TWI226098B - Multi-purpose stage in substrate inspection apparatus - Google Patents
Multi-purpose stage in substrate inspection apparatus Download PDFInfo
- Publication number
- TWI226098B TWI226098B TW092127110A TW92127110A TWI226098B TW I226098 B TWI226098 B TW I226098B TW 092127110 A TW092127110 A TW 092127110A TW 92127110 A TW92127110 A TW 92127110A TW I226098 B TWI226098 B TW I226098B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- guide
- item
- scope
- device described
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2003-0044608A KR100530982B1 (ko) | 2003-07-02 | 2003-07-02 | 기판 검사장치용 멀티 스테이지 |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI226098B true TWI226098B (en) | 2005-01-01 |
TW200503142A TW200503142A (en) | 2005-01-16 |
Family
ID=34587783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092127110A TWI226098B (en) | 2003-07-02 | 2003-09-30 | Multi-purpose stage in substrate inspection apparatus |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100530982B1 (ko) |
CN (1) | CN100505207C (ko) |
TW (1) | TWI226098B (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100670288B1 (ko) * | 2005-02-05 | 2007-01-16 | 삼성에스디아이 주식회사 | 기판 고정용 지그장치, 이를 구비한 누설전류 측정장치,및 누설전류 측정방법 |
KR100654808B1 (ko) * | 2005-07-01 | 2006-12-08 | 삼성전자주식회사 | 패널지지장치 |
KR100686100B1 (ko) * | 2005-07-20 | 2007-02-26 | 엘지전자 주식회사 | 이동통신기기용 액정표시장치의 충격 테스트용 지그 |
KR101290743B1 (ko) * | 2011-10-07 | 2013-07-29 | 삼성중공업 주식회사 | 곡가공용 부재고정장치 |
CN103399020A (zh) * | 2013-07-24 | 2013-11-20 | 惠晶显示科技(苏州)有限公司 | 玻璃检验装置 |
KR102007907B1 (ko) | 2016-07-26 | 2019-08-06 | 에이피시스템 주식회사 | 피처리물 지지 장치, 피처리물 처리 장치 및 피처리물 처리 방법 |
KR102184167B1 (ko) * | 2020-04-29 | 2020-11-27 | 가온솔루션 주식회사 | 검사장비용 워크 스테이지 |
-
2003
- 2003-07-02 KR KR10-2003-0044608A patent/KR100530982B1/ko not_active IP Right Cessation
- 2003-09-30 TW TW092127110A patent/TWI226098B/zh not_active IP Right Cessation
- 2003-10-08 CN CNB2003101001003A patent/CN100505207C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TW200503142A (en) | 2005-01-16 |
KR100530982B1 (ko) | 2005-11-28 |
CN1576827A (zh) | 2005-02-09 |
KR20050004434A (ko) | 2005-01-12 |
CN100505207C (zh) | 2009-06-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |