TW508943B - Pixel readout switched capacitor buffer circuit and method therefor - Google Patents

Pixel readout switched capacitor buffer circuit and method therefor Download PDF

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Publication number
TW508943B
TW508943B TW090101491A TW90101491A TW508943B TW 508943 B TW508943 B TW 508943B TW 090101491 A TW090101491 A TW 090101491A TW 90101491 A TW90101491 A TW 90101491A TW 508943 B TW508943 B TW 508943B
Authority
TW
Taiwan
Prior art keywords
capacitor
terminal
signal
receiving
transistor
Prior art date
Application number
TW090101491A
Other languages
English (en)
Chinese (zh)
Inventor
Andrea Niederkorn
Suhail Agwani
David Locascio
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Application granted granted Critical
Publication of TW508943B publication Critical patent/TW508943B/zh

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
TW090101491A 2000-01-24 2001-02-27 Pixel readout switched capacitor buffer circuit and method therefor TW508943B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/490,238 US6423961B1 (en) 2000-01-24 2000-01-24 Pixel readout switched capacitor buffer circuit and method therefor

Publications (1)

Publication Number Publication Date
TW508943B true TW508943B (en) 2002-11-01

Family

ID=23947201

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090101491A TW508943B (en) 2000-01-24 2001-02-27 Pixel readout switched capacitor buffer circuit and method therefor

Country Status (4)

Country Link
US (1) US6423961B1 (enExample)
JP (1) JP4867028B2 (enExample)
IL (1) IL140599A (enExample)
TW (1) TW508943B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412273B (zh) * 2009-03-18 2013-10-11 Sony Corp 固態影像裝置及其驅動方法，以及電子裝置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030151689A1 (en) * 2002-02-11 2003-08-14 Murphy Charles Douglas Digital images with composite exposure
US6791378B2 (en) * 2002-08-19 2004-09-14 Micron Technology, Inc. Charge recycling amplifier for a high dynamic range CMOS imager
US7388608B2 (en) * 2004-03-11 2008-06-17 Micron Technology, Inc. Sample and hold circuit and active pixel sensor array sampling system utilizing same
US20050200730A1 (en) * 2004-03-11 2005-09-15 Beck Jeffery S. Active pixel sensor array sampling system and method
US9200956B2 (en) * 2010-06-27 2015-12-01 Sri International Readout transistor circuits for CMOS imagers
CN103684408A (zh) * 2013-12-18 2014-03-26 苏州纳芯微电子有限公司 电容式传感器接口电路
WO2019227067A1 (en) * 2018-05-24 2019-11-28 Gigajot Technology Llc Image sensor having column-level correlated-double-sampling charge transfer amplifier

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1086578A4 (en) * 1998-03-16 2001-09-26 California Inst Of Techn CMOS INTEGRATION SENSOR WITH FULL DIFFERENTIAL COLUMN READING CIRCUIT FOR IMAGING BRIGHTNESS ADAPTIVES
US6128039A (en) * 1999-01-11 2000-10-03 Omnivision Technologies, Inc. Column amplifier for high fixed pattern noise reduction

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412273B (zh) * 2009-03-18 2013-10-11 Sony Corp 固態影像裝置及其驅動方法，以及電子裝置

Also Published As

Publication number Publication date
JP4867028B2 (ja) 2012-02-01
IL140599A (en) 2005-09-25
IL140599A0 (en) 2002-02-10
US6423961B1 (en) 2002-07-23
JP2001245210A (ja) 2001-09-07

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