the second transmission is transmitted to the circuit tester with excellent accuracy without distortion. In order for your reviewers to further understand and approve the purpose, features, and effects of the present invention, it is explained in detail below in conjunction with the drawings: [Embodiments of the present invention] σ First, please refer to the sixth figure for a clear display A probe for measurement according to the present invention refers to a body 20 2 integrally formed between the upper and lower ends of the probe 20, thereby forming an upper detection portion 203 and a lower connection portion 204, and A wire 22 is connected to the lower end of the probe 20 at a position of 204. Among them, the shape of the elastic body 202 formed in the probe 20 is any shape that can cause elastic expansion and contraction of the upper and lower ends of the probe 20, as shown in the sixth, seventh, eighth, nine, and ten figures. The embodiment shown can be set to various shapes such as spiral, zigzag, semi-arc, s-shaped, or wavy, etc.
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另，該導線22乃係在探針2〇 於探針2 0底端均可，而其結 綁固或套設等任何方式均可 定位於針板13之前或之後結合 合的方式係可以焊固或夾固或 明配合第十一圖所不，其係本發明探針按設定位於 =13實施例之斷面示意圖。其中，該針扣係設有下針 =31與上針板132，而其等乃係藉由治具預設之數定位導 ^的導引，❿逐一由下而上疊設在底座11上。即，該下 1 Q ^ 1 3 1主要係由一底板1 3 1 1、一中間板1 3 1 2及一蓋板 3組成，其等表面係分別設有相對應的插孔1 3 Η i、 、UUl ;其中，該中間板U12設有之插孔係 没為稍大徑並可容納探針2〇之彈性體2〇2，而底板1311、 盖板1313設有之插孔13111、13131乃係設為稍小徑並可分 別供探針20之下段接線部2〇4與上段探測部2〇3插設，及可 洽供彈性體202的下端與上端擋承，而該諸探針2〇插設定 位之位置則係與習知相同，係與待測物3〇之複數待測點呈 相對應為基。另，該上針板丨32係設有複數片，其等相互 疊設的厚度係依略小於探針2〇之上段探測部2〇3 了及在表 面係設有對應於待測物之待測點的插孔丨321，俾分別供探 =2 0之上段探測部2 〇 3穿設，並致該探測部2 〇 3的頂部係外 路於最上只上針板132的上表面。 上述，其中該上針板132設有之插孔1321及下針板13 1 之蓋板1 313設有的插孔13131，且可分別將下端孔徑設為 擴孔形狀（如喇叭口），俾便於探針2〇之上段探測 3安 1237337 五、發明說明（7) #七利用上述所構成的本發明，由於摈朴9 η μ η -Γ-端之間係成型有_强极髀9η9 田於铋針2〇的上、下 接線部204係可拉惮體。 上段探測部203與下段 裝設定位在* 二具有彈性伸縮的作動性’則當探針20 針20頂端時^並將待測物30之待測點下壓於外露的探 揮預期的=ϋ 該探⑽便可在彈性伸縮作動中發 針20之^ 與確實接觸待測點之效。又，由於該探 缩作動的it測部20 3、下段接線部m與促使其等彈性伸 =動=體2〇2係一體成型，而可產生較低的阻抗與 二=,導電性，及該職司訊號傳輸的導線2 2又係直接 又下焱接線部2 0 4，而非如習知必需透過其他間接構 體（如彈簧或探針套筒），而具直接減少接點之積極 效 則該探針2 0對待測物3 0檢測到的訊號將必然可以較 不失^的準確傳輸至電路測試機，進而致待測物實施檢測 ，作實，所需的預期準確性效果，可確實達到更為提高之 境者。。當然’由於本發明構成探針彈性伸縮作動及提供檢 測，號傳輸的構件係極少，故不但在製作的材料上係可大 為，省而具經濟性，就實際製作、組裝的實施性而言，該 亦疋明顯較習知具有更為簡易、方便、快速與經濟之效 者0 請參閱第十二圖所示，其係本發明探針20按設定位於 針板13另一實施例之斷面示意圖。其中，該探針2〇之上段 探測部20 3與下段接線部2〇4且可分別穿套一定位環套50 ’使分別位於彈性體20 2的上、下端，並在探針20按設於 針板13時恰定位在下針板13丨之底板插孔1311ι的上端預設In addition, the lead wire 22 may be located at the bottom of the probe 20 and the probe 20, and any method of binding, binding, or setting can be positioned before or after the needle plate 13 is bonded. The solid or clamped or Ming fits the eleventh figure, which is a schematic cross-sectional view of the probe of the present invention at the setting of = 13. Among them, the pin buckle is provided with a lower needle = 31 and an upper needle plate 132, and the other is guided by a preset positioning guide of the jig, which is stacked on the base 11 one by one from the bottom up. . That is, the lower 1 Q ^ 1 3 1 is mainly composed of a bottom plate 1 3 1 1, an intermediate plate 1 3 1 2 and a cover plate 3, and the corresponding surfaces are respectively provided with corresponding jacks 1 3 Η i , UUl; among them, the jack provided in the middle plate U12 is not an elastic body 202 which has a slightly larger diameter and can accommodate the probe 20, and the base plate 1311 and the cover plate 1313 have jacks 13111 and 13131. It is set to have a small diameter and can be inserted for the lower section wiring section 204 and the upper section detection section 203 of the probe 20, and the lower and upper ends of the elastomer 202 can be contacted. The probes The position of the 20 interpolation setting position is the same as the conventional one, which is based on the plurality of test points of the test object 30. In addition, the upper needle plate 32 is provided with a plurality of pieces, and the thickness of each other is slightly smaller than that of the upper part of the probe 20, and the surface corresponding to the object to be measured is provided. The jacks of the measuring points 321, 俾 are respectively provided for detecting = 20, and the upper part of the detecting part 200 is passed through, so that the top of the detecting part 200 is outwardly routed to the upper surface of the uppermost needle plate 132. As mentioned above, the jack 1321 provided in the upper needle plate 132 and the jack 13131 provided in the cover 1 313 of the lower needle plate 13 1, and the lower hole diameter can be set as an enlarged hole shape (such as a bell mouth). It is easy to detect the upper part of the probe 20. 3A 1237337 V. Description of the invention (7) # 七 Using the present invention constituted as above, since the 摈 朴 9 η μ η -Γ-terminus is formed with _ strong pole 髀 9η9 田The upper and lower connecting portions 204 on the bismuth needle 20 are pulverized bodies. The upper detection section 203 and the lower section are set at * 2. It has elastic expansion and contraction. 'When the probe 20 is at the top of the needle 20, it will press the test point 30 of the test object 30 to the exposed detection point. The probe can effectively make the hair pin 20 contact the point to be measured in the elastic telescopic action. In addition, because the it measuring section 20 3 of the exploration actuation is integrally formed with the lower-end wiring section m and the elastic extension = dynamic = body 202, it can generate lower impedance and electrical conductivity, and The conductor's signal transmission line 22 is directly and directly connected to the wiring portion 204, instead of having to directly reduce the contact through other indirect structures (such as springs or probe sleeves) as is known. In principle, the signal detected by the probe 20 to the test object 30 will inevitably be transmitted to the circuit tester accurately without losing ^, which will cause the test object to perform the test, and the expected accuracy effect required, It is indeed possible to reach a higher level. . Of course, 'as the present invention constitutes the probe's elastic expansion and contraction operation and provides detection, there are very few components of the number transmission, so it can not only be large in the materials produced, save provinces and be economical, but also in terms of the actual production and assembly This is obviously easier, more convenient, faster and more economical than the conventional ones. Please refer to the twelfth figure, which is a cut of another embodiment of the probe 20 of the present invention located on the needle plate 13 according to the setting.面 Schematic. Among them, the probe 20 has an upper section detection section 20 3 and a lower section connection section 204 and can be respectively sleeved with a positioning ring sleeve 50 ′ so as to be respectively located at the upper and lower ends of the elastic body 20 2, and the probe 20 is set according to the settings. At the time of the needle plate 13, it is precisely positioned at the upper end of the bottom plate jack 1311 of the lower needle plate 13 丨
第11頁 1237337 五、發明說明（8) 擴孔D與蓋板插孔13 131的下端預設擴孔E，俾應使用之需 ’該探針20係可以該兩相對應之定位環套5〇的中心孔5 01 為伸縮作動的中心，進而致該蓋板插孔1 3 1 3 1與上針板插 孔1321係可藉以設為稍大，以因應探針2〇之上段探測部 2 0 3實施檢測所產生的斜率者。 乡;τ'上所述’本發明一種檢測用探針，顯然對於諸如印 刷電路板、半，體封裝元件或晶圓等具有複數個待測點之 待測物的檢測實施，具有更符實際需要的新功能與 提供，其之設成雖不顯得複雜、繁瑣，然，整體的 想部深富實施孓具體性，且係目前同型產品所未見 5又 ，故誠已符合發明專利申請之要件，謹請 見的運用 審視並賜准專利，無任感禱。 貝惠予Page 11 1237337 V. Description of the invention (8) Reaming hole D and cover plate socket 13 131 are preset with a reaming hole E. It should be used if necessary. The probe 20 can be the two corresponding positioning rings 5 The center hole 5 01 is the center of the telescoping action, so that the cover hole 1 3 1 3 1 and the upper pin plate hole 1321 can be set to be slightly larger to correspond to the upper detection portion 2 of the probe 2 0 3 The slope produced by the detection. Township; τ 'described above,' A detection probe of the present invention is obviously more practical for the detection of a test object having a plurality of test points, such as a printed circuit board, a half-body package, or a wafer. The required new functions and supplies are not complicated or cumbersome. However, the overall thinking department is rich in implementation and concrete, and it has not been seen in similar products at present. Therefore, it has been in line with the invention patent application. Requirements, I would like to see the application review and grant a patent, without any prayer. Bei Huiyu
1237337 圖式簡單說明 第一圖係 第二圖係 第三圖係 第四圖係 第五圖係 第六圖係 第七圖係 第八圖係 第九圖係 第十圖係 第Η 圖 圖。 第十二圖 圖。 習知複合式仏 習知探斜^治具暨待測物之立體示意圖。 第二圖所邊探針套筒、導線之立體示意圖。 習知探鉦布探針構件按設於針板之平面示意圖。 第四圖所暨彈簧、導線之立體示意圖。 本發明斤不探針構件按設於治具之平面示意圖。 本發明探::之立體示意圖（一）。 本發明立體示意圖(二)。 本發明探：之立體不意圖(三）° 太淼nn 十之立體不意圖（四）。 孫太!探針之立體示意圖（五）。 ’、 發明探針設於針板實施例（一）之平面示意 係本發明探針設於針板實施例（二）之平面示意 圖號說明： 10 ·治具11 :底座12 :接頭 1 3 :針板 1 3 1 :下針板 1 31 1 :底板 1 31 2 :中間板 1 31 3 :蓋板 1 3 111 (1 3 1 2 1、1 3 1 3 1):插孔 1 3 2 :上針板 1 3 2 1 :插孔 20 :探針 20 2 :彈性體 203 :探測部 204 :接線部 21 :探針套筒 22 :導線 23 :彈簧 3 0 ·待測物 5 0 :定位環套 5 01 :中心孔1237337 Brief description of the drawings The first picture system The second picture system The third picture system The fourth picture system The fifth picture system The sixth picture system The seventh picture system The eighth picture system The ninth picture system The tenth picture system The second picture image. Twelfth figure Figure. Known compound 仏 Learned oblique ^ fixture and three-dimensional schematic diagram of the test object. The three-dimensional schematic diagram of the probe sleeve and the lead shown in the second figure. The conventional probe cloth probe member is a schematic plan view provided on a needle plate. The fourth diagram shows the three-dimensional schematic diagram of the spring and the wire. The present invention is a schematic plan view of a probe assembly provided on a jig. The present invention explores the three-dimensional schematic diagram of (1). Three-dimensional schematic diagram of the present invention (two). The present invention explores: the three-dimensional unintended (three) ° Tai Miao nn ten the three-dimensional unintended (four). Sun Tai! Three-dimensional diagram of the probe (five). ', The schematic diagram of the embodiment of the invention where the probe is provided on the needle plate (a) is the schematic diagram of the embodiment of the invention where the probe is provided on the needle plate (b): 10 · Fixture 11: base 12: connector 1 3: Needle plate 1 3 1: Lower needle plate 1 31 1: Base plate 1 31 2: Middle plate 1 31 3: Cover plate 1 3 111 (1 3 1 2 1, 1 3 1 3 1): Jack 1 3 2: Up Needle plate 1 3 2 1: Socket 20: Probe 20 2: Elastomer 203: Detection section 204: Wiring section 21: Probe sleeve 22: Lead wire 23: Spring 3 0 · Test object 5 0: Positioning ring sleeve 5 01: Center hole
第13頁 1237337 圖式簡單說明 A :定位導柱 D :擴孔 E :擴孔 第14頁Page 13 1237337 Brief description of drawings A: Positioning guide D: Reaming E: Reaming