TW543112B - Substrate holding apparatus, substrate processing apparatus and substrate edge cleaning apparatus - Google Patents

Substrate holding apparatus, substrate processing apparatus and substrate edge cleaning apparatus Download PDF

Info

Publication number
TW543112B
TW543112B TW091107071A TW91107071A TW543112B TW 543112 B TW543112 B TW 543112B TW 091107071 A TW091107071 A TW 091107071A TW 91107071 A TW91107071 A TW 91107071A TW 543112 B TW543112 B TW 543112B
Authority
TW
Taiwan
Prior art keywords
substrate
square
mentioned
patent application
plate
Prior art date
Application number
TW091107071A
Other languages
Chinese (zh)
Inventor
Takayuki Sato
Yasuhiro Kawaguchi
Kouji Kizaki
Takeshi Taniguchi
Original Assignee
Dainippon Screen Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2001113614A external-priority patent/JP3971120B2/en
Priority claimed from JP2001113613A external-priority patent/JP2002313894A/en
Application filed by Dainippon Screen Mfg filed Critical Dainippon Screen Mfg
Application granted granted Critical
Publication of TW543112B publication Critical patent/TW543112B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02082Cleaning product to be cleaned
    • H01L21/02087Cleaning of wafer edges

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

The object of this invention is to provide the function so that the large and thin substrate can be moved upwardly and downwardly between the substrate processing height level and the substrate receiving height level. The substrate retaining platform 11 is constructed by mounting four sucking strips 111A, 111B, 111C, 111D smaller than the substrate S having four round corners on the cubic frame 112. A plurality of up-down pins 12 are installed in the substrate retaining platform 11 to facilitate the moving up or down The plurality of up-down pins 12 are used to support the central portion of substrate S form back side, and the substrate S can be moved upwardly and downwardly on the substrate retaining platform 11 by moving the up-down pins 12 upwardly and downwardly. In addition, when cleaning the edge portion of the substrate S, the central portion of the substrate S is supported by the up-down pins 12, and all the portions except central portion and edge portion are sucked and retained on the retaining platform 11.

Description

543112543112

五、發明說明(1) [發明所屬之技術領域] 本發明有關於用以保持方 備有該保持裝置之基板處理 置。方形基板是指液晶顯示 板用玻璃基板等之矩形之基 矩形’亦可以在基板端緣形 [習知之技術] 在液晶顯示裝置或半導體 膜形成步驟,在基板之表面 亞胺樹脂,彩色過濾器用染 表面形成薄膜。薄膜之形成 以外之有效區域内,但是在 會擴散到有效區域外之緣部 之不要之薄膜。此種不要之 時,例如由於摩擦到基板保 生剝離,成為發塵源。因此 除去基板緣部之不要之薄膜 要除去不要之薄膜時,使 板端緣洗淨裝置。在適用於 之方形基板之基板端緣洗淨 台’平面看成為與基板大致 小;和多根之升降梢,被配 述之基板保持台是在由連續 著孔,使附著有欲除去之不 形基板之基板保持裝置,和耳 袭置,以及基板端緣洗淨裂 裝置用玻璃基板和電漿顯示面 板。但是,不一定要為完全之 成孔口或凹口之欠缺部。 裝置之製造步驟中,包含有薄 塗布光抗蝕劑液,感光性聚醯 色劑等之藥液,用來在基板之 玲要只形成在基板之緣部區域 上述之薄膜形成步驟中,藥液 區域,在該緣部區域形成所謂 薄膜在基板搬運時或基板處3 持手臂等之各種處理機具而發 ,一般是在藥液塗布後洗淨^ 0 用用以洗淨基板之端緣部之基 如同液晶顯示裝置用玻璃基板 裝置中,具備有:基板保持 相似之形狀,其尺寸比基板稍 置成為包圍該基板保持台。上 平面構成之上面,具有多個吸 要之薄膜之基板之端緣部殘V. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a substrate processing apparatus for holding a substrate provided with the holding device. A square substrate refers to a rectangular base rectangle such as a glass substrate for a liquid crystal display panel. It can also be shaped at the edge of the substrate. [Known technology] In the liquid crystal display device or semiconductor film formation step, imine resin is used on the surface of the substrate, and color filters are used. A thin film is formed on the dyed surface. The thin film is formed in an unnecessary area other than the effective area, but will spread to the edge outside the effective area. When this is not necessary, for example, the substrate may be peeled off due to rubbing and become a source of dust. Therefore, to remove unnecessary film on the edge of the substrate, to remove unnecessary film, the device cleans the edge of the board. The substrate edge cleaning stage of the square substrate to which it is applied is substantially smaller than the substrate when viewed from the plane; and a plurality of lifting and lowering tips, and the substrate holding stage to be described is continuously perforated, so that the substrate to be removed is attached. The substrate holding device of the shaped substrate, the earphone, and the glass substrate and plasma display panel for the device for cleaning and cracking the edge of the substrate. However, it is not necessary to be a complete lack or a notch. The manufacturing steps of the device include a thin coating of a chemical solution such as a photoresist solution, a photosensitive polychromatic toner, and the like, which are used to form the substrate on the substrate only in the edge region of the substrate. In the liquid region, the so-called thin film is formed in the edge region. It is issued when the substrate is transported or the substrate is held with various processing tools. Generally, it is washed after the application of the chemical solution. ^ 0 It is used to clean the edge of the substrate. The base is similar to a glass substrate device for a liquid crystal display device, and includes a substrate that has a similar shape, and has a size slightly larger than the substrate to surround the substrate holding stage. On the upper surface of the upper surface, the edge of the substrate with a plurality of attractive films remains.

丄二 --— _ 五、發明說明(2) ^,彳欠基板背面之中央部 基板之背面,和從吸著基=背面之端緣部附近,支持 板。另外’利用例如包含"^丁排虱,用來吸著和保持基 進行上下移動。在基板保::之驅動機構使多根之升降梢 形成薄膜後之基板授給升二之^ =之基板授受高度,將丄 二 --- _ V. Description of the invention (2) ^, owing to the central portion of the back surface of the substrate, the back surface of the substrate, and the support plate from the vicinity of the end edge portion of the adsorption base = back surface. In addition, the use of, for example, a quotient containing ticks, is used to suck and hold the substrate to move up and down. In the substrate protection :: the driving mechanism makes a plurality of lift pins to form a film, the substrate is given to the second substrate ^ = the receiving height of the substrate,

V 裝載在基板保持台。對美技=,μ後,使升降梢下降用來 吸著和保持在基板保持之洗淨處理是在基板被 到不會妨礙對基板端緣部進這時,升降梢下降 淨處理之後,使升降梢上升’將:厂里之位置。在完成洗 到基板授受高度。 將基板保持台上之基板提升 i [發明所欲解決之問題] 薄型化具有’成為處理對象之基板之大型化和 型,基丄板Hi:處理對象之基板變為大 緣部會彎曲,會干掙:::!口大幅突出日寺,該突出之端 為其問題。 ' 緣部施加洗淨處理之洗淨頭 為著防止此稽P卩日s ^ ^ 基板之突出部減小之思:f板保持台大型& ’用來使 難以維持基板 ^ 疋當基板保持台大型化時, 外,要維持基板性’裝置成本會變高。另 固定部份會成為大和強度時’基板保持台之 另外,美:to 構造,會使裝置成本增加。 持。因此:在严被吸著在基板保持台之上面全體之狀態保 和基板保持台:二】,持台將基板剥離時,在基板 之間會產生多置之靜電’周圍之污染物質附V is mounted on the substrate holding stage. For the US technology =, μ, the lifting tip is lowered to attract and hold the substrate. The cleaning process is to lift and lower the lifting tip after the net is removed so that it does not prevent the edge of the substrate from entering. Tip up 'will: position in the plant. After finishing washing to the substrate receiving and receiving height. Lifting the substrate on the substrate holding table [Problem to be solved by the invention] Thinning has the size and shape of the substrate to be processed, and the base plate Hi: The substrate of the processing object will bend when it becomes a large edge. Dry earning :::! The mouth sharply highlights the Nichi-ji Temple, and the prominent point is its problem. 'The cleaning head with cleaning treatment at the edge is to prevent this problem. ^ ^ The projection of the substrate is reduced: f board holding stage is large &' used to make it difficult to maintain the substrate ^ 疋 when the substrate is held When the size of the platform is increased, the cost of the device will increase because the substrate is maintained. In addition, the fixed part will become the substrate holding stage of Yamato ’s strength. In addition, the to: structure will increase the cost of the device. hold. Therefore: In the state where the entire substrate is sucked on the substrate holding stage, the substrate holding stage is maintained. When the substrate is peeled off by the holding stage, a multiplicity of static electricity is generated between the substrates.

第6頁 C:\2D-00DE\91-〇7\9]]〇7〇7].ptd 543112Page 6 C: \ 2D-00DE \ 91-〇7 \ 9]] 〇7〇7] .ptd 543112

者在基板之可能性增大為其問題。 另外 在利用升降梢去ϋ 1. 構造中,當基板成為^寺基板端緣部用來使基板升降之 幅彎曲,I# ^ ί ί Ϊ 缚型時,升降梢上之基板會大 弓萌 在升降途中基板备P A II夂祕# γ i , 士 U , 為其問題。 3攸升降柏洛下,和使基板破裂 因此, 的是提供 將大型而 型而且薄 有此種基 另外, 基板吸著 保持在基 溶劑供給 緣部之不 t發明之目的用來解決上述之技術性問題,其目 土 :反保持裝置,可以以大致沿著水平面之狀態, 且薄型之基板保持在預定之高度,和可以使該大 型之基板良好的升降。《外,本發明亦提供具備 板保持裝置之基板處理裝置。 基t保持台被構建成為可以將具有多個吸著孔之 板安裝在固定框架之上端成為可裝卸之方式,被 板保持台之基板其端緣部從基板吸著板突出,將 到忒犬出之端緣部,利用溶劑用來溶解和除去端 要之薄膜。 為著要將溶劑良好的供給到基板之端緣部,所以基板端 緣部之從基板吸著台突出之量,必需使其突出部份i為= 會彎曲之程度(例如,從基板吸著板之端緣到基板端緣之 距離成為5 Omm以下)。因此,基板吸著板使用與處理對象 之基板之尺寸對應之大小者。例如,在處理對象之基板之 大小為55〇11111^65〇111111之情況,使用52〇_><62〇111111之基板吸 著板。另外,在處理對象之基板之大小為6〇〇mm χ 72〇_之 情況,使用570mmx 690mm之基板吸著板。 在上述方式之構造中’因為使基板吸著板可以接著/脫Increasing the possibility of users on the substrate is their problem. In addition, the lift pin is used to remove the structure. 1. In the structure, when the base plate becomes the edge of the base plate, the width of the lift plate is bent. I # ^ ί ί Binding type, the base plate on the lift pin will sprout. The board prepares PA II 夂 秘 # γ i, taxi U, which is the problem. It is necessary to lift and lower the substrate and break the substrate. Therefore, the purpose of the invention is to provide a large-sized and thin substrate with such a substrate. In addition, the substrate is adsorbed and held at the base solvent supply edge. The problem of the problem is that the anti-holding device can keep the thickness along the horizontal plane, and the thin substrate can be maintained at a predetermined height, and the large substrate can be raised and lowered well. In addition, the present invention also provides a substrate processing apparatus having a plate holding device. The base holding table is constructed so that a plate with a plurality of suction holes can be mounted on the upper end of the fixed frame to be detachable. The end edge of the substrate of the board holding table protrudes from the substrate holding plate and will reach The solvent is used to dissolve and remove the thin film at the end edge. In order to supply the solvent to the edge of the substrate, the amount of the edge of the substrate protruding from the substrate suction stage must be such that the protruding portion i is equal to the degree of bending (for example, suction from the substrate The distance from the edge of the board to the edge of the substrate is less than 5 mm). Therefore, as the substrate suction plate, a size corresponding to the size of the substrate to be processed is used. For example, in the case where the size of the substrate to be processed is 55〇11111 ^ 65〇111111, a substrate absorbing plate of 5200_ > < 62〇111111 is used. When the size of the substrate to be processed is 600 mm x 72 mm, a substrate suction plate of 570 mm x 690 mm is used. In the structure of the above method, because the substrate suction plate can be attached / detached

C:\2D-C0DE\91-07\91107071.ptd 543112 五、發明說明(4) f固定框架,所以經由依照處理對象 士板吸著板,可以使各種尺寸之基板成::之尺寸,更換 大型之基板吸著板 不便, U =對象。但是 白:工夫,和比較長之時間。在更換作匕:業時,需要大 如止,所以基板吸著板之更換需要長功I必需使裝置 轉率降低。另外,使用多個基板吸著板裝置之運 大問題。 4 ’成本亦會成為 因此,本發明用來解決上述之技術性 供基板保持裝置和具備該基板保持装置之美二目的是提 二’可以良好的保持多種尺寸之基板;r裝 寸之變更簡單的進行調整作業。 了 乂紋者基板尺 [解決問題之手段和發明之效杲] a = it述目的之申請專利範圍第1項之發明是-種 ^ ΪΓ ),其特徵是包含有:第1基板支持裝置 方方形基板⑻之背面,用來大致水平的將該 方形基板支持在預定之高度;第2基板支持裝置(12), 觸在方形I板背面之比上4第i基板支持I置所接觸之區 H方之區域,可以單獨的支持該方形基板;升降 „ ’用來使該第2基板支持裝置對上述之第i基板以 對升降;和控制裝置(15),用來控制上述之。 ν?2ΐ:在上述;預定高,,使方形基板被上述之; 1和弟2基板支持裝置雙方支持。 义j 另外,括弧内之英數字丰_ 科虛今德# 予表不在後面所述之貫施形態中; 對應之構成元件等。以下與此項同。C: \ 2D-C0DE \ 91-07 \ 91107071.ptd 543112 V. Description of the invention (4) f fixed frame, so the substrates of various sizes can be made into :: the size, replacement by following the suction plate according to the processing object Inconvenient for large substrates, U = object. But Bai: Time, and a long time. In the replacement of the dagger: it needs to be as large as possible, so the replacement of the substrate suction plate requires long work, and the device rotation rate must be reduced. In addition, a problem arises in the use of a plurality of substrate chuck devices. 4 'The cost will also become the reason, the present invention is used to solve the above-mentioned technical beauty of the substrate holding device and the substrate holding device. The second purpose is to improve the two' substrates of various sizes can be well maintained; Perform adjustment work. The substrate ruler of the patterner [the solution to the problem and the effect of the invention] a = it is the first invention in the scope of the patent application mentioned above is-a kind ^ ΪΓ), which is characterized by including: the first substrate support device side The back of the square substrate ⑻ is used to support the square substrate at a predetermined height approximately horizontally; the second substrate support device (12) touches the back of the square I plate at a ratio of 4 to the area where the i substrate is in contact The area on the H side can support the square substrate alone; lifting "'is used to lift the second substrate supporting device to the above i-th substrate; and the control device (15) is used to control the above. Ν? 2ΐ: In the above; predetermined height, so that the square substrate is supported by the above; 1 and 2 substrate support devices support both sides. Yi j In addition, the English numerals in parentheses _ 科 虚 今 德 # 表表 is not described later In the application form, corresponding components, etc. The following is the same as this.

C·· \2D-C0DE\91 ·07\9Π07071 .ptd 第8頁 五、發明說明(5) 依照本發明時,在 — 被第1基板支持裝置姓疋之N度,方形基板之相對之外方 支持。利用此種方式,、,相對之内方被第2基板支持裝置 者時,在被支持於上》° f形基板即使為大型而且薄型 生彎曲之問題。 a之預定高度之方形基板亦不會有產 另外,經由使第2其如 基板提升到上述之預土―古、、爰置進行升降,可以將方形 之預定高度以上之方二=又以上,和可以使被提升到上述 時’因為方形基板之心第下降到上述之預定高度。這 即使方形基板為大型 1基j反支持裝置支持,所以 形基板亦不會發生 '尘日守,该大型而且薄型之方 另外,如申請之 ,裝置包含有基板裝載板⑴υ,:ί平=第1基板支 以在其上面裝載方形基板w 月專利範圍第3項之發明县力φ 士主皇4丨々々 板保持裝置中,# !_、+.. 申5月專利砣園第2項之基 @ π 1 使上述之基板裝載板之上面和休π a 、, ,考曲到外側之曲面連接。 田和外端面,以 申請專利範圍第4項之發明是在巾 板保持梦罟由,杜t 1 ^ g祀㈤第2項之基 丹衣置中,使上述之基板裝載板之上面 弩曲到外側之曲面連接。 不内如面,以 申請專利範圍第5項之發明是在申請專利 板样姓壯SB A i %固第3項之基 版保持衣置中,使在上述之基板裝載板之上 連接部份,被施加有使用樹脂之塗膜。 ^ $而之 依照該等之各個發明時,可以防止由於基板裝載板與被C ·· \ 2D-C0DE \ 91 · 07 \ 9Π07071 .ptd Page 8 V. Description of the invention (5) In accordance with the present invention, at-N degrees of the last name supported by the first substrate support device, the square substrate is opposite to Party support. In this way, when the device is supported by the second substrate on the inner side, the f-shaped substrate being supported on the upper surface of the f-shaped substrate may be bent even if it is large and thin. A square substrate of a predetermined height will not be produced. In addition, by raising and lowering the second substrate such as the above-mentioned pre-soil, ancient, and arranging, the square of the square having a predetermined height or more can be increased to two or more And can be lifted to the above-mentioned 'because the heart of the square substrate is lowered to the above-mentioned predetermined height. This is even if the square substrate is supported by a large 1-base anti-support device, so the shape of the substrate does not occur, the large and thin square. In addition, if you apply, the device contains a substrate loading plate ⑴υ: ί 平 = The first substrate supports a square substrate on which a square substrate is mounted. The invention of the third item of the patent scope of the invention is φ 士 主 皇 4 丨 The plate holding device, #! _, + .. Apply for May Patent Gion Garden No. 2 Xiang Zhiji @ π 1 connects the upper surface of the above-mentioned substrate loading plate with π a,,, and connects the curved surface to the outer surface. Tian He's outer face, according to the invention in the scope of the patent application No. 4 is to keep the nightmare on the towel board, Du t 1 ^ g sacrifice the Kidan clothes of the second item, so that the above board loading board is curved Connect to the outer surface. If it is not inside, the invention with the scope of the patent application No. 5 is in the base plate of the patent application model name SB A i% solid No. 3 holding clothes, so that the connection part above the board loading board A coating film using a resin is applied. ^ $ In accordance with each of these inventions, it is possible to prevent

C.\2D-CODE\9l.〇7\9n〇7〇71.ptd 第9頁 543112 五、發明說明(6) =該基板裝載板之方形基板之摩擦而 防止=於該發生灰塵而污染方形基板。 了 Μ 板::以?圍Γ上項十之發申請專利範圍第2項之基 I:-) 將方形基板之背面吸著和支持在上 板:=圍第7項之發明是在申請專利範圍第6項之基 ”、,置中,更包含有氣體供給裝置(1 1 4 ),連接到上" 述之,著孔,用來將氣體供給到基板裝載板之上面。 北^照^請專利範圍第6項之發明時,可以將方形基板之 L#持在*板裝載板之上面’ ·照申•專利範圍 ^ J、之务明時,經由將氣體供給到該被吸著和保持之方 k ί #基板衣載板之間,可以解除方形基板被吸著到基 板裝載板之吸著狀態。 土 申明$利範圍第8項之發明是在申請專利範圍第2項之基 ^保持I置中,使上述之基板裝載板之指定部被構建成 二’可以圍繞沿著其外端面之水平軸線(丨〗7 )自由的搖 動0C. \ 2D-CODE \ 9l.〇7 \ 9n〇7〇71.ptd Page 9 543112 V. Description of the invention (6) = Friction of the square substrate on the substrate loading plate is prevented = the square is contaminated by dust Substrate. Μ 板 :: by? The base of the tenth issue of the last tenth patent application scope I :-) The back of the square substrate is sucked and supported on the upper board: = The invention of the seventh scope is the base of the sixth scope of the patent application. " ,, And centering, it also includes a gas supply device (1 1 4), connected to the above, "the hole, which is used to supply gas to the top of the substrate loading board. North ^ photo ^ please patent scope 6 When inventing, you can hold the L # of the square substrate on the top of the * board loading plate '. * Applications of patents ^ J. When it is clear, by supplying gas to the side that is adsorbed and held k # Between the substrate and the carrier plate, the adsorption state of the square substrate to the substrate loading plate can be released. The invention in item 8 of the scope of the claim is based on the basis of the item 2 in the scope of the patent application. The above-mentioned designated portion of the substrate loading plate is constructed so that it can freely swing around a horizontal axis (丨 〖7) along its outer end surface.

依知、本發明時’可以使基板裝載板之指定部圍繞水平軸 =搖,。利用此種方式,例如在方形基板被吸著和保持在 土板f載板之狀態,經由使基板裝載板之指定部進行搖 動’可以使空氣進入到基板裝載板和基板之間,藉以緩和 方形基板之吸著狀態。According to the knowledge, in the present invention, the designated portion of the substrate loading plate can be swung around the horizontal axis. In this way, for example, in a state where a square substrate is sucked and held on the soil plate f carrier plate, by shaking the designated portion of the substrate loading plate, 'air can be introduced between the substrate loading plate and the substrate, thereby relaxing the square Suction state of the substrate.

543112 五、發明說明(7) 另外,如申請專利範圍第9項之方式, 板亦可以包含有分別沿著方形基板m基板襄載 ⑴B,luc,⑴D),在此種情況;^ == 粑圍第10項所示,使上述之4個板片之 :專利 可以圍繞該沿著外端面之水平軸線自由的二固被構建成為 另外,被構建成為可以圍繞上述水 片,亦可以如申請專利範圍第u項所示,。m之板 端緣可以對方形基板之背面進行接離,亦::置j使其外 乾圍第12項所示’被設置成使其“申:專利 背面進行接離。 冬j以對方形基板之 美m = 項之發明是在申請專利範圍第1項之 基板保持波置中,使上述之第2基板、 升降梢(12),接觸在方形基板之背面。置匕3有夕個 要防止基板升降時發生基板之落下或破 2 =有:基板保持☆,用來吸著和保持 了以使其 面中央部;和保持台升降機構,用來使該基板保持台月 降,在方形基板被吸著在基板伴持 ’:、 伴梏a斗扒叮、,m I牡丞板保符σ之狀悲,經由使基板 =持σ升卜’以用來使方形基板升降。但是,要使可保 2大型基板之大型基板保持台進行升降時,需要大型之保 寺台升降機構’因此襄置尺寸和裝置成本必定會增加。另 =在用則吏其基板保持台升降之構造中是直接進行將方 /基板授給基板保持台’但是在授給時(特別是在從基板 保持台取去方形基板時)會產生靜電,由於該靜電會產生 方形基板帶電之問冑。當基板帶電時,在基板之搬曰運等, m 第11頁 C:\2D-CODE\91-07\91107071.ptd 543112 五、發明說明(8) 基板會吸著搬運空間内之灰塵,會有基板被污染 人此相對的,假如構建成以第2基板支持裴置 °碭。 基板之内方,利用該第2基板支持裝置之升降形!'形 升降時,因為不需要可使基板保持台升降程度 '土板 降驅動機構’所以可以抑制裝置尺寸和:二之升 專利範圍第13項之方式,第2基成板 亦可以包含有多個升降梢,因為升降梢和基板之、置 很小,所以將方形基板授給該升降梢時,可以 、 給日 =靜電’可以防止由於靜電造成方形基板=授 申印專利範圍第14項之發明是在申請專利範圍第13 土板保持裝置中,在上述之升壓梢之前端孔 用來吸著方形基板之背面。 风有及者孔’ 依照本發明時,利用升降梢吸著方形基板之背面, =基板之升降時可以更進一層的防止方形基板 落下之問題。 丨午悄上 申明專利範圍第1 5項之發明是在申請專利範圍第1項之 基j保持裝置中,t包含有位置調整裝置⑺,接觸在方 形基板之端面,用來使該方形基板之水平面内之位置位在 預定之基板保持位置。 依"▽、本發明時,可以將方形基板之水平面内之位置, 位在預定之基板保持位置。 其1: ί ΐ範圍第16項之發明是在申請專利範圍第1項之 基板保持衣置中,更包含有除電裝置(4) ’用來對方形 板進行除電。 543112 五、發明說明(9) 、 —-------- 依^戶、?、本^潑^明士 基板時,合:,例如’在從第2基板支持裝置取去方形 在此種情i時i靜電、’由於該靜電使方形基板帶電,即使 進一芦的防/、可以進打邊方形基板之除電。因此可以更 _二2 Ζ ί由於帶電而引起之方形基板之污染。 洗淨:#而=圍第17項之發明是一種基板處理裝置,用來 含有.申^ 4》成有薄膜之方形基板之端緣部,其特徵是包 ⑴:二 之基板保持襄置 基板保持裝置之二莫?山來將溶劑供給到被保持在該 緣部之不要之薄:之'而緣部,藉以除去形成在該端 依照本發明時,被保持在基板保持裝置之Αχ^ 彎曲,所以其i山办 丨丁付衣罝之暴板不會產生 定。利用此淨裝置之位置關係可以保持-之目的:置:式’可以將溶劑供給到方形基板之端緣部 I以對基板之端緣部施加良好之洗淨處理。 D申4專利範圍第1 8項之方式,上述 获晉亦< LV 人<多而緣洗淨 f亦 S有溶劑吐出喷嘴(3 M,315),用來朝—方 形基板之端緣部吐出溶劑。 朝向方 申請專利範圍第i 9項之發明是在申請專利 基板處理裝置中,使上述之端緣洗 項 嘴(316,317),用來朝向方/吴拓^衣―/含有氣體喷 喷射氣體。編方开/基板上之浴劑供給位置近傍 依照本發明時,經由從氣體喷嘴將氣體喷射 上,可以使從溶劑吐出喷嘴供給到方形基板之溶^二 到外方。利用此種方式,不會影響形成在方 ^ ^、 u备扳之有效543112 V. Description of the invention (7) In addition, if the method of applying for item 9 of the patent scope, the board may also include ⑴B, luc, ⑴D) along the square base board m, respectively, in this case; ^ == 粑As shown in item 10, the patent of the four plates mentioned above can be constructed around the second solid free along the horizontal axis along the outer end surface. In addition, it can be constructed to surround the above-mentioned water slice. As shown in range u. The edge of the plate can be disconnected from the back of the square substrate, also :: set j to make the outer trunk as shown in item 12 'set to make it' application: patented back to disconnect. Winter j to square The beauty of the substrate m = item is in the substrate holding wave of item 1 of the scope of the patent application, so that the second substrate, the lifting tip (12), contacts the back of the square substrate. It is necessary to prevent the placement of the dagger 3 Falling or breaking of the substrate occurs when the substrate is raised and lowered 2 = Yes: the substrate is held ☆, which is used to suck and hold the central portion of its surface; and the holding table lifting mechanism is used to lower the substrate to the moon, on a square substrate It is sucked on the substrate supporting ':, 梏 斗 a bucket, m ,, m 丞, 丞, 保, 符, 符, and σ, and it is used to raise and lower the square substrate by making the substrate = holding σ 升.' When lifting a large substrate holding table capable of holding 2 large substrates, a large Hosuji table lifting mechanism is needed, so the size and cost of the installation must increase. In addition, it is directly used in the structure of the substrate holding table lifting. Perform the square / substrate to substrate holding stage 'but Static electricity may be generated during the delivery (especially when the square substrate is removed from the substrate holder). This static electricity may cause the square substrate to be charged. When the substrate is charged, the substrate is moved, etc., m p. 11 C: \ 2D-CODE \ 91-07 \ 91107071.ptd 543112 V. Description of the invention (8) The substrate will attract dust in the handling space, and there will be contaminated substrates. If it is constructed to be supported by the second substrate裴 置 ° 砀 Inside the substrate, the lifting shape of the second substrate supporting device is used! When the shape is raised and lowered, it is not necessary to allow the substrate holding table to be raised and lowered by the "soil plate driving mechanism", so the device size and: In the method of item 13 of Erzhisheng's patent scope, the second base plate can also include multiple lift pins. Because the lift pin and the base plate are very small, when a square substrate is granted to the lift pin, the = Static electricity 'can prevent square substrates from being caused by static electricity = The invention in item 14 of the scope of patent application is granted in the patent application scope 13 soil plate holding device. The end hole is used to attract the square substrate before the aforementioned booster pin. Back. When there is a hole 'According to the present invention, the lifting tip is used to suck the back of the square substrate, = the problem of preventing the square substrate from falling when the substrate is raised and lowered. In the base j holding device of the first patent application scope, t includes a position adjustment device ⑺, which is in contact with the end surface of the square substrate, and is used to position the position in the horizontal plane of the square substrate at a predetermined substrate holding position. " ▽, In the present invention, the position in the horizontal plane of the square substrate can be located at a predetermined substrate holding position. 1: The invention in the 16th item of the scope is the substrate holding clothes in the first item of the patent application range. In addition, it further includes a static elimination device (4) 'for neutralizing the square plate. 543112 V. Description of the invention (9), ---------- According to households, households, households, and households, it is necessary to combine: for example, 'the square is removed from the second substrate support device here In the case of i, the static electricity, 'Since the static electricity causes the square substrate to be charged, even if it is protected, the square substrate can be neutralized. Therefore, it can be more contaminated by square substrates due to electrification. Washing: # 而 = The invention of item 17 is a substrate processing device for containing the edge portion of a square substrate with a thin film of "Shen ^ 4", which is characterized by the following characteristics: the second substrate holds the substrate No. 2 holding device? Shan Lai supplies the solvent to the thin part that is held at the edge part: and the edge part is removed to be formed at the end. According to the present invention, it is held in the substrate holding device Αχ ^ bending, so its i丨 Ding Fuyi's violent board will not produce a decision. By using the positional relationship of the cleaning device, the purpose of-can be maintained: the formula: can be used to supply the solvent to the edge portion I of the square substrate to apply a good cleaning treatment to the edge portion of the substrate. In the method of item 18 of the scope of patent application D, the above-mentioned Jin Yi < LV > < LV > multi-edge cleaning f also S has a solvent ejection nozzle (3 M, 315) for the edge of the square substrate Spit out solvent. The invention of item No. 9 in the patent application scope of the facing party is to apply the above-mentioned edge cleaning nozzles (316,317) in the patent-applied substrate processing device to spray the gas toward the side / Wu Tuoyi-/ containing gas. Proximity / Proximity of bath supply position on the substrate In accordance with the present invention, by spraying the gas from the gas nozzle, the solvent from the solvent discharge nozzle to the square substrate can be supplied to the outside. In this way, it will not affect the effectiveness of

543112 五、發明說明(10) _ =二薄膜,將溶劑供給到方形基 不要之薄膜,藉以將其除去。 用不心解 =外,如申請專利範圍第20項之方式,最好 裝置包含有:洗淨頭(31A,31b,31c,3id)i;:: 出二和氣體 ’ ,3 2 D) ’用來使該洗淨頭沿著祐保柱产l 之基板保持以之方形基板之邊進行^;。被保持在上述 另外,如申請專利範圍第21項之方式,最好在 > "員形成有用以收容處理對象之基 J :洗 丨» :上述之端 間内之環产二接到之處理空間’用來排出該處理空 ί曰j η Ii兄乳體。經由肖合贫 今、—十^排乳裝置,供給到方形某叔 被;溶劑溶:之不要之薄膜(溶解物)可以從處ί Β以防止,谷劑和溶解物飛散到周圍。 =專利範圍第22項之發明是在申 基=理裝置中,使上述之洗淨頭具備有上下面;J; 之,(311,312),上述之處理空間形成在上述之-對之塊 之間,和在上述之一斜夕括^ 喷嘴和氣體喷嘴。、‘ @ ’设置上述之溶劑吐出 夺;因為被基板保持裝置保持之基板不會產 生”:所以在與一對之塊保持—定間隔之狀態 施加良好之洗淨處理二間…對方形基板之端緣部 申請專利範SI第23項之發明是—種基板保持裝置⑴),543112 V. Description of the invention (10) _ = two thin films, the solvent is supplied to the unnecessary film of the square base to remove it. Unexplainable = except, if the way of applying for the scope of patent application is the 20th, the best device includes: Wash head (31A, 31b, 31c, 3id) i; :: Out two and gas ', 3 2 D)' It is used to make the cleaning head along the side of the square substrate held by the substrate produced by Yubaozhu ^ ;. It is kept in the above. In addition, if the method of applying for the scope of the patent application is No. 21, it is best to form a base useful for accommodating the processing object. The processing space is used to discharge the processing space. It is supplied to a square uncle through Xiao Hepo's milk draining device; the solvent is dissolved: the unnecessary film (dissolved matter) can be used everywhere to prevent the cereals and dissolved matter from flying around. = The invention of item 22 in the patent scope is in the Shenji = management device, so that the above-mentioned cleaning head is provided with upper and lower surfaces; J; of (311, 312), the above-mentioned processing space is formed in the above-to-block Between, and in one of the above, ^ nozzles and gas nozzles are included. , '@' Set up the above solvent extraction; because the substrate held by the substrate holding device will not be generated ": So, in a state of maintaining a fixed interval with a pair of blocks, apply two good cleaning treatments to the square substrate. The invention of the 23rd edge of the patent application for the patent application SI is a substrate holding device ⑴),

第14頁 543112 五、發明說明(11) 其特徵是包含有:固定框架(111 );多個基板裝載板(丨丨9A, 119B ;117A,117B,117C,117D ;118A,118B,118C,118D, 118E,118F),被安裝在該固定框架,在其上面可以裝載基 板(8,81,82,33);和滑動機構(5 3,54,5 5人,556,112人,1126 ,6 ; 7 ),用來使該多個基板裝載板中之至少1個,以大致 水平之方向對上述之框架進行相對滑動。 依照本發明時,可以依照被 大小,使基板裝載板滑動。因 可以支持其端緣附近,可以良 生彎曲。 另外,依照基板之大小進行 利用滑動機構使基板裝載板滑 不需要很大之工夫,當與依照 (基板吸著板)之構造比較時, 作業。因此,不會由於基板大 而造成裝置運轉率之降低。因 備多種之基板裝載板,所以裝 申請專利範圍第2 4項之發明 基板保持裝置中,更包含有固 多個基板裝載板之間(5 7 ),用 板裝載板之基板之背面。 依照本發明時,因為在基板 利用基板吸著板之滑動,即使 在該間隔變大之基板吸著板間 裝載在基板裝載板之基板之 此,即使是大型之基板,亦 好的保持而不會在端緣部產 變更之調整作業,因為是只 動之作業,所以其調整作業 基板之大小更換基板裝載板 可以以更短之時間完成調整 小之變更伴隨之調整作業, 為不需要依照基板之大小準 置成本可以降低。 是在申請專利範圍第2 3項之 定梢(1 2 0 ),被配置在上述 來接觸被裝載在上述多個基 吸著板間設置固定梢,所以 基板吸著板之間隔很大時, ’亦不會有基板產生彎曲之Page 14 543112 V. Description of the invention (11) It is characterized by including: a fixed frame (111); a plurality of substrate loading plates (丨 丨 9A, 119B; 117A, 117B, 117C, 117D; 118A, 118B, 118C, 118D , 118E, 118F), are mounted on the fixed frame, and the substrate (8,81,82,33) can be loaded on it; and the sliding mechanism (5 3,54,5 5 people, 556,112 people, 1126, 6 7), for causing at least one of the plurality of substrate loading plates to relatively slide the above-mentioned frame in a substantially horizontal direction. According to the present invention, the substrate loading plate can be slid according to the size of the substrate. Because it can support near its edge, it can be bent well. In addition, sliding the substrate loading plate using a sliding mechanism does not require a great deal of work in accordance with the size of the substrate. When compared with the structure according to the (substrate suction plate), the operation is performed. Therefore, there is no reduction in the operating rate of the device due to the large substrate. Because there are many kinds of substrate loading boards, the invention for applying the invention in the 24th aspect of the patent application includes a substrate holding device that further includes a plurality of substrate loading boards (5 7), and the back of the substrate using the board loading boards. According to the present invention, since the substrate suction plate is used to slide the substrate, even if the substrate is mounted on the substrate loading plate between the substrate suction plates having a larger interval, even a large substrate is held well. The adjustment operation that will change the end edge is only a moving operation, so the adjustment operation of the size of the substrate replacement of the substrate loading plate can complete the adjustment operation accompanied by small adjustments in a shorter time. The size setting cost can be reduced. It is the fixed tip (120) in the 23rd scope of the patent application, and it is arranged in the above to contact and be mounted between the plurality of base suction plates, and a fixed tip is provided, so when the substrate suction plate has a large interval, 'There will be no substrate bending

543112 五、發明說明(12) 問題。 申凊專利範圍第2 5項是一種基板端緣洗淨裝置,用 淨在表面形成有薄膜之基板(S,S1,S2,S3)之端緣部,盆特 徵是^含有:申請專利範圍第23或24項之基板保持裝置〇 ) ’和端緣洗淨裝置(3),用來將溶劑供給到被該 裝置㈣之基板之端緣部,藉以除去形成在 反保之持 要之薄膜。 丨心个 =本發料’因為被基板保持裝置保持之基板不會產 生· ·弓曲’所以基板和端緣洗淨裝置之位置關係可 :目=種:式’可以將溶劑供給到方形基板之端緣部 W置,可以對基板之端緣部施加良好之洗淨處理。 [發明之實施形態] 下面將蒼如、p付圖用來詳細的說明本發明之第i實施 態。 、 圖1是本發日月之一實施形態、之基板 理裝置)之平面圖,圖2是你m々ττ ττ主丨尹表置(暴板處 基板端緣洗淨裝置用來= =:1门1看到之剖面圖。該 璃基板之方形基板S之束端先 布抗㈣㈣之^要之缚膜(例如附著在塗 膜)。 土扳之糕緣部之不要之抗蝕劑塗 該基板端緣洗淨裝番g I? f + ^ ^ A Q 八備有:基板保持機構1,用來保持 處理對象之基板s ;位晉士两敫4办 ^ ^ 1 ^ ^ ^ ^ S ^ ^ „ # 被基板保持機構!保持之’和洗淨機構3,用來洗淨 1卞倚之基板S之端緣部。另外,在基板保 C:\2D-CODE\91-07\91107071.ptd 第16頁 543112543112 V. Description of the Invention (12) Problem. The 25th item of the patent scope of the application is a substrate edge cleaning device, which uses the edge of the substrate (S, S1, S2, S3) with a thin film formed on the surface. The characteristics of the basin are: Contains: The substrate holding device of item 23 or 24) and the edge cleaning device (3) are used to supply a solvent to the edge of the substrate held by the device, thereby removing the thin film formed in the counter-warranty.丨 Heart = This material 'Because the substrate held by the substrate holding device will not produce · · bowing', the positional relationship between the substrate and the edge cleaning device can be: mesh = type: formula 'can supply the solvent to the square substrate The end edge portion W is provided, and a good cleaning treatment can be applied to the end edge portion of the substrate. [Embodiment of the invention] The following describes the i-th embodiment of the present invention in detail using Cangru and p. Figure 1 is a plan view of the embodiment of the sun and the moon, the substrate processing device), Figure 2 is your m々ττ ττ main 丨 Yin table set (the board edge cleaning device at the storm board is used to = =: 1 A cross-sectional view of the door 1. The bundled end of the square substrate S of the glass substrate is first covered with a film (for example, attached to a coating film) that is resistant to rubbing. An unnecessary resist is applied to the edge of the cake. The substrate edge cleaning device g I? F + ^ ^ AQ is equipped with: a substrate holding mechanism 1 to hold the substrate s of the processing object; 4 units of Jinshi two ^ ^ 1 ^ ^ ^ ^ S ^ ^ „# The substrate holding mechanism! The holding mechanism 'and the cleaning mechanism 3 are used to clean the edge of the substrate S that is leaning. In addition, the substrate protection C: \ 2D-CODE \ 91-07 \ 91107071.ptd No. 16 Page 543112

4 1之上方,如圖2所示,配置有除電器4用來對處理 後之基板S進行除電。除電器4例如利用電暈放電用來產生 f離子和負離子。在離開該除電器4適當之間隔,於除電 高度He配置基板3,可以用來對基板s之全體照射離子,藉 以良好的除去基板s所帶之電荷。 基板^保持機構1具備有:基板保持台丨丨,可以裝載基板 s,、吸著的保持該被裴載之基板s ;和多根(在本實施形態 中為8根)之升降梢1 2,用來使基板S對該基板保持台1丨進 行相對之升降。 基^保持台11所具有之構造是將用以構成比基板s小之 四角環狀之基板吸著板之4片之吸著板片111A,111B,111C, 111D(總稱為「基板吸著板ln」),安裝在組合成直方體 狀之框架1 1 2之上面。在基板吸著板丨丨丨之上面,沿著長度 方向一形成多、個之吸著溝1U,該等之多個吸著溝113,如圖 3/斤不,成為與連接到吸引源和氮氣供給源(圖中均未顯 不)之空氣吸引/氮氣供給配管丨丨4相通。依照此種方式, 可以利用吸引源之動作,吸引吸著溝丨丨3内之空氣,和將 來自氮氣供給源之氮氣供給到吸著溝丨丨3内。另外,以基 板s被裝載在基板吸著板1U之狀態,經由吸引吸著溝 内之空氣,可以將基板s吸著在基板吸著板丨丨丨之上面,另 外一方面,在基板s被吸著在基板吸著板丨丨丨之狀態,經由 將氮氣供給到吸著溝1 1 3,可以解除基板s之被吸著到基板 吸著板111。 另外’基板吸著板111之外緣部丨:!丨a,如圖3所示,不是Above 4 1, as shown in FIG. 2, a static eliminator 4 is provided for removing the processed substrate S. The static eliminator 4 uses, for example, corona discharge to generate f ions and negative ions. The substrate 3 is arranged at a neutralization height He at an appropriate interval away from the static eliminator 4 and can be used to irradiate the entire substrate s with ions, thereby removing the electric charge carried by the substrate s. The substrate ^ holding mechanism 1 is provided with: a substrate holding table 丨 丨, which can load a substrate s, and suck and hold the substrate s carried thereon; and a plurality of (eight in this embodiment) lifting tips 1 2 , Used to make the substrate S relatively lift and lower the substrate holding table 1 丨. The base holder 11 has a structure in which four suction plates 111A, 111B, 111C, and 111D (collectively referred to as "substrate suction plates") are used to form a four-corner ring-shaped substrate suction plate smaller than the substrate s. ln "), mounted on the cuboid-shaped frame 1 1 2. On the substrate suction plate 丨 丨 丨, a plurality of suction grooves 1U are formed along the length direction, and the plurality of suction grooves 113, as shown in FIG. 3, are connected to the suction source and The air suction / nitrogen supply piping of the nitrogen supply source (none shown in the figure) is connected. In this way, it is possible to use the action of the suction source to suck the air in the suction groove 3 and to supply nitrogen from the nitrogen supply source into the suction groove 3. In addition, in the state where the substrate s is mounted on the substrate suction plate 1U, the substrate s can be suctioned on the substrate suction plate 丨 丨 丨 by sucking the air in the suction groove. On the other hand, the substrate s is In the state of being sucked in the substrate suction plate 丨 丨 丨, by supplying nitrogen to the suction groove 1 1 3, the suction of the substrate s to the substrate suction plate 111 can be released. In addition, the outer edge of the substrate suction plate 111 丨:! 丨 a, as shown in FIG. 3, not

543112 五、發明說明(14) 角狀而是被加工成為曲面。換言之,基板吸著板〗丨丨苴上 面N1和外端面N2被彎曲到外側之曲面N3連接。另外,/至小 在曲面3(最好上面^亦同)被施加使用樹脂之塗膜,用來〉 減小與基板s之摩擦。另外,基板吸著板lu之内緣部丨丨“ 之上面N1和内端面!^被彎曲到外側之曲面N5連接。 矩:外等m基板吸著板114之4個外緣部⑴績形成之 矩形寻表或小於所保持之基板S之有效區域之尺寸。但 具/二寸之程度至少可以使被保持之基板吸著板 土板s之埏緣部不會垂下,可以保 平之各邊正交之方向之基板吸=之 *^π.^Β,,,,. 卜θ ;卜而了以保持水平之尺寸之程度。 另外,基板吸著板ln不是以基板3之 大致全體區域保持,而是只利用有 尺寸比外緣部llla小之矩开Λ Λ 外緣部111M〇 板ill 内緣部111|3之間之基板吸著 4才”末保持基板因此,在内緣部11 lb之内側,美 和基板s不會接觸。因此, “ 小,可以^ β A Α ^ ς β A / 與基板S之接觸面積變 ▲。咸’在基板S和基板吸著板111之間產生之靜電 另外,在本實施形態中,使 鎖入形成在基板吸著板⑴之使下螺而絲116經由框架112以螺紋 將基板吸著板111固定到框芊 《螺4孔11 5 ’可以達成 疋巧汇木U2,在基板吸著板lu之上 1 第18頁 C:\2D-CODE\91-07\91107071.ptd 543112 發明說明(15) 面,沒有吸著溝1 1 3以外之凹部。因此,被裝載(吸著)在 基板,著板ill之基板s,不會由於基板吸著板ηι之上面 之吸著溝11 3以外之凹冑,而產生局部之凹陷等之問題。543112 V. Description of the invention (14) The angle is processed into a curved surface. In other words, the upper surface N1 and the outer end surface N2 of the substrate suction plate are connected by a curved surface N3 bent to the outside. In addition, a coating film using a resin is applied to the curved surface 3 (preferably the same as above) to reduce friction with the substrate s. In addition, the upper surface N1 and the inner end surface of the substrate suction plate lu are connected by a curved surface N5 which is bent to the outside. Moment: The four outer edge portions of the substrate suction plate 114 of the outer substrate are formed. The rectangular look-up table is smaller than the size of the effective area of the substrate S that is held. However, the size of / two inches can at least prevent the edge of the substrate being held by the plate and the soil plate s from hanging down, which can keep the sides flat. The substrate suction in the orthogonal direction is equal to * ^ π. ^ B ,,,,. Θθ; the length of the substrate is kept to a horizontal dimension. In addition, the substrate suction plate ln is not held in substantially the entire area of the substrate 3. Only use a moment with a size smaller than the outer edge portion llla to open the Λ Λ outer edge portion 111M. Board ill between the inner edge portion 111 | 3 to attract the substrate 4 ". Therefore, the inner edge portion 11 Inside lb, beauty and substrate s will not contact. Therefore, "Small, ^ β A Α ^ β A / the contact area with the substrate S becomes ▲. The static electricity generated between the substrate S and the substrate suction plate 111 is changed. In addition, in this embodiment, the lock Into the substrate suction plate, the lower screw and wire 116 are used to fix the substrate suction plate 111 to the frame through the frame 112. The screw 4 holes 11 5 'can be achieved. Above lu 1 page 18 C: \ 2D-CODE \ 91-07 \ 91107071.ptd 543112 Description of the invention (15) There is no recess other than the suction groove 1 1 3. Therefore, it is loaded (sucked) on the substrate The substrate s of the plate ill does not cause problems such as local depression due to depressions other than the suction grooves 11 3 on the substrate suction plate η.

^根之升卩牛梢1 2被设在基板保持台1 1之内方,鉛直的設 立在1片之基座板121。在基座板121結合有被設在其下方 之升降驅動機構1 3。該升降驅動機構丨3包含有:一對之引 導軌道131,被固定在基板保持台n,沿著鉛直方向延 伸γ可移動之升降框架132,被該一對之引導執道引導; 螺旋軸133,在該一對之引導執道丨31之間之位置,被配置 成沿著鉛直方向(與引導軌道131平行之方向);螺帽134, 以螺紋結合該螺旋軸1 3 3 ;和馬達丨3 5,結合在螺旋軸 133升降框架丨32之上端被固定在基座板丨21之下面。另 外,螺帽1 3 4被安裝在升降框架丨3 2。因此,利用馬達丨3 5 之正轉/逆轉,使升降框架丨3 2沿著引導軌道丨3 1升降,用 來使被固定在該升降框架132之上端之基座板121進行升 降。 依照此種構造’利用升降驅動機構1 3使基座板丨2 1升降 (上下移動),以升降梢1 2從背面側支持基板S之中央部, 可以使該基板S,在基板吸著板111之上面和該上面之上方 之除電高度He或基板授受高度Hd之間,進行升降。基板授 受高度Hd,例如成為除電高度He和其上方之除電器4之間 之位置,在該基板授受高度Hd,於圖中未顯示之基板搬運 機器人和升降梢1 2之間,進行基板s之授受。 馬達1 3 5例如連接到包含微電腦之控制部5,控制部5驅^ The root bulge beef tip 12 is placed inside the substrate holding table 11 and is vertically placed on one base plate 121. The base plate 121 is coupled to a lift driving mechanism 13 provided below it. The lifting driving mechanism 3 includes: a pair of guide rails 131, which are fixed to the substrate holding table n and extend along the vertical direction. The movable lifting frame 132 is guided by the pair of guide guides. The screw shaft 133 The position between the pair of guide rails 31 and 31 is arranged along the vertical direction (the direction parallel to the guide rail 131); the nut 134 is screwed to the screw shaft 1 3 3; and the motor 丨3 5. The upper end coupled to the lifting frame 丨 32 of the screw shaft 133 is fixed below the base plate 21. In addition, the nuts 1 3 4 are mounted on the lifting frame 3 2. Therefore, the forward / reverse rotation of the motor 3 5 is used to raise and lower the lifting frame 3 2 along the guide rail 3 1 to raise and lower the base plate 121 fixed at the upper end of the lifting frame 132. According to this structure, the base plate 丨 2 1 is raised and lowered (moved up and down) using the lift driving mechanism 13 to support the central portion of the substrate S from the rear side with the lifting tip 1 2 so that the substrate S can be placed on the substrate suction plate. The upper surface of 111 is raised and lowered between the static elimination height He or the substrate receiving height Hd above the upper surface. The substrate receiving and receiving height Hd is, for example, a position between the static elimination height He and the static eliminator 4 above it. At the substrate receiving and receiving height Hd, the substrate s is performed between the substrate carrying robot and the lifting tip 12 (not shown). Acceptance. The motor 1 3 5 is connected to, for example, a control unit 5 including a microcomputer, and the control unit 5 drives

543112543112

543112543112

,,淨杯22内之接觸梢211吹喷洗淨液,可以用來除去 者接觸梢2 11之抗蝕劑液和抗蝕劑液之固化物或其他之 π染物質。因此,在適當之時期利用洗淨液進行接觸梢 211之洗淨,用來使未附著有污染物質之清淨之接觸梢工 觸在基板S之端面,可以使基板s不會被污染的進行基板 S之定位。 土 洗淨機構3具備有洗淨頭31A,31B,31C,31D(總稱為「洗 爭頭3 1」)刀別用來洗淨被吸著和保持在該基板^持台 11之基板S之4個邊之端緣部。洗淨頭31A,31B,31C,31D*The contact tip 211 in the clean cup 22 is blown and sprayed with a cleaning solution, and can be used to remove the resist solution and the solidified product of the resist solution or other π-dyeing substances in contact with the tip 2 11. Therefore, the contact tip 211 is cleaned with a cleaning solution at an appropriate time, so that the clean contact tip without the contaminated substance touches the end face of the substrate S, so that the substrate s can be carried out without being contaminated. S's positioning. The soil cleaning mechanism 3 is provided with cleaning heads 31A, 31B, 31C, and 31D (collectively referred to as "washing heads 3 1"). The blades are used to clean the substrates S that are attracted and held on the substrate ^ holder 11. Edges of 4 sides. Wash head 31A, 31B, 31C, 31D *

別接合在引導執道32A,32B,32C,32D(被配置成分別與基7板 S之4個邊平行)成為可自由滑動之方式。利用此種方式二, 洗淨頭31 A,31 B,3 1C,3 1D可以分別沿著基板S之4個邊水平 的進行直線往復移動。Do not engage the guide rails 32A, 32B, 32C, and 32D (arranged to be parallel to the four sides of the base plate 7), respectively, so that they can slide freely. In this second way, the cleaning heads 31 A, 31 B, 3 1C, and 3 1D can be linearly reciprocated linearly along the four sides of the substrate S, respectively.

洗淨頭3 1如圖4之側面圖所示,具有上下互相面對之上 噴嘴塊3 1 1和下喷嘴塊3 1 2,和安裝該等之喷嘴塊3 11,3 1 2 之本體塊3 1 3。上下之噴嘴塊3 11,3 1 2以一定之間隔被配置 成互相面對,在該等之間形成處理空間3 3,用來插入處理 對象之基板S之端緣部。上述之喷嘴塊311朝向在基板s之 上面之上方存在有基板S之方向,突出成為突緣狀,和喷 嘴塊312朝向在基板之背面之下方存在有基板s之方向,突 出成為突緣狀。另外,在喷嘴塊3 1 1,3 1 2分別安裝有溶劑 吐出喷嘴3 1 4,3 1 5,面臨處理空間3 3。另外,在比溶劑吐 出喷嘴3 1 4,3 1 5更内方之基板S之内方側(噴嘴塊3 11,3 1 2之 前端側),分別配置氣體喷嘴3 1 6,3 1 7。氣體喷嘴3 1 6,3 1 7As shown in the side view of FIG. 4, the cleaning head 3 1 has an upper nozzle block 3 1 1 and a lower nozzle block 3 1 2 which face each other up and down, and a body block on which the nozzle blocks 3 11, 3 1 2 are mounted. 3 1 3. The upper and lower nozzle blocks 3 11 and 3 1 2 are arranged to face each other at a certain interval, and a processing space 33 is formed between the upper and lower nozzle blocks 3 for inserting end edges of the substrate S to be processed. The above-mentioned nozzle block 311 protrudes in a direction where the substrate S exists above the upper surface of the substrate s, and protrudes into a flange shape, and the nozzle block 312 protrudes in a direction where the substrate s exists below the rear surface of the substrate, and protrudes into a flange shape. In addition, the solvent ejection nozzles 3 1 4 and 3 1 5 are respectively installed in the nozzle blocks 3 1 1 and 3 1 2 and face the processing space 3 3. In addition, gas nozzles 3 1 6 and 3 1 7 are disposed on the inner side of the substrate S (the front end side of the nozzle block 3 11, 3 1 2) which is more inward than the solvent discharge nozzles 3 1 4 and 3 1 5. Gas nozzle 3 1 6, 3 1 7

543112 五、發明說明(18) 被構建成為從基板S之内方朝向外方傾斜的噴射氣體(空氣 或氮氣等),利用溶劑吐出喷嘴3 1 4,3 1 5,將供給到基板s 之端緣部之溶劑等吹喷到外方。 下面將對溶劑吐出喷嘴3 1 4,3 1 5和氣體喷嘴進行詳細之 說明。在此處對基板s之下面施加處理之溶劑吐出喷嘴35 和氣體喷嘴317,其位置關係與對基板δ之上面施加處理之 溶劑吐出噴嘴314和氣體噴嘴316,只有包夾基板s之上下 相反,所以以溶劑吐出喷嘴3丨4和氣體噴嘴3丨6為例進行言、 明。 °543112 V. Description of the invention (18) It is constructed as a spray gas (air or nitrogen, etc.) inclined from the inside of the substrate S toward the outside, and the solvent is ejected from the nozzles 3 1 4 and 3 1 5 to be supplied to the end of the substrate s. Solvents at the edges are blown out. The solvent ejection nozzles 3 1 4, 3 1 5 and the gas nozzle will be described in detail below. The position of the solvent ejection nozzle 35 and the gas nozzle 317 applied to the lower surface of the substrate s here is opposite to that of the solvent ejection nozzle 314 and the gas nozzle 316 applied to the upper surface of the substrate δ. Therefore, the solvent ejection nozzles 3 and 4 and the gas nozzles 3 and 6 are taken as examples for explanation. °

*溶劑吐出喷嘴314以細管狀之喷嘴噴射用以溶解抗蝕 膜之/合刈,在基板之表面上以點狀形成溶劑之 (稱為溶劑點)。 A 另外,氣體喷嘴31 6亦以細管狀之噴嘴噴射氣體, 表:亡:;;點:形成氣體之噴射區域(稱為氣體點)' 然後,调即洛劑吐出喷嘴314和氣體噴嘴316之位 j 使該氣體點之位置被配置成大致重疊 yy 溶劑吐出喷嘴m和氣體噴嘴316之各二J之 基板S之直線狀之端緣正交之線上。亦 ^在與 喷嘴314和1個之氣體噴嘴316成為i組。另 ^ = f吐出 出噴嘴314和氣體噴嘴316之組,沿著其招s纟'谷劑吐 處理空間33與形成在本體塊313内之吸引路徑318相通。 吸引路徑318經由軟管319連接到圖中未顯示 源。因 此,利用氣體喷嘴316,317吹喷之溶劑等,經由吸引路徑* The solvent ejection nozzle 314 is sprayed with a thin tube-shaped nozzle to dissolve / combine the resist film, and forms a solvent (called a solvent dot) in a dot shape on the surface of the substrate. A In addition, the gas nozzle 316 also uses a thin tube nozzle to spray gas. Table: Die: ;; Point: the area where the gas is formed (called the gas point). Then, adjust the lotion ejection nozzle 314 and the gas nozzle 316. The position j is such that the position of the gas point substantially overlaps yy on a line on which the straight edge of the substrate S of each of the two J of the solvent discharge nozzle m and the gas nozzle 316 are orthogonal to each other. Also, the nozzle 314 and the gas nozzle 316 are group i. In addition, the set of the ejection nozzles 314 and the gas nozzles 316 communicate with the suctioning path 318 formed in the body block 313 along its stroke. The suction path 318 is connected via a hose 319 to a source not shown in the figure. Therefore, the solvent or the like blown by the gas nozzles 316, 317 passes through the suction path.

543112 五、發明說明(19) 3 1 8和軟管3 1 9之内被回收。 利用此種構造’不會影響在基板S之有效區域之抗蝕 膜,可以將溶劑供給到基板s之端緣部,溶解不 —片 膜,和將其除去。 ' 之博 圖5用來說明對基板S之端緣部之洗淨處理。 劑塗膜之處理對象之基板s,在基板授受 ,^ 到升降梢12(步驟T1)。 破搬入 當將基板S授給升降梢1 2時,使升降梢丨2下降 =3;與ίΓ吸著板111(基板保持台⑴之上面“ 相同之同度,基板S之中央部被升降梢丨2支持,和夷 ==緣部…部份成為被裝載在基板保“11之 狀心(v ^T2)。錢,在此種狀態,利用位置調整機 Ί水牛平面内之基板S之位置’帛來將基板S定位在預定 之位置(步驟T3)。 牡了貝疋 始吸著溝113内之空氣之吸引,將基板8吸著在 及者板111之上面(步驟Τ4)。然後,支持基板s之中央部之 升降梢1 2只下降預定之微小高度(步驟T5 )。上述之微小高 度被设定成為使基板s和升降梢丨2維持接觸之程产之言 度,當升降梢12下降上述之微小高度時,基板s:中:部 比鈿緣部稍微下降之狀態,成為被支 升降梢1 2。因此,A柘ς X合棱较以 土败保得口 i 1和 r — 土板S不曰偏移’利用位置調整機構2可 乂使,板S知疋在被定位之位置(上述之預定之位置)。另 外,時基板S之中央部被升降梢丨2支 部以外之部份被吸著和保持在基板保丄中 第23頁 \\312\2d-code\9】-07\9]107071·ι 543112 五、發明說明(20) — 吸著板1 1 1在與有效區域相同之位置或其内側,用來支持 基板之端緣部不會垂下和可以保持水平之區域。因此,基 板吸著板111之内緣部1Ub之内側之基板部份,即使對基i 板保持台11有上下之微小高度差時,亦可以確保端緣部i之 水平。543112 V. Description of the invention (19) 3 1 8 and hose 3 1 9 are recovered. With this structure ', the resist film in the effective area of the substrate S is not affected, and a solvent can be supplied to the edge portion of the substrate s to dissolve the non-film and remove it. FIG. 5 is a diagram for explaining the cleaning process of the edge portion of the substrate S. The substrate s of the processing target of the agent coating film is transmitted and received on the substrate to the lifting tip 12 (step T1). When the substrate S is given to the lifting pins 1 and 2, the lifting pins 丨 2 are lowered = 3; at the same degree as the upper surface of the suction plate 111 (the upper surface of the substrate holding table), the central portion of the substrate S is raised and lowered.丨 2 support, Heyi == edge part ... part of the shape is loaded on the substrate security "11" (v ^ T2). In this state, the position adjustment machine is used to position the substrate S in the buffalo plane. Then, the substrate S is positioned at a predetermined position (step T3). After the substrate is sucked by the air in the groove 113, the substrate 8 is adsorbed on the access panel 111 (step T4). Then, The lifting pins 12 at the center of the supporting substrate s are lowered by a predetermined minute height (step T5). The above-mentioned minute heights are set so that the substrate s and the lifting pins are maintained in contact with each other. 12 When the above-mentioned minute height is lowered, the state of the substrate s: middle: portion is slightly lower than that of the rim portion, and it becomes a supported lifting tip 1 2. Therefore, A 柘 ς X joint edge is more secure than soil failure i 1 and r — The soil plate S is not shifted. The position adjustment mechanism 2 can be used to ensure that the plate S is in the position to be positioned (the above-mentioned Fixed position). In addition, the central part of the substrate S is lifted and lowered, and the part other than the 2 branches is attracted and held in the substrate holder. Page 23 \\ 312 \ 2d-code \ 9】 -07 \ 9] 107071 · ι 543112 V. Description of the invention (20)-The suction plate 1 1 1 is used to support the area where the edge of the substrate will not sag and can be kept horizontal at the same position or inside of the effective area. Therefore, the substrate The substrate portion on the inner side of the inner edge portion 1Ub of the suction plate 111 can ensure the level of the end edge portion i even when there is a slight height difference between the base plate holding table 11 and the upper edge.

然後’利用洗淨機構3對基板s之端緣部進行洗淨(步驟 T6)。亦即,洗淨頭31八,31131(:,311)分別沿著引導轨道 32A,32B,32C,32D,從被基板吸著板吸著之基板s之各 邊之一端,移動到另外一端,在此過程中,從二劑吐出喷 嘴3 14, 315吐出溶劑,和從氣體喷嘴3 16, 317噴射氣體。另 外’在從氣體噴嘴3 1 6,3 1 7喷射氣體之期間,經由吸引路 徑3 1 8進行處理空間3 3内之吸氣。 工 當元成基板S之端緣部之洗淨時,經由空氣吸引/氮氣供 給配管114,將氮氣供給到吸著溝丨13(步驟T7)。升^梢 下降上述之微小咼度,用來使基板s成為中央部比端緣部 稍彳政下降之狀悲’因為可以緩和基板s被吸著到基板吸著 板1 1 1之吸著狀態,所以經由將氮氣供給到其後之吸著溝 11 3,可以使基板s不會產生偏移等,可以解除基板s被吸 著在基板吸著板111之吸著狀態。Then, the end portion of the substrate s is cleaned by the cleaning mechanism 3 (step T6). That is, the washing heads 31 and 31131 (:, 311) are moved along the guide rails 32A, 32B, 32C, and 32D from one end of each side of the substrate s attracted by the substrate attracting plate to the other end, In this process, the solvent is ejected from the two-dose ejection nozzle 3 14, 315, and the gas is ejected from the gas nozzle 3 16, 317. In addition, while the gas is ejected from the gas nozzles 3 1 6 and 3 1 7, the suction in the processing space 3 3 is performed via the suction path 3 1 8. When the end edge portion of the element substrate S is cleaned, nitrogen is supplied to the suction groove 13 through the air suction / nitrogen supply pipe 114 (step T7). The rising edge lowers the above-mentioned small degree, and is used to make the substrate s become slightly depressed at the central portion than the end edge portion, because the absorption state of the substrate s to the substrate suction plate 1 1 1 can be eased. Therefore, by supplying nitrogen to the subsequent suction groove 113, the substrate s can be prevented from being shifted, and the substrate s can be released from the suction state of the substrate suction plate 111.

其次,使升降梢12上升,將基板s提升到除電高度以(步 驟T8 )。然後,在其後之一定時間,將基板3保持在除電高 度He ’在這期間從除電器4對基板S照射正離子和負離子 (步驟T9)。利用此種方式,在基板3有帶電之情況時,可 以對該帶電之基板S進行良好之除電,可以防止由於帶電Next, the lifting tip 12 is raised, and the substrate s is raised to a static elimination height (step T8). Then, at a certain time thereafter, the substrate 3 is held at the neutralization height He 'during which the substrate S is irradiated with positive and negative ions from the static eliminator 4 (step T9). In this way, when the substrate 3 is charged, it is possible to perform good static elimination on the charged substrate S, which can prevent

\\312\2d-code\91-07\91107071.ptd\\ 312 \ 2d-code \ 91-07 \ 91107071.ptd

543112 五、發明說明(21) 而引起基板S之污染(灰塵之吸著等)。在基板s之除電後, 升降梢1 2更進一步的上升’將基板S提升到基板授受高度 Hd (步驟T10)。然後,從該基板授受高度Hd將基板s搬出 (步驟T1 1 )。 依照上述之方式,本實施形態之基板保持機構丨(基板保 持裝置)構建成利用多根之升降梢1 2從背面側支持基板s之 中央部,利用該升降梢1 2之升降用來使基板S升降,可以 使升降梢1 2上之基板S之彎曲變小,例如,即使基板s為大 型而且薄型者時,亦可以使該大型而且薄型之基板s良好 的升降。 义 另外,在對基板S之端緣部進行洗淨處理時,基板s其中 央。卩被升降梢1 2支持,和其中央部和端緣部以外之部彳八 吸著和保持在基板保持台丨丨。利用此種方式,即使美:s 型者時’被基板保持機構1保持之基板1亦不 曰有產生寫,曲之問題。因此,在與噴嘴塊3丨丨,3丨 定間隔之狀態,基板s之端緣部可以進入處理空内, 可以對基板S之端緣部施加良好之洗淨處理。亦即,美 之表面和溶劑吐出噴嘴314之距離可以正確的保二 此,不會對基板S之有效區域之抗蝕劑膜造成影塑。 另外,基板S因為對噴嘴塊311,312保持一定之a門隐^ 以基板S在上下方向可以對吸引路徑31 8進行正石^定位 因此’從吸引路徑318排氣之強度在基成 為指…度。因此,不會有基板3之上面或下面面和之下一面成 之排虱k成比扎疋值強’而另外一方變成比指定。543112 V. Description of the invention (21) Contamination of the substrate S (adsorption of dust, etc.). After the substrate s is de-energized, the lift pins 12 are further raised 'to raise the substrate S to the substrate receiving and receiving height Hd (step T10). Then, the substrate s is carried out from the substrate receiving and receiving height Hd (step T1 1). As described above, the substrate holding mechanism 丨 (substrate holding device) of this embodiment is configured to support the central portion of the substrate s from the back side by using a plurality of lifting pins 12 and use the lifting of the lifting pins 12 to make the substrate S lifting can reduce the bending of the substrate S on the lifting tip 12. For example, even if the substrate s is large and thin, the large and thin substrate s can be lifted well. In addition, when the end edge portion of the substrate S is cleaned, the substrate s is centered.卩 It is supported by the lifting tip 12 and the part other than the central part and the edge part 彳 It is sucked and held on the substrate holding table 丨 丨. With this method, even if the substrate 1 held by the substrate holding mechanism 1 is beautiful, the problem of writing and music is not caused. Therefore, in a state of being spaced apart from the nozzle blocks 3 丨 丨, 3 丨, the edge portion of the substrate s can enter the processing space, and a good cleaning treatment can be applied to the edge portion of the substrate S. That is, the distance between the beautiful surface and the solvent ejection nozzle 314 can be accurately maintained. Therefore, it does not affect the resist film in the effective area of the substrate S. In addition, because the substrate S keeps a certain door aside from the nozzle blocks 311 and 312, the suction path 318 can be positioned with the substrate S in the up and down direction. Therefore, the intensity of the exhaust gas from the suction path 318 becomes the basis ... degree. Therefore, no tick lice k formed on the upper or lower surface and lower surface of the substrate 3 will be stronger than the zap value, and the other will become more specific.

第25頁 543112Page 543112

543112 五、發明說明(23) 基板S在基板保持台1 1 (基板吸者板1 1 1 )上滑動時,亦大 不會由於基板S或基板吸著板1 1 1之摩耗而發生灰塵’、,、致 會由於該發生之灰塵而造成基板S之污染。 ’亦不 另外,對此種基板S和基板吸著板11 i之間供給氣f ,大 為基板S被吸著到基板吸著板111之吸著狀態被解2孔因 從基板吸著板111將處理後之基板3提升時,可以:= 之發生,和可以防止由於靜電使基板§帶電。另外,/ 板吸著板1 1 1提升時,即使在基板s有帶電之情況日士,k因^ 该V電之基板S,在該從基板端緣洗淨裝置搬出之寸,— 配置在除電咼度He的除電。因此可以更進一層的良 由於帶電而引起之基板S之污染。 以上所說明者是本發明之第丨實施形態,但是本 可以以其他之形態實施。例如,在上述之實施形離*中是以 被裝載在基板保持台〗丨之狀態進行基板5之定位,但是 可以在被升降梢1 2支持之狀態進行基板s之定位。亦即, 亦可以利用基板搬運機ϋ人搬運成為處理對象之基板s, 基給升降梢12之後’使接觸梢2ΐι接觸在升降 =12上之基板S之端面,用來將基板s定位在預定之位置。 建成在升降梢12上進行基板5之定位之情況時,當应 2板1持台η上進行基板5之定位之構造比較時… 之靜電量減少,可以更進-層的防止由於 月?電而造成基板s之帶電。 另=,當在升降梢12上進行基板3之定位之情況時,在 疋位後使升降梢12τ降,成為W基板保持台η保持基板 第27頁 C:\2D-roDE\91-07\91107071.ptd 543112543112 V. Description of the invention (23) When the substrate S slides on the substrate holding table 1 1 (substrate suction plate 1 1 1), dust will not be generated due to the friction of the substrate S or the substrate suction plate 1 1 1 ' The pollution of the substrate S may be caused by the generated dust. 'It is not otherwise, the gas f is supplied between the substrate S and the substrate suction plate 11 i, and the suction state of the substrate S is attracted to the substrate suction plate 111, and the hole 2 is released because the plate is sucked from the substrate. 111 When the processed substrate 3 is lifted, == can occur, and the substrate § can be prevented from being charged due to static electricity. In addition, when the / plate suction plate 1 1 1 is lifted, even if the substrate s is charged, the voltage k of the substrate S is removed from the substrate cleaning device at the edge of the substrate. The degree of static elimination is He. Therefore, it is possible to further improve the contamination of the substrate S due to charging. The above description is the first embodiment of the present invention, but it may be implemented in other forms. For example, in the above-mentioned embodiment, the positioning of the substrate 5 is carried out in the state of being loaded on the substrate holding table, but the positioning of the substrate s can be performed in the state of being supported by the lift pins 12. That is, it is also possible to use a substrate handler to transport the substrate s that is the object of processing, and after the substrate 12 is lifted and raised, the contact tip 2ΐ is brought into contact with the end surface of the substrate S on the lift = 12 to position the substrate s at a predetermined position. Its location. In the case of positioning the substrate 5 on the lifting tip 12, when the structure of the positioning of the substrate 5 on the 2 plate 1 holding platform η is compared ... The amount of static electricity is reduced, which can be further improved. Electricity causes charging of the substrate s. In addition, when the positioning of the substrate 3 is performed on the lifting tip 12, the lifting tip 12τ is lowered after the positioning, and becomes the W substrate holding table η to hold the substrate. 91107071.ptd 543112

543112 五、發明說明(25) 另外,如圖7所示,基板吸著板丨丨1被設著成可以圍繞沿 著其長度方向之水平軸線1 1 7自由的搖動,包夾升降梢1 2 之互相面對之一對基板吸著板1 1 1之外緣部丨丨丨a進行上 升,利用基板吸著板1 1 1之外緣部1 Π a將基板S壓上,亦可 以用來緩和基板S被吸著到基板吸著板丨〗1之吸著狀態。 另外,經由進行升降梢1 2之微小之上下移動,和基板吸 著板1 1 1之搖動之雙方,亦可以用來緩和基板3被吸^到基 板吸著板1 1 1之吸著狀態。亦即,與升降梢丨2之稍微上升 並行的,使基板吸著板111之外緣部丨丨丨a下降到下方,利 用基板吸著板11 1之内緣部1 llb將基板S壓上,亦可以用來 緩和基板S被吸著到基板吸著板丨n之吸著狀態。另外,盘 升降梢1 2之稍微下降並行的,使基板吸著板丨丨丨之外緣部、 1 1 1 a上升,用來使基板S之中央部落入在基板吸著板丨工^ 間,亦可以緩和基板S被吸著到基板吸著板丨丨丨之吸著狀 態。 另外,在上述之實施形態中,所示之實例是使用螺 133和螺帽134等所構成之螺旋構造作為升降驅動機構, 疋亦可以採用以氣缸作為驅動源之氣缸驅動機構。 另外,在上述之實施形態中,所示之實例是在塗 劑液之後,以附著在基板8之端緣部之不要之抗蝕劑汾几蝕 膜,作為基板S之端緣部之不要之薄膜,但是本發^ 應用在於塗布光抗蝕劑液,感光性聚醯亞胺樹脂, 濾器用染色劑等之各種藥液後,用以除去不要之薄膜之=543112 V. Description of the invention (25) In addition, as shown in FIG. 7, the substrate suction plate 丨 丨 1 is set to swing freely around the horizontal axis 1 1 7 along its length direction, and the lifting pin 1 2 is clamped. One of them facing each other raises the outer edge portion of the substrate suction plate 1 1 1 丨 丨 a, and uses the outer edge portion 1 of the substrate suction plate 1 1 1 to press the substrate S up, which can also be used to The substrate S is attracted to the adsorption state of the substrate adsorption plate 丨 1. In addition, both the slight upward and downward movements of the lifting tips 12 and the shaking of the substrate suction plate 1 1 1 can also be used to ease the suction state of the substrate 3 to the substrate suction plate 1 1 1. That is, in parallel with the slight rise of the lifter 丨 2, the outer edge portion 丨 丨 a of the substrate suction plate 111 is lowered downward, and the substrate S is pressed up by the inner edge portion 11b of the substrate suction plate 11 1 It can also be used to ease the adsorption state of the substrate S to the substrate adsorption plate n. In addition, the disc lifting tips 1 2 are slightly lowered in parallel, so that the outer edge of the substrate suction plate 丨 丨 1 rises 1 1 a, so that the central tribe of the substrate S enters the substrate suction plate 丨It is also possible to ease the adsorption state of the substrate S to the substrate adsorption plate 丨 丨 丨. In addition, in the above-mentioned embodiment, the illustrated example uses a spiral structure constituted by a screw 133, a nut 134, and the like as the lifting driving mechanism, and a cylinder driving mechanism using a cylinder as a driving source may also be used. In addition, in the embodiment described above, the illustrated example is an unnecessary resist film adhered to the end edge portion of the substrate 8 after the coating solution, as an unnecessary edge edge portion of the substrate S. Thin film, but this application is used to remove unnecessary thin films after coating various photochemical solutions such as photoresist liquid, photosensitive polyimide resin, and filter dyes.

543112 五、發明說明(26) 態了 路附圖用來詳細的說明本發明之第2實施形 面s Y 1曰二明之第2實施形態之基板端緣洗淨裝置之平 淨襄置用來洗淨和看到之剖面圖。該基板端緣洗 形基板s之端緣部之不去要如 液後之方形基板之Λ邦 例如’附著在塗布抗钱劑 哕其祐"而、味邛之不要之抗蝕劑塗膜)。 處;;i象:、:板Γ裝置具備有:基板保持機構1,用來保持 構1之保持基似之/持=置整機=’用來調整純 基板保持機構機構3,用來洗淨被 機構1之上方Γ固土一板s之而v部。另外,在基板保持 之灵板s進一 il:圖9所示,配置有除電器4用來對處理後 離;ί負離V,。除電器4例如利用電暈放電用來產生正 她配置基板S,可以對基板k全體照 的除去基板S所帶之電荷。 討错以良好 S,基用板來保吸持著機的構^備有:基板保持台11,可以裝載基板 形悲中為8根)之升降梢J 2,用來使 κ ώ 11造杆相#+在收二 用木使基板S對该基板保持台 之ί板保持台U接觸在包圍基板3之背面 LV : f :。大致四角框架之區4 ’吸著該接觸之區域,可 以,J板S保持在預定之基板處理高度,大致成為二。 的降梢12被設在基板保持台11之内方’成為敍直 之基座板121上。在基座板121結合被設在其 下方之升降驅動機構13。該升壓驅動機構13包含有:—對543112 V. Description of the invention (26) The attached drawing is used to describe in detail the second embodiment of the present invention. The surface cleaning device for the edge cleaning of the second embodiment of the second embodiment of the present invention is used to clean the substrate. Wash and see the cross section. The edge of the substrate washes the shape of the edge of the substrate s like the square substrate of the liquid substrate. For example, it is attached to the coating of anti-moisturizer 哕 其 佑 " ). I; ::: The plate Γ device is provided with: a substrate holding mechanism 1, which is used to hold the holding base of the structure 1 / hold = set the whole machine = 'for adjusting the pure substrate holding mechanism mechanism 3, for washing Above the net body 1 above, Γ solidifies a plate s and v part. In addition, as shown in FIG. 9, the spirit plate s held by the substrate is further equipped with a static eliminator 4 for separating after processing; The static eliminator 4 uses, for example, a corona discharge to generate the substrate S disposed thereon, so that the entire charge of the substrate k can be removed from the charge of the substrate S. The structure is based on a good S, and the substrate is used to hold the machine. The board is equipped with: a substrate holding table 11, which can be loaded with 8 substrates (2), which can be used to make the rod. Phase # + At the second stage, the substrate S is brought into contact with the substrate holding stage U of the substrate holding stage U on the back surface surrounding the substrate 3 LV: f:. The area 4 'of the substantially quadrangular frame attracts the contact area, so that the J plate S can be maintained at a predetermined substrate processing height, which becomes approximately two. The lower tip 12 is provided inside the substrate holding table 11 'on the base plate 121 which becomes straight. The base plate 121 is coupled to an elevating drive mechanism 13 provided below it. The boost driving mechanism 13 includes:

C:\2D-OODE\9]-07\91107071.ρί^ 543112 五、發明說明(27) 一 ---- 引導執道131,被固定在基板保持台^,以雜直方向延 =:可移動之升降框架132,被該一對之引導執道⑶引 導,螺旋軸133,在該一對之引導執道131之間之位置,被 配置成沿著鉛直方向(與引導執道131平行之方向);螺帽 134,以螺紋接合該螺旋軸133 ;和馬達135,結合在螺旋 軸133。升降框架132之上端被固定在基座板ΐ2ι之下面。 另外,螺帽1 3 4被安裝在升降框架丨3 2。因此,經由使馬 135正轉/逆轉,可以使升降框架132沿著引導執道i3i升 降,用來使被固定在該升降框架132之上端之基座板121進 行升降。 依照此種構造,經由利用升降驅動機構丨3使基座板丨2 i 進行升降(上下移動),用來從背面側支持基板3之中央 部,可以使該基板S,在基板處理高度(基板保持台丨丨之上 面)與其基板處理高度之上方之除電高度以或基板授受高 度Hd之間,進行升降。基板授受高度^例如成為除電高度 He和其上方之除電器4之間之位置,在該基板授受高度C: \ 2D-OODE \ 9] -07 \ 91107071.ρί ^ 543112 V. Description of the invention (27) A ---- The guide 131 is fixed on the substrate holding table ^ and extends in a straight direction =: may The moving elevating frame 132 is guided by the pair of guide rails ⑶, and the spiral shaft 133 is positioned between the pair of guide rails 131 in a vertical direction (parallel to the guide rails 131). Direction); a nut 134 to thread the screw shaft 133; and a motor 135 coupled to the screw shaft 133. The upper end of the elevating frame 132 is fixed below the base plate 2m. In addition, the nuts 1 3 4 are mounted on the elevating frame 丨 3 2. Therefore, by turning the horse 135 forward / reverse, the lifting frame 132 can be raised and lowered along the guide path i3i, and used to raise and lower the base plate 121 fixed to the upper end of the lifting frame 132. According to this structure, the base plate 丨 2 i is raised and lowered (moved up and down) by using a lifting drive mechanism 丨 3 to support the central portion of the substrate 3 from the rear side, so that the substrate S can be raised at a substrate processing height (substrate) Above the holding stage 丨 丨) and the substrate removal height above the substrate removal height or the substrate receiving and receiving height Hd. The substrate receiving and receiving height ^ is, for example, a position between the static elimination height He and the static eliminator 4 above it.

Hd,於圖中未顯示之基板搬運機器人與升降梢丨2之間,進 行基板S之授受。 位置δ周整機構2具備有利用氣缸進行進退之4個位置調整 頭21人,218,21(],210。位置調整頭21人,218,21〇,,210具肴1 根或多根之接觸梢21 1,被配置成對於被基板保持台丨丨保 持之基板S之各邊之面對位置,分別以接近/離開基板s之 各個之方向,進行進退。在本實施形態中,2個之位置調 整頭21 A,21B分別具有1根之接觸梢2Π,在該2個之位置調Hd, the substrate S is received and received between the substrate carrying robot and the lifting tip 2 (not shown). The position δ rounding mechanism 2 is equipped with 21 positioners, 218, 21 (], and 210 for 4 position adjustment heads that use the cylinder to advance and retreat. 21 position position adjustment heads, 218, 21, 2, 210, and 1 or more The contact pins 21 1 are arranged to advance and retreat in the directions of approaching and leaving the substrate s to the facing positions of the sides of the substrate S held by the substrate holding table 丨 丨. In this embodiment, two The position adjustment heads 21 A and 21B each have one contact tip 2Π.

543112 五、發明說明(28) 整頭2 1 A,2 1 B形成包夾基板俘拄 整頭21C,21D分別且有2祀對,位置調 刀乃J 百z根之接觸梢2 1 1。 各個接觸梢2 1 1被設置成為γ 之前端垂下之狀能,=位置调整頭21A,21B,21C, 21C,21D進退之氣缸f最^ f以使位置調整頭21A,21B, a ^ A 1干大伸長之狀態,成為接觸在被裝 ,基板S之端面。在所有之接觸梢21"妾 =,Λ時之水平面内之基板s之位置,因為被定 之後,U 曰所/以在將基板3裝載於基板保持台1 1上 在A % ς > \礼缸私進仃伸長,經由使各個接觸梢211接觸 ;;板=端面,可以將基板保持台η上之基板5定位在上 述之一定位置。 到2二# =面I在氣缸桿最收縮之狀態,接觸梢211退避 ,成為不會妨礙利用洗淨機構3洗淨基板S之端 卞^ ^ ί各個接觸梢2U之起始位置,配置有洗淨杯22, 置之接觸梢2U被收容在洗淨杯22内。在洗 ;=!,!液喷嘴用來喷出洗淨液,爾該洗淨液 賀為將冼斤液吹賀到被收容在洗淨杯22内之接觸梢211, 可以用來洗淨和除去附著在接觸梢21丨之固化之抗蝕劑 ,因此,利用洗淨液在適當之時期進行接觸梢2 1 1之洗 淨可以以未附著有抗蝕劑液之固化物之清淨之接觸梢 11接觸在基板s之端面,可以使基板s不會污染的進行基 板S之定位。 土 、/洗淨機構3具備有洗淨頭31 A,31 B,3 1C,31 D(總稱為「洗 淨頭3 1」)’分別用來洗淨被基板保持台11吸著和保持之 543112543112 V. Description of the invention (28) The whole heads 2 1 A and 2 1 B form the sandwich substrate capture heads. The whole heads 21C and 21D have 2 target pairs respectively, and the position adjustment knife is the contact tip 2 of the 100 roots. Each contact tip 2 1 1 is set to the state where the front end hangs down, = the position adjustment heads 21A, 21B, 21C, 21C, 21D are moved forward and backward by the cylinder f to make the position adjustment heads 21A, 21B, a ^ A 1 In a state of great elongation, the end face of the substrate S is brought into contact with the substrate. At the position of the substrate s in the horizontal plane of all the contact pins 21 " 妾 =, Λ time, since it is determined, U is set at A% ς > when the substrate 3 is mounted on the substrate holding table 1 1 The gift box is extended, and each contact tip 211 is brought into contact; plate = end surface, the substrate 5 on the substrate holding table η can be positioned at the above-mentioned certain position.到 22 二 # = The surface I is in the most contracted state of the cylinder rod, and the contact tip 211 is retracted, so that it will not prevent the end of the substrate S from being cleaned by the cleaning mechanism 3. ^ ^ The starting position of each contact tip 2U is configured with The cleaning cup 22 is placed in the cleaning cup 22 with the contact tip 2U. During washing; =!,! The liquid nozzle is used to spray the washing liquid. The washing liquid is used to blow the sack liquid to the contact tip 211 contained in the washing cup 22, which can be used for washing and Since the cured resist adhered to the contact tip 21 丨 is removed, the contact tip 2 1 1 can be cleaned with a cleaning solution at an appropriate time, and the contact tip can be cleaned with the solidified product without the resist solution attached. 11 is in contact with the end surface of the substrate s, so that the substrate s can be positioned without contamination. The soil / cleaning mechanism 3 is provided with cleaning heads 31 A, 31 B, 3 1C, and 31 D (collectively referred to as "cleaning heads 3 1"), which are used to clean the substrates held and held by the substrate holding table 11 respectively. 543112

543112 五、發明說明(30) 圖10是基板保持台丨〗之平 v ― v看到之剖面圖。基板保持另外’圖η是從圖! 〇之 —對之滑動框架lm,112B 固定框架112F ; 固定框架U2F進行自由之相?皮:又置成在水平方向可以對 119Β,分別被安裝在一對之、、月f ;和基板吸著板119Α, 固定框架η心建架im,ii2B-上面。 -對腳構㈣之間,架;= = 字狀之 件52。在腳構件51之上面51a Λ千方向延伸之多根連結構 執道53,在哕引遙鈾、#人〜者長度方向形成有引導 54。 在μ引¥執道53結合有可自由滑動之滑動構件 放二^ Γ架U2A,112Β分別在平面看形成口字狀,以使開 2而互相面對之狀態,設置成跨越在一對之腳構件。。在 滑動框架112Α,112Β之開放端間,產生間隙57,在各個間 隙57配置有}根之固定梢12〇。固定梢12〇設立在腳構件51 之上面,其上端位於包含基板吸著板n9A,119B之上面之 平面内。 沿著滑動框架11 2A,1 1 2B之腳構件51之部份,分別被固 定在滑動構件5 4,利用此種方式,滑動框架11 2 A,11 2 B可 以沿著引導軌道53往復的移動。另外,在滑動框架1 12A, 112B ’經由支架56A,56B連結氣缸55A,55B之氣缸桿551之 前端。氣缸55A,55B被安裝在固定框架112F,使各個氣缸 桿551以離開氣缸本體52之互反方向,和與引導執道53平 行之方向,進行進出。 基板吸著板119A,119B分別形成與滑動框架112A,112B對543112 V. Description of the invention (30) FIG. 10 is a cross-sectional view of the substrate holding table 丨〗 v ― v. The substrate remains another'Figure η is from the figure! 〇 之 —Sliding frame lm, 112B, fixed frame 112F; fixed frame U2F for free phase? Skin: It is set so that it can be paired with 119B in the horizontal direction, and it is installed on a pair of 、, ff; and the substrate suction plate 119A, the fixed frame η, the center frame im, ii2B-. -Between the foot frame, frame; = = Character 52. On the upper surface of the leg member 51, a plurality of connecting structure guides 53 extending in the Λ-thousand direction are provided with guides 54 in the direction of the long-distance uranium and the humans. Put two sliding members that can slide freely at μ 引 ¥ 道道 53 ^ U racks U2A, 112B are formed in the shape of a mouth when viewed in plan, so that the two are facing each other, and are set to span across a pair of Foot building. . A gap 57 is formed between the open ends of the sliding frames 112A and 112B, and a fixed tip 12 is arranged at each gap 57. The fixed tip 120 is set on the upper surface of the leg member 51, and its upper end is located in a plane including the upper surfaces of the substrate suction plates n9A and 119B. The parts of the foot members 51 along the slide frames 11 2A and 1 1 2B are respectively fixed to the slide members 5 4. In this way, the slide frames 11 2 A and 11 2 B can be reciprocated along the guide rail 53. . Further, the front ends of the cylinder rods 551 of the cylinders 55A and 55B are connected to the slide frames 112A and 112B 'via the brackets 56A and 56B. The air cylinders 55A and 55B are mounted on the fixed frame 112F so that each of the cylinder rods 551 can enter and exit in opposite directions away from the cylinder body 52 and in a direction parallel to the guide guide 53. The substrate suction plates 119A and 119B are respectively formed in pairs with the sliding frames 112A and 112B.

\\312\2d-code\9l-07\9l107071.ptd 第34頁 543112\\ 312 \ 2d-code \ 9l-07 \ 9l107071.ptd Page 34 543112

應之平面:7字狀。在其上面形成有多個之吸著溝丨丨3 (夂昭 圖8)。該多個吸著溝113與連接到吸引源和氮氣供給源^圖 中均未顯示)之空氣吸引/氮氣供給配管丨丨4相通。依照此 種方式,可以利用吸引源之動作用來吸引吸著溝11 3内之 空氣,和從氮氣供給源將氮氣供給到吸著溝丨丨3内。另 ^卜’在基板吸著板119人,1198可以裝載基板8,以基板8被 裝載在基板吸著板119A,11 9B之狀態,經由吸引該吸著溝 11 3内之空氣’可以使基板s被吸著在基板吸著板丨丨9 a,Should be flat: 7-shaped. A plurality of suction grooves 3 are formed thereon (沟 昭 Figure 8). The plurality of suction grooves 113 communicate with an air suction / nitrogen supply pipe connected to a suction source and a nitrogen supply source (not shown in the figure). In this way, the action of the suction source can be used to suck the air in the suction groove 113, and to supply nitrogen into the suction groove 1 from the nitrogen supply source. In addition, '119 people can be loaded on the substrate suction plate 1198, the substrate 8 can be loaded in 1198, and the substrate 8 is loaded on the substrate suction plates 119A, 11 9B, and the substrate can be attracted by the air in the suction groove 11 3'. s is adsorbed on the substrate adsorption plate 丨 丨 9 a,

11 9 B之上面。另外一方面,以基板s被吸著在基板吸著板 11 9 A,1 1 9 B之狀態,經由將氮氣供給到吸著溝丨丨3,可用來 解除基板S之被吸著到基板吸著板1 1 9A,1 1 9B。 在氣缸55A,55B之氣缸桿551沒入到氣缸本體552之狀 態,在基板吸著板1 1 9A, 1 1 9B例如可以裝載750mm X 6 2 0mm 之尺寸之基板s 1,在氣缸桿5 5 1之出沒方向,使其端緣部 從基板吸著板11 9A,1 1 9B之端緣突出1 5mm,在氣缸桿551之 出沒方向之正交方向,突出50mm。 另外一方面,在氣缸55A,55B之氣缸桿551最進出氣缸本 體5 52之狀態,例如可以在基板吸著板1 1 9A,1 1 9B裝載 680 mrax 880 mm之尺寸之基板S2,在氣缸桿551之出沒方 向,使其端緣部從基板吸著板1 13A,113B之端緣突出 15 mm,在氣缸桿551之出沒方向之正交方向突出15 mm。另 外,裝載73 0mmx 920mm之尺寸之基板S3,在氣缸桿551之 出沒方向,使其端緣部從基板吸著板Π 9A,11 9B之端緣突 出35 mm,在氣缸桿551之出沒方向之正交方向突出40 mm。11 9 B above. On the other hand, in the state where the substrate s is sucked on the substrate suction plates 11 9 A, 1 1 9 B, by supplying nitrogen to the suction grooves 3, it can be used to release the suction of the substrate S to the substrate suction. Landing plates 1 1 9A, 1 1 9B. In a state where the cylinder rods 551 of the cylinders 55A and 55B are submerged in the cylinder body 552, the substrate suction plates 1 1 9A, 1 1 9B can be loaded with a substrate s 1 having a size of 750 mm X 6 2 0 mm, and the cylinder rod 5 5 The direction of occurrence of 1 is such that the end edge portion protrudes 15 mm from the end edges of the substrate suction plates 11 9A and 1 1 9B, and protrudes 50 mm in the orthogonal direction of the direction of the cylinder rod 551. On the other hand, in the state where the cylinder rods 551 of the cylinders 55A and 55B are most in and out of the cylinder body 5 52, for example, a substrate S2 with a size of 680 mrax 880 mm can be loaded on the substrate suction plate 1 1A, 1 1B, and the cylinder rod The direction of 551 so that its end edge protrudes 15 mm from the edges of the substrate suction plates 113A and 113B, and protrudes 15 mm in the direction orthogonal to the direction of the cylinder rod 551. In addition, the substrate S3 with a size of 73.0 mmx 920 mm is mounted in the direction of the cylinder rod 551 so that its end edge protrudes 35 mm from the edge of the substrate suction plate Π 9A, 11 9B, and in the direction of the cylinder rod 551. Protrudes 40 mm in the orthogonal direction.

C:\2D-CODE\91-07\91107071.ptd 第35頁 543112C: \ 2D-CODE \ 91-07 \ 91107071.ptd Page 35 543112

因此’依照處理對象之基板之大小,使基板吸著板n9A ,士119B &動,即使是75〇mmx 62〇_之較小尺寸之基板^ 二J是73〇mm X 920_之較A尺寸之基板S3,目為可以保 ^成為基板端緣部不會從基板吸著板〗丨9 A,〗丨9 B大幅的突 口此,本貫施形態之基板保持台丨〗(基板保持裝置)可 ί ir的保持多種尺寸之基^,s2,s3,而在其端緣部等 个會產生幫曲。 另外,利用基板吸著板119A,119B(滑動框架112α ιΐ2Β) 之滑動,即使滑動框架11 2A,11 2B之開放端間之間隙57變 大時,因為在該間隙57設有固定梢12〇,所以間 變大亦不會有在基板S2,S3產生彎曲之問題。障57「使Therefore, according to the size of the substrate to be processed, the substrate suction plate n9A, 119B & is moved, even if the substrate is a smaller size of 75mm x 62〇_ ^ J is 73mm X 920_ compared to A The size of the substrate S3 is to ensure that the substrate edge does not attract the substrate from the substrate. 丨 9 A, 〖9 B The large protrusions. This is the substrate holding stage of this embodiment. The device) can keep the bases of various sizes ^, s2, s3, and waiting at its end edge will produce help. In addition, by using the sliding of the substrate suction plates 119A, 119B (sliding frame 112α ι 2B), even if the gap 57 between the open ends of the sliding frames 11 2A, 11 2B becomes large, because the gap 57 is provided with a fixed tip 120, Therefore, there is no problem that the substrates S2 and S3 are bent if the interval is large. Obstacle 57

另外,伴隨基板尺寸之變更之調整作業,因為經由操^ 圖中未顯示之輸入操作盤等,使氣缸55A,55B之氣缸桿55. 出沒即可,所以該調整作業不需要很大之工夫,當與依用 基板之尺寸更換基板吸著板之構造之裝置比較時,可以名 更短之時間内完成調整作業。因此,不會由於伴隨基板只 寸之變更而造成裝置運轉率之降低。另外,因為不需要你 照基板之大小準備多種之基板吸著板,所以可以使裝置成 本降低。 、以上已說明本發明之第2實施形態,但是本發明亦可以 以其他之形怨貫施。例如,在上述之實施形態中,所示之 實例其構造是依照基板之尺寸,使一對之基板吸著板 11 9A,11 9B在互相接近和離開之方向進行滑動,但是亦可 以採用如圖1 2所示之構造,使形成平面L字狀之4個之基板In addition, the adjustment operation accompanying the change in the size of the substrate requires the cylinder rod 55. of the cylinders 55A, 55B through the input operation panel and the like not shown in the figure, so the adjustment operation does not require a lot of time, When compared with a device that replaces the structure of the substrate suction plate according to the size of the substrate, the adjustment operation can be completed in a shorter time. Therefore, there is no reduction in the operating rate of the device due to the change in the size of the substrate. In addition, since you do not need to prepare a variety of substrate suction plates according to the size of the substrate, the cost of the device can be reduced. Although the second embodiment of the present invention has been described above, the present invention may be implemented in other forms. For example, in the embodiment described above, the example shown has a structure in which a pair of substrate suction plates 11 9A, 11 9B slide in the directions of approaching and leaving each other according to the size of the substrate, but it can also be used as shown in FIG. The structure shown in Fig. 12 makes four substrates in a flat L shape.

543112 五、發明說明(33) 吸著板117A,117B,117C,117D,利用包含氣缸6之驅動機 構,在基板S之中心和基板S之角之連結方向進行滑動。在 採用此種構造之情況時,最好將固定梢11 4配置在基板吸 著板117A,117B間,基板吸著板117B,117C間,基板吸著板 117C,117D間,和基板吸著板117D,117A間。543112 V. Description of the invention (33) The suction plates 117A, 117B, 117C, and 117D use the driving mechanism including the air cylinder 6 to slide in the connecting direction of the center of the substrate S and the corner of the substrate S. In the case of such a structure, it is preferable to arrange the fixing pins 11 4 between the substrate suction plates 117A and 117B, between the substrate suction plates 117B and 117C, between the substrate suction plates 117C and 117D, and between the substrate suction plates. Between 117D and 117A.

另外’亦可以採用如圖1 3所示之構造,配置6個之基板 吸著板118A,118B,118C,118D,118E,118F,在氣缸55A,55B 之氣缸桿5 5 1沒入氣缸本體之狀態,成為四角框狀,利用 包含氣缸7之驅動機構,使該等之基板吸著板118A〜n8F 依照基板之尺寸進行滑動。在採用此種構造之情況時, 最好將固定梢1 1 4配置在互相鄰接之基板吸著板丨丨8A〜 11 8 F之間。 另外,所說明之構造例是利用以氣缸作為驅動源之氣缸 驅動機構,使基板吸著板119^1198滑動,但是亦可以採 螺旋構造,利用包含螺旋軸和螺帽等之螺旋機構,用來使 ^板吸著板119A,11 9B進行滑動。在採用此種螺旋機構之 1*月況日τ,可以依照基板尺寸更精細的 ==位置’可…一層的防止在基板:持板台u :保持之基板產生彎曲之問題。另外,此種效果之#得不 螺旋機•’亦可以採用氣缸驅動機構其中使用可以 =個1¾段調整氣缸桿之突出量之氣虹作為驅動源。 薄膜夕曰卜冷ί上述之實施形態中’基板s之端緣部之不要之 ΐ ί疋布 劑液後,附著在基板s之端緣部之不要之 &劑塗膜,但是本發明亦可應用在塗布光抗姓劑液,感In addition, 'the structure shown in FIG. 13 can also be used, with six substrate suction plates 118A, 118B, 118C, 118D, 118E, 118F, and the cylinder rods 5 5 1 of the cylinders 55A, 55B are submerged into the cylinder body. The state is a rectangular frame shape, and the substrate suction plates 118A to n8F are slid according to the size of the substrate by a driving mechanism including the cylinder 7. In the case of adopting such a structure, it is preferable to arrange the fixing tips 1 1 4 between the substrate suction plates 8A to 11 8 F adjacent to each other. In addition, the illustrated structure example uses a cylinder driving mechanism using a cylinder as a driving source to slide the substrate suction plate 119 ^ 1198. However, a spiral structure may also be used, and a screw mechanism including a screw shaft and a nut is used to Sliding the suction plates 119A, 119B. In the case of 1 * monthly day τ using such a spiral mechanism, the size of the substrate can be finer == position 'to prevent the problem of warping on the substrate: holding table u: substrate held by the substrate. In addition, the ## screw screw of this effect can also use a cylinder drive mechanism which uses a gas rainbow that can adjust the protrusion of the cylinder rod as a driving source. The film is said to be cold. In the above-mentioned embodiment, "the unnecessary part of the end edge of the substrate s" is coated with the unnecessary & agent coating film that adheres to the end edge of the substrate s, but the present invention also Can be applied in coating anti-surname liquid

543112 五、發明說明(34) 光性聚醯亞胺樹脂,彩色過濾器用染色劑等之各種藥液之 後,用以除去不要之薄膜之裝置。 另外,在申請專利範圍内,可以進行各種設計變更。 [元件編號之說明] 1 基板保持機構 2 位置調整機構 3 洗淨機構 4 除電器 5 控制部 11 基板保持台 12 升降梢 13 升降驅動機構 21A, 21B, 21C, 21D 位置調整頭 31A, 31B, 31C, 31D 洗淨頭 32A, 32B,32C,32D 引導執道 33 處理空間 51 腳構件 52 連結構件 53 引導軌道 54 滑動構件 55A, 55B, 6, 7 氣缸 57 間隙 111 基板吸著板 1 1 1A, 111B, 1 1 1C, 11 1D 吸著板片543112 V. Description of the invention (34) After removing various chemical liquids such as photopolyimide resin and color filters, it is used to remove unnecessary films. In addition, various design changes can be made within the scope of the patent application. [Description of component numbers] 1 Board holding mechanism 2 Position adjustment mechanism 3 Washing mechanism 4 Eliminator 5 Control unit 11 Board holding table 12 Lifting tip 13 Lift driving mechanism 21A, 21B, 21C, 21D Position adjustment heads 31A, 31B, 31C , 31D Wash head 32A, 32B, 32C, 32D Guidance channel 33 Processing space 51 Foot member 52 Connecting member 53 Guide rail 54 Slide member 55A, 55B, 6, 7 Cylinder 57 Clearance 111 Substrate suction plate 1 1 1A, 111B , 1 1 1C, 11 1D suction plate

C:\2D-CQDE\91-07\91107071.ptd 第38頁 543112 五、發明說明(35) 111a 外緣部 111b 内緣部 112A, 112B 1 12F 113 滑動框架C: \ 2D-CQDE \ 91-07 \ 91107071.ptd Page 38 543112 V. Description of the invention (35) 111a Outer edge portion 111b Inner edge portion 112A, 112B 1 12F 113 Sliding frame

114 117 1 1 7A 1 18A 固定框架 吸著溝 空氣吸引/氮供給配管 水平轴線 117D 1 18F 119A, 119B 120 固定梢 311 上喷嘴塊 312 下喷嘴塊 313 本體塊 3 1 4,3 1 5 溶劑吐出喷嘴 3 1 6 , 3 1 7 氣體喷嘴 318 吸引路徑 319 軟管 S, SI, S2,S3 基板吸著板 基板吸著板 基板吸著板 基板114 117 1 1 7A 1 18A fixed frame suction groove air suction / nitrogen supply pipe horizontal axis 117D 1 18F 119A, 119B 120 fixed tip 311 upper nozzle block 312 lower nozzle block 313 body block 3 1 4, 3 1 5 solvent discharge Nozzles 3 1 6, 3 1 7 Gas nozzles 318 Suction path 319 Hoses S, SI, S2, S3 Substrate suction plate Substrate suction plate Substrate suction plate Substrate

\\312\2d-code\91-07\91107071.ptd 第39頁 543112 圖式簡單說明 圖1是本發明之第1實施形態之基板端緣洗淨裝置(基板 處理裝置)之平面圖。 圖2是從圖1之I I - I I看到之剖面圖。 圖3是剖面圖,用來說明基板保持台之構造。 圖4是側面圖,用來表示洗淨頭之構造。 圖5用來說明對基板之端緣部之洗淨處理。 圖6是圖解之剖面圖,用來說明用以緩和基板被吸著在 基板吸著板之吸著狀態之另一構造。 圖7是圖解之剖面圖,用來說明用以緩和基板被吸著在 基板吸著板之吸著狀態之更另一構造。 圖8是本發明之第2實施形態之基板端緣洗淨裝置之平面 圖 圖9是從圖8之I I - I I看到之剖面圖。 圖10是基板保持台之平面圖。 圖11是從圖1 0之V-V看到之剖面圖。 圖12是圖解之平面圖,用來說明基板保持台之另一構造 例 圖13是圖解之平面圖,用來說明基板保持台之更另一構 造例。\\ 312 \ 2d-code \ 91-07 \ 91107071.ptd Page 39 543112 Brief description of drawings Figure 1 is a plan view of a substrate edge cleaning device (substrate processing device) according to the first embodiment of the present invention. FIG. 2 is a cross-sectional view seen from I I-I I in FIG. 1. Fig. 3 is a sectional view for explaining the structure of a substrate holding table. Fig. 4 is a side view showing the structure of a washing head. FIG. 5 is a diagram for explaining a cleaning process of an edge portion of a substrate. Fig. 6 is a schematic cross-sectional view for explaining another structure for relaxing the adsorption state of the substrate on the substrate adsorption plate. Fig. 7 is a schematic cross-sectional view for explaining another structure for relaxing the adsorption state of the substrate on the substrate adsorption plate. Fig. 8 is a plan view of a substrate edge cleaning device according to a second embodiment of the present invention. Fig. 9 is a cross-sectional view as seen from I I-I I in Fig. 8. FIG. 10 is a plan view of a substrate holding table. Fig. 11 is a sectional view seen from V-V of Fig. 10. Fig. 12 is a diagrammatic plan view for explaining another example of the structure of the substrate holding table. Fig. 13 is a diagrammatic plan view for explaining another example of the structure of the substrate holding table.

C:\2D-CODE\91-07\91107071. ptd 第40頁C: \ 2D-CODE \ 91-07 \ 91107071. Ptd Page 40

Claims (1)

543112 六、申請專利範ΐ ~^ '~' -------— _ 1三一種基板保持裝置,其特徵是包含有: 第1基板支持裝置,接觸在方形基板 水=的將該方形基板支持在預定之高反度之;月面,用來大致 第2基板支持裝置,接觸在方形基板 板支持纟置所接觸之區域内方之區域比上述第1基 方形基板; 」以早獨的支持該 升降驅動機構,用來使該第2基板 基板支持裝置進行相對升降;和 孖農置對上述之第1 才工制衣置,用來控制上述之升降驅動 定高度,使方形基板被上述之第 】^上述之預 支持。 乐基板支持裝置雙方 2. 如申請專利範圍第丨項之基板保 L 基板支持裝置包含有基板裝載板,ΐί平=述之 基板小之矩形之外形,可 ^有十面看比方形 3. 如申請專利範圍第2項之芙、上面農載方形基板。 基板裝載板之上面和外端面,"·以彎曲’衣置’其中上述之 基板裝載板之上面和:2端員面之 5 ·如申請專利範圍第3 外側之曲面連接。 之基板裝載板之上面和外沪土板保持裝置,其中在上述 樹脂之塗膜。 而之連接部份,被施加有使用 6 ·如申請專利範圍第2項 在上述之基板裝載板之、土板保持裝置,其中 形基板之背面;和 面形成有吸著孔,用來吸著方543112 VI. Patent application scope ~ ^ '~' --------- _ 1 A substrate holding device, which is characterized in that it includes: a first substrate supporting device which is in contact with water on a square substrate; The square substrate is supported at a predetermined high degree of refraction; the lunar surface is used for roughly the second substrate support device, and the area in contact with the area contacted by the square substrate plate support arrangement is earlier than the above-mentioned first base square substrate; Unique support for the lifting driving mechanism is used to relatively lift the second substrate substrate supporting device; and the farmer's clothing to the above-mentioned first talented garment making device is used to control the above-mentioned lifting driving fixed height to make the square substrate It is pre-supported by the above mentioned [^]. Both sides of the Le substrate support device 2. If the substrate protection device of the patent application No. 丨 the substrate support device includes a substrate loading plate, the flat substrate described above is smaller than the rectangular shape, and can be seen on ten sides than the square 3. Such as The application of the second scope of the patent application, the above-mentioned agricultural-loaded square substrate. The upper surface and the outer end surface of the substrate loading plate are " curved " clothed " wherein the upper surface of the substrate loading plate and the upper surface of the 2 end member surface are connected according to the third outer surface of the patent application scope. The upper surface of the substrate loading plate and the outer soil plate holding device, wherein the above-mentioned resin is coated. And the connection part is applied with the use of 6 · as in the scope of the patent application No. 2 in the above-mentioned substrate loading plate, soil plate holding device, in which the back surface of the substrate; and the surface is formed with suction holes for suction square W312\2d-code\91-07\91107071. ptd 苐41頁 M3112 六、申請專利範圍 上述之第1基板支持裝置 支持在上述之基板裝载板 ^ :方形基板之背面吸著和 7·如申請專利範圍第6 ^。 有氣體供給裝置,連接到上之基板保持裝置,其中更包含 到基板裝載板之上面。 述之吸著孔,用來將氣體供給 8 ·如申請專利範圍第2項 基板裝載板之指定部被構建土 ”、、I置,其中上述之 水平軸線自由的搖動。 ’、可以圍繞沿著其外端面之 9.如申請專利範圍第2項 基板裝載板包含有分別沿著土板?襄置,其中上述之 1〇.如申請專利範圍第9 = = ;;;邊之4個板片。 4個板片之至少一個祐错、土板保持衣置,其中上述之 平軸線自由的搖動構建成為可以圍繞沿著外端面之水 其中被構 設置成使 其中被構 設置成使 其中上述之 11如申請專利範圍第1〇項之基板保持事置 =為可以圍繞上述水平軸線自由搖動之板片 ”外端緣可>以對方形基板之背面進行接離。 I2·、如申請專利範圍第1〇項之基板保持 建成為可以圍繞上述水平軸線自由搖動之板片 其内端緣可^以對方形基板之背面進行接離。 1 3 ·如申請專利範圍第丨項之基板保持裝豆 第2基板支持|置包含有多個升降梢,接觸在方形基板达之 背面。 1 4·如申請專利範圍第丨3項之基扳保持裝置,其中在上 述之升壓梢之刚端形成有吸著孔,用來吸著方形基板之背W312 \ 2d-code \ 91-07 \ 91107071. Ptd 页 Page 41 M3112 VI. Scope of patent application The above-mentioned first substrate support device supports the above-mentioned substrate loading plate ^: The back of the square substrate is sucked and 7. · If you apply Patent Scope 6 ^. There is a gas supply device, which is connected to the upper substrate holding device, and further includes the upper surface of the substrate loading plate. The suction hole is used to supply the gas. 8 If the designated part of the substrate loading plate of the patent application scope No. 2 is constructed with soil ", I, where the above-mentioned horizontal axis can be shaken freely. 9. The outer end face of the substrate loading board as in item 2 of the scope of the patent application contains the soil plate? Xiang, where the above 10. As the scope of the patent application is 9 = = ;;; 4 side plates . At least one of the 4 plates, the soil plate holding clothes, in which the above-mentioned flat axis is freely shaken to be constructed so that it can be arranged around the water along the outer end surface so that it is structured so that the above 11 If the substrate holding item No. 10 of the scope of patent application is set to be a plate that can be freely shaken about the above-mentioned horizontal axis, the "outer edge" may be > to separate the back of the square substrate. I2. The substrate holding such as the scope of patent application No. 10 is constructed as a plate that can be freely shaken about the above-mentioned horizontal axis. The inner edge of the substrate can be separated from the back of the square substrate. 1 3 · As for the substrate holding and mounting of item No. 丨 in the patent application, the second substrate support includes a plurality of lifting pins, which are in contact with the back of the square substrate. 14. The base plate holding device according to item No. 3 of the patent application scope, wherein a suction hole is formed at the rigid end of the booster pin, which is used to suck the back of the square substrate. 543112 六、申請專利範圍 面0 有置V二專置利#:圍广項之基板保持裝置 基板之水平面ί二觸在方形基板之端面’用來使該方形 16.如申-鼻利位置定位在預定之基板保持位置。 有除電/置用Λ 項之基板保持裝置,其中更包含 _衣置,用來對方形基板進行除電。 方形基板種之基/反缘處邻理\置’用來洗淨在表面形成有薄膜之 伋之纟而、、彖。卩,其特徵是包含有: 端第1用至;6項/任-項之基板保持裝置;和 裝置之古/、 用來將溶劑供給到被保持在該基板保持 要之薄膜形基板之端緣部,藉以除去形成在該端緣部之不 之^ ·緣如/、、=專利範圍第17項之基板處理裝置,其中上述 之端緣部吐含有溶劑吐出喷嘴’用來朝向方形基板 18 ^ ^ S ^ t -h it t g1# A 25包έ有氣體喷嘴,用來朝向方形基板上 合J供給位置近傍噴射氣體。 之圍第19項之基板處理裝置,其中上述 啥f ^ z, b包含有:洗淨頭,用來將上述之溶劑吐出 頭,、”::::嘴保持為一體;和移動機構,用來使該洗淨 移動者? ’、、在上述之基板保持裝置之方形基板之邊進行 21.如申請專利範圍第2〇項之基板處理裝置,其中543112 Sixth, the scope of the patent application is 0. There are two V. Specially set Lee #: The horizontal plane of the substrate holding device substrate of the wide item is touched on the end face of the square substrate 'to make the square 16. Hold in a predetermined substrate position. There is a substrate holding device for static elimination / placement Λ, which also includes _ clothes, which is used to remove electricity from square substrates. The base / anti-adjacent position of the square substrate is used to clean the substrate and the substrate where a thin film is formed on the surface.卩, which is characterized by including: the first to the end; the substrate holding device of item 6 / any-item; and the device of the device for supplying the solvent to the end of the film-shaped substrate held by the substrate holding device. The edge portion is used to remove the inconsistency formed at the end edge. The edge processing device includes a substrate processing device according to item 17 of the patent, in which the above-mentioned edge portion spit contains a solvent discharge nozzle and is used to face the square substrate 18. ^ ^ S ^ t -h it t g1 # A 25 has a gas nozzle, which is used to inject gas near the J supply position on the square substrate. The substrate processing device of item 19, wherein the above-mentioned f ^ z, b includes: a cleaning head for ejecting the above-mentioned solvent from the head, ":::: the mouth is kept as a whole; and the moving mechanism is used for Come to make the cleaning mover? '. Perform on the side of the square substrate of the substrate holding device described above. 21. The substrate processing device according to item 20 of the patent application scope, in which \\312\2d-code\91-07\91107071.ptd 第43頁 543112 六、申請專利範圍 在上述之洗淨頭形成有用以收容處理對象之基板之端緣 部之處理空間;和 上述之端緣洗淨裝置更包含有排氣裝置,連接到上述之 處理空間,用來排出該處理空間内之環境氣體。 2 2 ·如申請專利範圍第2 1項之基板處理裝置,其中 上述之洗淨頭具備有上下面對之一對之塊,上述之處理 空間形成在上述之一對之塊之間;和 在上述之一對之塊之各個,設置上述之溶劑吐出喷嘴和 氣體喷嘴。\\ 312 \ 2d-code \ 91-07 \ 91107071.ptd Page 43 543112 Sixth, the scope of the application for a patent is to form a processing space at the edge of the cleaning head which is used to receive the substrate of the processing object; and the above-mentioned end The edge cleaning device further includes an exhaust device, which is connected to the processing space described above and is used to exhaust the ambient gas in the processing space. 2 2 · If the substrate processing device according to item 21 of the patent application scope, wherein the above-mentioned cleaning head is provided with a pair of blocks facing up and down, the above-mentioned processing space is formed between the above-mentioned pair of blocks; and Each of the above-mentioned pair of blocks is provided with the above-mentioned solvent discharge nozzle and gas nozzle. 2 3 · —種基板保持裝置,其特徵是包含有: 固定框架; 多個基板裝載板,被安裝在該固定框架,在其上面可以 裝載基板;和 滑動機構,用來使該多個基板裝載板中之至少1個,以 大致水平之方向對上述之框架進行相對滑動。 2 4 ·如申請專利範圍第2 3項之基板保持裝置,其中更包 含有固定梢,被配置在上述多個基板裝載板之間,用來接 觸被裝載在上述多個基板裝載板之基板之背面。2 3 · A substrate holding device, comprising: a fixed frame; a plurality of substrate loading plates mounted on the fixed frame to which a substrate can be loaded; and a sliding mechanism for loading the plurality of substrates At least one of the plates slides the aforementioned frame relatively in a substantially horizontal direction. 2 4 · The substrate holding device according to item 23 of the scope of patent application, which further includes a fixed tip, which is arranged between the plurality of substrate loading plates for contacting the substrates loaded on the plurality of substrate loading plates. back. 25· —種基板端緣洗淨裝置,用來洗淨在表面形成有薄 膜之基板之端緣部,其特徵是包含有: 申請專利範圍第2 3或2 4項之基板保持裝置;和 端緣洗淨裝置,用來將溶劑供給到被該基板保持裝置保 持之基板之端緣部’藉以除去形成在該端緣部之不要之薄 膜。 125 · —A substrate edge cleaning device for cleaning the edge of a substrate on which a thin film is formed on a surface, which is characterized in that it includes: a substrate holding device in the scope of patent application No. 23 or 24; and The edge cleaning device is configured to supply a solvent to the edge portion of the substrate held by the substrate holding device, thereby removing unnecessary films formed on the edge portion. 1 C:\2D-CODE\91-07\91107071.ptd 第44頁C: \ 2D-CODE \ 91-07 \ 91107071.ptd Page 44
TW091107071A 2001-04-12 2002-04-09 Substrate holding apparatus, substrate processing apparatus and substrate edge cleaning apparatus TW543112B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001113614A JP3971120B2 (en) 2001-04-12 2001-04-12 Substrate holding device and substrate processing apparatus
JP2001113613A JP2002313894A (en) 2001-04-12 2001-04-12 Substrate holding device and substrate terminal end cleaning device provided therewith

Publications (1)

Publication Number Publication Date
TW543112B true TW543112B (en) 2003-07-21

Family

ID=29738258

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091107071A TW543112B (en) 2001-04-12 2002-04-09 Substrate holding apparatus, substrate processing apparatus and substrate edge cleaning apparatus

Country Status (2)

Country Link
KR (1) KR100472646B1 (en)
TW (1) TW543112B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100832802B1 (en) * 2006-11-27 2008-05-27 세메스 주식회사 Substrate processing apparatus and method for driving lift pin of the same
JP7138539B2 (en) * 2018-10-18 2022-09-16 東京エレクトロン株式会社 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
CN218308986U (en) * 2022-07-12 2023-01-17 江苏立导科技有限公司 Gluing equipment

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09246362A (en) * 1996-03-05 1997-09-19 Dainippon Screen Mfg Co Ltd Rotary wafer processing device and method
US5993552A (en) * 1996-08-08 1999-11-30 Tokyo Electron Ltd Processing apparatus
TW357389B (en) * 1996-12-27 1999-05-01 Tokyo Electric Ltd Apparatus and method for supplying process solution to surface of substrate to be processed
TW419716B (en) * 1997-04-28 2001-01-21 Tokyo Electron Ltd Processing apparatus
JP3874960B2 (en) * 1999-04-02 2007-01-31 東京エレクトロン株式会社 Substrate processing equipment

Also Published As

Publication number Publication date
KR100472646B1 (en) 2005-03-08
KR20020079540A (en) 2002-10-19

Similar Documents

Publication Publication Date Title
TWI293578B (en) Nozzle cleaning apparatus and substrate processing apparatus
JP3808741B2 (en) Processing equipment
KR102175327B1 (en) Substrate processing system
TW201002636A (en) Downward type apparatus for slimming substrate and slimming system of the same
JP2005294835A (en) Interface between substrate and mechanics and handling method of the same
JP5600624B2 (en) Coating film forming apparatus and coating film forming method
JP6503279B2 (en) Film processing unit, substrate processing apparatus and substrate processing method
US20210233784A1 (en) Film processing method
US7065900B2 (en) Docking-type system and method for transferring and treating substrate
TW543112B (en) Substrate holding apparatus, substrate processing apparatus and substrate edge cleaning apparatus
TW200537610A (en) Apparatus and method for treating a panel
TW448473B (en) Development method and development device
TW200537585A (en) Coating film forming apparatus
KR20120069576A (en) Coating process apparatus and coating process method
JP3624116B2 (en) Processing apparatus and processing method
JP2008277480A (en) Substrate transfer treatment method and apparatus
JP2000084844A (en) Plate body separating method and device therefor
KR100766115B1 (en) Coating apparatus for substrate of flat panel display
JP3971120B2 (en) Substrate holding device and substrate processing apparatus
JP2006269928A (en) Method and apparatus for processing substrate
TW421827B (en) Substrate cleaning apparatus
JP2004179513A (en) Substrate holding apparatus and substrate treatment apparatus
KR20130091576A (en) Apparatus for treating substrate
KR20140050863A (en) Apparatus for treating substrate
KR102660152B1 (en) Substrate processing apparatus and substrate processing method

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees